Device, chip, voltage calibration circuit, and voltage calibration method
By designing a voltage calibration circuit for driving the chip, the problem of reference voltage accuracy deviation due to high temperature is solved, and efficient calibration of the voltage to be calibrated in the chip is achieved, ensuring the stability of chip performance and the calibration efficiency are improved.
Patent Information
- Application Number
- CN202510223418.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-27
- Publication Date
- 2025-05-23
AI Technical Summary
After the driver chip is soldered to the printed circuit board, the accuracy of the reference voltage deviates from the preset value due to high temperature, resulting in a degradation of chip performance or failure.
A voltage calibration circuit is designed, including a first analog-to-digital converter, a preset quantization value generation module and a calibration module. By quantizing the bandgap reference voltage and the voltage to be calibrated, the actual quantized value is compared with the preset quantized value, and the voltage value of the voltage to be calibrated is adjusted according to the comparison results until the preset accuracy is achieved.
The reference voltage with accuracy deviation due to high temperature is effectively calibrated, ensuring stable performance of the chip, improving calibration efficiency and reducing calibration costs.
Smart Images
Figure CN120029408A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of integrated circuits, and in particular to a device, a chip, a voltage calibration circuit and a voltage calibration method. Background Art
[0002] Existing display devices are all provided with a driver chip, and some precise reference voltages are usually required in the driver chip. These reference voltages are generally generated by using a reference voltage in conjunction with a trimming circuit.
[0003] Although these reference voltages in the driver chip have been adjusted to the required accuracy before the chip leaves the factory, when the driver chip is soldered to the printed circuit board (PCB), the high temperature during the soldering process will cause the accuracy of these reference voltages to deviate from the preset values, resulting in performance degradation or even failure of the driver chip.
[0004] Therefore, a voltage calibration circuit is needed to calibrate the reference voltage whose accuracy is deviated due to high temperature after the driver chip is soldered to the printed circuit board. Summary of the invention
[0005] In view of the above problems, the object of the present invention is to provide a device, a chip, a voltage calibration circuit and a voltage calibration method, so as to calibrate the reference voltage whose accuracy deviates due to high temperature in the chip after the chip is soldered to a printed circuit board.
[0006] According to one aspect of the present invention, there is provided a voltage calibration circuit, comprising a first analog-to-digital converter, for quantizing a bandgap reference voltage and a voltage to be calibrated to obtain an actual quantization value, wherein the actual quantization value represents the ratio of the voltage values between the bandgap reference voltage and the voltage to be calibrated; a preset quantization value generating module, for quantizing the bandgap reference voltage and a standard reference voltage to obtain a first quantization value, and multiplying the first quantization value by the second quantization value to obtain a preset quantization value, wherein the first quantization value represents the ratio of the voltage values between the bandgap reference voltage and the standard reference voltage, and the second quantization value represents the ratio of the voltage values between the standard reference voltage and an ideal value of the voltage to be calibrated; and a calibration module, for comparing the actual quantization value with the preset quantization value, and adjusting the voltage value of the voltage to be calibrated according to the comparison result.
[0007] Optionally, the calibration module is further configured to adjust the voltage value of the voltage to be calibrated by a successive approximation method according to a comparison result between the actual quantized value and the preset quantized value until the voltage value of the voltage to be calibrated reaches a preset accuracy.
[0008] Optionally, the calibration module includes: a comparator, used to compare the actual quantization value with the preset quantization value, and output a comparison signal according to the comparison result; a successive approximation logic unit, used to generate a calibration signal according to the comparison signal; and a voltage adjustment unit, used to adjust the voltage value of the voltage to be calibrated according to the calibration signal.
[0009] Optionally, the preset quantization value generating module includes a second analog-to-digital converter, used to quantize the bandgap reference voltage and the standard reference voltage to obtain a first quantization value; and a multiplier, used to multiply the first quantization value and the second quantization value to obtain the preset quantization value.
[0010] Optionally, the second analog-to-digital converter multiplexes the first analog-to-digital converter.
[0011] Optionally, the voltage calibration circuit also includes a memory, which pre-stores a second quantized value corresponding to at least one voltage to be calibrated; the memory is used to provide the second quantized value of the at least one voltage to be calibrated to the multiplier in sequence, and store the preset quantized value corresponding to the at least one voltage to be calibrated obtained by the multiplier in sequence.
[0012] According to a second aspect of the present invention, a voltage calibration method is provided, comprising quantizing a bandgap reference voltage and a voltage to be calibrated to obtain an actual quantization value; comparing the actual quantization value with a preset quantization value, and adjusting the voltage value of the voltage to be calibrated according to the comparison result; repeating the above steps until the voltage to be calibrated reaches a preset accuracy; before quantizing the bandgap reference voltage and the voltage to be calibrated to obtain the actual quantization value, it also comprises: quantizing the bandgap reference voltage and a standard reference voltage to obtain a first quantization value; multiplying the first quantization value and the second quantization value to obtain the preset quantization value, wherein the actual quantization value represents the ratio of the voltage values between the bandgap reference voltage and the voltage to be calibrated, the first quantization value represents the ratio of the voltage values between the bandgap reference voltage and the standard reference voltage, and the second quantization value represents the ratio of the voltage values between the standard reference voltage and the ideal value of the voltage to be calibrated.
[0013] Optionally, the voltage calibration method further includes adjusting the voltage value of the voltage to be calibrated by adopting a successive approximation method according to a comparison result between the actual quantized value and the preset quantized value until the voltage to be calibrated reaches a preset accuracy.
[0014] Optionally, the voltage calibration method further includes pre-storing a second quantization value corresponding to at least one voltage to be calibrated; sequentially multiplying the second quantization value of the at least one voltage to be calibrated with the first quantization value to sequentially obtain a preset quantization value corresponding to the at least one voltage to be calibrated, and storing the preset quantization value corresponding to the at least one voltage to be calibrated.
[0015] According to a third aspect of the present invention, a chip is provided, comprising the voltage calibration circuit as described above, and configured to execute the voltage calibration method as described above.
[0016] According to a fourth aspect of the present invention, there is provided a device, comprising the chip as described above, wherein the voltage calibration circuit is used to calibrate a plurality of voltages to be calibrated in the chip.
[0017] The device, chip, voltage calibration circuit and voltage calibration method provided by the present invention quantize the bandgap reference voltage and the voltage to be calibrated by a first analog-to-digital converter to obtain an actual quantized value; quantize the bandgap reference voltage and the standard reference voltage by a preset quantized value generation module to obtain a first quantized value, and multiply the first quantized value by the second quantized value to obtain a preset quantized value; and compare the actual quantized value with the preset quantized value by a calibration module, and adjust the voltage value of the voltage to be calibrated according to the comparison result, so that the voltage to be calibrated in the chip after high-temperature welding can be calibrated to a preset accuracy. In addition, the voltage calibration circuit provided by the present invention only needs to receive a standard reference voltage provided by an external test circuit to realize the calibration of multiple voltages to be calibrated in the chip, which not only improves the calibration efficiency but also reduces the calibration cost. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] The above and other objects, features and advantages of the present invention will become more apparent through the following description of the embodiments of the present invention with reference to the accompanying drawings, in which:
[0019] Figure 1 A schematic diagram of the structure of a voltage calibration circuit according to an embodiment of the present invention is shown;
[0020] Figure 2 A schematic diagram of the structure of a preset quantization value generating module according to an embodiment of the present invention is shown;
[0021] Figure 3 A schematic flow chart of a voltage calibration method according to an embodiment of the present invention is shown. DETAILED DESCRIPTION
[0022] Various embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. In each of the accompanying drawings, the same elements or modules are represented by the same or similar reference numerals. For the sake of clarity, the various parts in the accompanying drawings are not drawn to scale.
[0023] It should be understood that in the following description, a "circuit" may include a single or multiple combined hardware circuits, programmable circuits, state machine circuits, and / or elements capable of storing instructions executed by programmable circuits. When an element or circuit is said to be "connected to" another element or an element or circuit is said to be "connected between" two nodes, it may be directly coupled or connected to another element or there may be an intermediate element, and the connection between the elements may be physical, logical, or a combination thereof. Conversely, when an element is said to be "directly coupled to" or "directly connected to" another element, it means that there is no intermediate element between the two.
[0024] At the same time, certain words are used in this patent specification and claims to refer to specific components. It should be understood by those skilled in the art that hardware manufacturers may use different terms to refer to the same component. This patent specification and claims do not use differences in names as a way to distinguish components, but rather use differences in components' functions as the criteria for distinction.
[0025] In addition, it should be noted that, in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that the process, method, article or equipment including a series of elements includes not only those elements, but also includes other elements not explicitly listed, or also includes elements inherent to such process, method, article or equipment. In the absence of more restrictions, the elements defined by the statement "comprise one..." do not exclude the existence of other identical elements in the process, method, article or equipment including the elements.
[0026] In order to solve the problem that the reference voltage in the driver chip is affected by the high temperature during the welding process, resulting in deviation in accuracy, the applicant tried to set up an existing voltage calibration circuit in the driver chip to calibrate the reference voltage, but the effect was not good. The accuracy of some modules in these voltage calibration circuits would be affected by the high temperature and deviate, resulting in the reference voltage failing to reach the preset accuracy when calibrating the reference voltage. Based on this, the applicant proposed a new voltage calibration circuit, the accuracy of which is basically not affected by the high temperature during the welding process, and can calibrate the reference voltage in the chip that is welded to the printed circuit board at high temperature.
[0027] Figure 1 A schematic structural diagram of a voltage calibration circuit according to an embodiment of the present invention is shown.
[0028] See also Figure 1The voltage calibration circuit 100 provided in the embodiment of the present invention includes an analog to digital converter (ADC) 110, a calibration module 120, a preset quantization value generation module 130 and a memory (not shown in the figure). The analog to digital converter 110 is connected to the calibration module 120, and receives the voltage V to be calibrated provided by the calibration module 120. text , and provide the actual quantized value D to the calibration module 120 real The preset quantization value generation module 130 is connected to the calibration module 120 and provides the preset quantization value D to the calibration module 120. ideal , preset quantization value D ideal Characterizing the Bandgap Reference Voltage V bg The ideal value of the voltage to be calibrated V text1 The ratio of the voltage values between ideal =V bg / V text1 Among them, the bandgap reference voltage V bg It is a high-precision voltage whose voltage value will not change after being exposed to high temperature.
[0029] The analog-to-digital converter 110 is used to convert the bandgap reference voltage V bg and the voltage to be calibrated V text Quantize to get the actual quantized value D real , the actual quantized value D real Characterizing the Bandgap Reference Voltage V bg and the voltage to be calibrated V text The ratio of the voltage values between real= V bg / V text .
[0030] The calibration module 120 is used to convert the actual quantization value D real With the preset quantization value D ideal Compare and adjust the voltage V to be calibrated according to the comparison result text Specifically, the calibration module 120 calculates the voltage value of the actual quantized value D real With the preset quantization value D ideal The comparison result is used to adjust the voltage V to be calibrated by successive approximation. text The voltage value until the voltage to be calibrated V text Achieve preset accuracy.
[0031] The preset quantization value generation module 130 is used to generate a standard reference voltage V EXT and the bandgap reference voltage V bg Quantization is performed to obtain a first quantization value D1, and the first quantization value D1 is multiplied by the second quantization value D2 to obtain a preset quantization value D ideal , that is, Dideal =D1*D2. Wherein, the first quantized value D1 represents the bandgap reference voltage V bg With the standard reference voltage V EXT The ratio of the voltage values between D1 and = V bg / V EXT The second quantized value D2 represents the standard reference voltage V EXT The ideal value of the voltage to be calibrated V text1 The ratio of the voltage values between, that is, D2=V EXT / V text1 The second quantized value D2 is pre-stored in the memory. For example, the second quantized value D2 is obtained before the chip is subjected to high temperature welding. The ideal value V of the voltage to be calibrated text1 The voltage value of the voltage to be calibrated when the chip leaves the factory may be used, that is, the voltage value of the voltage to be calibrated obtained by calibration when the chip is not soldered to the printed circuit board.
[0032] Substitute the calculation formula of the first quantization value D1 and the second quantization value D2 into the preset quantization value D ideal The calculation formula can be obtained, the preset quantization value D ideal =V bg / V text1 .
[0033] Assume that the voltage to be calibrated is V text The ideal value of the voltage to be calibrated V text1 The deviation between , then the voltage to be calibrated V text It can be expressed as V text= V text1 + , the actual quantized value D real It can be expressed as: (1) After Fourier transforming the above formula (1), we can get (2)
[0034] Therefore, when the voltage to be calibrated V text The ideal value of the voltage to be calibrated V text1 When there is no deviation between real Equal to the preset quantization value D ideal , when the actual quantized value D real Approximate the preset quantization value D ideal When the voltage to be calibrated is V text It will also approach the ideal value V of the voltage to be calibrated text1 .
[0035] Among them, the calibration module 120 and the analog-to-digital converter 110 form a closed loop. The calibration module 120 adjusts the voltage value of the voltage V to be calibrated according to the actual quantization value D provided by the analog-to-digital converter 110. The analog-to-digital converter 110 quantizes the bandgap reference voltage V and the voltage V to be calibrated to obtain the actual quantization value D until the voltage value of the voltage V to be calibrated reaches the preset accuracy. real for the voltage V to be calibrated text The analog-to-digital converter 110 quantizes the bandgap reference voltage V and the voltage V to be calibrated to obtain the actual quantization value D until the voltage value of the voltage V to be calibrated reaches the preset accuracy. text and the voltage V to be calibrated bg for the bandgap reference voltage V text to obtain the actual quantization value D real until the voltage value of the voltage V to be calibrated text reaches the preset accuracy.
[0036] Exemplarily, the calibration module 120 includes a comparator COMP, a successive approximation logic unit 121, and a voltage adjustment unit 122.
[0037] The comparator COMP is used to compare the actual quantization value D real with the preset quantization value D ideal and output a comparison signal D compn according to the comparison result. Exemplarily, the positive input terminal of the comparator COMP receives the actual quantization value D real the negative input terminal of the comparator COMP receives the preset quantization value D ideal and the output terminal provides the comparison signal D compn
[0038] The successive approximation logic unit 121 is used to generate a calibration signal TEST_TRIM compn according to the comparison signal D <n:0>Among them, the calibration signal TEST_TRIM <n:0>is n+1 (n>0) binary digits. It can be understood that the larger the value of n is, the higher the final voltage V to be calibrated will be. text The higher the accuracy.
[0039] The voltage adjustment unit 122 is used to adjust the voltage according to the calibration signal TEST_TRIM <n:0>Adjust the voltage to be calibrated V text The voltage value to be calibrated V text The voltage value of the calibrated voltage gradually approaches the ideal value V text1 Among them, the calibration signal TEST_TRIM <n:0>The larger the value is, the higher the voltage V text The larger the voltage value, the greater the calibration signal TEST_TRIM <n:0>The smaller the value, the higher the voltage V text For example, the voltage adjustment unit 122 can be implemented by using a circuit structure such as a digital-to-analog converter, a digital potentiometer, etc.
[0040] With calibration signal TEST_TRIM <n:0>The working principle of the calibration module 120 is as follows: the successive approximation logic unit 121 sets the initial value of the calibration signal TEST_TRIM<3:0> to 1000 and outputs it, and the voltage adjustment unit 122 adjusts the voltage V to be calibrated according to the calibration signal TEST_TRIM<3:0> output by the successive approximation logic unit 121. text The voltage value of the analog-to-digital converter 110 is then calibrated according to the voltage V text Get the actual quantized value D real , the comparator COMP is used to compare the actual quantized value D real With the preset quantization value D ideal Compare and output comparison signal D compn , when the comparison signal D compn When the comparison signal D compn When the value of the lowest bit of the calibration signal TEST_TRIM<3:0> is 0, the successive approximation logic unit 121 determines that the highest bit of the calibration signal TEST_TRIM<3:0> is 0, and then sets the second highest bit of the calibration signal TEST_TRIM<3:0> to 1, and outputs the calibration signal TEST_TRIM<3:0> with the highest bit being x (x represents the value of the highest bit previously determined), the second highest bit being 1, and the remaining bits being 0. Then, the above process is repeated three times to determine the values of the remaining bits of the calibration signal TEST_TRIM<3:0>. When the value of the lowest bit of the calibration signal TEST_TRIM<3:0> is determined, the voltage adjustment unit 122 obtains the ideal value V of the voltage to be calibrated according to the calibration signal TEST_TRIM<3:0> finally output by the successive approximation logic unit 121. text1 The voltage to be calibrated V text .
[0041] Figure 2 A schematic structural diagram of a preset quantization value generating module according to an embodiment of the present invention is shown.
[0042] See also Figure 2 The preset quantization value generation module 130 includes an analog-to-digital converter 131 and a multiplier 132. The analog-to-digital converter 131 is used to convert the standard reference voltage V EXT and the bandgap reference voltage V bg Quantization is performed to obtain a first quantization value D1.
[0043] The multiplier 132 is used to perform a multiplication operation on the first quantization value D1 and the second quantization value D2 to obtain a preset quantization value D ideal Since the calibration module 120 is in the process of calibrating the voltage V text When calibrating, the corresponding preset quantization value D needs to be used multiple times ideal Therefore, the multiplier 132 can also be connected to the memory to calculate the voltage to be calibrated V text The corresponding preset quantization value D ideal Then store it in memory.
[0044] It can be seen from the above formula (2) that when it is necessary to calibrate at least one voltage to be calibrated in the chip, it is only necessary to provide a standard reference voltage through an external test pin (not shown in the figure) and pre-store a second quantized value corresponding to at least one voltage to be calibrated in the memory. The voltage value of the standard reference voltage can be any value. At this time, the memory sequentially provides the second quantized value corresponding to at least one voltage to be calibrated to the multiplier, and stores the preset quantized value corresponding to at least one voltage to be calibrated calculated sequentially by the multiplier.
[0045] Furthermore, in order to save chip area, the analog converter 131 in the preset quantization value generation module 130 multiplexes the analog-to-digital converter 110. At this time, when the voltage calibration circuit 100 performs calibration on any voltage V text During calibration, the analog-to-digital converter 110 is first applied to the preset quantization value generation module 130. After the preset quantization value generation module 130 obtains the first quantization value D1, the bandgap reference voltage V bg and the voltage to be calibrated V text Quantify.
[0046] The voltage calibration circuit provided by the embodiment of the present invention can realize the calibration of multiple voltages to be calibrated only by using a standard reference voltage, which not only improves the calibration efficiency but also reduces the calibration cost. In addition, in the calibration process of the voltage to be calibrated, a digital comparator is used to compare two digital signals, namely, the actual quantization value and the preset quantization value. Compared with the prior art that uses an analog comparator to compare two analog signals, namely, the voltage to be calibrated and the ideal value of the voltage to be calibrated, the anti-interference ability and high temperature resistance are stronger, and the calibration accuracy of the reference voltage in the chip whose accuracy is deviated due to high temperature can be improved.
[0047] Figure 3 A schematic flow chart of a voltage calibration method according to an embodiment of the present invention is shown.
[0048] See also Figure 3 , which is a flow chart of a method for calibrating a voltage to be calibrated using the voltage calibration method provided in an embodiment of the present invention, specifically including steps S11-S15.
[0049] In step S11 , the bandgap reference voltage and the standard reference voltage are quantized to obtain a first quantized value.
[0050] The first quantized value represents a voltage ratio between the bandgap reference voltage and the standard reference voltage.
[0051] In step S12, multiply the first quantization value by the second quantization value to obtain the preset quantization value.
[0052] Wherein, the second quantization value represents the ratio of the voltage value between the standard reference voltage and the ideal value of the voltage to be calibrated. The preset quantization value represents the ratio of the voltage value between the bandgap reference voltage and the ideal value of the voltage to be calibrated.
[0053] In step S13, quantize the bandgap reference voltage and the voltage to be calibrated to obtain the actual quantization value.
[0054] Wherein, the actual quantization value represents the ratio of the voltage value between the bandgap reference voltage and the voltage to be calibrated.
[0055] In step S14, compare the actual quantization value with the preset quantization value, and adjust the voltage value of the voltage to be calibrated according to the comparison result.
[0056] In step S15, repeat the above steps S13 and S14 until the voltage to be calibrated reaches the preset accuracy.
[0057] Furthermore, after step S13, it may further include comparing the actual quantization value with the preset quantization value, and adjusting the voltage value of the voltage to be calibrated in a successive approximation manner according to the comparison result between the actual quantization value and the preset quantization value until the voltage to be calibrated reaches the preset accuracy.
[0058] Furthermore, the voltage calibration method provided by the present invention further includes:
[0059] Pre-store the second quantization values corresponding to at least one voltage to be calibrated;
[0060] Multiply the second quantization values of the at least one voltage to be calibrated by the first quantization value in sequence to obtain the preset quantization values corresponding to the at least one voltage to be calibrated in sequence, and store the preset quantization values corresponding to the at least one voltage to be calibrated.
[0061] Furthermore, the present invention also provides a chip, which includes the above-mentioned voltage calibration circuit 100, and the voltage calibration circuit 100 can execute the voltage calibration method as described above. For example, the chip is a driving chip.
[0062] Furthermore, the present invention also provides a device, which includes the above-mentioned chip. For example, the device is a display device.
[0063] It can be understood that although the embodiment of the present invention uses the voltage calibration circuit and the voltage calibration method to calibrate the reference voltage whose accuracy deviates due to high temperature in the chip after the chip is soldered to the printed circuit board as an example, the voltage calibration circuit and the voltage calibration method provided in the embodiment of the present invention can realize the calibration of all voltages to be calibrated.
[0064] According to the embodiments of the present invention, as described above, these embodiments do not describe all the details in detail, nor do they limit the invention to specific embodiments. Obviously, many modifications and changes can be made based on the above description. This specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the present invention, so that those skilled in the art can make good use of the present invention and the modified use based on the present invention. The scope of protection of the present invention shall be based on the scope defined by the claims of the present invention and their equivalents.
Claims
1. A voltage calibration circuit, comprising: A first analog-to-digital converter, configured to quantize the bandgap reference voltage and the voltage to be calibrated to obtain an actual quantized value, wherein the actual quantized value represents a voltage value ratio between the bandgap reference voltage and the voltage to be calibrated; a preset quantization value generating module, configured to quantize the bandgap reference voltage and the standard reference voltage to obtain a first quantization value, and multiply the first quantization value by the second quantization value to obtain a preset quantization value, wherein the first quantization value represents a voltage value ratio between the bandgap reference voltage and the standard reference voltage, and the second quantization value represents a voltage value ratio between the standard reference voltage and an ideal value of the voltage to be calibrated; The calibration module is used to compare the actual quantized value with the preset quantized value, and adjust the voltage value of the voltage to be calibrated according to the comparison result.
2. The voltage calibration circuit according to claim 1, wherein: The calibration module is further configured to adjust the voltage value of the voltage to be calibrated by adopting a successive approximation method according to a comparison result between the actual quantized value and the preset quantized value, until the voltage value of the voltage to be calibrated reaches a preset accuracy.
3. The voltage calibration circuit according to claim 2, wherein: The calibration module comprises: A comparator, used to compare the actual quantization value with the preset quantization value, and output a comparison signal according to the comparison result; a successive approximation logic unit, configured to generate a calibration signal according to the comparison signal; A voltage adjustment unit is used to adjust the voltage value of the voltage to be calibrated according to the calibration signal.
4. The voltage calibration circuit according to claim 3, wherein: The preset quantization value generating module comprises: A second analog-to-digital converter, configured to quantize the bandgap reference voltage and the standard reference voltage to obtain a first quantized value; A multiplier is used to perform a multiplication operation on the first quantization value and the second quantization value to obtain the preset quantization value.
5. The voltage calibration circuit according to claim 4, wherein: The second analog-to-digital converter multiplexes the first analog-to-digital converter.
6. The voltage calibration circuit according to claim 4, further comprising: A memory pre-stored with at least one second quantized value corresponding to a voltage to be calibrated; The memory is used to sequentially provide the second quantized value of the at least one voltage to be calibrated to the multiplier, and store the preset quantized value corresponding to the at least one voltage to be calibrated obtained by sequentially calculating the multiplier.
7. A voltage calibration method, comprising: quantizing the bandgap reference voltage and the voltage to be calibrated to obtain actual quantized values; Comparing the actual quantized value with the preset quantized value, and adjusting the voltage value of the voltage to be calibrated according to the comparison result; Repeat the above steps until the voltage to be calibrated reaches a preset accuracy; Before quantizing the bandgap reference voltage and the voltage to be calibrated to obtain actual quantized values, the method further includes: quantizing the bandgap reference voltage and the standard reference voltage to obtain a first quantized value; The first quantization value is multiplied by the second quantization value to obtain the preset quantization value. Among them, the actual quantized value represents the ratio of the voltage values between the bandgap reference voltage and the voltage to be calibrated, the first quantized value represents the ratio of the voltage values between the bandgap reference voltage and the standard reference voltage, and the second quantized value represents the ratio of the voltage values between the standard reference voltage and the ideal value of the voltage to be calibrated.
8. The voltage calibration method according to claim 7, further comprising: According to the comparison result between the actual quantized value and the preset quantized value, the voltage value of the voltage to be calibrated is adjusted in a successive approximation manner until the voltage to be calibrated reaches a preset accuracy.
9. The voltage calibration method according to claim 7, further comprising: Pre-storing at least one second quantized value corresponding to a voltage to be calibrated; The second quantized value of the at least one voltage to be calibrated is multiplied with the first quantized value in sequence to obtain preset quantized values corresponding to the at least one voltage to be calibrated in sequence, and the preset quantized value corresponding to the at least one voltage to be calibrated is stored.
10. A chip, comprising: The voltage calibration circuit according to any one of claims 1 to 6, used to perform the voltage calibration method according to any one of claims 7 to 9.
11. A device comprising: The chip as claimed in claim 10, wherein the voltage calibration circuit is used to calibrate a plurality of voltages to be calibrated in the chip.