Photonic crystal flat plate-conjugated polymer sensing system

Abstract

The invention discloses a photonic crystal panel-conjugated polymer sensing system, which relates to the field of sensors, solves the problem of poor detection effect of the existing photonic crystal panel explosive detection method, and comprises an intensity data module, a signal processing module and a signal processing module, the wavelength data module is used for carrying out wavelength analysis on spectral reflected light of a target photonic crystal panel in a panel optical monitoring period under different types of spectral irradiation to obtain a spectral wavelength monitoring coefficient; and the explosive module is used for carrying out explosive detection on the target photonic crystal panel by analyzing the spectral intensity monitoring data and the spectral wavelength monitoring coefficient. According to the invention, the explosive detection accuracy of the photonic crystal panel is improved.

Description

Technical Field

[0001] The present invention belongs to the field of sensors and relates to data analysis technology, specifically a photonic crystal flat-conjugated polymer sensing system. Background Art

[0002] When the existing explosive detection methods detect explosives on the surface of a photonic crystal flat, the following specific defects exist:

[0003] 1. The existing explosive detection methods have insufficient detection sensitivity for low-concentration explosives and are difficult to effectively identify trace explosives;

[0004] 2. When the existing explosive detection methods detect explosives on the surface of a photonic crystal flat, there is a certain lag in the output of the detection results and it cannot meet the requirements of real-time detection.

[0005] Therefore, we propose a photonic crystal flat-conjugated polymer sensing system. Summary of the Invention

[0006] Aiming at the deficiencies of the existing technology, the purpose of the present invention is to provide a photonic crystal flat-conjugated polymer sensing system, and the present invention aims to improve the accuracy and scientificity of explosive detection on the surface of a photonic crystal flat.

[0007] To achieve the above purpose, the present invention adopts the following technical solution: A photonic crystal flat-conjugated polymer sensing system, comprising:

[0008] An intensity data module: used to obtain the target photonic crystal flat and the flat optical monitoring period, set several different types of irradiation spectra, perform intensity analysis on the spectral reflected light of the target photonic crystal flat in the flat optical monitoring period under different types of spectral irradiations, and obtain a spectral intensity monitoring coefficient according to the analysis results to obtain spectral intensity monitoring data;

[0009] A wavelength data module: used to perform wavelength analysis on the spectral reflected light of the target photonic crystal flat in the flat optical monitoring period under different types of spectral irradiations to obtain a spectral wavelength monitoring coefficient;

[0010] An explosive module: used to obtain a flat explosive detection coefficient by analyzing the spectral intensity monitoring data and the spectral wavelength monitoring coefficient, compare the flat explosive detection coefficient threshold with the flat explosive detection coefficient for numerical comparison, and perform explosive detection on the target photonic crystal flat according to the numerical comparison result.

[0011] Further, the intensity data module obtains the spectral intensity monitoring data as follows:

[0012] The dissolved conjugated polymer is spin-coated on the surface of the photonic crystal flat plate. After the conjugated polymer solidifies, a conjugated polymer thin film is formed on the surface of the photonic crystal flat plate, and the photonic crystal flat plate covered with the conjugated polymer thin film is marked as the target photonic crystal flat plate;

[0013] During the optical monitoring of the target photonic crystal flat plate, the time value corresponding to the current moment is marked as the first optical characteristic time point. In the period before the first optical characteristic time point, a second optical characteristic time point is marked, and the period between the first optical characteristic time point and the second optical characteristic point is marked as the flat plate optical monitoring period;

[0014] During the spectral irradiation of the target photonic crystal flat plate, several different types of irradiation spectra are set, and the several set irradiation spectra are respectively named the first type of irradiation spectrum to the a-th type of irradiation spectrum;

[0015] For the target photonic crystal flat plate in the flat plate optical monitoring period, the intensity analysis of the spectral reflected light under different spectral irradiations is carried out to obtain the spectral intensity monitoring coefficient;

[0016] The flat plate optical monitoring period, the first type of irradiation spectrum to the a-th type of irradiation spectrum, and the spectral intensity monitoring coefficient are defined as spectral intensity monitoring data.

[0017] Further, the intensity data module obtains the first average reflection intensity value to the a-th average reflection intensity value and the first reflection intensity reference value to the a-th reflection intensity reference value, specifically as follows:

[0018] a spectral intensity monitoring periods are marked in the flat plate optical monitoring period, and the a marked spectral intensity monitoring periods are respectively named the first spectral intensity period to the a-th spectral intensity period;

[0019] Obtain the first average reflection intensity value;

[0020] Repeat the process of obtaining the first average reflection intensity value, obtain the average reflection intensity value of the second type of irradiation spectrum in the second spectral intensity period to get the second average reflection intensity value, and so on, obtain the average reflection intensity value of the a-th type of irradiation spectrum in the a-th spectral intensity period to get the a-th average reflection intensity value;

[0021] Respectively obtain the reflection reference values of the first type of irradiation spectrum to the a-th type of irradiation spectrum in the target photonic crystal flat plate to get the first reflection intensity reference value to the a-th reflection intensity reference value.

[0022] Further, the intensity data module obtains the first average reflection intensity value, specifically as follows:

[0023] Irradiate the target photonic crystal flat plate with the first type of irradiation spectrum within the first spectral intensity period. During the first spectral intensity period of the target photonic crystal flat plate, obtain the spectral reflection intensities at multiple different time points for average calculation to obtain the first average reflection intensity value.

[0024] Furthermore, the intensity data module obtains the spectral intensity monitoring coefficient as follows:

[0025] Calculate the spectral intensity monitoring coefficient from the first average reflection intensity value to the a-th average reflection intensity value and from the first reflection intensity reference value to the a-th reflection intensity reference value.

[0026] Calculate the spectral intensity monitoring coefficient.

[0027] Furthermore, the wavelength data module obtains the spectral wavelength monitoring coefficient as follows:

[0028] Mark a spectral wavelength monitoring periods within the flat plate optical monitoring cycle, and name the marked a spectral wavelength monitoring periods as the first spectral wavelength period to the a-th spectral wavelength period respectively.

[0029] Obtain the first average reflection wavelength value.

[0030] Repeat the process of obtaining the first average reflection wavelength value to obtain the average reflection wavelength value of the second type of irradiation spectrum within the second spectral wavelength period, obtaining the second average reflection wavelength value, and so on, to obtain the average reflection wavelength value of the a-th type of irradiation spectrum within the a-th spectral wavelength period, obtaining the a-th average reflection wavelength value.

[0031] Respectively obtain the reflection reference values of the first type of irradiation spectrum to the a-th type of irradiation spectrum in the target photonic crystal flat plate, obtaining the first reflection wavelength reference value to the a-th reflection wavelength reference value.

[0032] Obtain the spectral wavelength monitoring coefficient.

[0033] Furthermore, the wavelength data module obtains the first average reflection wavelength value as follows:

[0034] Irradiate the target photonic crystal flat plate with the first type of irradiation spectrum within the first spectral wavelength period. During the first spectral intensity period of the target photonic crystal flat plate, obtain the spectral reflection wavelengths at multiple different time points for average calculation to obtain the first average reflection wavelength value.

[0035] Furthermore, the wavelength data module obtains the spectral wavelength monitoring coefficient as follows:

[0036] Calculate the spectral wavelength monitoring coefficients from the first average reflection wavelength value to the a-th average reflection wavelength value and from the first reflection wavelength reference value to the a-th reflection wavelength reference value;

[0037] Calculate the spectral wavelength monitoring coefficients.

[0038] Furthermore, the explosive module obtains the flat explosive detection coefficients as follows:

[0039] Obtain the spectral intensity monitoring data and calculate the spectral intensity monitoring coefficients based on the spectral intensity monitoring data;

[0040] Obtain the spectral wavelength monitoring coefficients;

[0041] Calculate the flat explosive detection coefficients by calculating the spectral intensity monitoring coefficients and the spectral wavelength monitoring coefficients;

[0042] Calculate the flat explosive detection coefficients;

[0043] Obtain the flat explosive detection coefficient threshold, compare the flat explosive detection coefficient threshold with the flat explosive detection coefficients numerically, and perform explosive detection on the target photonic crystal flat according to the numerical comparison result.

[0044] Furthermore, the explosive module performs explosive detection on the target photonic crystal flat as follows:

[0045] Obtain the spectral intensity monitoring coefficient threshold and the spectral wavelength monitoring coefficient threshold respectively;

[0046] Calculate the flat explosive detection coefficient threshold by calculating the spectral intensity monitoring coefficient threshold and the spectral wavelength monitoring coefficient threshold;

[0047] Calculate the flat explosive detection coefficient threshold;

[0048] If the flat explosive detection coefficient is greater than or equal to the flat explosive detection coefficient threshold, it is determined that there is an explosive on the surface of the target photonic crystal flat;

[0049] If the flat explosive detection coefficient is less than the flat explosive detection coefficient threshold, it is determined that there is no explosive on the surface of the target photonic crystal flat.

[0050] In summary, due to the adoption of the above technical solutions, the beneficial effects of the present invention are as follows:

[0051] 1. By setting several different types of irradiation spectra to monitor the spectral reflection intensity and spectral reflection wavelength, and performing explosive detection based on the monitoring results, the present invention can improve the comprehensiveness and applicability of the detection process;

[0052] 2. The present invention obtains the flat explosive detection coefficient by analyzing the spectral intensity monitoring data and the spectral wavelength monitoring coefficient, compares the obtained flat explosive detection coefficient threshold with the flat explosive detection coefficient numerically, and performs explosive detection on the target photonic crystal flat according to the numerical comparison result, which can effectively ensure the accuracy of the detection result. BRIEF DESCRIPTION OF THE DRAWINGS

[0053] For the convenience of those skilled in the art to understand, the present invention will be further described below with reference to the accompanying drawings.

[0054] Figure 1 It is the overall system block diagram of the present invention;

[0055] Figure 2 It is the spectral intensity monitoring characteristic point of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0056] The technical solutions of the present invention will be clearly and completely described below in conjunction with the embodiments. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0057] Embodiment 1

[0058] Please refer to Figure 1 , the present invention provides a technical solution: a photonic crystal flat-conjugated polymer sensing system, including an intensity data module, a wavelength data module, an explosive module, and a server. The intensity data module, the wavelength data module, and the explosive module are respectively connected to the server, and the server controls the intensity data module, the wavelength data module, and the explosive module respectively;

[0059] The intensity data module obtains the target photonic crystal flat and the flat optical monitoring period, sets several different types of irradiation spectra, analyzes the intensity of the spectral reflected light of the target photonic crystal flat in the flat optical monitoring period under different types of spectral irradiations, and obtains the spectral intensity monitoring coefficient according to the analysis result to obtain the spectral intensity monitoring data;

[0060] Specifically as follows:

[0061] The dissolved conjugated polymer is spin-coated on the surface of the photonic crystal flat. After the conjugated polymer solidifies, a conjugated polymer thin film is formed on the surface of the photonic crystal flat, and the photonic crystal flat covered with the conjugated polymer thin film is marked as the target photonic crystal flat;

[0062] It should be noted here that:

[0063] In this application, the conjugated polymers involved herein are specifically various different types of conjugated polymers, and the various different types of conjugated polymers involved herein include but are not limited to poly[2-methoxy-5-(2-ethyl-ethoxy)-1,4-styrene;

[0064] In this application, the stronger the reflection fluorescence quenching corresponding to the selected conjugated polymer, the higher the content of explosives in the target photonic crystal plate.

[0065] During the optical monitoring of the target photonic crystal plate, the time value corresponding to the current moment is marked as the first optical characteristic time point. In the period before the first optical characteristic time point, a second optical characteristic time point is marked, and the period between the first optical characteristic time point and the second optical characteristic point is marked as the plate optical monitoring period;

[0066] It should be noted here that:

[0067] In this application, as the time value corresponding to the current moment changes, the first optical characteristic time point and the second optical characteristic time point also change accordingly, so as to realize the dynamic update of the plate optical monitoring period.

[0068] During the spectral irradiation of the target photonic crystal plate, several different types of irradiation spectra are set, and the several set irradiation spectra are respectively named the first type of irradiation spectrum to the a-th type of irradiation spectrum;

[0069] It should be noted here that:

[0070] In this application, a involved herein is the type quantity value corresponding to the irradiation spectrum, and a is an integer greater than 0;

[0071] For the target photonic crystal plate in the plate optical monitoring period, the intensity analysis of the spectral reflected light under different spectral irradiations is carried out to obtain the spectral intensity monitoring coefficient;

[0072] Specifically as follows:

[0073] a spectral intensity monitoring periods are marked in the plate optical monitoring period, and the a marked spectral intensity monitoring periods are respectively named the first spectral intensity period to the a-th spectral intensity period;

[0074] It should be noted here that:

[0075] In this application, a involved herein is the quantity value corresponding to the spectral intensity period, and a is an integer greater than 0;

[0076] Please refer to Figure 2, irradiate the target photonic crystal flat plate with the first type of irradiation spectrum during the first spectral intensity period. During the first spectral intensity period of the target photonic crystal flat plate, obtain the spectral reflection intensities at multiple different time points and calculate the average value to obtain the first average reflection intensity value;

[0077] Repeat the process of obtaining the first average reflection intensity value to obtain the average reflection intensity value of the second type of irradiation spectrum during the second spectral intensity period, and obtain the second average reflection intensity value. And so on, obtain the average reflection intensity value of the a-th type of irradiation spectrum during the a-th spectral intensity period, and obtain the a-th average reflection intensity value;

[0078] Respectively obtain the reflection reference values of the first type of irradiation spectrum to the a-th type of irradiation spectrum in the target photonic crystal flat plate, and obtain the first reflection intensity reference value to the a-th reflection intensity reference value;

[0079] It should be noted here that:

[0080] The reflection intensity reference value involved here is the maximum reflection intensity value corresponding to the corresponding type of spectrum in the target photonic crystal flat plate without explosives;

[0081] Calculate the spectral intensity monitoring coefficient from the first average reflection intensity value to the a-th average reflection intensity value and the first reflection intensity reference value to the a-th reflection intensity reference value;

[0082] Calculate the spectral intensity monitoring coefficient, and the specific formula is as follows:

[0083]

[0084] Among them, Gqx is the spectral intensity monitoring coefficient, Fsq i is the i-th average reflection intensity value, Fjq i is the i-th reflection intensity reference value, and a is the numerical value corresponding to the spectral wavelength period;

[0085] It should be noted here that:

[0086] In this application, the i-th average reflection intensity value involved here can be any one of the first average reflection intensity value to the a-th average reflection intensity value, and the i-th reflection intensity reference value involved here can be any one of the first reflection intensity reference value to the a-th reflection intensity reference value.

[0087] Define the flat plate optical monitoring period, the first type of irradiation spectrum to the a-th type of irradiation spectrum, and the spectral intensity monitoring coefficient as spectral intensity monitoring data;

[0088] The intensity data module obtains the spectral intensity monitoring data and transmits it to the wavelength data module and the explosive module;

[0089] The wavelength data module performs wavelength analysis on the spectral reflected light of the target photonic crystal flat under different types of spectral irradiations during the flat optical monitoring period, and obtains the spectral wavelength monitoring coefficient;

[0090] Specifically as follows:

[0091] During the flat optical monitoring period, a spectral wavelength monitoring time periods are marked, and the a marked spectral wavelength monitoring time periods are respectively named the first spectral wavelength time period to the a-th spectral wavelength time period;

[0092] It should be noted here that:

[0093] In this application, a involved here is the numerical value corresponding to the spectral wavelength time period, and a is an integer greater than 0;

[0094] Within the first spectral wavelength time period, the target photonic crystal flat is irradiated with the first type of irradiation spectrum. During the first spectral intensity time period of the target photonic crystal flat, the spectral reflection wavelengths at multiple different time points are obtained for average value calculation, and the first average reflection wavelength value is obtained;

[0095] Repeat the process of obtaining the first average reflection wavelength value to obtain the average reflection wavelength value of the second type of irradiation spectrum within the second spectral wavelength time period, and obtain the second average reflection wavelength value. And so on, obtain the average reflection wavelength value of the a-th type of irradiation spectrum within the a-th spectral wavelength time period, and obtain the a-th average reflection wavelength value;

[0096] Respectively obtain the reflection reference values of the first type of irradiation spectrum to the a-th type of irradiation spectrum in the target photonic crystal flat, and obtain the first reflection wavelength reference value to the a-th reflection wavelength reference value;

[0097] It should be noted here that:

[0098] The reflection wavelength reference value involved here is the maximum reflection wavelength value corresponding to the corresponding type of spectrum in the target photonic crystal flat without explosives;

[0099] The first average reflection wavelength value to the a-th average reflection wavelength value and the first reflection wavelength reference value to the a-th reflection wavelength reference value are calculated to obtain the spectral wavelength monitoring coefficient;

[0100] Calculate the spectral wavelength monitoring coefficient, and the specific formula is as follows:

[0101]

[0102] Among them, Gbc is the spectral wavelength monitoring coefficient, Fsb i is the i-th average reflection wavelength value, Fjb i is the i-th reflection wavelength reference value, and a is the numerical value corresponding to the spectral wavelength period;

[0103] It should be noted here that:

[0104] In this application, the i-th average reflection wavelength value involved here can be any one of the first average reflection wavelength value to the a-th average reflection wavelength value, and the i-th reflection wavelength reference value involved here can be any one of the first reflection wavelength reference value to the a-th reflection wavelength reference value.

[0105] The explosive module obtains the flat explosive detection coefficient by analyzing the spectral intensity monitoring data and the spectral wavelength monitoring coefficient, obtains the threshold value of the flat explosive detection coefficient and compares it with the flat explosive detection coefficient numerically, and performs explosive detection on the target photonic crystal flat according to the numerical comparison result;

[0106] Specifically as follows:

[0107] Obtain the spectral intensity monitoring data, and obtain the spectral intensity monitoring coefficient according to the spectral intensity monitoring data;

[0108] Obtain the spectral wavelength monitoring coefficient;

[0109] Calculate the flat explosive detection coefficient by calculating the spectral intensity monitoring coefficient and the spectral wavelength monitoring coefficient;

[0110] Calculate the flat explosive detection coefficient, and the specific formula is as follows:

[0111] Bzw = Gqx 2 + Gbc 2 ;

[0112] Among them, Bzw is the flat explosive detection coefficient, Gqx is the spectral intensity monitoring coefficient, and Gbc is the spectral wavelength monitoring coefficient;

[0113] Obtain the threshold value of the flat explosive detection coefficient, compare the threshold value of the flat explosive detection coefficient with the flat explosive detection coefficient numerically, and perform explosive detection on the target photonic crystal flat according to the numerical comparison result;

[0114] Specifically as follows:

[0115] Obtain the threshold values of the spectral intensity monitoring coefficient and the spectral wavelength monitoring coefficient respectively;

[0116] It should be noted here that:

[0117] In this application, the spectral intensity monitoring coefficient threshold and the spectral wavelength monitoring coefficient threshold involved here are respectively the maximum spectral intensity monitoring coefficient and the maximum spectral wavelength monitoring coefficient corresponding to the surface of the target photonic crystal plate with explosives;

[0118] Calculate the flat explosive detection coefficient threshold through the spectral intensity monitoring coefficient threshold and the spectral wavelength monitoring coefficient threshold;

[0119] Calculate the flat explosive detection coefficient threshold, and the specific formula is as follows:

[0120] Bzwy = Gqxy 2 + Gbcy 2 ;

[0121] Among them, Bzwy is the flat explosive detection coefficient threshold, Gqxy is the spectral intensity monitoring coefficient threshold, and Gbcy is the spectral wavelength monitoring coefficient threshold;

[0122] If the flat explosive detection coefficient is greater than or equal to the flat explosive detection coefficient threshold, it is determined that there are explosives on the surface of the target photonic crystal plate;

[0123] If the flat explosive detection coefficient is less than the flat explosive detection coefficient threshold, it is determined that there are no explosives on the surface of the target photonic crystal plate.

[0124] In this application, if there are corresponding calculation formulas, the above calculation formulas are all dimensionless and take their numerical values for calculation. The weight coefficients, proportionality coefficients, etc. in the formulas are set in such a way that they are a result value obtained by quantifying each parameter. Regarding the magnitudes of the weight coefficient and the proportionality coefficient, as long as the proportional relationship between the parameters and the result value is not affected.

[0125] A photonic crystal plate-conjugated polymer sensing system, during the application process, includes the following steps:

[0126] Step S1: Obtain the target photonic crystal plate and the flat optical monitoring period, and set several different types of irradiation spectra. Analyze the intensity of the spectral reflected light of the target photonic crystal plate during the flat optical monitoring period under different types of spectral irradiations, and obtain the spectral intensity monitoring coefficient according to the analysis results to obtain spectral intensity monitoring data;

[0127] Step S2: Analyze the wavelength of the spectral reflected light of the target photonic crystal plate during the flat optical monitoring period under different types of spectral irradiations to obtain the spectral wavelength monitoring coefficient;

[0128] Mark the target photonic crystal plate, randomly select several characteristic points for spectral wavelength monitoring, and name the marked characteristic points as spectral wavelength monitoring characteristic points to obtain multiple spectral wavelength monitoring characteristic points;

[0129] During the first spectral wavelength period, irradiate the target photonic crystal flat plate with the first type of irradiation spectrum, and respectively obtain the reflection wavelength values of each spectral wavelength monitoring feature point for the first type of irradiation spectrum, obtaining a plurality of reflection wavelength values, and calculate the average value of the obtained plurality of reflection wavelength values to obtain the first average reflection wavelength value;

[0130] Repeat the process of obtaining the first average reflection wavelength value to obtain the average reflection wavelength value of the second type of irradiation spectrum during the second spectral wavelength period, obtaining the second average reflection wavelength value, and so on, to obtain the average reflection wavelength value of the a-th type of irradiation spectrum during the a-th spectral wavelength period, obtaining the a-th average reflection wavelength value;

[0131] Respectively obtain the reflection reference values of the first type of irradiation spectrum to the a-th type of irradiation spectrum in the target photonic crystal flat plate, obtaining the first reflection wavelength reference value to the a-th reflection wavelength reference value;

[0132] Calculate the spectral wavelength monitoring coefficient from the first average reflection wavelength value to the a-th average reflection wavelength value and the first reflection wavelength reference value to the a-th reflection wavelength reference value;

[0133] Step S3: Obtain the flat plate explosive detection coefficient by analyzing the spectral intensity monitoring data and the spectral wavelength monitoring coefficient, compare the flat plate explosive detection coefficient threshold with the flat plate explosive detection coefficient, and perform explosive detection on the target photonic crystal flat plate according to the result of the numerical comparison.

[0134] The preferred embodiments of the present invention disclosed above are only used to help illustrate the present invention. The preferred embodiments do not describe all the details in detail, nor limit the invention to the specific embodiments. Obviously, many modifications and changes can be made according to the content of this specification. These embodiments are selected and specifically described in this specification to better explain the principle and practical application of the present invention, so that those skilled in the art can understand and utilize the present invention well.

Claims

1. A photonic crystal slab-conjugated polymer sensing system, characterized in that: include: Intensity data module: used to obtain the target photonic crystal plate and the plate optical monitoring period, and set several different types of irradiation spectra, perform intensity analysis on the spectral reflected light of the target photonic crystal plate in the plate optical monitoring period under different types of spectral irradiation, and obtain the spectral intensity monitoring coefficient according to the analysis results to obtain the spectral intensity monitoring data; Wavelength data module: used to perform wavelength analysis on the spectral reflected light of the target photonic crystal slab in the slab optical monitoring period under different types of spectral illumination to obtain the spectral wavelength monitoring coefficient; Explosive module: used to obtain the flat-panel explosive detection coefficient by analyzing the spectral intensity monitoring data and the spectral wavelength monitoring coefficient, obtain the flat-panel explosive detection coefficient threshold and perform numerical comparison with the flat-panel explosive detection coefficient, and perform explosive detection on the target photonic crystal flat panel according to the numerical comparison result.

2. A photonic crystal slab-conjugated polymer sensing system according to claim 1, characterized in that: The intensity data module acquires the spectral intensity monitoring data as follows: Spin-coating the dissolved conjugated polymer on the surface of the photonic crystal slab, and after the conjugated polymer is solidified, a conjugated polymer film is formed on the surface of the photonic crystal slab, and marking the photonic crystal slab covered with the conjugated polymer film as a target photonic crystal slab; During the process of optically monitoring the target photonic crystal slab, marking a slab optical monitoring cycle; In the process of spectrally irradiating the target photonic crystal slab, setting the first type of irradiation spectrum to the ath type of irradiation spectrum; For a target photonic crystal slab in a slab optical monitoring period, the intensity of the spectral reflected light under different spectral irradiation is analyzed to obtain a spectral intensity monitoring coefficient; The flat panel optical monitoring period, the first type of illumination spectrum to the ath type of illumination spectrum and the spectrum intensity monitoring coefficient are defined as spectrum intensity monitoring data.

3. A photonic crystal slab-conjugated polymer sensing system according to claim 2, characterized in that: The intensity data module obtains the first average reflection intensity value to the ath average reflection intensity value and the first reflection intensity reference value to the ath reflection intensity reference value, as follows: Mark a spectral intensity monitoring time periods in the flat optical monitoring period, and name the marked a spectral intensity monitoring time periods as the first spectral intensity time period to the ath spectral intensity time period respectively; Obtaining a first average reflection intensity value; Obtain the average reflection intensity value of the second type of illumination spectrum in the second spectrum intensity period to obtain the second average reflection intensity value, and so on, obtain the average reflection intensity value of the a-th type of illumination spectrum in the a-th spectrum intensity period to obtain the a-th average reflection intensity value; Reflection reference values ​​of the first type illumination spectrum to the ath type illumination spectrum in the target photonic crystal slab are respectively acquired to obtain the first reflection intensity reference value to the ath reflection intensity reference value.

4. A photonic crystal slab-conjugated polymer sensing system according to claim 3, characterized in that: The intensity data module obtains the first average reflection intensity value as follows: The target photonic crystal slab is irradiated with a first type of irradiation spectrum in a first spectral intensity period. The spectral reflection intensities at multiple different time points of the target photonic crystal slab are obtained in the first spectral intensity period to calculate the average value and obtain a first average reflection intensity value.

5. The photonic crystal slab-conjugated polymer sensing system according to claim 3, characterized in that: The intensity data module obtains the spectral intensity monitoring coefficient, as follows: The spectral intensity monitoring coefficient is obtained by calculating the first average reflection intensity value to the ath average reflection intensity value and the first reflection intensity reference value to the ath reflection intensity reference value; Calculate the spectral intensity monitoring coefficient.

6. The photonic crystal slab-conjugated polymer sensing system according to claim 1, characterized in that: The wavelength data module obtains the spectrum wavelength monitoring coefficient, as follows: Mark a spectral wavelength monitoring time periods in the flat optical monitoring period, and name the marked a spectral wavelength monitoring time periods as the first spectral wavelength time period to the ath spectral wavelength time period respectively; Obtaining a first average reflection wavelength value; Repeat the process of obtaining the first average reflection wavelength value, obtain the average reflection wavelength value of the second type of illumination spectrum in the second spectrum wavelength period, and obtain the second average reflection wavelength value. Similarly, obtain the average reflection wavelength value of the a-th type of illumination spectrum in the a-th spectrum wavelength period, and obtain the a-th average reflection wavelength value. Respectively acquiring reflection reference values ​​of the first type of illumination spectrum to the ath type of illumination spectrum in the target photonic crystal slab to obtain the first reflection wavelength reference value to the ath reflection wavelength reference value; Get the spectral wavelength monitoring coefficient.

7. The photonic crystal slab-conjugated polymer sensing system according to claim 6, characterized in that: The wavelength data module obtains the first average reflection wavelength value as follows: In a first spectral wavelength period, a first type of irradiation spectrum is used to irradiate the target photonic crystal slab. In a first spectral intensity period, spectral reflection wavelengths at multiple different time points are obtained and averaged to obtain a first average reflection wavelength value.

8. The photonic crystal slab-conjugated polymer sensing system according to claim 6, characterized in that: The wavelength data module obtains the spectrum wavelength monitoring coefficient, as follows: The spectrum wavelength monitoring coefficient is obtained by calculating the first average reflection wavelength value to the ath average reflection wavelength value and the first reflection wavelength reference value to the ath reflection wavelength reference value; Calculate the spectral wavelength monitoring coefficient.

9. The photonic crystal slab-conjugated polymer sensing system according to claim 1, characterized in that: The explosive module obtains the flat explosive detection coefficient as follows: Acquire spectral intensity monitoring data, and acquire spectral intensity monitoring coefficient according to the spectral intensity monitoring data; Obtain spectral wavelength monitoring coefficient; The detection coefficient of the flat explosive is obtained by calculating the spectral intensity monitoring coefficient and the spectral wavelength monitoring coefficient; Calculate the detection coefficient of flat explosives; A flat panel explosive detection coefficient threshold is obtained, a numerical comparison is performed between the flat panel explosive detection coefficient threshold and the flat panel explosive detection coefficient, and explosive detection is performed on the target photonic crystal flat panel according to the numerical comparison result.

10. The photonic crystal slab-conjugated polymer sensing system according to claim 9, characterized in that: The explosive module performs explosive detection on the target photonic crystal plate as follows: Obtaining the spectral intensity monitoring coefficient threshold and the spectral wavelength monitoring coefficient threshold respectively; The spectral intensity monitoring coefficient threshold and the spectral wavelength monitoring coefficient threshold are calculated to obtain the flat explosive detection coefficient threshold; If the flat plate explosive detection coefficient is greater than or equal to the flat plate explosive detection coefficient threshold, it is determined that there is explosive on the surface of the target photonic crystal plate; If the flat-plate explosive detection coefficient is less than the flat-plate explosive detection coefficient threshold, it is determined that there is no explosive on the surface of the target photonic crystal plate.

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