A test system model generation method, device, medium and equipment

Abstract

The embodiments of the present application disclose a test system model generation method, device, medium and equipment, which relate to the field of automated testing technology. The present application regards the third-party device as a special product under test and jointly models it, integrates the third-party device into the entire test system modeling, expands the modeling scope, and enhances versatility. After obtaining the electrical connection method of the target third-party device, the number of channels of different signal types can be sorted out, and the total number of signal type channels required for testing the product under test can be obtained after merging and counting. Finally, after loading the model constraints, the test station model is obtained. Combined with the initial modeling of the product under test and the third-party device, the adapter model and the test cable model are quickly generated to complete the modeling of the test system, thereby improving the effect of modeling the test system involving third-party devices.

Description

Technical Field

[0001] The present application relates to the field of automated testing technology, and in particular to a test system model generation method, device, medium, and equipment. Background Art

[0002] In the field of general signal-oriented automated testing, the current mainstream methods require modeling of the test system and the product under test. The main components of the test system include test stations and adapters. The mainstream method for modeling the test system still uses manual design, and the degree of automation and efficiency are insufficient. Especially when third-party equipment is involved, the existing methods are less effective and can only generate local models. There is no unified modeling method and the versatility is limited. Summary of the Invention

[0003] The main purpose of this application is to provide a test system model generation method, device, medium and equipment, aiming to solve the problem in the prior art of poor effect when modeling the test system involving third-party equipment.

[0004] To achieve the above objectives, the technical solutions adopted in the embodiments of the present application are as follows:

[0005] In a first aspect, an embodiment of the present application provides a method for generating a test system model, comprising the following steps:

[0006] Modeling the product under test and the third-party device respectively to obtain a first electrical interface and a first virtual interface of the product under test, and a second electrical interface and a second virtual interface of the third-party device;

[0007] Matching the first virtual interface with the second virtual interface to select a target third-party device;

[0008] Obtaining a second electrical interface of the target third-party device according to an electrical connection method of the target third-party device;

[0009] The first electrical interface and the second electrical interface of the target third-party device are combined and counted to obtain the total number of signal type channels required for the test;

[0010] Load model constraints according to the total number of signal type channels required for the test to obtain the test station model;

[0011] An adapter model and a test cable model are generated according to the test resource electrical interface, the first electrical interface, the second electrical interface and the adapter front panel constraints of the test station model.

[0012] In a possible implementation of the first aspect, generating an adapter model and a test cable model according to a test resource electrical interface, a first electrical interface, a second electrical interface, and an adapter front panel constraint of a test station model includes:

[0013] Obtaining a first mapping relationship between the test resource electrical interface and the product under test and the third-party device according to the test resource electrical interface, the first electrical interface, and the second electrical interface of the test station model;

[0014] generating, based on the first mapping relationship and the adapter front panel constraint, a second mapping relationship from the adapter front panel to the adapter rear panel, and a third mapping relationship from the connector port of the adapter rear panel to the product under test and the third-party device;

[0015] According to the second mapping relationship and the third mapping relationship, the adapter model and the test cable model are determined respectively.

[0016] In a possible implementation of the first aspect, the model constraints include test station model constraints and adapter model constraints. The test station model constraints include test station model constraints, backplane bus type constraints, and function card slot quantity constraints. The adapter model constraints include adapter front panel constraints and adapter rear panel constraints.

[0017] In a possible implementation of the first aspect, before loading the model constraints according to the total number of signal type channels required for the test and obtaining the test station model, the method further includes:

[0018] Define adapter front panel constraints based on the fact that the number of channels that each signal type can pass through on the adapter front panel is not less than the total number of channels of the signal type required for the test.

[0019] In a possible implementation of the first aspect, loading model constraints according to the total number of signal type channels required for testing to obtain a test station model includes:

[0020] Load the adapter front panel constraints and the test station model constraints according to the total number of signal type channels required for the test to obtain the test station model.

[0021] In a possible implementation of the first aspect, before acquiring the second electrical interface of the target third-party device according to the electrical connection mode of the target third-party device, the method further includes:

[0022] Based on the network port control and program-controlled power supply conditions of the target third-party device, determine whether to perform electrical interface analysis to obtain the electrical connection method of the target third-party device.

[0023] In a possible implementation of the first aspect, the modeling method for modeling the product under test and the third-party equipment respectively includes electrical interface modeling and virtual indicator modeling. The electrical interface modeling is used to define the signal type of each channel of the connector and the meaning of the pins in the channel. The virtual indicator modeling is used to define the performance indicators of non-electrical interface signals.

[0024] In a second aspect, an embodiment of the present application provides a test system model generation device, comprising:

[0025] A modeling module is used to model the product under test and the third-party device respectively, to obtain a first electrical interface and a first virtual interface of the product under test, and a second electrical interface and a second virtual interface of the third-party device;

[0026] A matching module, the matching module is used to match the first virtual interface and the second virtual interface to select a target third-party device;

[0027] An acquisition module, configured to acquire a second electrical interface of the target third-party device according to an electrical connection mode of the target third-party device;

[0028] A statistics module is used to combine and count the first electrical interface and the second electrical interface of the target third-party device to obtain the total number of signal type channels required for the test;

[0029] Constraint module, which is used to load model constraints according to the total number of signal type channels required for the test and obtain the test station model;

[0030] The generation module is used to generate an adapter model and a test cable model according to the test resource electrical interface, the first electrical interface, the second electrical interface and the adapter front panel constraints of the test station model.

[0031] In a third aspect, an embodiment of the present application provides a computer-readable storage medium storing a computer program. When the computer program is loaded and executed by a processor, the test system model generation method provided in any one of the first aspects above is implemented.

[0032] In a fourth aspect, an embodiment of the present application provides an electronic device, including a processor and a memory, wherein:

[0033] Memory is used to store computer programs;

[0034] The processor is used to load and execute a computer program so as to enable the electronic device to execute the test system model generation method provided in any one of the first aspects above.

[0035] Compared with the prior art, the present invention has the following advantages:

[0036] The embodiments of the present application propose a test system model generation method, device, medium and equipment, which include: modeling the product under test and the third-party device respectively to obtain the first electrical interface and the first virtual interface of the product under test, and the second electrical interface and the second virtual interface of the third-party device; matching the first virtual interface and the second virtual interface to select the target third-party device; obtaining the second electrical interface of the target third-party device based on the electrical connection method of the target third-party device; merging the first electrical interface and the second electrical interface of the target third-party device and performing statistics to obtain the total number of signal type channels required for the test; loading model constraints according to the total number of signal type channels required for the test to obtain a test station model; generating an adapter model and a test cable model according to the test resource electrical interface, the first electrical interface, the second electrical interface and the adapter back panel constraints of the test station model. This application treats the third-party device as a special product under test and models it together to assist in the testing of the product under test. Since the third-party device will also be linked to the test resources through a specific signal port, matching the virtual interface to determine the target third-party device will prepare for the electrical interface merging statistics, and integrating the third-party device into the entire test system modeling, which expands the modeling scope and enhances versatility. After obtaining the electrical connection method of the target third-party device, the number of channels of different signal types can be sorted out, and the total number of signal type channels required for testing the product under test can be obtained after merging statistics. Finally, the test station model is obtained after loading the model constraints. Combined with the initial modeling of the product under test and the third-party device, the adapter model and the test cable model are quickly generated to complete the modeling of the test system, which improves the effect of modeling the test system involving third-party devices. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] Figure 1 A schematic diagram of the electronic device structure of the hardware operating environment involved in the embodiments of the present application;

[0038] Figure 2 A flow chart of a test system model generation method provided in an embodiment of the present application;

[0039] Figure 3 A schematic diagram of a flow chart for obtaining the electrical connection mode of a target third-party device in the test system model generation method provided in an embodiment of the present application;

[0040] Figure 4 A schematic diagram of a module of a test system model generating device provided in an embodiment of the present application;

[0041] Markings in the figure: 101 - processor, 102 - communication bus, 103 - network interface, 104 - user interface, 105 - memory. DETAILED DESCRIPTION

[0042] It should be understood that the specific embodiments described herein are only used to explain the present application and are not intended to limit the present application.

[0043] Refer to the attached Figure 1 , attached Figure 1 This is a schematic diagram of the structure of an electronic device of the hardware operating environment involved in the embodiment of the present application. The electronic device may include: a processor 101, such as a central processing unit (CPU), a communication bus 102, a user interface 104, a network interface 103, and a memory 105. Among them, the communication bus 102 is used to realize the connection and communication between these components. The user interface 104 may include a display screen (Display), an input unit such as a keyboard (Keyboard), and optionally the user interface 104 may also include a standard wired interface and a wireless interface. The network interface 103 may optionally include a standard wired interface and a wireless interface (such as a wireless fidelity (WIreless-FIdelity, WI-FI) interface). The memory 105 may optionally be a storage device independent of the aforementioned processor 101. The memory 105 may be a high-speed random access memory (RAM) memory, or a stable non-volatile memory (NVM), such as at least one disk storage. The processor 101 may be a general-purpose processor, including a central processing unit, a network processor, etc., or may be a digital signal processor, an application-specific integrated circuit, a field programmable gate array or other programmable logic device, a discrete gate or transistor logic device, or a discrete hardware component.

[0044] Those skilled in the art will understand that Figure 1 The structure shown in the figure does not constitute a limitation to the electronic device, and may include more or fewer components than shown in the figure, or combine certain components, or arrange the components differently.

[0045] As attached Figure 1 As shown, the memory 105 as a storage medium may include an operating system, a network communication module, a user interface module, and a test system model generating device.

[0046] In the attached Figure 1 In the electronic device shown, the network interface 103 is mainly used for data communication with the network server; the user interface 104 is mainly used for data interaction with the user; the processor 101 and the memory 105 in this application can be set in the electronic device, and the electronic device calls the test system model generation device stored in the memory 105 through the processor 101, and executes the test system model generation method provided in the embodiment of this application.

[0047] Refer to the attached Figure 2 Based on the hardware device of the aforementioned embodiment, an embodiment of the present application provides a test system model generation method, comprising the following steps:

[0048] S10: Modeling the product under test and the third-party device respectively to obtain a first electrical interface and a first virtual interface of the product under test, and a second electrical interface and a second virtual interface of the third-party device.

[0049] During implementation, the UUT can be any electrical or electronic system, such as a radio altimeter. Third-party devices generally refer to devices that cannot be added to a traditional test chassis and are used to assist in product testing, such as turntables, radar target simulators, communication and navigation simulators, altimeter simulators, and atmospheric pressure simulators. Modeling primarily involves two parts: modeling the UUT and third-party devices separately. Modeling methods include electrical interface modeling and virtual indicator modeling. Electrical interface modeling is used to define the signal types of each connector channel and the meaning of the pins within the channel. Virtual indicator modeling is used to define the performance indicators of non-electrical interface signals.

[0050] One part is electrical interface modeling, which is based on the ICD (Interface Control File) modeling of the electrical interface. It is used to define the signal type of each channel of the connector and the meaning of the pins within the channel. The signal classification includes bus, analog, discrete, pulse, etc. The other part is virtual indicator modeling, which is used to define functions and performance indicators that cannot be described by connector channels. In other words, the performance indicators of non-electrical interface signals. For example, if the product under test is a radio altimeter, the performance description of its non-electrical interface signals includes maximum measurement altitude, maximum lifting speed, altitude accuracy, lifting speed accuracy, etc. The modeling of the product under test and third-party equipment adopts the same method, that is, the third-party equipment is regarded as a special UUT, and its modeling content is consistent with the UUT. The difference is that the third-party equipment is used to assist in the testing of the product under test.

[0051] S20: Match the first virtual interface and the second virtual interface to select a target third-party device.

[0052] During the specific implementation process, according to the virtual indicators determined above, that is, the first virtual interface of the product under test and the second virtual interface of the third-party device, a third-party device that meets the test requirements is matched and selected, recorded as the target third-party device, and the selected third-party device is used to assist the UUT test. Since the third-party device will also be linked to the test resources through a specific signal port, this will prepare for the total electrical interface statistics required for subsequent testing of the UUT.

[0053] S30: Acquire a second electrical interface of the target third-party device according to the electrical connection mode of the target third-party device.

[0054] In a specific implementation process, the electrical connection mode of the target third-party device is obtained, the number of channels of different signal types is sorted out, and the second electrical interface of the target third-party device is determined. Specifically, before obtaining the second electrical interface of the target third-party device based on the electrical connection mode of the target third-party device, the method further includes:

[0055] Based on the network port control and program-controlled power supply conditions of the target third-party device, determine whether to perform electrical interface analysis to obtain the electrical connection method of the target third-party device.

[0056] The process of obtaining the electrical connection method of the target third-party device is as follows: Figure 3 As shown in the figure, if the target third-party device is only controlled through the network port and does not require programmable power supply, there is no need to perform electrical connection analysis. The third-party device only needs to be connected to the switch and directly controlled by the measurement and control host. If the target third-party device is only controlled through the network port but requires programmable power supply, an electrical connection analysis is required. If the target third-party device contains other types of signals besides the network port, such as bus, analog, discrete, etc., an electrical connection analysis is required.

[0057] S40: The first electrical interface and the second electrical interface of the target third-party device are combined and counted to obtain the total number of signal type channels required for the test.

[0058] During the specific implementation process, the first electrical interface and the second electrical interface of the target third-party device are combined and counted to obtain the total number of signal type channels required for UUT testing. It should be noted that when obtaining the electrical connection mode of the target third-party device, only the second electrical interface of the target third-party device is combined and counted when electrical connection analysis is required.

[0059] S50: Load model constraints according to the total number of signal type channels required for the test to obtain a test station model.

[0060] During the specific implementation process, model constraints can be established in advance and used to directly generate a test station model when the above-mentioned conditions are determined, which is one part of the test system modeling. Among them, the model constraints include test station model constraints and adapter model constraints. The test station model constraints include test station model constraints, backplane bus type constraints and function card slot quantity constraints. The adapter model constraints include adapter front panel constraints and adapter rear panel constraints.

[0061] The front panel of the adapter faces the UUT, and the rear panel faces the test station. The front panel constraints are the constraints of its connectors and pins. The constraints are the connector numbers and the signal types of the pins, such as pins 1 to 20 for AD / DA signals, pins 21 to 40 for DIO signals, pins 41 to 50 for RS422 signals, and pins 51 to 60 for CAN signals. When performing adapter adaptation, it should be noted that the result of automatic adaptation can be a combination of multiple adapters or a single adapter. The adaptation principle is that the total number of channels of the same signal type is not less than the combined statistical result of the electrical interface, that is, the model constraints are loaded according to the total number of channels of the signal type required for the test. Before obtaining the test station model, the method also includes:

[0062] Define adapter front panel constraints based on the fact that the number of channels that each signal type can pass through on the adapter front panel is not less than the total number of channels of the signal type required for the test.

[0063] In one embodiment, loading model constraints according to the total number of signal type channels required for testing to obtain a test station model includes:

[0064] Load the adapter front panel constraints and the test station model constraints according to the total number of signal type channels required for the test to obtain the test station model.

[0065] During the specific implementation process, because the physical connection between the general adapter and the same type of test station is customized, adapters of different structures and sizes cannot be combined with different test stations. Therefore, the adapter model is required to be uniquely bound to the same type of test station. Therefore, when the adapter is loaded and automatically adapted, it also means that the test station selection is completed simultaneously. According to the constraints of the test station, the resource boards that meet the test requirements are placed in the corresponding slots of the corresponding test station, and the test station model is generated to realize the configuration of the resource boards in each slot of the test station. It should be noted that if there are constraints on the back panel of the adapter, the back panel constraints of the adapter need to be loaded.

[0066] S60: Generate an adapter model and a test cable model according to the test resource electrical interface, the first electrical interface, the second electrical interface, and the adapter front panel constraints of the test station model.

[0067] In the specific implementation process, the resource cards in each slot of the test station are determined in the above steps, which also determines the definition of each port of the resource card, that is, the test resource electrical interface. Combined with the modeling of the first electrical interface and the second electrical interface, the model is determined according to the corresponding mapping relationship. Specifically, based on the test resource electrical interface, the first electrical interface, the second electrical interface of the test station model, and the adapter front panel constraints, the adapter model and the test cable model are generated, including:

[0068] Obtaining a first mapping relationship between the test resource electrical interface and the product under test and the third-party device according to the test resource electrical interface, the first electrical interface, and the second electrical interface of the test station model;

[0069] generating, based on the first mapping relationship and the adapter front panel constraint, a second mapping relationship from the adapter front panel to the adapter rear panel, and a third mapping relationship from the connector port of the adapter rear panel to the product under test and the third-party device;

[0070] According to the second mapping relationship and the third mapping relationship, the adapter model and the test cable model are determined respectively.

[0071] Based on the definition of each port of the resource card, combined with the modeling of the first electrical interface and the second electrical interface, the mapping relationship between each port in each resource card and the UUT or third-party device can be realized, that is, the first mapping relationship. Combined with the front panel constraints of the adapter, the mapping relationship from the front panel of the adapter to the rear panel (adapter model) can be generated simultaneously, that is, the second mapping relationship, and the mapping relationship from the connector port of the rear panel of the adapter to the connector port of the UUT or third-party device (test cable model), that is, the third mapping relationship. At this point, the unified modeling of the test system is completed.

[0072] In this embodiment, the third-party device is regarded as a special product under test and modeled together, and is used to assist in the testing of the product under test. Since the third-party device will also be linked to the test resource through a specific signal port, matching the virtual interface to determine the target third-party device is also prepared for the electrical interface merging statistics. The third-party device is integrated into the entire test system modeling, which expands the modeling scope and enhances versatility. After obtaining the electrical connection method of the target third-party device, the number of channels of different signal types can be sorted out, and the total number of signal type channels required for the test of the product under test can be obtained after merging statistics. Finally, the test station model is obtained after loading the model constraints. Combined with the initial modeling of the product under test and the third-party device, the adapter model and the test cable model are quickly generated to complete the modeling of the test system, thereby improving the effect of modeling the test system involving third-party devices.

[0073] Refer to the attached Figure 4 Based on the same inventive concept as in the above embodiment, the embodiment of the present application further provides a test system model generation device, comprising:

[0074] A modeling module is used to model the product under test and the third-party device respectively, to obtain a first electrical interface and a first virtual interface of the product under test, and a second electrical interface and a second virtual interface of the third-party device;

[0075] A matching module, the matching module is used to match the first virtual interface and the second virtual interface to select a target third-party device;

[0076] An acquisition module, configured to acquire a second electrical interface of the target third-party device according to an electrical connection mode of the target third-party device;

[0077] A statistics module is used to combine and count the first electrical interface and the second electrical interface of the target third-party device to obtain the total number of signal type channels required for the test;

[0078] Constraint module, which is used to load model constraints according to the total number of signal type channels required for the test and obtain the test station model;

[0079] The generation module is used to generate an adapter model and a test cable model according to the test resource electrical interface, the first electrical interface, the second electrical interface and the adapter front panel constraints of the test station model.

[0080] Those skilled in the art should understand that the division of the various modules in the embodiment is merely a division of logical functions, and in actual application, they can be fully or partially integrated into one or more actual carriers, and these modules can all be implemented in the form of software called through the processing unit, or all be implemented in the form of hardware, or in the form of a combination of software and hardware. It should be noted that the modules in the test system model generation device in this embodiment correspond one-to-one to the steps in the test system model generation method in the aforementioned embodiment. Therefore, the specific implementation of this embodiment can refer to the implementation of the aforementioned test system model generation method, and will not be repeated here.

[0081] Based on the same inventive concept as in the aforementioned embodiment, an embodiment of the present application further provides a computer-readable storage medium storing a computer program. When the computer program is loaded and executed by a processor, the test system model generation method provided in the embodiment of the present application is implemented.

[0082] Based on the same inventive concept as in the above embodiment, an embodiment of the present application further provides an electronic device, including a processor and a memory, wherein:

[0083] Memory is used to store computer programs;

[0084] The processor is used to load and execute the computer program so that the electronic device executes the test system model generation method provided in the embodiment of the present application.

[0085] In some embodiments, the computer-readable storage medium may be a memory device such as FRAM, ROM, PROM, EPROM, EEPROM, flash memory, magnetic surface mount memory, optical disk, or CD-ROM; or various devices including any one or any combination of the above memories. The computer may be various computing devices including smart terminals and servers.

[0086] In some embodiments, executable instructions may be in the form of a program, software, software module, script, or code, written in any form of programming language (including compiled or interpreted languages, or declarative or procedural languages), and may be deployed in any form, including as a stand-alone program or as a module, component, subroutine, or other unit suitable for use in a computing environment.

[0087] As an example, executable instructions may, but need not, correspond to a file in a file system, may be stored as part of a file that stores other programs or data, such as in one or more scripts in a HyperText Markup Language (HTML) document, in a single file dedicated to the program in question, or in multiple coordinating files (e.g., files storing one or more modules, subroutines, or code portions).

[0088] By way of example, executable instructions may be deployed to be executed on one computing device, or on multiple computing devices at one site, or on multiple computing devices distributed across multiple sites and interconnected by a communication network.

[0089] It should be noted that, in this document, the terms "comprises," "includes," or any other variations thereof are intended to encompass non-exclusive inclusion, such that a process, method, article, or system comprising a series of elements includes not only those elements but also other elements not explicitly listed, or elements inherent to such process, method, article, or system. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of other identical elements in the process, method, article, or system comprising the element.

[0090] The serial numbers of the above embodiments of the present application are for description only and do not represent the advantages or disadvantages of the embodiments.

[0091] Through the description of the above embodiments, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus the necessary general hardware platform. Of course, they can also be implemented by hardware, but in many cases the former is a better embodiment. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, can be embodied in the form of a software product. The computer software product is stored in a storage medium (such as a read-only memory / random access memory, a magnetic disk, or an optical disk), and includes a number of instructions for enabling a multimedia terminal device (which can be a mobile phone, a computer, a television receiver, or a network device, etc.) to execute the methods described in each embodiment of the present application.

[0092] In summary, the present application provides a test system model generation method, device, medium and equipment, which includes: modeling the product under test and the third-party device respectively, obtaining the first electrical interface and the first virtual interface of the product under test, and the second electrical interface and the second virtual interface of the third-party device; matching the first virtual interface and the second virtual interface to select the target third-party device; obtaining the second electrical interface of the target third-party device according to the electrical connection method of the target third-party device; merging the first electrical interface and the second electrical interface of the target third-party device and performing statistics to obtain the total number of signal type channels required for the test; loading the model constraints according to the total number of signal type channels required for the test to obtain the test station model; generating the adapter model and the test cable model according to the test resource electrical interface, the first electrical interface, the second electrical interface and the adapter back panel constraints of the test station model. This application treats the third-party device as a special product under test and models it together to assist in the testing of the product under test. Since the third-party device will also be linked to the test resources through a specific signal port, matching the virtual interface to determine the target third-party device will prepare for the electrical interface merging statistics, and integrating the third-party device into the entire test system modeling, which expands the modeling scope and enhances versatility. After obtaining the electrical connection method of the target third-party device, the number of channels of different signal types can be sorted out, and the total number of signal type channels required for testing the product under test can be obtained after merging statistics. Finally, the test station model is obtained after loading the model constraints. Combined with the initial modeling of the product under test and the third-party device, the adapter model and the test cable model are quickly generated to complete the modeling of the test system, which improves the effect of modeling the test system involving third-party devices.

[0093] The above description is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present application should be included in the scope of protection of the present application.

Claims

1. A test system model generation method, characterized in that: The following steps are involved: Modeling the product under test and the third-party device respectively to obtain a first electrical interface and a first virtual interface of the product under test, and a second electrical interface and a second virtual interface of the third-party device; Matching the first virtual interface and the second virtual interface to select a target third-party device; acquiring the second electrical interface of the target third-party device according to the electrical connection mode of the target third-party device; Combining the first electrical interface and the second electrical interface of the target third-party device and performing statistics to obtain a total number of signal type channels required for testing; Loading model constraints according to the total number of signal type channels required for the test to obtain a test station model; Generating an adapter model and a test cable model according to the test resource electrical interface, the first electrical interface, the second electrical interface, and the adapter front panel constraints of the test station model; generating the adapter model and the test cable model according to the test resource electrical interface, the first electrical interface, the second electrical interface, and the adapter front panel constraints of the test station model, including: Obtaining a first mapping relationship between the test resource electrical interface and the product under test and the third-party device according to the test resource electrical interface, the first electrical interface, and the second electrical interface of the test station model; generating, based on the first mapping relationship and the adapter front panel constraint, a second mapping relationship from the adapter front panel to the adapter rear panel, and a third mapping relationship from the connector port of the adapter rear panel to the product under test and the third-party device; An adapter model and a test cable model are determined according to the second mapping relationship and the third mapping relationship.

2. The test system model generation method according to claim 1, characterized in that: The model constraints include test station model constraints and adapter model constraints. The test station model constraints include test station model constraints, backplane bus type constraints, and function card slot quantity constraints. The adapter model constraints include adapter front panel constraints and adapter rear panel constraints.

3. The test system model generation method according to claim 2, characterized in that: Before loading the model constraints according to the total number of signal type channels required for the test to obtain the test station model, the method further includes: The adapter front panel constraints are defined based on the number of channels that each signal type can pass through on the adapter front panel being no less than the total number of signal type channels required for the test.

4. The test system model generation method according to claim 2, characterized in that: The step of loading the model constraints according to the total number of signal type channels required for the test to obtain the test station model includes: The adapter front panel constraints and the test station model constraints are loaded according to the total number of signal type channels required for the test to obtain a test station model.

5. The test system model generation method according to claim 1, characterized in that: Before acquiring the second electrical interface of the target third-party device according to the electrical connection mode of the target third-party device, the method further includes: According to the network port control status and program-controlled power supply status of the target third-party device, determine whether to perform electrical interface analysis to obtain the electrical connection method of the target third-party device.

6. The test system model generation method according to claim 1, characterized in that: The modeling method for modeling the product under test and the third-party equipment respectively includes electrical interface modeling and virtual indicator modeling. The electrical interface modeling is used to define the signal type of each channel of the connector and the meaning of the pins in the channel, and the virtual indicator modeling is used to define the performance indicators of non-electrical interface signals.

7. A test system model generation device, characterized in that: include: A modeling module, the modeling module being used to model the product under test and the third-party device respectively, to obtain a first electrical interface and a first virtual interface of the product under test, and a second electrical interface and a second virtual interface of the third-party device; a matching module, configured to match the first virtual interface with the second virtual interface to select a target third-party device; an acquisition module, configured to acquire the second electrical interface of the target third-party device according to an electrical connection mode of the target third-party device; a statistics module, configured to combine and count the first electrical interface and the second electrical interface of the target third-party device to obtain a total number of signal type channels required for testing; A constraint module, the constraint module is used to load model constraints according to the total number of signal type channels required for the test to obtain a test station model; A generation module, the generation module being configured to generate an adapter model and a test cable model based on the test resource electrical interface of the test station model, the first electrical interface, the second electrical interface, and the adapter front panel constraints; the generation module comprising: Obtaining a first mapping relationship between the test resource electrical interface and the product under test and the third-party device according to the test resource electrical interface, the first electrical interface, and the second electrical interface of the test station model; generating, based on the first mapping relationship and the adapter front panel constraint, a second mapping relationship from the adapter front panel to the adapter rear panel, and a third mapping relationship from the connector port of the adapter rear panel to the product under test and the third-party device; An adapter model and a test cable model are determined according to the second mapping relationship and the third mapping relationship.

8. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is loaded and executed by a processor, the test system model generation method according to any one of claims 1 to 7 is implemented.

9. An electronic device, characterized in that: comprising a processor and a memory, wherein: The memory is used to store computer programs; The processor is configured to load and execute the computer program so as to enable the electronic device to execute the test system model generation method according to any one of claims 1 to 7.

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