Pulse detection device for transistor electric signal test

Abstract

The invention discloses a pulse detection device for transistor electric signal testing, and relates to the field of transistor detection devices.The pulse detection device comprises a shell, a conveying belt used for conveying a transistor is installed in the shell, the pulse detection device further comprises a detection frame, and the detection frame is installed at the tail end of the conveying belt; electric signal pulse detection contacts used for making contact with transistor pins are fixedly installed in the conveying belt, the transistors with the pins facing the same direction and the same height on the conveying belt can make direct contact with the detection contacts in the conveying process, and the tail end of the detection frame is rotationally connected with an overturning plate capable of rotating in the two directions; the tail end of the detection frame is further provided with a blocking structure used for blocking subsequent transistors in the overturning process of the overturning plate. The transistors are conveyed to the detection mechanism through the conveying belt, whether the quality of the transistors is qualified or not is rapidly judged, the transistors of different qualities are directly distributed and discharged, the phenomenon of wrong detection or missing detection is effectively avoided, and then the detection accuracy of the transistors is improved.

Description

Technical Field

[0001] The invention relates to the field of transistor detection devices, in particular to a pulse detection device for transistor electrical signal testing. Background Art

[0002] A transistor is a solid semiconductor device that has multiple functions such as detection, rectification, amplification, switching, voltage stabilization, and signal modulation. It can also be used as a variable current switch that can control the output current based on the input voltage.

[0003] A Chinese patent with related announcement number CN114137378A discloses a transistor detection device, including a mounting frame, on which a detection table is mounted, and the detection table is detachably mounted with multiple plug-in boards, and multiple mounting sleeves are arranged above the detection table, and the multiple mounting sleeves correspond to the multiple plug-in boards one by one, and the mounting frame is provided with a linear moving part for driving the multiple mounting sleeves to approach or move away from the plug-in boards.

[0004] With respect to the above-mentioned related technologies, the existing transistor electrical signal detection device needs to install the transistors one by one into the installation sleeve. When performing the detection, a large number of detection circuits need to be used simultaneously. The large number of transistors in the installation sleeve need to be detected one by one. When unqualified transistors are found, the unqualified transistors need to be located, which easily leads to the problem of wrong or missed transistors. In summary, the existing transistor electrical signal testing device is not easy to accurately perform transistor detection. Summary of the invention

[0005] Based on this, the purpose of the present invention is to provide a pulse detection device for transistor electrical signal testing to solve the technical problem that the existing transistor electrical signal testing device is not easy to accurately perform transistor detection work.

[0006] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: a pulse detection device for transistor electrical signal testing, comprising a shell, a conveyor belt for conveying transistors installed in the shell, and a detection frame, the detection frame is installed at the tail end of the conveyor belt, and an electrical signal pulse detection contact for contacting the transistor pins is fixedly installed inside, and transistors with the same pin orientation and the same pin height on the conveyor belt can directly contact the detection contact during the conveying process, the tail end of the detection frame is rotatably connected to a flip plate that can rotate in both directions, and the tail end of the detection frame is also provided with a blocking structure for blocking subsequent transistors during the flipping process of the flip plate.

[0007] By adopting the above technical solution, transistors are transported to the detection mechanism using a conveyor belt. The transistor pins that meet the detection requirements contact the pulse detection circuit during the transportation process, which quickly determines whether the quality of the transistor is qualified. Transistors of different qualities are directly sorted and discharged, effectively avoiding the phenomenon of false detection or missed detection, thereby improving the detection accuracy of transistors.

[0008] The present invention is further configured such that a first notch is provided at one end of the detection frame close to the conveyor belt, the length of the first notch along the conveying direction of the conveyor belt is greater than the width of the transistor, the width of the first notch is equal to the length of the transistor excluding the pin portion, the detection frame is provided with a guide slope at the tail end of the first notch, and a second notch is provided on the other side, and a through opening is reserved at the bottom end of the guide slope for the transistor pin that can contact the detection contact to pass through.

[0009] Preferably, the first notch and the second notch are used to push down transistors that do not meet the test requirements, so that transistors that meet the test requirements enter the test position of the test frame.

[0010] The present invention is further configured such that the detection frame is fixedly provided with a support seat inside the tail end of the guide ramp, and a detection seat is installed corresponding to the support seat, the support seat and the detection seat are both insulated, and the detection seat is provided with conductive platforms having the same number as the number of transistor pins at intervals along the width direction of the detection frame, and the projections of the conductive platforms along the width direction of the detection frame do not overlap with each other.

[0011] Preferably, each conductive platform is electrically contacted with each pin of the transistor to realize the detection of the transistor electrical signal.

[0012] The present invention is further configured such that a plurality of accommodating grooves are arranged at intervals along the width direction at the tail end of the detection frame, a blocking column for blocking the transistor is rotatably connected in the accommodating groove, the blocking column can rotate downward, and a reset torsion spring is arranged at the rotating shaft, a pressure groove is arranged on the side of the flip plate close to the blocking column, the pressure groove is used to push the blocking column to rotate downward, and the width of the flip plate is the same as the width of the transistor.

[0013] Preferably, the blocking column plays a role in blocking the subsequent transistors from continuing to move forward during the flipping process of the flip plate.

[0014] The present invention is further configured such that the shell is provided with a first slide below the first notch and the second notch of the detection frame, and a first outlet corresponding to the first slide is opened on the side wall, a second slide and a third slide are respectively provided on both sides of the rotating shaft of the flip plate in the shell, and a second outlet and a third outlet corresponding to the second slide and the third slide are respectively provided on the side wall.

[0015] Preferably, transistors that do not meet the inspection requirements slide out from the first outlet along the first slideway, are sorted and then placed on the conveyor belt, while transistors that pass the inspection and transistors that fail the inspection slide out from the second outlet and the third outlet respectively.

[0016] The present invention is further configured such that the length of the second gap along the conveying direction of the conveyor belt is greater than the width of the transistor.

[0017] Preferably, when the pin of the transistor is unable to enter the detection part of the detection frame during the pushing process, the pin is guided by the guide slope so that the transistor is lifted up and falls from the second notch.

[0018] The present invention is further configured such that when the top surface of the flip plate is flush with the top surface of the detection frame, a side of the flip plate facing the detection frame is in contact with the detection frame.

[0019] Preferably, the transistor can be moved onto the flip plate without hindrance.

[0020] The present invention is further configured such that the blocking column can be completely rotated into the accommodating groove and will not interfere with the rotation of the flip plate during the rotation process.

[0021] Preferably, the flip plate is prevented from being interfered by the blocking column during the rotation process.

[0022] In summary, the present invention mainly has the following beneficial effects:

[0023] 1. The present invention installs a detection mechanism in a shell structure and uses a conveyor belt to transport transistors to the detection mechanism. The transistor pins that meet the detection requirements contact the pulse detection circuit during the transportation process, which quickly determines whether the quality of the transistor is qualified. Transistors of different qualities are directly sorted and discharged, effectively avoiding the phenomenon of false detection or missed detection, thereby improving the detection accuracy of the transistor.

[0024] 2. The present invention uses the distribution structure on the detection rack to automatically push out the transistors whose pins are not aligned with the pulse detection circuit during the transportation of the transistors, so that the transistors transported to the detection circuit of the detection rack meet the detection requirements, and the electrical signal detection of the transistors can be directly performed during the transportation process. The pushed-down transistors leave the shell structure and can be sent into the shell again by the conveyor belt for detection after simple sorting;

[0025] 3. The present invention distinguishes qualified transistors from unqualified transistors by the forward and reverse rotation of the flip plate. After the flip plate rotates, the blocking column connected to the end of the detection frame rotates to block the subsequent transistors, thereby preventing the flip plate from interfering with the transistors that continue to be transported forward during the resetting process, thereby effectively improving the stability of the detection device.

[0026] 4. The present invention designs the width of the flip plate to be the same as the width of the transistor. When the transistor on the detection frame is pushed by the transistor on the conveyor belt and cannot move further, the flip plate happens to carry a transistor. At this time, the detection circuit in the detection frame is also performing electrical signal detection on the next transistor. During the flipping process of the flip plate, the next transistor can still perform electrical signal detection. The next transistor will not be pushed to the top of the flip plate until the flip plate is reset, leaving sufficient time for the electrical signal detection of the transistor, effectively improving the transistor detection efficiency while ensuring the detection quality. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Figure 1 A perspective view of the present invention;

[0028] Figure 2 Another perspective view of the present invention;

[0029] Figure 3 It is a three-dimensional diagram of the internal structure of the present invention;

[0030] Figure 4 It is a three-dimensional diagram of the state of the transmission transistor of the present invention;

[0031] Figure 5 A three-dimensional diagram of a transistor state is provided for another perspective of the present invention;

[0032] Figure 6 A three-dimensional diagram of a detection frame for a flip plate in a non-flipped state according to the present invention;

[0033] Figure 7 A three-dimensional diagram of the detection frame from another viewing angle when the flip plate of the present invention is not flipped;

[0034] Figure 8 For the present invention Figure 7 A magnified view of middle;

[0035] Fig. 9 A three-dimensional diagram of a detection frame for a flip plate in a flipped state according to the present invention;

[0036] Fig.10 This is a three-dimensional diagram of the detection frame from another viewing angle when the flip plate of the present invention has been flipped.

[0037] Description of reference numerals:

[0038] 1. Shell; 2. Conveyor belt; 3. Detection frame; 301. First notch; 302. Guide slope; 303. Second notch; 4. Turnover plate; 401. Pressing groove; 5. Accommodating groove; 6. Blocking column; 7. Support seat; 8. Detection seat; 9. Conductive table; 10. Turnover motor; 11. Support plate; 12. First slide; 13. Second slide; 14. Third slide; 15. First exit; 16. Second exit; 17. Third exit; 18. Threading port. DETAILED DESCRIPTION

[0039] The following will be combined with the accompanying drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0040] The following describes an embodiment of the present invention based on its overall structure.

[0041] First embodiment:

[0042] A pulse detection device for testing transistor electrical signals, see Figure 1-10 , including a shell 1, in which a conveyor belt 2 for conveying transistors is installed. Specifically, in order to enable the conveyor belt 2 to stably convey the transistors and prevent the middle part of the conveyor belt 2 from being compressed and deformed, a support plate 11 for supporting the conveyor belt 2 is installed in the shell 1, and the top surface of the support plate 11 is in contact with the inner surface of the top of the conveyor belt 2.

[0043] It also includes a detection frame 3, which is installed at the tail end of the conveyor belt 2, and has an electrical signal pulse detection contact fixedly installed inside for contacting the transistor pins. Specifically, a plurality of wire connectors for connecting wires are also provided on the detection frame 3, and an electrical signal detection host is installed on the outer wall of the shell 1. A wire connector is also provided on one side of the electrical signal detection host. Furthermore, a threading port 18 for the wire to pass through is opened on the side wall of the shell 1. The specific method of detecting the transistor and the method of connecting the wires are not improved in this application, and are not elaborated here.

[0044] Furthermore, transistors with the same pin orientation and pin height on the conveyor belt 2 can directly contact the detection contacts during the transportation process, and the transistors can be accurately detected one by one in an assembly line manner during the movement of the transistors, effectively avoiding the problem of missed detection or wrong detection. The tail end of the detection frame 3 is rotatably connected to a flip plate 4 that can rotate in both directions.

[0045] Specifically, the rotating shaft of the flip plate 4 is equipped with a flip motor 10, and the flip can be bidirectionally stepped and rotated, and can achieve accurate circular motion or rotation control at a specific angle. The flip plate 4 flips in two directions to send qualified and unqualified transistors to two different directions respectively. The tail end of the detection frame 3 is also provided with a blocking structure for blocking subsequent transistors during the flipping process of the flip plate 4, so as to prevent subsequent transistors from being pushed and affecting the normal flipping of the flip plate 4.

[0046] In the above embodiments, please refer to Figure 4-10 A first notch 301 is provided at one end of the detection frame 3 close to the conveyor belt 2. The length of the first notch 301 along the conveying direction of the conveyor belt 2 is greater than the width of the transistor. The width of the first notch 301 is equal to the length of the transistor excluding the pin part. When the transistor moves to the first notch 301, if the pin part is not above the first notch 301, it will fall from the first notch 301 because the heavier end of the transistor cannot be supported.

[0047] Furthermore, the detection frame 3 is provided with a guide slope 302 at the tail end of the first notch 301, and a second notch 303 is provided on the other side. The bottom end of the guide slope 302 is reserved with a through hole for the transistor pins that can contact the detection contacts to pass through. The first notch 301 and the second notch 303 are used to push down the transistors that do not meet the detection requirements, and the transistors that meet the detection requirements are allowed to enter the detection position of the detection frame 3. Specifically, the pins of the transistors that meet the detection requirements need to face the end of the detection frame 3 where the detection seat 8 is provided, and the height of the pins needs to be between the detection seat 8 and the support seat 7. In this embodiment, a mutually parallel transistor surface that is closer to the plane formed by multiple pins of the transistor is the bottom surface of the transistor, and the transistor that meets the detection requirements is a transistor with the bottom facing down and the pins facing one end of the detection seat 8.

[0048] Specifically, the length of the second notch 303 along the conveying direction of the conveyor belt 2 is greater than the width of the transistor, so that when the pins of the transistor are unable to enter the detection part of the detection frame 3 during the pushing process, the pins are guided by the guide slope 302 and the transistor is lifted up and falls from the second notch 303, thereby preventing the transistor from being stuck in the second notch 303 and unable to fall.

[0049] Furthermore, a support seat 7 is fixedly installed in the rear end of the guide slope 302 of the detection frame 3, and a detection seat 8 is installed corresponding to the support seat 7. The support seat 7 and the detection seat 8 are both insulated. The detection seat 8 is provided with conductive platforms 9 with the same number as the number of transistor pins at intervals along the width direction of the detection frame 3. Each conductive platform 9 is electrically connected to a wire interface on the outer wall of the detection frame 3. The projections of the conductive platforms 9 along the width direction of the detection frame 3 do not overlap with each other, so as to avoid the same pin being connected to different conductive platforms 9 at the same time. The electrical contact between each conductive platform 9 and each pin of the transistor is utilized to realize the detection of transistor electrical signals.

[0050] In the above embodiments, please refer to Figure 1-3 The shell 1 is provided with a first slide 12 below the first notch 301 and the second notch 303 of the detection frame 3, and a first outlet 15 corresponding to the first slide 12 is opened on the side wall. Specifically, the transistors falling from the first outlet 15 will be returned to the conveyor belt 2 after being collected and transported.

[0051] Furthermore, a second slide 13 and a third slide 14 are respectively provided on both sides of the rotating shaft of the flip plate 4 in the shell 1, and a second outlet 16 and a third outlet 17 corresponding to the second slide 13 and the third slide 14 are respectively provided on the side walls. After the transistors that do not meet the detection requirements slide out from the first outlet 15 along the first slide 12, they are sorted and then placed on the conveyor belt 2, and the second outlet 16 and the third outlet 17 slide out the qualified and unqualified transistors after the detection respectively. In this embodiment, specifically, the transistors discharged from the second outlet 16 are qualified transistors, and the transistors discharged from the third outlet 17 are unqualified transistors, so as to avoid confusion between qualified and unqualified transistors after detection.

[0052] Specifically, the top heights of the second landslide 13 and the third landslide 14 are lower than the rotation radius of the flip plate 4 to avoid interference with the circular motion of the flip plate 4 .

[0053] Second embodiment:

[0054] A pulse detection device for testing transistor electrical signals, see Figure 1-10On the basis of the first embodiment, the difference from the first embodiment is that a plurality of accommodating grooves 5 are arranged at intervals along the width direction at the tail end of the detection frame 3, and a blocking column 6 for blocking the transistor is rotatably connected in the accommodating groove 5. The blocking column 6 can rotate downward, and a reset torsion spring is arranged at the rotating shaft. Specifically, a torsion spring is arranged at the rotating shaft to reset the blocking column 6 when it is not subjected to downward pressure. The structure and specific setting position of the reset torsion spring are clearly known to those skilled in the art, and are not elaborated here. A pressing groove 401 is arranged on the side of the flip plate 4 close to the blocking column 6, and the pressing groove 401 is used to push the blocking column 6 to rotate downward. The width of the flip plate 4 is the same as the width of the transistor. The blocking column 6 plays a role in blocking the subsequent transistors from continuing to be transported forward during the flipping of the flip plate 4.

[0055] In the above embodiments, please refer to Figure 3-10 When the top surface of the flip plate 4 is flush with the top surface of the detection frame 3, the side of the flip plate 4 facing the detection frame 3 is in contact with the detection frame 3, so that the transistor can move onto the flip plate 4 without hindrance. When the flip plate 4 is not rotated, the transistor moved onto the flip plate 4 is blocked by the side wall of the flip plate 4 and will not continue to move along the conveying direction of the conveyor belt 2.

[0056] Furthermore, the blocking column 6 can be completely rotated into the receiving groove 5, and will not interfere with the rotation of the flip plate 4 during the rotation process, thereby preventing the flip plate 4 from being interfered with by the blocking column 6 during the rotation process. During the reverse circular rotation of the flip plate 4, the blocking columns 6 will be pressed into the receiving groove 5 one by one, and after the flip plate 4 leaves, the blocking columns 6 will rotate and pop out of the receiving groove 5 one by one and reset to a state capable of blocking subsequent transistors.

[0057] When the present invention performs an electrical signal test on transistors: the transistors are sent to the conveyor belt 2 manually or by a vibration plate to be aligned. When the transistors are sent to the first notch 301, the transistors with pins in the opposite direction to the pins of the transistors meeting the detection requirements fall from the first notch 301 to the first slide 12 because the center of gravity is not supported, and the transistors with the same pins continue to move forward. The transistors with pin heights higher than the pin heights of the transistors meeting the detection requirements are lifted toward the second notch 303 due to the guidance of the guide slope 302 during the transportation process, and also fall on the first slide 12, and are excluded from the first outlet 15 of the housing 1 and repeatedly enter the conveyor belt 2;

[0058] After the transistors that meet the detection requirements pass through the guide slope 302 of the detection frame 3, they are blocked by the transistors on the flip plate 4 or the blocking pillars 6 in front of them. The pins contact the conductive platforms 9 in the detection frame 3 to realize the electrical signal detection. After the previous transistor is flipped out by the flip plate 4, the flip plate 4 is reset, and the limit of the blocking pillars 6 is released. The transistors after the electrical signal detection can be pushed onto the flip plate 4 by the subsequent transistors. At this time, the transistors behind start the electrical signal detection, and the transistors pushed onto the flip plate 4 are flipped and dumped onto different slopes by the flip plate 4 according to whether their quality meets the requirements.

[0059] If the quality of the transistor on the flip plate 4 meets the requirements, the flip plate 4 is positively deflected to a vertical state, and the transistor slides down to the second slide 13 on the flip plate 4. When the flip plate 4 flips forward, the blocking columns 6 are reset and lifted one by one by the torsion spring, and play a role of blocking and limiting the transistor behind. After the flip plate 4 flips over and the transistor is reset, the blocking column 6 can be pressed down again, so that the torsion spring at the rotating shaft of the blocking column 6 accumulates elastic potential energy, and the transistor sliding to the second slide 13 finally leaves from the second outlet 16 of the housing 1.

[0060] If the quality of the transistor on the flip plate 4 does not meet the requirements, the flip plate 4 will rotate in the opposite direction for one circle to the reset state. Specifically, during the reverse rotation of the flip plate 4, the pressing groove 401 will further press the blocking column 6 back into the receiving groove 5. At this time, since the inclination angle of the flip plate 4 is not large, the transistor on the flip plate 4 can still block the subsequent transistors. After the reverse rotation angle of the flip plate 4 gradually increases, the blocking column 6 retracted into the receiving groove 5 gradually breaks away from the contact with the flip plate 4 and resets, thereby blocking the subsequent transistors. When the reverse flip angle of the flip plate 4 is large enough, the transistor falls from the surface of the flip plate 4 to the third slide 14, and the transistor that does not meet the quality requirements finally leaves the shell 1 from the third exit 17.

[0061] Although an embodiment of the present invention has been shown and described, this specific embodiment is merely an explanation of the present invention and is not a limitation of the invention. The specific features, structures, materials or characteristics described may be combined in a suitable manner in any one or more embodiments or examples. After reading this specification, those skilled in the art may make modifications, substitutions and variations to the embodiments without creative contributions as needed without departing from the principles and purpose of the present invention. However, as long as they are within the scope of the claims of the present invention, they are protected by patent law.

Claims

1. A pulse detection device for transistor electrical signal testing, characterized in that: include: A housing (1), wherein a conveyor belt (2) for conveying transistors is installed in the housing (1); A detection frame (3) is installed at the rear end of a conveyor belt (2), and an electrical signal pulse detection contact for contacting transistor pins is fixedly installed inside the detection frame. Transistors with the same pin orientation and the same pin height on the conveyor belt (2) can directly contact the detection contact during the conveying process. The rear end of the detection frame (3) is rotatably connected to a flip plate (4) that can rotate in both directions. The rear end of the detection frame (3) is also provided with a blocking structure for blocking subsequent transistors during the flipping process of the flip plate (4).

2. The pulse detection device for transistor electrical signal testing according to claim 1, characterized in that: The detection frame (3) is provided with a first notch (301) at one end close to the conveyor belt (2); the length of the first notch (301) along the conveying direction of the conveyor belt (2) is greater than the width of the transistor; the width of the first notch (301) is equal to the length of the transistor excluding the pin portion; the detection frame (3) is provided with a guide slope (302) at the tail end of the first notch (301), and a second notch (303) is provided at the other side; a through hole is reserved at the bottom end of the guide slope (302) for the transistor pin that can contact the detection contact to pass through.

3. The pulse detection device for transistor electrical signal testing according to claim 2, characterized in that: The detection frame (3) is fixedly mounted with a support seat (7) at the rear end of the guide slope (302), and a detection seat (8) is mounted corresponding to the support seat (7), the support seat (7) and the detection seat (8) are both insulated, and the detection seat (8) is provided with conductive platforms (9) with the same number as the number of transistor pins at intervals along the width direction of the detection frame (3), and the projections of the conductive platforms (9) along the width direction of the detection frame (3) do not overlap with each other.

4. The pulse detection device for transistor electrical signal testing according to claim 3, characterized in that: A plurality of accommodating grooves (5) are arranged at intervals along the width direction at the rear end of the detection frame (3); a blocking column (6) for blocking the transistor is rotatably connected in the accommodating groove (5); the blocking column (6) is capable of rotating downwards, and a return torsion spring is arranged at the rotating shaft; a pressing groove (401) is arranged on a side of the flip plate (4) close to the blocking column (6); the pressing groove (401) is used to push the blocking column (6) to rotate downwards; and the width of the flip plate (4) is the same as the width of the transistor.

5. The pulse detection device for transistor electrical signal testing according to claim 3, characterized in that: The housing (1) is provided with a first slide (12) below the first notch (301) and the second notch (303) of the detection frame (3), and a first outlet (15) corresponding to the first slide (12) is opened on the side wall; a second slide (13) and a third slide (14) are respectively provided on both sides of the rotating shaft of the flip plate (4) in the housing (1), and a second outlet (16) and a third outlet (17) corresponding to the second slide (13) and the third slide (14) are respectively provided on the side wall.

6. The pulse detection device for transistor electrical signal testing according to claim 2, characterized in that: The length of the second notch (303) along the conveying direction of the conveyor belt (2) is greater than the width of the transistor.

7. The pulse detection device for transistor electrical signal testing according to claim 1, characterized in that: When the top surface of the flip plate (4) is flush with the top surface of the detection frame (3), the side of the flip plate (4) facing the detection frame (3) is in contact with the detection frame (3).

8. The pulse detection device for transistor electrical signal testing according to claim 4, characterized in that: The blocking column (6) can be completely rotated into the accommodating groove (5) and will not interfere with the rotation of the flip plate (4) during the rotation process.

Images