Controllable commutation converter valve impact test device and method

Abstract

The invention provides a controllable commutation converter valve impact test device and method. The device comprises an impact generation device, a first rapid mechanical switch, a second rapid mechanical switch and a power frequency test transformer. The impact generating device and the power frequency testing transformer are connected in parallel, and the tested controllable commutation converter valve sample valve is connected between the impact generating device and the power frequency testing transformer; the first rapid mechanical switch is connected with the impact generating device and used for controlling the impact generating device to be put in and quit; and the second rapid mechanical switch is connected with the power frequency test transformer and is used for controlling the switching-on and switching-off of the power frequency test transformer. According to the invention, simultaneous energy taking of the IGBT element and the thyristor board card in the tested controllable commutation converter valve test sample valve in the test and electrical isolation of the power frequency test transformer and the impact generation device are realized, and safe and reliable development of the controllable commutation converter valve impact test is ensured.

Description

Technical Field

[0001] The present invention belongs to the technical field of controllable commutation converters, and particularly relates to a controllable commutation converter impulse test device and method. Background Art

[0002] A controllable commutation converter (CLCC valve) refers to a converter that uses a combination of semi-controlled devices and fully-controlled devices to actively turn off the current through the fully-controlled devices to achieve the controllable commutation function. The topology of the CLCC converter valve is as Figure 1 shown, and it is mainly composed of a main branch and an auxiliary branch connected in parallel. The main branch is composed of a conventional thyristor valve V1 in series with a low-voltage IGBT valve V2, and the auxiliary branch is composed of a high-voltage IGBT valve V3 and a high-voltage thyristor valve V4 in series.

[0003] The impulse test of the existing conventional thyristor converter valve energizes the control board of the test valve through a power frequency test transformer to make the board in a normal working state. The FOP function of the board can protect the series thyristor elements in the test valve from being broken down under a relatively high impulse voltage in extreme working conditions. The energizing voltage of the board of the conventional thyristor converter valve is relatively low, about 100V, and the voltage sharing situation between elements is relatively good. Therefore, for the conventional thyristor converter valve, the power frequency test transformer only needs to provide a relatively low-level AC voltage to meet the test requirements.

[0004] Different from the conventional thyristor converter valve, both the main and auxiliary branches in a single valve of the CLCC converter valve are composed of a thyristor sub-valve and an IGBT sub-valve in series, and the resistance value of the voltage-sharing resistor configured for the thyristor sub-valve is much higher than that of the IGBT sub-valve. Therefore, when a voltage is applied to a single valve of the CLCC converter valve, the thyristor sub-valve will bear most of the voltage, while the voltage division of the IGBT sub-valve is very low. If the impulse test device of the existing conventional thyristor converter valve is used, the requirement of simultaneous power taking for the boards of the thyristor sub-valve and the IGBT sub-valve cannot be met. If the voltage level of the power frequency test transformer is increased to make the voltage of the IGBT sub-valve reach the power-taking requirement, due to the influence of the voltage division effect, the voltage of the thyristor sub-valve will be very high at this time. When a reverse impulse voltage is applied to the test valve, the impulse voltage superimposed on the too high AC energizing voltage may cause serious faults such as device breakdown. To solve the above problems, it is necessary to develop a test method for the impulse test of the CLCC converter valve. Summary of the Invention

[0005] To overcome the problems existing in the above related technologies, the present application provides a controllable commutation converter impulse test device and method.

[0006] According to the first aspect of the embodiments of the present application, a controllable commutation converter impulse test device is provided. The device includes: an impulse generating device, a first fast mechanical switch, a second fast mechanical switch, and a power frequency test transformer;

[0007] The impact generating device is connected in parallel with the power frequency test transformer, and the test valve of the controllable phase - commutation converter valve to be tested is connected between the impact generating device and the power frequency test transformer;

[0008] The first fast mechanical switch is connected to the impact generating device and is used to control the input and withdrawal of the impact generating device;

[0009] The second fast mechanical switch is connected to the power frequency test transformer and is used to control the input and withdrawal of the power frequency test transformer;

[0010] The impact generating device is used to generate an impact voltage applied to the test valve of the controllable phase - commutation converter valve to be tested;

[0011] The power frequency test transformer is used to charge the drive board in the test valve of the controllable phase - commutation converter valve to be tested.

[0012] Preferably, one end of the first fast mechanical switch is connected to one end of the impact generating device, and the other end is connected to the anode of the test valve of the controllable phase - commutation converter valve to be tested;

[0013] One end of the second fast mechanical switch is connected to the anode of the test valve of the controllable phase - commutation converter valve to be tested, and the other end is connected to one end of the power frequency test transformer;

[0014] The other end of the power frequency test transformer is grounded.

[0015] Preferably, the first fast mechanical switch is connected in parallel with the impact generating device;

[0016] One end of the first fast mechanical switch is connected to the anode of the test valve of the controllable phase - commutation converter valve to be tested, and the other end is connected to one end of the second fast switch;

[0017] The second fast mechanical switch is connected in parallel with the power frequency test transformer; the other end of the second fast mechanical switch is connected to the cathode of the test valve of the controllable phase - commutation converter valve to be tested;

[0018] The connection point between the other end of the first fast mechanical switch and one end of the second fast switch is grounded.

[0019] Preferably, the controllable phase - commutation converter valve impact test device further includes: a wave - regulating inductor; the wave - regulating inductor is connected between the first fast mechanical switch and the impact generating device.

[0020] Preferably, the controllable phase - commutation converter valve impact test device further includes: a current - limiting resistor and a second capacitor;

[0021] One end of the current-limiting resistor is connected between the wave-tuning inductor and the first fast mechanical switch, and the other end is connected to one end of the second capacitor;

[0022] The other end of the second capacitor is connected to the impact device;

[0023] The other end of the second capacitor is grounded.

[0024] Preferably, the impact generating device includes: a wave-tail resistor, a wave-head resistor, a first capacitor, and an isolating sphere gap;

[0025] One end of the wave-head resistor is connected to the isolating sphere gap, and the other end is connected to the wave-tuning inductor;

[0026] The first capacitor and the wave-tail resistor are connected in parallel across the isolating sphere gap;

[0027] The connection point between the first capacitor and the wave-tail resistor is connected to the other end of the second capacitor.

[0028] Preferably, the test valve of the controllable phase-shifting converter valve to be measured includes: a main branch and an auxiliary branch connected in parallel; the main branch includes: a first saturable reactor, a first thyristor, and a first IGBT element connected in sequence; the auxiliary branch includes: a second saturable reactor, a second thyristor, and a second IGBT element connected in sequence;

[0029] The first saturable reactor is connected to the second saturable reactor, and the end where the first saturable reactor and the second saturable reactor are connected to each other forms the anode of the test valve of the controllable phase-shifting converter valve to be measured;

[0030] The first IGBT element is connected to the second IGBT element, and the end where the first IGBT element and the second IGBT element are connected to each other forms the cathode of the test valve of the controllable phase-shifting converter valve to be measured.

[0031] According to the second aspect of the embodiments of the present application, a method for performing an impact test on a controllable phase-shifting converter valve is provided, which is applied to the above-mentioned controllable phase-shifting converter valve impact test device. The method includes:

[0032] Set the states of the first fast mechanical switch and the second fast mechanical switch to the initial state, and the power frequency test transformer charges the drive board in the test valve of the controllable phase-shifting converter valve to be measured;

[0033] Change the states of the first fast mechanical switch and the second fast mechanical switch, and the test valve of the controllable phase-shifting converter valve to be measured enters the natural discharge state;

[0034] Change the states of the first fast mechanical switch and the second fast mechanical switch again, and the impulse generating device generates an impulse voltage applied to the test valve of the controllable commutation and commutation valve to be measured;

[0035] Restore the states of the first fast mechanical switch and the second fast mechanical switch to the initial states;

[0036] The initial states are the opening / closing of the first fast mechanical switch and the second fast mechanical switch.

[0037] Preferably, setting the states of the first fast mechanical switch and the second fast mechanical switch to the initial states, and the power frequency test transformer charges the drive board in the test valve of the controllable commutation and commutation valve to be measured, including:

[0038] When one end of the first fast mechanical switch is connected to one end of the impulse generating device and the other end is connected to the anode of the test valve of the controllable commutation and commutation valve to be measured, the first fast mechanical switch is opened and the second fast mechanical switch is closed, so that the power frequency test transformer charges the drive board in the test valve of the controllable commutation and commutation valve to be measured.

[0039] Preferably, changing the states of the first fast mechanical switch and the second fast mechanical switch, and the test valve of the controllable commutation and commutation valve to be measured enters the natural discharge state, including:

[0040] When one end of the first fast mechanical switch is connected to one end of the impulse generating device and the other end is connected to the anode of the test valve of the controllable commutation and commutation valve to be measured, the first fast mechanical switch remains open and the second fast mechanical switch is opened, so that the test valve of the controllable commutation and commutation valve to be measured enters the natural discharge state, and the impulse generating device does not participate in the work.

[0041] Preferably, changing the states of the first fast mechanical switch and the second fast mechanical switch again, and the impulse generating device generates an impulse voltage applied to the test valve of the controllable commutation and commutation valve to be measured, including:

[0042] When one end of the first fast mechanical switch is connected to one end of the impulse generating device and the other end is connected to the anode of the test valve of the controllable commutation and commutation valve to be measured, when the time for the test valve of the controllable commutation and commutation valve to be measured to enter the natural discharge state reaches the first preset time, the first fast mechanical switch is closed and the second fast mechanical switch remains open, and after the second preset time, the impulse generating device applies an impulse voltage to the test valve of the controllable commutation and commutation valve to be measured. When the impulse voltage reaches the preset voltage peak value, the thyristor and IGBT components in the main branch of the test valve of the controllable commutation and commutation valve to be measured are triggered, and the energy on the second capacitor is converted into current for the test valve of the controllable commutation and commutation valve to be measured.

[0043] Preferably, the first preset time is greater than the time required for the board voltages of all thyristors and IGBT components in the test valve of the controllable commutation converter valve under test to drop to the second preset voltage range, and less than the power-off maintenance time of the boards of all thyristors and IGBT components in the test valve of the controllable commutation converter valve under test;

[0044] The second preset time is greater than the operation time for the first fast mechanical switch to open.

[0045] Preferably, restoring the states of the first fast mechanical switch and the second fast mechanical switch to the initial states includes:

[0046] When one end of the first fast mechanical switch is connected to one end of the impact generating device and the other end is connected to the anode of the test valve of the controllable commutation converter valve under test, after the time for the impact generating device to apply an impact voltage to the test valve of the controllable commutation converter valve under test reaches the third preset time, the impact generating device stops applying the impact voltage. Until the impact voltage drops to the first preset voltage range, the IGBT component in the main branch of the test valve of the controllable commutation converter valve under test is turned off, and the first fast mechanical switch opens, the second fast mechanical switch closes, and the power frequency test transformer charges the drive board in the test valve of the controllable commutation converter valve under test again, and the impact test of the test valve of the controllable commutation converter valve under test ends.

[0047] Preferably, setting the states of the first fast mechanical switch and the second fast mechanical switch to the initial states to enable the power frequency test transformer to charge the drive board in the test valve of the controllable commutation converter valve under test includes:

[0048] When the first fast mechanical switch is connected in parallel with the impact generating device, the first fast mechanical switch closes, the second fast mechanical switch opens, and the power frequency test transformer charges the drive board in the test valve of the controllable commutation converter valve under test.

[0049] Preferably, changing the states of the first fast mechanical switch and the second fast mechanical switch, and the test valve of the controllable commutation converter valve under test enters the natural discharge state, including:

[0050] When the first fast mechanical switch is connected in parallel with the impact generating device, the first fast mechanical switch opens, and after the fourth preset time, the second fast mechanical switch closes, and the test valve of the controllable commutation converter valve under test enters the natural discharge state, and the impact generating device does not participate in the operation.

[0051] Preferably, the fourth preset time is greater than the operation time for the first fast mechanical switch to open.

[0052] Preferably, for the step of changing the states of the first fast mechanical switch and the second fast mechanical switch again, the impulse generating device generates an impulse voltage applied to the valve under test of the controllable commutation converter valve, including:

[0053] When the first fast mechanical switch is connected in parallel with the impulse generating device, when the time for the valve under test of the controllable commutation converter valve to enter the natural discharge state reaches a fifth preset time, the first fast mechanical switch remains open, the second fast mechanical switch remains closed, the impulse generating device applies an impulse voltage to the valve under test of the controllable commutation converter valve. When the impulse voltage reaches a preset voltage peak, the thyristors and IGBT components in the main branch of the valve under test of the controllable commutation converter valve are triggered, and the energy on the second capacitor is converted into current for the valve under test of the controllable commutation converter valve.

[0054] Preferably, the fifth preset time is greater than the time required for the board voltages of all thyristors and IGBT components in the valve under test of the controllable commutation converter valve to drop to a fourth preset voltage range, and less than the power-off maintenance time of the boards of all thyristors and IGBT components in the valve under test of the controllable commutation converter valve.

[0055] Preferably, for the step of restoring the states of the first fast mechanical switch and the second fast mechanical switch to the initial states, including:

[0056] When the first fast mechanical switch is connected in parallel with the impulse generating device, after the time for the impulse generating device to apply an impulse voltage to the valve under test of the controllable commutation converter valve reaches a sixth preset time, the impulse generating device stops applying the impulse voltage. Until the impulse voltage drops to a third preset voltage range, the IGBT components in the main branch of the valve under test of the controllable commutation converter valve are turned off, and the first fast mechanical switch is closed, the second fast mechanical switch is open, and the power frequency test transformer charges the drive board in the valve under test of the controllable commutation converter valve again, and the impulse test of the valve under test of the controllable commutation converter valve ends.

[0057] Preferably, for the impulse generating device to apply an impulse voltage to the valve under test of the controllable commutation converter valve, including:

[0058] Adjust the wavefront resistance, wave tail resistance and wave adjusting inductor so that the impulse generating device generates an impulse voltage applied to the valve under test of the controllable commutation converter valve and applies the impulse voltage to the valve under test of the controllable commutation converter valve.

[0059] According to the third aspect of the embodiments of the present application, a computer device is provided, including: one or more processors;

[0060] The processor is used to store one or more programs;

[0061] When the one or more programs are executed by the one or more processors, the above-mentioned controllable commutation converter valve impulse test method is implemented.

[0062] According to the fourth aspect of the embodiments of the present application, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed, the above-mentioned controllable commutation converter valve impulse test method is implemented.

[0063] One or more of the above technical solutions of the present invention have at least one or more of the following beneficial effects:

[0064] A controllable commutation converter valve impulse test device and method provided by the present invention include: an impulse generating device, a first fast mechanical switch, a second fast mechanical switch, and a power frequency test transformer; the impulse generating device and the power frequency test transformer are connected in parallel, and the test valve of the controllable commutation converter valve to be measured is connected between the impulse generating device and the power frequency test transformer; the first fast mechanical switch is connected to the impulse generating device and is used to control the input and output of the impulse generating device; the second fast mechanical switch is connected to the power frequency test transformer and is used to control the input and output of the power frequency test transformer; the impulse generating device is used to generate an impulse voltage applied to the test valve of the controllable commutation converter valve to be measured; the power frequency test transformer is used to charge the drive board in the test valve of the controllable commutation converter valve to be measured. The technical solution provided by the present invention realizes the simultaneous energy extraction of the IGBT components and thyristor boards in the test valve of the controllable commutation converter valve to be measured during the test, and the electrical isolation between the power frequency test transformer and the impulse generating device, ensuring the safe and reliable development of the controllable commutation converter valve impulse test. Description of the Drawings

[0065] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the following drawings are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0066] Figure 1 It is the topology diagram of the CLCC converter valve provided by the embodiments of the present invention;

[0067] Figure 2 It is the structural block diagram of a controllable commutation converter valve impulse test device provided by the embodiments of the present invention;

[0068] Figure 3 It is the flowchart of a controllable commutation converter valve impulse test method provided by the embodiments of the present invention;

[0069] Figure 4 It is a schematic diagram of the switch state of the impulse test method for a controllable phase - commutation converter valve;

[0070] Figure 5 It is a structural block diagram of an impulse test device for a controllable phase - commutation converter valve provided by an embodiment of the present invention;

[0071] Figure 6 It is a flow chart of an impulse test method for a controllable phase - commutation converter valve provided by an embodiment of the present invention;

[0072] Figure 7 It is a schematic diagram of the switch state of the impulse test method for a controllable phase - commutation converter valve;

[0073] In the figure, S - power frequency test transformer, V - test valve of the controllable phase - commutation converter valve to be measured, D - impulse generating device, K1 - first fast mechanical switch, K2 - second fast mechanical switch, L - wave - tuning inductor, R3 - current - limiting resistor, C2 - second capacitor, R1 - wave - tail resistor, R2 - wave - head resistor, C1 - first capacitor, 1 - isolation sphere gap, 2 - first saturable reactor, 3 - second saturable reactor, V11 - first thyristor, V12 - first IGBT element, V13 - second thyristor, V14 - second IGBT element. Specific embodiments

[0074] To make the objectives, technical solutions and advantages of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the following embodiments are some but not all of the embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art without making creative efforts based on the embodiments of the present invention belong to the scope of protection of the present invention.

[0075] Embodiment 1

[0076] The present invention provides an impulse test device for a controllable phase - commutation converter valve. As Figure 2 shown, the device includes: an impulse generating device D, a first fast mechanical switch K1, a second fast mechanical switch K2, and a power frequency test transformer S;

[0077] The impulse generating device D and the power frequency test transformer S are connected in parallel, and the test valve V of the controllable phase - commutation converter valve to be measured is connected between the impulse generating device D and the power frequency test transformer S;

[0078] The first fast mechanical switch K1 is connected to the impulse generating device D and is used to control the input and output of the impulse generating device D;

[0079] The second fast mechanical switch K2 is connected to the power frequency test transformer S and is used to control the input and output of the power frequency test transformer S;

[0080] An impact generating device D for generating an impact voltage applied to the test valve V of the controllable phase - commutation converter valve to be measured.

[0081] A power - frequency test transformer S for charging the drive board in the test valve V of the controllable phase - commutation converter valve to be measured.

[0082] Furthermore, one end of the first fast mechanical switch K1 is connected to one end of the impact generating device D, and the other end is connected to the anode of the test valve V of the controllable phase - commutation converter valve to be measured.

[0083] One end of the second fast mechanical switch K2 is connected to the anode of the test valve V of the controllable phase - commutation converter valve to be measured, and the other end is connected to one end of the power - frequency test transformer S.

[0084] The other end of the power - frequency test transformer S is grounded.

[0085] Furthermore, the controllable phase - commutation converter valve impact test device further includes: a wave - tuning inductor L; the wave - tuning inductor L is connected between the first fast mechanical switch K1 and the impact generating device D.

[0086] Furthermore, the controllable phase - commutation converter valve impact test device further includes: a current - limiting resistor R3 and a second capacitor C2;

[0087] One end of the current - limiting resistor R3 is connected between the wave - tuning inductor L and the first fast mechanical switch K1, and the other end is connected to one end of the second capacitor C2.

[0088] The other end of the second capacitor C2 is connected to the impact device.

[0089] The other end of the second capacitor C2 is grounded.

[0090] Furthermore, the impact generating device D includes: a wave - tail resistor R1, a wave - head resistor R2, a first capacitor C1, and an isolation sphere gap 1;

[0091] One end of the wave - head resistor R2 is connected to the isolation sphere gap 1, and the other end is connected to the wave - tuning inductor L.

[0092] The first capacitor C1 and the wave - tail resistor R1 are connected in parallel across both ends of the isolation sphere gap 1.

[0093] The connection point between the first capacitor C1 and the wave - tail resistor R1 is connected to the other end of the second capacitor C2.

[0094] It should be noted that the first capacitor C1 is the body capacitor inside the impact generating device D.

[0095] Further, the test valve V of the controllable phase - commutation converter valve to be measured includes a main branch and an auxiliary branch connected in parallel; the main branch includes a first saturable reactor 2, a first thyristor V11, and a first IGBT element V12 connected in sequence; the auxiliary branch includes a second saturable reactor 3, a second thyristor V13, and a second IGBT element V14 connected in sequence;

[0096] The first saturable reactor 2 is connected to the second saturable reactor 3, and one end where the first saturable reactor 2 and the second saturable reactor 3 are connected to each other forms the anode of the test valve V of the controllable phase - commutation converter valve to be measured;

[0097] The first IGBT element V12 is connected to the second IGBT element V14, and one end where the first IGBT element V12 and the second IGBT element V14 are connected to each other forms the cathode of the test valve V of the controllable phase - commutation converter valve to be measured.

[0098] Specifically, each IGBT element is composed of an IGBT chip in anti - parallel connection with a diode.

[0099] A controllable phase - commutation converter valve impulse test device provided by the present invention can be applied to all single - valve impulse voltage tests such as single - valve operation impulse test, single - valve lightning impulse test, single - valve steep - wave impulse test, and single - valve potential distribution test of the controllable phase - commutation converter valve, with a wide range of applications;

[0100] A controllable phase - commutation converter valve impulse test device provided by the present invention can change the output voltages of the power - frequency test transformer S and the impulse generating device D according to test requirements, and can be applicable to the impulse tests of controllable phase - commutation converter valves with different voltage and current levels.

[0101] Embodiment 2

[0102] The present invention provides a method for testing the impulse of a controllable phase - commutation converter valve, which is applied to the controllable phase - commutation converter valve impulse test device in Embodiment 1. As Figure 3 shown, the method includes:

[0103] Step 101: Set the states of the first fast mechanical switch K1 and the second fast mechanical switch K2 to the initial state, and the power - frequency test transformer S charges the drive board in the test valve V of the controllable phase - commutation converter valve to be measured;

[0104] Step 102: Change the states of the first fast mechanical switch K1 and the second fast mechanical switch K2, and the test valve V of the controllable phase - commutation converter valve to be measured enters the natural discharge state;

[0105] Step 103: Change the states of the first fast mechanical switch K1 and the second fast mechanical switch K2 again, and the impulse generating device D generates an impulse voltage applied to the test valve V of the controllable phase - commutation converter valve to be measured;

[0106] Step 104: Restore the states of the first fast mechanical switch K1 and the second fast mechanical switch K2 to their initial states;

[0107] The initial states are the open / closed states of the first fast mechanical switch K1 and the second fast mechanical switch K2.

[0108] Further, step 101 includes:

[0109] When one end of the first fast mechanical switch K1 is connected to one end of the impact generating device D and the other end is connected to the anode of the test valve V of the controllable phase - commutation converter valve to be measured, the first fast mechanical switch K1 is opened and the second fast mechanical switch K2 is closed, so that the power frequency test transformer S charges the drive board in the test valve V of the controllable phase - commutation converter valve to be measured.

[0110] Further, step 102 includes:

[0111] When one end of the first fast mechanical switch K1 is connected to one end of the impact generating device D and the other end is connected to the anode of the test valve V of the controllable phase - commutation converter valve to be measured, the first fast mechanical switch K1 remains open and the second fast mechanical switch K2 is opened, so that the test valve V of the controllable phase - commutation converter valve to be measured enters the natural discharge state and the impact generating device D does not participate in the operation.

[0112] Further, step 103 includes:

[0113] When one end of the first fast mechanical switch K1 is connected to one end of the impact generating device D and the other end is connected to the anode of the test valve V of the controllable phase - commutation converter valve to be measured, when the time for the test valve V of the controllable phase - commutation converter valve to be measured to enter the natural discharge state reaches the first preset time, the first fast mechanical switch K1 is closed and the second fast mechanical switch K2 remains open, and after the second preset time, the impact generating device D applies an impact voltage to the test valve V of the controllable phase - commutation converter valve to be measured. When the impact voltage reaches the preset voltage peak value, the thyristor and IGBT components in the main branch of the test valve V of the controllable phase - commutation converter valve to be measured are triggered, and the energy on the second capacitor C2 is converted into current for the test valve V of the controllable phase - commutation converter valve to be measured.

[0114] It can be understood that the preset voltage peak value is the maximum voltage value that the test valve V of the controllable phase - commutation converter valve to be measured can accept, that is, when exceeding the peak value, it may cause damage to the test valve V of the controllable phase - commutation converter valve to be measured.

[0115] It should be noted that the embodiments of the present invention do not limit the "first preset time", "second preset time" and "preset voltage peak value". In some embodiments, those skilled in the art can set them according to engineering needs or experimental data, etc.

[0116] Further, the impulse generating device D applies an impulse voltage to the test valve V of the controllable phase - commutation converter valve to be tested, including:

[0117] Adjust the wavefront resistor R2, the wave - tail resistor R1, and the wave - adjusting inductor L so that the impulse generating device D generates an impulse voltage applied to the test valve V of the controllable phase - commutation converter valve to be tested, and applies the impulse voltage to the test valve V of the controllable phase - commutation converter valve to be tested.

[0118] Specifically, the first preset time is greater than the time required for the board voltages of all thyristors and IGBT components in the test valve V of the controllable phase - commutation converter valve to be tested to drop to the second preset voltage range, and less than the power - off maintenance time of the boards in all thyristors and IGBT components in the test valve V of the controllable phase - commutation converter valve;

[0119] The second preset time is greater than the operating time for the first fast mechanical switch K1 to open.

[0120] It should be noted that the embodiments of the present invention do not limit the "time required for the board voltages of all thyristors and IGBT components in the test valve V of the controllable phase - commutation converter valve to be tested to drop to the second preset voltage range", the "second preset voltage range", and the "power - off maintenance time". In some embodiments, those skilled in the art can set them according to engineering requirements or experimental data, etc.

[0121] Further, step 104 includes:

[0122] When one end of the first fast mechanical switch K1 is connected to one end of the impulse generating device D and the other end is connected to the anode of the test valve V of the controllable phase - commutation converter valve to be tested, after the time for the impulse generating device D to generate and apply an impulse voltage to the test valve V of the controllable phase - commutation converter valve to be tested reaches the third preset time, the impulse generating device D stops applying the impulse voltage. Until the impulse voltage drops to the first preset voltage range, turn off the IGBT components in the main branch of the test valve V of the controllable phase - commutation converter valve, and the first fast mechanical switch K1 opens, and the second fast mechanical switch K2 closes. The power frequency test transformer S charges the drive board in the test valve V of the controllable phase - commutation converter valve again, and the impulse test of the test valve V of the controllable phase - commutation converter valve ends.

[0123] It should be noted that the embodiments of the present invention do not limit the "third preset time" and the "first preset voltage range". In some embodiments, those skilled in the art can set them according to engineering requirements or experimental data, etc.

[0124] A method for impulse test of a controllable phase - commutation converter valve provided by the present invention controls the input and output of a power - frequency test transformer S and an impulse generating device D by using a first fast mechanical switch K1 and a second fast mechanical switch K2, so as to ensure reliable power supply for the IGBT drive board in the valve V of the controllable phase - commutation converter valve to be tested, and at the same time avoid the risk of damage caused by the current - conducting components bearing too high voltage; it also realizes the simultaneous power supply of the IGBT sub - valve and the thyristor sub - valve board card during the test, as well as the electrical isolation between the power - frequency test transformer S and the impulse generating device D, ensuring the safe and reliable development of the impulse test of the controllable phase - commutation converter valve.

[0125] To further illustrate the above - mentioned method for impulse test of a controllable phase - commutation converter valve, the present invention provides a specific example as follows Figure 4 shown, where 0 represents the switch is off and 1 represents the switch is on. K1 is Figure 2 the schematic diagram of the switch state of the first fast mechanical switch K1 in Figure 2 and K2 is Figure 2 the schematic diagram of the switch state of the second fast mechanical switch K2 in

[0126] At the beginning stage of the test, that is Figure 4 stage ① in, at this time the first fast mechanical switch K1 is in the off state and the second fast mechanical switch K2 is in the on state. The power - frequency test transformer S and the valve V of the controllable phase - commutation converter valve to be tested form a loop, and the drive board in the valve V of the controllable phase - commutation converter valve to be tested is charged by the power - frequency test transformer S. The effective value of the voltage of the power - frequency test transformer S should be able to meet the requirement that all thyristor / IGBT component board cards of each sub - valve in the main and auxiliary branches of the valve V of the controllable phase - commutation converter valve to be tested can obtain normal power supply.

[0127] In the next stage, that is Figure 4 stage ② in, in this stage the first fast mechanical switch K1 remains in the off state and the second fast mechanical switch K2 is disconnected. The power - frequency test transformer S no longer charges the board cards in the valve V of the controllable phase - commutation converter valve to be tested, and the valve V of the controllable phase - commutation converter valve to be tested enters the natural discharge state. The duration Δt 1 (i.e., the first preset time) needs to ensure that the voltages of all thyristor / IGBT component board cards of each sub - valve in the main and auxiliary branches of the valve V of the controllable phase - commutation converter valve to be tested drop to the safe range (i.e., the second preset voltage range), ensure that the voltage will not be too high to cause component damage when the impulse voltage is superimposed later, and shall not be greater than the power - off maintenance time of the thyristor / IGBT component board cards in the valve V of the controllable phase - commutation converter valve to be tested, to prevent the FOP function from failing after the board cards are powered off. Then the first fast mechanical switch K1 is closed, and the duration is Δt 2(i.e., the second preset time) needs to be greater than the operation time of the first fast mechanical switch K1 to ensure that a stable and reliable electrical circuit is formed between the impulse generating device D and the test valve V of the controllable phase - commutation converter valve to be measured, and a reliable electrical isolation is formed with the power - frequency test transformer S. The impulse generating device D does not participate in the operation during this stage.

[0128] In the next stage, that is Figure 4 In the middle stage ③, the opening and closing states of the first fast mechanical switch K1 and the second fast mechanical switch K2 remain unchanged. The wave - front resistance R2, the wave - tail resistance R1 of the impulse generating device D and the wave - shaping inductor L are adjusted respectively to make the impulse generating device D generate an impulse voltage applied to the test valve V of the controllable phase - commutation converter valve to be measured. When the impulse voltage reaches the preset voltage peak value, the thyristor and IGBT components in the main branch of the test valve V of the controllable phase - commutation converter valve to be measured are triggered, and the energy on the second capacitor C2 is converted into current for the test valve V of the controllable phase - commutation converter valve to be measured, completing the impulse test of the test valve V of the controllable phase - commutation converter valve. The duration Δt 3 (i.e., the third preset time) is the duration of the impulse voltage, which can be adjusted according to different types of applied impulse voltages.

[0129] In the next stage, that is Figure 4 In the middle stage ④, after confirming that the states of the test equipment and the test valve are normal (i.e., after applying the impulse voltage, the components in the test valve V of the controllable phase - commutation converter valve to be measured are not damaged, etc.), this stage needs to adjust the test device to the initial state, that is, disconnect the first fast mechanical switch K1, close the second fast mechanical switch K2, and the power - frequency test transformer S continues to charge the test valve V of the controllable phase - commutation converter valve to be measured to prepare for the subsequent impulse test.

[0130] A method for impulse testing of a controllable phase - commutation converter valve provided by the present invention can achieve stable energy extraction of the board card under the condition of uneven voltage division of the thyristor sub - valve and IGBT sub - valve in the controllable phase - commutation converter valve, and ensure the normal operation of functions such as FOP triggering and status reporting;

[0131] A method for impulse testing of a controllable phase - commutation converter valve provided by the present invention isolates the power - frequency test transformer S required for the impulse test from the impulse generating device D by using a fast mechanical switch. The test valve will not be damaged due to excessive superimposed voltage, and at the same time, the power - frequency test transformer S will not be affected by the impulse voltage, ensuring the safety of the test device and the test valve;

[0132] A method for impulse testing of a controllable phase - commutation converter valve provided by the present invention can be applied to all single - valve impulse voltage tests such as single - valve operation impulse test, single - valve lightning impulse test, single - valve steep - wave impulse test, and single - valve potential distribution test of the controllable phase - commutation converter valve, with a wide range of applications;

[0133] A method for impulse test of a controllable phase - commutation converter valve provided by the present invention can change the output voltages of a power - frequency test transformer S and an impulse generating device D according to test requirements, and can be applicable to the impulse tests of controllable phase - commutation converter valves with different voltage and current levels.

[0134] Embodiment III

[0135] The present invention provides a controllable phase - commutation converter valve impulse test device, as Figure 5 shown. The device includes: an impulse generating device D, a first fast mechanical switch K1, a second fast mechanical switch K2, and a power - frequency test transformer S;

[0136] The impulse generating device D and the power - frequency test transformer S are connected in parallel, and the test valve V of the controllable phase - commutation converter valve to be measured is connected between the impulse generating device D and the power - frequency test transformer S;

[0137] The first fast mechanical switch K1 is connected to the impulse generating device D and is used to control the input and output of the impulse generating device D;

[0138] The second fast mechanical switch K2 is connected to the power - frequency test transformer S and is used to control the input and output of the power - frequency test transformer S;

[0139] The impulse generating device D is used to generate an impulse voltage applied to the test valve V of the controllable phase - commutation converter valve to be measured;

[0140] The power - frequency test transformer S is used to charge the drive board in the test valve V of the controllable phase - commutation converter valve to be measured.

[0141] Furthermore, the first fast mechanical switch K1 is connected in parallel with the impulse generating device D;

[0142] One end of the first fast mechanical switch K1 is connected to the anode of the test valve V of the controllable phase - commutation converter valve to be measured, and the other end is connected to one end of the second fast switch;

[0143] The second fast mechanical switch K2 is connected in parallel with the power - frequency test transformer S; the other end of the second fast mechanical switch K2 is connected to the cathode of the test valve V of the controllable phase - commutation converter valve to be measured;

[0144] The connection point between the other end of the first fast mechanical switch K1 and one end of the second fast switch is grounded.

[0145] Furthermore, the controllable phase - commutation converter valve impulse test device further includes: a wave - adjusting inductor L; the wave - adjusting inductor L is connected between the first fast mechanical switch K1 and the impulse generating device D.

[0146] Furthermore, the controllable phase - commutation converter valve impulse test device further includes: a current - limiting resistor R3 and a second capacitor C2;

[0147] One end of the current-limiting resistor R3 is connected between the wave-adjusting inductor L and the first fast mechanical switch K1, and the other end is connected to one end of the second capacitor C2;

[0148] The other end of the second capacitor C2 is connected to the impact device;

[0149] The other end of the second capacitor C2 is grounded.

[0150] It should be noted that the first capacitor C1 is the body capacitor inside the impact generating device D.

[0151] Further, the impact generating device D includes: a wave-tail resistor R1, a wave-head resistor R2, a first capacitor C1, and an isolation sphere gap 1;

[0152] One end of the wave-head resistor R2 is connected to the isolation sphere gap 1, and the other end is connected to the wave-adjusting inductor L;

[0153] The first capacitor C1 and the wave-tail resistor R1 are connected in parallel across both ends of the isolation sphere gap 1;

[0154] The connection point between the first capacitor C1 and the wave-tail resistor R1 is connected to the other end of the second capacitor C2.

[0155] Further, the test valve V of the controllable phase-shifting converter valve to be measured includes: a main branch and an auxiliary branch connected in parallel; the main branch includes: a first saturable reactor 2, a first thyristor V11, and a first IGBT element V12 connected in sequence; the auxiliary branch includes: a second saturable reactor 3, a second thyristor V13, and a second IGBT element V14 connected in sequence;

[0156] The first saturable reactor 2 is connected to the second saturable reactor 3, and one end where the first saturable reactor 2 and the second saturable reactor 3 are interconnected constitutes the anode of the test valve V of the controllable phase-shifting converter valve to be measured;

[0157] The first IGBT element V12 is connected to the second IGBT element V14, and one end where the first IGBT element V12 and the second IGBT element V14 are interconnected constitutes the cathode of the test valve V of the controllable phase-shifting converter valve to be measured.

[0158] Specifically, each IGBT element is composed of an IGBT chip and a diode connected in anti-parallel.

[0159] A controllable phase-shifting converter valve impact test device provided by the present invention can be applied to all single-valve impact voltage tests such as single-valve switching impulse tests, single-valve lightning impulse tests, single-valve steep wave impulse tests, and single-valve potential distribution tests of controllable phase-shifting converter valves, and has a wide range of applications;

[0160] A controllable commutation converter valve impulse test device provided by the present invention can change the output voltages of a power frequency test transformer S and an impulse generating device D according to test requirements, and can be applicable to impulse tests of controllable commutation converter valves with different voltage and current levels.

[0161] Embodiment 4

[0162] A method for testing a controllable commutation converter valve impulse of the present invention is applied to the controllable commutation converter valve impulse test device in Embodiment 3. As Figure 6 shown, the method includes:

[0163] Step 201: Set the states of a first fast mechanical switch K1 and a second fast mechanical switch K2 to the initial state, and the power frequency test transformer S charges the drive board in the test valve V of the controllable commutation converter valve to be tested;

[0164] Step 202: Change the states of the first fast mechanical switch K1 and the second fast mechanical switch K2, and the test valve V of the controllable commutation converter valve to be tested enters the natural discharge state;

[0165] Step 203: Change the states of the first fast mechanical switch K1 and the second fast mechanical switch K2 again, and the impulse generating device D generates an impulse voltage applied to the test valve V of the controllable commutation converter valve to be tested;

[0166] Step 204: Restore the states of the first fast mechanical switch K1 and the second fast mechanical switch K2 to the initial state;

[0167] The initial state is the open / closed state of the first fast mechanical switch K1 and the second fast mechanical switch K2.

[0168] Further, Step 201 includes:

[0169] When the first fast mechanical switch K1 is connected in parallel with the impulse generating device D, the first fast mechanical switch K1 is closed, the second fast mechanical switch K2 is open, and the power frequency test transformer S charges the drive board in the test valve V of the controllable commutation converter valve to be tested.

[0170] Further, Step 202 includes:

[0171] When the first fast mechanical switch K1 is connected in parallel with the impulse generating device D, the first fast mechanical switch K1 is opened, and after a fourth preset time, the second fast mechanical switch K2 is closed, and the test valve V of the controllable commutation converter valve to be tested enters the natural discharge state, and the impulse generating device D does not participate in the operation.

[0172] Specifically, the fourth preset time is greater than the operation time for opening the first fast mechanical switch K1.

[0173] Further, Step 203 includes:

[0174] When the first fast mechanical switch K1 is connected in parallel with the impulse generating device D, when the time for the test valve V of the controllable commutation converter valve under test to enter the natural discharge state reaches the fifth preset time, the first fast mechanical switch K1 remains open, the second fast mechanical switch K2 remains closed, and the impulse generating device D applies an impulse voltage to the test valve V of the controllable commutation converter valve under test. When the impulse voltage reaches the preset voltage peak value, the thyristors and IGBT components in the main branch of the test valve V of the controllable commutation converter valve under test are triggered, and the energy on the second capacitor C2 is converted into current for the test valve V of the controllable commutation converter valve under test.

[0175] It can be understood that the preset voltage peak value is the maximum voltage value that the test valve V of the controllable commutation converter valve under test can accept, that is, when exceeding the peak value, it may cause damage to the test valve V of the controllable commutation converter valve under test.

[0176] Further, the impulse generating device D applying an impulse voltage to the test valve V of the controllable commutation converter valve under test includes:

[0177] Adjusting the wavefront resistor R2, the wave tail resistor R1, and the wave adjusting inductor L so that the impulse generating device D generates an impulse voltage applied to the test valve V of the controllable commutation converter valve under test and applies the impulse voltage to the test valve V of the controllable commutation converter valve under test.

[0178] Specifically, the fifth preset time is greater than the time required for the board voltages of all thyristors and IGBT components in the test valve V of the controllable commutation converter valve under test to drop to the fourth preset voltage range, and less than the power-off maintenance time of the boards of all thyristors and IGBT components in the test valve V of the controllable commutation converter valve under test.

[0179] It should be noted that the embodiments of the present invention do not limit the "time required for the board voltages of all thyristors and IGBT components in the test valve V of the controllable commutation converter valve under test to drop to the fourth preset voltage range", the "fourth preset voltage range", and the "power-off maintenance time". In some embodiments, those skilled in the art can set them according to engineering requirements or experimental data, etc.

[0180] Further, step 204 includes:

[0181] When the first fast mechanical switch K1 is connected in parallel with the impulse generating device D, after the time for the impulse generating device D to apply an impulse voltage to the test valve V of the controllable commutation and conversion valve under test reaches the sixth preset time, the impulse generating device D stops applying the impulse voltage. Until the impulse voltage drops to the third preset voltage range, the IGBT element in the main branch of the test valve V of the controllable commutation and conversion valve under test is turned off, and the first fast mechanical switch K1 is closed, and the second fast mechanical switch K2 is opened. The power frequency test transformer S charges the drive board in the test valve V of the controllable commutation and conversion valve under test again, and the impulse test of the test valve V of the controllable commutation and conversion valve under test ends.

[0182] It should be noted that the embodiments of the present invention do not limit the "fourth preset time", "fifth preset time", "sixth preset time", "preset voltage peak value" and "third preset voltage range". In some embodiments, those skilled in the art can set them according to engineering needs or experimental data, etc.

[0183] An impulse test method for a controllable commutation and conversion valve provided by the present invention controls the input and output of the power frequency test transformer S and the impulse generating device D by using the first fast mechanical switch K1 and the second fast mechanical switch K2 to ensure reliable energy acquisition of the IGBT drive board in the test valve V of the controllable commutation and conversion valve under test, and at the same time avoid the risk of damage to the current-carrying components due to excessive voltage; it also realizes the simultaneous energy acquisition of the IGBT sub-valve and the thyristor sub-valve board card during the test, and the electrical isolation between the power frequency test transformer S and the impulse generating device D, ensuring the safe and reliable development of the impulse test of the controllable commutation and conversion valve.

[0184] To further illustrate the above-mentioned impulse test method for a controllable commutation and conversion valve, the present invention provides a specific example, such as Figure 7 shown, where 0 represents the switch is off and 1 represents the switch is on. K1 is Figure 5 the schematic diagram of the switch state of the first fast mechanical switch K1 in Figure 5 , K2 is Figure 5 the schematic diagram of the switch state of the second fast mechanical switch K2 in

[0185] In the initial stage of the test, that is, Figure 7 in stage ①, at this time the first fast mechanical switch K1 is in the closed state and the second fast mechanical switch K2 is in the open state. The power frequency test transformer S forms a loop with the test valve V of the controllable commutation and conversion valve under test, and the drive board in the test valve V of the controllable commutation and conversion valve under test is charged by the power frequency test transformer S. The effective value of the voltage of the power frequency test transformer S should be able to satisfy the normal energy acquisition of all thyristor / IGBT element board cards of the main and auxiliary branches of the test valve V of the controllable commutation and conversion valve under test;

[0186] The next stage, that isFigure 7 In the second middle stage, the first fast mechanical switch K1 is disconnected at this time, and the duration Δt 1 (i.e., the fourth preset time) needs to be greater than the operating time of the first fast mechanical switch K1 to ensure reliable disconnection of the switch. Subsequently, keep the state of the first fast mechanical switch K1 unchanged, close the second fast mechanical switch K2, bypass the power frequency test transformer S, ensure that the impulse generating device D and the test valve V of the controllable phase-shifting converter valve to be measured form a stable and reliable electrical circuit, and form a reliable electrical isolation from the power frequency test transformer S. At this time, the power frequency test transformer S no longer charges the boards in the test valve V of the controllable phase-shifting converter valve to be measured, and the test valve V of the controllable phase-shifting converter valve to be measured enters the natural discharge state. The duration Δt 2 (i.e., the fifth preset time) needs to ensure that the board voltages of all thyristor / IGBT components in the main and auxiliary branches of the test valve V of the controllable phase-shifting converter valve to be measured drop to the safe range (i.e., the fourth preset voltage range), ensure that the voltage will not be too high to cause component damage when the subsequent superimposed impulse voltage is applied, and shall not be greater than the power-off maintenance time of the thyristor / IGBT component boards in the test valve V of the controllable phase-shifting converter valve to be measured, to prevent the FOP function from failing after the board loses power. The impulse generating device D does not participate in the work in this stage.

[0187] The next stage, namely Figure 7 In the third middle stage, the on / off states of the first fast mechanical switch K1 and the second fast mechanical switch K2 remain unchanged. The wavefront resistance R2, the wave tail resistance R1 and the wave-shaping inductor L of the impulse generating device D are adjusted respectively to make the impulse generating device D generate an impulse voltage applied to the test valve V of the controllable phase-shifting converter valve to be measured. When the impulse voltage reaches the preset voltage peak value, trigger the thyristors and IGBT components in the main branch of the test valve V of the controllable phase-shifting converter valve to be measured. The energy on the second capacitor C2 is converted into current to the test valve V of the controllable phase-shifting converter valve to be measured, and the impulse test of the test valve V of the controllable phase-shifting converter valve to be measured is completed. The duration Δt 3 (i.e., the sixth preset time) is the duration of the impulse voltage and can be adjusted according to the type of the applied impulse voltage.

[0188] The next stage, namely Figure 7 In the fourth middle stage, after confirming that the states of the test equipment and the test valve are normal (i.e., after applying the impulse voltage, the components in the test valve V of the controllable phase-shifting converter valve to be measured are not damaged, etc.), this stage needs to adjust the test device to the initial state, that is, close the first fast mechanical switch K1, disconnect the second fast mechanical switch K2, and the power frequency test transformer S continues to charge the test valve V of the controllable phase-shifting converter valve to be measured to prepare for the subsequent impulse test.

[0189] A method for impulse test of a controllable commutation converter valve provided by the present invention can achieve stable energy extraction of a board card under the condition of uneven voltage division of thyristor sub-valves and IGBT sub-valves in the controllable commutation converter valve, and ensure the normal operation of functions such as FOP triggering and status reporting;

[0190] A method for impulse test of a controllable commutation converter valve provided by the present invention isolates the power frequency test transformer S required for the impulse test from the impulse generating device D by using a fast mechanical switch. The test valve will not be damaged due to excessive superimposed voltage, and at the same time, the power frequency test transformer S will not be affected by the impulse voltage, ensuring the safety of the test device and the test valve;

[0191] A method for impulse test of a controllable commutation converter valve provided by the present invention can be applied to all single-valve impulse voltage tests such as single-valve operation impulse test, single-valve lightning impulse test, single-valve steep wave impulse test, and single-valve potential distribution test of the controllable commutation converter valve, with a wide range of applications;

[0192] A method for impulse test of a controllable commutation converter valve provided by the present invention can change the output voltages of the power frequency test transformer S and the impulse generating device D according to test requirements, and can be applicable to impulse tests of controllable commutation converter valves with different voltage and current levels.

[0193] It can be understood that the same or similar parts in the above embodiments can be referred to each other, and the content not detailed in some embodiments can be seen in the same or similar content of other embodiments.

[0194] Embodiment Five

[0195] Based on the same inventive concept, the present invention further provides a computer device, which includes a processor and a memory. The memory is used to store a computer program, and the computer program includes program instructions. The processor is used to execute the program instructions stored in the computer storage medium. The processor may be a Central Processing Unit (CPU), or may also be other general-purpose processors, Digital Signal Processors (DSPs), Application Specific Integrated Circuits (ASICs), Field-Programmable Gate Arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. It is the computing core and control core of the terminal, and is suitable for implementing one or more instructions. Specifically, it is suitable for loading and executing one or more instructions in the computer storage medium to implement the corresponding method flow or corresponding function, so as to implement the steps of a controllable commutation valve impulse test method in the above embodiments.

[0196] Embodiment Six

[0197] Based on the same inventive concept, the present invention further provides a storage medium, specifically a computer-readable storage medium (Memory). The computer-readable storage medium is a memory device in a computer device and is used to store programs and data. It can be understood that the computer-readable storage medium here can include both the built-in storage medium in the computer device and, of course, the extended storage medium supported by the computer device. The computer-readable storage medium provides a storage space, and this storage space stores the operating system of the terminal. And, one or more instructions suitable for being loaded and executed by the processor are also stored in this storage space. These instructions can be one or more computer programs (including program codes). It should be noted that the computer-readable storage medium here can be a high-speed RAM memory or a non-volatile memory, such as at least one disk memory. The one or more instructions stored in the computer-readable storage medium can be loaded and executed by the processor to implement the steps of a controllable commutation valve impulse test method in the above embodiments.

[0198] Those skilled in the art should understand that the embodiments of the present invention can be provided as a method, a system, or a computer program product. Therefore, the present invention can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Moreover, the present invention can take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk memory, CD-ROM, optical memory, etc.) that contain computer-usable program code.

[0199] The present invention is described with reference to the flowcharts and / or block diagrams of methods, apparatuses (systems), and computer program products according to embodiments of the present invention. It should be understood that each flow and / or block in the flowchart and / or block diagram, as well as the combination of flows and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to the processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing devices to generate a machine, such that the instructions executed by the processor of the computer or other programmable data processing devices generate means for implementing the functions specified in Figure 1 one flow or multiple flows and / or blocks Figure 1 one block or multiple blocks.

[0200] These computer program instructions can also be stored in a computer-readable memory that can direct a computer or other programmable data processing devices to work in a specific manner, such that the instructions stored in the computer-readable memory generate a manufactured article including instruction means that implement the functions specified in Figure 1 one flow or multiple flows and / or blocks Figure 1 one block or multiple blocks.

[0201] These computer program instructions can also be loaded onto a computer or other programmable data processing devices, such that a series of operation steps are executed on the computer or other programmable devices to generate a computer-implemented process, and thus the instructions executed on the computer or other programmable devices provide steps for implementing the functions specified in Figure 1 one flow or multiple flows and / or blocks Figure 1 one block or multiple blocks.

[0202] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit them. Although the present invention has been described in detail with reference to the above embodiments, those of ordinary skill in the art should understand that: still can modify the specific implementation manners of the present invention or make equivalent replacements, and any modification or equivalent replacement that does not depart from the spirit and scope of the present invention should be covered by the protection scope of the claims of the present invention.

Claims

1. A controllable commutation converter valve impulse test device, characterized in that, the device includes: an impulse generating device, a first fast mechanical switch, a second fast mechanical switch and a power frequency test transformer; the impulse generating device and the power frequency test transformer are connected in parallel, and the controllable commutation converter valve test valve to be measured is connected between the impulse generating device and the power frequency test transformer; the first fast mechanical switch is connected to the impulse generating device and is used to control the input and output of the impulse generating device; the second fast mechanical switch is connected to the power frequency test transformer and is used to control the input and output of the power frequency test transformer; the impulse generating device is used to generate an impulse voltage applied to the controllable commutation converter valve test valve to be measured; the power frequency test transformer is used to charge the drive board in the controllable commutation converter valve test valve to be measured.

2. The device according to claim 1, characterized in that, one end of the first fast mechanical switch is connected to one end of the impulse generating device, and the other end is connected to the anode of the controllable commutation converter valve test valve to be measured; one end of the second fast mechanical switch is connected to the anode of the controllable commutation converter valve test valve to be measured, and the other end is connected to one end of the power frequency test transformer; the other end of the power frequency test transformer is grounded.

3. The device according to claim 1, characterized in that, the first fast mechanical switch is connected in parallel with the impulse generating device; one end of the first fast mechanical switch is connected to the anode of the controllable commutation converter valve test valve to be measured, and the other end is connected to one end of the second fast switch; the second fast mechanical switch is connected in parallel with the power frequency test transformer; the other end of the second fast mechanical switch is connected to the cathode of the controllable commutation converter valve test valve to be measured; the connection point between the other end of the first fast mechanical switch and one end of the second fast switch is grounded.

4. The device according to claim 1, characterized in that, the controllable commutation converter valve impulse test device further includes: a wave adjusting inductor; the wave adjusting inductor is connected between the first fast mechanical switch and the impulse generating device.

5. The device according to claim 4, characterized in that, the controllable commutation converter valve impulse test device further includes: a current limiting resistor and a second capacitor; one end of the current limiting resistor is connected between the wave adjusting inductor and the first fast mechanical switch, and the other end is connected to one end of the second capacitor; the other end of the second capacitor is connected to the impulse device; the other end of the second capacitor is grounded.

6. The device according to claim 5, characterized in that, the impulse generating device includes: a wave tail resistor, a wave head resistor, a first capacitor and an isolation sphere gap; one end of the wave head resistor is connected to the isolation sphere gap, and the other end is connected to the wave adjusting inductor; the first capacitor and the wave tail resistor are connected in parallel at both ends of the isolation sphere gap; the connection point between the first capacitor and the wave tail resistor is connected to the other end of the second capacitor.

7. The device according to claim 1, characterized in that, The test valve of the controllable phase - shifted converter valve to be measured includes: a main branch and an auxiliary branch connected in parallel; the main branch includes: a first saturable reactor, a first thyristor, and a first IGBT element connected in sequence; the auxiliary branch includes: a second saturable reactor, a second thyristor, and a second IGBT element connected in sequence; The first saturable reactor is connected to the second saturable reactor, and one end where the first saturable reactor and the second saturable reactor are interconnected forms the anode of the test valve of the controllable phase - shifted converter valve to be measured; The first IGBT element is connected to the second IGBT element, and one end where the first IGBT element and the second IGBT element are interconnected forms the cathode of the test valve of the controllable phase - shifted converter valve to be measured.

8. A method for the impulse test of a controllable phase - shifted converter valve, which is applied to the controllable phase - shifted converter valve impulse test device according to any one of claims 1 - 7, characterized in that, the method includes: Setting the states of the first fast mechanical switch and the second fast mechanical switch to the initial state, and the power - frequency test transformer charges the drive board in the test valve of the controllable phase - shifted converter valve to be measured; Changing the states of the first fast mechanical switch and the second fast mechanical switch, and the test valve of the controllable phase - shifted converter valve to be measured enters the natural discharge state; Changing the states of the first fast mechanical switch and the second fast mechanical switch again, and the impulse generating device generates an impulse voltage applied to the test valve of the controllable phase - shifted converter valve to be measured; Restoring the states of the first fast mechanical switch and the second fast mechanical switch to the initial state; The initial state is the open / closed state of the first fast mechanical switch and the second fast mechanical switch.

9. According to the method of claim 8, characterized in that, The setting the states of the first fast mechanical switch and the second fast mechanical switch to the initial state, and the power - frequency test transformer charges the drive board in the test valve of the controllable phase - shifted converter valve to be measured includes: When one end of the first fast mechanical switch is connected to one end of the impulse generating device and the other end is connected to the anode of the test valve of the controllable phase - shifted converter valve to be measured, the first fast mechanical switch is opened and the second fast mechanical switch is closed, so that the power - frequency test transformer charges the drive board in the test valve of the controllable phase - shifted converter valve to be measured.

10. According to the method of claim 8, characterized in that, The changing the states of the first fast mechanical switch and the second fast mechanical switch, and the test valve of the controllable phase - shifted converter valve to be measured enters the natural discharge state includes: When one end of the first fast mechanical switch is connected to one end of the impulse generating device and the other end is connected to the anode of the test valve of the controllable phase - shifted converter valve to be measured, the first fast mechanical switch remains open and the second fast mechanical switch is opened, so that the test valve of the controllable phase - shifted converter valve to be measured enters the natural discharge state and the impulse generating device does not participate in the operation.

11. According to the method of claim 8, characterized in that, Said changing the states of the first fast mechanical switch and the second fast mechanical switch again, the impulse generating device generates an impulse voltage applied to the thyristor valve under test of the controllable commutation and commutation valve, including: When one end of the first fast mechanical switch is connected to one end of the impulse generating device and the other end is connected to the anode of the thyristor valve under test of the controllable commutation and commutation valve, when the time for the thyristor valve under test of the controllable commutation and commutation valve to enter the natural discharge state reaches a first preset time, the first fast mechanical switch closes, the second fast mechanical switch remains open, and after a second preset time, the impulse generating device applies an impulse voltage to the thyristor valve under test of the controllable commutation and commutation valve. When the impulse voltage reaches a preset voltage peak value, the thyristors and IGBT components in the main branch of the thyristor valve under test are triggered, and the energy on the second capacitor is converted into current for the thyristor valve under test of the controllable commutation and commutation valve.

12. The method according to claim 11, characterized in that, the first preset time is greater than the time required for the board voltages of all thyristors and IGBT components in the thyristor valve under test of the controllable commutation and commutation valve to drop to a second preset voltage range, and less than the power-off maintenance time of the boards of all thyristors and IGBT components in the thyristor valve under test of the controllable commutation and commutation valve; the second preset time is greater than the operation time for the first fast mechanical switch to open.

13. The method according to claim 8, characterized in that, restoring the states of the first fast mechanical switch and the second fast mechanical switch to the initial states includes: When one end of the first fast mechanical switch is connected to one end of the impulse generating device and the other end is connected to the anode of the thyristor valve under test of the controllable commutation and commutation valve, after the time for the impulse generating device to apply an impulse voltage to the thyristor valve under test of the controllable commutation and commutation valve reaches a third preset time, the impulse generating device stops applying the impulse voltage. Until the impulse voltage drops to a first preset voltage range, the IGBT components in the main branch of the thyristor valve under test of the controllable commutation and commutation valve are turned off, and the first fast mechanical switch opens, the second fast mechanical switch closes, and the power frequency test transformer charges the drive board in the thyristor valve under test of the controllable commutation and commutation valve again, and the impulse test of the thyristor valve under test of the controllable commutation and commutation valve ends.

14. The method according to claim 8, characterized in that, setting the states of the first fast mechanical switch and the second fast mechanical switch to the initial states so that the power frequency test transformer charges the drive board in the thyristor valve under test of the controllable commutation and commutation valve includes: When the first fast mechanical switch is connected in parallel with the impulse generating device, the first fast mechanical switch closes, the second fast mechanical switch opens, and the power frequency test transformer charges the drive board in the thyristor valve under test of the controllable commutation and commutation valve.

15. The method according to claim 8, characterized in that, Changing the states of the first fast mechanical switch and the second fast mechanical switch, and the tested controllable commutation valve sample valve enters the natural discharge state, including: When the first fast mechanical switch is connected in parallel with the impulse generating device, the first fast mechanical switch is opened, and after a fourth preset time, the second fast mechanical switch is closed, and the tested controllable commutation valve sample valve enters the natural discharge state, and the impulse generating device does not participate in the operation.

16. The method according to claim 15, wherein, the fourth preset time is greater than the operation time for the first fast mechanical switch to open.

17. The method according to claim 8, wherein, changing the states of the first fast mechanical switch and the second fast mechanical switch again, and the impulse generating device generates an impulse voltage applied to the tested controllable commutation valve sample valve, including: When the first fast mechanical switch is connected in parallel with the impulse generating device, when the time for the tested controllable commutation valve sample valve to enter the natural discharge state reaches a fifth preset time, the first fast mechanical switch remains open, the second fast mechanical switch remains closed, the impulse generating device applies an impulse voltage to the tested controllable commutation valve sample valve, and when the impulse voltage reaches the preset voltage peak value, the thyristor and IGBT components in the main branch of the tested controllable commutation valve sample valve are triggered, and the energy on the second capacitor is converted into current for the tested controllable commutation valve sample valve.

18. The method according to claim 17, wherein, the fifth preset time is greater than the time required for the board voltages of all thyristors and IGBT components in the tested controllable commutation valve sample valve to drop to the fourth preset voltage range, and less than the power-off maintenance time of the boards of all thyristors and IGBT components in the tested controllable commutation valve sample valve.

19. The method according to claim 8, wherein, restoring the states of the first fast mechanical switch and the second fast mechanical switch to the initial states, including: When the first fast mechanical switch is connected in parallel with the impulse generating device, after the time for the impulse generating device to apply an impulse voltage to the tested controllable commutation valve sample valve reaches a sixth preset time, the impulse generating device stops applying the impulse voltage. Until the impulse voltage drops to the third preset voltage range, the IGBT components in the main branch of the tested controllable commutation valve sample valve are turned off, and the first fast mechanical switch is closed, the second fast mechanical switch is opened, and the power frequency test transformer charges the drive board in the tested controllable commutation valve sample valve again, and the impulse test of the tested controllable commutation valve sample valve ends.

20. The method according to claim 11 or 17, wherein, the impulse generating device applies an impulse voltage to the tested controllable commutation valve sample valve, including: Adjust the wavefront resistance, wave tail resistance and wave adjusting inductor so that the impulse generating device generates an impulse voltage applied to the test valve of the controllable commutation converter valve to be tested, and apply the impulse voltage to the test valve of the controllable commutation converter valve to be tested.

21. A computer device, characterized in that, comprising: one or more processors; the processor is used for storing one or more programs; when the one or more programs are executed by the one or more processors, the impulse test method for the controllable commutation converter valve according to any one of claims 8 to 20 is implemented.

22. A computer-readable storage medium, characterized in that, a computer program is stored thereon, and when the computer program is executed, the impulse test method for the controllable commutation converter valve according to any one of claims 8 to 20 is implemented.

Images