Batch data acquisition method in part detection process

Abstract

The invention provides a batch data acquisition method in a part detection process, and relates to the technical field of industrial data batch data acquisition, and the method comprises the steps: firstly initializing a data index i and a data acquisition counter P, and initializing the data index i and the data acquisition counter P to 0; the method comprises the following steps of: waiting for time Ttime, eliminating data jitter when a test state enters a suspended state, acquiring to-be-tested data of a component, acquiring sampling data, performing median filtering on the sampling data, judging whether the data is in a test state or not according to a state threshold value Tstate, forming an acquisition sequence by the sampling data at the current moment and past P numerical values, extracting a maximum value and a minimum value in the sequence, calculating a mean value m of the maximum value and the minimum value, setting a data stability deviation threshold value Tdiversity, multiplying a sampling frequency by P, if a result is greater than the set threshold value T, determining that the section of data is effective test data, and otherwise, discarding the section of data; and outputting the stored effective test data, wherein the effective test data comprises the number of all the elements in the test and the test result.

Description

Technical Field

[0001] The present invention relates to the technical field of industrial data batch data collection, and in particular to a batch data collection method in a parts detection process. Background Art

[0002] In the production and procurement of parts, both upstream manufacturers and downstream purchasing companies will set up quality inspection departments to conduct sampling inspections on these parts to ensure that the quality of the parts meets the demand. In most cases, the inspection process is mainly completed by manually operated inspection instruments or instruments, and then the results are recorded in paper documents or manually entered on the computer. When it is necessary to inspect a large number of parts, because the base number is large, many times the inspectors only record whether they are qualified, but not the specific data, especially when facing the inspection of a large number of small objects, it is even impossible to record the specific number of defects. On the one hand, this will lead to the loss of inspection data, and on the other hand, it is easy to form information islands, which cannot provide data support for upper-level industrial applications. Summary of the invention

[0003] In view of the shortcomings of the prior art, the present invention provides a method for batch data collection in the process of component detection, and provides a method for online data collection when manually detecting materials. The problem currently faced by this method is that there are jitters, interrupted tests, repeated tests and other processes in the process of manually detecting components, and the detection instrument may also cause abnormal sampling data due to problems such as surges. The present invention needs to solve these problems based on sampling data to obtain accurate measurement component numbers and test results.

[0004] A method for batch data collection in a component inspection process comprises the following steps:

[0005] Step 1: Initialize data index i; the data index i represents the number or identification of the components to be tested;

[0006] Step 2: Initialize the data acquisition counter P to 0;

[0007] Step 3: Waiting time T time , eliminate the data jitter when the test state enters the suspended state;

[0008] Step 4: Collect the data of the components to be tested, obtain the sampled data and perform median filtering on the sampled data. status Determine whether the data is in the test state. If it is in the test state, go to step 5. If it is in the suspended state, repeat this step to continue sampling.

[0009] The test state is: the sampled data is within the state threshold setting range and is valid data;

[0010] The suspended state is: the sampled data is outside the state threshold setting range and is invalid data;

[0011] Step 5: Combine the current sampling data and the past P values ​​into a collection sequence, extract the maximum and minimum values ​​in the sequence, calculate the mean m of the two, and set the data stability deviation threshold T divation , m+T divation Set as the upper limit of the stable period area, and set mT divation Set as the lower limit of the stable period area;

[0012] Step 6: Determine whether the sampling data at the current moment is within the stable data range. If it is stable data, then P+1, save the data, and re-enter step 4, otherwise enter step 7;

[0013] Step 7: Multiply the sampling frequency by P. If the result is greater than the set threshold T, the data is valid test data, otherwise it is discarded.

[0014] Step 8: Get the mean of all test data of data index i and save it, and set the initial data acquisition counter P to 0; if the acquisition is completed, go to step 9, otherwise go to step 3 and update the data index i, i=i+1.

[0015] Step 9: Output the saved valid test data, which includes the quantity and test results of all components tested this time.

[0016] The beneficial effects of adopting the above technical solution are:

[0017] The present invention provides a method for collecting batch data during a parts inspection process. The method for collecting batch data during a parts inspection process provided by the present invention can automatically identify inspection data and save the collected data during the process of inspectors inspecting components. On the one hand, the method can help inspectors reduce data recording work. On the other hand, it can record the inspection results in more detail and save them in digital form to provide data support for other upper-level applications. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 A schematic diagram of the flow structure of the batch data collection method in the parts detection process provided by the present invention.

[0019] Figure 2 A schematic diagram of the logical structure of the batch data collection method in the parts detection process provided by the present invention when deployed.

[0020] Figure 3 A schematic diagram of the physical structure of the batch data collection method in the component detection process provided by the present invention when deployed.

[0021] Figure 4 A schematic diagram of the results of the batch data collection method in the component detection process provided by the present invention after filtering and identifying the test inductance data;

[0022] Among them, (a) is the original data image, and (b) is the result image after filtering and recognition. DETAILED DESCRIPTION

[0023] The specific implementation of the present invention is further described in detail below in conjunction with the accompanying drawings and examples. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0024] A batch data collection method in the process of component inspection is built on a digital measuring instrument. The measuring instrument needs to save or send all sampled data. Its logical structure is as follows: (1) the inspection instrument is the core; (2) the inspection instrument is manually operated to complete batch inspection of components; (3) the inspection instrument obtains inspection data at a relatively high sampling frequency, which can be collected and saved by a third-party edge device or saved locally in the inspection instrument; (4) the batch data collection method in the process of component inspection identifies the number of inspected components and the inspection results based on these data. The algorithm can be deployed inside the inspection instrument or in a third-party edge computing device. Its logical structure diagram and physical structure diagram are shown in the figure. Figure 2 , Figure 3 As shown;

[0025] The overall process structure diagram in this embodiment is as follows Figure 1 As shown, the specific steps include:

[0026] Step 1: Initialize data index i; the data index i represents the number or identification of the components to be tested;

[0027] Step 2: Initialize the data acquisition counter P to 0, which is used to calculate the number of sampling times when measuring the current component;

[0028] Step 3: Waiting time T time , eliminate the data jitter when the test state enters the suspended state;

[0029] Step 4: Collect the data of the components to be tested, obtain the sampled data and perform median filtering on the sampled data. status Determine whether the data is in the test state. If it is in the test state, go to step 5. If it is in the suspended state, repeat this step to continue sampling.

[0030] Step 5: Combine the current sampling data and the past P values ​​into a collection sequence, extract the maximum and minimum values ​​in the sequence, calculate the mean m of the two, and set the data stability deviation threshold T divation , m+Tdivation Set as the upper limit of the stable period area, and set mT divation Set as the lower limit of the stable period area;

[0031] Step 6: Determine whether the sampling data at the current moment is within the stable data range. If it is stable data, then P+1, save the data, and re-enter step 4, otherwise enter step 7;

[0032] Step 7: Multiply the sampling frequency by P. If the result is greater than the set threshold T, the data is valid test data, otherwise it is discarded.

[0033] Step 8: Get the mean of all test data of data index i and save it, and set the initialized data acquisition counter P to 0; if the acquisition is completed, go to step 9, otherwise go to step 3 and update the data index i, i=i+1.

[0034] Step 9: Output the saved valid test data, which includes the quantity and test results of all components tested this time;

[0035] like Figure 4 The figure shows the result diagram of the test inductance data after filtering and identification in this embodiment, where (a) is the original data diagram and (b) is the result diagram after filtering and identification. It can be seen that the batch data collection method in the component inspection process can save and calculate the component qualification rate and specific data for the inspector based on the above results, and can provide data support for other industrial applications.

[0036] The above description is only a preferred embodiment of the present disclosure and an explanation of the technical principles used. Those skilled in the art should understand that the scope of the invention involved in the embodiments of the present disclosure is not limited to the technical solutions formed by a specific combination of the above-mentioned technical features, but should also cover other technical solutions formed by any combination of the above-mentioned technical features or their equivalent features without departing from the above-mentioned inventive concept. For example, the above-mentioned features are replaced with the technical features with similar functions disclosed in the embodiments of the present disclosure (but not limited to) to form a technical solution.

Claims

1. A method for batch data collection in a component inspection process, characterized in that: The following steps are involved: Step 1: Initialize data index i; Step 2: Initialize the data acquisition counter P to 0; Step 3: Waiting time T time , eliminate the data jitter when the test state enters the suspended state; Step 4: Collect the data of the components to be tested, obtain the sampled data and perform median filtering on the sampled data. status Determine whether the data is in the test state. If it is in the test state, go to step 5. If it is in the suspended state, repeat this step to continue sampling. Step 5: Combine the current sampling data and the past P values ​​into a collection sequence, extract the maximum and minimum values ​​in the sequence, calculate the mean m of the two, and set the data stability deviation threshold T divation , and obtain the stable period area; Step 6: Determine whether the sampling data at the current moment is within the stable data range. If it is stable data, then P+1, save the data, and re-enter step 4, otherwise enter step 7; Step 7: Multiply the sampling frequency by P. If the result is greater than the set threshold T, the data is valid test data, otherwise it is discarded. Step 8: Get the mean of all test data of data index i and save it, and set the initialization data collection counter P to 0; Step 9: Output the saved valid test data.

2. The method for batch data collection in a component inspection process according to claim 1, characterized in that: The data index i in step 1 represents the number or identification of the components tested.

3. The method for batch data collection in a component inspection process according to claim 1, characterized in that: The test status described in step 4 is: the sampled data is within the set range of the state threshold and is valid data.

4. The method for batch data collection in a component inspection process according to claim 1, characterized in that: The suspended state in step 4 is: the sampled data is outside the setting range of the state threshold and is invalid data.

5. The method for batch data collection in a component inspection process according to claim 1, characterized in that: The stable period region in step 5 is specifically: m+T divation Set as the upper limit of the stable period area, and set mT divation Set to the lower limit of the stable period area.

6. The method for batch data collection in a component inspection process according to claim 1, characterized in that: In step 8, if the collection is completed, go to step 9, otherwise go to step 3 and update the data index i, i=i+1.

7. The method for batch data collection in a component inspection process according to claim 1, characterized in that: The effective test data described in step 9 includes the quantity and test results of all components tested this time.

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