Automatic test system for switch secondary element
By designing the automatic test system of switch secondary components, using information processing, test control and report generation units, the problems of low testing efficiency and poor reporting reliability of switch secondary components in the prior art are solved, and efficient automatic testing and reliable report generation are achieved.
Patent Information
- Application Number
- CN202411762916.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-03
- Publication Date
- 2025-04-18
AI Technical Summary
The prior art is difficult to efficiently test the switch secondary components automatically, resulting in an increase in the failure rate in power production and the testing process consumes a lot of manpower and material resources.
An automatic testing system for switching secondary components is designed, including an information processing unit, a test control unit and a report generation unit. The information processing unit is used to receive and store test information, component information and sign-up information; the test control unit realizes data acquisition and supplementary testing through closed-loop control and the state machine model automatically scheduling the test process; the report generation unit generates test reports based on the standard library and uses digital watermarking technology to ensure the tamper-freeness of the report.
Through the automated test process, the testing efficiency of the switch secondary components is significantly improved, manual errors are reduced, and the reliability and uniformity of reports are ensured, providing guarantees for the safe and stable operation of the power system.
Smart Images
Figure CN119850114A_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the technical field of switch testing, in particular to an automatic testing system for switch secondary components. Background Art
[0002] A large number of switch secondary components are used in the power production process, the main types of which include time relays, intermediate relays, auxiliary switches, travel switches, etc. Power production accidents caused by failures of switch secondary components are increasing. In recent years, the failure rate of the company's switch equipment has increased, batch hidden dangers of existing equipment have gradually been exposed, and switch refusal to operate still seriously threatens the safe operation of the system. An analysis of 38 faulty components that caused refusal to operate from 2016 to 2020 showed that 22 failures were caused by secondary components of the mechanism, accounting for 58%.
[0003] It is urgent to carry out switch secondary component testing. There are various forms of monitoring and testing of power production equipment, mainly including network access testing, third-party certification testing, regular inspection testing, etc. These tests are for finished equipment, not for component testing. At present, if you need to test switch secondary components, you need to use a variety of different test equipment component test benches to test, record various equipment data during the test, and use multi-device data to analyze the performance of switch secondary components. At present, it takes a lot of manpower and material resources to carry out switch secondary component testing.
[0004] Therefore, it is urgent to carry out automatic testing research on switch secondary components. This research automatically carries out testing equipment to test switch secondary components, and intelligently analyzes switch secondary component detection reports by inputting switch information and detection data. Summary of the invention
[0005] In view of the above-mentioned problems, the present invention is proposed.
[0006] Therefore, the present invention provides a switch secondary component automatic testing system, which can solve the problems mentioned in the background technology.
[0007] To solve the above technical problems, the present invention provides the following technical solutions: a switch secondary component automatic testing system, comprising: an information processing unit, used to receive input of test information, component information and submission information, and store the input information in an input information database; a test control unit, used to send control instructions to a test device according to the component information in the input information database, and receive the test data collected by the test device and store it in a test database; a report generation unit, used to read the test data in the test database, and generate a test report containing the test data analysis results according to a preset standard library.
[0008] As a preferred solution of the automatic test system for switch secondary components described in the present invention, the information processing unit includes a test information input module, a component information input module, a submission information input module, an authentication information processing module, and an information storage module; the test information input module inputs the source information of the components to be inspected, the inspection unit information and the experimental process information, and sends the information to the information storage module; the component information input module inputs the number information, model information and quantity information of the components to be tested, and sends the information of the components to be tested to the information storage module; the submission information input module imports the electronic signature information and the electronic seal information, and sends the electronic signature information and the electronic seal information to the information storage module; the authentication information processing module stores the CNAS certification mark, the 3C certification mark and the ISO certification mark, and sends the selected certification mark to the report generation unit; the information storage module receives the information sent by the test information input module, the component information input module and the submission information input module, and writes the received information into the input information database.
[0009] As a preferred solution of the automatic test system for switch secondary components described in the present invention, the test control unit includes a component verification module, a test control module, a data acquisition module, and a status monitoring module; the component verification module receives the information of the component to be tested in the information storage module, and if the information of the component to be tested does not match the component information selected by the current test device, a test pause instruction is sent to the test control module.
[0010] As a preferred solution of the automatic testing system for switch secondary components described in the present invention, the test control module includes: if the pause test instruction is received, a pause signal is sent to the test equipment and the pause waiting state is maintained; if a restart test instruction is received, a test control instruction is sent to the test equipment according to the information of the component to be tested; if the test data missing prompt information is received, a supplementary test instruction is sent to the test equipment according to the missing data item; the data acquisition module receives the test data returned by the test equipment, and writes the test data into the test database, wherein the test data includes test progress information.
[0011] As a preferred solution of the automatic testing system for switch secondary components described in the present invention, the status monitoring module includes: receiving the test progress information collected by the data acquisition module; if the test progress information shows that the current test process is completed, determining whether there is a next stage test process; if there is a next stage test process, sending the next stage test instruction to the test control module; if there is no next stage test process, sending a test completion signal to the report generation unit.
[0012] As a preferred solution of the switch secondary component automatic testing system described in the present invention, wherein: the report generation unit includes a report cover generation module, a report content generation module, a report ending generation module, and a report review module; the report cover generation module receives the source information of the inspected component, the inspection unit information and the certification mark in the certification information processing module in the information storage module, and generates a test report cover; the report content generation module receives the test data in the test database, and analyzes the test data according to the standard requirements in the preset standard library, and generates a report content containing the test data analysis results; the report ending generation module receives the electronic signature information and electronic seal information sent by the submission information input module, and generates an anti-tampering mark line at the end of the report.
[0013] As a preferred solution of the automatic testing system for switch secondary components described in the present invention, the report review module includes: if the test report contains the test data analysis results, the test report is marked as completed; if the test report lacks the test data analysis results, a test data missing prompt message is sent to the test control unit; if the test report is in a completed state, a result sealing mark is generated below the anti-tampering mark line to prohibit users from modifying the report content.
[0014] To further solve the above technical problems, the present invention provides the following technical solutions: a method for an automatic test system for switch secondary components, comprising: receiving input of test information, component information and submission information; storing the test information, component information and submission information in an input information database; determining a test process according to the component information in the input information database; sending a control instruction to a test device to start the test process; receiving test data collected by the test device, and storing the test data in a test database; reading a test standard corresponding to the component information from a preset standard library; analyzing the test data in the test database according to the test standard; and generating a test report containing the analysis results of the test data.
[0015] A computer device comprises a memory and a processor, wherein the memory stores a computer program, and wherein the processor implements the steps of the automatic test system for switch secondary components as described above when executing the computer program.
[0016] A computer-readable storage medium stores a computer program thereon, wherein the computer program, when executed by a processor, implements the steps of the automatic test system for secondary components of a switch as described above.
[0017] Beneficial effects of the present invention: The automatic test system for switch secondary components provided by the present invention solves the problems of chaotic information entry and difficult data traceability in traditional test systems through modular classification management of the information processing unit; through the closed-loop control and state machine model of the test control unit, intelligent scheduling of the test process is realized, especially when data missing is found, targeted supplementary tests can be automatically initiated, avoiding the redundant operation of the need to re-perform the complete test process in traditional tests; through the standardized report generation process and digital watermark technology of the report generation unit, the uniformity of the report format and the non-tamperability of the content are ensured, effectively solving the problems of missed tests, wrong tests, and uneven report preparation quality in traditional manual tests, significantly improving the test efficiency and report reliability of switch secondary components, and providing a strong guarantee for the safe and stable operation of the power system. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying creative work.
[0019] Figure 1 This is a schematic diagram of the overall process of an automatic test system for switch secondary components proposed by the present invention;
[0020] Figure 2 The present invention is a schematic diagram of the operation of a switch secondary component automatic testing system. DETAILED DESCRIPTION
[0021] In order to make the above-mentioned purposes, features and advantages of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are described in detail below in conjunction with the drawings of the specification. Obviously, the described embodiments are part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary persons in the art without creative work should fall within the scope of protection of the present invention.
[0022] In the following description, many specific details are set forth to facilitate a full understanding of the present invention, but the present invention may also be implemented in other ways different from those described herein, and those skilled in the art may make similar generalizations without violating the connotation of the present invention. Therefore, the present invention is not limited to the specific embodiments disclosed below.
[0023] Example 1, reference Figure 1 , as an embodiment of the present invention, provides an automatic testing system for switch secondary components.
[0024] The present application provides an effective solution to the above-mentioned problems. Next, multiple embodiments will be combined to explain in detail how to implement the automatic testing system for switch secondary components.
[0025] The information processing unit is used to receive the input of test information, component information and submission information, and store the input information in an input information database.
[0026] The unit adopts a distributed information processing architecture, and processes different types of information through the test information input module, component information input module and submission information input module to achieve classified management of information. Among them, the test information mainly includes basic data such as the source information of the components to be tested and the information of the testing unit; the component information includes the number information, model information and quantity information of the components to be tested, which are directly related to the formulation of the subsequent test process; the submission information includes electronic signatures and electronic seals, and digital certificate technology is used to ensure the authenticity and non-tamperability of the information. Each module is managed uniformly through the information storage module to ensure the consistency and traceability of the data.
[0027] Specifically, the information processing unit includes a test information input module, a component information input module, a submission information input module, an authentication information processing module, and an information storage module.
[0028] The test information input module inputs the source information of the components to be inspected, the information of the inspection unit and the information of the experimental process, and sends the information to the information storage module;
[0029] The component information input module inputs the number information, model information and quantity information of the component to be tested, and sends the component information to the information storage module;
[0030] The signing information input module imports the electronic signature information and the electronic seal information, and sends the electronic signature information and the electronic seal information to the information storage module;
[0031] The certification information processing module stores the CNAS certification mark, the 3C certification mark and the ISO certification mark, and sends the selected certification mark to the report generation unit;
[0032] The information storage module receives information sent by the test information input module, the component information input module and the submission information input module, and writes the received information into the input information database.
[0033] Preferably, the information processing unit solves the problems of confusing information input and difficult data traceability in traditional test systems through modular design. By classifying and processing different types of information, the standardization and manageability of data are improved. In particular, in the application of electronic signatures and electronic seals, the problem of easy forgery of signatures in traditional paper reports is avoided, and the credibility of the report is improved.
[0034] The test control unit is used to send control instructions to the test equipment according to the component information in the input information database, and receive the test data collected by the test equipment and store it in the test database.
[0035] The unit adopts the closed-loop control principle. The component verification module first ensures the compatibility of the component to be tested with the test equipment to avoid equipment damage caused by incorrect test parameters. The test control module adopts a state machine model, which can flexibly adjust the test strategy according to different test states (such as pause, restart, and supplementary test). The data acquisition module adopts real-time data acquisition technology to ensure the timeliness and integrity of the test data. The status monitoring module automatically determines the test progress through the program to realize the automatic switching of the test process.
[0036] Specifically, the test control unit includes a component verification module, a test control module, a data acquisition module, and a status monitoring module.
[0037] The component verification module receives the information of the component to be tested in the information storage module, and sends a test suspension instruction to the test control module if the information of the component to be tested does not match the component information selected by the current test device.
[0038] The test control module includes:
[0039] If a pause test instruction is received, a pause signal is sent to the test equipment and the pause waiting state is maintained;
[0040] If a restart test instruction is received, a test control instruction is sent to the test equipment according to the information of the component to be tested;
[0041] If a prompt message indicating that test data is missing is received, a supplementary test instruction is sent to the test equipment according to the missing data items;
[0042] The data acquisition module receives the test data returned by the test equipment and writes the test data into the test database, wherein the test data includes the test progress information.
[0043] The status monitoring module includes:
[0044] Receive test progress information collected by the data acquisition module;
[0045] If the test progress information shows that the current test process is completed, determine whether there is a next stage of test process;
[0046] If there is a next stage test process, send the next stage test instruction to the test control module;
[0047] If there is no next stage test process, a test completion signal is sent to the report generation unit.
[0048] Preferably, the test control unit effectively solves the problems of missed tests and wrong tests that are easy to occur in traditional manual tests through the application of closed-loop control and state machine models. In particular, in terms of the supplementary test function, when data is found to be missing, the system can automatically initiate targeted supplementary tests, avoiding the redundant operations of re-performing the entire test process in traditional tests, and significantly improving the test efficiency.
[0049] The report generation unit is used to read the test data in the test database and generate a test report containing the test data analysis results according to the preset standard library.
[0050] Based on the modular report generation architecture, the unit divides the report into three parts: cover, content and ending, and generates and manages them independently. The report content generation module uses a preset standard library for data analysis to ensure that the analysis results meet the requirements of industry standards. The design of the tamper-proof mark line uses digital watermark technology to generate a unique tamper-proof mark at the end of the report. The report review module ensures the integrity and standardization of the report through multiple logical judgments.
[0051] Specifically, the report generation unit includes a report cover generation module, a report content generation module, a report ending generation module, and a report review module;
[0052] The report cover generation module receives the source information of the inspection component, the inspection unit information and the certification mark in the certification information processing module in the information storage module, and generates the inspection report cover;
[0053] The report content generation module receives the test data in the test database, analyzes the test data according to the standard requirements in the preset standard library, and generates report content containing the test data analysis results;
[0054] The report end generation module receives the electronic signature information and electronic seal information sent by the signature information input module, and generates an anti-tampering mark line at the end of the report.
[0055] The report review module includes:
[0056] If the test report contains test data analysis results, the test report is marked as completed;
[0057] If the test report lacks the test data analysis results, a test data missing prompt message is sent to the test control unit;
[0058] If the test report is in the completed state, a result sealing mark will be generated below the anti-tampering mark line to prohibit users from modifying the report content.
[0059] Preferably, the report generation unit solves the problems of inconsistent formats and uneven quality in traditional manual report preparation through a standardized report generation process. In particular, in terms of report tampering prevention, the application of digital watermark technology and result sealing marks effectively prevents unauthorized modification of report content and improves the reliability of reports. At the same time, the automated review function of the report review module avoids possible omissions in manual review and ensures the consistency of report quality.
[0060] In summary, the automatic test system for switch secondary components provided by the present invention solves the problems of chaotic information entry and difficult data traceability in traditional test systems through modular classification management of information processing units; through the closed-loop control and state machine model of the test control unit, intelligent scheduling of the test process is realized, especially when data missing is found, targeted supplementary tests can be automatically initiated, avoiding the redundant operation of re-performing the complete test process in traditional tests; through the standardized report generation process and digital watermark technology of the report generation unit, the uniformity of the report format and the non-tamperability of the content are ensured, effectively solving the problems of missed tests, wrong tests, and uneven report preparation quality in traditional manual tests, significantly improving the test efficiency and report reliability of switch secondary components, and providing a strong guarantee for the safe and stable operation of the power system.
[0061] Embodiment 2 is an embodiment of the present invention, which provides a switch secondary component automatic testing system method, including:
[0062] S1: Receive input of test information, component information and submission information;
[0063] S2: storing the test information, component information and submission information into the input information database;
[0064] S3: Determine the test process according to the component information in the input information database;
[0065] S4: Send control instructions to the test equipment to start the test process;
[0066] S5: receiving the test data collected by the test equipment and storing the test data in the test database;
[0067] S6: Reading the test standard corresponding to the component information from the preset standard library;
[0068] S7: Analyze the test data in the test database according to the test standard;
[0069] S8: Generate a test report including the test data analysis results.
[0070] Embodiment 3 is an embodiment of the present invention, which is different from the previous embodiment in that: if the function is implemented in the form of a software function unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk and other media that can store program codes.
[0071] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as an ordered list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by an instruction execution system, device or apparatus (such as a computer-based system, a system including a processor, or other system that can fetch instructions from an instruction execution system, device or apparatus and execute instructions), or in conjunction with such instruction execution systems, devices or apparatuses. For the purposes of this specification, "computer-readable medium" can be any device that can contain, store, communicate, propagate or transmit a program for use by an instruction execution system, device or apparatus, or in conjunction with such instruction execution systems, devices or apparatuses.
[0072] More specific examples of computer-readable media (a non-exhaustive list) include the following: an electrical connection with one or more wires (electronic device), a portable computer disk case (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable and programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disk read-only memory (CDROM). In addition, the computer-readable medium may even be a paper or other suitable medium on which the program is printed, since the program may be obtained electronically, for example, by optically scanning the paper or other medium, followed by editing, deciphering or, if necessary, processing in another suitable manner, and then stored in a computer memory.
[0073] It should be understood that the various parts of the present invention can be implemented by hardware, software, firmware or a combination thereof. In the above-mentioned embodiments, a plurality of steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented by hardware, as in another embodiment, it can be implemented by any one of the following technologies known in the art or their combination: a discrete logic circuit having a logic gate circuit for implementing a logic function for a data signal, a dedicated integrated circuit having a suitable combination of logic gate circuits, a programmable gate array (PGA), a field programmable gate array (FPGA), etc.
[0074] It should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solutions of the present invention may be modified or replaced by equivalents without departing from the spirit and scope of the technical solutions of the present invention, which should all be included in the scope of the claims of the present invention.
Claims
1. A switch secondary component automatic testing system, characterized in that: include: An information processing unit, used for receiving input of test information, component information and submission information, and storing the input information in an input information database; A test control unit, used to send control instructions to the test equipment according to the component information in the input information database, and receive the test data collected by the test equipment and store it in the test database; The report generating unit is used to read the test data in the test database and generate a test report containing the test data analysis results according to a preset standard library.
2. The automatic test system for switch secondary components according to claim 1, characterized in that: The information processing unit includes a test information input module, a component information input module, a signature information input module, an authentication information processing module, and an information storage module; The test information input module inputs the source information of the test component, the test unit information and the experimental process information, and sends the information to the information storage module; The component information input module inputs the number information, model information and quantity information of the component to be tested, and sends the component information to the information storage module; The remittance information input module imports the electronic signature information and the electronic seal information, and sends the electronic signature information and the electronic seal information to the information storage module; The certification information processing module stores the CNAS certification mark, the 3C certification mark and the ISO certification mark, and sends the selected certification mark to the report generation unit; The information storage module receives information sent by the test information input module, the component information input module and the submission information input module, and writes the received information into an input information database.
3. The automatic test system for switch secondary components according to claim 2, characterized in that: The test control unit includes a component verification module, a test control module, a data acquisition module, and a status monitoring module; The component verification module receives the information of the component to be tested in the information storage module, and sends a test suspension instruction to the test control module if the information of the component to be tested does not match the component information selected by the current test device.
4. The automatic test system for switch secondary components according to claim 3, characterized in that: The test control module comprises: If the test pause instruction is received, a pause signal is sent to the test device and the pause waiting state is maintained; If a restart test instruction is received, a test control instruction is sent to the test device according to the information of the component under test; If the test data missing prompt information is received, a supplementary test instruction is sent to the test device according to the missing data items; The data acquisition module receives the test data returned by the test equipment and writes the test data into a test database, wherein the test data includes test progress information.
5. The automatic test system for switch secondary components according to claim 4, characterized in that: The status monitoring module comprises: Receiving the test progress information collected by the data collection module; If the test progress information shows that the current test process is completed, determine whether there is a next stage test process; If there is a next stage test process, sending a next stage test instruction to the test control module; If there is no next stage test process, a test completion signal is sent to the report generating unit.
6. The automatic test system for switch secondary components according to claim 5, characterized in that: The report generation unit includes a report cover generation module, a report content generation module, a report ending generation module, and a report review module; The report cover generation module receives the inspection component source information, the inspection unit information and the certification mark in the certification information processing module in the information storage module, and generates the inspection report cover; The report content generation module receives the test data in the test database, analyzes the test data according to the standard requirements in the preset standard library, and generates report content including the test data analysis results; The report ending generation module receives the electronic signature information and electronic seal information sent by the signature information input module, and generates an anti-tampering mark line at the end of the report.
7. The automatic test system for switch secondary components according to claim 6, characterized in that: The report review module includes: If the test report includes test data analysis results, marking the test report as completed; If the test report lacks the test data analysis results, a test data missing prompt message is sent to the test control unit; If the test report is in a completed state, a result sealing mark is generated below the anti-tampering mark line to prohibit users from modifying the report content.
8. A method using the automatic test system for switch secondary components according to any one of claims 1 to 7, characterized in that: include: Receive input of test information, component information and submission information; Storing the test information, the component information and the submission information in an input information database; Determine a test process according to the component information in the input information database; Send control instructions to the test equipment to start the test process; Receiving test data collected by the test equipment and storing the test data in a test database; Reading a test standard corresponding to the component information from a preset standard library; Analyzing the test data in the test database according to the test standard; Generate a test report containing the test data analysis results.
9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the automatic testing system for switch secondary components according to any one of claims 1 to 7 are implemented.
10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the automatic testing system for switch secondary components according to any one of claims 1 to 7 are implemented.