Infrared measuring device and measuring method thereof

Abstract

The application relates to an infrared measuring device and a measuring method thereof, and belongs to the technical field of infrared measurement. The infrared measuring method comprises the following steps: S100, feeding and conveying a to-be-measured article; S200, acquiring and processing an image of the to-be-measured article, extracting and identifying an edge closed contour of the to-be-measured article, capturing center position data and posture data of the to-be-measured article according to the edge closed contour of the to-be-measured article, and sending the data to a control unit; collecting height data of the to-be-measured article and a height measuring unit and sending the data to the control unit; and S300, the control unit adjusts the position of an infrared measuring unit according to the center position data, the posture data of the to-be-measured article and the height data of the to-be-measured article and the height measuring unit, focuses on the to-be-measured article, and performs infrared irradiation on the to-be-measured article to form an infrared image. The application can realize automatic focusing infrared measurement of the to-be-measured article, does not need manual intervention, and effectively improves the precision and efficiency of infrared measurement.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of infrared measurement, and particularly relates to an infrared measurement device and a measurement method thereof. BACKGROUND

[0002] With the rapid development of manufacturing industry, the requirement of manufacturing industry for product precision is increasingly improved, and the accurate measurement of product size, shape and other physical quantities has become a key factor to ensure product quality and production efficiency. Especially in high-precision and large-scale production environment, how to quickly obtain product data and effectively control quality in real time has become a common technical challenge. In order to cope with the above challenges, the stability, accuracy and automation degree of the measurement equipment have been brought to an unprecedented height, especially for infrared measurement equipment, which has played an irreplaceable role in many industrial production. The traditional infrared measurement equipment usually needs an operator to focus by manually adjusting the camera focal length, which has many limitations in modern high-precision and high-demand industrial production applications.

[0003] Firstly, the manual focusing process is not only tedious and time-consuming, but also needs the operator to adjust the focal length according to experience and vision. The difference between different operators, especially in the absence of standardized operation process, often leads to inaccurate focal length adjustment, thereby causing measurement error. This measurement error not only affects the accuracy of the measurement result, but also seriously affects the reliability and repeatability of the measurement result. Moreover, due to the error of different personnel in operation, the measurement results of the same product at different batches or different time points may be biased, and the stability of product quality in the production process cannot be ensured. In addition, in some large-scale production environment requiring efficient measurement, the low operation efficiency of manual focusing mode leads to increased measurement time, which directly affects the operation efficiency of the production line in industrial production, so that the production line cannot complete the measurement task within the specified time, reduces the efficiency of the whole production process, and affects the production cycle and delivery period of the product. The manual focusing mode has been unable to meet the demand of rapid and continuous measurement, and the manual focusing mode has become a bottleneck of automated, accurate and intelligent production.

[0004] Therefore, in order to solve the problems existing in the traditional infrared measurement equipment, it is necessary to develop an infrared measurement equipment capable of automatic focusing, and to provide an efficient, accurate and highly automated product infrared measurement overall solution technical scheme, which has become an urgent demand in the field of infrared measurement technology in current industrial production. SUMMARY

[0005] The present application aims to overcome the defects in the prior art, and provide an infrared measuring device and a measuring method thereof, so as to partially or completely solve the technical problem that the existing lead-out line is usually partially protruding or uneven, resulting in poor welding of the lead-out line of the junction box and the bus bar. In order to achieve the above-mentioned purpose, the present application provides the following technical solution:

[0006] In a first aspect, the present application provides an infrared measuring device, comprising: a carrier unit, a feeding unit, an acquisition unit, an infrared measuring unit and a control unit, the feeding unit, the acquisition unit and the infrared measuring unit being installed on the carrier unit, the feeding unit feeding and conveying the measured object; the acquisition unit comprising a camera unit, a height measuring unit and a processing unit, the camera unit shooting an image of the measured object to obtain a measured object image, the processing unit processing the measured object image, extracting and identifying the edge closed contour of the measured object, capturing the center position data and the attitude data of the measured object according to the edge closed contour of the measured object, and sending these data to the control unit, the height measuring unit collecting and processing the height data of the measured object and the height measuring unit and sending them to the control unit; the control unit adjusting the position of the infrared measuring unit according to the center position data, the attitude data of the measured object, the height data of the measured object and the height measuring unit to focus on the measured object; the infrared measuring unit performing infrared irradiation on the measured object to form an infrared image.

[0007] Optionally, the camera unit comprises a camera, a telecentric lens and a camera light source, the camera is connected to the telecentric lens, and the telecentric lens is connected to the camera light source; the height measuring unit comprises a spectral height gauge; the infrared measuring unit comprises an infrared detector, an infrared camera light source and an optical lens, the infrared detector is connected to the infrared camera light source, and the infrared detector is connected to the optical lens; the infrared measuring device further comprises an adjusting unit, the control unit controls the adjusting unit to adjust the position of the infrared measuring unit to focus on the measured object; the feeding unit comprises an X-direction moving assembly, a Y-direction moving assembly and a loading table, the loading table is connected to the Y-direction moving assembly, the Y-direction moving assembly is connected to the X-direction moving assembly, the X-direction moving assembly is connected to the carrier unit, and the adjusting unit comprises a mounting seat and a Z-direction moving assembly, the mounting seat is connected to the carrier unit, and the Z-direction moving assembly is connected to the acquisition unit and the infrared measuring unit.

[0008] Optionally, the control unit obtains first focusing height data H1 according to the height data of the measured object and the height measuring unit, and the first focusing height data H1 is:

[0009] H1=Z1+Z2-Z3

[0010] Wherein, Z1 is the height difference between the measured object and the height measuring unit, Z2 is the fixed installation height difference value of the infrared camera and the height measuring unit, and Z3 is the reference height compensation value of the height measuring unit.

[0011] Optionally, the control unit controls the Z-direction moving assembly to adjust the distance between the infrared measuring unit and the to-be-measured object according to the center position data of the to-be-measured object, the attitude data of the to-be-measured object and the first focusing height data H1, so as to focus on the to-be-measured object, and the infrared measuring unit collects a plurality of infrared images of the to-be-measured object to obtain a plurality of focused infrared images of the to-be-measured object. the first sharpness , the second sharpness of the first focused infrared image of the to-be-measured object , the second sharpness of the second focused infrared image of the to-be-measured object , and calculates the total sharpness of the first focused infrared image of the to-be-measured object and the second focused infrared image of the to-be-measured object according to the first sharpness and the second sharpness , and judges whether to stop focusing according to the total sharpness of the first focused infrared image of the to-be-measured object and the second focused infrared image of the to-be-measured object and a preset condition.

[0012] Optionally, the formula of the first sharpness is as follows:

[0013] =

[0014] wherein, , , are respectively a first weight coefficient, a second weight coefficient and a third weight coefficient, + + =1.

[0015] The Sobel kernel in the horizontal direction is as follows:

[0016] =

[0017] The Sobel kernel in the vertical direction is as follows:

[0018] =

[0019] The focusing gradient in the horizontal direction and the focusing gradient in the vertical direction :

[0020] =

[0021] =

[0022] in, It is the first Pixels in the focused infrared image of the item to be tested pixel values, It is a positive integer. =1, 2, 3, ... , This represents the total number of pixels in the focused infrared image of the object under test.

[0023] No. Pixels in the focused infrared image of the item to be tested Focus gradient amplitude for:

[0024]

[0025] No. Gradient mean of the focused infrared image of the object to be tested Gradient standard deviation They are respectively:

[0026]

[0027]

[0028] Second clarity for:

[0029] When d=1, =

[0030] When d=2, 3, ..., = ( )

[0031]

[0032]

[0033]

[0034]

[0035] in, The gradient mean of the first focused infrared image of the object under test. The standard deviation of the gradient of the first focused infrared image of the object under test. As the first weighting factor, As the second weighting factor, For the first The gradient mean of the focused infrared image of the object to be tested. the first gradient standard deviation of the focused infrared image of the first the first -1 the gradient mean of the focused infrared image of the first the first gradient standard deviation of the focused infrared image of the first the first gradient mean variation amount the first gradient standard deviation variation amount

[0036] Optionally, the total clarity of the focused infrared image of the first is:

[0037]

[0038] The preset condition is:

[0039]

[0040] wherein, is the focusing stability coefficient.

[0041] In a second aspect, the present application provides an infrared measurement method, using the infrared measurement device of any one of the above first aspect, comprising:

[0042] Step S100, feeding and conveying the measured object;

[0043] Step S200, acquiring and processing the image of the measured object, extracting and identifying the edge closed contour of the measured object, and capturing the center position data and attitude data of the measured object according to the edge closed contour of the measured object, and sending these data to the control unit; collecting the height data of the measured object and the height unit and sending them to the control unit;

[0044] Step S300, the control unit adjusts the position of the infrared measurement unit to focus on the measured object according to the center position data, attitude data of the measured object, height data of the measured object and height unit, and performs infrared irradiation on the measured object to form an infrared image.

[0045] Optionally, in step S300, the control unit adjusts the position of the infrared measurement unit to focus on the measured object according to the center position data, attitude data of the measured object, height data of the measured object and height unit, comprising:

[0046] Step S301: the control unit acquires the first focusing height data H1 according to the height data of the height unit, and the first focusing height data H1 is: ​

[0047] H1=Z1+Z2-Z3

[0048] Wherein, Z1 is the height difference between the measured object and the height measuring unit, Z2 is the fixed installation height difference value of the infrared detector and the height measuring unit, and Z3 is the reference height compensation value of the height measuring unit.

[0049] Step S302: The control unit controls the Z-direction moving assembly to adjust the distance between the infrared measuring unit and the measured object according to the center position data of the measured object, the attitude data of the measured object, and the first focusing height data H1, so as to focus on the measured object. The infrared measuring unit collects multiple infrared images of the measured object to obtain multiple focused infrared images of the measured object, calculates the first sharpness of the first focused infrared image of the dth measured object , the second sharpness of the first focused infrared image of the dth measured object , and calculates the total sharpness of the first focused infrared image of the dth measured object according to the first sharpness , the second sharpness and a preset condition, judges whether to stop focusing, wherein d is a positive integer.

[0050] Optionally, the second sharpness is:

[0051] When d = 1, =

[0052] When d = 2, 3,..., the second sharpness = ( )

[0053]

[0054]

[0055]

[0056]

[0057] Wherein, is the gradient mean value of the first focused infrared image of the 1st measured object, is the gradient standard deviation of the first focused infrared image of the 1st measured object, is the first weight factor, is the second weight factor, is the dth focused infrared image of the measured object The gradient mean of the focused infrared image of the object to be tested. For the first The gradient standard deviation of the focused infrared image of the object to be tested. For the first -The gradient mean of one focused infrared image of the object under test. For the first -1 standard deviation of the gradient of a focused infrared image of the object under test. For the first The change in the mean of the gradient For the first Variation in gradient standard deviation.

[0058] Optionally, the first The overall sharpness of the focused infrared image of the item to be tested. for:

[0059]

[0060] The preset conditions are:

[0061]

[0062] in, This is the focus stability coefficient.

[0063] In summary, this invention application has the following beneficial technical effects:

[0064] (1) In this invention application, the infrared measuring device adopts an acquisition unit, an infrared measuring unit, an adjustment unit and a control unit. The infrared measuring device can automatically complete the positioning, focusing and data acquisition and processing of the object to be measured without human intervention. The infrared measurement process of the entire product is highly automated, which effectively avoids errors caused by improper human operation, such as inaccurate manual focusing and measurement position deviation. It not only improves the accuracy and reliability of infrared measurement results, but also makes the measurement operation simpler and faster, reduces the requirements for the professional skills of the operators, reduces human error and reduces labor cost investment.

[0065] (2) In the present application, the control unit accurately adjusts the focal length of the infrared camera according to the measured object and the height data (Z direction) of the height measuring unit, ensuring that the infrared camera is always in the best imaging state. Compared with the manual focusing mode, the infrared measuring unit is not affected by the subjective factors of the operator, and can focus more accurately on the target area of the measured object, thereby obtaining clearer and more accurate measurement images. High-precision measurement images provide a reliable basis for subsequent data processing and analysis, significantly improving the accuracy of measurement results. For example, in the size measurement of small parts, the automatic focusing mode of the infrared measuring unit can clearly capture the edge profile of the parts, and through accurate image processing algorithms, the size parameters can be accurately calculated, with an error range that can be controlled within a very small range, meeting the requirements of high-precision measurement.

[0066] (3) In the present application, the control unit can comprehensively optimize and intelligently control the infrared measurement process, realizing seamless connection and efficient cooperation between each measurement link. After the measured object enters the measurement area of the collection unit, the camera unit can quickly capture its position information and transmit it to the control unit, which immediately starts the automatic focusing and measurement operation. The entire infrared measurement process is fast and smooth, without the need for manual waiting and intervention; at the same time, the control unit can dynamically adjust the parameters and measurement method of the infrared camera during the infrared measurement process, avoiding infrared measurement failure or repeated measurement due to environmental changes or differences in measured objects, greatly improving the one-time success rate and overall efficiency of infrared measurement, and quickly measuring the continuously passing products, greatly shortening the infrared measurement time, and effectively improving the production efficiency and production capacity of the production line. BRIEF DESCRIPTION OF DRAWINGS

[0067] Figure 1 is a structural schematic diagram of the infrared measuring device of the present application;

[0068] Figure 2 is a partial structural schematic diagram of the infrared measuring device of the present application Figure One ;

[0069] Figure 3 is a partial structural schematic diagram of the infrared measuring device of the present application Figure Two ;

[0070] Figure 4 is a partial structural schematic diagram of the adjustment unit, collection unit and infrared measuring unit of the present application Figure One ;

[0071] Figure 5 is a partial structural schematic diagram of the adjustment unit, collection unit and infrared measuring unit of the present application Figure Two ;

[0072] Figure 6 This is a partial structural diagram of the adjustment unit, acquisition unit, and infrared measurement unit of the present invention. Figure Three ;

[0073] Figure 7 This is a flowchart illustrating the infrared measurement method of this invention.

[0074] Figure label:

[0075] Stage unit-100, loading unit-200, acquisition unit-300, infrared measurement unit-400, camera-3011, telecentric lens-3012, camera light source-3013, infrared detector-401, infrared camera light source-402, optical lens-403, mounting base-501, Z-direction moving assembly-502, connecting plate-503, lower frame-P2, upper frame-P1. Detailed Implementation

[0076] In the following description, numerous specific details are set forth in order to provide a more thorough understanding of this application. However, it will be apparent to those skilled in the art that this application can be practiced without one or more of these details. In other instances, certain technical features well-known in the art have not been described to avoid confusion with this application.

[0077] like Figures 1 to 6 As shown, in a first aspect, an infrared measuring device includes: a stage unit 100, a loading unit 200, a data acquisition unit 300, an infrared measuring unit 400, and a control unit. The loading unit 200, the data acquisition unit 300, and the infrared measuring unit 400 are mounted on the stage unit 100. The loading unit 200 loads and conveys the object to be measured. The data acquisition unit 300 includes a camera unit 301, a height measurement unit 302, and a processing unit. The camera unit 301 captures images of the object to be measured to obtain images of the object, and the processing unit 303 processes the images of the object to be measured. The system extracts and identifies the closed edge contour of the object under test, and captures the center position data and attitude data of the object under test based on the closed edge contour. The system then sends these data to the control unit. The height measurement unit 302 collects and processes the height data of the object under test and the height measurement unit and sends it to the control unit. The control unit adjusts the position of the infrared measurement unit 400 to focus on the object under test based on the center position data, attitude data, and height data of the object under test and the height measurement unit. The infrared measurement unit 400 illuminates the object under test with infrared light to form an infrared image.

[0078] In some embodiments, the lower frame P2 is provided with the loading unit 100, and the lower frame P2 and the loading unit 100 serve as the support base of the entire infrared measuring device. The loading unit 100 is provided with the feeding unit 200, the collecting unit 300 and the infrared measuring unit 400, so as to provide a stable working environment for the feeding unit 200, the collecting unit 300 and the infrared measuring unit 400. Of course, the loading unit 100, the feeding unit 200, the collecting unit 300 and the infrared measuring unit 400 can be externally provided with the upper frame P1. The upper frame P1 is used to cover the outside of the loading unit 100, the feeding unit 200, the collecting unit 300 and the infrared measuring unit 400. The upper frame P1 is connected to the lower frame P2, so as to form the entire infrared measuring device.

[0079] In some embodiments, the feeding unit 200 is used to transport the to-be-measured object to the measuring area of the collecting unit 300, so as to ensure that the to-be-measured object is in a suitable collecting position of the collecting unit 300 during the measuring process. The collecting unit 300 comprises a camera unit 301, a height measuring unit 302 and a processing unit. The camera unit 301 photographs the image of the to-be-measured object to obtain the to-be-measured object image. The processing unit processes the to-be-measured object image, extracts the edge closed contour of the to-be-measured object, captures the center position data and the attitude data of the to-be-measured object according to the edge closed contour of the to-be-measured object, and sends the data to the control unit.

[0080] In the present application, the infrared measuring device is provided with the collecting unit, the infrared measuring unit, the adjusting unit and the control unit. The infrared measuring device can automatically complete the positioning, focusing, collecting and processing of the measuring data of the to-be-measured object without manual intervention. The entire infrared measuring process of the product is highly automated, which effectively avoids the errors caused by improper human operation, such as inaccurate manual focusing and deviation of the measuring position. The accuracy and reliability of the infrared measuring result are improved, the measuring operation is more convenient and fast, the requirement for the professional skills of the operator is reduced, the human error is reduced, and the labor cost is reduced.

[0081] Optionally, the processing unit comprises an image contour extraction processing unit and a center position and attitude processing unit. The image contour extraction processing unit processes the to-be-measured object image to extract the edge closed contour of the to-be-measured object. The center position and attitude processing unit captures the center position data and the attitude data of the to-be-measured object according to the edge closed contour of the to-be-measured object, and sends the data to the control unit.

[0082] In some embodiments, the camera unit 301 can use a high-resolution camera and a precise optical lens, such as a 20 million camera, a 40 million camera, etc., to ensure that the image of the to-be-measured object has sufficient clarity and contrast to meet the subsequent processing requirements. The image acquisition process needs to consider factors such as lighting conditions and shooting angles to minimize noise interference. The height measuring unit 302 can collect height sensors, such as ultrasonic ranging sensors, laser ranging sensors, spectral height meters, etc., to measure the height difference between the to-be-measured object and the height measuring unit, and send the height data to the control unit to help the control unit determine the position of the to-be-measured object.

[0083] In some embodiments, the image contour extraction processing unit uses a Gaussian filter to smooth the to-be-measured object image. Specifically, the to-be-measured object image can be a grayscale image, and each pixel point in the to-be-measured object image is convolved with a Gaussian kernel function, which is:

[0084] K(x_i,x_j)=exp(-||x_i-x_j||^2 / (2*σ^2))

[0085] where (x_i, x_j) is the pixel point coordinate, ||x_i-x_j||^2 is the standard deviation, and σ^2 controls the distribution width of the Gaussian function, that is, the degree of filtering.

[0086] In some embodiments, the image contour extraction processing unit can also perform edge detection on the smoothed to-be-measured object image to obtain the edges of the to-be-measured object image. A common edge detection Sobel operator can be used to detect the edge information of the smoothed to-be-measured object image. The Sobel operator mainly highlights the edge region of the smoothed to-be-measured object image by calculating the first derivative approximation of the smoothed to-be-measured object image in the horizontal and vertical directions. The Sobel operator uses two convolution kernels to calculate the horizontal and vertical gradients (i.e., the approximation of the first derivative) of the smoothed to-be-measured object image. The two kernels calculate the neighborhood information of each pixel point in the smoothed to-be-measured object image by weighting, thereby obtaining the degree of change of each pixel point in the horizontal and vertical directions.

[0087] In some embodiments, the Sobel kernel in the horizontal direction The Sobel kernel in the horizontal direction is as follows used to calculate the gradient of the smoothed to-be-measured object image in the horizontal direction, focusing on the edges in the horizontal direction.

[0088] =

[0089] In some embodiments, the Sobel kernel in the vertical direction As follows, the Sobel kernel in the vertical direction For calculating the gradient of the smoothed image of the object to be tested in the vertical direction, focusing on the edge in the vertical direction.

[0090]

[0091] In some embodiments, the Sobel kernel in the horizontal and vertical directions described above is used to perform convolution operation on the smoothed image of the object to be tested, to obtain the gradient in the horizontal direction and the gradient in the vertical direction :

[0092]

[0093]

[0094] wherein, is the pixel value of any pixel point of the image of the object to be tested;

[0095] In some embodiments, the gradient amplitude of any pixel point and the gradient direction θ of any pixel point may be calculated according to the gradient image in the horizontal direction and the gradient image in the vertical direction :

[0096]

[0097] wherein, is the gradient amplitude of any pixel point , indicating the intensity of the edge; θ is the gradient direction of each pixel point, indicating the direction of the edge.

[0098] In some embodiments, in order to improve efficiency, the gradient amplitude of any pixel point may also use an approximate value without square root:

[0099]

[0100] In some embodiments, thresholding operation can also be usually applied to the gradient amplitude image, regarding the pixel points lower than a certain threshold as non-edge, so as to obtain the edge information of the image.

[0101] ​​​​​In some embodiments, the image contour extraction processing unit starts from an edge point of the edge of the image of the object to be measured, searches for a neighboring edge point, and extracts a closed contour of the edge of the image of the object to be measured. The search for the neighboring edge point can use a boundary-based tracking algorithm or a region-based tracking method, wherein the boundary-based tracking can employ a Moore-Neighbor tracking algorithm, which takes the current edge point as the center, sequentially checks the surrounding 8 neighboring pixel points in the clockwise or counterclockwise direction, updates the current point if an edge point is found, continues tracking, until the starting point is returned or the end condition is met, thereby obtaining the closed contour of the edge.

[0102] In some embodiments, the center position and posture processing unit captures the center position data and the posture data of the object to be measured according to the closed contour of the edge of the object to be measured, and sends the data to the control unit.

[0103] Specifically, the closed contour point set of the object to be measured is determined according to the closed contour of the edge of the object to be measured wherein, is the coordinate of the edge contour point, is the pixel value of the edge contour point.

[0104] Specifically, the center position data is:

[0105] ( )

[0106] wherein, is the coordinate of the center position of the object to be measured.

[0107] Specifically, the weighted second moment S1 of the x-axis, the weighted second moment S2 of the y-axis, and the weighted hybrid second moment S0 are calculated the weighted second moment S2 of the x-axis, the weighted second moment S1 of the y-axis, and the weighted hybrid second moment S0 are respectively: =

[0108] =

[0109]

[0110] =

[0111] Therefore, the posture data of the object to be measured is: ​​

[0112] arctan( )

[0113] In the present application, firstly, the center position and posture processing unit can accurately capture the (rotational) posture information of the measured object by combining the weighted second moment and the weighted hybrid second moment, and is suitable for various object shapes and postures. Whether it is a simple rectangular object or a complex polygonal object, the posture can be well estimated. Especially when the object shape is irregular, the posture can be effectively estimated. In addition, the center position and posture processing unit only relies on the contour points in the closed contour of the measured object, without additional physical calibration or additional sensor data, and is suitable for various visual measurement systems. The calculation method is very simple, has high calculation efficiency, calculation accuracy, strong adaptability and robustness, and can be well applied to infrared measurement of the measured object. Of course, other ways can be used to calculate the center position and posture data of the measured object, and the person skilled in the art can make reasonable settings according to the actual situation.

[0114] In some embodiments, the infrared measurement unit 400 performs infrared irradiation on the measured object to generate infrared imaging data. The control unit can receive the center position data, posture data and height data sent by the acquisition unit 300, and control the automatic focusing and position adjustment of the infrared measurement unit 400, so as to realize accurate infrared imaging of the measured object.

[0115] In the infrared measurement device of the present application, firstly, the control unit can automatically adjust the focal length of the infrared measurement unit 400 by the position information provided by the camera unit and the height measurement unit. The infrared measurement device can realize automatic focusing and accurate infrared measurement of the measured object, and the infrared measurement unit can obtain high-precision infrared images, so as to perform accurate object detection and analysis without manual intervention, effectively improving the accuracy and efficiency of infrared measurement. In addition, the infrared measurement unit is equipped with a high-resolution infrared camera and an optical lens (such as a microscope lens), which can obtain clear infrared images of the measured object, thereby improving the accuracy of measurement and the ability to capture details. The infrared measurement device can be applied to multiple fields, such as quality detection of electronic components, surface defect detection of precision machinery, thermal performance analysis of materials, etc., and has strong adaptability. In addition, the infrared measurement device has high automation degree, can realize automatic focusing and position adjustment of the infrared measurement unit, reduces the complexity of manual operation, greatly improves the efficiency and accuracy of the measurement process and the product production efficiency, and shows good reliability and adaptability in industrialized production application.

[0116] Optionally, the camera unit 301 comprises a camera 3011, a telecentric lens 3012 and a camera light source 3013, the camera 3011 is connected to the telecentric lens 3012, the telecentric lens 3012 is connected to the camera light source 3013, the height measuring unit 302 comprises a spectral height gauge, and the infrared measuring unit 400 comprises an infrared detector 401, an infrared camera light source 402 and an optical lens 403, the infrared detector 401 is connected to the infrared camera light source 402, and the infrared detector 401 is connected to the optical lens 403.

[0117] In some embodiments, the camera 3011 is connected to the telecentric lens 3012, and the telecentric lens 3012 is connected to the camera light source 3013. The camera 3011 can capture the center position and attitude data of the measured object, and a high-resolution camera is used to ensure that clear image information is obtained. The camera 3011 can have a high frame rate, which can capture the state of dynamic objects in real time. The telecentric lens 3012 can ensure that the imaging of the object is not affected by the angle, especially the size of the object remains unchanged at different heights and angles, which is suitable for shooting complex object shapes. The application of the telecentric lens 3012 can improve the imaging accuracy, especially for small or micro objects. The camera light source 3013 can provide uniform illumination to ensure that the camera can capture clear and contrast images. The camera light source 3013 can be suitable for low-light environments or scenes that require precise lighting, avoiding interference from reflections or shadows.

[0118] In some embodiments, the height measuring unit 302 comprises a spectral height gauge, which can be used to accurately measure the height difference Z1 between the measured object and the height measuring unit. By analyzing the reflected spectrum, high-precision and fast response of height measurement can be achieved, which is especially suitable for measuring irregular or dynamically changing object surfaces.

[0119] In some embodiments, the infrared detector 401 is connected to the infrared camera light source 402, and the infrared detector 401 is connected to the optical lens 403. The optical lens 403 comprises lenses, mirrors and filters, which are responsible for focusing the infrared radiation of the measured object onto the infrared detector 401. The infrared detector 401 is the core component of the infrared measuring unit 400, which can capture the infrared radiation emitted by the measured object and convert it into an electrical signal. In low-light environments, the infrared camera light source 402 can use common infrared LEDs or laser lights as supplemental light sources to enhance light intensity, and thus the infrared measuring unit 400 can capture infrared images of the measured object. Therefore, through infrared imaging technology, the temperature distribution and surface defects of the object can be non-contact detected, which is suitable for detecting electronic components, material thermal performance and other aspects.

[0120] In the present application, the camera 3011, the telecentric lens 3012, the infrared detector 401 and the optical lens 403 work together, and the infrared measuring device can adapt to different measured objects and environmental conditions during the infrared measurement process, and can provide accurate measurement and detection in multiple infrared measurement fields, especially suitable for application environments with high requirements for micro objects, complex shape objects and thermal performance, improving the efficiency and reliability of infrared imaging measurement, and reducing the complexity, interference and error of manual operation.

[0121] Optionally, the infrared measuring device further comprises an adjusting unit 500, and the control unit controls the adjusting unit 500 to adjust the position of the infrared measuring unit 400 to focus on the measured object. The loading unit 201 comprises an X-direction moving assembly 201, a Y-direction moving assembly 202 and a loading table 203. The loading table 203 is connected to the Y-direction moving assembly 202, the Y-direction moving assembly 202 is connected to the X-direction moving assembly 201, and the X-direction moving assembly 201 is connected to the loading table unit 100. The adjusting unit 500 comprises a mounting seat 501 and a Z-direction moving assembly 502. The mounting seat 501 is connected to the loading table unit 100, and the Z-direction moving assembly 502 is connected to the collecting unit 300 and the infrared measuring unit 400.

[0122] In some embodiments, the X-direction moving assembly 201 can move the loading table 203 in the X-axis direction to control the position of the measured object in the X-axis direction. The X-direction moving assembly 201 can be a conventional X-direction module, which can generally include a motor, a guide rail and a slider, etc. The X-direction moving assembly 201 can adjust the position of the measured object in the X-axis direction according to the control unit. The X-axis direction can be a horizontal direction.

[0123] In some embodiments, the loading table 203 is connected to the Y-direction moving assembly 202, and the Y-direction moving assembly 202 can move the loading table 203 in the Y-axis direction to control the position of the measured object in the Y-axis direction. The Y-direction moving assembly 202 can be a conventional Y-direction module, which can generally include a motor, a guide rail and a slider, etc. The Y-direction moving assembly 202 can adjust the position of the measured object in the X-axis direction according to the control unit. The Y-axis direction can be a vertical direction. The Y-direction moving assembly 202 generally forms a coordinated movement in the X-direction and the Y-direction by connecting the X-direction moving assembly 201, so as to realize the joint control of the object in the X-direction and the Y-direction.

[0124] In some embodiments, the loading table 203 is used to support and carry the measured object. The loading table 203 can include an adjusting mechanism, such as an air floating mechanism or an automatic clamp mechanism, which can ensure the stability of the measured object during movement.

[0125] In some embodiments, the control unit can send instructions to control the X-direction moving assembly 201 and the Y-direction moving assembly 202, so that the carrier table 203 moves along the X-axis and Y-axis directions according to the set trajectory, and the to-be-measured object will be accurately placed in the measurement area of the acquisition unit 200 or below the acquisition unit 200, and the next step of acquisition, measurement or analysis can be prepared.

[0126] In some embodiments, the mounting seat 501 is a basic support component of the adjustment unit 500, responsible for fixing the Z-direction moving assembly 502, the acquisition unit 300 and the infrared measurement unit 400 with the carrier table unit 100. The mounting seat 501 is usually made of rigid materials such as steel or aluminum alloy to ensure the stability and durability of the system; the mounting seat 501 should have certain adjustment capability in design, for example, through screw or hinge connection, the position can be fine-tuned, so as to make subtle adjustments according to actual measurement needs.

[0127] In some embodiments, the Z-direction moving assembly 502 connects the acquisition unit 300 and the infrared measurement unit 400. For example, the Z-direction moving assembly 502 can connect the acquisition unit 300 and the infrared measurement unit 400 through the connecting plate 503, and the acquisition unit 300 and the infrared measurement unit 400 are both installed on the connecting plate 503. The Z-direction moving assembly 502 can not only adjust the position of the acquisition unit 300 in the Z-axis direction, but also adjust the position of the infrared measurement unit 400 in the Z-axis direction, so as to ensure that the measurement unit 400 and the acquisition unit 300 always maintain appropriate relative positions, avoiding measurement errors caused by position changes.

[0128] In some embodiments, the Z-direction moving assembly 502 adjusts the distance between the infrared measurement unit 400 and the to-be-measured object to focus on the to-be-measured object. The Z-direction moving assembly 502 can be a conventional Z-direction module, which usually includes a motor, a guide rail and a slider, etc., so that the infrared measurement unit 400 can move accurately in the vertical direction. The Z-direction moving assembly 502 can perform a small vertical movement through the signal received by the control unit, automatically adjust to the most suitable measurement position, and ensure that it focuses clearly on the to-be-measured object and the measurement range is accurate.

[0129] In some embodiments, after the infrared measurement unit 400 is automatically adjusted to the appropriate position, the control unit can start to perform infrared imaging on the to-be-measured object to capture the temperature distribution or thermal characteristics of the surface of the to-be-measured object. At this time, the entire infrared imaging process can also be controlled by the adjustment unit 500. The infrared measurement unit 400 can accurately measure and image the surface area of the to-be-measured object, and can automatically adapt to and maintain the best measurement effect regardless of the size of the to-be-measured object, realizing unbiased high-precision infrared imaging.

[0130] In the present application, the adjusting unit 500 can automatically adjust the position of the infrared measuring unit 400, and through the coarse adjustment and / or fine adjustment capability of the Z-direction moving assembly 502, the infrared measuring unit 400 can achieve extremely accurate vertical focusing, ensuring clear infrared imaging under different measured objects and / or different measurement conditions, improving the measurement accuracy, greatly reducing the need for manual operation, and improving the overall efficiency and automation level of the production line.

[0131] Optionally, the control unit adjusts the position of the infrared measuring unit 400 according to the center position data and attitude data of the measured object, and the height data of the measured object and the height measuring unit.

[0132] In some embodiments, the control unit obtains first focusing height data H1 according to the height data of the height measuring unit, and the first focusing height data H1 is:

[0133] H1=Z1+Z2-Z3

[0134] Wherein, Z1 is the height difference between the measured object and the height measuring unit, Z2 is the fixed installation height difference value of the infrared detector 401 and the height measuring unit, and Z3 is the reference height compensation value of the height measuring unit 302.

[0135] In some embodiments, Z3 is the reference height compensation value of the height measuring unit 302, which is usually adjusted according to the reference height value of the height measuring unit 302 and the measured object in history, to compensate for the difference between the current height data of the height measuring unit 302 and the reference height data of the height measuring unit 302, and to help correct the height data of the height measuring unit 302; Z1 is the height difference between the measured object and the height measuring unit, which is measured in real time and can reflect the actual position relative to the measured object; Z2 is the fixed installation height difference value of the infrared detector 401 and the height measuring unit, which takes into account the physical position difference between the infrared camera and the height measuring unit, and the fixed installation height difference value is usually a fixed value.

[0136] In some embodiments, Z1-Z3 adjusts and compensates for the difference between the current height of the height measuring unit and the reference height, reflecting the change of the height measuring unit 302 relative to the reference position, and Z2 represents the fixed position of the infrared camera and the installation difference of the height measuring unit, which is used to correct the position of the infrared camera to ensure the correct position relationship between the infrared camera and the height measuring unit. First, by measuring the current height of the measuring unit and the relative position difference between the height measuring unit and the infrared camera, the first focusing height data H1 of the infrared camera can be calculated, which provides a basis for subsequent fine adjustment for accurate focusing, thereby ensuring the clarity of image acquisition.

[0137] Optionally, the control unit controls the Z-direction moving component 502 to adjust the distance between the infrared measuring unit 400 and the object under test based on the center position C data of the object under test, the attitude data T of the object under test, and the first focusing height data H1, so as to focus on the object under test. The infrared measuring unit 400 acquires multiple infrared images of the object under test to obtain multiple focused infrared images of the object under test. The control unit calculates the first... The first sharpness of the focused infrared image of the item to be tested. Second clarity And based on the first resolution Second clarity Calculate the first The overall sharpness of the focused infrared image of the item to be tested. According to the The overall sharpness of the focused infrared image of the item to be tested. Based on preset conditions, determine whether to stop focusing.

[0138] In some embodiments, in the The first sharpness of the focused infrared image of the item to be tested. In the calculation, the Sobel gradient operator can also be used, with a Sobel kernel in the horizontal direction. The following is a horizontal Sobel kernel. Used to calculate the gradient in the horizontal direction of the focused infrared image of the object under test.

[0139] =

[0140] In some embodiments, the vertical Sobel core The following is a vertical Sobel kernel. Used to calculate the gradient in the vertical direction of the focused infrared image of the object under test.

[0141] =

[0142] In some embodiments, the Sobel cores in the horizontal and vertical directions described above are used to check the first... The focusing infrared image of the object to be tested is convolved to obtain the focusing gradient in the horizontal direction. and vertical focus gradient :

[0143] =

[0144] =

[0145] wherein, is the pixel value of the pixel point in the focused infrared image of the th object to be measured, is a positive integer, = 1, 2, 3,..., , is the total number of pixel points in the focused infrared image of the object to be measured.

[0146] In some embodiments, the focusing gradient amplitude of the pixel point in the focused infrared image of the th object to be measured can be calculated according to the horizontal direction gradient focusing image and the vertical direction gradient focusing image as follows:

[0147]

[0148] wherein, is the focusing gradient amplitude of the pixel point in the focused infrared image of the th object to be measured.

[0149] In some embodiments, the gradient mean value and the gradient standard deviation of the focused infrared image of the th object to be measured are respectively:

[0150]

[0151]

[0152] Similarly, for the focused infrared image of the +1th object to be measured, the Sobel gradient operator can also be used, the horizontal direction Sobel kernel is as follows, the horizontal direction Sobel kernel is used to calculate the gradient of the focused infrared image of the object to be measured in the horizontal direction.

[0153] =

[0154] In some embodiments, the vertical direction Sobel kernel is as follows, the vertical direction Sobel kernel is used to calculate the gradient of the focused infrared image of the object to be measured in the vertical direction.

[0155] =

[0156] In some embodiments, the Sobel kernel in the horizontal and vertical directions described above is used to perform convolution operation on the focusing infrared image of the i-th object to be tested to obtain the focusing gradient in the horizontal direction and the focusing gradient in the vertical direction . :

[0157] =

[0158] =

[0159] wherein, Gx(i, j) is the pixel value of the pixel point (i, j) in the focusing infrared image of the i-th object to be tested, n is a positive integer, i = 1, 2, 3, …, and j = 1, 2, 3, …. is the total number of pixel points in the focusing infrared image of the i-th object to be tested. It should be noted that, for the convenience of calculation, the number of pixel points in the focusing infrared image of each object to be tested is set to be the same, and the pixel points that are not enough are supplemented by examples, and the pixel value of the pixel point that is not enough can be set to 0 or 255. In some embodiments, the focusing gradient amplitude G(i, j) of the pixel point (i, j) in the focusing infrared image of the i-th object to be tested can be calculated according to the gradient focusing image in the horizontal direction and the gradient focusing image in the vertical direction as follows:

[0160] In some embodiments, the focusing gradient amplitude G(i, j) of the pixel point (i, j) in the focusing infrared image of the i-th object to be tested can be calculated according to the gradient focusing image in the horizontal direction and the gradient focusing image in the vertical direction as follows: wherein, Gx(i, j) is the focusing gradient amplitude of the pixel point (i, j) in the focusing infrared image of the i-th object to be tested.

[0161]

[0162] wherein, Gx(i, j) is the focusing gradient amplitude of the pixel point (i, j) in the focusing infrared image of the i-th object to be tested. In some embodiments, the gradient mean value G of the focusing infrared image of the i-th object to be tested and the gradient standard deviation G are respectively:

[0163]

[0164] ​​​​​​​​​​​​

[0165]

[0166] In some embodiments, is the first pixel value of the pixel point in the focused infrared image of the to-be-measured object, is the first pixel value of the pixel point in the focused infrared image of the to-be-measured object, is the first pixel value of the pixel point in the focused infrared image of the to-be-measured object, is the first pixel value of the pixel point in the focused infrared image of the to-be-measured object, is the first pixel value of the pixel point in the focused infrared image of the to-be-measured object, is the first pixel value of the pixel point in the focused infrared image of the to-be-measured object, is a positive integer, =1, 2, 3,..., preferably, ≥2, so that each image can be described and quantified, facilitating feature extraction and analysis, and further used for clarity calculation in the focusing process.

[0167] In some embodiments, the gradient distribution processed focused infrared image of the first to-be-measured object has a small standard deviation and a relatively flat distribution for the out-of-focus image, and a large change and a large standard deviation for the clear image. Therefore, the first clarity can be constructed based on the gradient mean and the gradient standard deviation , and the first clarity can reflect the focusing condition of the infrared measurement unit, and can be used to judge whether the focused infrared image of the to-be-measured object is clear or needs to be focused. The formula of the first clarity is:

[0168] =

[0169] wherein, , , are the first weight coefficient, the second weight coefficient and the third weight coefficient respectively, + + =1.

[0170] In some embodiments, the first weight coefficient and the second weight coefficient balance the gradient mean and the gradient standard deviation for the first clarity The contribution, the third weighting coefficient By performing a non-linear transformation on the gradient distribution values ​​of each pixel and then summing them, detailed gradient distribution information for all pixels is captured. For example... , , The values ​​are 0.3, 0.3, and 0.4 respectively.

[0171] First resolution Based on the calculation, we can obtain the first... The focused infrared image of the item to be tested corresponds to the first level of sharpness. And thus, through the first The sharpness assessment of the focused infrared image of the test item determines whether the focus meets the set conditions. This relies on the local focusing imaging assessment characteristics of the infrared measurement unit. Simultaneously, the overall infrared imaging before and after the infrared measurement unit can also be considered. Accordingly, a second sharpness assessment of the focused infrared image of the test item is set. .

[0172] In some embodiments, the second sharpness of the focused infrared image of the object under test In the calculation, the first Gradient mean of the focused infrared image of the object to be tested Gradient standard deviation , No. Gradient mean of the focused infrared image of the object to be tested Gradient standard deviation ,...,No. Gradient mean of the focused infrared image of the object to be tested Gradient standard deviation ,...,No. Gradient mean of the focused infrared image of the object to be tested Gradient standard deviation Correspondingly, the first Gradient mean change , No. Gradient standard deviation variation They are respectively:

[0173]

[0174]

[0175] Therefore, the second level of clarity Calculated using the following formula:

[0176] = (i.e., when d=1)

[0177] = ( (i.e., when d=2, 3...)

[0178]

[0179]

[0180] in, The gradient mean of the first focused infrared image of the object under test. The standard deviation of the gradient of the first focused infrared image of the object under test. As the first weighting factor, As the second weighting factor, For the first The gradient mean of the focused infrared image of the object to be tested. For the first The gradient standard deviation of the focused infrared image of the object to be tested. For the first -The gradient mean of one focused infrared image of the object under test. For the first -1 standard deviation of the gradient of a focused infrared image of the object under test. For the first The change in the mean of the gradient For the first The change in the standard deviation of the gradient. It should be noted that the corresponding... Gradient mean change, the first The gradient standard deviation variation does not exist.

[0181] in, The gradient mean of the first focused infrared image of the object under test. The standard deviation of the gradient of the first focused infrared image of the object under test. As the first weighting factor, It is the second weighting factor.

[0182] In some embodiments, firstly, It can be used to comprehensively represent the first The accuracy of the sharpness of the focused infrared image of the object to be tested, ( ) can reflect changes in the focusing trend; when the focusing area is complete, ( The smaller the change, the better; in addition, a first weighting factor was set. Second weighting factor First weighting factor Second weighting factor The gradient mean change can be calculated at different stages of the focused infrared image of the object under test. Gradient mean change The weights can be dynamically adjusted based on the magnitude of the gradient. For example, in the early stages of focusing, the gradient changes are more significant, and the image sharpness improves rapidly. At this time, sharpness accuracy should be given more weight. During the focusing process, the image gradually becomes sharper or becomes stable. In the later stages of focusing, the gradient changes tend to be gentler, and the image is close to being sharp. At this time, the stability of the image can be emphasized. By dynamically adjusting the weights, the system can evaluate the features at different stages, avoiding any feature from excessively affecting the final result, thereby more accurately judging the focus status.

[0183] In some embodiments, based on the first resolution Second clarity Calculate the first The overall sharpness of the focused infrared image of the item to be tested. , No. The overall sharpness of the focused infrared image of the item to be tested. for:

[0184]

[0185] No. The overall sharpness of the focused infrared image of the item to be tested. The settings not only consider the sharpness of a single image to construct the first sharpness. Furthermore, a second level of clarity can be constructed by combining the change in the gradient mean, the change in the gradient standard deviation, and adaptive weight adjustment. Second clarity It reflects the dynamic trends of image sharpness and focus; and, through preset conditions, it monitors the first... The overall sharpness of the focused infrared image of the item to be tested. Changes in focus, post-processing The change range is stable, which allows for accurate assessment of focusing completion and the attainment of good focusing accuracy.

[0186] In some embodiments, the preset conditions are:

[0187]

[0188] in, This is the focus stability coefficient. For example, a constant. The values ​​are 0.02, 0.01, etc.

[0189] In some embodiments, in practice, the focus is typically adjusted multiple times (at least twice), and correspondingly... ≥2 means that two or more focused infrared images of the test object will be obtained, according to the first... total sharpness of the focused infrared image of the to-be-tested article , the first total sharpness of the focused infrared image of the to-be-tested article preset condition. If yes, the focused infrared image of the to-be-tested article is sharp, and the Z-direction moving assembly 502 stops moving to end the focusing process; if no, the focused infrared image of the to-be-tested article is not sharp, and the Z-direction moving assembly 502 continues to adjust the position of the infrared measurement unit to continue the focusing process.

[0190] Of course, in other embodiments, the preset condition can also be adjusted, and the first transform of the focused infrared image of the to-be-tested article, and thus the completion of focusing and the stability of the overall focusing process can be accurately evaluated.

[0191]

[0192] wherein, is a structural similarity coefficient, is a first constant, is a second constant.

[0193] SM=

[0194] In other embodiments, for a sharp image, since the brightness and contrast are well maintained and the structural information is complete, the two clear images in the later stage of focusing are highly similar, and for a blurred image, the brightness and contrast are reduced and the structural information is lost, so the similarity of the two images in the early and middle stages of focusing is low. Exemplarily, for an 8-bit image, the first constant may be 6.5025 and the second constant may be 58.5225, so that the SM can be stably calculated in most images, and of course, a person skilled in the art can also reasonably select the sizes of the first constant and the second constant according to actual needs.

[0195] As Figure 7 shown, in a second aspect, the present application provides an infrared measurement method, which adopts the infrared measurement device of any one of the first aspect, and comprises:

[0196] Step S100, loading and conveying the to-be-tested article;

[0197] In step S200, the image of the to-be-measured object is acquired and processed, the closed edge contour of the to-be-measured object is extracted, the center position data and the attitude data of the to-be-measured object are captured according to the closed edge contour of the to-be-measured object, and the data are sent to the control unit; the height data of the to-be-measured object and the height unit are collected and sent to the control unit.

[0198] In step S300, the control unit adjusts the position of the infrared measurement unit 400 according to the center position data, the attitude data of the to-be-measured object, and the height data of the to-be-measured object and the height unit, focuses on the to-be-measured object, and performs infrared irradiation on the to-be-measured object to form an infrared image.

[0199] In some embodiments, in step S100, the to-be-measured object is transported and positioned by the feeding unit 200. The specific feeding process can include: first, the to-be-measured object is placed on the loading table 203 by hand or a mechanical hand; then, the control unit controls the X-direction moving assembly 201 and the Y-direction moving assembly 202 to move, and the loading table 203 moves along the X-axis direction and the Y-axis direction, and the to-be-measured object moves into the measurement area of the collection unit 200 or is located below the collection unit 200.

[0200] In some embodiments, in step S200, the camera unit 301 and the height unit 302 are respectively used to collect the center position, attitude, and height related data of the to-be-measured object, and send the related data to the control unit. The camera unit 301 shoots the image of the to-be-measured object to acquire the image of the to-be-measured object, which includes the position and angle information of the to-be-measured object in the X and Y axis directions, and can be used for the subsequent automatic focusing needs of the infrared measurement unit. The height unit 302 can measure the height data between the to-be-measured object and the height unit, to ensure that the distance between the to-be-measured object and the infrared measurement unit is correct during the measurement.

[0201] In some embodiments, in step S300, the control unit can adjust the position of the infrared measurement unit 400 according to the center position data, the attitude data of the to-be-measured object, and the height data of the to-be-measured object and the height unit, to focus on the to-be-measured object. The infrared measurement unit 400 can perform infrared irradiation on the to-be-measured object to generate an infrared imaging image, which can be used for analyzing the thermal characteristics, defects, or other infrared characteristics of the object.

[0202] In the infrared measurement method of the present application, first, through the accurate data acquisition of the camera unit 301 and the height measuring unit 302, the precise positioning, attitude adjustment and height measurement of the measured object can be realized, and the control unit automatically adjusts the position of the infrared measurement unit 400 according to these data to ensure that each infrared imaging can obtain high-precision focusing effect, avoiding the error of manual operation. In addition, through the automatic positioning of the measured object, data acquisition and focusing adjustment, the automation degree of the production line is improved, and the manual intervention is reduced. The whole infrared measurement process of the measured object is not only fast, but also accurate, which can meet the needs of high-speed production line, improve the consistency and repeatability of infrared measurement results, and ensure the accuracy and reliability of each infrared measurement result. In addition, the infrared measurement method can be applied to many fields, such as quality detection of electronic components, surface defect detection of precision machinery, thermal performance analysis of materials, etc. It can automatically adapt to different sizes, shapes or heights of the measured object, and automatically adjust the position and focal length of the infrared measurement unit according to the specific situation of the object. The automation degree is high, the complexity of manual operation is reduced, the efficiency and accuracy of the measurement process are greatly improved, and good reliability and adaptability are shown in industrial production application.

[0203] Optionally, in step S300, the control unit adjusts the position of the infrared measurement unit 400 to focus on the measured object according to the center position data, attitude data of the measured object and height data of the measured object and the height measuring unit, comprising:

[0204] Step S301: the control unit obtains first focusing height data H1 according to the height data of the height measuring unit, and the first focusing height data H1 is:

[0205] H1=Z1+Z2-Z3

[0206] Wherein, Z1 is the height difference between the measured object and the height measuring unit, Z2 is the fixed installation height difference value of the infrared detector 401 and the height measuring unit, and Z3 is the reference height compensation value of the height measuring unit 302.

[0207] Step S302: the control unit controls the Z direction moving assembly 502 to adjust the distance between the infrared measurement unit 400 and the measured object to focus on the measured object according to the center position C data of the measured object, the attitude data T of the measured object and the first focusing height data H1, and the infrared measurement unit 400 unit collects multiple infrared images of the measured object to obtain multiple focusing infrared images of the measured object, calculates the first sharpness , the second sharpness of the first focusing infrared image of the measured object, and calculates the first focusing infrared image of the measured object according to the first sharpness , the second sharpness . ​Total sharpness of the focused infrared image of the object to be measured , according to the first Total sharpness of the focused infrared image of the object to be measured and the preset condition, whether to stop focusing.

[0208] In some embodiments, in step S300, the adjusting unit 500 includes a mounting seat 501 and a Z-direction moving assembly 502, and the control unit can control the Z-direction moving assembly 502 to adjust the position of the infrared measuring unit 400 in the vertical direction (Z-axis), so as to ensure that the focal length between the infrared measuring unit 400 and the surface of the object to be measured is in the best state. Specifically, the collecting unit 300 acquires the height data and position and attitude data of the object to be measured, and transmits them to the control unit, which can analyze these data and calculate the optimal focal length and position of the infrared measuring unit 400. According to the height information of the object to be measured, the control unit instructs the adjusting unit 500 to make accurate Z-axis adjustment, and the Z-direction moving assembly 502 adjusts the height of the infrared measuring unit 400 according to the instruction of the control unit, so as to ensure that it is focused on the surface of the object. After the infrared measuring unit 400 is adjusted to the appropriate focal length, the infrared measuring unit 400 irradiates the object to be measured, and then a very clear infrared imaging image can be generated, which is used to analyze the thermal characteristics, surface defects, etc. of the object to be measured.

[0209] In step S300, in the first First sharpness of the focused infrared image of the object to be measured In the calculation, Sobel gradient operators can also be used, and Sobel kernels in the horizontal direction The Sobel kernel in the horizontal direction is used to calculate the gradient of the focused infrared image of the object to be measured in the horizontal direction, and Sobel kernels in the vertical direction The Sobel kernel in the vertical direction is used to calculate the gradient of the focused infrared image of the object to be measured in the vertical direction.

[0210] =

[0211] =

[0212] In step S300, the Sobel kernels in the horizontal and vertical directions described above are used to perform convolution operation on the focused infrared image of the object to be measured, to obtain the focused gradient in the horizontal direction and the focused gradient in the vertical direction:

[0213] =

[0214] =

[0215] wherein, is the pixel value of the pixel point of the focusing infrared image of the to-be-measured object, is a positive integer, = 1, 2, 3, …, , is the total number of pixel points in the focusing infrared image of the to-be-measured object. In some embodiments, the focusing gradient amplitude

[0216] of the pixel point in the focusing infrared image of the to-be-measured object can be calculated according to the horizontal direction gradient focusing image and the vertical direction gradient focusing image , and is as follows:

[0217] wherein,

[0218] is the focusing gradient amplitude of the pixel point in the focusing infrared image of the to-be-measured object. The gradient mean value and the gradient standard deviation

[0219] of the focusing infrared image of the to-be-measured object are as follows:

[0220]

[0221]

[0222] In step S300, after the gradient distribution processing of the focusing infrared image of the to-be-measured object, the standard deviation of the out-of-focus image is small, and the distribution is relatively flat. For a clear image, the change is usually large, and the standard deviation is large. Therefore, after the gradient distribution processing, the first sharpness can be constructed based on the gradient mean value and the gradient standard deviation , and the first sharpness can reflect the focusing condition of the infrared measurement unit, and can be used to judge whether the focusing infrared image of the to-be-measured object is clear or needs to be focused. The formula of the first sharpness is as follows:

[0223] ​​​​​ =

[0224] wherein, 、 、 are a first weight coefficient, a second weight coefficient and a third weight coefficient respectively, + + =1.

[0225] In step S300, the second sharpness of the focused infrared image of the to-be-tested article is calculated. The gradient mean value of the first to-be-tested article focused infrared image, the gradient standard deviation of the first to-be-tested article focused infrared image, the gradient mean value of the second to-be-tested article focused infrared image, the gradient standard deviation of the second to-be-tested article focused infrared image, the gradient mean value of the third to-be-tested article focused infrared image, the gradient standard deviation of the third to-be-tested article focused infrared image, the gradient mean value of the fourth to-be-tested article focused infrared image, the gradient standard deviation of the fourth to-be-tested article focused infrared image, the gradient mean value of the fifth to-be-tested article focused infrared image, the gradient standard deviation of the fifth to-be-tested article focused infrared image, the gradient mean value of the sixth to-be-tested article focused infrared image, the gradient standard deviation of the sixth to-be-tested article focused infrared image, the gradient mean value of the seventh to-be-tested article focused infrared image, the gradient standard deviation of the seventh to-be-tested article focused infrared image, the gradient mean value change amount of the first to-be-tested article, the gradient standard deviation change amount of the first to-be-tested article, the gradient mean value change amount of the second to-be-tested article,

[0226]

[0227]

[0228] Thus, the second sharpness is calculated by the following formula:

[0229] = (d=1)

[0230] = ( ) (d=2, 3...)

[0231]

[0232]

[0233] wherein, is the gradient mean value of the first to-be-tested article focused infrared image, The standard deviation of the gradient of the first focused infrared image of the object under test. As the first weighting factor, As the second weighting factor, For the first The gradient mean of the focused infrared image of the object to be tested. For the first The gradient standard deviation of the focused infrared image of the object to be tested. For the first -The gradient mean of one focused infrared image of the object under test. For the first -1 standard deviation of the gradient of a focused infrared image of the object under test. For the first The change in the mean of the gradient For the first Variation in gradient standard deviation.

[0234] In step S300, based on the first resolution Second clarity Calculate the first The overall sharpness of the focused infrared image of the item to be tested. , No. The overall sharpness of the focused infrared image of the item to be tested. for:

[0235]

[0236] The preset conditions are:

[0237]

[0238] in, This is the focus stability coefficient. For example, a constant. The values ​​are 0.02, 0.01, etc.

[0239] Therefore, the first The overall sharpness of the focused infrared image of the item to be tested. The settings not only consider the sharpness of a single image to construct the first sharpness. Furthermore, a second level of clarity can be constructed by combining the change in the gradient mean, the change in the gradient standard deviation, and adaptive weight adjustment. Second clarity It can reflect the dynamic trend of image sharpness and focus; in addition, by setting preset conditions, it can monitor the first... The overall sharpness of the focused infrared image of the item to be tested. The changes, the post-focusing stage Focused infrared image of the item to be tested The variation region is stable, and thus the focusing completion condition can be accurately evaluated and good focusing precision can be obtained. In addition, in actual processes, focusing is usually performed multiple times, and accordingly, Generally, the number of the obtained focusing infrared images of the to-be-tested object is greater than or equal to 2, that is, two or more focusing infrared images of the to-be-tested object are obtained, and the total sharpness of the two or more focusing infrared images of the to-be-tested object is calculated according to the first The total sharpness of the two or more focusing infrared images of the to-be-tested object is calculated according to the first The total sharpness of the two or more focusing infrared images of the to-be-tested object is calculated according to the first The total sharpness of the two or more focusing infrared images of the to-be-tested object is calculated according to the first If yes, the focusing infrared image of the to-be-tested object is clear, and the Z-direction moving assembly 502 stops moving to end the focusing process; if no, the focusing infrared image of the to-be-tested object is not clear, and the Z-direction moving assembly 502 continues to adjust the position of the infrared measuring unit 400 to continue the focusing process.

[0240] Of course, in other embodiments, the preset condition can also be adjusted, and the transformation of the focusing infrared image of the to-be-tested object can be monitored by using structural similarity, and thus the focusing completion condition and the stability of the overall focusing process can be accurately evaluated.

[0241]

[0242] wherein, is a structural similarity coefficient, is a first constant, is a second constant.

[0243] SM=

[0244] In other embodiments, for a clear image, since the brightness and contrast are well maintained and the structural information is complete, the two clear images in the later stage of focusing are highly similar, and for a blurred image, the brightness and contrast are reduced and the structural information is lost, and the similarity of the two images in the early and middle stages of focusing is low. Exemplarily, for an 8-bit image, the first constant can be 6.5025 and the second constant 58.5225, so that the SM can be stably calculated in most images, and of course, the first constant and the second constant can be reasonably selected by the person skilled in the art according to actual needs.

[0245] ​In the application, the control unit can automatically adjust the focal length according to the height change of the to-be-detected article, ensure that clear infrared imaging images of high or low articles can be obtained, automatically adjust and focus, significantly improve the speed and accuracy of infrared imaging, reduce the time of manual intervention and adjustment, adapt to the needs of high-speed production lines, reduce the uncertainty of manual operation, improve the consistency and repeatability of the detection process, ensure that high-quality results can be obtained each time, realize accurate focusing and infrared imaging of the to-be-detected article, realize high precision and high efficiency of product infrared measurement, and can be widely applied to product detection of electronic components, mechanical parts and other manufacturing industries.

[0246] The technical features of the above embodiments can be combined in any manner. To make the description concise, all possible combinations of the technical features in the above embodiments are not described, but as long as the combinations of the technical features do not contradict, they should be considered within the scope of the present disclosure.

[0247] Those skilled in the art can understand that the steps, measures, schemes in various operations, methods and processes discussed in the application can be alternated, changed, combined or deleted; further, other steps, measures, schemes in various operations, methods and processes discussed in the application can also be alternated, changed, rearranged, decomposed, combined or deleted; further, the steps, measures, schemes in various operations, methods and processes in the prior art can also be alternated, changed, rearranged, decomposed, combined or deleted.

[0248] The above embodiments only express several embodiments of the present disclosure, and the description is more specific and detailed, but it should not be understood as a limitation on the scope of the patent of the present disclosure; it should be pointed out that for ordinary skilled in the art, without departing from the concept of the present disclosure, several modifications and improvements can be made, which are within the scope of the present disclosure; therefore, the protection scope of the present disclosure should be subject to the appended claims.

Claims

1. An infrared measuring device, characterized in that, include: The system comprises a platform unit, a feeding unit, a data acquisition unit, an infrared measurement unit, and a control unit. The feeding unit, data acquisition unit, and infrared measurement unit are mounted on the platform unit. The feeding unit feeds and conveys the object to be tested. The data acquisition unit includes a camera unit, a height measurement unit, and a processing unit. The camera unit captures images of the object to be tested. The processing unit processes these images, extracts and identifies the closed edge contour of the object, and captures its center position and attitude data based on this contour, sending these data to the control unit. The height measurement unit collects and processes the height data of the object and the height measurement unit, sending this data to the control unit. The control unit adjusts the position of the infrared measurement unit to focus on the object based on its center position and attitude data, as well as the height data of the object and the height measurement unit. The infrared measurement unit illuminates the object with infrared light to form an infrared image. The infrared measuring device also includes an adjustment unit. The control unit controls the adjustment unit to adjust the position of the infrared measuring unit to focus on the object to be measured. The loading unit includes an X-direction moving component, a Y-direction moving component, and a loading platform. The loading platform is connected to the Y-direction moving component, the Y-direction moving component is connected to the X-direction moving component, and the X-direction moving component is connected to the loading platform unit. The adjustment unit includes a mounting base and a Z-direction moving component. The mounting base is connected to the loading platform unit, and the Z-direction moving component is connected to the acquisition unit and the infrared measuring unit. The control unit, based on the center position data of the object under test, the attitude data of the object under test, and the first focusing height data H1, controls the Z-direction moving component to adjust the distance between the infrared measuring unit and the object under test to focus on the object. The infrared measuring unit acquires multiple infrared images of the object under test to obtain multiple focused infrared images of the object. The control unit calculates the first... The first sharpness of the focused infrared image of the item to be tested. Second clarity And based on the first resolution Second clarity Calculate the first The overall sharpness of the focused infrared image of the item to be tested. According to the The overall sharpness of the focused infrared image of the item to be tested. Based on preset conditions, determine whether to stop focusing. It is a positive integer; First resolution The formula is: = ； in, , , These are the first weighting coefficient, the second weighting coefficient, and the third weighting coefficient. + + =1; Sobel kernel in the horizontal direction for: = ； Vertical Sobel kernel for: = ； Horizontal focusing gradient and vertical focus gradient : = ； = ； in, It is the first Pixels in the focused infrared image of the item to be tested pixel values, It is a positive integer. =1, 2, 3, ... , This represents the total number of pixels in the focused infrared image of the object under test. No. Pixels in the focused infrared image of the item to be tested Focus gradient amplitude for: ； No. Gradient mean of the focused infrared image of the object to be tested Gradient standard deviation They are respectively: ； ； Second clarity for: When d=1, = ; When d=2, 3, ..., = ( ); ； ； ； ； in, The gradient mean of the first focused infrared image of the object under test. The standard deviation of the gradient of the first focused infrared image of the object under test. As the first weighting factor, As the second weighting factor, For the first The gradient mean of the focused infrared image of the object to be tested. For the first The gradient standard deviation of the focused infrared image of the object to be tested. For the first -The gradient mean of one focused infrared image of the object under test. For the first -1 standard deviation of the gradient of a focused infrared image of the object under test. For the first The change in the mean of the gradient For the first Variation in gradient standard deviation.

2. The infrared measuring device according to claim 1, characterized in that, The camera unit includes a camera, a telecentric lens, and a camera light source. The camera is connected to the telecentric lens, and the telecentric lens is connected to the camera light source. The altimeter unit includes a spectrometer altimeter. The infrared measurement unit includes an infrared detector, an infrared camera light source, and an optical lens. The infrared detector is connected to the infrared camera light source, and the infrared detector is connected to the optical lens.

3. The infrared measuring device according to claim 2, characterized in that, The control unit obtains the first focusing height data H1 based on the height data of the object to be measured and the height measuring unit. The first focusing height data H1 is: H1 = Z1 + Z2 - Z3 Where Z1 is the height difference between the object to be measured and the height measuring unit, Z2 is the fixed installation height difference between the infrared camera and the height measuring unit, and Z3 is the reference height compensation value of the height measuring unit.

4. The infrared measuring device according to claim 3, characterized in that, No. The overall sharpness of the focused infrared image of the item to be tested. for: ； The preset conditions are: ； in, This is the focus stability coefficient.

5. An infrared measurement method, employing an infrared measurement device according to any one of claims 1-4, characterized in that, include: Step S100: Loading and conveying the items to be tested; Step S200: Acquire and process the image of the object to be tested, extract and identify the closed edge contour of the object to be tested, and capture the center position data and attitude data of the object to be tested based on the closed edge contour of the object to be tested, and send these data to the control unit; collect the height data of the object to be tested and the height measuring unit and send them to the control unit. In step S300, the control unit adjusts the position of the infrared measuring unit to focus on the object under test based on the center position data, attitude data, and height data of the object under test and the height measuring unit, and then illuminates the object under test with infrared light to form an infrared image.

6. The infrared measurement method according to claim 5, characterized in that, In step S300, the control unit adjusts the position of the infrared measuring unit to focus on the object under test based on the center position data, attitude data, and height data of the object under test and the height measuring unit. Step S301: The control unit obtains the first focus height data H1 based on the height data from the height measuring unit. The first focus height data H1 is: H1 = Z1 + Z2 - Z3 Where Z1 is the height difference between the object to be measured and the height measuring unit, Z2 is the fixed installation height difference between the infrared detector and the height measuring unit, and Z3 is the reference height compensation value of the height measuring unit. Step S302: The control unit, based on the center position data of the object under test, the attitude data of the object under test, and the first focusing height data H1, controls the Z-direction moving component to adjust the distance between the infrared measuring unit and the object under test to focus on the object under test. The infrared measuring unit acquires multiple infrared images of the object under test to obtain multiple focused infrared images of the object under test, and calculates the first focusing height data H1. The first sharpness of the focused infrared image of the item to be tested. Second clarity And based on the first resolution Second clarity Calculate the total sharpness of the d-th focused infrared image of the object under test. According to the The overall sharpness of the focused infrared image of the item to be tested. Based on preset conditions, determine whether to stop focusing. It is a positive integer.

7. The infrared measurement method according to claim 6, characterized in that, Second clarity for: When d=1, = ; When d=2, 3, ..., = ( ); ； ； ； ； in, The gradient mean of the first focused infrared image of the object under test. The standard deviation of the gradient of the first focused infrared image of the object under test. As the first weighting factor, As the second weighting factor, For the first The gradient mean of the focused infrared image of the object to be tested. For the first The gradient standard deviation of the focused infrared image of the object to be tested. For the first -The gradient mean of one focused infrared image of the object under test. For the first -1 standard deviation of the gradient of a focused infrared image of the object under test. For the first The change in the mean of the gradient For the first Variation in gradient standard deviation.

8. The infrared measurement method according to claim 7, characterized in that, No. The overall sharpness of the focused infrared image of the item to be tested. for: ； The preset conditions are: ； in, This is the focus stability coefficient.

Images