Transfer table and transfer method before chip power-on test
By setting up the pending area and transfer area of the transfer table before the chip power-on test, and combining the recording and reminding functions of the process card storage cabinet, the problem of chip batch mixing is solved to ensure the normal progress of the test and the improvement of efficiency.
Patent Information
- Application Number
- CN202510150917.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-11
- Publication Date
- 2025-05-13
AI Technical Summary
Before the chip power-on test, the prior art is difficult to effectively prevent different batches of chip mixes, resulting in the failure to perform normally.
It provides a transfer table and corresponding transfer method before chip power-on testing. By setting up a pending area and a transfer area on the transfer table, it is necessary to ensure that the same batch of chip storage boxes are transferred from the pending area to the transfer area, and to remove the chips in the transfer area to avoid mixing. At the same time, the batch number and testing process of the chip are recorded and reminded by the process card storage cabinet to prevent incorrect mixing.
Effectively prevent different batches of chip mixes, ensure the normal progress of chip power-on tests, and improve testing efficiency and accuracy.
Smart Images
Figure CN119986061A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of chip technology, and in particular to a transfer table and a transfer method before chip power-on test. Background Art
[0002] Before leaving the factory, the chip must be powered on and tested to determine whether it is a qualified product, and defective products must be removed to ensure the quality of the chip before leaving the factory.
[0003] In the prior art, one chip is stored in a storage box. Before a power-on test is performed on the chip, the chip must be taken out of the storage box and then sent to a test bench for a power-on test. Different batches of chips have different processes and material qualities, resulting in different testing methods. As a result, in the process of taking multiple batches of chips out of the storage box and sending them to the test bench, it is easy for chips from different batches to be mixed and sent to the test bench at the same time, resulting in the chip power-on test not being able to proceed normally. Summary of the invention
[0004] The object of the present invention is to provide a transfer table and transfer method before chip power-on test, which can prevent chips from different batches from being mixed when transferring multiple batches of chips, thereby ensuring the normal conduct of chip power-on test.
[0005] To achieve this object, the present invention adopts the following technical solutions:
[0006] In a first aspect, a transfer table before a chip power-on test is provided, which is used to transfer chips, and the chips are placed in a storage box. The transfer table before a chip power-on test includes:
[0007] The table body includes a first table top and a second table top which are arranged in sequence along the vertical direction. The first table top is provided with a processing area for placing storage boxes to be processed, and the second table top is provided with a transfer area, which is used to place storage boxes of the same batch transferred from the processing area to the second table top; a process card storage cabinet, the process card storage cabinet is fixedly connected to the table body, and the process card storage cabinet is used to store test process cards.
[0008] Preferably, a process card placement box is provided in the process card storage cabinet, and a plurality of process card placement boxes are arranged in an M×N array, and the test process cards are stored in the process card placement boxes.
[0009] Preferably, the process card storage cabinet also includes a protective door, one end of which is rotatably connected to the table body, and the protective door can be switched between a closed position in which it shields the process card placement box and an open position in which it avoids the process card placement box.
[0010] Preferably, the process card storage cabinet also includes a display board, which is fixedly connected to the protective door and can display the test process card.
[0011] Preferably, the transfer table before the chip power-on test also includes a strap rack, which can be fixedly connected to the first desktop and / or the second desktop for hanging straps.
[0012] Preferably, the transfer table before the chip power-on test also includes a classification clip box for storing classification clips, and at least two classification clip boxes are fixedly connected to the second desktop.
[0013] Preferably, the classification folder box includes a second hanging portion and a storage box, the storage box is fixedly connected to the second hanging portion, the second hanging portion is hung on the second desktop, and the storage box is used to store the classification folders.
[0014] Preferably, the transfer table before the chip power-on test also includes an ion fan, which is fixedly connected to the second desktop, and the air outlet of the ion fan faces the transfer area.
[0015] Preferably, the transfer table before the chip power-on test also includes a scrap box, and the scrap box is fixedly connected to the second desktop.
[0016] In a second aspect, a chip transfer method before power-on test is provided, using the above chip transfer table before power-on test, comprising the following steps:
[0017] S10, placing storage boxes storing chips of different batches into a waiting area;
[0018] S20, transferring the storage boxes storing the same batch of chips from the waiting area to the transfer area, and checking the test process card of the current batch of chips;
[0019] S30, taking the chips placed in the transfer area out of the storage box and transferring them to the test bench.
[0020] Beneficial effects of the present invention:
[0021] The chip transfer table before power-on test provided by the present invention sets a processing area for placing storage boxes to be processed in the first tabletop, so that when transferring multiple batches of chips, all storage boxes are placed in the processing area, and by setting a transfer area in the second tabletop, the storage boxes storing chips of the same batch can be transferred from the processing area to the transfer area, and the chips can be taken out of the storage boxes, so that the chips taken out of the storage boxes are from the same batch, and will not be mixed with chips of other batches, so that only chips of the same batch are sent to the test bench, and when transferring multiple batches of chips, mixing of chips of different batches can be prevented, ensuring the normal power-on test of the chip; the test process card is stored in the process card storage cabinet, so that the batch number and test process of the chip currently taken out from the storage box by the transfer area can be recorded, and the staff can be reminded of the batch number of the chip that should be transferred from the processing area to the transfer area, so as to prevent the storage box containing chips of other batches from being transferred from the processing area to the transfer area, and further prevent the mixing of chips of different batches.
[0022] The present invention also provides a transfer method before chip power-on test, which can prevent chips from different batches from being mixed when transferring multiple batches of chips, thereby ensuring the normal conduct of chip power-on test. BRIEF DESCRIPTION OF THE DRAWINGS
[0023] Figure 1 It is a schematic diagram of the storage box provided by the present invention;
[0024] Figure 2 It is a structural schematic diagram of the transfer table before the chip power-on test provided by the present invention.
[0025] In the figure:
[0026] 100, chip; 200, storage box; 201, box body; 202, box cover; 1, table body; 11, first table top; 111, waiting area; 12, second table top; 121, transfer area; 122, box cover placement area; 2, process card storage cabinet; 21, process card placement box; 22, protective door; 23, display board; 3, strap rack; 31, first hanging part; 32, first hook; 4, classification clamp box; 41, second hanging part; 42, storage box; 5, ion fan; 6, scrap box. DETAILED DESCRIPTION
[0027] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It is to be understood that the specific embodiments described herein are only used to explain the present invention, rather than to limit the present invention. It should also be noted that, for ease of description, only parts related to the present invention, rather than all structures, are shown in the accompanying drawings.
[0028] In the description of the present invention, unless otherwise clearly specified and limited, the terms "connected", "connected", and "fixed" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.
[0029] In the present invention, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may include that the first and second features are in direct contact, or may include that the first and second features are not in direct contact but are in contact through another feature between them. Moreover, a first feature being "above", "above" and "above" a second feature includes that the first feature is directly above and obliquely above the second feature, or simply indicates that the first feature is higher in level than the second feature. A first feature being "below", "below" and "below" a second feature includes that the first feature is directly below and obliquely below the second feature, or simply indicates that the first feature is lower in level than the second feature.
[0030] In the description of this embodiment, the terms "upper", "lower", "right", etc., directions or positional relationships are based on the directions or positional relationships shown in the drawings, and are only for the convenience of description and simplification of operation, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore cannot be understood as limiting the present invention. In addition, the terms "first" and "second" are only used to distinguish in the description and have no special meaning.
[0031] Figure 1 FIG. 2 shows a schematic diagram of an exploded view of a storage box 200 provided in this embodiment. Figure 1 As shown, the manufacturing process and material quality of chips 100 in different batches are different, resulting in different test methods. As a result, in the process of taking out multiple batches of chips 100 from the storage box 200 and sending them to the test bench, it is easy for chips 100 from different batches to be mixed and sent to the test bench at the same time, resulting in the power-on test of the chips 100 not being able to proceed normally. Therefore, before transferring the chips 100 to the test bench, only taking out the chips 100 of the same batch from the storage box 200 is the key to solving the above technical problems. Figure 1 to Figure 2 The chip power-on test transfer table and transfer method provided by the present invention are introduced in detail.
[0032] Figure 2 FIG. 1 shows a schematic diagram of the structure of the transfer table before the chip power-on test provided in this embodiment. Figure 1 to Figure 2As shown, a chip transfer table before power-on test provided in this embodiment is used for transferring chip 100, and chip 100 is placed in storage box 200. The chip transfer table before power-on test includes a table body 1 and a process card storage cabinet 2; the table body 1 includes a first table top 11 and a second table top 12 spaced apart in the vertical direction, and a to-be-processed area 111 for placing storage boxes 200 to be processed is provided in the first table top 11, and a transfer area 121 is provided in the second table top 12, and the transfer area 121 is used for placing storage boxes 200 of the same batch transferred from the to-be-processed area 111 to the second table top 12; the process card storage cabinet 2 is fixedly connected to the table body 1, and the process card storage cabinet 2 is used for storing test process cards. It is worth noting that the storage box 200 often includes a box body 201 and a box cover 202. The chip 100 is placed in the box body 201. The second desktop 12 is also provided with a box cover placement area 122 for placing the storage box 200. After the chip 100 is taken out of the storage box 200, the box body 201 and the box cover 202 are placed together in the box cover placement area 122, so as to centrally store the storage box 200 and prevent the storage box 200 from being lost. After the chip 100 is sent to the test bench and powered on, the chip 100 can be put back into the storage box 200. The chips 100 of the same batch have a test process card.
[0033] The chip power-on test pre-transfer table provided in the present embodiment has a processing area 111 for placing the storage boxes 200 to be processed in the first table 11, so that when transferring multiple batches of chips 100, all the storage boxes 200 are placed in the processing area 111, and by setting the transfer area in the second table 12, the storage boxes 200 storing the chips 100 of the same batch can be transferred from the processing area 111 to the transfer area 121, and the chips 100 can be taken out of the storage boxes 200, so that the chips 100 taken out of the storage boxes 200 are of the same batch, and will not be mixed with chips 100 of other batches, so that only the chips 100 of the same batch can be transferred. 00 is sent to the test bench. When transferring multiple batches of chips 100, it is possible to prevent chips 100 from being mixed up in different batches, thereby ensuring the normal power-on test of the chips 100. The test process card is stored in the process card storage cabinet 2, so that the batch number and test process of the chip 100 currently taken out from the storage box 200 by the transfer area 121 can be recorded, and the staff can be reminded of the batch number of the chip 100 that should be transferred from the waiting area 111 to the transfer area 121, thereby preventing the storage box 200 containing chips 100 from other batches from being transferred from the waiting area 111 to the transfer area 121, and further preventing chips 100 from being mixed up in different batches.
[0034] Continue as Figure 1 to Figure 2As shown, a process card placement box 21 is provided in the process card storage cabinet 2, and several process card placement boxes 21 are arranged in an M×N array. Test process cards are stored in the process card placement box 21, so that only test process cards of one batch of chips 100 can be placed in one process card placement box 21, so that test process cards of all batches of chips 100 can be reasonably stored, preventing test process cards of different batches of chips 100 from being mixed, which would cause the current chip 100 to be transferred to be inconsistent with the test process card, resulting in the power-on test of the chip 100 not being able to proceed smoothly.
[0035] Continue as Figure 1 to Figure 2 As shown, the process card storage cabinet 2 also includes a protective door 22, one end of which is rotatably connected to the table body 1, and the protective door 22 can switch between a closed position that covers the process card placement box 21 and an open position that avoids the process card placement box 21, so that the staff can close the protective door 22 in time after taking out the test process card from the process card placement box 21 to prevent the second test process card from being taken out by mistake, which will cause confusion in the test process of the chip 100.
[0036] Preferably, the process card storage cabinet 2 also includes a display board 23, which is fixedly connected to the protective door 22. The display board 23 can display the test process card, so that the staff can put the process test card into the display board 23 after taking it out from the process card placement box 21, thereby always reminding the staff of the batch number of the chip 100 currently to be transferred, thereby preventing the storage box 200 containing chips 100 of different batches from being transferred from the processing area 111 to the transfer area 121.
[0037] Several storage boxes 200 containing chips 100 are often bundled together with straps to facilitate taking multiple storage boxes 200 at the same time and to facilitate storage of chips 100. However, in the process of taking chips 100 out of storage boxes 200, the straps are easily lost, and straps of different batches are often bundled with straps of different colors to distinguish batch numbers. Mixing straps will inevitably lead to confusion in the test process. Figure 1 to Figure 2 As shown, the transfer table before the chip power-on test also includes a strap rack 3, which can be fixedly connected to the first desktop 11 and / or the second desktop 12, and is used to hang straps, so that after the staff unties the straps, the straps can be hung on the strap rack 3, thereby preventing the straps from being lost. Specifically, the first desktop 11 and the second desktop 12 are respectively provided with baffles, and the strap rack 3 includes a first hanging portion 31 and a first hook 32, at least two first hooks 32 are arranged on the first hanging portion 31 in parallel and at intervals, and the first hanging portion 31 is hung on the baffle, and different first hooks 32 are hung with straps of different colors, thereby preventing the straps from being mixed.
[0038] The storage box 200 is often provided with a classification clip, on which the batch of the chip 100 stored in the storage box 200 and whether it is a qualified product are marked. Only after the power-on test can it be determined whether the chip 100 is a qualified product. Therefore, the classification clip needs to be removed before the chip 100 is powered on for testing. After the power-on test, the test result is filled in according to the test result, and the classification clip is re-set to the storage box 200 of the storage chip 100. The classification clips of chips 100 from different batches cannot be mixed. To solve the above technical problems, continue as follows Figure 1 to Figure 2 As shown, the transfer table before the chip power-on test also includes a classification clip box 4 for storing classification clips. At least two classification clip boxes 4 are fixedly connected to the second desktop 12, so that the classification clips of different batches of chips 100 can be summarized and placed in the classification clip boxes 4 to prevent the classification clips from mixing. Specifically, the classification clip box 4 includes a second hanging portion 41 and a receiving box 42. The receiving box 42 is used to store the classification clips. The receiving box 42 is fixedly connected to the second hanging portion 41. The second hanging portion 41 is hung on the second desktop 12, so that the classification clip box 4 can be quickly detached, and the removed classification clips can be sent to the test bench for use.
[0039] Continue as Figure 1 to Figure 2 As shown, before the chip is powered on for testing, the transfer table further includes an ion fan 5, which is fixedly connected to the second desktop 12, and the air outlet of the ion fan 5 faces the transfer area 121, so that when the staff takes the chip 100 out of the storage box 200, the ion fan 5 eliminates static electricity to prevent the chip 100 from being damaged by static discharge. It is worth noting that the number of ion fans 5 is not limited, and can be 1, 2, 3, or even more, as long as the air outlet of the ion fan 5 faces the transfer area 121, it can eliminate the static electricity of the chip 100 that has been taken out of the storage box 200, and prevent the chip 100 from being damaged by static discharge.
[0040] Continue as Figure 1 to Figure 2 As shown, the transfer table before the chip power-on test also includes a scrap box 6, which is fixedly connected to the second desktop 12, so that when the staff takes the chip 100 out of the storage box 200 and finds that the appearance is obviously damaged, even if the chip 100 is not powered on and tested, it can be determined that the chip 100 is a defective product. The defective product can be directly put into the scrap box 6 to improve the efficiency of the chip 100 power-on test.
[0041] The present embodiment also provides a transfer method for chips 100 before power-on testing, which uses a transfer table before power-on testing, including the following steps: S10, placing storage boxes 200 storing chips 100 of different batches into the waiting area 111; S20, transferring storage boxes 200 storing chips 100 of the same batch from the waiting area 111 to the transfer area 121, checking the test process card of the chip 100 to be transferred, and reminding the staff of the batch number of the chip 100 that should be transferred from the waiting area 111 to the transfer area 121; S30, taking the chip 100 placed in the transfer area 121 out of the storage box 200, and transferring it to the test bench, thereby preventing the storage box 200 containing chips 100 of other batches from being transferred from the waiting area 111 to the transfer area 121, and further preventing the mixing of chips 100 of different batches.
[0042] Obviously, the above embodiments of the present invention are merely examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention. For those skilled in the art, various obvious changes, readjustments and substitutions can be made without departing from the protection scope of the present invention. It is not necessary and impossible to list all the embodiments here. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the claims of the present invention.
Claims
1. A transfer table before power-on testing of a chip, used for transferring a chip (100), wherein the chip (100) is placed in a storage box (200), characterized in that: The chip power-on test pre-transfer table includes: A table body (1), the table body (1) comprising a first table top (11) and a second table top (12) arranged at intervals in a vertical direction, the first table top (11) being provided with a to-be-processed area (111) for placing the storage boxes (200) to be processed, the second table top (12) being provided with a transfer area (121), the transfer area (121) being used for placing the storage boxes (200) of the same batch transferred from the to-be-processed area (111) to the second table top (12); A process card storage cabinet (2), wherein the process card storage cabinet (2) is fixedly connected to the table body (1), and the process card storage cabinet (2) is used to store test process cards.
2. The chip power-on test front transfer table according to claim 1, characterized in that: A process card placement box (21) is provided in the process card storage cabinet (2), and a plurality of the process card placement boxes (21) are arranged in an M×N array, and the test process cards are stored in the process card placement boxes (21).
3. The chip power-on test front transfer table according to claim 2, characterized in that: The process card storage cabinet (2) further comprises a protective door (22), one end of which is rotatably connected to the table body (1), and the protective door (22) can be switched between a closed position in which it shields the process card placement box (21) and an open position in which it avoids the process card placement box (21).
4. The chip power-on test front transfer table according to claim 3, characterized in that: The process card storage cabinet (2) further comprises a display board (23), wherein the display board (23) is fixedly connected to the protective door (22), and the display board (23) is capable of displaying the test process card.
5. The chip power-on test front transfer table according to claim 1, characterized in that: The chip power-on test front transfer table also includes a strap rack (3), and the strap rack (3) can be fixedly connected to the first desktop (11) and / or the second desktop (12) for hanging straps.
6. The chip power-on test front transfer table according to claim 1, characterized in that: The chip power-on test pre-transfer table also includes a classification clip box (4) for storing classification clips, and at least two of the classification clip boxes (4) are fixedly connected to the second desktop (12).
7. The chip power-on test front transfer table according to claim 6, characterized in that: The classification folder box (4) comprises a second hanging portion (41) and a storage box (42), wherein the storage box (42) is fixedly connected to the second hanging portion (41), the second hanging portion (41) is hung on the second desktop (12), and the storage box (42) is used for storing the classification folders.
8. The chip power-on test front transfer table according to any one of claims 1 to 7, characterized in that: The chip power-on test front transfer table also includes an ion fan (5), the ion fan (5) is fixedly connected to the second desktop (12), and the air outlet of the ion fan (5) faces the transfer area (121).
9. The chip power-on test front transfer table according to any one of claims 1 to 7, characterized in that: The chip power-on test pre-transfer table also includes a scrap box (6), and the scrap box (6) is fixedly connected to the second table top (12).
10. A chip transfer method before power-on test, using the chip transfer table before power-on test according to any one of claims 1 to 9, characterized in that: The steps include: S10, placing a storage box (200) storing chips (100) of different batches into a waiting area (111); S20, transferring the storage box (200) storing the chips (100) of the same batch from the to-be-processed area (111) to the transfer area (121), and checking the test process card of the chips (100) of the current batch; S30, taking the chip (100) placed in the transfer area (121) out of the storage box (200), and transferring it to a test station.