Method, system, electronic device and computer-readable storage medium for analyzing polarized image information

By simulating the optical path and color conversion method, the problem of quantitative analysis of polarized light images was solved, accurate analysis of polarized images was achieved, and the imaging quality and accuracy of material property research were improved.

CN119804344BActive Publication Date: 2025-09-23XI AN JIAOTONG UNIV +1
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Patent Information

Application Number
CN202411891330.4
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2024-12-20
Publication Date
2025-09-23
Estimated Expiration
2044-12-20

AI Technical Summary

Technical Problem

Existing technologies lack methods for quantitatively analyzing polarized light images and are unable to effectively account for the light source, sample absorption/emission, and additional phase delays in the optical path, resulting in poor polarized image quality and impacting material property research and display device design.

Method used

By simulating the actual light path, taking into account the radiation spectrum of the light source, the absorption/emission of the sample and the additional phase delay, the CIE1931 color matching equation is used to convert to the sRGB color gamut. Combined with the Laplace differential equation to describe the molecular arrangement of the target object, the polarized light intensity-wavelength spectrum is calculated and the color conversion is performed.

Benefits of technology

It realizes the quantitative analysis of polarized images, improves the imaging quality and the accuracy of material property research, can accurately reflect the intrinsic characteristics of the material, and is suitable for the optical property research of polymer/liquid crystal materials and display device design.

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Abstract

The present invention discloses a method for analyzing polarized image information, a system, an electronic device, and a computer-readable storage medium. These methods, which fall within the field of optics, primarily target materials exhibiting birefringence. By comprehensively considering all factors, including the light source, material absorption / emission, birefringence, and the provision of additional optical path difference devices in the optical path, the method reproduces the sample's color and texture, revealing the material's optical properties and molecular arrangement characteristics. These methods, including optical index, birefringence, color, and molecular director distribution, provide quantitative analysis tools for polymer crystallization / orientation, liquid crystal texture analysis, and biofilm analysis. These methods can be applied to material microstructure and performance studies, including analysis of color distortion caused by design flaws in liquid crystal displays, liquid crystal spatial light modulators, and active-matrix organic light-emitting diode displays. Furthermore, in the production of polymer materials using stretching processes, this method can also monitor and analyze properties such as the order parameter and birefringence of oriented polymers in real time.
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Description

Technical Field

[0001] The present invention belongs to the field of optics, and in particular relates to a method, system, electronic device and computer-readable storage medium for analyzing polarized image information. Background Art

[0002] Polarization states are fundamental to the field of functional display materials. For example, widely used liquid crystal displays (LCDs), liquid crystal spatial light modulators (LC-LSMs), and active-matrix organic light-emitting diode displays (AM-OLEDs) all utilize polarization to achieve optical path on / off imaging, eliminate ambient light, and achieve precise spatial light fields through phase manipulation. Furthermore, polarization is crucial for fundamental research. Soft matter with periodic assembly structures (liquid crystals, polymers, and biomembranes) exhibit unique optical textures under polarized light. The optical textures of typical polymer spherulites and liquid crystals can reveal information about the material's optical index, birefringence, chirality, and molecular chain arrangement, thereby linking macroscopic properties with microscopic structure. This is a crucial technical tool for soft matter research.

[0003] However, there are still unresolved issues in the existing analysis of polarized light images. First, there is currently a lack of quantitative analysis methods for polarized light images. In the past, researchers could qualitatively interpret the arrangement of molecular directors using polarized light images, but it was difficult to quantitatively interpret the texture color caused by the arrangement of director vectors. The color of the texture is closely related to the birefringence and thickness of the sample, and the color can reflect these material properties. Secondly, polarized light image analysis generally does not take into account the absorption and emission of the sample. This leads to difficulties in studying the optical properties of dye-based liquid crystal functional materials. For example, absorption / emission causes polarized light textures to be colored, which is not conducive to the study of optical indices and birefringence. In terms of applications, guest-host dichroic dye liquid crystal display materials have absorption, and their imaging color deviation theory limits the application of this technology [Fan Xiaoqin et al. "Application of blue dichroic dyes in TN liquid crystal display mode." LCD and Display 6 (2009): 5.] Quantitative polarized image analysis techniques can simulate color shifts, which can improve imaging in dichroic dye-based liquid crystal displays. Finally, the functional design of display devices introduces dispersion and additional optical path length differences in the optical path, affecting image quality under polarized conditions. For example, the intensity distribution of the light source used in a display device significantly affects image quality. The encapsulation layer, transparent electrode layer, and glass layer of the polarizer all introduce additional optical path length differences, the cumulative effect of which can lead to image color deviation. Therefore, polarized image analysis methods that account for additional phase delays in the optical path system can help improve device design.

[0004] In summary, the light source, sample absorption / emission, sample birefringence, and additional phase delays in the optical path will affect the quality of polarized images. A quantitative analysis method that can take all of the above factors into account is needed to enhance the ability to deeply mine polarized image information and correct imaging quality. Summary of the Invention

[0005] The present invention is based on the inventors' discovery and understanding of the following facts and problems: there is currently a lack of quantitative analysis methods for polarized images; the light source, sample absorption / emission, sample birefringence and additional phase delay in the optical path are closely related to image quality, and there is currently a lack of a quantitative analysis method that comprehensively considers all factors.

[0006] The present invention aims to at least partially address one of the technical problems in the related art. To this end, the present invention proposes a method for analyzing polarized image information and its application in polymer / liquid crystal materials. This method simulates the actual optical path and the radiation spectrum of the light source; considers the changes in the spectral structure caused by absorption / emission; rigorously applies the physical model of birefringence of the sample and additional phase delay; and converts the intensity of the emitted light into the sRGB color space using the CIE1931 color matching function, thereby achieving polarized image formation.

[0007] The present invention solves the above problems through the following solutions:

[0008] A first object of the present invention is to provide a method for analyzing polarized image information, comprising the following steps:

[0009] Calculate the intensity-wavelength spectrum of the incident light from the light source into the target object based on the light source type and the absorption / stimulated emission of the light source by the target object;

[0010] Constructing the target object's microtexture and optical path difference, and simulating and calculating the intensity-wavelength spectrum of polarized light formed after the incident light passes through the target object's microtexture based on the additional phase delay of the target object's microtexture and the intensity-wavelength spectrum of the incident light;

[0011] The intensity-wavelength spectrum of the polarized light is projected onto the analyzer direction and converted into color to obtain a simulated polarization image.

[0012] As a further improvement of the present invention, the microstructure of the target object is a two-dimensional array formed by the arrangement of target molecules, and the two-dimensional array is described by the Laplace differential equation, specifically:

[0013] ;

[0014] Where, ( x , y ) is the position vector of a single target molecule in the two-dimensional array,u is the pointing vector of a single target molecule in the two-dimensional array.

[0015] As a further improvement of the present invention, specifically, the optical path difference is σ ,

[0016]

[0017] Where, t is the thickness of the target microtexture, Δ n is the birefringence parameter of the target object's microtexture.

[0018] As a further improvement of the present invention, the simulation calculation of the intensity-wavelength spectrum of polarized light formed after the incident light passes through the target microtexture is calculated based on the physical model of birefringence, decomposing the incident light into ordinary light and extraordinary light with mutually perpendicular polarization directions. The specific calculation formula is:

[0019]

[0020] Where, f e is the wave function of ordinary light, f o is the wave function of extraordinary light, E is the amplitude, α is the angle between the molecular optical axis in the target and the polarizer, k is the wave number, z is the distance along the thickness direction of the target microtexture, G is the initial phase of the incident light, σ is the optical path difference;

[0021] When the microstructure of the target object has additional phase retardation, the intensity-wavelength spectrum of the polarized light is further corrected using the birefringence physical model.

[0022] As a further improvement of the present invention, the intensity-wavelength spectrum of the polarized light is projected onto the analyzer direction and converted into color, specifically, into the sRGB color gamut through the color matching equation of CIE1931, and the calculation method is:

[0023]

[0024] Where: K m =683 lumens / watt, which is the luminous efficacy, is the emissivity, , , According to CIE1931 standard, is the wavelength interval, and is converted intoX , Y , Z Convert the value to RGB color.

[0025] As a further improvement of the present invention, the intensity-wavelength spectrum of the incident light from the light source entering the target object is calculated based on the light source type, specifically by performing a simulation calculation based on Planck's blackbody radiation law. The specific calculation method is:

[0026]

[0027] Where, T the color temperature of the light source, λ is the wavelength, c is the speed of light, h is Planck's constant, k B is the Boltzmann constant.

[0028] As a further improvement of the present invention, when the target object can absorb the light emitted by the light source, the intensity-wavelength spectrum of the incident light is corrected. The specific calculation method is:

[0029]

[0030] Where A is absorbance, I 0 is the incident light intensity, I is the outgoing light intensity;

[0031] When the target object can emit light under the excitation of a light source, the intensity-wavelength spectrum of the incident light is corrected by combining the emission spectra and quantum yields of different excitation wavelengths.

[0032] A second object of the present invention is to provide a polarization image analysis system, comprising:

[0033] The incident light simulation calculation module calculates the intensity-wavelength spectrum of the incident light from the light source into the target object based on the light source type and the absorption / stimulated emission of the light source by the target object;

[0034] a polarized light simulation calculation module, which constructs the target object's microtexture and optical path difference, and simulates and calculates the intensity-wavelength spectrum of polarized light formed after the incident light passes through the target object's microtexture based on the additional phase delay of the target object's microtexture and the intensity-wavelength spectrum of the incident light;

[0035] The polarization image simulation calculation module projects the intensity-wavelength spectrum of the polarized light to the analyzer direction and converts it into color to obtain a simulated polarization image.

[0036] The third object of the present invention is to provide an electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the above-mentioned polarization image analysis method when executing the computer program.

[0037] A fourth object of the present invention is to provide a computer-readable storage medium storing a computer program, wherein the computer program, when executed by a processor, implements the steps of the above-mentioned polarization image analysis method.

[0038] Compared with the prior art, the present invention has the following beneficial effects:

[0039] This invention proposes a method for analyzing polarized image information, combining the complex optical phenomena caused by light source, material absorption / emission, material birefringence, and additional phase delay to quantitatively analyze the properties of birefringent materials. Light sources include monochromatic light sources and composite light sources (natural light sources and artificial light sources). Their intensity-wavelength distribution spectra can be viewed or simulated according to Planck's law. The absorption and emission of materials need to be measured using ultraviolet-visible light absorption spectrum and fluorescence spectrum data. By calculating the birefringence parameter Δ n and sample thickness t Assign values ​​to simulate the outgoing light obtained by the incident light from the light source through the above physical process, and convert it into sRGB color through the color matching equation.

[0040] The method provided by this invention comprehensively considers the light source, sample absorption / emission, sample birefringence, and additional phase retardation in the optical path, providing a precise simulation method for complex material and functional design. This method accounts for the color shift caused by the additional phase retarder and complex absorption in the display device's optical path. The simulated polarization image more closely resembles the polarization color reflected by the intrinsic characteristics of the target object, improving the imaging quality in optical displays and avoiding the errors and potential fallacies of traditional methods. This provides more accurate polarization images for extracting material structural information, significantly improving the accuracy of optical property research for polymer / liquid crystal materials.

[0041] The method for analyzing polarized image information proposed in the present invention is based on the reproduction of the real light path, and performs precise mathematical analysis and spectral color conversion on the physical model therein to achieve the simulation of the polarized image, providing a quantitative analysis method for the polarized image. The method provided by the present invention can, on the basis of obtaining the real polarized image, adjust the intrinsic property parameters of each target object so that the similarity between the simulated polarization result and the real polarized image is matched, thereby being able to determine the various intrinsic optical property parameters of the target object. This method can be applied to obtain the intrinsic property parameters of materials, which is beneficial to the application of materials.

[0042] The present invention proposes a polarized image analysis system. Since the incident light simulation calculation module, polarized light simulation calculation module, and polarized image simulation calculation modules are independent of each other, the above modules can be combined and their parameters can be set separately, which greatly broadens the application scenarios and lowers the usage threshold. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] Figure 1 This is a step diagram of the polarization image analysis method proposed by the present invention;

[0044] Figure 2 The radiation spectrum (color temperature) of halogen lamp simulated according to Planck's law T =6000K);

[0045] Figure 3 Nematic phase ( s =-1) molecular director arrangement (short blue line). The four gray areas in the figure are the schlieren texture of the nematic phase;

[0046] Figure 4 Michel-Lévy interference color chart (www.zeiss.com / microscopy) and calculation program to simulate the color of polarized light texture under corresponding optical path difference conditions;

[0047] Figure 5 a) and c) Molecular director arrangement and polarization image color simulation in a photonegative spherulite; b) and d) Molecular director arrangement and polarization image color simulation in a photopositive spherulite. The black crosses represent the polarizer and analyzer, and the full-wave retarder orientation is shown in c) and d).

[0048] Figure 6 Side-chain multi-chain silicon-containing liquid crystal polymer SiA3 forms a) spherulites; b) image after inserting a full-wave retarder; c) simulated image. The elliptical cross in Figure c) represents the optical index body;

[0049] Figure 7 a) Spherulite of polylactic acid (PLLA) / PDLA (1 / 1) stereocomposite crystal; b) image under full-wave retarder; c) simulated image;

[0050] Figure 8 a) and c) Images of a polyvinyl alcohol (PVA) film stretched to 150% under a full-wave retarder. The sample orientation is shown in the figure; b) and d) are the molecular director simulation and color simulation images of the oriented sample in a) and c), respectively.

[0051] Figure 9 Squarylium cyanine liquid crystal film SQ n , a) Absorption spectrum; b) Emission spectrum, excitation 514nm

[0052] Figure 10 Squarylium cyanine liquid crystal SQ n Sample a) Polarization texture; b) Image with a full-wave retarder; c) Polarization texture simulated under a constant optical path difference (-600 nm); and d) Polarization texture with a full-wave retarder. The elliptical cross in b) represents the optical index, and the retarder orientation is shown in d). DETAILED DESCRIPTION

[0053] In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts should fall within the scope of protection of the present invention.

[0054] It should be noted that the terms "first", "second", etc. in the description and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that the numbers used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0055] The present invention is described in further detail below with reference to the accompanying drawings:

[0056] The present invention proposes a method for analyzing polarized image information. The specific steps are as follows: Figure 1 , quantitative analysis of complex optical phenomena caused by light source, material absorption / emission, material birefringence and additional phase delay:

[0057] Step 1: This analysis method can use a variety of light sources as the system luminous light source, including monochromatic light sources, composite light sources (natural light sources and artificial light sources), and their intensity-wavelength distribution spectrum can be consulted or simulated according to Planck's law;

[0058] Step 2: The absorption and emission of the target material need to be measured by UV-visible absorption spectrum and fluorescence spectrum data; the birefringence parameter Δ n and thickness tThe assignment is performed and the polarized outgoing light of the incident light passing through the microstructure of the target is simulated and calculated using the birefringence model.

[0059] Step 3: The outgoing light obtained by the incident light from the light source through the above physical process is converted into sRGB color through the color matching equation.

[0060] In step 1: Calculate the intensity-wavelength spectrum of the incident light, including:

[0061] 1) When characterizing the intrinsic intensity-wavelength spectrum of a light source, Planck's blackbody radiation law is used for simulation calculation. The specific calculation method is:

[0062]

[0063] Where, T the color temperature of the light source, λ is the wavelength, c is the speed of light, h is Planck's constant, k B is the Boltzmann constant.

[0064] 2) When the target object can absorb the light emitted by the light source, the intensity-wavelength spectrum of the incident light is corrected. The specific calculation method is:

[0065]

[0066] Where A is absorbance, I 0 is the incident light intensity, I is the outgoing light intensity;

[0067] 3) When the target object is capable of emitting light under the excitation of a light source, the intensity-wavelength spectrum of the incident light is corrected by combining the emission spectra and quantum yields of different excitation wavelengths.

[0068] In step 2, the intensity-wavelength spectrum of polarized light formed by incident light passing through the microstructure of the target object is simulated and calculated, including:

[0069] (1) Constructing the microstructure of the target

[0070] The microstructure of the target object is a two-dimensional array formed by the arrangement of the target object molecules. The two-dimensional array is described by the Laplace differential equation, specifically:

[0071] ;

[0072] Where, ( x , y ) is the position vector of a single target molecule in the two-dimensional array, uis the pointing vector of a single target molecule in the two-dimensional array.

[0073] (2) Constructing the optical path difference of the target object's microstructure

[0074] The optical path difference is σ ,

[0075]

[0076] Where, t is the thickness of the target microtexture, Δ n is the birefringence parameter of the target object’s microstructure. Δn as well as t Assignment, where Δn The value range can refer to the data obtained from the characterization of the target object by ellipsometer or polarizing microscope, the thickness of the target material microstructure t The assigned thickness can refer to the data measured by other methods such as optical testing.

[0077] (3) According to the birefringence physical model, the incident light is decomposed into ordinary light (o light) and extraordinary light (e light) with mutually perpendicular polarization directions:

[0078] The specific calculation formula is:

[0079]

[0080] Where, f e is the wave function of ordinary light, f o is the wave function of extraordinary light, E is the amplitude, α is the angle between the molecular optical axis in the target and the polarizer, k is the wave number, z is the distance along the thickness direction of the target microtexture, G is the initial phase of the incident light, σ is the optical path difference;

[0081] When the microstructure of the target object has additional phase retardation, the above-mentioned birefringence physical model can also be used to further correct the intensity-wavelength spectrum of the polarized light.

[0082] In step 3: the intensity-wavelength spectrum of the polarized light is projected onto the analyzer direction and converted into color: in order to convert into the sRGB color gamut through the color matching equation of CIE1931, the calculation method is as follows:

[0083]

[0084] Where, K m=683 lumens / watt, which is the luminous efficacy, is the emissivity, , , According to CIE1931 standard, is the wavelength interval, and is converted into X , Y , Z Convert the value to RGB color.

[0085] The following is further described with reference to specific embodiments.

[0086] Example 1

[0087] The reliability of the calculation was verified and assessed using the Michel-Lévy interference color table. This table displays the color of birefringent materials based on their birefringence and thickness. Using this table, information about either birefringence or material thickness can be used to determine the other. Therefore, this table provides a reliable guarantee of the validity of the calculation method.

[0088] See also Figure 1 , this embodiment is described according to the steps shown in the flowchart.

[0089] (1) Step 1: Obtain the radiation intensity of the light source: The light source used in the calculation is a halogen lamp, which is a commonly used light source for polarizing microscopes, and its radiation spectrum can be simulated by Planck's blackbody radiation law. Its only parameter is the color temperature. T( Here T =6000K). The radiation spectrum (intensity-wavelength distribution) of the light source is as follows Figure 2 As shown, it serves as the initial spectral data for calculation in the following steps.

[0090] (2) Step 2 obtains the absorption / emission of the sample: the intensity-wavelength distribution of the initial incident light in step 1 changes after absorption / emission, and is used as the incident light radiation intensity distribution in step 3. Due to the Michel-Lévy interference color sequence diagram, see Figure 4 , the absorption / emission of the sample is not considered, so this step can be ignored. Similarly, for materials with no absorption / emission, this step can be skipped.

[0091] (3) Step 3: Calculate the birefringence of the sample: the outgoing light after the incident light passes through the birefringence of the sample is used as the incident light for step 4. The simulation of the sample microstructure mainly includes the simulation of the molecular pointing vector arrangement and the optical path difference.

[0092] The molecular pointing vector arrangement simulation includes the position and director parameters of the molecule. In this embodiment, the nematic phase molecular arrangement (disclination strength s=-1), the arrangement can be described by the Laplace differential equation, and the arrangement diagram is shown in Figure 3 shown.

[0093] The optical path difference depends on the thickness of the sample t and birefringence parameter Δ n The two parameters can be measured experimentally or assigned values. Substitute the outgoing light after step 2 into the birefringence physical model to calculate the outgoing light, which can be used as the incident light in step 4.

[0094] (4) Step 4 calculates the additional phase delay: take the outgoing light of step 3 as the incident light, and the same as step 3, with three parameters, including the optical path difference σ 、Molecular position( x , y ), director parameter u Since the Michel-Lévy interference color sequence diagram does not take into account the additional phase delay, step 4 can be skipped in this embodiment.

[0095] (5) Finally, the radiation spectrum of the outgoing light from step 4 projected onto the analyzer is converted into the color of the final image through the color matching equation.

[0096] This embodiment simulates the polarization color of the optical path difference of 200~1800nm, which is consistent with the color at the same optical path difference in the interference color sequence, such as Figure 4 shown.

[0097] The above fitting demonstrates the accuracy of the calculation procedure. It is worth noting that the difference in color brightness of the fitting comes from the fact that the light source fitting only considers the relative intensity, not the absolute intensity.

[0098] Example 2

[0099] Optical texture analysis of polymer spherulites under polarized light conditions. In classical theory, after inserting a full-wave retarder (550nm) into a polymer spherulite in the polarized light state, the spherulites can be classified as photonegative spherulites (blue in the first to third quadrants and yellow in the second to fourth quadrants) due to the different colors. The molecular chains are distributed along the radial direction, such as Figure 5 As shown in a); Photopositive spherulites (quadrants 1-3 are yellow / quadrants 2-4 are blue) in which the molecular segments are distributed along the circumference, as shown in Figure 5 As shown in b).

[0100] (1) This analytical method is used to reproduce classical theoretical phenomena of polymers

[0101] The distribution of chain segments is simulated as Figure 5 As shown in a) and b), the light source is consistent with that in Example 1.

[0102] The birefringence of polymer materials is generally small, among which:

[0103] Birefringence parameter Δ of amorphous polymers n Between 0 and 0.01, such as the birefringence parameter Δ of ordinary polystyrene (PS) n Between 0.002 and 0.005;

[0104] Birefringence parameter Δ of crystalline polymers n Between 0.1 and 0.3, such as polyethylene (PE) and polyamide (PA).

[0105] Polymer optical materials generally exist in the form of thin films, and their thickness t At the micron / millimeter level, the overall optical path difference σ Smaller.

[0106] The optical path difference is calculated by this analysis method. σ The classic phenomena in the textbooks can be successfully reproduced between 60 and 200 nm, such as Figure 5 c) and d) show the optical path difference of 120nm. σ Simulated positive / negative polarization images of spherulites.

[0107] (2) Image analysis of photonegative spherulites formed by side chain multi-chain silicon-containing liquid crystal polymer SiA3

[0108] The birefringence parameter Δ of the liquid crystal material in the liquid crystal cell (5μm) n The optical path difference is measured to be between 0.02 and 0.03. σ At 100~150nm. Through the molecular arrangement model of photonegative spherulites and the optical path difference σ , this calculation method uses the optical path difference σ= 140nm successfully reproduces all the colors in the polarized texture, such as Figure 6 shown.

[0109] (3) Take the stereocomposite crystal formed by left-handed / right-handed polylactic acid PLLA / PDLA (1 / 1) as an example (molecular weight 80,000 Da).

[0110] The polymer has a thickness of 26 to 28 microns and a birefringence parameter Δ n is 0.004~0.005, and its optical path difference σ 110~140nm( Macromolecules 2023, 56, 8754−8766). The molecular arrangement model and optical path difference of the photopositive spherulite. This calculation method successfully reproduces all the colors in the polarization texture using an optical path difference of 130nm, such as Figure 7 shown.

[0111] Example 3

[0112] Image analysis of polyvinyl alcohol film (PVA, molecular weight 150,000 Da) stretched to 150%. Figure 8 In the direction shown in a) in the full-wave retarder, it appears yellow; the oriented sample is as follows Figure 8 The sample appears green when placed as shown in (c). This embodiment adopts the light source conditions similar to those of embodiment 1.

[0113] PVA does not absorb in the visible light region. This image analysis only requires the use of a birefringence module with a sample and an additional full-wave retarder. In addition, after stretching, the molecular chain segments of the polymer are well oriented and have a high order parameter. The molecular director simulation can be described using vectors, such as Figure 8 As shown in b) and d).

[0114] Through optical testing, the film thickness t The optical path difference is 180-200 nm. This calculation method successfully reproduces all the colors in the polarization texture, such as Figure 8 b) and d) show simulated images based on an optical path difference of 180 nm. It should be noted that color deviations in these images are primarily caused by stretching defects, inaccurate sample rotation, and light source brightness.

[0115] This example demonstrates the potential for industrial applications of this analytical method. For example, in polymer films requiring stretching, the birefringence of these films is closely related to the stretch ratio. By optically measuring the thickness of the polymer during stretching, the proposed calculation program can be used to determine the material's real-time birefringence, enabling precise control of the order parameter during the polymer stretching process.

[0116] Example 4

[0117] Texture analysis of squaraine liquid crystal phase with strong absorption in the visible light region.

[0118] Squarylium Q n The strong absorption in the yellow / red region creates a liquid crystal optical texture with a distinct color signature, making it extremely difficult to determine its optical index. The present invention successfully replicates the liquid crystal phase texture and its polarized light color using this computational program, demonstrating the photonegative nature of the liquid crystal and obtaining the distribution characteristics of the optical index.

[0119] (1) The observation of the texture of the squarylium cyanine liquid crystal was carried out on an Olympus BX51 polarizing microscope, the light source of which can be used with color temperature T =6000K fitting light source spectrum.

[0120] (2) The absorption of the sample in the visible light region (380-780 nm) is obtained by UV-visible absorption spectroscopy, and the intensity of the transmitted light is calculated ( I 0 is the incident light, I The fluorescence spectrum shows that its emission is very weak and distributed in the range of 800-1000 nm, which has little effect on the imaging of the visible light region, so it is ignored. Figure 9 shown.

[0121] (3) The growth mode of columnar liquid crystal is similar to that of spherulites, so its molecular arrangement model is similar to that of polymer spherulites, such as Figure 5 shown.

[0122] (4) The texture of the squarylium cyanine liquid crystal was observed in a liquid crystal cell. The thickness of the liquid crystal cell cavity was fixed at 5 μm. Through the polarizing microscope birefringence test accessory (quartz wedge), the birefringence was obtained to be 0.116~0.124, and the absolute value of the optical path difference was 580~620 nm.

[0123] (5) The texture of the cyanine columnar liquid crystal phase is as follows Figure 10 As shown in (a), under the condition of full-wave retarder (phase difference is 550nm), Figure 10 By using the molecular director arrangement of photonegative spherulites and an optical path difference of ~600 nm, the following can be obtained: Figure 10 The simulated polarization image shown in c) and the simulated polarization image under the full-wave retarder condition are shown in Figure 10 The above experimental results are in good agreement with the simulation results obtained by the analytical method. Based on the results, it can be judged that the liquid crystal material has photonegative properties, and its optical index distribution is as follows: Figure 10 As shown in b).

[0124] The above content is only for explaining the technical idea of ​​the present invention and cannot be used to limit the protection scope of the present invention. Any changes made on the basis of the technical solution in accordance with the technical idea proposed by the present invention shall fall within the protection scope of the claims of the present invention.

Claims

1. A method for analyzing polarized images, characterized in that: The following steps are involved: Calculate the intensity-wavelength spectrum of the incident light from the light source into the target object based on the light source type and the absorption / stimulated emission of the light source by the target object; The target object's microtexture and optical path difference are constructed. Based on the additional phase delay of the target object's microtexture and the intensity-wavelength spectrum of the incident light, the intensity-wavelength spectrum of the polarized light formed after the incident light passes through the target object's microtexture is simulated and calculated. Specifically, the incident light is decomposed into ordinary light and extraordinary light with mutually perpendicular polarization directions according to the physical model of birefringence. The specific calculation formula is: , Where, f e is the wave function of ordinary light, f o is the wave function of extraordinary light, E is the amplitude, α is the angle between the molecular optical axis in the target and the polarizer, k is the wave number, z is the distance along the thickness direction of the target microtexture, G is the initial phase of the incident light, σ is the optical path difference; when the microstructure of the target object has an additional phase delay, the intensity-wavelength spectrum of the polarized light is further corrected using the birefringence physical model; The intensity-wavelength spectrum of the polarized light is projected onto the analyzer direction and converted into color to obtain a simulated polarization image.

2. The polarization image analysis method according to claim 1, characterized in that: The microstructure of the target object is a two-dimensional array formed by the arrangement of target molecules. The two-dimensional array is described by the Laplace differential equation, specifically: ; Where, ( x , y ) is the position vector of a single target molecule in the two-dimensional array, u is the pointing vector of a single target molecule in the two-dimensional array.

3. The polarization image analysis method according to claim 1, wherein: The optical path difference is σ , Where, t is the thickness of the target microtexture, Δ n is the birefringence parameter of the target object's microtexture.

4. The polarization image analysis method according to claim 1, wherein: The intensity-wavelength spectrum of the polarized light is projected onto the analyzer direction and converted into color, specifically, into the sRGB color gamut through the color matching equation of CIE1931. The calculation method is: Where, K m =683 lumens / watt, which is the luminous efficacy, is the emissivity, , , According to CIE1931 standard, is the wavelength interval, and is converted into X , Y , Z Convert the value to RGB color.

5. The method for analyzing polarized images according to any one of claims 1 to 4, characterized in that: The intensity-wavelength spectrum of the incident light from the light source entering the target object is calculated based on the light source type, specifically by performing a simulation calculation based on Planck's blackbody radiation law. The specific calculation method is: Where, T the color temperature of the light source, λ is the wavelength, c is the speed of light, h is Planck's constant, k B is the Boltzmann constant.

6. The method for analyzing polarized images according to claim 5, wherein: When the target object can absorb the light emitted by the light source, the intensity-wavelength spectrum of the incident light is corrected. The specific calculation method is: Where A is absorbance, I 0 is the incident light intensity, I is the outgoing light intensity; When the target object can emit light under the excitation of a light source, the intensity-wavelength spectrum of the incident light is corrected by combining the emission spectra and quantum yields of different excitation wavelengths.

7. A polarization image analysis system, characterized in that: include: The incident light simulation calculation module calculates the intensity-wavelength spectrum of the incident light from the light source into the target object based on the light source type and the absorption / stimulated emission of the light source by the target object; The polarization light simulation calculation module constructs the target object's microtexture and optical path difference. Based on the additional phase delay of the target object's microtexture and the intensity-wavelength spectrum of the incident light, it simulates and calculates the intensity-wavelength spectrum of the polarized light formed after the incident light passes through the target object's microtexture. Specifically, based on the physical model of birefringence, the incident light is decomposed into ordinary light and extraordinary light with mutually perpendicular polarization directions. The specific calculation formula is: , Where, f e is the wave function of ordinary light, f o is the wave function of extraordinary light, E is the amplitude, α is the angle between the molecular optical axis in the target and the polarizer, k is the wave number, z is the distance along the thickness direction of the target microtexture, G is the initial phase of the incident light, σ is the optical path difference; when the microstructure of the target object has an additional phase delay, the intensity-wavelength spectrum of the polarized light is further corrected using the birefringence physical model; The polarization image simulation calculation module projects the intensity-wavelength spectrum of the polarized light to the analyzer direction and converts it into color to obtain a simulated polarization image.

8. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the polarization image analysis method according to any one of claims 1 to 6 when executing the computer program.

9. A computer-readable storage medium storing a computer program, wherein the computer program, when executed by a processor, implements the steps of the polarization image analysis method according to any one of claims 1 to 6.

Citation Information

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