Component test data acquisition method, device and system

Abstract

The invention is suitable for the technical field of component test, and provides a component test data acquisition method, device and system. The component test data acquisition method comprises the steps of obtaining test data of a component placed on a test instrument, determining a variable coefficient based on the test data, determining whether the component is in a stable state based on the variable coefficient, and obtaining target test data when the component is in the stable state, the test data including the target test data. The test data of the stably clamped component can be automatically collected, the workload of an operator is effectively reduced, and the product test efficiency is improved.

Description

Technical Field

[0001] The present application belongs to the field of component testing technology, and in particular, relates to a component testing data acquisition method, device and system. Background Art

[0002] At present, the collection of test data of mainstream electronic components on the market requires operators to use fixtures to clamp the components, and then trigger the collection system to collect data by pressing the corresponding trigger device. The operation is cumbersome and seriously affects the operator's work speed and progress. Summary of the invention

[0003] The embodiments of the present application provide a component test data collection method, device and system, which can automatically collect test data of clamped components, effectively reduce the operator's workload and improve product testing efficiency.

[0004] In a first aspect, an embodiment of the present application provides a component test data collection method, comprising:

[0005] Obtain test data of components placed on the test instrument;

[0006] determining a coefficient of variation based on the test data;

[0007] Determining whether the component is in a stable state based on the coefficient of variation;

[0008] When the component is in a stable state, target test data is acquired; wherein the test data includes the target test data.

[0009] In a possible implementation manner of the first aspect, determining the coefficient of variation based on the test data includes:

[0010] Determine a standard deviation of the test data and a mean of the test data based on the test data;

[0011] The coefficient of variation is determined based on a standard deviation of the test data and a mean of the test data.

[0012] In a possible implementation manner of the first aspect, determining whether the component is in a stable state based on the coefficient of variation includes:

[0013] When the coefficient of variation is less than a first preset threshold, it is determined that the component is in a stable state;

[0014] If the coefficient of variation is greater than or equal to the first preset threshold, it is determined that the component is in an unstable state.

[0015] In a possible implementation manner of the first aspect, the method further includes:

[0016] Determine the ratio of the absolute value of the current test data to the absolute value of the previous test data;

[0017] Calculate a first absolute value of a difference between the ratio and 1;

[0018] If the first absolute value is greater than a second preset threshold, the previous test data is discarded;

[0019] or,

[0020] Determine a second absolute value of a difference between current test data and previous test data;

[0021] If the second absolute value is greater than a third preset threshold, the previous test data is discarded.

[0022] In a second aspect, an embodiment of the present application provides a component test data acquisition device, comprising:

[0023] A first acquisition module, used to acquire test data of components placed on the test instrument;

[0024] A coefficient of variation determination module, used for determining the coefficient of variation based on the test data;

[0025] A stable state determination module, used for determining whether the component is in a stable state based on the coefficient of variation;

[0026] The second acquisition module is used to acquire target test data when the component is in a stable state.

[0027] In a third aspect, an embodiment of the present application provides a component test data acquisition system, comprising: a test instrument and a computer device; a mechanical arm and a fixture are provided on the test instrument; a photoelectric sensor is provided on the side of the fixture of the test instrument;

[0028] The robotic arm is used to clamp, move and place the components; the fixture is used to clamp the components; after the robotic arm places the clamped components on the fixture, the robotic arm stays at the fixture; after the photoelectric sensor detects the signal indicating that the robotic arm is staying, it generates an electrical signal and sends the electrical signal to the computer device; the computer device determines that the component is in a stable state based on the electrical signal; when the component is in a stable state, the target test data is obtained.

[0029] In a possible implementation of the third aspect, the component test data acquisition system further includes a lighting system;

[0030] When it is determined based on the target test data that the component meets the preset standard, a lighting instruction is sent to the lighting system;

[0031] The lighting system performs a lighting operation based on the lighting instruction;

[0032] While the indicator light of the lighting system is on, the target test data collection is stopped to replace the components; when the indicator light is off, the target test data is collected for the replaced components.

[0033] In a fourth aspect, an embodiment of the present application provides a computer device, comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the method described in any one of the first aspects is implemented.

[0034] In a fifth aspect, an embodiment of the present application provides a computer-readable storage medium, comprising: the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps in the method described in any one of the first aspects are implemented.

[0035] In a sixth aspect, an embodiment of the present application provides a computer program product, which, when executed on a computer device, enables the computer device to execute any of the methods described in the first aspect.

[0036] In the embodiment of the present application, test data of components placed on the test instrument is obtained, the coefficient of variation is determined based on the test data, whether the components are in a stable state is determined based on the coefficient of variation, and when the components are in a stable state, target test data is obtained, wherein the test data includes the target test data. Test data of clamped components can be automatically collected, effectively reducing the workload of operators and improving product testing efficiency.

[0037] It can be understood that the beneficial effects of the second to sixth aspects mentioned above can be found in the relevant description of the first aspect mentioned above, and will not be repeated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0039] Figure 1 is a flow chart of a component test data collection method provided by an embodiment of the present application;

[0040] Figure 2 is a flow chart of a component test data collection method provided by another embodiment of the present application;

[0041] Figure 3 It is a structural schematic diagram of a component test data acquisition device provided in one embodiment of the present application;

[0042] Figure 4 It is a structural diagram of a component test data acquisition system provided by an embodiment of the present application;

[0043] Figure 5 It is a structural diagram of a computer device provided in one embodiment of the present application. DETAILED DESCRIPTION

[0044] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application may also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present application.

[0045] It should be understood that when used in the present specification and the appended claims, the term "comprising" indicates the presence of described features, wholes, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, wholes, steps, operations, elements, components and / or combinations thereof.

[0046] It should also be understood that the term “and / or” used in the specification and appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0047] As used in the specification and appended claims of this application, the term "if" can be interpreted as "when" or "uponce" or "in response to determining" or "in response to detecting", depending on the context. Similarly, the phrase "if it is determined" or "if [described condition or event] is detected" can be interpreted as meaning "uponce it is determined" or "in response to determining" or "uponce [described condition or event] is detected" or "in response to detecting [described condition or event]", depending on the context.

[0048] In addition, in the description of the present application specification and the appended claims, the terms "first", "second", "third", etc. are only used to distinguish the descriptions and cannot be understood as indicating or implying relative importance.

[0049] References to "one embodiment" or "some embodiments" etc. described in the specification of this application mean that one or more embodiments of the present application include specific features, structures or characteristics described in conjunction with the embodiment. Therefore, the statements "in one embodiment", "in some embodiments", "in some other embodiments", "in some other embodiments", etc. that appear in different places in this specification do not necessarily refer to the same embodiment, but mean "one or more but not all embodiments", unless otherwise specifically emphasized in other ways. The terms "including", "comprising", "having" and their variations all mean "including but not limited to", unless otherwise specifically emphasized in other ways.

[0050] Figure 1 1 is a flow chart of a component test data collection method provided by an embodiment of the present application. Figure 1 As shown, the method comprises the following steps:

[0051] Step 101, obtaining test data of components placed on a test instrument.

[0052] In an embodiment of the present application, a component test data acquisition system includes a test instrument and a computer device. A mechanical arm and a fixture are provided on the test instrument. The mechanical arm is used to clamp, move, and place components. The fixture is used to clamp components. The mechanical arm can be used to place the clamped components on the fixture, and then collect and obtain test data of the components placed on the fixture.

[0053] The operation of collecting and acquiring the test data may be performed by the test instrument itself, that is, the test instrument itself has the ability to collect and acquire the test data, or other acquisition devices other than the test instrument may collect and acquire the test data.

[0054] Step 102: determining a coefficient of variation based on the test data.

[0055] Step 103: Determine whether the component is in a stable state based on the coefficient of variation.

[0056] Among them, the coefficient of variation is an indicator used to measure the volatility or stability of data.

[0057] In an optional embodiment, the standard deviation of the test data and the mean of the test data are determined based on the test data, and the coefficient of variation is determined based on the standard deviation of the test data and the mean of the test data.

[0058] In the embodiment of the present application, when the test instrument is not placed with components or the components are not placed firmly, the test data of the test instrument will shake violently, and when the components are placed firmly, the test data of the test instrument will tend to be stable. The component test data acquisition system uses this characteristic of the test instrument to collect the current test data of the test instrument at a certain frequency and continuously calculate its last n test data X1, X2...X n The coefficient of variation c v The absolute value of is less than the first preset threshold value, thereby judging whether the component has been placed stably. When the coefficient of variation is less than the first preset threshold value, it is determined that the component is in a stable state; if the coefficient of variation is greater than or equal to the first preset threshold value, it is determined that the component is in an unstable state.

[0059] The calculation formula of the coefficient of variation is: Among them, σ is X1, X2, ....X n The standard deviation of n The mean of .

[0060] Wherein, the above n is a preset value, such as n is 10. Assume that the component test data acquisition system collects the current test data X1, X2, ..., X of the test instrument at a certain frequency. 100 , and calculate the last 10 test data X 91 ....X 100 The coefficient of variation C v The absolute value of is less than the first preset threshold value, so as to judge whether the component has been placed stably. When the coefficient of variation is less than the first preset threshold value, it is determined that the component is in a stable state. If the coefficient of variation is greater than or equal to the first preset threshold value, it is determined that the component is in an unstable state. At this time, it is necessary to continue to collect test data X 101 ....X 110 , calculate the test data X 101 ....X 110 The coefficient of variation C v Is the absolute value of is less than the first preset threshold? If the coefficient of variation is greater than or equal to the first preset threshold, continue to collect test data X 111 ....X 120 , until the coefficient of variation calculated from the collected test data is less than the first preset threshold.

[0061] The first preset threshold is a preset value, for example, the value is 0.1.

[0062] Step 104: when the component is in a stable state, obtain target test data.

[0063] The test data includes target test data.

[0064] In the embodiment of the present application, as in the above example, when calculating the test data X 101 ....X 110 The coefficient of variation C v If the absolute value of is less than the first preset threshold, it is determined that the component is in a stable state, and the test data X 101 ....X 110 As target test data, the target test data is accurate test data without jitter after the components are stabilized.

[0065] In an optional embodiment, sometimes, simply using the coefficient of variation cannot directly determine whether a component is completely placed and stable. Consider the following situation: when a component is not placed and stable, its test data will vibrate violently. If the absolute value of one of the jittered data is much larger than the absolute value of other data, the calculated coefficient of variation will be relatively small, and may be smaller than a preset threshold, which will cause the system to mistakenly determine that the component has been placed and stable.

[0066] To solve the above problem, the following two methods can be used to discard the data with severe jitter that causes misjudgment.

[0067] Method 1: determining the ratio of the absolute value of the current test data to the absolute value of the previous test data; calculating the first absolute value of the difference between the ratio and 1; if the first absolute value is greater than a second preset threshold, discarding the previous test data;

[0068] Method 2: Determine a second absolute value of the difference between the current test data and the previous test data; if the second absolute value is greater than a third preset threshold, discard the previous test data.

[0069] For method 1, first, calculate the ratio of the absolute value of the current test data to the absolute value of the previous test data. This ratio reflects the relative change between two consecutive data points. Next, calculate the first absolute value of the difference between this ratio and 1 (i.e., the ideal state with no change). This first absolute value represents the degree of change of the current data compared with the previous data. If the first absolute value is greater than a preset second threshold, this means that the change between the current data and the previous data is too large, which may be due to severe jitter caused by the unstably placed components. In this case, the previous test data is discarded.

[0070] For method 2, the second absolute value of the difference between the current test data and the previous test data is calculated. The second absolute value directly reflects the change between two consecutive data points. If this second absolute value is greater than a preset third threshold, it indicates that the data change is too large, which may be due to the fact that the components are not placed stably. In this case, the system will also discard the previous test data.

[0071] Optionally, if the above data changes too much, it means that the current components are still not placed stably, then the previous test data will be discarded and will not enter into the final calculation process of the coefficient of variation.

[0072] Optionally, replace the previous test data X n After discarding, based on X n+1 The following n data (n data can include X n+1 ) calculates the coefficient of variation to determine whether the component is in a stable state.

[0073] Among them, the above-mentioned first preset threshold, second preset threshold, and third preset threshold are all pre-set values, and the first, second, and third are only used as a distinction in name and have no other meanings.

[0074] Optionally, the second and third values ​​may be the same value, and may be a value close to 0.

[0075] The first and the second in the above-mentioned first absolute value and second absolute value are only used as a distinction in name and have no other meanings.

[0076] In the embodiment of the present application, after the target test data is obtained, it is analyzed based on the target test data whether the components meet the preset standards.

[0077] In the embodiment of the present application, test data of components placed on the test instrument is obtained, the coefficient of variation is determined based on the test data, whether the components are in a stable state is determined based on the coefficient of variation, and when the components are in a stable state, target test data is obtained, wherein the test data includes the target test data. Test data of clamped components can be automatically collected, effectively reducing the workload of operators and improving product testing efficiency.

[0078] Figure 2 FIG. 1 is a flow chart of a component test data collection method provided by another embodiment of the present application. Figure 2 As shown, the method includes the following steps: 1) start; 2) whether the collection and analysis function is turned on; 3) the collection and analysis function is turned on, and test data is collected; 4) the coefficient of variation is calculated, and whether the coefficient of variation is less than a first preset threshold; 5) if the coefficient of variation is less than the first preset threshold, the indicator light is on; 6) if the coefficient of variation is greater than or equal to the first preset threshold, execute 3); 7) whether the indicator light time is greater than the preset time; 8) if it is greater than the preset time, after the indicator light is off, the target test data of the replaced components is collected, or the collection and analysis function is turned on; 8) if it is less than or equal to the preset time, the indicator light is on.

[0079] Optionally, when it is determined based on the target test data that the component meets the preset standard, a lighting instruction is sent to the lighting system; the lighting system performs the lighting operation based on the lighting instruction; while the indicator light of the lighting system is on, the target test data is stopped from being collected to replace the component; when the indicator light goes out, the target test data is collected for the replaced component.

[0080] It should be understood that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0081] Corresponding to the component test data collection method described in the above embodiment, Figure 2 A structural block diagram of a component test data acquisition device provided in an embodiment of the present application is shown. For ease of explanation, only the parts related to the embodiment of the present application are shown.

[0082] Reference Figure 3 The component test data acquisition device includes: a first acquisition module, a variation coefficient determination module, a stable state determination module and a second acquisition module. Specifically:

[0083] A first acquisition module, used to acquire test data of components placed on the test instrument;

[0084] A coefficient of variation determination module, used for determining the coefficient of variation based on the test data;

[0085] A stable state determination module, used for determining whether the component is in a stable state based on the coefficient of variation;

[0086] The second acquisition module is used to acquire target test data when the component is in a stable state.

[0087] In an optional embodiment, the coefficient of variation determination module is used to:

[0088] Determine a standard deviation of the test data and a mean of the test data based on the test data;

[0089] The coefficient of variation is determined based on a standard deviation of the test data and a mean of the test data.

[0090] In an optional embodiment, the stable state determination module is used to:

[0091] When the coefficient of variation is less than a first preset threshold, it is determined that the component is in a stable state;

[0092] If the coefficient of variation is greater than or equal to the first preset threshold, it is determined that the component is in an unstable state.

[0093] In an optional embodiment, the device further includes a discarding module, configured to:

[0094] Determine the ratio of the absolute value of the current test data to the absolute value of the previous test data; calculate the first absolute value of the difference between the ratio and 1; if the first absolute value is greater than a second preset threshold, discard the previous test data;

[0095] or,

[0096] Determine a second absolute value of a difference between current test data and previous test data; if the second absolute value is greater than a third preset threshold, discard the previous test data.

[0097] Corresponding to the component test data collection method described in the above embodiment, Figure 3 A structural block diagram of a component test data acquisition system provided in an embodiment of the present application is shown. For ease of explanation, only the parts related to the embodiment of the present application are shown.

[0098] Reference Figure 4 The component test data acquisition system includes: a test instrument and a computer device; the test instrument is provided with a mechanical arm and a fixture; a photoelectric sensor is provided on the side of the fixture of the test instrument; the mechanical arm is used to clamp, move and place the components; the fixture is used to clamp the components; after the mechanical arm places the clamped components on the fixture, the mechanical arm stays at the fixture; after the photoelectric sensor detects the signal of the mechanical arm staying, it generates an electrical signal and sends the electrical signal to the computer device; the computer device determines that the component is in a stable state based on the electrical signal; when the component is in a stable state, the target test data is obtained.

[0099] Optionally, the component test data acquisition system also includes a lighting system; when it is determined that the component meets the preset standard based on the target test data, a lighting instruction is sent to the lighting system; the lighting system performs a lighting operation based on the lighting instruction; while the indicator light of the lighting system is on, the target test data is stopped from being collected to replace the component; when the indicator light goes out, the target test data is collected for the replaced component.

[0100] In the embodiment of the present application, the component test data acquisition system is an automated test platform, which realizes automatic testing and data processing of components by integrating a mechanical arm, a fixture, a photoelectric sensor, a computer device, and a lighting system. The following is an explanation of the detailed composition and workflow of the system:

[0101] The system consists of the following:

[0102] Test Instruments: Contains equipment used to test the performance of electronic components.

[0103] Robotic arm: used to automatically pick up, move and place components on the test fixture.

[0104] Fixture: used to fix components during the test to ensure the accuracy of the test.

[0105] Photoelectric sensor: Installed on the side of the fixture, used to detect whether the robot arm has placed the component on the fixture and stopped, in order to further eliminate the impact of severe data jitter when the component is not placed. Optionally, the photoelectric sensor is a diffuse photoelectric sensor.

[0106] Computer equipment: Receives signals from photoelectric sensors, determines whether components are in a stable state, and obtains test data when stable.

[0107] Lighting system: used to indicate test results, such as pass or fail, and provide visual signals during testing.

[0108] Workflow:

[0109] The robot arm places the component on the fixture. After placement, the robot arm stops at the fixture. The photoelectric sensor detects the robot arm's stop signal and generates an electrical signal. After receiving the electrical signal, the computer device determines that the component has stabilized. After confirming that the component is stable, the computer device obtains the target test data. If the test data meets the preset standard, the computer device sends a lighting instruction to the lighting system, and the lighting system performs the lighting operation to indicate that the component is qualified. While the indicator light is on, the system stops collecting data to allow for component replacement. Components are replaced while the indicator light is on. After the indicator light goes out, the system resumes collecting target test data.

[0110] In the embodiment of the present application, when the robot arm is working, it will swing back and forth to pick up and put down materials. When the material is put down, the robot arm will stop next to the fixture. At this time, the photoelectric sensor detects the stop signal of the robot arm and generates an electrical signal. The system only reads the electrical signal collected when the robot arm stops next to the fixture, thereby avoiding excessive data jitter caused by components not being placed on the fixture, thereby affecting normal judgment.

[0111] In the embodiment of the present application, the cooperation of the photoelectric sensor and the computer equipment ensures that data collection is performed only when the components are stable. The lighting system provides instant feedback on the test results, facilitating rapid response. The system improves the efficiency and accuracy of component testing through automation and precise control, while reducing the possibility of human error.

[0112] It should be noted that the information interaction, execution process, etc. between the above-mentioned devices / units / modules are based on the same concept as the method embodiment of the present application. Their specific functions and technical effects can be found in the method embodiment part and will not be repeated here.

[0113] The technicians in the relevant field can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In practical applications, the above-mentioned function allocation can be completed by different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiment can be integrated in a processing unit, or each unit can exist physically separately, or two or more units can be integrated in one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, which will not be repeated here.

[0114] An embodiment of the present application also provides a computer device, which includes: at least one processor, a memory, and a computer program stored in the memory and executable on the at least one processor, wherein the processor implements the steps of any of the above-mentioned method embodiments when executing the computer program.

[0115] An embodiment of the present application further provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps in the above-mentioned method embodiments can be implemented.

[0116] An embodiment of the present application provides a computer program product. When the computer program product is run on a computer device, the computer device can implement the steps in the above-mentioned method embodiments when executing the computer device.

[0117] Figure 5 This is a schematic diagram of the structure of a computer device provided in one embodiment of the present application. Figure 5 As shown, the computer device of this embodiment includes: at least one processor 50 ( Figure 5 Only one is shown in the figure), a memory 51, and a computer program 52 stored in the memory 51 and executable on the at least one processor 50, wherein when the processor 50 executes the computer program 52, the steps in any of the above-mentioned visual programming method embodiments are implemented.

[0118] The computer device may include, but is not limited to, a processor 50 and a memory 51. Those skilled in the art will appreciate that Figure 5 It is only an example of a computer device and does not constitute a limitation of the computer device. It may include more or fewer components than shown in the figure, or a combination of certain components, or different components. For example, it may also include input and output devices, network access devices, etc.

[0119] The processor 50 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor, etc.

[0120] In some embodiments, the memory 51 may be an internal storage unit of the computer device, such as a hard disk or memory of the computer device. In other embodiments, the memory 51 may also be an external storage device of the computer device, such as a plug-in hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (Secure Digital, SD) card, a flash card (Flash Card), etc. equipped on the computer device. Further, the memory 51 may also include both an internal storage unit of the computer device and an external storage device. The memory 51 is used to store an operating system, an application program, a boot loader (BootLoader), data, and other programs, such as the program code of the computer program. The memory 51 may also be used to temporarily store data that has been output or is to be output.

[0121] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present application implements all or part of the processes in the above-mentioned embodiment method, which can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a computer-readable storage medium, and the computer program can implement the steps of the above-mentioned various method embodiments when executed by the processor. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium may at least include: any entity or device that can carry the computer program code to the device / computer device, a recording medium, a computer memory, a read-only memory (ROM, Read-Only Memory), a random access memory (RAM, Random Access Memory), an electric carrier signal, a telecommunication signal, and a software distribution medium. For example, a USB flash drive, a mobile hard disk, a magnetic disk or an optical disk. In some jurisdictions, according to legislation and patent practice, computer-readable media cannot be electric carrier signals and telecommunication signals.

[0122] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0123] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0124] In the embodiments provided in the present application, it should be understood that the disclosed apparatus / computer equipment and methods can be implemented in other ways. For example, the apparatus / computer equipment embodiments described above are merely schematic. For example, the division of the modules or units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of the apparatus or unit, which can be electrical, mechanical or other forms.

[0125] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0126] The embodiments described above are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, a person skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. A component test data collection method, characterized in that: include: Obtain test data of components placed on the test instrument; determining a coefficient of variation based on the test data; Determining whether the component is in a stable state based on the coefficient of variation; When the component is in a stable state, target test data is acquired; wherein the test data includes the target test data.

2. The component test data collection method according to claim 1, characterized in that: Determining the coefficient of variation based on the test data comprises: Determine a standard deviation of the test data and a mean of the test data based on the test data; The coefficient of variation is determined based on a standard deviation of the test data and a mean of the test data.

3. The component test data collection method according to claim 1, characterized in that: The determining whether the component is in a stable state based on the coefficient of variation includes: When the coefficient of variation is less than a first preset threshold, it is determined that the component is in a stable state; If the coefficient of variation is greater than or equal to the first preset threshold, it is determined that the component is in an unstable state.

4. The component test data collection method according to claim 1, characterized in that: The method further comprises: Determine the ratio of the absolute value of the current test data to the absolute value of the previous test data; Calculate a first absolute value of a difference between the ratio and 1; If the first absolute value is greater than a second preset threshold, the previous test data is discarded; or, Determine a second absolute value of a difference between current test data and previous test data; If the second absolute value is greater than a third preset threshold, the previous test data is discarded.

5. A component test data acquisition device, characterized in that: include: A first acquisition module, used to acquire test data of components placed on the test instrument; A coefficient of variation determination module, used for determining the coefficient of variation based on the test data; A stable state determination module, used for determining whether the component is in a stable state based on the coefficient of variation; The second acquisition module is used to acquire target test data when the component is in a stable state.

6. A component test data acquisition system, characterized in that: include: Testing instrument and computer equipment; the testing instrument is provided with a mechanical arm and a fixture; A photoelectric sensor is provided on the side of the fixture of the testing instrument; The robotic arm is used to clamp, move and place the components; the fixture is used to clamp the components; after the robotic arm places the clamped components on the fixture, the robotic arm stays at the fixture; after the photoelectric sensor detects the signal indicating that the robotic arm is staying, it generates an electrical signal and sends the electrical signal to the computer device; the computer device determines that the component is in a stable state based on the electrical signal; when the component is in a stable state, the target test data is obtained.

7. The component test data acquisition system according to claim 6, characterized in that: The component test data acquisition system also includes a lighting system; When it is determined based on the target test data that the component meets the preset standard, a lighting instruction is sent to the lighting system; The lighting system performs a lighting operation based on the lighting instruction; While the indicator light of the lighting system is on, the target test data collection is stopped to replace the components; when the indicator light is off, the target test data is collected for the replaced components.

8. A computer device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the method according to any one of claims 1 to 4 is implemented.

9. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the method according to any one of claims 1 to 4 is implemented.

10. A computer program product, characterized in that When the computer program product is executed on a computer device, the computer device is caused to execute the method according to any one of claims 1 to 4.

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