Production line scheduling method and device, electronic equipment and computer readable storage medium
By adding the test end of the second test station to the functional test of the first test station on the electronic product production line, the problem of unbalanced testing time of the test station on the production line is solved and the overall testing efficiency is improved.
Patent Information
- Application Number
- CN202311589458.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2023-11-24
- Publication Date
- 2025-05-27
AI Technical Summary
On the electronic product production line, due to the differences in different functions, the time spent on multiple consecutive different test stations on the same production line varies greatly when testing the same type of electronic product, and the test time balance of each test station is poor, resulting in the overall inefficiency of testing.
When the number of products to be tested on the first test station is greater than or equal to the threshold, based on the original test end of the first test station, the test end of the second test station is also added to the functional test of the products to be tested on the first test station to balance the test time of each test station.
By adding the test end of the second test station to the functional test of the first test station, the test time of each test station on the same production line can be effectively balanced and the overall testing efficiency can be improved.
Smart Images
Figure CN120044889A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of production line scheduling, and in particular, to a production line scheduling method, device, electronic device, and computer-readable storage medium. Background Art
[0002] A production line refers to the route through which the product production process passes, that is, starting from the raw materials entering the production site, passing through a series of production activities such as processing, transportation, assembly, and inspection.
[0003] Taking the production line of electronic products as an example, before the electronic products leave the factory, they need to be functionally tested on the production line. Since electronic products often have multiple functions to be tested, in order to ensure that all functions of the electronic products are accurately tested, different test stations need to be divided according to different functions to be tested of the electronic products. Then, different test stations on the same production line have different test objectives. The test objective is to test the target function to be tested of the same type of electronic products. Usually, at least one test device is allocated to each test station to test the functions of the electronic products. However, due to the differences in different functions of the electronic products, when testing the same type of electronic products (such as mobile phones) at multiple consecutive different test stations on the same production line, the time consumed varies greatly, and the test time balance of each test station is poor, resulting in low overall test efficiency. Summary of the Invention
[0004] In view of the above technical problems, this application provides a production line scheduling method, device, electronic device, and computer-readable storage medium. The technical solutions are as follows:
[0005] According to the first aspect of this application, a production line scheduling method is provided. The method includes:
[0006] If it is detected that the quantity of the first product to be tested is greater than or equal to the first threshold, at least one second test end is determined based at least on the first product to be tested. The quantity of the first product to be tested is the current quantity of the products to be tested at the first test station. Each test station is allocated at least one test device, and each test device integrates at least one test end. The second test end is integrated on the test device of the second test station. The first test station and the second test station belong to the same production line;
[0007] The determined second test end and the first test end are called to perform functional testing on the first product to be tested. The first test end is integrated on the test device of the first test station.
[0008] According to the second aspect of this application, a production line scheduling device is provided. The device includes:
[0009] A determination unit, configured to determine at least one second test end based at least on the first product to be tested if the quantity of the first product to be tested is greater than or equal to a first threshold, where the quantity of the first product to be tested is the current quantity of products to be tested at a first test station, and each test station is at least allocated with one test device, and each test device is at least integrated with one test end, and the second test end is integrated on the test device at a second test station, and the first test station and the second test station belong to the same production line;
[0010] A test unit, configured to call the determined second test end and the first test end to perform a function test on the first product to be tested, where the first test end is integrated on the test device at the first test station.
[0011] According to a third aspect of the present application, there is provided an electronic device, which includes:
[0012] A processor;
[0013] A memory for storing instructions executable by the processor;
[0014] Wherein, the processor is configured to implement the method described in the first aspect.
[0015] According to a fourth aspect of the present application, there is provided a production line scheduling system, which includes: a plurality of test devices allocated at different test stations, and the electronic device described in the third aspect; wherein, each test station is at least allocated with one test device, and each test device is at least integrated with one test end;
[0016] The plurality of test devices allocated at different test stations are configured to control the test ends to perform a function test on the product to be tested in response to the scheduling instruction of the electronic device.
[0017] According to a fifth aspect of the present application, there is provided a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the steps in the method described in the first aspect are implemented.
[0018] The technical solution provided by the present application is directed to multiple test stations for testing different functions of the same type of products on the same production line. When the quantity of products to be tested at the first test station is greater than or equal to the threshold, on the basis of the original test ends at the first test station, the test ends at the second test station are also added to perform a function test on the products to be tested at the first test station, which can balance the test time of each test station on the same production line and improve the overall test efficiency.
[0019] It should be understood that the above general description and the following detailed description are only exemplary and explanatory, and do not limit this application. Brief Description of the Drawings
[0020] In order to more clearly illustrate the technical solutions in the embodiments of this application or in the related art, the following will briefly introduce the drawings required for use in the description of the embodiments or the related art. Obviously, the drawings in the following description are only some embodiments recorded in this application. For those of ordinary skill in the art, other drawings can also be obtained based on these drawings.
[0021] Figure 1 is a schematic diagram of a production line scenario in the related art;
[0022] Figure 2 is a schematic diagram of the structure of a testing device in the related art;
[0023] Figure 3 is a schematic flowchart of a production line scheduling method according to an embodiment of this application;
[0024] Figure 4 is a schematic diagram of a production line scheduling scenario according to an embodiment of this application;
[0025] Figure 5 is a schematic diagram of the structure of a production line scheduling device according to an embodiment of this application;
[0026] Figure 6 is a schematic diagram of the structure of an electronic device according to an embodiment of this application;
[0027] Figure 7 is a schematic diagram of the structure of a production line scheduling system according to an embodiment of this application. Detailed Embodiments
[0028] In order to enable those skilled in the art to better understand the technical solutions in this application, the following will describe the technical solutions in the embodiments of this application in detail with reference to the drawings in the embodiments of this application. Obviously, the described embodiments are only some embodiments of this application, rather than all embodiments. Based on the embodiments in this application, all other embodiments obtained by those of ordinary skill in the art shall fall within the scope of protection of this application.
[0029] A production line refers to the route through which the product production process passes, that is, the route formed by a series of production activities such as raw material entry into the production site, processing, transportation, assembly, and inspection.
[0030] Taking the production line of electronic products as an example, before the electronic products leave the factory, they need to be tested for their functions on the production line. Since there are often multiple functions to be tested for electronic products, in order to ensure that all functions of the electronic products are accurately tested, different test stations need to be divided according to different functions to be tested of the electronic products. Then, different test stations on the same production line have different test objectives. The test objective is to test the target function to be tested of the same type of electronic products. Usually, at least one test device is allocated to a test station to test the functions of the electronic products. However, due to the differences in different functions of the electronic products, when multiple consecutive different test stations on the same production line test the same type of electronic products (such as mobile phones), the time consumed varies greatly, and the test time balance of each test station is poor, resulting in low overall test efficiency.
[0031] Please refer to Figure 1-2 , and an exemplary introduction to a production line scenario and the structure of test equipment in the related technology will be given below:
[0032] In a general production line (such as Figure 1 production line A in Figure 1 ), there may be multiple branches. When testing the functions of the same type of products to be tested (such as Figure 1 product to be tested B in Figure 1On the shown production line A, when the test stations 1, 2, and 3, as consecutive test stations, conduct functional tests on mobile phones, the time consumed varies greatly. For example, when the test station 1 tests the sliding unlock function of a mobile phone, the data consumed is only 5 seconds, while when the test station 2 tests the camera function of a mobile phone, the data consumed is 30 seconds. Therefore, the test time balance of each test station is poor, which may cause a large accumulation of products to be tested completed at one test station at another test station, resulting in low overall test efficiency.
[0033] Please refer to Figure 2 , the test end refers to the device for final inspection of the product to be tested on the production line. At least one test end can be integrated into one test device. When one test device integrates multiple test ends, for example Figure 2 Taking the test device 101 as an example in, the test device 101 can integrate test ends 1011, 1012, and 1013. Multiple test ends can conduct parallel tests on the same function of the product to be tested B. For example, the test ends 1011, 1012, and 1013 can all test the sliding unlock function of the mobile phone.
[0034] It can be understood that for multiple test ends integrated into the same test device, the multiple test ends can be arranged vertically or horizontally relative to the ground, and no specific limitation is made on this.
[0035] It is worth noting that the above introduction to the production line scenario and the structure of the test device with the mobile phone as the product to be tested is only an exemplary display. In actual applications, there may be other application scenarios and structures. Therefore, no specific limitation is made on the production line scenario and the structure of the test device.
[0036] To address the above problems, the present application provides a production line scheduling method, which can balance the test time of each test station on the same production line and improve the overall test efficiency. As Figure 3 shown, the method includes the following steps:
[0037] S301. If it is detected that the quantity of the first product to be tested is greater than or equal to the first threshold, at least one second test end is determined based on at least the first product to be tested. The quantity of the first product to be tested is the current quantity of the product to be tested under the first test station. Each test station is at least allocated one test device, and each test device at least integrates one test end. The second test end is integrated into the test device of the second test station. The first test station and the second test station belong to the same production line;
[0038] As an example, the first product to be tested can be various electronic products, such as mobile phones, tablet computers, etc., or other products, and specific limitations are not made in this regard.
[0039] It can be understood that the current product to be tested at the first test station can be the product to be tested that is currently stacked in front of the first test station and waiting to enter the first test station for testing.
[0040] As an example, when multiple test devices are allocated to a test station, the multiple test devices can perform parallel tests on products to be tested of the same type.
[0041] As an example, when a test device integrates multiple test ends, the multiple test ends can test the same function of products to be tested of the same type.
[0042] As an example, when multiple test devices are allocated to the second test station and the number of the second test ends is multiple, the multiple second test ends can be the test ends integrated on the same test device or the test ends respectively integrated on different test devices, and specific limitations are not made in this regard.
[0043] It can be understood that the first test station and the second test station can be test stations with different test objectives on the same production line.
[0044] As an example, before determining at least one second test end based on at least the first product to be tested and before detecting the quantity of the first product to be tested, the historical test yield of the first test station and the historical detection frequency in the same time period as the historical test yield can also be obtained first. The historical detection frequency represents the frequency of detecting the quantity of products to be tested at the first test station in history; based on the corresponding relationship between the obtained historical test yield and the historical detection frequency, the current detection frequency is determined, and the quantity of the first product to be tested, that is, the current product to be tested at the first test station, is detected according to the determined current detection frequency. The historical test yield is greater than or equal to a second threshold, and the historical detection frequency is less than or equal to a third threshold. Through historical data, that is, the corresponding relationship between the historical test yield greater than or equal to the second threshold and the historical detection frequency less than or equal to the third threshold, the frequency of detecting the quantity of the current product to be tested at the first test station, that is, the frequency of production line scheduling, is determined, so as to ensure low frequency and high yield as much as possible during production line scheduling, reduce the computing power burden and ensure the test effect at the same time.
[0045] As an example, the definition of the above test yield can refer to the proportion of qualified products among the products that have been tested at a certain test station. The above test yield can also have other definitions, and specific limitations are not made in this regard.
[0046] As an example, the process of determining the current detection frequency described above can be implemented by a neural network algorithm or a dynamic programming algorithm, or can be implemented by other algorithms, and specific limitations are not imposed thereon.
[0047] There are various ways to determine at least one second test end based on at least the first product to be tested. As an example, one way may include: determining the target number of the second test ends based on the quantity of the first product to be tested, that is, the current quantity of the products to be tested at the first test station. It is possible to determine how many second test ends on the second test stations need to be scheduled according to the quantity of the products to be tested currently stacked at the first test station, ensuring the accuracy of scheduling.
[0048] As an example, another way to determine at least one second test end based on at least the first product to be tested may include: if it is detected that the quantity of the first product to be tested is greater than or equal to the first threshold, and the quantity of the second product to be tested, that is, the current quantity of the products to be tested at the second test station, is less than or equal to the fourth threshold, then determine at least one of the second test ends. For other test stations except the first test station on the same production line, only when the quantity of the products to be tested currently stacked at a certain test station is small, will this test station be used as the second test station, and the test end at this test station will be scheduled to the first test station to assist in the test, ensuring the efficient progress of the functional test at the first test station while minimizing the impact on the test process at other test stations as much as possible.
[0049] As an example, another way to determine at least one second test end based on at least the first product to be tested may include: determining the target number of the second test ends based on the quantity of the first product to be tested, that is, the current quantity of the products to be tested at the first test station, and the quantity of the second product to be tested, that is, the current quantity of the products to be tested at the second test station. Determine the optimal number of test ends to be scheduled according to the quantities of the products stacked at the first and second test stations, ensuring that the first test station receives sufficient support from the test ends at the second test station, and at the same time minimizing the impact on the product test at the second test station.
[0050] As an example, the distance between the second test station and the first test station may be less than or equal to a first preset distance. When determining the second test station, the principle of proximity can be followed to ensure that when taking out the products to be tested stacked at the first test station and placing them on the second test station to assist in the test, the taking and placing time is as short as possible.
[0051] For example, multiple test ends integrated in the same test device at the second test station can be arranged vertically with respect to the ground, and the distance between the determined second test end and the first test station can be less than or equal to the second preset distance. When multiple test ends are arranged vertically on the same test device, the distance differences between the first test station and the respective test ends integrated in the same test device at the second test station may be relatively large. Therefore, when determining the second test end at the second test station, the principle of proximity can also be followed to further reduce the product pick-and-place time.
[0052] For example, the process of determining at least one second test end can be implemented by a greedy algorithm or a genetic algorithm, or can be implemented by other algorithms, and specific limitations are not made in this regard.
[0053] It should be noted that the above introduction to the method of determining at least one second test end is only an exemplary display. In actual applications, other determination methods are not excluded, and specific limitations are not made on the method of determining at least one second test end.
[0054] S302. Invoke the determined second test end and the first test end to perform a functional test on the first product to be tested, where the first test end is integrated on the test device at the first test station.
[0055] The functional test of the first product to be tested can be performed in various ways. For example, one functional test method can include: updating the current test target of the determined second test end, and based on the second test end after the test target is updated and the first test end integrated on the test device at the first test station, performing a functional test on the first product to be tested, where the test target of the second test end after the update corresponds to the test target of the first test station. The test target of the same test end can be switched as needed, and the test targets of the test ends at each test station can be dynamically adjusted according to the quantity distribution of the products to be tested at each test station. When there is an excessive accumulation of products to be tested at a certain test station, the test ends at other test stations can join the test at this test station after switching the test target to digest the accumulated products to be tested at this test station.
[0056] It can be understood that the test target of the second test end before the update is different from the test target of the first test station.
[0057] As an example, it can be understood that the test target after the update of the second test end corresponds to the test target of the first test station above, which means that the test target after the update of the second test end is exactly the same as the test target of the first test station above, or, part of the test target after the update of the second test end is the same as the test target of the first test station above. There is no specific limitation on this.
[0058] It can be understood that the current test target of the test end under each test station can be updated as needed, that is, the current test target of the test end may or may not be the same as the test target of the test station to which the test end belongs. There is no specific limitation on this.
[0059] It can be understood that the current test target of the test end of the first test station above is the same as the test target of the first test station above.
[0060] Please refer to Figure 4 , and the following is an exemplary introduction to the production line scheduling scenario of an embodiment of the present application:
[0061] Such as Figure 4As shown in the figure, on a general production line (production line A), taking the product B to be tested as a mobile phone for example, the test device 101 is the test device assigned to test station 1, and the test device 201 is the test device assigned to test station 2. Assume that the test objective of test station 1 is to test the sliding unlock function of the mobile phone, and the test objective of test device 2 is to test the camera function of the mobile phone. Also assume that the current test objectives of each test end integrated in test device 101: test ends 1011, 1012, and 1013 are all to test the sliding unlock function of the mobile phone, and the current test objectives of each test end integrated in test device 201: test ends 2011, 2012, and 2013 are all to test the camera function of the mobile phone. If it is detected that the number of current products to be tested at test station 2, that is, the number of stacked mobile phones to be tested, is greater than or equal to the first threshold, then at least one second test end can be determined among the test devices at test station 1. For example, two second test ends: test ends 1011 and 1012 are determined in test device 101, and based on the determined second test ends (test ends 1011 and 1012) and the test ends at test station 2 (test ends 2011, 2012, and 2013), functional tests are performed on the current products to be tested at test station 2, that is, the stacked mobile phones to be tested. Specifically, the current test objectives (to test the sliding unlock function of the mobile phone) of the determined second test ends (test ends 1011 and 1012) can be updated, for example, updated to test the camera function of the mobile phone, and based on the second test ends (test ends 1011 and 1012) with updated test objectives and the test ends at test station 2 (test ends 2011, 2012, and 2013), functional tests are performed on the current products to be tested at test station 2, that is, the stacked mobile phones to be tested.
[0062] It should be noted that the above introduction to the production line scheduling scenario is only an exemplary display. In actual applications, other scheduling scenarios are not excluded, and specific details are not limited here.
[0063] The technical solution provided in the embodiment of the present application is directed to multiple test stations on the same production line for testing different functions of the same type of product. When the number of products to be tested at the first test station is greater than or equal to the threshold, on the basis of the original test ends at the first test station, the test ends at the second test station are also added to the functional test of the products to be tested at the first test station, which can balance the test time of each test station on the same production line and improve the overall test efficiency.
[0064] Corresponding to the above method embodiment, the embodiment of the present application also provides a production line scheduling device. See Figure 5As shown, the device may include:
[0065] A determination unit 501, configured to determine at least one second test end based on at least the first product to be tested if it is detected that the quantity of the first product to be tested is greater than or equal to a first threshold, where the quantity of the first product to be tested is the current quantity of products to be tested at a first test station, and each test station is at least allocated with one test device, and each test device is at least integrated with one test end, and the second test end is integrated on the test device at a second test station, and the first test station and the second test station belong to the same production line;
[0066] A test unit 502, configured to call the determined second test end and the first test end to perform a function test on the first product to be tested, where the first test end is integrated on the test device at the first test station.
[0067] As an example, the test unit 502 is specifically configured to update the current test target of the determined second test end, and perform a function test on the first product to be tested based on the second test end after the test target is updated and the test end at the first test station, where the test target of the second test end after the update corresponds to the test target at the first test station.
[0068] As an example, the determination unit 501 is further configured to obtain the historical test yield rate of the first test station and the historical detection frequency in the same time period as the historical test yield rate, where the historical detection frequency represents the frequency of detecting the quantity of products to be tested at the first test station in history; determine the current detection frequency based on the corresponding relationship between the historical test yield rate and the historical detection frequency, and detect the quantity of the first product to be tested according to the current detection frequency, where the historical test yield rate is greater than or equal to a second threshold, and the historical detection frequency is less than or equal to a third threshold.
[0069] As an example, the determination unit 501 is specifically configured to determine the target quantity of the second test end based on the quantity of the first product to be tested.
[0070] As an example, the determination unit 501 is specifically configured to determine at least one of the second test ends if it is detected that the quantity of the first product to be tested is greater than or equal to the first threshold and the quantity of the second product to be tested is less than or equal to a fourth threshold, where the quantity of the second product to be tested is the current quantity of products to be tested at the second test station.
[0071] As an example, the determination unit 501 is specifically configured to determine the target quantity of the second test end based on the quantity of the first product to be tested and the quantity of the second product to be tested.
[0072] As an example, the distance between the second test station and the first test station is less than or equal to a first preset distance.
[0073] As an example, a plurality of test ends integrated by the same test device at the second test station are arranged vertically with respect to the ground, and the distance between the second test end and the first test station is less than or equal to a second preset distance.
[0074] This application also provides an electronic device, such as Figure 6 shown, the electronic device includes:
[0075] a processor 601;
[0076] a memory 602 for storing instructions executable by the processor;
[0077] wherein, the processor 601 is configured to implement the production line scheduling method described in any of the above embodiments.
[0078] This application also provides a production line scheduling system, such as Figure 7 shown, the system includes: a plurality of test devices 701 allocated at different test stations, and the electronic device 702 described in the above embodiment; wherein, at least one test device 701 is allocated to each test station, and each test device 701 integrates at least one test end;
[0079] The plurality of test devices 701 allocated at different test stations are used to control the test end to perform a functional test on the product to be tested in response to the scheduling instruction of the electronic device 702.
[0080] This application also provides a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, it implements the production line scheduling method described in any of the above embodiments.
[0081] The above are only the specific embodiments of this application. It should be noted that for those of ordinary skill in the art, without departing from the principle of this application, several improvements and refinements can be made, and these improvements and refinements should also be regarded as the protection scope of this application.
Claims
1. A production line scheduling method, characterized in that, the method includes: If it is detected that the quantity of the first product to be tested is greater than or equal to the first threshold, at least one second test end is determined based at least on the first product to be tested, where the quantity of the first product to be tested is the current quantity of products to be tested at the first test station. Each test station is at least assigned one test device, and each test device is at least integrated with one test end. The second test end is integrated on the test device of the second test station, and the first test station and the second test station belong to the same production line; Call the determined second test end and the first test end to perform a functional test on the first product to be tested, where the first test end is integrated on the test device of the first test station.
2. The method according to claim 1, characterized in that, the calling the determined second test end and the first test end to perform a functional test on the first product to be tested includes: Updating the current test target of the determined second test end, and performing a functional test on the first product to be tested based on the second test end and the first test end after the test target is updated, where the updated test target of the second test end corresponds to the test target of the first test station.
3. The method according to claim 1, characterized in that, before at least determining at least one second test end based on the first product to be tested, the method further includes: Obtaining the historical test yield rate of the first test station and the historical detection frequency in the same period as the historical test yield rate, where the historical detection frequency represents the frequency of detecting the quantity of products to be tested at the first test station in history; Determining the current detection frequency based on the corresponding relationship between the historical test yield rate and the historical detection frequency, and detecting the quantity of the first product to be tested according to the current detection frequency, where the historical test yield rate is greater than or equal to the second threshold and the historical detection frequency is less than or equal to the third threshold.
4. The method according to claim 1, characterized in that, the at least determining at least one second test end based on the first product to be tested includes: Determining the target quantity of the second test end based on the quantity of the first product to be tested.
5. The method according to claim 1, characterized in that, the at least determining at least one second test end based on the first product to be tested includes: If it is detected that the quantity of the first product to be tested is greater than or equal to the first threshold and the quantity of the second product to be tested is less than or equal to the fourth threshold, determine at least one second test end, where the quantity of the second product to be tested is the current quantity of products to be tested at the second test station.
6. The method according to claim 5, characterized in that, the at least determining at least one second test end based on the first product to be tested includes: Determining the target quantity of the second test end based on the quantity of the first product to be tested and the quantity of the second product to be tested.
7. The method according to claim 5, characterized in that, The distance between the second test station and the first test station is less than or equal to a first preset distance.
8. The method according to claim 7, wherein, a plurality of test ends integrated by the same test device at the second test station are arranged vertically with respect to the ground, and the distance between the second test end and the first test station is less than or equal to a second preset distance.
9. A production line scheduling device, wherein, the device includes: a determination unit, configured to, if it is detected that the quantity of a first product to be tested is greater than or equal to a first threshold, determine at least one second test end based at least on the first product to be tested, where the quantity of the first product to be tested is the quantity of current products to be tested at the first test station, wherein at least one test device is allocated to each test station, and at least one test end is integrated by each test device, the second test end is integrated on the test device at the second test station, and the first test station and the second test station belong to the same production line; a test unit, configured to call the determined second test end and the first test end to perform a function test on the first product to be tested, where the first test end is integrated on the test device at the first test station.
10. An electronic device, wherein, it includes: a processor; a memory for storing instructions executable by the processor; wherein, the processor is configured to implement the method according to any one of claims 1 to 8.
11. A production line scheduling system, wherein, the system includes: a plurality of test devices allocated at different test stations, and the electronic device according to claim 10; wherein at least one test device is allocated to each test station, and at least one test end is integrated by each test device; the plurality of test devices allocated at different test stations are configured to control the test ends to perform a function test on the product to be tested in response to the scheduling instruction of the electronic device.
12. A computer-readable storage medium, on which a computer program is stored, wherein, when the computer program is executed by a processor, the steps in the method according to any one of claims 1 to 8 are implemented.