Method, device and equipment for determining parameters of a refractive layer, and storage medium

Abstract

The application provides a method and device for determining parameters of a refractive layer, equipment and a storage medium. The method comprises the following steps: obtaining shot gather first arrival data of a work area; determining common midpoint first arrival data based on the shot gather first arrival data, performing moveout correction on the common midpoint first arrival data to obtain corrected data; determining offset distance range segments corresponding to the number of layers of the refractive layer of the work area based on the corrected data; dividing the corrected data into segmented corrected data corresponding to the offset distance range segments; performing least square linear fitting on each segmented corrected data to obtain a fitting straight line corresponding to each offset distance range segment; calculating a chi-square value corresponding to each offset distance based on the fitting straight line; determining an offset distance corresponding to each refractive layer based on the chi-square value corresponding to each offset distance; and calculating a velocity and a thickness corresponding to each refractive layer based on the offset distance corresponding to each refractive layer.

Description

Technical Field

[0001] This application relates to the field of petroleum geophysical exploration technology, and in particular to a method, apparatus, equipment and storage medium for determining refractive layer parameters. Background Technology

[0002] Refraction static correction is a reference surface static correction that estimates the refraction velocity and the velocity and thickness of the weathering layer using refraction or first-arrival travel time. Accurate estimation of the weathering layer velocity and thickness can improve the calculation of weathering layer correction, thereby enhancing the effectiveness of reference surface static correction.

[0003] In simple cases, the initial refraction model of the work area can be constructed by analyzing the first arrival time and offset. Generally, the user interactively selects the minimum and maximum offset for the refraction layer analysis, and chooses the best linear fit for the first arrival time, thus obtaining the intercept time and the refraction layer velocity. The intercept time is the zero-offset projection of the best-fit line, equal to the sum of the average shot-receiver delay times.

[0004] However, the construction of the refraction layer based on the analysis of the first arrival time and offset distance can vary from person to person. Furthermore, users will not include all the first arrival times and offset distances of the common center point in the process of constructing the refraction layer. On the one hand, the amount of data is relatively large, which will increase the workload significantly. On the other hand, the refraction layer data obtained by each person will vary, and the results will also be very different. Summary of the Invention

[0005] To address the aforementioned issues, this application provides a method, apparatus, device, and storage medium for determining refractive layer parameters, which can automatically pick up the refractive layer and ensure that each common center point is picked up, reducing user interaction workload and improving computational efficiency.

[0006] This application provides a method for determining the parameters of a refractive layer, including:

[0007] Acquire the initial arrival data of the shot gather in the work area; determine the initial arrival data of the common center point based on the initial arrival data of the shot gather, and perform dynamic correction on the initial arrival data of the common center point to obtain the corrected data;

[0008] Based on the number of refractive layers in the work area and the correction data, determine the offset range segment corresponding to the number of layers; divide the correction data into segmented correction data corresponding to the offset range segment;

[0009] Each segment of the correction data is fitted with least squares linear data to obtain the fitted straight line corresponding to each offset range segment.

[0010] Calculate the chi-square value corresponding to each offset distance based on the fitted straight line; determine the offset distance corresponding to each refractive layer based on the chi-square value corresponding to each offset distance.

[0011] The velocity and thickness of each refractive layer are calculated based on the offset distance of each refractive layer.

[0012] In some embodiments, determining the common center point initial arrival data based on the shot gather initial arrival data includes:

[0013] Determine the range of the shot point in each bubble point and the range of the receiver point in each receiver point of the first arrival data of the shot gather;

[0014] Determine the grid domain data range of each grid in the map of the work area;

[0015] The shot point and receiver point corresponding to the grid domain data range of each grid are determined based on the grid domain data range, the shot point range of each bubble point, and the receiver point range of each receiver point.

[0016] The center point coordinates are calculated based on the shot point coordinates and receiver point coordinates corresponding to the grid domain data range of each grid.

[0017] The initial arrival data of the common center point are determined based on the coordinates of the center point.

[0018] In some embodiments, the center point coordinates are calculated based on the shot point coordinates and receiver point coordinates corresponding to the grid domain data range of each grid, including:

[0019] The x-coordinate of the center point is calculated based on the x-coordinate of the shot point and the x-coordinate of the receiver point in the grid domain data of each grid.

[0020] The ordinates of the center point are calculated based on the ordinates of the shot point and the receiver point to obtain the center point coordinates.

[0021] In some embodiments, the step of dynamically correcting the initial arrival data of the common center point to obtain corrected data includes:

[0022] The fitting speed is determined by fitting the initial arrival time and offset of the common center point initial arrival data;

[0023] Determine the speed range based on the fitted speed;

[0024] Based on the speed range and speed increment, the initial arrival data of the common center point are dynamically corrected to obtain corrected data.

[0025] In some embodiments, determining the offset range corresponding to the number of refractive layers in the work area and the correction data includes:

[0026] Based on the correction data, the offset range of all refractive layers is determined by fitting the Kalman distribution.

[0027] The offset range of all refractive layers is divided into offset range segments corresponding to the number of layers.

[0028] In some embodiments, determining the offset distance corresponding to each refractive layer based on the chi-square value corresponding to each offset distance includes:

[0029] The minimum chi-square value is determined by the chi-square value corresponding to each offset distance in two adjacent offset distance ranges;

[0030] The offset position corresponding to the minimum chi-square value is determined as the boundary position between two adjacent refractive layers;

[0031] The offset distance of each refractive layer is determined based on the boundary position of two adjacent refractive layers.

[0032] In some embodiments, calculating the velocity and thickness of each refractive layer based on the offset distance of each refractive layer includes:

[0033] Based on the offset distance corresponding to each refractive layer, the velocity and thickness of each refractive layer are calculated using a formula, wherein the formula includes:

[0034]

[0035] Among them, h k With v k These are the thickness and velocity of the k-th refractive layer, respectively, α k =sin -1 (v k / v n ), t is the travel time of the refracted wave from the shot point to the receiver point, x is the offset distance, v n Let be the velocity of the nth refractive layer.

[0036] This application provides an apparatus for determining refractive layer parameters, comprising:

[0037] The acquisition module is used to acquire the initial arrival data of the shot gather in the work area; determine the initial arrival data of the common center point based on the initial arrival data of the shot gather; and perform dynamic correction on the initial arrival data of the common center point to obtain the corrected data.

[0038] The determination module is used to determine the offset range segment corresponding to the number of refractive layers in the work area and the correction data; and to divide the correction data into segmented correction data corresponding to the offset range segment.

[0039] The fitting module is used to perform least-squares linear fitting on each segment of the correction data to obtain the fitting line corresponding to each offset range segment.

[0040] The first calculation module is used to calculate the chi-square value corresponding to each offset distance based on the fitted straight line; and to determine the offset distance corresponding to each refractive layer based on the chi-square value corresponding to each offset distance.

[0041] The second calculation module is used to calculate the velocity and thickness of each refractive layer based on the offset distance of each refractive layer.

[0042] This application provides an electronic device, including a memory and a processor. The memory stores a computer program, which, when executed by the processor, performs the method for determining the refractive layer parameters described above.

[0043] This application provides a storage medium storing a computer program that can be executed by one or more processors and can be used to implement the method for determining the refractive layer parameters described in any of the above claims.

[0044] This application provides a method, apparatus, device, and storage medium for determining refractive layer parameters. The method involves: acquiring initial arrival data of the shot gather for a work area; determining initial arrival data of common midpoints based on the initial arrival data of the shot gather; performing dynamic correction on the initial arrival data of common midpoints to obtain corrected data; determining the offset range corresponding to the number of refractive layers in the work area based on the corrected data; dividing the corrected data into segmented corrected data corresponding to the offset range; performing least-squares linear fitting on each segmented corrected data to obtain a fitted straight line corresponding to each offset range; calculating the chi-square value corresponding to each offset based on the fitted straight line; determining the offset corresponding to each refractive layer based on the chi-square value corresponding to each offset; and calculating the velocity and thickness corresponding to each refractive layer based on the offset corresponding to each refractive layer. This method can automatically pick up refractive layers and can pick up each common midpoint, reducing user interaction workload and improving computational efficiency. Attached Figure Description

[0045] The present application will be described in more detail below based on embodiments and with reference to the accompanying drawings.

[0046] Figure 1 A schematic diagram illustrating the implementation process of a method for determining refractive layer parameters provided in an embodiment of this application;

[0047] Figure 2 A schematic diagram illustrating the implementation process of another method for determining refractive layer parameters provided in this application embodiment;

[0048] Figure 3 A schematic diagram illustrating the effect of determining refractive layer parameters according to an embodiment of this application;

[0049] Figure 4 This is a schematic diagram of the composition structure of the electronic device provided in the embodiments of this application.

[0050] In the accompanying drawings, the same parts are referred to by the same reference numerals, and the drawings are not drawn to scale. Detailed Implementation

[0051] To make the objectives, technical solutions, and advantages of this application clearer, the application will be further described in detail below with reference to the accompanying drawings. The described embodiments should not be regarded as limitations on this application. All other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0052] In the following description, references are made to “some embodiments,” which describe a subset of all possible embodiments. However, it is understood that “some embodiments” may be the same subset or different subsets of all possible embodiments and may be combined with each other without conflict.

[0053] If the application documents contain similar descriptions such as "first, second, third", the following explanation shall be added: In the following description, the terms "first, second, third" are used only to distinguish similar objects and do not represent a specific order of objects. It is understood that "first, second, third" may be interchanged in a specific order or sequence where permitted, so that the embodiments of this application described herein can be implemented in an order other than that illustrated or described herein.

[0054] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing embodiments of this application only and is not intended to limit this application.

[0055] Example 1

[0056] To address the problems existing in related technologies, this application provides a method for determining refractive layer parameters. The method can be executed by an electronic device, such as a mobile terminal or a computer, and the computer can be a server. The function implemented by the method for determining refractive layer parameters provided in this application can be achieved by the processor of the electronic device calling program code, wherein the program code can be stored in a computer storage medium.

[0057] This application provides a method for determining the parameters of a refractive layer. Figure 1 A schematic diagram illustrating the implementation flow of a method for determining refractive layer parameters provided in this application embodiment is shown below. Figure 1 As shown, it includes:

[0058] Step S101: Obtain the initial arrival data of the shot gather in the work area, determine the initial arrival data of the common center point based on the initial arrival data of the shot gather, and perform dynamic correction on the initial arrival data of the common center point to obtain the corrected data.

[0059] In this application embodiment, the electronic device can obtain the initial arrival data of the shot collection from the database. In some embodiments, the electronic device can communicate with the initial arrival acquisition device to obtain the initial arrival data of the shot collection through the initial arrival acquisition device.

[0060] In this embodiment of the application, the common center point initial arrival data can be obtained by organizing the initial arrival data of the shot collection.

[0061] In this embodiment of the application, determining the common center point initial arrival data based on the shot gather initial arrival data can be achieved through the following steps:

[0062] Step S1: Determine the range of each shot point and the range of each receiver point in the initial arrival data of the shot gather.

[0063] In this embodiment of the application, the shot point [bx,ex] and receiver range [by,ey] of all shot gather first arrival data can be calculated, where bx represents the starting value in the x-direction under local coordinates, and ex represents the ending value in the x-direction under local coordinates; where by represents the starting value in the y-direction under local coordinates, and ey represents the ending value in the y-direction under local coordinates.

[0064] Step S2: Determine the grid domain data range of each grid in the map of the work area.

[0065] In this embodiment of the application, the grid domain data range of each grid in the map of the work area can be directly obtained. Let the range of the x direction be gx and the range of the y direction be gy. The grid size and its corresponding index in the two directions are calculated based on [bx,ex], [by,ey] and gx and gy.

[0066] Step S3: Determine the shot point and receiver point corresponding to the grid domain data range of each grid based on the grid domain data range, the shot point range of each bubble point, and the receiver point range of each receiver point.

[0067] Step S4: Calculate the center point coordinates based on the shot point coordinates and receiver point coordinates corresponding to the grid domain data range of each grid.

[0068] In this embodiment of the application, for any initial arrival data, the abscissa of the center point is calculated based on the abscissa of the shot point and the abscissa of the receiver point in the grid domain data range of each grid; the ordinate of the center point is calculated based on the ordinate of the shot point and the ordinate of the receiver point to obtain the coordinates of the center point.

[0069] Continuing with the example above, for any first arrival data, the midpoint is calculated as follows: (The original text contains some formatting errors and inconsistencies. A more accurate translation would require the full context.) The index position of this coordinate in the grid [gIdx,gIdy] can also be calculated.

[0070] Step S5: Determine the initial arrival data of the common center point based on the coordinates of the center point.

[0071] The initial arrival data corresponding to the same center point can be determined as the initial arrival dataset for key points.

[0072] In this embodiment of the application, dynamic correction is performed on the initial arrival data of the common center point to obtain corrected data, which can be achieved through the following steps:

[0073] Step S6: Determine the fitting speed by fitting the initial arrival time and offset distance of the initial arrival data of the common center point.

[0074] In this embodiment of the application, for any common center point initial arrival data, a fitting velocity v0 is obtained by fitting the initial arrival time and offset distance.

[0075] Step S7: Determine the speed range based on the fitted speed.

[0076] In this embodiment, a velocity offset value can be set, and a velocity range can be obtained through the velocity offset value. For example, based on the fitted velocity v0, a velocity range [v0-v0] is then given. m v0+v m ].

[0077] Step S8: Perform dynamic correction on the initial arrival data of the common center point based on the speed range and speed increment to obtain corrected data.

[0078] In this embodiment of the application, the value of the speed increment can be set, but the speed increment is much smaller than the speed offset value.

[0079] For example, a velocity increment v is given within the interval. d Range, where v d < <v m Dynamic correction is performed on the initial arrival data.

[0080] Step S102: Determine the offset range segment corresponding to the number of refractive layers in the work area and the correction data; divide the correction data into segmented correction data corresponding to the offset range segment.

[0081] In this embodiment of the application, if there are multiple layers, then there are multiple offset ranges.

[0082] In this embodiment of the application, the user can input the number of refractive layers. The user can determine the number of refractive layers based on their understanding of the work area and their viewing of the data. Generally, it is 2 or 3 layers.

[0083] In this embodiment of the application, determining the offset range corresponding to the number of refractive layers in the work area and the correction data can be achieved through the following steps:

[0084] Step S21: Based on the correction data, perform a Kalfa distribution fitting to determine the offset range of all refractive layers.

[0085] In this embodiment of the application, the offset range of all refractive layers can be calculated by fitting the Kalman distribution.

[0086] For example, the offset range is calculated to be (0, off) max ), where off max This represents the maximum offset distance in the data of the common center point.

[0087] Step S22: Divide the offset range of all refractive layers into offset range segments corresponding to the number of layers.

[0088] In this embodiment of the application, the offset range has 2 segments for 2 layers and 3 segments for 3 layers.

[0089] For example, taking two refractive layers as an example, assuming that the common center point data contains n seismic traces, a migration step size Δ is given. off , will be located at the offset distance (0, off max All seismic gather data within the range are divided into two groups. One group consists of seismic traces with offsets ranging from (0, j*Δ). off The data includes k seismic traces, and another set of seismic traces has an offset range of (j*Δ). off ,off max ), which includes seismic trace data in nk traces.

[0090] Step S103: Perform least-squares linear fitting on each segmented correction data to obtain the fitting line corresponding to each offset range segment.

[0091] Continuing with the example above, least-squares linear fitting is performed on the two sets of piecewise correction data respectively. For the i-th seismic trace, its set of information regarding first arrival time and offset is obtained (fa). i ,off i Based on the offset step size, calculate the minimum linear fitting line for each of the two sets of data. r1 ={line r11 ,line r12 ,……,liner1k}, line r2 ={line r2(k+1) ,……,line r2n}

[0092] Step S104: Calculate the chi-square value corresponding to each offset distance based on the fitted straight line; determine the offset distance corresponding to each refractive layer based on the chi-square value corresponding to each offset distance.

[0093] Continuing with the example above, for the same offset, there are both actual initial arrival values ​​and linearly fitted values, and the chi-square value of the first fitted line relative to the actual value. The chi-square value of the second fitted line relative to the actual value Among them, fa i This is the actual value.

[0094] In this embodiment, determining the offset distance of each refractive layer based on the chi-square value corresponding to each offset distance can be achieved through the following steps:

[0095] Step S41: Determine the minimum chi-square value from the chi-square values ​​corresponding to each offset distance in two adjacent offset distance range segments.

[0096] In this embodiment, the two chi-square values ​​are summed to calculate the chi-square values ​​corresponding to different offset positions, and the offset position corresponding to the minimum chi-square value is statistically determined.

[0097] Step S42: Determine the offset position corresponding to the minimum chi-square value as the boundary position between two adjacent refractive layers.

[0098] In this embodiment, the offset position corresponding to the minimum chi-square value is the boundary position between two adjacent refractive layers.

[0099] Step S43: Determine the offset distance of each refractive layer based on the boundary position of two adjacent refractive layers.

[0100] Step S105: Calculate the velocity and thickness of each refractive layer based on the offset distance of each refractive layer.

[0101] In this embodiment of the application, the velocity and thickness of each refractive layer can be calculated using a formula based on the offset distance corresponding to each refractive layer. The formula includes:

[0102]

[0103] Among them, h k With v k These are the thickness and velocity of the k-th refractive layer, respectively, α k =sin -1 (v k / vn ), t is the travel time of the refracted wave from the shot point to the receiver point, x is the offset distance, v n Let be the velocity of the nth refractive layer.

[0104] This application provides a method for determining refractive layer parameters, which involves: acquiring the initial arrival data of the shot gather in the work area; determining the initial arrival data of the common center point based on the initial arrival data of the shot gather; performing dynamic correction on the initial arrival data of the common center point to obtain corrected data; determining the offset range segment corresponding to the number of refractive layers in the work area based on the corrected data; dividing the corrected data into segmented corrected data corresponding to the offset range segment; performing least-squares linear fitting on each segmented corrected data to obtain a fitted line corresponding to each offset range segment; calculating the chi-square value corresponding to each offset based on the fitted line; determining the offset distance corresponding to each refractive layer based on the chi-square value corresponding to each offset; and calculating the velocity and thickness corresponding to each refractive layer based on the offset distance corresponding to each refractive layer. This method can automatically pick up refractive layers and can pick up each common center point, reducing the user's interactive workload and improving computational efficiency.

[0105] Example 2

[0106] Based on the foregoing embodiments, this application further provides a method for determining the parameters of the refractive layer. Figure 2 A schematic diagram illustrating the implementation flow of a method for determining refractive layer parameters provided in this application embodiment is shown below. Figure 2 As shown, it includes:

[0107] Step S201: Organize the initial arrival data of the shot collection into the common center point domain.

[0108] In this embodiment of the application, the range of shot point and receiver point for all first arrival data is calculated as: [bx,ex],[by,ey], where bx represents the starting value in the x-direction under local coordinates, and ex represents the ending value in the x-direction under local coordinates; where by represents the starting value in the y-direction under local coordinates, and ey represents the ending value in the y-direction under local coordinates.

[0109] Given the grid domain data range with the shot point and receiver point as the base map of the work area, let the range in the x direction be gx and the range in the y direction be gy; calculate the grid size and its corresponding index in the two directions based on [bx,ex], [by,ey] and gx, gy.

[0110] For any initial arrival point, the shot point [sx, sy] and receiver point [rx, ry] in their corresponding local coordinates are calculated as follows: The index position of this coordinate in the grid [gIdx,gIdy] can also be calculated.

[0111] Step S202, give the number of refractive layers.

[0112] In this embodiment of the application, the user determines the number of refractive layers based on their understanding of the work area and their viewing of the data; typically, it is 2 or 3 layers.

[0113] Step S203: Perform dynamic correction on the initial arrival data, and then use the multi-segment card method to fit the data after dynamic correction.

[0114] In this embodiment, for any common center point initial arrival data, a fitted velocity v0 is obtained by fitting the initial arrival time and offset distance; based on the fitted velocity v0, a velocity range [v0-v] is then given. m v0+v m Within this interval, a velocity increment v is given. d Range, where v d <<v m Dynamic correction is performed on the initial arrival data; for the dynamically corrected data, taking a two-layer refractive layer as an example, the Kalman distribution is fitted, and the (0, off) values ​​are statistically analyzed. max ), where off max This represents the maximum offset within the common center point data; assuming the common center point data contains n seismic traces, a offset movement step size Δ is given. off , will be located at the offset distance (0, off max All seismic gather data within the range are divided into two groups. One group consists of seismic traces with offsets ranging from (0, j*Δ). off The data includes k seismic traces, and another set of seismic traces has an offset range of (j*Δ). off ,off max The dataset contains seismic traces in trace nk. Least squares linear fitting is performed on the first arrivals of both trace sets. For the i-th trace, the set of first arrival times and offsets (fai,offi) is obtained. Based on the offset step size, the minimum linear fitting line for each trace is calculated. r1 ={line r11 ,line r12 ,……,line r1k}, line r2 ={line r2(k+1) ,……,line r2n For the same offset, there are actual initial arrival values ​​and linearly fitted values, and the chi-square value of the first fitted line relative to the actual value. The chi-square value of the second fitted line relative to the actual value Then, the two chi-square values ​​are summed to calculate the chi-square value corresponding to different offset positions, and the offset position corresponding to the minimum chi-square value is calculated. This position is the position where the two refractive layers decompose.

[0115] Step S204: Determine the start and end offsets of each segment based on the principle of minimizing the error between the fitted value and the actual value.

[0116] In this embodiment of the application, for each dynamic correction, the position and chi-square value of the refractive layer boundary are calculated, all chi-square values ​​are counted, and the boundary position corresponding to the minimum value is found, which is the final refractive layer boundary position. The offset range is determined based on this position.

[0117] Step S205: Calculate the speed and thickness based on the offset of each segment.

[0118] In this embodiment, it is assumed that the surface undulations are small and approximately horizontal. It is also assumed that the stratum velocity interface undulations are small and approximately horizontal. In this case, the time-distance curve of the refracted wave in the multilayer medium is... Where h k With v k These are the thickness and velocity of the k-th layer, respectively, α k =sin -1 (v k / v n The speed and thickness of each layer are calculated using this formula.

[0119] To verify the effectiveness of this invention, data from the Loess Plateau with low signal-to-noise ratio and large elevation variations were selected for testing. Figure 3 A schematic diagram illustrating the effect of determining refractive layer parameters provided in an embodiment of this application is shown below. Figure 3 As shown, the initial arrival data from the common center point yields two refraction layers. The data segment on the left with a small offset represents the direct wave data, the corresponding data segment on the right represents the first refraction layer data, and the second data segment corresponding to the blue data represents the second refraction layer data.

[0120] The method provided in this application can automatically pick up the refractive layer and can pick up each common center point, reducing the amount of user interaction while improving efficiency.

[0121] Example 3

[0122] Based on the foregoing embodiments, this application provides a device for determining refractive layer parameters. The various modules and units included in the device can be implemented by a processor in a computer device; of course, they can also be implemented by specific logic circuits. In the implementation process, the processor can be a central processing unit (CPU), a microprocessor (MPU), a digital signal processor (DSP), or a field programmable gate array (FPGA), etc.

[0123] This application provides a device for determining the parameters of a refractive layer, the device comprising:

[0124] The acquisition module is used to acquire the initial arrival data of the shot gather in the work area; determine the initial arrival data of the common center point based on the initial arrival data of the shot gather; and perform dynamic correction on the initial arrival data of the common center point to obtain the corrected data.

[0125] The determination module is used to determine the offset range segment corresponding to the number of refractive layers in the work area and the correction data; and to divide the correction data into segmented correction data corresponding to the offset range segment.

[0126] The fitting module is used to perform least-squares linear fitting on each segment of the correction data to obtain the fitting line corresponding to each offset range segment.

[0127] The first calculation module is used to calculate the chi-square value corresponding to each offset distance based on the fitted straight line; and to determine the offset distance corresponding to each refractive layer based on the chi-square value corresponding to each offset distance.

[0128] The second calculation module is used to calculate the velocity and thickness of each refractive layer based on the offset distance of each refractive layer.

[0129] In some embodiments, determining the common center point initial arrival data based on the shot gather initial arrival data includes:

[0130] Determine the range of the shot point in each bubble point and the range of the receiver point in each receiver point of the first arrival data of the shot gather;

[0131] Determine the grid domain data range of each grid in the map of the work area;

[0132] The shot point and receiver point corresponding to the grid domain data range of each grid are determined based on the grid domain data range, the shot point range of each bubble point, and the receiver point range of each receiver point.

[0133] The center point coordinates are calculated based on the shot point coordinates and receiver point coordinates corresponding to the grid domain data range of each grid.

[0134] The initial arrival data of the common center point are determined based on the coordinates of the center point.

[0135] In some embodiments, the center point coordinates are calculated based on the shot point coordinates and receiver point coordinates corresponding to the grid domain data range of each grid, including:

[0136] The x-coordinate of the center point is calculated based on the x-coordinate of the shot point and the x-coordinate of the receiver point in the grid domain data of each grid.

[0137] The ordinates of the center point are calculated based on the ordinates of the shot point and the receiver point to obtain the center point coordinates.

[0138] In some embodiments, the step of dynamically correcting the initial arrival data of the common center point to obtain corrected data includes:

[0139] The fitting speed is determined by fitting the initial arrival time and offset of the common center point initial arrival data;

[0140] Determine the speed range based on the fitted speed;

[0141] Based on the speed range and speed increment, the initial arrival data of the common center point are dynamically corrected to obtain corrected data.

[0142] In some embodiments, determining the offset range corresponding to the number of refractive layers in the work area and the correction data includes:

[0143] Based on the correction data, the offset range of all refractive layers is determined by fitting the Kalman distribution.

[0144] The offset range of all refractive layers is divided into offset range segments corresponding to the number of layers.

[0145] In some embodiments, determining the offset distance corresponding to each refractive layer based on the chi-square value corresponding to each offset distance includes:

[0146] The minimum chi-square value is determined by the chi-square value corresponding to each offset distance in two adjacent offset distance ranges;

[0147] The offset position corresponding to the minimum chi-square value is determined as the boundary position between two adjacent refractive layers;

[0148] The offset distance of each refractive layer is determined based on the boundary position of two adjacent refractive layers.

[0149] In some embodiments, calculating the velocity and thickness of each refractive layer based on the offset distance of each refractive layer includes:

[0150] Based on the offset distance corresponding to each refractive layer, the velocity and thickness of each refractive layer are calculated using a formula, wherein the formula includes:

[0151]

[0152] Among them, h k With v k These are the thickness and velocity of the k-th refractive layer, respectively, α k =sin -1 (v k / v n ), t is the travel time of the refracted wave from the shot point to the receiver point, x is the offset distance, v n Let be the velocity of the nth refractive layer.

[0153] It should be noted that, in the embodiments of this application, if the method for determining the refractive layer parameters described above is implemented as a software functional module and sold or used as an independent product, it can also be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the embodiments of this application, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), magnetic disks, or optical disks. Thus, the embodiments of this application are not limited to any specific hardware and software combination.

[0154] Accordingly, this application provides a storage medium storing a computer program thereon, characterized in that the computer program, when executed by a processor, implements the steps in the method for determining the refractive layer parameters provided in the above embodiments.

[0155] Example 4

[0156] This application provides an electronic device, which may be a master node or a computing node. Figure 4 This is a schematic diagram of the composition structure of the electronic device provided in the embodiments of this application, such as... Figure 4As shown, the electronic device 700 includes: a processor 701, at least one communication bus 702, a user interface 703, at least one external communication interface 704, and a memory 705. The communication bus 702 is configured to enable communication between these components. The user interface 703 may include a display screen, and the external communication interface 704 may include standard wired and wireless interfaces. The processor 701 is configured to execute a program for determining refractive layer parameters stored in the memory, to implement the steps in the method for determining refractive layer parameters provided in the above embodiment.

[0157] The descriptions of the above embodiments of the electronic devices and storage media are similar to those of the above method embodiments, and have similar beneficial effects. For technical details not disclosed in the embodiments of the computer devices and storage media of this application, please refer to the descriptions of the method embodiments of this application for understanding.

[0158] It should be understood that the phrase "one embodiment" or "an embodiment" throughout the specification means that a specific feature, structure, or characteristic related to the embodiment is included in at least one embodiment of this application. Therefore, "in one embodiment" or "in an embodiment" appearing throughout the specification does not necessarily refer to the same embodiment. Furthermore, these specific features, structures, or characteristics can be combined in any suitable manner in one or more embodiments. It should be understood that in the various embodiments of this application, the sequence numbers of the above-described processes do not imply a sequential order of execution; the execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this application. The sequence numbers of the above-described embodiments are merely descriptive and do not represent the superiority or inferiority of the embodiments.

[0159] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0160] In the several embodiments provided in this application, it should be understood that the disclosed devices and methods can be implemented in other ways. The device embodiments described above are merely illustrative. For example, the division of units is only a logical functional division, and in actual implementation, there may be other division methods, such as: multiple units or components can be combined, or integrated into another system, or some features can be ignored or not executed. In addition, the coupling, direct coupling, or communication connection between the various components shown or discussed can be through some interfaces, and the indirect coupling or communication connection between devices or units can be electrical, mechanical, or other forms.

[0161] The units described above as separate components may or may not be physically separate. The components shown as units may or may not be physical units. They may be located in one place or distributed across multiple network units. Some or all of the units may be selected to achieve the purpose of this embodiment according to actual needs.

[0162] In addition, each functional unit in the various embodiments of this application can be integrated into one processing unit, or each unit can be a separate unit, or two or more units can be integrated into one unit; the integrated unit can be implemented in hardware or in the form of hardware plus software functional units.

[0163] Those skilled in the art will understand that all or part of the steps of the above method embodiments can be implemented by hardware related to program instructions. The aforementioned program can be stored in a computer-readable storage medium. When the program is executed, it performs the steps of the above method embodiments. The aforementioned storage medium includes various media that can store program code, such as mobile storage devices, read-only memory (ROM), magnetic disks, or optical disks.

[0164] Alternatively, if the integrated units described above are implemented as software functional modules and sold or used as independent products, they can also be stored in a computer-readable storage medium. Based on this understanding, the technical solutions of the embodiments of this application, or the parts that contribute to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a controller to execute all or part of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as mobile storage devices, ROMs, magnetic disks, or optical disks.

[0165] The above description is merely an embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A method for determining refractive layer parameters, characterized in that, include: Obtain the initial arrival data of the shot gather in the work area; Based on the initial arrival data of the shot gather, the initial arrival data of the common center point is determined, and the initial arrival data of the common center point is dynamically corrected to obtain the corrected data; Based on the number of refractive layers in the work area and the correction data, determine the offset range segment corresponding to the number of layers; divide the correction data into segmented correction data corresponding to the offset range segment; Each segment of the correction data is fitted with least squares linear data to obtain the fitted straight line corresponding to each offset range segment. Calculate the chi-square value corresponding to each offset distance based on the fitted straight line; determine the offset distance corresponding to each refractive layer based on the chi-square value corresponding to each offset distance. The velocity and thickness of each refractive layer are calculated based on the offset distance of each refractive layer.

2. The method according to claim 1, characterized in that, The determination of the common center point initial arrival data based on the initial arrival data of the shot gather includes: Determine the range of each shot point and the range of each receiver point in the initial arrival data of the shot gather; Determine the grid domain data range of each grid in the map of the work area; The shot point and receiver point corresponding to the grid domain data range of each grid are determined based on the grid domain data range, the shot point range of each shot point, and the receiver point range of each receiver point. The center point coordinates are calculated based on the shot point coordinates and receiver point coordinates corresponding to the grid domain data range of each grid. The initial arrival data of the common center point are determined based on the coordinates of the center point.

3. The method according to claim 2, characterized in that, The center point coordinates are calculated based on the shot point coordinates and receiver point coordinates corresponding to the grid domain data range of each grid, including: The x-coordinate of the center point is calculated based on the x-coordinate of the shot point and the x-coordinate of the receiver point corresponding to each shot point in the grid domain data of each grid. The ordinates of the center point are calculated based on the ordinates of the shot point and the receiver point to obtain the center point coordinates.

4. The method according to claim 1, characterized in that, The step of performing dynamic correction on the initial arrival data of the common center point to obtain corrected data includes: The fitting speed is determined by fitting the initial arrival time and offset of the common center point initial arrival data; Determine the speed range based on the fitted speed; Based on the speed range and speed increment, the initial arrival data of the common center point are dynamically corrected to obtain corrected data.

5. The method according to claim 1, characterized in that, The determination of the offset range corresponding to the number of refractive layers in the work area and the correction data includes: Based on the correction data, chi-square distribution fitting is performed to determine the offset range of all refractive layers; The offset range of all refractive layers is divided into offset range segments corresponding to the number of layers.

6. The method according to claim 1, characterized in that, The determination of the offset distance corresponding to each refractive layer based on the chi-square value corresponding to each offset distance includes: The minimum chi-square value is determined by the chi-square value corresponding to each offset distance in two adjacent offset distance ranges; The offset position corresponding to the minimum chi-square value is determined as the boundary position between two adjacent refractive layers; The offset distance of each refractive layer is determined based on the boundary position of two adjacent refractive layers.

7. The method according to claim 6, characterized in that, The calculation of the velocity and thickness of each refractive layer based on the offset distance of each refractive layer includes: Based on the offset distance corresponding to each refractive layer, the velocity and thickness of each refractive layer are calculated using a formula, wherein the formula includes: Among them, h k With v k These are the thickness and velocity of the k-th refractive layer, respectively, α k =sin -1 (v k / v n ), t is the travel time of the refracted wave from the shot point to the receiver point, x is the offset distance, v n Let be the velocity of the nth refractive layer.

8. A device for determining the parameters of a refractive layer, characterized in that, include: The acquisition module is used to acquire the initial arrival data of the shot gather in the work area; Based on the initial arrival data of the shot gather, the initial arrival data of the common center point is determined, and the initial arrival data of the common center point is dynamically corrected to obtain the corrected data; The determination module is used to determine the offset range segment corresponding to the number of refractive layers in the work area and the correction data; and to divide the correction data into segmented correction data corresponding to the offset range segment. The fitting module is used to perform least-squares linear fitting on each segment of the correction data to obtain the fitting line corresponding to each offset range segment. The first calculation module is used to calculate the chi-square value corresponding to each offset distance based on the fitted straight line; and to determine the offset distance corresponding to each refractive layer based on the chi-square value corresponding to each offset distance. The second calculation module is used to calculate the velocity and thickness of each refractive layer based on the offset distance of each refractive layer.

9. An electronic device, characterized in that, It includes a memory and a processor, wherein the memory stores a computer program that, when executed by the processor, performs the method for determining the refractive layer parameters as described in any one of claims 1 to 7.

10. A storage medium, characterized in that, The computer program stored in the storage medium can be executed by one or more processors and can be used to implement the method for determining the refractive layer parameters as described in any one of claims 1 to 7.

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