Test method and device, test equipment and storage medium

Abstract

The invention discloses a test method and device, test equipment and a storage medium. The method comprises the following steps: executing an in-device coexistence (IDC) problem test process on a terminal; under the condition that the first test result is not obtained, determining whether the terminal detects an IDC problem in the IDC problem test process; and generating a second test result for the terminal according to whether the terminal detects the IDC problem in the IDC problem test process or not.

Description

Technical Field

[0001] The present application relates to the field of equipment testing technology, and in particular to a testing method, apparatus, testing equipment and storage medium. Background Art

[0002] In the related art, a minimization of drive test (MDT) function of a wireless network (i.e., a radio access network (RAN)) is defined. A measurement report (i.e., an MDT measurement report) for MDT by a terminal (also referred to as a user equipment (UE)) can be transmitted via a control plane. The terminal can output the MDT measurement report according to the definition of the related art. By analyzing the quality of the wireless network by reviewing the signaling process and measurement results in the MDT measurement report, the workload of the drive test (DT) can be minimized. Among them, the MDT data defined in the related art (such as the data in the above-mentioned MDT measurement report) can be collected in two different modes: immediate mode and logged mode. With respect to the logged mode, the related art introduces an in-device co-existence (IDC) mechanism (mechanism) in MDT. In order to verify whether the MDT function of the terminal has an IDC mechanism that meets relevant technical requirements, a test mechanism for an IDC problem (which can be expressed as IDC problem in English) is also defined in the relevant technology.

[0003] However, using the test mechanism in the related art may not accurately determine whether the terminal correctly supports the relevant functions of the IDC problem, that is, it is impossible to accurately determine whether the MDT function of the terminal has an IDC mechanism that meets the relevant technical requirements. Summary of the Invention

[0004] To solve related technical problems, the embodiments of the present application provide a testing method, an apparatus, a testing device and a storage medium.

[0005] The technical solution of the embodiment of the present application is implemented as follows:

[0006] The present invention provides a testing method, including:

[0007] Perform IDC problem testing process on the terminal;

[0008] If no first test result is obtained, confirming whether the terminal detects an IDC problem in the IDC problem test process;

[0009] A second test result for the terminal is generated according to whether the terminal detects an IDC problem in the IDC problem test process.

[0010] In the above solution, the step of confirming whether the terminal detects an IDC problem in the IDC problem testing process includes:

[0011] Construct at least one test condition identical to the IDC problem test process;

[0012] For each of the at least one test condition, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal;

[0013] The at least one measurement result is used to confirm whether the terminal detects an IDC problem in the IDC problem testing process.

[0014] In the above solution, the step of confirming whether the terminal detects an IDC problem in the IDC problem testing process includes:

[0015] During the execution of the IDC problem test process on the terminal, for each of the at least one constructed test condition, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal;

[0016] The at least one measurement result is used to confirm whether the terminal detects an IDC problem in the IDC problem testing process.

[0017] In the above solution, for the first test condition, at least one indicator associated with the IDC problem is measured on the terminal;

[0018] or,

[0019] For the first test condition and the second test condition, at least one indicator associated with the IDC problem is measured on the terminal respectively; wherein,

[0020] Under the first test condition, the operating channel of the first receiver and the operating channel of the first transmitter of the terminal are configured to be in a minimum separation state;

[0021] Under the second test condition, the working channel of the first receiver and the working channel of the first transmitter of the terminal are configured to be in a maximum gap state.

[0022] In the above solution, under the second test condition, the first transmitter is configured to be in a closed state.

[0023] In the above solution, the indicators associated with the IDC problem include at least one of the following:

[0024] a reference sensitivity of a first receiver of the terminal;

[0025] The throughput of the first receiver of the terminal.

[0026] In the above solution, the step of using the at least one measurement result to confirm whether the terminal detects an IDC problem in the IDC problem test process includes:

[0027] If the at least one measurement result does not meet the first test requirement, it indicates that an IDC problem is detected by the terminal in the IDC problem test process;

[0028] or,

[0029] If the at least one measurement result meets the first test requirement, it indicates that no IDC problem is detected for the terminal in the IDC problem test process.

[0030] In the above solution, the indicators associated with the first test requirement include N, where N is an integer greater than or equal to 1; satisfying the first test requirement includes at least one of the following:

[0031] At least one of the N indicators is better than or equal to the corresponding threshold;

[0032] The change of at least one indicator among the N indicators is better than or equal to the corresponding threshold.

[0033] In the above solution, satisfying the first test requirement includes at least one of the following:

[0034] The reference sensitivity of the first receiver of the terminal under the first test condition is better than or equal to the first threshold;

[0035] The throughput of the first receiver of the terminal under the first test condition is better than or equal to a second threshold;

[0036] A change in the reference sensitivity of the first receiver of the terminal under the first test condition and the second test condition is better than or equal to a third threshold;

[0037] The throughput change of the first receiver of the terminal under the first test condition and the second test condition is better than or equal to a fourth threshold; wherein,

[0038] Under the first test condition, the operating channel of the first receiver and the operating channel of the first transmitter of the terminal are configured to be in a minimum separation state;

[0039] Under the second test condition, the working channel of the first receiver and the working channel of the first transmitter of the terminal are configured to be in a maximum gap state.

[0040] In the above solution, the method further includes:

[0041] The third threshold and / or the fourth threshold are determined by using the capability level of the terminal, and different capability levels correspond to different third thresholds and / or fourth thresholds.

[0042] In the above solution, generating a second test result for the terminal according to whether the terminal detects an IDC problem in the IDC problem test process includes:

[0043] In a case where the terminal detects an IDC problem during the IDC problem testing process, the second test result indicates that the terminal fails the test;

[0044] In a case where no IDC problem is detected on the terminal during the IDC problem test process, the second test result indicates that the terminal passes the test.

[0045] The present application also provides a testing method, including:

[0046] Check whether the terminal detects an IDC problem;

[0047] If it is confirmed that the terminal has detected an IDC problem, executing an IDC problem test process on the terminal to generate a third test result for the terminal; or

[0048] When it is confirmed that no IDC problem is detected in the terminal, an IDC problem construction process is executed on the terminal; after the IDC problem construction process is completed, an IDC problem test process is executed on the terminal to generate a third test result for the terminal.

[0049] In the above solution, the step of confirming whether the terminal has detected an IDC problem includes:

[0050] Construct at least one test condition;

[0051] For each of the at least one test condition, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal;

[0052] Using the at least one measurement result, it is determined whether the terminal detects an IDC problem.

[0053] In the above solution, the indicators associated with the IDC problem include at least one of the following:

[0054] a reference sensitivity of a second receiver of the terminal;

[0055] The throughput of the second receiver of the terminal.

[0056] In the above solution, the step of using the at least one measurement result to confirm whether the terminal detects an IDC problem includes:

[0057] If the at least one measurement result meets the second test requirement, it indicates that no IDC problem is detected in the terminal;

[0058] or,

[0059] If the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an unclosed state, and the at least one measurement result meets the second test requirement when the second transmitter of the terminal is configured to be in a closed state, it indicates that an IDC problem is detected in the terminal.

[0060] In the above solution, the method further includes:

[0061] In a case where the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an off state, or,

[0062] In a case where the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an unclosed state, and the at least one measurement result also does not meet the second test requirement when the second transmitter of the terminal is configured to be in a closed state,

[0063] A fourth test result for the terminal is generated, where the fourth test result indicates that the terminal has failed the test.

[0064] In the above solution, the indicators associated with the second test requirement include N, where N is an integer greater than or equal to 1; meeting the second test requirement includes at least one of the following:

[0065] At least one of the N indicators is better than or equal to the corresponding threshold;

[0066] The change of at least one indicator among the N indicators is better than or equal to the corresponding threshold.

[0067] In the above solution, satisfying the second test requirement includes at least one of the following:

[0068] A reference sensitivity of the second receiver of the terminal under a third test condition is better than or equal to a fifth threshold;

[0069] The throughput of the second receiver of the terminal under the third test condition is better than or equal to a sixth threshold;

[0070] A change in the reference sensitivity of the second receiver of the terminal under the third test condition and the fourth test condition is better than or equal to a seventh threshold;

[0071] The throughput change of the second receiver of the terminal under the third test condition and the fourth test condition is better than or equal to the eighth threshold; wherein,

[0072] Under the third test condition, the operating channel of the second receiver and the operating channel of the second transmitter of the terminal are configured to be in a maximum spacing state;

[0073] Under the fourth test condition, the operating channel of the second receiver and the operating channel of the second transmitter of the terminal are configured to be in a minimum spacing state.

[0074] In the above solution, the method further includes:

[0075] Construct at least one test condition;

[0076] For each of the at least one test condition, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal;

[0077] In a case where the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an off state, or,

[0078] In a case where the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an unclosed state, and the at least one measurement result also does not meet the second test requirement when the second transmitter of the terminal is configured to be in a closed state,

[0079] A fourth test result for the terminal is generated, where the fourth test result indicates that the terminal has failed the test.

[0080] In the above solution, after the IDC problem construction process is completed, the IDC problem testing process is performed on the terminal, including:

[0081] When the IDC problem building process is completed and the terminal detects an IDC problem, the IDC problem testing process is executed on the terminal.

[0082] In the above solution, in the IDC problem construction process, the fifth test condition is used as the initial test condition, and the working channel of the second receiver of the terminal and the working channel of the second transmitter are configured to be close to each other, or the working channel of the second transmitter of the terminal is configured to be close to the working channel of the second receiver, or the working channel of the second receiver of the terminal is configured to be close to the working channel of the second transmitter; wherein, under the fifth test condition, the working channel of the second receiver of the terminal and the working channel of the second transmitter are configured to be in the maximum interval state, and the second transmitter is configured to be in the non-closed state;

[0083] When the test condition changes, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal;

[0084] If the at least one measurement result does not meet the third test requirement, it is determined that the IDC problem construction process is completed and the terminal detects an IDC problem.

[0085] In the above solution, the indicators associated with the third test requirement include N, where N is an integer greater than or equal to 1; satisfying the third test requirement includes at least one of the following:

[0086] At least one of the N indicators is better than or equal to the corresponding threshold;

[0087] The change of at least one indicator among the N indicators is better than or equal to the corresponding threshold.

[0088] In the above solution, satisfying the third test requirement includes at least one of the following:

[0089] A reference sensitivity of the second receiver of the terminal is better than or equal to a ninth threshold;

[0090] The throughput of the second receiver of the terminal is better than or equal to a tenth threshold;

[0091] A change in the reference sensitivity of the second receiver of the terminal under the current test condition and the fifth test condition is better than or equal to an eleventh threshold;

[0092] A throughput change of the second receiver of the terminal under the current test condition and the fifth test condition is better than or equal to a twelfth threshold.

[0093] In the above solution, the step of executing the IDC question construction process on the terminal includes:

[0094] A first signal is configured for the terminal, wherein the first signal enables the terminal to detect an IDC problem.

[0095] The present application also provides a testing device, including:

[0096] The first testing unit is configured to execute an IDC problem testing process on the terminal;

[0097] a first confirmation unit, configured to confirm whether the terminal detects an IDC problem in the IDC problem test process if the first test result is not obtained;

[0098] The second testing unit is configured to generate a second test result for the terminal according to whether the terminal detects an IDC problem in the IDC problem testing process.

[0099] The present application also provides a testing device, including:

[0100] A second confirmation unit is used to confirm whether the terminal detects an IDC problem;

[0101] The third test unit is used to execute the IDC problem test process on the terminal to generate a third test result for the terminal when it is confirmed that the terminal has detected an IDC problem; or, to execute the IDC problem construction process on the terminal when it is confirmed that the terminal has not detected an IDC problem; after the IDC problem construction process is executed, execute the IDC problem test process on the terminal to generate a third test result for the terminal.

[0102] The embodiment of the present application further provides a testing device, comprising: a communication interface and a processor; wherein,

[0103] The processor is configured to: execute an IDC problem test process on the terminal; if no first test result is obtained, confirm whether the terminal detects an IDC problem in the IDC problem test process; and generate a second test result for the terminal based on whether the IDC problem is detected in the IDC problem test process.

[0104] or,

[0105] The processor is configured to: confirm whether the terminal has detected an IDC problem; and, if it is confirmed that the terminal has detected an IDC problem, execute an IDC problem test process on the terminal to generate a third test result for the terminal; or, if it is confirmed that the terminal has not detected an IDC problem, execute an IDC problem construction process on the terminal; and after the IDC problem construction process is executed, execute an IDC problem test process on the terminal to generate a third test result for the terminal.

[0106] The present application also provides a testing device, comprising: a processor and a memory for storing a computer program that can be run on the processor.

[0107] The processor is configured to execute the steps of any of the above methods when running the computer program.

[0108] An embodiment of the present application further provides a storage medium on which a computer program is stored. When the computer program is executed by a processor, the steps of any of the above methods are implemented.

[0109] The test method, apparatus, test equipment and storage medium provided in the embodiments of the present application execute an IDC problem test process on a terminal; if no first test result is obtained, confirm whether the terminal detects an IDC problem in the IDC problem test process; generate a second test result for the terminal based on whether the terminal detects an IDC problem in the IDC problem test process; or confirm whether the terminal detects an IDC problem; if it is confirmed that the terminal detects an IDC problem, execute an IDC problem test process on the terminal to generate a third test result for the terminal, or if it is confirmed that the terminal does not detect an IDC problem, execute an IDC problem construction process on the terminal; after the IDC problem construction process is executed, execute an IDC problem test process on the terminal to generate a third test result for the terminal. The solution provided by the embodiment of the present application is to confirm whether the terminal has detected an IDC problem in the IDC problem test process after executing the IDC problem test process on the terminal, if the terminal fails the test, that is, if the test result of passing the test (that is, the above-mentioned first test result) is not obtained, and then generate the final test result for the terminal according to the confirmed result; or, before executing the IDC problem test process on the terminal, first confirm whether the terminal has detected an IDC problem, and then execute the IDC problem test process on the terminal if it is confirmed that the terminal has detected an IDC problem, or first execute the IDC problem construction on the terminal if it is confirmed that the terminal has not detected an IDC problem. The IDC problem is constructed using the test process, and the IDC problem test process is then executed on the terminal. In this way, the situation where "the IDC problem does not occur during the execution of the IDC problem test process on the terminal due to the excellent terminal design (which can be understood as the terminal being able to support the IDC mechanism and improve the IDC problem)" can be avoided from being mistakenly judged as the terminal failing the test. In other words, the problem of a qualified terminal that can support the IDC mechanism being mistakenly judged as an unqualified terminal that cannot support the IDC mechanism can be avoided, thereby accurately judging whether the terminal correctly supports the relevant functions of the IDC problem, that is, accurately judging whether the MDT function of the terminal has an IDC mechanism that meets the relevant technical requirements. BRIEF DESCRIPTION OF THE DRAWINGS

[0110] Figure 1 A flow chart of a testing method according to an embodiment of the present application;

[0111] Figure 2 This is a flow chart of another testing method according to an embodiment of the present application;

[0112] Figure 3 This is a flowchart of an embodiment of the present application to confirm whether a terminal has detected an IDC problem;

[0113] Figure 4 This is a schematic diagram of an IDC problem construction process according to an embodiment of the present application;

[0114] Figure 5 This is a schematic diagram of another IDC problem construction process according to an embodiment of the present application;

[0115] Figure 6 This is a schematic diagram of the third IDC problem construction process in an embodiment of the present application;

[0116] Figure 7 This is a schematic diagram of the fourth IDC problem construction process in an embodiment of the present application;

[0117] Figure 8 This is a schematic diagram of the fifth IDC problem construction process in an embodiment of the present application;

[0118] Figure 9 This is a schematic diagram of the sixth IDC problem construction process in an embodiment of the present application;

[0119] Figure 10 This is a schematic diagram of the structure of a testing device according to an embodiment of the present application;

[0120] Figure 11 This is a schematic diagram of another test device structure according to an embodiment of the present application;

[0121] Figure 12 This is a schematic diagram of the test equipment structure of the embodiment of the present application. DETAILED DESCRIPTION

[0122] The present application will be described in further detail below with reference to the accompanying drawings and embodiments.

[0123] In related technologies, immediate-mode MDT data collection relies on measurement results provided by the wireless network and terminals. Terminal measurements are derived from Radio Resource Control (RRC) measurement reports. The wireless network can also include data such as power headroom reported by the Medium Access Control (MAC) layer, received interference power (RIP) measured by the cell antenna at the physical radio interface layer, data volume, Internet Protocol (IP) throughput, user-plane packet delay reports, and packet loss rate measured by the base station.

[0124] In logging mode, the terminal stores information related to accessibility issues in idle mode, RRC establishment failures, random access during handovers, and radio link failures (which may include connection loss). The terminal's MDT event log (i.e., the MDT measurement report mentioned above, also referred to as an MDT report, can be expressed in English as MDT report) is sent to the network upon request. If the radio connection is lost (i.e., a link is disconnected), the terminal sends an MDT logging mode report (i.e., an MDT measurement report) after the next successful radio connection is established.

[0125] In related art, the IDC mechanism introduced in MDT for logging mode includes: upon detecting an IDC problem, the terminal suspends measurement logging and reports an IDC detection flag (InDeviceCoexDetected-r17) through the measurement report (this flag can also be understood as a sign or mark, which can be expressed as a flag in English). In other words, when the terminal detects an IDC problem, the terminal suspends measurement logging and tags the MDT report with the IDC detection flag in the measurement information table of the measurement record (which can be expressed as When UE detects IDC problem, UE suspends measurement logging and tags MDT report with inDeviceCoexDetected-r17 flag inlogMeasInfoList-r16 in VarLogMeasReport in English). Once the IDC problem is resolved, the terminal resumes measurement logging (which can be expressed as When the IDC problems detected by the UE is resolved during the last logging interval, the terminal resumes measurement logging).

[0126] In the related art, in order to verify whether the MDT function of the terminal has an IDC mechanism that meets the relevant technical requirements, the test mechanism for the IDC problem defined includes: introducing 2.4 GHz Wireless Fidelity (Wi-Fi) as an interference source, interfering with the 2300-2400 MHz frequency band (i.e., Band n40) of the New Radio (NR), and constructing an IDC condition. This can then verify whether the terminal will suspend recording and report the IDC detection (InDeviceCoexDetected-r17 in English) identification (also understood as a sign or mark, expressed as flag in English) through the measurement report; and whether the terminal will resume measurement recording after the IDC problem is resolved.

[0127] However, some well-designed terminals may have certain solutions to improve IDC issues, such as using software strategies to prevent 2.4GHz Wi-Fi and Band n40 from operating simultaneously. For example, when interference risks are detected, Wi-Fi can be adjusted to a channel away from the cellular network operating frequency, or the cellular network operating frequency can be adjusted to a channel away from the Wi-Fi operating frequency. Therefore, even if the test environment is set to 2.4GHz Wi-Fi and the 2300-2400MHz frequency band (i.e., Band n40), the terminal may not necessarily experience IDC issues. According to the IDC problem test mechanism defined in the relevant technology, if a well-designed terminal does not exhibit the expected pause recording state due to the absence of an IDC problem, it will be mistakenly judged as not correctly supporting the relevant functions of the IDC problem. In other words, using the test mechanism in the relevant technology may not accurately determine whether the terminal correctly supports the relevant functions of the IDC problem, that is, it is impossible to accurately determine whether the terminal's MDT function has an IDC mechanism that meets the relevant technical requirements.

[0128] Based on this, in various embodiments of the present application, after executing the IDC problem test process on the terminal, if the terminal fails the test, that is, if the test result of passing the test is not obtained, it is confirmed whether the terminal detects an IDC problem in the IDC problem test process, and then the final test result for the terminal is generated according to the confirmed result; or, before executing the IDC problem test process on the terminal, it is first confirmed whether the terminal detects an IDC problem, and if it is confirmed that the terminal detects an IDC problem, the IDC problem test process is executed on the terminal, or if it is confirmed that the terminal does not detect an IDC problem, the IDC problem construction process is first executed on the terminal to construct the problem. Create an IDC problem, and then execute the IDC problem test process for the terminal; in this way, it is possible to avoid the situation where "the IDC problem does not occur during the execution of the IDC problem test process on the terminal due to the excellent terminal design (which can be understood as the terminal being able to support the IDC mechanism and improving the IDC problem)" is mistakenly judged as the terminal failing the test. In other words, it is possible to avoid the problem of a qualified terminal that can support the IDC mechanism being mistakenly judged as an unqualified terminal that cannot support the IDC mechanism, thereby accurately judging whether the terminal correctly supports the relevant functions of the IDC problem, that is, accurately judging whether the MDT function of the terminal has an IDC mechanism that meets the relevant technical requirements.

[0129] Specifically, the present invention provides a test method for testing a device such as Figure 1 As shown, the method includes:

[0130] Step 101: Execute the IDC problem test process on the terminal;

[0131] Step 102: If no first test result is obtained, confirm whether the terminal detects an IDC problem in the IDC problem test process;

[0132] Step 103: Generate a second test result for the terminal according to whether the terminal detects an IDC problem in the IDC problem test process.

[0133] In actual applications, the terminal may also be referred to as a UE or a device. The test device may also be referred to as an instrument, a test instrument, a test system, or a system simulator (SS). The present embodiment does not limit the name of the test device, as long as it implements its function. Furthermore, it is understood that the test device has the ability to exchange information with the terminal.

[0134] In actual application, the first test result can be understood as the result expected or anticipated by the IDC problem test process, that is, the first test result can indicate that the terminal has passed the IDC problem test, or that the IDC problem test has been successful. The specific form of the first test result can be set according to needs, and the embodiments of this application are not limited to this; for example, the first test result can specifically include a conclusion (expressed as Verdict in English) that the test passed (expressed as Pass in English, abbreviated as P).

[0135] Specifically, in the process of executing the IDC problem test process on the terminal, the test device can construct at least one test condition (which can be expressed as test conditions or Pre-test conditions in English) that is expected or anticipated to enable the qualified terminal to detect the IDC problem, such as setting the test environment to 2.4GHz WiFi and 2300-2400MHz frequency band (i.e., Band n40) to cause the terminal to generate an IDC problem. Afterwards, the test device can obtain the MDT report of the terminal. When it is determined according to the MDT report that the terminal has the following two behaviors at the same time or only one of the following two behaviors (i.e., when it is determined according to the MDT report that the terminal has the following behavior 1 and / or behavior 2), the test device can determine that the terminal has passed the IDC problem test, that is, obtain the first test result:

[0136] Behavior 1: When the terminal detects an IDC problem, the terminal suspends measurement logging and tags the MDT report with an IDC detection flag in the measurement information table of the measurement log (which can be expressed in English as When UE detects IDCproblem, UE suspend measurement logging and tag MDT report withinDeviceCoexDetected-r17 flag in logMeasInfoList-r16 in VarLogMeasReport);

[0137] Behavior 2: When the IDC problems detected by the UE are resolved during the last logging interval, the UE resumes measurement logging (which can be expressed in English as When the IDC problems detected by the UE is resolved during the last logging interval, UE resumes measurement logging).

[0138] In actual application, if the terminal is determined, based on the MDT report, to not exhibit the aforementioned behavior 1 and / or behavior 2, the test device may determine that the first test result was not obtained. In this case, the terminal may be a non-qualified terminal (also referred to as an unqualified terminal) that cannot properly support the IDC mechanism, or a qualified terminal that does not exhibit IDC issues due to its excellent design (which can be understood as the terminal being able to support the IDC mechanism and improve IDC issues). Therefore, the test device needs to confirm whether the terminal detected an IDC issue during the IDC issue test process.

[0139] In actual application, the test device may specifically use the following two methods to confirm whether the terminal detects an IDC problem during the IDC problem test process:

[0140] Method 1: Post-testing and post-verifying the IDC problem; that is, after executing the IDC problem test process on the terminal, at least one test condition identical to the IDC problem test process is repeated, and for each test condition, specific indicators associated with the IDC problem are measured on the terminal. The measurement results are used to confirm whether the IDC problem was detected on the terminal during the IDC problem test process.

[0141] Method 2 is a method of first testing and then verifying the IDC problem; that is, in the process of executing the IDC problem test process on the terminal, for each of at least one constructed test condition, some specific indicators associated with the IDC problem are first measured on the terminal; after executing the IDC problem test process on the terminal, the measurement results are used to confirm whether the terminal has detected the IDC problem in the IDC problem test process.

[0142] Based on this, in one embodiment, for the above-mentioned method 1, confirming whether the terminal detects an IDC problem in the IDC problem testing process may include:

[0143] Construct at least one test condition identical to the IDC problem test process;

[0144] For each of the at least one test condition, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal;

[0145] The at least one measurement result is used to confirm whether the terminal detects an IDC problem in the IDC problem testing process.

[0146] In another embodiment, for the above-mentioned method 2, confirming whether the terminal detects an IDC problem in the IDC problem testing process may include:

[0147] During the execution of the IDC problem test process on the terminal, for each of the at least one constructed test condition, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal;

[0148] The at least one measurement result is used to confirm whether the terminal detects an IDC problem in the IDC problem testing process.

[0149] In actual application, it can be understood that the at least one test condition is a preset condition that is expected or anticipated to enable a qualified terminal to detect an IDC problem, and each test condition can be understood as a network test environment virtualized by the test equipment, or can be understood as a simulated network test state.

[0150] Specifically, the terminal is internally provided with at least one receiver and at least one transmitter, and an IDC problem may exist between a receiver (which may be referred to as a first receiver in the subsequent description) and a transmitter (which may be referred to as a first transmitter in the subsequent description), and the first transmitter is the interference source of the IDC problem. A test condition constructed by the test device can make the working channel of the first receiver and the working channel of the first transmitter passively (which can be understood as being configured to) present a state corresponding to the test condition; the test device can measure at least one indicator associated with the IDC problem on the terminal in this state, such as measuring the reference sensitivity (which can be expressed as Reference sensitivity in English) and / or throughput of the first receiver; and confirm whether the terminal detects an IDC problem in the IDC problem test process based on at least one measurement result obtained.

[0151] Based on this, in one embodiment, the indicators associated with the IDC problem may include at least one of the following:

[0152] a reference sensitivity (which may be expressed as ReferenceSensitivity in English) of the first receiver of the terminal;

[0153] The throughput of the first receiver of the terminal.

[0154] In actual application, the specific types of the first receiver and the first transmitter can be set according to the test requirements, and the embodiment of the present application does not limit this. For example, the type of the first receiver may include an NR receiver (i.e., a fifth-generation mobile communication technology (5G) receiver), a long-term evolution (LTE) receiver (i.e., a fourth-generation mobile communication technology (4G) receiver), a sixth-generation mobile communication technology (6G) receiver, or a wireless local area network (WLAN) receiver, etc. The first receiver can be a cellular network receiver or a non-cellular network receiver; accordingly, the first transmitter may include a WLAN transmitter operating on an overlapping carrier / frequency band or an adjacent carrier / frequency band with the first receiver, a Licensed Assisted Access (LAA) receiver, and may also include other NR transmitters and / or LTE transmitters operating on an overlapping carrier / frequency band or an adjacent carrier / frequency band with the first receiver, i.e., the type of the first transmitter may be the same as or different from the type of the first receiver. In addition, when the first receiver includes an NR receiver, the throughput of the first receiver can be obtained based on a performance test of a synchronization block (SSB) or a channel state information reference signal (CSI-RS).

[0155] In actual application, whether it is the above-mentioned method 1 or method 2, after obtaining at least one measurement result of the terminal, the test device can confirm whether the terminal has detected an IDC problem in the IDC problem test process based on whether the at least one measurement result meets the pre-set test requirements (which can be expressed as test requirements in English and can be referred to as the first test requirement in the subsequent description); if the at least one measurement result does not meet the first test requirement, it can be determined that the terminal has detected an IDC problem in the IDC problem test process; if the at least one measurement result meets the first test requirement, it can be determined that the terminal has not detected an IDC problem in the IDC problem test process.

[0156] Based on this, in one embodiment, the using the at least one measurement result to confirm whether the terminal detects an IDC problem in the IDC problem test process may include:

[0157] When the at least one measurement result does not meet the first test requirement, it indicates (which can be understood as confirmation) that the terminal has detected an IDC problem in the IDC problem test process.

[0158] In another embodiment, the using the at least one measurement result to confirm whether the terminal detects an IDC problem in the IDC problem testing process may include:

[0159] When the at least one measurement result meets the first test requirement, it indicates (can be understood as confirmation) that the terminal does not detect an IDC problem in the IDC problem test process.

[0160] In actual application, the first test requirement may include a threshold corresponding to a specific indicator associated with the IDC problem. The threshold may be of the following two types:

[0161] Type 1, absolute value threshold. It should be noted that the absolute value is not the absolute value in the mathematical sense, but is used to represent the opposite meaning of the relative value. It refers to the value directly obtained by measurement under a test condition. The value can be positive or negative.

[0162] Type 2, relative value threshold; it can be understood as the threshold of the change in a specific indicator obtained by measurement and calculation under at least two test conditions.

[0163] Based on this, in one embodiment, the indicators associated with the first test requirement may include N, where N is an integer greater than or equal to 1; and satisfying the first test requirement may include at least one of the following:

[0164] At least one of the N indicators is better than or equal to the corresponding threshold;

[0165] The change of at least one indicator among the N indicators is better than or equal to the corresponding threshold.

[0166] In actual application, it can be understood that the number of indicators associated with the IDC problem, the number of indicators measured for the terminal, and the number of indicators associated with the first test requirement can be the same or different. For example, assuming that the total number of indicators associated with the IDC problem is 10, the test device can measure 5 of the 10 indicators for the terminal, and the first test requirement can be associated with 3 of the 10 indicators. As long as one or more indicators of the terminal measured by the test device (here, the number of the multiple indicators is not greater than the smaller value (i.e., 3) of the number of indicators measured for the terminal (i.e., 5) and the number of indicators associated with the first test requirement (i.e., 3)) are better than or equal to the corresponding threshold, it can be determined that the first test requirement is met; otherwise, it can be determined that the first test requirement is not met.

[0167] In practical applications, the actual meaning of "better than" depends on whether the corresponding indicator value is positive or negative. For example, since the reference sensitivity value is a negative number, a larger reference sensitivity value indicates worse sensitivity, that is, a smaller reference sensitivity value indicates better performance. Therefore, "better than" a corresponding threshold value means that the reference sensitivity is less than the corresponding threshold value. For throughput, since the throughput value is a positive number, a larger throughput value indicates better performance. Therefore, "better than" a corresponding threshold value means that the throughput is greater than the corresponding threshold value.

[0168] In practical applications, as can be seen from the above description, when the first test requirement includes an absolute value threshold (i.e., the threshold of Type 1 described above), the test device can measure at least one indicator associated with the IDC problem on the terminal under only one test condition, regardless of whether the above method 1 or method 2 is used. Under this test condition, the test device can configure the operating channel of the first receiver and the operating channel of the first transmitter of the terminal to a minimum separation state.

[0169] Based on this, in one embodiment, for the above-mentioned manner 1 and manner 2, when the first test requirement includes an absolute value threshold (i.e., the threshold of the above-mentioned type 1), measuring at least one indicator associated with the IDC problem on the terminal may include:

[0170] Under a first test condition, at least one indicator associated with the IDC problem is measured for the terminal; wherein, under the first test condition, the working channel of the first receiver and the working channel of the first transmitter of the terminal are configured to be in a minimum interval state.

[0171] Accordingly, satisfying the first test requirement may include at least one of the following:

[0172] The reference sensitivity of the first receiver of the terminal under the first test condition is better than (ie, less than) or equal to a first threshold;

[0173] The throughput of the first receiver of the terminal under the first test condition is better than (ie, greater than) or equal to a second threshold.

[0174] In practical applications, as can be seen from the above description, when the first test requirement includes a relative value threshold (i.e., the threshold of Type 2 described above), whether using Method 1 or Method 2, the test equipment needs to measure at least one indicator associated with the IDC problem on the terminal under at least two test conditions to obtain the change in each indicator. Therefore, to improve test efficiency, the test equipment can configure the operating channel of the terminal's first receiver and the operating channel of the first transmitter to the minimum spacing state and the maximum spacing state under the two test conditions, and measure at least one indicator associated with the IDC problem on the terminal under the two test conditions.

[0175] Based on this, in one embodiment, for the above-mentioned manner 1 and manner 2, when the first test requirement includes a relative value threshold (i.e., the threshold of the above-mentioned type 2), measuring at least one indicator associated with the IDC problem on the terminal may include:

[0176] For a first test condition and a second test condition, at least one indicator associated with the IDC problem is measured for the terminal respectively; wherein, under the first test condition, the working channel of the first receiver of the terminal and the working channel of the first transmitter are configured to be in a minimum interval state; under the second test condition, the working channel of the first receiver of the terminal and the working channel of the first transmitter are configured to be in a maximum interval state.

[0177] Accordingly, satisfying the first test requirement may include at least one of the following:

[0178] The reference sensitivity of the first receiver of the terminal under the first test condition is better than (ie, less than) or equal to a first threshold;

[0179] The throughput of the first receiver of the terminal under the first test condition is better than (that is, greater than) or equal to a second threshold;

[0180] A change in the reference sensitivity of the first receiver of the terminal under the first test condition and the second test condition is better than (i.e., less than) or equal to a third threshold;

[0181] A throughput variation of the first receiver of the terminal under the first test condition and the second test condition is better than (ie, smaller than) or equal to a fourth threshold.

[0182] In actual application, under the second test condition, in order to configure the operating channel of the first receiver of the terminal and the operating channel of the first transmitter to be in the maximum separation state, the test equipment may configure the first transmitter to be in the off state (which can be expressed as being configured as being off in English). Specifically, the first transmitter being configured to be in the off state may include the following two situations:

[0183] Case 1: power off the first transmitter;

[0184] Case 2: The first transmitter stops transmitting signals.

[0185] In actual application, the specific values ​​of the first threshold, the second threshold, the third threshold, and the fourth threshold can be pre-set according to the test requirements. Alternatively, the association between different capability levels of the terminal and different values ​​of the thresholds (i.e., the first threshold, the second threshold, the third threshold, and the fourth threshold) can be pre-set, and the test equipment can use the capability level of the terminal to determine the specific values ​​of the thresholds (i.e., the first threshold, the second threshold, the third threshold, and the fourth threshold). Exemplarily, the association relationship between different capability levels of the terminal and different values ​​of the third threshold and / or the fourth threshold can be pre-set: the first capability level (default capability level) is associated with 3 decibels (dB) (i.e., the third threshold is 3dB) and / or 50% (i.e., the fourth threshold is 50%), the second capability level is associated with 6dB (i.e., the third threshold is 6dB) and / or 75% (i.e., the fourth threshold is 75%), and the third capability level is associated with 1.5dB (i.e., the third threshold is 1.5dB) and / or 25% (i.e., the fourth threshold is 25%); the terminal can declare its own capability level to the test device by reporting the capability level identifier or directly reporting the specific values ​​of the third threshold and / or the fourth threshold according to its own implementation situation; the test device can determine the specific values ​​of the third threshold and / or the fourth threshold based on the capability level declared by the terminal, as a basis for judging whether the terminal has detected an IDC problem in the IDC problem test process.

[0186] Based on this, in one embodiment, the method may further include:

[0187] The third threshold and / or the fourth threshold are determined by using the capability level of the terminal, and different capability levels correspond to different third thresholds and / or fourth thresholds.

[0188] In actual application, after confirming whether the terminal detects an IDC problem in the IDC problem test process, a final test result (ie, the second test result) for the terminal may be generated according to the confirmation result.

[0189] Based on this, in one embodiment, generating a second test result for the terminal according to whether the terminal detects an IDC problem in the IDC problem test process may include:

[0190] In a case where the terminal detects an IDC problem during the IDC problem testing process, the second test result indicates that the terminal fails the test;

[0191] In a case where no IDC problem is detected on the terminal during the IDC problem test process, the second test result indicates that the terminal passes the test.

[0192] In actual application, the specific form of the second test result can be set as needed, and the embodiments of the present application do not limit this. For example, when the second test result indicates that the terminal has failed the test, the second test result may specifically include a conclusion (expressed as Verdict in English) of test failure (expressed as Fail in English, abbreviated as F); when the second test result indicates that the terminal has passed the test, the second test result may specifically include a conclusion (expressed as Pass in English, abbreviated as P) of test passing.

[0193] In actual application, for example, it is assumed that a post-test and post-verification method of the IDC problem (i.e., the above-mentioned method 1) is adopted to confirm whether the terminal detects the IDC problem in the IDC problem test process, and it is assumed that the first test requirement includes an absolute value threshold (i.e., the threshold of the above-mentioned type 1), and it is assumed that the indicator associated with the first test requirement includes the reference sensitivity of the first receiver of the terminal, and it is assumed that the first receiver is the NR cell 1 (Cell 1) receiver (which can be recorded as NR Cell 1 in the subsequent description) and the first transmitter is the WLAN access point 1 (Cell 27) (Cell 27) transmitter (which can be recorded as WLAN AP 1 (Cell 27) in the subsequent description); then the test conditions constructed by the system simulator (i.e., the test equipment) in the process of executing the IDC problem test process on the terminal, and the test conditions constructed when confirming whether the terminal detects the IDC problem in the IDC problem test process are shown in Table 1. The specific steps of the system simulator executing the IDC problem test process on the terminal and confirming whether the terminal detects the IDC problem in the IDC problem test process are shown in Table 2. In Table 1, "T0" represents the initial test condition; "T1" and "T2" represent two test conditions constructed by the system simulator during the execution of the IDC problem test process; "T3" represents the same test condition as "T1" that the system simulator reproduces (i.e., reconstructs) when confirming whether the terminal has detected an IDC problem in the IDC problem test process, i.e., "T3" is equivalent to the first test condition. In Table 2, the IDC problem test process specifically includes steps 1 to 22, and the conclusion (which can be expressed as "Verdict" in English) P obtained in step 22 is the first test result; the specific process for the system simulator to confirm whether the terminal has detected an IDC problem in the IDC problem test process includes steps 23 to 24.

[0194]

[0195]

[0196] Table 1

[0197]

[0198]

[0199]

[0200]

[0201]

[0202]

[0203] Table 2

[0204] In actual application, for example, it is assumed that the post-test and post-verification method of the IDC problem (i.e., the above-mentioned method 1) is adopted to confirm whether the terminal detects the IDC problem in the IDC problem test process, and it is assumed that the first test requirement includes a relative value threshold (i.e., the threshold of the above-mentioned type 2), and it is assumed that the indicator associated with the first test requirement includes the reference sensitivity of the first receiver of the terminal, and it is assumed that the first receiver is an NR Cell 1 receiver (which can be recorded as NR Cell 1 in the subsequent description) and the first transmitter is a WLAN AP 1 (Cell 27) transmitter (which can be recorded as WLAN AP 1 (Cell27) in the subsequent description); then the test conditions constructed by the system simulator (i.e., the test equipment) in the process of executing the IDC problem test process on the terminal, and the test conditions constructed when confirming whether the terminal detects the IDC problem in the IDC problem test process are shown in Table 3. The specific steps of the system simulator executing the IDC problem test process on the terminal and confirming whether the terminal detects the IDC problem in the IDC problem test process are shown in Table 4. In Table 3, "T0" represents the initial test condition; "T1" and "T2" represent two test conditions constructed by the system simulator during the execution of the IDC problem test process, and "T2" is equivalent to the second test condition; "T3" represents the same test condition as "T1" that the system simulator reproduces (i.e., reconstructs) when confirming whether the terminal has detected an IDC problem in the IDC problem test process, i.e., "T3" is equivalent to the first test condition. In Table 4, the IDC problem test process specifically includes steps 1 to 22, and the conclusion (which can be expressed as Verdict in English) P obtained in step 22 is the first test result; the specific process for the system simulator to confirm whether the terminal has detected an IDC problem in the IDC problem test process includes steps 23 to 26.

[0205]

[0206]

[0207] Table 3

[0208]

[0209]

[0210]

[0211]

[0212]

[0213]

[0214] Table 4

[0215] In actual application, for example, it is assumed that a method of first testing and then verifying the IDC problem (i.e., the above-mentioned method 2) is adopted to confirm whether the terminal detects the IDC problem in the IDC problem test process, and it is assumed that the first test requirement includes an absolute value threshold (i.e., the threshold of the above-mentioned type 1), and it is assumed that the indicator associated with the first test requirement includes the reference sensitivity of the first receiver of the terminal, and it is assumed that the first receiver is an NR Cell 1 receiver (which can be recorded as NR Cell 1 in the subsequent description) and the first transmitter is a WLAN AP 1 (Cell 27) transmitter (which can be recorded as WLAN AP 1 (Cell27) in the subsequent description); then the test conditions constructed by the system simulator (i.e., the test equipment) in the process of executing the IDC problem test process on the terminal, and the test conditions constructed when confirming whether the terminal detects the IDC problem in the IDC problem test process are shown in Table 5. The specific steps of the system simulator executing the IDC problem test process on the terminal and confirming whether the terminal detects the IDC problem in the IDC problem test process are shown in Table 6. In Table 5, "T0" represents the initial test condition; "T1" and "T2" represent two test conditions constructed by the system simulator during the execution of the IDC problem test process, with "T1" corresponding to the first test condition. In Table 6, the IDC problem test process specifically includes steps 1-3, steps 3a-4, and steps 4a-22. The conclusion (Verdict) P obtained in step 22 is the first test result. The specific process for the system simulator to confirm whether the terminal has detected an IDC problem during the IDC problem test process includes steps 3aa, step 4aa, and step 23.

[0216]

[0217] Table 5

[0218]

[0219]

[0220]

[0221]

[0222]

[0223] Table 6

[0224] In actual application, for example, it is assumed that a method of first testing and then verifying the IDC problem (i.e., the above-mentioned method 2) is adopted to confirm whether the terminal detects the IDC problem in the IDC problem test process, and it is assumed that the first test requirement includes a relative value threshold (i.e., the threshold of the above-mentioned type 2), and it is assumed that the indicator associated with the first test requirement includes the reference sensitivity of the first receiver of the terminal, and it is assumed that the first receiver is an NR Cell 1 receiver (which can be recorded as NR Cell 1 in the subsequent description) and the first transmitter is a WLAN AP 1 (Cell 27) transmitter (which can be recorded as WLAN AP 1 (Cell27) in the subsequent description); then the test conditions constructed by the system simulator (i.e., the test equipment) in the process of executing the IDC problem test process on the terminal, and the test conditions constructed when confirming whether the terminal detects the IDC problem in the IDC problem test process are shown in Table 7. The specific steps of the system simulator executing the IDC problem test process on the terminal and confirming whether the terminal detects the IDC problem in the IDC problem test process are shown in Table 8. In Table 7, "T0" represents the initial test condition, which is also equivalent to the second test condition; "T1" and "T2" represent two test conditions constructed by the system simulator during the execution of the IDC problem test process, with "T1" corresponding to the first test condition. In Table 8, the IDC problem test process specifically includes steps 1-3, steps 3a-4, and steps 4a-22. The conclusion (which can be expressed as "Verdict" in English) P obtained in step 22 is the first test result. The specific process for the system simulator to confirm whether the terminal has detected an IDC problem during the IDC problem test process includes steps 3aa, step 4aa, and step 23.

[0225]

[0226]

[0227] Table 7

[0228]

[0229]

[0230]

[0231]

[0232]

[0233]

[0234] Table 8

[0235] The present application also provides a testing method for testing equipment, such as Figure 2 As shown, the method includes:

[0236] Step 201: Confirm whether the terminal detects an IDC problem;

[0237] Step 202: When it is confirmed that the terminal has detected an IDC problem, an IDC problem test process is executed on the terminal to generate a third test result for the terminal; or, when it is confirmed that the terminal has not detected an IDC problem, an IDC problem construction process is executed on the terminal; after the IDC problem construction process is executed, an IDC problem test process is executed on the terminal to generate a third test result for the terminal.

[0238] In actual application, step 201 can be understood as an IDC problem confirmation process set before the IDC problem test process, that is, before testing whether the terminal has the above-mentioned behavior 1, the test equipment confirms whether the terminal has detected an IDC problem; if it is confirmed that the terminal has detected an IDC problem, the IDC problem test process is executed on the terminal.

[0239] In actual applications, to confirm whether the terminal has detected an IDC problem, the test equipment may construct at least one test condition (which may be expressed as test conditions or pre-test conditions) that is expected or anticipated to cause a qualified terminal to detect an IDC problem. For each test condition, the test equipment may measure specific indicators associated with IDC problems on the terminal and use the measurement results to confirm whether the terminal has detected an IDC problem.

[0240] Based on this, in one embodiment, confirming whether the terminal detects an IDC problem may include:

[0241] Construct at least one test condition;

[0242] For each of the at least one test condition, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal;

[0243] Using the at least one measurement result, it is determined whether the terminal detects an IDC problem.

[0244] In actual application, it can be understood that the at least one test condition is a preset condition that is expected or anticipated to enable a qualified terminal to detect an IDC problem, and each test condition can be understood as a network test environment virtualized by the test equipment, or can be understood as a simulated network test state.

[0245] Specifically, the terminal is internally provided with at least one receiver and at least one transmitter. An IDC problem may exist between a receiver (which may be referred to as a second receiver in the subsequent description) and a transmitter (which may be referred to as a second transmitter in the subsequent description), and the second transmitter is the interference source of the IDC problem. A test condition constructed by the test device can make the working channel of the second receiver and the working channel of the second transmitter passively (which can be understood as being configured to) present a state corresponding to the test condition; the test device can measure at least one indicator associated with the IDC problem on the terminal in this state, such as measuring the reference sensitivity (which can be expressed as Reference sensitivity in English) and / or throughput of the second receiver; and confirm whether the terminal has detected an IDC problem based on at least one measurement result obtained.

[0246] Based on this, in one embodiment, the indicators associated with the IDC problem may include at least one of the following:

[0247] a reference sensitivity (which may be expressed as ReferenceSensitivity in English) of the second receiver of the terminal;

[0248] The throughput of the second receiver of the terminal.

[0249] In actual application, the specific types of the second receiver and the second transmitter can be set according to the test requirements. The specific type of the second receiver can be the same as or different from the specific type of the first receiver, and the specific type of the second transmitter can be the same as or different from the specific type of the first transmitter. This embodiment of the present application does not limit this. For example, the type of the second receiver may include an NR receiver (i.e., a 5G receiver), an LTE receiver (i.e., a 4G receiver), a 6G receiver, or a WLAN receiver, etc. The second receiver can be a cellular network receiver or a non-cellular network receiver; accordingly, the second transmitter may include a WLAN transmitter or an LAA receiver operating on an overlapping carrier / frequency band or an adjacent carrier / frequency band with the second receiver, or may include other NR transmitters and / or LTE transmitters of a cellular working system operating on an overlapping carrier / frequency band or an adjacent carrier / frequency band with the second receiver, that is, the type of the second transmitter may be the same as or different from the type of the second receiver. In addition, when the second receiver includes an NR receiver, the throughput of the second receiver can be obtained based on the performance test of SSB or CSI-RS.

[0250] In actual application, after obtaining at least one measurement result of the terminal, the test device can confirm whether the terminal has detected an IDC problem based on whether the at least one measurement result meets a preset test requirement (which can be expressed as test requirements in English and can be referred to as the second test requirement in the subsequent description). For example, a process for confirming whether the terminal has detected an IDC problem can be as follows: Figure 3 As shown, the test equipment can configure the operating channel of the second receiver to X0 (channel X0 is the channel farthest from the operating frequency band of the second transmitter) and the operating channel of the second transmitter to Y0 (channel Y0 is the channel farthest from the operating frequency band of the second receiver), thereby establishing a third test condition. Under the third test condition, the operating channel of the second receiver and the operating channel of the second transmitter are configured to be in a state of maximum separation. To further configure the operating channel of the second receiver and the operating channel of the second transmitter to be in a state of maximum separation, the test equipment can configure the second transmitter to be in a shutdown state according to test requirements. Configuring the second transmitter to be in a shutdown state can include the following two situations: Scenario 1: Powering off the second transmitter; Scenario 2: Stopping the second transmitter from transmitting signals.

[0251] like Figure 3As shown, under the third test condition, the test device can measure the reference sensitivity and / or throughput of the second receiver, and determine whether the reference sensitivity and / or throughput of the second receiver meets the second test requirement. When the reference sensitivity and / or throughput of the second receiver does not meet the second test requirement, if the interference source (i.e., the second transmitter) is in the off state (i.e., the second transmitter is configured to be off under the third test condition), the test device considers (can be understood as directly determining) that the terminal is an unqualified terminal, that is, the test device can directly generate a fourth test result for the terminal, and the fourth test result indicates that the terminal has failed the test; if the second transmitter is in an open state (i.e., the second transmitter is configured to be open under the third test condition), the test device can turn off the second transmitter and reconfirm that the reference sensitivity and / or throughput of the second receiver is Whether it meets the second test requirement; if after turning off the second transmitter, the reference sensitivity and / or throughput of the second receiver meets the second test requirement, the test device can confirm that the terminal has detected an IDC problem. After turning on the second transmitter again, the terminal can enter the IDC problem test process, that is, the test device can perform the IDC problem test process on the terminal; if after turning off the second transmitter, the reference sensitivity and / or throughput of the second receiver still does not meet the second test requirement, the test device considers the terminal to be an unqualified terminal, that is, the test device can directly generate a fourth test result for the terminal, and the fourth test result indicates that the terminal has failed the test. When the reference sensitivity and / or throughput of the second receiver meets the second test requirement, regardless of whether the second transmitter is in the off state, the test device can determine that the terminal has not detected an IDC problem and can enable the terminal to enter the IDC problem construction process, that is, the test device can perform the IDC problem construction process on the terminal. After the IDC problem construction process is completed, the IDC problem test process is performed on the terminal again.

[0252] Based on this, in one embodiment, the confirming whether the terminal detects an IDC problem by using the at least one measurement result may include:

[0253] If the at least one measurement result meets the second test requirement, it indicates that the terminal does not detect an IDC problem; or

[0254] If the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an unclosed state, and the at least one measurement result meets the second test requirement when the second transmitter of the terminal is configured to be in a closed state, it indicates that an IDC problem is detected in the terminal.

[0255] In another embodiment, the method may further include:

[0256] In a case where the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an off state, or,

[0257] In a case where the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an unclosed state, and the at least one measurement result also does not meet the second test requirement when the second transmitter of the terminal is configured to be in a closed state,

[0258] A fourth test result for the terminal is generated, where the fourth test result indicates that the terminal has failed the test.

[0259] In actual application, the specific form of the fourth test result can be set according to needs. For example, the fourth test result can specifically include a conclusion (expressed as Verdict in English) of test failure (expressed as Fail in English, abbreviated as F).

[0260] In actual application, the second test requirement may also include an absolute value threshold (ie, the threshold of the above-mentioned type 1) and / or a relative value threshold (ie, the threshold of the above-mentioned type 2).

[0261] Based on this, in one embodiment, the indicators associated with the second test requirement may include N, where N is an integer greater than or equal to 1; and satisfying the second test requirement may include at least one of the following:

[0262] At least one of the N indicators is better than or equal to the corresponding threshold;

[0263] The change of at least one indicator among the N indicators is better than or equal to the corresponding threshold.

[0264] In actual application, it can be understood that when the second test requirement includes a relative value threshold, in the process of confirming whether the terminal detects an IDC problem, the test equipment needs to measure at least one indicator associated with the IDC problem on the terminal under at least two test conditions respectively to obtain the change amount of each indicator.

[0265] Based on this, in one embodiment, satisfying the second test requirement may include at least one of the following:

[0266] A reference sensitivity of the second receiver of the terminal under a third test condition is better than (i.e., less than) or equal to a fifth threshold;

[0267] The throughput of the second receiver of the terminal under the third test condition is better than (that is, greater than) or equal to a sixth threshold;

[0268] A change in the reference sensitivity of the second receiver of the terminal under the third test condition and the fourth test condition is better than (ie, less than) or equal to a seventh threshold;

[0269] The throughput variation of the second receiver of the terminal under the third test condition and the fourth test condition is better than (ie, less than) or equal to an eighth threshold; wherein,

[0270] Under the third test condition, the operating channel of the second receiver and the operating channel of the second transmitter of the terminal are configured to be in a maximum spacing state;

[0271] Under the fourth test condition, the operating channel of the second receiver and the operating channel of the second transmitter of the terminal are configured to be in a minimum spacing state.

[0272] In actual application, the specific values ​​of the fifth threshold, the sixth threshold, the seventh threshold, and the eighth threshold can be preset according to test requirements. Alternatively, the association between different capability levels of the terminal and different values ​​of the thresholds (i.e., the fifth threshold, the sixth threshold, the seventh threshold, and the eighth threshold) can be preset, and the test equipment can use the capability level of the terminal to determine the specific values ​​of the thresholds (i.e., the fifth threshold, the sixth threshold, the seventh threshold, and the eighth threshold). Exemplarily, the association relationship between different capability levels of the terminal and different values ​​of the seventh threshold and / or the eighth threshold can be pre-set: the first capability level (default capability level) is associated with 3dB (i.e., the seventh threshold is 3dB) and / or 50% (i.e., the eighth threshold is 50%), the second capability level is associated with 6dB (i.e., the seventh threshold is 6dB) and / or 75% (i.e., the eighth threshold is 75%), and the third capability level is associated with 1.5dB (i.e., the seventh threshold is 1.5dB) and / or 25% (i.e., the eighth threshold is 25%); the terminal can declare its own capability level to the test device by reporting the capability level identifier or directly reporting the specific values ​​of the seventh threshold and / or the eighth threshold according to its own implementation situation; the test device can determine the specific values ​​of the seventh threshold and / or the eighth threshold according to the capability level declared by the terminal as a basis for judging whether the terminal has detected an IDC problem.

[0273] In actual application, in order to further ensure that the terminal can detect the IDC problem during the execution of the IDC problem test process on the terminal, after the IDC problem construction process is completed, the testing device can once again confirm whether the terminal has detected the IDC problem (which can be understood as confirming whether the IDC problem is successfully constructed); when it is confirmed that the terminal has detected the IDC problem (which can be understood as the IDC problem is successfully constructed), the IDC problem test process is executed on the terminal again.

[0274] Based on this, in one embodiment, after the IDC problem construction process is completed, executing the IDC problem testing process on the terminal may include:

[0275] When the IDC problem building process is completed and the terminal detects an IDC problem, the IDC problem testing process is executed on the terminal.

[0276] In actual application, the test device may also confirm again whether the terminal detects an IDC problem in the IDC problem test process after executing the IDC problem test process on the terminal, that is, execute Figure 1 The relevant steps of the corresponding test method can further accurately determine whether the MDT function of the terminal has an IDC mechanism that meets the relevant technical requirements.

[0277] In actual application, the test device may also, during the process of executing the IDC problem test process on the terminal, reconfirm that the IDC problem detected by the terminal has been resolved before testing whether the terminal exhibits the above-mentioned behavior 2; after confirming that the IDC problem detected by the terminal has been resolved, continue to execute the subsequent process of the IDC problem test on the terminal, that is, test whether the terminal exhibits the above-mentioned behavior 2, so as to further accurately determine whether the MDT function of the terminal has an IDC mechanism that meets the relevant technical requirements.

[0278] In actual application, during the execution of the IDC problem establishment process for the terminal, the test device may first configure the operating channel of the second receiver to X0 (channel X0 is the channel farthest from the operating frequency band of the second transmitter) and the operating channel of the second transmitter to Y0 (channel Y0 is the channel farthest from the operating frequency band of the second receiver), thereby establishing a fifth test condition. Under the fifth test condition, the operating channel of the second receiver and the operating channel of the second transmitter are configured to be in a maximum spacing state, and the second transmitter is configured to be in an open state. Thereafter, the test device may reconfigure the operating channels of the second receiver and / or the second transmitter using the fifth test condition as the initial test condition, adjust the operating channels of the second receiver and / or the second transmitter to a closer position, and measure at least one indicator associated with the IDC problem on the terminal when the channel environment changes. By determining whether the at least one measurement result meets the third test requirement, it is confirmed whether the IDC problem is detected, that is, whether the IDC problem is successfully established.

[0279] Based on this, in one embodiment, the method may further include:

[0280] In the IDC problem construction process, with the fifth test condition as the initial test condition, the operating channel of the second receiver of the terminal and the operating channel of the second transmitter are configured to be close to each other, or the operating channel of the second transmitter of the terminal is configured to be close to the operating channel of the second receiver, or the operating channel of the second receiver of the terminal is configured to be close to the operating channel of the second transmitter; wherein, under the fifth test condition, the operating channel of the second receiver of the terminal and the operating channel of the second transmitter are configured to be in a maximum interval state, and the second transmitter is configured to be in an open state;

[0281] When the test condition changes, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal;

[0282] If the at least one measurement result does not meet the third test requirement, it is determined that the IDC problem construction process is completed and the terminal detects an IDC problem.

[0283] Among them, in actual application, in the IDC problem construction process, at least two test conditions can be constructed, that is, the fifth test condition and the sixth test condition are constructed. Under the sixth test condition, the working channel of the second receiver of the terminal and the working channel of the second transmitter are configured to be in the minimum interval state, that is, the working channel of the second receiver and the working channel of the second transmitter are set at a position as close as possible to each other's working channels or at an overlapping position. For example, assuming that the second receiver is an NR Cell 1 receiver (which can be referred to as NR Cell 1 in the subsequent description) and the second transmitter is a WLAN AP 1 (Cell 27) transmitter (which can be referred to as WLAN AP 1 (Cell 27) in the subsequent description); then the fifth test condition and the sixth test condition can be as shown in Table 9. In Table 9, "T0" is equivalent to the fifth test condition and "T1" is equivalent to the sixth test condition.

[0284]

[0285] Table 9

[0286] In actual application, the third test requirement may include an absolute value threshold (i.e., the threshold of Type 1 described above). For example, after configuring the operating channel of the second receiver to X0 (channel X0 is the channel farthest from the operating frequency band of the second transmitter) and configuring the operating channel of the second transmitter to Y0 (channel Y0 is the channel farthest from the operating frequency band of the second receiver) to establish the fifth test condition, the test equipment may measure the reference sensitivity and / or throughput of the second receiver and confirm whether the reference sensitivity and / or throughput of the second receiver meets the third test requirement. That is, the third test requirement may include an absolute value threshold corresponding to the reference sensitivity and / or throughput of the second receiver. If the reference sensitivity and / or throughput of the second receiver does not meet the third test requirement, the test device can determine that the terminal has detected an IDC problem; if the reference sensitivity and / or throughput of the second receiver meets the third test requirement, the test device can determine that the terminal has not detected an IDC problem; when the terminal has not detected an IDC problem, the test device can configure the working channel of the second receiver and the working channel of the second transmitter to gradually approach each other, and the reference sensitivity and / or throughput of the second receiver needs to be tested once every time the working channels of the second receiver and / or the second transmitter are adjusted once or every multiple times (the multiple times are at least twice) (that is, the test conditions change), until the reference sensitivity and / or throughput of the second receiver does not meet the third test requirement, then the test device can determine that the terminal has detected an IDC problem at this time.

[0287] When the operating channel of the second receiver configured by the test equipment and the operating channel of the second transmitter are gradually close to each other, Figure 4 As shown, the test equipment can configure the working channel of the second receiver and the working channel of the second transmitter to be close to each other, and determine whether the terminal detects an IDC problem through the third test requirement. If the maximum number of channels in the working frequency band of the second receiver is N (N is an integer greater than 1), then n is a positive integer starting from 1 in the range [1, N]; if the maximum number of channels in the working frequency band of the second transmitter is M (M is an integer greater than 1), then m is a positive integer starting from 1 in the range [1, M]. Specifically, Figure 4 As shown, when the measured reference sensitivity and / or throughput of the second receiver meets the third test requirement, the value of m increases by 1, and the value of n also increases by 1, that is, the working channel of the second receiver moves one channel toward the working frequency band close to the interference source (that is, the second transmitter), and the working channel of the second transmitter also moves one channel toward the working frequency band close to the second receiver at the same time; at this time, the test device needs to measure the reference sensitivity and / or throughput of the second receiver again, and again determine whether the reference sensitivity and / or throughput of the second receiver meets the third test requirement; if the reference sensitivity and / or throughput of the second receiver does not meet the third test requirement, then the test device can determine that the terminal has detected an IDC problem and can enter the subsequent IDC problem test process; thereafter, the test device can execute the IDC problem test process on the terminal. If the reference sensitivity and / or throughput of the second receiver meets the third test requirement, and the terminal still does not detect the IDC problem at this time, then the value of m continues to increase by 1, and the value of n also continues to increase by 1, until the reference sensitivity and / or throughput of the second receiver no longer meets the third test requirement. Here, if the terminal still does not detect the IDC problem, n = N and m = M can be set, that is, the working channel of the second receiver and the working channel of the second transmitter are both set at a position as close as possible to each other's working channels or at an overlapping position, that is, the sixth test condition is established. If the terminal also does not detect the IDC problem under the sixth test condition, the IDC problem establishment fails.

[0288] When the operating channel of the second receiver configured by the test equipment and the operating channel of the second transmitter are gradually close to each other, as shown in FIG. Figure 5As shown, the test equipment can configure the working channel of the second transmitter to be close to the working channel of the second receiver, and determine whether the terminal detects an IDC problem through the third test requirement. If the maximum number of channels in the working frequency band of the second transmitter is M (M is an integer greater than 1), then m is a positive integer starting from 1 in the range [1, M]. Specifically, Figure 5 As shown, when the measured reference sensitivity and / or throughput of the second receiver meets the third test requirement, the value of m increases by 1, that is, the working channel of the interference source (i.e., the second transmitter) moves one channel closer to the working frequency band of the second receiver; at this time, the test device needs to measure the reference sensitivity and / or throughput of the second receiver again and again determine whether the reference sensitivity and / or throughput of the second receiver meets the third test requirement; if the reference sensitivity and / or throughput of the second receiver does not meet the third test requirement, the test device can determine that the terminal has detected an IDC problem and can enter the subsequent IDC problem test process; thereafter, the test device can execute the IDC problem test process on the terminal. If the reference sensitivity and / or throughput of the second receiver meets the third test requirement, then the terminal still has not detected an IDC problem, and the value of m continues to increase by 1 until the reference sensitivity and / or throughput of the second receiver does not meet the third test requirement. Here, if the terminal has not detected the IDC problem, m=M can be set, that is, the working channel of the second transmitter is set as close as possible to or overlapping with the working channel of the second receiver; if the terminal still has not detected the IDC problem, the IDC problem construction fails.

[0289] When the operating channel of the second receiver configured by the test equipment and the operating channel of the second transmitter are gradually close to each other, as shown in FIG. Figure 6 As shown, the test equipment can configure the working channel of the second receiver to be close to the working channel of the second transmitter, and determine whether the terminal detects an IDC problem through the third test requirement. If the maximum number of channels in the working frequency band of the second receiver is N (N is an integer greater than 1), then n is a positive integer starting from 1 in the range [1, N]. Specifically, Figure 4As shown, when the measured reference sensitivity and / or throughput of the second receiver meets the third test requirement, the value of n increases by 1, that is, the operating channel of the second receiver moves one channel toward the operating frequency band of the interference source (i.e., the second transmitter); at this time, the test device needs to measure the reference sensitivity and / or throughput of the second receiver again and again determine whether the reference sensitivity and / or throughput of the second receiver meets the third test requirement; if the reference sensitivity and / or throughput of the second receiver does not meet the third test requirement, the test device can determine that the terminal has detected an IDC problem and can enter the subsequent IDC problem test process; thereafter, the test device can execute the IDC problem test process on the terminal. If the reference sensitivity and / or throughput of the second receiver meets the third test requirement, then the terminal still has not detected an IDC problem, and the value of n continues to increase by 1 until the reference sensitivity and / or throughput of the second receiver does not meet the third test requirement. Here, if the terminal has not detected the IDC problem, n=N can be set, that is, the working channel of the second receiver is set as close as possible to or overlapping with the working channel of the second transmitter; if the terminal still has not detected the IDC problem, the IDC problem construction fails.

[0290] In actual application, the third test requirement may include an absolute value threshold (i.e., the threshold of Type 1 described above) and a relative value threshold (also known as a change threshold, i.e., the threshold of Type 2 described above). For example, after configuring the operating channel of the second receiver to X0 (channel X0 is the channel farthest from the operating frequency band of the second transmitter) and configuring the operating channel of the second transmitter to Y0 (channel Y0 is the channel farthest from the operating frequency band of the second receiver) to establish the fifth test condition, the test equipment may measure the reference sensitivity and / or throughput of the second receiver and confirm whether the reference sensitivity and / or throughput of the second receiver meets the third test requirement. If the reference sensitivity and / or throughput of the second receiver does not meet the third test requirement, the test device may determine that the terminal has detected an IDC problem; if the reference sensitivity and / or throughput of the second receiver meets the third test requirement, the test device may determine that the terminal has not detected an IDC problem, and may use the currently measured reference sensitivity and / or throughput of the second receiver as a benchmark value; when the terminal has not detected an IDC problem, the test device may configure the working channel of the second receiver and the working channel of the second transmitter to gradually approach each other, and the reference sensitivity and / or throughput of the second receiver needs to be tested once each time the working channels of the second receiver and / or second transmitter are adjusted once or multiple times (i.e., the test conditions change), until the change in the reference sensitivity and / or throughput of the second receiver compared to the benchmark value reaches a threshold T (for example, the change in the reference sensitivity reaches the above-mentioned XdB), and the test device may determine that the terminal has detected an IDC problem at this time.

[0291] When the operating channel of the second receiver configured by the test equipment and the operating channel of the second transmitter are gradually close to each other, Figure 7 As shown, the test equipment can configure the working channel of the second receiver and the working channel of the second transmitter to be close to each other, and determine whether the terminal detects the IDC problem through the third test requirement (i.e., the change threshold T). If the maximum number of channels in the working frequency band of the second receiver is N (N is an integer greater than 1), then n is a positive integer starting from 1 in the range [1, N]; if the maximum number of channels in the working frequency band of the second transmitter is M (M is an integer greater than 1), then m is a positive integer starting from 1 in the range [1, M]; the threshold T can be a fixed value (such as 3dB) when corresponding to the reference sensitivity, and can be a percentage value (such as 50%) when corresponding to the throughput. Specifically, as Figure 7As shown, once it is determined that the change in the reference sensitivity RefSense_n and / or throughput TP_n of the second receiver compared to the reference reference sensitivity RefSense_0 and / or reference throughput TP_0 of the second receiver is less than a threshold T, the value of m is increased by 1, and the value of n is also increased by 1, that is, the working channel of the second receiver is moved by one channel toward the working frequency band of the interference source (that is, the second transmitter), and the working channel of the second transmitter is also moved by one channel toward the working frequency band of the second receiver. At this time, the test device needs to measure the reference sensitivity RefSense_n and / or throughput TP_n of the second receiver again, and again determine whether the change in RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is less than the threshold T. If it is determined that the change in RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is not less than the threshold T, the test device can determine that the terminal has detected an IDC problem and can enter the subsequent IDC problem test process. Thereafter, the test device can execute the IDC problem test process on the terminal. If it is determined that the change in RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is less than the threshold T, then the terminal has not yet detected the IDC problem. In this case, the value of m continues to increase by 1, and the value of n also continues to increase by 1, until the change in RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is not less than the threshold T. Here, if the terminal has not yet detected the IDC problem, n=N and m=M can be set, that is, the operating channel of the second receiver and the operating channel of the second transmitter are both set at positions as close as possible to each other's operating channels or at overlapping positions, that is, the sixth test condition is established. If the terminal has not detected the IDC problem under the sixth test condition, the IDC problem establishment fails.

[0292] When the operating channel of the second receiver configured by the test equipment and the operating channel of the second transmitter are gradually close to each other, as shown in FIG. Figure 8 As shown, the test equipment can configure the working channel of the second transmitter to be close to the working channel of the second receiver, and determine whether the terminal detects the IDC problem through the third test requirement (i.e., the change threshold T). If the maximum number of channels in the working frequency band of the second transmitter is M (M is an integer greater than 1), then the value of m is a positive integer starting from 1 in the range [1, M]; the threshold T can be a fixed value (such as 3dB) when corresponding to the reference sensitivity, and can be a percentage value (such as 50%) when corresponding to the throughput. Specifically, as Figure 8As shown, once it is determined that the change in the reference sensitivity RefSense_n and / or throughput TP_n of the second receiver compared to the reference reference sensitivity RefSense_0 and / or reference throughput TP_0 of the second receiver is less than the threshold T, the value of m is increased by 1, that is, the working channel of the interference source (that is, the second transmitter) moves one channel toward the working frequency band of the second receiver; at this time, the test device needs to measure the reference sensitivity RefSense_n and / or throughput TP_n of the second receiver again, and again determine whether the change in RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is less than the threshold T; if it is determined that the change in RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is not less than the threshold T, then the test device can determine that the terminal has detected an IDC problem and can enter the subsequent IDC problem test process; thereafter, the test device can execute the IDC problem test process on the terminal. If it is determined that the change in RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is less than the threshold T, then the terminal has not yet detected an IDC problem, and the value of m continues to increase by 1 until the change in RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is not less than the threshold T. Here, if the terminal has not yet detected an IDC problem, m=M can be set, that is, the operating channel of the second transmitter is set as close as possible to or overlapping with the operating channel of the second receiver; if the terminal still has not detected an IDC problem, the IDC problem construction fails.

[0293] When the operating channel of the second receiver configured by the test equipment and the operating channel of the second transmitter are gradually close to each other, as shown in FIG. Figure 9 As shown, the test equipment can configure the working channel of the second receiver to be close to the working channel of the second transmitter, and determine whether the terminal detects the IDC problem through the third test requirement (i.e., the change threshold T). If the maximum number of channels in the working frequency band of the second receiver is N (N is an integer greater than 1), then n is a positive integer starting from 1 in the range of [1, N]; the threshold T can be a fixed value (such as 3dB) when corresponding to the reference sensitivity, and can be a percentage value (such as 50%) when corresponding to the throughput. Specifically, as Figure 9As shown, once it is determined that the change in the reference sensitivity RefSense_n and / or throughput TP_n of the second receiver compared to the reference reference sensitivity RefSense_0 and / or reference throughput TP_0 of the second receiver is less than the threshold T, the value of n is increased by 1, that is, the working channel of the second receiver moves one channel toward the working frequency band close to the interference source (that is, the second transmitter); at this time, the test device needs to measure the reference sensitivity RefSense_n and / or throughput TP_n of the second receiver again, and again determine whether the change in RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is less than the threshold T; if it is determined that the change in RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is not less than the threshold T, then the test device can determine that the terminal has detected an IDC problem and can enter the subsequent IDC problem test process; thereafter, the test device can execute the IDC problem test process on the terminal. If it is determined that the change in RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is less than the threshold T, then the terminal has not yet detected an IDC problem. The value of n then continues to increase by 1 until the change in RefSense_n and / or TP_n compared to RefSense_0 and / or TP_0 is no less than the threshold T. Here, if the terminal has not yet detected an IDC problem, n=N may be set, i.e., the operating channel of the second receiver is set as close as possible to or overlapping with the operating channel of the second transmitter. If the terminal still has not detected an IDC problem, then the IDC problem construction fails.

[0294] In actual application, it can be seen from the above description that the third test requirement can also include an absolute value threshold (i.e. the threshold of the above type 1) and / or a relative value threshold (i.e. the threshold of the above type 2, i.e. the above change threshold T).

[0295] Based on this, in one embodiment, the indicators associated with the third test requirement may include N, where N is an integer greater than or equal to 1; and satisfying the third test requirement may include at least one of the following:

[0296] At least one of the N indicators is better than or equal to the corresponding threshold;

[0297] The change of at least one indicator among the N indicators is better than or equal to the corresponding threshold.

[0298] Specifically, in one embodiment, satisfying the third test requirement may include at least one of the following:

[0299] The reference sensitivity of the second receiver of the terminal is better than (ie, less than) or equal to a ninth threshold;

[0300] The throughput of the second receiver of the terminal is better than (i.e., greater than) or equal to a tenth threshold;

[0301] The reference sensitivity change of the second receiver of the terminal under the current test condition and the fifth test condition is better than (i.e., less than) or equal to an eleventh threshold (i.e., the above-mentioned change threshold T);

[0302] The throughput variation of the second receiver of the terminal under the current test condition and the fifth test condition is better than (ie, smaller than) or equal to a twelfth threshold (ie, the variation threshold T).

[0303] In actual application, the eleventh threshold and / or the twelfth threshold are equivalent to the above-mentioned change threshold T. The specific values ​​of the ninth threshold, the tenth threshold, the eleventh threshold, and the twelfth threshold can be preset according to the test requirements. Alternatively, the association between the different capability levels of the terminal and the different values ​​of the thresholds (i.e., the ninth threshold, the tenth threshold, the eleventh threshold, and the twelfth threshold) can be preset, and the test equipment can use the capability level of the terminal to determine the specific values ​​of the thresholds (i.e., the ninth threshold, the tenth threshold, the eleventh threshold, and the twelfth threshold). Exemplarily, the association relationship between different capability levels of the terminal and different values ​​of the eleventh threshold and / or the twelfth threshold can be pre-set: the first capability level (default capability level) is associated with 3dB (that is, the eleventh threshold is 3dB, that is, the change threshold T is 3dB) and / or 50% (that is, the twelfth threshold is 50%, that is, the change threshold T is 50%), the second capability level is associated with 6dB (that is, the eleventh threshold is 6dB, that is, the change threshold T is 6dB) and / or 75% (that is, the twelfth threshold is 75%, that is, the change threshold T is 75%), the third capability level is associated with 1.5dB (that is, the eleventh threshold is 1.5dB, that is, the change threshold T is 1.5dB), and / or 50% (that is, the twelfth threshold is 50%, that is, the change threshold T is 50%). 1.5dB, that is, the change threshold T is 1.5dB) and / or 25% (that is, the twelfth threshold is 25%, that is, the change threshold T is 25%); the terminal can declare its own capability level to the test device by reporting the capability level identifier or directly reporting the specific values ​​of the eleventh threshold and / or the twelfth threshold according to its own implementation situation; the test device can determine the specific values ​​of the eleventh threshold and / or the twelfth threshold according to the capability level declared by the terminal, as a basis for judging whether the terminal has detected an IDC problem.

[0304] In one embodiment, executing the IDC question construction process on the terminal may include:

[0305] A first signal is configured for the terminal, wherein the first signal enables the terminal to detect an IDC problem.

[0306] Among them, in actual application, the embodiment of the present application does not limit the specific type of the first signal, as long as its function is realized. Exemplarily, the first signal may include a man-machine interface (MMI) signal or an attention (AT) command, etc. In addition, the first signal can also enable the terminal to solve the detected IDC problem, that is, "the terminal detects the IDC problem" and "the terminal solves the detected IDC problem" can be completed by MMI or AT command (English can be expressed as "UE detects IDC problem" and "The IDC problems detected by the UE are resolved" could be done by MMI or AT command).

[0307] The test method provided in the embodiment of the present application executes an IDC problem test process on the terminal; if no first test result is obtained, confirms whether the terminal detects an IDC problem in the IDC problem test process; generates a second test result for the terminal based on whether the terminal detects an IDC problem in the IDC problem test process; or confirms whether the terminal detects an IDC problem; if it is confirmed that the terminal detects an IDC problem, executes an IDC problem test process on the terminal to generate a third test result for the terminal, or if it is confirmed that the terminal does not detect an IDC problem, executes an IDC problem construction process on the terminal; after the IDC problem construction process is executed, executes an IDC problem test process on the terminal to generate a third test result for the terminal. The solution provided by the embodiment of the present application is to confirm whether the terminal has detected an IDC problem in the IDC problem test process after executing the IDC problem test process on the terminal, if the terminal fails the test, that is, if the test result of passing the test (that is, the above-mentioned first test result) is not obtained, and then generate the final test result for the terminal according to the confirmed result; or, before executing the IDC problem test process on the terminal, first confirm whether the terminal has detected an IDC problem, and then execute the IDC problem test process on the terminal if it is confirmed that the terminal has detected an IDC problem, or first execute the IDC problem construction on the terminal if it is confirmed that the terminal has not detected an IDC problem. The IDC problem is constructed using the test process, and the IDC problem test process is then executed on the terminal. In this way, the situation where "the IDC problem does not occur during the execution of the IDC problem test process on the terminal due to the excellent terminal design (which can be understood as the terminal being able to support the IDC mechanism and improve the IDC problem)" can be avoided from being mistakenly judged as the terminal failing the test. In other words, the problem of a qualified terminal that can support the IDC mechanism being mistakenly judged as an unqualified terminal that cannot support the IDC mechanism can be avoided, thereby accurately judging whether the terminal correctly supports the relevant functions of the IDC problem, that is, accurately judging whether the MDT function of the terminal has an IDC mechanism that meets the relevant technical requirements.

[0308] In order to implement the method of the embodiment of the present application, the embodiment of the present application also provides a testing device, which is set on the testing equipment, such as Figure 10 As shown, the device includes:

[0309] The first testing unit 1001 is configured to execute an IDC problem testing process on the terminal;

[0310] A first confirmation unit 1002 is configured to confirm whether the terminal detects an IDC problem in the IDC problem test process if the first test result is not obtained;

[0311] The second testing unit 1003 is configured to generate a second test result for the terminal according to whether the terminal detects an IDC problem in the IDC problem testing process.

[0312] In one embodiment, the first confirmation unit 1002 is specifically configured to:

[0313] Construct at least one test condition identical to the IDC problem test process;

[0314] For each of the at least one test condition, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal;

[0315] The at least one measurement result is used to confirm whether the terminal detects an IDC problem in the IDC problem testing process.

[0316] In one embodiment, the first confirmation unit 1002 is specifically configured to:

[0317] During the execution of the IDC problem test process on the terminal, for each of the at least one constructed test condition, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal;

[0318] The at least one measurement result is used to confirm whether the terminal detects an IDC problem in the IDC problem testing process.

[0319] In one embodiment, the first confirmation unit 1002 is further configured to:

[0320] Under a first test condition, measuring at least one indicator associated with an IDC problem on the terminal;

[0321] or,

[0322] For the first test condition and the second test condition, at least one indicator associated with the IDC problem is measured on the terminal respectively; wherein,

[0323] Under the first test condition, the operating channel of the first receiver and the operating channel of the first transmitter of the terminal are configured to be in a minimum separation state;

[0324] Under the second test condition, the working channel of the first receiver and the working channel of the first transmitter of the terminal are configured to be in a maximum gap state.

[0325] In one embodiment, the first confirmation unit 1002 is further configured to:

[0326] If the at least one measurement result does not meet the first test requirement, it indicates (which can be understood as confirmation) that the terminal has detected an IDC problem in the IDC problem test process;

[0327] or,

[0328] If the at least one measurement result meets the first test requirement, it indicates that no IDC problem is detected for the terminal in the IDC problem test process.

[0329] In one embodiment, the first confirmation unit 1002 is further configured to determine a third threshold and / or a fourth threshold by using the capability level of the terminal, and different capability levels correspond to different third thresholds and / or fourth thresholds.

[0330] In one embodiment, the second testing unit 1003 is specifically configured to:

[0331] In a case where the terminal detects an IDC problem during the IDC problem testing process, determining that the second test result indicates that the terminal has failed the test;

[0332] In a case where no IDC problem is detected on the terminal during the IDC problem test process, it is determined that the second test result indicates that the terminal has passed the test.

[0333] In actual application, the first test unit 1001 and the first confirmation unit 1002 can be implemented by a processor in the test device in combination with a communication interface; the second test unit 1003 can be implemented by a processor in the test device.

[0334] In order to implement the method of the embodiment of the present application, the embodiment of the present application also provides a testing device, which is set on the testing equipment, such as Figure 11 As shown, the device includes:

[0335] The second confirmation unit 1101 is used to confirm whether the terminal detects an IDC problem;

[0336] The third test unit 1102 is used to execute an IDC problem test process on the terminal to generate a third test result for the terminal when it is confirmed that the terminal has detected an IDC problem; or to execute an IDC problem construction process on the terminal when it is confirmed that the terminal has not detected an IDC problem; after the IDC problem construction process is executed, execute an IDC problem test process on the terminal to generate a third test result for the terminal.

[0337] In one embodiment, the second confirmation unit 1101 is specifically configured to:

[0338] Construct at least one test condition;

[0339] For each of the at least one test condition, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal;

[0340] Using the at least one measurement result, it is determined whether the terminal detects an IDC problem.

[0341] In one embodiment, the second confirmation unit 1101 is further configured to:

[0342] If the at least one measurement result meets the second test requirement, it indicates (which can be understood as confirmation) that the terminal does not detect the IDC problem;

[0343] or,

[0344] If the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an unclosed state, and the at least one measurement result meets the second test requirement when the second transmitter of the terminal is configured to be in a closed state, it indicates that an IDC problem is detected in the terminal.

[0345] In one embodiment, the second confirmation unit 1101 is further configured to:

[0346] In a case where the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an off state, or,

[0347] In a case where the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an unclosed state, and the at least one measurement result also does not meet the second test requirement when the second transmitter of the terminal is configured to be in a closed state,

[0348] A fourth test result for the terminal is generated, where the fourth test result indicates that the terminal has failed the test.

[0349] In one embodiment, if Figure 11 As shown, the apparatus may further include a fourth testing unit 1103, configured to:

[0350] Construct at least one test condition;

[0351] For each of the at least one test condition, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal;

[0352] In a case where the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an off state, or,

[0353] In a case where the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an unclosed state, and the at least one measurement result also does not meet the second test requirement when the second transmitter of the terminal is configured to be in a closed state,

[0354] A fourth test result for the terminal is generated, where the fourth test result indicates that the terminal has failed the test.

[0355] In one embodiment, the third testing unit 1102 is further configured to execute the IDC problem testing process on the terminal when the IDC problem building process is completed and the terminal detects an IDC problem.

[0356] In one embodiment, the third testing unit 1102 is specifically configured to:

[0357] In the IDC problem construction process, with the fifth test condition as the initial test condition, the operating channel of the second receiver of the terminal and the operating channel of the second transmitter are configured to be close to each other, or the operating channel of the second transmitter of the terminal is configured to be close to the operating channel of the second receiver, or the operating channel of the second receiver of the terminal is configured to be close to the operating channel of the second transmitter; wherein, under the fifth test condition, the operating channel of the second receiver of the terminal and the operating channel of the second transmitter are configured to be in a maximum interval state, and the second transmitter is configured to be in an open state;

[0358] When the test condition changes, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal;

[0359] If the at least one measurement result does not meet the third test requirement, it is determined that the IDC problem construction process is completed and the terminal detects an IDC problem.

[0360] In one embodiment, the third testing unit 1102 is specifically configured to configure a first signal to the terminal, where the first signal enables the terminal to detect an IDC problem.

[0361] In actual application, the second confirmation unit 1101, the third test unit 1102 and the fourth test unit 1103 can be implemented by a processor in the test device in combination with a communication interface.

[0362] It should be noted that the test device provided in the above embodiment is merely illustrated by the division of the aforementioned program modules during testing. In actual application, the aforementioned processing can be distributed among different program modules as needed, that is, the internal structure of the device can be divided into different program modules to complete all or part of the aforementioned processing. Furthermore, the test device provided in the above embodiment and the test method embodiment are based on the same concept. The specific implementation process is detailed in the method embodiment and will not be repeated here.

[0363] Based on the hardware implementation of the above program modules, and in order to implement the method of the embodiment of the present application, the embodiment of the present application also provides a testing device, such as Figure 12 As shown, the test device 1200 includes:

[0364] Communication interface 1201, capable of exchanging information with the terminal;

[0365] A processor 1202, connected to the communication interface 1201, to implement information interaction with the terminal, and configured to execute the method provided by one or more of the above technical solutions when running a computer program;

[0366] The computer program is stored in the memory 1203 .

[0367] Specifically, when implementing a testing method according to an embodiment of the present application, the processor 1202 is configured to:

[0368] Perform IDC problem testing process on the terminal;

[0369] If no first test result is obtained, confirming whether the terminal detects an IDC problem in the IDC problem test process;

[0370] A second test result for the terminal is generated according to whether the terminal detects an IDC problem in the IDC problem test process.

[0371] In one embodiment, the processor 1202 is further configured to:

[0372] Construct at least one test condition identical to the IDC problem test process;

[0373] For each of the at least one test condition, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal;

[0374] The at least one measurement result is used to confirm whether the terminal detects an IDC problem in the IDC problem testing process.

[0375] In one embodiment, the processor 1202 is further configured to:

[0376] During the execution of the IDC problem test process on the terminal, for each of the at least one constructed test condition, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal;

[0377] The at least one measurement result is used to confirm whether the terminal detects an IDC problem in the IDC problem testing process.

[0378] In one embodiment, the processor 1202 is further configured to:

[0379] Under a first test condition, measuring at least one indicator associated with an IDC problem on the terminal;

[0380] or,

[0381] For the first test condition and the second test condition, at least one indicator associated with the IDC problem is measured on the terminal respectively; wherein,

[0382] Under the first test condition, the operating channel of the first receiver and the operating channel of the first transmitter of the terminal are configured to be in a minimum separation state;

[0383] Under the second test condition, the working channel of the first receiver and the working channel of the first transmitter of the terminal are configured to be in a maximum gap state.

[0384] In one embodiment, the processor 1202 is further configured to:

[0385] If the at least one measurement result does not meet the first test requirement, it indicates (which can be understood as confirmation) that the terminal has detected an IDC problem in the IDC problem test process;

[0386] or,

[0387] If the at least one measurement result meets the first test requirement, it indicates that no IDC problem is detected for the terminal in the IDC problem test process.

[0388] In one embodiment, the processor 1202 is further configured to determine a third threshold and / or a fourth threshold by using the capability level of the terminal, and different capability levels correspond to different third thresholds and / or fourth thresholds.

[0389] In one embodiment, the processor 1202 is further configured to:

[0390] In a case where the terminal detects an IDC problem during the IDC problem testing process, determining that the second test result indicates that the terminal has failed the test;

[0391] In a case where no IDC problem is detected on the terminal during the IDC problem test process, it is determined that the second test result indicates that the terminal has passed the test.

[0392] Accordingly, when implementing another testing method according to an embodiment of the present application, the processor 1202 is configured to:

[0393] Check whether the terminal detects an IDC problem;

[0394] If it is confirmed that the terminal has detected an IDC problem, executing an IDC problem test process on the terminal to generate a third test result for the terminal; or

[0395] When it is confirmed that no IDC problem is detected in the terminal, an IDC problem construction process is executed on the terminal; after the IDC problem construction process is completed, an IDC problem test process is executed on the terminal to generate a third test result for the terminal.

[0396] In one embodiment, the processor 1202 is further configured to:

[0397] Construct at least one test condition;

[0398] For each of the at least one test condition, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal;

[0399] Using the at least one measurement result, it is determined whether the terminal detects an IDC problem.

[0400] In one embodiment, the processor 1202 is further configured to:

[0401] If the at least one measurement result meets the second test requirement, it indicates (which can be understood as confirmation) that the terminal does not detect the IDC problem;

[0402] or,

[0403] If the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an unclosed state, and the at least one measurement result meets the second test requirement when the second transmitter of the terminal is configured to be in a closed state, it indicates that an IDC problem is detected in the terminal.

[0404] In one embodiment, the processor 1202 is further configured to:

[0405] In a case where the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an off state, or,

[0406] In a case where the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an unclosed state, and the at least one measurement result also does not meet the second test requirement when the second transmitter of the terminal is configured to be in a closed state,

[0407] A fourth test result for the terminal is generated, where the fourth test result indicates that the terminal has failed the test.

[0408] In one embodiment, the processor 1202 is further configured to:

[0409] Construct at least one test condition;

[0410] For each of the at least one test condition, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal;

[0411] In a case where the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an off state, or,

[0412] In a case where the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an unclosed state, and the at least one measurement result also does not meet the second test requirement when the second transmitter of the terminal is configured to be in a closed state,

[0413] A fourth test result for the terminal is generated, where the fourth test result indicates that the terminal has failed the test.

[0414] In one embodiment, the processor 1202 is further configured to execute the IDC problem testing process on the terminal when the IDC problem building process is completed and the terminal detects an IDC problem.

[0415] In one embodiment, the processor 1202 is further configured to:

[0416] In the IDC problem construction process, with the fifth test condition as the initial test condition, the operating channel of the second receiver of the terminal and the operating channel of the second transmitter are configured to be close to each other, or the operating channel of the second transmitter of the terminal is configured to be close to the operating channel of the second receiver, or the operating channel of the second receiver of the terminal is configured to be close to the operating channel of the second transmitter; wherein, under the fifth test condition, the operating channel of the second receiver of the terminal and the operating channel of the second transmitter are configured to be in a maximum interval state, and the second transmitter is configured to be in an open state;

[0417] When the test condition changes, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal;

[0418] If the at least one measurement result does not meet the third test requirement, it is determined that the IDC problem construction process is completed and the terminal detects an IDC problem.

[0419] In one embodiment, the processor 1202 is further configured to configure a first signal to the terminal, where the first signal enables the terminal to detect an IDC problem.

[0420] It should be noted that the specific processing process of the processor 1202 can be understood by referring to the above method and will not be repeated here.

[0421] Of course, in actual application, the various components in the test device 1200 are coupled together through the bus system 1204. It can be understood that the bus system 1204 is used to realize the connection and communication between these components. In addition to the data bus, the bus system 1204 also includes a power bus, a control bus, and a status signal bus. However, for the sake of clarity, Figure 12 Various buses are labeled as bus system 1204.

[0422] The memory 1203 in the embodiment of the present application is used to store various types of data to support the operation of the test device 1200. Examples of such data include: any computer program used to operate on the test device 1200.

[0423] The methods disclosed in the above embodiments of the present application can be applied to the processor 1202 or implemented by the processor 1202. The processor 1202 may be an integrated circuit chip with signal processing capabilities. During implementation, the steps of the above methods can be completed by hardware integrated logic circuits or software instructions in the processor 1202. The processor 1202 may be a general-purpose processor, a digital signal processor (DSP), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The processor 1202 can implement or execute the various methods, steps, and logic block diagrams disclosed in the embodiments of the present application. A general-purpose processor may be a microprocessor or any conventional processor, etc. The steps of the methods disclosed in the embodiments of the present application can be directly embodied as being executed by a hardware decoding processor, or by a combination of hardware and software modules in the decoding processor. The software module can be located in a storage medium, which is located in the memory 1203. The processor 1202 reads the information in the memory 1203 and completes the steps of the above methods in combination with its hardware.

[0424] In an exemplary embodiment, the test device 1200 can be implemented by one or more application-specific integrated circuits (ASICs), DSPs, programmable logic devices (PLDs), complex programmable logic devices (CPLDs), field-programmable gate arrays (FPGAs), general-purpose processors, controllers, microcontrollers (MCUs), microprocessors, or other electronic components to perform the aforementioned method.

[0425] It is understood that the memory 1203 of the embodiment of the present application can be a volatile memory or a non-volatile memory, and can also include both volatile and non-volatile memories. Among them, the non-volatile memory can be a read-only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), a magnetic random access memory (FRAM), a flash memory, a magnetic surface memory, an optical disc, or a compact disc read-only memory (CD-ROM); the magnetic surface memory can be a magnetic disk memory or a tape memory. The volatile memory can be a random access memory (RAM), which is used as an external cache. By way of example and not limitation, many forms of RAM are available, such as static random access memory (SRAM), synchronous static random access memory (SSRAM), dynamic random access memory (DRAM), synchronous dynamic random access memory (SDRAM), double data rate synchronous dynamic random access memory (DDRSDRAM), enhanced synchronous dynamic random access memory (ESDRAM), synchronous link dynamic random access memory (SLDRAM), and direct rambus random access memory (DRRAM).The memories described in the embodiments of this application are intended to include, but are not limited to, these and any other suitable types of memories.

[0426] In an exemplary embodiment, the present application also provides a storage medium, namely, a computer storage medium, specifically, a computer-readable storage medium, including, for example, a memory 1203 storing a computer program. The computer program can be executed by a processor 1202 of a test device 1200 to perform the steps of the aforementioned method. The computer-readable storage medium can be a memory such as FRAM, ROM, PROM, EPROM, EEPROM, Flash Memory, magnetic surface storage, optical disk, or CD-ROM.

[0427] It should be noted that: "first", "second", etc. are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence.

[0428] In addition, the technical solutions described in the embodiments of the present application can be arbitrarily combined without conflict.

[0429] The above description is merely a preferred embodiment of the present application and is not intended to limit the scope of protection of the present application.

Claims

1. A testing method, characterized in that: include: Execute the IDC coexistence problem test process on the terminal; If the first test result is not obtained, confirming whether the terminal detects an IDC problem in the IDC problem test process; A second test result for the terminal is generated according to whether the terminal detects an IDC problem in the IDC problem test process.

2. The method according to claim 1, characterized in that The confirming whether the terminal detects an IDC problem in the IDC problem testing process includes: Constructing at least one test condition identical to the IDC problem test process; For each test condition of the at least one test condition, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal; Using the at least one measurement result, it is confirmed whether the terminal detects an IDC problem in the IDC problem test process.

3. The method according to claim 1, characterized in that The confirming whether the terminal detects an IDC problem in the IDC problem testing process includes: In the process of executing the IDC problem test process on the terminal, for each of the at least one test condition constructed, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal; Using the at least one measurement result, it is confirmed whether the terminal detects an IDC problem in the IDC problem test process.

4. The method according to claim 2 or 3, characterized in that: For the first test condition, measuring at least one indicator associated with the IDC problem on the terminal; or, For the first test condition and the second test condition, at least one indicator associated with the IDC problem is measured for the terminal respectively; wherein, Under the first test condition, the working channel of the first receiver and the working channel of the first transmitter of the terminal are configured to be in a minimum spacing state; Under the second test condition, the working channel of the first receiver and the working channel of the first transmitter of the terminal are configured to be in a maximum spacing state.

5. The method according to claim 4, characterized in that Under the second test condition, the first transmitter is configured to be in an off state.

6. The method according to claim 2 or 3, characterized in that: Indicators associated with IDC issues include at least one of the following: a reference sensitivity of a first receiver of the terminal; A throughput of a first receiver of the terminal.

7. The method according to claim 2 or 3, characterized in that: The using the at least one measurement result to confirm whether the terminal detects an IDC problem in the IDC problem test process includes: If the at least one measurement result does not meet the first test requirement, it indicates that the terminal has detected an IDC problem in the IDC problem test process; or, When the at least one measurement result meets the first test requirement, it indicates that the terminal does not detect an IDC problem in the IDC problem test process.

8. The method according to claim 7, characterized in that The indicators associated with the first test requirement include N, where N is an integer greater than or equal to 1; satisfying the first test requirement includes at least one of the following: At least one of the N indicators is better than or equal to the corresponding threshold; The change amount of at least one indicator among the N indicators is better than or equal to the corresponding threshold.

9. The method according to claim 7, characterized in that: The first test requirement is met, including at least one of the following: A reference sensitivity of the first receiver of the terminal under a first test condition is better than or equal to a first threshold; The throughput of the first receiver of the terminal under the first test condition is better than or equal to a second threshold; A reference sensitivity change amount of the first receiver of the terminal under the first test condition and the second test condition is better than or equal to a third threshold; The throughput change of the first receiver of the terminal under the first test condition and the second test condition is better than or equal to the fourth threshold; wherein, Under the first test condition, the working channel of the first receiver and the working channel of the first transmitter of the terminal are configured to be in a minimum spacing state; Under the second test condition, the working channel of the first receiver and the working channel of the first transmitter of the terminal are configured to be in a maximum spacing state.

10. The method according to claim 9, characterized in that The method further comprises: The third threshold and / or the fourth threshold are determined by using the capability level of the terminal, and different capability levels correspond to different third thresholds and / or fourth thresholds.

11. The method according to claim 1, characterized in that: The generating a second test result for the terminal according to whether the terminal detects an IDC problem in the IDC problem test process comprises: In the case where the terminal detects an IDC problem in the IDC problem test process, the second test result indicates that the terminal fails the test; In a case where the terminal does not detect an IDC problem in the IDC problem test process, the second test result indicates that the terminal passes the test.

12. A testing method, characterized in that: include: Confirm whether the terminal detects IDC problems; When it is confirmed that the terminal has detected an IDC problem, executing an IDC problem test process on the terminal to generate a third test result for the terminal; or, When confirming that the terminal does not detect an IDC problem, executing an IDC problem construction process on the terminal; After the IDC problem building process is executed, an IDC problem testing process is executed on the terminal to generate a third test result for the terminal.

13. The method according to claim 12, characterized in that The step of confirming whether the terminal detects an IDC problem includes: Construct at least one test condition; For each test condition of the at least one test condition, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal; Using the at least one measurement result, it is confirmed whether the terminal detects an IDC problem.

14. The method according to claim 13, characterized in that Indicators associated with IDC issues include at least one of the following: a reference sensitivity of a second receiver of the terminal; A throughput of a second receiver of the terminal.

15. The method according to claim 13, characterized in that The using the at least one measurement result to confirm whether the terminal detects an IDC problem includes: If the at least one measurement result meets the second test requirement, it indicates that the terminal does not detect the IDC problem; or, If the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an open state, and the at least one measurement result meets the second test requirement when the second transmitter of the terminal is configured to be in a closed state, it indicates that the terminal has detected an IDC problem.

16. The method according to claim 15, characterized in that The method further comprises: In a case where the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an off state, or, In a case where the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an unclosed state, and the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in a closed state, A fourth test result for the terminal is generated, wherein the fourth test result indicates that the terminal fails the test.

17. The method according to claim 15, characterized in that The indicators associated with the second test requirement include N, where N is an integer greater than or equal to 1; satisfying the second test requirement includes at least one of the following: At least one of the N indicators is better than or equal to the corresponding threshold; The change amount of at least one indicator among the N indicators is better than or equal to the corresponding threshold.

18. The method according to claim 15, characterized in that Meeting the second test requirement includes at least one of the following: A reference sensitivity of the second receiver of the terminal under a third test condition is better than or equal to a fifth threshold; The throughput of the second receiver of the terminal under the third test condition is better than or equal to a sixth threshold; A reference sensitivity variation of the second receiver of the terminal under the third test condition and the fourth test condition is better than or equal to a seventh threshold; The throughput change of the second receiver of the terminal under the third test condition and the fourth test condition is better than or equal to the eighth threshold; wherein, Under the third test condition, the working channel of the second receiver and the working channel of the second transmitter of the terminal are configured to be in a maximum spacing state; Under the fourth test condition, the working channel of the second receiver and the working channel of the second transmitter of the terminal are configured to be in a minimum interval state.

19. The method according to claim 12, characterized in that The method further comprises: Construct at least one test condition; For each test condition of the at least one test condition, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal; In a case where the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an off state, or, In a case where the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in an unclosed state, and the at least one measurement result does not meet the second test requirement when the second transmitter of the terminal is configured to be in a closed state, A fourth test result for the terminal is generated, wherein the fourth test result indicates that the terminal fails the test.

20. The method according to claim 12, characterized in that After the IDC problem building process is completed, the IDC problem testing process is performed on the terminal, including: When the IDC problem building process is completed and the terminal detects an IDC problem, the IDC problem testing process is executed on the terminal.

21. The method according to claim 12, characterized in that In the IDC problem construction process, the fifth test condition is used as the initial test condition, and the working channel of the second receiver of the terminal and the working channel of the second transmitter are configured to be close to each other, or the working channel of the second transmitter of the terminal is configured to be close to the working channel of the second receiver, or the working channel of the second receiver of the terminal is configured to be close to the working channel of the second transmitter; wherein, under the fifth test condition, the working channel of the second receiver of the terminal and the working channel of the second transmitter are configured to be in the maximum interval state, and the second transmitter is configured to be in the non-closed state; When the test condition changes, measuring at least one indicator associated with the IDC problem on the terminal to obtain at least one measurement result of the terminal; When the at least one measurement result does not meet the third test requirement, it is determined that the IDC problem construction process is completed and the terminal detects an IDC problem.

22. The method according to claim 21, characterized in that The indicators associated with the third test requirement include N, where N is an integer greater than or equal to 1; satisfying the third test requirement includes at least one of the following: At least one of the N indicators is better than or equal to the corresponding threshold; The change amount of at least one indicator among the N indicators is better than or equal to the corresponding threshold.

23. The method according to claim 21, characterized in that Meeting the third test requirement includes at least one of the following: A reference sensitivity of the second receiver of the terminal is better than or equal to a ninth threshold; The throughput of the second receiver of the terminal is better than or equal to a tenth threshold; A reference sensitivity change of the second receiver of the terminal under the current test condition and the fifth test condition is better than or equal to an eleventh threshold; A throughput variation of the second receiver of the terminal under the current test condition and the fifth test condition is better than or equal to a twelfth threshold.

24. The method according to claim 12, characterized in that The executing of the IDC question construction process on the terminal includes: A first signal is configured to the terminal, wherein the first signal enables the terminal to detect an IDC problem.

25. A testing device, characterized in that: include: The first testing unit is used to perform an IDC problem testing process on the terminal; A first confirmation unit, configured to confirm whether the terminal detects an IDC problem in the IDC problem test process if the first test result is not obtained; The second testing unit is configured to generate a second test result for the terminal according to whether the terminal detects an IDC problem in the IDC problem testing process.

26. A testing device, characterized in that: include: A second confirmation unit, used to confirm whether the terminal detects an IDC problem; A third testing unit is configured to, when it is confirmed that the terminal has detected an IDC problem, execute an IDC problem testing process on the terminal to generate a third test result for the terminal; or, when it is confirmed that the terminal has not detected an IDC problem, execute an IDC problem building process on the terminal; After the IDC problem building process is executed, an IDC problem testing process is executed on the terminal to generate a third test result for the terminal.

27. A testing device, characterized in that: include: A communication interface and a processor; wherein, The processor is configured to: execute an IDC problem test process on a terminal; if a first test result is not obtained, confirm whether the terminal detects an IDC problem in the IDC problem test process; and generate a second test result for the terminal according to whether the IDC problem is detected by the terminal in the IDC problem test process; or, The processor is used to: confirm whether the terminal detects an IDC problem; and when it is confirmed that the terminal has detected the IDC problem, execute an IDC problem test process on the terminal to generate a third test result for the terminal; or, when it is confirmed that the terminal has not detected the IDC problem, execute an IDC problem construction process on the terminal; after the IDC problem construction process is executed, execute an IDC problem test process on the terminal to generate a third test result for the terminal.

28. A testing device, characterized in that: include: a processor and a memory for storing a computer program capable of being executed on the processor, Wherein, when the processor is used to run the computer program, it executes the steps of the method described in any one of claims 1 to 11, or executes the steps of the method described in any one of claims 12 to 24.

29. A storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the computer program implements the steps of the method according to any one of claims 1 to 11, or implements the steps of the method according to any one of claims 12 to 24.

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