Space radiation effect evaluation method and device of lithium niobate modulator

Abstract

The invention relates to a space radiation effect evaluation method and device of a lithium niobate modulator. The method comprises the following steps: forming a lithium niobate modulator for space radiation effect evaluation through a lithium niobate crystal, an electrode, a tail fiber, a UV (Ultraviolet) adhesive and a shell; sequentially carrying out device crystal material performance tests on the lithium niobate modulator before irradiation and the lithium niobate modulator after irradiation, and determining the device crystal material performance change condition of the space radiation effect evaluation; and analyzing the radiation effect type of the space radiation effect evaluation according to the performance change condition of the device crystal material. According to the method, the radiation effect test can be performed according to the characteristics of the lithium niobate modulator, the radiation effect type of the lithium niobate modulator can be analyzed according to the test result of the performance test of the device crystal material, and the radiation damage of the device can be evaluated according to different radiation effect types.

Description

Technical Field

[0001] The present invention relates to the technical field of space radiation effect testing, and more specifically, to a method and device for evaluating space radiation effect of a lithium niobate modulator. Background Art

[0002] Lithium niobate (LN) modulator is an optoelectronic device whose function is to change the characteristics of light passing through it, such as phase, amplitude or polarization, through the electro-optic effect. Lithium niobate modulators have been used in ground communication systems to achieve high-speed data transmission. They also have important application value in future fields such as space communications. Lithium niobate modulators can also be used in systems for other space missions such as fiber optic gyroscopes FOG, resonators, and electro-optic switches. As a core component of space optical communication systems, lithium niobate modulators can achieve high-speed modulation of transmission signals, but space laser communication satellites need to face complex space environments, especially space radiation environments, which have serious impacts on laser communication missions. The stability and service life of lithium niobate modulators under radiation conditions directly affect the efficiency of space laser communications.

[0003] Current research mainly focuses on the impact on the radiation performance of lithium niobate crystals. There are many experimental studies on the radiation of lithium niobate crystals, but most of them are limited to the impact of radiation on the optical properties of the crystals. There is no specific test method for the radiation performance of lithium niobate crystals. Therefore, in view of the widespread demand for lithium niobate modulators in space applications in the future, it is necessary to establish a radiation effect evaluation method for lithium niobate modulators.

[0004] To this end, the present application designs a method for evaluating the space radiation effect of a lithium niobate modulator, which can be used to evaluate the radiation effect of a lithium niobate modulator in space applications. Summary of the invention

[0005] The embodiments of the present application provide a method and device for evaluating the spatial radiation effect of a lithium niobate modulator. In order to have a basic understanding of some aspects of the disclosed embodiments, a simple summary is given below. This summary is not a general review, nor is it intended to identify key / important components or describe the scope of protection of these embodiments. Its only purpose is to present some concepts in a simple form as a preface to the detailed description that follows.

[0006] In a first aspect, the present application provides a method for evaluating the spatial radiation effect of a lithium niobate modulator, the method comprising:

[0007] The lithium niobate modulator, which is composed of lithium niobate crystal, electrode, pigtail, UV glue and shell, is evaluated for space radiation effect;

[0008] Performing device crystal material performance tests on the lithium niobate modulator before irradiation and the lithium niobate modulator after irradiation in turn to determine the changes in device crystal material performance for the space radiation effect assessment;

[0009] According to the change in the performance of the device crystal material, the radiation effect type of the space radiation effect assessment is analyzed.

[0010] According to a preferred embodiment, the electrodes and the pigtail of the lithium niobate modulator are shielded during irradiation.

[0011] According to a preferred embodiment, the device crystal material performance test is performed on the lithium niobate modulator before irradiation and the lithium niobate modulator after irradiation in sequence to determine the change in the device crystal material performance for the space radiation effect evaluation, including:

[0012] Using a half-wave voltage test method, an eye diagram test method, and a loss test method, the device crystal material performance test is performed on the lithium niobate modulator before irradiation and the lithium niobate modulator after irradiation in turn to determine the refractive index change of the lithium niobate crystal and the transmittance change of the lithium niobate crystal for the spatial radiation effect evaluation;

[0013] The refractive index change of the lithium niobate crystal and the transmittance change of the lithium niobate crystal are used as the performance change of the device crystal material for evaluating the space radiation effect.

[0014] According to a preferred embodiment, analyzing the radiation effect type of the spatial radiation effect evaluation according to the change in the performance of the device crystal material includes:

[0015] When the change in the performance of the device crystal material is a change in the refractive index of the lithium niobate crystal, the radiation effect type of the spatial radiation effect assessment is a displacement damage radiation effect;

[0016] When the change in the device crystal material performance is a change in the transmittance of the lithium niobate crystal, the radiation effect type of the space radiation effect assessment is an ionization damage effect.

[0017] According to a preferred embodiment, it also includes:

[0018] According to the radiation effect type, the radiation damage of the device evaluated by the space radiation effect is evaluated.

[0019] In a second aspect, the present application provides a device for evaluating the spatial radiation effect of a lithium niobate modulator, the device comprising:

[0020] The device component module is used to evaluate the spatial radiation effect of a lithium niobate modulator composed of a lithium niobate crystal, an electrode, a pigtail, a UV adhesive and a shell;

[0021] A performance testing module, used to perform device crystal material performance tests on the lithium niobate modulator before irradiation and after irradiation in sequence, to determine the performance changes of the device crystal material for the space radiation effect evaluation;

[0022] The type analysis module is used to analyze the radiation effect type of the spatial radiation effect assessment according to the change in the performance of the device crystal material.

[0023] According to a preferred embodiment, the electrodes and the pigtail of the lithium niobate modulator are shielded during irradiation.

[0024] According to a preferred embodiment, the performance testing module is specifically used for:

[0025] Using a half-wave voltage test method, an eye diagram test method, and a loss test method, the device crystal material performance test is performed on the lithium niobate modulator before irradiation and the lithium niobate modulator after irradiation in turn to determine the refractive index change of the lithium niobate crystal and the transmittance change of the lithium niobate crystal for the spatial radiation effect evaluation;

[0026] The refractive index change of the lithium niobate crystal and the transmittance change of the lithium niobate crystal are used as the performance change of the device crystal material for evaluating the space radiation effect.

[0027] According to a preferred embodiment, the type analysis module includes:

[0028] When the change in the performance of the device crystal material is a change in the refractive index of the lithium niobate crystal, the radiation effect type of the spatial radiation effect assessment is a displacement damage radiation effect;

[0029] When the change in the device crystal material performance is a change in the transmittance of the lithium niobate crystal, the radiation effect type of the space radiation effect assessment is an ionization damage effect.

[0030] According to a preferred embodiment, it also includes:

[0031] The damage evaluation module is used to evaluate the radiation damage of the device in the space radiation effect assessment according to the radiation effect type.

[0032] In a third aspect, the present application provides a computer storage medium, which stores a plurality of instructions, and the instructions are suitable for being loaded by a processor and executing the above-mentioned method steps.

[0033] In a fourth aspect, the present application provides a terminal, which may include: a processor and a memory; wherein the memory stores a computer program, and the computer program is suitable for being loaded by the processor and executing the above-mentioned method steps.

[0034] The technical solution provided by this application may have the following beneficial effects:

[0035] In the present application, the method for evaluating the spatial radiation effect of the lithium niobate modulator firstly forms a lithium niobate modulator for evaluating the spatial radiation effect through a lithium niobate crystal, an electrode, a pigtail, a UV ultraviolet glue and a shell; then, the device crystal material performance test is performed on the lithium niobate modulator before irradiation and the lithium niobate modulator after irradiation in turn to determine the change in the device crystal material performance for the spatial radiation effect evaluation; finally, the radiation effect type for the spatial radiation effect evaluation is analyzed based on the change in the device crystal material performance. The present application can perform radiation effect tests based on the characteristics of the lithium niobate modulator, and realize the radiation effect evaluation of the lithium niobate modulator through the test results of the device crystal material performance test; through the device crystal material performance test, the radiation effect type of the lithium niobate modulator can be analyzed, and the radiation damage of the device can be evaluated based on different radiation effect types.

[0036] It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0038] Figure 1 It is a flow chart of a method for evaluating the spatial radiation effect of a lithium niobate modulator provided in an embodiment of the present application;

[0039] Figure 2 It is a schematic diagram of a half-wave voltage test result of a lithium niobate modulator according to a method for evaluating the spatial radiation effect of a lithium niobate modulator provided in an embodiment of the present application;

[0040] Figure 3 It is a schematic diagram of a half-wave voltage test of a lithium niobate modulator according to a method for evaluating the spatial radiation effect of a lithium niobate modulator provided in an embodiment of the present application;

[0041] Figure 4 It is a schematic diagram of an eye diagram test of a lithium niobate modulator according to a method for evaluating the spatial radiation effect of a lithium niobate modulator provided in an embodiment of the present application;

[0042] Figure 5 It is a schematic diagram of loss test of a lithium niobate modulator according to a method for evaluating the spatial radiation effect of a lithium niobate modulator provided in an embodiment of the present application;

[0043] Figure 6 It is a schematic diagram of a device for evaluating the spatial radiation effect of a lithium niobate modulator provided in an embodiment of the present application;

[0044] Figure 7 This is a terminal schematic diagram provided in an embodiment of the present application.

[0045] Reference numerals:

[0046] 10000, device composition module, 20000, performance test module, 30000, type analysis module, 40000, damage evaluation module;

[0047] 1001. Processor, 1002. Communication bus, 1003. User interface, 1004. Network interface, 1005. Memory. DETAILED DESCRIPTION

[0048] The following description and the drawings sufficiently illustrate specific embodiments of the invention to enable those skilled in the art to practice them.

[0049] It should be clear that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0050] When the following description refers to the drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present invention. Instead, they are only examples of systems and methods consistent with some aspects of the present invention as detailed in the attached claims.

[0051] In the description of the present invention, it should be understood that the terms "first", "second", etc. are only used for descriptive purposes and cannot be understood as indicating or implying relative importance. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances. In addition, in the description of the present invention, unless otherwise specified, "plurality" refers to two or more. "And / or" describes the association relationship of associated objects, indicating that three relationships may exist. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. The character " / " generally indicates that the previously associated objects are in an "or" relationship.

[0052] The following will be combined with the attached Figure 1 -Attached Figure 5 , a method for evaluating the spatial radiation effect of a lithium niobate modulator provided in an embodiment of the present application is introduced in detail.

[0053] See also Figure 1-5 The method of the embodiment of the present application may include the following steps:

[0054] The present application provides a method for evaluating the spatial radiation effect of a lithium niobate modulator, and a corresponding radiation effect analysis method is formulated for the lithium niobate modulator. The method includes the characteristic parameter test of the lithium niobate modulator and its characterization method; based on the optoelectronic characteristics of the lithium niobate crystal, the modulation of the optoelectronic signal is realized, and the modulation performance of the lithium niobate modulator is tested by testing the refractive index of the lithium niobate crystal and the half-wave voltage and extinction ratio of the lithium niobate modulator. The absorption performance of the lithium niobate modulator is tested by testing the absorptivity of the lithium niobate crystal and the loss of the lithium niobate modulator, which is used to evaluate the radiation effect of the lithium niobate modulator and provide support for the subsequent space application and radiation effect evaluation of optoelectronic devices.

[0055] S100, a lithium niobate modulator for space radiation effect evaluation is composed of a lithium niobate crystal, an electrode, a pigtail, UV glue and a shell; wherein the electrode is used to apply an electric field to the lithium niobate crystal, the pigtail is used for the input and output of optical signals, the UV glue is used to fix and connect the lithium niobate crystal and the pigtail, the shell is used to fix and protect the internal components of the lithium niobate modulator, and the lithium niobate crystal realizes the photoelectric conversion and modulation of the optical signal through the electro-optical effect. Therefore, in the evaluation of the radiation effect of the lithium niobate modulator, the focus is on the evaluation of the spatial radiation effect of the lithium niobate modulator through the performance evaluation of the lithium niobate crystal.

[0056] S200, testing the device crystal material performance of the lithium niobate modulator before irradiation and the lithium niobate modulator after irradiation in sequence to determine the change in the device crystal material performance for the space radiation effect assessment, including:

[0057] The device crystal material performance test is performed on the lithium niobate modulator before irradiation and after irradiation in turn using a half-wave voltage test method, an eye diagram test method, and a loss test method to determine the change in the refractive index of the lithium niobate crystal and the change in the transmittance of the lithium niobate crystal for the spatial radiation effect evaluation; wherein the electrode and the pigtail of the lithium niobate modulator are shielded during irradiation. The change in the refractive index of the lithium niobate crystal and the change in the transmittance of the lithium niobate crystal are used as the change in the device crystal material performance for the spatial radiation effect evaluation.

[0058] In the embodiments of the present application, the loss, eye diagram and extinction ratio tests of the lithium niobate modulator are used to evaluate the radiation effect of the lithium niobate modulator, and the lithium niobate modulator is irradiated on the ground using radiation simulation sources such as gamma, high-energy electrons, neutrons and protons.

[0059] For the lithium niobate crystal of the lithium niobate modulator, the performance of the lithium niobate crystal can be tested by measuring the transmittance of the lithium niobate crystal and the refractive index of the lithium niobate crystal; by comparing the test results before irradiation with the test results after irradiation, the change in the refractive index of the lithium niobate crystal and the change in the transmittance of the lithium niobate crystal can be determined. The irradiation and testing process of the embodiment of the present application is as follows:

[0060] Firstly, the loss, eye diagram and extinction ratio tests were carried out on the lithium niobate modulator before irradiation to obtain the pre-irradiation test results;

[0061] Then, the lithium niobate modulator is subjected to an irradiation test. During the irradiation test, shielding equipment is used to shield other components of the lithium niobate modulator, namely, electrodes and pigtails, and the lithium niobate crystal part is irradiated;

[0062] Finally, the loss, eye diagram and extinction ratio of the lithium niobate modulator after irradiation were tested again to obtain the test results after irradiation.

[0063] In the embodiment of the present application, when performing loss, eye diagram and extinction ratio tests on the lithium niobate modulator, the test methods used include: half-wave voltage test method, eye diagram test method and loss test method. The extinction ratio test is a test performed using the half-wave voltage test method. The lithium niobate modulator is also called a lithium niobate intensity modulator.

[0064] Among them, the half-wave voltage test method: For the half-wave voltage test of the lithium niobate intensity modulator, a sawtooth voltage signal is loaded on an interference arm of the lithium niobate intensity modulator, which can avoid the influence of random phase changes caused by external factors such as temperature changes and vibrations. Use an electronic oscilloscope to track the sawtooth voltage signal and the output light signal at the same time. By comparing the periods of the two signals, the half-wave voltage can be calculated.

[0065] Assuming that a sawtooth voltage signal with a period of T1 is loaded on the lithium niobate intensity modulator, and the period of the output sinusoidal signal is T2, the electronic oscilloscope can detect the following: Figure 2 The signal shown, Figure 2 Where V represents sawtooth voltage and T represents time. The half-wave voltage Vπ can be calculated by formula (1):

[0066]

[0067] in, in is the maximum value of the sawtooth voltage, is the minimum value of the sawtooth voltage.

[0068] The half-wave voltage test is as follows: Figure 3As shown in the experiment, the 1550nm wavelength laser output by the tunable laser is first amplified by the erbium-doped fiber amplifier EDFA, then processed by the polarization controller PC, and then coupled to the chip of the lithium niobate modulator. The 10khz continuous triangle wave signal generated by the low-speed arbitrary wave generator AWG is applied to the lithium niobate modulator. The output of the lithium niobate modulator is detected by the photodetector PD through the bandpass filter output light signal, and directed to the electronic oscilloscope OSC to measure the half-wave voltage Vπ.

[0069] Eye diagram test method: The eye diagram is an experimental tool for evaluating channel noise and inter-symbol interference. The eye diagram displays the received digital signal. Under many different coding systems, the eye diagram will overlap all possible changes within a specific time on a screen. In the baseband square wave modulation system, it looks like several eyes side by side. It is a reflection of the comprehensive performance of the lithium niobate modulator on signal transmission. Through the eye diagram, it can be seen that the signal is too long or too short, the synchronization with the clock pulse is not good, the signal voltage is too high or too low, there is too much noise, the change is too slow, or there is overshoot or undershoot. The larger the "eye" part of the eye diagram, the smaller the amplitude of the signal distortion. If the signal distortion is caused by noise or inter-symbol interference, the "eye" part of the eye diagram will become smaller. The eye diagram test of lithium niobate modulator is as follows: Figure 4 As shown in the figure, during the test, the optical signal output by the tunable laser with a wavelength of 1550nm is first amplified by the erbium-doped fiber amplifier EDFA, then the polarization state is adjusted by the polarization controller PC, and then coupled to the chip of the lithium niobate modulator. The high-speed arbitrary waveform generator AWG generates a high-frequency electrical signal and applies it to the electrical input end of the lithium niobate modulator. The optical signal output by the lithium niobate modulator is filtered by the bandpass filter BPF, converted into an electrical signal by the photodetector PD, and transmitted to the high-speed oscilloscope OSC for displaying and analyzing the eye diagram.

[0070] Loss test method: The difference between the light intensity emitted from the laser diode as the input light intensity and the output light intensity of the lithium niobate modulator represents the loss. The loss Ls is:

[0071]

[0072] I represents the light intensity of the modulated wave. At this time, the modulation signal applied is between zero and maximum. The light intensity when no modulation wave is applied is I0; the light intensity when the modulation signal is maximum is represented by Im, and Iin is the input light intensity, expressed in dB.

[0073] The loss test of lithium niobate modulator is as follows: Figure 5As shown in the figure, during the test, a wide spectrum light source is used as the signal source input of the lithium niobate modulator, and the voltage source provides a stable voltage for the lithium niobate modulator. After the polarization state of the optical signal is adjusted by the polarization controller PC, it is coupled to the input end of the lithium niobate modulator. The output end of the lithium niobate modulator is connected to the optical spectrum analyzer OSA to measure the modulated optical power spectrum and calculate the loss.

[0074] The embodiment of the present application can be carried out through an online test method or an offline test method, and the performance change of the device crystal material is analyzed after the test. The key parameters of the lithium niobate modulator, including loss, eye diagram, and half-wave voltage, are tested. The change in loss is directly related to the change in the transmittance of the lithium niobate crystal in the working band of the lithium niobate modulator, and the change in the eye diagram and half-wave voltage is directly related to the change in the refractive index of the lithium niobate crystal of the lithium niobate modulator.

[0075] The embodiment of the present application can evaluate the radiation effect of the lithium niobate modulator by testing the change of the refractive index of the lithium niobate crystal and the change of the transmittance of the lithium niobate crystal.

[0076] S300, analyzing the radiation effect type of the space radiation effect assessment according to the change in the performance of the device crystal material, including:

[0077] The core component of the lithium niobate modulator of the embodiment of the present application is the lithium niobate crystal, which belongs to the optoelectronic material. Therefore, the embodiment of the present application may mainly cause the total dose effect and the displacement damage radiation effect. The embodiment of the present application analyzes the radiation effect of the lithium niobate modulator caused by high-energy particles according to the change in the performance of the device crystal material. When the change in the performance of the device crystal material is the change in the refractive index of the lithium niobate crystal, the radiation effect type of the spatial radiation effect evaluation is the displacement damage radiation effect; when the change in the performance of the device crystal material is the change in the transmittance of the lithium niobate crystal, the radiation effect type of the spatial radiation effect evaluation is the ionization damage effect. If the transmittance of the lithium niobate crystal decreases, it is a total dose effect.

[0078] The method described in the embodiment of the present application further includes:

[0079] According to the radiation effect type, the radiation damage of the device evaluated by the space radiation effect is evaluated.

[0080] In the embodiments of the present application, due to the influence of irradiation, ionization damage effect or displacement damage radiation effect may occur in the lithium niobate crystal. Since the transmittance of lithium niobate crystal is mainly affected by factors such as impurities, the device radiation damage caused by the ionization damage effect is: the lithium niobate crystal is doped with impurities and impurity ionization, etc., which has little effect on the main structure of the lithium niobate modulator; since the refractive index of the lithium niobate crystal is mainly affected by the lithium niobate crystal structure, the device radiation damage caused by the displacement damage radiation effect is that the lithium niobate crystal structure changes, resulting in changes in the modulation performance of the lithium niobate modulator.

[0081] At this point, the embodiments of the present application have achieved the evaluation of the radiation effect type of the lithium niobate modulator by testing the transmittance of the lithium niobate crystal and the change of the refractive index of the lithium niobate crystal before and after irradiation, thereby realizing the evaluation of the lithium niobate modulator, and then the possible radiation damage of the device corresponding to the lithium niobate modulator can be reinforced.

[0082] In an embodiment of the present application, the method for evaluating the spatial radiation effect of the lithium niobate modulator first comprises: firstly, a lithium niobate crystal, an electrode, a pigtail, a UV ultraviolet glue and a shell are used to form a lithium niobate modulator for evaluating the spatial radiation effect; then, the device crystal material performance test is performed on the lithium niobate modulator before irradiation and the lithium niobate modulator after irradiation in turn to determine the change in the device crystal material performance for the spatial radiation effect evaluation; finally, the radiation effect type for the spatial radiation effect evaluation is analyzed based on the change in the device crystal material performance. The present application can perform radiation effect tests based on the characteristics of the lithium niobate modulator, and realize the radiation effect evaluation of the lithium niobate modulator through the test results of the device crystal material performance test; through the device crystal material performance test, the radiation effect type of the lithium niobate modulator can be analyzed, and the radiation damage of the device can be evaluated based on the different radiation effect types.

[0083] The following are embodiments of the device of the present invention, which can be used to implement the method embodiments of the present invention. For details not disclosed in the device embodiments of the present invention, please refer to the method embodiments of the present invention.

[0084] See also Figure 6 , which shows a schematic diagram of the structure of a spatial radiation effect evaluation device for a lithium niobate modulator provided by an exemplary embodiment of the present invention. The device includes: a device composition module 10000, a performance test module 20000, a type analysis module 30000 and a damage evaluation module 40000.

[0085] Device component module 10000, used for evaluating the spatial radiation effect of a lithium niobate modulator composed of a lithium niobate crystal, an electrode, a pigtail, a UV adhesive and a shell;

[0086] The performance test module 20000 is used to test the device crystal material performance of the lithium niobate modulator before irradiation and after irradiation in turn, so as to determine the change of the device crystal material performance for the space radiation effect evaluation;

[0087] The type analysis module 30000 is used to analyze the radiation effect type of the spatial radiation effect assessment according to the change in the performance of the device crystal material.

[0088] According to a preferred embodiment, the electrodes and the pigtail of the lithium niobate modulator are shielded during irradiation.

[0089] According to a preferred embodiment, the performance testing module 20000 is specifically used for:

[0090] Using a half-wave voltage test method, an eye diagram test method, and a loss test method, the device crystal material performance test is performed on the lithium niobate modulator before irradiation and the lithium niobate modulator after irradiation in turn to determine the refractive index change of the lithium niobate crystal and the transmittance change of the lithium niobate crystal for the spatial radiation effect evaluation;

[0091] The refractive index change of the lithium niobate crystal and the transmittance change of the lithium niobate crystal are used as the performance change of the device crystal material for evaluating the space radiation effect.

[0092] According to a preferred embodiment, the type analysis module 30000 includes:

[0093] When the change in the performance of the device crystal material is a change in the refractive index of the lithium niobate crystal, the radiation effect type of the spatial radiation effect assessment is a displacement damage radiation effect;

[0094] When the change in the device crystal material performance is a change in the transmittance of the lithium niobate crystal, the radiation effect type of the space radiation effect assessment is an ionization damage effect.

[0095] According to a preferred embodiment, it also includes:

[0096] The damage evaluation module 40000 is used to evaluate the radiation damage of the device in the space radiation effect assessment according to the radiation effect type.

[0097] It should be noted that the spatial radiation effect evaluation device of the lithium niobate modulator provided in the above embodiment only uses the division of the above functional modules as an example when executing the spatial radiation effect evaluation method of the lithium niobate modulator. In actual applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above. In addition, the spatial radiation effect evaluation device of the lithium niobate modulator provided in the above embodiment and the spatial radiation effect evaluation method embodiment of the lithium niobate modulator belong to the same concept. The implementation process is detailed in the method embodiment, which will not be repeated here.

[0098] In the embodiment of the present application, the spatial radiation effect evaluation device of the lithium niobate modulator firstly forms a lithium niobate modulator for spatial radiation effect evaluation through a lithium niobate crystal, an electrode, a pigtail, a UV ultraviolet glue and a shell; then, the device crystal material performance test is performed on the lithium niobate modulator before irradiation and the lithium niobate modulator after irradiation in turn to determine the change in the device crystal material performance of the spatial radiation effect evaluation; finally, according to the change in the device crystal material performance, the radiation effect type of the spatial radiation effect evaluation is analyzed. The present application can perform radiation effect tests according to the characteristics of the lithium niobate modulator, and realize the radiation effect evaluation of the lithium niobate modulator through the test results of the device crystal material performance test; through the device crystal material performance test, the radiation effect type of the lithium niobate modulator can be analyzed, and according to different radiation effect types, the radiation damage of the device can be evaluated.

[0099] The present invention also provides a computer-readable medium having program instructions stored thereon, and when the program instructions are executed by a processor, the spatial radiation effect evaluation method of the lithium niobate modulator provided by the above-mentioned various method embodiments is implemented.

[0100] The present invention also provides a computer program product comprising instructions, which, when executed on a computer, enables the computer to execute the spatial radiation effect evaluation method of the lithium niobate modulator of each of the above method embodiments.

[0101] See also Figure 7 , which is a schematic diagram of the structure of a terminal according to an embodiment of the present application. The terminal may include: at least one processor 1001, at least one network interface 1004, a user interface 1003, a memory 1005, and at least one communication bus 1002.

[0102] The communication bus 1002 is used to realize the connection and communication between these components.

[0103] The user interface 1003 may include a display screen (Display) and a camera (Camera), and the optional user interface 1003 may also include a standard wired interface and a wireless interface.

[0104] The network interface 1004 may optionally include a standard wired interface or a wireless interface (such as a WI-FI interface).

[0105] Among them, the processor 1001 may include one or more processing cores. The processor 1001 uses various interfaces and lines to connect various parts in the entire terminal, and executes various functions of the terminal and processes data by running or executing instructions, programs, code sets or instruction sets stored in the memory 1005, and calling data stored in the memory 1005. Optionally, the processor 1001 can be implemented in at least one hardware form of digital signal processing (Digital Signal Processing, DSP), field programmable gate array (Field-Programmable Gate Array, FPGA), and programmable logic array (Programmable Logic Array, PLA). The processor 1001 can integrate one or a combination of a central processing unit (Central Processing Unit, CPU), a graphics processing unit (Graphics Processing Unit, GPU) and a modem. Among them, the CPU mainly processes the operating system, user interface and application programs; the GPU is responsible for rendering and drawing the content to be displayed on the display screen; the modem is used to process wireless communications. It can be understood that the above-mentioned modem may not be integrated into the processor 1001, and it can be implemented separately through a chip.

[0106] Among them, the memory 1005 may include a random access memory (Random Access Memory, RAM) and may also include a read-only memory (Read-Only Memory). Optionally, the memory 1005 includes a non-transitory computer-readable storage medium. The memory 1005 can be used to store instructions, programs, codes, code sets or instruction sets. The memory 1005 may include a program storage area and a data storage area, wherein the program storage area may store instructions for implementing an operating system, instructions for at least one function (such as a touch function, a sound playback function, an image playback function, etc.), instructions for implementing the above-mentioned various method embodiments, etc.; the data storage area may store data involved in the above-mentioned various method embodiments, etc. The memory 1005 may optionally be at least one storage device located away from the aforementioned processor 1001. As Figure 7 As shown, the memory 1005 as a computer storage medium may include an operating system, a network communication module, a user interface module, and an application for evaluating the spatial radiation effects of a lithium niobate modulator.

[0107] exist Figure 7 In the terminal shown, the user interface 1003 is mainly used to provide an input interface for the user and obtain the data input by the user; and the processor 1001 can be used to call the spatial radiation effect evaluation application of the lithium niobate modulator stored in the memory 1005, and specifically perform the following operations:

[0108] The lithium niobate modulator, which is composed of lithium niobate crystal, electrode, pigtail, UV glue and shell, is evaluated for space radiation effect;

[0109] The device crystal material performance test is performed on the lithium niobate modulator before irradiation and the lithium niobate modulator after irradiation in turn to determine the change in the device crystal material performance for the space radiation effect evaluation; during irradiation, the electrode and the pigtail of the lithium niobate modulator have been shielded;

[0110] Analyzing the radiation effect type of the space radiation effect assessment according to the change in the performance of the device crystal material;

[0111] According to the radiation effect type, the radiation damage of the device evaluated by the space radiation effect is evaluated.

[0112] In one embodiment, the processor 1001 performs the following operations when performing the device crystal material performance test on the lithium niobate modulator before irradiation and the lithium niobate modulator after irradiation in sequence to determine the change in the device crystal material performance of the space radiation effect evaluation:

[0113] Using a half-wave voltage test method, an eye diagram test method, and a loss test method, the device crystal material performance test is performed on the lithium niobate modulator before irradiation and the lithium niobate modulator after irradiation in turn to determine the refractive index change of the lithium niobate crystal and the transmittance change of the lithium niobate crystal for the spatial radiation effect evaluation;

[0114] The refractive index change of the lithium niobate crystal and the transmittance change of the lithium niobate crystal are used as the performance change of the device crystal material for evaluating the space radiation effect.

[0115] In one embodiment, when the processor 1001 performs the analysis of the radiation effect type of the spatial radiation effect evaluation according to the change in the performance of the device crystal material, the processor 1001 specifically performs the following operations:

[0116] When the change in the performance of the device crystal material is a change in the refractive index of the lithium niobate crystal, the radiation effect type of the spatial radiation effect assessment is a displacement damage radiation effect;

[0117] When the change in the device crystal material performance is a change in the transmittance of the lithium niobate crystal, the radiation effect type of the space radiation effect assessment is an ionization damage effect.

[0118] In the embodiment of the present application, the method and device for evaluating the spatial radiation effect of the lithium niobate modulator firstly composes the lithium niobate modulator for evaluating the spatial radiation effect through the lithium niobate crystal, electrode, pigtail, UV ultraviolet glue and shell; then the device crystal material performance test is carried out on the lithium niobate modulator before irradiation and the lithium niobate modulator after irradiation in turn to determine the change of the device crystal material performance for evaluating the spatial radiation effect; finally, the radiation effect type for evaluating the spatial radiation effect is analyzed according to the change of the device crystal material performance. The present application can carry out radiation effect test according to the characteristics of the lithium niobate modulator, and realize the radiation effect evaluation of the lithium niobate modulator through the test results of the device crystal material performance test; through the device crystal material performance test, the radiation effect type of the lithium niobate modulator can be analyzed, and the radiation damage of the device can be evaluated according to the different radiation effect types.

[0119] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiments can be implemented by instructing related hardware through a computer program, and the program can be stored in a computer-readable storage medium, and when the program is executed, it can include the processes of the embodiments of the above-mentioned methods. The storage medium can be a disk, an optical disk, a read-only storage memory, or a random access memory, etc.

[0120] The above disclosure is only the preferred embodiment of the present application, which certainly cannot be used to limit the scope of rights of the present application. Therefore, equivalent changes made according to the claims of the present application are still within the scope covered by the present application.

Claims

1. A method for evaluating the spatial radiation effect of a lithium niobate modulator, characterized in that: The following steps are involved: The lithium niobate modulator, which is composed of lithium niobate crystal, electrode, pigtail, UV glue and shell, is evaluated for space radiation effect; Performing device crystal material performance tests on the lithium niobate modulator before irradiation and the lithium niobate modulator after irradiation in turn to determine the changes in device crystal material performance for the space radiation effect assessment; According to the change in the performance of the device crystal material, the radiation effect type of the space radiation effect assessment is analyzed.

2. The method for evaluating the spatial radiation effect of a lithium niobate modulator according to claim 1, characterized in that: During irradiation, the electrodes and the pigtail of the lithium niobate modulator were shielded.

3. The method for evaluating the spatial radiation effect of a lithium niobate modulator according to claim 1, characterized in that: The device crystal material performance test is performed on the lithium niobate modulator before irradiation and the lithium niobate modulator after irradiation in sequence to determine the change in the device crystal material performance of the space radiation effect evaluation, including: Using a half-wave voltage test method, an eye diagram test method, and a loss test method, the device crystal material performance test is performed on the lithium niobate modulator before irradiation and the lithium niobate modulator after irradiation in turn to determine the refractive index change of the lithium niobate crystal and the transmittance change of the lithium niobate crystal for the spatial radiation effect evaluation; The refractive index change of the lithium niobate crystal and the transmittance change of the lithium niobate crystal are used as the performance change of the device crystal material for evaluating the space radiation effect.

4. The method for evaluating the spatial radiation effect of a lithium niobate modulator according to claim 3, characterized in that: The analyzing the radiation effect type of the space radiation effect evaluation according to the change in the performance of the device crystal material includes: When the change in the performance of the device crystal material is a change in the refractive index of the lithium niobate crystal, the radiation effect type of the spatial radiation effect assessment is a displacement damage radiation effect; When the change in the device crystal material performance is a change in the transmittance of the lithium niobate crystal, the radiation effect type of the space radiation effect assessment is an ionization damage effect.

5. The method for evaluating the spatial radiation effect of a lithium niobate modulator according to claim 1, characterized in that: Furthermore, it also includes: According to the radiation effect type, the radiation damage of the device evaluated by the space radiation effect is evaluated.

6. A device for evaluating the spatial radiation effect of a lithium niobate modulator, characterized in that: include: The device component module is used to evaluate the spatial radiation effect of a lithium niobate modulator composed of a lithium niobate crystal, an electrode, a pigtail, a UV adhesive and a shell; A performance testing module, used to perform device crystal material performance tests on the lithium niobate modulator before irradiation and after irradiation in sequence, to determine the performance changes of the device crystal material for the space radiation effect evaluation; The type analysis module is used to analyze the radiation effect type of the spatial radiation effect assessment according to the change in the performance of the device crystal material.

7. The spatial radiation effect evaluation device of the lithium niobate modulator according to claim 6, characterized in that: During irradiation, the electrodes and the pigtail of the lithium niobate modulator were shielded.

8. The spatial radiation effect evaluation device of the lithium niobate modulator according to claim 6, characterized in that: The performance testing module is specifically used for: Using a half-wave voltage test method, an eye diagram test method, and a loss test method, the device crystal material performance test is performed on the lithium niobate modulator before irradiation and the lithium niobate modulator after irradiation in turn to determine the refractive index change of the lithium niobate crystal and the transmittance change of the lithium niobate crystal for the spatial radiation effect evaluation; The refractive index change of the lithium niobate crystal and the transmittance change of the lithium niobate crystal are used as the performance change of the device crystal material for evaluating the space radiation effect.

9. The spatial radiation effect evaluation device of the lithium niobate modulator according to claim 8, characterized in that: The type analysis module includes: When the change in the performance of the device crystal material is a change in the refractive index of the lithium niobate crystal, the radiation effect type of the spatial radiation effect assessment is a displacement damage radiation effect; When the change in the device crystal material performance is a change in the transmittance of the lithium niobate crystal, the radiation effect type of the space radiation effect assessment is an ionization damage effect.

10. The spatial radiation effect evaluation device of the lithium niobate modulator according to claim 6, characterized in that: Furthermore, it also includes: The damage evaluation module is used to evaluate the radiation damage of the device in the space radiation effect assessment according to the radiation effect type.

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