Gauge structure

Abstract

The invention relates to a gauge structure. The testing fixture structure comprises a testing fixture bottom plate and a simulation block arranged on the testing fixture bottom plate, the surface of the simulation block forms a molded surface in zero clearance fit with a component to be tested, and a movable cushion block is arranged between the simulation block and the testing fixture bottom plate. The movable cushion block is provided with a first position inserted between the simulation block and the testing fixture bottom plate and a second position drawn out between the simulation block and the testing fixture bottom plate, when the movable cushion block is located at the first position, the simulation block is located at the abutting position, when the movable cushion block is located at the second position, the simulation block is located at the offset position, and a gap is formed between the molded surface and the component to be tested. According to the testing fixture structure provided by the invention, the movable cushion block is arranged between the simulation block and the testing fixture bottom plate, so that the gap measurement between the to-be-tested part and the opponent part in zero-clearance fit with the to-be-tested part can be realized in the abutting state and the offset state by utilizing one set of simulation block and pulling the movable cushion block; therefore, the surface profile tolerance of the to-be-measured component is measured, the simulation block does not need to be replaced, and operation is more convenient.

Description

Technical Field

[0001] The present disclosure relates to the technical field of component detection, and in particular to a detection fixture structure. Background Art

[0002] The role of door gauges in the vehicle production process cannot be ignored. It is an important link to ensure the quality of door and subsequent assembly. The frequent use of door gauges requires that the door gauges meet certain requirements in structure and manufacturing cost. At present, the gauge structure used to measure the gap between the door trim skirt and the sheet metal, as well as the surface contour of the door trim skirt, usually requires replacement of the simulation block in the sheet metal state and the simulation block in the sheet metal surface offset state of 3mm to achieve detection, that is, two sets of simulation blocks are needed to detect a door, and the two sets of simulation blocks need to be replaced, and the simulation blocks are heavy, making replacement very inconvenient. Summary of the invention

[0003] In order to solve the above technical problems, the present disclosure provides a gauge structure.

[0004] The present disclosure provides a gauge structure, comprising a gauge bottom plate and a simulation block arranged on the gauge bottom plate, wherein a surface of the simulation block is configured to be a profile that matches a component to be measured with zero clearance, a movable pad is arranged between the simulation block and the gauge bottom plate, the movable pad has a first position of being inserted between the simulation block and the gauge bottom plate, and a second position of being withdrawn from between the simulation block and the gauge bottom plate, when the movable pad is in the first position, the simulation block is in an abutting position, and the profile abuts against the component to be measured when the simulation block is in the abutting position, and when the movable pad is in the second position, the simulation block is in an offset position, and a gap is formed between the profile and the component to be measured when the simulation block is in the offset position.

[0005] Optionally, the simulation block includes a plurality of simulation sub-blocks sequentially arranged along the periphery of the component to be tested, surfaces of the plurality of simulation sub-blocks are jointly configured to form the profile, and the number of the movable pads is multiple and they are arranged one-to-one between the plurality of simulation sub-blocks and the bottom plate of the gauge.

[0006] Optionally, a mounting hole is provided on the simulation sub-block, a first fixing hole is correspondingly provided on the movable pad block, and a first limiting hole is correspondingly provided on the inspection fixture base plate. The simulation sub-block is fixed to the movable pad block and the inspection fixture base plate by a first fastener penetrating through the mounting hole, the first fixing hole and the first limiting hole.

[0007] Optionally, an avoidance notch is formed on the side wall of the first fixing hole, and the avoidance notch is located at the front end of the movable pad along the insertion direction. When the movable pad moves along the insertion or withdrawal direction, the side of the first fastener enters or escapes from the first fixing hole through the avoidance notch.

[0008] Optionally, a second fixing hole is provided on the movable cushion block, and a second limiting hole is provided on the gauge bottom plate, and the movable cushion block is fixed to the gauge bottom plate by a second fastener penetrating through the second fixing hole and the second limiting hole.

[0009] Optionally, the second fixing hole is an elongated through hole extending along the insertion or withdrawal direction of the movable cushion block, so that the movable cushion block can move relative to the second fastener along the insertion or withdrawal direction.

[0010] Optionally, it further comprises a go / no-go gauge, wherein the go / no-go gauge is used to measure the gap between the component to be tested and the profile surface of the simulation block when the movable cushion block is in the second position;

[0011] The go / no-go gauge has a first end and a second end, wherein the diameter of the first end and the diameter of the second end are both set according to the thickness of the movable pad, wherein the first end is a thick end and its diameter is larger than the thickness of the movable pad, and the second end is a thin end and its diameter is smaller than the thickness of the movable pad.

[0012] Optionally, a feeler gauge is further included, wherein the feeler gauge is used to measure the gap between the component to be tested and the profile of the simulation block when the movable cushion block is in the first position, and the feeler gauge includes a plurality of feeler pieces with different thicknesses.

[0013] Optionally, a fixed pad is further provided between the simulation block and the bottom plate of the gauge, and the fixed pad is provided between the movable pad and the bottom plate of the gauge.

[0014] Optionally, a handle is provided on the movable cushion block, and the handle is arranged at the rear end portion of the movable cushion block along the insertion direction and is fixedly connected to the movable cushion block.

[0015] Compared with the prior art, the technical solution provided by the present invention has the following advantages:

[0016] The inspection tool structure provided by the present disclosure comprises an inspection tool base plate and a simulation block arranged on the inspection tool base plate, the inspection tool base plate is used to support and fix the simulation block, the surface of the simulation block is constructed into a profile that matches with the component to be measured with zero clearance, that is, the simulation block is used to simulate the counterpart that matches with the component to be measured with zero clearance, the profile formed by the surface of the simulation block is used to simulate the surface of the counterpart that matches with the component to be measured with zero clearance, a movable pad is arranged between the simulation block and the inspection tool base plate, the movable pad has a first position of being inserted between the simulation block and the inspection tool base plate, and a second position of being withdrawn from between the simulation block and the inspection tool base plate, when the movable pad is in the first position, the simulation block is in an abutting position, and when the movable pad is in the second position, the simulation block is in an offset position, and the profile abuts with the component to be measured when the movable pad is in the first position, that is, when the simulation block is in the abutting position, that is, when the movable pad is in the first position, that is, when the simulation block is in the abutting position, the simulation block The profile of the simulation block can abut against the part to be measured, that is, there is a zero-gap fit between the part to be measured and the profile of the simulation block. A gap is formed between the profile and the part to be measured when the movable pad is in the second position, that is, the simulation block is in the offset position. That is to say, when the movable pad is pulled out and placed in the second position, that is, the simulation block is in the offset position, a certain gap is formed between the profile of the simulation block and the part to be measured. By measuring this gap, the surface contour of the part to be measured can be obtained, so as to judge whether the zero-gap fit between the part to be measured and the profile of the simulation block meets the requirements. With such an arrangement, a set of simulation blocks can be used to measure the gap between the part to be measured and the counterpart with zero gap therewith in the abutment and offset states by pulling out the movable pad. In this way, the surface contour measurement of the part to be measured is realized. There is no need to replace the simulation block, and the operation is more convenient. The cost and weight of the gauge structure can be reduced, and the development cycle of the gauge structure can be reduced. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and, together with the description, serve to explain the principles of the present disclosure.

[0018] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0019] Figure 1 It is a schematic diagram of the installation of the inspection fixture structure and the component to be tested when the movable cushion block is in the first position according to one embodiment of the present invention;

[0020] Figure 2 for Figure 1 Sectional view along AA direction;

[0021] Figure 3It is a schematic diagram of the installation of the inspection fixture structure and the component to be tested when the movable cushion block is in the second position according to one embodiment of the present invention;

[0022] Figure 4 for Figure 3 Cross-sectional view along the BB direction;

[0023] Figure 5 The figure is a schematic structural diagram of a movable cushion block according to an embodiment of the present invention.

[0024] Reference numerals:

[0025] 1. Inspection fixture bottom plate; 11. First limiting hole; 12. Second limiting hole; 2. Simulation sub-block; 21. Mounting hole; 3. Movable pad; 31. First fixing hole; 311. Avoidance gap; 32. Second fixing hole; 33. Handle; 4. Fixing pad; 5. First fastener; 6. Second fastener; 7. Fixing part; 8. Part to be tested. DETAILED DESCRIPTION

[0026] In order to more clearly understand the above-mentioned objectives, features and advantages of the present disclosure, the scheme of the present disclosure will be further described below. It should be noted that the embodiments of the present disclosure and the features in the embodiments can be combined with each other without conflict.

[0027] In the following description, many specific details are set forth to facilitate a full understanding of the present disclosure, but the present disclosure may also be implemented in other ways different from those described herein; it is obvious that the embodiments in the specification are only part of the embodiments of the present disclosure, rather than all of the embodiments.

[0028] The structure of the inspection tool disclosed in the present invention is described in detail below through specific embodiments:

[0029] Reference Figures 1 to 5 As shown, a gauge structure provided by an embodiment of the present invention includes a gauge base plate 1 and a simulation block arranged on the gauge base plate 1, the gauge base plate 1 is used to support and fix the simulation block, the surface of the simulation block is constructed into a profile that matches the component to be tested 8 with zero clearance, that is, the simulation block is used to simulate the counterpart that matches the component to be tested 8 with zero clearance, and the profile formed by the surface of the simulation block is used to simulate the surface of the counterpart that matches the component to be tested 8 with zero clearance.

[0030] A movable pad block 3 is arranged between the simulation block and the gauge bottom plate 1. The movable pad block 3 has a first position of being inserted between the simulation block and the gauge bottom plate 1, and a second position of being pulled out from between the simulation block and the gauge bottom plate 1. When the movable pad block 3 is in the first position, the simulation block is in abutting position, and the profile abuts against the component to be measured 8 when the simulation block is in the abutting position. When the movable pad block 3 is in the second position, the simulation block is in an offset position, and a gap is formed between the profile and the component to be measured 8 when the simulation block is in the offset position.

[0031] Specifically, when the movable pad block 3 is in the first position, that is, the simulation block is in the abutting position, the profile of the simulation block can abut against the component to be measured 8, that is, there is a zero-gap fit between the profile of the component to be measured 8 and the profile of the simulation block. When the movable pad block 3 is pulled out and placed in the second position, that is, the simulation block is in the offset position, a certain gap can be formed between the profile of the simulation block and the component to be measured 8. By measuring this gap, the surface contour of the component to be measured 8 can be obtained, so as to judge whether the zero-gap fit between the profile of the component to be measured and the profile of the simulation block meets the requirements. With such an arrangement, a set of simulation blocks can be used to realize the gap measurement between the component to be measured 8 and the counterpart with zero gap therewith in the abutting and offset states by pulling out the movable pad block 3, so as to realize the surface contour measurement of the component to be measured 8, without replacing the simulation block, and the operation is more convenient, which can reduce the cost and weight of the gauge structure and reduce the development cycle of the gauge structure.

[0032] It should be noted that the inspection fixture structure provided by the present disclosure can be applied to the detection process of the surface profile of all the components to be tested 8 with zero clearance to the counterpart, referring to Figure 1 and Figure 3 As shown, in a specific embodiment, the component to be tested 8 is a skirt structure of a door trim, the counterpart that matches the skirt structure with zero clearance is a door sheet metal structure, the door trim is fixed to the inspection fixture bottom plate 1 by a fixing portion 7, and the skirt structure is arranged in contact with the simulation block.

[0033] Specifically, the simulation block includes a plurality of simulation sub-blocks 2 sequentially arranged along the periphery of the component to be tested 8, the surfaces of the plurality of simulation sub-blocks 2 jointly construct a molding surface, and the number of movable pads 3 is plural and they are arranged one by one between the plurality of simulation sub-blocks 2 and the bottom plate 1 of the gauge. The plurality of movable pads 3 can all have a first position inserted between the simulation sub-block 2 and the gauge base plate 1, and a second position pulled out from between the simulation sub-block 2 and the gauge base plate 1. The plurality of simulation sub-blocks 2 can all have an abutting position when the movable pads 3 are in the first position and an offset position when the movable pads 3 are in the second position. When the plurality of movable pads 3 are all in the first position, the plurality of simulation sub-blocks 2 are all in the abutting position, that is, the profile formed by the surfaces of the plurality of simulation sub-blocks 2 abuts against the component 8 to be measured, that is, the profile formed by the surfaces of the plurality of simulation sub-blocks 2 abuts against the skirt structure of the door trim; when the plurality of movable pads 3 are all pulled out and are in the second position, the plurality of simulation sub-blocks 2 are all in the offset position, and a gap is formed between the profile and the component 8 to be measured. By measuring the gap, the surface profile measurement of the component 8 to be measured can be achieved.

[0034] It should be noted that the simulation block is not limited to including a plurality of independently arranged simulation sub-blocks 2, and the simulation block may also be an annular simulation block continuously arranged along the periphery of the component to be measured 8, and the surface of the annular simulation block is configured to be a profile that matches the component to be measured 8 with zero clearance. With such a configuration, the clearance measurement between the component to be measured 8 and the counterpart that matches with zero clearance therewith in both abutment and offset states can also be achieved through the inspection fixture structure.

[0035] In some embodiments, reference Figure 2 and Figure 4 As shown, the simulation sub-block 2 is provided with a mounting hole 21, the movable cushion block 3 is correspondingly provided with a first fixing hole 31, and the inspection tool base plate 1 is correspondingly provided with a first limiting hole 11. The simulation sub-block 2 is fixed to the movable cushion block 3 and the inspection tool base plate 1 by a first fastener 5 penetrating through the mounting hole 21, the first fixing hole 31 and the first limiting hole 11. It can be understood that the mounting hole 21 and the first fixing hole 31 are through holes that penetrate the simulation sub-block 2 and the movable cushion block 3, and the first limiting hole 11 can be a threaded hole, so the first fastener 5 can pass through the mounting hole 21 and the first fixing hole 31 and be threadedly fixed in the first limiting hole 11, thereby fixing the movable cushion block 3 between the simulation sub-block 2 and the inspection tool base plate 1.

[0036] It should be noted that if Figure 1 The cross-sectional views at the multiple positions 'a' arranged along the periphery of the component to be tested 8 shown in FIG. Figure 2 ,like Figure 3 The cross-sectional views at the multiple positions 'b' arranged along the periphery of the component to be tested 8 shown in FIG. Figure 4 However, the surfaces of the simulation sub-blocks 2 at the multiple 'a' or 'b' positions are different, so as to jointly construct a profile that matches the component to be tested 8 with zero clearance.

[0037] Reference Figure 5 As shown, an avoidance notch 311 is formed on the side wall of the first fixing hole 31, and the avoidance notch 311 is located at the front end of the movable pad 3 along the insertion direction. When the movable pad 3 moves along the insertion or extraction direction, the side of the first fastener 5 enters or escapes from the first fixing hole 31 through the avoidance notch 311. In other words, the movable pad 3 can move relative to the gauge base plate 1 along the insertion or extraction direction. During the insertion or extraction process, the movable pad 3 can avoid the position of the first fastener 5 through the avoidance notch 311, and the movable pad 3 can be inserted between the simulation sub-block 2 and the gauge base plate 1, or pulled out from the simulation sub-block 2 and the gauge base plate 1, without completely removing the simulation sub-block 2 from the gauge base plate 1, so that the movable pad 3 is easy to disassemble and operate.

[0038] Further, refer to Figure 5As shown, the movable pad 3 is provided with a second fixing hole 32, and the gauge bottom plate 1 is provided with a second limiting hole 12. The movable pad 3 is fixed to the gauge bottom plate 1 by a second fastener 6 penetrating the second fixing hole 32 and the second limiting hole 12. It can be understood that the second fixing hole 32 is a through hole that passes through the simulation sub-block 2 and the movable pad 3, and the second limiting hole 12 can be a threaded hole, so the second fastener 6 can pass through the second fixing hole 32 and be threadedly fixed in the second limiting hole 12, thereby fixing the movable pad 3 between the simulation sub-block 2 and the gauge bottom plate 1, and further increasing the fixing strength of the movable pad 3.

[0039] In a specific implementation, the second fixing hole 32 is a long strip through hole extending along the insertion or extraction direction of the movable cushion block 3, so that the movable cushion block 3 can move relative to the second fastener 6 along the insertion or extraction direction. Figure 5 As shown, the number of the second fasteners 6 is two, and both of the second fasteners 6 can be inserted into the second fixing hole 32, and the length of the second fixing hole 32 is at least greater than the distance between the two second fasteners 6, so that the two second fasteners 6 will not affect the movement of the movable cushion block 3 relative to the second fasteners 6. It should be noted that the number of the second fasteners 6 can also be single or multiple, and the present disclosure does not limit this, as long as the fixation of the movable cushion block 3 on the bottom plate 1 of the gauge can be strengthened.

[0040] In some embodiments, the thickness of the movable pad 3 is greater than or equal to 3 mm and less than or equal to 5 mm. Specifically, when measuring the surface profile of the skirt structure of the door trim, the thickness of the movable pad 3 is x, wherein the value range of the thickness x is between 3 mm and 5 mm. It can be understood that due to the influence of various factors such as processing or assembly, the zero clearance fit between the part to be tested 8 and the profile of the simulation block is not a true zero clearance, but has a certain clearance at some positions, the clearance at some positions is zero, or the clearance becomes zero after elastic deformation of other positions. Therefore, after the movable pad 3 is pulled out, the position where the elastic deformation occurs should be completely released to measure the surface profile of the part to be tested 8 by measuring the clearance between the profile of the part to be tested 8 and the simulation block. Therefore, it is limited that the thickness of the movable pad 3 of the present disclosure should be greater than or equal to 3 mm, but for the convenience of extraction, the thickness of the movable pad 3 should not be too large, so the thickness of the movable pad 3 is set to be less than or equal to 5 mm to reduce weight and facilitate measurement.

[0041] When implementing it, refer to Figure 4As shown, the inspection fixture structure provided by the present invention also includes a go / no-go gauge, which is used to measure the gap d2 between the part to be measured 8 and the profile of the simulation block when the movable pad 3 is in the second position, that is, the multiple simulation sub-blocks 2 are in the offset position. The go / no-go gauge has a first end and a second end, and the diameter of the first end and the diameter of the second end are both set according to the thickness of the movable pad 3, wherein the first end is a thick end and the diameter is larger than the thickness of the movable pad 3, and the second end is a thin end and the diameter is smaller than the thickness of the movable pad 3.

[0042] Exemplarily, the first end is a thick end and its diameter is 0.5mm to 1.0mm larger than the thickness of the movable cushion block 3, and the second end is a thin end and its diameter is 0.5mm to 1.0mm smaller than the thickness of the movable cushion block 3. In other words, the diameter of the first end is x+y, and the diameter of the second end is xy, wherein x is the thickness of the movable cushion block 3, and the value range of y is between 0.5mm and 1.0mm, that is, y is greater than or equal to 0.5mm and less than or equal to 1.0mm.

[0043] Of course, the thickness of the movable cushion block 3 and the diameters of the first end and the second end of the go / no-go gauge are not limited to the above specific limitations and can be reasonably set according to actual needs.

[0044] It should be noted that when the multiple movable pads 3 are all in the first position, the multiple simulation sub-blocks 2 are all in the abutment position, that is, the surfaces of the components to be tested 8 and the simulation blocks at the multiple 'a' positions are all zero-gap fits, the components to be tested 8 will undergo elastic deformation, and excessive stress after deformation will cause adverse effects. Therefore, after the movable pads 3 are pulled out, the gaps between the components to be tested 8 and the surfaces of the simulation blocks at the multiple 'a' positions are different.

[0045] In a specific embodiment, a movable pad 3 with a thickness x of 3 mm is set at the bottom of the simulation sub-block 2. When the value of y is 0.75 mm, that is, the gap d2 is 3±0.75 mm, it is considered that the surface profile of the component to be tested 8 meets the standard, that is, the gap between the component to be tested 8 and the profile of the simulation block is between 2.25 mm and 3.75 mm, and the component to be tested 8 meets the standard. Specifically, the gap between the component to be tested 8 and the profile of the simulation block can be measured with a go-no-go gauge with a thin end diameter of 2.25 mm and a thick end diameter of 3.75 mm. It can be understood that the value of y can be specifically designed according to actual production requirements. In the process of measuring the surface profile of the skirt structure of the door trim, when the value range of y is between 0.5 mm and 1.0 mm, it can be considered that the surface profile of the skirt structure meets the requirements.

[0046] Of course, it should be noted that in the process of detecting the surface contour of other components to be tested 8 with zero clearance with the opponent, the thickness of the movable pad 3 and the diameters of the thick and thin ends of the go and no-go gauge disclosed in the present invention can be determined according to actual measurement requirements, and the present disclosure does not limit this.

[0047] Further, refer to Figure 2 As shown, the gauge structure provided by the present disclosure also includes a feeler gauge, which is used to measure the gap d1 between the part to be measured 8 and the profile of the simulation block when the movable cushion block 3 is in the first position, that is, the multiple simulation sub-blocks 2 are all in the abutment position, and the feeler gauge includes a plurality of plug pieces with different thicknesses, so as to form a plurality of feeler gauges with different thicknesses by combining the plurality of plug pieces with different thicknesses.

[0048] Exemplarily, the minimum thickness difference of each plug piece is 0.01mm, and multiple plug pieces can be combined to form any thickness between 0.01mm and 0.30mm with an accuracy of 0.01mm. It should be noted that when multiple active pads 3 are all in the first position, that is, multiple simulation sub-blocks 2 are all in the abutment position, the gap between the tested component 8 and the profile of the simulation block is within 0.3mm, that is, d1 is within 0.3mm, then it is determined that the profile of the tested component 8 and the simulation block is zero-gap fit, and then the active pads 3 are pulled out to facilitate the subsequent gap measurement.

[0049] Of course, the thickness rules of the multiple plug pieces included in the feeler gauge, and the thickness of the feeler gauge formed by combining the multiple plug pieces, are not limited to the above specific limitations and can be reasonably set according to actual needs.

[0050] In some embodiments, a fixed pad 4 is further provided between the simulation block and the gauge bottom plate 1, and the fixed pad 4 is provided between the movable pad 3 and the gauge bottom plate 1. It is understood that through holes are provided on the fixed pad 4 at positions corresponding to the first fixing hole 31 and the second fixing hole 32, and the first fastener 5 and the second fastener 6 can pass through the corresponding through holes to fix the fixed pad 4 between the movable pad 3 and the gauge bottom plate 1.

[0051] Reference Figure 2 and Figure 4 As shown, a handle 33 is provided on the movable cushion block 3, and the handle 33 is provided at the rear end of the movable cushion block 3 along the insertion direction and is fixedly connected to the movable cushion block 3. The movable cushion block 3 is driven to switch between the first position and the second position by the handle 33, which is convenient for operation. Specifically, the handle 33 can be provided on the movable cushion block 3 by screwing, welding, magnetic attraction, etc., and the present disclosure does not limit this, as long as the movable cushion block 3 can be driven to move by the handle 33.

[0052] It should be noted that, in this article, relational terms such as "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the term "comprises" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0053] The above description is only a specific embodiment of the present disclosure, so that those skilled in the art can understand or implement the present disclosure. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present disclosure. Therefore, the present disclosure will not be limited to the embodiments described herein, but will conform to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A gauge structure, characterized in that: It includes a gauge bottom plate and a simulation block arranged on the gauge bottom plate, the surface of the simulation block is configured to be a profile that matches the component to be tested with zero clearance, and a movable cushion block is arranged between the simulation block and the gauge bottom plate; The movable pad has a first position inserted between the simulation block and the bottom plate of the gauge, and a second position pulled out from between the simulation block and the bottom plate of the gauge. When the movable pad is in the first position, the simulation block is in abutting position, and the profile abuts against the component to be measured when the simulation block is in the abutting position. When the movable pad is in the second position, the simulation block is in an offset position, and a gap is formed between the profile and the component to be measured when the simulation block is in the offset position.

2. The gauge structure according to claim 1, characterized in that: The simulation block includes a plurality of simulation sub-blocks sequentially arranged along the periphery of the component to be tested, the surfaces of the plurality of simulation sub-blocks are jointly configured to form the profile, and the movable pads are multiple in number and are arranged one-to-one between the plurality of simulation sub-blocks and the bottom plate of the gauge.

3. The gauge structure according to claim 2, characterized in that: The simulation sub-block is provided with a mounting hole, the movable cushion block is correspondingly provided with a first fixing hole, and the inspection tool bottom plate is correspondingly provided with a first limiting hole. The simulation sub-block is fixed to the movable cushion block and the inspection tool bottom plate by a first fastener penetrating the mounting hole, the first fixing hole and the first limiting hole.

4. The gauge structure according to claim 3, characterized in that: An avoidance notch is formed on the side wall of the first fixing hole, and the avoidance notch is located at the front end of the movable pad along the insertion direction. When the movable pad moves along the insertion or withdrawal direction, the side of the first fastener enters or escapes from the first fixing hole through the avoidance notch.

5. The inspection fixture structure according to claim 3, characterized in that: The movable cushion block is provided with a second fixing hole, and the gauge bottom plate is provided with a second limiting hole. The movable cushion block is fixed to the gauge bottom plate by a second fastener penetrating through the second fixing hole and the second limiting hole.

6. The gauge structure according to claim 5, characterized in that: The second fixing hole is a long strip through hole extending along the insertion or withdrawal direction of the movable cushion block, so that the movable cushion block can move relative to the second fastener along the insertion or withdrawal direction.

7. The gauge structure according to any one of claims 1 to 6, characterized in that: Also included is a go / no-go gauge, the go / no-go gauge is used to measure the gap between the component to be tested and the profile surface of the simulation block when the movable cushion block is in the second position; The go / no-go gauge has a first end and a second end, wherein the diameter of the first end and the diameter of the second end are both set according to the thickness of the movable pad, wherein the first end is a thick end and its diameter is larger than the thickness of the movable pad, and the second end is a thin end and its diameter is smaller than the thickness of the movable pad.

8. The gauge structure according to any one of claims 1 to 6, characterized in that: It also includes a feeler gauge, which is used to measure the gap between the component to be tested and the profile of the simulation block when the movable cushion block is in the first position, and the feeler gauge includes a plurality of plugs with different thicknesses.

9. The gauge structure according to any one of claims 1 to 6, characterized in that: A fixed cushion block is further arranged between the simulation block and the bottom plate of the gauge, and the fixed cushion block is arranged between the movable cushion block and the bottom plate of the gauge.

10. The gauge structure according to any one of claims 1 to 6, characterized in that: The movable cushion block is provided with a handle, and the handle is arranged at the rear end of the movable cushion block along the insertion direction and is fixedly connected to the movable cushion block.

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