Amorphous wire annular hysteresis loop measuring device and measuring method
By designing an amorphous wire loop movable hysteresis loop loop measuring device including a bridge circuit and a signal processing module, the problem of low measurement efficiency of amorphous wire loop movable is solved, and a fast and accurate measurement effect is achieved.
Patent Information
- Application Number
- CN202510154054.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-12
- Publication Date
- 2025-05-09
AI Technical Summary
The prior art is difficult to measure the amorphous wire annular hysteresis loop loop quickly and accurately, resulting in inefficient measurements.
A amorphous wire circumferential hysteresis loop loop measuring device is designed, including a signal source, a measurement module, a sampling module, a signal processing module and an oscilloscope module. The circumferential magnetization of the amorphous wire is measured by a bridge circuit, and a circumferential hysteresis loop loop is generated through signal processing.
It realizes fast and accurate measurement of the amorphous wire loop hysteresis loop loop, improves measurement efficiency, and is simple to operate, convenient and efficient.
Smart Images
Figure CN119959839A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of magnetic performance testing, and in particular to a device and method for measuring annular hysteresis loops of amorphous wires. Background Art
[0002] Amorphous wire is a kind of amorphous alloy microwire. Due to its unique giant magneto-impedance effect, that is, when high-frequency alternating current is used to drive the amorphous wire, the tiny external magnetic field in the axial direction of the amorphous wire causes a significant change in the AC impedance at both ends of the amorphous wire. Therefore, it can be widely used in various magnetic sensors with the advantages of high sensitivity, fast response speed, high linearity and good temperature stability.
[0003] Due to the amorphous properties of amorphous wires themselves and the large residual stress introduced by the ultra-high cooling rate during preparation, amorphous wires generally need to measure parameters such as annular hysteresis loops, axial hysteresis loops, magnetic impedance ratio and magnetoelastic coefficient. However, amorphous wires are small in size and difficult to measure using traditional methods. Therefore, how to quickly and accurately measure the annular hysteresis loop of amorphous wires is a technical problem that needs to be solved urgently. Summary of the invention
[0004] In view of the above-mentioned defects or deficiencies in the related art, it is desired to provide a device and method for measuring the annular hysteresis loop of an amorphous wire, which can accurately measure the annular hysteresis loop of the amorphous wire and improve the measurement efficiency.
[0005] In a first aspect, the present application provides an amorphous wire annular hysteresis loop measuring device, the amorphous wire annular hysteresis loop measuring device comprising a signal source, a measuring module, a sampling module, a signal processing module and an oscilloscope module, the measuring module comprising a bridge circuit, a first branch of the bridge circuit is provided with a first resistor, a second branch is provided with an amorphous wire to be measured, and the resistance value of the first resistor is equal to the DC resistance value of the amorphous wire to be measured;
[0006] The first end of the signal source is connected to the first end of the bridge circuit, the second end of the signal source is respectively connected to the first end of the sampling module and the first end of the oscilloscope module, the second end of the sampling module is respectively connected to the second end of the bridge circuit and the second end of the oscilloscope module, the third end of the bridge circuit is connected to the first end of the signal processing module, the fourth end of the bridge circuit is connected to the second end of the signal processing module, and the third end of the signal processing module is connected to the third end of the oscilloscope module;
[0007] The signal source is configured to output a current that can excite the amorphous wire to be tested to generate a toroidal magnetic field; the measurement module is configured to measure the toroidal magnetization of the amorphous wire to be tested through the bridge circuit; the sampling module is configured to sample the current signal of the bridge circuit; the signal processing module is configured to process the voltage signal of the bridge circuit; the oscilloscope module is configured to generate a toroidal hysteresis loop of the amorphous wire to be tested based on the current signal and the voltage signal.
[0008] Optionally, in some embodiments of the present application, the bridge circuit further includes a second resistor located in the third branch and a third resistor located in the fourth branch;
[0009] The first end of the second resistor is connected to the first end of the signal source, the second end of the second resistor is respectively connected to the first end of the amorphous wire to be tested and the first end of the signal processing module, the first end of the third resistor is connected to the first end of the second resistor, the second end of the third resistor is respectively connected to the first end of the first resistor and the second end of the signal processing module, and the second end of the first resistor is respectively connected to the second end of the amorphous wire to be tested and the second end of the sampling module.
[0010] Optionally, in some embodiments of the present application, the first resistor is a variable resistor.
[0011] Optionally, in some embodiments of the present application, the sampling module includes a fourth resistor, a first end of the fourth resistor is respectively connected to the second end of the signal source and the first end of the oscilloscope module, and a second end of the fourth resistor is respectively connected to the second end of the bridge circuit and the second end of the oscilloscope module.
[0012] Optionally, in some embodiments of the present application, the signal processing module includes a differential amplifier and an integrator, the first end of the differential amplifier is connected to the third end of the bridge circuit, the second end of the differential amplifier is connected to the fourth end of the bridge circuit, the third end of the differential amplifier is connected to the first end of the integrator, and the second end of the integrator is connected to the third end of the oscilloscope module.
[0013] Optionally, in some embodiments of the present application, the signal source is a function generator, wherein when measuring the toroidal hysteresis loop of the amorphous wire to be measured, the function generator operates in a sinusoidal signal mode.
[0014] Optionally, in some embodiments of the present application, the oscilloscope module is an oscilloscope, wherein when measuring the toroidal hysteresis loop of the amorphous wire to be measured, the oscilloscope operates in a YX mode.
[0015] In a second aspect, the present application provides a method for measuring a circumferential hysteresis loop of an amorphous wire, the method for measuring a circumferential hysteresis loop of an amorphous wire being used in the device for measuring a circumferential hysteresis loop of an amorphous wire according to any one of the first aspects, the method for measuring a circumferential hysteresis loop of an amorphous wire comprising:
[0016] Fixing the amorphous wire to be measured in the bridge circuit of the measuring module;
[0017] Measuring the DC resistance of the amorphous wire to be measured, and making the resistance of the first resistor equal to the DC resistance of the amorphous wire to be measured;
[0018] The operating frequency and amplitude of the signal source are adjusted, and the toroidal hysteresis loop of the amorphous wire to be tested is displayed when the oscilloscope module is in YX mode.
[0019] Optionally, the coercive force H of the toroidal hysteresis loop in some embodiments of the present application is c Obtained by the following formula:
[0020]
[0021] In the above formula, U1 represents the voltage across the fourth resistor in the sampling module, r represents the radius of the amorphous wire to be measured, and R4 represents the resistance value of the fourth resistor in the sampling module.
[0022] Optionally, the magnetization intensity M of the toroidal hysteresis loop in some embodiments of the present application is obtained by the following formula:
[0023]
[0024] In the above formula, R represents the resistance of the integrator resistor in the signal processing module, C represents the capacitance of the integrator capacitor in the signal processing module, U2 represents the voltage processed by the signal processing module, G represents the gain of the differential amplifier in the signal processing module, r represents the radius of the amorphous wire to be measured, and L represents the length of the amorphous wire to be measured.
[0025] It can be seen from the above technical solutions that the embodiments of the present application have the following advantages:
[0026] The embodiment of the present application provides a device and method for measuring the annular hysteresis loop of an amorphous wire. By setting an amorphous wire to be measured and a first resistor in a bridge circuit of a measuring module, and the resistance value of the first resistor is equal to the DC resistance value of the amorphous wire to be measured, when a signal source outputs a current that can excite the amorphous wire to be measured to generate an annular magnetic field, the bridge circuit can be used to measure the annular magnetization of the amorphous wire to be measured. The oscilloscope module can quickly generate the annular hysteresis loop of the amorphous wire to be measured according to the current signal of the bridge circuit collected by the sampling module and the voltage signal of the bridge circuit processed by the signal processing module, with high accuracy, simple operation, convenience and high efficiency. BRIEF DESCRIPTION OF THE DRAWINGS
[0027] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.
[0028] Figure 1 A structural block diagram of an amorphous wire toroidal hysteresis loop measurement device provided in an embodiment of the present application;
[0029] Figure 2 A schematic diagram of a toroidal hysteresis loop of an amorphous wire to be tested provided in an embodiment of the present application;
[0030] Figure 3 A schematic flow chart of a method for measuring annular hysteresis loop of an amorphous wire provided in an embodiment of the present application.
[0031] Reference numerals:
[0032] 10-amorphous wire annular hysteresis loop measuring device, 101-signal source, 102-measuring module, 1021-bridge circuit, R1-first resistor, R2-second resistor, R3-third resistor, D-amorphous wire to be measured, 103-sampling module, R4-fourth resistor, 104-signal processing module, 1041-differential amplifier, 1042-integrator, 105-oscilloscope module. DETAILED DESCRIPTION
[0033] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.
[0034] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, the present application is further described in detail below in conjunction with the accompanying drawings and specific implementation methods.
[0035] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application can be combined with each other. Figures 1 to 3 The amorphous wire annular hysteresis loop measurement device and measurement method provided in the embodiments of the present application are described in detail.
[0036] Please refer to Figure 1, which is a structural block diagram of an amorphous wire annular hysteresis loop measuring device provided in an embodiment of the present application, the amorphous wire annular hysteresis loop measuring device 10 includes a signal source 101, a measuring module 102, a sampling module 103, a signal processing module 104 and an oscilloscope module 105, the measuring module 102 includes a bridge circuit 1021, and the first branch of the bridge circuit 1021 is provided with a first resistor R1, and the second branch is provided with an amorphous wire D to be measured, and the resistance value of the first resistor R1 is equal to the DC resistance value of the amorphous wire D to be measured.
[0037] Among them, the first end of the signal source 101 is connected to the first end of the bridge circuit 1021, the second end of the signal source 101 is respectively connected to the first end of the sampling module 103 and the first end of the oscilloscope module 105, the second end of the sampling module 103 is respectively connected to the second end of the bridge circuit 1021 and the second end of the oscilloscope module 105, and the third end of the bridge circuit 1021 is connected to the first end of the signal processing module 104, the fourth end of the bridge circuit 1021 is connected to the second end of the signal processing module 104, and the third end of the signal processing module 104 is connected to the third end of the oscilloscope module 105. During actual measurement, the signal source 101 outputs a current that can excite the amorphous wire D to be measured to generate a toroidal magnetic field, the measuring module 102 can measure the toroidal magnetization of the amorphous wire D to be measured through the bridge circuit 1021, the sampling module 103 can sample the current signal of the bridge circuit 1021, the signal processing module 104 can process the voltage signal of the bridge circuit 1021, and the oscilloscope module 105 can generate a voltage signal according to the current signal and the voltage signal. Figure 2 The annular hysteresis loop of the amorphous wire to be tested is shown.
[0038] In some embodiments of the present application, the bridge circuit 1021 may further include a second resistor R2 located in the third branch and a third resistor R3 located in the fourth branch, and the first end of the second resistor R2 (corresponding to the first end of the bridge circuit 1021) is connected to the first end of the signal source 101, the second end of the second resistor R2 (corresponding to the third end of the bridge circuit 1021) is respectively connected to the first end of the amorphous wire D to be measured and the first end of the signal processing module 104, the first end of the third resistor R3 is connected to the first end of the second resistor R2, the second end of the third resistor R3 (corresponding to the fourth end of the bridge circuit 1021) is respectively connected to the first end of the first resistor R1 and the second end of the signal processing module 104, and the second end of the first resistor R1 (corresponding to the second end of the bridge circuit 1021) is respectively connected to the second end of the amorphous wire D to be measured and the second end of the sampling module 103. For example, in the embodiment of the present application, the signal source 101 is a function generator, and when measuring the annular hysteresis loop of the amorphous wire D to be measured, the function generator operates in a sinusoidal signal mode. For another example, in the embodiment of the present application, the first resistor R1 is a variable resistor (potentiometer). The advantage of such a setting is that it is convenient to quickly adjust the resistance value of the first resistor R1 so that it is equal to the DC resistance value of the amorphous wire D to be measured, thereby eliminating the need for disassembly and replacement, having strong reusability and reducing measurement costs.
[0039] In some embodiments of the present application, the sampling module 103 may include a fourth resistor R4, a first end of the fourth resistor R4 (corresponding to the first end of the sampling module 103) is respectively connected to the second end of the signal source 101 and the first end of the oscilloscope module 105, and a second end of the fourth resistor R4 (corresponding to the second end of the sampling module 103) is respectively connected to the second end of the bridge circuit 1021 and the second end of the oscilloscope module 105. For example, in the embodiment of the present application, the fourth resistor R4 of the sampling module 103 can be arranged on the same printed circuit board (PCB) as the first resistor R1, the second resistor R2, the third resistor R3 of the bridge circuit 1021, and the amorphous wire D to be measured.
[0040] Further, in some embodiments of the present application, the signal processing module 104 may include a differential amplifier 1041 and an integrator 1042, the first end of the differential amplifier 1041 (corresponding to the first end of the signal processing module 104) is connected to the third end of the bridge circuit 1021, the second end of the differential amplifier 1041 (corresponding to the second end of the signal processing module 104) is connected to the fourth end of the bridge circuit 1021, the third end of the differential amplifier 1041 is connected to the first end of the integrator 1042, and the second end of the integrator 1042 (corresponding to the third end of the signal processing module 104) is connected to the third end of the oscilloscope module 105. During actual measurement, the differential amplifier 1041 can amplify the voltage difference generated by the unbalanced bridge (corresponding to the first resistor R1, the second resistor R2, the third resistor R3 and the amorphous wire D to be measured), so that the amplified voltage signal can be input to the oscilloscope module 105 through the integrator 1042. For example, in the embodiment of the present application, the oscilloscope module 105 is an oscilloscope. When measuring the toroidal hysteresis loop of the amorphous wire D to be measured, the oscilloscope works in the YX mode.
[0041] The amorphous wire circumferential hysteresis loop measuring device provided in the embodiment of the present application is configured such that an amorphous wire to be measured and a first resistor are arranged in a bridge circuit of a measuring module, and the resistance value of the first resistor is equal to the DC resistance value of the amorphous wire to be measured. Thus, when a signal source outputs a current that can excite the amorphous wire to be measured to generate a circumferential magnetic field, the bridge circuit can be used to measure the circumferential magnetization of the amorphous wire to be measured. Thus, the oscilloscope module can quickly generate the circumferential hysteresis loop of the amorphous wire to be measured according to the current signal of the bridge circuit collected by the sampling module and the voltage signal of the bridge circuit processed by the signal processing module. The device has high accuracy, is simple to operate, and is convenient and efficient.
[0042] Based on the above embodiments, the present invention provides a method for measuring the annular hysteresis loop of an amorphous wire. The method can be used to measure the annular hysteresis loop of an amorphous wire. Figure 1 to Figure 2 The amorphous wire annular hysteresis loop measuring device 10 of the corresponding embodiment. Please refer to Figure 3 , which is a flow chart of a method for measuring annular hysteresis loop of an amorphous wire provided in an embodiment of the present application, the method specifically comprises the following steps:
[0043] S101, fixing the amorphous wire to be measured in the bridge circuit of the measuring module.
[0044] Illustratively, in an embodiment of the present application, a cutting pair can be used to cut a 2-cm-long amorphous wire D to be tested, and a low-temperature solder with a melting point of 143 degrees Celsius is selected to solder the amorphous wire D to be tested to the bridge circuit 1021 on the printed circuit board. The welding temperature is set to 180 degrees Celsius and the welding time is set to 1 second.
[0045] S102, measuring the DC resistance of the amorphous wire to be measured, and making the resistance of the first resistor equal to the DC resistance of the amorphous wire to be measured.
[0046] Exemplarily, the embodiment of the present application can use the resistance range of a multimeter to measure the DC resistance of the amorphous wire D to be tested, and then adjust the potentiometer (corresponding to the first resistor R1) so that the resistance value of the first resistor R1 is equal to the DC resistance value of the amorphous wire D to be tested.
[0047] S103, adjusting the operating frequency and amplitude of the signal source, and displaying the toroidal hysteresis loop of the amorphous wire to be tested when the oscilloscope module is in YX mode.
[0048] For example, the coercive force H of the toroidal hysteresis loop of the amorphous wire D to be measured in the embodiment of the present application is c It can be obtained by formula (1):
[0049]
[0050] In formula (1), U1 represents the voltage across the fourth resistor in the sampling module, that is, the voltage corresponding to the oscilloscope channel 1, r represents the radius of the amorphous wire to be measured, and R4 represents the resistance value of the fourth resistor in the sampling module.
[0051] For example, the magnetization intensity M of the toroidal hysteresis loop of the amorphous wire D to be measured in the embodiment of the present application can be obtained by formula (2):
[0052]
[0053] In formula (2), R represents the resistance of the integrator resistor in the signal processing module, C represents the capacitance of the integrator capacitor in the signal processing module, U2 represents the voltage after being processed by the signal processing module, that is, the voltage corresponding to the second channel of the oscilloscope, G represents the gain of the differential amplifier in the signal processing module, r represents the radius of the amorphous wire to be measured, and L represents the length of the amorphous wire to be measured. In addition, the embodiment of the present application can also calculate the remanence B according to the annular hysteresis loop r And the saturation magnetic induction intensity B s Parameters such as magnetic field and magnetic field can provide valuable key information for magnetic sensor design.
[0054] It should be noted that, for the description of the same steps and the same contents in this embodiment as those in other embodiments, reference can be made to the description in other embodiments and will not be repeated here.
[0055] The method for measuring the annular hysteresis loop of an amorphous wire provided in the embodiment of the present application is achieved by setting the amorphous wire to be measured and a first resistor in the bridge circuit of the measuring module, and the resistance value of the first resistor is equal to the DC resistance value of the amorphous wire to be measured. Therefore, when the signal source outputs a current that can excite the amorphous wire to be measured to generate an annular magnetic field, the bridge circuit can be used to measure the annular magnetization of the amorphous wire to be measured. As a result, the oscilloscope module can quickly generate the annular hysteresis loop of the amorphous wire to be measured according to the current signal of the bridge circuit collected by the sampling module and the voltage signal of the bridge circuit processed by the signal processing module. The method has high accuracy, simple operation, convenience and efficiency.
[0056] The technical features of the above embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0057] This article uses specific examples to illustrate the principles and implementation methods of this application. The description of the above embodiments is only used to help understand the method and core ideas of this application. At the same time, for those skilled in the art, according to the ideas of this application, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as limiting this application.
Claims
1. A device for measuring the annular hysteresis loop of an amorphous wire, characterized in that: The amorphous wire annular hysteresis loop measuring device comprises a signal source, a measuring module, a sampling module, a signal processing module and an oscilloscope module, wherein the measuring module comprises a bridge circuit, wherein a first branch of the bridge circuit is provided with a first resistor, and a second branch is provided with an amorphous wire to be measured, and the resistance value of the first resistor is equal to the DC resistance value of the amorphous wire to be measured; The first end of the signal source is connected to the first end of the bridge circuit, the second end of the signal source is respectively connected to the first end of the sampling module and the first end of the oscilloscope module, the second end of the sampling module is respectively connected to the second end of the bridge circuit and the second end of the oscilloscope module, the third end of the bridge circuit is connected to the first end of the signal processing module, the fourth end of the bridge circuit is connected to the second end of the signal processing module, and the third end of the signal processing module is connected to the third end of the oscilloscope module; The signal source is configured to output a current that can excite the amorphous wire to be tested to generate a toroidal magnetic field; the measurement module is configured to measure the toroidal magnetization of the amorphous wire to be tested through the bridge circuit; the sampling module is configured to sample the current signal of the bridge circuit; the signal processing module is configured to process the voltage signal of the bridge circuit; the oscilloscope module is configured to generate a toroidal hysteresis loop of the amorphous wire to be tested based on the current signal and the voltage signal.
2. The amorphous wire annular hysteresis loop measuring device according to claim 1, characterized in that: The bridge circuit further includes a second resistor located in the third branch and a third resistor located in the fourth branch; The first end of the second resistor is connected to the first end of the signal source, the second end of the second resistor is respectively connected to the first end of the amorphous wire to be tested and the first end of the signal processing module, the first end of the third resistor is connected to the first end of the second resistor, the second end of the third resistor is respectively connected to the first end of the first resistor and the second end of the signal processing module, and the second end of the first resistor is respectively connected to the second end of the amorphous wire to be tested and the second end of the sampling module.
3. The amorphous wire annular hysteresis loop measuring device according to claim 2, characterized in that: The first resistor is a variable resistor.
4. The amorphous wire annular hysteresis loop measuring device according to claim 1, characterized in that: The sampling module includes a fourth resistor, a first end of the fourth resistor is respectively connected to the second end of the signal source and the first end of the oscilloscope module, and a second end of the fourth resistor is respectively connected to the second end of the bridge circuit and the second end of the oscilloscope module.
5. The device for measuring the annular hysteresis loop of an amorphous wire according to any one of claims 1 to 4, characterized in that: The signal processing module includes a differential amplifier and an integrator, wherein a first end of the differential amplifier is connected to a third end of the bridge circuit, a second end of the differential amplifier is connected to a fourth end of the bridge circuit, a third end of the differential amplifier is connected to a first end of the integrator, and a second end of the integrator is connected to a third end of the oscilloscope module.
6. The device for measuring the annular hysteresis loop of an amorphous wire according to claim 5, characterized in that: The signal source is a function generator, wherein when measuring the toroidal hysteresis loop of the amorphous wire to be measured, the function generator works in a sinusoidal signal mode.
7. The device for measuring the annular hysteresis loop of an amorphous wire according to claim 5, characterized in that: The oscilloscope module is an oscilloscope, wherein when measuring the toroidal hysteresis loop of the amorphous wire to be measured, the oscilloscope works in a YX mode.
8. A method for measuring the annular hysteresis loop of an amorphous wire, characterized in that: The method for measuring the annular hysteresis loop of an amorphous wire is used for the device for measuring the annular hysteresis loop of an amorphous wire according to any one of claims 1 to 7, and the method for measuring the annular hysteresis loop of an amorphous wire comprises: Fixing the amorphous wire to be measured in the bridge circuit of the measuring module; Measuring the DC resistance of the amorphous wire to be measured, and making the resistance of the first resistor equal to the DC resistance of the amorphous wire to be measured; The operating frequency and amplitude of the signal source are adjusted, and the toroidal hysteresis loop of the amorphous wire to be tested is displayed when the oscilloscope module is in YX mode.
9. The method for measuring the annular hysteresis loop of an amorphous wire according to claim 8, characterized in that: The coercive force H of the annular hysteresis loop c Obtained by the following formula: In the above formula, U1 represents the voltage across the fourth resistor in the sampling module, r represents the radius of the amorphous wire to be measured, and R4 represents the resistance value of the fourth resistor in the sampling module.
10. The method for measuring the annular hysteresis loop of an amorphous wire according to claim 8, characterized in that: The magnetization intensity M of the annular hysteresis loop is obtained by the following formula: In the above formula, R represents the resistance of the integrator resistor in the signal processing module, C represents the capacitance of the integrator capacitor in the signal processing module, U2 represents the voltage processed by the signal processing module, G represents the gain of the differential amplifier in the signal processing module, r represents the radius of the amorphous wire to be measured, and L represents the length of the amorphous wire to be measured.