Testing method and system for annular spot laser

Abstract

The present application discloses a ring spot laser testing method and system. The method includes: initializing a test fixture for the ring spot laser, and generating a first light output control instruction and a second light output control instruction based on an automated test signal sent by an automatic test circuit; controlling the first light output control circuit to output a first light output modulation signal based on the first light output control instruction, and controlling the second light output control circuit to output a second light output modulation signal based on the second light output control instruction; controlling the outer ring light output of the ring spot laser based on the first light output modulation signal, and controlling the center light output of the ring spot laser based on the second light output modulation signal. This method can achieve one-button automated testing of the ring spot laser, greatly improving the testing efficiency of the laser.

Description

Technical Field

[0001] The present application relates to the field of laser testing technology, and in particular to a testing method and system for an annular spot laser. Background Art

[0002] In the related art, the laser electrical test tooling can only manually input control signals by dialing the code one by one. Not only does it involve many dial switches and place certain requirements on the testers, the testing process takes a long time, and it is not compatible with the testing of annular spot lasers. Summary of the Invention

[0003] In response to the shortcomings of the existing technology, the present application provides a testing method and system for an annular spot laser, which can not only realize the testing of the annular spot laser, but also perform one-click automatic testing of the annular spot laser, greatly improving the testing efficiency of the laser.

[0004] To solve the above problems, in a first aspect, the present application provides a testing method for an annular spot laser, which is applied to a testing tool for the annular spot laser. The testing tool includes an automatic testing circuit, a microcontroller unit, a first light output control circuit, and a second light output control circuit. The testing method includes:

[0005] Initialize the test fixture of the annular spot laser;

[0006] Generate a first light emission control instruction and a second light emission control instruction according to an automatic test signal sent by an automatic test circuit;

[0007] Controlling the first light output control circuit to output a first light output modulation signal according to the first light output control instruction, and controlling the second light output control circuit to output a second light output modulation signal according to the second light output control instruction;

[0008] The outer ring light of the annular spot laser is controlled according to the first light-emitting modulation signal, and the center light of the annular spot laser is controlled according to the second light-emitting modulation signal.

[0009] In a second aspect, the present application also provides a testing system for an annular spot laser, comprising:

[0010] An initialization unit, used for initializing a test fixture for the annular spot laser;

[0011] a generating unit, configured to generate a first light emitting control instruction and a second light emitting control instruction according to the automatic test signal sent by the automatic test circuit;

[0012] a first control unit, configured to control the first light output control circuit to output a first light output modulation signal according to the first light output control instruction, and to control the second light output control circuit to output a second light output modulation signal according to the second light output control instruction;

[0013] The second control unit is configured to control the outer ring light emission of the annular spot laser according to the first light emission modulation signal, and control the center light emission of the annular spot laser according to the second light emission modulation signal.

[0014] The present application provides a method for testing an annular spot laser. After initializing the test fixture of the annular spot laser, the method generates a first light output control instruction and a second light output control instruction according to an automatic test signal sent by an automatic test circuit. Then, the method controls the first light output control circuit to output a first light output modulation signal according to the first light output control instruction, and controls the second light output control circuit to output a second light output modulation signal according to the second light output control instruction. Finally, the outer ring light output and the center light output of the annular spot laser can be controlled according to the first light output modulation signal and the second light output modulation signal, respectively. This method not only realizes the test of the annular spot laser, but also can perform one-button automatic testing on the annular spot laser, greatly improving the test efficiency of the laser. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following is a brief introduction to the drawings required for use in the description of the embodiments. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0016] Figure 1 A schematic block diagram of a test fixture for an annular spot laser provided in an embodiment of the present application;

[0017] Figure 2 A circuit diagram of a control circuit provided in an embodiment of the present application;

[0018] Figure 3 A circuit diagram of a state detection circuit provided in an embodiment of the present application;

[0019] Figure 4 A circuit diagram of an automatic test circuit provided in an embodiment of the present application;

[0020] Figure 5 A circuit diagram of a first light output control circuit provided in an embodiment of the present application;

[0021] Figure 6 A circuit diagram of a second light output control circuit provided in an embodiment of the present application;

[0022] Figure 7 A circuit diagram of a power regulation circuit provided in an embodiment of the present application;

[0023] Figure 8 A circuit diagram of a power feedback circuit provided in an embodiment of the present application;

[0024] Figure 9 A circuit diagram of a copy machine control circuit provided in an embodiment of the present application;

[0025] Figure 10 A circuit diagram of a channel detection circuit provided in an embodiment of the present application;

[0026] Figure 11 A circuit diagram of a display circuit provided in an embodiment of the present application;

[0027] Figure 12 A schematic flow chart of a method for testing an annular spot laser according to an embodiment of the present application.

[0028] Reference numerals:

[0029] 10. Ring spot laser; 20. Automatic test circuit; 30. Microcontroller unit; 40. First light output control circuit; 50. Second light output control circuit; 60. Control circuit; 70. Status detection circuit; 80. Power regulation circuit; 90. Channel detection circuit; 100. Power feedback circuit; 110. Copy machine control circuit 60; 120. Display circuit. DETAILED DESCRIPTION

[0030] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0031] It will be understood that when used in this specification and the appended claims, the terms “comprises” and “comprising” indicate the presence of described features, integers, steps, operations, elements and / or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or groups thereof.

[0032] It should also be understood that the terms used in this specification are for the purpose of describing specific embodiments only and are not intended to limit the present application. As used in this specification and the appended claims, the singular forms "a," "an," and "the" are intended to include the plural forms unless the context clearly indicates otherwise.

[0033] It should be further understood that the term "and / or" used in this specification and the appended claims refers to and includes any and all possible combinations of one or more of the associated listed items.

[0034] In addition, in this application, unless otherwise clearly specified or limited in the embodiments, the terms "installed", "connected", "connected" and "fixed" appearing in the embodiments should be understood in a broad sense. For example, the connection can be a fixed connection, a detachable connection, or an integrated connection. It can also be a mechanical connection, an electrical connection, etc.; of course, it can also be a direct connection, or an indirect connection through an intermediate medium, or it can be the internal communication of two elements, or the interaction relationship between two elements. For those skilled in the art, the specific meanings of the above terms in this application can be understood based on the specific implementation.

[0035] The embodiments of the present application provide a testing method and a testing system for an annular spot laser 10. The testing system includes a testing fixture for the annular spot laser 10, and the testing method for the annular spot laser 10 uses the testing fixture to perform the testing method for the annular spot laser 10.

[0036] For ease of understanding, the test fixture of the annular spot laser 10 is first introduced, and then the test method and test system of the annular spot laser 10 are described in detail based on the test fixture of the annular spot laser 10 .

[0037] See also Figure 1 , Figure 1 A schematic block diagram of a test fixture for the annular spot laser 10 provided in an embodiment of the present application.

[0038] like Figure 1 As shown, the present application provides a testing fixture for an annular spot laser 10, which includes:

[0039] Automatic test circuit 20;

[0040] A microcontroller unit 30, wherein a first input end of the microcontroller unit 30 is electrically connected to the automatic test circuit 20, and a first output end of the microcontroller unit 30 is electrically connected to the control end of the annular spot laser 10;

[0041] The first light output control circuit 40 is electrically connected to the first input end of the annular spot laser 10 and the second output end of the microcontroller unit 30;

[0042] The second light output control circuit 50 is electrically connected to the second input terminal of the annular spot laser 10 and the third output terminal of the microcontroller unit 30;

[0043] The automatic test circuit 20 is configured to request the microcontroller unit 30 to control the annular spot laser 10 to emit light, the first light output control circuit is configured to control the outer ring light output of the annular spot laser 10, and the second light output control circuit is configured to control the center light output of the annular spot laser.

[0044] The annular spot laser 10, also known as a dual-beam continuous laser, is manufactured based on annular spot laser welding technology. Its output beam consists of a central Gaussian spot and an outer ring spot. The annular spot laser 10 offers advantages such as high output power, excellent consistency, spatter-free welding, and efficient cutting. It is widely used in a variety of fields, including automotive manufacturing, power batteries, electronic components, aerospace, and shipbuilding.

[0045] In this embodiment, when the annular spot laser 10 needs to be tested, it is only necessary to request the microcontroller unit 30 to control the annular spot laser 10 to emit light through the automatic test circuit 20. After receiving the request from the automatic test circuit 20, the microcontroller unit 30 can output a signal to control the annular spot laser 10. After receiving the output signal of the microcontroller unit 30, the annular spot laser 10 outputs a status bit so that the microcontroller unit 30 can detect whether the annular spot laser 10 can respond normally, and then control the first light output control circuit and the second light output control circuit to control the annular spot laser 10 to emit outer ring light and center light.

[0046] A switch can be provided within the automatic test circuit 20 to enable the microcontroller unit 30 to control the annular spot laser 10 to emit light in both the outer ring and the center. The microcontroller unit 30 (MCU) is a highly integrated single-chip microcomputer that typically integrates resources such as a CPU, ROM, RAM, FLASH, timers, and I / O interfaces on a single chip, forming a chip-level computer. The microcontroller unit 30 can be a 144-pin MCU from the GD32F407 series.

[0047] The test fixture of the ring spot laser 10 provided in the present application includes an automatic test circuit 20, a microcontroller unit 30, a first light output control circuit 40 and a second light output control circuit 50. The first input end, the first output end, the second output end and the third output end of the microcontroller unit 30 are electrically connected to the automatic test circuit 20, the first light output control circuit 40 and the second light output control circuit 50, respectively. The first light output control circuit 40 and the second light output control circuit 50 are electrically connected to the first input end and the second input end of the ring spot laser 10, respectively. The automatic test circuit 20 is configured to request the microcontroller unit 30 to control the ring spot laser 10 to emit light, the first light output control circuit is configured to control the outer ring light of the ring spot laser 10, and the second light output control circuit is configured to control the center light of the ring spot laser. This not only realizes the test of the ring spot laser 10, but also can perform one-button automatic testing on the ring spot laser 10, greatly improving the test efficiency of the laser.

[0048] In some embodiments, as Figure 1 As shown, the test fixture further includes a control circuit 60 ; wherein one end of the control circuit 60 is electrically connected to the first output end of the microcontroller unit 30 , and the other end of the control circuit 60 is electrically connected to the control end of the annular spot laser 10 .

[0049] In this embodiment, the control circuit 60 is arranged between the first output end of the microcontroller unit 30 and the control end of the annular spot laser 10. After receiving the request of the automatic test circuit 20, the microcontroller unit 30 can output a signal for controlling the annular spot laser 10 to the control circuit 60. The control circuit 60 can then output the control signal of the annular spot laser 10, so that the annular spot laser 10 outputs a status bit, thereby facilitating the microcontroller unit 30 to detect whether the annular spot laser 10 can respond normally, and then control the first light output control circuit and the second light output control circuit to control the annular spot laser 10 to emit outer ring light and center light.

[0050] Furthermore, in some embodiments, Figure 2 As shown, the control circuit 60 includes:

[0051] A first optical coupler U1, wherein a first input terminal of the first optical coupler U1 is electrically connected to a first output terminal AI-XP1 of the microcontroller unit 30, and a first output terminal of the first optical coupler U1 is grounded GND;

[0052] a first switch K1, wherein a first end of the first switch K1 is electrically connected to the second input end of the first optical coupler U1, a second end of the first switch K1 is electrically connected to the second output end of the first optical coupler U1, and a third end of the first switch K1 is electrically connected to the control end of the annular spot laser 10;

[0053] The first light emitting diode LED1 has an anode electrically connected to the third end of the first switch K1 , and a cathode connected to the ground GND.

[0054] In this embodiment, a first optical coupler U1 can be provided in the control circuit 60 to achieve electrical isolation between the microcontroller unit 30 and the annular spot laser 10, so that the signal output by the microcontroller unit 30 can be stably transmitted between the microcontroller unit 30 and the annular spot laser 10. A resistor R1 is provided between the first input terminal of the first optical coupler U1 and the first output terminal AI-XP1 of the microcontroller unit 30. Two transistors can be provided in the first optical coupler U1 to enhance its driving capability and improve signal transmission efficiency, thereby achieving higher driving capability and better signal transmission effects.

[0055] Specifically, the first switch K1 may be a dip switch to enable manual dialing, and the on / off of the first switch K1 may also be controlled by the microcontroller unit 30. Furthermore, a first light-emitting diode LED1 and a resistor R2 connected in series may be provided at the connection point between the third end of the first switch K1 and the control end of the annular spot laser 10, so as to accurately determine whether the annular spot laser 10 has detected a corresponding signal and output a status bit.

[0056] In addition, the first end of the first switch K1 is electrically connected to the second input end of the first optical coupler U1 and can also be connected to a 24V power supply provided by the power port 24VIN, so that the first light-emitting diode LED1 is in a continuous light-emitting state during the test.

[0057] In some embodiments, as Figure 1 As shown, the test fixture further includes a state detection circuit 70 ; wherein, one end of the state detection circuit 70 is electrically connected to the state output end of the annular spot laser 10 , and the other end of the state detection circuit 70 is electrically connected to the second input end of the microcontroller unit 30 .

[0058] In this embodiment, the state detection circuit 70 is provided between the second input terminal of the microcontroller unit 30 and the state output terminal of the annular spot laser 10. After the microcontroller unit 30 outputs the state signal, it can be transmitted to the second input terminal of the microcontroller unit 30 via the state detection circuit 70, so that the microcontroller unit 30 can detect whether the annular spot laser 10 can respond normally, and then control the first light output control circuit and the second light output control circuit to control the annular spot laser 10 to emit outer ring light and center light.

[0059] In some embodiments, as Figure 3 As shown, the state detection circuit 70 includes:

[0060] A second optical coupler U2, wherein a first input end of the second optical coupler U2 is electrically connected to a status output end XP1_OLT_B1 of the annular spot laser 10, a first output end of the second optical coupler U2 is grounded GND, a second input end of the second optical coupler U2 is connected to a first power supply, and a second output end of the second optical coupler U2 is electrically connected to a second input end XP1_B1 of the microcontroller unit 30;

[0061] The first filter circuit has one end electrically connected to the second output end of the second optical coupler U2 and the second input end XP1_B1 of the microcontroller unit 30 , and the other end of the first filter circuit is grounded GND.

[0062] In this embodiment, a second optical coupler U2 can be provided in the state detection circuit 70 to achieve electrical isolation between the microcontroller unit 30 and the annular spot laser 10, so that the state signal output by the annular spot laser 10 can be stably transmitted to the microcontroller unit 30. A resistor R4 is provided between the first input end of the second optical coupler U2 and the state output end XP1_OLT_B1 of the annular spot laser 10.

[0063] Specifically, a first filter circuit can be provided between the second output terminal of the second optical coupler U2 and the second input terminal XP1_B1 of the microcontroller unit 30 , so that the status signal output by the annular spot laser 10 can be further stably transmitted to the second input terminal XP1_B1 of the microcontroller unit 30 .

[0064] In which, the first filtering circuit may include a parallel resistor R3 and a capacitor C1, one end of the parallel resistor R3 and the capacitor C1 are electrically connected to the second output end of the second optocoupler U2 and the second input end XP1_B1 of the microcontroller unit 30 respectively, and the other end of the parallel resistor R3 and the capacitor C1 are grounded GND.

[0065] In addition, the second input terminal of the second optical coupler U2 can be connected to the first 3.3V power supply and connected to the ground GND through the capacitor C2.

[0066] In some embodiments, as Figure 4 As shown, the automatic test circuit 20 includes:

[0067] A second switch K2, one end of the second switch K2 is connected to a second power supply;

[0068] A third optical coupler U3, wherein a first input end of the third optical coupler U3 is electrically connected to the other end of the second switch K2, a first output end of the third optical coupler U3 is grounded GND, a second input end of the third optical coupler U3 is connected to a third power supply, and a second output end of the third optical coupler U3 is electrically connected to a first input end Hard Wire Auto Test of the microcontroller unit 30;

[0069] The second filter circuit has one end electrically connected to the first input terminal Hard Wire Auto Test of the microcontroller unit 30 and the second output terminal of the third optical coupler U3 , and the other end of the second filter circuit is grounded GND.

[0070] In this embodiment, a third optical coupler U3 can be provided in the automatic test circuit 20 to isolate the second power supply from the microcontroller unit 30, so that the microcontroller unit 30 can stably receive the test signal for testing the annular spot laser 10. A resistor R6 is provided between the first input terminal of the third optical coupler U3 and the second switch K2.

[0071] Specifically, the second switch K2 can be a dial switch to enable manual dialing, and the on and off of the second switch K2 can also be controlled by the microcontroller unit 30. A second filter circuit can be provided between the second output terminal of the third optical coupler U3 and the first input terminal Hard Wire Auto Test of the microcontroller unit 30 to enable the microcontroller unit 30 to stably receive the test signal for testing the annular spot laser 10.

[0072] The second filtering circuit may include a resistor R5 and a capacitor C3 connected in parallel, one end of the resistor R5 and the capacitor C3 being electrically connected to the second output end of the third optocoupler U3 and the first input end Hard Wire Auto Test of the microcontroller unit 30, respectively, and the other end of the resistor R5 and the capacitor C3 being grounded GND.

[0073] In addition, the second input terminal of the third optical coupler U3 can be connected to a 3.3V second power supply and grounded GND via a capacitor C4. One terminal of the second switch K2 can be connected to a 24V third power supply, which can be provided by the power port 24VIN.

[0074] In some embodiments, as Figure 5 As shown, the first light output control circuit 40 includes:

[0075] a third switch K3, one end of the third switch K3 is connected to the fourth power supply, and the other end of the third switch K3 is electrically connected to the first input end of the annular spot laser 10;

[0076] A second light emitting diode LED2, wherein the anode of the second light emitting diode LED2 is electrically connected to the other end of the third switch K3 and the first input end of the annular spot laser 10, and the other end of the second light emitting diode LED2 is grounded GND;

[0077] a fourth optical coupler U4, wherein a first input end of the fourth optical coupler U4 is electrically connected to a second output end MOD_R of the microcontroller unit 30, a first output end of the fourth optical coupler U4 is grounded GND, a second input end of the fourth optical coupler U4 is connected to a fifth power supply, and a second output end of the fourth optical coupler U4 is electrically connected to a first input end of the annular spot laser 10;

[0078] The third filter circuit has one end electrically connected to the second output end of the fourth optical coupler U4 and the first input end of the annular spot laser 10 , and the other end of the third filter circuit is grounded GND.

[0079] In this embodiment, a fourth optical coupler U4 can be provided in the first light output control circuit 40 to achieve electrical isolation between the microcontroller unit 30 and the annular spot laser 10, so that the signal output by the microcontroller unit 30 can be stably transmitted between the microcontroller unit 30 and the annular spot laser 10.

[0080] A resistor R7 is provided between the first input terminal of the fourth optical coupler U4 and the second output terminal MOD_R of the microcontroller unit 30. A resistor R8 can also be provided between the first input terminal and the first output terminal of the fourth optical coupler U4. Two transistors can be provided within the fourth optical coupler U4 to enhance its driving capability and improve signal transmission efficiency, thereby achieving higher driving capability and better signal transmission effects.

[0081] Specifically, the third switch K3 can independently control the annular spot laser 10 to emit light in an outer ring pattern. Simultaneously, the microcontroller unit 30 can independently control the annular spot laser 10 to emit light in an outer ring pattern via the fourth optical coupler U4. The microcontroller unit 30 can also control the third switch K3 to independently control the annular spot laser 10 to emit light in an outer ring pattern. The third switch K3 can be a dial switch for manual operation, and the microcontroller unit 30 can also control the on / off of the third switch K3. One end of the third switch K3 can be connected to a 24V fourth power supply, which can be provided by the power port 24VIN.

[0082] The third filtering circuit may include a resistor R25 and a capacitor C10 connected in parallel, one end of the resistor R25 and the capacitor C10 connected in parallel are electrically connected to the second output end of the fourth optical coupler U4 and the first input end of the annular spot laser 10, respectively, and the other end of the resistor R25 and the capacitor C10 connected in parallel are grounded GND.

[0083] At the same time, a second light-emitting diode LED2 and a resistor R9 connected in series can be provided at the connection point where the other end of the third switch K3 is electrically connected to the first input end of the annular spot laser 10, so as to accurately know whether the annular spot laser 10 is continuously emitting outer ring light.

[0084] In addition, the second input terminal of the fourth optical coupler U4 can be connected to a fifth power supply of 24V, which can be provided by the power port 24VIN.

[0085] In some embodiments, as Figure 6 As shown, the second light output control circuit 50 includes:

[0086] a fourth switch K4, one end of the fourth switch K4 is connected to the sixth power supply, and the other end of the fourth switch K4 is electrically connected to the second input end of the annular spot laser 10;

[0087] a third light emitting diode LED3, wherein the anode of the third light emitting diode LED3 is electrically connected to the other end of the fourth switch K4 and the second input end of the annular spot laser 10, and the other end of the third light emitting diode LED3 is grounded GND;

[0088] a fifth optical coupler U5, wherein a first input end of the fifth optical coupler U5 is electrically connected to the third output end MOD_C of the microcontroller unit 30, a first output end of the fifth optical coupler U5 is grounded GND, a second input end of the fifth optical coupler U5 is connected to the seventh power supply, and a second output end of the fifth optical coupler U5 is electrically connected to the second input end of the annular spot laser 10;

[0089] The fourth filter circuit has one end electrically connected to the second output end of the fifth optical coupler U5 and the second input end of the annular spot laser 10 , and the other end of the fourth filter circuit is grounded GND.

[0090] In this embodiment, a fifth optical coupler U5 can be provided in the second light output control circuit 50 to achieve electrical isolation between the microcontroller unit 30 and the annular spot laser 10, so that the signal output by the microcontroller unit 30 can be stably transmitted between the microcontroller unit 30 and the annular spot laser 10.

[0091] A resistor R10 is provided between the first input terminal of the fifth optical coupler U5 and the third output terminal MOD_C of the microcontroller unit 30. A resistor R11 can also be provided between the first input terminal and the first output terminal of the fifth optical coupler U5. Two transistors can be provided within the fifth optical coupler U5 to enhance its driving capability and improve signal transmission efficiency, thereby achieving higher driving capability and better signal transmission performance.

[0092] Specifically, the fourth switch K4 can independently control the annular spot laser 10 to emit light from the center. Simultaneously, the microcontroller unit 30 can independently control the annular spot laser 10 to emit light from the center via the fifth optical coupler U5. The microcontroller unit 30 can also control the fourth switch K4 to independently control the annular spot laser 10 to emit light from the center. The fourth switch K4 can be a DIP switch for manual operation, and the microcontroller unit 30 can also control the on / off of the fourth switch K4. One end of the fourth switch K4 can be connected to a 24V sixth power supply, which can be provided by the power port 24VIN.

[0093] The fourth filtering circuit may include a resistor R26 and a capacitor C11 connected in parallel, one end of the resistor R26 and the capacitor C11 connected in parallel are electrically connected to the second output end of the fifth optical coupler U5 and the second input end of the annular spot laser 10, respectively, and the other end of the resistor R26 and the capacitor C11 connected in parallel are grounded GND.

[0094] At the same time, a third light-emitting diode LED3 and a resistor R12 connected in series can be provided at the connection point between the other end of the fourth switch K4 and the second input end of the annular spot laser 10, so as to accurately determine whether the annular spot laser 10 is continuously emitting light in the outer ring. In addition, the second input end of the fifth optical coupler U5 can be connected to a seventh 24V power supply, which can be provided by the power port 24VIN.

[0095] In some embodiments, as Figure 1 As shown, the test fixture also includes a power regulation circuit 80; wherein, one end of the power regulation circuit 80 is connected to the eighth power supply, and the other end of the power regulation circuit 80 is electrically connected to the power regulation end of the annular spot laser 10 and the third input end of the microcontroller unit 30.

[0096] In this embodiment, the power adjustment circuit 80 can simultaneously output a power adjustment signal to the microcontroller unit 30 and the annular spot laser 10. After receiving the power adjustment signal, the annular spot laser 10 can emit outer ring light and center light at corresponding powers. After receiving the power adjustment signal, the microcontroller unit 30 can display the adjusted output power of the annular spot laser 10.

[0097] In some embodiments, as Figure 7 As shown, the power regulation circuit 80 includes:

[0098] a fifth switch K5, one end of the fifth switch K5 being connected to an eighth power source;

[0099] a potentiometer R13, one end of the potentiometer R13 being electrically connected to the other end of the fifth switch K5;

[0100] A first voltage follower U6, a first input end of the first voltage follower U6 is electrically connected to the other end of the potentiometer R13, a second input end of the first voltage follower U6 is electrically connected to the output end of the voltage follower, and the output end of the first voltage follower U6 is electrically connected to the power adjustment end of the annular spot laser 10 and the third input end ADIn_R of the microcontroller unit 30 respectively.

[0101] In this embodiment, the output power of the annular spot laser 10 can be adjusted by a potentiometer R13, which can be an adjustable resistor. A resistor R16 can be provided between the potentiometer R13 and the fifth switch K5. The second input terminal of the first voltage follower U6 can be electrically connected to the output terminal of the voltage follower via a resistor R17. The first power supply terminal of the first voltage follower U6 can be connected to a 12V power supply and grounded to GND via a capacitor C5. The first power supply terminal of the first voltage follower U6 is grounded to GND. The output terminal of the first voltage follower U6 is electrically connected to the power adjustment terminal of the annular spot laser 10 and is also electrically connected to the third input terminal ADIn_R of the microcontroller unit 30 via a resistor R15. The eighth power supply can be a 12V power supply.

[0102] In some embodiments, as Figure 7 As shown, the power regulator also includes a fifth filtering circuit; wherein, one end of the fifth filtering circuit is electrically connected to the output end of the first voltage follower U6 and the power adjustment end of the annular spot laser 10, respectively, and the other end of the fifth filtering circuit is electrically connected to the third input end ADIn_R of the microcontroller unit 30.

[0103] In this embodiment, in order to ensure that the microcontroller unit 30 can stably receive the power adjustment signal output by the power adjustment circuit 80, a fifth filter circuit can be set between the output end of the first voltage follower U6 and the third input end ADIn_R of the microcontroller unit 30, so that the microcontroller unit 30 can accurately display the adjusted power of the annular spot laser 10.

[0104] Specifically, the fifth filtering circuit includes a resistor R14 and a capacitor C4 in parallel, one end of the resistor R14 and the capacitor C4 in parallel are electrically connected to the output end of the first voltage follower U6 and the third input end ADIn_R of the microcontroller unit 30, respectively, and the other end of the resistor R14 and the capacitor C4 in parallel are grounded GND.

[0105] In some embodiments, as Figure 1 As shown, the test fixture further includes a copy machine control circuit 60 ; wherein, one end of the copy machine control circuit 60 is connected to the ninth power supply, and the other end of the copy machine control circuit 60 is electrically connected to the fourth input end of the microcontroller unit 30 .

[0106] Specifically, the present application can also implement a burn-in test on the annular spot laser 10, and the burn-in control circuit 60 can be provided between the annular spot laser 10 and the microcontroller unit 30. When the annular spot laser 10 needs to be burn-in tested, the burn-in control circuit 60 can control the annular spot laser 10 to perform the burn-in test, and the microcontroller unit 30 can detect the corresponding signal from the burn-in control circuit 60 to determine whether the annular spot laser 10 is in the burn-in test.

[0107] In some embodiments, as Figure 9 As shown, the copy machine control circuit 60 includes:

[0108] a sixth switch K6, one end of the sixth switch K6 being connected to a ninth power source;

[0109] a sixth optical coupler U8, wherein a first input end of the sixth optical coupler U8 is electrically connected to the other end of the sixth switch K6, a first output end of the sixth optical coupler U8 is grounded GND, a second input end of the sixth optical coupler U8 is connected to a tenth power supply, and a second output end of the sixth optical coupler U8 is electrically connected to a fourth input end of the microcontroller unit 30, BeamSwtich Auto Test;

[0110] A sixth filter circuit, one end of the sixth filter circuit is electrically connected to the second output end of the sixth optical coupler U8 and the fourth input end BeamSwtich Auto Test of the microcontroller unit 30, and the other end of the sixth filter circuit is grounded GND.

[0111] In this embodiment, the sixth switch K6 may be a shutter copy switch of the annular spot laser 10 , which may be a dial switch for manual dialing. The on and off of the sixth switch K6 may also be controlled by the microcontroller unit 30 .

[0112] At the same time, a sixth optical coupler U8 can be set between the sixth switch K6 and the fourth input terminal BeamSwtich Auto Test of the microcontroller unit 30, a resistor R20 can be set between the sixth switch K6 and the sixth optical coupler U8, the second input terminal of the sixth optical coupler U8 can be connected to the tenth power supply of 3.3V and grounded GND through the capacitor C8, and a sixth filter circuit can be set between the second output terminal of the sixth optical coupler U8 and the fourth input terminal BeamSwtich Auto Test of the microcontroller unit 30, thereby realizing stable detection of the automatic copying signal of the optical gate machine of the annular spot laser 10.

[0113] In which, the sixth filtering circuit may include a parallel resistor R19 and a capacitor C7, one end of the parallel resistor R19 and the capacitor C7 are electrically connected to the second output end of the sixth optocoupler U8 and the fourth input end BeamSwtich Auto Test of the microcontroller unit 30, respectively, and the other end of the parallel resistor R19 and the capacitor C7 are grounded GND.

[0114] In some embodiments, as Figure 1 As shown, the test fixture further includes a power feedback circuit 100 ; wherein, one end of the power feedback circuit 100 is electrically connected to the feedback end of the annular spot laser 10 , and the other end of the power feedback circuit 100 is electrically connected to the fifth input end of the microcontroller unit 30 .

[0115] Specifically, the power feedback circuit 100 can be arranged between the feedback end of the annular spot laser 10 and the fifth input end of the microcontroller unit 30. The feedback end of the annular spot laser 10 can feed back its power to the microcontroller unit 30 through the power feedback circuit 100, so that the microcontroller unit 30 can feed back the power of the central light and the outer ring light of the annular spot laser 10.

[0116] In some embodiments, as Figure 8 As shown, the power feedback circuit 100 includes:

[0117] a seventh filtering circuit, one end of the seventh filtering circuit being electrically connected to the feedback end, and the other end of the seventh filtering circuit being grounded GND;

[0118] The second voltage follower U7, the first input end of the second voltage follower U7 is electrically connected to one end of the seventh filter circuit, the second input end of the second voltage follower U7 is electrically connected to the feedback end LaserPowerFk-R of the annular spot laser 10, and the output end of the second voltage follower U7 is electrically connected to the fifth input end PowerFk-R of the microcontroller unit 30.

[0119] In this embodiment, the second voltage follower U7 is arranged between the fifth input terminal PowerFk-R of the microcontroller unit 30 and the feedback terminal LaserPowerFk-R of the annular spot laser 10. At the same time, a seventh filter circuit can be set between the second input terminal of the second voltage follower U7 and the feedback terminal of the spot laser, thereby ensuring that the power feedback signal output by the feedback terminal LaserPowerFk-R of the annular spot laser 10 can be stably input into the second voltage follower U7 and stably input into the microcontroller unit 30 through the second voltage follower U7.

[0120] The seventh filter circuit may include a parallel resistor R18 and a capacitor C6. One end of the parallel resistor R18 and capacitor C6 is electrically connected to the feedback terminal LaserPowerFk-R of the annular spot laser 10 and the fifth input terminal PowerFk-R of the microcontroller unit 30, respectively. The other ends of the parallel resistor R18 and capacitor C6 are grounded to GND. A first power supply terminal of the second voltage follower U7 can be connected to a 12V power supply, and a second power supply terminal of the second voltage follower U7 is grounded to GND.

[0121] In some embodiments, as Figure 1 As shown, the test fixture further includes a display circuit 120 ; wherein the display circuit 120 is electrically connected to the fourth output terminal of the microcontroller unit 30 , and is configured to display the outer ring light and the center light of the annular spot laser 10 respectively.

[0122] In this embodiment, the display circuit 120 can display the test status information, power information, and power feedback information of the annular spot laser 10 , thereby enabling a visual test of the annular spot laser 10 .

[0123] In some embodiments, as Figure 11 As shown, the display circuit 120 may include a resistor R23 and a light-emitting diode LED4 connected in series, one end of the resistor R23 and the light-emitting diode LED4 connected in series is connected to the pin MCU_LEDRED of the microcontroller unit 30, and the other end of the resistor R23 and the light-emitting diode LED4 connected in series is grounded GND, so as to display that the test of the annular spot laser 10 is successful; the display circuit 120 may also include a resistor R24 ​​and a light-emitting diode LED5 connected in series, one end of the resistor R24 ​​and the light-emitting diode LED5 connected in series is connected to the pin MCU_LEDGREEN of the microcontroller unit 30, and the other end of the resistor R24 ​​and the light-emitting diode LED5 connected in series is grounded GND, so as to display that the test of the annular spot laser 10 fails.

[0124] In some embodiments, as Figure 1 As shown, the test fixture also includes a channel detection circuit 90; wherein, one end of the channel detection circuit 90 is electrically connected to the channel signal output end of the annular spot laser 10, and the other end of the channel detection circuit 90 is electrically connected to the sixth input end of the microcontroller unit 30; the channel detection circuit 90 is configured to detect the channel lens state of the annular spot laser 10.

[0125] In this embodiment, the channel detection circuit 90 can be arranged between the channel lens of the annular spot laser 10 and the sixth input terminal of the microcontroller unit 30. When the shutter copy machine switch of the annular spot laser 10 is closed, the microcontroller unit 30 detects that the annular spot laser 10 is performing a copy machine test. At this time, the microcontroller unit 30 also needs to obtain the status of whether the channel lens of the annular spot laser 10 is turned on to further determine whether the annular spot laser 10 is performing a copy machine test.

[0126] In some embodiments, as Figure 10 As shown, the channel detection circuit 90 includes:

[0127] a seventh optical coupler U9, wherein a first input end of the seventh optical coupler U9 is electrically connected to the channel signal output end of the annular spot laser 10, a first output end of the seventh optical coupler U9 is grounded GND, a second input end of the seventh optical coupler U9 is connected to a twelfth power supply, and a second output end of the seventh optical coupler U9 is electrically connected to a sixth input end BS1 MirrorOFF of the microcontroller unit 30;

[0128] An eighth filtering circuit, one end of the eighth filtering circuit is electrically connected to the second output end of the seventh optical coupler U9 and the sixth input end BS1 Mirror OFF of the microcontroller unit 30, and the other end of the eighth filtering circuit is grounded GND.

[0129] In this embodiment, the seventh optical coupler U9 is provided between the channel mirror of the annular spot laser 10 and the sixth input terminal BS1 Mirror OFF of the microcontroller unit 30, which can achieve electrical isolation between the microcontroller unit 30 and the annular spot laser 10, so that the signal output by the microcontroller unit 30 can be stably transmitted between the microcontroller unit 30 and the annular spot laser 10. Among them, a resistor R22 is provided between the first input terminal of the seventh optical coupler U9 and the channel signal output terminal BS-Mirror OFF-2 of the annular spot laser 10.

[0130] The eighth filter circuit may include a parallel resistor R21 and a capacitor C9. One end of the parallel resistor R21 and capacitor C9 is electrically connected to the second output terminal of the seventh optical coupler U9 and the sixth input terminal BS1MirrorOFF of the microcontroller unit 30, respectively. The other ends of the parallel resistor R21 and capacitor C9 are grounded GND. The second input terminal of the seventh optical coupler U9 can be connected to a twelfth 3.3V power supply and to ground GND via capacitor C10.

[0131] The test fixture of the ring spot laser 10 provided in the present application includes an automatic test circuit 20, a microcontroller unit 30, a first light output control circuit 40 and a second light output control circuit 50. The first input end, the first output end, the second output end and the third output end of the microcontroller unit 30 are electrically connected to the automatic test circuit 20, the first light output control circuit 40 and the second light output control circuit 50, respectively. The first light output control circuit 40 and the second light output control circuit 50 are electrically connected to the first input end and the second input end of the ring spot laser 10, respectively. The automatic test circuit 20 is configured to request the microcontroller unit 30 to control the ring spot laser 10 to emit light, the first light output control circuit is configured to control the outer ring light of the ring spot laser 10, and the second light output control circuit is configured to control the center light of the ring spot laser. This not only realizes the test of the ring spot laser 10, but also can perform one-button automatic testing on the ring spot laser 10, greatly improving the test efficiency of the laser.

[0132] It is understood that the test fixture for the annular spot laser 10 provided in the above embodiment is merely an example. The test fixture for the annular spot laser 10 described in the embodiment of this application is intended to more clearly illustrate the technical solution of the test method for the annular spot laser 10 provided in the embodiment of this application, and does not constitute a limitation of the technical solution provided in the embodiment of this application. It is understood by those skilled in the art that with the evolution of the system and the emergence of new business scenarios, the technical solution provided in the embodiment of this application is also applicable to similar technical problems. The following is a detailed description of the test method for the annular spot laser 10.

[0133] It should be noted that the order in which the following embodiments are described does not limit the preferred order of the embodiments. The following describes in detail the testing method for the annular spot laser 10. Furthermore, the testing method for the annular spot laser 10 provided herein can be executed by the microcontroller unit 30. That is, the application corresponding to the testing method for the annular spot laser 10 can be burned into the microcontroller unit 30.

[0134] like Figure 12 As shown, the present application also provides a testing method for an annular spot laser 10, which is applied to a testing tool for the annular spot laser 10, the testing tool including an automatic testing circuit 20, a microcontroller unit 30, a first light output control circuit 40 and a second light output control circuit 50; the testing method includes: steps S110, S120, S130 and S140.

[0135] S110, initializing the test fixture of the annular spot laser;

[0136] S120, generating a first light emission control instruction and a second light emission control instruction according to the automatic test signal sent by the automatic test circuit;

[0137] S130, controlling the first light output control circuit 40 to output a first light output modulated signal according to the first light output control instruction, and controlling the second light output control circuit 50 to output a second light output modulated signal according to the second light output control instruction;

[0138] S140 , controlling the outer ring light emission of the annular spot laser 10 according to the first light emission modulation signal, and controlling the center light emission of the annular spot laser 10 according to the second light emission modulation signal.

[0139] In this embodiment, after the annular spot laser test fixture is powered on, the microcontroller unit 30 configures the peripheral interfaces such as ADC, DAC, IIC, and TIMER in the annular spot laser test fixture, and initializes the OLED electronic screen display.

[0140] Specifically, after receiving the automatic test signal sent by the automatic test circuit, a first light output control instruction and a second light output control instruction can be generated, and the first light output control circuit 40 can be controlled to output a first light output modulation signal according to the first light output control instruction, and the second light output control circuit 50 can be controlled to output a second light output modulation signal according to the second light output control instruction. The annular spot laser 10 can then emit outer ring light according to the first light output modulation signal and emit center light according to the second light output modulation signal.

[0141] At the same time, the microcontroller unit 30 collects external analog quantities in real time and displays them on the OLED screen, monitors external automatic test signals and external optical shutter automatic copying signals in real time, executes corresponding functions upon receiving commands, performs tests according to established procedures, and displays the test results on the OLED screen and indicator lights.

[0142] In some embodiments, the test fixture further includes a control circuit 60; wherein, the first light output control instruction and the second light output control instruction are generated according to the automatic test signal sent by the automatic test circuit, including: controlling the control circuit to generate a control signal of the annular spot laser according to the automatic test signal to obtain a status signal output by the annular spot laser; generating the first light output control instruction and the second light output control instruction according to the status signal.

[0143] In this embodiment, after receiving the automatic test signal sent by the automatic test circuit, the microcontroller unit 30 needs to output a signal for controlling the annular spot laser 10 to the control circuit 60, so as to control the control circuit 60 to output a control signal to the annular spot laser 10, so that the annular spot laser 10 outputs a status bit, that is, outputs a status signal, thereby facilitating the microcontroller unit 30 to detect whether the annular spot laser 10 can respond normally, thereby generating a first light output control instruction and a second light output control instruction to control the first light output control circuit and the second light output control circuit to control the annular spot laser 10 to emit outer ring light and center light.

[0144] In some embodiments, the control circuit 60 includes a first switch K1; wherein, controlling the control circuit to generate a control signal for the annular spot laser according to the automated test signal to obtain a status signal output by the annular spot laser includes: controlling the first switch to be closed, and outputting a first signal to the control circuit according to the automated test signal to generate a control signal; and obtaining a status signal output by the annular spot laser to the microcontroller unit according to the control signal.

[0145] In this embodiment, the first switch K1 can be controlled by the microcontroller unit 30. After controlling the first switch K1 to be closed, the microcontroller unit 30 can output a first signal to the control circuit, so that the control circuit outputs a control signal to the annular spot laser 10, thereby controlling the annular spot laser 10 to output a status signal.

[0146] In some embodiments, the test tool also includes a status detection circuit; wherein, generating a first light control instruction and a second light control instruction according to the status signal includes: obtaining a second signal output by the status detection circuit; wherein the second signal is generated by the status detection circuit according to the status signal; and generating a first light control instruction and a second light control instruction according to the second signal.

[0147] In this embodiment, the annular spot laser 10 can output a status signal to the status detection circuit, and the status detection circuit can output a second signal to the microcontroller unit 30 based on the status signal. After receiving the second signal, the microcontroller unit 30 can determine the status of the annular spot laser 10 and then generate the first light output control instruction and the second light output control instruction.

[0148] In some embodiments, the first light output control circuit 40 includes a third switch K3, and the second light output control circuit 50 includes a fourth switch K4; wherein, according to the first light output control instruction output by the microcontroller unit 30, the first light output control circuit 40 is controlled to output the first light output modulation signal, and according to the second light output control instruction output by the microcontroller unit 30, the second light output control circuit 50 is controlled to output the second light output modulation signal, including: determining the light output mode of the annular spot laser 10; if the light output mode is the preset first mode, controlling the third switch K3 and the fourth switch K4 to be closed respectively to generate the first light output modulation signal and the second light output modulation signal; if the light output mode is the preset second mode, disconnecting the third switch K3 and the fourth switch K4 respectively; generating the first light output modulation signal and the second light output modulation signal respectively according to the first light output control instruction and the second light output control instruction.

[0149] In some embodiments, the test tool further includes a power regulation circuit 80; wherein the test method further includes: obtaining a power regulation signal from the power regulation circuit 80; controlling the outer ring light emission of the annular spot laser 10 according to the power regulation signal and the first light emission modulation signal, and controlling the center light emission of the annular spot laser 10 according to the power regulation signal and the second light emission modulation signal.

[0150] In this embodiment, after the microcontroller unit 30 receives the automatic test signal sent by the automatic test circuit, if it receives the power adjustment signal output by the power adjustment circuit 80, the microcontroller unit 30 can generate a first light output control instruction and a second light output control instruction according to the power adjustment signal, thereby causing the annular spot laser 10 to emit outer ring light and center light according to the first light output control instruction and the second light output control instruction.

[0151] At the same time, when the annular spot laser 10 is already in the state of emitting outer ring light and center light, if it receives a power adjustment signal output by the power adjustment circuit 80, the annular spot laser 10 can emit outer ring light and center light of corresponding power according to the power adjustment signal output by the power adjustment circuit 80.

[0152] In some embodiments, the power regulation circuit 80 includes a fifth switch K5 ; before obtaining the power regulation signal of the power regulation circuit 80 , the method further includes: controlling the fifth switch K5 to be closed to generate the power regulation signal.

[0153] In this embodiment, a potentiometer is further provided in the power adjustment circuit 80. When the annular spot laser 10 is required to emit outer ring light and center light of corresponding power, the potentiometer can be adjusted in advance. After the potentiometer is adjusted, the fifth switch K5 can be closed to generate a power adjustment signal.

[0154] In some embodiments, the power regulation circuit 80 includes a fifth switch K5 ; wherein, after obtaining the power regulation signal of the power regulation circuit 80 , the power regulation signal is further sent to the microcontroller unit 30 to display the output light power of the annular spot laser 10 .

[0155] In this embodiment, the microcontroller unit 30 can also collect the output light power of the annular spot laser 10 from the power regulation circuit 80, and input the collected output light power into the OLED screen for display, so as to visualize the output light power of the annular spot laser 10.

[0156] In some embodiments, the test tool also includes a copy machine control circuit 60 and a first channel detection circuit and a second channel detection circuit; wherein, the testing method also includes: if a copy machine signal input by the copy machine control circuit is received, obtaining the first state information input by the first channel detection circuit and the second state information input by the second channel detection circuit; if the first state information is the preset first information, determining whether the second state information is the preset second information; if the second state information is the second information, generating a third light output control instruction and a fourth light output control instruction; according to the third light output control instruction and the fourth light output control instruction, respectively controlling the first light output control circuit to output a third light output modulation signal and a fourth light output modulation signal; according to the third light output modulation signal and the fourth light output modulation signal, respectively controlling the outer ring light output and the center light output of the annular spot laser to perform a copy machine test on the annular spot laser.

[0157] In this embodiment, the test fixture can also perform a copy test on the annular spot laser 10. When the annular spot laser 10 needs to be copied, a copy signal can be output through the copy control circuit 60. After receiving the copy signal, the microcontroller unit 30 needs to first close the channel corresponding to the current channel lens of the optical shutter of the annular spot laser 10. The closed state can be determined by obtaining the first state information input by the first channel detection circuit. After determining that the first state information is the preset first information, it can be determined that the channel corresponding to the current channel lens of the optical shutter of the annular spot laser 10 is in the closed state. At this time, the channel corresponding to the channel lens where the copy machine test is located can be turned on, and the second state information input by the second channel detection circuit can be obtained to determine that the channel lens where the copy machine test is located is in the turned-on state. Then, the third light output control instruction and the fourth light output control instruction can be generated to control the first light output control circuit to output the third light output modulation signal and the fourth light output modulation signal, so that the outer ring light output and the center light output of the annular spot laser can be controlled according to the third light output modulation signal and the fourth light output modulation signal respectively to perform a copy machine test on the annular spot laser. Among them, the first channel detection circuit and the second channel detection circuit can be implemented using the channel detection circuit provided by this application.

[0158] In some embodiments, the test fixture further includes a power feedback circuit 100 and a display circuit 120; after controlling the outer ring light output of the ring spot laser 10 according to the first light output modulation signal and controlling the center light output of the ring spot laser 10 according to the second light output modulation signal, it further includes: obtaining the output power of the ring spot laser 10 from the power feedback circuit 100 according to the power feedback signal output by the ring spot laser 10; and inputting the output power of the ring spot laser 10 into the display circuit 120 to display the outer ring light output power and the center light output power of the ring spot laser 10.

[0159] In this embodiment, the test fixture is also provided with a power feedback circuit and a display circuit. When the annular spot laser 10 emits outer ring light and center light, the outer ring light output power and center light output power of the annular spot laser 10 can be output to the microcontroller unit 30 through the power feedback circuit 100. After the microcontroller unit 30 receives the outer ring light output power and center light output power of the annular spot laser 10, the outer ring light output power and center light output power of the annular spot laser 10 can be displayed through the display circuit.

[0160] The test method of the ring spot laser 10 provided in the present application initializes the test fixture of the ring spot laser and generates a first light output control instruction and a second light output control instruction according to the automatic test signal sent by the automatic test circuit; controls the first light output control circuit to output a first light output modulation signal according to the first light output control instruction, and controls the second light output control circuit to output a second light output modulation signal according to the second light output control instruction; controls the outer ring light of the ring spot laser according to the first light output modulation signal, and controls the center light of the ring spot laser according to the second light output modulation signal. This not only realizes the test of the ring spot laser, but also can perform one-button automatic testing on the ring spot laser, greatly improving the test efficiency of the laser.

[0161] In some embodiments, the present application further provides a testing system for an annular spot laser, comprising:

[0162] An initialization unit, used to initialize the test fixture of the annular spot laser;

[0163] A generating unit, configured to generate a first light emitting control instruction and a second light emitting control instruction according to an automatic test signal sent by the automatic test circuit;

[0164] a first control unit, configured to control the first light output control circuit to output a first light output modulation signal according to a first light output control instruction, and to control the second light output control circuit to output a second light output modulation signal according to a second light output control instruction;

[0165] The second control unit is used to control the outer ring light emission of the annular spot laser according to the first light emission modulation signal, and to control the center light emission of the annular spot laser according to the second light emission modulation signal.

[0166] The ring spot laser test system provided in the embodiment of the present application is used to execute the above-mentioned test tooling for initializing the ring spot laser, and generate a first light output control instruction and a second light output control instruction according to the automatic test signal sent by the automatic test circuit; control the first light output control circuit to output a first light output modulation signal according to the first light output control instruction, and control the second light output control circuit to output a second light output modulation signal according to the second light output control instruction; control the outer ring light of the ring spot laser according to the first light output modulation signal, and control the center light of the ring spot laser according to the second light output modulation signal.

[0167] It should be noted that those skilled in the art can clearly understand that the specific implementation process of the above-mentioned ring spot laser test system and each unit can refer to the corresponding description in the above-mentioned method embodiment, and for the convenience and brevity of description, it will not be repeated here.

[0168] It should also be noted that the above-mentioned ring spot laser testing system can be burned into the microcontroller unit 30 in the form of an application program, and the microcontroller unit 30 is used to execute the testing method of the ring spot laser 10 provided in this application.

[0169] The above description is merely a specific embodiment of the present application, but the scope of protection of the present application is not limited thereto. Any person skilled in the art can easily conceive of various equivalent modifications or substitutions within the technical scope disclosed in the present application, and such modifications or substitutions should be included in the scope of protection of the present application. Therefore, the scope of protection of the present application should be based on the scope of protection of the claims.

Claims

1. A method for testing an annular spot laser, characterized in that: A test fixture for an annular spot laser, the test fixture comprising an automatic test circuit, a microcontroller unit, a first light output control circuit and a second light output control circuit; the test method comprising: Initializing a test fixture for the annular spot laser; Generate a first light emission control instruction and a second light emission control instruction according to the automatic test signal sent by the automatic test circuit; Controlling the first light output control circuit to output a first light output modulation signal according to the first light output control instruction, and controlling the second light output control circuit to output a second light output modulation signal according to the second light output control instruction; Controlling the outer ring light emission of the annular spot laser according to the first light emission modulation signal, and controlling the center light emission of the annular spot laser according to the second light emission modulation signal; The first input end of the microcontroller unit is electrically connected to the automatic test circuit, and the first output end of the microcontroller unit is electrically connected to the control end of the annular spot laser; the first light output control circuit is electrically connected to the first input end of the annular spot laser and the second output end of the microcontroller unit respectively; the second light output control circuit is electrically connected to the second input end of the annular spot laser and the third output end of the microcontroller unit respectively; the automatic test circuit is configured to request the microcontroller unit to control the annular spot laser to emit light, the first light output control circuit is configured to control the outer ring light of the annular spot laser, and the second light output control circuit is configured to control the center light of the annular spot laser; The automatic test circuit comprises: a second switch, one end of which is connected to a second power supply; a third optical coupler, wherein a first input end of the third optical coupler is electrically connected to the other end of the second switch, a first output end of the third optical coupler is grounded, a second input end of the third optical coupler is connected to a third power supply, and a second output end of the third optical coupler is electrically connected to the first input end of the microcontroller unit; a second filtering circuit, one end of the second filtering circuit being electrically connected to the first input end of the microcontroller unit and the second output end of the third optical coupler, and the other end of the second filtering circuit being grounded; The test fixture further includes a control circuit and a state detection circuit; one end of the control circuit is electrically connected to the first output end of the microcontroller unit, and the other end of the control circuit is electrically connected to the control end of the annular spot laser; one end of the state detection circuit is electrically connected to the state output end of the annular spot laser, and the other end of the state detection circuit is electrically connected to the second input end of the microcontroller unit; The step of generating the first light output control instruction and the second light output control instruction according to the automatic test signal sent by the automatic test circuit includes: controlling the control circuit to generate a control signal for the annular spot laser according to the automatic test signal to obtain a status signal output by the annular spot laser; and generating the first light output control instruction and the second light output control instruction according to the status signal; Generating the first light-emitting control instruction and the second light-emitting control instruction according to the status signal includes: obtaining a second signal output by the status detection circuit; wherein the second signal is generated by the status detection circuit according to the status signal; and generating the first light-emitting control instruction and the second light-emitting control instruction according to the second signal.

2. The method for testing an annular spot laser according to claim 1, characterized in that: The control circuit includes a first switch; The step of controlling the control circuit to generate a control signal for the annular spot laser according to the automated test signal to obtain a status signal output by the annular spot laser includes: controlling the first switch to close, and outputting a first signal to the control circuit according to the automation test signal to generate the control signal; The state signal output by the annular spot laser to the microcontroller unit is acquired according to the control signal.

3. The method for testing an annular spot laser according to claim 1, wherein: The first light output control circuit includes a third switch, and the second light output control circuit includes a fourth switch; The step of controlling the first light control circuit to output a first light modulation signal according to the first light control instruction, and controlling the second light control circuit to output a second light modulation signal according to the second light control instruction, includes: Determining the light emission mode of the annular spot laser; If the light output mode is the preset first mode, controlling the third switch and the fourth switch to be closed respectively to generate the first light output modulation signal and the second light output modulation signal; If the light emission mode is the preset second mode, disconnecting the third switch and the fourth switch respectively; The first light-emitting modulation signal and the second light-emitting modulation signal are generated respectively according to the first light-emitting control instruction and the second light-emitting control instruction.

4. The method for testing an annular spot laser according to claim 1, wherein: The test fixture also includes a power regulation circuit; The test method further comprises: Obtaining a power regulation signal from the power regulation circuit; Controlling the outer ring light emission of the annular spot laser according to the power adjustment signal and the first light emission modulation signal; The center light emission of the annular spot laser is controlled according to the power adjustment signal and the second light emission modulation signal.

5. The method for testing an annular spot laser according to claim 4, characterized in that: The power regulation circuit includes a fifth switch; Before obtaining the power regulation signal of the power regulation circuit, the method further includes: controlling the fifth switch to be closed to generate the power regulation signal; After obtaining the power regulation signal of the power regulation circuit, the method further includes: The output light power of the annular spot laser is displayed according to the power adjustment signal.

6. The method for testing an annular spot laser according to claim 1, wherein: The test fixture also includes a power feedback circuit and a display circuit; Wherein, after controlling the outer ring light emission of the annular spot laser according to the first light emission modulation signal and controlling the center light emission of the annular spot laser according to the second light emission modulation signal, the method further includes: obtaining the output power of the annular spot laser from the power feedback circuit according to the power feedback signal output by the annular spot laser; The output power of the annular spot laser is input into the display circuit to display the outer ring light output power and the center light output power of the annular spot laser.

7. The method for testing an annular spot laser according to any one of claims 1 to 6, characterized in that: The test fixture further includes a copy machine control circuit, a first channel detection circuit and a second channel detection circuit; The method further comprises: If a copying signal is received from the copying control circuit, first state information input from the first channel detection circuit and second state information input from the second channel detection circuit are acquired; If the first status information is the preset first information, determining whether the second status information is the preset second information; If the second state information is the preset second information, generating a third light emitting control instruction and a fourth light emitting control instruction; Controlling the first light control circuit to output a third light modulation signal and a fourth light modulation signal according to the third light control instruction and the fourth light control instruction respectively; The outer ring light and the center light of the annular spot laser are controlled respectively according to the third light output modulation signal and the fourth light output modulation signal, so as to perform a burn-in test on the annular spot laser.

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