Test platform based on electronic science and technology

Abstract

The invention discloses a test platform based on electronic science and technology, and belongs to the technical field of test platforms based on electronic science and technology, the test platform based on electronic science and technology comprises a tester body and four supporting legs, the bottom of the tester body is fixedly connected with the four supporting legs, and the tester body is connected with the supporting legs. A display screen and operation buttons are arranged on the outer surface of the tester body, a protection assembly is arranged on the outer surface of the tester body close to the display screen, and a suspension assembly is arranged on the back surface of the tester body; the side plates, the rotating rods and the silica gel pads are in close contact with the display screen, buffering and dustproof protection are provided, external dust, particles and other impurities are prevented from adhering to the display screen, the definition of the display screen is prevented from being affected, dust and particles are effectively prevented from entering the display screen, scratches and abrasion are reduced, and the service life of the display screen is prolonged. The test platform can be fixed on a wall surface or other positions by means of bolts through mutual cooperation of the mounting grooves, the mounting blocks, the fixing plates and the mounting holes, and otherwise, the test platform can be detached.

Description

Technical Field

[0001] The present invention relates to the technical field of test platforms for electronic science and technology, and more specifically, to a test platform based on electronic science and technology. Background Art

[0002] In the field of electronic science and technology, the development and application of test platforms are crucial to ensuring the performance and quality of electronic equipment. With the rapid development of science and technology, the functions of electronic equipment are becoming increasingly complex, and the requirements for test platforms are becoming higher and higher. Traditional test platforms often have many limitations, such as insufficient test accuracy, cumbersome test procedures, low test efficiency, and test results that are easily affected by external interference. These problems have seriously restricted the development of electronic equipment testing technology.

[0003] 1. Challenges of Test Accuracy and Efficiency

[0004] Traditional test platforms have bottlenecks in data acquisition and processing, resulting in insufficient test accuracy. Since the signals of electronic devices are often very weak and susceptible to noise interference, traditional data acquisition methods have difficulty accurately capturing these signals, resulting in inaccurate test results. In addition, traditional test processes are cumbersome and time-consuming, with low test efficiency, and cannot meet the rapid iteration test requirements of modern electronic devices.

[0005] 2. Limitations of the test environment

[0006] Traditional test platforms can often only be used in specific test environments, such as laboratories or specific test sites. This limits the scope of use of the test platform and makes it difficult for testers to test electronic devices in different environments. In addition, unstable factors in the test environment may also interfere with the test results, thereby affecting the accuracy of the test.

[0007] 3. The intelligence and automation of the test platform are insufficient

[0008] Traditional test platforms are deficient in terms of intelligence and automation. Testers need to manually set test parameters and processes, which is not only time-consuming and labor-intensive, but also prone to human errors. In addition, traditional test platforms lack adaptive test strategies and cannot automatically adjust test parameters and processes according to the type and characteristics of the electronic equipment to be tested, thus limiting the versatility and flexibility of the test platform.

[0009] 4. Requirements for Remote Testing and Monitoring

[0010] With the development of electronic equipment testing technology, the demand for remote testing and monitoring is becoming increasingly urgent. Traditional test platforms often cannot achieve remote access and monitoring, which requires testers to perform testing work at a specific location and time, limiting the flexibility and convenience of testing. In addition, remote testing and monitoring can also improve test efficiency and reduce test costs, which is of great significance to promoting the development of electronic equipment testing technology.

[0011] 5. Test Data Processing and Analysis

[0012] Traditional test platforms also have shortcomings in data processing and analysis. Test data is often large and complex, and traditional data processing methods are difficult to quickly and accurately extract key information. In addition, traditional test platforms lack intelligent data analysis modules and cannot conduct in-depth analysis and mining of test data, thus limiting the accuracy and reliability of test results. Summary of the invention

[0013] 1. Technical problems to be solved

[0014] In view of the problems existing in the prior art, the present invention provides a testing platform based on electronic science and technology.

[0015] 2. Technical solution

[0016] To solve the above problems, the present invention adopts the following technical solutions.

[0017] A test platform based on electronic science and technology comprises a tester body and supporting legs, wherein four supporting legs are fixedly connected to the bottom of the tester body, a display screen and operation buttons are arranged on the outer surface of the tester body, a protective component is arranged on the outer surface of the tester body near the display screen, and a suspension component is arranged on the back of the tester body; the protective component comprises two side panels fixedly mounted on the outer surface of the tester body near the display screen, a rotating rod is rotatably connected between the two side panels, and a protective plate is fixedly connected to the outer surface of the rotating rod; the suspension component comprises a pair of mounting grooves symmetrically mounted on the side surfaces of the tester body, a mounting block is clamped inside the mounting groove, a fixing plate is fixedly connected to the side surface of the fixing block, and a plurality of mounting holes are opened inside the fixing plate.

[0018] Furthermore, a silicone pad is fixedly connected to the side surface of the protective plate near the display screen, and the silicone pad abuts against the display screen.

[0019] Furthermore, two fixing grooves are provided inside the installation groove, a telescopic rod is fixedly connected inside the fixing groove, and an inclined block is fixedly connected to one end of the telescopic rod.

[0020] Furthermore, two adjustment grooves are symmetrically formed on the outer surface of the mounting block, and the inclined block is engaged with the adjustment grooves.

[0021] Furthermore, a spring is sleeved and connected to the outer surface of the telescopic rod, one end of the spring is connected to the fixing groove, and the other end is connected to the inclined block.

[0022] Furthermore, two hand-held rods are fixedly connected to the outer surface of the tester body, and the outer surfaces of the hand-held rods are sleeved with anti-slip sleeves.

[0023] Furthermore, the tester body includes:

[0024] A data acquisition module, the data acquisition module is used to receive test data of the electronic device to be tested;

[0025] A data analysis module, wherein the data analysis module is used to process and analyze the received test data to obtain test results;

[0026] A data output module, which is used to transmit the test results to a display screen for output display;

[0027] Remote access module, used to access the test platform through the remote network to achieve remote testing and monitoring;

[0028] Data storage module, used to store test data and test results for subsequent analysis and query;

[0029] The permission setting module logs in through a biometric authentication method such as fingerprint, face, or iris to ensure the security of the test platform.

[0030] Furthermore, the data analysis module includes a preprocessing unit, a feature extraction unit, a judgment unit and an anomaly detection unit. The preprocessing unit is used to preprocess the received test data, the feature extraction unit is used to extract feature values ​​from the preprocessed data, the judgment unit is used to judge the test results according to the feature values, and the anomaly detection unit is used to detect abnormal values ​​or abnormal patterns in the test data and trigger an alarm or retest.

[0031] Furthermore, the preprocessing unit includes a filtering subunit, an amplifying subunit and a DC offset removal subunit. The filtering subunit is used to remove noise in the test data, the amplifying subunit is used to amplify useful signals in the test data, and the DC offset removal subunit is used to eliminate DC offset components in the test data. The feature extraction unit adopts a deep learning algorithm to automatically extract key eigenvalues ​​from the test data, and continuously optimizes the accuracy of feature extraction through a training model.

[0032] Furthermore, the tester body also includes an adaptive test strategy module, which automatically adjusts the test parameters and test process according to the type and characteristics of the electronic device to be tested. The adaptive test strategy module includes:

[0033] Intelligent identification and classification unit,The adaptive test strategy module first obtains the basic information of the electronic device to be tested through the interface, and then uses the built-in database or online query service to intelligently identify and classify the device;

[0034] Test parameter optimization unit: Based on the classification results of the equipment, the adaptive test strategy module automatically selects or adjusts the test parameters to ensure that the test process is both efficient and accurate;

[0035] Test process customization: In addition to test parameters, the adaptive test strategy module also customizes the test process according to the characteristics of the device;

[0036] Real-time adjustment and feedback unit: During the test process, the adaptive test strategy module will continuously monitor the test data and adjust the test parameters and processes according to the real-time changes in the data. If an abnormality or an unexpected result is detected, the module will trigger an alarm or retest to ensure the accuracy and reliability of the test;

[0037] The learning and optimization unit, through machine learning algorithms, can continuously optimize test strategies and parameters based on historical test data and user feedback.

[0038] 3. Beneficial effects

[0039] Compared with the prior art, the advantages of the present invention are:

[0040] (1) The test platform of this scheme adopts high-precision data acquisition modules and advanced data analysis modules, which can accurately capture the weak signals of electronic equipment and accurately process and analyze them, thereby improving the test accuracy. At the same time, the test platform also has an efficient test process, which can quickly complete the test tasks and improve the test efficiency.

[0041] (2) The test platform of this scheme can be used in different environments by designing structures such as suspension components and handheld rods, thereby enhancing the adaptability of the test environment. In addition, the test platform also has dust-proof and scratch-proof protection functions, which can protect key components such as the display screen from external interference, thereby improving the accuracy of the test.

[0042] (3) By introducing an adaptive test strategy module, the test platform of this solution can automatically adjust the test parameters and processes according to the type and characteristics of the electronic equipment to be tested, thereby improving the versatility and flexibility of the test platform. At the same time, the test platform also has an intelligent data analysis module that can conduct in-depth analysis and mining of test data to improve the accuracy and reliability of test results.

[0043] (4) The test platform of the present invention integrates a remote access module, so that testers can access the test platform through a remote network to achieve remote testing and monitoring. This not only improves the flexibility and convenience of testing, but also reduces testing costs, which is of great significance for promoting the development of electronic equipment testing technology. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] Figure 1 It is a schematic diagram of the overall structure of the present invention;

[0045] Figure 2 It is a side view of the structure of the present invention as a whole;

[0046] Figure 3 A schematic diagram of the structure of the protective plate of the present invention when it is opened;

[0047] Figure 4 It is a partial structural cross-sectional view of the whole invention;

[0048] Figure 5 It is a partial structural exploded view of the suspension assembly of the present invention;

[0049] Figure 6 It is a functional module diagram of the present invention.

[0050] Description of the numbers in the figure:

[0051] 1. Tester body; 101. Support legs; 102. Display screen; 103. Operation buttons;

[0052] 2. Protective assembly; 201. Side panel; 202. Rotating rod; 203. Protective plate; 204. Silicone pad;

[0053] 3. Suspension assembly; 301. Mounting slot; 302. Mounting block; 303. Fixing plate; 304. Mounting hole; 305. Fixing slot; 306. Telescopic rod; 307. Inclined block; 308. Adjusting slot; 309. Spring. DETAILED DESCRIPTION

[0054] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention; it is obvious that the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments, and all other embodiments obtained by ordinary technicians in this field based on the embodiments of the present invention without making creative work are within the scope of protection of the present invention.

[0055] Example 1

[0056] Reference Figure 1-Figure 5 , which is the first embodiment of the present invention, provides a test platform based on electronic science and technology, including a tester body 1 and support legs 101, four support legs 101 are fixedly connected to the bottom of the tester body 1, a display screen 102 and operation buttons 103 are arranged on the outer surface of the tester body 1, and a protective component 2 is arranged on the outer surface of the tester body 1 near the display screen 102.

[0057] Specifically, the protective component 2 includes two side panels 201 fixedly installed on the outer surface of the tester body 1 near the display screen 102, a rotating rod 202 is rotatably connected between the two side panels 201, a protective plate 203 is fixedly connected to the outer surface of the rotating rod 202, a silicone pad 204 is fixedly connected to the side of the protective plate 203 near the display screen 102, the silicone pad 204 is in contact with the display screen 102, two hand-held rods are fixedly connected to the outer surface of the tester body 1, and the outer surfaces of the hand-held rods are sleeved with anti-slip sleeves.

[0058] Furthermore, the protective plate 203 is rotated by the rotating rod 202, so that the protective plate 203 drives the silicone pad 204 to move away from the surface of the display screen 102, so that the staff can use the tester body 1 to work. If the tester body 1 is not needed, the protective plate 203 is covered on the display screen 102 by the rotating rod 202. At the same time, the silicone pad 204 is in close contact with the display screen 102 to provide buffering and dustproof protection, avoiding external impurities such as dust and particles from adhering to the display screen 102 and affecting the clarity of the display screen 102, thereby effectively preventing dust and particles from entering the display screen 102 and reducing scratches and wear.

[0059] Example 2

[0060] Reference Figure 1-Figure 5 , which is the second embodiment of the present invention. This embodiment is based on the previous embodiment, and a suspension component 3 is provided on the back of the tester body 1.

[0061] Specifically, the suspension assembly 3 includes a pair of mounting grooves 301 symmetrically installed on the side of the tester body 1, the mounting groove 301 has a mounting block 302 clamped inside, the side of the mounting block 302 is fixedly connected to a fixing plate 303, the fixing plate 303 has a plurality of mounting holes 304, the mounting groove 301 has two fixing grooves 305, the fixing groove 305 has a telescopic rod 306 fixedly connected inside, one end of the telescopic rod 306 is fixedly connected to an inclined block 307, the outer surface of the mounting block 302 has two adjusting grooves 308 symmetrically arranged, the inclined block 307 is clamped with the adjusting groove 308, the outer surface of the telescopic rod 306 is sleeved with a spring 309, one end of the spring 309 is connected to the inside of the fixing groove 305, and the other end is connected to the inclined block 307.

[0062] Furthermore, the mounting block 302 on the fixing plate 303 is aligned with the mounting slot 301 on the side of the tester body 1, and the mounting block 302 is pushed into the mounting slot 301 until the mounting block 302 is fully inserted, and at the same time, the inclined block 307 is automatically inserted into the adjustment slot 308 on the mounting block 302 under the action of the spring 309, ensuring that the fixing plate 303 is firmly fixed on the tester body 1, and then installed with the corresponding wall through the mounting hole 304 with the help of screws. Conversely, the fixing plate 303 is pulled outward to make the inclined block 307 disengage from the adjustment slot 308, and the fixing plate 303 is continued to be pulled outward until the mounting block 302 is completely separated from the mounting slot 301, and the tester body 1 can be conveniently carried and moved through the hand-held rod, and the test platform can be placed on the desktop through the support leg 101 so as to adapt to different usage environments according to needs.

[0063] Working principle: When in use, hold the protective plate 203 and rotate the protective plate 203 through the rotating rod 202, so that the protective plate 203 drives the silicone pad 204 to move away from the surface of the display screen 102, so that the staff can use the tester body 1 to work. If the tester body 1 is not needed, cover the protective plate 203 on the display screen 102 through the rotating rod 202. At the same time, the silicone pad 204 is in close contact with the display screen 102 to provide buffering and dustproof protection, and prevent foreign dust and particles from adhering to the display screen 102, affecting the clarity of the display screen 102, thereby effectively preventing dust and particles from entering the display screen 102 and reducing scratches and wear. If the tester body 1 needs to be hung on a wall or other place, the mounting block 303 on the fixing plate 303 is fixed. 02 is aligned with the mounting slot 301 on the side of the tester body 1, and the mounting block 302 is pushed into the mounting slot 301 until the mounting block 302 is fully inserted, and at the same time, the inclined block 307 is automatically inserted into the adjustment slot 308 on the mounting block 302 under the action of the spring 309, ensuring that the fixing plate 303 is firmly fixed on the tester body 1, and then installed with the corresponding wall through the mounting hole 304 with the help of screws, otherwise the fixing plate 303 is pulled outward to make the inclined block 307 disengage from the adjustment slot 308, and the fixing plate 303 is continued to be pulled outward until the mounting block 302 is completely separated from the mounting slot 301, and the hand-held rod is used to facilitate carrying and moving the tester body 1, and the test platform can be placed on the desktop through the support leg 101, so as to adapt to different usage environments according to needs.

[0064] Example 3

[0065] See also Figure 6 , the tester body 1 comprises:

[0066] Data acquisition module, which is used to receive test data of the electronic device to be tested, including but not limited to key electronic parameters such as capacitance, inductance, resistance, voltage, current, frequency, etc.;

[0067] Data analysis module: The data analysis module is used to process and analyze the received test data to obtain the test results. This module can accurately calculate and analyze specific parameters such as capacitance and inductance to ensure the accuracy of the test results;

[0068] A data output module is used to transmit the test results to the display screen 102 for output display, so that the test personnel can intuitively view the test results of parameters such as capacitance and inductance;

[0069] Remote access module, used to access the test platform through the remote network to achieve remote testing and monitoring;

[0070] Data storage module, used to store test data and test results for subsequent analysis and query;

[0071] The permission setting module logs in through a biometric authentication method such as fingerprint, face, or iris to ensure the security of the test platform.

[0072] The data analysis module includes a preprocessing unit, a feature extraction unit, a judgment unit and an anomaly detection unit. The preprocessing unit is used to preprocess the received test data, the feature extraction unit is used to extract feature values ​​from the preprocessed data, the judgment unit is used to judge the test results according to the feature values, and the anomaly detection unit is used to detect abnormal values ​​or abnormal patterns in the test data and trigger an alarm or retest.

[0073] The preprocessing unit includes a filtering subunit, an amplifying subunit and a DC offset removal subunit. The filtering subunit is used to remove noise in the test data, the amplifying subunit is used to amplify useful signals in the test data, and the DC offset removal subunit is used to eliminate the DC offset component in the test data. The feature extraction unit adopts a deep learning algorithm to automatically extract key feature values, such as capacitance value, inductance value, etc., from the preprocessed data, and continuously optimizes the accuracy of feature extraction through training models.

[0074] The tester body 1 also includes an adaptive test strategy module, which automatically adjusts the test parameters and test process according to the type and characteristics of the electronic device to be tested. The adaptive test strategy module includes:

[0075] Intelligent Identification and Classification Unit,The adaptive test strategy module first obtains the basic information of the electronic device to be tested, such as model, specification, and manufacturer, through the interface, and then uses the built-in database or online query service to intelligently identify and classify the device;

[0076] Test parameter optimization unit: Based on the classification results of the equipment, the adaptive test strategy module will automatically select or adjust the test parameters, such as test voltage, test current, test frequency, etc., to ensure that the test process is both efficient and accurate;

[0077] Test process customization: In addition to test parameters, the adaptive test strategy module also customizes the test process according to the characteristics of the device. For example, for highly sensitive sensors, the module may choose more sophisticated test steps and higher sampling rates; for high-power electronic devices, the module may choose more stringent load tests to ensure the safety of the test platform.

[0078] Real-time adjustment and feedback unit: During the test process, the adaptive test strategy module will continuously monitor the test data and adjust the test parameters and processes according to the real-time changes in the data. If an abnormality or an unexpected result is detected, the module will trigger an alarm or retest to ensure the accuracy and reliability of the test;

[0079] The learning and optimization unit can continuously optimize test strategies and parameters based on historical test data and user feedback through machine learning algorithms. For example, reinforcement learning is a method that allows models to learn optimal strategies from the environment and optimize the model's behavior through continuous trial and error and reward mechanisms. In adaptive testing, reinforcement learning can be used to dynamically adjust test parameters and processes to maximize test efficiency and accuracy.

[0080] Working principle:

[0081] 1. Initialization and login:

[0082] After the tester body 1 is started, it is initialized first to complete the self-check and configuration of each module. The tester logs in to the test platform through biometric authentication to ensure the security of the test process.

[0083] 2. Device information acquisition and intelligent identification:

[0084] The tester body 1 obtains basic information of the electronic device to be tested through the interface, such as model, specification, etc. The adaptive test strategy module uses the built-in database or online query service to intelligently identify and classify the device, providing a basis for the selection of subsequent test parameters and processes.

[0085] 3. Test parameters and process customization:

[0086] According to the classification results of the equipment, the adaptive test strategy module automatically selects or adjusts the test parameters, such as test voltage, test current, etc., and customizes the corresponding test process to meet the test requirements of different equipment.

[0087] 4. Data collection and preprocessing:

[0088] The data acquisition module receives test data from the electronic device to be tested in real time, including key parameters such as capacitance and inductance. The preprocessing unit filters, amplifies and removes DC offset on the received test data to improve data quality.

[0089] 5. Feature extraction and determination:

[0090] The feature extraction unit uses a deep learning algorithm to automatically extract key feature values ​​from the preprocessed data, such as capacitance value, inductance value, etc. The determination unit determines the test result according to the feature value and outputs the corresponding determination result.

[0091] 6. Anomaly detection and feedback:

[0092] The anomaly detection unit monitors abnormal values ​​or abnormal patterns in the test data in real time. Once an anomaly is detected, an alarm is triggered immediately and retesting may be required to ensure the accuracy and reliability of the test.

[0093] 7. Test result output and storage:

[0094] The data output module transmits the test results to the display screen 102 for output display. The data storage module stores the test data and test results in local or cloud storage to facilitate subsequent analysis and query.

[0095] 8. Learning and Optimization:

[0096] The learning and optimization unit continuously optimizes test strategies and parameters through machine learning algorithms to improve the intelligence level of testing. As time goes by and test data accumulates, the module will become more intelligent and efficient, providing testers with better testing services.

[0097] 9. Remote access and monitoring optional:

[0098] Testers can access the test platform through the remote network to achieve remote testing and monitoring, which improves the flexibility and convenience of testing and allows testers to perform testing work at different locations and times.

[0099] The above is only a preferred specific implementation of the present invention; however, the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes according to the technical solution and its improved conception within the technical scope disclosed by the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A test platform based on electronic science and technology, comprising a tester body (1) and support legs (101), wherein the bottom of the tester body (1) is fixedly connected with four support legs (101), characterized in that: The outer surface of the tester body (1) is provided with a display screen (102) and an operation button (103); the outer surface of the tester body (1) is provided with a protection component (2) near the display screen (102); and the back of the tester body (1) is provided with a suspension component (3); The protection assembly (2) comprises two side panels (201) fixedly mounted on the outer surface of the tester body (1) near the display screen (102), a rotating rod (202) being rotatably connected between the two side panels (201), and a protection plate (203) being fixedly connected to the outer surface of the rotating rod (202); The suspension assembly (3) comprises a pair of mounting grooves (301) symmetrically mounted on the side of the tester body (1); a mounting block (302) is clamped inside the mounting groove (301); a fixing plate (303) is fixedly connected to the side of the mounting block (302); and a plurality of mounting holes (304) are provided inside the fixing plate (303).

2. A test platform based on electronic science and technology according to claim 1, characterized in that: A silicone pad (204) is fixedly connected to the side of the protective plate (203) near the display screen (102), and the silicone pad (204) abuts against the display screen (102).

3. A test platform based on electronic science and technology according to claim 1, characterized in that: Two fixing grooves (305) are provided inside the installation groove (301), a telescopic rod (306) is fixedly connected inside the fixing groove (305), and an inclined block (307) is fixedly connected to one end of the telescopic rod (306).

4. A test platform based on electronic science and technology according to claim 3, characterized in that: Two adjustment grooves (308) are symmetrically formed on the outer surface of the mounting block (302), and the inclined block (307) is snap-connected with the adjustment grooves (308).

5. The test platform based on electronic science and technology according to claim 3, characterized in that: The outer surface of the telescopic rod (306) is sleeved with a spring (309), one end of the spring (309) is connected to the inside of the fixing groove (305), and the other end is connected to the inclined block (307).

6. A test platform based on electronic science and technology according to claim 1, characterized in that: Two hand-held rods are fixedly connected to the outer surface of the tester body (1), and the outer surfaces of the hand-held rods are sleeved with anti-slip sleeves.

7. The test platform based on electronic science and technology according to claim 1, characterized in that: The tester body (1) comprises: A data acquisition module, the data acquisition module is used to receive test data of the electronic device to be tested; A data analysis module, wherein the data analysis module is used to process and analyze the received test data to obtain test results; A data output module, the data output module is used to transmit the test results to a display screen (102) for output display; Remote access module, used to access the test platform through the remote network to achieve remote testing and monitoring; Data storage module, used to store test data and test results for subsequent analysis and query; The permission setting module logs in through a biometric authentication method such as fingerprint, face, or iris to ensure the security of the test platform.

8. A test platform based on electronic science and technology according to claim 7, characterized in that: The data analysis module includes a preprocessing unit, a feature extraction unit, a determination unit and an anomaly detection unit. The preprocessing unit is used to preprocess the received test data, the feature extraction unit is used to extract feature values ​​from the preprocessed data, the determination unit is used to determine the test results according to the feature values, and the anomaly detection unit is used to detect abnormal values ​​or abnormal patterns in the test data and trigger an alarm or retest.

9. A test platform based on electronic science and technology according to claim 8, characterized in that: The preprocessing unit includes a filtering subunit, an amplifying subunit and a DC offset removal subunit. The filtering subunit is used to remove noise in the test data, the amplifying subunit is used to amplify useful signals in the test data, and the DC offset removal subunit is used to eliminate DC offset components in the test data. The feature extraction unit adopts a deep learning algorithm to automatically extract key feature values ​​from the test data, and continuously optimizes the accuracy of feature extraction through a training model.

10. A test platform based on electronic science and technology according to any one of claims 7 to 9, characterized in that: The tester body (1) further comprises an adaptive test strategy module, which automatically adjusts test parameters and test procedures according to the type and characteristics of the electronic device to be tested, and the adaptive test strategy module comprises: Intelligent identification and classification unit,The adaptive test strategy module first obtains the basic information of the electronic device to be tested through the interface, and then uses the built-in database or online query service to intelligently identify and classify the device; Test parameter optimization unit: Based on the classification results of the equipment, the adaptive test strategy module automatically selects or adjusts the test parameters to ensure that the test process is both efficient and accurate; Test process customization: In addition to test parameters, the adaptive test strategy module also customizes the test process according to the characteristics of the device; Real-time adjustment and feedback unit: During the test process, the adaptive test strategy module will continuously monitor the test data and adjust the test parameters and processes according to the real-time changes in the data. If an abnormality or an unexpected result is detected, the module will trigger an alarm or retest to ensure the accuracy and reliability of the test; The learning and optimization unit, through machine learning algorithms, can continuously optimize test strategies and parameters based on historical test data and user feedback.

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