Signal analysis method and system, electronic equipment and computer program product

Abstract

The invention is suitable for the field of signal processing, and provides a signal analysis method and system, electronic equipment and a computer program product, and the method comprises the steps: obtaining the waveform data of an equipment signal under a test point in to-be-tested equipment based on measurement equipment in response to an analysis request of a user side; the equipment signal under the test point corresponds to a set communication protocol; based on a set to-be-analyzed dimension, analyzing the waveform data of the equipment signal to obtain a signal analysis result under the test point in the to-be-tested equipment; and outputting the signal analysis result to the user side. According to the scheme, manual intervention is reduced, and the signal analysis accuracy and analysis efficiency can be improved.

Description

Technical Field

[0001] The present application belongs to the field of signal processing, and in particular, relates to a signal analysis method, system, electronic device and computer program product. Background Art

[0002] In the signal integrity test, the waveform image corresponding to the device signal under the test point in the device under test measured by the oscilloscope is manually analyzed to verify the communication status based on the signal analysis results obtained. However, this signal analysis method that relies on manual labor has obvious problems: on the one hand, manual analysis is prone to misjudgment, resulting in low accuracy of signal analysis results; on the other hand, the amount of data that can be processed manually is limited, and the analysis efficiency is low. Summary of the invention

[0003] The embodiments of the present application provide a signal analysis method, system, electronic device and computer program product to solve the problems of low analysis accuracy and low analysis efficiency in manual signal analysis in the prior art.

[0004] A first aspect of an embodiment of the present application provides a signal analysis method, comprising:

[0005] In response to an analysis request from a user terminal, waveform data of a device signal at a test point in the device under test is obtained based on a measuring device; the device signal at the test point corresponds to a set communication protocol;

[0006] Based on the set dimension to be analyzed, the waveform data of the device signal is analyzed to obtain the signal analysis result at the test point in the device to be tested;

[0007] The signal analysis result is output to the user end.

[0008] A second aspect of an embodiment of the present application provides a signal analysis system, including:

[0009] An acquisition module, for responding to an analysis request from a user terminal, and acquiring waveform data of a device signal at a test point in the device under test based on a measuring device; the device signal at the test point corresponds to a set communication protocol;

[0010] An analysis module, used to analyze the waveform data of the device signal based on the set dimension to be analyzed, and obtain the signal analysis result at the test point in the device under test;

[0011] The output module is used to output the signal analysis result to the user end.

[0012] A third aspect of an embodiment of the present application provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the method described in the first aspect when executing the computer program.

[0013] A fourth aspect of the present application provides a computer program product, which includes a computer program, and when the computer program is executed by a processor, the steps of the method described in the first aspect are implemented.

[0014] A fifth aspect of an embodiment of the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the method described in the first aspect are implemented.

[0015] As can be seen from the above, the present application responds to the analysis request sent by the user end, obtains the waveform data of the device signal under the test point in the device to be tested from the measuring device, obtains it in a targeted manner, improves efficiency, does not obtain it manually, reduces the analysis errors caused by incorrect or incomplete data acquisition, and improves the analysis efficiency and analysis accuracy. Afterwards, based on the set dimension to be analyzed, the waveform data of the device signal is analyzed, and the analysis dimension is clarified, which helps to ensure the correctness and accuracy of the analysis logic, thereby improving the analysis accuracy. Through analysis, the signal analysis results under the test point in the device to be tested under the dimension to be analyzed are obtained and output to the user end. After receiving the analysis request, the present application automates the analysis process from the acquisition of waveform data to the output of signal analysis results, reduces the chance of manual intervention, reduces the analysis errors caused by human errors, improves the analysis accuracy, and speeds up the analysis efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0017] Figure 1 is a flow chart of a signal analysis method provided in an embodiment of the present application;

[0018] Figure 2 is a structural diagram of a signal analysis system provided in an embodiment of the present application;

[0019] Figure 3 It is a structural diagram of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0020] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application may also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present application.

[0021] It should be understood that when used in this specification and the appended claims, the term "comprising" indicates the presence of described features, integers, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or groups thereof.

[0022] It should also be understood that the terms used in this application specification are only for the purpose of describing specific embodiments and are not intended to limit the application. As used in this application specification and the appended claims, unless the context clearly indicates otherwise, the singular forms "a", "an" and "the" are intended to include plural forms.

[0023] It should be further understood that the term “and / or” used in the specification and appended claims refers to any combination and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0024] As used in this specification and the appended claims, the term "if" may be interpreted as "when" or "upon" or "in response to determining" or "in response to detecting," depending on the context. Similarly, the phrases "if it is determined" or "if [described condition or event] is detected" may be interpreted as meaning "upon determination" or "in response to determining" or "upon detection of [described condition or event]" or "in response to detecting [described condition or event]," depending on the context.

[0025] In a specific implementation, the terminal described in the embodiments of the present application includes, but is not limited to, other portable devices such as mobile phones, laptop computers, or tablet computers with touch-sensitive surfaces (e.g., touch screen displays and / or touch pads). It should also be understood that in some embodiments, the device is not a portable communication device, but a desktop computer with a touch-sensitive surface (e.g., touch screen displays and / or touch pads).

[0026] In the following discussion, a terminal including a display and a touch-sensitive surface is described. However, it should be understood that the terminal may include one or more other physical user interface devices such as a physical keyboard, mouse and / or joystick.

[0027] The terminal supports various applications, such as one or more of the following: a drawing application, a presentation application, a word processing application, a website creation application, a disk burning application, a spreadsheet application, a game application, a telephone application, a video conferencing application, an email application, an instant messaging application, a workout support application, a photo management application, a digital camera application, a digital camcorder application, a web browsing application, a digital music player application, and / or a digital video player application.

[0028] Various applications that can be executed on the terminal can use at least one common physical user interface device such as a touch-sensitive surface. One or more functions of the touch-sensitive surface and corresponding information displayed on the terminal can be adjusted and / or changed between applications and / or within corresponding applications. In this way, the common physical architecture of the terminal (e.g., the touch-sensitive surface) can support various applications with user interfaces that are intuitive and transparent to the user.

[0029] It should be understood that the size of the serial numbers of the steps in this embodiment does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiment of the present application.

[0030] In current signal integrity testing, an oscilloscope is often used to measure the voltage signals of each signal transmission channel at each test point of the device under test on a printed circuit board (PCB), and the waveform image corresponding to the voltage signal of each signal transmission channel is displayed on the display interface of the oscilloscope. Subsequently, the staff will perform signal analysis based on the waveform image, such as communication protocol analysis and waveform category analysis.

[0031] Whether it is communication protocol analysis or waveform category analysis, the analysis is relatively difficult, requiring the staff to have rich professional qualities and work experience, high requirements for staff quality, and high personnel costs. Due to the difficulty of analysis, the staff is slow in the analysis process, prone to errors, and the quality of the analysis results is low, especially for some staff who are engaged in analysis work for a short period of time.

[0032] The above problems seriously reduce the analysis accuracy and efficiency of signals in signal integrity testing. To this end, the present application provides a signal analysis method, system, electronic device and computer program product.

[0033] In some embodiments, the signal analysis method is applied to a signal analysis system.

[0034] This application designs a signal analysis system based on the signal analysis requirements, selecting appropriate programming languages, frameworks, databases, and measurement equipment control components.

[0035] In some embodiments, the programming language may be Python; the framework may be a web framework with a Representational State Transfer Application Programming Interface (REST API), such as Django or Flask; the database may be MySQL; and the measurement device control component may be a Python-based virtual instrument software architecture (PyVISA) component. Through PyVISA, the system can communicate with measurement devices such as oscilloscopes, send control commands, and receive measurement information.

[0036] The signal analysis system is a software system, including a user end and a server end. The user controls the test points to be analyzed and the analysis dimensions through the user end. The server performs the analysis according to the user's needs and feeds back the signal analysis results to the user through the user end.

[0037] The signal analysis system communicates with measuring devices such as oscilloscopes through the Transmission Control Protocol (TCP) or Internet Protocol (IP) to send commands and receive data, thereby controlling measuring devices such as oscilloscopes.

[0038] In some embodiments, a user may access the signal analysis system through a client software application or a web interface.

[0039] For example, users can select test points and analysis dimensions and obtain signal analysis results by entering the corresponding URL or accessing a specific web application through a browser. This web-based access method greatly improves the flexibility and ease of use of the system. When the network is good, users can perform signal analysis at any location and at any time.

[0040] In addition, users can install the signal analysis system on a terminal, such as a computer, and implement signal analysis at the software level without purchasing hardware analysis equipment or a license, thereby saving capital investment costs.

[0041] In order to illustrate the technical solution described in this application, a specific embodiment is provided below for illustration.

[0042] See also Figure 1 , Figure 1 : is a flow chart of a signal analysis method provided in an embodiment of the present application. Figure 1 As shown, a signal analysis method comprises the following steps:

[0043] Step 101, in response to an analysis request from a user terminal, waveform data of a device signal at a test point in a device under test is obtained based on a measuring device; the device signal at the test point corresponds to a set communication protocol.

[0044] Before step 101, an analysis request sent by the user is received.

[0045] In some embodiments, the user inputs the test point and the dimension to be analyzed corresponding to the test point through the interactive interface of the user terminal. The user can freely select the test point and the analysis dimension, which is highly flexible.

[0046] In some embodiments, the interactive interface provides optional items in the form of a drop-down box, providing test points and analyzable dimensions of the device under test that can be selected. Accordingly, the user selects a test point from the test points of the device under test that can be selected, and selects a dimension to be analyzed from the analyzable dimensions, thereby setting the test point and the dimension to be analyzed.

[0047] Among them, the device to be tested is an electronic device such as a chip, for example, a test point on a PCB. The test point refers to a specific component, logic point, wiring point, signal source point, load point, etc. of the circuit. Specific components include pins, resistors, capacitors, inductors, etc. of integrated circuits. A logic point is a node in the circuit that performs a specific logic function. For example, the output end of a logic gate (such as an AND gate, an OR gate, a NOT gate, etc.) is a logic point. A wiring point is a connection point in the circuit, such as a solder joint on a PCB board, an interface of a connector, etc. The signal source point is the location where the signal is generated. The load point is the location where the signal is received or processed.

[0048] Different test points are distinguished by different names or numbers for users to select. The analyzable dimensions include communication protocol dimension and waveform category dimension.

[0049] In some embodiments, the user needs to confirm after input, that is, confirm to perform the signal analysis operation, which can be confirmed by clicking a virtual button. At this time, a parameter legitimacy check will be performed, that is, the content input by the user will be checked.

[0050] If the content input by the user does not include the test point and / or the dimension to be analyzed, or the input test point and / or the dimension to be analyzed does not exist, the confirmation failure will be prompted through the interactive interface, and the user can be prompted which input content has a problem.

[0051] If the content selected by the user includes the required content such as test points, dimensions to be analyzed and the following device measurement channels, and the content is valid, a confirmation success prompt will be displayed. At this time, an analysis request containing the test points and dimensions to be analyzed of the device to be tested sent by the user will be received.

[0052] In some embodiments, the dimension to be analyzed may be one or more analyzable dimensions of the test point, and the dimension to be analyzed includes a communication protocol dimension and / or a waveform category dimension.

[0053] After receiving the analysis request, the waveform data of the device signal under the selected test point is obtained according to the analysis request. The waveform data may be a waveform value, a waveform curve, a waveform image including the waveform curve, etc. The waveform may be a signal waveform such as a voltage waveform or a current waveform.

[0054] In some embodiments, the waveform data can be directly obtained from a measuring device such as an oscilloscope, or from a database. It should be clear that the waveform data in the database is also obtained based on the measuring device. Therefore, before this, it is necessary to establish a communication connection with a measuring device such as an oscilloscope in order to obtain the waveform data.

[0055] In some embodiments, the communication connection is established through the address and port of the measurement device. For example, an oscilloscope is connected through the loopback address "127.0.0.1" and the port "5025".

[0056] If the communication connection is successfully established, a response message from the measuring device will be received. If no response message from the measuring device is received, an abnormal alarm prompt can be issued based on the interactive interface of the user end.

[0057] In some embodiments, the database may not be a database within the system, such as a cloud database. Before obtaining waveform data from the database, it will be checked whether a communication connection is established with the database. If the communication connection is successfully established, a response message from the database will be received. If no response message from the database is received, an abnormal alarm prompt can be issued based on the interactive interface of the user end.

[0058] In addition, prompts can be given when the interactive interface function items are abnormal. During test analysis, prompts can also be given for the operation of the test points, such as powering on and off the prototype, so that users can know the status of the system, measurement equipment, and test points, and handle abnormal events in a timely manner.

[0059] In some embodiments, the response to the analysis request of the user terminal and the acquisition of waveform data of the device signal at the test point in the device to be tested based on the measuring device include: based on the measuring device, acquiring the waveform value of the device signal at the test point at different time points; and / or, based on the measuring device, acquiring the waveform curve of the device signal at the test point.

[0060] In some embodiments, the functions of the measuring devices vary. Some measuring devices may not be able to draw and display waveform curves, or, due to abnormal readings, waveform values ​​cannot be directly obtained from the measuring devices.

[0061] In some embodiments, based on the measuring device, the waveform values ​​of the device signal at different time points under the test point are obtained, including: based on multiple device measurement channels in the measuring device, the waveform values ​​at different time points are collected; the multiple device measurement channels are used to respectively collect waveform values ​​of multiple signal transmission channels used to transmit the device signal under the test point with the set communication protocol; or, the voltage value at the set timing is extracted from the waveform curve corresponding to each of the device measurement channels sent by the measuring device to obtain the waveform value.

[0062] The communication protocols include Inter-Integrated Circuit (I2C) protocol, Serial Peripheral Interface (SPI) protocol, Management Data Input / Output (MDIO) protocol, etc.

[0063] Different communication protocols include different signal lines, and different signal lines correspond to different signal transmission channels. When the measuring device measures the signal line at the test point, i.e., the signal transmission channel, the waveform value of the signal line at the test point, i.e., the signal transmission channel, is measured. The measuring device transmits the measured waveform value through the device measurement channel.

[0064] The I2C protocol includes a data line (Serial Data Line, SDA) and a clock line (Serial Clock Line, SCL), corresponding to the SDA signal transmission channel and the SCL signal transmission channel.

[0065] The SPI protocol includes the Master Out Slave In (MOSI) line, the Master In Slave Out (MISO) line, the Serial Clock (SCK) line and the Chip Select (CS / SS) line, which correspond to the MOSI signal transmission channel, the MISO signal transmission channel, the SCK signal transmission channel and the CS / SS signal transmission channel.

[0066] The MDIO protocol includes a Management Data Input / Output (MDIO) line and a Management Data Clock (MDC) line, which correspond to an MDIO signal transmission channel and an MDC signal transmission channel.

[0067] In some embodiments, the device measurement channel is content directly input by the user in the interactive interface.

[0068] In some embodiments, the device measurement channel, test points, and dimensions to be analyzed should be input together through an interactive interface. The device measurement channel also needs to pass a parameter validity check. If the user input does not include the device measurement channel, or the input device measurement channel does not exist, the interactive interface prompts a confirmation failure and points out the problem.

[0069] The user inputs the actual channels of the measurement device involved in the measurement transmission into the interactive interface as the device measurement channels. The number of device measurement channels is the same as the number of signal transmission channels. For example, the SCL signal transmission channel corresponds to channel 1 of the measurement device, and the SDA signal transmission channel corresponds to channel 2 of the measurement device. Channel 1 and channel 2 can be determined as device measurement channels to obtain waveform data of these two channels.

[0070] In some embodiments, the system may collect voltage values ​​in each set measurement channel of the measuring device at a certain time sequence to obtain the voltage value, that is, the waveform value.

[0071] In some embodiments, the voltage value under the timing sequence can be extracted from the waveform curve corresponding to each signal transmission channel to obtain the waveform value.

[0072] In some embodiments, the acquired waveform values ​​may be used directly or stored in a database.

[0073] In some embodiments, the waveform values ​​are represented in vector form. For example:

[0074] #Read voltage value

[0075] raw_data=scope.query_binary_values('CURV?', datatype='B', container=np.array).

[0076] During the analysis, vector calculation analysis is performed on the array or matrix composed of waveform values ​​based on Numpy and Pandas libraries. Since Numpy and Pandas, which are Python libraries based on C language, are used for vector calculation, the analysis speed is greatly improved, and the number of analyses also increases. For example, the analysis of the communication protocol dimension is completed within 5 seconds, which meets the user's usage needs and improves the analysis efficiency.

[0077] In some embodiments, obtaining the waveform curve of the device signal at the test point based on the measuring device includes: sending a waveform curve acquisition command to the measuring device; receiving the waveform curve sent by the measuring device; or, drawing a waveform curve based on the waveform values ​​at different time points to obtain the waveform curve.

[0078] If a waveform curve is to be obtained, a waveform curve acquisition command is sent to the measuring device, and the command includes an image capture instruction and an image transmission instruction. When the measuring device receives the waveform curve acquisition command, it will perform a screenshot operation based on the image capture instruction, that is, it will take a screenshot based on the waveform curve displayed on its display interface, and obtain a waveform image containing waveform curves of multiple device measurement channels, that is, obtain a waveform image containing waveform curves of multiple signal transmission channels. Afterwards, based on the image transmission instruction, the waveform image containing the waveform curve is transmitted to the system, and the system will receive the waveform image from the measuring device, that is, obtain a waveform curve.

[0079] Alternatively, connect the drawing software through PyVISA and draw the waveform curve based on the read waveform values.

[0080] In some embodiments, the waveform curve and the waveform image containing the waveform curve can be stored in a database for easy management and for providing training sample data for the waveform classification model.

[0081] In some embodiments, the waveform curve or the waveform image including the waveform curve is obtained through a REST API.

[0082] Waveform data can be acquired through different methods. When any acquisition method has problems, data acquisition can be achieved through other methods without affecting the analysis efficiency.

[0083] Step 102: Analyze the waveform data of the device signal based on the set dimension to be analyzed to obtain the signal analysis result at the test point in the device to be tested.

[0084] Different analysis dimensions correspond to different analysis methods. Under different analysis dimensions, different processing methods are used to process waveform data, and signal analysis results under different dimensions are obtained accordingly.

[0085] In some embodiments, the analysis dimensions include a communication protocol dimension and a waveform category dimension. The communication protocol dimension and the waveform category dimension correspond to different analysis units. Therefore, the user can select one or both dimensions for analysis. The analysis of the communication protocol dimension is used to analyze the communication logic presented by the test point, whether it is performing a read operation or a write operation, which slave is communicating with, what data is sent, and so on. The analysis of the waveform category dimension is used to analyze whether the fluctuation curve in the waveform image has characteristics such as monotonicity, hook back, ringing, steps, glitches, power failure, etc., which may occur during the power-on overshoot test.

[0086] Accordingly, the dimension to be analyzed is the communication protocol dimension and / or the waveform category dimension. Different dimensions to be analyzed will result in different signal analysis results.

[0087] In some embodiments, the waveform data of the device signal is analyzed based on the set dimension to be analyzed to obtain the signal analysis result at the test point in the device under test, including: analyzing the waveform data to obtain data frame characteristic information of the device signal at the test point in the device under test; and / or analyzing the waveform data to obtain waveform category information of the device signal at the test point in the device under test.

[0088] If the dimension to be analyzed is the communication protocol dimension, the signal analysis result is the data frame feature information. If the dimension to be analyzed is the waveform category dimension, the signal analysis result is the waveform category information. If the dimension to be analyzed is the communication protocol dimension and the waveform category dimension, the signal analysis result is the data frame feature information and the waveform category information.

[0089] In some embodiments, the waveform data of the device signal includes waveform data of a device voltage signal, and the analysis of the waveform data to obtain data frame characteristic information of the device signal at the test point in the device under test includes: determining voltage values ​​of multiple signal transmission channels arranged in time sequence based on the waveform data of the device voltage signal, and binarizing the voltage values ​​to obtain voltage characterization values; obtaining first voltage jump characteristic information corresponding to the start bit and second voltage jump characteristic information corresponding to the end bit of the data frame under the set communication protocol; the first voltage jump characteristic information and the second voltage jump characteristic information refer to the jump information of the voltage signal of the data frame in the multiple signal transmission channels; determining third voltage jump characteristic information corresponding to the voltage characterization values ​​of the multiple signal transmission channels at each time point in time sequence; comparing the multiple third voltage jump characteristic information with the first voltage jump characteristic information. A voltage jump characteristic information and the second voltage jump characteristic information are compared respectively; a first time point corresponding to at least one of the third voltage jump characteristic information that is the same as the first voltage jump characteristic information and a second time point corresponding to at least one of the third voltage jump characteristic information that is the same as the second voltage jump characteristic information are determined; in accordance with the time sequence, the voltage characteristic values ​​between each of the first time points and the first second time point located after each of the first time points in the plurality of signal transmission channels are intercepted to obtain at least one data segment; the voltage characteristic values ​​of the plurality of signal transmission channels between each of the first time points and the first second time point located after each of the first time points correspond to one data frame; based on the voltage value corresponding to the voltage characterization value in each of the data segments, the data frame characteristic information of the device signal at the test point in the device under test is obtained.

[0090] In some embodiments, the waveform data is a waveform value. The device signal is a device voltage signal, and accordingly, the waveform value is a voltage value in a time sequence arrangement.

[0091] In some embodiments, the waveform data is a waveform curve. According to the time sequence, the values ​​on the waveform curve are extracted to obtain the voltage values ​​in the time sequence.

[0092] The voltage values ​​were filtered using the Scientific Python Library (SciPy) to remove noise and improve the accuracy of the analysis.

[0093] The set voltage threshold is compared with the voltage value, and the voltage value higher than the set voltage threshold is determined as "1", otherwise it is determined as "0", and the voltage characterization value represented by "0" or "1" is obtained to achieve binary processing. Accordingly, the voltage characterization value corresponding to the voltage value of each signal transmission channel is obtained. The set voltage threshold can be determined by the rated working voltage of the test point. For example, the set voltage threshold is set to the rated working voltage.

[0094] The voltage signals of the start bit and the stop bit of the data frame of the communication protocol on multiple signal transmission channels have voltage jump characteristic information that is different from other functional bits.

[0095] Voltage jump refers to whether the voltage characterization value on each signal transmission channel is continuously 0 or 1, whether it is a rising edge corresponding to a change from 0 to 1 or a falling edge corresponding to a change from 1 to 0.

[0096] Voltage jump characteristic information refers to the voltage jump conditions of multiple signal transmission channels. The voltage jump conditions in the voltage jump characteristic information are arranged according to the arrangement order of the multiple signal transmission channels. For example, the signal transmission channels of the SPI protocol are arranged in the order of MOSI signal transmission channel, MISO signal transmission channel, SCK signal transmission channel and CS / SS signal transmission channel. Correspondingly, the voltage jump characteristic information is the voltage jump conditions corresponding to the MOSI signal transmission channel, MISO signal transmission channel, SCK signal transmission channel and CS / SS signal transmission channel. Such a sequential correspondence makes it easy to compare the voltage jump characteristic information.

[0097] Function bits refer to start bit, stop bit, read bit, write bit, acknowledge bit, address bit, data bit, etc. The start bit is used to identify the beginning of the data frame. The stop bit is used to identify the end of the data frame. The read bit is used to indicate that the current operation is a read operation. The write bit is used to indicate that the current operation is a write operation. The acknowledge bit is used by the receiver to confirm that the data or instruction has been received. The address bit is used to specify the device address in the communication. The data bit is the actual data content transmitted.

[0098] Taking the I2C protocol as an example, its corresponding signal transmission channels are SCL and SDA. The first voltage jump characteristic information of the start bit of the data frame of the I2C protocol is that the voltage characterization value of SCL is 1, and the voltage characterization value of SDA changes from 1 to 0, which is the voltage falling edge; the second voltage jump characteristic information of the stop bit is that the voltage characterization value of SCL is 1, and the voltage characterization value of SDA changes from 0 to 1, which is the voltage rising edge.

[0099] After obtaining the voltage characterization value, the third voltage jump characteristic information corresponding to the voltage characterization values ​​of multiple signal transmission channels at each time point is determined, and the multiple third voltage jump characteristic information obtained are compared in sequence with the first voltage jump characteristic information corresponding to the start bit of the data frame under the set communication protocol and the second voltage jump characteristic information corresponding to the end bit.

[0100] By comparing the voltage jump characteristic information, a first time point corresponding to at least one third voltage jump characteristic information identical to the first voltage jump characteristic information and a second time point corresponding to at least one third voltage jump characteristic information identical to the second voltage jump characteristic information are determined.

[0101] When capturing, it is necessary to capture in chronological order.

[0102] According to the time sequence, a first first time point is determined, and a voltage characterization value between the first first time point and a first second time point after the first first time point in a plurality of signal transmission channels is intercepted to obtain a data segment.

[0103] That is, when intercepting, the voltage characterization value between each first time point and the first second time point after the first time point in the multiple signal transmission channels is intercepted to obtain at least one data segment. The intercepted data segment contains the voltage characterization values ​​of the multiple signal transmission channels corresponding to the first time point and the second time point used during the interception.

[0104] Accordingly, the voltage characteristic values ​​of the plurality of signal transmission channels between each first time point and the first second time point after each first time point correspond to one data frame;

[0105] Each data segment includes a plurality of voltage characterization values, and each voltage characterization value corresponds to a voltage value before binarization processing, that is, each data segment corresponds to a plurality of voltage values.

[0106] The voltage value is the carrier of information in the communication process. Therefore, according to the decoding rules of the communication protocol, that is, the decoding rules corresponding to the encoding rules for converting information into voltage values, the voltage values ​​corresponding to each data segment are decoded to obtain the information carried by the voltage value, that is, the data frame feature information of the test point in the communication segment.

[0107] The data frame characteristic information is characteristic information of different functional bits, such as data transmission content of the data bit, address information of the address bit, read operation information, write operation information, response information of the response bit, and the like.

[0108] Taking I2C as an example, the signal analysis process for obtaining data frame feature information is as follows:

[0109] SciPy is used to filter the voltage values ​​in the read SCL signal transmission channel and the SDA signal transmission channel to make the original data smooth and reduce the interference of data noise on the analysis.

[0110] The rated working voltage As a set voltage threshold, it is used to determine the voltage characterization value. For example, if the rated working voltage is 3.3V, 1.65V can be used as the set voltage threshold, and the voltage characterization value of the voltage value greater than 1.65V is "1", otherwise it is "0".

[0111] In some embodiments, after obtaining the voltage characterization value, the voltage rising edge and voltage falling edge of each signal transmission channel can be determined according to the voltage jump of the voltage characterization value under timing, so as to quickly identify the start bit, stop bit, data bit, etc. and quickly realize decoding.

[0112] In the signal analysis of the I2C protocol, the voltage rising edge and voltage falling edge of the SCL signal transmission channel and the SDA signal transmission channel are determined according to the voltage characterization values. The voltage characterization values, voltage rising edge, and voltage falling edge of SCL and SDA are analyzed to find the start bit and stop bit. The start bit SCL is 1, and the voltage falling edge is when SDA changes from 1 to 0. The stop bit SCL is 1, and the voltage rising edge is when SDA changes from 0 to 1.

[0113] In chronological order, between the start bit and the stop bit of the data segment, at each rising edge of SCL, i.e., the position where the signal changes from 0 to 1, the voltage value corresponding to SDA is read. According to the decoding rules corresponding to the I2C protocol, the read voltage value is decoded to obtain characteristic information such as the data transmission content and address information of the communication segment of the test point, that is, the characteristic information of the data frame is obtained.

[0114] Different communication protocols correspond to different signal lines and different analysis logics.

[0115] In some embodiments, the analyzing the waveform data to obtain the waveform category information of the device signal at the test point in the device under test includes: determining a first waveform morphological feature or a first waveform timing change feature based on the waveform data; matching the first waveform morphological feature with a second waveform morphological feature of a different waveform category to obtain the waveform category information; or matching the first waveform timing change feature with a second waveform timing change feature of a different waveform category to obtain the waveform category information.

[0116] The waveform category information includes one or more category information. The waveform morphological characteristics refer to the peak height, trough depth, waveform width, etc. of the waveform. The waveform timing change characteristics refer to the rise time, fall time, periodicity, frequency, phase, amplitude change, etc. of the waveform.

[0117] If the waveform data is a waveform curve and the dimension to be analyzed is a waveform category dimension, the waveform category information of the device signal at the test point can be determined by the extracted first waveform morphological features and the second waveform morphological features of different waveform categories. If the waveform data is a waveform value and the dimension to be analyzed is a waveform category dimension, the waveform category information of the device signal at the test point can be determined by the extracted first waveform timing change features and the second waveform timing change features of different waveform categories.

[0118] In some embodiments, the waveform curve is saved in the form of a waveform image.

[0119] In some embodiments, the analysis of waveform category dimensions is implemented through a waveform classification model. The waveform image can be directly obtained and used through a measuring device, or it can be obtained from a database through a FAST API server and a hypertext transfer protocol (HTTP). The waveform image is input into the model, and the model will match and classify according to the morphological features of the waveform curve in the waveform image, and after classification, a classification string is output. Subsequently, the classification string output by the model is output to the interactive interface of the user end for display.

[0120] In some embodiments, model training is performed in advance, and the training process of the waveform classification model is as follows:

[0121] Prepare training sample data. The training sample data is divided into training set and validation set, and the ratio of training data to validation data is 8:2. The training set and validation set are stored in the database in the form of folders, so that when the model is trained and updated, the data can be called from the database for training. The training set folder and validation set folder contain images of various waveform categories, and each category can correspond to a subfolder for easy distinction and calling.

[0122] Preprocessing of training data. Waveform images are in different formats. First, convert all images into Red Green Blue (RGB) format, resize the image so that its minimum side is 256 pixels, and then convert the image into a tensor format for easy analysis. In this process, crop an image area of ​​224 pixels × 224 pixels from the center of the image, randomly rotate the image by no more than 5 degrees, select 50% of the images for image flipping, and randomly change the brightness, contrast, and saturation of the image to increase the diversity of the training sample data and improve the model classification ability. Through preprocessing, the image is normalized to match the requirements of model training. The numerical settings in this step are only examples and can be changed according to actual needs.

[0123] Set the initial best accuracy to 0 and specify the path to save the model parameters. Traverse the training set data, calculate the training loss and accuracy, and perform backpropagation and parameter update based on the loss.

[0124] During verification, the verification loss and accuracy are calculated. If the current accuracy exceeds the set accuracy or the previous best accuracy, the current model parameters are saved, the current best model parameters are loaded, and the trained waveform classification model is obtained. The model can be saved to the database and called when needed.

[0125] In some embodiments, the residual network 50 (Residual Network 50, ResNet50) model is used as the initial model for training. PyTorch, an open source machine learning library, is introduced to analyze the image. PyTorch provides powerful GPU acceleration capabilities, making model construction, training, and deployment more efficient and simple.

[0126] In some embodiments, as the method and system are used, the number of images increases, that is, the amount of training sample data available for training increases. Jenkins is introduced to regularly perform model training updates to further improve the classification accuracy of the model.

[0127] During the model training phase and the actual application phase, regular sampling will be conducted to check whether the model's category analysis is correct. If it is incorrect, the staff can correct the classification, and the image with the incorrect recognition will be put into the corresponding training data for the next model training update.

[0128] Step 103: output the signal analysis result to the user terminal.

[0129] After the analysis is completed, the signal analysis results obtained are displayed to the user through the interactive interface of the user end.

[0130] The user can view data frame feature information and / or waveform category information through the interactive interface of the user end.

[0131] In some embodiments, the signal analysis results are output in the form of a Python dictionary array. As described below, the data frame feature information corresponding to the device signal of the test point using the I2C communication protocol is output in the form of a Python dictionary array.

[0132] I2C_PROTOCOL=[

[0133] {

[0134] 'addr':'0x20'

[0135] 'rw':'write'

[0136] 'data':'0x0'

[0137] }

[0138] {

[0139] 'addr':'0x20'

[0140] 'rw':'read'

[0141] 'data':'0x8'

[0142] }

[0143] ].

[0144] The output shows the test point address 0x20, the write operation and the written data 0x0, the read operation and the read data 0x8.

[0145] During signal integrity testing, large PCB projects can be analyzed using the method described in this application, which can reduce the workload of each person by approximately 2 days compared to previous manual analysis.

[0146] By performing signal analysis through this application, labor is liberated, labor costs are reduced, analysis speed is accelerated, signal analysis time is saved, analysis volume is increased, and high-quality signal analysis results can be efficiently output.

[0147] In an embodiment of the present application, in response to an analysis request sent by a user terminal, the waveform data of the device signal under the test point in the device to be tested is obtained from the measuring device, and the data is obtained in a targeted manner to improve efficiency. The data is not obtained manually, which reduces the analysis errors caused by incorrect or incomplete data acquisition, and improves the analysis efficiency and analysis accuracy. Afterwards, based on the set dimension to be analyzed, the waveform data of the device signal is analyzed, and the analysis dimension is clarified, which helps to ensure the correctness and accuracy of the analysis logic, thereby improving the analysis accuracy. Through analysis, the signal analysis results under the test point in the device to be tested under the dimension to be analyzed are obtained and output to the user terminal. After receiving the analysis request, the present application automates the analysis process from the acquisition of waveform data to the output of signal analysis results, reduces the chance of manual intervention, reduces the analysis errors caused by human errors, improves the analysis accuracy, and speeds up the analysis efficiency.

[0148] See also Figure 2 , Figure 2 This is a structural diagram of a signal analysis system provided in an embodiment of the present application. For ease of explanation, only the parts related to the embodiment of the present application are shown.

[0149] The signal analysis system 200 includes: an acquisition module 201 , an analysis module 202 , and an output module 203 .

[0150] The acquisition module 201 is used to respond to the analysis request of the user end and acquire the waveform data of the device signal at the test point in the device under test based on the measuring device; the device signal at the test point corresponds to the set communication protocol.

[0151] The analysis module 202 is used to analyze the waveform data of the device signal based on the set dimension to be analyzed, and obtain the signal analysis result at the test point in the device under test.

[0152] The output module 203 is used to output the signal analysis result to the user terminal.

[0153] In some embodiments, the acquisition module is specifically used to:

[0154] Based on the measuring device, obtaining waveform values ​​of the device signal at the test point at different time points; and / or,

[0155] Based on the measuring device, a waveform curve of the device signal at the test point is obtained.

[0156] Based on a plurality of device measurement channels in the measuring device, the waveform values ​​at different time points are collected; the plurality of device measurement channels are used to respectively collect waveform values ​​of a plurality of signal transmission channels used to transmit the device signal at the test point using the set communication protocol; or,

[0157] The voltage value at a set timing is extracted from the waveform curve corresponding to each device measurement channel sent by the measuring device to obtain the waveform value.

[0158] Sending a waveform curve acquisition command to the measuring device;

[0159] receiving the waveform curve sent by the measuring device; or,

[0160] A waveform curve is drawn based on the waveform values ​​at different time points to obtain the waveform curve.

[0161] In some embodiments, the waveform data of the device signal includes waveform data of a device voltage signal, and the analysis module is specifically used to:

[0162] Analyzing the waveform data to obtain data frame characteristic information of the device signal at the test point in the device under test; and / or,

[0163] The waveform data is analyzed to obtain waveform category information of the device signal at the test point in the device under test.

[0164] Based on the waveform data of the device voltage signal, determine the voltage values ​​of multiple signal transmission channels arranged in time sequence, and perform binarization processing on the voltage values ​​to obtain voltage characterization values;

[0165] Acquire first voltage jump characteristic information corresponding to the start bit and second voltage jump characteristic information corresponding to the end bit of the data frame under the set communication protocol; the first voltage jump characteristic information and the second voltage jump characteristic information refer to the jump information of the voltage signal of the data frame in the plurality of signal transmission channels;

[0166] Determine, in chronological order, third voltage jump characteristic information corresponding to the voltage characterization values ​​of the plurality of signal transmission channels at each time point;

[0167] Comparing the plurality of third voltage jump characteristic information with the first voltage jump characteristic information and the second voltage jump characteristic information respectively;

[0168] Determine a first time point corresponding to at least one third voltage jump characteristic information that is the same as the first voltage jump characteristic information and a second time point corresponding to at least one third voltage jump characteristic information that is the same as the second voltage jump characteristic information;

[0169] According to the time sequence, the voltage characteristic value between each first time point and the first second time point after each first time point in the plurality of the signal transmission channels is intercepted to obtain at least one data segment; the voltage characteristic values ​​of the plurality of the signal transmission channels between each first time point and the first second time point after each first time point correspond to one data frame;

[0170] Based on the voltage value corresponding to the voltage characterization value in each of the data segments, the data frame characteristic information of the device signal at the test point in the device under test is obtained.

[0171] Based on the waveform data, determining a first waveform morphological feature or a first waveform time series change feature;

[0172] The first waveform morphological feature is matched with the second waveform morphological feature of a different waveform category to obtain the waveform category information; or, the first waveform timing change feature is matched with the second waveform timing change feature of a different waveform category to obtain the waveform category information.

[0173] The signal analysis system provided in the embodiment of the present application can implement each process of the embodiment of the above-mentioned signal analysis method and can achieve the same technical effect. To avoid repetition, it will not be described here.

[0174] Figure 3is a structural diagram of an electronic device provided in an embodiment of the present application. As shown in the figure, the electronic device 3 of the embodiment includes: at least one processor 30 ( Figure 3 Only one is shown in the figure), a memory 31, and a computer program 32 stored in the memory 31 and executable on the at least one processor 30, wherein the processor 30 implements the steps of any of the above-mentioned method embodiments when executing the computer program 32.

[0175] The electronic device 3 may be a computing device such as a desktop computer, a notebook, a PDA, or a cloud server. The electronic device 3 may include, but is not limited to, a processor 30 and a memory 31. Those skilled in the art will appreciate that Figure 3 It is only an example of the electronic device 3 and does not constitute a limitation of the electronic device 3. It may include more or fewer components than shown in the figure, or a combination of certain components, or different components. For example, the electronic device may also include input and output devices, network access devices, buses, etc.

[0176] The processor 30 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor, etc.

[0177] The memory 31 may be an internal storage unit of the electronic device 3, such as a hard disk or memory of the electronic device 3. The memory 31 may also be an external storage device of the electronic device 3, such as a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, etc. equipped on the electronic device 3. Further, the memory 31 may also include both an internal storage unit and an external storage device of the electronic device 3. The memory 31 is used to store the computer program and other programs and data required by the electronic device. The memory 31 may also be used to temporarily store data that has been output or is to be output.

[0178] Those skilled in the art can clearly understand that, for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In practical applications, the above-mentioned function allocation can be completed by different functional units and modules as needed, that is, the internal structure of the system can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiment can be integrated in a processing unit, or each unit can exist physically separately, or two or more units can be integrated in one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, which will not be repeated here.

[0179] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0180] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0181] In the embodiments provided in the present application, it should be understood that the disclosed systems / electronic devices and methods can be implemented in other ways. For example, the system / electronic device embodiments described above are merely schematic. For example, the division of the modules or units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, and the indirect coupling or communication connection of the system or unit can be electrical, mechanical or other forms.

[0182] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0183] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0184] If the integrated module / unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present application implements all or part of the processes in the above-mentioned embodiment method, and can also be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium, and the computer program can implement the steps of the above-mentioned various method embodiments when executed by the processor. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, U disk, mobile hard disk, disk, optical disk, computer memory, read-only memory (ROM, Read-Only Memory, ROM), random access memory (Random Access Memory, RAM), electric carrier signal, telecommunication signal and software distribution medium. It should be noted that the content contained in the computer-readable medium can be appropriately increased or decreased according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, computer-readable media do not include electric carrier signals and telecommunication signals.

[0185] The present application implements all or part of the processes in the above-mentioned embodiment method, and may also be implemented through a computer program product. When the computer program product runs on an electronic device, the electronic device can implement the steps in the above-mentioned method embodiments when executing the computer program product.

[0186] The embodiments described above are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, a person skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. A signal analysis method, characterized in that: The method comprises: In response to an analysis request from a user terminal, waveform data of a device signal at a test point in the device under test is obtained based on a measuring device; the device signal at the test point corresponds to a set communication protocol; Based on the set dimension to be analyzed, the waveform data of the device signal is analyzed to obtain the signal analysis result at the test point in the device to be tested; The signal analysis result is output to the user end.

2. The method according to claim 1, characterized in that The step of obtaining waveform data of a device signal at a test point in the device under test based on a measuring device in response to an analysis request from a user terminal includes: Based on the measuring device, obtaining waveform values ​​of the device signal at the test point at different time points; and / or, Based on the measuring device, a waveform curve of the device signal at the test point is obtained.

3. The method according to claim 2, characterized in that The step of obtaining waveform values ​​of the device signal at different time points at the test point based on the measuring device includes: Based on a plurality of device measurement channels in the measuring device, the waveform values ​​at different time points are collected; the plurality of device measurement channels are used to respectively collect waveform values ​​of a plurality of signal transmission channels used to transmit the device signal at the test point using the set communication protocol; or, The voltage value at a set timing is extracted from the waveform curve corresponding to each device measurement channel sent by the measuring device to obtain the waveform value.

4. The method according to claim 2, characterized in that: The step of obtaining the waveform curve of the device signal at the test point based on the measuring device includes: Sending a waveform curve acquisition command to the measuring device; receiving the waveform curve sent by the measuring device; or, A waveform curve is drawn based on the waveform values ​​at different time points to obtain the waveform curve.

5. The method according to claim 1, characterized in that: The step of analyzing the waveform data of the device signal based on the set dimension to be analyzed to obtain the signal analysis result at the test point in the device to be tested includes: Analyzing the waveform data to obtain data frame characteristic information of the device signal at the test point in the device under test; and / or, The waveform data is analyzed to obtain waveform category information of the device signal at the test point in the device under test.

6. The method according to claim 5, characterized in that The waveform data of the device signal includes waveform data of a device voltage signal, and the analyzing the waveform data to obtain data frame feature information of the device signal at the test point in the device under test includes: Based on the waveform data of the device voltage signal, determine the voltage values ​​of multiple signal transmission channels arranged in time sequence, and perform binarization processing on the voltage values ​​to obtain voltage characterization values; Acquire first voltage jump characteristic information corresponding to the start bit and second voltage jump characteristic information corresponding to the end bit of the data frame under the set communication protocol; the first voltage jump characteristic information and the second voltage jump characteristic information refer to the jump information of the voltage signal of the data frame in the plurality of signal transmission channels; Determine, in chronological order, third voltage jump characteristic information corresponding to the voltage characterization values ​​of the plurality of signal transmission channels at each time point; Comparing the plurality of third voltage jump characteristic information with the first voltage jump characteristic information and the second voltage jump characteristic information respectively; Determine a first time point corresponding to at least one third voltage jump characteristic information that is the same as the first voltage jump characteristic information and a second time point corresponding to at least one third voltage jump characteristic information that is the same as the second voltage jump characteristic information; According to the time sequence, the voltage characteristic value between each first time point and the first second time point after each first time point in the plurality of the signal transmission channels is intercepted to obtain at least one data segment; the voltage characteristic values ​​of the plurality of the signal transmission channels between each first time point and the first second time point after each first time point correspond to one data frame; Based on the voltage value corresponding to the voltage characterization value in each of the data segments, the data frame characteristic information of the device signal at the test point in the device under test is obtained.

7. The method according to claim 5, characterized in that The analyzing the waveform data to obtain the waveform category information of the device signal at the test point in the device under test includes: Based on the waveform data, determining a first waveform morphological feature or a first waveform time series change feature; The first waveform morphological feature is matched with the second waveform morphological feature of a different waveform category to obtain the waveform category information; or, the first waveform timing change feature is matched with the second waveform timing change feature of a different waveform category to obtain the waveform category information.

8. A signal analysis system, characterized in that: include: An acquisition module, used for acquiring waveform data of a device signal at a test point in the device under test based on a measuring device in response to an analysis request from a user terminal; The device signal under the test point corresponds to a set communication protocol; An analysis module, used to analyze the waveform data of the device signal based on the set dimension to be analyzed, and obtain the signal analysis result at the test point in the device under test; The output module is used to output the signal analysis result to the user end.

9. An electronic device, characterized in that: The electronic device comprises a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the electronic device implements the method according to any one of claims 1 to 7.

10. A computer program product, characterized in that The invention comprises a computer program which, when executed, causes the method according to any one of claims 1 to 7 to be performed.

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