MOS open circuit detection method, device and equipment and storage medium

By detecting whether the MOS of the three-phase circuit of the E-modulation three-phase circuit is short-circuited, and detecting whether the three MOS is open-circuited one by one, using the calculation method of periodic pulse signal and phase current difference, the problems of inaccurate MOS open-circuit detection and damage to devices in the prior art are solved, and the accuracy and stability of detection are achieved.

CN119936735APending Publication Date: 2025-05-06SHENZHEN HOBBYWING TECH CO LTD
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Patent Information

Application Number
CN202411873669.1
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-12-18
Publication Date
2025-05-06

AI Technical Summary

Technical Problem

In the prior art, the MOS open circuit detection method has problems of inaccurate and unstable detection and the problem of damaging the MOS device.

Method used

By detecting whether the MOS of the three-phase circuit of the E-module circuit is short-circuited. If it is not short-circuited, it will detect whether the three-phase MOS of the E-module circuit is open one by one. The specific steps include turning on the AB phase circuit, disconnecting the BC and CA phase circuits, inputting a periodic pulse signal to the AB phase circuit, reading the phase current of phase A and B phases, calculating the phase current difference, and if the difference is greater than the current threshold, it is determined that MOS is open.

Benefits of technology

The accuracy and stability of MOS open circuit detection is achieved without damaging the MOS device.

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Abstract

The invention relates to an MOS open circuit detection method and device, equipment and a storage medium. The MOS open circuit detection method comprises the following steps: detecting whether the MOS of the electrically tunable three-phase circuit is short-circuited or not; if the MOS of the three-phase circuit of the electronic speed controller is not short-circuited, detecting whether the three MOS of the electronic speed controller is open-circuited one by one; wherein the step of detecting whether the MOS of the electronic speed controller AB phase circuit is open comprises the following steps of: conducting the AB phase circuit, and disconnecting the BC phase circuit and the CA phase circuit; a periodic pulse signal is input into the AB phase circuit; reading the phase current IA + of the phase A, and reading the phase current IB-of the phase B; subtracting the phase current IA + from the phase current IB-to obtain a phase current difference IA-B; and if the phase current difference IA-B is greater than the current threshold value I0, the MOS of the AB-phase circuit is normally conducted, otherwise, the MOS of the AB-phase circuit is in an open circuit. According to the invention, the problems of inaccurate and unstable detection and damage to the MOS device in the MOS open circuit detection method in the prior art are solved.
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Description

Technical Field

[0001] The present invention relates to the technical field of unmanned aerial vehicle (UAV) electrical adjustment detection, and in particular to a MOS open circuit detection method, device, equipment and storage medium. Background Art

[0002] In the UAV electronic control system, MOS devices are mainly used to control the speed and direction of the motor. Since the UAV may face various complex environments and working conditions during operation, MOS devices are easily damaged by factors such as vibration, high temperature, and overcurrent, resulting in abnormal driving, which in turn affects the flight stability and safety of the UAV. Therefore, before the UAV electronic control is operated, the MOS devices need to be tested.

[0003] Currently, the detection methods for MOS open circuit include MOS voltage detection and MOS current detection methods.

[0004] Regarding the MOS voltage detection method: Some drone electric control systems use the MOS voltage detection method to detect open-circuit faults in MOS devices. However, when an open-circuit fault occurs in the MOS lower bridge, the MOS cannot be pre-charged, resulting in insufficient driving voltage for the MOS upper tube, causing the MOS upper tube to lose control and the output not to execute as expected. In this case, even if the voltage detection method is used, it may not be possible to accurately determine whether the MOS device is open-circuited, thus posing a detection risk. In addition, due to the limited sensitivity of the voltage detection method, it may not be possible to accurately capture small voltage changes, further increasing the difficulty and uncertainty of detection.

[0005] For the MOS current detection method: the working state of the MOS device is determined by detecting the current. However, the common current detection method has the problem of small margin and is prone to false alarms. In addition, when the current is too large, it may also cause damage to the MOS device, further affecting the reliability and safety of the drone's electronic control. Summary of the invention

[0006] The object of the present invention is to provide a MOS open circuit detection method, device, equipment and storage medium to solve the problems of inaccurate and unstable detection and damage to MOS devices in the MOS open circuit detection method in the prior art.

[0007] The purpose of the present invention can be achieved through the following technical solutions:

[0008] A MOS open circuit detection method, comprising:

[0009] Check whether the MOS of the three-phase circuit of the electric regulator is short-circuited; if the MOS of the three-phase circuit of the electric regulator is not short-circuited, check whether the three MOS of the electric regulator are open-circuited one by one;

[0010] The step of detecting whether the MOS of the electrical control AB phase circuit is open includes:

[0011] The AB phase circuit is turned on and the BC and CA phase circuits are turned off;

[0012] Inputting a periodic pulse signal to the AB phase circuit;

[0013] Read the phase current I of phase A A+ , read the phase current I of phase B B- ;

[0014] The phase current I A+ With phase current I B- Subtract the phase current difference I A-B ;

[0015] If the phase current difference I A-B Greater than the current threshold I 0 , then the MOS of the AB phase circuit is normally turned on, otherwise the MOS of the AB phase circuit is open;

[0016] The steps of detecting whether the MOS of the electrical adjustment BC phase circuit and the electrical adjustment CA phase circuit are open are the same as the steps of detecting whether the MOS of the electrical adjustment AB phase circuit is open.

[0017] As a preferred implementation, the current threshold I 0 is an adaptive parameter.

[0018] As a preferred implementation, the current threshold I 0 Adaptively adjust according to the periodic pulse signal; the current threshold I 0 corresponds to the pulse width of the periodic pulse signal; the higher the voltage of the periodic pulse signal, the higher the current threshold I 0 The pulse width of the corresponding periodic pulse signal is narrower.

[0019] Another object of the present invention is to provide a MOS open circuit detection device, comprising:

[0020] MOS short-circuit detection and judgment module, detects whether the MOS of the three-phase circuit of the electric control is short-circuited;

[0021] MOS open circuit detection and judgment module, detects whether the three MOS of the ESC are open circuit one by one;

[0022] The MOS open circuit detection and judgment module includes: an electric adjustment circuit control unit, a periodic pulse signal input unit, a current acquisition unit, a current difference calculation unit and a MOS open circuit judgment unit;

[0023] When the MOS open circuit detection and judgment module detects whether the MOS of the AB phase circuit of the electric control is open circuit,

[0024] The electric control circuit control unit conducts the AB phase circuit and disconnects the BC and CA phase circuits;

[0025] A periodic pulse signal input unit inputs a periodic pulse signal to the AB phase circuit;

[0026] Current acquisition unit, reads the phase current I of phase A A+ , read the phase current I of phase B B- ;

[0027] The current difference calculation unit converts the phase current I A+ With phase current I B- Subtract the phase current difference I A-B ;

[0028] MOS open circuit judgment unit, if the phase current difference I A-B Greater than the current threshold I 0 , then the MOS of the AB phase circuit is normally turned on, otherwise the MOS of the AB phase circuit is open;

[0029] The process of the MOS open circuit detection and judgment module detecting whether the MOS of the electrical adjustment BC phase circuit and the electrical adjustment CA phase circuit are open circuit is consistent with the process of detecting whether the MOS of the electrical adjustment AB phase circuit is open circuit.

[0030] Another object of the present invention is to provide an electronic device, comprising:

[0031] processor, and

[0032] The memory stores executable codes, and when the executable codes are executed by the processor, the processor is enabled to execute the MOS open circuit detection method.

[0033] Another object of the present invention is to provide a computer-readable storage medium storing executable code, which, when executed by a processor of an electronic device, enables the processor to execute the MOS open circuit detection method.

[0034] Compared with the existing solutions, the present invention achieves the following beneficial effects:

[0035] The MOS open circuit detection method and the MOS open circuit detection device disclosed in the present invention are accurate and stable in detection and do not damage the MOS device. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in the present invention. For ordinary technicians in this field, other drawings can also be obtained based on these drawings.

[0037] Figure 1 is a flow chart of detecting whether the MOS of the electric adjustment AB phase circuit is open circuit according to an embodiment of the present invention;

[0038] Figure 2 is a current schematic diagram of the electric adjustment AB phase circuit in the embodiment of the present invention during normal conduction;

[0039] Figure 3 is a current schematic diagram of the electric control AB phase circuit of an embodiment of the present invention when the motor is in the freewheeling process;

[0040] Figure 4 is a structural schematic diagram of a MOS open circuit detection device according to an embodiment of the present invention;

[0041] Figure 5 It is a structural schematic diagram of a MOS open circuit detection and judgment module according to an embodiment of the present invention;

[0042] Figure 6 It is a schematic diagram of the structure of a computing electronic device according to an embodiment of the invention. DETAILED DESCRIPTION

[0043] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0044] In addition, the described features, structures or characteristics may be combined in one or more example embodiments in any suitable manner. In the following description, many specific details are provided to provide a full understanding of the example embodiments of the present disclosure. However, those skilled in the art will appreciate that the technical solutions of the present disclosure may be practiced while omitting one or more of the specific details, or other methods, components, steps, etc. may be adopted. In other cases, well-known structures, methods, implementations or operations are not shown or described in detail to avoid obscuring various aspects of the present disclosure.

[0045] The technical solution of the present invention is described below in conjunction with the accompanying drawings.

[0046] This embodiment provides a MOS open circuit detection method, including:

[0047] Check whether the MOS of the three-phase circuit of the electric regulator is short-circuited; if the MOS of the three-phase circuit of the electric regulator is not short-circuited, check whether the three MOS of the electric regulator are open-circuited one by one;

[0048] like Figure 1 As shown, the step of detecting whether the MOS of the electrical adjustment AB phase circuit is open includes:

[0049] The AB phase circuit is turned on and the BC and CA phase circuits are turned off;

[0050] Inputting a periodic pulse signal to the AB phase circuit;

[0051] Read the phase current I of phase A A+ , read the phase current I of phase B B- ;

[0052] The phase current I A+ With phase current I B- Subtract the phase current difference I A-B ;

[0053] If the phase current difference I A-B Greater than the current threshold I 0 , then the MOS of the AB phase circuit is normally turned on, otherwise the MOS of the AB phase circuit is open;

[0054] The steps of detecting whether the MOS of the electrical adjustment BC phase circuit and the electrical adjustment CA phase circuit are open are the same as the steps of detecting whether the MOS of the electrical adjustment AB phase circuit is open.

[0055] Combine the following Figure 2 , Figure 3 The process of detecting whether the MOS of the AB phase circuit of the electric control is open is as follows:

[0056] Through software control, the AB phase circuit is turned on and the BC and CA phase circuits are turned off. Figure 2 As shown, MOS tube Q1 and MOS tube Q4 are closed by software. At this time, the lower bridge arm of phase B is in an open state, and a periodic pulse signal is input to the AB phase circuit (that is, a periodic pulse signal is input to the upper bridge arm of phase A).

[0057] Read the phase current I of phase A A+ , read the phase current I of phase B B- It should be noted that the conduction of the AB phase circuit of the electronic control is divided into two processes:

[0058] like Figure 2 As shown, when the AB phase circuit of the electric control is in the normal conduction period, the current flows through the upper bridge arm of phase A through the motor. At this time, the current flowing through the upper bridge arm of phase A is a positive current I A+ (It is stipulated that the current flowing into the motor is positive and the current flowing out is negative); then it flows out through the lower bridge arm of phase B. At this time, a negative current I flows out of the lower bridge arm of phase B. B- (The flow into the motor is positive, and the flow out is negative). When the output pulse of the upper bridge of phase A is low, the motor will have a continuous flow process, such as Figure 3 As shown, the current flows out from the lower bridge arm of phase B of the motor, and then flows into the motor through the lower bridge arm of phase A to form a loop. At this time, a positive current I is formed in the upper bridge arm of phase A.A+ , phase B forms a negative current I B- .

[0059] The phase current I A+ With phase current I B- Subtract the phase current difference I A-B If the phase current difference I A-B Greater than the current threshold I 0 , the MOS of the AB phase circuit is normally turned on, otherwise the MOS of the AB phase circuit is open.

[0060] It should be noted that the steps of detecting whether the MOS of the electrically adjustable BC phase circuit and the electrically adjustable CA phase circuit are open are the same as the steps of detecting whether the MOS of the electrically adjustable AB phase circuit is open, and will not be repeated here.

[0061] It should be noted that the current threshold I 0 is an adaptive parameter. Current threshold I 0 Adaptive adjustment is performed according to the periodic pulse signal. Current threshold I 0 Corresponding to the pulse width of the periodic pulse signal. The higher the voltage of the periodic pulse signal, the higher the current threshold I 0 The narrower the pulse width of the corresponding periodic pulse signal.

[0062] In this embodiment, the current threshold I 0 Adaptive process: Taking AB phase conduction as an example, in the process of detecting whether the MOS of the AB phase circuit of the electric control is open:

[0063] First, the AB phase circuit is turned on, and the BC and CA phase circuits are turned off; then a periodic pulse signal is input to the AB phase circuit (i.e., a periodic pulse signal is applied to the upper bridge arm of the A phase, and at this time, the lower bridge arm of the B phase is in the normally open mode;);

[0064] The duty cycle of the periodic pulse signal starts with the minimum duty cycle (for example, the minimum duty cycle is 1%); it increases according to a certain duty cycle step (for example, the duty cycle step is 0.5%), and then the current IB- of the lower bridge arm of phase B is detected. If there is no current in the lower bridge arm of phase B, the duty cycle of the periodic pulse signal continues to increase; when the duty cycle of the periodic pulse signal increases to the maximum duty cycle (for example, the maximum duty cycle is 2%), if there is still no current in the lower bridge arm of phase B, it means that there is an open circuit in the upper bridge of phase A or the lower bridge of phase B; if the current of the lower bridge arm of phase B begins to increase during the increase of the duty cycle of the periodic pulse signal, it is determined whether the current of the lower bridge arm of phase B is greater than 0.1 times the rated current of the hardware MOS (of course, it can also be set to other multiples lower than 1); when the current of the lower bridge arm of phase B is greater than 0.1 times the rated current of the hardware MOS, the periodic pulse signal corresponding to the current of the lower bridge arm of phase B is used as a signal to detect whether the MOS of phases BC and CA are open; at the same time, the currently collected current is used as the current threshold I0 Detect whether the MOS of the other two phase bridges are open circuit. Because the difference between the AB phase current is the current threshold I 0 It is twice as high as the current threshold I, so it is easier to judge whether it is open circuit, and it is accurate, stable, and will not damage the MOS device. 0 The adaptive method can effectively detect different bus voltage conditions and different motors, adaptively identify the MOS open-circuit threshold current, and detect whether it is open-circuited.

[0065] like Figure 4 As shown, another object of the present invention is to provide a MOS open circuit detection device 10, comprising:

[0066] MOS short circuit detection and judgment module 100, detects whether the MOS of the three-phase circuit of the electric regulation is short-circuited;

[0067] The MOS open circuit detection and judgment module 200 detects whether the three MOS of the electric regulator are open circuit one by one.

[0068] like Figure 5 As shown, the MOS open circuit detection and judgment module includes: an electric adjustment circuit control unit, a periodic pulse signal input unit, a current acquisition unit, a current difference calculation unit and a MOS open circuit judgment unit;

[0069] When the MOS open circuit detection module detects whether the MOS of the AB phase circuit of the electric control is open circuit,

[0070] The electric adjustment circuit control unit 210 turns on the AB phase circuit and turns off the BC and CA phase circuits;

[0071] The periodic pulse signal input unit 220 inputs the periodic pulse signal to the AB phase circuit;

[0072] The current acquisition unit 230 reads the phase current I of phase A A+ , read the phase current I of phase B B- ;

[0073] The current difference calculation unit 240 calculates the phase current I A+ With phase current I B- Subtract the phase current difference I A-B ;

[0074] MOS open circuit determination unit 250, if the phase current difference I A-B Greater than the current threshold I 0 , then the MOS of the AB phase circuit is normally turned on, otherwise the MOS of the AB phase circuit is open;

[0075] The process of the MOS open circuit detection and judgment module detecting whether the MOS of the electric adjustment BC phase circuit and the electric adjustment CA phase circuit are open circuit is consistent with the process of detecting whether the MOS of the electric adjustment AB phase circuit is open circuit.

[0076] Another object of the present invention is to provide an electronic device, comprising:

[0077] processor, and

[0078] The memory stores executable codes, and when the executable codes are executed by the processor, the processor executes the MOS open circuit detection method.

[0079] like Figure 6 As shown, another embodiment of the present application shows a computing electronic device 300 including a memory 310 and a processor 320 .

[0080] The processor 320 can be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc.

[0081] A general purpose processor may be a microprocessor or the processor may be any conventional processor. The memory 320 may include various types of storage units, such as system memory, read-only memory (ROM), and permanent storage.

[0082] Among them, ROM can store static data or instructions required by processor 320 or other modules of the computer. The permanent storage device can be a readable and writable storage device. The permanent storage device can be a non-volatile storage device that does not lose the stored instructions and data even if the computer is powered off. In some embodiments, the permanent storage device uses a large-capacity storage device (such as a magnetic or optical disk, flash memory) as a permanent storage device.

[0083] In some other embodiments, the permanent storage device may be a removable storage device (e.g., a floppy disk, an optical drive). The system memory may be a read-write storage device or a volatile read-write storage device, such as a dynamic random access memory. The system memory may store some or all of the instructions and data required by the processor at run time.

[0084] In addition, memory 310 may include any combination of computer-readable storage media, including various types of semiconductor memory chips (eg, DRAM, SRAM, SDRAM, flash memory, programmable read-only memory), magnetic disks and / or optical disks may also be used.

[0085] In some embodiments, the memory 310 may include a removable storage device that can be read and / or written, such as a laser disc (CD), a read-only digital versatile disc (such as a DVD-ROM, a double-layer DVD-ROM), a read-only Blu-ray disc, an ultra-density optical disc, a flash memory card (such as an SD card, a mini SD card, and a Micro-SD card, etc.), a magnetic floppy disk, etc. Computer-readable storage media do not contain carrier waves and instantaneous electronic signals transmitted wirelessly or by wire. The memory 310 stores executable code, and when the executable code is processed by the processor 320, the processor 320 can execute part or all of the methods described above.

[0086] Another object of the present invention is to provide a computer-readable storage medium storing executable codes, which, when executed by a processor of an electronic device, enable the processor to execute a MOS open circuit detection method.

[0087] The MOS open circuit detection method and the MOS open circuit detection device disclosed in the present invention are accurate and stable in detection and do not damage the MOS device.

[0088] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0089] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the systems, devices and units described above can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0090] In the several embodiments provided in the present application, it should be understood that the disclosed systems, devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of the units is only some logical function divisions. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0091] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0092] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art who is familiar with the present technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims

1. A MOS open circuit detection method, characterized in that: include: Check whether the MOS of the three-phase circuit of the electric regulator is short-circuited; if the MOS of the three-phase circuit of the electric regulator is not short-circuited, check whether the three MOS of the electric regulator are open-circuited one by one; The step of detecting whether the MOS of the electrical control AB phase circuit is open includes: The AB phase circuit is turned on and the BC and CA phase circuits are turned off; Inputting a periodic pulse signal to the AB phase circuit; Read the phase current I of phase A A+ , read the phase current I of phase B B- ; The phase current I A+ With phase current I B- Subtract the phase current difference I A-B ; If the phase current difference I A-B If the current is greater than the current threshold I0, the MOS of the AB phase circuit is normally turned on, otherwise the MOS of the AB phase circuit is open; The steps of detecting whether the MOS of the electrical adjustment BC phase circuit and the electrical adjustment CA phase circuit are open are the same as the steps of detecting whether the MOS of the electrical adjustment AB phase circuit is open.

2. The MOS open circuit detection method according to claim 1, characterized in that: The current threshold I0 is an adaptive parameter.

3. The MOS open circuit detection method according to claim 2, characterized in that: The current threshold I0 is adaptively adjusted according to the periodic pulse signal; The current threshold I0 corresponds to the pulse width of the periodic pulse signal; the higher the voltage of the periodic pulse signal, the narrower the pulse width of the periodic pulse signal corresponding to the current threshold I0.

4. A MOS open circuit detection device, characterized in that: include: MOS short-circuit detection and judgment module, detects whether the MOS of the three-phase circuit of the electric control is short-circuited; MOS open circuit detection and judgment module, detects whether the three MOS of the ESC are open circuit one by one; The MOS open circuit detection and judgment module includes: an electric adjustment circuit control unit, a periodic pulse signal input unit, a current acquisition unit, a current difference calculation unit and a MOS open circuit judgment unit; When the MOS open circuit detection and judgment module detects whether the MOS of the AB phase circuit of the electric control is open circuit, The electric control circuit control unit conducts the AB phase circuit and disconnects the BC and CA phase circuits; A periodic pulse signal input unit inputs a periodic pulse signal to the AB phase circuit; Current acquisition unit, reads the phase current I of phase A A+ , read the phase current I of phase B B- ; The current difference calculation unit converts the phase current I A+ With phase current I B- Subtract the phase current difference I A-B ; MOS open circuit judgment unit, if the phase current difference I A-B If the current is greater than the current threshold I0, the MOS of the AB phase circuit is normally turned on, otherwise the MOS of the AB phase circuit is open; The process of the MOS open circuit detection and judgment module detecting whether the MOS of the electrical adjustment BC phase circuit and the electrical adjustment CA phase circuit are open circuit is consistent with the process of detecting whether the MOS of the electrical adjustment AB phase circuit is open circuit.

5. An electronic device, characterized in that: include: processor, and A memory stores executable codes, and when the executable codes are executed by the processor, the processor is caused to execute the MOS open circuit detection method according to any one of claims 1 to 3.

6. A computer-readable storage medium, characterized in that: An executable code is stored, and when the executable code is executed by a processor of an electronic device, the processor is caused to execute the MOS open circuit detection method as described in any one of claims 1 to 3.