Method and system for measuring frequency response characteristics of an electronic device based on an OFDM signal

Abstract

The present application relates to a method for measuring the frequency response characteristics of an electronic device based on an OFDM signal, which includes: generating a target input signal; connecting the target input signal to a first measurement object and measuring a first output signal output by the first measurement object; connecting the first output signal to a second measurement object configured in a first state and measuring a second output signal output by the second measurement object; the second measurement object is different from the first measurement object, and the second output signal is different from the first output signal; calculating first frequency response information of the second measurement object in the first state according to the frequency response difference between the first output signal and the second output signal. Through the above method, the present application can reduce the measurement cost of the frequency response information of the electronic device and improve the measurement accuracy of the frequency response information.

Description

Technical Field

[0001] The present application relates to the technical field of integrated circuits, and in particular, to a method and system for measuring the frequency response characteristics of electronic devices based on OFDM signals. Background Art

[0002] Currently, there are mainly two methods for measuring the frequency response characteristics of integrated circuits. One is to use a Vector Network Analyzer (VNA). The signal generated by the VNA is connected to the integrated circuit, and then the output signal passing through the integrated circuit is connected to another port of the VNA. This method obtains the frequency response characteristics of the integrated circuit with the help of the VNA instrument. The other is to use a signal generator and a digital oscilloscope. The input signal generated by the signal generator is connected to the integrated circuit, and the input signal and the output signal of the integrated circuit are connected to the digital oscilloscope. The frequency response characteristics of the integrated circuit are analyzed with the help of the digital oscilloscope.

[0003] However, the above-mentioned related technologies have the following defects: 1) The VNA is too expensive, making the measurement cost of the frequency response characteristics of integrated circuits too high; 2) The digital oscilloscope can only support the measurement of low-frequency signals and cannot support the measurement of high-frequency and intermediate-frequency signals, with a narrow scope of application; 3) Using other instruments with lower costs except for the VNA and the digital oscilloscope cannot meet the measurement accuracy requirements of the frequency response characteristics of integrated circuits. Summary of the Invention

[0004] To solve the deficiencies of the related technologies, the purpose of the present application is to provide a method and system for measuring the frequency response characteristics of electronic devices based on OFDM signals, which have the effects of reducing the measurement cost of frequency response characteristics, increasing the frequency range of frequency response characteristics measurement, and improving the measurement accuracy of frequency response characteristics.

[0005] In a first aspect, the present application provides a method for measuring the frequency response characteristics of electronic devices based on OFDM signals, including:

[0006] Generating a target input signal;

[0007] Connecting the target input signal to a first measurement object and measuring a first output signal output by the first measurement object;

[0008] Connecting the first output signal to a second measurement object configured in a first state and measuring a second output signal output by the second measurement object; the second measurement object is different from the first measurement object, and the second output signal is different from the first output signal;

[0009] Calculate the first frequency response information of the second measurement object in the first state according to the frequency response difference between the first output signal and the second output signal.

[0010] By adopting the above technical solution, it is possible to measure with a low-cost device while meeting the measurement accuracy of the frequency response characteristics of the second measurement object, thereby reducing the cost of measurement.

[0011] Preferably, the above generation of the target input signal includes:

[0012] Generate an initial input signal based on OFDM;

[0013] Convert the initial input signal to obtain the target input signal, and send the target input signal.

[0014] By adopting the above technical solution, it is possible to generate a target input signal that meets the requirements of frequency response characteristic measurement, enabling a low-cost device to also accurately measure the frequency response characteristics of the second measurement object.

[0015] Preferably, the above method for measuring the frequency response characteristics of an electronic device based on an OFDM signal further includes:

[0016] Change at least one configuration information of the second measurement object to switch the second measurement object from the first state to a second state; the second state is different from the first state;

[0017] Connect the first output signal to the second measurement object in the second state, and measure the third output signal output by the second measurement object;

[0018] Calculate the second frequency response information of the second measurement object in the second state according to the frequency response difference between the first output signal and the third output signal.

[0019] By adopting the above technical solution, it is possible to measure the frequency response characteristics of the second measurement object in the state under different configurations.

[0020] Preferably, the above method for measuring the frequency response characteristics of an electronic device based on an OFDM signal further includes:

[0021] Calculate the third frequency response information of the second measurement object according to the frequency response difference between the second output signal and the third output signal; the third frequency response information characterizes the frequency response change that occurs when the second measurement object switches from the first state to the second state.

[0022] By adopting the above technical solution, it is possible to measure the frequency response characteristics exhibited when the state of the second measurement object is switched.

[0023] Preferably, the target input signal includes at least two subcarrier signals, the at least two target sub-signals are orthogonal to each other in the frequency domain, and are implemented by orthogonal frequency division multiplexing technology.

[0024] By adopting the above technical solution, during the measurement of the frequency response characteristics, it is beneficial for devices with lower costs to measure the frequency response characteristics of the first measurement object and the second measurement object, and reduce the difficulty of improving the accuracy.

[0025] In a second aspect, the present application also proposes a system for measuring the frequency response characteristics of an electronic device based on an OFDM signal, including:

[0026] A signal generation device for generating a target input signal;

[0027] A first measurement device for connecting the target input signal to a first measurement object to obtain a first output signal output by the first measurement object;

[0028] A second measurement device for connecting the first output signal to a second measurement object configured in a first state and measuring a second output signal output by the second measurement object; the second measurement object is different from the first measurement object, and the second output signal is different from the first output signal;

[0029] A first calculation device for calculating first frequency response information of the second measurement object in the first state according to the frequency response difference between the first output signal and the second output signal.

[0030] By adopting the above technical solution, it is possible to measure using a device with low cost while meeting the measurement accuracy of the frequency response characteristics of the second measurement object, thereby reducing the cost of measurement.

[0031] Preferably, the signal generation device includes:

[0032] A signal generation unit for generating an initial input signal based on OFDM;

[0033] A signal conversion unit for performing signal conversion on the initial input signal to obtain the target input signal and sending the target input signal.

[0034] By adopting the above technical solution, it is possible to generate a target input signal that meets the requirements for measuring the frequency response characteristics, enabling a device with lower cost to also achieve accurate measurement of the frequency response characteristics of the second measurement object.

[0035] Preferably, the system further includes:

[0036] A third measuring device, configured to connect the first output signal to the second measuring object in the second state to measure a third output signal output by the second measuring object when at least one configuration information of the second measuring object is changed and the second measuring object is switched from the first state to the second state; the second state is different from the first state;

[0037] A second calculating device, configured to calculate second frequency response information of the second measuring object in the second state according to a frequency response difference between the first output signal and the third output signal.

[0038] By adopting the above technical solution, it is possible to measure the frequency response characteristics of the second measuring object in different configurations.

[0039] Preferably, the system further includes:

[0040] A third calculating device, configured to calculate third frequency response information of the second measuring object according to a frequency response difference between the second output signal and the third output signal; the third frequency response information characterizes a frequency response change that occurs when the second measuring object is switched from the first state to the second state.

[0041] By adopting the above technical solution, it is possible to measure the frequency response characteristics exhibited when the second measuring object switches states.

[0042] Preferably, the target input signal includes at least two target sub-signals, the at least two target sub-signals are orthogonal to each other in the frequency domain, and are implemented by orthogonal frequency division multiplexing technology.

[0043] By adopting the above technical solution, during the measurement of the frequency response characteristics, it is beneficial for a device with a lower cost to measure the frequency response characteristics of the first measuring object and the second measuring object, and the difficulty of improving the accuracy is reduced.

[0044] In summary, the beneficial effects of this application are:

[0045] 1. When the measurement accuracy of the frequency response characteristics of the second measuring object is satisfied, a device with a low cost is used for measurement, thereby reducing the cost of measurement;

[0046] 2. Generate a target input signal that meets the requirements for measuring the frequency response characteristics. During the measurement of the frequency response characteristics, it is beneficial for a device with a lower cost to measure the frequency response characteristics of the first measuring object and the second measuring object, and the difficulty of improving the accuracy is reduced;

[0047] 3. Implement the measurement of the frequency response characteristics of the second measurement object in different configurations, and the frequency response characteristics exhibited when the state of the second measurement object switches. Description of the Drawings

[0048] Figure 1 is a schematic flowchart of a method for measuring the frequency response characteristics of an electronic device based on an OFDM signal provided by this application.

[0049] Figure 2 is a schematic flowchart of a method for generating a target input signal provided by this application.

[0050] Figure 3 is another schematic flowchart of a method for measuring the frequency response characteristics of an electronic device based on an OFDM signal provided by this application.

[0051] Figure 4 is yet another schematic flowchart of a method for measuring the frequency response characteristics of an electronic device based on an OFDM signal provided by this application.

[0052] Figure 5 is a schematic diagram of the system framework for measuring the frequency response characteristics of an electronic device based on an OFDM signal provided by this application.

[0053] Figure 6 is a schematic diagram of the system structure for measuring the frequency response characteristics of an electronic device based on an OFDM signal provided by this application.

[0054] Figure 7 is another schematic diagram of the system structure for measuring the frequency response characteristics of an electronic device based on an OFDM signal provided by this application. Detailed Implementation Manner

[0055] Next, the technical solutions in the embodiments of this application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of this application.

[0056] Refer to Figure 1 , which is a schematic flowchart of a method for measuring the frequency response characteristics of an electronic device based on an OFDM signal disclosed in this application, applied to an integrated circuit, and includes:

[0057] S101: Generate a target input signal;

[0058] In the embodiments of this application, the target input signal can be generated by a signal generating device, or can be obtained by performing signal conversion on the initial input signal generated by the signal generating device.

[0059] In a specific embodiment, the target input signal may be a digital signal applied to digital circuit testing. Correspondingly, the signal generating device may be a digital signal generator or a mixed signal generator.

[0060] In a specific embodiment, the target input signal may be an analog signal applied to analog circuit testing. Correspondingly, the signal generating device may be an analog signal generator or a mixed signal generator.

[0061] In a specific embodiment, the target input signal may be a low-frequency signal, a medium-frequency signal, or a high-frequency signal.

[0062] In practical applications, compared with the cases where the target input signal is a low-frequency signal or a medium-frequency signal, when the target input signal is a high-frequency signal, the degree of influence by interference and multipath effects is lower, and the measurement accuracy of frequency response information is higher.

[0063] S102: Connect the target input signal to a first measurement object and measure a first output signal output by the first measurement object;

[0064] In the embodiments of the present application, the first measurement object may be a reference measurement object. When the first measurement object serves as a carrier of the target input signal, the frequency response characteristic of the first output signal may be a reference frequency response characteristic. Specifically, the reference frequency response characteristic may include a reference amplitude characteristic and / or a reference phase characteristic.

[0065] It can be understood that the reference measurement object may be at least one signal transmission line or a reference integrated circuit. The channel through which the target input signal is transmitted in the reference measurement object may be a reference channel. The reference frequency response characteristic may be the frequency response characteristic of the reference channel.

[0066] In practical applications, multiple signal transmission lines may be used to connect the output end of the signal generating device and the input end of the signal measuring device to form a path. When the target input signal passes through the path, the frequency response characteristics of the multiple signal transmission lines are measured.

[0067] S103: Connect the first output signal to a second measurement object configured in a first state and measure a second output signal output by the second measurement object; the second measurement object is different from the first measurement object, and the second output signal is different from the first output signal;

[0068] In the embodiments of the present application, the second measurement object may be the target measurement object, and the first state may be the initial state of the target measurement object, or may be other states other than the initial state, such as the standby state and the sleep state. When the target measurement object in the initial state serves as the carrier of the target input signal, the second output signal may be used to measure the initial frequency response characteristic of the target measurement object.

[0069] In a specific embodiment, the target measurement object may be an integrated circuit, including an analog circuit, a digital circuit, and a mixed circuit. Among them, the mixed circuit can be used to process or transmit analog signals and digital signals.

[0070] It can be understood that when the target measurement object in the initial state serves as the carrier of the first output signal, the channel through which the first output signal is transmitted in the target measurement object may be the initial measurement channel. The frequency response characteristic of the initial measurement channel may be the initial frequency response characteristic.

[0071] In practical applications, the target measurement object may be an electronic device, such as a chip, and the chip is a packaged integrated circuit device.

[0072] In practical applications, at least one signal transmission line can be used to connect the output end of the signal generating device and the input end of the target measurement object, and at least one signal transmission line can be used to connect the output end of the target measurement object and the input end of the signal testing device to form a path. When the target input signal passes through the path, the frequency response characteristic of the initial measurement channel is measured and calculated.

[0073] S104: Calculate the first frequency response information of the second measurement object in the first state according to the frequency response difference between the first output signal and the second output signal.

[0074] In the embodiments of the present application, when measuring the target measurement object, signal transmission lines need to be used for connection to form a path between the signal generating device, the target measurement object, and the signal analysis device, or to form a path between the signal generating device, the up-conversion device, the target measurement object, the down-conversion device, and the signal analysis device.

[0075] It can be understood that the second output signal characterizes the total frequency response characteristics of the first measurement object and the second measurement object. The second output signal cannot directly reflect the frequency response characteristic of the target measurement object in the first state and needs to be analyzed in combination with the frequency response characteristic of the first output signal.

[0076] In a specific embodiment, the first measurement object may also be a reference integrated circuit. In practical applications, when measuring the reference integrated circuit, a signal transmission line needs to be used for connection to form a path between the signal generating device, the reference integrated circuit, and the signal analysis device, or to form a path between the signal generating device, the up-conversion device, the reference integrated circuit, the down-conversion device, and the signal analysis device. In this case, the first output signal characterizes the overall frequency response characteristics of the reference integrated circuit and the at least one signal transmission line. However, this does not affect the subsequent measurement of the frequency response characteristics of the second measurement object in the first state or the second state.

[0077] In a specific embodiment, when measuring the first output signal, if the first output signal is a high-frequency signal, after obtaining the first output signal, the first output signal is input into a down-conversion device to perform down-conversion on the first output signal to obtain a fourth output signal. When measuring the second output signal, if the second output signal is a high-frequency signal, the second output signal is input into the down-conversion device to obtain a fifth output signal. Based on the fourth output signal and the fifth output signal, the first frequency response characteristic information is calculated.

[0078] In a specific embodiment, the frequency response characteristic of the first output signal can be mathematically expressed as Formula 1, and the frequency response characteristic of the second output signal can be mathematically expressed as Formula 2. Based on the frequency response characteristic of the first output signal and the frequency response characteristic of the second output signal, the frequency response characteristic of the target measurement object is calculated , as shown in Formula 3:

[0079] , (Formula 1)

[0080] , (Formula 2)

[0081] , (Formula 3)

[0082] where is the amplitude characteristic parameter of is the phase characteristic parameter of is the amplitude characteristic parameter of is the phase characteristic parameter of is the amplitude characteristic parameter, For the phase characteristic parameters. Among them, the angular frequencies of the first output signal, the second output signal, and the first frequency response information.

[0083] According to formula (3), the amplitude characteristic of the second measurement object in the first state is , and the phase characteristic is .

[0084] Through the above solution, the frequency response characteristics of the second measurement object in different states can be accurately measured. This solution is applicable to various signal generation devices and signal analysis devices, does not rely on expensive signal generation devices and signal analysis devices, and can effectively reduce costs.

[0085] In a specific embodiment, as Figure 2 shown, it is a schematic flowchart of a method for generating a target input signal provided by this application. The generation of the target input signal includes:

[0086] S201: Generate an initial input signal based on OFDM;

[0087] In a specific embodiment, the initial input signal may be a baseband signal, and the baseband signal may be a low-frequency OFDM signal. When the signal generator generates the baseband signal, it transmits the baseband signal to an up-conversion device, and the up-conversion device processes the baseband signal to obtain the target input signal.

[0088] S202: Perform signal conversion on the initial input signal to obtain the target input signal, and send the target input signal.

[0089] In a specific embodiment, the up-conversion device performs signal conversion on the initial input signal to obtain the target input signal. Specifically, the signal conversion process can be processed by the up-conversion device, and the processing steps may include serial-to-parallel conversion, modulation, inverse fast Fourier transform (IFFT), adding a cyclic prefix, digital-to-analog conversion, and up-conversion. The target input signal is sent from the output end of the up-conversion device.

[0090] By adopting the above technical solution, a target input signal that meets the requirements of frequency response characteristic measurement can be generated, enabling devices with lower costs to also achieve accurate measurement of the frequency response characteristics of the second measurement object.

[0091] As Figure 3 shown, it is another method for measuring the frequency response characteristics of an electronic device based on an OFDM signal provided by an embodiment of this application. The method for measuring the frequency response characteristics of an OFDM-based electronic device further includes:

[0092] S301: Change at least one configuration information of the second measurement object to switch the second measurement object from the first state to a second state; the second state is different from the first state.

[0093] In a specific embodiment, the at least one configuration information may include, but is not limited to, the working mode, working temperature, and communication protocol of the second measurement object. When changing the working mode of the second measurement object, the second state may include a sleep state, no-load state, and full-load state. When changing the working temperature of the second measurement object, the second state may include a low-temperature working state and a high-temperature working state. When changing the communication protocol of the second measurement object, the second state may include a Wi-Fi working state, a Bluetooth working state, and a ZigBee working state.

[0094] It can be understood that the second state is different from the first state, and the second state and the first state can be interchanged.

[0095] S302: Connect the first output signal to the second measurement object in the second state, and measure the third output signal output by the second measurement object.

[0096] When the target measurement object in the second state is the carrier of the first output signal, the second output signal can be used to measure the first frequency response information of the target measurement object. The first frequency response information characterizes the frequency response characteristics of the target measurement object in the second state, including amplitude characteristics and phase characteristics.

[0097] It can be understood that when the target measurement object in the second state is the carrier of the first output signal, the channel through which the target input signal is transmitted in the reference measurement object and the target measurement object can be the second state measurement channel. The frequency response characteristics of the second state measurement channel can be the frequency response characteristics of the target measurement object in the second state.

[0098] In practical applications, when the signal generated by the signal generating device is the target input signal, multiple signal transmission lines can be used to connect the output end of the signal generating device and the input end of the target measurement object, and connect the output end of the target measurement object and the input end of the signal testing device to form a path. When the target input signal passes through the path, the second frequency response information is measured.

[0099] In practical applications, when the signal generated by the signal generating device is the initial input signal, multiple signal transmission lines can be used to connect the output end of the signal generating device and the input end of the up-conversion device, and connect the output end of the up-conversion device and the input end of the target measurement object. When the signal analysis device can analyze high-frequency signals, multiple signal transmission lines can be used to connect the output end of the target measurement object and the input end of the signal testing device to form a path. When the signal analysis device can analyze low-frequency signals, the output end of the target measurement object is connected to the input end of the down-conversion device, and the output end of the down-conversion device is connected to the input end of the signal testing device to form a path. When the target input signal passes through the path, the second frequency response information is measured and calculated.

[0100] Among them, the signal processing of the down-conversion device includes down-conversion, analog-to-digital conversion, removal of cyclic prefix, fast Fourier transform (FFT), demodulation, and serial-to-parallel conversion.

[0101] S303: Calculate the second frequency response information of the second measurement object in the second state according to the frequency response difference between the first output signal and the third output signal.

[0102] Specifically, the frequency response difference includes amplitude characteristic difference and also includes phase characteristic difference.

[0103] In a specific embodiment, when the third output signal is a high-frequency signal, the third output information is connected to the down-conversion device, and the output of the down-conversion device is connected to the signal analysis device to measure the sixth output information. According to the sixth output information, the second frequency response information is calculated.

[0104] In practical applications, when the initial input signal is a baseband signal, multiple signal transmission lines can be used to connect the output end of the signal generating device and the input end of the up-conversion device, connect the output end of the up-conversion device and the input end of the reference measurement object, connect the output end of the reference measurement object and the input end of the down-conversion device, and connect the output end of the down-conversion device to the signal analysis device. The signal generating device generates a baseband signal to form a path, and the signal analysis device measures and obtains the fourth output information.

[0105] Replacing the above reference measurement object with the second measurement object in the first state, the fifth output information can be measured. Replacing the above reference measurement object with the second measurement object in the first state, the sixth output information can be measured.

[0106] In a specific embodiment, the frequency response characteristic of the third output signal can be mathematically expressed as Formula 4. According to the frequency response characteristic of the first output signal and the frequency response characteristic of the third output signal, the second frequency response information is calculated See Formula 5:

[0107] , (Formula 4)

[0108] , (Formula 5)

[0109] wherein is the amplitude characteristic parameter of is the phase characteristic parameter of; is the amplitude characteristic parameter of is the phase characteristic parameter of. Wherein is the angular frequency of the first output signal and the first frequency response information.

[0110] wherein, the amplitude characteristic of the second measurement object in the second state is , and the phase characteristic is .

[0111] By adopting the above technical solution, it is possible to measure the frequency response characteristics of the second measurement object in different configurations.

[0112] As Figure 4 shown, another method for measuring the frequency response characteristics of an electronic device based on an OFDM signal provided by an embodiment of the present application, the method for measuring the frequency response characteristics of an OFDM-based electronic device further includes:

[0113] S401: Obtain third frequency response information of the second measurement object according to the frequency response difference between the second output signal and the third output signal; the third frequency response information characterizes the frequency response change that occurs when the second measurement object switches from the first state to the second state.

[0114] In a specific embodiment, the third frequency response information can be mathematically expressed as Formula 6. According to the first frequency response information and the second frequency response information, the third frequency response information is calculated , see Formula 7:

[0115] , (Formula 6)

[0116] , (Formula 7)

[0117] Wherein, is the amplitude characteristic parameter of is the phase characteristic parameter of is the angular frequency of the first frequency response information.

[0118] Wherein, the amplitude characteristic transition of the second measurement object switching from the first state to the second state is , and the phase characteristic transition is .

[0119] By adopting the above technical solution, it is possible to measure the frequency response characteristics exhibited when the state of the second measurement object is switched.

[0120] In a specific embodiment, the target input signal includes at least two target sub-signals, the at least two target sub-signals are orthogonal to each other in the frequency domain, and are implemented by orthogonal frequency division multiplexing (OFDM) technology.

[0121] In a specific embodiment, the initial input signal can be an analog signal converted after the OFDM signal undergoes baseband processing and radio frequency processing. Correspondingly, the at least two target sub-signals can be at least two sub-carriers of the OFDM signal.

[0122] In a specific embodiment, in order to obtain the OFDM input signal, the signal conversion step may include serial-to-parallel conversion, modulation, inverse fast Fourier transform (IFFT), adding a cyclic prefix, digital-to-analog conversion, and a conversion that requires up-conversion for high-frequency OFDM signals in particular.

[0123] The embodiment of the present application relates to a system for measuring the frequency response characteristics of an electronic device based on an OFDM signal, refer to Figure 5, the system for measuring the frequency response characteristics of an electronic device based on an OFDM signal includes a signal generating device 51, an up-conversion device 52, a measurement object 53, a down-conversion device 54, a signal analysis device 55, and at least one signal transmission line 56. Specifically, the at least one signal transmission line 56 is used to connect the output end of the signal generating device 51 and the input end of the up-conversion device 52, the output end of the up-conversion device 52 and the input port of the measurement object 53, and is also used to connect the output port of the measurement object 53 and the input port of the down-conversion device 54, and the output port of the down-conversion device 54 and the input port of the signal analysis device 55. Among them, the measurement object 53 can be the first measurement object or the second measurement object.

[0124] Among them, the signal generating device 51 generates an initial input signal, and the initial input signal can be an OFDM baseband signal. Particularly for the measurement of high-frequency devices, the baseband signal needs to be processed by the up-conversion device 52 to obtain a high-frequency target input signal. The target input signal can be an OFDM signal, and the OFDM signal includes a plurality of orthogonal subcarriers. When the OFDM signal is loaded on the measurement object 53, the frequency response characteristics of the measurement object 53 will affect the frequency response characteristics of the OFDM signal, specifically, the amplitude and phase of the OFDM signal change. The down-conversion device 54 performs down-conversion processing on the changed OFDM signal to obtain a changed baseband signal. The signal analysis device 55 analyzes the changed baseband signal to obtain the frequency response characteristics of the changed baseband signal.

[0125] Among them, the frequency response characteristics changes caused by loading the OFDM signal on the first measurement object and the second measurement object are different. The frequency response characteristics changes caused by loading the OFDM signal on the second measurement object in the first state and the frequency response characteristics changes caused by loading the OFDM signal on the second measurement object in the second state are also different. By comparing the frequency response characteristics of the first output signal and the second output signal, the frequency response characteristics of the second measurement object in the first state can be obtained. By comparing the frequency response characteristics of the first output signal and the third output signal, the frequency response characteristics of the second measurement object in the second state can be obtained. From the frequency response characteristics of the first frequency response information and the second frequency response information, the frequency response characteristics changes that occur when the second measurement object transitions from the first state to the second state can be obtained.

[0126] Among them, such as Figure 5As shown, the signal generating device 51 also generates a reference clock signal (reference clock signal transmission channel 57), and sends the reference clock to the up-conversion device 52, the down-conversion device 54, and the signal analysis device 55 to achieve reference clock synchronization. The signal generating device 51 also generates a clock pulse signal (clock pulse signal transmission line 58), and sends the clock pulse signal to the signal analysis device 55 to achieve clock synchronization. Reference synchronization is beneficial to reducing the frequency offset interference suffered by the OFDM signal during transmission, and reducing the frequency phase drift and jitter caused by different crystal oscillators; while clock synchronization is beneficial to reducing the clock offset interference suffered by the OFDM signal during transmission.

[0127] Figure 5 The dashed boxes in indicate that the up-conversion device 52 and the signal generating device 51 can communicate internally; the down-conversion device 54 and the signal analysis device 55 can communicate internally. Or, it means that the up-conversion device 52 and the signal generating device 51 can be integrated, and the down-conversion device 54 and the signal analysis device 55 can be integrated.

[0128] In the embodiment of the present application, the advantage of loading the signal of the measurement object with the OFDM signal is that the characteristics of the OFDM signal including multiple orthogonal subcarriers can be utilized, so that the influence of the frequency response characteristics of the measurement object on the multiple orthogonal subcarriers is independent of each other and does not affect each other. It is beneficial to improve the measurement accuracy. At the same time, since the OFDM signal is a broadband signal, the characteristics at multiple frequency points can be measured simultaneously through the OFDM signal.

[0129] In a specific embodiment, when the signal generating device 51 can generate a high-frequency OFDM signal, the up-conversion device 52 can be omitted in Figure 5 When the signal analysis device 55 can analyze a high-frequency OFDM signal, the down-conversion device 54 can also be omitted in Figure 5

[0130] In a specific embodiment, the signal analysis device 55 can be a signal analyzer.

[0131] The embodiment of the present application also discloses a system for measuring the frequency response characteristics of an electronic device based on an OFDM signal. Refer to Figure 6 , including:

[0132] A signal generation device 61 for generating a target input signal;

[0133] A first measurement device 62 for connecting the target input signal to a first measurement object to obtain a first output signal output by the first measurement object;

[0134] ​A second measuring device 63 for connecting the first output signal to a second measurement object configured in a first state and measuring a second output signal output by the second measurement object; the second measurement object is different from the first measurement object, and the second output signal is different from the first output signal;

[0135] A first computing device 64 for calculating first frequency response information of the second measurement object in the first state according to a frequency response difference between the first output signal and the second output signal.

[0136] The signal generating device 61 includes:

[0137] A signal generating unit for generating an initial input signal based on OFDM;

[0138] A signal conversion unit for performing signal conversion on the initial input signal to obtain the target input signal and sending the target input signal.

[0139] The system further includes:

[0140] A third measuring device for, when at least one configuration information of the second measurement object is changed and the second measurement object is switched from the first state to a second state, connecting the first output signal to the second measurement object in the second state and measuring a third output signal output by the second measurement object; the second state is different from the first state;

[0141] A second computing device for calculating second frequency response information of the second measurement object in the second state according to a frequency response difference between the first output signal and the third output signal.

[0142] The system further includes:

[0143] A third computing device for calculating third frequency response information of the second measurement object according to a frequency response difference between the second output signal and the third output signal; the third frequency response information characterizes a frequency response change that occurs when the second measurement object is switched from the first state to the second state.

[0144] The target input signal includes at least two target sub-signals that are orthogonal to each other in the frequency domain and are implemented by orthogonal frequency division multiplexing technology.

[0145] An embodiment of the present application also discloses another system for measuring the frequency response characteristics of an electronic device based on an OFDM signal, refer to Figure 7 , including:

[0146] A signal generation device 71 for generating a target input signal;

[0147] A first measurement device 72 for connecting the target input signal to a first measurement object and measuring a first output signal output by the first measurement object;

[0148] A second measurement device 73 for connecting the first output signal to a second measurement object configured in a first state and measuring a second output signal output by the second measurement object; the second measurement object is different from the first measurement object, and the second output signal is different from the first output signal;

[0149] A first calculation device 74 for calculating first frequency response information of the second measurement object in the first state according to a frequency response difference between the first output signal and the second output signal.

[0150] The signal generation device 71 includes:

[0151] A signal generation unit for generating an initial input signal based on OFDM;

[0152] A signal conversion unit for performing signal conversion on the initial input signal to obtain the target input signal and sending the target input signal.

[0153] The system further includes:

[0154] A third measurement device for, when at least one configuration information of the second measurement object is changed and the second measurement object is switched from the first state to a second state, connecting the first output signal to the second measurement object in the second state and measuring a third output signal output by the second measurement object; the second state is different from the first state;

[0155] A second calculation device for calculating second frequency response information of the second measurement object in the second state according to a frequency response difference between the first output signal and the third output signal.

[0156] The system further includes:

[0157] A third calculation device for calculating third frequency response information of the second measurement object according to a frequency response difference between the second output signal and the third output signal; the third frequency response information characterizes a frequency response change that occurs when the second measurement object is switched from the first state to the second state.

[0158] The target input signal includes at least two target sub-signals, the at least two target sub-signals are orthogonal to each other in the frequency domain, and are implemented by orthogonal frequency division multiplexing technology.

[0159] The implementation principle of the embodiments of this application is as follows: The multiple subcarriers of the OFDM signal are orthogonal, having the advantages of anti-multipath effect, easy synchronization, and adaptability to various different channel conditions. According to the first output signal obtained by loading the OFDM signal on the reference measurement object and the second output signal obtained by loading it on the electronic device, the embodiments of this application can accurately obtain the frequency response characteristics of the second measurement object in different states. In this process, the problems of frequency offset and clock offset of the OFDM signal are solved through clock synchronization and frequency synchronization. Coarse clock synchronization between the transmitter and the receiver can be achieved through the trigger signal. Coupled with the clock offset compensation algorithm, precise clock synchronization is completed, solving the influence of frequency characteristics caused by clock asynchronization. The influence of different device crystal oscillators on frequency characteristic measurement can be solved by using the same reference clock for each module. The generation and measurement of signals can be completed using signal generation devices, signal analysis devices, and up / down conversion devices with relatively low costs, which can greatly reduce the measurement cost and still meet the measurement accuracy requirements.

[0160] The embodiments of this specific implementation manner are all preferred embodiments of the present invention, and do not limit the protection scope of the present invention accordingly. Therefore, all equivalent changes made according to the structure, shape, and principle of the present invention should be covered within the protection scope of the present invention.

[0161] Based on the embodiments in this application, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the protection scope of this application.

[0162] It should be noted that the terms "first", "second", etc. in the specification, claims, and the above drawings of this application are used to distinguish similar objects, and do not necessarily need to describe a specific order or sequence. It should be understood that such data can be interchanged under appropriate circumstances so that the embodiments of this application described here can be implemented in an order other than those illustrated or described here. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a series of steps or units included do not exclude other steps or units that are not clearly listed or are inherent to these processes, methods, products, or devices.

Claims

1. A method for measuring the frequency response characteristics of an electronic device based on an OFDM signal, characterized in that, The method includes: generating a target input signal; connecting the target input signal to a first measurement object and measuring a first output signal output by the first measurement object; connecting the first output signal to a second measurement object configured in a first state and measuring a second output signal output by the second measurement object; the second measurement object is different from the first measurement object, and the second output signal is different from the first output signal; calculating first frequency response information of the second measurement object in the first state according to the frequency response difference between the first output signal and the second output signal; changing at least one configuration information of the second measurement object to switch the second measurement object from the first state to a second state; the second state is different from the first state; connecting the first output signal to the second measurement object in the second state and measuring a third output signal output by the second measurement object; calculating second frequency response information of the second measurement object in the second state according to the frequency response difference between the first output signal and the third output signal; calculating third frequency response information of the second measurement object according to the frequency response difference between the second output signal and the third output signal; the third frequency response information characterizes the frequency response change that occurs when the second measurement object switches from the first state to the second state; the target input signal includes at least two target sub-signals, the at least two target sub-signals are orthogonal to each other in the frequency domain, and are implemented by orthogonal frequency division multiplexing technology.

2. The method for measuring the frequency response characteristics of an electronic device based on an OFDM signal according to claim 1, characterized in that The generating of the target input signal includes generating an initial input signal; performing signal conversion on the initial input signal to obtain the target input signal, and sending the target input signal.

3. A system for measuring the frequency response characteristics of an electronic device based on an OFDM signal, the system being based on the method according to claim 1, characterized in that, The system includes: a signal generating device for generating a target input signal; a first measuring device for connecting the target input signal to a first measurement object and measuring a first output signal output by the first measurement object; a second measuring device for connecting the first output signal to a second measurement object configured in a first state and measuring a second output signal output by the second measurement object; the second measurement object is different from the first measurement object, and the first output signal is different from the second output signal; a first calculating device for calculating first frequency response information of the second measurement object in the first state according to the frequency response difference between the first output signal and the second output signal.

4. The system for measuring the frequency response characteristics of an electronic device based on an OFDM signal according to claim 3, wherein The signal generating device includes: a signal generating unit for generating an initial input signal; a signal conversion unit for performing signal conversion on the initial input signal to obtain the target input signal, and sending the target input signal.

5. The system for measuring the frequency response characteristics of an electronic device based on an OFDM signal according to claim 3, characterized in that, The system further includes: a third measuring device for connecting the first output signal to the second measurement object in the second state and measuring a third output signal output by the second measurement object when at least one configuration information of the second measurement object is changed to switch the second measurement object from the first state to a second state; The second state is different from the first state; A second computing device, configured to calculate second frequency response information of the second measurement object in the second state according to a frequency response difference between the first output signal and the third output signal.

6. The system for measuring the frequency response characteristics of an electronic device based on an OFDM signal according to claim 5, wherein The system further includes: A third computing device, configured to calculate third frequency response information of the second measurement object according to a frequency response difference between the second output signal and the third output signal; The third frequency response information characterizes a frequency response change that occurs when the second measurement object switches from the first state to the second state.

7. The system for measuring the frequency response characteristics of an electronic device based on an OFDM signal according to any one of claims 3 to 5, characterized in that The target input signal includes at least two target sub-signals, the at least two target sub-signals are orthogonal to each other in the frequency domain, and are implemented by orthogonal frequency division multiplexing technology.

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