A detection circuit for a battery short-circuit test tooling

Abstract

This application relates to a detection circuit for a battery short - circuit test tooling. A detection circuit for a battery short - circuit test tooling includes a BMS board to be tested, an air switch, and a short - circuit test tooling. The short - circuit test tooling includes a test switch module, a control module, a switch driving module, and a switch management module. The BMS board to be tested, the air switch, and the switch management module are connected in series with each other to form a detection loop. The signal output end of the test switch module is connected to the signal input end of the control module, the signal output end of the control module is connected to the signal input end of the switch driving module, and the signal output end of the switch driving module is connected to the signal input end of the switch management module; it avoids the complex operation of manually building a short - circuit environment in the traditional manual test process, makes the test results more stable and reliable, reduces human errors, and improves the accuracy of product quality detection.

Description

Technical Field

[0001] The present invention relates to the technical field of battery short - circuit testing, and in particular to a detection circuit for a battery short - circuit testing tooling. Background Art

[0002] Currently, during the detection process of battery short - circuit protection modules, traditional testing methods mainly rely on manual operation and manual measurement, and there are many technical bottlenecks and limitations. First of all, the testing efficiency is low. Manual measurement requires connecting test points one by one and using equipment such as multimeters and oscilloscopes to read key parameters such as voltage and current, resulting in a long testing cycle and being not suitable for large - scale production environments. Secondly, the measurement accuracy is unstable. Since traditional manual testing relies on the experience of operators and manual recording, it is easily affected by human errors, instrument drift, and environmental interference, leading to poor data reliability. Moreover, the management of test data is difficult. Manual testing usually requires handwritten records or manual input into a computer, which not only increases the workload of testers but also may affect product quality traceability due to data omission or input errors. In addition, safety issues are also major defects of traditional methods. Short - circuit testing involves high - current transient impacts, and manual operation is prone to cause equipment damage or even safety accidents. Therefore, traditional testing methods are difficult to meet the requirements of high - precision, high - efficiency, and intelligent detection, and there is an urgent need for an automated, precise, and intelligent testing system to improve the detection quality and production efficiency of short - circuit protection modules. Summary of the Invention

[0003] In order to solve the problems of low quality and low efficiency caused by the fact that traditional testing methods mainly rely on manual operation and manual measurement, the present application provides a detection circuit for a battery short - circuit testing tooling.

[0004] A detection circuit for a battery short - circuit testing tooling, the detection circuit for a battery short - circuit testing tooling includes a BMS board to be tested, an air switch, and a short - circuit testing tooling. The short - circuit testing tooling includes a test switch module, a control module, a switch driving module, and a switch management module. The BMS board to be tested, the air switch, and the switch management module are connected in series with each other to form a detection circuit. The signal output end of the test switch module is connected to the signal input end of the control module, the signal output end of the control module is connected to the signal input end of the switch driving module, and the signal output end of the switch driving module is connected to the signal input end of the switch management module;

[0005] The test switch module is for a tester to manually press a corresponding test switch to generate a corresponding switch signal. After receiving the switch signal, the control module drives the switch management module to conduct or disconnect through the switch driving module, thereby simulating a corresponding test state.

[0006] By adopting the above technical solutions, a complete battery short-circuit detection circuit can be formed in the test tooling, and through a modular control method, automatic detection of the short-circuit protection module can be achieved. The test switch module can be manually pressed by the tester to trigger a switch signal. After the control module receives the signal, it uses the switch drive module to drive the conduction or disconnection of the switch management module to accurately simulate the short-circuit test state. This control method avoids the complex operations of manually building a short-circuit environment in the traditional manual testing process, greatly improves the convenience and repeatability of testing, makes the test results more stable and reliable, reduces human errors at the same time, and improves the accuracy of product quality inspection.

[0007] Preferably, the control module includes a front-end control chip AFE and an MCU chip. The signal input end of the MCU chip is connected to the signal output end of the test switch module. The data communication end of the MCU chip and the data communication end of the front-end control chip AFE are connected. The signal output end of the front-end control chip AFE is connected to the signal input end of the switch drive module.

[0008] By adopting the above technical solutions, the MCU chip and the front-end control chip AFE can work together to achieve intelligent signal processing and short-circuit state monitoring. The MCU chip receives the control signal from the test switch module and interacts with the AFE chip through the data communication interface, enabling the AFE chip to monitor key parameters such as current and voltage in the detection circuit in real time, and feeding the measurement data back to the MCU. Then, the MCU drives the switch drive module to perform short-circuit simulation or protection response. In this way, the system can automatically adapt to different test environments, ensure more accurate short-circuit detection, and support data storage and analysis, thereby improving the test reliability of the battery short-circuit protection module.

[0009] Preferably, the signal input end of the MCU chip includes a conduction control signal input port and a disconnection control signal input port. The test switch module includes a conduction control unit and a disconnection control unit. The conduction control unit includes a switch SW2 and a resistor R1. The first end of the resistor R1 is connected to the conduction control signal input port. The second end of the resistor R1 is connected to the first end of the switch SW2. The second end of the switch SW2 is grounded. The disconnection control unit includes a switch SW3 and a resistor R2. The first end of the resistor R2 is connected to the disconnection control signal input port. The second end of the resistor R1 is connected to the first end of the switch SW3. The second end of the switch SW3 is grounded.

[0010] By adopting the above technical solution, the control signals of conduction and disconnection can be respectively received through the independent signal input ports of the MCU chip, making the control logic of the short-circuit test clearer. The test switch module includes a conduction control unit and a disconnection control unit. Among them, the conduction control unit consists of switch SW2 and resistor R1, and the disconnection control unit consists of switch SW3 and resistor R2. When the tester presses different switches, the MCU chip can accurately distinguish the conduction signal and the disconnection signal and send corresponding control instructions to the switch drive module to ensure that the test tooling can accurately perform short-circuit simulation and loop cutting operations, thereby enhancing the controllability and safety of the test.

[0011] Preferably, the test switch module includes a reset control unit. The reset control unit includes switch SW4, resistor R3, and resistor R4. The first end of resistor R3 is connected to the power supply, the second end of resistor R3 is connected to the first end of resistor R4, the second end of resistor R4 is grounded, and the common node between the second end of resistor R3 and the first end of resistor R4 is connected to the first end of switch SW4. The second end of SW4 is connected to the reset control signal input terminal of the MCU chip.

[0012] By adopting the above technical solution, an additional reset control unit can be provided, enabling the system to quickly return to the initial state in case of anomalies and preventing the system from being locked or misjudged due to incorrect operations. The reset control unit consists of switch SW4, resistor R3, and resistor R4, forming a stable reset signal generation circuit. When the tester presses the reset switch SW4, the reset control signal input terminal of the MCU chip will receive a clear reset instruction, re-initializing the entire test system, thereby ensuring the stable operation of the test tooling and improving the reliability and repeatability of the test process.

[0013] Preferably, a current detection resistor is provided on the detection loop, and the current detection input terminals of the front-end control chip AFE are respectively connected to both ends of the current detection resistor.

[0014] By adopting the above technical solution, a current detection resistor can be added to the detection loop, enabling the AFE chip to accurately detect the magnitude of the short-circuit current. Both ends of the current detection resistor are respectively connected to the current detection input terminals of the AFE, enabling the AFE chip to monitor the current change flowing through the detection loop in real time and accurately judge the response time and protection threshold of the short-circuit protection module. This can effectively improve the accuracy of the short-circuit test and ensure that the battery management system (BMS) can respond quickly when a short circuit occurs, thereby enhancing the safety performance of the product and the quality detection standard.

[0015] Preferably, the switch driving module includes a resistor R5, a resistor R6, and a driving chip U5. The signal output terminal of the front-end control chip AFE is connected to the first end of the resistor R5. The second end of the resistor R5 is connected to the signal input terminal of the driving chip U5. The signal output terminal of the driving chip U5 is connected to the first end of the resistor R6. The second end of the resistor R6 is connected to the signal input terminal of the switch management module.

[0016] By adopting the above technical solution, the signal transmission can be reasonably allocated and controlled through the switch driving module, improving the system response speed and driving efficiency. The switch driving module consists of a resistor R5, a resistor R6, and a driving chip U5. The signal output terminal of the AFE chip is connected to the driving chip U5 through R5. After the U5 chip further processes the signal, it sends a driving signal to the switch management module through R6. This design can effectively isolate the direct signal transmission between the AFE chip and the switch management module, avoid signal interference, improve the driving accuracy of the MOS transistor, and thus ensure the accuracy of the short-circuit test.

[0017] Preferably, the switch management module includes a resistor R21, a zener diode ZD3, and multiple MOS switch conduction units. Each MOS switch conduction unit includes at least one first current-limiting resistor and one MOS transistor. The two conduction ends of the MOS transistor are used to access the detection circuit. The controlled end of the MOS transistor is connected to the first end of the first current-limiting resistor. The second end of the first current-limiting resistor is connected to the signal output terminal of the switch driving module. The first end of the resistor R21 is connected to the signal output terminal of the switch driving module. The second end of the resistor R21 is grounded. The negative terminal of the zener diode ZD3 is connected to the signal output terminal of the switch driving module. The positive terminal of the resistor R21 is grounded.

[0018] By adopting the above technical solution, the efficient control of the short-circuit test can be achieved through the switch management module, and the protection performance of the system can be improved. The switch management module includes multiple MOS switch conduction units. Each unit consists of a MOS transistor and a current-limiting resistor. The conduction end of the MOS transistor is connected to the detection circuit, and the controlled end is connected to the switch driving module through the current-limiting resistor. In addition, the zener diode ZD3 can provide a stable control signal during the driving process of the MOS transistor, avoiding misoperation of the MOS transistor caused by driving voltage fluctuations, thereby improving the reliability and accuracy of the entire short-circuit test tooling.

[0019] Preferably, the detection circuit of the battery short - circuit test tooling further includes a lamp indication module and a digital tube timing module. The lamp indication module includes a plurality of indication units. Each indication unit includes at least one second current - limiting resistor and one first light - emitting diode. The first end of the second current - limiting resistor is connected to the lamp indication signal output end of the MCU chip. The second end of the second current - limiting resistor is connected to the positive electrode end of the first light - emitting diode. The negative electrode end of the first light - emitting diode is grounded. The signal input end of the digital tube timing module is connected to the timing signal output end of the MCU chip.

[0020] By adopting the above - mentioned technical solution, it is possible to provide intuitive status feedback during the short - circuit test, enabling the tester to understand the working condition of the test tooling in real time. The lamp indication module consists of multiple LED indication units, and the digital tube timing module is used to display the countdown information of the short - circuit test. The LED indicator can clearly identify the switching state of the MOS transistor, the short - circuit protection state, and the over - current protection state, while the digital tube timing module can display the remaining test time, facilitating the tester to prepare in advance and observe the test results, thereby improving the operation convenience and the visualization level of the test process.

[0021] Preferably, the detection circuit of the battery short - circuit test tooling further includes a capacitor protection module. The capacitor protection module is connected between the air switch and the switch management module. The capacitor protection module includes two capacitor modules arranged in parallel. Each capacitor module includes a plurality of polarized capacitors arranged in parallel with each other.

[0022] By adopting the above - mentioned technical solution, it is possible to reduce the impact current at the moment of short - circuit through the capacitor protection module and improve the safety of the test tooling. The capacitor protection module consists of two capacitor modules connected in parallel. Each module contains a plurality of polarized capacitors connected in parallel to improve the energy absorption capacity. When the short - circuit test tooling triggers a short - circuit, the capacitor protection module can quickly absorb and buffer the large current at the moment of short - circuit, reducing the current impact on the test equipment and the BMS board, thereby effectively improving the system safety and preventing equipment damage caused by short - circuit testing.

[0023] Preferably, the capacitor protection module further includes a capacitor power - on indication unit. The capacitor power - on indication unit is connected in parallel with each capacitor module. The capacitor power - on indication unit includes at least one second light - emitting diode and one third current - limiting resistor. The positive electrode end of the second light - emitting diode is connected to the positive electrode end of the detection circuit. The negative electrode end of the second light - emitting diode is connected to the first end of the third current - limiting resistor. The second end of the third current - limiting resistor is connected to the negative electrode end of the detection circuit.

[0024] By adopting the above technical solution, a capacitor power indication unit can be added to the capacitor protection module, enabling testers to intuitively judge whether the capacitor stores residual charge and avoiding safety risks caused by misoperations. The capacitor power indication unit includes an LED and a current-limiting resistor and is connected in parallel with the capacitor module. When the capacitor still stores electricity, the LED will remain lit, indicating to the tester that there is still charge inside the capacitor, preventing testers from operating when the capacitor has not been fully discharged, thereby improving the safety of the test environment and reducing the risk of accidentally touching live components.

[0025] In summary, the present application includes at least one of the following beneficial technical effects:

[0026] 1. The present application operates through a test switch module, which provides a human-machine interaction interface, allowing testers to press the test switch to trigger a test signal, thereby avoiding manual recording and test errors. Once the test signal is triggered, the control module will receive the signal and send an instruction to the switch drive module to drive switch components such as MOS transistors to conduct or turn off, forming an automated short-circuit test process. This circuit structure not only greatly improves the test efficiency but also reduces the inconsistencies that may be brought about by manual operations, improving the repeatability and reliability of detection;

[0027] 2. Through the coordinated action of the control module and the switch management module, it is ensured that during the short-circuit test process, the on-off of the test loop can be precisely controlled, and parameters such as the time and intensity of short-circuit simulation can be adjusted according to different test requirements. This precise control method enables the short-circuit test to be carried out in a strictly controlled environment, avoiding damage to the battery or test equipment due to too long short-circuit time or too large short-circuit current, greatly improving the safety of the test. At the same time, the system can collect test data in real-time and use it for quality analysis, ensuring the integrity and traceability of test data, overcoming the defects of traditional manual recording being cumbersome and prone to omission, thereby greatly improving the factory inspection quality of the battery short-circuit protection module. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 is a flow block diagram of a detection circuit for a battery short-circuit test tooling in an embodiment of the present application.

[0029] Figure 2 is a partial circuit structure diagram of the detection loop and the control module in a detection circuit for a battery short-circuit test tooling in an embodiment of the present application;

[0030] Figure 3 is a partial circuit structure diagram of the test switch module in a detection circuit for a battery short-circuit test tooling in an embodiment of the present application;

[0031] Figure 4It is a partial circuit structure diagram of a switch driving module in a detection circuit of a battery short - circuit test tooling according to an embodiment of the present application;

[0032] Figure 5 It is a partial circuit structure diagram of a switch management module in a detection circuit of a battery short - circuit test tooling according to an embodiment of the present application;

[0033] Figure 6 It is a partial circuit structure diagram of a capacitor protection module in a detection circuit of a battery short - circuit test tooling according to an embodiment of the present application;

[0034] Figure 7 It is a partial circuit structure diagram of a lamp indication module in a detection circuit of a battery short - circuit test tooling according to an embodiment of the present application. Detailed implementation manners

[0035] The following further elaborates on the present application in conjunction with the attached drawings.

[0036] In an embodiment, as Figure 1 shown, the present application discloses a detection circuit of a battery short - circuit test tooling. A detection circuit of a battery short - circuit test tooling includes a BMS board to be tested, an air switch, and a short - circuit test tooling. The short - circuit test tooling includes a test switch module, a control module, a switch driving module, and a switch management module. The BMS board to be tested, the air switch, and the switch management module are connected in series with each other to form a detection loop. The signal output end of the test switch module is connected to the signal input end of the control module. The signal output end of the control module is connected to the signal input end of the switch driving module. The signal output end of the switch driving module is connected to the signal input end of the switch management module;

[0037] The test switch module is for the tester to manually press the corresponding test switch to generate a corresponding switch signal. After the control module receives the switch signal, it drives the switch management module to conduct or disconnect through the switch driving module, thereby simulating the corresponding test state.

[0038] In this embodiment, the core logic of the circuit is to realize the automation and precise control of the battery short - circuit test through the series connection and signal control of multiple modules. The BMS board to be tested, the air switch, and the switch management module are connected in series to form a complete short - circuit detection loop, enabling the short - circuit test tooling to verify the short - circuit protection function of the BMS board. The composition of the detection loop ensures that when the switch management module conducts, current can flow in the test loop, thereby simulating the short - circuit state; when the switch management module disconnects, the loop is cut off and the short - circuit test terminates, ensuring that the battery system will not be damaged due to continuous short - circuit during the test process.

[0039] The signal output terminal of the test switch module is connected to the signal input terminal of the control module. Its function is that the tester manually presses the test switch to generate a corresponding switch signal and transmit it to the control module. The function of the test switch module is to provide a trigger signal for the short-circuit test, enabling the control module to perform corresponding short-circuit test operations according to different input signals. Since the short-circuit test needs to be carried out under specific conditions, the tester ensures that the test is carried out in a safe and controllable manner through manual triggering, rather than performing the short-circuit test disorderly or randomly.

[0040] The signal output terminal of the control module is connected to the signal input terminal of the switch drive module, responsible for receiving the input signal from the test switch module and converting it into a control signal to control the downstream switch drive module. The function of the control module is to judge the current test requirements and decide whether to trigger or terminate the short-circuit test according to different input signals. It can judge whether the current input switch signal belongs to on-control or off-control through the logic circuit or the programming logic of the MCU, and generate a corresponding output signal to make the whole test process run according to the set logic.

[0041] The signal output terminal of the switch drive module is connected to the signal input terminal of the switch management module. Its function is to drive the execution unit of the switch management module according to the instructions of the control module. As an intermediate bridge, the switch drive module ensures that the low-power signal of the control module can be effectively converted into an effective signal to drive the switch management module, enabling the execution components such as MOS transistors or relays to work properly. Since the control module usually uses logic level signals, while the switch management module usually requires a higher-power drive signal, the switch drive module can amplify the signal to meet the working requirements of the switch management module and ensure that the short-circuit test is carried out in a stable and controllable manner.

[0042] The switch management module, as the execution mechanism of the entire short-circuit test, directly determines the conduction or disconnection of the short-circuit loop. The connection between the signal input terminal of the switch management module and the signal output terminal of the switch drive module means that when the switch drive module receives the control signal from the control module, it will trigger the switch management module to make it conduct when a short-circuit test is required and disconnect when the test ends or the protection mechanism is triggered. The switch management module usually consists of multiple MOS transistors or relays inside and can quickly execute the switch operation according to the instructions of the control signal. The conduction of the MOS transistor means that the short-circuit test loop is closed and the battery pack enters the short-circuit test state; the turn-off of the MOS transistor means that the short-circuit test loop is disconnected and the test ends.

[0043] The entire control logic ensures the efficient execution of the short - circuit test while guaranteeing the safety and test accuracy of the system. During the test, the test switch module serves as a manual trigger unit, providing a clear on or off signal. The control module processes the signal logically, and the switch drive module amplifies and transmits the signal to the switch management module, enabling the short - circuit test to proceed smoothly according to the predetermined logic. Through this structural design, the cumbersome process of relying on manual construction of the short - circuit loop in traditional test methods can be avoided. At the same time, it reduces human error, improves test accuracy, and ensures the safety and reliability of the battery short - circuit protection module.

[0044] In summary, this application operates through the test switch module, which provides a human - machine interaction interface that allows testers to press the test switch to trigger the test signal, thus avoiding manual recording and test errors. Once the test signal is triggered, the control module receives the signal and sends instructions to the switch drive module to drive switch components such as MOS transistors to conduct or turn off, forming an automated short - circuit test process. This circuit structure not only greatly improves the test efficiency but also reduces the inconsistencies that may be brought about by manual operations, enhancing the repeatability and reliability of detection. Moreover, through the collaborative effect of the control module and the switch management module, it is ensured that during the short - circuit test, the on - off of the test loop can be precisely controlled, and parameters such as the time and intensity of short - circuit simulation can be adjusted according to different test requirements. This precise control method enables the short - circuit test to be carried out in a strictly controlled environment, avoiding damage to the battery or test equipment due to excessive short - circuit time or current, and greatly improving the safety of the test. At the same time, the system can collect test data in real - time and use it for quality analysis, ensuring the integrity and traceability of the test data, overcoming the defects of cumbersome and easily missed traditional manual recording, and thus greatly improving the factory inspection quality of the battery short - circuit protection module.

[0045] Furthermore, as Figure 2 shown, the control module includes a front - end control chip AFE and an MCU chip. The signal input end of the MCU chip is connected to the signal output end of the test switch module. The data communication end of the MCU chip and the data communication end of the front - end control chip AFE are connected. The signal output end of the front - end control chip AFE is connected to the signal input end of the switch drive module.

[0046] In this embodiment, the control module consists of a front-end control chip AFE and an MCU chip. The two work together to ensure high-precision signal processing and short-circuit protection control of the short-circuit test system. The signal input end of the MCU chip is connected to the signal output end of the test switch module, which means that when the tester presses the test switch module, this module will provide the corresponding control signal to the MCU chip, indicating that the system needs to perform operations such as short-circuit testing, terminating the test, or resetting. After receiving this signal, as the core control unit of the entire system, the MCU chip will parse the operation instructions according to the type of the input signal and perform corresponding logical judgments through its internal logic processing unit to decide whether to trigger a short-circuit test or whether to terminate the ongoing test process.

[0047] The data communication end of the MCU chip is connected to the data communication end of the front-end control chip AFE to form a two-way communication link, enabling the MCU chip to obtain the monitoring data of the front-end control chip AFE in real time and send control instructions to the front-end control chip AFE at the same time. This connection method ensures that the front-end control chip AFE can continuously monitor the key electrical parameters of the short-circuit test loop, such as current, voltage, etc., and feedback the detected data to the MCU chip, enabling the MCU chip to perform intelligent short-circuit test management based on these data. The core function of the front-end control chip AFE is to accurately measure the current change in the detection loop and provide overcurrent protection during the short-circuit test. Since the short-circuit test will cause a large current to flow, if the current exceeds the set protection threshold, the front-end control chip AFE will feedback an over-limit signal to the MCU chip, enabling the MCU chip to respond immediately, terminate the test, and execute safety protection measures, thereby avoiding damage to the battery pack or test equipment due to overcurrent.

[0048] The signal output end of the front-end control chip AFE is connected to the signal input end of the switch drive module, enabling the front-end control chip AFE to directly affect the working state of the switch drive module. When the front-end control chip AFE detects the current signal in the test loop, it can decide whether to send a trigger signal to the switch drive module according to the preset short-circuit protection threshold. When the front-end control chip AFE confirms that the short-circuit test should continue, it will send a signal to keep the switch drive module conducting, making the switch management module remain closed to ensure the smooth progress of the test. When the front-end control chip AFE detects that the current exceeds the safe range, it will send a turn-off signal to the switch drive module, causing the MOS tube or relay of the switch management module to disconnect, thereby cutting off the short-circuit test loop and protecting the battery pack and equipment from damage caused by short-circuit impact.

[0049] The data communication connection method between the MCU chip and the front-end control chip AFE enables the test system to have high-precision dynamic response capabilities. After receiving the detection data fed back by the front-end control chip AFE, the MCU chip can further analyze the change trend of the current during the short-circuit test to optimize the test strategy, such as adjusting the short-circuit duration or recording the short-circuit current characteristic curve for subsequent product performance analysis. The direct connection between the front-end control chip AFE and the switch drive module enables the system to quickly turn off the test circuit directly through the hardware protection mechanism of the front-end control chip AFE without relying on additional calculations of the MCU chip when a short-circuit anomaly occurs, thereby enhancing the real-time protection capabilities of the system. This multi-level control architecture enables the short-circuit test tooling to achieve highly automated and intelligent short-circuit test management, ensuring that the short-circuit detection process is both safe and efficient, while guaranteeing the accuracy of data acquisition to improve the traceability of test data and the reliability of product quality control.

[0050] Further, as Figure 3 shown, the signal input terminals of the MCU chip include a conduction control signal input port and a disconnection control signal input port. The test switch module includes a conduction control unit and a disconnection control unit. The conduction control unit includes a switch SW2 and a resistor R1. The first end of the resistor R1 is connected to the conduction control signal input port, the second end of the resistor R1 is connected to the first end of the switch SW2, and the second end of the switch SW2 is grounded. The disconnection control unit includes a switch SW3 and a resistor R2. The first end of the resistor R2 is connected to the disconnection control signal input port, the second end of the resistor R1 is connected to the first end of the switch SW3, and the second end of the switch SW3 is grounded.

[0051] In this embodiment, the signal input terminals of the MCU chip are composed of a conduction control signal input port and a disconnection control signal input port, which respectively receive different control signals from the test switch module to achieve precise control of the short-circuit test circuit. The test switch module internally contains a conduction control unit and a disconnection control unit, which are respectively used to provide a short-circuit test start signal and a termination signal to ensure the controllability of the test process. The conduction control unit is composed of a switch SW2 and a resistor R1. The first end of the resistor R1 is directly connected to the conduction control signal input port, enabling the MCU chip to detect the voltage change at this port. The second end of the resistor R1 is connected to the first end of the switch SW2, and the second end of the switch SW2 is grounded. This connection method ensures that under normal circumstances, when the switch SW2 is not pressed, the conduction control signal input port is at a high level, and when the switch SW2 is pressed, this port is grounded through the resistor R1, enabling the MCU chip to detect a low-level signal, thereby triggering the conduction control logic and indicating that the system enters the short-circuit test state.

[0052] The disconnection control unit is composed of a switch SW3 and a resistor R2. Its function is opposite to that of the conduction control unit and is mainly used to terminate the short-circuit test. The first end of the resistor R2 is connected to the disconnection control signal input port of the MCU chip, and the second end of R1 is simultaneously connected to the first end of SW3, which means that the disconnection control unit and the conduction control unit share the second end of the resistor R1 to form a common node. The second end of the switch SW3 is grounded, so that when the switch SW3 is not pressed, the disconnection control signal input port of the MCU chip maintains a high level, and when the switch SW3 is pressed, the port is grounded through the resistor R2, so that the MCU chip detects a low-level signal, thereby triggering the disconnection control logic, instructing the system to terminate the short-circuit test and turn off the relevant switch management module.

[0053] This circuit design logic ensures that the MCU chip can accurately distinguish between the control signals of conduction and disconnection, avoiding false triggering caused by signal mixing or interference. The independence of the conduction control signal input port and the disconnection control signal input port enables the MCU chip to adjust the test state in time according to different control signals during the short-circuit test, achieving fast response and precise control. When the tester presses switch SW2, the MCU chip detects the level change of the conduction signal input port, triggers the short-circuit test logic, turns on the switch management module, closes the short-circuit loop, and the test begins. When the test needs to be terminated, press switch SW3, the MCU chip detects the low level of the disconnection signal input port, and immediately executes the termination logic, turning off the switch management module, cutting off the short-circuit loop, and the test ends.

[0054] The test process is completely automatically controlled by the MCU chip, and the reliability and operability of the short-circuit test are guaranteed through simple switch button operation. The addition of resistors R1 and R2 plays a role in current limiting and signal stabilization, preventing signal mutations from interfering with the input port of the MCU chip. At the same time, it also ensures the accurate signal collection of the MCU chip, ensuring that the short-circuit test tooling can work according to the predetermined logic, and improving the safety and accuracy of the system.

[0055] Further, such as Figure 3 As shown, the test switch module includes a reset control unit, which includes a switch SW4, a resistor R3 and a resistor R4, wherein the first end of the resistor R3 is connected to the power supply, the second end of the resistor R3 is connected to the first end of the resistor R4, the second end of the resistor R4 is grounded, a common node between the second end of the resistor R3 and the first end of the resistor R4 is connected to the first end of the switch SW4, and the second end of the SW4 is connected to the reset control signal input end of the MCU chip.

[0056] In this embodiment, the reset control unit in the test switch module consists of switch SW4, resistor R3, and resistor R4. Its function is to provide a clear reset signal to the MCU chip, so as to re-initialize the system when needed and prevent the system from malfunctioning due to misoperation or abnormal conditions. The first end of resistor R3 is directly connected to the power supply to ensure that it is always at a high potential state. The second end of resistor R3 is connected to the first end of resistor R4 to form a voltage division network, making the common node in a stable voltage state. The second end of resistor R4 is grounded, so that when the circuit is in the default state, that is, when switch SW4 is not pressed, the voltage of this common node is determined by the resistance ratio of resistor R3 and resistor R4 and remains within the effective level range of the reset control signal input terminal of the MCU chip, ensuring the stable operation of the MCU chip and preventing accidental reset due to power fluctuations or other factors.

[0057] The common node between the second end of resistor R3 and the first end of resistor R4 is also connected to the first end of switch SW4, enabling this point to receive the power supply voltage and discharge to ground through resistor R4. By default, switch SW4 is not pressed. At this time, the reset control signal input terminal of the MCU chip receives the high-level signal provided by resistor R3 through this common node, ensuring the normal operation of the MCU chip. When the tester needs to perform a system reset, press switch SW4. The first end and the second end of switch SW4 are directly conducted to form a low-impedance path, forcing the originally high-level common node to be pulled to the ground potential, causing the reset control signal input terminal of the MCU chip to change from high level to low level, thereby triggering the MCU chip to execute the reset operation and re-initialize the entire system.

[0058] The logic of this circuit structure ensures the reliability of the MCU chip reset signal and also avoids accidental triggering of the reset signal under non-necessary circumstances. The combination of resistor R3 and resistor R4 forms a pull-up and pull-down voltage division network, maintaining the reset input terminal of the MCU chip at a stable high level when switch SW4 is not pressed, and shorting to the ground through switch SW4 when reset is required to achieve low-level trigger reset. It can provide a stable reset control mechanism, enabling the MCU chip to quickly return to the initial state through a simple key operation when software errors, test anomalies, or reloading of the test program occur, avoiding the cumbersome process of power-off restart, and improving the operability and reliability of the system. The manual control method of switch SW4 also ensures that the tester can manually trigger the reset when necessary, preventing the system from entering an uncontrollable state, and enhancing the stability and maintainability of the short-circuit test tooling.

[0059] Furthermore, as Figure 2 shown, a current detection resistor is provided on the detection loop, and the current detection input terminals of the front-end control chip AFE are respectively connected to both ends of the current detection resistor.

[0060] In this embodiment, a current detecting resistor is provided in the detection circuit. Its function is to provide an accurate current detection path, enabling the front-end control chip AFE to monitor and feedback in real time the magnitude of the current flowing through the detection circuit during the short-circuit test. The current detecting resistor is serially installed in the detection circuit, such that all the current passing through the short-circuit test circuit will flow through this resistor, and a voltage difference proportional to the magnitude of the current is formed across its two ends. The current detection input terminals of the front-end control chip AFE are respectively connected to the two ends of the current detecting resistor. This connection method ensures that the AFE can directly measure the voltage drop across the current detecting resistor, and uses the internal high-precision amplification circuit and ADC conversion module to convert this voltage value into an actual current value to provide an accurate short-circuit current measurement result.

[0061] The current detection logic of the AFE chip relies on Ohm's law, that is, the current flowing through the current detecting resistor is equal to the ratio of the voltage drop across the resistor to the resistance value. Therefore, the AFE chip can calculate the actual magnitude of the current in the detection circuit by measuring the voltage difference across the current detecting resistor. This measurement method avoids the complexity of directly measuring large currents, and at the same time can provide high-precision detection results, enabling the short-circuit test tooling to accurately judge whether the current in the short-circuit test circuit exceeds the safety threshold. During the short-circuit test, when the detection circuit is turned on, the current begins to flow through the current detecting resistor, and the current detection input terminals of the AFE chip obtain a voltage signal and calculate the current value in real time. If the current detected by the AFE chip exceeds the set short-circuit protection threshold, for example, exceeds 100A, the AFE will immediately send an overcurrent alarm signal to the MCU chip, or directly trigger the switch drive module to quickly turn off the MOS transistor of the switch management module, thereby cutting off the short-circuit test circuit to prevent the test equipment or battery pack from being damaged due to overcurrent.

[0062] This detection method can provide continuous current monitoring throughout the short-circuit test process, enabling the system to not only detect the initial current at the start of the short-circuit test, but also continuously monitor the current change during the test, thereby analyzing the short-circuit protection performance and response time of the BMS board. In addition, the high-precision detection ability of the AFE chip enables the system to distinguish between normal short-circuit test current and abnormal overcurrent states, making the short-circuit test more intelligent and safe. By adding a current detecting resistor in the detection circuit and using the current detection function of the AFE chip, the short-circuit test tooling can ensure the accuracy of the test data and provide an overcurrent protection function, improving the reliability and safety of the entire short-circuit test system.

[0063] Furthermore, as Figure 4As shown in the figure, the switch driving module includes a resistor R5, a resistor R6, and a driving chip U5. The signal output terminal of the front-end control chip AFE is connected to the first end of the resistor R5. The second end of the resistor R5 is connected to the signal input terminal of the driving chip U5. The signal output terminal of the driving chip U5 is connected to the first end of the resistor R6. The second end of the resistor R6 is connected to the signal input terminal of the switch management module.

[0064] In this embodiment, the switch driving module is composed of a resistor R5, a resistor R6, and a driving chip U5. Its function is to receive the control signal from the front-end control chip AFE, process and amplify the signal, so that it can effectively drive the MOS tube or relay of the switch management module, thereby controlling the conduction or disconnection of the short-circuit test loop. The signal output terminal of the front-end control chip AFE is connected to the first end of the resistor R5, so that when the front-end control chip AFE detects that the short-circuit test current reaches the set condition, it can apply a voltage signal to the resistor R5 through the signal output terminal. The function of the resistor R5 is to limit the current of the signal output by the front-end control chip AFE, to prevent damage caused by excessive current when the signal output terminal of the AFE chip is directly connected to the signal input terminal of the driving chip U5. At the same time, the resistor R5 can also play a role in impedance matching, making the signal transmission more stable and reliable.

[0065] The second end of the resistor R5 is connected to the signal input terminal of the driving chip U5, which means that the signal output by the AFE enters the driving chip U5 for further processing after being attenuated and current-limited by the resistor R5. The function of the driving chip U5 is to perform signal conditioning, amplification, and isolation on the low-power signal transmitted by the front-end control chip AFE, so that it can effectively drive high-power MOS tubes or other switching elements. Since the signal output ability of the front-end control chip AFE is weak, directly driving the MOS tube may not provide enough current. Therefore, signal conversion is required through the driving chip U5 to enable the switch management module to work stably. The driving chip U5 usually includes functions such as level conversion, power amplification, and short-circuit protection inside, ensuring that the control signal of the switch management module can respond quickly and avoiding reverse impact on the front-end control chip AFE caused by high voltage or high current.

[0066] The signal output terminal of the driving chip U5 is connected to the first end of the resistor R6, and the second end of the resistor R6 is connected to the signal input terminal of the switch management module. This connection method ensures that the driving signal can be appropriately current-limited before being transmitted to the switch management module, preventing the driving signal from being too large and causing the MOS transistor to break down or damage other key components of the switch management module. The function of the resistor R6 is to further stabilize the signal, enabling the signal output by the driving chip U5 to enter the switch management module with an appropriate amplitude and intensity, ensuring that the switch management module can accurately execute the switching operation. When the output signal of the driving chip U5 is at a high level, the MOS transistor of the switch management module will be triggered to conduct, closing the short-circuit test loop and entering the execution stage of the test; when the output signal of the driving chip U5 is at a low level, the MOS transistor will be turned off, cutting off the short-circuit test loop and terminating the test.

[0067] This circuit design logic ensures that when the short-circuit test tooling performs a short-circuit test, the AFE can trigger the driving signal by detecting the short-circuit current, and amplify the signal through the driving chip U5, enabling the switch management module to accurately execute the switching instruction. At the same time, the resistors R5 and R6 provide current-limiting and impedance matching functions during signal transmission, ensuring the stability of signal transmission and preventing excessive current from damaging the front-end control chip AFE and the switch management module. The entire system, through the high-precision detection of the front-end control chip AFE, signal amplification and conditioning of the driving chip U5, and precise execution of the switch management module, enables the short-circuit test to be carried out in a safe and controllable state, improving the reliability and accuracy of the test and ensuring the safety of the test equipment and the battery pack under test.

[0068] Furthermore, as Figure 5 shown, the switch management module includes a resistor R21, a zener diode ZD3, and multiple MOS switch conduction units. Each MOS switch conduction unit includes at least one first current-limiting resistor and one MOS transistor. The two conduction ends of the MOS transistor are used to access the detection loop, the controlled end of the MOS transistor is connected to the first end of the first current-limiting resistor, the second end of the first current-limiting resistor is connected to the signal output terminal of the switch driving module, the first end of the resistor R21 is connected to the signal output terminal of the switch driving module, the second end of the resistor R21 is grounded, the negative terminal of the zener diode ZD3 is connected to the signal output terminal of the switch driving module, and the positive terminal of the resistor R21 is grounded.

[0069] In this embodiment, the switch management module consists of a resistor R21, a zener diode ZD3, and multiple MOS switch conduction units. Its function is to achieve precise switch control of the short - circuit test loop according to the control signal of the switch drive module, making the short - circuit test process stable and safe. The MOS switch conduction unit is the core execution unit. Each MOS switch conduction unit includes at least one first current - limiting resistor and one MOS transistor. The two conduction ends of the MOS transistor are directly connected to the detection loop. When the MOS transistor is turned on, the detection loop is closed and current can flow freely, thus completing the short - circuit test. When the MOS transistor is turned off, the detection loop is cut off and the test terminates, thereby realizing the control of the short - circuit test.

[0070] The controlled end of the MOS transistor, that is, the gate, is connected to the first end of the first current - limiting resistor. When the first current - limiting resistor receives the control signal of the switch drive module, the signal will enter the gate of the MOS transistor through the first current - limiting resistor, determining the turn - on or turn - off of the MOS transistor. The second end of the first current - limiting resistor is connected to the signal output end of the switch drive module, enabling the output signal of the switch drive module to directly affect the working state of the MOS transistor and appropriately attenuating the signal through the current - limiting resistor to prevent excessive gate current of the MOS transistor from damaging the MOS transistor or affecting its normal operation. Since the MOS transistor requires a specific gate drive voltage to conduct reliably, the role of the first current - limiting resistor is not only to limit current but also to contribute to the stable transmission of the signal, avoiding mis - turn - on or mis - turn - off of the MOS transistor caused by signal jitter.

[0071] The first end of the resistor R21 is also connected to the signal output end of the switch drive module, and its second end is directly grounded. This connection method ensures that there is always a stable current loop at the signal output end of the switch drive module, enabling the drive signal to effectively act on the controlled end of the MOS transistor without signal attenuation due to high impedance. The presence of the resistor R21 helps to suppress signal spikes, making the drive signal more stable and providing a certain discharge path during the MOS transistor switching process to prevent signal rebound from affecting the stability of the switch state.

[0072] The negative end of the zener diode ZD3 is connected to the signal output end of the switch drive module, and the positive end of the resistor R21 is grounded. Such a connection structure enables the zener diode ZD3 to play a voltage - stabilizing and protecting role when the signal voltage exceeds the set value, ensuring that the gate voltage of the MOS transistor will not be too high to prevent damage to the MOS transistor. The function of the zener diode ZD3 is to limit the maximum drive voltage of the MOS transistor gate, keeping it within the safe operating range at all times, thereby preventing the drive signal from overshooting or abnormally rising and affecting the reliability of the MOS transistor. At the same time, it can also enhance the anti - interference ability of the switch drive module, making the short - circuit test process more stable.

[0073] The logic of the entire switch management module controls the on-off state of the MOS transistor through the signal output of the switch drive module, and ensures the stability and reliability of the drive signal through current limiting and voltage stabilizing measures. When the switch drive module outputs a high-level signal, the first current-limiting resistor provides a drive current to the gate of the MOS transistor, causing the MOS transistor to conduct, closing the short-circuit test loop, and the battery pack enters the short-circuit test state. When the switch drive module outputs a low-level signal, the gate potential of the MOS transistor decreases, the MOS transistor turns off, the short-circuit test loop is cut off, and the test terminates. The resistor R21 provides a stable signal discharge path to avoid misoperation caused by signal floating, and the zener diode ZD3 ensures that the gate voltage does not exceed the safe range of the MOS transistor, preventing the MOS transistor from being damaged due to overvoltage. This switch management mechanism enables the short-circuit test tooling to precisely control the execution time and protection mechanism of the short-circuit test, ensuring both the reliability of the test and improving the safety and stability of the test system.

[0074] Further, as Figure 2 and Figure 7 shown, a battery short-circuit test tooling detection circuit further includes a lamp indication module and a digital tube timing module. The lamp indication module includes multiple indication units. The indication unit at least includes a second current-limiting resistor and a first light-emitting diode. The first end of the second current-limiting resistor is connected to the lamp indication signal output end of the MCU chip, the second end of the second current-limiting resistor is connected to the positive electrode of the first light-emitting diode, and the negative electrode of the first light-emitting diode is grounded. The signal input end of the digital tube timing module is connected to the timing signal output end of the MCU chip.

[0075] In this embodiment, the addition of the lamp indication module and the digital tube timing module enables the battery short-circuit test tooling detection circuit to have real-time visual status feedback and intuitive time control functions, improving the convenience and safety of the test operation. The lamp indication module provides different working status indications through multiple indication units. Each indication unit includes at least one second current-limiting resistor and one first light-emitting diode. When the lamp indication signal output terminal of the MCU chip provides a signal, the second current-limiting resistor limits the current and drives the first light-emitting diode to light up, indicating the short-circuit test status, short-circuit protection status, or over-current protection status of the current system, enabling the tester to intuitively judge the test process and the operating condition of the system, and avoiding misjudgment or unnecessary short-circuit impacts caused by blind operation. The negative terminal of the first light-emitting diode is grounded to ensure the integrity of the current loop, enabling the indicator light to work stably without being affected by voltage fluctuations or current instability. The signal input terminal of the digital tube timing module is connected to the timing signal output terminal of the MCU chip, enabling the MCU to precisely control the duration of the short-circuit test and display the countdown information through the digital tube, prompting the tester of the remaining time or waiting time of the current test, improving the predictability of the test process, ensuring that the tester can make preparations in advance, and avoiding misoperations or safety hazards caused by time uncertainty. This integrated indication and timing function makes the short-circuit test more intelligent and efficient, reduces human intervention, improves test consistency, and enhances the safety and controllability of the short-circuit test.

[0076] Further, as Figure 6 shown, a battery short-circuit test tooling detection circuit further includes a capacitor protection module. The capacitor protection module is connected between the air switch and the switch management module. The capacitor protection module includes two capacitor modules arranged in parallel. Each capacitor module includes a plurality of polar capacitors arranged in parallel with each other.

[0077] In this embodiment, the setting of the capacitor protection module endows the detection circuit of the battery short-circuit test tooling with efficient short-circuit impact buffering ability and enhanced system stability, improving the safety of the short-circuit test process and the reliability of the equipment. This module is connected between the air switch and the switch management module to form a buffer circuit that can absorb the transient current impact when the short-circuit test is triggered. Two parallel capacitor modules ensure a larger total capacitance, enabling the system to effectively absorb and disperse the large current at the moment when the short-circuit test starts, preventing the sudden change current from damaging the test equipment, battery pack, and BMS board. Each capacitor module contains multiple polar capacitors connected in parallel. This parallel structure not only increases the total capacitance but also reduces the equivalent series resistance (ESR), improving the current-carrying capacity of the system, enabling the short-circuit test loop to be fast and stable when the MOS transistor is turned on, without voltage fluctuations or MOS transistor overload damage caused by the transient large current impact. In addition, the capacitor protection module can provide a partial energy recovery function after the short-circuit test ends, gradually decaying the current in the circuit instead of instantaneously disconnecting, reducing the EMI electromagnetic interference caused by the current mutation and improving the anti-interference ability of the entire short-circuit test system. This capacitor buffer design not only improves the safety and stability of the short-circuit test process but also extends the service life of the test equipment, reduces the risk of hardware damage caused by the short-circuit current overshoot, and makes the short-circuit test more controllable, accurate, and efficient.

[0078] Furthermore, the capacitor protection module further includes a capacitor power indication unit. The capacitor power indication unit is connected in parallel with each capacitor module. The capacitor power indication unit includes at least one second light-emitting diode and a third current-limiting resistor. The positive terminal of the second light-emitting diode is connected to the positive terminal of the detection circuit, the negative terminal of the second light-emitting diode is connected to the first end of the third current-limiting resistor, and the second end of the third current-limiting resistor is connected to the negative terminal of the detection circuit.

[0079] In this embodiment, a capacitor power indication unit is added to the capacitor protection module, enabling the battery short-circuit test tooling detection circuit to have the functions of real-time capacitor status monitoring and remaining charge indication, improving the safety and operability of the test process. The capacitor power indication unit is connected in parallel with each capacitor module, enabling it to synchronously monitor the charging status of the capacitor module when the short-circuit test tooling is running. The positive terminal of the second light-emitting diode is connected to the positive terminal of the detection circuit, and the negative terminal is connected to the negative terminal of the detection circuit through the third current-limiting resistor. When there is still charge in the capacitor module, a current path is formed in the circuit, and the second light-emitting diode is lit, indicating to the tester that the capacitor has not been fully discharged, avoiding accidental touch or operation in the charged state, and preventing electric shock or equipment damage caused by residual charge. The addition of the third current-limiting resistor ensures the stability of the indication current, prevents the light-emitting diode from being damaged due to overcurrent, and at the same time makes the brightness of the indicator lamp proportional to the remaining voltage of the capacitor, enabling the tester to intuitively judge whether the capacitor is in a safe state based on the on / off situation of the indicator lamp. This design not only provides a visual safety warning function, reduces the risk of misoperation, but also improves the user experience of the short-circuit test tooling, makes the test process more intelligent and safe, and enhances the management ability of the short-circuit test tooling for high-voltage stored charges.

[0080] The above-described embodiments are only used to illustrate the technical solutions of the present application, and are not intended to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions described in the foregoing embodiments, or perform equivalent replacements for some of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the various embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. A detection circuit for a battery short-circuit test tooling, characterized in that, The detection circuit of the battery short-circuit test tooling includes the BMS board to be tested, an air switch, and a short-circuit test tooling. The short-circuit test tooling includes a test switch module, a control module, a switch driving module, and a switch management module. The BMS board to be tested, the air switch, and the switch management module are connected in series with each other to form a detection loop. The signal output end of the test switch module is connected to the signal input end of the control module. The signal output end of the control module is connected to the signal input end of the switch driving module. The signal output end of the switch driving module is connected to the signal input end of the switch management module; The test switch module is for the tester to manually press the corresponding test switch to generate a corresponding switch signal. After receiving the switch signal, the control module drives the switch management module to conduct or disconnect through the switch driving module, thereby simulating a corresponding test state; The control module includes a front-end control chip AFE and an MCU chip. The signal input end of the MCU chip is connected to the signal output end of the test switch module. The data communication end of the MCU chip and the data communication end of the front-end control chip AFE are connected. The signal output end of the front-end control chip AFE is connected to the signal input end of the switch driving module; A current detection resistor is provided on the detection loop. The current detection input ends of the front-end control chip AFE are respectively connected to both ends of the current detection resistor; The switch driving module includes a resistor R5, a resistor R6, and a driving chip U5. The signal output end of the front-end control chip AFE is connected to the first end of the resistor R5. The second end of the resistor R5 is connected to the signal input end of the driving chip U5. The signal output end of the driving chip U5 is connected to the first end of the resistor R6. The second end of the resistor R6 is connected to the signal input end of the switch management module; The switch management module includes a resistor R21, a zener diode ZD3, and multiple MOS switch conduction units. Each MOS switch conduction unit includes at least one first current-limiting resistor and one MOS transistor. The two conduction ends of the MOS transistor are used to access the detection loop. The controlled end of the MOS transistor is connected to the first end of the first current-limiting resistor. The second end of the first current-limiting resistor is connected to the signal output end of the switch driving module. The first end of the resistor R21 is connected to the signal output end of the switch driving module. The second end of the resistor R21 is grounded. The negative end of the zener diode ZD3 is connected to the signal output end of the switch driving module. The positive end of the resistor R21 is grounded.

2. The detection circuit of a battery short-circuit test tooling according to claim 1, wherein, The signal input terminals of the MCU chip include a conduction control signal input port and a disconnection control signal input port. The test switch module includes a conduction control unit and a disconnection control unit. The conduction control unit includes a switch SW2 and a resistor R1. The first end of the resistor R1 is connected to the conduction control signal input port. The second end of the resistor R1 is connected to the first end of the switch SW2. The second end of the switch SW2 is grounded. The disconnection control unit includes a switch SW3 and a resistor R2. The first end of the resistor R2 is connected to the disconnection control signal input port. The second end of the resistor R1 is connected to the first end of the switch SW3. The second end of the switch SW3 is grounded.

3. The detection circuit of a battery short - circuit test tooling according to claim 1, wherein The test switch module includes a reset control unit. The reset control unit includes a switch SW4, a resistor R3, and a resistor R4. The first end of the resistor R3 is connected to the power supply. The second end of the resistor R3 is connected to the first end of the resistor R4. The second end of the resistor R4 is grounded. The common node between the second end of the resistor R3 and the first end of the resistor R4 is connected to the first end of the switch SW4. The second end of the SW4 is connected to the reset control signal input terminal of the MCU chip.

4. A detection circuit for a battery short - circuit test tooling according to claim 1, wherein, The battery short-circuit test tooling detection circuit further includes a lamp indication module and a digital tube timing module. The lamp indication module includes a plurality of indication units. Each indication unit includes at least one second current-limiting resistor and a first light-emitting diode. The first end of the second current-limiting resistor is connected to the lamp indication signal output terminal of the MCU chip. The second end of the second current-limiting resistor is connected to the positive electrode end of the first light-emitting diode. The negative electrode end of the first light-emitting diode is grounded. The signal input terminal of the digital tube timing module is connected to the timing signal output terminal of the MCU chip.

5. The detection circuit of a battery short - circuit test tooling according to claim 1, wherein, The battery short-circuit test tooling detection circuit further includes a capacitor protection module. The capacitor protection module is connected between the air switch and the switch management module. The capacitor protection module includes two capacitor modules connected in parallel. Each capacitor module includes a plurality of polar capacitors connected in parallel.

6. The detection circuit of a battery short - circuit test tooling according to claim 5, characterized in that, The capacitor protection module further includes a capacitor power indication unit. The capacitor power indication unit is connected in parallel with each capacitor module. The capacitor power indication unit includes at least one second light-emitting diode and a third current-limiting resistor. The positive electrode end of the second light-emitting diode is connected to the positive electrode end of the detection circuit. The negative electrode end of the second light-emitting diode is connected to the first end of the third current-limiting resistor. The second end of the third current-limiting resistor is connected to the negative electrode end of the detection circuit.

Images