Metrological demand analysis method based on MBSE and computer equipment

Abstract

The invention discloses an MBSE-based metrological demand analysis method and computer equipment, and the method comprises the steps: constructing a demand model of a complete machine level, taking a complete machine development total requirement demand list as the input, and obtaining an entries complete machine detection and calibration demand as the input of a demand model of a subsystem level; constructing a demand model of a subsystem level, obtaining entries of detection and calibration demands of the subsystem level, and taking the detection and calibration demands as demand model input of an equipment level; constructing a demand model of the equipment hierarchy, and obtaining detection and calibration demands of the entries of the equipment hierarchy; and performing integrated verification and logic verification on the demands of the whole machine, the subsystem and the equipment, completing metrological demand analysis if the verification is passed, and re-constructing the demand model of the whole machine level if the verification is not passed. According to the invention, the metering scheme of the equipment or the engineering product can be automatically realized, the detection and calibration demand information of the equipment or the engineering product is obtained, and the full life cycle of the equipment or the engineering product is prolonged.

Description

Technical Field

[0001] The present invention belongs to the field of system engineering methods and metrology, and in particular, relates to a metrology demand analysis method and computer equipment based on MBSE. Background Art

[0002] MBSE (Model-Based Systems Engineering) is an application modeling method that can support all requirements, design, analysis, inspection and verification work involved from the conceptual design stage of system engineering to the design, analysis, optimization process throughout the entire project and the subsequent engineering life cycle. Metrology refers to a design feature that equipment or engineering products can easily and fully determine their metrological characteristics, judge the accuracy and reliability of their values, and quickly implement detection and calibration in engineering. The level of metrology mainly depends on whether the designer has injected the metrology of the main technical indicators into the structural design during the design stage, and can even be pushed forward to whether the designer has considered the metrology of the main technical indicators during the scheme demonstration stage. Since the entire life cycle of equipment or engineering products is generally long, the accuracy of their measurement data cannot be maintained by the performance of the instrument itself for a long time, so the accuracy and reliability of the measurement data can only be guaranteed by metrology. Use a complete, reliable, and mature metrology technology system to support and ensure the accuracy of measurement data, and trace the value of the measurement system to ultimately ensure the unification of the value. However, the current MBSE design does not incorporate metrology requirements, so it is impossible to guarantee the accuracy of its measurement data and to conveniently and fully trace the value.

[0003] Take the design of a single instrument, a signal generator, as an example. In the previous design of signal generators, design requirements were proposed from the perspective of technical indicators, such as the output signal frequency range and amplitude range that the instrument needs to achieve, the spectral purity of the output signal, etc. These technical requirements are converted into models through modeling languages, and then the corresponding mainboard is designed through the model. After the prototype is made through material selection and other processes, it is tested and feedback is given on whether the technical indicators meet the design requirements. This process does not take into account the metrology of the signal generator, that is, in the design, it is not considered which parameters are tested by which detection or calibration equipment, whether the connection port is reserved for value traceability, whether the connection port meets the standard requirements, whether the connection port is convenient to access, etc. The design of the signal generator is only a relatively simple device design, but its design complexity increases after considering metrology. If it involves the metrology design of the entire platform, its design complexity will be greatly increased, and there are more mutually influential or constrained relationships, so it is difficult to adjust or iterate the design scheme. Summary of the invention

[0004] The purpose of the present invention is to provide a metrological requirements analysis method, computer equipment, computer-readable storage medium and computer program product based on MBSE, which can automatically implement the metrological plan of equipment or engineering products, obtain the equipment or engineering product detection and calibration requirements information, and extend the entire life cycle of equipment or engineering products.

[0005] In order to achieve the above object, one aspect of the present invention provides a quantitative demand analysis method based on MBSE, comprising:

[0006] Construct a three-level demand model of the whole machine, subsystem, and equipment to obtain itemized whole machine inspection and calibration requirements and itemized subsystem inspection and calibration requirements. The whole machine-level demand model takes the total requirements list of the whole machine development as input, the itemized whole machine inspection and calibration requirements are the output of the whole machine-level demand model and the input of the subsystem-level demand model, and the itemized subsystem inspection and calibration requirements are the output of the subsystem-level demand model and the input of the equipment-level demand model;

[0007] Among them, building a three-level demand model includes: identifying stakeholders of the demand; examining the system from a black box perspective and building a logical architecture; identifying contextual relationships and analyzing logical behaviors in combination with use cases; performing performance indicator analysis and establishing an inheritance relationship for performance indicators; starting from a white box perspective, gradually decomposing the items or parameters to be tested from the top level; defining the framework relationship and communication interface relationship between the items or parameters to be tested and the testing and calibration equipment, and improving the logical architecture of the system; capturing the performance indicator relationship between the items or parameters to be tested and the testing and calibration equipment; establishing the traceability relationship and verification relationship of the demand model;

[0008] The three-level demand models of the whole machine, subsystem and equipment are integrated and logically verified. If the verification passes, the quantitative demand analysis is completed. If the verification fails, based on the verification results, the demand model at the whole machine level is rebuilt.

[0009] Preferably, constructing a whole-machine-level demand model includes: taking a list of total requirements for whole-machine development as input to identify stakeholders of the demand; examining the system from a black-box perspective, constructing a logical architecture of the whole machine, and capturing stakeholder requirements through model analysis; identifying the contextual relationship of the whole machine based on the model, analyzing the logical behavior of the whole machine in combination with use cases, and improving the capture of stakeholder requirements; performing performance indicator analysis on the whole machine, and establishing an inheritance relationship from the whole machine to the container class value attributes of its performance indicators; starting from a white-box perspective, taking the measured items or parameters of the whole machine as the top-level functions, and gradually decomposing the measured items or parameters; defining the overall framework relationship and communication interface relationship between the measured items or parameters and the testing equipment and calibration equipment, and improving the system logical architecture; capturing the performance indicator relationship between the measured items or parameters of the whole machine and the testing equipment and calibration equipment, and obtaining itemized whole machine testing and calibration requirements; and establishing a traceability relationship for the whole-machine-level demand model.

[0010] Preferably, constructing a subsystem-level requirement model includes: taking the obtained itemized whole-machine inspection and calibration requirements as input, establishing a traceability relationship from subsystem requirements to stakeholder requirements; examining the system from a black box perspective and establishing a logical architecture of the subsystem; identifying the contextual relationship of the subsystem based on the model, analyzing the logical behavior of the subsystem in combination with the use case, and completing the capture of stakeholder requirements at the subsystem level; analyzing the performance indicators of the subsystem and establishing an inheritance relationship from the subsystem to its performance indicators; starting from a white box perspective, using the use case activity scenario function for analysis, and constructing the logical behavior of the subsystem; defining the relationship between the measured items or parameters and the system framework and communication interface of the inspection equipment and calibration equipment, and improving the logical architecture of the subsystem; capturing the relationship between the measured items or parameters of the subsystem and the performance indicators of the inspection equipment and calibration equipment, and obtaining itemized subsystem inspection and calibration requirements; and establishing a traceability relationship for the subsystem-level requirement model.

[0011] Preferably, constructing a device-level requirement model includes: using the obtained itemized subsystem detection and calibration requirements as input to establish a traceability relationship from device requirements to stakeholder requirements; examining the system from a black box perspective to establish the logical architecture of the device; identifying the contextual relationship of the device based on the model, analyzing the logical behavior of the device in combination with the use case, and capturing the stakeholder requirements of the device; analyzing the performance indicators of the device to establish an inheritance relationship from the device to its performance indicators; starting from a white box perspective, using the use case activity scenario function for analysis to construct the logical behavior of the device; defining the relationship between the items or parameters under test and the system framework and communication interface of the detection equipment and calibration equipment, and improving the logical architecture of the device; capturing the relationship between the items or parameters under test and the performance indicators of the detection equipment and calibration equipment, and obtaining the itemized detection and calibration requirements of the device; and establishing a traceability relationship for the device-level requirement model.

[0012] Preferably, the list of total requirements for the development of the whole machine includes the names of the whole machine, subsystems and equipment of the equipment or engineering product to be tested, the items or parameters to be tested, the scope of use or value, the allowable error in use, and the detection and calibration cycle.

[0013] Another aspect of the present invention provides a computer device, including a memory, a processor, and a computer program stored in the memory, wherein the processor executes the computer program to implement the steps of the above method.

[0014] Another aspect of the present invention provides a computer-readable storage medium having a computer program stored thereon, which implements the steps of the above method when executed by a processor.

[0015] Another aspect of the present invention provides a computer program product, comprising a computer program, which implements the steps of the above method when executed by a processor.

[0016] The MBSE-based metrology requirement analysis method, computer device, computer-readable storage medium and computer program product according to the above aspects of the present invention can automatically implement the metrology plan of equipment or engineering products, obtain the equipment or engineering product detection and calibration requirement information, and extend the entire life cycle of the equipment or engineering products. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solution of the present invention, the following briefly introduces the drawings used in the description of the embodiments of the present invention. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative work:

[0018] Figure 1 is a flow chart of a quantitative demand analysis method based on MBSE according to an embodiment of the present invention;

[0019] Figure 2 This is a schematic diagram of the whole machine requirements of an embodiment of the present invention;

[0020] Figure 3 is a schematic diagram of subsystem requirements of an embodiment of the present invention;

[0021] Figure 4 is a schematic diagram of equipment requirements for an embodiment of the present invention;

[0022] Figure 5 It is a structural diagram of a computer device according to an embodiment of the present invention. DETAILED DESCRIPTION

[0023] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0024] An embodiment of the present invention provides a method for analyzing metrological requirements based on MBSE. First, a three-level requirement model of a whole machine, a subsystem, and equipment is constructed to obtain itemized whole machine detection and calibration requirements and itemized subsystem detection and calibration requirements. The whole machine level requirement model takes the total requirement list of the whole machine development as input, the itemized whole machine detection and calibration requirements are the output of the whole machine level requirement model and the input of the subsystem level requirement model, and the itemized subsystem detection and calibration requirements are the output of the subsystem level requirement model and the input of the equipment level requirement model. Then, the three-level requirement models of the whole machine, subsystem, and equipment are integrated and logically verified. If the verification is passed, the metrological requirement analysis is completed. If the verification fails, based on the verification result, the whole machine level requirement model is returned and rebuilt.

[0025] Among them, building a three-level demand model includes: identifying stakeholders of the demand; examining the system from a black box perspective and building a logical architecture; identifying contextual relationships and analyzing logical behaviors in combination with use cases; performing performance indicator analysis and establishing an inheritance relationship for performance indicators; starting from a white box perspective, gradually decomposing the items or parameters to be tested from the top level; defining the framework relationship and communication interface relationship between the items or parameters to be tested and the testing and calibration equipment, and improving the system logical architecture; capturing the performance indicator relationship between the items or parameters to be tested and the testing and calibration equipment; and establishing traceability and verification relationships for the demand model.

[0026] Figure 1 FIG. 1 is a flow chart of a method for quantitative demand analysis based on MBSE according to an embodiment of the present invention. Figure 1 As shown, the MBSE-based quantitative demand analysis method of the embodiment of the present invention includes four parts: whole machine level demand model construction, subsystem level demand model construction, equipment level demand model construction, and three-level demand integration. Among them, the whole machine level demand model construction part includes steps S1 to S8, the subsystem level demand model construction part includes steps S9 to S16, the equipment level demand model construction part includes steps S17 to S24, and the three-level demand integration part includes step S25. Figure 1 The solid lines in the figure indicate the process path of demand analysis and identification, and the dotted lines indicate the tracking, copying, and tracing relationships within the hierarchy.

[0027] 1. Construction of demand model at the whole machine level

[0028] Step S1: Using the overall requirements list of the whole machine development as input, identify the stakeholders of the requirements. The requirements list may include: the whole machine, subsystem and equipment name of the equipment or engineering product to be tested; the items or parameters to be tested; the scope of use or value; the allowable error of use; the detection / calibration cycle, etc.

[0029] Step S2: Use SysML model elements to characterize and refine the overall development requirements, build them into individual elements, examine the system from a black box perspective, build the logical architecture of the whole machine, and capture stakeholder requirements through model analysis. The black box perspective is that the model analyzes and processes the existing data of the model to identify the requirements required for the logical architecture of the whole machine.

[0030] Step S3: Identify the contextual relationship of the whole machine based on the model, analyze the logical behavior of the whole machine in combination with the use case, and preliminarily improve the capture of stakeholder requirements.

[0031] Step S4: Analyze the performance indicators of the whole machine according to the measured items or parameters, usage range or value, and usage allowable error of the overall requirements for the development of the whole machine, and pass the value attributes to any hierarchical structure of the whole machine by establishing an inheritance relationship from the whole machine to the container class value attributes of its performance indicators.

[0032] Step S5: Further analyze the whole machine under test from a white box perspective, use the use case activity scenario model allocation function to take the items or parameters under test of the whole machine as the top-level functions, and gradually decompose the items or parameters under test.

[0033] Step S6: Define the overall framework relationship and communication interface relationship between the measured items or parameters and the testing equipment and calibration equipment, and improve the logical architecture construction.

[0034] Step S7: Capture the relationship between the tested items or parameters of the whole machine and the performance indicators of the testing equipment and calibration equipment to obtain itemized whole machine testing and calibration requirements.

[0035] Step S8: There are tracking relationships, copy relationships, and traceability relationships between elements at the whole machine level. The traceability relationship of the hierarchical model is established to achieve interaction between elements.

[0036] 2. Construction of demand model at subsystem level

[0037] Step S9: After Step S1-Step S7, the itemized whole machine inspection and calibration requirements can be obtained, which are also the requirements input of the next level, the subsystem. With the requirements of the subsystem as the input directory, a traceability relationship from the subsystem requirements to the requirements of stakeholders is established, that is, a traceability relationship that can achieve value traceability of the measured items or parameters, etc., which can better track the realization process of the requirements and form positive feedback. Analyze the stakeholders of the requirements.

[0038] Step S1O: Examine the system from a black box perspective, initialize the architecture analysis model, and establish the logical architecture of the subsystem. Capture stakeholder requirements.

[0039] Step S11: Identify the contextual relationship of the subsystem based on the model, analyze the logical behavior of the subsystem in combination with the use case, and preliminarily complete the capture of the needs of stakeholders at the subsystem level.

[0040] Step S12: Analyze the performance indicators of the subsystem according to the requirements of steps S9 to S11, and establish an inheritance relationship between the subsystem and its performance indicators.

[0041] Step S13: Starting from a white box perspective, use the use case activity scenario function for analysis, construct the logical behavior of the subsystem, analyze the change process of its working state in detail, and connect the functional activities of the entire subsystem in series through the internal behavior of the state, where the measured items or parameters serve as the top-level functions of this level.

[0042] Step S14: Define the system framework and communication interface relationship between the measured items or parameters and the detection equipment and calibration equipment, and improve the subsystem logical architecture. Construct the top-level solution architecture of the measured items or parameters, define the types, inheritance relationships, and connection relationships of each port module, and then construct the value traceability solution and cost control solution of the measured items or parameters of the subsystem. In principle, the interface model type is not changed to maintain consistency with the top-level structural design of the whole machine.

[0043] Step S15: Capture the relationship between the tested items or parameters of the subsystem and the performance indicators of the testing equipment and calibration equipment, and obtain the itemized testing and calibration requirements at the subsystem level.

[0044] Step S16: By tracking, copying, and tracing the relationship between elements at the subsystem level, a traceability relationship of the hierarchical model is established, the matching and integration of the ports are verified, and the iteration of the subsystem is realized.

[0045] 3. Construction of equipment-level demand model

[0046] Step S17: After Step S9-Step S15, the itemized subsystem-level inspection and calibration requirements can be obtained, which are also the input requirements of the next level, the equipment level. With the equipment requirements as the input directory, a traceability relationship from equipment requirements to stakeholder requirements is established, that is, a traceability relationship that can achieve value traceability of equipment measured items or parameters. Analyze the stakeholders of the requirements.

[0047] Step S18: Examine the system from a black box perspective, initialize the architecture analysis model, and establish the logical architecture of the device. Capture stakeholder requirements.

[0048] Step S19: Identify the contextual relationship of the device based on the model, analyze the logical behavior of the device in combination with the use case, and preliminarily capture the stakeholder needs of the device.

[0049] Step S20: Analyze the performance indicators of the device according to the requirements of steps S17 to S19, and establish an inheritance relationship between the device and its performance indicators.

[0050] Step S21: Starting from a white box perspective, use the use case activity scenario function for analysis, construct the logical behavior of the device, analyze in detail the change process of the device's logical working state, and connect the functional activities of the entire device in series through the internal behavior of the state, where the measured items or parameters serve as the top-level functions of this level.

[0051] Step S22: Define the system framework and communication interface relationship between the measured items or parameters and the test equipment and calibration equipment, and improve the logical architecture of the equipment. Construct the top-level solution architecture of the measured items or parameters, define the types, inheritance relationships, and connection relationships of each port module, and then construct the value traceability solution, cost control solution, and test / calibration cycle solution for the measured items or parameters of the equipment. In principle, the interface model type is not changed to maintain consistency with the top-level structural design of the whole machine and subsystem level.

[0052] Step S23: capturing the relationship between the measured items or parameters of the equipment and the performance indicators of the testing equipment and calibration equipment.

[0053] Step S24: By tracking, copying, and tracing the relationship between elements at the device level, the traceability relationship of the hierarchical model is established, the matching and integration of the ports are verified, and the iteration of the device is realized.

[0054] Step S25: The three-level demand analysis of the whole machine, subsystem and equipment is integrated and logically verified with each other, that is, the three-level demand is organically combined, constrained and traceable. If the verification is passed, the quantitative demand analysis is completed. If the verification fails, based on the verification result, return to step S1 and re-analyze the whole machine demand.

[0055] The following uses a simple device, a rubidium atomic frequency standard, as an example to perform a metrological requirement analysis based on the requirement of “outputting a standard 10 MHz frequency signal” to illustrate the requirement analysis process of the MBSE-based metrological requirement analysis method of an embodiment of the present invention.

[0056] The rubidium atomic frequency standard is a passive atomic frequency standard. The crystal oscillator generates a microwave excitation signal through frequency synthesis technology. The rubidium isotope atoms undergo transitions under the induction of the microwave excitation signal. The atomic transition signal and the microwave signal are discriminated to generate an error signal. The crystal oscillator frequency is controlled by the frequency-locked loop, so that the microwave frequency synthesized by the crystal oscillator is locked to the rubidium atomic transition frequency, and a high-stability signal is output. The rubidium atomic frequency standard consists of five subsystems: the excitation signal generation system, the atomic transition and frequency discrimination system, the frequency-locked loop control system, the signal output system, and the power supply and temperature control system. The excitation signal generation system consists of three devices: the crystal oscillator, the frequency synthesizer, and the excitation signal amplification and modulation module. The atomic transition and frequency discrimination system consists of two devices: the rubidium atomic cavity and the rubidium atomic discriminator. The frequency-locked loop control system consists of two devices: the frequency-locked loop controller and the servo circuit module. The signal output system consists of two devices: the signal amplifier and the signal distributor. The power supply and temperature control system consists of two devices: the power supply control module and the temperature control module.

[0057] Step S1: For the requirement of "outputting a standard 10MHz frequency signal", with subsequent analysis, more and more detailed requirement expressions will be refined. As the number of requirement expressions increases, the design will become more complex. Therefore, this example focuses on analyzing the requirements that mainly affect the quantitative design.

[0058] The input requirement of the whole machine is "output standard 10MHz frequency signal". The stakeholders identified by this requirement are R&D personnel, calibration personnel of metrology institutions and enterprise testers.

[0059] Step S2: Build the logical architecture of the whole machine and capture the stakeholders’ requirements as shown in Table 1.

[0060] Table 1 List of requirements of stakeholders of the whole machine

[0061]

[0062]

[0063] Step S3: Identify the context of the whole machine requirement, that is, connect the causal relationship and constraints of the demand elements through the use behavior or activity behavior, and analyze the whole machine logical behavior in combination with the use case to obtain the whole machine requirement diagram as shown in the figure. Figure 2 shown.

[0064] Step S4: Establish the performance index value attribute inheritance relationship of the whole machine. The role of performance index is to quantitatively describe the physical properties or functional properties of the target product. The subsequent verification process can also verify its design through performance index. Value attribute is used to store specific data values ​​in modeling tools, which can be either measurement or parameter.

[0065] Therefore, the functional requirement of the whole machine "output sinusoidal wave frequency signal." and the performance requirements "the signal frequency is 10MHz, with high frequency accuracy and good stability.", "the signal amplitude stability is good, and the amplitude is within the safe use range of the access calibration and testing equipment.", "the signal phase noise is low.", "the signal harmonic distortion is small." are converted into value attributes.

[0066] Step S5: Further analyze the requirements of the whole machine from a white box perspective, use the use case activity scenario model allocation function to take the tested items or parameters of the whole machine as the top-level function, and gradually decompose the tested items or parameters. Take the output 10MHz frequency signal activity as an example: enter the command "output 10MHz frequency signal". At this time, the rubidium atoms in the rubidium vapor chamber are excited to generate energy level transitions, generating a stable frequency f0 (the rubidium atom transition frequency is 6,834,682,612.8Hz±0.5Hz). The crystal oscillator generates a tunable frequency signal f, which is compared with the frequency f0 generated by the rubidium atom energy level transition to obtain a difference Δf. The crystal oscillator frequency f is adjusted through the frequency locking circuit to make it infinitely close to the frequency generated by the rubidium atom energy level transition, that is, Δf→0. Through the feedback mechanism, the frequency f is long-term stable at the rubidium atom transition frequency f0. Lock the high-frequency signal f, and perform frequency multiplication or frequency division processing through the electronic circuit to obtain a 10MHz frequency signal after processing. The processed 10MHz frequency signal is amplified by a buffer amplifier and output. At this time, the 10MHz signal output activity ends.

[0067] Step S6: Define the overall framework relationship and communication interface relationship between the measured items or parameters and the testing equipment and calibration equipment, and improve the logical architecture construction.

[0068] The output 10MHz frequency signal should be easily connected to calibration and testing equipment, including but not limited to frequency meters, oscilloscopes, phase noise analyzers, spectrum analyzers, etc. The ports of such equipment are mostly BNC interfaces, SMA interfaces, N-type interfaces, and TNC interfaces, and the port load is mostly 50Ω. The signal output port is constrained by the port and impedance, so the port impedance is designed to be a 50Ω load, and the port type is selected from BNC interface, SMA interface, N-type interface, and TNC interface.

[0069] Step S7: Capture the relationship between the tested items or parameters of the whole machine and the performance indicators of the testing equipment and calibration equipment.

[0070] According to the metrological requirements that have been captured and analyzed, the following information can be derived: output sine wave frequency signal, frequency is 10MHz, frequency accuracy is high and stability is good, amplitude stability is good and the amplitude is in line with the safe use range of access calibration and testing equipment, signal phase noise is low, signal harmonic distortion is small. The output frequency signal can be easily connected to calibration and testing equipment, the output port impedance is 50Ω, and the port type can be BNC interface, SMA interface, N-type interface, TNC interface.

[0071] Step S9: After executing steps S1 to S7, the whole machine itemized requirement of "outputting a standard 10MHz frequency signal" can be obtained, as shown in Table 2. Therefore, Table 2 is both the output of the whole machine level requirement model and the input of the subsystem level requirement model. Because the rubidium atomic frequency standard whole machine consists of five subsystems: excitation signal generation system, atomic transition and frequency discrimination system, frequency locking loop control system, signal output system, power supply and temperature control system, the subsystem level requirement model takes the excitation signal generation system as an example for demand analysis. Table 2 is an input catalog, which establishes a traceability relationship from the excitation signal generation system requirements to the stakeholder requirements.

[0072] Table 2 Requirements for the whole machine

[0073]

[0074]

[0075] Step S10: Examine the excitation signal generating system from a black box perspective, initialize the architecture analysis model, and establish the logical architecture of the excitation signal generating system, including the crystal oscillator frequency generating function, the crystal oscillator frequency synthesizing function, and the signal amplification and modulation function.

[0076] Step S11: Based on the model, the contextual relationship of the subsystem is identified, and the logical behavior of the subsystem is analyzed in combination with the use case, and the requirements of the stakeholders at the subsystem level are preliminarily captured to obtain the subsystem stakeholder requirements list shown in Table 3.

[0077] Table 3 List of requirements of subsystem stakeholders

[0078]

[0079] Step S12: Based on the information such as the measured items or parameters, usage range or value input in Table 2, and combined with the subsystem stakeholder requirements in Table 3, a performance indicator analysis is performed by establishing an inheritance relationship from the subsystem to its performance indicator.

[0080] The subsystems inherit the performance indicators of "waveform", "amplitude", "frequency" and "signal quality" of the whole machine respectively.

[0081] Step S13: Starting from the white box perspective, use the use case activity scenario function for analysis, construct the logical behavior of the subsystem, analyze the change process of its working state in detail, and connect the functional activities of the entire subsystem in series through the internal behavior of the state, where the measured items or parameters are the top-level functions of this level. Take the activity of the excitation signal generation system as an example: the crystal oscillator generates a tunable frequency signal, synthesizes the frequency signal into a frequency infinitely close to the frequency generated by the energy level transition of the rubidium atom, amplifies and modulates the frequency signal to a suitable state, and outputs the signal excitation.

[0082] Step S14: Construct the top-level solution architecture of the measured items or parameters and establish the subsystem logical architecture. Define the types, inheritance relationships, and connection relationships of each port module, and then construct the value traceability solution and cost control solution of the measured items or parameters of the subsystem. In principle, the interface model type is not changed to maintain consistency with the top-level structural design of the whole machine. The requirement diagram of the excitation signal generation system can be obtained as follows: Figure 3 shown.

[0083] Step S15: Capture the relationship between the tested items or parameters of the subsystem and the performance indicators of the testing equipment and calibration equipment.

[0084] According to the metrological requirements that have been captured and analyzed, the following information can be derived: the excitation signal waveform is a sine wave, the frequency accuracy is high and the stability is good, the amplitude stability is good and the amplitude accuracy meets the subsequent calculation requirements, the phase noise is low, and the harmonic distortion is small. The signal port impedance is 50Ω, and the port type can be BNC interface, SMA interface, N-type interface, TNC interface.

[0085] Step S17: After step S9-step S15, the itemized subsystem-level detection and calibration requirements can be obtained, as shown in Table 4, which is also the input of the next level, the equipment-level requirement model. The excitation signal generation system includes two devices: a crystal oscillator and a frequency synthesizer. Taking the crystal oscillator device as an example, capture and analyze the requirements. Enter the requirement catalog and establish a traceability relationship from the equipment requirements to the stakeholder requirements, that is, the traceability relationship that can achieve value traceability for the equipment measured items or parameters. Analyze the stakeholders of the requirements.

[0086] Table 4 Itemized requirements for stimulus signal generation system

[0087]

[0088]

[0089] Step S18: Examine the system from a black box perspective, initialize the architecture analysis model, and establish the logical architecture of the crystal oscillator device. The crystal oscillator is composed of crystal oscillators, capacitors, inductors and other components, and its working mechanism is divided into oscillation generation function, frequency stabilization and adjustment function, and signal shaping and output function.

[0090] Step S19: Identify the contextual relationship of the device based on the model, analyze the logical behavior of the device in combination with the use case, and preliminarily capture the stakeholder requirements of the device, as shown in Table 5.

[0091] Table 5 List of requirements of crystal oscillator equipment stakeholders

[0092]

[0093] Step S20: Analyze the performance indicators of the device according to the requirements of step S9 to step S11, by establishing an inheritance relationship between the device and its performance indicators.

[0094] The equipment inherits the performance indicators of "waveform", "amplitude", "frequency" and "signal quality" of the whole machine and subsystem respectively.

[0095] Step S21: Starting from the white box perspective, use the use case activity scenario function to analyze, construct the logical behavior of the device, analyze the change process of the device's logical working state in detail, and connect the functional activities of the entire device in series through the internal behavior of the state, where the measured items or parameters are the top-level functions of this level. Take the activities of the crystal oscillator device as an example: preheating of electronic components, stable oscillation of the voltage-controlled crystal oscillator, amplification, shaping and stabilization of the frequency signal, output of high-quality crystal oscillator frequency signal when the signal is stable, and when the signal is unstable, the internal feedback circuit of the crystal oscillator compensates for the influence of changes in external temperature, voltage, etc.

[0096] Step S22: Construct the top-level solution architecture of the measured items or parameters and establish the logical architecture of the device. Define the types, inheritance relationships, and connection relationships of each port module, and then construct the value traceability solution, cost control solution, and detection / calibration cycle solution for the measured items or parameters of the device. In principle, the interface model type is not changed to maintain consistency with the top-level structural design of the whole machine and subsystem level. The demand diagram of the crystal oscillator device can be obtained as follows: Figure 4 shown.

[0097] Step S23: capturing the relationship between the measured items or parameters of the equipment and the performance indicators of the testing equipment and calibration equipment.

[0098] Based on the captured and analyzed metrological requirements, the following information can be derived: the crystal oscillator signal waveform is a sine wave, the frequency accuracy is high and the stability is good, the amplitude stability is good and the amplitude accuracy meets the subsequent calculation requirements.

[0099] Obtain the itemized equipment testing and calibration requirements in Table 6.

[0100] Table 6 Itemization requirements for crystal oscillator equipment

[0101]

[0102]

[0103] Step S8, step S16, and step S24 can be performed by Figure 4 See the traceability relationship of requirements.

[0104] Step S25: The three-level demand analysis of the whole machine, subsystem and equipment is integrated and logically verified with each other, that is, the three-level demand is organically combined, constrained and traceable. If the verification is passed, the quantitative demand analysis is completed. If the verification fails, based on the verification result, return to step S1 and re-analyze the whole machine demand.

[0105] After analyzing the requirements of the three levels of rubidium atomic frequency standard system, excitation signal generation system and crystal oscillator equipment, the three-level requirements summary table 7 is obtained. After integration verification and logic verification, similar requirements are combined to obtain the requirements list table 8.

[0106] Table 7 Summary of three-level requirements

[0107]

[0108]

[0109] Table 8 Requirements list

[0110]

[0111]

[0112] If the initial requirements increase, the subsequent demand analysis will also be more detailed and more complicated. Therefore, MBSE is needed to record and standardize the analysis process. At the same time, the three-level model will make the demand analysis more detailed, try to avoid omissions, and improve the quantitative design of the whole machine from the basics.

[0113] According to the MBSE-based metrology requirement analysis method of the embodiment of the present invention, metrology is integrated into MBSE design. The concept that equipment or engineering product parameters can be accurately and quickly measured is injected into the design. The equipment or engineering product design incorporating metrology will ensure the accuracy of its measurement data, so that the equipment or engineering product parameters can be traced back to the highest national standards, which helps to extend the entire life cycle of the equipment or engineering product. MBSE can effectively solve the problems of complex and abstract models after the introduction of metrology, and can optimize the design scheme through rapid iteration.

[0114] An embodiment of the present invention further provides a computer device, which may be a server, and its internal structure diagram may be as shown in FIG. Figure 5As shown. The computer device includes a processor, a memory and a network interface connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store operating parameter data of each framework. The network interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, the steps of the method of the embodiment of the present invention are implemented.

[0115] Those skilled in the art will understand that Figure 5 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0116] An embodiment of the present invention further provides a computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the steps of the method of the embodiment of the present invention are implemented.

[0117] An embodiment of the present invention further provides a computer program product, including a computer program, which implements the steps of the method of the embodiment of the present invention when executed by a processor.

[0118] The above description is only by way of illustration of certain exemplary embodiments of the present invention. It is undoubted that those skilled in the art can modify the described embodiments in various ways without departing from the spirit and scope of the present invention. Therefore, the above drawings and descriptions are illustrative in nature and should not be construed as limiting the scope of protection of the claims of the present invention.

Claims

1. A quantitative demand analysis method based on MBSE, characterized in that: include: Construct a three-level demand model of the whole machine, subsystem, and equipment to obtain itemized whole machine inspection and calibration requirements and itemized subsystem inspection and calibration requirements. The whole machine-level demand model takes the total requirements list of the whole machine development as input, the itemized whole machine inspection and calibration requirements are the output of the whole machine-level demand model and the input of the subsystem-level demand model, and the itemized subsystem inspection and calibration requirements are the output of the subsystem-level demand model and the input of the equipment-level demand model; Among them, building a three-level demand model includes: identifying stakeholders of the demand; examining the system from a black box perspective and building a logical architecture; identifying contextual relationships and analyzing logical behaviors in combination with use cases; performing performance indicator analysis and establishing an inheritance relationship for performance indicators; starting from a white box perspective, gradually decomposing the items or parameters to be tested from the top level; defining the framework relationship and communication interface relationship between the items or parameters to be tested and the testing and calibration equipment, and improving the logical architecture of the system; capturing the performance indicator relationship between the items or parameters to be tested and the testing and calibration equipment; establishing the traceability relationship and verification relationship of the demand model; The three-level demand models of the whole machine, subsystem and equipment are integrated and logically verified. If the verification passes, the quantitative demand analysis is completed. If the verification fails, based on the verification results, the demand model at the whole machine level is rebuilt.

2. The method according to claim 1, characterized in that Building a whole-machine-level demand model includes: using the total demand list of whole-machine development as input to identify stakeholders; examining the system from a black-box perspective, building the logical architecture of the whole machine, and capturing stakeholder needs through model analysis; identifying the contextual relationship of the whole machine based on the model, analyzing the logical behavior of the whole machine in combination with use cases, and improving the capture of stakeholder needs; analyzing the performance indicators of the whole machine, and establishing an inheritance relationship from the whole machine to the container class value attributes of its performance indicators; starting from a white-box perspective, taking the measured items or parameters of the whole machine as the top-level functions, and gradually decomposing the measured items or parameters; defining the overall framework relationship and communication interface relationship between the measured items or parameters and the testing equipment and calibration equipment, and improving the system logical architecture; capturing the performance indicator relationship between the measured items or parameters of the whole machine and the testing equipment and calibration equipment, and obtaining the itemized whole machine testing and calibration requirements; and establishing a traceability relationship for the whole-machine-level demand model.

3. The method according to claim 2, characterized in that Constructing a subsystem-level requirement model includes: taking the obtained itemized whole-machine inspection and calibration requirements as input, establishing a traceability relationship from subsystem requirements to stakeholder requirements; examining the system from a black box perspective and establishing the logical architecture of the subsystem; identifying the contextual relationship of the subsystem based on the model, analyzing the logical behavior of the subsystem in combination with the use case, and completing the capture of stakeholder requirements at the subsystem level; analyzing the performance indicators of the subsystem and establishing an inheritance relationship from the subsystem to its performance indicators; starting from a white box perspective, using the use case activity scenario function for analysis, and constructing the logical behavior of the subsystem; defining the relationship between the measured items or parameters and the system framework and communication interface of the inspection equipment and calibration equipment, and improving the logical architecture of the subsystem; capturing the relationship between the measured items or parameters of the subsystem and the performance indicators of the inspection equipment and calibration equipment, and obtaining the itemized subsystem inspection and calibration requirements; and establishing a traceability relationship for the subsystem-level requirement model.

4. The method according to claim 3, characterized in that Building a device-level demand model includes: using the obtained itemized subsystem detection and calibration requirements as input, establishing a traceability relationship from device requirements to stakeholder requirements; examining the system from a black box perspective and establishing the logical architecture of the device; identifying the contextual relationship of the device based on the model, analyzing the logical behavior of the device in combination with the use case, and capturing the stakeholder requirements of the device; analyzing the performance indicators of the device and establishing an inheritance relationship from the device to its performance indicators; starting from a white box perspective, using the use case activity scenario function for analysis and constructing the logical behavior of the device; defining the relationship between the items or parameters under test and the system framework and communication interface of the detection and calibration equipment, and improving the logical architecture of the device; capturing the relationship between the items or parameters under test and the performance indicators of the detection and calibration equipment, and obtaining the itemized detection and calibration requirements of the device; and establishing a traceability relationship for the device-level demand model.

5. The method according to any one of claims 1 to 4, characterized in that The list of general requirements for the development of the whole machine includes the names of the whole machine, subsystems and equipment of the equipment or engineering product to be tested, the items or parameters to be tested, the scope of use or value, the allowable error in use, and the inspection and calibration cycle.

6. A computer device comprising a memory, a processor and a computer program stored in the memory, characterized in that: The processor executes the computer program to implement the steps of the method according to any one of claims 1 to 5.

7. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 5 are implemented.

8. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 5 are implemented.

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