Metallized film and film capacitor

Abstract

Provided is a metallized film capable of suppressing excessive operation of a fuse. A metallized thin film obtained by depositing a metal so as to form an insulating edge (40) at one end of a dielectric thin film (10) in the width direction, the metallized thin film being characterized by being provided with: divided electrodes (23a, 23b) formed by dividing the deposited metal (20) on the insulating edge (40) side by means of a slit-shaped non-deposited part (41); and fuses (24, 25, 26, 27) connected to the divided electrodes, a plurality of the divided electrodes being arranged in the width direction of the dielectric thin film (10), the divided electrodes in the first and second rows satisfying all of the following conditions [1]-[3] when viewed from the insulating edge (40) side: [1] the area is 15 mm2 or more; [2] more than four fuses are connected; and [3] each of the divided electrodes adjacent to each other is connected by a fuse.

Description

Technical Field

[0001] The present invention relates to a metallized film obtained by vapor-depositing a metal on a dielectric film and a film capacitor using the metallized film. Background Art

[0002] In a metallized film capacitor, when an insulation defect occurs, self-repair (self-recovery function) occurs, that is, current flows into the defective part and causes the deposited metal to heat up, and then the deposited metal around the defective part evaporates and scatters, thereby ensuring insulation. However, in this self-repair, since it is also necessary to deal with larger insulation defects that cannot be dealt with completely, a fuse mechanism is sometimes used. In the fuse mechanism, the deposited metal is divided by a slit-shaped non-evaporated part to form a plurality of split electrodes, and the split electrodes are connected to each other by a fuse. That is, a mechanism (self-protection function) is constructed to use the current flowing from other split electrodes toward the split electrode where the insulation defect occurs to cause the fuse to heat up and melt, thereby cutting off the defective part together with the split electrode. It should be noted that this fuse mechanism is currently the mainstream.

[0003] In order to ensure reliable insulation, capacitors such as recent automotive capacitors (e.g., capacitors for inverter smoothing of electric vehicles and hybrid electric vehicles) that are required to have strict safety are designed so that even a slight defect will cause the fuse to operate, and the defective part is cut off together with the split electrodes regardless of the size of the defect. Here, the "fuse operation rate" is used as an indicator of the ease of fuse operation. The fuse operation rate is the ratio of "the number of split electrodes cut by fuse operation" to "the number of split electrodes that have undergone self-repair", and as this fuse operation rate, designs that pursue approximately 100% are often seen (for example, see Patent Documents 1 and 2).

[0004] Prior art literature

[0005] Patent Literature

[0006] Patent Document 1: Japanese Patent Application Publication No. 2019-207931

[0007] Patent Document 2: Japanese Patent Application Publication No. 2020-025051 Summary of the invention

[0008] Technical problem to be solved by the invention

[0009] In a design that pursues a higher fuse operating rate, while insulation can be reliably ensured, if insulation defects occur, the split electrodes will be almost reliably cut off, resulting in a decrease in electrostatic capacitance by an amount corresponding to the cut split electrodes.

[0010] In order to suppress the reduction of electrostatic capacitance, it is also considered to divide the deposited metal into smaller parts and reduce the area of ​​each divided electrode. However, since the area of ​​the non-deposited part that divides the deposited metal increases, the effective electrode area decreases, resulting in a reduction in the initial capacitance of the entire capacitor.

[0011] Therefore, an object of the present invention is to provide a metallized film capable of suppressing excessive operation of a fuse.

[0012] Solutions for solving technical problems

[0013] In order to suppress excessive operation of the fuse, first, it is necessary to control the heat generated by the deposited metal caused by the current flowing into the defective part when an insulation defect occurs. Specifically, if the heat generated by the defective part is large, the scale of self-repair becomes larger. If the scale of self-repair is large, the current flowing through the fuse becomes larger, causing the heat generated by the fuse to increase. If the heat generated by the fuse is large, the fuse action rate increases. The inventors conducted in-depth research and the results showed that if the heat generated by the fuse can be suppressed to less than 30% of the heat generated by the defective part, the fuse action rate can be suppressed to less than 10%. In order to increase the heat generated by the defective part without increasing the heat generated by the fuse, it is preferred that all or most of the electrical energy required for self-repair is provided by the split electrode itself where the insulation defect occurs.

[0014] In addition, the ease with which the fuse operates varies depending on the location of the insulation defect. For example, since more current flows through the fuse closer to the insulation defect, there is a tendency for the fuse to operate more easily. In order to suppress excessive operation of the fuse caused by the positional deviation of such insulation defects, it is preferred to arrange the fuses as evenly as possible on the periphery of the split electrodes.

[0015] The metallized film of the present invention is a film that satisfies these conditions. That is, a metallized film obtained by vapor-depositing metal in a manner that forms an insulating edge 40 at one end of a dielectric film 10 in the width direction, characterized in that it comprises: split electrodes (23a, 23b) formed by splitting the vapor-deposited metal 20 on the insulating edge 40 side using a slit-shaped non-vapor-deposited portion 41; and fuses (24, 25, 26, 27) connected to the split electrodes, wherein a plurality of split electrodes are arranged in the width direction of the dielectric film 10, and the split electrodes in the first and second rows when viewed from the insulating edge 40 side satisfy all of the following conditions [1] to [3].

[0016] [1] Area: 15 mm 2 above;

[0017] [2] Four or more fuses are connected; and

[0018] [3] All adjacent divided electrodes are connected via one fuse.

[0019] In addition, it is preferable that all the divided electrodes satisfy all of the above conditions [1] to [3].

[0020] The film capacitor of the present invention is characterized by using the metallized film 2 described above.

[0021] Effects of the Invention

[0022] The metallized film and the film capacitor of the present invention are formed by making the area of ​​the divided electrodes in the first column and the second column 15 mm2 when viewed from the insulating edge 40 side. 2 In the above, the split electrode itself that has an insulation defect can provide all or most of the electric energy required for self-repair, and the electric energy supplied from other split electrodes via fuses can be eliminated or reduced. In addition, four or more fuses are connected to the split electrode, and the split electrode is connected to all the split electrodes adjacent to the split electrode via a fuse, so that the offset of the position where the fuse is set becomes smaller, and even if an insulation defect occurs in any part of the split electrode, it is possible to suppress the concentrated supply of electric energy required for self-repair from a specific fuse. As a result, excessive operation of the fuse can be suppressed. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 This is a cross-sectional view showing a part of a thin film capacitor according to an embodiment of the invention of this application.

[0024] Figure 2 It is a top view of a metallized film according to an embodiment of the present invention.

[0025] Figure 3 3 is a plan view showing the metallized film of Comparative Example 1.

[0026] Figure 4 It is a graph showing the VT test (capacitance change rate).

[0027] Figure 5 is a graph showing the results of the voltage step-up test, Figure 5 (A) shows the capacitance change rate with respect to voltage, Figure 5 (B) shows the value of insulation resistance relative to voltage.

[0028] Figure 6 This is a graph showing the relationship between the heat generated by the fuse / the heat generated by the defective portion and the fuse operation rate.

[0029] Figure 7 This is a circuit diagram of a model for calculating the heat generated by a fuse and the heat generated by a defective part.

[0030] Figure 8 is a graph showing the relationship between capacitor performance (potential gradient) and effective electrode area.

[0031] Fig. 9 It is a top view of a metallized film showing a modified example.

[0032] Fig.10 It is a top view of a metallized film showing another modified example. DETAILED DESCRIPTION

[0033] Next, the embodiment of the metallized film 2 of the present invention will be described in detail based on the accompanying drawings. Figure 1 As shown, the metallized film 2 is formed by forming a vapor-deposited metal 20 formed by vapor-depositing a metal such as aluminum or zinc on the surface of a dielectric film 10 made of a synthetic resin such as polypropylene (PP) or polyethylene terephthalate (PET). Figure 1 This is a schematic diagram, and the thickness of the dielectric film 10 and the vapor-deposited metal 20 are exaggerated. The actual thickness of the dielectric film 10 is, for example, 2 to 3 μm, and the actual thickness of the vapor-deposited metal 20 is, for example, 10 to 100 Å, which are extremely thin.

[0034] like Figure 2 As shown in FIG. 1 , the vapor-deposited metal 20 is provided to one end (the left end in the figure) of the dielectric film 10 in the width direction (hereinafter referred to as the film width direction). However, the other end (the right end in the figure) of the vapor-deposited metal 20 in the film width direction is not provided over the entire length of the dielectric film 10 in the length direction (hereinafter referred to as the film length direction). This is to prevent one vapor-deposited metal 20 from being connected to both of the two metal spray electrodes 30 provided at the two ends in the film width direction when the metallized film 2 is superimposed to manufacture the film capacitor 1 (see FIG. 1 ). Figure 1 ). It should be noted that, for the sake of convenience, the portion on one end side in the film width direction and connected to the metal sprayed electrode 30 is referred to as the connecting portion 21, and the non-evaporated portion on the other end side in the film width direction is referred to as the insulating edge 40.

[0035] The vapor-deposited metal 20 having the above structure is divided by the slit-shaped non-vapor-deposited portion 41. Specifically, the vapor-deposited metal 20 is divided by a plurality of first insulating slits 41a substantially parallel to the film length direction and a plurality of second insulating slits 41b substantially parallel to the film width direction.

[0036] Two first insulating slits 41a are provided in the film width direction. The width of the first insulating slit 41a is, for example, 0.05 to 0.5 mm. More preferably, it is 0.05 to 0.3 mm. The first insulating slit 41a located on the connection portion 21 side is provided at approximately the center in the film width direction, and divides the evaporated metal 20 into the connection portion side electrode 22 and the insulating edge side electrode 23. Another first insulating slit 41a divides the insulating edge side electrode 23 into two in the film width direction. The other first insulating slit 41a is not provided at the center of the first insulating slit 41a on the connection portion 21 side and the insulating edge 40, but is provided close to the insulating edge 40.

[0037] A plurality of second insulating slits 41b are provided in the length direction of the film. Moreover, the second insulating slits 41b divide the insulating edge side electrode 23 in the length direction of the film to form divided electrodes. It should be noted that the connecting portion side electrode 22 is not a divided electrode. The width of the second insulating slit 41b is, for example, 0.05 to 0.5 mm. More preferably, it is 0.05 to 0.3 mm. Regarding the second insulating slits 41b, a second insulating slit 41b that reaches the insulating edge 40 and a second insulating slit 41b that does not reach the insulating edge 40 are provided every other second insulating slit 41b. Thus, a plurality of first divided electrodes 23a and a plurality of second divided electrodes 23b are formed, respectively, wherein the first divided electrode 23a is located closest to the insulating edge 40 and is arranged in the length direction of the film, and is roughly rectangular in a plan view; the second divided electrode 23b is adjacent to the first divided electrode 23a in the width direction of the film, and is roughly rectangular in a plan view. The second divided electrode 23b is also arranged in the length direction of the film. Therefore, it can be said that a plurality of split electrodes are arranged in the film width direction and the film length direction. The first split electrode 23a is a rectangle that is longer in the film length direction, and the second split electrode 23b is a rectangle that is longer in the film width direction. It should be noted that it can be said that when viewed from the insulating edge 40 side, the first split electrode 23a is in the first column, and when viewed from the insulating edge 40 side, the second split electrode 23b is in the second column. The vapor deposition pattern is continuous in the film length direction.

[0038] However, an arbitrary first split electrode 23a is adjacent to two first split electrodes 23a in the film length direction and adjacent to two second split electrodes 23b in the film width direction. Moreover, an arbitrary first split electrode 23a is connected to the adjacent first split electrode 23a via the first fuse 24. In addition, the arbitrary first split electrode 23a is connected to the adjacent second split electrode 23b via the second fuse 25. This state can also be said to be: four fuses are connected to one first split electrode 23a. In addition, it can also be said that one first split electrode 23a is connected to all the split electrodes (first adjacent electrodes) adjacent to the one first split electrode 23a in the film width direction and the film length direction via one fuse respectively.

[0039] In addition, a certain arbitrary second split electrode 23b is adjacent to two second split electrodes 23b in the film length direction, and is adjacent to the connection portion side electrode 22 and one first split electrode 23a in the film width direction. Moreover, a certain arbitrary second split electrode 23b is connected to the adjacent second split electrode 23b via the third fuse 26. In addition, the arbitrary second split electrode 23b is connected to the adjacent connection portion side electrode 22 via the fourth fuse 27. Moreover, the arbitrary second split electrode 23b is connected to the adjacent first split electrode 23a via the second fuse 25. This state can also be said to be that four fuses are connected to one second split electrode 23b. In addition, it can also be said that one second split electrode 23b is connected to all the split electrodes (second adjacent electrodes) adjacent to the one second split electrode 23b in the film width direction and the film length direction via one fuse respectively.

[0040] The second, third, and fourth fuses 25, 26, and 27 are arranged so that when the lengths of the outer peripheries of the second segmented electrode 23b that are cut into four pieces by the four fuses in total are compared with each other, the length of the longest portion is three times or less the length of the shortest portion. For example, when the third fuse 26 is arranged at the approximate center in the film width direction of the second segmented electrode 23b, and the second and fourth fuses 25 and 27 are arranged at the approximate center in the film length direction of the second segmented electrode 23b, the length of the longest portion is one time the length of the shortest portion, that is, the lengths of the respective outer peripheries that are cut are equal to each other.

[0041] It should be noted that the fuse is preferably not a fuse disposed at a corner (also referred to as a corner or vertex) of the split electrode (so-called a corner fuse), but a fuse disposed at a side (above the slit) of the split electrode. In addition, the so-called fuse is a component that cuts off the split electrode from the current path, so as long as it is a component that has such an effect, its shape does not matter.

[0042] As can be seen from this, since [2] four or more fuses are connected to one split electrode, and [3] the split electrode is connected to all the split electrodes (adjacent electrodes) adjacent to the split electrode via one fuse, the deviation of the position where the fuse is set becomes smaller. Therefore, even if an insulation defect occurs in any part of the split electrode, it is possible to suppress the concentrated supply of electric energy required for self-repair from a specific fuse. As a result, excessive operation of the fuse can be suppressed.

[0043] In addition, the area of ​​the first segmented electrode 23a is set to 15 mm 2 The area of ​​the second segmented electrode 23b is also set to 15 mm 2 Thus, the area of ​​the split electrode is set to 15 mm by [1]. 2 As described above, the split electrode with insulation defects can provide all or most of the power required for self-repair. As a result, the power supplied from other split electrodes via the fuse can be eliminated or reduced. The area of ​​the first split electrode 23a is 3000mm 2 Below, preferably 2000mm 2 Below, more preferably 1000mm 2 Below, more preferably 200mm 2 The same applies to the second divided electrode 23b.

[0044] The width of the first fuse 24, the second fuse 25, the third fuse 26, and the fourth fuse 27 is, for example, 0.1 to 5 mm, and more preferably 0.1 to 0.5 mm.

[0045] Next, a comparison between a film capacitor using the metallized film of the present invention (Example 1) and a film capacitor using a conventional metallized film as a comparison object (Comparative Example 1) will be described.

[0046] The metallized film of Example 1 is Figure 2 The metallized film shown in the figure has a dielectric film made of polypropylene, a film thickness of 2.8 μm, and a film width of 25 mm. In addition, [1] when viewed from the insulating edge side, the areas of the first split electrode 23 a in the first column and the second split electrode 23 b in the second column are 32 mm 2, the areas are the same. In addition, [2] four fuses are connected to the first split electrode 23a and the second split electrode 23b, respectively. In addition, [3] the first split electrode 23a is connected to all the split electrodes (23a, 23b) adjacent to the first split electrode 23a through a fuse (24, 25), respectively. In addition, the second split electrode 23b is connected to all the split electrodes (23a, 23b) adjacent to the second split electrode 23b through a fuse (25, 26), respectively. In short, the conditions [1] to [3] are met. The rated voltage of Example 1 is 850V and the initial electrostatic capacitance is 80μF.

[0047] The metallized film of Comparative Example 1 is Figure 3 The raw materials, film thickness and film width of the metallized film and the dielectric film are the same as those of Example 1. On the other hand, the areas of the split electrodes in the first and second columns when viewed from the insulating edge side are 18 mm 2 In addition, when viewed from the insulating edge side, two fuses are connected to the split electrodes in the first column, and three fuses are connected to the split electrodes in the second column. In addition, the split electrodes in the first column are not connected to all the split electrodes adjacent to the split electrodes by a fuse (refer to Figure 3 : The split electrodes adjacent to each other in the film length direction are not connected by a fuse. In addition, the split electrode in the second column is not connected to all the split electrodes adjacent to the split electrode by a fuse (the split electrodes adjacent to each other in the film length direction are not connected by a fuse). In short, the conditions [1] to [3] are not satisfied. The fuse width and the fuse length (the width of the insulating slit) are the same as those in Example 1. The rated voltage of Comparative Example 1 is 850 V, which is equal to that of Example 1. The initial electrostatic capacitance is 80 μF, which is equal to that of Example 1.

[0048] ・Life test

[0049] The following life test was conducted: the capacitor was placed in a hot air circulation thermostat set at 105°C, a DC voltage (rated voltage: 850V) was applied, and after a predetermined time (e.g. 250, 500 hours, etc.) the capacitor was taken out, the temperature was set to room temperature, and the electrical characteristics such as electrostatic capacitance were measured, and the capacitor was placed in the thermostat again to restart the test. Figure 4 As shown in the figure, it can be seen that Example 1 has a life of about 1.7 times that of Comparative Example 1 at the rated voltage (the time until the electrostatic capacitance reaches -5% of the initial electrostatic capacitance). It should be noted that the reason why the capacitance decreases in Example 1 even at the rated voltage is that: due to multiple insulation defects in the same split electrode, the current flows through the fuse multiple times, which aggravates the durability degradation and eventually the fuse is activated.

[0050] ・Voltage boost test

[0051] The capacitor was placed in a hot air circulation thermostat set at 105°C and a DC voltage of 550V was applied for 1000 minutes. After the test, the capacitor was set to room temperature and the electrical characteristics such as electrostatic capacitance were measured. The capacitor was placed in the thermostat again and then tested at 650V. After that, the test and measurement were repeated by applying a voltage 100V higher than the previous step until the test at 1350V was completed. The results of Example 1 and Comparative Example 1 are shown in Table 1. Figure 5 As shown in Figure 5 As shown in (A), it can be seen that in Comparative Example 1, the electrostatic capacitance starts to decrease when the voltage is around 900 V. On the other hand, it can be seen that in Example 1, the electrostatic capacitance does not decrease until around 1050 V, and the rate of decrease of the electrostatic capacitance until around 1200 V is smaller than that of Comparative Example 1. Figure 5 As shown in (B), it can be seen that, since Example 1 is similar to Comparative Example 1 and no insulation breakdown occurs, the fuse operates stably in Example 1 as well.

[0052] Thus, in the film capacitor using the metallized film of the present invention, in an overvoltage region such as one that induces a large insulation defect, the fuse is operated to reliably cut off the defective segmented electrode. In addition, in the actual use region below the rated voltage where a large insulation defect is unlikely to occur, insulation is ensured by self-repair. As a result, both safety and electrostatic capacitance can be achieved.

[0053] ・Relationship between the heat generation of the fuse / heat generation of the defective part and the fuse operating rate

[0054] Figure 6 The figure shows the relationship between the heating value of the fuse / the heating value of the defective part and the fuse operation rate. As shown in the figure, it can be seen that in Example 1, the heating value of the fuse is less than 30% of the heating value of the defective part, and the fuse operation rate is suppressed to less than 10%. On the other hand, it can be seen that in Comparative Example 1, the heating value of the fuse is about 50~80% of the heating value of the defective part, which exceeds 30%, and the fuse operation rate is about 50~80%, which exceeds 10%.

[0055] It should be noted that the state in which a defective portion is generated in the split electrode is replaced with a circuit diagram to calculate the heating value of the fuse and the heating value of the defective portion. Figure 7As shown in FIG. 1 , first, the vapor deposition pattern is replaced with a circuit consisting of a capacitor C and a resistor R. Then, the current value flowing through each resistor R when a short circuit occurs in the capacitor on the far right of the figure is obtained by applying a DC voltage to the circuit under a DC power supply. Then, the calorific value is calculated based on these current values ​​and the resistance value of each resistor R. It should be noted that Figure 7 In the figure, C1 is the electrostatic capacitance of the split electrode (hereinafter referred to as the defective split electrode) forming the defective portion. C2 is the electrostatic capacitance of the split electrode (hereinafter referred to as the adjacent split electrode) connected to the defective split electrode via a fuse. R1 is the resistance value of the defective split electrode itself. R2 is the resistance value of the fuse connecting the defective split electrode and the adjacent split electrode. In addition, the solid arrow represents the current flowing from the defective split electrode to the defective portion, and the dotted arrow represents the current flowing from the adjacent split electrode to the defective split electrode via the fuse.

[0056] ・Relationship between capacitor performance (potential gradient) and effective electrode area

[0057] Figure 8 This is a graph showing the relationship between capacitor performance (potential gradient) and effective electrode area. As shown in the figure, when the potential gradient is about 300V / μm, in Example 1, the effective electrode area (ratio of the area of ​​the deposited metal to the dielectric film) is about 96%. On the other hand, in Comparative Example 1, it is about 92%, which shows that if the electrostatic capacitance is the same, it can be miniaturized compared with Comparative Example 1.

[0058] As mentioned above, although the specific embodiment of the present invention was described, the present invention is not limited to the above-mentioned embodiment, and can be implemented with various modifications within the scope of the present invention.

[0059] For example, in Figure 2 In the metallized film 2 shown, the split electrodes are provided only in the second column when viewed from the insulating edge 40 side, but they can also be provided in the third column and thereafter. For example, by providing three or more first insulating slits 41a, split electrodes in the third column and thereafter can be formed. Fig. 9 In the film, three first insulating slits 41a (N=3) are provided. Thus, the third (N) split electrodes 23c of the third (N) column are formed. In addition, all the split electrodes adjacent to the third (N) split electrodes 23c in the film width direction and the film length direction (third (N) adjacent electrodes) are defined. In addition, a fifth fuse 28 is formed to connect the third split electrodes 23c adjacent to each other in the film length direction, and a sixth fuse 29 is formed to connect the third split electrodes 23c and the connecting portion side electrode 22. Needless to say, the first split electrode 23a and the second split electrode 23b also satisfy the above conditions [1] to [3] in the third (N) split electrode 23c. Specifically, [1] The area is 15mm2 [2] connected to more than four fuses (27, 28, 29); and [3] connected to all adjacent split electrodes (all third (N) adjacent electrodes) through a fuse (27, 28) respectively. In short, all split electrodes meet the above conditions [1] to [3]. Therefore, even in Fig. 9 The metallized film 2, with Figure 2 The metalized film 2 shown can also suppress excessive operation of the fuse.

[0060] In addition, the number of fuses connected to one split electrode is four, but may be five or more. Fig.10 As shown, the insulating edge side electrode 23 can also be divided into: when viewed from the insulating edge 40 side, the shape of the divided electrodes 123 is a pentagon in the first row, a hexagon in the second row, and a pentagon in the third row; and the number of fuses 124 is changed to four in the first row, six in the second row, and five in the third row. It should be noted that in Fig.10 In the metalized film 2, the insulating edge-side electrode 23 is divided in the film width direction by the inclined insulating slit 141. In other words, the inclined insulating slit 141 functions as a first insulating slit 41a.

[0061] The connection side electrode 22 may be divided, for example, at a certain interval in the film length direction. It should be noted that the slit (specifically, the first insulating slit 41a) dividing the film in the film width direction and the deposited metal sandwiched between the insulating edge 40 are "divided electrodes", and even if the connection side electrode 22 is divided in the film length direction, it does not correspond to a "divided electrode".

[0062] As the connection portion 21, a so-called heavy edge using a vapor-deposited metal thicker than the split electrode may be used. As a method of overlapping a plurality of metallized films 2, in addition to simply stacking them, they may be overlapped by winding. In addition, a double-sided metallized film may be overlapped with a dielectric film 10 to form a film capacitor, wherein the double-sided metallized film is formed by forming vapor-deposited metal 20 on both sides of a dielectric film 10. Moreover, it is not necessary to overlap metallized films with the same vapor-deposited pattern, and metallized films with different vapor-deposited patterns may be combined to form a film capacitor.

[0063] In addition, the metallized film of the present invention further includes the following components. A metallized film comprising: a dielectric film; split electrodes deposited on the dielectric film; an insulating edge formed along one end of the dielectric film in the width direction; and a fuse, wherein the split electrodes are arranged in the width direction and the length direction of the dielectric film, and when the split electrodes located in the first column when viewed from the insulating edge side are set as first split electrodes, the split electrodes adjacent to the first split electrodes are set as first adjacent electrodes, and when the split electrodes located in the second column when viewed from the insulating edge side are set as second split electrodes, and the split electrodes adjacent to the second split electrodes are set as second adjacent electrodes, the first split electrodes satisfy all of the following conditions [1], [2], and [3A], and the second split electrodes satisfy all of the following conditions [1], [2], and [3B].

[0064] [1] Area: 15 mm 2 above;

[0065] [2] Four or more of the fuses are connected;

[0066] [3A] connected to all of the first adjacent electrodes via one of the fuses; and

[0067] [3B] All of the second adjacent electrodes are connected via one of the fuses.

[0068] Description of Reference Numerals

[0069] 1 Film capacitor

[0070] 2 metallized film

[0071] 10Dielectric film

[0072] 20 Evaporated Metal

[0073] 21Connection

[0074] 22Connection side electrode

[0075] 23 Insulation edge side electrode

[0076] 23a First segmentation electrode

[0077] 23b Second segmentation electrode

[0078] 23c Third segmentation electrode

[0079] 24 First Fuse

[0080] 25 Second fuse

[0081] 26 Third fuse

[0082] 27 Fourth Fuse

[0083] 28 Fifth Fuse

[0084] 29 Sixth Fuse

[0085] 30 Metal Spraying Electrode

[0086] 40 Insulation Edge

[0087] 41 Non-evaporation department

[0088] 41a First insulating slit

[0089] 41b Second insulating slit

[0090] 123 split electrode

[0091] 124 Fuse

[0092] 141 Insulation slits.

Claims

1. A metallized film obtained by evaporating metal so as to form an insulating edge at one end in the width direction of a dielectric film, comprising: a split electrode formed by splitting the deposited metal on the insulating edge side by a slit-shaped non-deposited portion; and A fuse connected to the split electrode, A plurality of the split electrodes are arranged in a width direction of the dielectric film. The split electrodes in the first and second columns when viewed from the insulating edge side meet all of the following conditions [1] to [3]: [1] Area: 15 mm 2 above; [2] Four or more of the fuses are connected; and [3] All the adjacent divided electrodes are connected via one of the fuses.

2. The metallized film according to claim 1, wherein: All of the split electrodes satisfy all of the above conditions [1] to [3].

3. A film capacitor using the metallized film according to claim 1 or 2.

Images