Automatic inspection system for low-light power supply environment test

Abstract

The invention discloses an automatic inspection system for a low-light power supply environment test. The low-light power supply environment test automatic inspection system is used for carrying out automatic inspection on a to-be-tested power supply of a low-light image intensifier, and comprises a low-light power supply testing device, a high and low temperature environment test box, an automatic inspection electrical connection tool, a relay assembly and at least one controller, each to-be-tested power supply is suitable for forming a test channel with the low-light power supply test device and the high and low temperature environment test box through the automatic inspection electrical connection tool; the relay assembly comprises a plurality of control relays and at least one protection relay; wherein each control relay is connected to the automatic inspection electrical connection tool, so as to be connected to the corresponding test channel in an electrically conductive manner, and is used for controlling the connection and disconnection of the corresponding test channel; and each at least two control relays are connected with one protection relay.

Description

Technical Field

[0001] The present application relates to the field of low-light-level image intensifier power supply detection, and in particular to an automatic inspection system for low-light-level power supply environmental testing. Background Art

[0002] A low-light-level image intensifier can enhance a weak visible light image into a brightness image visible to the human eye. A low-light-level image intensifier is usually composed of a photocathode, a microchannel plate (MCP), a fluorescent screen, and a dedicated power supply. The photocathode, MCP, and fluorescent screen constitute the optical component of the low-light-level image intensifier, and the dedicated power supply adapted thereto not only provides the necessary stable voltage for each electrode of the low-light-level image intensifier, but also must have an automatic brightness control (ABC) function and a strong light protection function to ensure that the brightness of the fluorescent screen remains stable and suitable for human eye observation, while protecting the photocathode from damage under high illumination.

[0003] The performance of the dedicated power supply of the low-light image intensifier has an important impact on the functional realization of the low-light image intensifier. The dedicated power supply of the low-light image intensifier is a power supply with special requirements. The output voltage is high, up to 15 kilovolts, the output current is extremely small, less than 1 microampere, the number of output groups is large, and multiple groups of power supplies can be combined for output. Accordingly, a specific test system needs to be configured for the dedicated power supply of the low-light image intensifier. Summary of the invention

[0004] An advantage of the present application is that it provides an automatic inspection system for low-light power supply environmental testing, wherein the automatic inspection system for low-light power supply environmental testing can automatically inspect multiple low-light power supplies (i.e., dedicated power supplies for low-light image intensifiers) to achieve batch detection of low-light power supplies.

[0005] Another advantage of the present application is that it provides an automatic inspection system for low-light power supply environment test, wherein the low-light power supply test device of the automatic inspection system for low-light power supply environment test adopts a combined sensor testing technology, which can test the comprehensive performance.

[0006] According to one aspect of the present application, a low-light power supply environmental test automatic inspection system is provided, which is used to automatically inspect the power supply to be tested of the low-light image intensifier, and includes: A low-light power supply test device is used to detect the power supply to be tested of the low-light image intensifier; A high and low temperature environment test chamber, used to provide a test environment of corresponding temperature for the test of the low-light power supply test device; An automatic inspection electrical connection tool, comprising an electrical test electrical connection element and an environmental test chamber electrical connection element, wherein the electrical test electrical connection element is arranged on the low-light power supply test device, and is used to electrically connect the low-light power supply test device to the environmental test chamber electrical connection element; the environmental test chamber electrical connection element is arranged on the high-low temperature environmental test chamber, and is used to connect the high-low temperature environmental test chamber to the power supply to be tested, so that each power supply to be tested is suitable for forming a test channel with the low-light power supply test device and the high-low temperature environmental test chamber through the automatic inspection electrical connection tool; A relay assembly, comprising a plurality of control relays and at least one protection relay; wherein each of the control relays is connected to the electrical connection element of the environmental test chamber so as to be electrically connected to a corresponding test channel, and is used to control the opening and closing of the corresponding test channel; and each of at least two control relays is connected to one protection relay; At least one controller is connected to the relay assembly and is used to automatically control each of the control relays in the relay assembly to be closed or opened in sequence, so that the low-light power supply test device can detect each power supply to be tested in sequence through the test channel.

[0007] In one embodiment of the automatic inspection system for low-light power source environmental testing according to the present application, the relay assembly includes 60 control relays.

[0008] In one implementation of the automatic inspection system for low-light power source environmental testing according to the present application, every ten control relays are connected to one protection relay.

[0009] In one embodiment of the automatic inspection system for environmental testing of low-light power sources according to the present application, the low-light power source testing device includes: an anode high-voltage test module, a cathode voltage test module, an anode current test module, and a microchannel plate voltage test module; the anode high-voltage test module is configured to test the voltage of the anode of the power source to be tested; the cathode voltage test module is configured to test the voltage of the cathode of the power source to be tested; the anode current test module is configured to test the working current of the test channel; and the microchannel plate voltage test module is configured to test the output voltage of the power source to be tested to the microchannel plate.

[0010] In one embodiment of the automatic inspection system for low-light power environmental testing according to the present application, the automatic inspection system for low-light power environmental testing further comprises at least one power supply module, and the power supply module is configured to provide electrical energy for testing the low-light power testing device.

[0011] In one embodiment of the automatic inspection system for low-light power environment testing described in the present application, the electrical test electrical connection element includes a first power supply positive terminal, a first power supply negative terminal, a second power supply positive terminal, a second power supply negative terminal, a high-voltage test terminal, a microchannel plate test terminal, and a cathode test terminal.

[0012] In one embodiment of the automatic inspection system for low-light power source environmental testing described in the present application, at least one controller is configured to control the current control relay to open and control the next control relay to close in sequence when a preset time interval has passed since the closing time of the currently closed control relay.

[0013] In one embodiment of the automatic inspection system for the environmental test of the low-light power supply described in the present application, the automatic inspection system for the environmental test of the low-light power supply includes at least two controllers, the two controllers are a lower-computer programmable logic controller and an upper-computer computer controller, the lower-computer programmable logic controller is directly connected to the relay assembly, and is used to automatically control each of the control relays in the relay assembly to be closed or opened in sequence, so that the low-light power supply test device detects each power supply to be tested in sequence through the test channel, and then obtains test data; the upper-computer computer controller can be communicatively connected to the lower-computer programmable logic controller, and is used to receive the test data obtained by the lower-computer programmable logic controller.

[0014] In one embodiment of the automatic inspection system for low-light power environment test according to the present application, the automatic inspection system for low-light power environment test includes at least one display screen, and at least one of the display screens is connected to at least one of the controllers.

[0015] Further objectives and advantages of the present application will be fully reflected through understanding of the following description and drawings.

[0016] These and other objects, features and advantages of the present application are fully reflected in the following detailed description, drawings and claims. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] By describing the embodiments of the present application in more detail in conjunction with the accompanying drawings, the above and other purposes, features and advantages of the present application will become more apparent. The accompanying drawings are used to provide a further understanding of the embodiments of the present application and constitute a part of the specification. Together with the embodiments of the present application, they are used to explain the present application and do not constitute a limitation of the present application. In the drawings, the same reference numerals generally represent the same components.

[0018] Figure 1The figure shows a schematic diagram of the framework of an automatic inspection system for low-light power supply environment test according to an embodiment of the present application.

[0019] Figure 2 The figure shows a schematic diagram of a framework of a low-light power supply testing device according to an embodiment of the present application.

[0020] Figure 3 The figure shows a schematic framework diagram of an automatic inspection electrical connection tool according to an embodiment of the present application.

[0021] Figure 4 A schematic diagram of a framework of a relay assembly according to an embodiment of the present application is illustrated.

[0022] Figure 5 The figure shows a schematic three-dimensional diagram of a low-light power supply test device of an automatic inspection system for low-light power supply environmental testing according to an embodiment of the present application.

[0023] Figure 6 The figure shows a schematic three-dimensional diagram of a high and low temperature environment test box of the automatic inspection system for the low-light power source environment test according to an embodiment of the present application.

[0024] Figure 7 The figure shows a partial circuit diagram of an automatic inspection system for a low-light power source environmental test according to an embodiment of the present application. DETAILED DESCRIPTION

[0025] Below, the exemplary embodiments according to the present application will be described in detail with reference to the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments of the present application, and it should be understood that the present application is not limited to the exemplary embodiments described here.

[0026] It is understood that the term "one" should be understood as "at least one" or "one or more", that is, in one embodiment, the number of an element can be one, while in another embodiment, the number of the element can be multiple, and the term "one" cannot be understood as a limitation on the number. "Multiple" means greater than or equal to two.

[0027] Although ordinals such as "first," "second," and the like will be used to describe various components, those components are not limited herein. The term is used only to distinguish one component from another. For example, a first component may be referred to as a second component, and likewise, a second component may be referred to as a first component without departing from the teachings of the present application. The term "and / or" as used herein includes any and all combinations of one or more associated listed items.

[0028] The terms used herein are only used for the purpose of describing various embodiments and are not intended to be limiting. As used herein, the singular form is intended to include the plural form, unless the context clearly indicates an exception. It will also be understood that the terms "including" and / or "having" when used in this specification specify the presence of the described features, numbers, operations, components, elements, or combinations thereof, without excluding the presence or addition of one or more other features, numbers, operations, components, elements, or combinations thereof.

[0029] Schematic low-light power supply environment test automatic inspection system: like Figures 1 to 7 As shown, the automatic inspection system for low-light power supply environment test according to the embodiment of the present application is explained. Figure 1 As shown, the low-light power supply environmental test automatic inspection system of the present application includes a low-light power supply test device 10, a high and low temperature environmental test box 50, an automatic inspection electrical connection tool 70, a relay assembly 80 and at least one controller 20. The low-light power supply test device 10 is used to detect the power supply 200 to be tested of the low-light image intensifier. The high and low temperature environmental test box 50 is used to provide a test environment with a corresponding temperature for the test of the low-light power supply test device 10. Figure 3 As shown, the automatic inspection electrical connection tool 70 includes an electrical test electrical connection element 710 and an environmental test chamber electrical connection element 720. The electrical test electrical connection element 710 is arranged on the low-light power supply test device 10, and is used to electrically connect the low-light power supply test device 10 to the environmental test chamber electrical connection element 720; the environmental test chamber electrical connection element 720 is arranged on the high and low temperature environmental test chamber 50, and is used to connect the high and low temperature environmental test chamber 50 to the power supply 200 to be tested. Optionally, the high and low temperature environmental test chamber 50 is directly connected to the power supply 200 to be tested, so that each power supply 200 to be tested is suitable for forming a test channel with the low-light power supply test device 10 and the high and low temperature environmental test chamber 50 through the automatic inspection electrical connection tool 70. As shown Figure 4 As shown, the relay assembly 80 includes a plurality of control relays 81 and at least one protection relay 82. Each control relay 81 is connected to the environmental test chamber electrical connection element 720 so as to be electrically connected to the corresponding test channel, and is used to control the opening and disconnection of the corresponding test channel; one protection relay 82 is connected to every at least two control relays 81. At least one controller 20 is connected to the relay assembly 80, and is used to automatically control each control relay 81 in the relay assembly 80 to be opened or disconnected in sequence, so that the low-light power supply test device 10 detects each power supply 200 to be tested in sequence through the test channel.

[0030] In one embodiment of the present application, Figure 5 As shown, the electrical test electrical connection element 710 includes a high voltage test terminal 75, a microchannel plate test terminal 76, a cathode test terminal 77, etc. The environmental test box electrical connection element 720 includes a plurality of environmental test box electrical interfaces. During the test process, the environmental test box electrical connection element 720 is directly connected to the power supply 200 to be tested; the low-light power supply test device 10 is electrically connected to the environmental test box electrical connection element 720 through the electrical test electrical connection element 710, so that the low-light power supply test device 10 is electrically connected to the high and low temperature environmental test box 50; the relay assembly 80 is connected to the environmental test box electrical connection element 720 through an electrical connection line, so that the relay assembly 80 is connected to the high and low temperature environmental test box 50. There are two ways to connect each power supply 200 to be tested. One is to connect each power supply 200 to be tested to the relay assembly 80, and connect it to the low-light power supply test device 10 through at least one of the controllers 20, so as to achieve the purpose of automatic inspection; the other is to connect each power supply 200 to be tested to the two environmental test chamber electrical interfaces through two connecting wires, and connect each power supply 200 to be tested to the low-light power supply test device 10 through multiple connecting wires; one end of the two connecting wires connecting each power supply 200 to be tested and the two environmental test chamber electrical interfaces is connected to the high-voltage output end of the power supply 200 to be tested, and the other end is connected to one of the environmental test chamber electrical interfaces. Environmental test box electrical interface; another connecting wire is a 4-core wire, that is, it includes 4 core wires; one end of which is connected to the low-voltage output end of the power supply 200 to be tested, and the other end is connected to another electrical interface of the environmental test box; among the multiple connecting wires connecting each power supply 200 to be tested and the low-light power supply test device 10, one end of a connecting wire is integrally or separately connected to the connecting wire connected to the high-voltage output end of the power supply 200 to be tested, and the other end is connected to the high-voltage test terminal 75; one end of the other connecting wire is integrally or separately connected to the low-voltage output end of the power supply 200 to be tested, and the other end is connected to the microchannel plate test terminal 76 or the cathode test terminal 77, thereby achieving the purpose of manual inspection.

[0031] Specifically, the low-light power supply test device 10 is suitable for being electrically connected to the power supply 200 to be tested, so as to detect the power supply 200 to be tested. The low-light power supply test device 10 adopts a combined sensor test technology and can test the comprehensive performance. Figure 2As shown, the low-light power supply test device 10 includes: an anode high-voltage test module 11, a cathode voltage test module 13, an anode current test module 14, and a microchannel plate voltage test module 12. The anode high-voltage test module 11 is configured to test the voltage of the anode of the power supply 200 to be tested; the cathode voltage test module 13 is configured to test the voltage of the cathode of the power supply 200 to be tested; the anode current test module 14 is configured to test the current of the power supply 200 to be tested; and the microchannel plate voltage test module 12 is configured to test the voltage of the output of the power supply 200 to be tested to the microchannel plate.

[0032] The anode high voltage test module 11 is suitable for being connected to the high voltage test terminal 75, and is suitable for testing the high voltage signal (voltage of 0-15kv) generated by the power supply 200 to be tested, and the test error is less than 0.5%. The anode current test module 14 is suitable for testing the current of the power supply 200 to be tested, and the test error is less than 0.2%. The voltage of the cathode of the light source to be tested is usually 0-±1000v. In one embodiment of the present application, the low-light power supply environmental test automatic inspection system is also suitable for being connected to an oscilloscope 90. The cathode voltage test module 13 is suitable for being connected between the oscilloscope 90 and the power supply 200 to be tested, and is suitable for testing the cathode voltage of the power supply 200 to be tested. The microchannel plate voltage test module 12 is suitable for being connected to the microchannel plate test terminal 76, and is suitable for testing the voltage signal (voltage of 0-3000v) of the microchannel plate output by the power supply 200 to be tested, and the error is less than 0.2%.

[0033] In one embodiment of the present application, the automatic inspection system for the low-light power supply environment test also includes at least one power supply module 40, and the power supply module 40 is configured to provide electrical energy for the test of the low-light power supply test device 10. The power supply of the power supply module 40 can be adjusted, and the minimum step is to increase or decrease 0.1V or increase or decrease 0.5V. The power supply module 40 outputs a positive voltage, and the positive voltage is 0-12.00V. The output current of the power supply module 40 is greater than 100mA when its output voltage is greater than 3v. The power supply module 40 cuts off the power supply to prevent excessive current from damaging the power supply 200 to be tested.

[0034] In one embodiment of the present application, the low-light power supply environment test automatic inspection system includes two power supply modules 40. The two power supply modules 40 include a first power supply module and a second power supply module. The electrical test electrical connection element 710 also includes a first power supply positive terminal 71, a first power supply negative terminal 72, a second power supply positive terminal 73, and a second power supply negative terminal 74.

[0035] The first power supply module is connected to the first power supply positive terminal 71 and / or the first power supply negative terminal 72, and is suitable for connecting to the power supply 200 to be tested through the first power supply positive terminal 71 and the first power supply negative terminal 72. The second power supply module is connected to the second power supply positive terminal 73 and / or the second power supply negative terminal 74, and is suitable for connecting to the power supply 200 to be tested through the second power supply positive terminal 73 and the second power supply negative terminal 74.

[0036] like Figure 6 As shown, the high and low temperature environment test box 50 includes at least one electrical cabinet 51 and at least one sample cabinet 52. The electrical cabinet 51 can be used to accommodate the relay assembly 80. The sample cabinet 52 can be used to accommodate the power supply 200 to be tested. In other words, the relay assembly 80 is placed in the electrical cabinet 51 of the high and low temperature environment test box 50; the power supply 200 to be tested is placed in the sample cabinet 52. The temperature of the sample cabinet 52 is adjustable to provide a test environment of corresponding temperature for the power supply 200 to be tested. Nitrogen can be filled in the electrical cabinet 51 to prevent the micro-current generated by the relay assembly 80 during operation from leaking or interfering with the test results.

[0037] It is worth mentioning that during the operation of each of the control relays 81 in the relay assembly 80, even if the control relay 81 is controlled to be disconnected, a micro-current may flow through it, causing interference to the control relay 81 in the closed state, which not only affects the test accuracy, but also reduces the overall test safety. Based on this, the present application configures one protection relay 82 for every at least two control relays 81, such as Figure 7 When the protection relay 82 is in the disconnected state, the interference of the control relay 81 not electrically connected thereto on the control relay 81 electrically connected thereto can be reduced or avoided, thereby improving the test accuracy and test safety.

[0038] In one example of the present application, the relay assembly 80 includes 60 control relays 81; every 10 control relays 81 are connected to one protection relay 82. Accordingly, when one protection relay 82 is in a disconnected state, the interference of the 50 control relays 81 not electrically connected to it on the 10 control relays 81 electrically connected to it can be reduced or avoided.

[0039] In an embodiment of the present application, at least one controller 20 is configured to control the current control relay 81 to open and control the next control relay 81 to close in turn when a preset time interval has passed since the closing time of the currently closed control relay 81, thereby controlling the test channel corresponding to the current control relay 81 to open and controlling the test channel corresponding to the next control relay 81 to open.

[0040] It should be understood that the controller 20 can also control the state switching of each of the control relays 81 in other ways, so that each of the control relays 81 is closed in sequence, and then each of the test channels is opened in sequence, so as to test each power supply 200 to be tested in sequence.

[0041] In an embodiment of the present application, the automatic inspection system for the low-light power supply environment test includes at least two controllers 20, the two controllers 20 are a lower-level programmable logic controller and an upper-level computer controller, the lower-level programmable logic controller is directly connected to the relay assembly 80, and is used to automatically control each of the control relays 81 in the relay assembly 80 to be closed or disconnected in sequence, so that the low-light power supply test device 10 detects each power supply 200 to be tested in sequence through the test channel, and then obtains test data; the upper-level computer controller can be communicatively connected to the lower-level programmable logic controller. Specifically, in an example of the present application, the upper-level computer controller can be communicatively connected to the lower-level programmable logic controller through a physical communication interface. It should be understood that in other examples, the upper-level computer controller can be communicatively connected to the lower-level programmable logic controller through other means, such as Bluetooth, WIFI. The upper-level computer controller is used to receive the test data obtained by the lower-level programmable logic controller. The upper-level computer controller can also record, print, and manage the test data. The upper computer controller can also record and manage the parameters or status of the lower computer controller 20 .

[0042] The automatic inspection system for the low-light power supply environment test also includes at least one display screen 30; at least one of the display screens 30 is connected to at least one of the controllers 20. At least one of the display screens 30 can be a touch display screen 30. In one example of the present application, the automatic inspection system for the low-light power supply environment test includes two display screens 30, one of which is directly connected to the lower-level programmable logic controller, and the other is directly connected to the upper-level computer controller; since the upper-level computer controller can be communicatively connected to the lower-level programmable logic controller, the test data can be displayed synchronously on the two display screens 30.

[0043] In summary, the automatic inspection system for the low-light power supply environment test based on the embodiment of the present application is explained. The automatic inspection system for the low-light power supply environment test can automatically inspect multiple low-light power supplies (i.e., the dedicated power supply for the low-light image intensifier) ​​to achieve batch detection of low-light power supplies. And the automatic inspection system for the low-light power supply environment test adopts a combined sensor testing technology, which can perform a comprehensive performance test on the low-light power supply (i.e., the dedicated power supply for the low-light image intensifier) ​​and measure multiple groups of low-light power supplies simultaneously.

[0044] The present application and its implementation methods are described above, and such description is not restrictive. The drawings show only one implementation method of the present application, and the actual structure is not limited thereto. In short, if ordinary technicians in the field are inspired by it and design structural methods and embodiments similar to the technical solution without creative design without departing from the inventive purpose of the present application, they should all fall within the protection scope of the present application.

Claims

1. An automatic inspection system for low-light power supply environmental test, used for automatic inspection of the power supply to be tested of the low-light image intensifier, characterized in that: include: A low-light power supply test device is used to detect the power supply to be tested of the low-light image intensifier; A high and low temperature environment test chamber, used to provide a test environment of corresponding temperature for the test of the low-light power supply test device; An automatic inspection electrical connection tool, comprising an electrical test electrical connection element and an environmental test chamber electrical connection element, wherein the electrical test electrical connection element is arranged on the low-light power supply test device, and is used to electrically connect the low-light power supply test device to the environmental test chamber electrical connection element; the environmental test chamber electrical connection element is arranged on the high-low temperature environmental test chamber, and is used to connect the high-low temperature environmental test chamber to the power supply to be tested, so that each power supply to be tested is suitable for forming a test channel with the low-light power supply test device and the high-low temperature environmental test chamber through the automatic inspection electrical connection tool; A relay assembly, comprising a plurality of control relays and at least one protection relay; wherein each of the control relays is connected to the electrical connection element of the environmental test chamber so as to be electrically connected to a corresponding test channel, and is used to control the opening and closing of the corresponding test channel; and each of at least two control relays is connected to one protection relay; At least one controller is connected to the relay assembly and is used to automatically control each of the control relays in the relay assembly to be closed or opened in sequence, so that the low-light power supply test device can detect each power supply to be tested in sequence through the test channel.

2. The automatic inspection system for low-light power supply environment test according to claim 1, wherein: The relay assembly includes 60 control relays.

3. The automatic inspection system for low-light power supply environment test according to claim 2, wherein: Every 10 control relays are connected to one protection relay.

4. The automatic inspection system for low-light power supply environment test according to claim 1, wherein: The low-light power supply test device includes: an anode high-voltage test module, a cathode voltage test module, an anode current test module, and a microchannel plate voltage test module; the anode high-voltage test module is configured to test the voltage of the anode of the power supply to be tested; the cathode voltage test module is configured to test the voltage of the cathode of the power supply to be tested; the anode current test module is configured to test the working current of the test channel; and the microchannel plate voltage test module is configured to test the output voltage of the power supply to be tested to the microchannel plate.

5. The automatic inspection system for low-light power supply environment test according to claim 4, wherein: The automatic inspection system for low-light power environment test also includes at least one power supply module, and the power supply module is configured to provide electric energy for the test of the low-light power test device.

6. The automatic inspection system for low-light power supply environment test according to claim 5, wherein: The electrical test electrical connection element includes a first power supply positive terminal, a first power supply negative terminal, a second power supply positive terminal, a second power supply negative terminal, a high voltage test terminal, a microchannel plate test terminal, and a cathode test terminal.

7. The automatic inspection system for low-light power supply environment test according to claim 1, wherein: At least one of the controllers is configured to control the current control relay to be opened and control the next control relay to be closed in sequence when a preset time interval has passed since the closing time of the currently closed control relay.

8. The automatic inspection system for low-light power supply environment test according to claim 1, wherein: The automatic inspection system for the low-light power supply environmental test includes at least two controllers, which are a lower-level programmable logic controller and an upper-level computer controller. The lower-level programmable logic controller is directly connected to the relay assembly, and is used to automatically control each control relay in the relay assembly to be closed or opened in sequence, so that the low-light power supply test device can detect each power supply to be tested in sequence through the test channel, and then obtain test data; the upper-level computer controller can be communicatively connected to the lower-level programmable logic controller, and is used to receive the test data obtained by the lower-level programmable logic controller.

9. The automatic inspection system for low-light power supply environment test according to claim 8, wherein: The automatic inspection system for low-light power supply environment test comprises at least one display screen, and at least one display screen is connected to at least one controller.

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