High-speed I / O connector high-frequency simulation test data analysis method and system

By using a dual data group comparison architecture of test group and constant group in I/O connector simulation test, the benchmark error is quantified and data float is corrected, the problem of insufficient reliability of simulation test results in the existing technology is solved, and more accurate and reliable simulation test results are achieved.

CN119885679AActive Publication Date: 2025-04-25SHENZHEN GLGNET ELECTRONICS

Patent Information

Application Number
CN202510357494.7
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-03-25
Publication Date
2025-04-25
Estimated Expiration
2045-03-25

AI Technical Summary

Technical Problem

The reliability of the simulation test results of existing I/O connectors is insufficient, and the fuzzy processing capability is lacking, so the test results in interference are not effectively handled, resulting in the results deviating from the actual situation.

Method used

Through independent parameterized configuration, the dual data group comparison architecture of the test group and the constant group is used for simulation testing, and the data floating situation is obtained based on the reference error of the constant group, and the floating correction data is predicted to predict the possible landing range of the simulation test results.

Benefits of technology

It improves the diversity and reliability of simulation test results, can output accurate simulation test results, and determine the possible landing range of test results through data drift prediction, enhancing the credibility of the results.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention relates to the field of I / O connector simulation testing, in particular to a high-speed I / O connector high-frequency simulation testing data analysis method and system, and aims at solving the problems that in the simulation testing process, data processing is insufficient, so that reliability of a testing result is insufficient, fuzzy processing capacity does not exist, and judgment of a drop point range of the testing result is insufficient. According to the method, simulation testing is carried out simultaneously through a double-data-group comparison framework of the testing group and the constant group, reference error quantization based on the constant group is carried out according to double results of the testing group and the constant group so as to obtain the data floating condition, and data of the testing group is corrected through the floating condition, so that the accuracy of the data is improved. When signal integrity, electromagnetic coupling and time domain characteristics are evaluated, an accurate simulation test result can be output, and data drift prediction can be carried out according to the data after floating correction, so that the possible drop point range of the simulation test result is predicted, and the diversity of output results and the reliability of the results are improved.
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Description

Technical Field

[0001] The present invention relates to the field of I / O connector simulation testing, and in particular to a high-speed I / O connector high-frequency simulation testing data analysis method and system. Background Art

[0002] The performance of I / O connectors in high-frequency environments is critical, especially in applications with high-speed data transmission, such as servers, communication equipment, or high-performance computing. I / O connector high-frequency simulation testing is the process of modeling, analyzing, and verifying the performance of input / output (I / O) connectors in high-frequency signal transmission scenarios through electromagnetic field simulation tools. The core goal is to evaluate the signal integrity (SI), electromagnetic compatibility (EMC), and high-frequency characteristics of the connector, such as impedance matching, crosstalk, and loss, to ensure that it works reliably in high-speed digital or radio frequency systems. Currently, commonly used electromagnetic simulation software includes ANSYS HFSS, CSTStudio Suite, etc., which can analyze the transmission performance of I / O connectors. At present, the connector simulation test in the prior art is to use simulation test software to model and analyze the performance of the I / O connector to obtain the connector performance. However, during the test process, due to the variety of parameters, some special parameters will interfere with the simulation test results, causing the simulation test results to deviate from the actual situation. The simulation test of the prior art will only output a fixed result, resulting in insufficient reliability of the simulation test results. At the same time, it also lacks the ability to fuzzy process the test results and cannot perform range positioning on the test results in the presence of interference.

[0003] In view of the above technical problems, this application proposes a solution. Summary of the invention

[0004] The present invention performs simulation tests simultaneously through autonomous parameter configuration and a dual data group comparison architecture of a test group and a constant group, performs benchmark error quantification based on the constant group according to the dual results of the test group and the constant group to obtain data floating conditions, and corrects the data of the test group according to the floating conditions. When evaluating signal integrity, electromagnetic coupling and time domain characteristics, not only accurate simulation test results can be output, but also data drift prediction can be performed according to the floating corrected data to predict the possible landing point range of the simulation test results, improve the diversity of the output results and the reliability of the results, so as to solve the problems of insufficient data processing in the simulation test process, resulting in insufficient reliability of the test results and lack of fuzzy processing capability, resulting in insufficient determination of the landing point range of the test results, and propose a high-speed I / O connector high-frequency simulation test data analysis method and system.

[0005] The purpose of the present invention can be achieved by the following technical solution: A high-speed I / O connector high-frequency simulation test data analysis method comprises the following steps: Step 1: Select a simulation test tool, set input parameters in the simulation test tool, generate a test group and a constant group, perform simulation testing through the simulation test tool, and obtain simulation test data of the test group and simulation test data of the constant group; Step 2: Filter the noise of the simulation test data of the test group, and make a credibility judgment on the filtered data, and perform corresponding processing according to the credibility judgment result to obtain applicable data; Step 3: Compare the constant group simulation test data with the set numerical standard to obtain the constant group numerical difference, and generate the test deviation according to the constant group numerical difference; Step 4: Compare the test deviation with the set upper limit of the deviation to obtain data anomaly signals or data floating signals, and combine the applicable data and the test deviation for analysis to generate floating data; Step 5: Analyze applicable data, including signal integrity, time domain characteristics, and electromagnetic compatibility; Step 6: Correct the available data according to the floating data to obtain the corrected signal integrity, electromagnetic compatibility and time domain characteristics.

[0006] As a preferred embodiment of the present invention, when filtering the noise in the step 2, the input signal frequency is obtained through the input parameters set in the step 1, and the frequency range of the signal is obtained by expanding the frequency of the input signal through the set range. After obtaining the simulation test data in the step 1, the signal frequency in the simulation test data is compared with the frequency range of the signal, and the signal frequency outside the frequency range of the signal is recorded as the noise frequency and filtered, and the signal frequency within the frequency range of the signal is retained.

[0007] As a preferred embodiment of the present invention, the method for judging the credibility of the filtered data in step 2 is: Each type of data in the filtered data is taken as a set to obtain multiple data sets, and the data in each data set is graphically processed to obtain a data distribution curve, wherein the vertical axis of the coordinates of the curve is the numerical value of the data, and the horizontal axis is the acquisition time of the data; After obtaining the data distribution curve, the oscillation degree of the data distribution curve is analyzed to obtain the curve oscillation value, and the curve range is limited by the curve oscillation value, and the curve data within the limited range is recorded as applicable data.

[0008] As a preferred embodiment of the present invention, the method for analyzing the oscillation degree of the data distribution curve is: Get the highest point and the lowest point of the data distribution curve, and record the difference between the highest point and the lowest point as the curve amplitude ZF; select a point in the data distribution curve, calculate the difference between the selected point and the highest point and the lowest point, and record them as the upper margin SF and the lower margin XF respectively; calculate the fluctuation degree B by the formula; take the arithmetic average of the fluctuation degrees of all points to get the curve oscillation value.

[0009] As a preferred embodiment of the present invention, the method for limiting the curve range by the curve oscillation value is: The midpoint between the highest and lowest points of the distribution curve is taken as the data midpoint, and the distance extending upward and downward from the data midpoint by 0.5 times the product of the curve amplitude and the degree of fluctuation is recorded as the limited range.

[0010] As a preferred embodiment of the present invention, the method for obtaining the constant group value difference in step 3 is: Calculate the ratio of each item in the constant group simulation test data to the corresponding item in the set numerical standard, and record the average value of the ratio as the constant group numerical difference; The comparison method in step four is: if the difference in the constant group values ​​is greater than the set upper limit of the deviation, a data anomaly signal is generated, and the simulation test data is recorded as unavailable; if the difference in the constant group values ​​is not greater than the set upper limit of the deviation, a data floating signal is generated.

[0011] As a preferred embodiment of the present invention, the method for generating the data floating degree in step 4 is: record the constant group value difference as A, record the applicable data as Y, and obtain the floating data through Y×(1+A) and Y×(1-A); In the step six, the signal integrity, electromagnetic compatibility and time domain characteristics are calculated respectively by two sets of floating data, and the results between the two sets of signal integrity, electromagnetic compatibility and time domain characteristics are taken as the possible real result range, and the signal integrity, time domain characteristics and electromagnetic compatibility in step five are taken as the expected real results.

[0012] The present invention also provides a high-speed I / O connector high-frequency simulation test data analysis system, comprising a test generation unit, a data acquisition unit, a data correction unit, a deviation control unit, a data floating unit and a result output unit, wherein the test generation unit is used to perform the simulation test in step one; The data acquisition unit is used to collect data for the simulation test in step 1 to obtain the test group simulation test data and the constant group simulation test data; The data correction unit is used to perform noise filtering, credibility judgment and generation of applicable data in step 2; The deviation control unit is used to generate the test deviation in step 3, and generate a data abnormality signal or a data floating signal for the test deviation; The data floating unit is used to generate the floating data in step 4; The result output unit is used to analyze and generate the signal integrity, time domain characteristics and electromagnetic compatibility in step five and step six, and output the analysis results.

[0013] Compared with the prior art, the present invention has the following beneficial effects: 1. In the present invention, in the process of high-frequency simulation evaluation of the I / O connector, parameter configuration is performed autonomously, and simulation tests are performed simultaneously through a dual data group comparison architecture of a test group and a constant group, so as to obtain dual result outputs of the test group and the constant group, and a benchmark error quantification based on the constant group is performed according to the output results, so as to obtain the data floating situation, and a dynamic threshold is triggered according to the floating situation to correct the data of the test group, so that when evaluating the signal integrity, electromagnetic coupling and time domain characteristics, not only can accurate simulation test results be output, but also data drift prediction can be performed according to the floating corrected data, so as to predict the possible landing point range of the simulation test results, thereby improving the diversity of the output results and the reliability of the results.

[0014] 2. In the present invention, a dual processing mechanism of noise filtering and credibility verification is implemented for the data collected during the simulation test, which realizes automatic interception of abnormal data and secondary processing of data, thereby deeply cleaning the data and improving the authenticity of the data. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to facilitate understanding by those skilled in the art, the present invention is further described below with reference to the accompanying drawings.

[0016] Figure 1 is a system block diagram of the present invention; Figure 2 is a system flow chart of the present invention; Figure 3 It is a schematic diagram of the data distribution curve of the present invention. DETAILED DESCRIPTION

[0017] The technical scheme of the present invention will be described clearly and completely in conjunction with the embodiments below. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0018] Example 1: Please refer to Figure 1 - Figure 3As shown, a high-speed I / O connector high-frequency simulation test data analysis method includes the following steps: Step 1: The tester selects a simulation test tool, such as electromagnetic simulation software, through the test generation unit, and sets input parameters in the simulation test tool. At the same time, the test generation unit automatically generates a test group and a constant group, performs a simulation test through the simulation test tool, and obtains the test group simulation test data and the constant group simulation test data through the data acquisition unit during the simulation test. Step 2: The data correction unit obtains the set input parameters through the test generation unit to obtain the input signal frequency, and expands the input signal frequency through the set range to obtain the frequency range of the signal. At the same time, after the simulation test data is obtained by the data acquisition unit, the signal frequency in the simulation test data is compared with the frequency range of the signal, and the signal frequency outside the frequency range of the signal is recorded as the noise frequency, and filtered, and the signal frequency within the frequency range of the signal is retained to achieve noise filtering of the simulation test data of the test group, and each type of data in the filtered data is taken as a set to obtain multiple data sets, and the data in each data set is graphically processed to obtain a data distribution curve, wherein the vertical axis of the coordinates of the curve is the numerical value of the data, and the horizontal axis is the acquisition time of the data; After obtaining the data distribution curve, the data correction unit analyzes the oscillation degree of the data distribution curve: The data correction unit obtains the highest point and the lowest point of the data distribution curve, and records the difference between the highest point and the lowest point as the curve amplitude ZF. The point in the data distribution curve is selected, and the difference between the selected point and the highest point and the lowest point is calculated, and recorded as the upper margin SF and the lower margin XF respectively. The fluctuation degree B is calculated by the formula. , the arithmetic average of the fluctuation degree of all points is obtained to obtain the curve oscillation value, which reflects the credibility of the data and limits the curve range by the curve oscillation value. The midpoint between the highest point and the lowest point of the distribution curve is taken as the data midpoint, and the X distance is extended to the upper and lower sides through the data midpoint. , the width after the extension of the X distance is recorded as the limited range, and the curve data within the limited range is recorded as applicable data, so as to optimize the applicable data according to the credibility of the initial data; Step 3: The deviation control unit obtains the constant group simulation test data through the data acquisition unit, compares the constant group simulation test data with the set numerical standard, calculates the ratio of each data item in the constant group simulation test data to the corresponding item in the set numerical standard, records the average value of the ratio as the constant group numerical difference, thereby obtaining the constant group numerical difference, and generates a test deviation according to the constant group numerical difference; Step 4: The data floating unit obtains the test deviation through the deviation control unit, and compares the test deviation with the set deviation upper limit. If the value difference of the constant group is greater than the set deviation upper limit, a data abnormality signal is generated, and the simulation test data is recorded as unavailable. If the value difference of the constant group is not greater than the set deviation upper limit, a data floating signal is generated, and the applicable data and the test deviation are combined for analysis. Specifically, the value difference of the constant group is first recorded as A, and then the applicable data is recorded as Y. The floating data on the upper and lower sides of the original data are obtained through Y×(1+A) and Y×(1-A); Step 5: The result output unit obtains application data through the data correction unit, analyzes the applicable data, analyzes the signal integrity, time domain characteristics and electromagnetic compatibility, and outputs a set of determined signal integrity, time domain characteristics and electromagnetic compatibility, and uses the accurate results as the expected real results, wherein the output method of the signal integrity includes the S parameter matrix, return loss and eye diagram, the output method of electromagnetic compatibility is the near field radiation value and crosstalk parameters, and the output method of the time domain characteristics is the time domain reflection waveform (TDR); Step six: The result output unit obtains the floating data through the data floating unit, corrects the available data according to the floating data Y×(1+A) and Y×(1-A), and generates two sets of signal integrity conditions, electromagnetic compatibility and time domain characteristics according to the corrected data. The range between the two sets of signal integrity conditions, the range between the two sets of electromagnetic compatibility and the two sets of time domain characteristics are used as the range where the real simulation test results may exist after removing interference, that is, the real result landing range. According to the output of the real result landing range, the fuzzy processed results can be presented to the user, which is convenient for the user to fully understand the degree of deviation and consequences of the simulation test results, thereby improving the comprehensiveness of the simulation test results.

[0019] Example 2: Please refer to Figure 1 - Figure 3 As shown, a high-speed I / O connector high-frequency simulation test data analysis system includes a test generation unit, a data acquisition unit, a data correction unit, a deviation control unit, a data floating unit and a result output unit; The test generation unit is used to select a simulation test tool, and perform simulation tests on the test group and the constant group through the simulation test tool; The data acquisition unit is used to collect data for the simulation test to obtain the test group simulation test data and the constant group simulation test data; The data correction unit performs noise filtering, credibility judgment and generation of applicable data on the test group simulation test data and the constant group simulation test data collected by the data collection unit; The deviation control unit is used to compare the constant group simulation test data with the set numerical standard, so as to obtain the test deviation contained in the simulation test system this time, and generate a data abnormality signal or a data floating signal for the test deviation; The data floating unit generates floating data according to the data floating signal; The result output unit is used to analyze and generate the signal integrity, time domain characteristics and electromagnetic compatibility obtained by the final analysis, and output the analysis results, wherein the output results include the expected real results and the possible landing point range of the real results.

[0020] The preferred embodiments of the present invention disclosed above are only used to help explain the present invention. The preferred embodiments do not describe all the details in detail, nor do they limit the invention to only specific implementation methods. Obviously, many modifications and changes can be made according to the content of this specification. This specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the present invention, so that those skilled in the art can understand and use the present invention well. The present invention is limited only by the claims and their full scope and equivalents.

Claims

1. A high-speed I / O connector high-frequency simulation test data analysis method, characterized in that: The following steps are involved: Step 1: Select a simulation test tool, set input parameters in the simulation test tool, generate a test group and a constant group, perform simulation testing through the simulation test tool, and obtain simulation test data of the test group and simulation test data of the constant group; Step 2: Filter the noise of the simulation test data of the test group, and make a credibility judgment on the filtered data, and perform corresponding processing according to the credibility judgment result to obtain applicable data; Step 3: Compare the constant group simulation test data with the set numerical standard to obtain the constant group numerical difference, and generate the test deviation according to the constant group numerical difference; Step 4: Compare the test deviation with the set upper limit of the deviation to obtain data anomaly signals or data floating signals, and combine the applicable data and the test deviation for analysis to generate floating data; Step 5: Analyze applicable data, including signal integrity, time domain characteristics, and electromagnetic compatibility; Step 6: Correct the available data according to the floating data to obtain the corrected signal integrity, electromagnetic compatibility and time domain characteristics.

2. A high-speed I / O connector high-frequency simulation test data analysis method according to claim 1, characterized in that: When filtering the noise in the step 2, the input signal frequency is obtained through the input parameters set in the step 1, and the frequency range of the signal is obtained by expanding the frequency of the input signal through the set range. After obtaining the simulation test data in the step 1, the signal frequency in the simulation test data is compared with the frequency range of the signal, and the signal frequency outside the frequency range of the signal is recorded as the noise frequency and filtered, and the signal frequency within the frequency range of the signal is retained.

3. A high-speed I / O connector high-frequency simulation test data analysis method according to claim 1, characterized in that: The method for judging the credibility of the filtered data in step 2 is: Each type of data in the filtered data is taken as a set to obtain multiple data sets, and the data in each data set is graphically processed to obtain a data distribution curve, wherein the vertical axis of the coordinates of the curve is the numerical value of the data, and the horizontal axis is the acquisition time of the data; After obtaining the data distribution curve, the oscillation degree of the data distribution curve is analyzed to obtain the curve oscillation value, and the curve range is limited by the curve oscillation value, and the curve data within the limited range is recorded as applicable data.

4. A high-speed I / O connector high-frequency simulation test data analysis method according to claim 3, characterized in that: The analysis method for the oscillation degree of the data distribution curve is: Get the highest point and the lowest point of the data distribution curve, and record the difference between the highest point and the lowest point as the curve amplitude ZF; select a point in the data distribution curve, calculate the difference between the selected point and the highest point and the lowest point, and record them as the upper margin SF and the lower margin XF respectively; calculate the fluctuation degree B by the formula; take the arithmetic average of the fluctuation degrees of all points to get the curve oscillation value.

5. A high-speed I / O connector high-frequency simulation test data analysis method according to claim 3, characterized in that: The method of limiting the curve range by the curve oscillation value is: The midpoint between the highest and lowest points of the distribution curve is taken as the data midpoint, and the distance extending upward and downward from the data midpoint is 0.5 times the product of the curve amplitude and the degree of fluctuation, and the extended width is recorded as the limited range.

6. A high-speed I / O connector high-frequency simulation test data analysis method according to claim 1, characterized in that: The method for obtaining the constant group value difference in step 3 is: Calculate the ratio of each item in the constant group simulation test data to the corresponding item in the set numerical standard, and record the average value of the ratio as the constant group numerical difference; The comparison method in step four is: if the difference in the constant group values ​​is greater than the set upper limit of the deviation, a data anomaly signal is generated, and the simulation test data is recorded as unavailable; if the difference in the constant group values ​​is not greater than the set upper limit of the deviation, a data floating signal is generated.

7. A high-speed I / O connector high-frequency simulation test data analysis method according to claim 1, characterized in that: The method for generating the data floating degree in step 4 is: record the constant group value difference as A, record the applicable data as Y, and obtain the floating data through Y×(1+A) and Y×(1-A); In the step six, the signal integrity, electromagnetic compatibility and time domain characteristics are calculated respectively by two sets of floating data, and the results between the two sets of signal integrity, electromagnetic compatibility and time domain characteristics are taken as the possible real result range, and the signal integrity, time domain characteristics and electromagnetic compatibility in step five are taken as the expected real results.

8. A high-speed I / O connector high-frequency simulation test data analysis system, used for a high-speed I / O connector high-frequency simulation test data analysis method as claimed in any one of claims 1 to 7, characterized in that: It includes a test generation unit, a data acquisition unit, a data correction unit, a deviation control unit, a data floating unit and a result output unit, wherein the test generation unit is used to perform the simulation test in step 1; The data acquisition unit is used to collect data for the simulation test in step 1 to obtain the test group simulation test data and the constant group simulation test data; The data correction unit is used to perform noise filtering, credibility judgment and generation of applicable data in step 2; The deviation control unit is used to generate the test deviation in step 3, and generate a data abnormality signal or a data floating signal for the test deviation; The data floating unit is used to generate the floating data in step 4; The result output unit is used to analyze and generate the signal integrity, time domain characteristics and electromagnetic compatibility in step five and step six, and output the analysis results.

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