Product testing method and device, storage medium and electronic equipment

Abstract

The invention provides a product testing method and device, a storage medium and electronic equipment, and the method comprises the steps: obtaining the information of a to-be-tested product; acquiring test parameters for performing quality test on the to-be-tested product; and if it is determined that the quality of the to-be-tested product meets the factory parameter requirements based on a comparison result of the test parameters and the factory parameter requirements, determining the exceeding amplitude of the test parameters compared with the factory parameter requirements. According to the method provided by the embodiment of the invention, the problem that the test result of the factory test is not accurate enough can be solved.

Description

Technical Field

[0001] The technical solution disclosed herein relates to the field of product testing technology, and in particular to a product testing method, device, storage medium and electronic device. Background Art

[0002] In the prior art, after a batch of products is produced, the quality of the batch of products is tested (e.g., sampling test). If the test parameters meet the factory parameter requirements, the quality of the entire batch of products is deemed qualified, and the qualified products are then sold.

[0003] Generally speaking, there may be false detections and missed detections in factory tests, so products that pass factory tests may still have quality problems, which will reduce the user experience.

[0004] Therefore, a method is needed to solve the problem that the test results of factory tests are not accurate enough. Summary of the invention

[0005] In view of this, the present disclosure provides a product testing method, device, storage medium and electronic device to solve the problem that the test results of factory tests are not accurate enough.

[0006] According to a first aspect of an embodiment of the present disclosure, a product testing method is provided, the method comprising:

[0007] Acquire information of the product to be tested; the product to be tested is a product that has been tested at the factory and meets the factory parameter requirements;

[0008] Acquire test parameters for performing a quality test on the product to be tested, wherein the quality test is at least partially different from the factory test;

[0009] If it is determined based on the comparison result of the test parameter with the factory parameter requirement that the quality of the product to be tested meets the factory parameter requirement, then the extent to which the test parameter exceeds the factory parameter requirement is determined.

[0010] According to a second aspect of an embodiment of the present disclosure, there is provided a product testing device, the device comprising:

[0011] The first acquisition module is used to acquire information of the product to be tested; the product to be tested is a product that meets the factory parameter requirements after factory testing;

[0012] A second acquisition module is used to acquire test parameters for performing a quality test on the product to be tested, wherein the quality test is at least partially different from the factory test;

[0013] The amplitude determination module is used to determine the amplitude by which the test parameter exceeds the factory parameter requirement if it is determined based on the comparison result of the test parameter with the factory parameter requirement that the quality of the product to be tested meets the factory parameter requirement.

[0014] According to a third aspect of an embodiment of the present disclosure, there is provided an electronic device, including:

[0015] processor;

[0016] a memory for storing processor-executable instructions;

[0017] Wherein, the processor is configured to implement the steps of any product testing method described in the first aspect by running the executable instructions.

[0018] According to a fourth aspect of an embodiment of the present disclosure, there is provided a non-temporary computer-readable storage medium on which a computer program is stored, and when the program is executed by a processor, the steps of any product testing method described in the first aspect are implemented.

[0019] The technical solution provided by the embodiments of the present disclosure may have the following beneficial effects:

[0020] Quality testing is performed on the products to be tested (products with qualified quality) that have met the factory parameter requirements to obtain test parameters.

[0021] Since there are at least some differences between quality testing and factory testing, different testing schemes can be used to re-verify whether the product to be tested meets the factory parameter requirements.

[0022] In this way, by re-testing the products of the same batch and the same specifications, it is helpful to reduce the problems of missed detection and wrong detection in factory testing. Especially when the factory test is a sampling test, the solution of re-testing the quality can help increase the coverage of the tested products and reduce the situation of selling unqualified products to consumers.

[0023] Furthermore, when it is determined that the test parameters of the quality test meet the factory parameter requirements, the degree to which the test parameters exceed the factory parameter requirements can be obtained by comparing the test parameters with the factory parameter requirements, thereby intuitively understanding the excellent quality performance of the product to be tested of this specification through the degree of excess.

[0024] It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present disclosure. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and, together with the description, serve to explain the principles of the present disclosure.

[0026] Figure 1 is a flow chart of a product testing method according to an exemplary embodiment of the present disclosure;

[0027] Figure 2 is a structural schematic diagram of a product testing device according to an exemplary embodiment of the present disclosure;

[0028] Figure 3 It is a schematic structural diagram of an electronic device according to an exemplary embodiment of the present disclosure. DETAILED DESCRIPTION

[0029] Exemplary embodiments will be described in detail herein, examples of which are shown in the accompanying drawings. When the following description refers to the drawings, the same numbers in different drawings represent the same or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present disclosure. Instead, they are merely examples of devices and methods consistent with some aspects of the present disclosure as detailed in the appended claims.

[0030] The terms used in this disclosure are for the purpose of describing specific embodiments only and are not intended to limit the disclosure. The singular forms of "a", "said" and "the" used in this disclosure and the appended claims are also intended to include plural forms unless the context clearly indicates otherwise. It should also be understood that the term "and / or" used herein refers to and includes any or all possible combinations of one or more associated listed items.

[0031] It should be understood that although the terms first, second, third, etc. may be used in the present disclosure to describe various information, such information should not be limited to these terms. These terms are only used to distinguish the same type of information from each other. For example, without departing from the scope of the present disclosure, the first information may also be referred to as the second information, and similarly, the second information may also be referred to as the first information. Depending on the context, the word "if" as used herein may be interpreted as "at the time of" or "when" or "in response to determining".

[0032] In the prior art, after a batch of products is produced, the quality of the batch of products is tested (e.g., sampling test). If the test parameters meet the factory parameter requirements, the quality of the entire batch of products is deemed qualified, and the qualified products are then sold.

[0033] However, there may be false detections and missed detections during the factory testing process, especially when the factory testing is a sampling test, only a small number of products will be sampled, and then the entire batch of products will be deemed to be of qualified quality based on the test parameters of the sampling test.

[0034] Therefore, products that are deemed to be of qualified quality by factory testing may still have quality problems, which will reduce the user experience.

[0035] In order to solve the above problems, the present disclosure first obtains information about products (products to be tested) that meet the factory parameter requirements after factory testing, so as to perform quality testing on the products to be tested. Since quality testing and factory testing are partially different (different testing methods are used, such as a more stringent test environment for quality testing, more targeted test procedures or test items, etc.), by comparing the test parameters obtained from the quality test with the factory parameter requirements, the products to be tested can be reviewed, thereby reducing the situation where many products with qualified factory quality still have quality problems due to false detection and missed detection in factory testing.

[0036] Furthermore, by determining the extent to which the test parameters exceed the factory parameter requirements, the outstanding performance of the product to be tested in terms of quality can be intuitively understood.

[0037] The following is a detailed description:

[0038] Figure 1 is a flow chart of a product testing method according to an exemplary embodiment of the present disclosure. Figure 1 As shown, the method comprises the following steps:

[0039] Step 101, obtaining information of a product to be tested; the product to be tested is a product that has been tested in the factory and meets factory parameter requirements.

[0040] The information of the product to be tested includes, but is not limited to: product specifications, product number (or identification), product test information (such as whether it has been tested, test data, etc.), product location data, etc. This disclosure is mainly introduced by taking the product to be tested as a charging device as an example. In this disclosure, a charging device generally refers to a portable charging device, which includes a battery or a battery pack, and can store the power input into the battery of the charging device and output it to other devices to be charged. Exemplarily, the charging device includes, but is not limited to: a mobile power supply, a power bank, or a terminal device. Among them, when charging a laptop, a mobile phone, or a tablet computer, in addition to its own use, it can also be regarded as a charging device when it can charge other devices.

[0041] The factory parameter requirements are preset, and their specific parameters can be set according to user needs. The factory parameter requirements are usually set to the minimum quality standard that allows the product to pass the factory. For example, when the product to be tested is a charging device, the factory parameter requirements can be set as: the conversion efficiency reaches 60% (charging capacity is 1000 coulombs, and discharging capacity is 600 coulombs). At this time, if the charging device wants to pass the factory, the conversion efficiency of the charging device needs to be greater than or equal to 60% (for example, 60%, 70%, 83%, etc.), otherwise it will be deemed unqualified.

[0042] That is, the obtained products to be tested (one or more products of the same specification in a batch) are products that have been factory tested and certified as having qualified quality (meeting factory parameter requirements).

[0043] Step 102: acquiring test parameters for performing a quality test on the product to be tested, wherein the quality test is at least partially different from the factory test.

[0044] The present disclosure takes the case where the product to be tested is a charging device as an example. When the product to be tested is a charging device (a single charging device or a group of charging devices that performs charging and discharging, such as a portable mobile power source), the test items of the quality test include at least one of the following:

[0045] Effective output power test, conversion efficiency test, high temperature exposure test, vibration test, free fall test.

[0046] Among them, the effective output capacity, also known as battery capacity (or effective output capacity), is one of the important performance indicators to measure the performance of charging equipment. It indicates the amount of electricity discharged by the charging equipment under certain conditions (discharge rate, temperature, termination voltage, etc.). That is, the capacity of the charging equipment (battery), usually in ampere-hours (abbreviated as A·H), 1A·H = 3600c (coulomb).

[0047] The effective output power test is a test item that places the charging device in different temperature environments to test its effective output power, thereby measuring the discharge performance of the charging device in different temperature environments.

[0048] Conversion efficiency refers to the percentage between the actual output discharge power of the charging device after it is fully charged and the rated output power, which can be calculated according to the following formula (Formula 1):

[0049]

[0050] Among them, η is the conversion efficiency, E1 is the actual output discharge power (also known as effective output power, effective output capacity), and E0 is the rated output power (rated output capacity).

[0051] The high temperature exposure test is used to test the high temperature discharge test parameters of the charging device when it is in a high temperature environment for a long time (such as a first preset time), so as to effectively measure the quality of the charging device after long-term exposure to the sun.

[0052] The vibration test is used to test the charging and discharging conditions of the charging device after it has been vibrated a certain number of times in a specific manner (for example, the product to be tested is fastened to a vibration test bench and a sinusoidal vibration test is performed in the X, Y, and Z directions).

[0053] Free drop test: After the product to be tested is fully charged, it is dropped freely from a specific height to test its quality. For example, it is dropped freely from a height of 1m and 1.5m onto a concrete slab, and after it is dropped freely several times in each of the positive and negative directions of X, Y, and Z (a total of 6 directions), the open circuit voltage is measured to obtain the quality of the product to be tested under free drop conditions.

[0054] Among them, there are at least some differences in the test methods, test environments or test processes between quality testing and factory testing. For example, the environment requirements for quality testing are more stringent and more accurate than those for factory testing (temperature control is more precise, charge and discharge current is more accurate, and there are fewer other interference factors, etc.).

[0055] Step 103: If it is determined based on the comparison result between the test parameter and the factory parameter requirement that the quality of the product to be tested meets the factory parameter requirement, then the extent to which the test parameter exceeds the factory parameter requirement is determined.

[0056] Assume that the factory parameter requirement is set to: conversion efficiency is 60%. And the test value corresponding to the test parameter of the quality test is 80%, then the comparison result can be:

[0057] The test value of the quality test (80%) ≥ the preset value required in the factory parameter requirements (60%).

[0058] Then, based on the comparison result, it can be determined that the quality of the product to be tested meets the factory parameter requirements. At this time, the excess range can be additionally determined, where the excess range can be a specific value or a corresponding level.

[0059] Exemplarily, when the excess is a specific value, the excess may be: 20% (80%-60%).

[0060] When the excess is the level corresponding to this test parameter, the excess can be: three stars; and the level corresponding to the preset value in the factory parameter requirements is one star, and it is pre-specified that: the smaller the star, the worse the quality, so the quality level of one star is lower than the quality level of three stars.

[0061] Optionally, executing step 102 to obtain test parameters for performing quality test on the product to be tested includes the following steps:

[0062] At least two groups of test parameters are obtained by performing at least two test items.

[0063] At this time, multiple test items (such as effective output power test and high temperature exposure test) may be tested, so multiple groups of test parameters will be obtained. Each test item corresponds to a group of test parameters, and at least two groups of test parameters are obtained.

[0064] After obtaining at least two sets of test parameters, the method further comprises the following steps:

[0065] Based on the weights pre-set for each of the test items, weighted sums are performed on the at least two groups of test parameters to obtain a test value.

[0066] Assuming that the above five groups of test items are all tested in the same batch of charging equipment with the same specifications, the following weights can be used for calculation (only exemplary and can be modified according to needs):

[0067] The weight of the effective output power test is set to 40%, the weight of the conversion efficiency test is set to 12%, the weight of the high temperature exposure test is set to 24%, the weight of the vibration test is set to 12%, and the weight of the free fall test is set to 12%.

[0068] For example, assuming that the test parameter obtained from each test item is not a specific value but a level, a corresponding score can be specified for each level, and the value corresponding to the test parameter can be obtained by multiplying the score by the weight, and the weighted sum can be obtained by summing up multiple test items based on this value.

[0069] For example, when the test parameter corresponding to each test item is a level, a corresponding score can be set for each level according to Table 1, so that a weighted sum can be performed according to the scores corresponding to the test parameters (levels) when calculating the test value.

[0070] Table 1:

[0071]

[0072] The weights set for each test item in Table 1 and the corresponding scores for each level are preset. In order to indicate the quality performance of the charging equipment in common usage scenarios, a higher weight is set for common usage scenarios. For example, the performance of the charging equipment at normal temperature or the second high temperature under effective output power. At this time, a higher weight is set for the effective output power at normal temperature, and a higher weight is set for the effective output power at the second high temperature; a relatively low weight is set for the effective output power at the first low temperature and the second low temperature, because compared with the normal temperature of 23℃±2℃, the second low temperature such as -20℃±2℃ charging equipment usage environment is less likely to appear in life scenarios (especially the charging equipment itself will have a certain amount of heat during charging and discharging, which will relatively increase the temperature).

[0073] By performing weighted summation according to Table 1 above, we can get the test values ​​corresponding to the test parameters obtained after all five test items are executed. And according to the qualified values ​​required for each of the above test items in the factory parameter requirements, weighted summation is also performed according to Table 1 above to obtain the preset value (or directly set manually). Among them, if the weight or score of a certain test item is not set in the factory parameter requirements, it can be calculated as 0. For example, the factory parameter requirements do not make any requirements for the recovery of power after high temperature exposure, and the recovery of power after high temperature exposure can be ignored when calculating the preset value.

[0074] At this time, by executing: if the test value is greater than or equal to the preset value required by the factory parameter requirement, the excess range is determined; the excess range can be a numerical value or a level.

[0075] Exemplarily, when the magnitude of the excess is a level, the magnitude of the excess may be set with reference to Table 2:

[0076] Table 2:

[0077]

[0078] Where s is the test value, and the score interval corresponding to one star is [60, 70), which is the score interval of the preset value of the factory parameter requirements. Therefore, if the test value is in the score interval of one star, it means that the quality level of the product to be tested is one star, and the factory parameter requirements are also one star, so the margin of excess is 0 (not exceeded).

[0079] If the test value is within the five-star score range, it indicates that the quality level of the product to be tested is five stars, while the factory parameter requirement is one star, so the excess is four levels (it can be seen that the quality of the product to be tested is very high).

[0080] The above method can effectively obtain a comprehensive quality score when testing multiple test items.

[0081] Optionally, the test items at least include a high temperature exposure test. The step of obtaining test parameters for quality testing the product to be tested includes:

[0082] If it is detected that the charging device in the target device has finished charging, the temperature in the target device is controlled to switch between normal temperature and a first high temperature; the normal temperature is lower than the first high temperature, and the standing time between two temperature switches is not less than a first preset time; when the number of switching times is greater than or equal to the preset number of times, and the temperature difference between the temperature in the target device and the normal temperature is less than or equal to the preset difference, the target device is controlled to perform a discharge test on the charging device to obtain high-temperature discharge test parameters.

[0083] Exemplarily, the target device may be a temperature control device capable of charging and discharging a charging device, so that after the charging device is placed in the temperature control device, the ambient temperature of the environment in which the charging device is located can be freely adjusted to meet the test environment requirements.

[0084] After detecting that the charging device in the target device has finished charging, the temperature of the target device can be controlled according to the following steps:

[0085] Step a: Raise the temperature to a first high temperature (assuming it is set to 85°C±2°C) at a heating rate of 2-3°C / min (exemplary), and keep the sample at this temperature for a first preset time (eg, 7 hours).

[0086] Step b, cooling the sample to room temperature (assuming it is set to 23°C±2°C) at a cooling rate of 1-2°C / min (exemplary), and keeping the sample at this temperature for a first preset time (eg, 7 hours).

[0087] Step c: repeat steps a to b (assuming 2 cycles in total) so that the charging device experiences high temperature twice, obtains high temperature discharge test parameters, and determines the quality of the charging device after high temperature exposure.

[0088] Among them, the high temperature discharge test parameters obtained include the following two cases:

[0089] Case 1: Discharging the charging device to obtain the remaining power after high temperature exposure.

[0090] At this time, perform step d, discharge at the nominal output current until cutoff at an ambient temperature of 23°C ± 2°C, and record the effective output capacity, which is the remaining capacity after high temperature exposure. That is, direct discharge.

[0091] Assuming that the setting experiences high temperature twice, the preset number can be set to 4. That is, when the initial temperature of the target device is normal temperature (usually normal temperature), the first switch is to execute step a, and then execute step b after executing step a (second switch); after executing step b, execute step a again (third switch), and after executing step a, execute step b again (fourth switch). At this time, the number of switches reaches the preset number, and the difference between the current temperature and the preset normal temperature is less than or equal to the preset difference (for example, the preset difference can be 7). Controlling the target device to discharge the charging device can obtain the remaining power after high temperature exposure in the high temperature test parameters.

[0092] For another example, when the initial temperature of the target device is the first high temperature, the first switch is to execute step b, and then execute step a after executing step b (the second switch); after executing step a, execute step b again (the third switch), and after executing step b, execute step a again (the fourth switch). At this time, although the number of switches reaches the preset number, the current temperature is the first high temperature, so the above steps continue to be cycled, that is, after executing step a, execute step b again (the fifth switch). At this time, it is satisfied that: the number of switches (5) reaches the preset number (4), and the difference between the current temperature and the preset normal temperature is less than or equal to the preset difference, so the target device can be controlled to discharge the charging device to obtain the remaining power after high temperature exposure in the high temperature test parameters.

[0093] Or in case 2, after discharging the charging device, the charging device is charged; when the charging of the charging device is completed, the charging device is discharged to recover the power after high temperature exposure.

[0094] Characterization of the amount of power recovered after high-temperature exposure: After the charging device has been exposed to the first high temperature, the effective output power is measured after the target number of charge and discharges at normal temperature. It can reflect the charging and discharging performance of the charging device after high-temperature exposure, thereby accurately reflecting the quality of the charging device. At this time, first perform step d, and then perform step e: At room temperature (assuming 23°C ± 2°C), after the sample is charged with the rated current, the sample is left to stand for 0.5 to 1h, and discharged to cutoff with the rated current, and the effective output power is recorded, which is the amount of power recovered after high-temperature exposure. That is, discharge first, then charge, and then discharge.

[0095] Further, after obtaining the remaining power after high temperature exposure and the recovered power after high temperature exposure, the test parameters of the high temperature exposure test can be determined according to Table 3:

[0096] Table 3:

[0097]

[0098] It should be noted that before controlling the temperature of the target device, when charging the charging device at the rated current (or voltage) (for example, there is a switch or command to control when to start charging), the end of charging can be detected in the following ways: for example, the charging time reaches the specified charging time (assuming it is 5 hours, and it can be fully charged after 5 hours). Or, when it is detected that the charging current automatically decreases (for example, becomes 0A), it is considered that it is fully charged at this time, and the end of charging is detected.

[0099] Optionally, when the test items include at least an effective output power test, the step of obtaining test parameters for performing a quality test on the product to be tested includes:

[0100] If it is detected that the charging device in the target device has finished charging, the temperature in the target device is controlled to switch between four temperatures; the charging device is charged between every two temperature switches, and the static time after charging is not less than a second preset time; the target device is controlled to discharge the charging device at each temperature to obtain the discharge power at at least four different temperatures; the four temperatures include at least: normal temperature, second high temperature, first low temperature, and second low temperature.

[0101] Among them, the temperature values ​​of each temperature are as follows from small to large:

[0102] Second low temperature, first low temperature, normal temperature, second high temperature.

[0103] Exemplarily, the second low temperature is in the range of -20°C±2°C, the first low temperature is in the range of -10°C±2°C, the normal temperature is in the range of 23°C±2°C, and the second high temperature is in the range of 45°C±2°C.

[0104] The second preset time length may be, for example, 0.5 h, or 1 h (to avoid overheating of the charging temperature and affecting the accuracy of the ambient temperature). The above method can effectively measure the discharge capacity at four commonly used temperatures to obtain the effective output capacity.

[0105] Exemplarily, the effective output power may be the maximum output power among multiple test parameters obtained by multiple tests at each temperature, or the average output power. It should be noted that in order to avoid high loss of charging equipment caused by multiple charging and discharging in the second low temperature, the first low temperature, and the second high temperature, only one test may be performed in these three temperature environments.

[0106] Optionally, controlling the temperature in the target device to switch between four temperatures includes the following steps: controlling the target device to switch between the four temperatures in the following order: normal temperature, second high temperature, first low temperature, and second low temperature.

[0107] That is, the target device is first controlled at a normal temperature (since the target device is usually indoors, the initial indoor temperature is close to the normal temperature, thus saving power and eliminating the need to wait for too long).

[0108] Then the target device is controlled to discharge at the second high temperature and the first low temperature. The loss is small at the second high temperature and the first temperature, which can avoid the loss of the previous tests affecting the test accuracy of the subsequent tests. Finally, the second low temperature with higher loss is tested.

[0109] In this way, four relatively accurate test parameters can be obtained by testing one product to be tested, which helps to reduce the number of tests on the product to be tested (test loss) while ensuring the test accuracy.

[0110] Specifically, controlling the target device to discharge the charging device at each temperature includes: for each temperature, controlling the target device to discharge the charging device with a target current corresponding to the temperature; wherein the target current corresponding to the normal temperature and the second high temperature is a first current, and the current corresponding to the first low temperature and the second low temperature is a second current; and the first current is greater than the second current.

[0111] For example, the first current is the rated current, and the second current can be half of the rated current. Under the first low temperature and the second low temperature, when the discharge current is large, the low temperature internal resistance will increase a lot. If the discharge is directly carried out according to the first current, the output power will be very low. Therefore, the discharge current can be appropriately reduced.

[0112] The above method can be organized into the following steps:

[0113] (1) The temperature in the target device is set to the normal temperature, and the charging device is discharged with a first current to obtain a first discharge power (normal temperature effective output power).

[0114] (2) After charging, the charging device is left alone for 0.5 h (second preset time length).

[0115] (3) The temperature in the target device is set to the second high temperature, and the charging device is discharged with the first current to obtain a second discharged power (second high temperature effective output power).

[0116] (4) The temperature inside the target device is set to the normal temperature, and the charging device is left standing for 0.5 h (a second preset time period) after charging.

[0117] (5) Setting the temperature in the target device to the first low temperature, and discharging the charging device with a second current to obtain a third discharge power (first low temperature effective output power); the second current is less than the first current.

[0118] (6) The temperature inside the target device is set to the normal temperature, and the charging device is left standing for 0.5 h (a second preset time period) after charging.

[0119] (7) Setting the temperature in the target device to the second low temperature, and discharging the charging device with a second current to obtain a fourth discharge power (second low temperature effective output power). Through the above steps, the effective output power at four temperatures can be obtained.

[0120] After obtaining the effective output power at four temperatures, the test parameters of the effective output power test can be determined according to Table 4:

[0121] Table 4:

[0122]

[0123] It should be noted that when executing the above steps (1) to (7), the effective output power (effective output power) can be measured several times (for example, 3 times) and then the maximum output power (or average output power) can be measured as the effective output power.

[0124] Optionally, when the test items (in addition to the effective output power) also include a conversion efficiency test, the step of obtaining test parameters for performing a quality test on the product to be tested includes:

[0125] The rated output power of the product to be tested is obtained; in response to controlling the temperature in the target device to switch to a normal temperature, a first discharge power of the product to be tested at the normal temperature is obtained; the first discharge power is used as the effective output power, and based on the ratio between the effective output power and the rated output power, the conversion efficiency of the product to be tested is obtained. The conversion efficiency can be calculated according to the above formula 1. In the present disclosure, when determining the conversion efficiency, the test parameters in the effective output power test are directly used for calculation, which reduces the steps of testing the conversion efficiency.

[0126] After obtaining the conversion efficiency, the test parameters for the conversion efficiency test can be determined according to Table 5:

[0127] Table 5:

[0128] grade Grading evaluation indicators 1 88%≤η 2 86%≤η<88% 3 84%≤η<86% 4 82%≤η<84% 5 80%≤η<82%

[0129] Optionally, the test parameters obtained by the vibration test of the present disclosure can be determined according to Table 6:

[0130] Table 6:

[0131]

[0132] Among them, frequency (Hz), amplitude (mm), acceleration (m / s 2 ), the value of sweep cycle time (min) is preset, and the number of test cycles in each direction is to test whether it can reach the preset number. When the number of test cycles in each direction can reach 16 times and the charging and discharging functions of the charging equipment are qualified, the product level is considered to be level one; if the number of test cycles in each direction cannot reach 16 times (partial faults will occur if ≥16 times), but can reach 12 times, the product level is considered to be level two.

[0133] The test parameters obtained from the free fall test can be determined according to Table 7:

[0134] Table 7:

[0135] grade Grading evaluation indicators 1 Drop height 1.5m, normal function, no cracks, no breakage. 2 Drop height 1.5m, normal function, with cracks but no breakage. 3 Drop height 1m, normal function, no cracks, no breakage. 4 Drop height 1m, normal function, with cracks but no breakage.

[0136] It should be noted that no matter which test item is carried out, it is necessary to meet the following requirements:

[0137] After the test, place the sample aside for a certain period of time (e.g. 2h, 24h) and visually inspect its appearance. There should be no obvious deformation, and it should not explode, leak, catch fire, leak, or break (this should also be true during the test). When the test item is the effective output power test, it should also meet the following requirements: the effective output power at room temperature should be greater than or equal to the rated output power of the charging device.

[0138] For the aforementioned method embodiments, for the sake of simplicity of description, they are all expressed as a series of action combinations, but those skilled in the art should know that the present disclosure is not limited by the described order of actions, because according to the present disclosure, certain steps can be performed in other orders or simultaneously.

[0139] Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all optional embodiments, and the actions and modules involved are not necessarily required by the present disclosure.

[0140] Corresponding to the aforementioned application function realization method embodiment, the present disclosure also provides an embodiment of a product testing device and a corresponding terminal.

[0141] Figure 2 is a structural schematic diagram of a product testing device according to an exemplary embodiment of the present disclosure, such as Figure 2 As shown, the product testing device may include:

[0142] The first acquisition module 201 is used to acquire information of the product to be tested; the product to be tested is a product that has been tested in the factory and meets the factory parameter requirements.

[0143] The second acquisition module 202 is used to acquire test parameters for performing a quality test on the product to be tested, where the quality test is at least partially different from the factory test.

[0144] The amplitude determination module 203 is used to determine the amplitude by which the test parameter exceeds the factory parameter requirement if it is determined based on the comparison result of the test parameter with the factory parameter requirement that the quality of the product to be tested meets the factory parameter requirement.

[0145] Optionally, the product to be tested is a charging device, and the test items for quality testing of each product to be tested include at least one of the following:

[0146] Effective output power test, conversion efficiency test, high temperature exposure test, vibration test, free fall test.

[0147] Optionally, the first acquisition module 201 is used to acquire information of the product to be tested, including:

[0148] At least two groups of test parameters are obtained by performing at least two test items.

[0149] The device also includes:

[0150] A weighted summation module, configured to perform weighted summation on the at least two groups of test parameters based on a weight pre-set for each of the test items to obtain a test value;

[0151] The amplitude determination module 203 is used to determine the amplitude by which the test parameter exceeds the factory parameter requirement if it is determined based on the comparison result between the test parameter and the factory parameter requirement that the quality of the product to be tested meets the factory parameter requirement, and is used to:

[0152] If the test value is greater than or equal to the preset value required by the factory parameter requirement, the magnitude of the excess is determined; the greater the difference between the test value and the preset value, the greater the magnitude of the excess.

[0153] Optionally, the test items include at least a high temperature exposure test.

[0154] When the second acquisition module 202 is used to acquire the test parameters for performing a quality test on the product to be tested, it is used to:

[0155] If it is detected that the charging device in the target device has finished charging, the temperature in the target device is controlled to switch between normal temperature and a first high temperature; the normal temperature is lower than the first high temperature, and the static time between two temperature switches is not less than a first preset time.

[0156] When the switching times are greater than or equal to the preset times and the temperature difference between the temperature in the target device and the normal temperature is less than or equal to the preset difference, the target device is controlled to perform a discharge test on the charging device to obtain high temperature discharge test parameters.

[0157] Optionally, when the second acquisition module 202 is used to control the target device to perform a discharge test on the charging device to obtain a high-temperature discharge test parameter, it is used to:

[0158] The charging device is discharged to obtain the remaining power after high temperature exposure.

[0159] Alternatively, after the charging device is discharged, the charging device is charged.

[0160] When it is detected that the charging device has finished charging, the charging device is discharged to obtain the power restored after high temperature exposure.

[0161] Optionally, the test items include at least an effective output power test.

[0162] When the second acquisition module 202 is used to acquire the test parameters for performing a quality test on the product to be tested, it is used to:

[0163] If it is detected that the charging device in the target device has finished charging, the temperature in the target device is controlled to switch between four temperatures; the charging device is charged between every two temperature switches, and the static time after charging is not less than a second preset time.

[0164] The target device is controlled to discharge the charging device at each of the temperatures to obtain discharge quantities at at least four different temperatures; the four temperatures at least include: normal temperature, a second high temperature, a first low temperature, and a second low temperature.

[0165] Among them, the temperature values ​​of each temperature are as follows from small to large:

[0166] Second low temperature, first low temperature, normal temperature, second high temperature.

[0167] Optionally, when the second acquisition module 202 is used to control the temperature in the target device to switch between four temperatures, it is used to:

[0168] The target device is controlled to switch between four temperatures in the following order:

[0169] Normal temperature, second highest temperature, first lowest temperature, second lowest temperature.

[0170] Optionally, when the second acquisition module 202 is used to control the target device to discharge the charging device at each temperature, it is used to:

[0171] For each of the temperatures, the target device is controlled to discharge the charging device with a target current corresponding to the temperature. The target currents corresponding to the normal temperature and the second high temperature are the first current, and the currents corresponding to the first low temperature and the second low temperature are the second current; and the first current is greater than the second current.

[0172] Optionally, the test item further includes a conversion efficiency test, and the second acquisition module 202, when used to acquire test parameters for performing a quality test on the product to be tested, is used to:

[0173] The rated output power of the product to be tested is obtained.

[0174] In response to controlling the temperature in the target device to switch to a normal temperature, a first discharge capacity of the product to be tested at the normal temperature is obtained.

[0175] The first discharged electric quantity is used as the effective output electric quantity, and based on the ratio between the effective output electric quantity and the rated output electric quantity, the conversion efficiency of the product to be tested is obtained.

[0176] For the device embodiments, since they basically correspond to the method embodiments, the relevant parts can refer to the partial description of the method embodiments. The device embodiments described above are only schematic, wherein the units described above as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place, or they may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the disclosed solution. A person of ordinary skill in the art may understand and implement it without creative work.

[0177] Accordingly, an embodiment of the present disclosure provides an electronic device, comprising: a processor; and a memory for storing processor executable instructions; wherein the processor is configured to implement the steps of any of the above-mentioned product testing methods by running the executable instructions.

[0178] Figure 33 is a schematic diagram of a structure of an electronic device according to an exemplary embodiment of the present disclosure. For example, the electronic device 300 may be a user device, which may specifically be a mobile phone, a computer, a digital broadcast terminal, a message transceiver device, a game console, a tablet device, a medical device, a fitness device, a personal digital assistant, a wearable device such as a smart watch, a smart glasses, a smart bracelet, a smart running shoe, etc.

[0179] Reference Figure 3 , the electronic device 300 may include one or more of the following components: a processing component 302 , a memory 304 , a power component 306 , a multimedia component 308 , an audio component 310 , an input / output (I / O) interface 312 , a sensor component 314 , and a communication component 316 .

[0180] The processing component 302 generally controls the overall operation of the electronic device 300, such as operations associated with display, phone calls, data communications, camera operations, and recording operations. The processing component 302 may include one or more processors 320 to execute instructions to complete all or part of the steps of the above-mentioned method. In addition, the processing component 302 may include one or more modules to facilitate the interaction between the processing component 302 and other components. For example, the processing component 302 may include a multimedia module to facilitate the interaction between the multimedia component 308 and the processing component 302.

[0181] The memory 304 is configured to store various types of data to support operations on the device 300. Examples of such data include instructions for any application or method operating on the electronic device 300, contact data, phone book data, messages, pictures, videos, etc. The memory 304 can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk or optical disk.

[0182] The power supply component 306 provides power to the various components of the electronic device 300. The power supply component 306 may include a power management system, one or more power supplies, and other components associated with generating, managing, and distributing power to the electronic device 300.

[0183] The multimedia component 308 includes a screen that provides an output interface between the electronic device 300 and the user. In some embodiments, the screen may include a liquid crystal display (LCD) and a touch panel (TP). If the screen includes a touch panel, the screen may be implemented as a touch screen to receive input signals from the user. The touch panel includes one or more touch sensors to sense touch, slide, and gestures on the touch panel. The touch sensor may not only sense the boundaries of the touch or slide action, but also detect the duration and pressure associated with the touch or slide operation. In some embodiments, the multimedia component 308 includes a front camera and / or a rear camera. When the electronic device 300 is in an operating mode, such as a shooting mode or a video mode, the front camera and / or the rear camera may receive external multimedia data. Each front camera and rear camera may be a fixed optical lens system or have a focal length and optical zoom capability.

[0184] The audio component 310 is configured to output and / or input audio signals. For example, the audio component 310 includes a microphone (MIC), and when the electronic device 300 is in an operating mode, such as a call mode, a recording mode, and a voice recognition mode, the microphone is configured to receive an external audio signal. The received audio signal can be further stored in the memory 304 or sent via the communication component 316. In some embodiments, the audio component 310 also includes a speaker for outputting audio signals.

[0185] I / O interface 312 provides an interface between processing component 302 and peripheral interface modules, such as keyboards, click wheels, buttons, etc. These buttons may include but are not limited to: a home button, a volume button, a start button, and a lock button.

[0186] The sensor assembly 314 includes one or more sensors for providing various aspects of status assessment for the electronic device 300. For example, the sensor assembly 314 can detect the open / closed state of the electronic device 300, the relative positioning of the components, such as the display and keypad of the electronic device 300, and the sensor assembly 314 can also detect the position change of the electronic device 300 or a component of the electronic device 300, the presence or absence of contact between the user and the electronic device 300, the orientation or acceleration / deceleration of the electronic device 300, and the temperature change of the electronic device 300. The sensor assembly 314 may include a proximity sensor configured to detect the presence of nearby objects without any physical contact. The sensor assembly 314 may also include an optical sensor, such as a CMOS or CCD image sensor, for use in imaging applications. In some embodiments, the sensor assembly 314 may also include an acceleration sensor, a gyroscope sensor, a magnetic sensor, a pressure sensor, or a temperature sensor.

[0187] The communication component 316 is configured to facilitate wired or wireless communication between the electronic device 300 and other devices. The electronic device 300 can access a wireless network based on a communication standard, such as WiFi, 4G or 5G, 4G LTE, 5G NR or a combination thereof. In an exemplary embodiment, the communication component 316 receives a broadcast signal or broadcast-related information from an external broadcast management system via a broadcast channel. In an exemplary embodiment, the communication component 316 also includes a near field communication (NFC) module to facilitate short-range communication. For example, the NFC module can be implemented based on radio frequency identification (RFID) technology, infrared data association (IrDA) technology, ultra-wideband (UWB) technology, Bluetooth (BT) technology and other technologies.

[0188] In an exemplary embodiment, the electronic device 300 may be implemented by one or more application-specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field programmable gate arrays (FPGAs), controllers, microcontrollers, microprocessors, or other electronic components to perform the above methods.

[0189] In an exemplary embodiment, a non-temporary computer-readable storage medium is also provided, such as a memory 304 including instructions, which, when executed by a processor 320 of an electronic device 300, enables the electronic device 300 to perform any of the above-mentioned product testing methods.

[0190] The non-transitory computer-readable storage medium may be a ROM, a random access memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, an optical data storage device, and the like.

[0191] Those skilled in the art will readily appreciate other embodiments of the present disclosure after considering the specification and practicing the invention disclosed herein. The present disclosure is intended to cover any variations, uses or adaptations of the present disclosure that follow the general principles of the present disclosure and include common knowledge or customary techniques in the art that are not disclosed in the present disclosure. The description and examples are to be considered exemplary only, and the true scope and spirit of the present disclosure are indicated by the following claims.

[0192] It should be understood that the present disclosure is not limited to the exact structures that have been described above and shown in the drawings, and that various modifications and changes may be made without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.

Claims

1. A product testing method, characterized in that: The method comprises: Acquire information of the product to be tested; the product to be tested is a product that has been tested at the factory and meets the factory parameter requirements; Acquire test parameters for performing a quality test on the product to be tested, wherein the quality test is at least partially different from the factory test; If it is determined based on the comparison result of the test parameter with the factory parameter requirement that the quality of the product to be tested meets the factory parameter requirement, then the extent to which the test parameter exceeds the factory parameter requirement is determined.

2. The method according to claim 1, characterized in that The product to be tested is a charging device, and the test items for the quality test of each product to be tested include at least one of the following: Effective output power test, conversion efficiency test, high temperature exposure test, vibration test, free fall test.

3. The method according to claim 2, characterized in that The obtaining of test parameters for quality testing of the product to be tested includes: Acquire at least two groups of test parameters obtained by performing at least two test items; The method further comprises: Based on the weights pre-set for each of the test items, weighted summing the at least two groups of test parameters is performed to obtain a test value; If it is determined based on the comparison result between the test parameter and the factory parameter requirement that the quality of the product to be tested meets the factory parameter requirement, then determining the extent by which the test parameter exceeds the factory parameter requirement includes: If the test value is greater than or equal to the preset value required by the factory parameter requirement, the magnitude of the excess is determined; the greater the difference between the test value and the preset value, the greater the magnitude of the excess.

4. The method according to claim 2, characterized in that: The test items at least include high temperature exposure test; The obtaining of test parameters for quality testing of the product to be tested includes: If it is detected that the charging device in the target device has finished charging, controlling the temperature in the target device to switch between a normal temperature and a first high temperature; The normal temperature is lower than the first high temperature, and the static time between two temperature switching is not less than a first preset time; When the switching times are greater than or equal to the preset times and the temperature difference between the temperature in the target device and the normal temperature is less than or equal to the preset difference, the target device is controlled to perform a discharge test on the charging device to obtain high temperature discharge test parameters.

5. The method according to claim 4, characterized in that The controlling the target device to perform a discharge test on the charging device to obtain a high temperature discharge test parameter includes: Discharging the charging device to obtain the remaining power after high temperature exposure; Alternatively, after discharging the charging device, the charging device is charged; When it is detected that the charging device has finished charging, the charging device is discharged to obtain the power restored after high temperature exposure.

6. The method according to claim 2, characterized in that The test items at least include an effective output power test, and the obtaining of test parameters for quality testing of the product to be tested includes: If it is detected that the charging device in the target device has finished charging, the temperature in the target device is controlled to switch between four temperatures; the charging device is charged between every two temperature switches, and the static time after charging is not less than a second preset time; Controlling the target device to discharge the charging device at each of the temperatures to obtain discharge quantities at at least four different temperatures; the four temperatures at least include: normal temperature, a second high temperature, a first low temperature, and a second low temperature; Among them, the temperature values ​​of each temperature are as follows from small to large: Second low temperature, first low temperature, normal temperature, second high temperature.

7. The method according to claim 6, characterized in that The controlling the temperature in the target device to switch between four temperatures includes: The target device is controlled to switch between four temperatures in the following order: Normal temperature, second highest temperature, first lowest temperature, second lowest temperature.

8. The method according to claim 6 or 7, characterized in that: The controlling the target device to discharge the charging device at each temperature includes: For each of the temperatures, controlling the target device to discharge the charging device with a target current corresponding to the temperature; Among them, the target current corresponding to the normal temperature and the second high temperature is a first current, and the current corresponding to the first low temperature and the second low temperature is a second current; the first current is greater than the second current.

9. The method according to claim 6 or 7, characterized in that: The test items also include a conversion efficiency test, and the obtaining of test parameters for quality testing of the product to be tested includes: Obtaining the rated output power of the product to be tested; In response to controlling the temperature in the target device to switch to a normal temperature, obtaining a first discharge capacity of the product to be tested at the normal temperature; The first discharged electric quantity is used as the effective output electric quantity, and based on the ratio between the effective output electric quantity and the rated output electric quantity, the conversion efficiency of the product to be tested is obtained.

10. A product testing device, characterized in that: The device comprises: The first acquisition module is used to acquire information of the product to be tested; the product to be tested is a product that meets the factory parameter requirements after factory testing; A second acquisition module is used to acquire test parameters for performing a quality test on the product to be tested, wherein the quality test is at least partially different from the factory test; The amplitude determination module is used to determine the amplitude by which the test parameter exceeds the factory parameter requirement if it is determined based on the comparison result of the test parameter with the factory parameter requirement that the quality of the product to be tested meets the factory parameter requirement.

11. An electronic device, characterized in that: include: processor; a memory for storing processor-executable instructions; The processor is configured to implement the steps of any one of the methods of claims 1 to 9 by running the executable instructions.

12. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the program is executed by a processor, the steps of any method described in claims 1 to 9 are implemented.

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