Encapsulated resistor withstand voltage test device and withstand voltage test method thereof

By designing a packaged resistance voltage withstand test device, using transmission lines and test components for batch voltage withstand tests, and automatically screening of defective and qualified products through the sorting table, the problems of low detection efficiency and complex sorting in the existing technology are solved, and production efficiency is improved.

CN119881567APending Publication Date: 2025-04-25YEZHAN ELECTRONICS (HUIZHOU CITY) CO LTD
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Patent Information

Application Number
CN202510186312.4
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-02-20
Publication Date
2025-04-25

AI Technical Summary

Technical Problem

The existing voltage-withstanding detection equipment has low detection efficiency and requires detection resistors one by one. The sorting of defective resistors requires additional sorting devices, which affects production efficiency.

Method used

A packaged resistance voltage-withstanding test device is designed, including transmission line, discharge assembly and test assembly. The resistance is introduced into the test assembly through the transmission line, batch voltage-withstanding test is performed using probes and distribution boxes, and automatic screening of defective and qualified products is achieved through sorting tables and recycling boxes.

Benefits of technology

It improves the efficiency of resistance detection, can batch test resistance, and screens the defective products from qualified products without additional sorting devices, improving production efficiency.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention provides a packaging resistor voltage withstanding testing device and a testing method thereof. The packaging resistor voltage withstanding testing device comprises a transmission line, a blanking assembly and a testing assembly. The transmission line is used for bearing a to-be-tested resistor and driving the resistor to approach the test assembly. The test assembly comprises a support frame, a detection sliding table and a plurality of probes, the detection sliding table comprises a lifting part and a power distribution box, the plurality of probes are arranged on the power distribution box at intervals, and the lifting part is used for driving the probes to be in contact with a resistor; the discharging assembly comprises a carrying table, a material stirring mechanical arm and a tray located on the carrying table, a plurality of containing holes are formed in the tray, and the containing holes are used for containing the tested resistors. According to the packaging resistor withstand voltage testing device and the withstand voltage testing method thereof, the resistors to be tested can be tested in batches, the testing efficiency is improved, meanwhile, defective resistors and qualified resistors can be screened, and a sorting device does not need to be additionally arranged at a subsequent station.
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Description

Technical Field

[0001] The present invention relates to the field of resistor production, and in particular to a packaged resistor withstand voltage test device and a withstand voltage test method thereof. Background Art

[0002] After the resistors are sealed in plastic and before they are packaged and shipped, they are also required to undergo insulation and voltage resistance tests to screen out defective resistors to ensure stable quality of resistor shipment.

[0003] When conducting a withstand voltage test on a resistor, the resistor is transferred to the testing equipment, which connects the resistor to electricity and applies high voltage to the insulating material of the resistor for a period of time. By judging whether no breakdown occurs during the power-on time, it is determined whether the insulation of the resistor meets the standard, thereby avoiding the shipment of resistors with poor insulation.

[0004] However, the withstand voltage test requires that a continuous resistor be connected to an electric current. The detection process itself is time-consuming, and defective resistors need to be sorted. Therefore, the existing withstand voltage testing equipment uses a one-by-one detection method to detect resistors. Specifically, the plastic-sealed resistors are transported to the test position one by one, and then the tested resistors are taken away by a robot. The qualified ones are coded into the material tray and the defective ones are placed in the recycling location. This detection method consumes a long time and is not suitable for mass production occasions. That is, the detection efficiency of the existing withstand voltage testing equipment is low. Summary of the invention

[0005] The purpose of the present invention is to overcome the shortcomings of the prior art and provide a package resistor withstand voltage test device and a withstand voltage test method thereof, which can improve the detection efficiency and separate defective products from qualified products without setting up a sorting device at a subsequent workstation.

[0006] The objective of the present invention is achieved through the following technical solutions:

[0007] A package resistor withstand voltage test device, comprising: a transmission line, a blanking component and a test component;

[0008] The transmission line is used to carry the resistor to be tested and drive the resistor close to the test component;

[0009] The test assembly includes a support frame, a detection slide and a plurality of probes, the detection slide includes a lifting part and a distribution box, a plurality of the probes are arranged on the distribution box at intervals, and the lifting part is used to drive the probes to contact the resistor;

[0010] The unloading assembly includes a carrier, a material-discharging robot, and a tray located on the carrier. The tray is provided with a plurality of storage holes for storing resistors that have completed the test. The material-discharging robot is used to push the resistors that have completed the test to slide on the tray so that the resistors fall into the storage holes.

[0011] In one of the embodiments, a slope is provided on a side of the track away from the test assembly.

[0012] In one of the embodiments, a direct vibrator is provided on the slope.

[0013] In one embodiment, a sorting table and a recycling box are provided between the transmission line and the tray, and the recycling box is located below the transmission line. The sorting table includes a base, a plurality of floating brackets and a sorting cylinder connected to the floating bracket. The base is provided with a plurality of material distribution channels, and the material distribution channels are provided with movable grooves, guide rails and bottom slides. The floating bracket is slidably arranged in the movable groove, the floating bracket and the guide rail are arranged opposite to each other, and the guide rail and the floating bracket are used to support the resistor in cooperation, the sorting cylinder is used to drive the floating bracket to descend, and the bottom slide is inclined toward the location of the recycling box. A stop spring is provided at one end of the guide rail away from the transmission line; a plurality of first rails are provided on the transmission line, and a plurality of second rails are provided on the surface of the tray, and the material distribution channel is used to connect the first rail and the second rail.

[0014] In one embodiment, the receiving hole is located in the second track.

[0015] In one embodiment, the floating bracket and the guide rail are parallel to the extension direction of the first track.

[0016] In one embodiment, the material-moving robot includes a translation motor, a crossbeam and a material-moving plate, the crossbeam is provided with a T-shaped stepped hole, the material-moving plate passes through the T-shaped stepped hole, a plurality of material-moving teeth are provided on the material-moving plate at positions exposed outside the T-shaped stepped hole, an inclined surface is provided at the end of the material-moving teeth, and the inclined surface is inclined toward the position of the first track.

[0017] In one embodiment, the probes are arranged in groups of two, with one group of probes disposed above each of the first tracks.

[0018] In one embodiment, the test component further includes a plurality of markers.

[0019] A withstand voltage test method, based on the above package resistor withstand voltage test device, comprises the following steps:

[0020] Step 1: Connect the transmission line to the plastic packaging equipment and guide the resistor to be tested into the first track;

[0021] Step 2: The oscillator drives the resistor to be tested to slide along the first track;

[0022] Step 3: When the resistor to be tested moves to below the test assembly, the lifting unit drives the distribution box to descend so that the probe contacts the resistor to be tested in the first track;

[0023] Step 4: The power distribution box continuously supplies current to the resistor to be tested, and uses the probe to determine whether the resistor to be tested is broken down. If the insulation layer on the resistor to be tested is broken down during the power-on process, the resistor is a defective product, otherwise the resistor to be tested is a qualified product;

[0024] Step 5: The resistors that have completed the test are pushed to the sorting table. The guide rails and floating brackets work together to support the resistors. If the resistors on the sorting table are qualified, the floating brackets remain in place. If the resistors on the sorting table are defective, the sorting cylinder drives the floating brackets down, so that the defective resistors fall into the recycling box.

[0025] Step 6: The material-selecting robot pushes the qualified resistor into the tray and makes the qualified resistor slide along the second track until the qualified resistor falls into the storage hole.

[0026] The above-mentioned packaged resistor withstand voltage test device and withstand voltage test method can perform batch testing on resistors to be tested. While improving the test efficiency, it can screen out defective resistors from qualified resistors without the need to set up a sorting device at a subsequent workstation. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for use in the embodiments are briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without creative work.

[0028] Figure 1 It is a structural schematic diagram of a package resistor withstand voltage test device;

[0029] Figure 2 It is a side view of a package resistor withstand voltage test device;

[0030] Figure 3 It is a schematic diagram of the coordination between the transmission line and the blanking component;

[0031] Figure 4 This is a schematic diagram of the coordination between the beam and the pallet;

[0032] Figure 5 This is a schematic diagram of the material-shifting robot pushing the resistor;

[0033] Figure 6 It is a structural diagram of the sorting station;

[0034] Figure 7 This is the front view of the sorting table;

[0035] Figure 8 It is a schematic diagram of the state of the guide rail and the floating bracket supporting the resistor;

[0036] Fig. 9 This is the falling state diagram of the resistor when the floating support descends;

[0037] Fig.10 This is a schematic diagram of the state of the floating bracket after it is reset. DETAILED DESCRIPTION

[0038] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the relevant drawings. The preferred embodiments of the present invention are given in the drawings. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present invention more thoroughly understood.

[0039] It should be noted that when an element is referred to as being "fixed to" another element, it may be directly on the other element or there may be a central element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. The terms "vertical", "horizontal", "left", "right" and similar expressions used herein are for illustrative purposes only and do not represent the only implementation method.

[0040] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art of the present invention. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more related listed items.

[0041] See also Figure 1 and Figure 2 The present invention provides a package resistor withstand voltage test device 10, which includes: a transmission line 100, a blanking component 200 and a test component 300.

[0042] The transmission line 100 is used to carry the resistor 20 to be tested and drive the resistor close to the test component 300; the transmission line 100 is connected to the plastic packaging device, and the resistor that has completed the plastic packaging process enters the transmission line 100, and the transmission line 100 transfers the resistor toward the test component 300, thereby improving the resistance transmission efficiency.

[0043] See also Figure 1 and Figure 2 The test assembly 300 includes a support frame 310, a detection slide 320 and a plurality of probes 330. The detection slide 320 includes a lifting portion 321 and a distribution box 322. The plurality of probes 330 are arranged at intervals on the distribution box 322. The lifting portion 321 is used to drive the probes 330 to contact the resistor. When the resistor moves to the test assembly 300, the lifting portion 321 drives the distribution box 322 to descend, so that the probes 330 contact the resistor. The distribution box 322 inputs current to the contacted part of the resistor through the probes 330 to detect whether the insulation layer on the resistor meets the standard.

[0044] See also Figure 1 , Figure 2 and Figure 3 The unloading assembly 200 includes a carrier 210, a material-dispensing manipulator 220, and a tray 230 located on the carrier 210. The tray 230 is provided with a plurality of receiving holes 231 for receiving the resistors that have been tested. The material-dispensing manipulator 220 is used to push the resistors that have been tested to slide on the tray 230 so that the resistors fall into the receiving holes 231. The material-dispensing manipulator 220 is used to push the resistors that have been tested to slide on the tray 230 and dispense the resistors into the receiving holes 231. The tray 230 is used to temporarily store the resistors that have been tested so that they can be transferred in batches.

[0045] During the test, the transmission line 100 is connected to the plastic packaging equipment of the resistor, so that the resistors that have completed the plastic packaging process can directly enter the test equipment, and the distribution box 322 is equipped with multiple probes 330, which can perform a withstand voltage test on multiple resistors at the same time, and the material transfer robot 220 transfers the tested resistors to the tray 230 for batch testing, thereby improving the efficiency of the withstand voltage test;

[0046] Among them, the probes 330 are coordinated in groups of two, that is, every two probes 330 are coordinated to test one resistor 20. During the test, if the insulation layer of the resistor 20 does not meet the standard, the current will flow from one of the probes 330 through the resistor 20 and then enter the other probe 330; on the contrary, if the insulation layer formed by the plastic sealing of the resistor 20 is qualified, the above situation will not occur, that is, the distribution box 322 and the probes 330 form an open circuit. When the insulation layer of the resistor 20 does not meet the standard, the circuit will be turned on, that is, by judging whether there is current passing between the probes 330 in the same group, it can be determined whether the insulation layer of the resistor 20 is complete. Testing multiple resistors 20 at the same time can also accurately identify the location of the defective resistor 20.

[0047] See also Figure 2 Preferably, the test component 300 also includes a plurality of markers 350 , and the markers 350 are used to engrave marks on the surface of the defective resistor 20 for identifying the defective resistor 20 .

[0048] It can be seen that the above-mentioned testing device performs batch withstand voltage tests on resistors 20 by configuring multiple probes 330 on the distribution box 322, and can accurately determine the positions of defective resistors 20 during the test process, and transfer the tested resistors 20 to the tray 230 through the material transfer robot 220 to improve the testing efficiency of the resistors 20. However, in the above process, there are multiple resistors 20 that have completed the test, and the position and number of defective resistors 20 are uncertain. If a robot is used to sort defective products, a multi-axis robot needs to be configured to ensure that it can move to different positions to pick up defective products. Since the number of defective products measured each time will be different, it is necessary to wait for the robot to go back and forth multiple times to take away the defective products. During this period, the resistors 20 that have completed the test are in a standby state, which easily leads to the accumulation of resistors 20. That is, the sorting efficiency of this method will not keep up with the test efficiency of the resistors, and the inverted products will accumulate on the transmission line 100; the existing practice is to only mark the defective products and temporarily store them in batches on the tray 230. When the resistors 20 are packaged in the subsequent workstation, the packaging step is skipped after the mark on the defective resistors 20 is identified, saving sorting time. In other words, the test device identifies the defective products, and the sorting operation needs to be performed on other equipment, but in this way, the tray 230 is a mixed state of qualified products and defective products. Due to the presence of defective resistors, a part of the driving force is doing "useless work" when transporting the tray 230, which is not conducive to improving the shipment efficiency of the resistors.

[0049] See also Figure 2 , Figure 6 and Figure 8 In order to solve the above problem, a slope 340 is provided on the side of the track away from the test assembly 300; a straight vibrator is provided on the slope 340. A sorting platform 400 and a recycling box 600 are provided between the transmission line 100 and the tray 230. The recycling box 600 is located below the transmission line 100. The sorting platform 400 includes a base 410, a plurality of floating brackets 420 and a sorting cylinder 430 connected to the floating bracket 420. A plurality of material distribution channels 411 are provided on the base 410. The material distribution channels 411 are provided with movable grooves 41, guide rails 42 and bottom slides 43. The floating bracket 420 is slidably arranged in the movable groove 41. The floating bracket 420 and the guide rail 42 are arranged facing each other. The guide rail 42 and the floating bracket 420 cooperate to support the resistor. The sorting cylinder 430 is used to drive the floating bracket 420 to descend. The bottom slide 43 is inclined toward the location of the recycling box 600. A stop spring (not shown) is provided at one end of the guide rail 42 away from the transmission line 100. The stop spring can resist the resistor 20 to stop the resistor 20 in each material distribution channel 411 from moving forward.

[0050] See also Figure 3 , Figure 4 and Figure 6, a plurality of first tracks 110 are provided on the transmission line 100, a plurality of second tracks 232 are provided on the surface of the tray 230, and the material distribution channel 411 is used to connect the first track 110 and the second track 232;

[0051] See also Figure 4 and Figure 5 , the receiving hole 231 is located in the second track 232;

[0052] The floating bracket 420 and the guide rail 42 are parallel to the extending direction of the first track 110 .

[0053] At the same time, the following withstand voltage test method is provided, based on the above-mentioned package resistor withstand voltage test device 10, including the following steps:

[0054] Step 1: dock the transmission line 100 with the plastic packaging equipment, and guide the resistor 20 to be tested into the first track 110;

[0055] The plastic-sealed resistor 20 enters the slope 340 and moves along the first track 110 under the action of the straight vibrator. The first track 110 provides a limit for the resistor 20 to be tested, so that the resistors 20 entering the transmission line 100 are separated into multiple columns. Under the action of the straight vibrator, the resistor 20 at the rear of the first track 110 is tightly attached to the resistor 20 at the front, and provides thrust to push the resistor 20 in the front forward.

[0056] Step 2: The oscillator drives the resistor to be tested to slide along the first track 110;

[0057] Step 3: When the resistor to be tested 20 moves to below the test assembly 300 , the lifting unit 321 drives the distribution box 322 to descend, so that the probe 330 contacts the resistor to be tested in the first track 110 ;

[0058] The probes 330 are arranged in pairs, with one group of probes 330 disposed above each first track 110 . When the distribution box 322 descends, the two probes 330 in the same group contact the positions to be tested on the resistor 20 to perform a withstand voltage test.

[0059] Step 4: The distribution box 322 continuously supplies current to the resistor 20 to be tested, and determines whether the resistor to be tested is broken down through the probe 330. If the insulating layer on the resistor to be tested is broken down during the power-on process, the resistor is a defective product, otherwise the resistor to be tested is a qualified product;

[0060] Step 5: The resistors that have completed the test are pushed to the sorting table 400, and the guide rails 42 and the floating brackets 420 cooperate to support the resistors. If the resistors on the sorting table 400 are qualified products, the floating brackets 420 remain in place. If the resistors on the sorting table 400 are defective products, the sorting cylinders 430 drive the floating brackets 420 to descend, so that the defective resistors fall into the recycling box 600.

[0061] During the test, the specific position of the defective resistor 20 can be identified. After the resistor 20 enters the sorting platform 400, the sorting cylinder 430 at the position of the defective product is retracted, and the floating bracket 420 descends. One end of the defective resistor 20 loses support and tilts, and falls to the bottom landslide 43. Fig. 9 As shown, after the defective resistor 20 slides into the recovery box 600, the floating bracket 420 is reset. Fig.10 As shown, due to the departure of the defective resistor 20, the subsequent resistor 20 in the channel where it is located will fill the position of the original defective resistor 20. If the resistor 20 is a qualified product, the floating bracket 420 remains in place, as shown in FIG. Figure 8 As shown, when all the resistors 20 on the sorting table 400 are qualified, the material transfer robot 220 is started.

[0062] Step 6: The material-selecting robot 220 pushes the qualified resistor into the tray 230 , and makes the qualified resistor 20 slide along the second track 232 until the qualified resistor falls into the receiving hole 231 .

[0063] It should be noted that the number of the first track 110 on the transmission line 100, the second track 232 on the surface of the tray 230 and the material distribution channels 411 on the sorting table 400 are the same. The material distribution channel 411 is used to connect the first track 110 and the second track 232. The resistor 20 enters the material distribution channel 411 from the first track 110, and then the material transfer robot 220 provides a thrust to push the resistor 20 from the material distribution channel 411 into the second track 232. When the resistor 20 passes through the storage hole 231, if the storage hole 231 is empty, the resistor 20 will fall into the storage hole 231; if other resistors 20 are already loaded in the storage hole 231, the resistor 20 continues to move along the second track 232 until it encounters the next empty storage hole 231.

[0064] It should be emphasized that in the above sorting process, the probe 330 and the distribution box 322 detect the position of the defective resistor 20, thereby triggering the sorting cylinder 430 at the corresponding position, releasing the support of the floating bracket 420 for the resistor 20, and realizing rapid sorting, ensuring that the resistors 20 entering the tray 230 are all qualified products, without the need to perform sorting operations in the packaging station, thereby improving the shipping efficiency of the resistor 20 and avoiding "useless work" when moving the tray 230.

[0065] See also Figure 4 and Figure 5In one embodiment, the material-diverting manipulator 220 includes a translation motor 221, a crossbeam 222, and a material-diverting plate 223. The crossbeam 222 is provided with a T-shaped stepped hole 2221, and the material-diverting plate 223 is provided with a T-shaped stepped hole 2221. A plurality of material-diverting teeth 2231 are provided at positions exposed outside the T-shaped stepped hole 2221 on the material-diverting plate 223. An inclined surface 2232 is provided at the end of the material-diverting teeth 2231, and the inclined surface 2232 is inclined toward the position where the first track 110 is located. In this way, when the crossbeam 222 moves toward the sorting platform 400, the inclined surface 2232 first contacts the resistor 20, and the material-diverting plate 223 retracts into the T-shaped stepped hole 2221 under the thrust provided by the resistor 20, and pops out after the material-diverting teeth 2231 pass over the resistor 20. When the crossbeam 222 returns to its original path, the material-diverting teeth 2231 can push the resistor 20 to translate toward the position where the tray 230 is located.

[0066] The above-mentioned embodiments only express several implementation methods of the present invention, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for ordinary technicians in this field, several variations and improvements can be made without departing from the concept of the present invention, and these all belong to the protection scope of the present invention. Therefore, the protection scope of the patent of the present invention shall be subject to the attached claims.

Claims

1. A package resistor withstand voltage test device, characterized in that: include: Transmission lines, blanking components and test components; The transmission line is used to carry the resistor to be tested and drive the resistor close to the test component; The test assembly includes a support frame, a detection slide and a plurality of probes, the detection slide includes a lifting part and a distribution box, a plurality of the probes are arranged on the distribution box at intervals, and the lifting part is used to drive the probes to contact the resistor; The unloading assembly includes a carrier, a material-discharging robot, and a tray located on the carrier. The tray is provided with a plurality of storage holes for storing resistors that have completed the test. The material-discharging robot is used to push the resistors that have completed the test to slide on the tray so that the resistors fall into the storage holes.

2. The package resistor withstand voltage test device according to claim 1, characterized in that: A slope is arranged on one side of the track away from the test assembly.

3. The package resistor withstand voltage test device according to claim 2, characterized in that: A straight vibrator is arranged on the slope.

4. The package resistor withstand voltage test device according to claim 3, characterized in that: A sorting platform and a recycling box are provided between the transmission line and the tray, the recycling box is located below the transmission line, the sorting platform includes a base, a plurality of floating brackets and a sorting cylinder connected to the floating bracket, a plurality of material distribution channels are provided on the base, and movable grooves, guide rails and bottom slides are provided in the material distribution channels, the floating bracket is slidably arranged in the movable groove, the floating bracket and the guide rail are arranged facing each other, the guide rail and the floating bracket are used to support the resistor in cooperation, the sorting cylinder is used to drive the floating bracket to descend, the bottom slide is inclined toward the location of the recycling box, and a stop spring is provided at one end of the guide rail away from the transmission line; The transmission line is provided with a plurality of first tracks, the surface of the tray is provided with a plurality of second tracks, and the material distribution channel is used to connect the first tracks and the second tracks.

5. The package resistor withstand voltage test device according to claim 4, characterized in that: The receiving hole is located in the second track.

6. The package resistor withstand voltage test device according to claim 4, characterized in that: The floating bracket and the guide rail are both parallel to the extension direction of the first track.

7. The package resistor withstand voltage test device according to claim 4, characterized in that: The material-moving robot comprises a translation motor, a crossbeam and a material-moving plate, the crossbeam is provided with a T-shaped stepped hole, the material-moving plate passes through the T-shaped stepped hole, a plurality of material-moving teeth are provided on the material-moving plate at positions exposed outside the T-shaped stepped hole, an inclined surface is provided at the end of the material-moving teeth, and the inclined surface is inclined toward the position of the first track.

8. The package resistor withstand voltage test device according to claim 4, characterized in that: The probes are arranged in groups of two, and a group of the probes is disposed above each of the first tracks.

9. The package resistor withstand voltage test device according to claim 1, characterized in that: The test assembly also includes a plurality of markers.

10. A withstand voltage test method, based on the package resistor withstand voltage test device according to claim 4, characterized in that: The steps include: Step 1: Connect the transmission line to the plastic packaging equipment and guide the resistor to be tested into the first track; Step 2: The oscillator drives the resistor to be tested to slide along the first track; Step 3: When the resistor to be tested moves to below the test assembly, the lifting unit drives the distribution box to descend so that the probe contacts the resistor to be tested in the first track; Step 4: The power distribution box continuously supplies current to the resistor to be tested, and uses the probe to determine whether the resistor to be tested is broken down. If the insulation layer on the resistor to be tested is broken down during the power-on process, the resistor is a defective product, otherwise the resistor to be tested is a qualified product; Step 5: The resistors that have completed the test are pushed to the sorting table. The guide rails and floating brackets work together to support the resistors. If the resistors on the sorting table are qualified, the floating brackets remain in place. If the resistors on the sorting table are defective, the sorting cylinder drives the floating brackets down, so that the defective resistors fall into the recycling box. Step 6: The material-selecting robot pushes the qualified resistor into the tray and makes the qualified resistor slide along the second track until the qualified resistor falls into the storage hole.