A test data management method and system for testing equipment

Abstract

The present invention provides a test data management method and system for testing equipment, belonging to the field of data management technology, and specifically comprising: determining the charge and discharge data of the on-board power supply in different capacity intervals based on the analysis results of the test data of the on-board power supply; when it is determined based on the analysis results of the charge and discharge data that the on-board power supply has an aging defect, obtaining the matching situation between the charge and discharge data and the charge and discharge curves of different aging types; when it is determined based on the matching situation that the on-board power supply does not have a matching aging type, using the aging identification results of the on-board power supply, storing and processing the on-board power supply as characteristic data of the charge and discharge curve of the matching aging type, thereby improving the efficiency of the aging identification processing.

Description

Technical Field

[0001] The present invention belongs to the technical field of data management, and in particular relates to a test data management method and system for testing equipment. Background Art

[0002] In order to realize the test processing of the power supply, the patent application CN216670070U "Vehicle Power Supply Aging Test Box" specifically realizes the aging test processing of the vehicle power supply by setting a power display screen and a charging interface, and using a charging device electrically connected to the charging interface.

[0003] When testing a power supply, its charge and discharge curve is often related to the type of aging of the power supply. For example, electrode aging, low electrolyte level or deterioration in quality, and poor battery line connection are all related to the charge and discharge curve. Therefore, if the power supply test data with more obvious aging characteristics cannot be stored and processed in the test equipment, then the aging identification method is uniformly used for remote identification, which will not improve the efficiency of power supply aging testing.

[0004] In response to the above technical problems, the present application specifically provides a test data management method and system for testing equipment. Summary of the Invention

[0005] To achieve the purpose of the present invention, the present invention adopts the following technical solutions:

[0006] In a first aspect, the present application provides a test data management method for a test device, specifically comprising:

[0007] The device model of the vehicle power supply is determined based on the analysis results of the test data of the test equipment. When it is determined that the test data of the vehicle power supply of the device model needs to be stored, analyzed and processed using the historical test data and aging defect data of the vehicle power supply of the device model, the next step is entered;

[0008] Determining charge and discharge data of the on-board power supply in different capacity intervals based on analysis results of test data of the on-board power supply, and obtaining a match between the charge and discharge data and charge and discharge curves of different aging types when determining that the on-board power supply has an aging defect based on the analysis results of the charge and discharge data;

[0009] When it is determined based on the matching condition that the on-board power supply has a matching aging type, determining whether the test data and charge-discharge data of the on-board power supply of the matching aging type need to be stored and processed as characteristic data of the charge-discharge curve of the matching aging type based on the matching condition of the test data and charge-discharge data of the on-board power supply of the matching aging type and the charge-discharge curve of the matching aging type;

[0010] When there is no matching aging type, the aging identification result of the on-board power supply is used to store and process the characteristic data of the charge and discharge curve of the on-board power supply as the matching aging type.

[0011] The beneficial effects of the present invention are:

[0012] Based on the matching of the test data and charge and discharge data of the on-board power supply of the matching aging type and the charge and discharge curve of the matching aging type, it is determined whether the test data of the on-board power supply needs to be stored and processed as characteristic data of the charge and discharge curve of the matching aging type. This not only takes into account the difference in the number of occurrences of the on-board power supply of the matching aging type in the historical test processing process, which leads to the difference in the storage requirements of the charge and discharge curve of the matching aging type, but also takes into account the similarity between the charge and discharge data and the existing charge and discharge curve of the matching aging type. This ensures the storage and processing of the charge and discharge data with higher identification necessity, and reduces the waste of unnecessary storage space.

[0013] By utilizing the aging identification results of the on-board power supply, the on-board power supply is stored and processed as characteristic data of the charge and discharge curve of the matching aging type, thereby realizing the dynamic update of the characteristic charge and discharge curves of different aging types of the test equipment, improving the processing efficiency of the aging identification processing of the on-board power supply, and at the same time reducing the storage processing of unnecessary test data, thereby improving the utilization efficiency of storage space.

[0014] A further technical solution is that the device model is determined based on device characteristic information of the vehicle power supply read by the test device.

[0015] A further technical solution is that the historical test data includes the historical test times of the vehicle power supply of the device model.

[0016] A further technical solution is that the aging defect data includes the number of historical tests of the on-board power supply of the device model under different aging types.

[0017] A further technical solution is to determine the need for storage, analysis and processing of vehicle power supply test data, specifically including:

[0018] Determine the number of historical tests of the vehicle power supply of the device model based on historical test data of the vehicle power supply of the device model;

[0019] Determining the number of historical tests in which the on-board power supply of the device model has aging defects based on the aging defect data of the on-board power supply of the device model;

[0020] The number of historical tests with aging defects is used as the number of defective tests, and whether storage, analysis and processing of the vehicle power supply test data need to be determined based on the proportion of the defective test number in the historical test number and the historical test number.

[0021] A further technical solution is to determine whether it is necessary to store, analyze and process the test data of the vehicle power supply, which specifically includes:

[0022] When the number of historical tests is greater than a preset number threshold and the proportion of the defect test number in the historical test number is greater than a preset proportion threshold, it is determined that storage, analysis and processing of the vehicle power supply test data are required.

[0023] A further technical solution is that the aging identification result of the on-board power supply includes a matching aging type of the on-board power supply.

[0024] A further technical solution is that the matched aging type is determined based on the charging and discharging data of the vehicle power supply and the recognition result of a preset aging recognition model. Specifically, the charging and discharging data of the vehicle power supply is used as the input of the preset aging recognition model, and the output of the preset aging recognition model is used as the aging recognition result of the vehicle power supply.

[0025] In a second aspect, the present invention provides a computer system comprising: a memory and a processor in communication connection, and a computer program stored in the memory and capable of running on the processor, wherein the processor executes the above-mentioned test data management method for testing equipment when running the computer program.

[0026] Other features and advantages will be described in the following description. The objectives and other advantages of the present invention are realized and obtained by the structures particularly pointed out in the description and drawings.

[0027] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, preferred embodiments are given below and described in detail with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] The above and other features and advantages of the present invention will become more apparent by describing in detail example embodiments thereof with reference to the accompanying drawings;

[0029] Figure 1 is a flow chart of a test data management method for a test device;

[0030] Figure 2 It is a flow chart for determining the storage, analysis and processing of the test data of the vehicle power supply;

[0031] Figure 3It is a flow chart for determining whether there is an aging defect in the vehicle power supply;

[0032] Figure 4 It is a flow chart for determining whether a vehicle power supply has a matching aging type. DETAILED DESCRIPTION

[0033] To help those skilled in the art better understand the technical solutions in this specification, the following will provide a clear and complete description of the technical solutions in the embodiments of this specification, in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of this specification, not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of this specification without creative work should fall within the scope of protection of this specification.

[0034] When testing a power supply, its charge and discharge curve is often related to the type of aging of the power supply. For example, electrode aging, low electrolyte level or deterioration in quality, and poor battery line connection are all related to the charge and discharge curve. Therefore, how to store and process power supply test data with more obvious aging characteristics in the test equipment and perform local curve comparison processing during fault diagnosis has become a technical problem that needs to be solved urgently.

[0035] In this application, the matching of the charge and discharge curves of aging defects in the on-board power supply experimental data and the charge and discharge curves in the local library is used to realize local storage management of experimental data with more obvious characteristics, which not only reduces the local storage space, but also improves the recognition and processing accuracy of fault diagnosis.

[0036] Example 1

[0037] To solve the above problems, according to one aspect of the present invention, Figure 1 As shown, in a first aspect, the present application provides a test data management method for a test device, specifically comprising:

[0038] S1 determines the device model of the vehicle power supply based on the analysis results of the test data of the test equipment. When it is determined that the test data of the vehicle power supply of the device model needs to be stored, analyzed and processed using the historical test data and aging defect data of the vehicle power supply of the device model, the next step is entered;

[0039] When the number of historical tests is greater than 1000 and the proportion of the number of defective tests in the number of historical tests is greater than 0.1, it is determined that storage, analysis and processing of the test data of the on-board power supply are required.

[0040] S2 determines charge and discharge data of the on-board power supply in different capacity intervals based on the analysis results of the test data of the on-board power supply, and when it is determined that the on-board power supply has an aging defect based on the analysis results of the charge and discharge data, obtains a match between the charge and discharge data and charge and discharge curves of different aging types;

[0041] Based on the analysis results of the charge and discharge data of different capacity intervals, the charge and discharge curves of the different capacity intervals are determined. Based on the deviation of the charge and discharge curves of the different capacity intervals from the preset charge and discharge curves of the corresponding capacity intervals, the curve deviation coefficients of the charge and discharge curves in the different capacity intervals are determined. When the average value of the curve deviation coefficients of the charge and discharge curves of the different capacity intervals is greater than 0.6, it is determined that the on-board power supply has an aging defect.

[0042] S3, when it is determined that the on-board power supply has a matching aging type based on the matching condition, determining whether the test data and charge-discharge data of the on-board power supply of the matching aging type need to be stored and processed as characteristic data of the charge-discharge curve of the matching aging type based on the matching condition of the charge-discharge curve of the matching aging type;

[0043] The curve deviation coefficients of the charge and discharge curves in different capacity intervals are determined based on the matching conditions of the charge and discharge curves of different corresponding characteristic data in different capacity intervals with the charge and discharge curves of the on-board power supply. The data deviation coefficients with respect to the different corresponding characteristic data are determined based on the average values of the curve deviation coefficients of the charge and discharge curves in different capacity intervals. When there is a charge and discharge curve corresponding to an aging type with a data deviation coefficient less than 0.2, the aging type with the smallest data deviation coefficient is used as the matching aging type.

[0044] Using the test data of the on-board power supply of the matching aging type, it is determined that there is a historical test number of the matching aging type, and the number is used as the matching aging test number. According to the matching situation of the charge and discharge data of different matching aging test numbers and the test data of the on-board power supply, the data deviation coefficients of different matching aging test numbers are determined. When the average value of the data deviation coefficients of different matching aging test numbers is greater than 0.3, it is determined that the test data of the on-board power supply needs to be stored and processed as characteristic data of the charge and discharge curve of the matching aging type.

[0045] S4: When there is no matching aging type, using the aging identification result of the on-board power supply, the on-board power supply is used as characteristic data of the charge and discharge curve of the matching aging type for storage and processing.

[0046] Furthermore, the device model is determined based on device characteristic information of the vehicle-mounted power supply read by the testing device.

[0047] Specifically, the historical test data includes the number of historical tests of the vehicle power supply of the device model.

[0048] It should be noted that the aging defect data includes the historical test times of the vehicle-mounted power supply of the device model under different aging types.

[0049] It is understandable that if Figure 2 As shown, it is determined that the storage, analysis and processing of the vehicle power supply test data needs to be performed, specifically including:

[0050] Determine the number of historical tests of the vehicle power supply of the device model based on historical test data of the vehicle power supply of the device model;

[0051] Determining the number of historical tests in which the on-board power supply of the device model has aging defects based on the aging defect data of the on-board power supply of the device model;

[0052] The number of historical tests with aging defects is used as the number of defective tests, and whether storage, analysis and processing of the vehicle power supply test data need to be determined based on the proportion of the defective test number in the historical test number and the historical test number.

[0053] Furthermore, it is determined whether it is necessary to store, analyze and process the test data of the vehicle power supply, including:

[0054] When the number of historical tests is greater than a preset number threshold and the proportion of the defect test number in the historical test number is greater than a preset proportion threshold, it is determined that storage, analysis and processing of the vehicle power supply test data are required.

[0055] It should be noted that, when there is no need to store, analyze, or process the test data of the on-board power supply, the aging identification result of the on-board power supply is directly used to determine whether the on-board power supply has an aging defect.

[0056] In another embodiment, determining the need to store, analyze, and process the vehicle-mounted power supply test data specifically includes:

[0057] Determine the number of historical tests of the vehicle power supply of the device model based on historical test data of the vehicle power supply of the device model;

[0058] Determining the number of historical tests in which the on-board power supply of the device model has aging defects based on the aging defect data of the on-board power supply of the device model;

[0059] The number of historical tests with aging defects is used as the number of defect tests, and whether storage, analysis and processing of the vehicle power supply test data need to be determined based on the proportion of the number of defect tests in the historical test numbers.

[0060] In another embodiment, determining the need to store, analyze, and process the vehicle-mounted power supply test data specifically includes:

[0061] Determine the historical test times of the vehicle power supply of the device model based on the historical test data of the vehicle power supply of the device model. If the historical test times are not within the preset test times range:

[0062] When the number of historical tests is greater than a preset test number threshold, it is determined that storage, analysis and processing of the vehicle power supply test data is required;

[0063] When the number of historical tests is not greater than a preset test number threshold, it is determined that there is no need to store, analyze, or process the test data of the vehicle-mounted power supply;

[0064] When the historical test times are within the preset test times range:

[0065] Determining the number of historical tests for aging defects of the on-board power supply of the device model based on the aging defect data of the on-board power supply of the device model, using the number of historical tests for aging defects as the number of defect tests, and determining the need to store, analyze, and process the test data of the on-board power supply when the number of defect tests does not meet the requirement;

[0066] When the defect test times meet the requirements:

[0067] Determining a defect ratio based on the ratio of the number of defective tests to the number of tests, and determining that storage, analysis, and processing of the vehicle power supply test data are required when the defect ratio does not meet the requirement;

[0068] When the defect ratio meets the requirements:

[0069] Determine the test defect coefficients for different defect types based on the number of defect tests corresponding to different defect types and their proportion in the test number. Determine the comprehensive defect coefficients based on the preset defect weight coefficients corresponding to the different defect types. If the comprehensive defect coefficient does not meet the requirements, determine that the test data of the on-board power supply needs to be stored, analyzed, and processed.

[0070] When the comprehensive defect coefficient meets the requirements:

[0071] Obtain the historical test times of the vehicle power supply of the equipment model, and determine the analysis and processing demand coefficient of the vehicle power supply in combination with the comprehensive defect coefficient, and determine whether storage, analysis and processing of the vehicle power supply test data is required based on the analysis and processing demand coefficient.

[0072] Furthermore, the capacity intervals are divided into equal intervals according to the number of preset intervals and the capacity of the vehicle-mounted power supply.

[0073] Specifically, the charge and discharge data is determined according to a charge and discharge curve within a preset time period according to a preset charge and discharge power.

[0074] Specifically, such as Figure 3 As shown, it is determined that the vehicle power supply has an aging defect, specifically including:

[0075] Determine the charge and discharge curves for different capacity intervals based on the analysis results of the charge and discharge data for different capacity intervals;

[0076] Determining curve deviation coefficients of the charge-discharge curves in different capacity intervals based on deviations between the charge-discharge curves in different capacity intervals and preset charge-discharge curves in corresponding capacity intervals;

[0077] Whether the on-board power supply has an aging defect is determined according to average values of curve deviation coefficients of the charge and discharge curves in different capacity intervals.

[0078] Furthermore, the curve deviation coefficient is determined according to the ratio of the number of moments at which the charge-discharge curve deviates from the preset charge-discharge curve.

[0079] It should be noted that when the average value of the curve deviation coefficients of the charge and discharge curves in different capacity intervals is greater than the preset deviation coefficient, it is determined that the on-board power supply has an aging defect.

[0080] In another embodiment, determining whether the vehicle-mounted power supply has an aging defect specifically includes:

[0081] Determining charge and discharge curves for the different capacity intervals based on analysis results of charge and discharge data for the different capacity intervals, and determining curve mutation moments of the on-board power supply based on the charge and discharge curves for the different capacity intervals. When the number of curve mutation moments of the on-board power supply does not meet a requirement, determining that the on-board power supply has an aging defect;

[0082] When the number of sudden changes in the curve of the vehicle power supply meets the requirements:

[0083] The number of curve mutation moments in different capacity intervals is used to determine the curve abnormal variation coefficient in different capacity intervals. When there is a capacity interval where the curve abnormal variation coefficient does not meet the requirements:

[0084] When the number of capacity intervals in which the abnormal variation coefficient of the curve does not meet the requirement does not meet the requirement, it is determined that the on-board power supply has an aging defect;

[0085] When there is no capacity interval where the abnormal variation coefficient of the curve does not meet the requirements or the number of capacity intervals where the abnormal variation coefficient of the curve does not meet the requirements meets the requirements:

[0086] Determining curve deviation coefficients of the charge-discharge curves in different capacity intervals based on deviations between the charge-discharge curves in different capacity intervals and preset charge-discharge curves in corresponding capacity intervals; and determining that the on-board power supply does not have an aging defect when the curve deviation coefficients of the charge-discharge curves in different capacity intervals all meet requirements;

[0087] When the curve deviation coefficient of the charge and discharge curve does not meet the required capacity range:

[0088] Obtaining a maximum value of a curve deviation coefficient of a charge-discharge curve in different capacity intervals, and determining that the on-board power supply has an aging defect when the maximum value of the curve deviation coefficient of the charge-discharge curve does not meet a requirement;

[0089] When the maximum value of the curve deviation coefficient of the charge-discharge curve meets the requirement:

[0090] The capacity intervals in which the curve deviation coefficients of the charge-discharge curve do not meet the requirements are used as curve deviation intervals. When the number of the curve deviation intervals does not meet the requirements, it is determined that the on-board power supply has an aging defect.

[0091] When the number of curve deviation intervals meets the requirements:

[0092] Based on the curve deviation coefficients and curve abnormal variation coefficients of different capacity intervals, curve abnormality coefficients of different capacity intervals are determined, and based on the average values of the curve abnormality coefficients of the charge and discharge curves of different capacity intervals, it is determined whether the on-board power supply has an aging defect.

[0093] Specifically, such as Figure 4 As shown, determining whether the vehicle power supply has a matching aging type specifically includes:

[0094] Acquire characteristic data of the charge-discharge curve corresponding to different aging types and use the data as corresponding characteristic data, and determine curve deviation coefficients of the charge-discharge curves in different capacity intervals based on the matching between the charge-discharge curves of the different corresponding characteristic data in different capacity intervals and the charge-discharge curve of the on-board power supply;

[0095] Determine the data deviation coefficients of different corresponding characteristic data according to the average values of the curve deviation coefficients of the charge and discharge curves in different capacity intervals;

[0096] It is determined whether the on-board power supply has a matching aging type based on the data deviation coefficient.

[0097] Furthermore, when there is characteristic data with a data deviation coefficient meeting the requirements in the corresponding aging type, the corresponding aging type is determined to be a matching aging type.

[0098] In one embodiment, determining whether the test data of the vehicle power supply needs to be stored and processed as characteristic data of the charge-discharge curve matching the aging type specifically includes:

[0099] Determine the number of historical tests of the matching aging type based on the test data of the on-board power supply of the matching aging type, and use the number as the number of historical tests of the matching aging type;

[0100] Determining the data deviation coefficient of the characteristic data corresponding to the charge-discharge data of different matching aging test times and different charge-discharge curves according to the matching conditions of the charge-discharge data of different matching aging test times and the charge-discharge curves of the matching aging type;

[0101] The data deviation coefficient is used to determine the number of identification deviation tests in the matching aging test number, and the matching conditions between different identification deviation test numbers and the test data of the on-board power supply are used to determine the data deviation coefficients of different identification deviation test numbers. The average value of the data deviation coefficients of different identification deviation numbers is used to determine whether the test data of the on-board power supply needs to be stored and processed as characteristic data of the charge and discharge curve of the matching aging type.

[0102] Furthermore, when the average value of the data deviation coefficients of different identification deviation times is less than the preset deviation coefficient, it is determined that the test data of the on-board power supply needs to be stored and processed as the characteristic data of the charge and discharge curve matching the aging type.

[0103] Specifically, the data deviation coefficient is determined according to an average value of curve deviation coefficients of the charge-discharge curves in different capacity intervals and the charge-discharge curve of the matching aging type.

[0104] It can be understood that the number of identification deviation tests is the number of matching aging tests in which the data deviation coefficient does not meet the requirements.

[0105] In another embodiment, determining whether the test data of the vehicle power supply needs to be stored and processed as characteristic data of the charge and discharge curve matching the aging type specifically includes:

[0106] Determine the number of historical tests of the matching aging type based on the test data of the on-board power supply of the matching aging type, and use the number as the number of historical tests of the matching aging type;

[0107] Determining data deviation coefficients for different matching aging test times according to matching conditions between the charge and discharge data for different matching aging test times and the test data of the on-board power supply;

[0108] The average value of the data deviation coefficients of different matching aging test times is used to determine whether the test data of the on-board power supply needs to be stored and processed as the characteristic data of the charge-discharge curve of the matching aging type.

[0109] Optionally, determining whether the test data of the vehicle-mounted power supply needs to be stored and processed as characteristic data of the charge-discharge curve matching the aging type specifically includes:

[0110] S31: using the test data of the on-board power supply of the matching aging type, determining the number of historical tests of the matching aging type, and using the number of historical tests as the matching aging test number, and determining a basic storage requirement coefficient of the test data of the on-board power supply using the matching aging test number;

[0111] S32: determining, based on the matching conditions of the charge-discharge data of different matching aging test times and the charge-discharge curves of the matching aging types, data deviation coefficients of characteristic data corresponding to the charge-discharge data of different matching aging test times and different charge-discharge curves; determining, using the data deviation coefficients, the number of identification deviation tests in the matching aging test times; determining, based on the matching conditions of the different identification deviation test times and the test data of the on-board power supply, data deviation coefficients of different identification deviation test times; and determining, based on the data deviation coefficients of the different identification deviation test times, an identification processing requirement coefficient.

[0112] S33 determines a storage requirement coefficient based on an average value of the identification processing requirement coefficient and the basic storage requirement coefficient, and uses the storage requirement coefficient to determine whether the test data of the on-board power supply needs to be stored as characteristic data of the charge and discharge curve matching the aging type.

[0113] Optionally, the above step S31 includes the following contents:

[0114] S311 determines, based on the matching of the test data of the on-board power supply and the charge-discharge curve of the matching aging type, that there exists a charge-discharge curve of the matching aging type whose data deviation coefficient of the corresponding characteristic data is within a preset deviation coefficient interval, then determines that it is not necessary to store and process the test data of the on-board power supply as the characteristic data of the charge-discharge curve of the matching aging type; if there does not exist a charge-discharge curve of the matching aging type whose data deviation coefficient of the corresponding characteristic data is within the preset deviation coefficient interval, then proceeds to step S312;

[0115] S312 determines the number of historical tests of the matching aging type based on the test data of the on-board power supply of the matching aging type, and uses it as the matching aging test number. If the matching aging test number is less than the preset aging test number threshold, the process proceeds to step S313. If the matching aging test number is not less than the preset aging test number threshold, the process proceeds to step S314.

[0116] At step S313, when the average value of the data deviation coefficients of the characteristic data corresponding to the charge and discharge curves of different matching aging types is greater than a preset coefficient threshold, it is determined that the test data of the on-board power supply does not need to be stored and processed as the characteristic data of the charge and discharge curves of the matching aging types. When the average value of the data deviation coefficients of the characteristic data corresponding to the charge and discharge curves of different matching aging types is not greater than the preset coefficient threshold, the process proceeds to step S314.

[0117] S314 uses the matching aging test times to determine the basic storage requirement coefficient of the test data of the vehicle power supply, and then goes to step S32.

[0118] Optionally, the above step S32 includes the following contents:

[0119] S321 determines, based on the matching conditions between the charge-discharge data of different matching aging test times and the charge-discharge curves of the matching aging types, data deviation coefficients of characteristic data corresponding to the charge-discharge data of different matching aging test times and different charge-discharge curves, and determines the number of identification deviation tests in the matching aging test times using the data deviation coefficients;

[0120] At step S322, when the number of identification deviation tests is less than the preset identification deviation threshold, it is determined that the test data of the on-board power supply does not need to be stored and processed as characteristic data of the charge-discharge curve matching the aging type. When the number of identification deviation tests is not less than the preset identification deviation threshold, the process proceeds to step S323.

[0121] S323 determines data deviation coefficients for different identification deviation test times based on the matching conditions between different identification deviation test times and the test data of the on-board power supply. If there is no identification deviation test time with a data deviation coefficient less than a preset data deviation coefficient threshold, it is determined that the test data of the on-board power supply does not need to be stored and processed as characteristic data of the charge and discharge curve matching the aging type. If there is an identification deviation test time with a data deviation coefficient less than the preset data deviation coefficient threshold, the process proceeds to step S324.

[0122] S324: When the data deviation coefficient is less than the preset data deviation coefficient threshold and the number of identification deviation tests is greater than the preset deviation test number threshold, it is determined that the test data of the on-board power supply needs to be stored and processed as characteristic data of the charge and discharge curve matching the aging type; when the data deviation coefficient is less than the preset data deviation coefficient threshold and the number of identification deviation tests is not greater than the preset deviation test number threshold, the process proceeds to step S325;

[0123] S325 uses the matching conditions of different identification deviation test times and the test data of the on-board power supply to determine the data deviation coefficients of different identification deviation test times and determine the identification processing requirement coefficient. When the identification processing requirement coefficient is greater than the preset requirement coefficient threshold, it is determined that the test data of the on-board power supply needs to be stored and processed as the characteristic data of the charge and discharge curve of the matching aging type. When the identification processing requirement coefficient is not greater than the preset requirement coefficient threshold, proceed to step S33.

[0124] Furthermore, the aging identification result of the vehicle power supply includes a matching aging type of the vehicle power supply.

[0125] Specifically, the matched aging type is determined based on the charging and discharging data of the vehicle power supply and the recognition result of a preset aging recognition model. Specifically, the charging and discharging data of the vehicle power supply is used as the input of the preset aging recognition model, and the output of the preset aging recognition model is used as the aging recognition result of the vehicle power supply.

[0126] Example 2

[0127] In a second aspect, the present invention provides a computer system comprising: a memory and a processor in communication connection, and a computer program stored in the memory and capable of running on the processor, wherein the processor executes the above-mentioned test data management method for testing equipment when running the computer program.

[0128] The various embodiments in this specification are described in a progressive manner. Similar portions between the various embodiments can be referenced to each other, and each embodiment focuses on the differences from the other embodiments. In particular, the device, apparatus, and non-volatile computer storage medium embodiments are generally similar to the method embodiments, so their descriptions are relatively simplified. For relevant details, refer to the descriptions of the method embodiments.

[0129] The foregoing description of this specification describes specific embodiments. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recited in the claims can be performed in an order different from that described in the embodiments and still achieve the desired results. Furthermore, the processes depicted in the accompanying drawings do not necessarily require the specific order shown or the sequential order to achieve the desired results. In certain embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0130] The foregoing description is merely one or more embodiments of this specification and is not intended to limit this specification. It will be apparent to those skilled in the art that various modifications and variations may be made to one or more embodiments of this specification. Any modifications, equivalent substitutions, or improvements made within the spirit and principles of one or more embodiments of this specification are intended to be within the scope of the claims of this specification.

Claims

1. A test data management method for testing equipment, characterized in that: Specifically include: The device model of the vehicle power supply is determined based on the analysis results of the test data of the test equipment. When it is determined that the test data of the vehicle power supply of the device model needs to be stored, analyzed and processed using the historical test data and aging defect data of the vehicle power supply of the device model, the next step is entered; Determining charge and discharge data of the on-board power supply in different capacity intervals based on analysis results of test data of the on-board power supply, and obtaining a match between the charge and discharge data and charge and discharge curves of different aging types when determining that the on-board power supply has an aging defect based on the analysis results of the charge and discharge data; When it is determined based on the matching condition that the on-board power supply has a matching aging type, determining whether the test data and charge-discharge data of the on-board power supply of the matching aging type need to be stored and processed as characteristic data of the charge-discharge curve of the matching aging type based on the matching condition of the test data and charge-discharge data of the on-board power supply of the matching aging type and the charge-discharge curve of the matching aging type; When there is no matching aging type, using the aging identification result of the on-board power supply, storing and processing the characteristic data of the charge and discharge curve of the on-board power supply as the matching aging type; Determine the need for storage, analysis and processing of vehicle power supply test data, including: Determine the number of historical tests of the vehicle power supply of the device model based on historical test data of the vehicle power supply of the device model; Determining the number of historical tests in which the on-board power supply of the device model has aging defects based on the aging defect data of the on-board power supply of the device model; The number of historical tests with aging defects is used as the number of defective tests, and whether it is necessary to store, analyze and process the test data of the on-board power supply according to the proportion of the defective test number in the historical test number and the number of historical tests; Determining whether the test data of the vehicle-mounted power supply needs to be stored and processed as characteristic data of the charge-discharge curve matching the aging type specifically includes: Determine the number of historical tests of the matching aging type based on the test data of the on-board power supply of the matching aging type, and use the number as the number of historical tests of the matching aging type; Determining the data deviation coefficient of the characteristic data corresponding to the charge-discharge data of different matching aging test times and different charge-discharge curves according to the matching conditions of the charge-discharge data of different matching aging test times and the charge-discharge curves of the matching aging type; The data deviation coefficient is used to determine the number of identification deviation tests in the matching aging test number, and the matching conditions between different identification deviation test numbers and the test data of the on-board power supply are used to determine the data deviation coefficients of different identification deviation test numbers. The average value of the data deviation coefficients of different identification deviation numbers is used to determine whether the test data of the on-board power supply needs to be stored and processed as characteristic data of the charge and discharge curve of the matching aging type.

2. The test data management method for testing equipment according to claim 1, characterized in that: The device model is determined based on the device characteristic information of the vehicle power supply read by the testing device.

3. The test data management method for testing equipment according to claim 1, characterized in that: The historical test data includes the historical test times of the vehicle power supply of the device model.

4. The test data management method for testing equipment according to claim 1, wherein: Determine whether it is necessary to store, analyze and process the test data of the vehicle power supply, including: When the number of historical tests is greater than a preset number threshold and the proportion of the defect test number in the historical test number is greater than a preset proportion threshold, it is determined that storage, analysis and processing of the vehicle power supply test data are required.

5. The test data management method for testing equipment according to claim 1, wherein: When the storage, analysis and processing of the test data of the on-board power supply is not required, the aging identification result of the on-board power supply is directly used to determine whether the on-board power supply has an aging defect.

6. The test data management method for testing equipment according to claim 1, wherein: Determining whether the vehicle power supply has a matching aging type includes: Acquire characteristic data of the charge-discharge curve corresponding to different aging types and use the data as corresponding characteristic data, and determine curve deviation coefficients of the charge-discharge curves in different capacity intervals based on the matching between the charge-discharge curves of the different corresponding characteristic data in different capacity intervals and the charge-discharge curve of the on-board power supply; Determine the data deviation coefficients of different corresponding characteristic data according to the average values of the curve deviation coefficients of the charge and discharge curves in different capacity intervals; It is determined whether the on-board power supply has a matching aging type based on the data deviation coefficient.

7. The test data management method for testing equipment according to claim 6, characterized in that: When there is characteristic data with a data deviation coefficient meeting the requirements in the corresponding aging type, the corresponding aging type is determined to be a matching aging type.

8. The test data management method for testing equipment according to claim 1, wherein: The aging identification result of the vehicle power supply includes a matching aging type of the vehicle power supply.

9. A computer system comprising: A memory and a processor in communication connection, and a computer program stored in the memory and capable of running on the processor, characterized in that when the processor runs the computer program, a test data management method for testing equipment according to any one of claims 1 to 8 is executed.

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