Method and device for repairing local defects of perovskite photovoltaic module

Abstract

The invention discloses a method and a device for repairing local defects of a perovskite photovoltaic module, and belongs to the field of perovskite solar cells. The method utilizes an ink-jet printing technology to repair local defects of a perovskite layer in a large-area perovskite photovoltaic module, and specifically comprises the following steps: carrying out first detection on the perovskite layer in a first to-be-detected perovskite photovoltaic module, and determining position information and geometric information of the local defects of the perovskite layer based on information obtained through detection, and carrying out ink-jet repair treatment on the local defect position, carrying out second detection on a perovskite layer in a second to-be-detected perovskite photovoltaic module obtained through repair, and judging whether the second to-be-detected perovskite photovoltaic module is qualified or not. According to the invention, the functional repair material is used to carry out accurate and efficient repair and performance enhancement treatment on the region with local defects in the perovskite layer, so that the photoelectric conversion efficiency and long-term stability of the perovskite photovoltaic module can be improved.

Description

Technical Field

[0001] The present invention belongs to the field of perovskite solar cells, and in particular relates to a method and device for repairing local defects of a perovskite photovoltaic module. Background Art

[0002] With the continuous advancement of solar cell technology, the third generation of solar cells has emerged. The third generation of solar cells refers to solar cells with a perovskite crystal structure, which uses perovskite-type organic metal halide semiconductors as light-absorbing materials to form a new concept of solar cells with a perovskite crystal structure. Perovskite solar cells have received widespread attention in recent years due to their advantages such as high efficiency, low cost and processability. The excellent optoelectronic properties of perovskite materials give them great application potential in the photovoltaic field.

[0003] like Figure 1 The figure shows the film structure of the currently common perovskite solar cell, which mainly uses TCO glass 8 as a substrate, deposits a hole transport layer 7, a perovskite layer 6, an electron transport layer 5, and an electrode layer 4 on the TCO glass 8, and then laminates butyl rubber 2, POE film 3 and cover glass 1 for packaging, and finally laminates tempered glass 9 on the back of the TCO glass 8.

[0004] In the process of preparing large-area perovskite photovoltaic modules, local areas of the perovskite layer in the perovskite photovoltaic module are prone to defects such as film unevenness, performance degradation, and crystal degradation. These problems can easily lead to performance degradation of the perovskite photovoltaic module, and even cause the perovskite photovoltaic module to fail.

[0005] At present, in order to improve the efficiency and long-term stability of perovskite photovoltaic modules, the method of re-coating the entire perovskite layer film is usually adopted to repair the locations where the perovskite layer in the perovskite photovoltaic module has local defects. However, in this case, the entire process is usually complicated and wastes a lot of materials. Summary of the invention

[0006] In order to overcome the shortcomings of the above-mentioned prior art, the purpose of the present invention is to provide a method and device for repairing local defects in the perovskite layer of a perovskite photovoltaic module, and to perform inkjet repair treatment on the locations of defects detected in the perovskite layer of a large-area perovskite photovoltaic module to improve the long-term stability of the module, while also improving the production efficiency of the module and reducing production costs.

[0007] In order to achieve the above object, the present invention adopts the following technical solutions: The first object of the present invention is to disclose a method for repairing local defects of a perovskite photovoltaic module, which specifically comprises the following steps: Step S1, performing a first detection on a perovskite layer in a first perovskite photovoltaic component to be detected, and obtaining detection information of the first perovskite photovoltaic component to be detected; Step S2: based on the detection information of the first perovskite photovoltaic component to be detected, determining the position information of the local defects of the perovskite layer in the first perovskite photovoltaic component to be detected and the geometric information of the local defects; Step S3, based on the position information of the local defect and the geometric information of the local defect, performing inkjet repair processing on the position of the local defect of the perovskite layer in the first perovskite photovoltaic component to be detected, to obtain a second perovskite photovoltaic component to be detected; Step S4: performing a second test on the perovskite layer in the second perovskite photovoltaic component to be tested to determine whether the second perovskite photovoltaic component to be tested is qualified.

[0008] Furthermore, in step S2, based on the detection information of the first perovskite photovoltaic component to be detected, determining the position information of the local defects of the perovskite layer in the first perovskite photovoltaic component to be detected and the geometric information of the local defects includes: Comparing the detection information of the first perovskite photovoltaic module to be detected with the detection information of a non-defective perovskite photovoltaic module to determine the center point position of the local defect of the perovskite layer in the first perovskite photovoltaic module to be detected; Determining geometric information of the local defect based on the center point position of the local defect; The geometric information of the local defect refers to: the area of ​​the local defect, the depth of the local defect, and the shape of the local defect.

[0009] Furthermore, in step S3, based on the position information of the local defect and the geometric information of the local defect, inkjet repair processing is performed on the position of the local defect of the perovskite layer in the first perovskite photovoltaic component to be detected to obtain a second perovskite photovoltaic component to be detected, including: Based on the position information of the local defect and the geometric information of the local defect, determining a first area to be repaired and / or a second area to be repaired; the area of ​​the second area to be repaired is larger than the area of ​​the first area to be repaired, and the depth of the second area to be repaired is larger than the depth of the first area to be repaired; The first area to be repaired is subjected to a first inkjet repair process, and / or the second area to be repaired is subjected to a second inkjet repair process, so as to obtain the second perovskite photovoltaic component to be inspected.

[0010] Further, performing a first inkjet repair process on the first area to be repaired includes: Depositing a single layer of first repair material on the first area to be repaired; After depositing the first repair material on the first area to be repaired, the first area to be repaired is annealed, the annealing temperature ranges from 100° C. to 150° C., and the annealing time ranges from 10 min to 40 min.

[0011] Furthermore, the deposition amount of the first repair material is 0.1 µL / µm²~0.5 µL / µm²; the first repair material includes: one of a halide dopant, a peroxide or an antioxidant, a passivator material, and an organic coordination compound.

[0012] Further, performing a second inkjet repair process on the second area to be repaired includes: Depositing multiple layers of second repair material on the second area to be repaired; After depositing multiple layers of the second repair material on the second area to be repaired, the second area to be repaired is annealed, the annealing temperature ranges from 100°C to 150°C, and the annealing time ranges from 10min to 40min.

[0013] Further, depositing multiple layers of second repair material on the second area to be repaired includes: depositing a layer of second repair material on the second area to be repaired; After depositing a layer of the second repair material on the second repair area, the second repair area is dried at a temperature of 55° C. to 65° C. and for a time of 3 min to 7 min; A layer of second repair material is deposited on the second to-be-repaired area after the drying process.

[0014] Furthermore, a single layer deposition amount of the second repair material is 0.5 µL / µm²~2 µL / µm²; the second repair material includes: one of a halide dopant and an organic coordination compound.

[0015] Furthermore, after performing a second inspection on the perovskite layer in the second perovskite photovoltaic component to be inspected to determine whether the second perovskite photovoltaic component to be inspected is qualified, the method further includes: If the second perovskite photovoltaic component to be tested is determined to be qualified, the second perovskite photovoltaic component to be tested is transported to the next process; If it is determined that the second perovskite photovoltaic module to be tested is unqualified, steps S1 to S4 are repeated.

[0016] The second object of the present invention is to provide a device for repairing local defects of a perovskite photovoltaic module, comprising: A detection module, used to perform a first detection on the perovskite layer in the first perovskite photovoltaic component to be detected, and obtain detection information of the first perovskite photovoltaic component to be detected; A determination module, configured to determine, based on the detection information of the first perovskite photovoltaic component to be detected, position information of a local defect of the perovskite layer in the first perovskite photovoltaic component to be detected and geometric information of the local defect; A repair module, configured to perform inkjet repair processing on the location of the local defect of the perovskite layer in the first perovskite photovoltaic component to be detected based on the location information of the local defect and the geometric information of the local defect, so as to obtain a second perovskite photovoltaic component to be detected; The judgment module is used to perform a second detection on the perovskite layer in the second perovskite photovoltaic component to be detected, and determine whether the second perovskite photovoltaic component to be detected is qualified.

[0017] Compared with the prior art, the present invention has the following beneficial effects: The present invention provides a method for repairing local defects of a perovskite photovoltaic module, which can accurately locate the local area of ​​the perovskite layer in a large-area perovskite photovoltaic module with defects, and carry out targeted repairs on this area. Among them, by using a repair material to deposit the defective area of ​​the perovskite layer, and after the repair material is deposited to the defective area, annealing treatment is performed, so that the local defects in the perovskite layer can be effectively repaired, and the photoelectric conversion efficiency of the perovskite photovoltaic module can be improved, and the long-term stability of the repaired area can be enhanced, thereby avoiding the performance degradation of the perovskite photovoltaic module during actual use.

[0018] At the same time, there is no need to re-coat the entire perovskite layer, which avoids material waste, helps reduce manufacturing costs in large-scale production, and improves repair efficiency. The repair method provided by this application can efficiently repair local defects in the perovskite layer, improve the photoelectric conversion efficiency and stability of the perovskite photovoltaic module, and has significant practical value and broad application prospects.

[0019] Furthermore, the method for repairing local defects of perovskite photovoltaic modules provided by the present invention can perform single-layer or multi-layer repair for different types of defects by pre-collecting defect size information, and can effectively repair different types of defects by adjusting the inkjet equipment parameters and adjusting the deposition amount of repair materials for different types of defects. For the first area to be repaired, that is, the smaller defect area, a small amount of single-layer deposition of repair material is performed, which ensures a good defect repair effect while ensuring a high flatness of the first area to be repaired after repair; for the second area to be repaired, that is, the larger defect area, a strategy of depositing repair materials layer by layer is performed, which can ensure the consistency between layers and avoid uneven crystal structure caused by the deposition of a large amount of repair materials during the drying process.

[0020] Furthermore, the method for repairing local defects of perovskite photovoltaic modules provided by the present invention has strong universality. By selecting different repair material solutes, solvents and additives, it can repair different matrix materials and defect types, guide local recrystallization, improve interface stability and reduce non-radiative recombination, and enhance the long-term stability of the device.

[0021] The method for repairing local defects of perovskite photovoltaic modules provided by the present invention is suitable for the production and repair of large-area perovskite photovoltaic modules, especially can be applied to perovskite modules on rigid substrates and perovskite modules on flexible substrates, and can effectively improve the production efficiency of perovskite photovoltaic modules, reduce production costs and improve the long-term stability of the modules. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 This is a schematic diagram of the film structure of the current perovskite solar cell; Figure 2 is a flow chart of the detection method; Figure 3 is the grain size and film thickness diagram of the perovskite layer before and after inkjet repair treatment; Figure 4 It is the voltage-current density curve of the perovskite photovoltaic module before and after the inkjet repair treatment.

[0023] Among them: cover glass 1, butyl rubber 2, POE film 3, electrode layer 4, electron transport layer 5, perovskite layer 6, hole transport layer 7, TCO glass 8, tempered glass 9. DETAILED DESCRIPTION

[0024] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, device, product or equipment that includes a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or equipment.

[0025] The specific implementation of the present invention is further described below in conjunction with examples, but the implementation and protection of the present invention are not limited thereto. It should be noted that if there are processes that are not particularly described in detail below, they can be implemented or understood by those skilled in the art with reference to the prior art. If the manufacturer of the reagents or instruments used is not indicated, they are deemed to be conventional products that can be purchased commercially.

[0026] Please refer to Figure 2 , Figure 2 This is a flow chart of a method for repairing local defects of a perovskite photovoltaic module provided in an embodiment of the present application. The method for repairing local defects of a perovskite photovoltaic module may include: Step S1, performing a first detection on a perovskite layer in a first perovskite photovoltaic component to be detected, and obtaining detection information of the first perovskite photovoltaic component to be detected.

[0027] In an embodiment of the present application, in one possible implementation, a high-resolution optical detection device can be used to fully scan the perovskite layer in the first perovskite photovoltaic component to be detected, and then the computer device can obtain the detection information of the first perovskite photovoltaic component to be detected. The detection information of the first perovskite photovoltaic component to be detected can be: a picture containing the perovskite layer in the first perovskite photovoltaic component to be detected.

[0028] In another possible implementation, the perovskite layer in the first perovskite photovoltaic component to be detected can be first detected by any one of optical microscopy, infrared imaging, EL imaging, and PL imaging to obtain detection information of the first perovskite photovoltaic component to be detected. This embodiment of the present application is not limited to this.

[0029] Step S2: based on the detection information of the first perovskite photovoltaic component to be detected, determine the position information of the local defects of the perovskite layer in the first perovskite photovoltaic component to be detected and the geometric information of the local defects.

[0030] In the present application, after obtaining the detection information of the first perovskite photovoltaic component to be detected, it can be sent directly to a computer device, so that the computer device can obtain the detection information of the first perovskite photovoltaic component to be detected at regular intervals. Afterwards, the computer device can compare the detection information of the first perovskite photovoltaic component to be detected with the information of the defect-free perovskite photovoltaic component to determine the location information of the local defects in the perovskite layer in the first perovskite photovoltaic component to be detected.

[0031] Then, based on the position information of the local defects of the perovskite layer in the perovskite photovoltaic module, the detected local defect location can be further processed to generate detailed geometric information of the local defects. For example, the detected local defect location can be further imaged to generate detailed geometric information of the local defects.

[0032] Here, the position information of the local defect of the perovskite layer in the first perovskite photovoltaic module to be detected can be: the center point position coordinates of the local defect of the perovskite layer in the first perovskite photovoltaic module to be detected. The geometric information of the local defect of the perovskite layer in the first perovskite photovoltaic module to be detected can be: the area of ​​the local defect, the depth of the local defect, and the shape of the local defect.

[0033] Step S3: Based on the position information of the local defect and the geometric information of the local defect, inkjet repair processing is performed on the position of the local defect of the perovskite layer in the first perovskite photovoltaic component to be inspected to obtain a second perovskite photovoltaic component to be inspected.

[0034] It should be noted that the computer device can determine the first area to be repaired and / or the second area to be repaired based on the geometric information of the local defect and the location information of the local defect. Here, the area of ​​the second area to be repaired can be larger than the area of ​​the first area to be repaired, and the depth of the second area to be repaired can be larger than the depth of the first area to be repaired.

[0035] For example, the area of ​​the first area to be repaired can range from 0.1 mm² to 1 mm², the depth of the first area to be repaired is usually less than 10% of the thickness of the perovskite layer, the shape of the first area to be repaired is usually dot-shaped or has tiny scratches, and the crystals of the first area to be repaired are specifically characterized by slight crystal degradation.

[0036] The area of ​​the second area to be repaired can range from 1 mm² to 100 mm². The depth of the second area to be repaired is usually in the range of 10% to 30% of the thickness of the perovskite layer. The shape of the second area to be repaired is usually a flake defect. The crystals in the second area to be repaired may be partially damaged, and the edges of the damaged crystals are more obvious.

[0037] In this application, different inkjet repair treatment methods are required for different areas to be repaired. The embodiments of this application will be exemplified by the following two cases: In the first case, the computer device determines that the repair area is the first area to be repaired based on the geometric information of the local defect and the position information of the local defect.

[0038] In this case, the computer device can synchronize the geometric information of the local defect and the position information of the local defect to the control system in the inkjet printing device, and then the control system in the inkjet printing device can accurately locate the first area to be repaired according to the geometric information of the local defect and the position information of the local defect. It should be noted that the inkjet printing device should have high-precision positioning and micron-level material deposition capabilities to ensure the accuracy of the processing.

[0039] The inkjet print head in the inkjet printing device can move to the first area to be repaired according to the position information of the local defect synchronized by the control system, and adjust the specific parameters of the first repair material to be deposited by the inkjet print head according to the geometric information of the local defect synchronized by the control system. Thereafter, the pre-set first repair material is accurately deposited in the first area to be repaired.

[0040] Here, the deposition amount of the first repair material may be 0.1 µL / µm² to 0.5 µL / µm². It should be noted that, since the area of ​​the first region to be repaired may be small, the deposition amount of the first repair material needs to be small, so as to avoid uneven thickness between the first region to be repaired and other regions after repair due to excessive deposition of the first repair material.

[0041] The first repair material may include: a first repair solute and a solvent. The first repair solute may include: one of a halide dopant, a peroxide or an antioxidant, a passivator material, and an organic coordination compound.

[0042] For example, the halide dopant may include: bromide, chloride and other halides, which can promote local recrystallization and local defect repair in the first area to be repaired, improve the stability of the interface of the perovskite layer and reduce non-radiative recombination, for example, lead bromide and formamidinium bromide.

[0043] The peroxide or antioxidant may include: hydrogen iodide, zinc iodide and other substances, which can repair the oxidation defects in the first area to be repaired, thereby enhancing the long-term stability of the perovskite photovoltaic module.

[0044] The passivator material may include, for example, fullerene derivatives (PCBM) or zwitterionic compounds (eg, copper phthalocyanine), which may be deposited on the surface of the first region to be repaired, thereby reducing local defects in the first region to be repaired and improving the charge transfer performance of the perovskite photovoltaic module.

[0045] Organic coordination compounds: such as quaternary ammonium salt compounds (such as FAI), which can effectively passivate local defects on the surface of the first area to be repaired, thereby reducing carrier recombination and improving the photoelectric performance of the perovskite photovoltaic module.

[0046] It should be noted that the solvent in the first repair material may be: solvents such as dimethyl sulfoxide (DMSO) and N-methylpyrrolidone (NMP), which are helpful to optimize the recrystallization process of the first area to be repaired during the inkjet printing process.

[0047] It should also be noted that additives may be added to the first repair material: for example, ammonium chloride (NH 4Cl) or potassium chloride (KCl), these materials can improve the uniformity and stability of the perovskite layer film by inducing the crystal growth direction of the perovskite and increasing the grain size.

[0048] Here, after depositing the first repair material on the first area to be repaired, the first area to be repaired is locally annealed, or after depositing the first repair material on the first area to be repaired, the entire perovskite layer is annealed to obtain a second perovskite photovoltaic module to be tested. The annealing temperature ranges from 100°C to 150°C, and the annealing time ranges from 10 minutes to 40 minutes.

[0049] In this case, the deposited first repair material is crystallized by precisely controlling the annealing temperature and the annealing time, so that a uniform and dense perovskite crystal structure can be formed in the first area to be repaired.

[0050] In the second case, the computer device determines that the repair area is the second area to be repaired based on the geometric information of the local defect and the position information of the local defect.

[0051] In this case, the computer device can synchronize the geometric information of the local defect and the position information of the local defect to the control system in the inkjet printing device, and then the control system in the inkjet printing device can accurately locate the second area to be repaired according to the geometric information of the local defect and the position information of the local defect. It should be noted that the inkjet printing device should have high-precision positioning and micron-level material deposition capabilities to ensure the accuracy of the processing.

[0052] The inkjet print head in the inkjet printing device can move to the second area to be repaired according to the position information of the local defect synchronized by the control system, and adjust the specific parameters of the second repair material to be deposited by the inkjet print head according to the geometric information of the local defect synchronized by the control system. After that, the pre-set second repair material is accurately deposited in the first area to be repaired multiple times.

[0053] In the present application, after depositing a layer of the second repair material on the second area to be repaired, the second area to be repaired needs to be dried. After that, a layer of the second repair material is further deposited on the second area to be repaired after the drying process. The drying process temperature is 55°C to 65°C, and the drying process time is 3min to 7min. For example, the drying process temperature can be 60°C, and the drying process time can be 5min.

[0054] It should be noted that the deposition amount of each layer of the second repair material can be 0.5µL / µm²-2 µL / µm². Since the area of ​​the second area to be repaired is large, it is necessary to deposit multiple layers of the second repair material. In this case, through layer-by-layer deposition and intermediate drying processes, it can be ensured that the thickness and structure of the repaired second area to be repaired match the original perovskite layer.

[0055] The second repair material may include: a second repair solute and a solvent. The second repair solute may include: one of a halide dopant and an organic coordination compound.

[0056] For example, the halide dopant may include: bromide, chloride and other halides, which can promote local recrystallization and local defect repair of the second area to be repaired, improve the stability of the perovskite layer interface and reduce non-radiative recombination, for example, lead bromide and formamidinium bromide.

[0057] Organic coordination compounds: such as quaternary ammonium salt compounds (such as FAI), which can effectively passivate local defects on the surface of the second area to be repaired, thereby reducing carrier recombination and improving the photoelectric performance of perovskite photovoltaic modules.

[0058] It should be noted that the solvent in the second repair material may be: solvents such as dimethyl sulfoxide (DMSO) and N-methylpyrrolidone (NMP), which are helpful to optimize the recrystallization process of the second area to be repaired during the inkjet printing process.

[0059] It should also be noted that additives may be added to the second repair material: for example, ammonium chloride (NH 4 Cl) or potassium chloride (KCl), these materials can improve the uniformity and stability of the perovskite layer film by inducing the crystal growth direction of the perovskite and increasing the grain size.

[0060] Here, after depositing the second repair material on the second area to be repaired, the second area to be repaired is locally annealed, or after depositing the second repair material on the second area to be repaired, the entire perovskite layer is annealed to obtain a second perovskite photovoltaic module to be tested. The annealing temperature ranges from 100°C to 150°C, and the annealing time ranges from 10 minutes to 40 minutes.

[0061] In this case, the deposited second repair material is crystallized by precisely controlling the annealing temperature and annealing time, so that a uniform and dense perovskite crystal structure can be formed in the second area to be repaired.

[0062] Step S4: perform a second test on the perovskite layer in the second perovskite photovoltaic component to be tested to determine whether the second perovskite photovoltaic component to be tested is qualified.

[0063] Specifically, the second perovskite photovoltaic module to be tested is fully tested again to ensure that the material uniformity, thickness and photoelectric performance of the first repair area and / or the second repair area meet the expected standards. If the repair quality of the second perovskite photovoltaic module to be tested does not meet the standards, the above-mentioned repair method steps can be repeated.

[0064] The embodiment of the present application also provides a device for repairing local defects of a perovskite photovoltaic module, comprising: A detection module, used to perform a first detection on the perovskite layer in the first perovskite photovoltaic component to be detected, and obtain detection information of the first perovskite photovoltaic component to be detected; A determination module, configured to determine, based on the detection information of the first perovskite photovoltaic component to be detected, the position information of the local defects of the perovskite layer in the first perovskite photovoltaic component to be detected and the geometric information of the local defects; A repair module, for performing inkjet repair processing on the location of the local defect of the perovskite layer in the first perovskite photovoltaic component to be detected based on the location information of the local defect and the geometric information of the local defect, so as to obtain a second perovskite photovoltaic component to be detected; The judgment module is used to perform a second detection on the perovskite layer in the second perovskite photovoltaic component to be detected, and determine whether the second perovskite photovoltaic component to be detected is qualified.

[0065] The present application also provides a computer device. The computer device may include: a processor and a memory. The memory stores at least one instruction, at least one program, a code set or an instruction set, and the at least one instruction, at least one program, a code set or an instruction set is loaded and executed by the processor to implement Figure 2 Some steps in the method of repairing local defects of perovskite photovoltaic modules are shown.

[0066] The present invention also provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, the specific module of the aforementioned device for repairing local defects of the perovskite photovoltaic module can be implemented to control the relevant equipment to repair the local defects of the perovskite photovoltaic module. Specifically, it is a computer-readable storage medium (Memory), which is a memory device in a terminal device for storing programs and data. It can be understood that the computer-readable storage medium here can include both the built-in storage medium in the terminal device and the extended storage medium supported by the terminal device. The computer-readable storage medium provides a storage space, which stores the operating device of the terminal. In addition, one or more instructions suitable for being loaded and executed by the processor are also stored in the storage space. These instructions can be one or more computer programs (including program codes). It should be noted that the computer-readable storage medium here can be a high-speed RAM memory or a non-volatile memory (Non-Volatile Memory), such as at least one disk memory.

[0067] Example The following describes the specific implementation examples.

[0068] During the production and preparation process of large-area perovskite photovoltaic modules, it was found that the first perovskite photovoltaic module to be tested had a significant efficiency decline in the photoelectric performance test, and its photoelectric conversion efficiency dropped from 20% to 17%.

[0069] Here, after a comprehensive scan of the perovskite layer in the first perovskite photovoltaic module to be inspected using a high-resolution optical inspection device, the computer equipment obtains a detection image of the perovskite layer in the first perovskite photovoltaic module to be inspected.

[0070] First, the computer equipment compares the detection image of the perovskite layer in the first perovskite photovoltaic module to be tested with the image of the perovskite layer in the defect-free perovskite photovoltaic module, confirms the location and nature of the local defect, records the area and shape of the local defect, and digitizes the detected local defect information through the computer equipment. Among them, the local defect position information is generated as follows: the coordinates of the center point of the local defect are (10 mm, 15 mm); the defect shape geometric data is generated: the area is about 5 mm², the depth reaches 25% of the thickness of the perovskite layer film, and the shape is an irregular polygon.

[0071] The computer device analyzes the geometric information of the local defect and the position information of the local defect, and determines the area where the local defect is located as the second area to be repaired. Afterwards, the computer device synchronizes the geometric information of the local defect and the position information of the local defect to the control system in the inkjet printing device, and then the control system in the inkjet printing device accurately locates the second area to be repaired according to the geometric information of the local defect and the position information of the local defect. The inkjet printing device used in this embodiment has high-precision positioning and micron-level material deposition capabilities, which can ensure the accuracy of the processing.

[0072] After that, the staff can use the passivation material ammonium thiocyanate (NH 4 SCN) was used as the solute of the repair material and isopropanol was used as the solvent to prepare a second repair material with a concentration of 0.5 mg / mL for inkjet repair treatment.

[0073] The inkjet print head in the inkjet printing device moves to the center coordinates (10 mm, 15 mm) of the second defect to be repaired according to the position information of the local defect synchronized by the control system, and sets the inkjet parameters to a droplet size of 10 µm and a deposition speed of 1 mm / s, and performs a two-layer printing repair: Printing the first layer: Transfer the first perovskite photovoltaic module to be tested from the hot plate to the inkjet station for fixing, and use an inkjet machine to drop the repair material ammonium thiocyanate-isopropanol solution on the defective area, with a deposition amount of 0.5µL / µm²~2 µL / µm². After the dropwise addition is completed, place the first perovskite photovoltaic module to be tested on the hot plate for drying, heat it to 60°C, and dry it for 5 minutes; Printing the second layer: Transfer the first perovskite photovoltaic module to be tested from the hot plate to the inkjet station for fixing, and continue to use the inkjet machine to apply the repair material ammonium thiocyanate-isopropanol solution to the upper layer of the first printed repair layer in the defective area, with a deposition amount of 0.5µL / µm²~2 µL / µm². After the addition is completed, transfer the first perovskite photovoltaic module to be tested to the hot plate for drying, heat it to 60°C, and dry it for 5 minutes.

[0074] The first perovskite photovoltaic module to be tested after the above treatment is annealed in an air atmosphere at 120° C. for 30 minutes to obtain a second perovskite photovoltaic module to be tested.

[0075] After the repair is completed, the high-resolution optical inspection device is used again to conduct a comprehensive scan of the perovskite layer film surface of the second perovskite photovoltaic module to be inspected to confirm that the defect has been repaired.

[0076] Specifically, please refer to Figure 3 ,from Figure 3It can be seen that the grain size of the area with local defects in the perovskite layer has increased significantly after inkjet repair treatment, and the thickness has increased. In this way, it can be ensured that the crystallization performance of the area with local defects in the perovskite layer is enhanced after inkjet repair treatment, and the defect density of the area with local defects in the perovskite layer is suppressed.

[0077] Please refer to Figure 4 ,from Figure 4 It can be seen that the voltage and current of the repaired perovskite photovoltaic module have increased. When the voltage and current are improved, the photoelectric conversion efficiency of the perovskite photovoltaic module will also increase. After the second area to be repaired in the perovskite photovoltaic module is repaired by the above-mentioned method for repairing local defects of the perovskite photovoltaic module, the photoelectric conversion efficiency of the perovskite photovoltaic module is restored to a level close to the original level, and the photoelectric conversion efficiency is increased by about 12%, from 17.64% to 19.84%. The stability and photoelectric performance of the second area to be repaired in the perovskite photovoltaic module are significantly improved.

[0078] It should be noted that after long-term accelerated aging testing at a temperature of 85°C and a relative humidity of 85% for 1000 hours, the perovskite photovoltaic modules after local defect repair performed well in a high temperature and high humidity environment with no obvious performance degradation.

[0079] The above contents are only for explaining the technical idea of ​​the present invention and cannot be used to limit the protection scope of the present invention. Any changes made on the basis of the technical solution in accordance with the technical idea proposed by the present invention shall fall within the protection scope of the claims of the present invention.

Claims

1. A method for repairing local defects of a perovskite photovoltaic module, characterized in that: The following steps are involved: Step S1, performing a first detection on a perovskite layer in a first perovskite photovoltaic component to be detected, and obtaining detection information of the first perovskite photovoltaic component to be detected; Step S2: based on the detection information of the first perovskite photovoltaic component to be detected, determining the position information of the local defects of the perovskite layer in the first perovskite photovoltaic component to be detected and the geometric information of the local defects; Step S3, based on the position information of the local defect and the geometric information of the local defect, performing inkjet repair processing on the position of the local defect of the perovskite layer in the first perovskite photovoltaic component to be detected, to obtain a second perovskite photovoltaic component to be detected; Step S4: performing a second test on the perovskite layer in the second perovskite photovoltaic component to be tested to determine whether the second perovskite photovoltaic component to be tested is qualified.

2. The method according to claim 1, characterized in that The step S2 determines the position information and geometric information of the local defects of the perovskite layer in the first perovskite photovoltaic component to be detected based on the detection information of the first perovskite photovoltaic component to be detected, including: Comparing the detection information of the first perovskite photovoltaic module to be detected with the detection information of a non-defective perovskite photovoltaic module to determine the center point position of the local defect of the perovskite layer in the first perovskite photovoltaic module to be detected; Determining geometric information of the local defect based on the center point position of the local defect; The geometric information of the local defect refers to: the area of ​​the local defect, the depth of the local defect, and the shape of the local defect.

3. The method according to claim 1, characterized in that In step S3, based on the position information of the local defect and the geometric information of the local defect, inkjet repair processing is performed on the position of the local defect of the perovskite layer in the first perovskite photovoltaic component to be detected to obtain a second perovskite photovoltaic component to be detected, including: Based on the position information of the local defect and the geometric information of the local defect, determining a first area to be repaired and / or a second area to be repaired; the area of ​​the second area to be repaired is larger than the area of ​​the first area to be repaired, and the depth of the second area to be repaired is larger than the depth of the first area to be repaired; The first area to be repaired is subjected to a first inkjet repair process, and / or the second area to be repaired is subjected to a second inkjet repair process, so as to obtain the second perovskite photovoltaic component to be inspected.

4. The method according to claim 3, characterized in that Performing a first inkjet repair process on the first area to be repaired includes: Depositing a single layer of first repair material on the first area to be repaired; After depositing the first repair material on the first area to be repaired, the first area to be repaired is annealed, the annealing temperature ranges from 100° C. to 150° C., and the annealing time ranges from 10 min to 40 min.

5. The method according to claim 4, characterized in that The deposition amount of the first repair material is 0.1 µL / µm²~0.5 µL / µm²; the first repair material includes: one of a halide dopant, a peroxide or an antioxidant, a passivator material, and an organic coordination compound.

6. The method according to claim 3, characterized in that: Performing a second inkjet repair process on the second area to be repaired includes: Depositing multiple layers of second repair material on the second area to be repaired; After depositing multiple layers of the second repair material on the second area to be repaired, the second area to be repaired is annealed, the annealing temperature ranges from 100°C to 150°C, and the annealing time ranges from 10min to 40min.

7. The method according to claim 6, characterized in that Depositing multiple layers of second repair material on the second area to be repaired, comprising: depositing a layer of second repair material on the second area to be repaired; After depositing a layer of the second repair material on the second repair area, the second repair area is dried at a temperature of 55° C. to 65° C. and for a time of 3 min to 7 min; A layer of second repair material is deposited on the second to-be-repaired area after the drying process.

8. The method according to claim 6, characterized in that The single layer deposition amount of the second repair material is 0.5 µL / µm²~2 µL / µm²; The second repair material includes: one of a halide dopant and an organic coordination compound.

9. The method according to any one of claims 1 to 8, characterized in that: After performing a second test on the perovskite layer in the second perovskite photovoltaic component to be tested to determine whether the second perovskite photovoltaic component to be tested is qualified, the method further includes: If the second perovskite photovoltaic component to be tested is determined to be qualified, the second perovskite photovoltaic component to be tested is transported to the next process; If it is determined that the second perovskite photovoltaic module to be tested is unqualified, steps S1 to S4 are repeated.

10. A device for repairing local defects of a perovskite photovoltaic module, characterized in that: include: A detection module, used to perform a first detection on the perovskite layer in the first perovskite photovoltaic component to be detected, and obtain detection information of the first perovskite photovoltaic component to be detected; A determination module, configured to determine, based on the detection information of the first perovskite photovoltaic component to be detected, position information of a local defect of the perovskite layer in the first perovskite photovoltaic component to be detected and geometric information of the local defect; A repair module, configured to perform inkjet repair processing on the location of the local defect of the perovskite layer in the first perovskite photovoltaic component to be detected based on the location information of the local defect and the geometric information of the local defect, so as to obtain a second perovskite photovoltaic component to be detected; The judgment module is used to perform a second detection on the perovskite layer in the second perovskite photovoltaic component to be detected, and determine whether the second perovskite photovoltaic component to be detected is qualified.

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