Damped oscillation magnetic field test device with adjustable intensity

By designing protective equipment such as protective plates and linkage racks in the test device, the problem of unexpected opening of the test frame is solved, the stability of the test conditions and data reliability are ensured, and the temperature control effect is improved.

CN119936547AActive Publication Date: 2025-05-06JIANGSU POLICE INST
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Patent Information

Application Number
CN202510430372.6
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-04-08
Publication Date
2025-05-06
Estimated Expiration
2045-04-08

AI Technical Summary

Technical Problem

The existing damping oscillating magnetic field test device with adjustable strength is difficult to prevent external forces from accidentally opening the test frame, resulting in unstable test conditions and affecting the effectiveness of the test data.

Method used

A protective device including a protective plate, an L-shaped plate, a T-shaped rod and a linkage rack is designed. The protective plate moves backward to contact the top of the L-shaped plate to prevent the test frame from being opened unexpectedly, and the temperature control effect of the temperature control device is enhanced by the linkage rack and the push plate.

Benefits of technology

It effectively prevents the unexpected opening of the test box, maintains the stability of the test conditions, ensures the reliability and accuracy of the test detection data, and optimizes the working environment of the damped oscillating magnetic field interference generator.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention discloses an intensity-adjustable damped oscillation magnetic field test device, and relates to the technical field of magnetic test detection, the intensity-adjustable damped oscillation magnetic field test device comprises a test frame and a protection device, the front side of the test frame is provided with a damped oscillation magnetic field interference generator, and the left side of the test frame is provided with a magnetic field sensor; a temperature control device is arranged on the right side of the damped oscillation magnetic field interference generator, the protection equipment comprises a test hole, a shielding rod, an L-shaped plate, a separation plate, a hollow frame, a T-shaped rod and a protection plate, the protection plate moves backwards to make contact with the top of the L-shaped plate and limit the L-shaped plate, and the test hole is formed in the right side of the test frame. The shielding rod is fixedly installed at the top of the test frame, the L-shaped plate is limited through the protection plate so as to prevent the test frame in a test from being opened, the stability of test conditions can be kept, and therefore the reliability and accuracy of test detection data are ensured.
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Description

Technical Field

[0001] The invention relates to the technical field of magnetic force test detection, in particular to a damped oscillation magnetic field test device with adjustable intensity. Background Art

[0002] The damped oscillation magnetic field test device with adjustable intensity usually consists of a damped oscillation magnetic field interference generator, a magnetic field sensor, a temperature control device and a protective device.

[0003] The patent with the patent announcement number CN109100594B relates to a damped oscillation magnetic field test device with adjustable intensity, including a damped oscillation magnetic field interference generator and a current-carrying coil. The damped oscillation magnetic field interference generator outputs a current signal to the current-carrying coil, and the current-carrying coil generates a magnetic field with adjustable magnetic field intensity. The protection device under test is placed in the magnetic field generated by the current-carrying coil. When conducting the test, the magnetic field intensity is adjusted, such as increasing the magnetic field intensity to a suitable degree or until the protection of the protection device under test fails, and the ability of the protection device under test to withstand magnetic field interference is tested, so as to find the weak points of the protection device under test in withstanding magnetic field interference. Therefore, the test device generates a variable interference magnetic field intensity, and can also increase the damped oscillation magnetic field intensity to several times that of the standard generator, more realistically simulating the actual working environment, making the anti-interference performance results of the protection device against strong magnetic fields more realistic and accurate, solving the problem that the test results in the prior art are inconsistent with the actual situation.

[0004] In the above patent, the test device generates variable interference magnetic field strength and can also increase the damped oscillation magnetic field strength to several times that of the standard generator, more realistically simulating the actual working environment, making the anti-interference performance results of the protection device against strong magnetic fields more realistic and accurate, solving the problem in the prior art that the test results are inconsistent with the actual situation. However, it is difficult to prevent external forces from causing the test frame in the test to be accidentally opened. The accidental opening of the test frame will cause the test conditions to be interrupted or unstable, thereby making the test data lose validity, and further causing fluctuations or errors in the test data. Summary of the invention

[0005] In view of the deficiencies of the prior art, the present invention provides a damped oscillation magnetic field test device with adjustable intensity, which solves the problems raised in the above-mentioned background technology.

[0006] To achieve the above objectives, the present invention is implemented through the following technical solutions: a damped oscillation magnetic field test device with adjustable intensity, comprising a test frame and a protective device, wherein a damped oscillation magnetic field interference generator is arranged on the front side of the test frame, a magnetic field sensor is arranged on the left side of the test frame, and a temperature control device is arranged on the right side of the damped oscillation magnetic field interference generator, wherein the protective device comprises a test hole, a shielding rod, an L-shaped plate, a separation plate, a hollow frame, a T-shaped rod and a protective plate, the T-shaped rod moves backward to drive the protective plate to move backward, the protective plate moves backward to contact the top of the L-shaped plate and limit the L-shaped plate, the test hole is opened on the right side of the test frame, the shielding rod is fixedly installed on the top of the test frame, the L-shaped plate is slidably installed on the circumferential surface of the shielding rod, the separation plate is fixedly installed on the inner wall of the temperature control device, the hollow frame is fixedly installed on the top of the test frame, the T-shaped rod is slidably installed on the inner wall of the hollow frame, the protective plate is fixedly installed on the front side of the T-shaped rod, and a No. 1 spring is arranged between the test frame and the L-shaped plate.

[0007] According to the above technical solution, a linkage rack is provided at the bottom of the protective plate, a rotating rod is rotatably passed through the left and right walls of the separation plate, a linkage gear is fixedly installed on the circumferential surface of the rotating rod, a pushing plate is fixedly installed on the circumferential surface of the rotating rod, and an arc panel is fixedly installed on the right side of the separation plate.

[0008] According to the above technical solution, the arc panel is elastic, the linkage rack is meshed with the linkage gear, a No. 2 spring is arranged between the hollow frame and the T-shaped rod, and the No. 2 spring can drive the T-shaped rod to reset, the protective plate is in contact with the L-shaped plate, and a U-shaped frame is fixedly installed at the bottom of the damped oscillation magnetic field interference generator, and an adjustment button is fixedly installed inside the U-shaped frame, and the strength of the damped oscillation magnetic field interference generator can be adjusted by the adjustment button, and the adjustment button is electrically connected to the damped oscillation magnetic field interference generator.

[0009] According to the above technical solution, a fastening device for preventing the test product from shifting is provided on the inner wall of the test frame, and a protective device is provided on the front side of the test frame. The fastening device includes a placement plate, a U-shaped plate, an elastic telescopic rod, a hollow rod, a connecting plate, a placement hole, a placement rod, a support plate and a support hole. The support plate moves downward due to the squeezing of the connecting plate, and the support plate moves downward to contact the inner wall of the support hole and support the hollow rod. The placement plate is fixedly installed on the inner wall of the test frame, the U-shaped plate is fixedly installed on the top of the placement plate, the elastic telescopic rod is fixedly installed on the right side of the U-shaped plate, the hollow rod is fixedly installed on the free end of the elastic telescopic rod, the connecting plate slides through the left and right walls of the hollow rod, the placement hole is opened on the front side of the hollow rod, the placement rod is fixedly installed on the inner wall of the placement hole, the support plate is slidably installed on the circumferential surface of the placement rod, and the support hole is opened on the top of the placement plate.

[0010] According to the above technical solution, a Z-shaped plate is slidably installed on the inner wall of the hollow rod, the Z-shaped plate is in contact with the support plate, the right side of the hollow rod is set as an inclined surface, the hollow rod passes through the inner and outer walls of the test frame, and the Z-shaped plate moves downward to contact the top of the sample and assist in fixing the top of the sample.

[0011] According to the above technical solution, a No. 3 spring is arranged between the connecting plate and the hollow rod, and the No. 3 spring can drive the connecting plate to reset. A No. 4 spring is arranged between the support plate and the placement hole, and the No. 4 spring can drive the support plate to reset. The top of the support plate is set as an inclined surface.

[0012] According to the above technical solution, the protection device includes a detection frame, a connecting frame, a protection frame, a protection plate, a linkage plate and a movable plate. The adjustment button is blocked by the movable plate, so that the strength of the damped oscillation magnetic field interference generator cannot be adjusted during the test. The detection frame is fixedly installed on the top of the Z-shaped plate, the connecting frame is slidably installed on the inner wall of the detection frame, the protection frame is fixedly passed through the front side of the test frame, the protection plate is slidably installed on the inner wall of the protection frame, the linkage plate is fixedly installed on the front side of the protection plate, the movable plate is fixedly installed on the front side of the linkage plate, a hose is arranged between the detection frame and the protection frame, and a movable hole is opened on the top of the movable plate.

[0013] According to the above technical solution, a No. 5 spring is arranged between the detection frame and the connecting frame, and the No. 5 spring can drive the connecting frame to reset. Liquid is arranged inside the detection frame, liquid is arranged inside the protection frame, and the connecting frame passes through the upper and lower walls of the Z-shaped plate.

[0014] The present invention provides a damped oscillation magnetic field test device with adjustable intensity. It has the following beneficial effects: (1) The strength-adjustable damped oscillation magnetic field test device, through the protective plate moving backward to contact with the top of the L-shaped plate and limit the L-shaped plate, the accidental opening of the test frame may lead to instability of the test environment. The protective plate limits the L-shaped plate to prevent the test frame from being opened during the test, which can maintain the stability of the test conditions, thereby ensuring the reliability and accuracy of the test detection data. By pushing the foreign matter on the right side of the separation plate to rotate and the arc plate driving the separation plate to resonate together, the temperature control effect of the temperature control device can be improved, thereby maintaining the stability of the temperature of the damped oscillation magnetic field interference generator during the test, thereby optimizing the working environment of the damped oscillation magnetic field interference generator and reducing the influence of temperature fluctuations on the test results.

[0015] (2) The strength-adjustable damped oscillation magnetic field test device can improve the fastening effect of the hollow rod on the magnetic sample by moving the support plate downward to contact the inner wall of the support hole. The hollow rod can fasten the magnetic sample in the test frame through the physical structure, thereby ensuring that the magnetic sample will not be displaced during the change of the magnetic field, thereby making the test result more accurate. By moving the Z-shaped plate downward to contact the top of the sample and assisting in fixing the top of the sample, the top of the magnetic sample can be further ensured to be uniform, thereby improving the accuracy of the measurement test.

[0016] (3) The intensity-adjustable damped oscillation magnetic field test device drives the movable plate forward by moving the protective plate forward. The movable plate moves forward to block the adjustment button. The adjustment button is blocked by the movable plate, making it impossible to adjust the intensity of the damped oscillation magnetic field interference generator during the test. By making it impossible to adjust the magnetic field intensity during the test, the possibility of improper adjustment of the magnetic field intensity by the operator can be eliminated, thereby avoiding drastic changes in the test conditions due to adjustment errors, thereby ensuring the continuity and reliability of the test process. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a schematic diagram of the overall structure of the present invention; Figure 2 This is a schematic diagram of the internal structure of the test frame of the present invention; Figure 3 This is a schematic diagram of the position structure of the placement plate and the U-shaped plate of the present invention; Figure 4 For the present invention Figure 3 A schematic diagram of the structure enlargement of part A; Figure 5 This is a schematic diagram of the position structure of the T-shaped rod and the protective plate of the present invention; Figure 6 For the present invention Figure 5 A schematic diagram of the structure of part B in the middle is enlarged; Figure 7 For the present invention Figure 5 The enlarged schematic diagram of the structure of part C in the middle; Figure 8 Schematic diagram of the internal structure of the detection frame of the present invention.

[0018] In the figure: 1, test frame; 2, damped oscillation magnetic field interference generator; 3, magnetic field sensor; 4, temperature control device; 5, test hole; 6, shielding rod; 7, L-shaped plate; 8, separation plate; 9, hollow frame; 10, T-shaped rod; 11, protective plate; 12, linkage rack; 13, rotating rod; 14, linkage gear; 15, pushing plate; 16, arc panel; 171, placement plate; 172, U-shaped plate; 173, elastic telescopic rod; 174, hollow rod; 175, connecting plate; 176, placement hole; 177, placement rod; 178, support plate; 179, Z-shaped plate; 1710, support hole; 181, detection frame; 182, connection frame; 183, protection frame; 184, protection plate; 185, linkage plate; 186, U-shaped frame; 187, moving plate; 188, adjustment button. DETAILED DESCRIPTION

[0019] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0020] See also Figure 1-Figure 6 An embodiment of the present invention is: an intensity adjustable damped oscillation magnetic field test device, comprising a test frame 1, and also comprising protective equipment, wherein a damped oscillation magnetic field interference generator 2 is arranged on the front side of the test frame 1, a magnetic field sensor 3 is arranged on the left side of the test frame 1, and a temperature control device 4 is arranged on the right side of the damped oscillation magnetic field interference generator 2, wherein the protective equipment comprises a test hole 5, a shielding rod 6, an L-shaped plate 7, a separation plate 8, a hollow frame 9, a T-shaped rod 10 and a protective plate 11, the test hole 5 is opened on the right side of the test frame 1, and the shielding rod 6 is fixedly installed Installed on the top of the test frame 1, the L-shaped plate 7 is slidably installed on the circumferential surface of the shielding rod 6, the separation plate 8 is fixedly installed on the inner wall of the temperature control device 4, the hollow frame 9 is fixedly installed on the top of the test frame 1, the T-shaped rod 10 is slidably installed on the inner wall of the hollow frame 9, and the protective plate 11 is fixedly installed on the front side of the T-shaped rod 10. A spring No. 1 is arranged between the test frame 1 and the L-shaped plate 7. The protective plate 11 is used to limit the L-shaped plate 7 to prevent the test frame 1 from being opened during the test, which can maintain the stability of the test conditions, thereby ensuring the reliability and accuracy of the test detection data.

[0021] A linkage rack 12 is provided at the bottom of the protective plate 11, a rotating rod 13 is rotatably penetrated through the left and right walls of the separation plate 8, a linkage gear 14 is fixedly installed on the circumferential surface of the rotating rod 13, a pushing plate 15 is fixedly installed on the circumferential surface of the rotating rod 13, and an arc panel 16 is fixedly installed on the right side of the separation plate 8. By improving the temperature control effect of the temperature control device 4, the temperature of the damped oscillation magnetic field interference generator 2 is kept stable during the test, thereby optimizing the working environment of the damped oscillation magnetic field interference generator 2.

[0022] The arc panel 16 is elastic, the linkage rack 12 is meshed with the linkage gear 14, a No. 2 spring is arranged between the hollow frame 9 and the T-shaped rod 10, and the No. 2 spring can drive the T-shaped rod 10 to reset, the protective plate 11 is in contact with the L-shaped plate 7, and a U-shaped frame 186 is fixedly installed at the bottom of the damped oscillation magnetic field interference generator 2, and an adjustment button 188 is fixedly installed inside the U-shaped frame 186. The strength of the damped oscillation magnetic field interference generator 2 can be adjusted by adjusting the adjustment button 188, and the adjustment button 188 is electrically connected to the damped oscillation magnetic field interference generator 2.

[0023] When the present embodiment is working, the magnetic sample is placed into the test frame 1 through the test hole 5. After the sample is stably placed in the test frame 1, the L-shaped plate 7 is manually pushed downward. The L-shaped plate 7 moves downward to squeeze the No. 1 spring. The No. 1 spring is squeezed by the L-shaped plate 7 to deform and accumulate force. At the same time, the L-shaped plate 7 moves downward to break away from the contact with the protective plate 11. When the protective plate 11 breaks away from the contact with the L-shaped plate 7, the T-shaped rod 10 moves backward under the elastic force of the No. 2 spring. The T-shaped rod 10 The movement to the rear side drives the protection plate 11 to move to the rear side, and the protection plate 11 moves to the rear side to contact the top of the L-shaped plate 7 and limit the L-shaped plate 7. At the same time, the movement of the protection plate 11 to the rear side drives the linkage rack 12 to move, and the linkage rack 12 moves to squeeze the linkage gear 14 to rotate. The rotation of the linkage gear 14 drives the push plate 15 to rotate, and the push plate 15 rotates to push the foreign matter on the right side of the separation plate 8. At the same time, the push plate 15 rotates to hit the arc panel 16 to generate vibration, and the arc panel 16 generates vibration to drive the separation The plate 8 resonates together, thereby improving the temperature control effect of the temperature control device 4. After the L-shaped plate 7 moves downward to completely block the test hole 5, the damped oscillation magnetic field interference generator 2 and the magnetic field sensor 3 are started to test the magnetic sample. The damped oscillation magnetic field interference generator 2 is adjusted by adjusting the adjustment button 188, and the magnetic force strength generated by the damped oscillation magnetic field interference generator 2 can be adjusted. After the test is completed, the protective plate 11 is manually pulled to move forward. The movement of the protective plate 11 to the forward side drives the T-shaped rod 10 to move forward. The T-shaped rod 10 moves forward to pull the No. 2 spring. The No. 2 spring is deformed and accumulates force due to the pulling of the T-shaped rod 10. At the same time, the protective plate 11 moves forward to break away from the contact with the top of the L-shaped plate 7 and releases the limit of the L-shaped plate 7. After the limit of the L-shaped plate 7 is released, the L-shaped plate 7 moves upward and resets under the elastic force of the No. 1 spring. The L-shaped plate 7 moves upward and resets to release the blocking of the test hole 5. After the blocking of the test hole 5 is released, the sample inside the test frame 1 is manually taken out.

[0024] See also Figure 1-Figure 8On the basis of the above embodiment, in another embodiment of the present invention, the inner wall of the test frame 1 is provided with a fastening device for preventing the test product from shifting, and the front side of the test frame 1 is provided with a protective device, the fastening device includes a placement plate 171, a U-shaped plate 172, an elastic telescopic rod 173, a hollow rod 174, a connecting plate 175, a placement hole 176, a placement rod 177, a support plate 178 and a support hole 1710, the placement plate 171 is fixedly mounted on the inner wall of the test frame 1, the U-shaped plate 172 is fixedly mounted on the top of the placement plate 171, and the elastic telescopic rod 173 is fixedly mounted on the U-shaped plate 17 On the right side, the hollow rod 174 is fixedly mounted on the free end of the elastic telescopic rod 173, the connecting plate 175 slides through the left and right walls of the hollow rod 174, the placement hole 176 is opened on the front side of the hollow rod 174, the placement rod 177 is fixedly mounted on the inner wall of the placement hole 176, the support plate 178 is slidably mounted on the circumferential surface of the placement rod 177, and the support hole 1710 is opened on the top of the placement plate 171. The hollow rod 174 can fasten the magnetic sample in the test frame 1 through the physical structure, thereby ensuring that the magnetic sample will not be displaced during the change of the magnetic field, so as to make the test result more accurate.

[0025] A Z-shaped plate 179 is slidably installed on the inner wall of the hollow rod 174, and the Z-shaped plate 179 contacts the support plate 178. The right side of the hollow rod 174 is set as an inclined surface. The hollow rod 174 passes through the inner and outer walls of the test frame 1. The Z-shaped plate 179 moves downward to contact the top of the sample and assists in fixing the top of the sample. By assisting in fixing the top of the magnetic sample, it can be further ensured that the magnetic field acts on the sample uniformly, thereby assisting in improving the accuracy of the measurement test.

[0026] A No. 3 spring is arranged between the connecting plate 175 and the hollow rod 174, and the No. 3 spring can drive the connecting plate 175 to reset. A No. 4 spring is arranged between the support plate 178 and the placement hole 176, and the No. 4 spring can drive the support plate 178 to reset. The top of the support plate 178 is arranged as an inclined surface.

[0027] The protection equipment includes a detection frame 181, a connection frame 182, a protection frame 183, a protection plate 184, a linkage plate 185 and a movable plate 187. The detection frame 181 is fixedly installed on the top of the Z-shaped plate 179, the connection frame 182 is slidably installed on the inner wall of the detection frame 181, the protection frame 183 is fixedly passed through the front side of the test frame 1, the protection plate 184 is slidably installed on the inner wall of the protection frame 183, the linkage plate 185 is fixedly installed on the front side of the protection plate 184, and the movable plate 187 is fixedly installed on the front side of the linkage plate 185. A hose is arranged between the detection frame 181 and the protection frame 183, and a movable hole is opened on the top of the movable plate 187. By making it impossible to adjust the magnetic field strength during the test, the possibility of improper adjustment of the magnetic field strength by the operator can be eliminated, thereby avoiding drastic changes in the test conditions due to adjustment errors, thereby ensuring the continuity and reliability of the test process.

[0028] A No. 5 spring is arranged between the detection frame 181 and the connection frame 182 , and the No. 5 spring can drive the connection frame 182 to reset. Liquid is arranged inside the detection frame 181 , and liquid is arranged inside the protection frame 183 . The connection frame 182 passes through the upper and lower walls of the Z-shaped plate 179 .

[0029] When the present embodiment is working, the L-shaped plate 7 moves downward to contact the inclined surface of the hollow rod 174 and squeeze the hollow rod 174. The hollow rod 174 is squeezed by the L-shaped plate 7 and moves in the direction close to the magnetic field sensor 3. The hollow rod 174 moves in the direction close to the magnetic field sensor 3 to drive the connecting plate 175 to move. The connecting plate 175 moves to contact the sample and squeeze the sample. The connecting plate 175 is subjected to the reaction force of squeezing the sample and moves in the direction close to the L-shaped plate 7. The connecting plate 175 moves in the direction close to the L-shaped plate 7 to squeeze the No. 3 spring. The No. 3 spring is squeezed by the connecting plate 175 and deforms. While accumulating force, the connecting plate 175 moves toward the direction close to the L-shaped plate 7, contacts the inclined surface of the supporting plate 178 and squeezes the supporting plate 178. The supporting plate 178 moves downward due to the squeezing of the connecting plate 175. The supporting plate 178 moves downward and contacts the inner wall of the supporting hole 1710 and supports the hollow rod 174. At the same time, the hollow rod 174 squeezes and tightens the sample. When the supporting plate 178 moves downward due to the squeezing of the connecting plate 175, the supporting plate 178 moves downward, driving the Z-shaped plate 179 downward. The Z-shaped plate 179 moves downward and contacts the top of the sample to assist in fixing the top of the sample.

[0030] The Z-shaped plate 179 moves downward, driving the detection frame 181 downward. The detection frame 181 moves downward, driving the connection frame 182 downward. The connection frame 182 moves downward and squeezes the top of the sample. The connection frame 182 moves upward under the reaction force of the squeezed sample. The connection frame 182 moves upward to squeeze the No. 5 spring. The No. 5 spring is squeezed by the connection frame 182 to deform and store force. At the same time, the connection frame 182 moves upward to squeeze the liquid inside the detection frame 181. The liquid inside the detection frame 181 The liquid is squeezed by the connecting frame 182 and enters the interior of the protective frame 183 through the hose. The liquid that enters the protective frame 183 squeezes the protective plate 184. The protective plate 184 moves forward due to the squeeze of the liquid that enters the protective frame 183. The movement of the protective plate 184 forward drives the movable plate 187 forward. The movable plate 187 moves forward to block the adjustment button 188. The adjustment button 188 is blocked by the movable plate 187, which makes it impossible to adjust the intensity of the damped oscillation magnetic field interference generator 2 during the test.

[0031] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A damped oscillating magnetic field test device with adjustable intensity, comprising a test frame (1), characterized in that: It also includes protective equipment; Wherein, a damped oscillation magnetic field interference generator (2) is arranged on the front side of the test frame (1), a magnetic field sensor (3) is arranged on the left side of the test frame (1), and a temperature control device (4) is arranged on the right side of the damped oscillation magnetic field interference generator (2); The protective device comprises a test hole (5), a shielding rod (6), an L-shaped plate (7), a separation plate (8), a hollow frame (9), a T-shaped rod (10) and a protective plate (11), wherein the test hole (5) is opened on the right side of the test frame (1), the shielding rod (6) is fixedly mounted on the top of the test frame (1), the L-shaped plate (7) is slidably mounted on the circumferential surface of the shielding rod (6), the separation plate (8) is fixedly mounted on the inner wall of the temperature control device (4), the hollow frame (9) is fixedly mounted on the top of the test frame (1), the T-shaped rod (10) is slidably mounted on the inner wall of the hollow frame (9), the protective plate (11) is fixedly mounted on the front side of the T-shaped rod (10), and a No. 1 spring is provided between the test frame (1) and the L-shaped plate (7); The inner wall of the test frame (1) is provided with a fastening device for preventing the test object from shifting, and the front side of the test frame (1) is provided with a protective device.

2. The damped oscillating magnetic field test device with adjustable intensity according to claim 1, characterized in that: A linkage rack (12) is provided at the bottom of the protection plate (11); a rotating rod (13) is rotatably penetrated through the left and right walls of the separation plate (8); a linkage gear (14) is fixedly mounted on the circumferential surface of the rotating rod (13); a push plate (15) is fixedly mounted on the circumferential surface of the rotating rod (13); and a curved panel (16) is fixedly mounted on the right side of the separation plate (8).

3. The damped oscillating magnetic field test device with adjustable intensity according to claim 2, characterized in that: The arc panel (16) is elastic, the linkage rack (12) is meshed with the linkage gear (14), a second spring is provided between the hollow frame (9) and the T-shaped rod (10), the protective plate (11) is in contact with the L-shaped plate (7), a U-shaped frame (186) is fixedly installed at the bottom of the damped oscillation magnetic field interference generator (2), an adjustment button (188) is fixedly installed inside the U-shaped frame (186), and the adjustment button (188) is electrically connected to the damped oscillation magnetic field interference generator (2).

4. The damped oscillating magnetic field test device with adjustable intensity according to claim 3, characterized in that: The fastening device comprises a placement plate (171), a U-shaped plate (172), an elastic telescopic rod (173), a hollow rod (174), a connection plate (175), a placement hole (176), a placement rod (177), a support plate (178) and a support hole (1710), wherein the placement plate (171) is fixedly mounted on the inner wall of the test frame (1), the U-shaped plate (172) is fixedly mounted on the top of the placement plate (171), and the elastic telescopic rod (173) is fixedly mounted on the U-shaped plate ( 172), the hollow rod (174) is fixedly mounted on the free end of the elastic telescopic rod (173), the connecting plate (175) slides through the left and right walls of the hollow rod (174), the placement hole (176) is opened on the front side of the hollow rod (174), the placement rod (177) is fixedly mounted on the inner wall of the placement hole (176), the support plate (178) is slidably mounted on the circumferential surface of the placement rod (177), and the support hole (1710) is opened on the top of the placement plate (171).

5. The damped oscillating magnetic field test device with adjustable intensity according to claim 4, characterized in that: A Z-shaped plate (179) is slidably mounted on the inner wall of the hollow rod (174), the Z-shaped plate (179) is in contact with the support plate (178), the right side of the hollow rod (174) is arranged as an inclined surface, and the hollow rod (174) passes through the inner and outer walls of the test frame (1).

6. The damped oscillating magnetic field test device with adjustable intensity according to claim 5, characterized in that: A No. 3 spring is provided between the connection plate (175) and the hollow rod (174), a No. 4 spring is provided between the support plate (178) and the placement hole (176), and the top of the support plate (178) is provided as an inclined surface.

7. The damped oscillating magnetic field test device with adjustable intensity according to claim 6, characterized in that: The protection device comprises a detection frame (181), a connection frame (182), a protection frame (183), a protection plate (184), a linkage plate (185) and a movable plate (187); the detection frame (181) is fixedly mounted on the top of the Z-shaped plate (179); the connection frame (182) is slidably mounted on the inner wall of the detection frame (181); the protection frame (183) is fixedly passed through the front side of the test frame (1); the protection plate (184) is slidably mounted on the inner wall of the protection frame (183); the linkage plate (185) is fixedly mounted on the front side of the protection plate (184); the movable plate (187) is fixedly mounted on the front side of the linkage plate (185); a hose is provided between the detection frame (181) and the protection frame (183); and a movable hole is provided on the top of the movable plate (187).

8. The damped oscillating magnetic field test device with adjustable intensity according to claim 7, characterized in that: A No. 5 spring is provided between the detection frame (181) and the connection frame (182), liquid is provided inside the detection frame (181), liquid is provided inside the protection frame (183), and the connection frame (182) penetrates the upper and lower walls of the Z-shaped plate (179).

Citation Information

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