Chip Performance Evaluation Method, Device, Equipment and Storage Medium

By obtaining the initial parameters of each channel in the chip, generating reference parameters based on the target distance, evaluating chip performance, identifying and positioning potential risk channels, the problem of difficult to identify and locate abnormal channels in the prior art is solved, and the reliability of communication transmission is ensured.

CN119996257BActive Publication Date: 2025-06-17M2 SEMICON LTD
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Patent Information

Application Number
CN202510462520.2
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2025-04-14
Publication Date
2025-06-17
Estimated Expiration
2045-04-14

AI Technical Summary

Technical Problem

The prior art is difficult to effectively identify and locate local abnormal channels in chips caused by process or design defects, which makes it difficult to ensure the reliability of communication transmission.

Method used

By obtaining the initial parameters of each channel in the chip, determining the target weight based on the target distance between each channel and the central channel, generating reference parameters, and evaluating chip performance through the similarity between the initial parameters and the reference parameters, identifying and positioning potential risk channels.

Benefits of technology

It realizes an effective evaluation of the channel transmission performance in the chip, can accurately locate the channels with risks, and ensure the reliability of communication transmission.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present application provides a method, apparatus, device, and storage medium for evaluating chip performance. The method is applied in the field of chips and includes: obtaining initial parameters of each channel in the chip under candidate configuration information; wherein the candidate configuration information is used to configure the transmission performance of the channel; the initial parameters include the sampling window length of the channel; determining the target weight of each channel based on the target distance between each channel and the central channel; wherein the target distance is negatively correlated with the target weight; generating reference parameters based on the target weight and the initial parameters corresponding to each channel; determining the performance evaluation result of the chip based on the first similarity between the initial parameters corresponding to each channel and the reference parameters; wherein the performance evaluation result is used to indicate whether there are risky channels in the chip. This method can evaluate the transmission performance of channels in the chip, and then determine whether there are risky channels in the chip to ensure the reliability of communication transmission.
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Description

Technical Field

[0001] The present application relates to the field of chips, and more particularly, to a method, apparatus, device, and storage medium for evaluating chip performance. Background Art

[0002] In high-performance chip design, multi-channel parallel transmission architectures are often adopted for communication within the chip or between the chip and external systems to improve data throughput. In a typical architecture, each physical channel usually adopts a transmitter (TX) and a receiver (RX) structure with a unified design, and the channel layout, wiring, and packaging symmetry are maintained as much as possible at the design level to ensure the equivalence and consistency of signal transmission, and the channels are regarded as equivalent channels in logical design.

[0003] In related technologies, the static performance of channels under a certain parameter configuration is usually concerned, or the convergence boundary of channels under extreme working conditions is evaluated. For example, bit error rate testing, eye diagram scanning, jitter tolerance testing, etc. Such methods are difficult to capture the response trend differences of different channels in the dimension of parameter changes, and cannot effectively identify local abnormal channels caused by process or design defects, so it is difficult to determine whether there are risky channels in the chip. Therefore, how to evaluate the transmission performance of channels in the chip and then determine whether there are risky channels in the chip to ensure the reliability of communication transmission has become an urgent problem to be solved. Summary of the Invention

[0004] The present application provides a method, apparatus, device, and storage medium for evaluating chip performance. The method can evaluate the transmission performance of channels in the chip and then determine whether there are risky channels in the chip to ensure the reliability of communication transmission.

[0005] In a first aspect, a method for evaluating chip performance is provided. The method includes:

[0006] Obtaining initial parameters of each channel in the chip under candidate configuration information; wherein, the candidate configuration information is used to configure the transmission performance of the channel; the initial parameters include the sampling window length of the channel.

[0007] Determining the target weight of each channel based on the target distance between each channel and the central channel; wherein, the target distance is negatively correlated with the target weight.

[0008] Generating reference parameters based on the target weight and the initial parameters corresponding to each channel.

[0009] Determining the performance evaluation result of the chip based on the first similarity between the initial parameters corresponding to each channel and the reference parameters; wherein, the performance evaluation result is used to indicate whether there are risky channels in the chip.

[0010] For the above technical solution, the initial parameters of each channel in the chip under the candidate configuration information are obtained, the target weights of each channel are determined based on the target distances between each channel and the central channel, reference parameters are generated based on the target weights and the initial parameters corresponding to each channel, and the performance evaluation result of the chip is determined based on the first similarity between the initial parameters corresponding to each channel and the reference parameters; compared with the prior art in which when an abnormality occurs in the chip, the performance of the communication channel is detected, since the central channel of the chip is located in the core area of the chip and far from the edge of the chip, the influence of the external environment can be reduced. Therefore, the target weights of each channel are determined based on the target distances between each channel and the central channel, and the target distance is negatively correlated with the target weight, which can comprehensively consider the influence of the channel performance data (initial parameters) of each channel in the communication transmission, thereby ensuring the accuracy of the reference parameters; on this basis, whether there are channels with potential risks in the chip is determined through the reference parameters and the initial parameters of each channel, and thus when there are channels with risks in the chip, the positions of the channels with potential risks in the chip can be accurately located, so that technicians can intervene in advance to ensure the reliability of the communication transmission.

[0011] In combination with the first aspect, in some possible implementation manners, the generating the reference parameters based on the target weights and the initial parameters corresponding to each channel includes:

[0012] Performing weighted processing on the initial parameters corresponding to each channel based on the target weights to generate first sub-parameters; determining the first sub-parameters as the reference parameters; or,

[0013] Performing weighted processing on the initial parameters corresponding to each channel based on the target weights to generate first sub-parameters; performing superposition processing on the initial parameters corresponding to each channel to generate second sub-parameters; using the average parameter of the first sub-parameters and the second sub-parameters as the reference parameters.

[0014] For the above technical solution, the target weights of each channel are determined through the target distances between each channel and the central channel, and reference parameters under each candidate configuration information are generated through the target weights; since the target distances between each channel and the central channel are negatively correlated with the target weights, that is, the target weights decrease as the target distance increases, the influence of the channel performance data of each channel in the channel transmission can be comprehensively considered, thereby ensuring the accuracy of the reference parameters.

[0015] In combination with the first aspect and the above implementation manners, in some possible implementation manners, the performing weighted processing on the initial parameters corresponding to each channel based on the target weights to generate first sub-parameters includes:

[0016] Performing a weighted processing on the initial parameters of the reference channel based on the target weight of the reference channel to obtain the weighted parameters of the reference channel; wherein, the reference channel is used to indicate any one of the channels.

[0017] Determining weighted sub-parameters under the same candidate configuration information among multiple weighted parameters.

[0018] Performing a superposition processing on the weighted sub-parameters to obtain superposition sub-parameters under the same candidate configuration information.

[0019] Generating the first sub-parameter based on the superposition sub-parameters.

[0020] In the above technical solution, by performing a weighted processing on the initial parameters of the reference channel based on the target weight of the reference channel to obtain the weighted parameters of the reference channel, determining weighted sub-parameters under the same candidate configuration information among multiple weighted parameters, performing a superposition processing on the weighted sub-parameters to obtain superposition sub-parameters under the same candidate configuration information, and generating the first sub-parameter based on the superposition sub-parameters; by aligning each candidate configuration information, realizing a weighted average processing of the initial parameters of each channel by the target weights of each channel to generate the first sub-parameter, it can comprehensively consider the influence of the channel performance data of each channel in channel transmission, thereby ensuring the accuracy of the first sub-parameter.

[0021] Combining the first aspect and the above implementation manner, in some possible implementation manners, the method further includes:

[0022] Generating a first image based on the initial parameters corresponding to each channel; and generating a second image based on the reference parameters;

[0023] Determining a second similarity between the first image and the second image of each channel.

[0024] The determining of the performance evaluation result of the chip based on the first similarity between the initial parameters corresponding to each channel and the reference parameters includes:

[0025] Determining the performance evaluation result based on the first similarity and the second similarity corresponding to each channel.

[0026] In the above technical solution, the second similarity between the initial parameters of each channel corresponding to the first image and the second image corresponding to the reference parameters is determined, and the performance evaluation result is determined based on the first similarity and the second similarity corresponding to each channel. Since the first similarity focuses on the numerical similarity between the initial parameters and the reference parameters, and the second similarity focuses on the similarity of the visual content and image texture between the first image and the second image, by combining the data in two dimensions of numerical similarity and image texture similarity to determine the performance evaluation result of the chip, the accuracy of the performance evaluation result of the chip can be improved.

[0027] Combined with the first aspect and the above implementation, in some possible implementations, the determining the performance evaluation result based on the first similarity and the second similarity corresponding to each channel includes:

[0028] If the first similarity corresponding to the target channel is less than the first preset similarity, and / or the second similarity is less than the second preset similarity, it is determined that there is a risk in the target channel, where the target channel is used to indicate any one of the channels; or,

[0029] Based on the first similarity and the second similarity corresponding to the target channel, a target similarity is generated; if the target similarity is less than the third preset similarity, it is determined that there is a risk in the target channel.

[0030] In the above technical solution, the performance evaluation results of each channel are determined based on the first similarity and the second similarity corresponding to each channel. By combining the first similarity and the second similarity corresponding to each channel to determine the performance evaluation results of each channel, and the first similarity focuses on the numerical similarity between the initial parameters and the reference parameters, and the second similarity focuses on the similarity of the visual content and image texture between the first image and the second image. By combining the data in two dimensions of numerical similarity and image texture similarity to determine the performance evaluation result of the chip, the accuracy of the performance evaluation result of the chip can be improved.

[0031] Combined with the first aspect and the above implementation, in some possible implementations, the generating the first image based on the initial parameters corresponding to each channel, and the generating the second image based on the reference parameters includes:

[0032] Based on the adjustment directions of the respective candidate configuration information, the sorting of the initial parameters is adjusted to obtain first parameters; and based on the adjustment directions of the respective candidate configuration information, the sorting of the reference parameters is adjusted to obtain second parameters;

[0033] Based on the first parameters of the respective channels, the first images corresponding to the respective channels are generated; and the second image is generated based on the reference parameters.

[0034] In the above technical solution, the sorting of the initial parameters is adjusted based on the adjustment directions of the respective candidate configuration information to obtain the first parameter, and the sorting of the reference parameters is adjusted based on the adjustment directions of the respective candidate configuration information to obtain the second parameter. Then, based on the first parameters of the respective channels, the first images corresponding to the respective channels are generated, and a second image is generated based on the reference parameters. By adjusting the order of the initial parameters and the reference parameters to make the changes in the physical quantities represented by the re-sorted (adjusted) parameters continuous and generating the first image and the second image of the same type, the chip performance can be determined from the visual content and the similarity of the image texture through continuous physical quantities, ensuring the accuracy of the performance evaluation result.

[0035] Combined with the first aspect and the above implementation, in some possible implementations, after determining the performance evaluation result of the chip based on the first similarity between the initial parameters corresponding to the respective channels and the reference parameters, the method further includes:

[0036] If there are channels with risks in the chip, determine the channel identifiers of the channels with risks;

[0037] Output the channel identifiers.

[0038] In the above technical solution, when there are channels with risks in the chip, determine the channel identifiers corresponding to the channels with risks and output the channel identifiers, so that the user / technician can know the positions of the channels with risks, and then conduct a check on the chip design to avoid affecting data transmission.

[0039] In a second aspect, a chip performance evaluation device is provided. The chip performance evaluation device includes:

[0040] An acquisition module, configured to acquire the initial parameters of each channel in the chip under candidate configuration information; wherein, the candidate configuration information is used to configure the transmission performance of the channel; the initial parameters include the sampling window length of the channel;

[0041] A determination module, configured to determine the target weights of the respective channels based on the target distances between the respective channels and the central channel; wherein, the target distances are negatively correlated with the target weights;

[0042] A generation module, configured to generate reference parameters based on the target weights and the initial parameters corresponding to the respective channels;

[0043] An evaluation module, configured to determine the performance evaluation result of the chip based on the first similarity between the initial parameters corresponding to the respective channels and the reference parameters; wherein, the performance evaluation result is used to indicate whether there are channels with risks in the chip.

[0044] In a third aspect, a chip performance evaluation device is provided, including a memory and a processor. The memory is used to store executable program codes; the processor is used to call and run the executable program codes from the memory, so that the chip performance evaluation device executes the chip performance evaluation method in the above first aspect or any possible implementation manner of the first aspect.

[0045] In a fourth aspect, a computer-readable storage medium is provided. The computer-readable storage medium stores computer program codes. When the computer program codes are run on a computer, the computer is caused to execute the chip performance evaluation method in the above first aspect or any possible implementation manner of the first aspect.

[0046] In a fifth aspect, a computer program product is provided. The computer program product includes: computer program codes. When the computer program codes are run on a computer, the computer is caused to execute the chip performance evaluation method in the above first aspect or any possible implementation manner of the first aspect. Description of the Drawings

[0047] Figure 1 is a schematic flowchart of a chip performance evaluation method provided by an embodiment of the present application;

[0048] Figure 2 is a schematic flowchart of another chip performance evaluation method provided by an embodiment of the present application;

[0049] Figure 3 is a schematic diagram of a first similarity calculation provided by an embodiment of the present application;

[0050] Figure 4 is a schematic structural diagram of a chip performance evaluation device provided by an embodiment of the present application;

[0051] Figure 5 is a schematic structural diagram of a chip performance evaluation device provided by an embodiment of the present application. Detailed Embodiments

[0052] The technical solutions in the present application will be clearly and elaborately described below with reference to the drawings. Among them, in the description of the embodiments of the present application, unless otherwise specified, " / " means "or". For example, A / B may represent A or B. The "and / or" in the text is only a description of the association relationship of the associated objects, indicating that there can be three relationships. For example, A and / or B may represent: A exists alone, A and B exist simultaneously, and B exists alone. In addition, in the description of the embodiments of the present application, "a plurality" means two or more than two.

[0053] In the following, the terms "first" and "second" are used for descriptive purposes only and are not to be understood as suggesting or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features.

[0054] In modern high-speed chip design, multi-channel parallel transmission architecture is often used for communication within the chip or between the chip and external systems to improve data throughput. In a typical architecture, each physical channel usually adopts a transmitter (Transmit, TX) and receiver (Receive, RX) structure with a unified design. At the design level, the channel layout, wiring, and packaging symmetry are maintained as much as possible to ensure the equivalence and consistency of signal transmission, and are regarded as equivalent channels in logic design.

[0055] However, in actual engineering implementation, even if the design structure is exactly the same, there may still be slight differences in the electrical performance of different channels. The reasons may include: non-ideal chip packaging, internal chip process fluctuations, parasitic effects caused by crowded routing, impedance changes caused by PCB layout and welding, etc.

[0056] In related technologies, signal integrity evaluation methods, such as bit error rate testing, eye diagram scanning, and jitter tolerance testing, mainly focus on the static performance of the channel under a certain parameter configuration, or evaluate the convergence boundary of the channel under extreme working conditions. Such methods are difficult to capture the response trend differences of different channels in the dimension of parameter changes, and thus cannot effectively identify local abnormal channels caused by process or design defects.

[0057] In the actual testing and verification process, it was observed that even if the channel design is the same, the receiving performance change trend under different parameter configurations (such as equalization, de-emphasis, clock sampling phase, etc.) may be different. Currently, there is a lack of a universal and systematic method that can quantitatively model the parameter change trend in the entire channel range, and then mine the channel characteristics that deviate from the group behavior. This makes it difficult to quickly locate potential design risks at the channel level in the later chip testing and system verification stages, increasing the debugging complexity and the risk of system instability.

[0058] In view of this, the present application provides a chip performance evaluation method, device, equipment and storage medium, which can evaluate the transmission performance of the channel in the chip, and then determine whether there are risky channels in the chip to ensure the reliability of communication transmission.

[0059] For example, in order to detect the channel performance of a transmitter and a receiver, the duty cycle of the clock signals of the transmitter and the receiver is adjusted to determine the transmission performance of the channel by adjusting the duty cycle control (DCC) parameters, and then locate the channels with risks.

[0060] Figure 1 It is a schematic flowchart of a chip performance evaluation method provided by an embodiment of the present application.

[0061] Exemplarily, as Figure 1 shown, the chip performance evaluation method 100 includes S110-S140.

[0062] S110, obtain the initial parameters of each channel in the chip under the candidate configuration information.

[0063] Exemplarily, the candidate configuration information is used to configure the transmission performance of the channel. It can be understood that each channel in the chip includes a specific circuit; for example, during the DCC parameter adjustment process, the candidate configuration information of each channel includes 0-15. As the selection of the DCC corresponding candidate configuration information for each channel is different (that is, by modifying the value of the register, the adjustment of the DCC parameters of each channel is realized), the transmission performance of each channel is different.

[0064] It can be understood that the candidate configuration information is used to configure the corresponding functional modules in the transceiver, thereby affecting the transmission performance of the channel. Continuing with the example of DCC parameter adjustment, due to the different candidate configuration information of the DCC parameters, the settings of the DCC adjustment modules of the receiver and the transmitter are changed, thereby affecting the transmission performance of the channel. Configuring the transmission performance of the channel here means that with different selections of the candidate configuration information, the transmission performance of each channel may be different. In other words, it is not that the higher the DCC parameter is configured, the better the transmission performance of the channel is. Instead, it means that as the DCC parameters change, the transmission performance of the channel may change, that is, the candidate configuration information will affect the transmission performance of the channel.

[0065] Exemplarily, the initial parameters include the sampling window length of the channel. The sampling window length refers to the length of the time window for accurately sampling the transmitted data; for example, the width of the eye diagram (the length of the time opening for correctly receiving data). In the entire link, the transmission and reception of the chip will be affected by many factors, so the length of the time window for each channel to accurately sample the data (sampling window length) is different. The sampling window length also represents the signal transmission quality and overall performance of the link under specific parameters. Generally, the sampling window length is positively correlated with the transmission performance of the channel. The longer the sampling window length, the better the transmission performance of the channel.

[0066] It should be noted that the receiving structure of the chip in the embodiments of the present application (a combination of functional modules used to receive and process transmission signals in integrated circuit design) includes a clock delay line (delay line) and a structure that traverses the delay line to perform specific pattern detection. This structure traverses the delay line and checks whether the data pattern can be correctly received at each delay line tap; and the length of the gear range that can continuously and accurately receive the pattern is the sampling window length, that is, the sampling window length indicates the maximum continuous effective sampling window length (maximum continuous effective sampling span). It can be understood that the sampling window length is similar to the eye diagram width. The longer the sampling window length (the wider the eye diagram width), the higher the tolerance of the communication link to jitter, and the better the bit error rate performance of the link. Therefore, the quality of the communication link and its anti-jitter ability can be evaluated through the sampling window length.

[0067] Optionally, the sampling window length of the channel can be the time period length of the window; or, the sampling window length of the channel can also be the delay amount corresponding to the gear (the delay line includes multiple delay gears, and different delay gears correspond to different delay amounts, that is, delay values). Of course, the initial parameters can also include other parameters that can represent the transmission performance of the channel, which are not specifically limited here.

[0068] Optionally, the candidate configuration information of each channel can be the configuration information corresponding to the DCC, or the pre-emphasis parameter (Pre-cursor, the influence of one or more symbols before the current symbol on the current symbol; or, Post-cursor, the influence of one or more symbols after the current symbol on the current symbol) in the Finite Impulse Response (FIR). The candidate configuration information of each channel can be determined according to the actual situation, which is not specifically limited here.

[0069] Optionally, the initial parameters of each channel under the candidate configuration information can be represented by a table; or, the initial parameters of each channel under the candidate configuration information can be represented by a matrix. The representation method of the initial parameters can be determined according to the actual situation, which is not specifically limited here.

[0070] It should be noted that the initial parameters are obtained by traversing the parameter data of the combined performance of the transmitters and receivers in each channel of the chip. For example, during the DCC parameter adjustment process, the sampling window lengths of each channel from 0 to 15 (candidate configuration information) under the combination of all transmitter DCC (Transmit Duty Cycle Control, TX DCC) and receiver DCC (Receive Duty Cycle Control, RX DCC) are traversed, and the data matrix is constructed according to the TX DCC and RX DCC coordinates with the sampling window lengths.

[0071] S120. Determine the target weights of each channel based on the target distances between each channel and the central channel.

[0072] Exemplarily, the number of channels in a multi-channel chip may be 2, 4, 8, 17, etc. The number of channels of the chip can be determined according to the chip performance and is not specifically limited here.

[0073] Exemplarily, based on the channel positions of each channel in the chip, determine the target distances between each channel and the central channel, and determine the target weights of each channel according to the target distances. The target distance is negatively correlated with the target weight. As the target distance increases, the target weight gradually decreases; as the target distance decreases, the target weight gradually increases.

[0074] Taking the number of chip channels as 17 for explanation, the chip channels are respectively 0, 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, and the central channel of the chip is channel 8. If the chip channels gradually decrease from 0 to 7, the target weights of chip channels 0 - 7 gradually increase; if the chip channels gradually increase from 8 to 16, the target weights of chip channels 8 - 16 gradually decrease.

[0075] Exemplarily, the change trend of the target weight can be a linear change. For example, the target weights of channel 0 and channel 16 are both 1, the target weights of channel 1 and channel 15 are both 2, the target weights of channel 2 and channel 14 are both 3, the target weights of channel 3 and channel 13 are both 4, the target weights of channel 4 and channel 12 are both 5, the target weights of channel 5 and channel 11 are both 6, the target weights of channel 6 and channel 10 are both 7, and the target weights of channel 7 and channel 9 are both 8. Of course, the change trend of the target weight can be a non-linear change. The change trend of the target weight can be determined according to the actual situation and is not specifically limited here.

[0076] S130. Generate reference parameters based on the target weights and the initial parameters corresponding to each channel.

[0077] Exemplarily, when the target weights of each channel are determined, reference parameters are generated according to the target weights and the initial parameters corresponding to each channel.

[0078] In one example, the initial parameters corresponding to each channel are superimposed to generate reference parameters. Specifically, the initial sub-parameters under the same candidate configuration information among multiple initial parameters are determined, the initial sub-parameters are superimposed and averaged to obtain the superimposed sub-parameters under the same candidate configuration information, and the reference parameters under each candidate configuration information are generated through the superimposed sub-parameters under each candidate configuration information.

[0079] In another example, the initial parameters corresponding to each channel are weighted based on the target weights to generate first sub-parameters, and the first sub-parameters are determined as reference parameters. Specifically, the initial parameters corresponding to each channel are weighted by the target weights of each channel to obtain the first sub-parameters, and the first sub-parameters are determined as reference parameters.

[0080] In yet another example, the initial parameters corresponding to each channel are weighted based on the target weights to generate first sub-parameters, and the initial parameters corresponding to each channel are superimposed to generate second sub-parameters; the average parameter of the first sub-parameters and the second sub-parameters is used as the reference parameter.

[0081] Specifically, the initial parameters corresponding to each channel are weighted by the target weights of each channel to obtain the first sub-parameters; and the initial sub-parameters under the same candidate configuration information among multiple initial parameters are determined, the initial sub-parameters are superimposed and averaged to obtain the superimposed sub-parameters under the same candidate configuration information, the superimposed sub-parameters under each candidate configuration information and the first sub-parameters are averaged to obtain the average sub-parameters under each candidate configuration information, and the reference parameters under each candidate configuration information are generated based on the average sub-parameters.

[0082] In the above technical solution, the target weights of each channel are determined through the target distances between each channel and the central channel, and the reference parameters under each candidate configuration information are generated through the target weights; since the target distances between each channel and the central channel are negatively correlated with the target weights, that is, the target weights decrease as the target distances increase, the influence of the channel performance data of each channel in channel transmission can be comprehensively considered, thereby ensuring the accuracy of the reference parameters.

[0083] Exemplarily, the initial parameters of the reference channel are weighted based on the target weight of the reference channel to obtain the weighted parameters of the reference channel, the reference channel is used to indicate any one of the channels, and the weighted sub-parameters under the same candidate configuration information among multiple weighted parameters are determined, the weighted sub-parameters are superimposed to obtain the superimposed sub-parameters under the same candidate configuration information; the first sub-parameters are generated based on the superimposed sub-parameters.

[0084] In the above technical solution, the initial parameters of the reference channel are weighted by the target weight of the reference channel to obtain the weighted parameters of the reference channel. The weighted sub-parameters under the same candidate configuration information among the multiple weighted parameters are determined, and the weighted sub-parameters are superimposed to obtain the superimposed sub-parameters under the same candidate configuration information. Based on the superimposed sub-parameters, the first sub-parameters are generated. By aligning each candidate configuration information, the target weights of each channel are used to perform weighted average processing on the initial parameters of each channel to generate the first sub-parameters, which can comprehensively consider the influence of the channel performance data of each channel in channel transmission, thereby ensuring the accuracy of the first sub-parameters.

[0085] S140, determine the performance evaluation result of the chip based on the first similarity between the initial parameters corresponding to each channel and the reference parameters.

[0086] Exemplarily, in the case of determining the initial parameters corresponding to each channel and the reference parameters, the first similarity between the initial parameters corresponding to each channel and the reference parameters is determined to obtain the first similarity corresponding to each channel. It is determined whether the first similarity corresponding to each channel is less than the first preset similarity. When the first similarity of the target channel is greater than or equal to the first preset similarity, it is determined that there is no risk for the target channel; when the first similarity of the target channel is less than the first preset similarity, it is determined that the target channel has a risk.

[0087] Optionally, the first preset similarity can be 90%, 92%, etc. The first preset similarity can be determined according to the actual situation and is not specifically limited here.

[0088] Exemplarily, the initial parameters and the reference parameters can be represented in matrix form, and then the matrix similarity between the matrix corresponding to the initial parameters of each channel and the matrix corresponding to the reference parameters is calculated, and the matrix similarity is determined as the first similarity.

[0089] For the above technical solution, the initial parameters of each channel in the chip under the candidate configuration information are obtained. Based on the target distances between each channel and the central channel, the target weights of each channel are determined. Based on the target weights and the initial parameters corresponding to each channel, reference parameters are generated. And based on the first similarity between the initial parameters corresponding to each channel and the reference parameters, the performance evaluation result of the chip is determined. Compared with the prior art where when the chip is abnormal, the performance of the communication channel is detected, since the central channel of the chip is located in the core area of the chip and far from the edge of the chip, the influence of the external environment can be reduced. Therefore, by the target distances between each channel and the central channel, the target weights of each channel are determined, and the target distances are negatively correlated with the target weights, which can comprehensively consider the influence of the channel performance data (initial parameters) of each channel in the communication transmission, and thus ensure the accuracy of the reference parameters. On this basis, through the reference parameters and the initial parameters of each channel, it is determined whether there are channels with potential risks in the chip. Furthermore, when there are channels with risks in the chip, the positions of the channels with potential risks in the chip can be accurately located, so that technicians can intervene in advance to ensure the reliability of the communication transmission.

[0090] To improve the performance evaluation result of the chip, the performance evaluation result of the chip is determined by combining the second similarity between the first image corresponding to the initial parameters and the second image corresponding to the reference parameters, so as to improve the accuracy of the chip performance evaluation result.

[0091] Exemplarily, based on the initial parameters corresponding to each channel, a first image is generated, and based on the reference parameters, a second image is generated. The second similarity between the first image and the second image of each channel is determined, and then based on the first similarity and the second similarity corresponding to each channel, the performance evaluation result is determined.

[0092] Exemplarily, through the initial parameters corresponding to each channel, the first image corresponding to each channel is generated, and through the reference parameters, the second image is generated. In the case of generating multiple first images and second images, the second similarity between the first image and the second image of each channel is determined by calculating the image similarity.

[0093] Optionally, the second similarity between the first image and the second image can be calculated by the mean square error algorithm, or can be obtained by the feature point matching algorithm, or can be obtained by the structural similarity index algorithm. Of course, it can also be predicted by a convolutional neural network. The determination method of the second similarity can be determined according to the actual situation and is not specifically limited here.

[0094] In the above technical solution, the second similarity between the initial parameters of each channel corresponding to the first image and the second image corresponding to the reference parameters is determined, and the performance evaluation result is determined based on the first similarity and the second similarity corresponding to each channel. Since the first similarity focuses on the numerical similarity between the initial parameters and the reference parameters, and the second similarity focuses on the similarity of the visual content and image texture between the first image and the second image, by combining the data in two dimensions of numerical similarity and image texture similarity to determine the performance evaluation result of the chip, the accuracy of the performance evaluation result of the chip can be improved.

[0095] Exemplarily, based on the adjustment directions of the respective candidate configuration information, the sorting of the initial parameters is adjusted to obtain first parameters; and based on the adjustment directions of the respective candidate configuration information, the sorting of the reference parameters is adjusted to obtain second parameters. Based on the first parameters of each channel, a first image corresponding to each channel is generated; and a second image is generated based on the reference parameters.

[0096] It can be understood that the arrangement order of the respective candidate configuration information affects the arrangement order of the initial parameters, that is, by adjusting the arrangement order of the candidate configuration information, the initial parameters can be re-sorted so that the change of the physical quantity represented by the re-sorted parameters is continuous and there is no mutation.

[0097] Taking the adjustment of the DCC parameters in the chip as an example, during the process of adjusting the DCC parameters of each channel of the chip, the initial parameters of each channel under the candidate configuration information (0-15) of DCC are first obtained, and the initial parameters are constructed into a 16*16 matrix. However, due to the actual structure of the hardware DCC register (for example, the forward adjustment and reverse adjustment in the register), the change of the physical quantity represented by the re-sorted (adjusted) parameters is continuous.

[0098] For example, in the actual structure of the DCC register, since the forward adjustment is between 0-7 and the reverse adjustment is between 8-15, the sorting of the directly obtained initial parameters is 0-15, and there is a data mutation between 7 and 8. Therefore, it is necessary to adjust the sorting of the initial parameters according to the adjustment directions of the respective candidate configuration information.

[0099] It can be understood that during the process of adjusting the DCC parameters of each channel of the chip, the initial parameter is a 16*16 matrix, and the row and column sorting of the initial parameter are both parameters corresponding to the candidate configuration information that increases sequentially from 0 to 15. According to the adjustment direction of the candidate configuration information of the DCC, the initial parameter (16*16 matrix) is adjusted to obtain the first parameter, which is also a 16*16 matrix. However, the row and column sorting of the first parameter are parameters corresponding to the candidate configuration information that decreases sequentially from 7 to 0 and increases sequentially from 8 to 15, and the parameters corresponding to 0 and 8 are adjacent parameters. That is, according to the chip characteristics, the order of the rows and columns of the matrix corresponding to the initial parameter is adjusted to obtain the matrix corresponding to the first parameter. Among the parameters corresponding to the rows and columns of the matrix corresponding to the first parameter, there is no sudden change in the physical quantities represented by the adjacent rows or columns.

[0100] Further, after adjusting the sorting of the initial parameter according to the adjustment direction of each candidate configuration information to obtain the first parameter, and adjusting the sorting of the reference parameter according to the adjustment direction of each candidate configuration information to obtain the second parameter, the first image corresponding to the initial parameter of each channel and the second image corresponding to the reference parameter can be generated.

[0101] Optionally, the first image and the second image can be two-dimensional heat maps; for example, taking the adjustment of DCC parameters in the chip as an example, the X-axis of the two-dimensional heat map represents TX DCC, the Y-axis represents RX DCC, and the color depth (or color gradient) represents the size of the sampling window length. Or, the first image and the second image can be three-dimensional surface plots. The X-axis of the three-dimensional surface plot represents TX DCC, the Y-axis represents RX DCC, and the Z-axis is the parameter value in the target parameter (the samplable window length after smoothing), so that users can rotate and zoom to observe the change trend. However, the first image and the second image are of the same type of image.

[0102] In the above technical solution, by adjusting the sorting of the initial parameter according to the adjustment direction of each candidate configuration information to obtain the first parameter, and adjusting the sorting of the reference parameter according to the adjustment direction of each candidate configuration information to obtain the second parameter, and generating the first image corresponding to each channel based on the first parameter of each channel and the second image based on the reference parameter; by adjusting the order of the initial parameter and the reference parameter, the change of the physical quantity represented by the re-sorted (adjusted) parameter is continuous, and the first image and the second image of the same type are generated, so that the chip performance can be determined from the visual content and the similarity of the image texture through the continuous physical quantity, ensuring the accuracy of the performance evaluation result.

[0103] Further, when determining the first similarity between the initial parameters and the reference parameters of each channel, and the second similarity between the first image corresponding to the initial parameters of each channel and the second image corresponding to the reference parameters, the performance evaluation result of the chip is determined through the first similarity and the second similarity of each channel, and the performance evaluation result is used to indicate whether there is a risky channel in the chip.

[0104] In one example, if the first similarity corresponding to the target channel is less than the first preset similarity, and / or the second similarity is less than the second preset similarity, it is determined that the target channel is risky, and the target channel is used to indicate any one of the channels.

[0105] Optionally, the first preset similarity and the second preset similarity can be 90%, 92%, 95%, etc. The first preset similarity can be the same as the second similarity; of course, the first preset similarity can also be different from the second similarity. The first preset similarity and the second similarity can be determined according to the actual situation and are not specifically limited here.

[0106] Specifically, when determining the first similarity and the second similarity of each channel, it is determined whether the first similarity corresponding to the target channel is less than the first preset similarity, and whether the second similarity corresponding to the target channel is less than the second preset similarity; when the first similarity corresponding to the target channel is less than the first preset similarity, it is determined that the target channel is risky; or, when the second similarity corresponding to the target channel is less than the second preset similarity, it is determined that the target channel is risky; or, when the first similarity corresponding to the target channel is less than the first preset similarity and the second similarity corresponding to the target channel is less than the second preset similarity, it is determined that the target channel is risky. In addition, when the first similarity corresponding to the target channel is greater than or equal to the first preset similarity and the second similarity corresponding to the target channel is greater than or equal to the second preset similarity, it is determined that the target channel is not risky.

[0107] In another example, based on the first similarity and the second similarity corresponding to the target channel, a target similarity is generated; if the target similarity is less than the third preset similarity, it is determined that the target channel is risky.

[0108] Optionally, the third preset similarity can be 90%, 92%, 95%, etc. The third preset similarity can be the same as the first preset similarity or the second similarity; of course, the third preset similarity can also be the same as the first preset similarity and the second similarity. The third similarity can be determined according to the actual situation and is not specifically limited here.

[0109] Specifically, when the first similarity and the second similarity corresponding to the target channel are determined, the first similarity and the second similarity are weighted to obtain the target similarity of the target channel, and it is determined whether the target similarity is less than a third preset similarity; when the target similarity of the target channel is less than the third preset similarity, it is determined that the target channel has a risk; when the target similarity of the target channel is greater than or equal to the third preset similarity, it is determined that the target channel has no risk.

[0110] In the above technical solution, based on the first similarity and the second similarity corresponding to each channel, the performance evaluation result of each channel is determined; by combining the first similarity and the second similarity corresponding to each channel, the performance evaluation result of each channel is determined. The first similarity focuses on the numerical similarity between the initial parameters and the reference parameters, and the second similarity focuses on the similarity of the visual content and image texture between the first image and the second image. By combining the data in two dimensions of numerical similarity and image texture similarity to determine the performance evaluation result of the chip, the accuracy of the performance evaluation result of the chip can be improved.

[0111] In addition, when the performance evaluation result of the chip is determined, if there are channels with risks in the chip, the channel identifiers corresponding to the channels with risks are determined and the channel identifiers are output, so that the user / technician can know the positions of the channels with risks, and then the chip design can be checked to avoid affecting data transmission.

[0112] For example, the channels of the chip include channel 0, channel 1, channel 2, channel 3, and channel 4. When there is a risk in channel 1, the channel identifier "1" is output so that the user can know that there is a risk in channel 1; that is, there may be potential risks in channel 1, and technicians need to check it early.

[0113] In the above technical solution, when there are channels with risks in the chip, the channel identifiers corresponding to the channels with risks are determined and the channel identifiers are output, so that the user / technician can know the positions of the channels with risks, and then the chip design can be checked to avoid affecting data transmission.

[0114] Figure 2 It is a schematic flowchart of another chip performance evaluation method provided by an embodiment of the present application.

[0115] Exemplarily, as Figure 2 shown, the chip performance evaluation method 200 includes the following processes S210-S270.

[0116] S210, obtain the initial parameters of each channel in the chip under the candidate configuration information.

[0117] Exemplarily, the candidate configuration information is used to configure the transmission performance of the channels. Taking the adjustment of DCC parameters as an example, the candidate configuration information (DCC parameters) of each channel includes 0 - 15. As the selection of the corresponding candidate configuration information of DCC for each channel is different (i.e., by modifying the value of the register, the adjustment of the DCC parameters of each channel is achieved), the transmission performance of each channel is different.

[0118] It can be understood that the candidate configuration information is used to configure the corresponding functional modules in the transceiver, thereby affecting the transmission performance of the channels. Continuing with the example of DCC parameter adjustment, due to the different candidate configuration information of DCC parameters, the settings of the DCC adjustment modules of the receiver and the transmitter are changed, thereby affecting the transmission performance of the channels. Here, configuring the transmission performance of the channels means that with different selections of the candidate configuration information, the transmission performance of each channel may be different. In other words, it is not that the higher the DCC parameters are configured, the better the transmission performance of the channels. Instead, it means that as the DCC parameters change, the transmission performance of the channels may change, that is, the candidate configuration information will affect the transmission performance of the channels.

[0119] Exemplarily, the initial parameters include the sampling window length of the channels. The sampling window length refers to the length of the time window for accurately sampling the transmitted data; for example, the width of the eye diagram (the length of the time opening for correctly receiving data). In the entire link, the transmission and reception of the chip are affected by many factors, so the length of the time window for each channel to accurately sample the data (sampling window length) is different. The sampling window length also represents the signal transmission quality and overall performance of the link under specific parameters. Generally, the sampling window length is positively correlated with the transmission performance of the channels. The longer the sampling window length, the better the transmission performance of the channels.

[0120] Exemplarily, the initial parameters are obtained by traversing the parameter data of the combined performance of each channel in the transmitter and the receiver in the chip. Specifically, during the DCC parameter adjustment process, the sampling window lengths of each channel under the combination of all TX DCC and RX DCC from 0 - 15 (candidate configuration information) are traversed, and the sampling window lengths are used to construct a data matrix (initial parameters) according to the TX DCC and RX DCC coordinates.

[0121] S220. Based on the target distances between each channel and the central channel, determine the target weights of each channel.

[0122] Exemplarily, the number of channels in a multi - channel chip may be 2, 4, 8, 17, etc. The number of channels of the chip can be determined according to the chip performance and is not specifically limited here.

[0123] Exemplarily, according to the channel positions of each channel in the chip, determine the target distances between each channel and the central channel, and determine the target weights of each channel according to the target distances. The target distance is negatively correlated with the target weight. As the target distance increases, the target weight gradually decreases; as the target distance decreases, the target weight gradually increases.

[0124] Taking the number of chip channels as 17 for explanation, the chip channels are respectively 0, 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, and the central channel of the chip is channel 8. The chip channels gradually decrease from 0 to 7, so the target weights of chip channels 0 to 7 gradually increase; the chip channels gradually increase from 8 to 16, so the target weights of chip channels 8 to 16 gradually decrease.

[0125] For example, the target weights of channel 0 and channel 16 are both 1, the target weights of channel 1 and channel 15 are both 2, the target weights of channel 2 and channel 14 are both 3, the target weights of channel 3 and channel 13 are both 4, the target weights of channel 4 and channel 12 are both 5, the target weights of channel 5 and channel 11 are both 6, the target weights of channel 6 and channel 10 are both 7, and the target weights of channel 7 and channel 9 are both 8.

[0126] S230, perform weighted processing on the initial parameters corresponding to each channel based on the target weights to generate reference parameters.

[0127] Exemplarily, in the case of determining the target weights of each channel, perform weighted processing according to the target weights and the initial parameters corresponding to each channel to generate reference parameters.

[0128] Specifically, perform weighted processing on the initial parameters of the reference channel based on the target weight of the reference channel to obtain the weighted parameters of the reference channel. The reference channel is used to indicate any one of the channels, and determine the weighted sub-parameters under the same candidate configuration information among the multiple weighted parameters, and perform superposition processing on the weighted sub-parameters to obtain the superposition sub-parameters under the same candidate configuration information; generate reference parameters based on the superposition sub-parameters.

[0129] In the above technical solution, by aligning each candidate configuration information, the target weights of each channel are used to perform weighted average processing on the initial parameters of each channel to generate reference parameters, which can comprehensively consider the influence of the channel performance data of each channel in channel transmission, thereby ensuring the accuracy of the reference parameters.

[0130] S240, determine the first similarity between the initial parameters corresponding to each channel and the reference parameters.

[0131] Exemplarily, in the case of determining the initial parameters and reference parameters corresponding to each channel, determine the first similarity between the initial parameters and reference parameters corresponding to each channel, and obtain the first similarity corresponding to each channel.

[0132] Exemplarily, the initial parameters and reference parameters can be represented in matrix form, and then calculate the matrix similarity between the matrix corresponding to the initial parameters of each channel and the matrix corresponding to the reference parameters, and determine the matrix similarity as the first similarity.

[0133] S250, generate a first image based on the initial parameters corresponding to each channel, and generate a second image based on the reference parameters.

[0134] Exemplarily, generate a first image based on the initial parameters corresponding to each channel, and generate a second image based on the reference parameters.

[0135] Specifically, based on the adjustment directions of each candidate configuration information, adjust the sorting of the initial parameters to obtain the first parameters; and based on the adjustment directions of each candidate configuration information, adjust the sorting of the reference parameters to obtain the second parameters. Generate the first image corresponding to each channel based on the first parameters of each channel; and generate a second image based on the reference parameters.

[0136] It can be understood that the arrangement order of each candidate configuration information affects the arrangement order of the initial parameters, that is, by adjusting the arrangement order of the candidate configuration information, the initial parameters can be re-sorted so that the change of the physical quantity represented by the re-sorted parameters is continuous and there is no mutation.

[0137] Taking the adjustment of the DCC parameters in the chip as an example, during the process of adjusting the DCC parameters of each channel of the chip, first obtain the initial parameters of each channel under the candidate configuration information (0-15) of DCC, and construct the initial parameters into a 16*16 matrix. However, due to the actual structure of the hardware DCC register (for example, the forward adjustment and reverse adjustment in the register), so that the change of the physical quantity represented by the re-sorted (adjusted) parameters is continuous.

[0138] For example, in the actual structure of the DCC register, since the adjustment is forward between 0-7 and reverse between 8-15, the sorting of the directly obtained initial parameters is 0-15, and there is a data mutation between 7 and 8. Therefore, it is necessary to adjust the sorting of the initial parameters according to the adjustment direction of each candidate configuration information.

[0139] It is understandable that during the process of adjusting the DCC parameters of each channel of the chip, the initial parameter is a 16*16 matrix, and the row and column sorting of the initial parameter are both parameters corresponding to the candidate configuration information that increases sequentially from 0 to 15. According to the adjustment direction of the candidate configuration information of DCC, the initial parameter (16*16 matrix) is adjusted to obtain the first parameter, which is also a 16*16 matrix. However, the row and column sorting of the first parameter are parameters corresponding to the candidate configuration information that decreases sequentially from 7 to 0 and increases sequentially from 8 to 15, and the parameters corresponding to 0 and 8 are adjacent parameters. That is, according to the chip characteristics, the order of the rows and columns of the matrix corresponding to the initial parameter is adjusted to obtain the matrix corresponding to the first parameter. Among the parameters corresponding to the rows and columns of the matrix corresponding to the first parameter, there is no sudden change in the physical quantities represented by the parameters corresponding to adjacent rows or columns.

[0140] Further, after adjusting the sorting of the initial parameter according to the adjustment direction of each candidate configuration information to obtain the first parameter, and adjusting the sorting of the reference parameter based on the adjustment direction of each candidate configuration information to obtain the second parameter, the first image corresponding to the initial parameter of each channel and the second image corresponding to the reference parameter can be generated.

[0141] Optionally, the first image and the second image can be two-dimensional heat maps; for example, taking the adjustment of DCC parameters in the chip as an example, the X-axis of the two-dimensional heat map represents TX DCC, the Y-axis represents RX DCC, and the color depth (or color gradient) represents the size of the sampling window length. Or, the first image and the second image can be three-dimensional surface plots. The X-axis of the three-dimensional surface plot represents TX DCC, the Y-axis represents RX DCC, and the Z-axis is the parameter value in the target parameter (the samplable window length after smoothing processing), so that users can rotate and zoom to observe the change trend. However, the first image and the second image are of the same type of image.

[0142] S260, determine the second similarity between the first image and the second image of each channel.

[0143] Exemplarily, the first image corresponding to each channel is generated through the initial parameter corresponding to each channel, and the second image is generated through the reference parameter; in the case of generating multiple first images and second images, the second similarity between the first image and the second image of each channel is determined by calculating the image similarity.

[0144] Optionally, the second similarity between the first image and the second image can be calculated by the mean square error algorithm, can also be obtained by the feature point matching algorithm, and can also be obtained by the structural similarity index algorithm; of course, it can also be predicted by a convolutional neural network. The determination method of the second similarity can be determined according to the actual situation and is not specifically limited here.

[0145] S270. Determine the performance evaluation result based on the first similarity and the second similarity corresponding to each channel.

[0146] Exemplarily, the performance evaluation result is used to indicate whether there are risky channels in the chip. There may be risky channels in the chip. Of course, there may also be no risky channels in the chip. By evaluating the chip performance, the reliability of data transmission can be ensured. When there are risky channels in the chip, technicians can conduct early investigations to avoid affecting data transmission.

[0147] In one example, when the first similarity and the second similarity of each channel are determined, determine whether the first similarity corresponding to the target channel is less than the first preset similarity, and whether the second similarity corresponding to the target channel is less than the second preset similarity; when the first similarity corresponding to the target channel is less than the first preset similarity, determine that the target channel is risky; or, when the second similarity corresponding to the target channel is less than the second preset similarity, determine that the target channel is risky; or, when the first similarity corresponding to the target channel is less than the first preset similarity and the second similarity corresponding to the target channel is less than the second preset similarity, determine that the target channel is risky. When the first similarity corresponding to the target channel is greater than or equal to the first preset similarity and the second similarity corresponding to the target channel is greater than or equal to the second preset similarity, determine that the target channel is not risky.

[0148] In another example, when the first similarity and the second similarity corresponding to the target channel are determined, perform a weighted process on the first similarity and the second similarity to obtain the target similarity of the target channel, and determine whether the target similarity is less than the third preset similarity; when the target similarity of the target channel is less than the third preset similarity, determine that the target channel is risky; when the target similarity of the target channel is greater than or equal to the third preset similarity, determine that the target channel is not risky.

[0149] In addition, when the performance evaluation result of the chip is determined, if there are risky channels in the chip, determine the channel identifiers corresponding to the risky channels and output the channel identifiers so that the user / technician can know the positions of the risky channels, and then conduct investigations on the chip design to avoid affecting data transmission.

[0150] In the above technical solution, since the central channel of the chip is located in the core area of the chip and far from the edge of the chip, the influence of the external environment can be reduced. Therefore, the target weights of the channels are determined by the target distances between the channels and the central channel, and the target distance is negatively correlated with the target weight, which can comprehensively consider the influence of the channel performance data (initial parameters) of each channel in communication transmission, thereby ensuring the accuracy of the reference parameters. Further, based on the first similarity and the second similarity corresponding to each channel, the performance evaluation result is determined. The first similarity focuses on the numerical similarity between the initial parameter and the reference parameter, while the second similarity focuses on the similarity of the visual content and image texture between the first image and the second image. By combining the data in two dimensions of numerical similarity and image texture similarity to determine the performance evaluation result of the chip, the accuracy of the performance evaluation result of the chip can be improved.

[0151] It should be noted that in the following embodiments, the method takes the initial parameter as matrix data as an example to Figure 1 refine the step S140 in the illustrated embodiment.

[0152] Figure 3 is a schematic diagram of calculating a first similarity provided by an embodiment of the present application.

[0153] Exemplarily, as Figure 3 shown, the number of channels of the chip is 5, and the configuration information of each channel includes 4 states. Taking the abscissa as the receiver candidate configuration information (including 0-3) and the ordinate as the transmitter candidate configuration information (including 0-3), the combined initial parameters of the receiver and the transmitter are obtained, and the initial parameters are represented by a matrix (a 4*4 matrix). Then, the 0th channel corresponds to matrix 310, the 1st channel corresponds to matrix 320, the 2nd channel corresponds to matrix 330, the 3rd channel corresponds to matrix 340, and the 4th channel corresponds to matrix 350.

[0154] Taking the matrix 310 corresponding to the 0th channel as an example, when the receiver candidate configuration information is 0 and the transmitter candidate configuration information is 0, the initial parameter (sampling window length) is a11; when the receiver candidate configuration information is 0 and the transmitter candidate configuration information is 1, the initial parameter (sampling window length) is a21; when the receiver candidate configuration information is 0 and the transmitter candidate configuration information is 2, the initial parameter (sampling window length) is a31; when the receiver candidate configuration information is 0 and the transmitter candidate configuration information is 3, the initial parameter (sampling window length) is a41; and so on for other parameters, which will not be elaborated here.

[0155] The central channel of the chip is determined to be Channel 2, and the target weights of each channel are determined according to the target distances between each channel and Channel 2. Since Channel 1 and Channel 3 are adjacent to Channel 2 (closer in distance), the target weights of Channel 1 and Channel 3 are 2; since Channel 0 and Channel 4 are separated from Channel 2 by one channel (farther in distance), the target weights of Channel 0 and Channel 4 are 1, and the weight of the central channel is 3.

[0156] According to the target weights of each channel and the initial parameters corresponding to each channel, a reference parameter correspondence matrix 360 is generated. Specifically, the initial parameters of the reference channel (any one of the channels) are weighted according to the target weight of the reference channel to obtain the weighted parameters of the reference channel, and the weighted sub-parameters under the same candidate configuration information among the multiple weighted parameters are determined. The weighted sub-parameters are superimposed to obtain the superimposed sub-parameters under the same candidate configuration information, and the reference parameters are generated based on the superimposed sub-parameters.

[0157] Taking the matrix 310 corresponding to Channel 0 (reference channel) as an example, since the target weight of Channel 0 is 1, the matrix 310 is weighted by the target weight 1 to obtain the weighted parameters of Channel 0 (the weighted parameters are the same as the matrix 310). By analogy, the weighted parameters corresponding to each channel can be obtained.

[0158] Taking the receiver candidate configuration information as 0 and the transmitter candidate configuration information as 0 (the same candidate configuration information) as an example, the weighted sub-parameters of Channel 0 are determined to be a11, the weighted sub-parameters of Channel 1 are 2*b11, the weighted sub-parameters of Channel 2 are 3*c11, the weighted sub-parameters of Channel 3 are 2*d11, and the weighted sub-parameters of Channel 4 are e11. The weighted sub-parameters are superimposed to obtain the superimposed sub-parameters under the same candidate configuration information; for example, k11 = a11 + 2*b11 + 3*c11 + 2*d11 + e11; or, k11 = (a11 + 2*b11 + 3*c11 + 2*d11 + e11) / 5. By analogy, the superimposed sub-parameters under other candidate configuration information can be obtained, and then the reference parameters (matrix 360) are obtained according to each candidate configuration information.

[0159] Further, determine the first similarity between the initial parameters of Channel 0 and the reference parameters (the similarity between Matrix 310 and Matrix 360), the first similarity between the initial parameters of Channel 1 and the reference parameters (the similarity between Matrix 320 and Matrix 360), the first similarity between the initial parameters of Channel 2 and the reference parameters (the similarity between Matrix 330 and Matrix 360), the first similarity between the initial parameters of Channel 3 and the reference parameters (the similarity between Matrix 340 and Matrix 360), and the first similarity between the initial parameters of Channel 4 and the reference parameters (the similarity between Matrix 350 and Matrix 360); determine whether the first similarity is less than the first preset similarity. When the first similarity of any channel is less than the first preset similarity, it is determined that there is a risk in this channel, and then output the channel identifier of this channel for technicians to check and avoid affecting data transmission.

[0160] It should be understood that the above examples are for helping those skilled in the art to understand the embodiments of the present application, rather than limiting the embodiments of the present application to the specific numerical values or specific scenarios illustrated. Those skilled in the art can clearly make various equivalent modifications or changes according to the above examples, and such modifications or changes also fall within the scope of the embodiments of the present application.

[0161] As described above in conjunction with Figures 1 to 3 the chip performance evaluation method provided by the embodiments of the present application is described in detail; hereinafter, in conjunction with Figure 4 and Figure 5 the embodiments of the chip performance evaluation device of the present application will be described in detail. It should be understood that the chip performance evaluation device in the embodiments of the present application can execute various methods of the foregoing embodiments of the present application, that is, the specific working processes of the following various products can refer to the corresponding processes in the foregoing method embodiments.

[0162] Figure 4 is a schematic structural diagram of a chip performance evaluation device provided by an embodiment of the present application.

[0163] Exemplarily, as Figure 4 shown, the chip performance evaluation device 400 includes:

[0164] An acquisition module 410: configured to acquire the initial parameters of each channel in the chip under candidate configuration information; wherein, the candidate configuration information is used to configure the transmission performance of the channel; the initial parameters include the sampling window length of the channel.

[0165] A determination module 420: configured to determine the target weight of each channel based on the target distance between each channel and the central channel; wherein, the target distance is negatively correlated with the target weight.

[0166] A generation module 430: configured to generate reference parameters based on the target weight and the initial parameters corresponding to each channel.

[0167] Evaluation module 440: used to determine the performance evaluation result of the chip based on the first similarity between the initial parameters corresponding to each channel and the reference parameters; wherein, the performance evaluation result is used to indicate whether there are risky channels in the chip.

[0168] Optionally, as an embodiment, the generating module 430 is specifically configured to:

[0169] Perform weighted processing on the initial parameters corresponding to each channel based on the target weight to generate first sub-parameters; determine the first sub-parameters as the reference parameters; or,

[0170] Perform weighted processing on the initial parameters corresponding to each channel based on the target weight to generate first sub-parameters; perform superposition processing on the initial parameters corresponding to each channel to generate second sub-parameters; use the average parameter of the first sub-parameters and the second sub-parameters as the reference parameters.

[0171] Optionally, as an embodiment, the generating module 430 is specifically configured to:

[0172] Perform weighted processing on the initial parameters of the reference channel based on the target weight of the reference channel to obtain the weighted parameters of the reference channel; wherein, the reference channel is used to indicate any one of the channels;

[0173] Determine the weighted sub-parameters under the same candidate configuration information among the multiple weighted parameters;

[0174] Perform superposition processing on the weighted sub-parameters to obtain the superposition sub-parameters under the same candidate configuration information;

[0175] Generate first sub-parameters based on the superposition sub-parameters.

[0176] Optionally, as an embodiment, the evaluation module 440 is specifically configured to:

[0177] Generate a first image based on the initial parameters corresponding to each channel; and generate a second image based on the reference parameters;

[0178] Determine the second similarity between the first image and the second image of each channel;

[0179] Determine the performance evaluation result based on the first similarity and the second similarity corresponding to each channel.

[0180] Optionally, as an embodiment, the evaluation module 440 is specifically configured to:

[0181] If the first similarity corresponding to the target channel is less than the first preset similarity, and / or the second similarity is less than the second preset similarity, determine that the target channel is risky; wherein, the target channel is used to indicate any one of the channels; or,

[0182] Generate a target similarity based on a first similarity and a second similarity corresponding to a target channel; if the target similarity is less than a third preset similarity, determine that there is a risk in the target channel.

[0183] Optionally, as an embodiment, the evaluation module 440 is specifically configured to:

[0184] Adjust the sorting of the initial parameters based on the adjustment directions of the respective candidate configuration information to obtain first parameters; and adjust the sorting of the reference parameters based on the adjustment directions of the respective candidate configuration information to obtain second parameters;

[0185] Generate first images corresponding to the respective channels based on the first parameters of the respective channels; and generate a second image based on the reference parameters.

[0186] Optionally, as an embodiment, the chip performance evaluation device 400 further includes an output module, and the output module is specifically configured to:

[0187] If there are channels with risks in the chip, determine the channel identifiers corresponding to the channels with risks;

[0188] Output the channel identifiers.

[0189] It should be noted that the above chip performance evaluation device 400 is embodied in the form of functional units. The term "module" here can be implemented in software and / or hardware forms, and no specific limitation is made thereto.

[0190] For example, the "module" can be a software program, a hardware circuit, or a combination of the two that implements the above functions. The hardware circuit may include an application specific integrated circuit (ASIC), an electronic circuit, a processor (such as a shared processor, a dedicated processor, or a group of processors, etc.) for executing one or more software or firmware programs, a memory, a merged logic circuit, and / or other suitable components that support the described functions.

[0191] Therefore, the units of the respective examples described in the embodiments of the present application can be implemented in electronic hardware, or in a combination of computer software and electronic hardware. Whether these functions are executed in a hardware or software manner depends on the specific application and design constraint conditions of the technical solution. A person skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of the present application.

[0192] Figure 5 It is a schematic structural diagram of a chip performance evaluation device provided by an embodiment of the present application.

[0193] Exemplarily, such as Figure 5As shown, the chip performance evaluation device 500 includes: a memory 510 and a processor 520. Among them, an executable program code 530 is stored in the memory 510, and the processor 520 is used to call and execute the executable program code 530 to execute a chip performance evaluation method.

[0194] Exemplarily, the memory 510 can be used to store the relevant programs of the chip performance evaluation method provided in the embodiments of the present application; the processor 520 can call the relevant programs of the chip performance evaluation method stored in the memory 510 and execute the chip performance evaluation method of the embodiments of the present application; for example, obtain the initial parameters of each channel in the chip under the candidate configuration information, and the candidate configuration information is used to configure the transmission performance of the channel; the initial parameters include the sampling window length of the channel; based on the target distance between each channel and the central channel, determine the target weight of each channel, and the target distance is negatively correlated with the target weight; based on the target weight and the initial parameters corresponding to each channel, generate reference parameters; based on the first similarity between the initial parameters corresponding to each channel and the reference parameters, determine the performance evaluation result of the chip, and the performance evaluation result is used to indicate whether there are risky channels in the chip.

[0195] In this embodiment, the device can be divided into functional modules according to the above method examples. For example, it can correspond to each functional module, or two or more functions can be integrated into one processing module. The above integrated modules can be implemented in the form of hardware. It should be noted that the division of modules in this embodiment is illustrative, only a logical function division, and there can be other division methods in actual implementation.

[0196] In the case of dividing each functional module corresponding to each function, the device can also include an acquisition module, a determination module, a generation module, an evaluation module, etc. It should be noted that all the relevant contents of each step involved in the above method embodiment can be cited in the function description of the corresponding functional module, and will not be repeated here.

[0197] It should be understood that the device provided in this embodiment is used to execute the above-mentioned chip performance evaluation method, so it can achieve the same effect as the above implementation method.

[0198] In the case of adopting an integrated unit, the device can include a processing module and a storage module. Among them, the processing module can be a processor or a controller, which can implement or execute various exemplary logic blocks, modules and circuits shown in combination with the disclosure of the present application. The processor can also be a combination that realizes computing functions, such as including a combination of one or more microprocessors, a combination of digital signal processing (DSP) and a microprocessor, etc. The storage module can be a memory.

[0199] In addition, the device provided by the embodiments of the present application may specifically be a chip, a component or a module. The chip may include a processor and a memory connected thereto; wherein, the memory is used to store instructions, and when the processor calls and executes the instructions, the chip can execute a chip performance evaluation method provided by the above embodiments.

[0200] The present application also provides a computer-readable storage medium, in which computer program code is stored. When the computer program code runs on a computer, the computer is caused to execute the above-related method steps to implement a chip performance evaluation method provided by the above embodiments. Among them, the computer-readable storage medium may include, but is not limited to, any type of disk, including floppy disks, optical disks, digital versatile discs (DVDs), compact disc read-only memories (CD-ROMs), micro drives, and magneto-optical disks, read-only memories (ROMs), random access memories (RAMs), erasable programmable read-only memories (EPROMs), electrically erasable programmable read-only memories (EEPROMs), dynamic random access memories (DRAMs), video random access memories (VRAMs), flash memory devices, magnetic cards or optical cards, nano-systems (including molecular memory ICs), or any type of medium or device suitable for storing instructions and / or data.

[0201] The present application also provides a computer program product. When the computer program product runs on a computer, the computer is caused to execute the above-related steps to implement a chip performance evaluation method provided by the above embodiments.

[0202] Among them, the computer-readable storage medium, the computer program product or the chip provided by the present application are all used to execute the corresponding methods provided above. Therefore, the beneficial effects that can be achieved can refer to the beneficial effects in the corresponding methods provided above, and will not be elaborated here.

[0203] From the description of the above embodiments, those skilled in the art can understand that for the convenience and conciseness of description, only the division of the above functional modules is used as an example. In actual applications, the above functions can be allocated to different functional modules as needed, that is, the internal structure of the device is divided into different functional modules to complete all or part of the functions described above.

[0204] In the embodiments provided in the present application, it should be understood that the disclosed device and method can be implemented in other ways. For example, the device embodiments described above are only illustrative. For example, the division of modules or units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or integrated into another device, or some features can be ignored or not executed. Another point is that the displayed or discussed coupling or direct coupling or communication connection between each other can be through some interfaces. The indirect coupling or communication connection of the device or unit can be in electrical, mechanical or other forms.

[0205] The above content is only the specific implementation manner of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art within the technical scope disclosed in the present application can easily think of changes or substitutions, which should all be covered by the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A chip performance evaluation method, characterized in that: The method comprises: Acquire initial parameters of each channel in the chip under candidate configuration information; wherein the candidate configuration information is used to configure the transmission performance of the channel; the initial parameters include the sampling window length of the channel; Determine the target weight of each channel based on the target distance between each channel and the central channel; wherein the target distance is negatively correlated with the target weight; Generate reference parameters based on the target weight and the initial parameters corresponding to each channel; Based on a first similarity between the initial parameters corresponding to each channel and the reference parameters, a performance evaluation result of the chip is determined; wherein the performance evaluation result is used to indicate whether the chip includes a channel with risks.

2. The method according to claim 1, characterized in that: The generating reference parameters based on the target weight and the initial parameters corresponding to each channel includes: Perform weighted processing on the initial parameters corresponding to the channels based on the target weight to generate a first sub-parameter; determine the first sub-parameter as the reference parameter; or, Based on the target weight, the initial parameters corresponding to the channels are weighted to generate a first sub-parameter; the initial parameters corresponding to the channels are superimposed to generate a second sub-parameter; and the average parameter of the first sub-parameter and the second sub-parameter is used as the reference parameter.

3. The method according to claim 2, characterized in that The step of performing weighted processing on the initial parameters corresponding to the channels based on the target weight to generate the first sub-parameters includes: Performing weighted processing on the initial parameters of the reference channel based on the target weight of the reference channel to obtain weighted parameters of the reference channel; wherein the reference channel is used to indicate any one of the channels; Determine a weighted sub-parameter under the same candidate configuration information among multiple weighted parameters; Performing superposition processing on the weighted sub-parameters to obtain superposition sub-parameters under the same candidate configuration information; Based on the superposition sub-parameter, the first sub-parameter is generated.

4. The method according to claim 1, characterized in that: The method further comprises: generating a first image based on the initial parameters corresponding to the channels; and generating a second image based on the reference parameters; Determine a second similarity between the first image and the second image of each channel; The determining the performance evaluation result of the chip based on the first similarity between the initial parameters corresponding to each channel and the reference parameters includes: The performance evaluation result is determined based on the first similarity and the second similarity corresponding to each channel.

5. The method according to claim 4, characterized in that The determining the performance evaluation result based on the first similarity and the second similarity corresponding to each channel includes: If the first similarity corresponding to the target channel is less than a first preset similarity, and / or the second similarity is less than a second preset similarity, it is determined that the target channel has a risk; wherein the target channel is used to indicate any channel among the channels; or, A target similarity is generated based on the first similarity and the second similarity corresponding to the target channel; if the target similarity is less than a third preset similarity, it is determined that the target channel has a risk.

6. The method according to claim 4, characterized in that generating a first image based on the initial parameters corresponding to each channel; and generating a second image based on the reference parameters, comprising: Based on the adjustment direction of each candidate configuration information, the order of the initial parameters is adjusted to obtain a first parameter; and based on the adjustment direction of each candidate configuration information, the order of the reference parameters is adjusted to obtain a second parameter; Based on the first parameters of the channels, a first image corresponding to each channel is generated; and based on the reference parameters, the second image is generated.

7. The method according to any one of claims 1 to 6, characterized in that After determining the performance evaluation result of the chip based on the first similarity between the initial parameters corresponding to each channel and the reference parameters, the method further includes: If the chip includes a channel at risk, determining a channel identifier of the channel at risk; The channel identifier is output.

8. A chip performance evaluation device, characterized in that: The device comprises: An acquisition module, used to acquire initial parameters of each channel in the chip under candidate configuration information; wherein the candidate configuration information is used to configure the transmission performance of the channel; the initial parameters include the sampling window length of the channel; A determination module, configured to determine a target weight of each channel based on a target distance between each channel and a central channel; wherein the target distance is negatively correlated with the target weight; A generating module, configured to generate reference parameters based on the target weight and the initial parameters corresponding to each channel; An evaluation module is used to determine a performance evaluation result of the chip based on a first similarity between the initial parameters corresponding to each channel and the reference parameter; wherein the performance evaluation result is used to indicate whether the chip includes a channel with risks.

9. A chip performance evaluation device, characterized in that: include: A memory for storing executable program codes; A processor, configured to call and run the executable program code from the memory, so that the chip performance evaluation device executes the chip performance evaluation method as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed, the chip performance evaluation method according to any one of claims 1 to 7 is implemented.

Citation Information

Patent Citations

  • Wafer anomaly analysis method and device, electronic equipment and readable storage medium

    CN113448787A

  • Defect detection method, device and system

    CN118130464A