Single-frequency laser frequency drift testing device and method based on temperature control wave locking device

Abstract

The invention relates to the technical field of laser frequency drift testing, in particular to a single-frequency laser frequency drift testing device and method based on a temperature control wave lock, and the testing device comprises a single wave lock and a single-frequency laser frequency drift testing device with a double-wave lock structure. According to the invention, the problems of environment temperature fluctuation and poor stability of optical devices such as an external FP cavity are solved through the temperature control wave locking device, the stability of frequency drift measurement is ensured, and the equipment cost is greatly reduced at the same time. Through the two phase-matched temperature control wave locks, the problem that when a single wave lock or an FP cavity measures frequency drift, the frequency drift direction cannot be judged when the laser frequency drifts to the frequency spectrum wave crest or wave trough position of the FP cavity, so that the measurement range is limited is solved.

Description

Technical Field

[0001] The present invention relates to the technical field of laser frequency drift testing, and in particular to a single-frequency laser frequency drift testing device and method based on a temperature-controlled wave locker. Background Art

[0002] The measurement methods of laser frequency drift mainly include direct measurement method, dual-beam beat frequency method, single-beam self-heterodyne method and frequency standard reference method. The direct measurement method uses a spectrum analyzer to directly measure the output frequency of the laser, and its measurement accuracy is limited by the frequency resolution of the spectrum analyzer; the dual-beam method beats the laser to be measured with a high-stability reference laser, and measures the frequency of the beat frequency signal to infer the frequency of the light source to be measured. The disadvantage of this method is that the instability comes from two lasers, so the reference light source is required to have higher stability than the laser to be measured. Compared with the dual-beam beat frequency method, the single-beam self-heterodyne method has a simpler system structure and is easy to implement, but in order to obtain high-precision measurements, it is usually necessary to use a fiber delay line of several hundred meters or even thousands of meters. Long optical fiber will cause loss and instability of the laser signal, and is easily affected by external environmental factors. Using frequency standard reference methods such as the principle of optical frequency comb to measure frequency drift, it is more difficult to achieve extremely high measurement accuracy when using this method. This is because as the measurement accuracy improves, higher requirements are placed on the performance indicators of the instrument, and accordingly, the measurement system will become more complex.

[0003] To this end, the present application designs a single-frequency laser frequency drift test device and method based on a temperature-controlled wave lock. By using a temperature-controlled wave lock system and a synchronous acquisition card, the hardware design is simplified, the system complexity is reduced, and frequency drift measurement can be achieved with simpler equipment. Summary of the invention

[0004] In order to make up for the deficiencies in the prior art, the present invention provides a single-frequency laser frequency drift testing device and method based on a temperature-controlled wave locker.

[0005] A single-frequency laser frequency drift test device based on a temperature-controlled wave locker is a single-frequency laser frequency drift test device with a single wave locker: The single-frequency laser frequency drift test device with a single wave locker comprises a single-frequency laser, the single-frequency laser is connected to the wave locker, the wave locker is connected to a synchronous acquisition card and a temperature control module, and the synchronous acquisition card is connected to a data processing module; The wave locker includes a coupler, an FP cavity, a first photodetector and a second photodetector, and the synchronous acquisition card includes a first AD conversion port and a second AD conversion port.

[0006] A single-frequency laser frequency drift test method based on a temperature-controlled wave locker, and a single-frequency laser frequency drift test device based on the single wave locker, comprising the following steps: a single-frequency laser inputs a single-frequency laser into the wave locker, and an output port of the wave locker comprises a filter output end, i.e., a first photodetector, and a reference output end, i.e., a second photodetector, wherein an electrical signal outputted from the filter output end is connected to a first AD conversion port of a synchronous acquisition card for analog-to-digital conversion, and an electrical signal outputted from the reference output end is connected to a second AD conversion port of the synchronous acquisition card for analog-to-digital conversion; a temperature control module is used in advance to control the temperature of the wave locker to a fixed value, so that the spectrum of the wave locker remains stable during the measurement process; the frequency drift of the single-frequency laser measured by the wave locker will be affected by the power and frequency of the single-frequency laser, and in order to eliminate the influence of the power change of the single-frequency laser itself on the frequency drift measurement, the data collected by the synchronous acquisition card is input into a data processing module, and the voltage value collected by the first AD conversion port is divided by the voltage value collected by the second AD conversion port, so that the influence of the power fluctuation of the single-frequency laser itself can be eliminated, leaving only the influence of the frequency change, and then the magnitude of the frequency drift is calculated.

[0007] A single-frequency laser frequency drift test device based on a temperature-controlled wave locker is a single-frequency laser frequency drift test device with a double wave locker, the double wave locker single-frequency laser frequency drift test device comprises a single-frequency laser, the single-frequency laser is connected to a first coupler, the first coupler is connected to a first wave locker and a second wave locker, the first wave locker is connected to a first synchronous acquisition card and a first temperature control module, the first synchronous acquisition card is connected to a data processing module, the second wave locker is connected to a second synchronous acquisition card and a second temperature control module, and the second synchronous acquisition card is connected to the data processing module; the first wave locker comprises a second coupler, a first FP cavity, a first photodetector and a second photodetector; the first A synchronous acquisition card includes a first AD conversion port and a second AD conversion port; the second wave locker includes a third coupler, a second FP cavity, a third photodetector and a fourth photodetector; the second synchronous acquisition card includes a third AD conversion port and a fourth AD conversion port; when the laser emitted by a single-frequency laser is at a peak or a trough point of the FP cavity spectrum in the first wave locker and the frequency drift direction cannot be determined, a second wave locker is added, and a second temperature control module controls the FP cavity spectrum in the second wave locker so that the FP cavity spectrum in the first wave locker and the FP cavity spectrum in the second wave locker are staggered by a certain phase, so that the problem that a wave locker cannot determine the frequency drift direction can be solved.

[0008] A single-frequency laser frequency drift test method based on a temperature-controlled wave locker and a single-frequency laser frequency drift test device based on the above-mentioned double wave locker include the following steps: The output laser of the single-frequency laser enters the coupler and is divided into two beams of light with equal light intensity, one of which enters the first wave locker and the other enters the second wave locker. The light entering the first wave locker is divided by the second coupler inside. A relatively strong signal enters the first FP cavity, and then is processed by the first photodetector and then goes to the first AD conversion port of the first synchronous acquisition card for analog-to-digital conversion; the other weaker light is processed by the second photodetector and then goes to the second AD conversion port of the first synchronous acquisition card for analog-to-digital conversion. Input the data collected by the synchronous acquisition card into the data processing module, and divide the voltage value collected by the first AD conversion port by the voltage value collected by the second AD conversion port, so as to eliminate the influence of the power fluctuation of the single-frequency laser itself, leaving only the influence of the frequency change, and then calculate the magnitude of the frequency drift. When the laser frequency of the single-frequency laser drifts to the peak or trough of the first FP cavity spectrum in the first wave locker, the data obtained by the data processing module cannot determine the direction of the laser frequency drift. At this time, the laser frequency is in the linear region of the second FP cavity spectrum in the second wave locker, so the direction of the frequency drift of the single-frequency laser can be determined and the magnitude of the frequency drift can be measured.

[0009] The beneficial effects of the present invention are: The present invention solves the problems of ambient temperature fluctuation and poor stability of optical devices such as external FP cavity by using temperature-controlled wave lockers, ensures the stability of frequency drift measurement, and greatly reduces the equipment cost. The two phase-matched temperature-controlled wave lockers solve the problem that when a single wave locker or FP cavity measures frequency drift, when the laser frequency drifts to the peak or valley position of the FP cavity spectrum, the frequency drift direction cannot be determined, thereby limiting the measurement range. BRIEF DESCRIPTION OF THE DRAWINGS

[0010] Figure 1 It is a structural schematic diagram of a single-frequency laser frequency drift test device based on a single temperature-controlled wave locker according to the present invention; Figure 2 For the present invention Figure 1 The spectrum of the FP cavity in the wave locker of the single-frequency laser frequency drift test device based on a single temperature-controlled wave locker. At this time, the laser wavelength of the single-frequency laser is in the linear region of the FP cavity spectrum. Figure 3 In the first embodiment, when R is 32%, n is 1.45, and d is 0.008m, V d The relationship diagram with the change of λ; Figure 4 It is a structural schematic diagram of another single-frequency laser frequency drift test device based on a dual temperature-controlled wave locker of the present invention; Figure 5 For the present invention Figure 4Another single-frequency laser frequency drift test device based on dual temperature-controlled wave lockers shows the FP cavity spectrum in the wave locker; wherein (A) is the spectrum when the laser wavelength of the single-frequency laser is at the FP cavity peak of the first wave locker, and (B) is the spectrum when the laser wavelength of the single-frequency laser is in the FP cavity linear region of the second wave locker at the same moment.

[0011] Figure 6 It is an alternative to the second specific embodiment of the present invention; wherein (A) is the spectrum when the laser wavelength of the single-frequency laser is located at the FP cavity peak of the first wave locker, and (B) is the transmission spectrum when the wavelength of the single-frequency laser is located in the spectral linear region of the fiber grating filter at the same moment.

[0012] In the figure, 1. Single frequency laser, 2. Wave locker, 3. Synchronous acquisition card, 4. Temperature control module, 5. Data processing module, 6. Coupler, 7. FP cavity, 8. First photodetector, 9. Second photodetector, 10. First AD conversion port, 11. Second AD conversion port; 61. a first coupler, 21. a first wave locker, 31. a first synchronous acquisition card, 22. a second wave locker, 32. a second synchronous acquisition card, 41. a first temperature control module, 42. a second temperature control module, 62. a second coupler, 71. a first FP cavity, 63. a third coupler, 72. a second FP cavity, 81. a third photodetector, 91. a fourth photodetector, 101. a third AD conversion port, 111. a fourth AD conversion port. DETAILED DESCRIPTION

[0013] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Generally, the components of the embodiments of the present invention described and shown in the accompanying drawings here can be arranged and designed in various different configurations.

[0014] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention claimed for protection, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without making creative work are within the scope of protection of the present invention.

[0015] Figure 1 This is the first specific embodiment of the present invention, which is a single-frequency laser frequency drift test device based on a temperature-controlled wave locker. The single-frequency laser 1 emits a single-frequency laser and is incident on the wave locker 2. The output port of the wave locker 2 includes a filter output end (a first photodetector 8) and a reference output end (a second photodetector 9). The filter output end outputs an electrical signal connected to the first AD conversion port 10 of the synchronous acquisition card 3 for analog-to-digital conversion, and the reference output end outputs an electrical signal connected to the second AD conversion port 11 of the synchronous acquisition card 3 for analog-to-digital conversion. The temperature of the wave locker 2 is set to a fixed value using the temperature control module 4 in advance, so that the spectrum of the FP cavity 7 in the wave locker 2 remains stable during the measurement process. The voltage signal of the filter output end of the wave locker 2, i.e., the first photodetector 8, will be affected by the power and frequency of the single-frequency laser 1. In order to eliminate the influence of the power change of the single-frequency laser 1 itself on the frequency drift measurement, the data collected by the synchronous acquisition card 3 is input into the data processing module 5, and the voltage value collected by the first AD conversion port 10 is divided by the voltage value collected by the second AD conversion port 11, so that the influence of the power fluctuation of the single-frequency laser 1 itself can be eliminated, leaving only the influence of the laser frequency change, and then the magnitude of the frequency drift can be calculated.

[0016] like Figure 2 The figure shows a typical spectrum of the FP cavity in the wave locker 2. The single-frequency laser 1 in the 1550nm band outputs laser light into the wave locker 2. The light signal with a relatively strong intensity is divided into a beam of light by the coupler 6 inside the wave locker 2 and enters the FP cavity 7. The light signal is then converted into photoelectricity by the first photodetector 8 and then to the first AD conversion port 10 of the synchronous acquisition card 3 for analog-to-digital conversion. The first AD conversion port 10 of the synchronous acquisition card 3 can collect voltage in real time. , Wherein A1 represents the photoelectric conversion coefficient of the first photodetector 8, C1 represents the coupling coefficient of the optical signal in the transmission path, I0 represents the light intensity incident to the wave locker, λ is the wavelength of the light emitted by the single-frequency laser 1, and its change is to be measured, R is the plane reflectivity of the FP cavity 7, n is the refractive index of the FP cavity 7, d is the parallel cavity spacing of the FP cavity 7, and T(λ) represents the change of the transmittance of the FP cavity 7 with λ. , λ is the wavelength of the light emitted by the single-frequency laser 1, and its change is to be measured. If the FP cavity 7 does not change, then R and n will not change either, and d will change with the adjustment of the temperature control module 4. Figure 2 Shown is a curve in which the transmittance formula of the FP cavity 7 in the wave locker 2 has an R value of 32%, an n value of 1.45, and a d value of 0.008 m, as well as a schematic diagram when the laser wavelength is in the linear region of the transmission spectrum.

[0017] Another weaker light intensity signal is processed by the second photodetector 9 and then sent to the second AD conversion port 11 of the synchronous acquisition card 3 for analog-to-digital conversion. The second AD conversion port 11 of the synchronous acquisition card 3 can collect voltage in real time. , where A2 represents the photoelectric conversion coefficient of the second photodetector 9, C2 represents the coupling coefficient of the optical signal on the transmission path, and I0 represents the light intensity incident on the wave locker. During the frequency drift measurement process, the frequency spectrum of the FP cavity 7 in the wave locker 2 may shift due to temperature changes, so a temperature control module 4 is added to keep the frequency spectrum of the FP cavity 7 in the wave locker 2 stable. Figure 1 In the test device shown in the figure, A1, A2, C1, and C2 are all fixed values ​​(A1 represents the photoelectric conversion coefficient of the first photodetector 8, A2 represents the photoelectric conversion coefficient of the second photodetector 9, C1 represents the coupling coefficient of the optical signal on the transmission path, and C2 represents the coupling coefficient of the optical signal on the transmission path). After temperature control, it is considered that the parameters R, n, and d (R is the plane reflectivity of the FP cavity 7, n is the refractive index of the FP cavity 7, and d is the parallel cavity spacing of the FP cavity 7) of the wave locker are fixed values ​​and do not change with time, then V d1 and V d2 The data collected by the synchronous acquisition card 3 is input into the data processing module 5, and the voltage value collected by the first AD conversion port 10 is divided by the voltage value collected by the second AD conversion port 11, that is, , the influence of the power fluctuation of the single-frequency laser 1 itself can be eliminated, leaving only the influence of the wavelength change. Where A1 represents the photoelectric conversion coefficient of the first photodetector 8, A2 represents the photoelectric conversion coefficient of the second photodetector 9, C1 represents the coupling coefficient of the optical signal on the transmission path, and C2 represents the coupling coefficient of the optical signal on the transmission path. According to the relationship between laser wavelength and frequency , C is the speed of light in vacuum, λ is the wavelength of light emitted by single-frequency laser 1, the change of which is to be measured, n is the refractive index of FP cavity 7, ν is the frequency of light emitted by single-frequency laser 1, the change of which is to be measured, then V is obtained d It only depends on the frequency ν of the light emitted by the single-frequency laser 1.

[0018] The voltage ratio obtained at time t1 is V d (t1), the voltage ratio obtained at time t2 is V d (t2), subtracting the two, we get: , In this formula, A1, A2, C1, and C2 (A1 represents the photoelectric conversion coefficient of the first photodetector 8, A2 represents the photoelectric conversion coefficient of the second photodetector 9, C1 represents the coupling coefficient of the optical signal on the transmission path, and C2 represents the coupling coefficient of the optical signal on the transmission path) are all fixed values. R, n, and d (R is the plane reflectivity of the FP cavity 7, n is the refractive index of the FP cavity 7, and d is the parallel cavity spacing of the FP cavity 7) are also fixed values ​​because the FP cavity 7 used is unchanged. Then, the change of λ from time t1 to time t2 Δλ=λ(t2)-λ(t1) can be inferred according to the formula, and then the change of laser frequency, that is, the frequency drift size Δν, can be obtained according to the relationship between laser wavelength and frequency. Figure 3 The following is the V when R is 32%, n is 1.45, and d is 0.008m in Example 1. d The relationship between V and λ is shown in Figure 2. d The relationship with λ is periodic, according to the collected and calculated V d The change of λ cannot be obtained by the change of λ. Only when the change range of λ is within the half cycle range from the peak to the trough (or from the trough to the peak) of the curve, there is a unique corresponding relationship. Therefore, this method can test the laser frequency drift within this half cycle range.

[0019] Figure 4 This is the second specific embodiment of the present invention, which is a single-frequency laser frequency drift test device with dual wave lockers. When the laser frequency emitted by the single-frequency laser 1 is located at the peak or trough of the spectrum of the first FP cavity 71 in the first wave locker 21, the frequency drift direction cannot be determined, and the second wave locker 22 is added. The second temperature control module 42 controls the spectrum of the second FP cavity 72 in the second wave locker 22 so that the spectrum of the first FP cavity 71 in the first wave locker 21 and the spectrum of the second FP cavity 72 in the second wave locker 22 are staggered by a certain phase, which can solve the problem that the frequency drift direction cannot be determined when the laser frequency drifts to the peak or trough of the FP cavity in the wave locker when measuring the frequency drift of a single wave locker.

[0020] The specific implementation of this embodiment is as follows: The single-frequency laser 1 in the 1550nm band outputs laser light into the coupler 6, and is divided into two beams of light with equal light intensity, one of which enters the first wave locker 21, and the other enters the second wave locker 22. The light entering the first wave locker 21 is divided into a beam of light with a relatively strong light intensity signal by the internal second coupler 62 and enters the first FP cavity 71, and then processed by the first photodetector 8 and then sent to the first AD conversion port 10 of the first synchronous acquisition card 31 for analog-to-digital conversion. The first AD conversion port 10 of the first synchronous acquisition card 31 can collect voltage in real time. , where A1 represents the photoelectric conversion coefficient of the first photodetector 8, C1 represents the coupling coefficient of the optical signal on the transmission path, I0 represents the light intensity incident to the wave locker, and T(λ) represents the variation of the transmittance of the first FP cavity 71 with λ. The transmittance formula of the first FP cavity 71 is , where λ is the wavelength of the light emitted by the single-frequency laser 1, and its change is to be measured, R is the plane reflectivity of the first FP cavity 71, n is the refractive index of the first FP cavity 71, and d is the parallel cavity spacing of the first FP cavity 71. Since the first FP cavity 71 does not change, R and n will not change either, and d will change with the adjustment of the first temperature control module 41. Figure 5 (A) shows an image in which the transmittance formula of the first FP cavity 71 in the first wave lock 21 is 32%, n is 1.45, and d is 0.008m. Another weaker beam of light is processed by the second photodetector 9 and then converted to digital by the second AD conversion port 11 of the first synchronous acquisition card 31. The second AD conversion port 11 of the first synchronous acquisition card 31 can collect electrical , where A2 represents the photoelectric conversion coefficient of the second photodetector 9, C2 represents the coupling coefficient of the optical signal on the transmission path, and I0 represents the light intensity incident on the wave locker. The data collected by the first synchronous acquisition card 31 is input into the data processing module 5, and the voltage value collected by the first AD conversion port 10 is divided by the voltage value collected by the second AD conversion port 11, that is, , the influence of the power fluctuation of the single-frequency laser 1 itself on the frequency drift measurement is eliminated, leaving only the influence of the frequency change. Wherein, A1 represents the photoelectric conversion coefficient of the first photodetector 8, A2 represents the photoelectric conversion coefficient of the second photodetector 9, C1 represents the coupling coefficient of the optical signal on the transmission path, and C2 represents the coupling coefficient of the optical signal on the transmission path.

[0021] The voltage value obtained at time t1 is V d (t1), the voltage value obtained at time t2 is V d (t2), subtracting the two, we get: , In this formula, A1, A2, C1, and C2 are all fixed values ​​(A1 represents the photoelectric conversion coefficient of the first photodetector 8, A2 represents the photoelectric conversion coefficient of the second photodetector 9, C1 represents the coupling coefficient of the optical signal on the transmission path, and C2 represents the coupling coefficient of the optical signal on the transmission path), R, n, and d (R is the plane reflectivity of the first FP cavity 71, n is the refractive index of the first FP cavity 71, and d is the parallel cavity spacing of the first FP cavity 71). Since the first FP cavity 71 used does not change, they are all fixed values. Then, according to the above formula, the change of λ from time t1 to time t2 can be inferred as Δλ=λ(t2)-λ(t1). Then, according to the relationship between laser wavelength and frequency , (C is the speed of light in vacuum, λ is the wavelength of light emitted by the single-frequency laser 1, whose change is to be measured, n is the refractive index of the first FP cavity 71, ν is the frequency of light emitted by the single-frequency laser 1, whose change is to be measured) to obtain the laser frequency change, that is, the frequency drift size Δν.

[0022] If it appears Figure 5 In the case of (A), that is, when the laser emitted by the single-frequency laser 1 is at the peak of the spectrum of the first FP cavity 71 in the first wave locker 21, the frequency drift direction cannot be determined based on the data collected by the data processing module 5, and the second wave locker 22 is required. The second temperature control module 42 is used to control the temperature of the second wave locker 22, that is, to change Where d is the size (λ is the wavelength of the light emitted by the single-frequency laser 1, whose change is to be measured, R is the plane reflectivity of the second FP cavity 72, n is the refractive index of the second FP cavity 72, and d is the parallel cavity spacing of the second FP cavity 72). Figure 5 (B) in the figure shows the transmittance formula of the second FP cavity 72 in the second wave locker 22, where R is 32%, n is 1.45, and d is 0.008111m. λ is the wavelength of the light emitted by the single-frequency laser 1, and its change is to be measured. At this time, the FP cavity spectra in the two wave lockers are staggered by a certain phase, so that when the laser emitted by the single-frequency laser 1 is at the peak of the spectrum of the first FP cavity 71 in the first wave locker 21, the laser is in the hypotenuse linear region of the spectrum of the second FP cavity 72 in the second wave locker 22. The data collected by the second synchronous acquisition card 32 is input into the data processing module 5, and the voltage value collected by the third AD conversion port 101 is divided by the voltage value collected by the fourth AD conversion port 111 to obtain a ratio. The ratio is only related to the wavelength. The direction of the laser frequency drift can be determined by the size of this value, so that the algorithm is designed to obtain the laser frequency drift size according to the frequency drift direction and the voltage difference change of the data processing module 5, thereby expanding the frequency drift test range.

[0023] Figure 6This is an alternative to the second specific embodiment of the present invention, which uses a wave locker and a filter to replace the double wave locker structure. For example, a fiber grating filter is used, and the linear region of the fiber grating filter transmission spectrum can contain multiple peaks and valleys of the FP cavity spectrum in the wave locker, so that the direction of the frequency drift of the single-frequency laser can be distinguished in a larger range. Figure 6 As shown, in Figure 6 The wavelength of the single-frequency laser in (A) is located at the peak of the FP cavity spectrum in the wave locker. Figure 6 In (B), the single-frequency laser wavelength is located in the hypotenuse linear region of the transmission spectrum of the fiber Bragg grating filter. However, the transmission spectrum of the fiber Bragg grating filter is wider than the FP cavity spectrum in the wave locker, and the sensitivity is lower. However, it can also avoid the problem that a wave locker cannot determine the direction of frequency drift.

[0024] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the present invention rather than to limit it. Other modifications or equivalent substitutions made to the technical solution of the present invention by ordinary technicians in the field should be included in the scope of the claims of the present invention as long as they do not depart from the spirit and scope of the technical solution of the present invention.

Claims

1. A single-frequency laser frequency drift test device based on a temperature-controlled wave locker, including a single-frequency laser frequency drift test device with a single wave locker and a single-frequency laser frequency drift test device with a double wave locker, characterized in that: The single-frequency laser frequency drift test device with a single wave lock comprises a single-frequency laser (1), the single-frequency laser (1) is connected to the wave lock (2), the wave lock (2) is connected to a synchronous acquisition card (3) and a temperature control module (4), and the synchronous acquisition card (3) is connected to a data processing module (5); The wave locker (2) comprises a coupler (6), an FP cavity (7), a first photodetector (8) and a second photodetector (9); and the synchronous acquisition card (3) comprises a first AD conversion port (10) and a second AD conversion port (11); The dual-wavelocker single-frequency laser frequency drift test device comprises a single-frequency laser (1), the single-frequency laser (1) is connected to a first coupler (61), the first coupler (61) is connected to a first wavelocker (21) and a second wavelocker (22), the first wavelocker (21) is connected to a first synchronous acquisition card (31) and a first temperature control module (41), the first synchronous acquisition card (31) is connected to a data processing module (5), the second wavelocker (22) is connected to a second synchronous acquisition card (32) and a second temperature control module (42), and the second synchronous acquisition card (32) is connected to the data processing module (5); The first wave locker (21) comprises a second coupler (61), a first FP cavity (71), a first photodetector (8) and a second photodetector (9); the first synchronous acquisition card (31) comprises a first AD conversion port (10) and a second AD conversion port (11); The second wave locker (22) comprises a third coupler (63), a second FP cavity (72), a third photodetector (81) and a fourth photodetector (91); the second synchronous acquisition card (32) comprises a third AD conversion port (101) and a fourth AD conversion port (111); when the laser light emitted by the single-frequency laser (1) is at the peak and valley point of the spectrum of the first FP cavity (71) in the first wave locker (21), and the direction of frequency drift cannot be determined, a second wave locker (22) is added, and the second temperature control module (42) controls the spectrum of the second FP cavity (72) in the second wave locker (22) so that the spectrum of the first FP cavity (71) in the first wave locker (21) and the spectrum of the second FP cavity (72) in the second wave locker (22) are phase-shifted, thereby solving the problem that a wave locker cannot determine the direction of frequency drift.

2. A single-frequency laser frequency drift test method based on a temperature-controlled wave locker, based on the single-frequency laser frequency drift test device based on a temperature-controlled wave locker according to claim 1, characterized in that: The frequency drift test method of a single-frequency laser with a single wave locker comprises the following steps: The single-frequency laser (1) inputs the single-frequency laser into the wave locker (2); the output port of the wave locker (2) comprises a filter output end, i.e., a first photodetector (8), and a reference output end, i.e., a second photodetector (9); the filter output end, i.e., the first photodetector (8) outputs an electrical signal which is connected to a first AD conversion port (10) of a synchronous acquisition card (3) for analog-to-digital conversion, and the reference output end, i.e., the second photodetector (9) outputs an electrical signal which is connected to a second AD conversion port (11) of the synchronous acquisition card (3) for analog-to-digital conversion; the temperature of the wave locker (2) is controlled to a fixed value using a temperature control module (4) in advance, so that the wave locker (2) The spectrum remains stable during the measurement process; the electrical signal value at the filter output end of the wave lock device (2), i.e., the first photodetector (8), will be affected by both the power and frequency of the single-frequency laser (1). In order to eliminate the influence of the power change of the single-frequency laser (1) itself on the frequency drift measurement, the data collected by the synchronous acquisition card (3) is input into the data processing module (5), and the voltage value collected by the first AD conversion port (10) is divided by the voltage value collected by the second AD conversion port (11). This can eliminate the influence of the power fluctuation of the single-frequency laser (1) itself, leaving only the influence of the laser frequency change, and then calculate the magnitude of the frequency drift.

3. A single-frequency laser frequency drift test method based on a temperature-controlled wave locker, based on the single-frequency laser frequency drift test device based on a temperature-controlled wave locker according to claim 1, characterized in that: The frequency drift test method of a single-frequency laser with a double-wave locker includes the following steps: The output laser of a single-frequency laser (1) enters a coupler (6) and is divided into two beams of light with equal light intensity, one of which enters a first wave locker (21) and the other enters a second wave locker (22). The light entering the first wave locker (21) is divided by an internal second coupler (62) into a beam of light with a relatively strong signal, which enters a first FP cavity (71) and is then photoelectrically converted by a first photodetector (8) and then analog-to-digital converted by a first AD conversion port (10) of a first synchronous acquisition card (31). The other weaker light enters a second photodetector (9) and is then photoelectrically converted and then analog-to-digital converted by a second AD conversion port (11) of the first synchronous acquisition card (31). The data is input into the data processing module (5), and the voltage value collected by the first AD conversion port (10) is divided by the voltage value collected by the second AD conversion port (11), so that the influence of the power fluctuation of the single-frequency laser (1) itself can be eliminated, leaving only the influence of the frequency change, and then the magnitude of the frequency drift can be calculated; when the laser frequency of the single-frequency laser (1) drifts to the peak or trough of the spectrum of the first FP cavity (71) in the first wave locker (21), the data obtained by the data processing module (5) cannot determine the direction of the laser frequency drift. At this time, the laser frequency is in the linear region of the spectrum of the second FP cavity (72) in the second wave locker (22), so that the direction of the frequency drift of the single-frequency laser (1) can be determined and the magnitude of the frequency drift can be measured.

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