Shipborne electronic system reliability index verification method and system, and storage medium

Abstract

The application provides a shipborne electronic compact system reliability index verification method and system, and a storage medium. The shipborne electronic compact system reliability index verification method comprises the following steps: acquiring basic information of a shipborne electronic compact system; acquiring external input requirements of the shipborne electronic compact system; judging whether reliability evaluation is needed according to the external input requirements; when the reliability evaluation is not needed, performing reliability index verification based on an L-M method; when the reliability evaluation is needed, judging whether a reliability distribution result is confirmed by review; when the reliability distribution result is not confirmed by review, performing reliability index verification based on a compact ratio K; and when the reliability distribution result is confirmed by review, performing reliability index verification based on a reliability model backstepping. Through the technical scheme, the product reliability index verification is completed, the test time is shortened, the test cost of a research and development unit is reduced, and the research and development progress of equipment is ensured.

Description

Technical Field

[0001] This application belongs to the field of reliability index verification technology, and specifically relates to a method and system for verifying the reliability index of a shipborne electronic compression system, as well as a storage medium. Background Technology

[0002] Reliability verification testing is a crucial task in the development phase of shipborne electronic systems. Mean Time Between Failures (MTBF) is a commonly used indicator for shipborne electronic systems, strictly corresponding to the system's constituent equipment. Shipborne electronic systems typically exist in two forms during development: a prototype and an operational system. The prototype is usually fully functional, but with fewer components than the operational system, thus forming a compact shipborne electronic system. Traditionally, reliability verification testing of shipborne electronic systems primarily involves selecting a suitable time-truncation test scheme based on equipment reliability requirements and user risk. Since reliability indicators are set for operational systems, and the actual testing is conducted on a prototype, strictly adhering to the selected time-truncation test scheme cannot complete the verification. As complex, large-scale systems, shipborne platforms are often constrained by development budgets, typically requiring testing with a compact system during the development phase. Currently, the MTBF requirements for shipborne electronic systems are very high, and conventional reliability verification methods for compact shipborne electronic systems suffer from problems such as long testing times, high costs, and disruption to development schedules. Summary of the Invention

[0003] This application aims to solve or improve the aforementioned technical problems.

[0004] Therefore, this application provides a method for verifying the reliability indicators of a shipborne electronic compression system.

[0005] This application also provides a reliability index verification system for a shipborne electronic compression system.

[0006] This application also provides a reliability index verification system for a shipborne electronic compression system.

[0007] This application also provides a readable storage medium.

[0008] To achieve the above objectives, this application provides a method for verifying the reliability indicators of a shipborne electronic compression system, comprising: acquiring basic information of the shipborne electronic compression system, including mean time between failures (MTBF), compression ratio, mission profile duration of the shipborne electronic system, and confidence level; acquiring external input requirements of the shipborne electronic compression system, and determining whether a reliability assessment is required based on the external input requirements; verifying the reliability indicators using a test time determination method based on the LM method when a reliability assessment is not required; determining whether the reliability allocation result has been reviewed and confirmed when a reliability assessment is required; verifying the reliability indicators using a test time determination method based on the compression ratio K when the reliability allocation result has not been reviewed and confirmed; and verifying the reliability indicators using a test time determination method based on reliability model back-calculation when the reliability allocation result has been reviewed and confirmed.

[0009] According to the reliability index verification method for shipborne electronic compression systems provided in this application, the basic information of the shipborne electronic compression system is first obtained. This basic information includes the reliability index, compression ratio, mission profile duration, and confidence level required to verify the reliability index. The reliability index is the mean time between failures (MTBF). Then, the external input requirements of the shipborne electronic compression system are obtained, and a reliability assessment is determined based on these requirements. If a reliability assessment is not required, the reliability index is verified using a test time determination method based on the LM method. If a reliability assessment is required, it is determined whether the reliability allocation result has been reviewed and confirmed. If the reliability allocation result has not been reviewed and confirmed, the reliability index is verified using a test time determination method based on the compression ratio K. If the reliability allocation result has been reviewed and confirmed, the reliability index is verified using a test time determination method based on reliability model back-calculation. The reliability index verification method for shipborne electronic compression systems provided in this application can fully utilize the number of equipment in the shipborne electronic compression system during the development stage without increasing the number of equipment components. By adopting the LM method, compression ratio K, and reliability allocation result back-calculation method, and considering external input requirements and reliability allocation results, the reliability index verification of the shipborne electronic system can be achieved. While completing the product reliability index verification, the test time is shortened, the test cost of the development unit is reduced, and the development progress of the equipment is guaranteed.

[0010] Among them, the Levenberg-Marquardt (LM) method is a least-squares estimation method for nonlinear regression parameters. The LM method combines the advantages of the steepest descent method and the linearization method (Taylor series), and is suitable for cases where the parameter estimates are far from or close to the optimal values, thus enabling the finding of the optimal solution relatively quickly.

[0011] In addition, the technical solution provided in this application may also have the following additional technical features:

[0012] In some technical solutions, optionally, basic information about the shipborne electronic compression system is obtained, including: obtaining the reliability indicators of the shipborne electronic system, the mission profile duration and confidence level of the shipborne electronic system, and the reliability indicators include the mean time between failures; obtaining the equipment of the shipborne electronic compression system, the quantity of the equipment and the quantity of the prototypes of the equipment; and obtaining the compression ratio of the equipment based on the quantity of the equipment and the quantity of the prototypes.

[0013] In this technical solution, obtaining the basic information of the shipborne electronic compression system specifically involves first acquiring the reliability index, mission profile duration, and confidence level of the shipborne electronic system. The reliability index includes the mean time between failures (MTBF). Then, the equipment, the quantity of each piece of equipment, and the quantity of prototypes of each piece of equipment are acquired. Finally, the compression ratio of the equipment is obtained based on the quantity of each piece of equipment and the quantity of prototypes. Specifically, given that the reliability index of a certain shipborne electronic system is MTBF = θ, it consists of equipment A1, A2, ..., An, with the quantities of each piece of equipment (system) being N1, N2, ..., Nn, and the quantities of prototypes (compression systems) being M1, M2, ..., Mn, the compression ratio Ki of each component equipment A1 to An is Ni / Mi, the mission profile duration of the shipborne electronic system is T0, and the confidence level required to verify the reliability index is C.

[0014] In some technical solutions, optionally, the reliability index verification is performed using a test time determination method based on the LM method, including: determining the test plan based on the allowable number of failures, and determining the coefficients based on the test plan; obtaining the required reliability test time based on the reliability index and coefficients; obtaining the lower limit estimate of the mean time between failures (MTBF) of the shipborne electronic system using the LM method based on the required reliability test time, the compression ratio, the duration of the shipborne electronic system mission profile, and the confidence level; and determining whether the requirements are met based on the lower limit estimate of the MTBF and the reliability index.

[0015] In this technical solution, a test time determination method based on the LM method is used to verify reliability indicators. Specifically, firstly, a test plan is determined based on the allowable number of failures, and coefficients are determined based on the test plan. Then, the required reliability test time is obtained based on the reliability indicators and coefficients. Based on the required reliability test time, the compression ratio, the duration of the shipborne electronic system mission profile, and the confidence level, the lower limit estimate of the mean time between failures (MTBF) of the shipborne electronic system is obtained using the LM method. Finally, the lower limit estimate of the MTBF and the reliability indicators are used to determine whether the requirements are met, thereby achieving reliability indicator verification.

[0016] In some technical solutions, optionally, the formula for calculating the lower limit estimate of the mean time between failures (MTBF) is as follows:

[0017] The required reliability testing time is:

[0018] T1 = ε × MTBF = ε × θ;

[0019] Where T1 is the required reliability test time, ε is a coefficient, MTBF=θ is the reliability index, the compression ratios of equipment A1, A2, …, An of the shipborne electronic system are K1, K2, …, Kn, the actual test times of equipment A1, A2, …, An of the shipborne electronic system are T11=K1×T1, T12=K2×T1, …, T1n=Kn×T1, the equivalent number of tasks of equipment A1, A2, …, An of the shipborne electronic system are η1=T11 / T0, η2=T12 / T0, …, ηn=T1n / T0, T0 is the duration of the task profile of the shipborne electronic system, the reliability assessment is carried out using the LM method, and the sample size of equipment A1, A2, …, An of the shipborne electronic system is (η1, 0), (η2, 0), …, (ηn, 0);

[0020]

[0021] Among them, R L C represents reliability, C represents confidence level, and MTBF is the mean squared error. L Here, is the lower bound estimate of the mean time between failures (MTBF), Q is the equivalent number of missions for the shipborne electronic system, f is the number of mission failures for the shipborne electronic system in Q trials, T0 is the duration of the mission profile for the shipborne electronic system, and η is the mean time between failures. i Let Ai be the equivalent number of equipment in the shipborne electronic system, and n be the number of equipment in the shipborne electronic system.

[0022] In this technical solution, by using the LM method to conduct reliability assessment, the lower limit of the mean time between failures can be estimated, thereby realizing the verification of reliability indicators.

[0023] In some technical solutions, optionally, a method for determining the test time based on the compression ratio K is used to verify the reliability index, including: determining the test plan based on the number of allowable failures, and determining the coefficient based on the test plan; obtaining the required reliability test time based on the reliability index and the coefficient; obtaining the actual test time of multiple devices based on the required reliability test time and the compression ratio of multiple devices in the shipborne electronic compression system; and obtaining the reliability test time based on the maximum value among the multiple actual test times.

[0024] In this technical solution, a method for determining the test time based on the compression ratio K is used to verify reliability indicators. Specifically, firstly, a test plan is determined based on the allowable number of failures, and then coefficients are determined based on the test plan. The required reliability test time is obtained based on the reliability indicators and coefficients. Then, the actual test times for multiple devices are obtained based on the required reliability test time and the compression ratios of multiple devices in the shipborne electronic compression system. Finally, the maximum value among the multiple actual test times is used to obtain the reliability test time, thereby significantly shortening the reliability test time while achieving the goal of verifying reliability indicators.

[0025] In some technical solutions, optionally, the formulas derived from the reliability model include:

[0026]

[0027] T3=ε×θ # ;

[0028] This involves allocating reliability to the shipborne electronic systems, assigning the reliability index MTBF = θ to devices A1, A2, ..., An of the shipborne electronic systems, with corresponding reliability indices θ1, θ2, ..., θ... n The quantities of equipment are N1, N2, ..., Nn, and the quantities of prototypes are M1, M2, ..., Mn, respectively. The reliability index of the prototypes is θ. # T3 is the required reliability test time, and ε is a coefficient.

[0029] In this technical solution, the reliability index verification is carried out by using the test time determination method derived from the reliability model. This method can significantly shorten the reliability test time while achieving the purpose of reliability index verification.

[0030] In some technical solutions, the verification method for the reliability indicators of the shipborne electronic compression system may optionally include: developing a reliability test outline and conducting reliability tests.

[0031] In this technical solution, the method for verifying the reliability indicators of the shipborne electronic compression system also includes developing a reliability test outline and conducting reliability tests.

[0032] This application provides a reliability index verification system for a shipborne electronic compression system, comprising: a first acquisition module for acquiring basic information of the shipborne electronic compression system, including mean time between failures (MTBF), compression ratio, mission profile duration of the shipborne electronic system, and confidence level; a second acquisition module for acquiring external input requirements of the shipborne electronic compression system and determining whether a reliability assessment is required based on the external input requirements; and a verification module for verifying reliability indexes using a test time determination method based on the LM method when a reliability assessment is not required; determining whether the reliability allocation result has been reviewed and confirmed when a reliability assessment is required; verifying reliability indexes using a test time determination method based on the compression ratio K when the reliability allocation result has not been reviewed and confirmed; and verifying reliability indexes using a test time determination method based on reliability model back-calculation when the reliability allocation result has been reviewed and confirmed.

[0033] The shipborne electronic compression system reliability index verification system provided in this application includes a first acquisition module, a second acquisition module, and a verification module. The first acquisition module acquires basic information about the shipborne electronic compression system, including mean time between failures (MTBF), compression ratio, mission profile duration, and confidence level. The second acquisition module acquires the external input requirements of the shipborne electronic compression system and determines whether a reliability assessment is required based on these requirements. The verification module verifies reliability indexes using a test time determination method based on the LM method when a reliability assessment is not required. When a reliability assessment is required, it determines whether the reliability allocation result has been reviewed and confirmed. If the reliability allocation result has not been reviewed and confirmed, the reliability indexes are verified using a test time determination method based on the compression ratio K. If the reliability allocation result has been reviewed and confirmed, the reliability indexes are verified using a test time determination method based on reliability model back-calculation. The shipborne electronic compression system reliability index verification system provided in this application can fully utilize the number of shipborne electronic compression system devices during the development stage without increasing the number of devices in each component of the equipment. It adopts the LM method, compression ratio K and reliability allocation result back-calculation method, and considers external input requirements and reliability allocation results to realize the reliability index verification of the shipborne electronic system. While completing the product reliability index verification, it shortens the test time, reduces the test cost of the development unit, and ensures the development progress of the equipment.

[0034] This application provides a shipborne electronic compression system reliability index verification system, including a memory and a processor. The memory stores a program or instructions that can be run on the processor. When the processor executes the program or instructions, it implements the shipborne electronic compression system reliability index verification method of any one of the first aspect of the technical solution, and thus has the technical effects of any one of the first aspect of the technical solution, which will not be elaborated here.

[0035] This application provides a readable storage medium storing a program or instructions. When the program or instructions are executed by a processor, they implement the steps of the shipborne electronic compression system reliability index verification method according to any one of the first aspect of the technical solution. Therefore, it has the technical effects of any one of the first aspect of the technical solution, which will not be repeated here.

[0036] Additional aspects and advantages of this application will become apparent in the following description or may be learned by practice of this application. Attached Figure Description

[0037] The above and / or additional aspects and advantages of this application will become apparent and readily understood from the description of the embodiments taken in conjunction with the following drawings, in which:

[0038] Figure 1 This is a flowchart illustrating the steps of a method for verifying the reliability index of a shipborne electronic compression system according to an embodiment of this application.

[0039] Figure 2 This is a flowchart illustrating the steps of a method for verifying the reliability index of a shipborne electronic compression system according to an embodiment of this application.

[0040] Figure 3 This is a flowchart illustrating the steps of a method for verifying the reliability index of a shipborne electronic compression system according to an embodiment of this application.

[0041] Figure 4 This is a flowchart illustrating the steps of a method for verifying the reliability index of a shipborne electronic compression system according to an embodiment of this application.

[0042] Figure 5 This is a flowchart illustrating the steps of a method for verifying the reliability index of a shipborne electronic compression system according to an embodiment of this application.

[0043] Figure 6 This is a schematic block diagram of the structure of a shipborne electronic compression system reliability index verification system according to an embodiment of this application;

[0044] Figure 7 This is a schematic block diagram of the structure of a shipborne electronic compression system reliability index verification system according to an embodiment of this application;

[0045] Figure 8 This is a flowchart illustrating the steps of a method for verifying the reliability index of a shipborne electronic compression system according to an embodiment of this application.

[0046] in, Figure 6 and Figure 7 The correspondence between the reference numerals and component names in the attached drawings is as follows:

[0047] 10: Shipborne electronic compression system reliability index verification system; 110: First acquisition module; 120: Second acquisition module; 130: Verification module; 20: Shipborne electronic compression system reliability index verification system; 300: Memory; 400: Processor. Detailed Implementation

[0048] To make the objectives, technical solutions, and advantages of this application clearer, the technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this application. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0049] The following reference Figures 1 to 8 This application describes a method and system for verifying the reliability of shipborne electronic compression systems, as well as a storage medium, according to some embodiments of this application.

[0050] like Figure 1 As shown, an embodiment of the first aspect of this application provides a method for verifying the reliability indicators of a shipborne electronic compression system, comprising the following steps:

[0051] Step S102: Obtain basic information about the shipborne electronic compression system, including mean time between failures, compression ratio, duration of the shipborne electronic system mission profile, and confidence level.

[0052] Step S104: Obtain the external input requirements of the shipborne electronic compression system, and determine whether a reliability assessment is required based on the external input requirements;

[0053] Step S106: When reliability assessment is not required, the reliability index is verified using the test time determination method based on the LM method;

[0054] Step S108: When a reliability assessment is required, determine whether the reliability allocation results have been reviewed and confirmed.

[0055] Step S110: Before the reliability allocation results have been reviewed and confirmed, the reliability index is verified based on the test time determination method of the compression ratio K;

[0056] Step S112: When the reliability allocation results are reviewed and confirmed, the reliability index is verified by the test time determination method based on the reliability model.

[0057] According to the reliability index verification method for shipborne electronic compression systems provided in this embodiment, the basic information of the shipborne electronic compression system is first obtained. This basic information includes the reliability index, compression ratio, mission profile duration, and confidence level required to verify the reliability index. The reliability index is the mean time between failures (MTBF). Then, the external input requirements of the shipborne electronic compression system are obtained, and a reliability assessment is determined based on these requirements. If a reliability assessment is not required, the reliability index is verified using a test time determination method based on the LM method. If a reliability assessment is required, it is determined whether the reliability allocation result has been reviewed and confirmed. If the reliability allocation result has not been reviewed and confirmed, the reliability index is verified using a test time determination method based on the compression ratio K. If the reliability allocation result has been reviewed and confirmed, the reliability index is verified using a test time determination method based on reliability model back-calculation. The reliability index verification method for shipborne electronic compression systems provided in this application can fully utilize the number of equipment in the shipborne electronic compression system during the development stage without increasing the number of equipment components. By adopting the LM method, compression ratio K, and reliability allocation result back-calculation method, and considering external input requirements and reliability allocation results, the reliability index verification of the shipborne electronic system can be achieved. While completing the product reliability index verification, the test time is shortened, the test cost of the development unit is reduced, and the development progress of the equipment is guaranteed.

[0058] like Figure 2 As shown, according to an embodiment of the shipborne electronic compression system reliability index verification method proposed in this application, the basic information of the shipborne electronic compression system is obtained, including the following steps:

[0059] Step S202: Obtain the reliability indicators of the shipborne electronic system, the duration and confidence level of the shipborne electronic system mission profile. The reliability indicators include the mean time between failures.

[0060] Step S204: Obtain the equipment of the shipborne electronic compression system, the quantity of the equipment, and the quantity of the prototype of the equipment;

[0061] Step S206: Obtain the compactness ratio of the equipment based on the corresponding quantity of the equipment and the corresponding quantity of the prototype.

[0062] In this embodiment, obtaining the basic information of the shipborne electronic compression system specifically involves first obtaining the reliability index, mission profile duration, and confidence level of the shipborne electronic system. The reliability index includes the mean time between failures (MTBF). Then, the equipment, the quantity of each piece of equipment, and the quantity of each prototype are obtained. Finally, the compression ratio of the equipment is obtained based on the quantity of each piece of equipment and the quantity of each prototype. Specifically, given that the reliability index of a certain shipborne electronic system is MTBF = θ, it consists of equipment A1, A2, ..., An, with the quantities of each piece of equipment (system) being N1, N2, ..., Nn, and the quantities of each prototype (compression system) being M1, M2, ..., Mn, the compression ratio Ki of each component equipment A1 to An is Ni / Mi, the mission profile duration of the shipborne electronic system is T0, and the confidence level required to verify the reliability index is C.

[0063] like Figure 3 As shown, a reliability index verification method for a shipborne electronic compression system according to an embodiment of this application verifies reliability indexes using a test time determination method based on the LM method, including the following steps:

[0064] Step S302: Determine the test plan based on the number of allowable failures, and determine the coefficients based on the test plan;

[0065] Step S304: Obtain the required reliability test time based on the reliability indicators and coefficients;

[0066] Step S306: Based on the required reliability test time, compression ratio, mission profile duration of the shipborne electronic system, and confidence level, obtain the estimated lower limit of the mean time between failures (MTBF) of the shipborne electronic system using the LM method;

[0067] Step S308: Determine whether the requirements are met based on the estimated lower limit of mean time between failures and the reliability index.

[0068] In this embodiment, a test time determination method based on the LM method is used to verify reliability indicators. Specifically, firstly, a test plan is determined based on the allowable number of failures, and coefficients are determined based on the test plan. Then, the required reliability test time is obtained based on the reliability indicators and coefficients. Based on the required reliability test time, the compression ratio, the duration of the shipborne electronic system mission profile, and the confidence level, the lower limit estimate of the mean time between failures (MTBF) of the shipborne electronic system is obtained using the LM method. Finally, the lower limit estimate of the MTBF and the reliability indicators are used to determine whether the requirements are met, thereby achieving reliability indicator verification.

[0069] Optionally, in some embodiments, the formula for calculating the lower limit estimate of the mean time between failures (MTBF) is:

[0070] The required reliability testing time is:

[0071] T1 = ε × MTBF = ε × θ;

[0072] Where T1 is the required reliability test time, ε is a coefficient, MTBF=θ is the reliability index, the compression ratios of equipment A1, A2, …, An of the shipborne electronic system are K1, K2, …, Kn, the actual test times of equipment A1, A2, …, An of the shipborne electronic system are T11=K1×T1, T12=K2×T1, …, T1n=Kn×T1, the equivalent number of tasks of equipment A1, A2, …, An of the shipborne electronic system are η1=T11 / T0, η2=T12 / T0, …, ηn=T1n / T0, T0 is the duration of the task profile of the shipborne electronic system, the reliability assessment is carried out using the LM method, and the sample size of equipment A1, A2, …, An of the shipborne electronic system is (η1, 0), (η2, 0), …, (ηn, 0);

[0073]

[0074] Among them, R L C represents reliability, C represents confidence level, and MTBF is the mean squared error. L Let f be the estimated lower bound of the mean time between failures (MTBF), Q be the equivalent number of missions of the shipborne electronic system, f be the number of mission failures of the shipborne electronic system in Q tests, T0 be the mission profile duration of the shipborne electronic system, ηi be the equivalent number of missions of device Ai of the shipborne electronic system, and n be the number of devices of the shipborne electronic system. By using the LM method to conduct reliability assessment, the estimated lower bound of the MTBF can be obtained, thereby realizing the verification of reliability indicators.

[0075] like Figure 4 As shown, a reliability index verification method for a shipborne electronic compression system according to an embodiment of this application verifies reliability indexes based on a test time determination method for compression ratio K, including the following steps:

[0076] Step S402: Determine the test plan based on the number of allowable failures, and determine the coefficients based on the test plan;

[0077] Step S404: Obtain the required reliability test time based on the reliability indicators and coefficients;

[0078] Step S406: Obtain the actual test time of multiple devices based on the required reliability test time and the compression ratio of multiple devices in the shipborne electronic compression system;

[0079] Step S408: Obtain the reliability test time based on the maximum value among multiple actual test times.

[0080] In this embodiment, a method for determining the test time based on the compression ratio K is used to verify reliability indicators. Specifically, firstly, a test plan is determined based on the allowable number of failures, and then coefficients are determined based on the test plan. The required reliability test time is obtained based on the reliability indicators and coefficients. Then, the actual test times for multiple devices are obtained based on the required reliability test time and the compression ratios of multiple devices in the shipborne electronic compression system. Finally, the maximum value among the multiple actual test times is used to obtain the reliability test time, thereby significantly shortening the reliability test time while achieving the goal of verifying reliability indicators.

[0081] Optionally, in some embodiments, reliability allocation is performed on the shipborne electronic system, assigning the reliability index MTBF = θ to devices A1, A2, ..., An of the shipborne electronic system, with corresponding reliability indices θ1, θ2, ..., θ3. n It satisfies the following formula:

[0082]

[0083] The quantities of equipment are N1, N2, ..., Nn, and the quantities of prototypes are M1, M2, ..., Mn. The reliability index of the prototypes is θ. # It satisfies the following formula:

[0084]

[0085] The required reliability test time is T3 = ε*θ # ;

[0086] Where ε is a coefficient. The method of determining test time through reverse engineering of the reliability model for verifying reliability indicators can significantly shorten the reliability test time while achieving the goal of reliability indicator verification.

[0087] like Figure 5 As shown, the reliability index verification method for a shipborne electronic compression system according to an embodiment of this application further includes the following steps:

[0088] Step S502: Compile a reliability test outline and conduct reliability tests.

[0089] In this embodiment, the method for verifying the reliability indicators of the shipborne electronic compression system also includes developing a reliability test outline and conducting reliability tests.

[0090] like Figure 6As shown, an embodiment of the second aspect of this application provides a reliability index verification system 10 for a shipborne electronic compression system, comprising: a first acquisition module 110, used to acquire basic information of the shipborne electronic compression system, including mean time between failures (MTBF), compression ratio, mission profile duration of the shipborne electronic system, and confidence level; a second acquisition module 120, used to acquire external input requirements of the shipborne electronic compression system and determine whether a reliability assessment is required based on the external input requirements; and a verification module 130, used to verify reliability indexes using a test time determination method based on the LM method when a reliability assessment is not required; to determine whether the reliability allocation result has been reviewed and confirmed when a reliability assessment is required; to verify reliability indexes using a test time determination method based on the compression ratio K when the reliability allocation result has not been reviewed and confirmed; and to verify reliability indexes using a test time determination method based on reliability model back-calculation when the reliability allocation result has been reviewed and confirmed.

[0091] The shipborne electronic compression system reliability index verification system 10 provided in this embodiment includes a first acquisition module 110, a second acquisition module 120, and a verification module 130. The first acquisition module 110 acquires basic information about the shipborne electronic compression system, including mean time between failures (MTBF), compression ratio, mission profile duration, and confidence level. The second acquisition module 120 acquires external input requirements for the shipborne electronic compression system and determines whether a reliability assessment is required based on these requirements. The verification module 130 verifies reliability indicators using a test time determination method based on the LM method when a reliability assessment is not required. When a reliability assessment is required, it determines whether the reliability allocation result has been reviewed and confirmed. If the reliability allocation result has not been reviewed and confirmed, it verifies reliability indicators using a test time determination method based on the compression ratio K. If the reliability allocation result has been reviewed and confirmed, it verifies reliability indicators using a test time determination method based on reliability model back-calculation. The shipborne electronic compression system reliability index verification system provided in this application can fully utilize the number of shipborne electronic compression system devices during the development stage without increasing the number of devices in each component of the equipment. It adopts the LM method, compression ratio K and reliability allocation result back-calculation method, and considers external input requirements and reliability allocation results to realize the reliability index verification of the shipborne electronic system. While completing the product reliability index verification, it shortens the test time, reduces the test cost of the development unit, and ensures the development progress of the equipment.

[0092] like Figure 7As shown, an embodiment of the third aspect of this application provides a shipborne electronic compression system reliability index verification system 20, including: a memory 300 and a processor 400, wherein the memory 300 stores a program or instructions that can be run on the processor 400, and when the processor 400 executes the program or instructions, it implements the steps of the shipborne electronic compression system reliability index verification method of any one of the embodiments of the first aspect, and thus has the technical effects of any embodiment of the first aspect, which will not be repeated here.

[0093] An embodiment of the fourth aspect of this application provides a readable storage medium storing a program or instructions thereon. When the program or instructions are executed by a processor, they implement the steps of the shipborne electronic compression system reliability index verification method of any one of the embodiments of the first aspect, and thus have the technical effects of any embodiment of the first aspect described above, which will not be repeated here.

[0094] like Figure 8 As shown, the reliability index verification method for a shipborne electronic compression system according to a specific embodiment of this application mainly uses the LM method, compression ratio K, and reliability index re-determination method to determine whether external input requirements allow for reliability assessment. It adopts a "reliability test + reliability assessment" mode or a "reliability test" mode to complete the reliability index verification. On the basis of achieving the purpose of reliability index verification, the reliability test time is greatly shortened.

[0095] The steps implemented in this embodiment are as follows:

[0096] Step 1: Determine the basic information of the shipborne electronic compression system. Given that the reliability index of a certain shipborne electronic system is MTBF = θ, it consists of devices A1, A2, ..., An, with corresponding quantities of N1, N2, ..., Nn for each device (system), and M1, M2, ..., Mn for each prototype (compression system). The compression ratio Ki = Ni / Mi for each component device A1 to An, the mission profile duration of the shipborne electronic system is T0, and the confidence level required to verify the reliability index is C.

[0097] Step Two: Review the external input requirements of the shipboard electronic systems. Communicate with the product purchaser to determine the test plan according to the following principles:

[0098] (1) If an assessment is permitted, proceed to step three;

[0099] (2) If an assessment is not permitted and the reliability allocation results have not been rigorously reviewed and confirmed, proceed to step four.

[0100] (3) If an assessment is not permitted, but the reliability allocation results have been reviewed and approved by the purchaser, proceed to step five.

[0101] Step 3: Determining the test time based on the LM method: Select a test plan with an allowable number of failures of 0, and define the coefficient as ε. Then, the reliability test time that should be conducted on the shipborne electronic compression system during the development phase is:

[0102] T1=ε×MTBF=ε×θ

[0103] The actual test times for each component of the shipborne electronic compression system, A1 to An, are T11 = K1 × T1, T12 = K2 × T1, ..., T1n = Kn × T1. The equivalent number of tasks for each component is then η1 = T11 / T0, η2 = T12 / T0, ..., ηn = T1n / T0. Using the LM method for reliability assessment, the sample sizes for each component A1 to An are (η1, 0), (η2, 0), ..., (ηn, 0). These are then substituted into the following formula for evaluation:

[0104]

[0105] Reliability R L Substituting the mission duration T0 into the following formula, we can obtain the estimated lower limit of the mean time between failures (MTBF) of the shipborne electronic system.

[0106]

[0107] If MTBF L If the value is greater than or equal to θ, the requirement is met; otherwise, the requirement is not met.

[0108] Therefore, the time for this reliability test is determined to be T1, and then proceed to step six.

[0109] Step 4: Method for determining test time based on compression ratio K: Select a test plan with an allowable number of failures of 0, and define the coefficient as ε. Then, the reliability test time for the shipborne electronic compression system during the development phase is:

[0110] T1=ε×MTBF=ε×θ

[0111] The actual test times for each component of the shipborne electronic compression system, A1 to An, are T11 = K1 × T1, T12 = K2 × T1, ..., T1n = Kn × T1. Under the arrangement of simultaneous tests, the longest test time is... The reliability test of the shipborne electronic compression system will take place at time T2.

[0112] Step 5: Method for determining test time based on reliability model back-calculation: Reliability allocation is performed on the shipborne electronic system, assigning the system reliability index MTBF = θ to each component device A1, A2, ..., An, with corresponding reliability indices θ1, θ2, ..., θ... n It satisfies the following formula:

[0113]

[0114] Since the number of components in the prototype does not exceed the number of units in the final assembly, the reliability index of the prototype is θ. # It satisfies the following formula

[0115]

[0116] The required reliability test time for the system is T3 = ε × θ #

[0117] Therefore, the reliability verification test time for this shipborne electronic compression system is T3.

[0118] Step Six: Develop Test Outline and Conduct Tests: Develop a reliability test outline and conduct reliability tests.

[0119] This embodiment, without increasing the number of components of the equipment, makes full use of the number of devices in the shipborne electronic compression system during the development stage. It adopts the LM method, compression ratio K and reliability allocation result back-calculation method, takes into account external input requirements and reliability allocation results, and verifies the reliability index of the shipborne electronic system by designing a reasonable test plan.

[0120] This embodiment not only completed the verification of product reliability indicators, but also shortened the testing time, reduced the testing costs for the research and development unit, and ensured the development progress of the equipment.

[0121] Specifically, step one: determine the basic information of the shipborne electronic compression system.

[0122] A shipborne electronic system has a reliability index MTBF of 500h. It consists of equipment A, B, C, and D, with corresponding quantities of N1=1, N2=2, N3=3, and N4=4, respectively. The prototype (compacted system) in the development phase has corresponding quantities of M1=1, M2=1, M3=2, and M4=3, respectively. The compaction ratios of each component equipment A1 to An are K1=1, K2=2, K3=1.5, and K4=1.34, respectively. The mission profile duration of the shipborne electronic system is T0=2160h, and the confidence level required to verify the reliability index is C=0.7.

[0123] Step 2: Review the external input requirements of the shipboard electronic systems and communicate with the product orderer.

[0124] (1) If an assessment is permitted, proceed to step three;

[0125] (2) If an assessment is not permitted and the reliability allocation results have not been rigorously reviewed and confirmed, proceed to step four.

[0126] (3) If an assessment is not permitted, but the reliability allocation results have been reviewed and approved by the purchaser, proceed to step five.

[0127] Step 3: Select a test plan with an allowable number of failures of 0. The coefficient specified in the test plan is 1.204. Therefore, the required reliability test duration for the shipborne electronic compression system during the development phase is:

[0128] T1=ε×MTBF=ε×θ=1.204×500h=602h

[0129] The actual test time for each component of the shipborne electronic compression system, A, B, C, and D, was as follows:

[0130] T11=K1×T1=1×602h=602h;

[0131] T12=K2×T1=2×602h=1204h;

[0132] T13=K3×T1=1.5×602h=903h;

[0133] T14=K4×T1=1.34×602h≈807h;

[0134] The equivalent number of tasks for each component device can be obtained.

[0135] η1=T11 / T0=602 / 2160≈0.28;

[0136] η2=T12 / T0=1204 / 2160≈0.56;

[0137] η3=T12 / T0=903 / 2160≈0.42;

[0138] eta4=T1n / T0=807 / 2160≈0.37.

[0139] Using the LM method to conduct reliability assessment, the sample numbers for each component device A1 to An are (η1, 0), (η2, 0), ..., (ηn, 0). These are then substituted into the following formula for assessment:

[0140]

[0141] Reliability R L =0.0136, mission duration T0 = 2160. Substituting these values ​​into the following formula, we can obtain the estimated lower limit of the mean time between failures (MTBF) for the shipborne electronic systems.

[0142]

[0143] If MTBF L If ≥500h is greater than or equal to θ, then the requirement is met.

[0144] Step 4: Select a test plan with an allowable number of failures of 0. The coefficient specified in the test plan is ε. Therefore, the reliability test duration for the shipborne electronic compression system during the development phase is:

[0145] T1=ε×MTBF=ε×θ=1.204×500h=602h

[0146] The actual test time for each component of the shipborne electronic compression system, A, B, C, and D, was as follows:

[0147] T11=K1×T1=1×602h=602h;

[0148] T12=K2×T1=2×602h=1204h;

[0149] T13=K3×T1=1.5×602h=903h;

[0150] T14=K4×T1=1.34×602h≈807h;

[0151] Under the arrangement of conducting experiments simultaneously, the longest experimental time is

[0152] The reliability test of the shipborne electronic compression system lasted for T2 = 1204 hours.

[0153] Step 5: Perform reliability allocation for the shipborne electronic system, assigning the system reliability index MTBF = θ to each component device A1, A2, ..., An, with corresponding reliability indices θ1 = 5000h, θ2 = 5000h, θ3 = 5000h, and θ4 = 5000h, satisfying the following formula:

[0154]

[0155] Since the number of components in the prototype does not exceed the number of units in the final assembly, the reliability index of the prototype is θ. # It satisfies the following formula

[0156]

[0157] θ can be obtained # ≈714.3h

[0158] The required reliability test time for the system is T3 = ε × θ # =1.204 × 714.3h ≈ 860h

[0159] Therefore, the reliability verification test time for this shipborne electronic compression system is T3 = 860h.

[0160] Step Six: Develop a reliability test outline and conduct reliability tests.

[0161] In summary, the beneficial effects of the embodiments of this application are as follows: without increasing the number of each component of the equipment, the number of equipment in the shipborne electronic compression system during the development stage is fully utilized. The LM method, compression ratio K and reliability allocation result back-calculation method are adopted, taking into account external input requirements and reliability allocation results. By designing a reasonable test plan, the reliability index verification of the shipborne electronic system is realized. While completing the product reliability index verification, the test time is shortened, the test cost of the development unit is reduced, and the development progress of the equipment is guaranteed.

[0162] In this application, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance; the term "multiple" refers to two or more unless otherwise expressly defined. The terms "install," "connect," "link," and "fix" should be interpreted broadly. For example, "connect" can mean a fixed connection, a detachable connection, or an integral connection; "link" can mean a direct connection or an indirect connection through an intermediate medium. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0163] In the description of this application, it should be understood that the terms "upper", "lower", "front", "rear", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the system or module referred to must have a specific orientation or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application.

[0164] In the description of this specification, the terms "one embodiment," "some embodiments," "specific embodiment," etc., refer to a specific feature, structure, material, or characteristic described in connection with that embodiment or example, which is included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0165] The above are merely preferred embodiments of this application and are not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A method for verifying the reliability indicators of a shipborne electronic compression system, characterized in that, include: Acquire basic information about the shipborne electronic compression system, including mean time between failures, compression ratio, duration of the shipborne electronic system mission profile, and confidence level. Obtain the external input requirements of the shipborne electronic compression system, and determine whether a reliability assessment is required based on the external input requirements; When reliability assessment is not required, the test time determination method based on the Levenberg-Marquardt method is used to verify reliability indicators. When a reliability assessment is required, determine whether the reliability allocation results have been reviewed and confirmed. When the reliability allocation results have not been reviewed and confirmed, the reliability index is verified by the test time determination method based on the compression ratio K. Once the reliability allocation results have been reviewed and confirmed, the reliability index is verified using the test time determination method based on the reliability model.

2. The method for verifying the reliability index of a shipborne electronic compression system according to claim 1, characterized in that, The acquisition of basic information about the shipborne electronic compression system includes: Acquire reliability indicators, mission profile duration, and confidence level of shipborne electronic systems, including mean time between failures (MTBF). Acquire the equipment of the shipborne electronic compression system, the quantity of the equipment corresponding to the equipment, and the quantity of the prototype of the equipment; The compression ratio of the equipment is obtained based on the quantity of the equipment and the quantity of the prototype.

3. The method for verifying the reliability index of the shipborne electronic compression system according to claim 2, characterized in that, The reliability index verification of the test time determination method based on the Levenberg-Marquardt method includes: The test plan is determined based on the number of allowable failures, and the coefficients are determined based on the test plan; The required reliability test time is obtained based on the reliability index and the coefficient. Based on the required reliability test time, the compression ratio, the duration of the shipborne electronic system mission profile, and the confidence level, the lower limit of the mean time between failures (MTBF) of the shipborne electronic system is estimated using the Levberg-Marquardt method. Determine whether the requirements are met based on the estimated lower limit of the mean time between failures (MTBF) and the reliability index.

4. The method for verifying the reliability index of the shipborne electronic compression system according to claim 3, characterized in that, The formula for calculating the lower limit estimate of the mean time between failures (MTBF) is as follows: The required reliability testing time is: T1 = ε × MTBF = ε × θ; Where T1 is the required reliability test time, ε is a coefficient, MTBF=θ is the reliability index, the compression ratios of equipment A1, A2, ..., An of the shipborne electronic system are K1, K2, ..., Kn, the actual test times of equipment A1, A2, ..., An of the shipborne electronic system are T11=K1×T1, T12=K2×T1, ..., T1n=Kn×T1, the equivalent number of tasks of equipment A1, A2, ..., An of the shipborne electronic system are η1= T11 / T0, η2= T12 / T0, ..., ηn= T1n / T0, T0 is the duration of the task profile of the shipborne electronic system, the Levenberg-Marquardt method is used for reliability assessment, and the sample sizes of equipment A1, A2, ..., An of the shipborne electronic system are (η1, 0), (η2, 0), ..., (ηn, 0). ； ； in, C represents reliability, and C represents confidence level. This is an estimate of the lower limit of the mean time between failures (MTBF). The equivalent number of tasks for shipborne electronic systems. T0 represents the number of mission failures of the shipborne electronic system in Q tests, and T0 represents the duration of the shipborne electronic system mission profile. Let Ai be the equivalent number of equipment in the shipborne electronic system, and n be the number of equipment in the shipborne electronic system.

5. The method for verifying the reliability index of a shipborne electronic compression system according to claim 2, characterized in that, The method for determining the test time based on the compression ratio K is used to verify reliability indicators, including: The test plan is determined based on the number of allowable failures, and the coefficients are determined based on the test plan; The required reliability test time is obtained based on the reliability index and the coefficient. The actual test time of the multiple devices is obtained based on the required reliability test time and the compression ratio of the multiple devices of the shipborne electronic compression system. The reliability test time is obtained based on the maximum value among the multiple actual test times.

6. The method for verifying the reliability index of a shipborne electronic compression system according to claim 2, characterized in that, The formulas derived from the reliability model include: ； ； ； This involves reliability allocation for the shipborne electronic systems, assigning the reliability index MTBF=θ to devices A1, A2, ..., An within the shipborne electronic systems, with corresponding reliability indices as follows: , … The quantities of the equipment are N1, N2, ..., Nn, and the quantities of the prototypes are M1, M2, ..., Mn. The reliability index of the prototypes is... , ε is the required reliability test time.

7. The method for verifying the reliability index of a shipborne electronic compression system according to any one of claims 1 to 6, characterized in that, Also includes: Develop a reliability test outline and conduct reliability tests.

8. A reliability index verification system for a shipborne electronic compression system, characterized in that, include: The first acquisition module (110) is used to acquire basic information of the shipborne electronic compression system, including mean time between failures, compression ratio, mission profile duration of the shipborne electronic system and confidence level. The second acquisition module (120) is used to acquire the external input requirements of the shipborne electronic compression system and determine whether a reliability assessment is required based on the external input requirements. The verification module (130) is used to verify reliability indicators based on the Levenberg-Marquardt method for determining test time when no reliability assessment is required; to determine whether the reliability allocation result has been reviewed and confirmed when a reliability assessment is required; to verify reliability indicators based on the compaction ratio K when the reliability allocation result has not been reviewed and confirmed; and to verify reliability indicators based on the reliability model-based method for determining test time when the reliability allocation result has been reviewed and confirmed.

9. A reliability index verification system for a shipborne electronic compression system, characterized in that, include: A memory (300) and a processor (400), wherein the memory (300) stores a program or instructions that can be run on the processor (400), and the processor (400) executes the program or instructions to implement the steps of the shipborne electronic compression system reliability index verification method as described in any one of claims 1 to 7.

10. A readable storage medium having a program or instructions stored thereon, characterized in that, When the program or the instructions are executed by the processor, they implement the steps of the method for verifying the reliability index of the shipborne electronic compression system as described in any one of claims 1 to 7.

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