Method and device for debugging test parameters, equipment and medium

Abstract

The embodiment of the invention discloses a test parameter debugging method and device, equipment and a medium, and the method comprises the steps: obtaining a first parameter value sequence from an initial parameter value sequence based on a preset interval value, determining a second parameter value sequence in the first parameter value sequence based on a test result corresponding to each parameter value in the first parameter value sequence, amplifying the parameter values of the second parameter value sequence to obtain amplified parameter value information, and determining a target parameter value range corresponding to the test parameters based on test results corresponding to the parameter values in the amplified parameter value information. Therefore, in the embodiment of the invention, the second parameter value sequence is formed by selecting the plurality of parameter values of which the test results are all successful tests from the first parameter value sequence, so that the accuracy of amplification parameter value information obtained by subsequently utilizing the second parameter value sequence is ensured, and the accuracy of the determined target parameter value range is further ensured; and the debugging efficiency is improved.

Description

Technical Field

[0001] The present application relates to chip testing technology, and in particular to a method, device, equipment and medium for debugging test parameters. Background Art

[0002] Functional testing is to verify whether the device under test (DUT) such as chips, integrated circuits or wafers can correctly implement the involved logical functions. When performing functional testing, it is necessary to apply a series of parameter values ​​of the characteristic parameters (test parameters) required for the functional test to the DUT to obtain the corresponding output, and compare the output with the expected value in the test vector file (Pattern) to determine whether the function of the DUT is normal. Therefore, it is necessary to debug the parameter value range of the characteristic parameters before performing the functional test to ensure the accuracy of the DUT functional test.

[0003] In the process of implementing the present application, it was discovered through research that in the related art, when debugging the parameter value range of the characteristic parameter, the parameter value corresponding to the success / failure (Pass / Fail) jump point is usually determined first, and then the parameter value range is manually narrowed continuously near the parameter value corresponding to the jump point, and the parameter value range is finally obtained by executing multiple times to obtain the parameter value range of the characteristic parameter used for the DUT functional test. However, since this parameter value range debugging method requires multiple manual narrowing operations, the efficiency of debugging the parameter value range of the test parameter is low. Summary of the invention

[0004] In order to solve the above technical problems, the embodiments of the present application provide a method, device, equipment and medium for debugging test parameters.

[0005] One aspect of an embodiment of the present application provides a method for debugging test parameters, which is applied to a chip testing device, and the method includes: based on a preset interval value, obtaining a first parameter value sequence from an initial parameter value sequence corresponding to a test parameter of a device under test; based on a test result corresponding to each parameter value in the first parameter value sequence, determining a second parameter value sequence in the first parameter value sequence, wherein the second parameter value sequence includes multiple parameter values, and the test result corresponding to each parameter value in the second parameter value sequence is a successful test; amplifying the parameter values ​​of the second parameter value sequence to obtain amplified parameter value information; and determining a target parameter value range corresponding to the test parameter based on the test result corresponding to each parameter value in the amplified parameter value information.

[0006] According to another aspect of an embodiment of the present application, there is provided an apparatus for debugging test parameters, which is applied to a chip testing device, and the apparatus comprises: a first sequence determination module, which is used to obtain a first parameter value sequence from an initial parameter value sequence corresponding to a test parameter of a device under test based on a preset interval value; a second sequence determination module, which is used to determine a second parameter value sequence in the first parameter value sequence based on a test result corresponding to each parameter value in the first parameter value sequence, wherein the second parameter value sequence includes a plurality of parameter values, and the test result corresponding to each parameter value in the second parameter value sequence is a successful test; a parameter value sequence expansion module, which is used to amplify the parameter values ​​of the second parameter value sequence to obtain amplified parameter value information; and a first parameter value range determination module, which is used to determine a target parameter value range corresponding to the test parameter based on the test result corresponding to each parameter value in the amplified parameter value information.

[0007] Another aspect of an embodiment of the present application provides an electronic device, comprising: a memory for storing a computer program; a processor for executing the computer program stored in the memory, and when the computer program is executed, the above-mentioned method of debugging test parameters is implemented.

[0008] According to another aspect of the embodiments of the present application, a computer-readable storage medium is provided, on which a computer program is stored, characterized in that when the computer program is executed by a processor, the above-mentioned method for debugging test parameters is implemented.

[0009] In another aspect of the embodiments of the present application, a computer program product is provided, including computer program instructions, characterized in that the computer program instructions implement the above-mentioned method for debugging test parameters when executed by a processor.

[0010] The method, device, equipment and medium for debugging test parameters in the embodiments of the present application. The method for debugging test parameters includes: based on a preset interval value, obtaining a first parameter value sequence from an initial parameter value sequence corresponding to the test parameters of the device under test, determining a second parameter value sequence in the first parameter value sequence based on the test results corresponding to each parameter value in the first parameter value sequence, the second parameter value sequence including multiple parameter values, and the test results corresponding to each parameter value in the second parameter value sequence are all successful tests, then amplifying the parameter values ​​of the second parameter value sequence to obtain amplified parameter value information, and determining the target parameter value range corresponding to the test parameters based on the test results corresponding to each parameter value in the amplified parameter value information. Therefore, in the embodiments of the present application, by selecting multiple parameter values ​​whose test results are all successful tests in the first parameter value sequence to form a second parameter value sequence, the accuracy of the amplified parameter value information subsequently obtained using the second parameter value sequence is ensured, thereby ensuring the accuracy of the determined target parameter value range. At the same time, the parameter value of the second parameter value sequence is amplified to automatically expand the second parameter value sequence, and the target parameter value range is determined by amplifying the parameter value information, thereby realizing automatic debugging and determining the target parameter value range of the test parameter, and there is no need to manually narrow the parameter value range near the parameter value corresponding to the jump point multiple times, thereby improving the debugging efficiency of the target parameter value range of the test parameter.

[0011] The technical solution of the present application is further described in detail below through the accompanying drawings and embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] The accompanying drawings, which constitute a part of the specification, illustrate embodiments of the present application and, together with the description, serve to explain the principles of the present application.

[0013] The present application can be more clearly understood from the following detailed description with reference to the accompanying drawings, in which:

[0014] Figure 1 It is a flowchart of a method for debugging test parameters provided by an exemplary embodiment of the present application.

[0015] Figure 2 It is a schematic diagram of test results corresponding to a first parameter value sequence provided by an exemplary embodiment of the present application.

[0016] Figure 3 It is a flowchart of step S110 provided by an exemplary embodiment of the present application.

[0017] Figure 4 It is a schematic diagram of a parameter value sequence provided by an exemplary embodiment of the present application.

[0018] Figure 5It is a structural block diagram of a device for debugging test parameters provided by an exemplary embodiment of the present disclosure.

[0019] Figure 6 This is a schematic diagram of the structure of an application embodiment of the electronic device of the present application. DETAILED DESCRIPTION

[0020] Various exemplary embodiments of the present application will now be described in detail with reference to the accompanying drawings. It should be noted that unless otherwise specifically stated, the relative arrangement of components and steps, numerical expressions and numerical values ​​set forth in these embodiments do not limit the scope of the present application.

[0021] Those skilled in the art can understand that the terms "first" and "second" in the embodiments of the present application are only used to distinguish different steps, devices or modules, etc., and neither represent any specific technical meaning nor indicate the necessary logical order between them.

[0022] It should also be understood that in the embodiments of the present application, "plurality" may refer to two or more than two, and "at least one" may refer to one, two or more than two.

[0023] It should also be understood that any component, data or structure mentioned in the embodiments of the present application can generally be understood as one or more, unless explicitly limited or otherwise indicated in the context.

[0024] In addition, the term "and / or" in this application is only a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this application generally indicates that the associated objects before and after are in an "or" relationship.

[0025] It should also be understood that the description of the various embodiments in this application focuses on the differences between the various embodiments, and the same or similar aspects thereof can be referenced to each other, and for the sake of brevity, they will not be described one by one.

[0026] At the same time, it should be understood that for the convenience of description, the sizes of the various parts shown in the drawings are not drawn according to the actual proportional relationship.

[0027] The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the present application, its application, or uses.

[0028] Technologies, methods, and equipment known to ordinary technicians in the relevant art may not be discussed in detail, but where appropriate, the technologies, methods, and equipment should be considered as part of the specification.

[0029] It should be noted that like reference numerals and letters refer to similar items in the following figures, and therefore, once an item is defined in one figure, it need not be further discussed in subsequent figures.

[0030] The embodiments of the present application can be applied to electronic devices such as terminal devices, computer systems, servers, etc., which can operate with many other general or special computing system environments or configurations. Examples of well-known terminal devices, computing systems, environments and / or configurations suitable for use with electronic devices such as terminal devices, computer systems, servers, etc. include, but are not limited to: personal computer systems, server computer systems, thin clients, thick clients, handheld or laptop devices, microprocessor-based systems, set-top boxes, programmable consumer electronics, network personal computers, small computer systems, large computer systems, and distributed cloud computing technology environments including any of the above systems, etc.

[0031] Electronic devices such as terminal devices, computer systems, servers, etc. can be described in the general context of computer system executable instructions (such as program modules) executed by computer systems. Generally, program modules can include routines, programs, object programs, components, logic, data structures, etc., which perform specific tasks or implement specific abstract data types. Computer systems / servers can be implemented in a distributed cloud computing environment, where tasks are performed by remote processing devices linked through a communication network. In a distributed cloud computing environment, program modules can be located on local or remote computing system storage media including storage devices.

[0032] In the process of implementing the present application, it was discovered through research that in the prior art, when debugging the parameter value range of the characteristic parameter, it is necessary to first determine the parameter value corresponding to the jump node through the test results corresponding to each test parameter value, and then manually narrow the parameter value range near the jump point for multiple times to finally obtain the parameter value range of the characteristic parameter for testing the DUT function. Since this method requires manual continuous narrowing of the parameter value range near the jump point to obtain the final parameter value range, the efficiency of debugging the parameter value range of the test parameters is low.

[0033] Figure 1 FIG. 1 is a flow chart of a method for debugging test parameters provided by an exemplary embodiment of the present application. This embodiment can be applied to chip test equipment, such as Figure 1 As shown, the method for debugging test parameters may include the following steps:

[0034] Step S100: acquiring a first parameter value sequence from an initial parameter value sequence corresponding to a test parameter of the device under test based on a preset interval value.

[0035] The chip testing equipment is used to test the function and / or performance of a chip, a wafer or an integrated circuit, etc. For example, the chip testing equipment may be an integrated circuit automatic test equipment (ATE).

[0036] The device under test may include, for example, at least one of the following: a chip, an integrated circuit, and a die. The test parameters of the device under test may be used to indicate the parameters applied to the device under test when performing a functional test on the device under test. Exemplarily, the test parameters may include at least one of the following table, but the test parameters are not limited to the following table.

[0037] Test Parameters illustrate VDD Min / Max DUT power supply level VIL / VIH Input low level / Input high level VOL / VOH Output low level / output high level IOL / IOH Low level output current / high level output current, that is, output current load VREF IOL / IOH Switching point Test Frequency Test frequency / cycle Input Signal Timings Clock / setup time / hold time / control signal Input Signal Formats Input waveform Output Timings When to sample during the cycle Vector Sequencing Start / end point of vector file

[0038] The parameter value is used to represent the value of the test parameter. For example, if the test parameter is an input low level, the corresponding parameter value is the input low level value. The preset interval value can be used to represent the difference between two adjacent parameter values. In one embodiment, the interval value set by the user can be determined as the preset interval value, or the preset interval values ​​corresponding to different test parameters can be pre-set. Before debugging the parameter value range of the test parameter, the preset interval value corresponding to the test parameter can be obtained first.

[0039] The initial parameter value sequence of the test parameter includes multiple parameter values. The first parameter value sequence includes multiple parameter values. Wherein, each parameter value in the initial parameter value sequence and the first parameter value sequence can be sorted according to the order applied to the device under test. In one embodiment, the first parameter value in the initial parameter value sequence is used as the starting point, and the last parameter value in the initial parameter value sequence is used as the end point. In the initial parameter value sequence, a parameter value is selected at each preset interval value, and the first parameter value and the last parameter value in the initial parameter value sequence, as well as the selected parameter values, constitute the first parameter value sequence, wherein the order of each parameter value in the first parameter value sequence is the same as its order in the initial parameter value sequence.

[0040] Step S110: determining a second parameter value sequence in the first parameter value sequence based on the test results corresponding to each parameter value in the first parameter value sequence.

[0041] The second parameter value sequence includes multiple parameter values, and the test results corresponding to each parameter value in the second parameter value sequence are all successful tests. In one embodiment, each parameter value in the second parameter value sequence can be sorted according to the order in which it is applied to the device under test.

[0042] The test result obtained by applying the test signal generated based on the parameter value to the device under test can be determined as the test result corresponding to the parameter value. The test result may include a test success (Pass) and a test failure (Fail). A test success result indicates that the device under test can be tested with the parameter value corresponding to the test result, and a test failure result indicates that the device under test cannot be tested with the parameter value corresponding to the test result.

[0043] In this embodiment, for ease of description, the parameter value corresponding to the test result of successful test may be referred to as a successful parameter value. In one implementation, a group of continuous successful parameter values ​​may be selected from the first parameter value sequence to form a second parameter value sequence.

[0044] For example, Figure 2 FIG. 1 is a schematic diagram of a test result corresponding to a first parameter value sequence provided by an exemplary embodiment of the present application. Figure 2 As shown, the test results corresponding to each parameter value in the first parameter value sequence of the test parameter input low level (VIL) are shown; Figure 2 Medium red indicates that the test result is a parameter value that fails the test, and green indicates that the test result is a parameter value that succeeds the test; the first parameter value sequence of VIL includes parameter values ​​of 0.969, 0.976, 0.983, 0.990, 0.997, 1.003, 1.010, 1.017, 1.024 and 1.031, respectively, with a preset interval value of 0.007, and the second parameter value sequence obtained through the first parameter value sequence is from parameter value 1.003 to parameter value 1.031.

[0045] Step S120: performing parameter value amplification processing on the second parameter value sequence to obtain amplified parameter value information.

[0046] The parameter value amplification processing on the second parameter value sequence can be understood as extending the first parameter value and the last parameter value in the second parameter value sequence out of the second parameter value sequence respectively to expand the second parameter value sequence. The amplified parameter information may include at least one newly added parameter value sequence obtained by performing the parameter value amplification processing on the second parameter value sequence.

[0047] Step S130, determining a target parameter value range corresponding to the test parameter based on the test results corresponding to each parameter value in the amplification parameter value information.

[0048] The target parameter value range may include multiple parameter values, and the parameter values ​​in the target parameter value range may be used for corresponding functional tests on the device under test.

[0049] Exemplarily, the amplification parameter value information and the second parameter value sequence can be merged into a merged parameter value sequence, and the first consecutive successful parameter value and the last successful parameter value in the merged parameter value sequence are determined as the first parameter value and the last parameter value in the target parameter value range. Accordingly, the target parameter value range can be the parameter value range corresponding to the first parameter value to the last parameter value.

[0050] In the embodiment of the present application, by selecting multiple parameter values ​​whose test results are all successful in the first parameter value sequence to form a second parameter value sequence, the accuracy of the subsequent amplified parameter value information obtained by using the second parameter value sequence is ensured, thereby ensuring the accuracy of the determined target parameter value range. At the same time, by performing parameter value amplification on the second parameter value sequence to automatically expand the second parameter value sequence, and determining the target parameter value range through the amplified parameter value information, automatic debugging and determination of the target parameter value range of the test parameter are achieved, and there is no need to manually reduce the parameter value range near the parameter value corresponding to the jump point multiple times, thereby improving the debugging efficiency of the target parameter value range of the test parameter.

[0051] Figure 3 is a flow chart of step S110 provided by an exemplary embodiment of the present application. In some optional implementations, such as Figure 3 As shown, step S110 may include the following steps:

[0052] Step S111: based on the test results corresponding to the parameter values ​​in the first parameter value sequence, obtaining at least one initial sequence segment in the first parameter value sequence.

[0053] Wherein, each initial sequence segment in at least one initial sequence segment includes multiple parameter values, and the test results corresponding to each parameter value in each initial sequence segment are all test success. A sequence segment including at least two consecutive successful parameter values ​​in the first parameter value sequence can be called an initial sequence segment. Exemplarily, assuming that the first parameter value sequence includes 9 consecutive parameter values, and the 9 parameter values ​​are 1, 2, 3, 4, 5, 6, 7, 8 and 9, respectively, wherein the test results corresponding to parameter values ​​2, 3, 4 and 5 are test success, and the test results corresponding to parameter values ​​7 and 8 are test success, respectively, then the first parameter value sequence includes 2 initial sequence segments, and the two initial sequence segments are respectively an initial sequence segment including parameter values ​​2, 3, 4 and 5, and an initial sequence segment including parameter values ​​7 and 8.

[0054] Step S112: determining a target sequence segment based on the number of parameter values ​​in each initial sequence segment.

[0055] The initial sequence segment including the largest number of parameter values ​​may be determined as the target sequence segment. Exemplarily, the example in step S111 is also used to illustrate that the initial sequence segment including parameter values ​​2, 3, 4 and 5 may be determined as the target sequence segment.

[0056] Step S113 : in response to the number of the target sequence segments being at least two, determining a second parameter value sequence based on the order of the target sequence segments in the first parameter value sequence.

[0057] When the first parameter value sequence includes at least two target sequence segments, the target sequence segment that is ranked last in the first parameter value sequence segments is determined as the second parameter value sequence.

[0058] For example, Figure 4 is a schematic diagram of a parameter value sequence provided by an exemplary embodiment of the present application. Figure 4 As shown in the figure, the red part indicates the parameter value for which the test result failed, and the green part indicates the parameter value for which the test result failed. Figure 4 Start and End in represent the starting point and the end point of the parameter value sequence, respectively. The starting parameter value is the starting point, and the ending parameter value is at the end point. For the first parameter sequence corresponding to S3, the first parameter value sequence includes 9 parameter values, which are 0 to 8. The test results corresponding to parameter values ​​1, 2, 3, 5, 6, and 7 are all successful tests, and the test results corresponding to parameter values ​​0, 4, and 8 are test failures. The two initial sequence segments included in the first parameter value sequence are initial sequence segment 1 including parameter values ​​1, 2, and 3, and initial sequence segment 2 including parameter values ​​5, 6, and 7. Both initial sequence segment 1 and initial sequence segment 2 include the most continuous parameter values. Then, initial sequence segment 1 and initial sequence segment 2 are determined as target sequence segment 1 and target sequence segment 2, respectively. Since target sequence segment 2 is ranked last in the first parameter value sequence, target sequence segment 2 is determined as the second parameter value sequence. The starting parameter value in the second parameter value sequence is 5, and the ending parameter value is 7.

[0059] Step S114: in response to the number of the target sequence segments being one, determining the target sequence segment as a second parameter value sequence.

[0060] It should be noted that, in this embodiment, there is no execution order between step S113 and step S114.

[0061] In the application embodiment, based on the test results corresponding to each parameter value, an initial sequence segment including continuous successful parameter values ​​is efficiently determined in the first parameter value sequence, and the second parameter value sequence is determined based on the initial sequence segment, thereby achieving efficient and flexible determination of the second parameter value sequence.

[0062] In some optional embodiments, step S120 in the embodiment of the present application may include the following: in response to the starting parameter value in the second parameter value sequence being different from the starting parameter value in the first parameter value sequence, determining a third parameter value sequence in the amplification parameter value information based on the starting parameter value in the second parameter value sequence and a preset interval value.

[0063] The amplification parameter value information may include a third parameter value sequence, where the third parameter value sequence is obtained based on the starting parameter value in the second parameter value sequence, and the third parameter value sequence may include multiple parameter values.

[0064] The starting parameter value in the first parameter value sequence can be used to represent the first parameter value in the first parameter value sequence; the starting parameter value in the second parameter value sequence can be used to represent the first parameter value in the second parameter value sequence.

[0065] In one embodiment, the starting parameter value and the ending parameter value in the third parameter sequence value can be calculated using formulas (1) and (2), respectively. Then, starting from the starting parameter value, a parameter value is obtained at each preset interval between the starting parameter value and the ending parameter value. The starting parameter value, the obtained parameter value and the ending parameter value form a third parameter value sequence, thereby expanding the starting parameter value in the second parameter value sequence.

[0066] Start1 = min value - 1.2 * preset interval value formula (1)

[0067] End1 = min value + 0.2 * preset interval value formula (2)

[0068] In formulas (1) and (2), the min value represents the starting parameter value in the second parameter value sequence, Start1 represents the starting parameter value in the third sequence, and End1 represents the ending parameter value in the third sequence.

[0069] Accordingly, step S130 in the embodiment of the present application may include: determining a target starting parameter value of a target parameter value range based on test results corresponding to each parameter value in the third parameter value sequence.

[0070] The target starting parameter value may be used to represent the first parameter value in the target parameter value range.

[0071] In one embodiment, according to a first preset traversal order, the test results corresponding to each parameter value in the third parameter value sequence are traversed to determine whether there is a first parameter value group that meets the preset conditions in the third parameter value sequence; the first parameter value group includes a plurality of consecutive successful parameter values; the first preset traversal order may include traversing in order from the end parameter value to the start parameter value; the preset condition may include determining a group of consecutive successful parameter values ​​exceeding a preset number of consecutive successful parameter values ​​(for example, two) as the first parameter value group, and when there are multiple groups of first parameter value groups at the same time, the first first parameter value group traversed may be selected, or the first parameter value group including the most parameter values ​​may be selected. As an example, assuming that the third parameter value sequence includes parameter values ​​7, 8, 9, 10 and 11, wherein parameter values ​​9 and 10 are the first two consecutive successful parameter values ​​traversed (preset consecutive number), then the first parameter value group is composed of parameter values ​​9 and 10. As another example, assuming that the third parameter value sequence includes parameter values ​​6, 7, 8, 9, 10 and 11, wherein parameter values ​​6 and 7 are successful parameter values, and 9, 10 and 11 are successful parameter values, then parameter values ​​9, 10 and 11 may form a first parameter value group.

[0072] When the third parameter value sequence has a first parameter value group that meets the preset condition, the first parameter value in the first parameter value group is determined as the target starting parameter value. When the third parameter value sequence does not have a first parameter value group that meets the preset condition, the starting parameter value in the second parameter value sequence is determined as the target starting parameter value.

[0073] For example, Figure 4 For example, assume that the number of preset continuous success parameter values ​​in the preset condition is two. Figure 4 The parameter value sequence corresponding to S4 is the third parameter value sequence, which includes two parameter values, 5.2 and 3.8. The test result corresponding to the parameter value 5.2 is a successful test, and the test result corresponding to the parameter value 3.8 is a failed test. There is no first parameter value group that meets the preset conditions in the third parameter value sequence, so the starting parameter value 5 in the second parameter value sequence is used as the target starting parameter value.

[0074] In an embodiment of the present application, the second parameter value sequence is amplified forward by the starting parameter value and the preset interval value in the second parameter value sequence, and the target starting parameter value is determined according to the test results corresponding to each parameter value in the third parameter sequence obtained by the amplification, thereby efficiently obtaining an accurate target starting parameter value, thereby ensuring the accuracy of the target parameter value range.

[0075] In some optional embodiments, step S120 in the embodiment of the present application may also include: in response to the termination parameter value in the second parameter value sequence being different from the termination parameter value in the first parameter value sequence, determining a fourth parameter value sequence in the amplification parameter value information based on the termination parameter value in the second parameter value sequence and a preset interval value.

[0076] The amplification parameter value information may include a fourth parameter value sequence, where the fourth parameter value sequence is obtained based on the termination parameter value in the second parameter value sequence, and the fourth parameter value sequence may include multiple parameter values.

[0077] The ending parameter value in the first parameter value sequence may be used to represent the last parameter value in the first parameter value sequence; the ending parameter value in the second parameter value sequence may be used to represent the last parameter value in the second parameter value sequence.

[0078] In one embodiment, the starting parameter value and the ending parameter value in the fourth parameter sequence value can be calculated using formulas (3) and (4), respectively. Then, starting from the starting parameter value, a parameter value is obtained at each preset interval between the starting parameter value and the ending parameter value. The starting parameter value, the obtained parameter value and the ending parameter value form a fourth parameter value sequence, thereby expanding the ending parameter value of the second parameter value sequence.

[0079] Start2 = max value - 0.2 * preset interval value formula (3)

[0080] End2 = max value + 1.2 * preset interval value formula (4)

[0081] In formulas (3) and (4), the max value represents the end parameter value in the second parameter value sequence, Start2 represents the start parameter value in the fourth sequence, and End2 represents the end parameter value in the fourth sequence.

[0082] Accordingly, step S130 in the embodiment of the present application may include: determining a target termination parameter value of the target parameter value range according to the test results corresponding to each parameter value in the fourth parameter value sequence.

[0083] The target end parameter value may be used to represent the last parameter value in the target parameter value range. The target parameter value range may include a parameter value range consisting of a target start parameter value and a target end parameter value.

[0084] In one embodiment, according to the second preset traversal order, the test results corresponding to each parameter value in the fourth parameter value sequence are traversed to determine whether there is a second parameter value group that meets the preset conditions in the fourth parameter value sequence; the second parameter value group includes a plurality of consecutive successful parameter values; the second preset traversal order may include traversing in order from the starting parameter value to the ending parameter value; the preset condition may also include determining a group of consecutive successful parameter values ​​exceeding the preset number of consecutive successful parameter values ​​as the second parameter value group, and when there are multiple groups of second parameter value groups at the same time, the first traversed second parameter value group may be selected, or the second parameter value group including the most parameter values ​​may be selected. As an example, assuming that the fourth parameter value sequence includes parameter values ​​7, 8, 9, 10 and 11, wherein parameter values ​​8 and 9 are the first two consecutive successful parameter values ​​(preset consecutive number) traversed, then the second parameter value group is composed of parameter values ​​7 and 8. As another example, assuming that the fourth parameter value sequence includes parameter values ​​6, 7, 8, 9, 10 and 11, wherein parameter values ​​6 and 7 are successful parameter values, and 9, 10 and 11 are successful parameter values, then parameter values ​​9, 10 and 11 may form a second parameter value group.

[0085] When the fourth parameter value sequence contains a second parameter value group that meets the preset conditions, the last parameter value in the second parameter value group is determined as the target termination parameter value; when the fourth parameter value sequence does not contain a second parameter value group that meets the preset conditions, the termination parameter value in the second parameter value sequence is determined as the target termination parameter value.

[0086] For example, Figure 4 For example, assume that the number of preset continuous success parameter values ​​in the preset condition is two. Figure 4 The parameter value sequence corresponding to S5 is the fourth parameter value sequence, which includes three parameter values, namely 6.8, 7.325 and 8.2. The test results corresponding to the parameter values ​​6.8 and 7.325 are both successful tests, and the test result corresponding to the parameter value 8.2 is a test failure. The fourth parameter value sequence has a second parameter value group that meets the preset conditions, and the second parameter value group includes parameter values ​​of 6.8 and 7.325. The parameter value 7.325 is determined to be the target termination parameter value, that is, the target parameter value range determined by the second parameter value sequence in S3 is 5 (target starting parameter value) to 7.325 (target termination parameter value).

[0087] In an embodiment of the present application, the second parameter value sequence is amplified backward by the termination parameter value and the preset interval value in the second parameter value sequence, and the target termination parameter value is determined according to the test results corresponding to each parameter value in the fourth parameter sequence obtained by the amplification, thereby efficiently obtaining an accurate target termination parameter value, thereby ensuring the accuracy of the target parameter value range.

[0088] In some optional embodiments, before step S120 in the embodiment of the present application, the following may also be included: in response to the starting parameter value in the second parameter value sequence being the same as the starting parameter value in the first parameter value sequence, determining a target starting parameter value of the target parameter value range based on the starting parameter value in the second parameter value sequence.

[0089] In one embodiment, when the starting parameter value in the second parameter value sequence is the same as the starting parameter value in the first parameter value sequence, the starting parameter value in the second parameter value sequence may be determined as the target starting parameter value.

[0090] In an embodiment of the present application, when the starting parameter value in the second parameter value sequence is the same as the starting parameter value in the first parameter value sequence, the starting parameter value in the second parameter value sequence is determined as the target starting parameter value, thereby achieving rapid determination of the target starting parameter value, thereby improving the efficiency of determining the target parameter value range.

[0091] In some optional embodiments, before step S120 in the embodiment of the present application, the following may also be included: in response to the target termination parameter value in the second parameter value sequence being the same as the termination parameter value in the first parameter value sequence, determining the target termination parameter value of the target parameter value range based on the termination parameter value in the second parameter value sequence.

[0092] In one embodiment, when the termination parameter value in the second parameter value sequence is the same as the termination parameter value in the first parameter value sequence, the termination parameter value in the second parameter value sequence is determined as the target termination parameter value.

[0093] In an embodiment of the present application, when the termination parameter value in the second parameter value sequence is the same as the termination parameter value in the first parameter value sequence, the termination parameter value in the second parameter value sequence is determined as the target termination parameter value, thereby achieving rapid determination of the target termination parameter value, thereby improving the efficiency of determining the target parameter value range.

[0094] In some optional embodiments, before step S110 in the embodiment of the present application, it also includes: in response to the test results corresponding to each target parameter value in the first parameter value sequence being a successful test, determining the target parameter value range based on the starting parameter value and the ending parameter value in the first parameter value sequence.

[0095] Among them, when the test results corresponding to each target parameter value in the first parameter value sequence are all successful tests, the parameter value range corresponding to the first parameter value sequence is determined as the target parameter value range, that is, the starting parameter value in the first parameter value sequence is determined as the target starting parameter value, the ending parameter value in the first parameter value sequence is determined as the target ending parameter value, and the parameter value range formed by the target starting parameter value and the target ending parameter value is determined as the target parameter value range.

[0096] In one embodiment, when the test results corresponding to each parameter value in the first parameter value sequence are all test failures, it can be determined that the target starting parameter value and the ending target parameter value in the target parameter value range are both set to 0, which means that the target parameter value range cannot be determined in the initial parameter value sequence corresponding to the test parameter.

[0097] For example, Figure 4 Taking an example to illustrate, the first parameter value sequence corresponding to S1 indicates that the test results corresponding to each parameter value in the first parameter value sequence are all test successes, and the target starting parameter value and the target ending parameter value are respectively the starting parameter value and the ending parameter value in the first parameter value sequence; the first parameter value sequence corresponding to S2 indicates that the test results corresponding to each parameter value in the second parameter value sequence are all test failures, and at this time, the target starting parameter value and the target ending parameter value are both set to 0.

[0098] In an embodiment of the present application, when the test results corresponding to each parameter value in the first parameter value sequence are all successful tests, the target parameter value range can be determined according to the first parameter value sequence. This makes it possible to flexibly select a method for determining the target parameter value range based on the actual conditions of the test results corresponding to each parameter value in the first parameter value sequence, thereby improving the efficiency of determining the debugging target parameter value range.

[0099] The following is an application example of the method for debugging test parameters of the present application. In this application example, the method for debugging test parameters may include:

[0100] Based on a preset interval value, a first parameter value sequence is obtained from an initial parameter value sequence corresponding to the test parameters of the device under test, and it is determined whether the test results corresponding to each parameter value in the first parameter value sequence are all test successes. When it is determined that the test results corresponding to each parameter value are all test successes, a target parameter value range is determined based on the starting parameter value and the ending parameter value in the first parameter value sequence; when it is determined that there are parameter values ​​whose corresponding test results are test failures among the parameter values, a second parameter value sequence is determined in the first parameter value sequence based on the test results corresponding to each parameter value in the first parameter value sequence.

[0101] When the starting parameter value in the second parameter value sequence is different from the starting parameter value in the first parameter value sequence, the third parameter value sequence in the amplification parameter value information is determined based on the starting parameter value in the second parameter value sequence and the preset interval value, and the target starting parameter value of the target parameter value range is determined based on the test results corresponding to each parameter value in the third parameter value sequence; when the starting parameter value in the second parameter value sequence is the same as the starting parameter value in the first parameter value sequence, the target starting parameter value of the target parameter value range is determined based on the starting parameter value in the second parameter value sequence.

[0102] When the termination parameter value in the second parameter value sequence is different from the termination parameter value in the first parameter value sequence, the fourth parameter value sequence in the amplification parameter value information is determined based on the termination parameter value in the second parameter value sequence and the preset interval value, and the target termination parameter value of the target parameter value range is determined based on the test results corresponding to each parameter value in the fourth parameter value sequence; when the target termination parameter value in the second parameter value sequence is the same as the termination parameter value in the first parameter value sequence, the target termination parameter value of the target parameter value range is determined based on the termination parameter value in the second parameter value sequence.

[0103] Figure 5 The present invention is a block diagram of a device for debugging test parameters provided by an exemplary embodiment of the present invention. The device for debugging test parameters is applied to chip testing equipment, and the device for debugging test parameters includes: a first sequence determination module 200, a second sequence determination module 210, a parameter value sequence expansion module 220, and a first parameter value range determination module 230.

[0104] A first sequence determination module 200, configured to obtain a first parameter value sequence from an initial parameter value sequence corresponding to a test parameter of the device under test based on a preset interval value;

[0105] A second sequence determination module 210, configured to determine a second parameter value sequence in the first parameter value sequence based on the test results corresponding to each parameter value in the first parameter value sequence, wherein the second parameter value sequence includes a plurality of parameter values, and the test results corresponding to each parameter value in the second parameter value sequence are all test successes;

[0106] A parameter value sequence expansion module 220, configured to amplify the parameter values ​​of the second parameter value sequence to obtain amplified parameter value information;

[0107] The first parameter value range determination module 230 is used to determine the target parameter value range corresponding to the test parameter based on the test results corresponding to each parameter value in the amplification parameter value information.

[0108] In some optional implementations, the second sequence determination module 210 may include:

[0109] A first sequence segment determination submodule is configured to obtain at least one initial sequence segment in the first parameter value sequence based on the test results corresponding to the parameter values ​​in the first parameter value sequence, wherein the test results corresponding to the parameter values ​​in the initial sequence segments in the at least one initial sequence segment are all test successes;

[0110] A second sequence segment determination submodule, configured to determine a target sequence segment based on the number of parameter values ​​in each of the initial sequence segments;

[0111] a first determination submodule, configured to determine, in response to the number of the target sequence segments being at least two, the second parameter value sequence based on the order of the target sequence segments in the first parameter value sequence;

[0112] The second judgment submodule is configured to determine the target sequence segment as the second parameter value sequence in response to the number of the target sequence segments being one.

[0113] In some optional implementations, the parameter value sequence expansion module 220 may include:

[0114] a first amplification submodule, configured to determine, in response to the starting parameter value in the second parameter value sequence being different from the starting parameter value in the first parameter value sequence, a third parameter value sequence in the amplification parameter value information based on the starting parameter value in the second parameter value sequence and the preset interval value;

[0115] The first parameter value range determination module 230 may include:

[0116] The first range determination submodule is used to determine a target starting parameter value of the target parameter value range based on the test results corresponding to each parameter value in the third parameter value sequence.

[0117] In some optional implementations, the parameter value sequence expansion module 220 may further include:

[0118] a second amplification submodule, configured to determine, in response to the termination parameter value in the second parameter value sequence being different from the termination parameter value in the first parameter value sequence, a fourth parameter value sequence in the amplification parameter value information based on the termination parameter value in the second parameter value sequence and the preset interval value;

[0119] The first parameter value range determination module 230 may further include:

[0120] The second range determination submodule is used to determine a target end parameter value of the target parameter value range according to the test results corresponding to each parameter value in the fourth parameter value sequence.

[0121] In some optional implementations, the device for debugging test parameters further includes:

[0122] The first range determination module is configured to determine a target starting parameter value of the target parameter value range based on the starting parameter value in the second parameter value sequence in response to the starting parameter value in the second parameter value sequence being the same as the starting parameter value in the first parameter value sequence.

[0123] In some optional implementations, the device for debugging test parameters further includes:

[0124] The second range determination module is configured to determine a target termination parameter value of the target parameter value range based on the termination parameter value in the second parameter value sequence in response to the target termination parameter value in the second parameter value sequence being the same as the termination parameter value in the first parameter value sequence.

[0125] In some optional implementations, the device for debugging test parameters further includes:

[0126] The second parameter value range determination module is used to determine the target parameter value range based on the starting parameter value and the ending parameter value in the first parameter value sequence in response to the test results corresponding to the target parameter values ​​in the first parameter value sequence being all successful.

[0127] The device for debugging test parameters in the embodiment of the present disclosure corresponds to the embodiment of the method for debugging test parameters in the present disclosure, and the relevant contents can be referenced to each other and will not be repeated here.

[0128] The beneficial technical effects corresponding to the exemplary embodiment of the device for debugging test parameters of the embodiment of the present disclosure can be found in the corresponding beneficial technical effects of the above-mentioned corresponding exemplary method part, which will not be repeated here.

[0129] In addition, an embodiment of the present application further provides an electronic device, including:

[0130] Memory for storing computer programs;

[0131] The processor is used to execute the computer program stored in the memory, and when the computer program is executed, the method for debugging test parameters described in any of the above embodiments of the present application is implemented.

[0132] Figure 6 This is a schematic diagram of the structure of an application embodiment of the electronic device of the present application. Figure 6 The electronic device according to the embodiment of the present application is described. The electronic device may be any one or both of the first device and the second device, or a stand-alone device independent of them, and the stand-alone device may communicate with the first device and the second device to receive the collected input signal from them.

[0133] like Figure 6 As shown, the electronic device includes one or more processors and memory.

[0134] The processor may be a central processing unit (CPU) or other forms of processing units having data processing capabilities and / or instruction execution capabilities, and may control other components in the electronic device to perform desired functions.

[0135] The memory may include one or more computer program products, and the computer program product may include various forms of computer-readable storage media, such as volatile memory and / or non-volatile memory. The volatile memory may include, for example, a random access memory (RAM) and / or a cache memory (cache), etc. The non-volatile memory may include, for example, a read-only memory (ROM), a hard disk, a flash memory, etc. One or more computer program instructions may be stored on the computer-readable storage medium, and the processor may execute the program instructions to implement the method for debugging test parameters of the various embodiments of the present application described above and / or other desired functions.

[0136] In one example, the electronic device may further include: an input device and an output device, and these components are interconnected via a bus system and / or other forms of connection mechanisms (not shown).

[0137] In addition, the input device may also include, for example, a keyboard, a mouse, and the like.

[0138] The output device can output various information to the outside, including the determined distance information, direction information, etc. The output device can include, for example, a display, a speaker, a printer, a communication network and a remote output device connected thereto, and the like.

[0139] Of course, to simplify, Figure 6 Only some of the components in the electronic device related to the present application are shown, and components such as a bus, an input / output interface, etc. are omitted. In addition, the electronic device may further include any other appropriate components according to specific application conditions.

[0140] In addition to the above-mentioned methods and devices, an embodiment of the present application may also be a computer program product, which includes computer program instructions, which, when executed by a processor, enable the processor to execute the steps in the method for debugging test parameters according to various embodiments of the present application described in the above part of this specification.

[0141] The computer program product may be written in any combination of one or more programming languages ​​to write program codes for performing the operations of the embodiments of the present application, including object-oriented programming languages, such as Java, C++, etc., and conventional procedural programming languages, such as "C" language or similar programming languages. The program code may be executed entirely on the user computing device, partially on the user device, as an independent software package, partially on the user computing device and partially on a remote computing device, or entirely on a remote computing device or server.

[0142] In addition, an embodiment of the present application may also be a computer-readable storage medium on which computer program instructions are stored. When the computer program instructions are executed by a processor, the processor executes the steps of the method for debugging test parameters according to various embodiments of the present application described in the above part of this specification.

[0143] The computer readable storage medium can adopt any combination of one or more readable media. The readable medium can be a readable signal medium or a readable storage medium. The readable storage medium can include, for example, but is not limited to, a system, device or device of electricity, magnetism, light, electromagnetic, infrared, or semiconductor, or any combination of the above. More specific examples (non-exhaustive list) of readable storage media include: an electrical connection with one or more wires, a portable disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above.

[0144] A person of ordinary skill in the art can understand that all or part of the steps of implementing the above method embodiment can be completed by hardware related to program instructions, and the aforementioned program can be stored in a computer-readable storage medium. When the program is executed, it executes the steps of the above method embodiment; and the aforementioned storage medium includes: ROM, RAM, magnetic disk or optical disk, etc., various media that can store program codes.

[0145] The basic principles of the present application are described above in conjunction with specific embodiments. However, it should be noted that the advantages, strengths, effects, etc. mentioned in the present application are only examples and not limitations, and it cannot be considered that these advantages, strengths, effects, etc. are required by each embodiment of the present application. In addition, the specific details disclosed above are only for the purpose of illustration and ease of understanding, not for limitation, and the above details do not limit the present application to being implemented by adopting the above specific details.

[0146] Each embodiment in this specification is described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts between the embodiments can be referred to each other. For the system embodiment, since it basically corresponds to the method embodiment, the description is relatively simple, and the relevant parts can be referred to the partial description of the method embodiment.

[0147] The block diagrams of the devices, apparatuses, equipment, and systems involved in this application are only illustrative examples and are not intended to require or imply that they must be connected, arranged, and configured in the manner shown in the block diagram. As will be appreciated by those skilled in the art, these devices, apparatuses, equipment, and systems can be connected, arranged, and configured in any manner. Words such as "including", "comprising", "having", etc. are open words, referring to "including but not limited to", and can be used interchangeably with them. The words "or" and "and" used here refer to the words "and / or" and can be used interchangeably with them, unless the context clearly indicates otherwise. The words "such as" used here refer to the phrase "such as but not limited to", and can be used interchangeably with them.

[0148] The method and apparatus of the present application may be implemented in many ways. For example, the method and apparatus of the present application may be implemented by software, hardware, firmware, or any combination of software, hardware, and firmware. The above order of steps for the method is for illustration only, and the steps of the method of the present application are not limited to the order specifically described above, unless otherwise specifically stated. In addition, in some embodiments, the present application may also be implemented as a program recorded in a recording medium, which includes machine-readable instructions for implementing the method according to the present application. Therefore, the present application also covers a recording medium storing a program for executing the method according to the present application.

[0149] It should also be noted that in the apparatus, device and method of the present application, each component or each step can be decomposed and / or recombined. Such decomposition and / or recombination should be regarded as equivalent solutions of the present application.

[0150] The above description of the disclosed aspects is provided to enable any person skilled in the art to make or use the present application. Various modifications to these aspects will be readily apparent to those skilled in the art, and the general principles defined herein may be applied to other aspects without departing from the scope of the present application. Therefore, the present application is not intended to be limited to the aspects shown herein, but rather to the widest scope consistent with the principles and novel features disclosed herein.

[0151] The above description has been given for the purpose of illustration and description. In addition, this description is not intended to limit the embodiments of the present application to the forms disclosed herein. Although multiple example aspects and embodiments have been discussed above, those skilled in the art will recognize certain variations, modifications, changes, additions and sub-combinations thereof.

Claims

1. A method for debugging test parameters, characterized in that: Applied to chip testing equipment, the method comprises: Based on the preset interval value, obtaining a first parameter value sequence from an initial parameter value sequence corresponding to the test parameter of the device under test; Based on the test results corresponding to each parameter value in the first parameter value sequence, determine a second parameter value sequence in the first parameter value sequence, the second parameter value sequence includes a plurality of parameter values, and the test results corresponding to each parameter value in the second parameter value sequence are all test successes; amplifying the parameter values ​​of the second parameter value sequence to obtain amplified parameter value information; Based on the test results corresponding to each parameter value in the amplification parameter value information, a target parameter value range corresponding to the test parameter is determined.

2. The method according to claim 1, characterized in that The determining a second parameter value sequence in the first parameter value sequence based on the test results corresponding to each parameter value in the first parameter value sequence includes: Based on the test results corresponding to the parameter values ​​in the first parameter value sequence, obtaining at least one initial sequence segment in the first parameter value sequence, wherein the test results corresponding to the parameter values ​​in the initial sequence segments in the at least one initial sequence segment are all test successes; determining a target sequence segment based on the number of parameter values ​​in each of the initial sequence segments; In response to the number of the target sequence segments being at least two, determining the second parameter value sequence based on the order of the target sequence segments in the first parameter value sequence; In response to the number of the target sequence segments being one, the target sequence segment is determined to be the second parameter value sequence.

3. The method according to claim 1 or 2, characterized in that: The performing parameter value amplification processing on the second parameter value sequence to obtain amplified parameter value information includes: In response to the starting parameter value in the second parameter value sequence being different from the starting parameter value in the first parameter value sequence, determining a third parameter value sequence in the amplification parameter value information based on the starting parameter value in the second parameter value sequence and the preset interval value; The determining, based on the test results corresponding to the parameter values ​​in the amplification parameter value information, a target parameter value range corresponding to the test parameter includes: Based on the test results corresponding to the parameter values ​​in the third parameter value sequence, a target starting parameter value of the target parameter value range is determined.

4. The method according to claim 3, characterized in that The performing sequence value amplification processing on the second parameter value sequence to obtain amplified parameter value information also includes: In response to the termination parameter value in the second parameter value sequence being different from the termination parameter value in the first parameter value sequence, determining a fourth parameter value sequence in the amplification parameter value information based on the termination parameter value in the second parameter value sequence and the preset interval value; The determining, based on the test results corresponding to the parameter values ​​in the amplification parameter value information, a target parameter value range corresponding to the test parameter includes: The target termination parameter value of the target parameter value range is determined according to the test results corresponding to the parameter values ​​in the fourth parameter value sequence.

5. The method according to any one of claims 1 to 4, characterized in that: Before performing parameter value amplification processing on the second parameter value sequence to obtain amplified parameter value information, the method further includes: In response to the starting parameter value in the second parameter value sequence being the same as the starting parameter value in the first parameter value sequence, a target starting parameter value of the target parameter value range is determined based on the starting parameter value in the second parameter value sequence.

6. The method according to claim 5, characterized in that Before performing parameter value amplification processing on the second parameter value sequence to obtain amplified parameter value information, the method further includes: In response to the target end parameter value in the second parameter value sequence being the same as the end parameter value in the first parameter value sequence, a target end parameter value of the target parameter value range is determined based on the end parameter value in the second parameter value sequence.

7. The method according to any one of claims 1 to 6, characterized in that: Before determining the second parameter value sequence in the first parameter value sequence based on the test results corresponding to each parameter value in the first parameter value sequence, the method further includes: In response to the test results corresponding to the target parameter values ​​in the first parameter value sequence being all successful, the target parameter value range is determined based on the start parameter value and the end parameter value in the first parameter value sequence.

8. A device for debugging test parameters, characterized in that: Applied to chip testing equipment, the device comprises: A first sequence determination module, configured to obtain a first parameter value sequence from an initial parameter value sequence corresponding to a test parameter of the device under test based on a preset interval value; A second sequence determination module, configured to determine a second parameter value sequence in the first parameter value sequence based on the test results corresponding to each parameter value in the first parameter value sequence, wherein the second parameter value sequence includes a plurality of parameter values, and the test results corresponding to each parameter value in the second parameter value sequence are all test successes; A parameter value sequence expansion module, used for amplifying the parameter values ​​of the second parameter value sequence to obtain amplified parameter value information; The first parameter value range determination module is used to determine the target parameter value range corresponding to the test parameter based on the test results corresponding to each parameter value in the amplification parameter value information.

9. An electronic device, characterized in that: include: Memory for storing computer programs; The processor is used to execute the computer program stored in the memory, and when the computer program is executed, the method for debugging test parameters described in any one of claims 1 to 7 is implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the method for debugging test parameters described in any one of claims 1 to 7 is implemented.

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