Detection method, system, electronic device and storage medium of differential crystal oscillator

Abstract

The present invention provides a differential crystal oscillator detection method, system, electronic device, and storage medium, relating to the technical field of oscillator detection. The method is based on a differential crystal oscillator detection device, comprising a network analyzer, a test board, a digital electric meter, and a data processing device. The differential crystal oscillator detection method includes: applying a preset power signal to the differential crystal oscillator via the network analyzer, and obtaining the oscillator's electrical performance parameter values ​​based on the network analyzer; supplying the differential crystal oscillator with a rated voltage, switching the differential crystal oscillator's output frequency via the test board; applying a preset test current to the differential crystal oscillator's detection pin via the test board using the digital electric meter to obtain the oscillator's microcurrent parameter value; and obtaining the oscillator anomaly detection results via the data processing device. The present invention improves the accuracy of differential crystal oscillator anomaly detection.

Description

Technical Field

[0001] The present invention relates to the technical field of oscillator detection, and in particular to a detection method, system, electronic device and storage medium for a differential crystal oscillator. Background Art

[0002] Differential crystal oscillators play a crucial role in modern electronic systems, enabling them to quickly and uniformly transmit collected information to a controller for data processing. Promptly detecting problems with differential crystal oscillators, identifying and fixing potential issues, and thus avoiding system failures caused by oscillator malfunctions, is an effective measure to ensure their proper operation.

[0003] Currently, the main method for testing differential crystal oscillators is to determine product problems through the accuracy of room temperature or high and low temperature frequency, current consumption and waveform shape. The detection method is single and it is difficult to identify tiny leakage current defects of differential crystal oscillators. Summary of the Invention

[0004] The present invention aims to solve at least one of the above problems.

[0005] To solve the above problems, the present invention provides a detection method, system, electronic device and storage medium for a differential crystal oscillator.

[0006] In a first aspect, the present invention provides a detection method for a differential crystal oscillator.

[0007] A detection device based on a differential crystal oscillator includes a network analyzer, a test board, a digital electric meter, and a data processing device. The network analyzer is used to connect to the differential crystal oscillator, the test board is used to connect to the differential crystal oscillator and the digital electric meter respectively, and the data processing device is connected to the network analyzer and the digital electric meter respectively. The detection method of the differential crystal oscillator includes:

[0008] After applying a signal of preset power to the differential crystal oscillator through the network analyzer, obtaining an electrical performance parameter value of the oscillator according to the network analyzer, and sending the electrical performance parameter value of the oscillator to the data processing device;

[0009] supplying rated voltage to the differential crystal oscillator, switching the output frequency of the differential crystal oscillator through the test board, detecting oscillator circuit parameter values ​​through the output end of the test board, and sending the oscillator circuit parameter values ​​to the data processing device;

[0010] Applying a preset test current to the detection pin of the differential crystal oscillator through the test board according to the digital electric meter to obtain a micro-current parameter value of the oscillator, and sending the micro-current parameter value of the oscillator to the data processing device;

[0011] The data processing device obtains an oscillator abnormality detection result according to the oscillator electrical performance parameter value, the oscillator circuit parameter value and the oscillator micro-current parameter value.

[0012] Optionally, the preset power includes a preset initial low power, a preset minimum power, and a preset maximum power; the oscillator electrical performance parameter value includes a first network analyzer parameter value and a second network analyzer parameter value; and after applying a preset power signal to the differential crystal oscillator through the network analyzer, obtaining the oscillator electrical performance parameter value according to the network analyzer includes:

[0013] After applying the preset initial low-power signal to the differential crystal oscillator through the network analyzer, obtaining the first network analyzer parameter value according to the network analyzer;

[0014] The preset initial low power is:

[0015] ,

[0016] Wherein, Power is the preset initial low power, dBm is the crystal power of the differential crystal oscillator, and RR is the crystal equivalent impedance of the differential crystal oscillator;

[0017] After the preset minimum power signal and the preset maximum power signal are respectively applied to the differential crystal oscillator through the network analyzer, the second network analyzer parameter value is obtained according to the network analyzer.

[0018] Optionally, the network analyzer is provided with a high-frequency crystal resonator capacitor; the first network analyzer parameter values ​​include the crystal resonator frequency, the crystal resonator equivalent impedance, the crystal resonator static capacitance, the crystal resonator dynamic capacitance, and the crystal resonator dynamic inductance; and obtaining the first network analyzer parameter values ​​according to the network analyzer includes:

[0019] performing at least two data scans within a preset frequency range according to the network analyzer to obtain a scan data set, and fitting the scan data set to obtain the crystal resonator frequency, wherein the preset frequency range includes the crystal resonator frequency;

[0020] Obtaining the equivalent impedance of the crystal resonator at the resonance point of the crystal resonator according to the network analyzer;

[0021] Performing at least two data scans within a preset capacitance value range based on the high-frequency crystal resonator capacitance of the network analyzer to obtain the static capacitance of the crystal resonator, wherein the preset capacitance value range includes the crystal resonator capacitance;

[0022] The inductance is calculated based on at least two lowest resonance point frequencies and impedance changes obtained by the network analyzer, and the dynamic capacitance and the dynamic inductance of the crystal resonator are obtained by calculating the inductance based on the lowest resonance point frequencies and the impedance changes.

[0023] Optionally, the second network analyzer parameter value includes a maximum difference in equivalent impedance and a maximum difference in resonant frequency, and obtaining the second network analyzer parameter value according to the network analyzer includes:

[0024] Obtaining the lowest resonance point equivalent impedances corresponding to the preset minimum power and the preset maximum power respectively according to the network analyzer, and obtaining the maximum difference of the equivalent impedances through the two lowest resonance point equivalent impedances;

[0025] The lowest resonance point resonant frequencies corresponding to the preset minimum power and the preset maximum power are obtained according to the network analyzer, and the maximum difference in the resonant frequencies is obtained through the two lowest resonance point resonant frequencies.

[0026] Optionally, the detection pins include a crystal oscillator power input pin, a crystal oscillator ground pin, a crystal oscillator enable pin, a crystal oscillator differential positive pin, a crystal oscillator differential negative pin, a crystal oscillator resonator input pin, and a crystal oscillator resonator output pin; the oscillator micro-current parameter value includes a first pin-to-pin resistance, a second pin-to-pin resistance, a third pin-to-pin resistance, a fourth pin-to-pin resistance, a fifth pin-to-pin resistance, and a sixth pin-to-pin resistance; and the oscillator micro-current parameter value is obtained by applying a preset test current to the detection pins of the differential crystal oscillator through the test board according to the digital ammeter, including:

[0027] Applying the preset test current to the power input pin of the crystal oscillator and the ground pin of the crystal oscillator through the test board according to the digital electric meter to obtain the resistance between the first pins;

[0028] applying the preset test current to the crystal oscillator enable pin and the crystal oscillator ground pin through the test board according to the digital ammeter to obtain the second inter-pin resistance;

[0029] Applying the preset test current to the differential positive pin of the crystal oscillator and the ground pin of the crystal oscillator through the test board according to the digital electric meter to obtain the resistance between the third pins;

[0030] Applying the preset test current to the differential negative pin of the crystal oscillator and the ground pin of the crystal oscillator through the test board according to the digital electric meter to obtain the resistance between the fourth pins;

[0031] Applying the preset test current to the crystal oscillator resonator input pin and the crystal oscillator ground pin through the test board according to the digital electric meter to obtain the resistance between the fifth pins;

[0032] The digital ammeter applies the preset test current to the crystal oscillator resonator output pin and the crystal oscillator ground pin through the test board to obtain the sixth inter-pin resistance.

[0033] Optionally, the oscillator circuit parameter values ​​include differential output positive end frequency, differential output negative end frequency, positive and negative end frequency difference, power supply current consumption value, crystal oscillator standby current, minimum voltage level, maximum voltage level, low level rise time, high level fall time and duty cycle. Switching the output frequency of the test board and obtaining the oscillator circuit parameter values ​​using the test board includes:

[0034] The test board is used to switch the output frequencies of the differential positive terminal pin of the crystal oscillator and the differential negative terminal pin of the crystal oscillator, and the test board is used to detect the output signal of the differential crystal oscillator to obtain the differential output positive terminal frequency, the differential output negative terminal frequency, the positive and negative terminal frequency difference, the power supply current consumption value, the crystal oscillator standby current, the minimum voltage level, the maximum voltage level, the low level rise time, the high level fall time and the duty cycle.

[0035] Optionally, obtaining the oscillator abnormality detection result according to the oscillator electrical performance parameter value, the oscillator circuit parameter value, and the oscillator micro-current parameter value by the data processing device includes:

[0036] Obtaining a standard deviation value by the data processing device according to the oscillator electrical performance parameter value, the oscillator circuit parameter value, the oscillator micro current parameter value and a differential crystal oscillator standard threshold value;

[0037] The oscillator abnormality detection result is obtained by comparing the standard deviation value with a preset difference range.

[0038] In a second aspect, the present invention provides a differential crystal oscillator detection system, based on a differential crystal oscillator detection device, the differential crystal oscillator detection device comprising a network analyzer, a test board, a digital meter, and a data processing device, the network analyzer being connected to the differential crystal oscillator, the test board being connected to the differential crystal oscillator and the digital meter, respectively, and the data processing device being connected to the network analyzer and the digital meter, respectively; the differential crystal oscillator detection system comprising:

[0039] a network component measurement module, configured to obtain electrical performance parameter values ​​of the oscillator according to the network analyzer after applying a signal of preset power to the differential crystal oscillator through the network analyzer, and send the electrical performance parameter values ​​of the oscillator to the data processing device;

[0040] an oscillator circuit measurement module, configured to supply rated voltage to the differential crystal oscillator, switch the output frequency of the differential crystal oscillator through the test board, detect oscillator circuit parameter values ​​through the output end of the test board, and send the oscillator circuit parameter values ​​to the data processing device;

[0041] a micro-current measurement module, configured to apply a preset test current to the detection pin of the differential crystal oscillator via the test board according to the digital ammeter to obtain a micro-current parameter value of the oscillator, and send the micro-current parameter value of the oscillator to the data processing device;

[0042] The oscillator abnormality detection result acquisition module is used to obtain the oscillator abnormality detection result according to the oscillator electrical performance parameter value, the oscillator circuit parameter value and the oscillator micro-current parameter value through the data processing device.

[0043] In a third aspect, the present invention provides an electronic device comprising a memory and a processor;

[0044] The memory is used to store computer programs;

[0045] The processor is configured to implement the differential crystal oscillator detection method as described in the first aspect when executing the computer program.

[0046] In a fourth aspect, the present invention provides a computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, the detection method of the differential crystal oscillator as described in the first aspect is implemented.

[0047] The differential crystal oscillator detection method, device, electronic device, and storage medium of the present invention have the following beneficial effects: after applying a preset power signal to the differential crystal oscillator via a network analyzer, the oscillator's electrical performance parameter values ​​are obtained from the network analyzer to confirm the compliance of various parameters of the crystal oscillator's chip oscillator at low power, preventing the long-term performance degradation caused by some parameters reaching lower limits while functional tests are normal at low power. The differential crystal oscillator is powered by a rated voltage, and the output frequency of the differential crystal oscillator is switched via the test board. Two-way frequency and waveform detection are performed, and the oscillator circuit parameter values ​​are detected via the output of the test board. A digital ammeter applies a preset test current to the differential crystal oscillator's detection pin via the test board to obtain the oscillator's micro-current parameter value, thereby detecting micro-defects in the internal integrated current. A data processing device then obtains an oscillator anomaly detection result based on the oscillator's electrical performance parameter values, oscillator circuit parameter values, and oscillator micro-current parameter values, enabling identification of micro-leakage current defects in semiconductors and improving the accuracy of differential crystal oscillator anomaly detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0048] Figure 1 Schematic diagram of a detection device for a differential crystal oscillator according to an embodiment of the present invention;

[0049] Figure 2 1 is a flow chart of a detection method for a differential crystal oscillator according to an embodiment of the present invention;

[0050] Figure 3 Schematic diagram of the structure of a detection system for a differential crystal oscillator according to an embodiment of the present invention;

[0051] Figure 4 The figure is a schematic structural diagram of an electronic device according to an embodiment of the present invention. DETAILED DESCRIPTION

[0052] To make the above-mentioned objects, features, and advantages of the present invention more clearly understood, specific embodiments of the present invention are described in detail below with reference to the accompanying drawings. Although certain embodiments of the present invention are shown in the accompanying drawings, it should be understood that the present invention can be implemented in various forms and should not be construed as being limited to the embodiments described herein. Instead, these embodiments are provided to provide a more thorough and complete understanding of the present invention. It should be understood that the drawings and embodiments of the present invention are for illustrative purposes only and are not intended to limit the scope of protection of the present invention.

[0053] It should be understood that the various steps described in the method embodiments of the present invention may be performed in different orders and / or in parallel. In addition, the method embodiments may include additional steps and / or omit the steps shown. The scope of the present invention is not limited in this respect.

[0054] The term "including" and its variations used in this document are open inclusions, that is, "including but not limited to"; the term "based on" means "based at least in part on"; the term "one embodiment" means "at least one embodiment"; the term "another embodiment" means "at least one other embodiment"; the term "some embodiments" means "at least some embodiments"; the term "optionally" means "optional embodiments". The relevant definitions of other terms will be given in the following description. It should be noted that the concepts of "first", "second", etc. mentioned in the present invention are only used to distinguish different devices, modules or units, and are not used to limit the order or interdependence of the functions performed by these devices, modules or units.

[0055] It should be noted that the modifications of "one" and "multiple" mentioned in the present invention are illustrative rather than restrictive. Those skilled in the art should understand that unless otherwise clearly indicated in the context, it should be understood as "one or more".

[0056] The names of the messages or information exchanged between multiple devices in the embodiments of the present invention are only used for illustrative purposes and are not used to limit the scope of these messages or information.

[0057] The embodiment of the present invention provides a detection method for a differential crystal oscillator, based on a detection device for a differential crystal oscillator, such as Figure 1 As shown, the detection device of the differential crystal oscillator includes a network analyzer, a test board, a digital meter and a data processing device, wherein the network analyzer is used to connect to the differential crystal oscillator, the test board is used to connect to the differential crystal oscillator and the digital meter respectively, and the data processing device is connected to the network analyzer and the digital meter respectively; Figure 2 As shown, the detection method of the differential crystal oscillator includes:

[0058] Step 210: After applying a signal of a preset power to the differential crystal oscillator through the network analyzer, obtain an electrical performance parameter value of the oscillator according to the network analyzer, and send the electrical performance parameter value of the oscillator to the data processing device;

[0059] Specifically, the starting waveforms are from low to high, and the initial work is all at very low power. The voltage divider principle is used to use lower power in the early stage to confirm the compliance of various parameters of the chip oscillator in the crystal oscillator at low power.

[0060] Step 220: supplying rated voltage to the differential crystal oscillator, switching the output frequency of the differential crystal oscillator through the test board, detecting oscillator circuit parameter values ​​through the output end of the test board, and sending the oscillator circuit parameter values ​​to the data processing device;

[0061] Specifically, the circuit board is designed to switch the output channel, which can achieve simultaneous two-way frequency and waveform detection. By switching the output frequency of the test board and calculating the difference between the two frequencies through statistical data processing, the two outputs are detected to improve the output transmission stability.

[0062] Step 230 , applying a preset test current to the detection pin of the differential crystal oscillator through the test board according to the digital electric meter to obtain a micro current parameter value of the oscillator, and sending the micro current parameter value of the oscillator to the data processing device;

[0063] Specifically, by adopting different gear designs of the digital meter and maximizing the line impedance design, leakage current abnormality test can be detected, thereby selecting two different gear currents according to the design between the pins and detecting the resistance between the pins at the same time.

[0064] Step 240: Obtain an oscillator abnormality detection result according to the oscillator electrical performance parameter value, the oscillator circuit parameter value, and the oscillator micro-current parameter value through the data processing device.

[0065] In some more specific embodiments, Figure 1 As shown, the detection device of the differential crystal oscillator also includes a power supply, an oscilloscope and a frequency counter. The test board is connected to the power supply, the oscilloscope and the frequency counter respectively; the signal waveform information is observed through the oscilloscope; the measured frequency value is obtained using the frequency counter; and the detection equipment is powered by the power supply.

[0066] In this embodiment, after applying a preset power signal to a differential crystal oscillator via a network analyzer, the oscillator's electrical performance parameter values ​​are obtained from the network analyzer to confirm the compliance of various parameters of the crystal oscillator's chip oscillator at low power. This prevents the low-power parameters from reaching lower limits while functional testing is normal, leading to long-term performance degradation. The differential crystal oscillator is powered by a rated voltage, and the output frequency of the differential crystal oscillator is switched via a test board. Two-way frequency and waveform detection is performed, and the oscillator circuit parameter values ​​are detected via the output of the test board. A digital ammeter is used to apply a preset test current to the differential crystal oscillator's detection pins via the test board to obtain the oscillator's micro-current parameter values, thereby detecting micro-impurities in the internal integrated circuit. A data processing device uses the oscillator's electrical performance parameter values, oscillator circuit parameter values, and oscillator micro-current parameter values ​​to determine oscillator anomaly detection results. This allows identification of micro-leakage current defects in semiconductors, thereby improving the accuracy of differential crystal oscillator anomaly detection.

[0067] Optionally, the preset power includes a preset initial low power, a preset minimum power, and a preset maximum power; the oscillator electrical performance parameter value includes a first network analyzer parameter value and a second network analyzer parameter value; and after applying a preset power signal to the differential crystal oscillator through the network analyzer, obtaining the oscillator electrical performance parameter value according to the network analyzer includes:

[0068] After applying the preset initial low-power signal to the differential crystal oscillator through the network analyzer, obtaining the first network analyzer parameter value according to the network analyzer;

[0069] The preset initial low power is:

[0070] ,

[0071] Wherein, Power is the preset initial low power, dBm is the crystal power of the differential crystal oscillator, and RR is the crystal equivalent impedance of the differential crystal oscillator;

[0072] After the preset minimum power signal and the preset maximum power signal are respectively applied to the differential crystal oscillator through the network analyzer, the second network analyzer parameter value is obtained according to the network analyzer.

[0073] Specifically, the oscillation waveforms are from low to high, and the actual stabilization is expected to be 50 microwatts (uW), but the initial work is all at very low power. Therefore, the voltage divider principle is used to use lower power in the early stage to confirm the compliance of various parameters of the crystal oscillator chip oscillator at low power, to prevent the low-power parameters from reaching the lower limit but the functional test is normal, resulting in long-term performance deterioration.

[0074] In this optional embodiment, the existing network analyzer can only stably output nanowatt-level power for testing. The network analyzer is used to apply a preset initial low-power signal to the differential crystal oscillator for testing to prevent the low-power part parameters from reaching the lower limit but the functional test is normal, resulting in long-term performance deterioration. This helps to evaluate its performance without damaging the device.

[0075] Optionally, the network analyzer is provided with a high-frequency crystal resonator capacitor; the first network analyzer parameter values ​​include the crystal resonator frequency, the crystal resonator equivalent impedance, the crystal resonator static capacitance, the crystal resonator dynamic capacitance, and the crystal resonator dynamic inductance; and obtaining the first network analyzer parameter values ​​according to the network analyzer includes:

[0076] performing at least two data scans within a preset frequency range according to the network analyzer to obtain a scan data set, and fitting the scan data set to obtain the crystal resonator frequency, wherein the preset frequency range includes the crystal resonator frequency;

[0077] Obtaining the equivalent impedance of the crystal resonator at the resonance point of the crystal resonator according to the network analyzer;

[0078] Performing at least two data scans within a preset capacitance value range based on the high-frequency crystal resonator capacitance of the network analyzer to obtain the static capacitance of the crystal resonator, wherein the preset capacitance value range includes the crystal resonator capacitance;

[0079] The inductance is calculated based on at least two lowest resonance point frequencies and impedance changes obtained by the network analyzer, and the dynamic capacitance and the dynamic inductance of the crystal resonator are obtained by calculating the inductance based on the lowest resonance point frequencies and the impedance changes.

[0080] Specifically, the crystal resonator frequency Fr is scanned using a network analyzer to a frequency close to the crystal resonator frequency, and at least two data scans are performed above and below the preset range of the crystal resonator frequency. According to the existing fitting formula, the frequency at which the reactance is 0 is inversely calculated according to the fitting formula. After multiple fitting and scanning, the frequency at which the fitted reactance is 0 is found. If the difference between the fitted reactance 0 frequency and the actual tested fitted reactance 0 frequency is within a numerical value, this frequency is determined to be the resonant frequency of the chip in the crystal oscillator, and the data is then transmitted to the data processing equipment for pre-prepared specification determination;

[0081] The equivalent impedance RR of the crystal resonator is obtained by using a network analyzer to find the equivalent impedance of the crystal resonator's resonance point frequency. The data is then transmitted to the data processing equipment for pre-production specification determination.

[0082] The static capacitance C0 of the crystal resonator is measured by using a network analyzer embedded in an integrated board with a high frequency of more than MHz and away from the crystal resonator itself. The crystal resonator capacitance is scanned at least twice to obtain a similar capacitance value. The data is then transmitted to the data processing equipment for pre-production specification determination.

[0083] Crystal resonator dynamic capacitance C1, use network analysis to scan the crystal resonator's lowest resonance frequency twice and calculate the impedance change to calculate the inductance, and then use the inductance and frequency to calculate the dynamic capacitance;

[0084] The dynamic inductance L1 of the crystal resonator is calculated by scanning the actual test frequency of the crystal resonator using network analysis, and calculating the inductance by fitting the last two lowest resonance point frequencies and impedance changes.

[0085] Optionally, the second network analyzer parameter value includes a maximum difference in equivalent impedance and a maximum difference in resonant frequency, and obtaining the second network analyzer parameter value according to the network analyzer includes:

[0086] Obtaining the lowest resonance point equivalent impedances corresponding to the preset minimum power and the preset maximum power respectively according to the network analyzer, and obtaining the maximum difference of the equivalent impedances through the two lowest resonance point equivalent impedances;

[0087] The lowest resonance point resonant frequencies corresponding to the preset minimum power and the preset maximum power are obtained according to the network analyzer, and the maximum difference in the resonant frequencies is obtained through the two lowest resonance point resonant frequencies.

[0088] Specifically, the maximum difference DLD2 in the equivalent impedance of the crystal resonator at different powers is obtained by using a network analyzer to provide different power inputs to the crystal resonator, scanning the equivalent impedance of the lowest resonance point at different powers, calculating the maximum and minimum differences, and transmitting the values ​​to the data processing software for specification determination;

[0089] The maximum difference in the resonant frequency of the crystal resonator under different powers is FDLD. Use a network analyzer to provide different power inputs to the crystal resonator, scan the resonant frequency of the lowest resonance point under different powers, calculate the maximum and minimum differences, and transmit the values ​​to the data processing equipment for specification determination.

[0090] Optionally, the detection pins include a crystal oscillator power input pin, a crystal oscillator ground pin, a crystal oscillator enable pin, a crystal oscillator differential positive pin, a crystal oscillator differential negative pin, a crystal oscillator resonator input pin, and a crystal oscillator resonator output pin, and the oscillator micro-current parameter value includes a first pin-to-pin resistance, a second pin-to-pin resistance, a third pin-to-pin resistance, a fourth pin-to-pin resistance, a fifth pin-to-pin resistance, and a sixth pin-to-pin resistance.

[0091] The method of applying a preset test current to the detection pin of the differential crystal oscillator through the test board according to the digital ammeter to obtain a small current parameter value of the oscillator includes:

[0092] Applying the preset test current to the power input pin of the crystal oscillator and the ground pin of the crystal oscillator through the test board according to the digital electric meter to obtain the resistance between the first pins;

[0093] applying the preset test current to the crystal oscillator enable pin and the crystal oscillator ground pin through the test board according to the digital ammeter to obtain the second inter-pin resistance;

[0094] Applying the preset test current to the differential positive pin of the crystal oscillator and the ground pin of the crystal oscillator through the test board according to the digital electric meter to obtain the resistance between the third pins;

[0095] Applying the preset test current to the differential negative pin of the crystal oscillator and the ground pin of the crystal oscillator through the test board according to the digital electric meter to obtain the resistance between the fourth pins;

[0096] Applying the preset test current to the crystal oscillator resonator input pin and the crystal oscillator ground pin through the test board according to the digital electric meter to obtain the resistance between the fifth pins;

[0097] The digital ammeter applies the preset test current to the crystal oscillator resonator output pin and the crystal oscillator ground pin through the test board to obtain the sixth inter-pin resistance.

[0098] In some more specific embodiments, the valid pins of the differential crystal oscillator include VDD: crystal oscillator power input pin, GND: crystal oscillator ground pin, OE: crystal oscillator enable pin, Q-1: crystal oscillator differential positive pin, Q-2: crystal oscillator differential negative pin, X1: crystal oscillator resonator input pin, and X2: crystal oscillator resonator output pin.

[0099] Specifically, the active pins of a differential crystal oscillator are connected to a test board, which is then connected to a digital ammeter. The test board switches between different product pin combinations. The digital ammeter is programmed to switch between desired currents using preset test currents (Table 1). The preset test currents and corresponding resistances are then read from the data processing software for specification verification. Two different current ranges are selected based on the pin-to-pin design, while the resistance between the pins is simultaneously measured. This yields the oscillator's micro-current parameter values, which are used to identify differences between integrated circuits with different micro-currents and identify minor defects. While differential crystal oscillators previously only performed functional testing and were unable to detect minor internal integrated circuit current defects, the use of a digital ammeter with different ranges and maximized line impedance allows detection of nanowatt (nW)-level leakage current anomalies. This can be expanded to include testing between all pins of the differential crystal oscillator, including but not limited to the following combinations: VDD-GND, OE-GND, Q-1-GND, Q-2-GND, X1-GND, and X2-GND.

[0100]

[0101] In this optional embodiment, two different current levels are selected based on the design between the pins and the resistance between the pins is detected simultaneously to confirm the differences between the integrated circuits with different small currents, find out the small defective integrated circuits, and improve the detection accuracy.

[0102] Optionally, the oscillator circuit parameter values ​​include differential output positive end frequency, differential output negative end frequency, positive and negative end frequency difference, power supply current consumption value, crystal oscillator standby current, minimum voltage level, maximum voltage level, low level rise time, high level fall time and duty cycle. Switching the output frequency of the test board and obtaining the oscillator circuit parameter values ​​using the test board includes:

[0103] The test board is used to switch the output frequencies of the differential positive terminal pin of the crystal oscillator and the differential negative terminal pin of the crystal oscillator, and the test board is used to detect the output signal of the differential crystal oscillator to obtain the differential output positive terminal frequency, the differential output negative terminal frequency, the positive and negative terminal frequency difference, the power supply current consumption value, the crystal oscillator standby current, the minimum voltage level, the maximum voltage level, the low level rise time, the high level fall time and the duty cycle.

[0104] Specifically, the positive frequency of the differential output is FL1. The product is powered by the rated voltage, and the output pin is connected to the test board. The test board output is connected to the frequency counter. The test board switches the positive and negative output pin frequencies. The frequency counter recognizes the frequency and outputs it to the data processing software to calculate the difference and make specification judgments.

[0105] The negative frequency of the differential output is FL2. The product is powered by the rated voltage, and the output pin is connected to the test board. The test board output is connected to the frequency counter. The test board switches the positive and negative output pin frequencies. After the frequency counter recognizes the frequency, it outputs it to the data processing software to calculate the difference and make specification judgments.

[0106] The frequency difference between the positive and negative terminals is △F, which is FL1 minus FL2.

[0107] The power supply current consumption value Idd is used to obtain the power supply current consumption of the circuit under normal operating conditions;

[0108] The crystal oscillator's standby current is Idiable. The crystal oscillator's power input pin VDD is supplied with a rated voltage. The crystal oscillator's enable pin OE is also supplied with a voltage of VDD*0.3. A digital meter is connected in series to the VDD port to detect the current value and transmit it to the data processing equipment for determination.

[0109] Minimum voltage level Voh, obtained by testing the board when the output is high level;

[0110] Maximum voltage level Vol, obtained by testing the board when the output is low level;

[0111] Low level rise time Tr, the time required for the signal to rise from low level to high level is obtained by testing the board;

[0112] High level fall time Tf, the time required for the signal to fall from high level to low level is obtained by testing the board;

[0113] Duty: The test board obtains the proportion of the signal at a high level within a cycle.

[0114] Optionally, obtaining the oscillator abnormality detection result according to the oscillator electrical performance parameter value, the oscillator circuit parameter value, and the oscillator micro-current parameter value by the data processing device includes:

[0115] Obtaining a standard deviation value by the data processing device according to the oscillator electrical performance parameter value, the oscillator circuit parameter value, the oscillator micro current parameter value and a differential crystal oscillator standard threshold value;

[0116] The oscillator abnormality detection result is obtained by comparing the standard deviation value with a preset difference range.

[0117] Specifically, the oscillator abnormality detection result includes an oscillator abnormality result and an oscillator normal result, and the oscillator abnormality detection result is obtained by comparing the standard deviation value with a preset difference range, including:

[0118] When the standard deviation is greater than the maximum value of the preset difference range, the oscillator abnormality result is obtained.

[0119] The standard deviation includes the difference of the oscillator electrical performance parameters, the difference of the oscillator circuit parameters and the difference of the oscillator micro current. The oscillator abnormality detection result is obtained by comparing the standard deviation with the preset difference range, including:

[0120] When the standard deviation is less than or equal to the minimum value of the preset difference range, the oscillator electrical performance parameter difference, the oscillator circuit parameter difference and the oscillator micro current difference are compared with the preset oscillator electrical performance parameter difference, the preset oscillator circuit parameter difference and the preset oscillator micro current difference to obtain a difference comparison result, and the oscillator abnormality detection result is obtained according to the difference comparison result.

[0121] Obtaining the oscillator abnormality detection result according to the difference comparison result includes:

[0122] When the oscillator electrical performance parameter difference is greater than the preset oscillator electrical performance parameter difference, inputting the oscillator electrical performance parameter into a pre-trained electrical performance parameter model to obtain an electrical performance parameter evaluation value;

[0123] Among them, the electrical performance parameter evaluation value is:

[0124] ,

[0125] in, is a weight parameter, E is the electrical performance parameter evaluation value, Fr is the crystal resonator frequency, RR is the crystal resonator equivalent impedance, C0 is the crystal resonator static capacitance, C1 is the crystal resonator dynamic capacitance, and L1 is the crystal resonator dynamic inductance;

[0126] When the electrical performance parameter evaluation value is less than or equal to a preset evaluation value, obtaining a normal result of the oscillator;

[0127] When the electrical performance parameter evaluation value is greater than a preset evaluation value, the oscillator abnormality result is obtained.

[0128] The step of obtaining the oscillator abnormality detection result according to the difference comparison result further includes:

[0129] When the oscillator electrical performance parameter difference is less than or equal to the preset oscillator electrical performance parameter difference, and any difference between the preset oscillator micro current difference and the preset oscillator micro current difference is greater than the preset oscillator circuit parameter difference and the preset oscillator micro current difference, the oscillator abnormal result is obtained.

[0130] In some more specific embodiments, considering that frequency is a key parameter with a higher weight, equivalent impedance has a greater impact on oscillator stability, static capacitance has a smaller impact, dynamic capacitance has a certain impact, and dynamic inductance has a certain impact. is 0.4, is 0.3, is 0.1, is 0.1, is 0.1.

[0131] Specifically, the data processing device obtains a standard deviation value based on the oscillator electrical performance parameter value, the oscillator circuit parameter value, the oscillator micro-current parameter value, and the differential crystal oscillator standard threshold value. This standard deviation value is obtained by subtracting these obtained parameter values ​​from the standard value. The differential crystal oscillator standard threshold value includes the oscillator electrical performance standard threshold value, the oscillator circuit standard threshold value, and the oscillator micro-current standard threshold value. The standard deviation value includes the oscillator electrical performance parameter difference value, the oscillator circuit parameter difference value, and the oscillator micro-current difference value.

[0132] In some more specific embodiments, a preset difference range is set, and all the obtained differences are judged. When the standard deviation is greater than the preset difference range, it indicates that the differential crystal oscillator is obviously abnormal at this time, and an oscillator abnormality detection result is obtained. When the standard deviation is less than or equal to the preset difference range, there may be a misjudgment due to detection current or equipment problems, and further judgment is made on each parameter value. First, the three parameter differences are compared with the preset differences. When the oscillator electrical performance parameter difference is too large, the electrical performance parameter evaluation value is obtained by pre-training the electrical performance parameter model for further judgment, and an oscillator abnormality detection result is obtained. When the oscillator electrical performance parameter difference is small, the preset oscillator micro-current difference is compared with the preset oscillator micro-current difference and the preset difference. When it is greater than, an oscillator abnormality result is obtained, and when it is less than or equal to, an oscillator normal result is obtained.

[0133] like Figure 3 As shown, an embodiment of the present invention provides a differential crystal oscillator detection system, based on a differential crystal oscillator detection device, the differential crystal oscillator detection device includes a network analyzer, a test board, a digital meter, and a data processing device, the network analyzer is used to connect to the differential crystal oscillator, the test board is used to connect to the differential crystal oscillator and the digital meter respectively, and the data processing device is connected to the network analyzer and the digital meter respectively; the differential crystal oscillator detection system includes:

[0134] a network component measurement module 10, configured to obtain electrical performance parameter values ​​of the oscillator according to the network analyzer after applying a preset power signal to the differential crystal oscillator through the network analyzer, and send the electrical performance parameter values ​​of the oscillator to the data processing device;

[0135] an oscillator circuit measurement module 20, configured to supply rated voltage to the differential crystal oscillator, switch the output frequency of the differential crystal oscillator through the test board, detect oscillator circuit parameter values ​​through the output end of the test board, and send the oscillator circuit parameter values ​​to the data processing device;

[0136] a micro-current measurement module 30 for applying a preset test current to the detection pin of the differential crystal oscillator through the test board according to the digital ammeter to obtain a micro-current parameter value of the oscillator, and sending the micro-current parameter value of the oscillator to the data processing device;

[0137] The oscillator abnormality detection result acquisition module 40 is used to obtain the oscillator abnormality detection result according to the oscillator electrical performance parameter value, the oscillator circuit parameter value and the oscillator micro current parameter value through the data processing device.

[0138] The differential crystal oscillator detection system of this embodiment is used to implement the differential crystal oscillator detection method described above. Its advantages over the existing technology are the same as the advantages of the differential crystal oscillator detection method described above over the existing technology, and will not be repeated here.

[0139] Optionally, the network component measurement module 10 is specifically configured to: obtain the first network analyzer parameter value according to the network analyzer after applying the preset initial low-power signal to the differential crystal oscillator through the network analyzer;

[0140] The preset initial low power is:

[0141] ,

[0142] Wherein, Power is the preset initial low power, dBm is the crystal power of the differential crystal oscillator, and RR is the crystal equivalent impedance of the differential crystal oscillator;

[0143] After the preset minimum power signal and the preset maximum power signal are respectively applied to the differential crystal oscillator through the network analyzer, the second network analyzer parameter value is obtained according to the network analyzer.

[0144] Optionally, the network component measurement module 10 is specifically configured to: obtain a scan data set by performing at least two data scans within a preset frequency range according to the network analyzer, and obtain the crystal resonator frequency by fitting the scan data set, wherein the preset frequency range includes the crystal resonator frequency;

[0145] Obtaining the equivalent impedance of the crystal resonator at the resonance point of the crystal resonator according to the network analyzer;

[0146] Performing at least two data scans within a preset capacitance value range based on the high-frequency crystal resonator capacitance of the network analyzer to obtain the static capacitance of the crystal resonator, wherein the preset capacitance value range includes the crystal resonator capacitance;

[0147] The inductance is calculated based on at least two lowest resonance point frequencies and impedance changes obtained by the network analyzer, and the dynamic capacitance and the dynamic inductance of the crystal resonator are obtained by calculating the inductance based on the lowest resonance point frequencies and the impedance changes.

[0148] Optionally, the network component measurement module 10 is specifically configured to: obtain the lowest resonance point equivalent impedances corresponding to the preset minimum power and the preset maximum power respectively according to the network analyzer, and obtain the maximum difference of the equivalent impedances through the two lowest resonance point equivalent impedances;

[0149] The lowest resonance point resonant frequencies corresponding to the preset minimum power and the preset maximum power are obtained according to the network analyzer, and the maximum difference in the resonant frequencies is obtained through the two lowest resonance point resonant frequencies.

[0150] Optionally, the micro-current measurement module 30 is specifically configured to: apply the preset test current to the power input pin of the crystal oscillator and the ground pin of the crystal oscillator through the test board according to the digital ammeter to obtain the resistance between the first pins;

[0151] applying the preset test current to the crystal oscillator enable pin and the crystal oscillator ground pin through the test board according to the digital ammeter to obtain the second inter-pin resistance;

[0152] Applying the preset test current to the differential positive pin of the crystal oscillator and the ground pin of the crystal oscillator through the test board according to the digital electric meter to obtain the resistance between the third pins;

[0153] Applying the preset test current to the differential negative pin of the crystal oscillator and the ground pin of the crystal oscillator through the test board according to the digital electric meter to obtain the resistance between the fourth pins;

[0154] Applying the preset test current to the crystal oscillator resonator input pin and the crystal oscillator ground pin through the test board according to the digital electric meter to obtain the resistance between the fifth pins;

[0155] The digital ammeter applies the preset test current to the crystal oscillator resonator output pin and the crystal oscillator ground pin through the test board to obtain the sixth inter-pin resistance.

[0156] Optionally, the oscillation circuit measurement module 20 is specifically used to: switch the output frequency of the differential positive end pin of the crystal oscillator and the differential negative end pin of the crystal oscillator through the test board, and use the test board to detect the output signal of the differential crystal oscillator to obtain the differential output positive end frequency, the differential output negative end frequency, the positive and negative end frequency difference, the power supply current consumption value, the crystal oscillator standby current, the minimum voltage level, the maximum voltage level, the low level rise time, the high level fall time and the duty cycle.

[0157] Optionally, the oscillator abnormality detection result acquisition module 40 is specifically configured to: obtain a standard deviation value based on the oscillator electrical performance parameter value, the oscillator circuit parameter value, the oscillator micro current parameter value and a differential crystal oscillator standard threshold value through the data processing device;

[0158] The oscillator abnormality detection result is obtained by comparing the standard deviation value with a preset difference range.

[0159] like Figure 4 As shown, an electronic device 400 provided by an embodiment of the present invention includes a memory 410 and a processor 420; the memory 410 is used to store a computer program; the processor 420 is used to implement the differential crystal oscillator detection method as described above when executing the computer program.

[0160] In other words, an electronic device 400 includes a memory 410 and a processor 420 coupled to the memory 410; the memory 410 is configured to store a computer program; and the processor 420 is configured to perform the following operations when executing the computer program:

[0161] After applying a signal of preset power to the differential crystal oscillator through the network analyzer, obtaining an electrical performance parameter value of the oscillator according to the network analyzer, and sending the electrical performance parameter value of the oscillator to the data processing device;

[0162] supplying rated voltage to the differential crystal oscillator, switching the output frequency of the differential crystal oscillator through the test board, detecting oscillator circuit parameter values ​​through the output end of the test board, and sending the oscillator circuit parameter values ​​to the data processing device;

[0163] Applying a preset test current to the detection pin of the differential crystal oscillator through the test board according to the digital electric meter to obtain a micro-current parameter value of the oscillator, and sending the micro-current parameter value of the oscillator to the data processing device;

[0164] The data processing device obtains an oscillator abnormality detection result according to the oscillator electrical performance parameter value, the oscillator circuit parameter value and the oscillator micro-current parameter value.

[0165] An embodiment of the present invention provides a computer-readable storage medium, wherein a computer program is stored on the storage medium. When the computer program is executed by a processor, the above-mentioned differential crystal oscillator detection method is implemented.

[0166] In other words, a non-volatile computer-readable storage medium stores a computer program, which, when executed by a processor, causes the processor to perform the following operations:

[0167] After applying a signal of preset power to the differential crystal oscillator through the network analyzer, obtaining an electrical performance parameter value of the oscillator according to the network analyzer, and sending the electrical performance parameter value of the oscillator to the data processing device;

[0168] supplying rated voltage to the differential crystal oscillator, switching the output frequency of the differential crystal oscillator through the test board, detecting oscillator circuit parameter values ​​through the output end of the test board, and sending the oscillator circuit parameter values ​​to the data processing device;

[0169] Applying a preset test current to the detection pin of the differential crystal oscillator through the test board according to the digital electric meter to obtain a micro-current parameter value of the oscillator, and sending the micro-current parameter value of the oscillator to the data processing device;

[0170] The data processing device obtains an oscillator abnormality detection result according to the oscillator electrical performance parameter value, the oscillator circuit parameter value and the oscillator micro-current parameter value.

[0171] An electronic device 400 that can serve as a server or client of the present invention will now be described, which is an example of a hardware device that can be applied to various aspects of the present invention. The electronic device 400 is intended to represent various forms of digital electronic computer devices, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device 400 can also represent various forms of mobile devices, such as personal digital assistants, cellular phones, smart phones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely examples and are not intended to limit the implementation of the present invention described and / or required herein.

[0172] Electronic device 400 includes a computing unit that can perform various appropriate actions and processes based on a computer program stored in a read-only memory (ROM) or a computer program loaded from a storage unit into a random access memory (RAM). The RAM can also store various programs and data required for device operation. The computing unit, ROM, and RAM are interconnected via a bus. An input / output (I / O) interface is also connected to the bus.

[0173] Those skilled in the art will appreciate that all or part of the processes in the above-described method embodiments can be implemented by instructing the relevant hardware through a computer program. The program can be stored in a computer-readable storage medium, and when executed, the program can include the processes in the above-described method embodiments. The storage medium can be a magnetic disk, an optical disk, a read-only memory (ROM), or a random access memory (RAM).

[0174] Although the present invention is disclosed as above, the protection scope of the present invention is not limited thereto. Those skilled in the art may make various changes and modifications without departing from the spirit and scope of the present invention, and these changes and modifications will fall within the protection scope of the present invention.

Claims

1. A detection method for a differential crystal oscillator, characterized in that: A detection device based on a differential crystal oscillator, comprising a network analyzer, a test board, a digital electric meter, and a data processing device, wherein the network analyzer is connected to the differential crystal oscillator, the test board is connected to the differential crystal oscillator and the digital electric meter, respectively, and the data processing device is connected to the network analyzer and the digital electric meter, respectively; The detection method of the differential crystal oscillator includes: After applying a signal of preset power to the differential crystal oscillator through the network analyzer, obtaining an electrical performance parameter value of the oscillator according to the network analyzer, and sending the electrical performance parameter value of the oscillator to the data processing device; supplying rated voltage to the differential crystal oscillator, switching the output frequency of the differential crystal oscillator through the test board, detecting oscillator circuit parameter values ​​through the output end of the test board, and sending the oscillator circuit parameter values ​​to the data processing device; Applying a preset test current to the detection pin of the differential crystal oscillator through the test board according to the digital electric meter to obtain a micro-current parameter value of the oscillator, and sending the micro-current parameter value of the oscillator to the data processing device; Obtaining an oscillator abnormality detection result according to the oscillator electrical performance parameter value, the oscillator circuit parameter value, and the oscillator micro-current parameter value by the data processing device; The preset power includes a preset initial low power, a preset minimum power, and a preset maximum power. The oscillator electrical performance parameter value includes a first network analyzer parameter value and a second network analyzer parameter value. After applying a preset power signal to the differential crystal oscillator through the network analyzer, the oscillator electrical performance parameter value is obtained according to the network analyzer, including: After applying the preset initial low-power signal to the differential crystal oscillator through the network analyzer, obtaining the first network analyzer parameter value according to the network analyzer; The preset initial low power is: ， Wherein, Power is the preset initial low power, dBm is the crystal power of the differential crystal oscillator, and RR is the crystal equivalent impedance of the differential crystal oscillator; After the preset minimum power signal and the preset maximum power signal are respectively applied to the differential crystal oscillator through the network analyzer, the second network analyzer parameter value is obtained according to the network analyzer.

2. The detection method of a differential crystal oscillator according to claim 1, wherein: The network analyzer is provided with a high-frequency crystal resonator capacitor; the first network analyzer parameter values ​​include the crystal resonator frequency, the crystal resonator equivalent impedance, the crystal resonator static capacitance, the crystal resonator dynamic capacitance, and the crystal resonator dynamic inductance, and the first network analyzer parameter values ​​are obtained according to the network analyzer, including: performing at least two data scans within a preset frequency range according to the network analyzer to obtain a scan data set, and fitting the scan data set to obtain the crystal resonator frequency, wherein the preset frequency range includes the crystal resonator frequency; Obtaining the equivalent impedance of the crystal resonator at the resonance point of the crystal resonator according to the network analyzer; Performing at least two data scans within a preset capacitance value range based on the high-frequency crystal resonator capacitance of the network analyzer to obtain the static capacitance of the crystal resonator, wherein the preset capacitance value range includes the crystal resonator capacitance; The inductance is calculated based on at least two lowest resonance point frequencies and impedance changes obtained by the network analyzer, and the dynamic capacitance and the dynamic inductance of the crystal resonator are obtained by calculating the inductance based on the lowest resonance point frequencies and the impedance changes.

3. The detection method of a differential crystal oscillator according to claim 2, wherein: The second network analyzer parameter value includes a maximum difference in equivalent impedance and a maximum difference in resonant frequency. The second network analyzer parameter value is obtained according to the network analyzer, including: Obtaining the lowest resonance point equivalent impedances corresponding to the preset minimum power and the preset maximum power respectively according to the network analyzer, and obtaining the maximum difference of the equivalent impedances through the two lowest resonance point equivalent impedances; The lowest resonance point resonant frequencies corresponding to the preset minimum power and the preset maximum power are obtained according to the network analyzer, and the maximum difference in the resonant frequencies is obtained through the two lowest resonance point resonant frequencies.

4. The detection method of a differential crystal oscillator according to claim 1, wherein: The detection pins include a crystal oscillator power input pin, a crystal oscillator ground pin, a crystal oscillator enable pin, a crystal oscillator differential positive pin, a crystal oscillator differential negative pin, a crystal oscillator resonator input pin, and a crystal oscillator resonator output pin. The oscillator micro-current parameter value includes a first pin-to-pin resistance, a second pin-to-pin resistance, a third pin-to-pin resistance, a fourth pin-to-pin resistance, a fifth pin-to-pin resistance, and a sixth pin-to-pin resistance. The digital ammeter is used to apply a preset test current to the detection pins of the differential crystal oscillator through the test board to obtain the oscillator micro-current parameter value, including: Applying the preset test current to the power input pin of the crystal oscillator and the ground pin of the crystal oscillator through the test board according to the digital electric meter to obtain the resistance between the first pins; applying the preset test current to the crystal oscillator enable pin and the crystal oscillator ground pin through the test board according to the digital ammeter to obtain the second inter-pin resistance; Applying the preset test current to the differential positive pin of the crystal oscillator and the ground pin of the crystal oscillator through the test board according to the digital electric meter to obtain the resistance between the third pins; Applying the preset test current to the differential negative pin of the crystal oscillator and the ground pin of the crystal oscillator through the test board according to the digital electric meter to obtain the resistance between the fourth pins; Applying the preset test current to the crystal oscillator resonator input pin and the crystal oscillator ground pin through the test board according to the digital electric meter to obtain the resistance between the fifth pins; The digital ammeter applies the preset test current to the crystal oscillator resonator output pin and the crystal oscillator ground pin through the test board to obtain the sixth inter-pin resistance.

5. The detection method of a differential crystal oscillator according to claim 4, wherein: The oscillator circuit parameter values ​​include differential output positive end frequency, differential output negative end frequency, positive and negative end frequency difference, power supply current consumption value, crystal oscillator standby current, minimum voltage level, maximum voltage level, low level rise time, high level fall time and duty cycle. By switching the output frequency of the test board, the oscillator circuit parameter values ​​are obtained using the test board, including: The test board is used to switch the output frequencies of the differential positive terminal pin of the crystal oscillator and the differential negative terminal pin of the crystal oscillator, and the test board is used to detect the output signal of the differential crystal oscillator to obtain the differential output positive terminal frequency, the differential output negative terminal frequency, the positive and negative terminal frequency difference, the power supply current consumption value, the crystal oscillator standby current, the minimum voltage level, the maximum voltage level, the low level rise time, the high level fall time and the duty cycle.

6. The detection method of a differential crystal oscillator according to claim 1, wherein: Obtaining an oscillator abnormality detection result according to the oscillator electrical performance parameter value, the oscillator circuit parameter value, and the oscillator micro-current parameter value by the data processing device includes: Obtaining a standard deviation value by the data processing device according to the oscillator electrical performance parameter value, the oscillator circuit parameter value, the oscillator micro-current parameter value and a differential crystal oscillator standard threshold value; The oscillator abnormality detection result is obtained by comparing the standard deviation value with a preset difference range.

7. A detection system for a differential crystal oscillator, characterized in that: A detection device based on a differential crystal oscillator includes a network analyzer, a test board, a digital electric meter, and a data processing device. The network analyzer is used to connect to the differential crystal oscillator, the test board is used to connect to the differential crystal oscillator and the digital electric meter respectively, and the data processing device is connected to the network analyzer and the digital electric meter respectively. The detection system of the differential crystal oscillator includes: a network component measurement module, configured to obtain electrical performance parameter values ​​of the oscillator according to the network analyzer after applying a signal of preset power to the differential crystal oscillator through the network analyzer, and send the electrical performance parameter values ​​of the oscillator to the data processing device; an oscillator circuit measurement module, configured to supply rated voltage to the differential crystal oscillator, switch the output frequency of the differential crystal oscillator through the test board, detect oscillator circuit parameter values ​​through the output end of the test board, and send the oscillator circuit parameter values ​​to the data processing device; The preset power includes a preset initial low power, a preset minimum power, and a preset maximum power. The oscillator electrical performance parameter value includes a first network analyzer parameter value and a second network analyzer parameter value. After applying a preset power signal to the differential crystal oscillator through the network analyzer, the oscillator electrical performance parameter value is obtained according to the network analyzer, including: After applying the preset initial low-power signal to the differential crystal oscillator through the network analyzer, obtaining the first network analyzer parameter value according to the network analyzer; The preset initial low power is: ， Wherein, Power is the preset initial low power, dBm is the crystal power of the differential crystal oscillator, and RR is the crystal equivalent impedance of the differential crystal oscillator; After applying the preset minimum power signal and the preset maximum power signal to the differential crystal oscillator respectively through the network analyzer, obtaining the second network analyzer parameter value according to the network analyzer; a micro-current measurement module, configured to apply a preset test current to the detection pin of the differential crystal oscillator via the test board according to the digital ammeter to obtain a micro-current parameter value of the oscillator, and send the micro-current parameter value of the oscillator to the data processing device; The oscillator abnormality detection result acquisition module is used to obtain the oscillator abnormality detection result according to the oscillator electrical performance parameter value, the oscillator circuit parameter value and the oscillator micro-current parameter value through the data processing device.

8. An electronic device, characterized in that: including memory and processor; The memory is used to store computer programs; The processor is configured to implement the differential crystal oscillator detection method according to any one of claims 1 to 6 when executing the computer program.

9. A computer-readable storage medium, characterized in that The storage medium stores a computer program, and when the computer program is executed by the processor, the detection method of the differential crystal oscillator according to any one of claims 1 to 6 is implemented.

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