Intelligent test system and test method for high-voltage test of transformer

Abstract

The invention provides an intelligent test system and test method for a transformer high-voltage test, the test system comprises a switching device and a control device, the switching device comprises a plurality of groups of loops, a plurality of switching devices corresponding to each group of loops, a grounding port corresponding to each group of loops, a plurality of output ports and a plurality of input ports, the first type of switching devices are used for controlling a connection relationship between an input port and an output port corresponding to each first type of switching device and a loop to which the first type of switching device belongs, and the second type of switching devices are used for controlling a connection relationship between a grounding port corresponding to each second type of switching device and a loop to which the second type of switching device belongs; the control device is used for obtaining a test item identifier for a to-be-tested transformer, and determining first switch state matrix information corresponding to the test item identifier according to the test item identifier. And controlling the plurality of switching devices according to the first switching state matrix information. According to the arrangement, line adjustment between the transformer to be tested and the switching equipment can be automatically realized.

Description

Technical Field

[0001] The present application relates to the technical field of transformer testing, and in particular to an intelligent testing system and testing method for transformer high voltage testing. Background Art

[0002] A transformer is a device that uses the principle of electromagnetic induction to change AC voltage. In order to ensure the safe and reliable operation of the transformer, it is necessary to conduct a power outage test on the transformer to detect whether the corresponding performance of the transformer meets the requirements. The power outage test items of the transformer include, for example, detecting winding resistance, detecting winding frequency response, detecting voltage ratio, etc. The power outage test items require the use of test instruments. There are multiple connecting wires on the transformer. When doing a certain power outage test item, it is necessary to connect the connecting wires corresponding to the power outage test item among the multiple connecting wires on the transformer and the corresponding test instrument. Different power outage test items require the use of different test instruments.

[0003] In the prior art, when switching power outage test items, test personnel are required to climb the transformer multiple times to plug in test wiring, transfer working tools and various wires up and down, and manually remove the connecting wires corresponding to the completed power outage test items from the corresponding test instruments, and then connect the connecting wires corresponding to the power outage test items to be done with the corresponding test instruments, which is time-consuming and laborious. Summary of the invention

[0004] The present application provides an intelligent test system and test method for transformer high-voltage testing, which can automatically adjust the line between the transformer to be tested and the switching equipment, and quickly respond to different test items of the transformer to be tested.

[0005] In order to achieve the above objectives, this application adopts the following technical solutions: In a first aspect, the present application provides an intelligent test system for transformer high voltage testing, including a switching device and a control device; The switching device includes a plurality of loop groups, a plurality of switch devices corresponding to each loop group in the plurality of loop groups, a ground port and a plurality of output ports corresponding to each loop group in the plurality of loop groups, and a plurality of input ports corresponding to each loop group in the plurality of loop groups; The input port is used to connect to the transformer under test; the output port is used to connect to the test equipment; The first type of switch devices among the plurality of switch devices are used to control the connection relationship between the input port and the output port corresponding to each of the first type of switch devices and the corresponding loop, and the second type of switch devices among the plurality of switch devices are used to control the connection relationship between the ground port corresponding to each of the second type of switch devices and the corresponding loop; The control device is used to obtain a test item identification for the transformer to be tested, determine first switch state matrix information corresponding to the test item identification according to the test item identification; and control multiple switch devices according to the first switch state matrix information.

[0006] In some possible implementations, the multiple groups of loops include a first type of loop, and the switching device includes a dielectric loss port corresponding to each group of loops in the first type of loop; the multiple switching devices also include a third type of switching device, and the third type of switching device is used to control the connection relationship between the dielectric loss port corresponding to each third type of switching device and the loop to which it belongs.

[0007] In some possible implementations, the multiple groups of loops include a first type of loop, and an input port corresponding to each group of loops in the first type of loops is used to connect to a winding of a transformer to be tested.

[0008] In some possible implementations, the multiple groups of loops also include a second type of loop, the second type of loop includes at least one group of bushing end screen loops; the transformer to be tested has a bushing, and the bushing has an end screen; the input port corresponding to each group of bushing end screen loops is used to connect to the end screen of the transformer to be tested.

[0009] In some possible implementations, the multiple groups of loops include a first type of loop, and a fourth type of switching device is arranged between every two groups of loops in the first type of loop, and the fourth type of switching device is used to control the connection relationship between every two groups of loops in the first type of loop; the control device is also used to determine whether the test item identifier is a specific test item identifier, and if so, determine the first switch state matrix information and the second switch state matrix information corresponding to the specific test item identifier; according to the first switch state matrix information and the second switch state matrix information, the first type of switching device, the second type of switching device and the fourth type of switching device are controlled.

[0010] In some possible implementations, the test equipment includes multiple test instruments and multiple control switches, and a control switch is arranged between each test instrument and the corresponding output port, and the control switch is used to control the connection relationship between the test instrument and the output port corresponding to the test instrument; the control device is also used to determine the third switch state matrix information corresponding to the test project identifier according to the test project identifier; and control the multiple control switches according to the third switch state matrix information.

[0011] In some possible implementations, the test system further includes a control device, which is used to store the test item identification of the transformer to be tested and obtain user instructions, select the corresponding test item identification according to the user instructions, and send the corresponding test item identification to the control device.

[0012] In some possible implementations, the test system further includes a power supply device and a power switch, wherein the power switch is disposed between the power supply device and the control device, and the power switch is used to control a connection relationship between the power supply device and the control device.

[0013] In some possible implementations, the first type of switching device includes a base and a first fixed part, a second fixed part and a rotating part installed on the base, one end of the rotating part is rotatably connected to the base, the first fixed part and the second fixed part are located on both sides of the rotating part, and the rotating part is used to rotate to cooperate with the first fixed part or rotate to cooperate with the second fixed part; in each group of loops, the input port corresponding to the first type of switching device is connected to the rotating part, the output port corresponding to the first type of switching device is connected to the first fixed part, and the group of loops is connected to the second fixed part.

[0014] In a second aspect, the present application provides an intelligent test method for transformer high-voltage testing, which is applied to a test system, wherein the test system includes a switching device and a control device, wherein the switching device includes multiple groups of loops, multiple switching devices corresponding to each group of loops in the multiple groups of loops, a grounding port and multiple output ports corresponding to each group of loops in the multiple groups of loops, and multiple input ports corresponding to each group of loops in the multiple groups of loops; the input port is used to connect to the transformer to be tested; the output port is used to connect to the test equipment; the first type of switching devices in the multiple switching devices are used to control the connection relationship between the input port and the output port corresponding to each first type of switching device and the loop to which it belongs, and the second type of switching devices in the multiple switching devices are used to control the connection relationship between the ground port corresponding to each second type of switching device and the loop to which it belongs; the test method includes: The control device obtains the test item identification for the transformer to be tested; The control device determines, according to the test item identifier, first switch state matrix information corresponding to the test item identifier; The control device controls the plurality of switch devices according to the first switch state matrix information.

[0015] It can be seen from the above technical solution that the present application has at least the following beneficial effects: In the present application, before testing the transformer to be tested, the transformer to be tested is connected one-to-one with multiple input ports of the switching device of the test system. When performing specific test projects, the control device of the test system obtains the test project identification of the transformer to be tested, and determines the switch state matrix information corresponding to the test project identification based on the test project identification. According to the switch state matrix information, multiple switching devices are controlled to automatically adjust the line between the transformer to be tested and the switching device. In order to quickly respond to different test projects, it is only necessary to connect the test equipment to the corresponding output port on the switching device, which saves time and effort. Moreover, when switching test projects, there is no need to manually change the wiring between the switching device and the transformer to be tested, and climb the transformer multiple times to change the wiring, which avoids wiring errors and ensures the accuracy of the test results. Furthermore, it reduces manual operation, reduces the risk of electric shock to personnel, and improves personal safety. At the same time, it reduces the number of manual operations on equipment and facilities such as the transformer to be tested and the switching device, and improves the protection of equipment and facilities.

[0016] It should be understood that the description of technical features, technical solutions, beneficial effects or similar language in this application does not imply that all features and advantages can be realized in any single embodiment. On the contrary, it is understood that the description of features or beneficial effects means that specific technical features, technical solutions or beneficial effects are included in at least one embodiment. Therefore, the description of technical features, technical solutions or beneficial effects in this specification does not necessarily refer to the same embodiment. Furthermore, the technical features, technical solutions and beneficial effects described in the present embodiment can also be combined in any appropriate manner. Those skilled in the art will understand that the embodiment can be realized without one or more specific technical features, technical solutions or beneficial effects of a specific embodiment. In other embodiments, additional technical features and beneficial effects can also be identified in a specific embodiment that does not embody all embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 A schematic diagram of the structure of a switching device provided by the present application in a specific embodiment; Figure 2 A schematic diagram of multiple groups of loops, multiple input ports, multiple output ports, multiple ground ports, multiple dielectric loss ports, and multiple switch devices provided in an embodiment of the present application; Figure 3 A schematic diagram of a first type of loop and a second type of loop provided in an embodiment of the present application, wherein a fourth type of switch device is provided between every two groups of loops in the first type of loop; Figure 4 A schematic diagram of multiple groups of loops, multiple input ports, multiple output ports, multiple ground ports, multiple dielectric loss ports, and multiple switch devices provided in another embodiment of the present application; Figure 5 A flow chart of an intelligent test method for transformer high voltage testing provided in an embodiment of the present application.

[0018] Figure numerals: 10 - control device; 20 - input port; 30 - output port; 40 - housing; 50 - power switch; 1 - first voltage circuit; 2 - second voltage circuit; 3 - third voltage circuit; 4 - first bushing end screen circuit; 5 - second bushing end screen circuit; 12 - first switch; 13 - second switch; 23 - third switch. DETAILED DESCRIPTION

[0019] The terms "first", "second", "third", etc. in the specification of this application and the accompanying drawings are used to distinguish different objects rather than to limit a specific order.

[0020] In the embodiments of the present application, words such as "exemplary" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a specific way.

[0021] In order to make the description of the following embodiments clear and concise, a brief introduction to the related technology is first given: In order to ensure the safe and reliable operation of the transformer, it is necessary to conduct a power-off test on the transformer to detect whether the corresponding performance of the transformer meets the requirements. When conducting a power-off test on the transformer, connecting wires are required. The number of connecting wires is usually multiple. One end of the multiple connecting wires is connected to the windings and other structures of the transformer one by one, and the other end of the multiple connecting wires is connected to the connection port of the test instrument corresponding to the test item to be done, so that the test instrument can obtain the relevant test parameters of the transformer.

[0022] However, when switching test items, test personnel need to climb the transformer multiple times to plug in test wires, pass work tools and various wires up and down, and manually remove the connecting wires corresponding to the completed test items from the corresponding test instruments, and then connect the connecting wires corresponding to the test items to be done with the corresponding test instruments, which is time-consuming, labor-intensive and poses a safety hazard.

[0023] In view of this, an embodiment of the present application provides an intelligent test system for transformer high-voltage testing, including a switching device and a control device, wherein the switching device has multiple groups of circuits, each group of the multiple circuits is correspondingly provided with multiple input ports, multiple output ports and multiple switching devices, wherein the input port is used to connect to the transformer to be tested, and the output port is used to connect to the test equipment. When switching the test items, the multiple switching devices in the switching device are controlled by the control device to automatically adjust the line between the transformer to be tested and the switching device, so as to quickly respond to different test items. It is only necessary to connect the test equipment to the corresponding output port on the switching device, which saves time and effort. Moreover, when switching the test items, there is no need to manually change the wiring between the switching device and the transformer to be tested, and climb the transformer multiple times to change the wiring, which avoids wiring errors and ensures the accuracy of the test results. Furthermore, it reduces manual operation, reduces the risk of electric shock to personnel, and improves personal safety. At the same time, it reduces the number of manual operations on equipment and facilities such as the transformer to be tested and the switching device, thereby improving the protection of the equipment and facilities.

[0024] The following is an introduction to the intelligent test system for transformer high-voltage testing. The test system includes a switching device and a control device; the switching device includes multiple groups of loops, multiple switching devices corresponding to each group of loops in the multiple groups of loops, a grounding port and multiple output ports corresponding to each group of loops in the multiple groups of loops, and multiple input ports corresponding to each group of loops in the multiple groups of loops; the input port is used to connect to the transformer to be tested; the output port is used to connect to the test equipment; the first type of switching devices among the multiple switching devices are used to control the connection relationship between the input port and the output port corresponding to each first-type switching device and the corresponding loop, and the second type of switching devices among the multiple switching devices are used to control the connection relationship between the grounding port corresponding to each second-type switching device and the corresponding loop; the control device is used to obtain a test item identification for the transformer to be tested, and determine the first switch state matrix information corresponding to the test item identification according to the test item identification; and control multiple switching devices according to the first switch state matrix information.

[0025] The test items of the transformer to be tested may include multiple items such as winding resistance detection, winding frequency response detection, etc. Each test item is assigned a corresponding identifier, for example, the identifier corresponding to the winding resistance detection is Z1, and the identifier corresponding to the winding frequency response detection is Z2.

[0026] In each test item, the state of the switch device is defined by a symbol. For example, for one of the multiple switch devices, if the switch device is in a disconnected state, the corresponding state symbol is 1; if the switch device is in a connected state, the corresponding state symbol is 0. Then, in each test item, the state information corresponding to each of the multiple switch devices can be represented by a row of symbol columns.

[0027] For multiple test items, the state information of the switch devices of the multiple test items are arranged to form multiple rows of symbol columns, and the multiple rows of symbol columns are the first switch state matrix information.

[0028] The test system also includes a control device, which includes an input module, a storage module and a transmission module. All test project identifiers are stored in the storage module. The input module is used to collect user instructions. The user instruction can be any test item. The input module transmits the user instruction to the transmission module. The transmission module selects the corresponding test project identifier in the storage module according to the user instruction, and sends the corresponding test project identifier to the control device so that the control device obtains the corresponding test project identifier.

[0029] The test system also includes a power supply device and a power switch. The power switch is arranged between the power supply device and the control device. The power switch is used to control the connection relationship between the power supply device and the control device.

[0030] When testing the transformer under test, turn on the power switch, connect the power supply device with the control device, operating device and other devices, and supply power to the control device, operating device and other devices. When the test of the transformer under test is finished, turn off the power switch, and disconnect the power supply device from the control device, operating device and other devices.

[0031] Specifically, the multiple groups of loops include first-class loops, and the switching equipment includes a dielectric loss port corresponding to each group of loops in the first-class loops; the multiple switching devices corresponding to each group of loops in the first-class loops also include a third-class switching device, and the third-class switching device is used to control the connection relationship between the dielectric loss port corresponding to each third-class switching device and the loop to which it belongs.

[0032] The dielectric loss port is used to connect to the transformer to be tested. Through the dielectric loss port, the test system provided in the embodiment of the present application can perform a winding dielectric loss test and a bushing dielectric loss test.

[0033] The input port corresponding to each group of loops in the first type of loops is used to connect to the winding of the transformer to be tested.

[0034] The multiple groups of loops also include a second type of loop, which includes at least one group of bushing end screen loops; the transformer to be tested has a bushing, and the bushing has an end screen; the input port corresponding to each group of bushing end screen loops is used to connect to the end screen of the transformer to be tested.

[0035] The second type of circuit may include only one set of casing end screen circuits, or may include two sets of casing end screen circuits, three sets of casing end screen circuits, or more sets of casing end screen circuits. The embodiment of the present application does not limit the number of sets of casing end screen circuits.

[0036] like Figure 1 The figure shows a schematic diagram of the structure of the adapter device, which includes a shell 40, an input port 20, an output port 30, a ground port, a dielectric loss port, a control device 10 and a power switch 50 arranged on the shell, and multiple groups of loops, multiple switching devices, control devices, and power devices are arranged in the shell 40. Figure 1 In the illustrated embodiment, the control device, the control device 10, the power supply device and the power switch 50 are all part of the switching device. In other embodiments, the control device, the control device 10, the power supply device and the power switch 50 may also be separate devices, which can communicate with the switching device to achieve corresponding functions.

[0037] Specifically, each set of loops may be a copper conductive ring or the like.

[0038] Taking the transformer to be tested as a three-phase three-winding transformer as an example, the test system is explained as follows: Figure 2 As shown, the multiple groups of circuits in the switching device include a first type of circuit and a second type of circuit. The first type of circuit includes a first voltage circuit 1, a second voltage circuit 2 and a third voltage circuit 3, and the second type of circuit includes a first bushing end screen circuit 4 and a second bushing end screen circuit 5.

[0039] Among them, all the first-type switch devices in the switching equipment are double-throw switches, and all the second-type switch devices and all the third-type switch devices are single-throw switches.

[0040] The first voltage loop 1 corresponds to four first-type switching devices, one second-type switching device and one third-type switching device, the four first-type switching devices are switch X1, switch X2, switch X3 and switch X4, the second-type switching device is switch Y1, and the third-type switching device is switch M1; the first voltage loop 1 corresponds to four input ports, the four input ports are input port A, input port B, input port C and input port O; the first voltage loop 1 corresponds to four output ports, the four output ports are output port A#, output port B#, output port C# and output port O#; the first voltage loop 1 corresponds to a ground port E and a dielectric loss port K.

[0041] The switch X1 is used to control: the input port A is connected to the output port A# and the input port A is disconnected from the first voltage loop 1, or the input port A is disconnected from the output port A# and the input port A is connected to the first voltage loop 1. When the input port A is connected to the output port A# and the input port A is disconnected from the first voltage loop 1, the state symbol corresponding to the switch X1 is 0; when the input port A is disconnected from the output port A# and the input port A is connected to the first voltage loop 1, the state symbol corresponding to the switch X1 is 1.

[0042] The switch X2 is used to control: the input port B is connected to the output port B#, the input port B is disconnected from the first voltage loop 1, or the input port B is disconnected from the output port B#, and the input port B is connected to the first voltage loop 1. When the input port B is connected to the output port B# and the input port B is disconnected from the first voltage loop 1, the state symbol corresponding to the switch X2 is 0; when the input port B is disconnected from the output port B# and the input port B is connected to the first voltage loop 1, the state symbol corresponding to the switch X2 is 1.

[0043] The switch X3 is used to control: the input port C is connected to the output port C#, the input port C is disconnected from the first voltage loop 1, or the input port C is disconnected from the output port C#, and the input port C is connected to the first voltage loop 1. When the input port C is connected to the output port C# and the input port C is disconnected from the first voltage loop 1, the state symbol corresponding to the switch X3 is 0; when the input port C is disconnected from the output port C# and the input port C is connected to the first voltage loop 1, the state symbol corresponding to the switch X3 is 1.

[0044] The switch X4 is used to control: the input port O is connected to the output port O#, the input port O is disconnected from the first voltage loop 1, or the input port O is disconnected from the output port O#, and the input port O is connected to the first voltage loop 1. When the input port O is connected to the output port O# and the input port O is disconnected from the first voltage loop 1, the state symbol corresponding to the switch X4 is 0; when the input port O is disconnected from the output port O# and the input port O is connected to the first voltage loop 1, the state symbol corresponding to the switch X4 is 1.

[0045] The switch Y1 is used to control whether the ground port E is connected or disconnected from the first voltage loop 1. When the ground port E is disconnected from the first voltage loop 1, the state symbol corresponding to the switch Y1 is 0; when the ground port E is connected to the first voltage loop 1, the state symbol corresponding to the switch Y1 is 1.

[0046] The switch M1 is used to control whether the dielectric loss port K is connected or disconnected from the first voltage loop 1. When the dielectric loss port K is disconnected from the first voltage loop 1, the state symbol corresponding to the switch M1 is 0; when the dielectric loss port K is connected to the first voltage loop 1, the state symbol corresponding to the switch M1 is 1.

[0047] The second voltage loop 2 corresponds to four first-type switching devices, one second-type switching device and one third-type switching device, the four first-type switching devices are switch X5, switch X6, switch X7 and switch X8, the second-type switching device is switch Y2, and the third-type switching device is switch M2; the second voltage loop 2 corresponds to four input ports, the four input ports are input port Am, input port Bm, input port Cm and input port Om; the second voltage loop 2 corresponds to four output ports, the four output ports are output port Am#, output port Bm#, output port Cm# and output port Om#; the second voltage loop 2 corresponds to a ground port Em and a dielectric loss port Km.

[0048] The switch X5 is used to control: the input port Am is connected to the output port Am# and the input port Am is disconnected from the second voltage loop 2, or the input port Am is disconnected from the output port Am# and the input port Am is connected to the second voltage loop 2. When the input port Am is connected to the output port Am# and the input port Am is disconnected from the second voltage loop 2, the state symbol corresponding to the switch X5 is 0; when the input port Am is disconnected from the output port Am# and the input port Am is connected to the second voltage loop 2, the state symbol corresponding to the switch X5 is 1.

[0049] The switch X6 is used to control: the input port Bm is connected to the output port Bm#, the input port Bm is disconnected from the second voltage loop 2, or the input port Bm is disconnected from the output port Bm#, and the input port Bm is connected to the second voltage loop 2. When the input port Bm is connected to the output port Bm# and the input port Bm is disconnected from the second voltage loop 2, the state symbol corresponding to the switch X6 is 0; when the input port Bm is disconnected from the output port Bm# and the input port Bm is connected to the second voltage loop 2, the state symbol corresponding to the switch X6 is 1.

[0050] The switch X7 is used to control: the input port Cm is connected to the output port Cm#, the input port Cm is disconnected from the second voltage loop 2, or the input port Cm is disconnected from the output port Cm#, and the input port Cm is connected to the second voltage loop 2. When the input port Cm is connected to the output port Cm# and the input port Cm is disconnected from the second voltage loop 2, the state symbol corresponding to the switch X7 is 0; when the input port Cm is disconnected from the output port Cm# and the input port Cm is connected to the second voltage loop 2, the state symbol corresponding to the switch X7 is 1.

[0051] The switch X8 is used to control: the input port Om is connected to the output port Om#, the input port Om is disconnected from the second voltage loop 2, or the input port Om is disconnected from the output port Om#, and the input port Om is connected to the second voltage loop 2. When the input port Om is connected to the output port Om# and the input port Om is disconnected from the second voltage loop 2, the state symbol corresponding to the switch X8 is 0; when the input port Om is disconnected from the output port Om# and the input port Om is connected to the second voltage loop 2, the state symbol corresponding to the switch X8 is 1.

[0052] The switch Y2 is used to control whether the ground port Em is connected or disconnected from the second voltage loop 2. When the ground port Em is disconnected from the second voltage loop 2, the state symbol corresponding to the switch Y2 is 0; when the ground port Em is connected to the second voltage loop 2, the state symbol corresponding to the switch Y2 is 1.

[0053] The switch M2 is used to control whether the dielectric loss port Km is connected or disconnected from the second voltage loop 2. When the dielectric loss port Km is disconnected from the second voltage loop 2, the state symbol corresponding to the switch M2 is 0; when the dielectric loss port Km is connected to the second voltage loop 2, the state symbol corresponding to the switch M2 is 1.

[0054] The third voltage loop 3 corresponds to three first-type switching devices, one second-type switching device and one third-type switching device, the three first-type switching devices are switch X9, switch X10, and switch X11, the second-type switching device is switch Y3, and the third-type switching device is switch M3; the third voltage loop 3 corresponds to three input ports, the three input ports are input port a, input port b, input port c, and input port o; the third voltage loop 3 corresponds to three output ports, the three output ports are output port a#, output port b#, output port c#, and output port o#; the third voltage loop 3 corresponds to a ground port e and a dielectric loss port k.

[0055] The switch X9 is used to control: the input port a is connected to the output port a#, the input port a is disconnected from the third voltage loop 3, or the input port a is disconnected from the output port a#, and the input port a is connected to the third voltage loop 3. When the input port a is connected to the output port a#, and the input port a is disconnected from the third voltage loop 3, the state symbol corresponding to the switch X9 is 0; when the input port a is disconnected from the output port a#, and the input port a is connected to the third voltage loop 3, the state symbol corresponding to the switch X9 is 1.

[0056] The switch X10 is used to control: the input port b is connected to the output port b#, the input port b is disconnected from the third voltage loop 3, or the input port b is disconnected from the output port b#, and the input port b is connected to the third voltage loop 3. When the input port b is connected to the output port b# and the input port b is disconnected from the third voltage loop 3, the state symbol corresponding to the switch X10 is 0; when the input port b is disconnected from the output port b# and the input port b is connected to the third voltage loop 3, the state symbol corresponding to the switch X10 is 1.

[0057] The switch X11 is used to control: the input port c is connected to the output port c#, the input port c is disconnected from the third voltage loop 3, or the input port c is disconnected from the output port c#, and the input port c is connected to the third voltage loop 3. When the input port c is connected to the output port c# and the input port c is disconnected from the third voltage loop 3, the state symbol corresponding to the switch X11 is 0; when the input port c is disconnected from the output port c# and the input port c is connected to the third voltage loop 3, the state symbol corresponding to the switch X11 is 1.

[0058] The switch Y3 is used to control whether the ground port e is connected or disconnected from the third voltage loop 3. When the ground port e is disconnected from the third voltage loop 3, the state symbol corresponding to the switch Y3 is 0; when the ground port e is connected to the third voltage loop 3, the state symbol corresponding to the switch Y3 is 1.

[0059] The switch M3 is used to control whether the dielectric loss port k is connected or disconnected from the third voltage loop 3. When the dielectric loss port k is disconnected from the third voltage loop 3, the state symbol corresponding to the switch M3 is 0; when the dielectric loss port k is connected to the third voltage loop 3, the state symbol corresponding to the switch M3 is 1.

[0060] The first bushing end screen loop 4 corresponds to four first-type switching devices and one second-type switching device, the four first-type switching devices are switch X12, switch X13, switch X14, and switch X15, and the second-type switching device is switch Y4; the first bushing end screen loop 4 corresponds to four input ports and four output ports, the four input ports are input port Ap, input port Bp, input port Cp, and input port Op, and the four output ports are output port Ap#, output port Bp#, output port Cp#, and output port Op#; the first bushing end screen loop 4 corresponds to a grounding port Ep.

[0061] The switch X12 is used to control: the input port Ap is connected to the output port Ap#, the input port Ap is disconnected from the first casing end screen loop 4, or the input port Ap is disconnected from the output port Ap#, and the input port Ap is connected to the first casing end screen loop 4. When the input port Ap is connected to the output port Ap#, and the input port Ap is disconnected from the first casing end screen loop 4, the state symbol corresponding to the switch X12 is 0; when the input port Ap is disconnected from the output port Ap#, and the input port Ap is connected to the first casing end screen loop 4, the state symbol corresponding to the switch X12 is 1.

[0062] The switch X13 is used to control: the input port Bp is connected to the output port Bp#, the input port Bp is disconnected from the first casing end screen loop 4, or the input port Bp is disconnected from the output port Bp#, and the input port Bp is connected to the first casing end screen loop 4. When the input port Bp is connected to the output port Bp# and the input port Bp is disconnected from the first casing end screen loop 4, the state symbol corresponding to the switch X13 is 0; when the input port Bp is disconnected from the output port Bp# and the input port Bp is connected to the first casing end screen loop 4, the state symbol corresponding to the switch X13 is 1.

[0063] The switch X14 is used to control: the input port Cp is connected to the output port Cp#, the input port Cp is disconnected from the first casing end screen loop 4, or the input port Cp is disconnected from the output port Cp#, and the input port Cp is connected to the first casing end screen loop 4. When the input port Cp is connected to the output port Cp# and the input port Cp is disconnected from the first casing end screen loop 4, the state symbol corresponding to the switch X14 is 0; when the input port Cp is disconnected from the output port Cp# and the input port Cp is connected to the first casing end screen loop 4, the state symbol corresponding to the switch X14 is 1.

[0064] The switch X15 is used to control: the input port Op is connected to the output port Op#, the input port Op is disconnected from the first casing end screen loop 4, or the input port Op is disconnected from the output port Op#, and the input port Op is connected to the first casing end screen loop 4. When the input port Op is connected to the output port Op# and the input port Op is disconnected from the first casing end screen loop 4, the state symbol corresponding to the switch X15 is 0; when the input port Op is disconnected from the output port Op# and the input port Op is connected to the first casing end screen loop 4, the state symbol corresponding to the switch X15 is 1.

[0065] The switch Y4 is used to control whether the grounding port Ep is connected or disconnected with the first bushing end screen loop 4. When the grounding port Ep is disconnected from the first bushing end screen loop 4, the state symbol corresponding to the switch Y4 is 0; when the grounding port Ep is connected to the first bushing end screen loop 4, the state symbol corresponding to the switch Y4 is 1.

[0066] The second bushing end screen loop 5 corresponds to four first-class switching devices and one second-class switching device, the four first-class switching devices are switch X16, switch X17, switch X18, and switch X19, and the second-class switching device is switch Y5; the second bushing end screen loop 5 corresponds to four input ports and four output ports, the four input ports are input port Apm, input port Bpm, input port Cpm, and input port Opm, and the four output ports are output port Apm#, output port Bpm#, output port Cpm#, and output port Opm#; the first bushing end screen loop 4 corresponds to one grounding port Epm.

[0067] The switch X16 is used to control: the input port Apm is connected to the output port Apm#, the input port Apm is disconnected from the second casing end screen loop 5, or the input port Apm is disconnected from the output port Apm#, and the input port Apm is connected to the second casing end screen loop 5. When the input port Apm is connected to the output port Apm#, and the input port Apm is disconnected from the second casing end screen loop 5, the state symbol corresponding to the switch X16 is 0; when the input port Apm is disconnected from the output port Apm#, and the input port Apm is connected to the second casing end screen loop 5, the state symbol corresponding to the switch X16 is 1.

[0068] The switch X17 is used to control: the input port Bpm is connected to the output port Bpm#, the input port Bpm is disconnected from the second casing end screen loop 5, or the input port Bpm is disconnected from the output port Bpm#, and the input port Bpm is connected to the second casing end screen loop 5. When the input port Bpm is connected to the output port Bpm# and the input port Bpm is disconnected from the second casing end screen loop 5, the state symbol corresponding to the switch X17 is 0; when the input port Bpm is disconnected from the output port Bpm# and the input port Bpm is connected to the second casing end screen loop 5, the state symbol corresponding to the switch X17 is 1.

[0069] The switch X18 is used to control: the input port Cpm is connected to the output port Cpm#, the input port Cpm is disconnected from the second casing end screen loop 5, or the input port Cpm is disconnected from the output port Cpm#, and the input port Cpm is connected to the second casing end screen loop 5. When the input port Cpm is connected to the output port Cpm# and the input port Cpm is disconnected from the second casing end screen loop 5, the state symbol corresponding to the switch X18 is 0; when the input port Cpm is disconnected from the output port Cpm# and the input port Cpm is connected to the second casing end screen loop 5, the state symbol corresponding to the switch X18 is 1.

[0070] The switch X19 is used to control: the input port Opm is connected to the output port Opm#, the input port Opm is disconnected from the second casing end screen loop 5, or the input port Opm is disconnected from the output port Opm#, and the input port Opm is connected to the second casing end screen loop 5. When the input port Opm is connected to the output port Opm# and the input port Opm is disconnected from the second casing end screen loop 5, the state symbol corresponding to the switch X19 is 0; when the input port Opm is disconnected from the output port Opm# and the input port Opm is connected to the second casing end screen loop 5, the state symbol corresponding to the switch X19 is 1.

[0071] The switch Y5 is used to control whether the grounding port Epim is connected or disconnected with the second casing end screen loop 5. When the grounding port Epim is disconnected with the second casing end screen loop 5, the state symbol corresponding to the switch Y5 is 0; when the grounding port Epim is connected with the second casing end screen loop 5, the state symbol corresponding to the switch Y5 is 1.

[0072] The connection relationship between the first type of switch device and the corresponding input port, output port and the circuit to which it belongs is described by taking the corresponding switch X1, input port A and output port A# in the first voltage circuit 1 as an example. The switch X1 includes a base and a first fixed part, a second fixed part and a rotating part arranged on the base. One end of the rotating part is rotatably connected to the base, and the first fixed part and the second fixed part are located on both sides of the rotating part; the rotating part is connected to the input port A, the first fixed part is connected to the output port A#, and the second fixed part is connected to the first voltage circuit 1. When the rotating part rotates to match with the first fixed part, the input port A is connected to the output port A# through the switch X1; when the rotating part rotates to match with the second fixed part, the input port A is connected to the first voltage circuit 1 through the switch X1. The connection relationship between the remaining first type of switch devices and the corresponding input ports, output ports and circuits to which they belong refers to the connection relationship between the switch X1, the input port A, the output port A# and the first voltage circuit 1.

[0073] The connection relationship between the second type of switch device and the corresponding ground port and the circuit to which it belongs is described by taking the corresponding switch Y1 and ground port E in the first voltage circuit 1 as an example. The switch Y1 includes a first contact, a second contact and a switch rod. One end of the switch rod is connected to the first contact, the first contact is connected to the ground port E, and the second contact is connected to the first voltage circuit 1. When the switch rod is matched with the second contact, the ground port E is connected to the first voltage circuit 1 through the switch Y1. When the switch rod is unmatched with the second contact, the ground port E is disconnected from the first voltage circuit 1. The connection relationship between the remaining second type of switch devices and the corresponding ground ports and circuits to which they belong refers to the connection relationship between the switch Y1, the ground port E and the first voltage circuit 1.

[0074] The connection relationship between the third type of switch device and the corresponding dielectric loss port and the corresponding loop refers to the connection relationship between the second type of switch device and the corresponding ground port and the corresponding loop.

[0075] The transformer to be tested comprises a high voltage winding, a medium voltage winding, a low voltage winding, a high voltage bushing and a low voltage bushing. The high voltage bushing comprises a first end screen, and the medium voltage bushing comprises a second end screen.

[0076] Before testing the transformer to be tested, the switching device is connected to the transformer to be tested through a first connecting line, wherein: the input port A, input port B, input port C, and input port O corresponding to the first voltage loop 1 are respectively connected to the four terminals of the high voltage winding of the transformer in a one-to-one correspondence; the input port Am, input port Bm, input port Cm, and input port Om corresponding to the second voltage loop 2 are respectively connected to the four terminals of the medium voltage winding of the transformer in a one-to-one correspondence; the input port a, input port b, and input port c corresponding to the third voltage loop 3 are respectively connected to the three terminals of the low voltage winding of the transformer in a one-to-one correspondence; the input port Ap, input port Bp, input port Cp, and input port Op corresponding to the first bushing end screen loop 4 are respectively connected to the four lead-out terminals of the first end screen of the high voltage bushing of the transformer to be tested; the input port Apm, input port Bpm, input port Cpm, and input port Opm corresponding to the second bushing end screen loop 5 are respectively connected to the four lead-out terminals of the second end screen of the medium voltage bushing of the transformer to be tested.

[0077] The grounding port E, the grounding port Em, the grounding port e, the grounding port Ep, and the grounding port Epim can be connected to a grounding body through corresponding grounding wires. The grounding body can be, for example, a grounding grid or a grounding rod.

[0078] The dielectric loss port K, the dielectric loss port Km, and the dielectric loss port k can be connected to the insulation structure of the transformer to be tested in a one-to-one correspondence through their respective corresponding first connecting lines.

[0079] like Figure 3 As shown, the switching device also includes three fourth-category switching devices, which are a first switch 12, a second switch 13 and a third switch 23. The first switch 12 is arranged between the first voltage loop 1 and the second voltage loop 2, and the first switch 12 is used to control the connection relationship between the first voltage loop 1 and the second voltage loop 2; the second switch 13 is arranged between the first voltage loop 1 and the third voltage loop 3, and the second switch 13 is used to control the connection relationship between the first voltage loop 1 and the third voltage loop 3; the third switch 23 is arranged between the second voltage loop 2 and the third voltage loop 3, and the third switch 23 is used to control the connection relationship between the second voltage loop 2 and the third voltage loop 3.

[0080] The structure of the fourth type of switching device refers to the structure of the second type of switching device.

[0081] Among them, when the first voltage loop 1 and the second voltage loop 2 are in a disconnected state, the state symbol corresponding to the first switch 12 is 0; when the first voltage loop 1 and the second voltage loop 2 are in a connected state, the state symbol corresponding to the first switch 12 is 1. When the second voltage loop 2 and the third voltage loop 3 are in a disconnected state, the state symbol corresponding to the third switch 23 is 0; when the second voltage loop 2 and the third voltage loop 3 are in a connected state, the state symbol corresponding to the third switch 23 is 1. When the first voltage loop 1 and the third voltage loop 3 are in a disconnected state, the state symbol corresponding to the second switch 13 is 0; when the second voltage loop 2 and the third voltage loop 3 are in a connected state, the state symbol corresponding to the second switch 13 is 1.

[0082] The corresponding relationship between the test item identification and the test items of the transformer to be tested is shown in Table 1 below: Table 1:

[0083] The first switch state matrix information corresponding to the test item identifier is shown in Table 2 and Table 3 below: Table 2:

[0084] Table 3:

[0085] Among them, the test items corresponding to the test item identifiers Z8-Z14 are specific test items, so the test item identifiers Z8-Z14 are specific test item identifiers. The second switch state matrix information corresponding to the specific test item identifiers is shown in the following Table 4: Table 4:

[0086] When a test item other than a specific test item is performed, the first switch 12 , the second switch 13 and the third switch 23 are all in an open state.

[0087] When the user wants to perform a routine test item on the transformer under test, for example, when the user wants to test the winding resistance of the transformer under test, the user transmits the test item identifier Z1 of the winding resistance to the control device through the control device 10, the control device obtains the test item identifier Z1, the control device judges the test item identifier Z1, the control device judges that the test item identifier Z1 is not a specific test item identifier, and the control device controls switches X1 to X19, switches Y1 to Y5, and switches M1 to M3 according to the information in Table 2 and Table 3, so that the above-mentioned multiple switches are respectively in the states corresponding to the test item Z1 in Table 2 and Table 3.

[0088] When the user wants to perform a specific test item on the transformer under test, for example, when the user wants to test the dielectric loss factor and capacitance (high voltage to medium and low voltage and ground) of the transformer under test, the user transmits the test item identifier Z8 to the control device through the control device 10, the control device obtains the test item identifier Z8, the control device determines the test item Z8, the control device determines that the test item identifier Z8 is a specific test item identifier, and the control device controls switches X1 to X19, switches Y1 to Y5, and switches M1 to M3 according to the information in Table 2 and Table 3, so that the multiple switches are respectively in the states corresponding to the test item Z8 in Table 2 and Table 3. At the same time, the control device controls the first switch 12, the second switch 13 and the third switch 23 according to the information in Table 4, so that the first switch 12, the second switch 13 and the third switch 23 are respectively in the states corresponding to the test item Z8 in Table 4.

[0089] In another embodiment, if Figure 4 As shown, the third voltage loop 3 also corresponds to a switch X20, an input port o and an output port o#, and the switch X20 is used to control: the input port o is connected to the output port o#, and the input port o is disconnected from the third voltage loop 3, or the input port o is disconnected from the output port o#, and the input port o is connected to the third voltage loop 3.

[0090] According to the above content, the intelligent test system for transformer high-voltage testing provided by the embodiment of the present application connects the transformer to be tested with multiple input ports of the switching device of the test system one by one before testing the transformer to be tested. When doing a specific test project, the control device of the test system obtains the test project identification, and determines the switch state matrix information corresponding to the test project identification according to the test project identification. According to the switch state matrix information, multiple switching devices are controlled to automatically adjust the line between the transformer to be tested and the switching device, and quickly respond to different test projects. It is only necessary to connect the test equipment to the corresponding output port on the switching device, which saves time and effort. Moreover, when switching test projects, there is no need to manually change the wiring between the switching device and the transformer to be tested, and climb the transformer multiple times to change the wiring, which avoids wiring errors and ensures the accuracy of the test results. Furthermore, it reduces manual operation, reduces the risk of electric shock to personnel, and improves personal safety. At the same time, it reduces the number of manual operations on equipment and facilities such as the transformer to be tested and the switching device, and improves the protection of equipment and facilities.

[0091] In order to further save the workload of manual wiring, the test equipment includes multiple test instruments and multiple control switches. A control switch is arranged between each test instrument and the corresponding output port, and the control switch is used to control the connection relationship between the test instrument and the output port corresponding to the test instrument; the control device is also used to determine the third switch state matrix information corresponding to the test project identifier according to the test project identifier; and control the multiple control switches according to the third switch state matrix information.

[0092] In a specific embodiment, the test equipment includes a first test instrument, a second test instrument and a third test instrument, the test system includes a first control switch, a second control switch and a third control switch, and the multiple output ports of the switching device include a first output port, a second output port and a third output port.

[0093] Among them, the first test instrument is connected to the first output port, and there is a first control switch between the two, and the first control switch is used to control the connection relationship between the first test instrument and the first output port; the second test instrument is connected to the second output port, and there is a second control switch between the two, and the second control switch is used to control the connection relationship between the second test instrument and the second output port; the third test instrument is connected to the third output port, and there is a third control switch between the two, and the third control switch is used to control the connection relationship between the third test instrument and the third output port.

[0094] Alternatively, the first test instrument is connected to the first output port and the third output port respectively, with a first control switch between the first test instrument and the first output port, and a third control switch between the first test instrument and the third output port; the second test instrument is connected to the first output port and the second output port respectively, with a first control switch between the second test instrument and the first output port, and a second control switch between the second test instrument and the second output port; the third test instrument is connected to the second output port and the third output port respectively, with a second control switch between the third test instrument and the second output port, and a third control switch between the third test instrument and the third output port.

[0095] In each test item, the state of the control switch is defined by a symbol. For example, for one of the multiple control switches, if the control switch is in a disconnected state, the corresponding state symbol is 1; if the control switch is in a connected state, the corresponding state symbol is 0. Then, in each test item, the state information of each of the multiple control switches can be represented by a row of symbol columns.

[0096] For multiple test items, the state information of the control switches corresponding to the multiple test items are arranged to form multiple rows of symbol columns, and the multiple rows of symbol columns are the third switch state matrix information.

[0097] The third switch state matrix information is similar to the first switch state matrix information, and the contents of Table 2 and Table 3 may be referred to.

[0098] Before testing the transformer to be tested, multiple test instruments are connected to the output ports of the adapter device one by one through the second connecting wires. For example, Figure 3 Output port A# to output port Opm# in the illustrated embodiment are respectively connected to respective test instruments in a one-to-one correspondence; when a test item is performed on the transformer to be tested, the control device obtains the test item identifier of the test item, and obtains first switch state matrix information and third switch state matrix information corresponding to the test item identifier according to the test item identifier. The control device controls multiple switch devices and multiple control switches according to the first switch state matrix information and the third switch state matrix information, thereby automatically realizing the line adjustment between the transformer to be tested and the switching device, and automatically realizing the line adjustment between the switching device and the test equipment. It is only necessary to connect the transformer to be tested and the switching device once before the test, and to connect the switching device and the test equipment once. No manual wiring and line change is required during the test, thereby further improving the test efficiency.

[0099] Among them, when doing a specific test project, according to the specific test project identifier, the first switch state matrix information, the second switch state matrix information and the third switch state matrix information corresponding to the specific test project identifier are obtained, and the control device controls the first type of switch devices, the second type of switch devices, the third type of switch devices, the fourth type of switch devices and multiple control switches according to the first switch state matrix information, the second switch state matrix information and the third switch state matrix information.

[0100] On the other hand, the embodiment of the present application further provides an intelligent test method for transformer high voltage test, which is applied to the test system in the above embodiment, and the test method comprises the following steps: S101, the control device obtains the test item identification for the transformer to be tested; S102, the control device determines first switch state matrix information corresponding to the test item identifier according to the test item identifier; S103: The control device controls multiple switch devices according to the first switch state matrix information.

[0101] In a specific embodiment, the plurality of groups of loops in the switching device include first-class loops, and a fourth-class switch device is provided between every two groups of loops in the first-class loops, and the fourth-class switch device is used to control the connection relationship between every two groups of loops in the first-class loops, and the test items include common test items and specific test items, and the test method further includes: The control device determines whether the test item identifier is a specific test item identifier; If so, the control device determines the first switch state matrix information and the second switch state matrix information corresponding to the specific test item identifier, and the control device controls the first type of switching devices, the second type of switching devices, the third type of switching devices, and the fourth type of switching devices according to the first switch state matrix information and the second switch state matrix information.

[0102] If not, the control device determines the first switch state matrix information corresponding to the common test item identifier, and the control device controls the first type of switch devices, the second type of switch devices, and the third type of switch devices according to the first switch state matrix information.

[0103] In a specific embodiment, the test equipment includes a plurality of test instruments and a plurality of control switches, a control switch is provided between each test instrument and a corresponding output port, and the control switch is used to control the connection relationship between the test instrument and the output port corresponding to the test instrument. The test method also includes: The control device also determines, according to the test item identifier, third switch state matrix information corresponding to the test item identifier; The control device controls the multiple control switches according to the third switch state matrix information.

[0104] The descriptions of the processes or structures corresponding to the above-mentioned figures have different emphases. For parts that are not described in detail in a certain process or structure, please refer to the relevant descriptions of other processes or structures.

[0105] The above description is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any changes or substitutions within the technical scope disclosed in the present application should be included in the protection scope of the present application.

Claims

1. An intelligent test system for transformer high voltage test, characterized in that: Including switching equipment and control equipment; The switching device includes multiple groups of loops, multiple switch devices corresponding to each group of loops in the multiple groups of loops, a ground port and multiple output ports corresponding to each group of loops in the multiple groups of loops, and multiple input ports corresponding to each group of loops in the multiple groups of loops; The input port is used to connect to the transformer to be tested; the output port is used to connect to the test equipment; The first type of switch devices among the plurality of switch devices are used to control the connection relationship between the input port and the output port corresponding to each of the first type of switch devices and the corresponding loop, and the second type of switch devices among the plurality of switch devices are used to control the connection relationship between the ground port corresponding to each of the second type of switch devices and the corresponding loop; The control device is used to obtain a test item identifier for the transformer to be tested, determine first switch state matrix information corresponding to the test item identifier according to the test item identifier, and control the multiple switch devices according to the first switch state matrix information.

2. The intelligent test system for transformer high voltage test according to claim 1 is characterized in that: The plurality of groups of loops include a first type of loop, and the switching device includes a dielectric loss port corresponding to each group of loops in the first type of loop; The plurality of switch devices also include a third type of switch device, and the third type of switch device is used to control the connection relationship between the dielectric loss port corresponding to each of the third type of switch devices and the loop to which it belongs.

3. The intelligent test system for transformer high voltage test according to claim 1 is characterized in that: The multiple groups of loops include a first type of loop, and the input port corresponding to each group of loops in the first type of loops is used to be connected to the winding of the transformer to be tested.

4. The intelligent test system for transformer high voltage test according to claim 1 is characterized in that: The plurality of groups of circuits also include a second type of circuit, the second type of circuit including at least one group of casing end screen circuits; The transformer to be tested has a bushing, and the bushing has an end screen; The input port corresponding to each group of bushing end screen loops is used to connect to the end screen of the transformer to be tested.

5. The intelligent test system for transformer high voltage test according to claim 1 is characterized in that: The plurality of groups of loops include first-type loops, and a fourth-type switch device is provided between every two groups of loops in the first-type loops, and the fourth-type switch device is used to control the connection relationship between every two groups of loops in the first-type loops; The control device is also used to determine whether the test item identifier is a specific test item identifier. If so, determine the first switch state matrix information and the second switch state matrix information corresponding to the specific test item identifier; and control the first type of switch devices, the second type of switch devices, and the fourth type of switch devices according to the first switch state matrix information and the second switch state matrix information.

6. The intelligent test system for transformer high voltage test according to claim 1, characterized in that: The test equipment includes a plurality of test instruments and a plurality of control switches, wherein the control switch is provided between each of the test instruments and the corresponding output port, and the control switch is used to control the connection relationship between the test instrument and the output port corresponding to the test instrument; The control device is further used to determine third switch state matrix information corresponding to the test item identifier according to the test item identifier; and control the plurality of control switches according to the third switch state matrix information.

7. The intelligent test system for transformer high voltage test according to claim 1 is characterized in that: The test system further includes a control device, which is used to store the test item identification of the transformer to be tested and obtain user instructions, select the corresponding test item identification according to the user instructions, and send the corresponding test item identification to the control device.

8. The intelligent test system for transformer high voltage test according to claim 1, characterized in that: The test system further comprises a power supply device and a power switch. The power switch is arranged between the power supply device and the control device, and is used to control the connection relationship between the power supply device and the control device.

9. The intelligent test system for transformer high voltage test according to claim 1, characterized in that: The first type of switch device comprises a base and a first fixed part, a second fixed part and a rotating part mounted on the base, one end of the rotating part is rotatably connected to the base, the first fixed part and the second fixed part are located on both sides of the rotating part, and the rotating part is used to rotate to cooperate with the first fixed part or rotate to cooperate with the second fixed part; In each group of loops, the input port corresponding to the first type of switching device is connected to the rotating part, the output port corresponding to the first type of switching device is connected to the first fixed part, and the group of loops is connected to the second fixed part.

10. An intelligent test method for transformer high voltage test, characterized in that: Applied to a test system, the test system includes a switching device and a control device, the switching device includes multiple groups of loops, multiple switch devices corresponding to each group of loops in the multiple groups of loops, a ground port and multiple output ports corresponding to each group of loops in the multiple groups of loops, and multiple input ports corresponding to each group of loops in the multiple groups of loops; the input port is used to connect to the transformer to be tested; the output port is used to connect to the test equipment; the first type of switch devices in the multiple switch devices are used to control the connection relationship between the input port and the output port corresponding to each first type of switch device and the corresponding loop, and the second type of switch devices in the multiple switch devices are used to control the connection relationship between the ground port corresponding to each second type of switch device and the corresponding loop; the test method includes: The control device obtains a test item identifier for the transformer to be tested; The control device determines, according to the test item identifier, first switch state matrix information corresponding to the test item identifier; The control device controls the plurality of switch devices according to the first switch state matrix information.

Images