Performance test method and device for solid state disk and storage medium

Abstract

The embodiment of the invention provides a solid state disk performance testing method and device and a storage medium, and the method comprises the steps: changing the wear value of a to-be-tested solid state disk for multiple times through a specified accelerated wear intervention strategy, so as to simulate the wear state of the to-be-tested solid state disk in multiple life cycle stages in a full life cycle; the full life cycle refers to the life cycle of the to-be-tested solid state disk from zero wear to the wear value upper limit; different life cycle stages in the plurality of life cycle stages correspond to different wear value ranges; aiming at the specified performance item, performing performance testing on the to-be-tested solid state disk in the wear state corresponding to the plurality of life cycle stages to obtain test values of the specified performance item corresponding to the plurality of life cycle stages; and determining a performance test result of the to-be-tested solid state disk according to the specified performance item and the test values corresponding to the plurality of life cycle stages. According to the method, the problem that the performance of the solid state disk is reduced in the using process due to insufficient wear value testing strength in related technologies is solved.

Description

Technical Field

[0001] The embodiments of the present application relate to the field of computers, and more particularly, to a method, device, and storage medium for testing the performance of a solid-state drive. Background Art

[0002] A solid-state drive (SSD) is a hard disk that uses flash memory chips as a storage medium. Compared with traditional hard disk drives (HDDs), it has higher read and write speeds, lower power consumption, lighter weight, smaller volume, and stronger anti-vibration performance. With the progress of technology and market demand, SSDs have become the mainstream products in the computer storage field and are widely used in personal computers, servers, data centers, and other fields. The solid-state drive (SSD) refers to a product that follows the nvmel.4 or nvme2.0 protocol, is equipped with important hardware components such as nand and a controller, and develops SSD disk products with capacities including 0.96T, 1.60T, 3.2T, 3.84T, 6.40T, 7.68T, etc. This product can be inserted into a server for data bearing and storage in various business scenarios.

[0003] Although SSD technology is becoming increasingly mature, some problems still emerge in product launch and actual applications. In particular, the testing methods for data erasure and the number of programmable times (PE, Program / Erase Cycle) are insufficient, resulting in unexpected performance degradation or stability problems during customer use. Summary of the Invention

[0004] The embodiments of the present application provide a method, device, and storage medium for testing the performance of a solid-state drive to at least solve the problem of performance degradation during use of a solid-state drive due to insufficient wear value testing in related technologies.

[0005] According to an embodiment of the present application, there is provided a method for testing the performance of a solid-state drive, including: changing the wear value of the solid-state drive to be tested multiple times through a specified accelerated wear intervention strategy to simulate the wear states of multiple life cycle stages in the entire life cycle of the solid-state drive to be tested; the entire life cycle refers to the life cycle of the solid-state drive to be tested from zero wear to the wear value upper limit; different life cycle stages in the multiple life cycle stages correspond to different wear value ranges; for a specified performance item, performing performance tests on the solid-state drive to be tested in the wear states corresponding to the multiple life cycle stages respectively to obtain test values corresponding to the specified performance item and the multiple life cycle stages; and determining the performance test result of the solid-state drive to be tested according to the test values corresponding to the specified performance item and the multiple life cycle stages.

[0006] According to another embodiment of the present application, there is provided a performance testing device for a solid-state drive, including: a wear simulation unit configured to change the wear value of the solid-state drive to be tested multiple times through a specified accelerated wear intervention strategy to simulate the wear states of multiple life cycle stages of the solid-state drive to be tested during its entire life cycle; the entire life cycle refers to the life cycle of the solid-state drive to be tested from zero wear to the wear value upper limit; different life cycle stages among the multiple life cycle stages correspond to different wear value ranges; a performance testing unit configured to perform performance tests on the solid-state drive to be tested in the wear states corresponding to the multiple life cycle stages respectively for a specified performance item, and obtain test values corresponding to the specified performance item and the multiple life cycle stages; a result generation unit configured to determine the performance test result of the solid-state drive to be tested according to the test values corresponding to the specified performance item and the multiple life cycle stages.

[0007] According to still another embodiment of the present application, there is also provided a computer-readable storage medium storing a computer program, wherein the computer program is configured to execute the steps in any one of the above method embodiments when running.

[0008] According to still another embodiment of the present application, there is also provided an electronic device including a memory and a processor, wherein a computer program is stored in the memory, and the processor is configured to run the computer program to execute the steps in any one of the above method embodiments.

[0009] According to still another embodiment of the present application, there is also provided a computer program product including a computer program, and the computer program realizes the steps in any one of the above method embodiments when executed by a processor.

[0010] Through this application, the entire life cycle of the solid-state drive to be tested is divided into multiple wear stages, each stage corresponding to a different wear value range. Through the specified accelerated wear intervention strategy, the wear value of the solid-state drive to be tested is changed multiple times to simulate the wear states of multiple life cycle stages in the entire life cycle of the solid-state drive to be tested, accelerating the wear process of the solid-state drive to be tested. The wear states of different stages in the entire life cycle of the solid-state drive to be tested are simulated in a relatively short time without waiting for the time required for natural wear, greatly shortening the test cycle and improving the test efficiency. Under each simulated life cycle stage, the solid-state drive to be tested is tested for specified performance items, and the performance test values of different life cycle stages are recorded. By comparing the test values of different life cycle stages, the change trend of the performance of the solid-state drive to be tested in the entire life cycle can be determined, the performance of the solid-state drive to be tested in each stage of the entire life cycle can be identified in advance, and the stability and reliability of the solid-state drive to be tested can be judged. This not only improves the coverage rate of the test scenarios and test aspects, as well as the overall quality of the product, but also can avoid the problem of performance degradation during use. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] Figure 1 is a hardware structure block diagram of an optional computer device according to an embodiment of the present application;

[0012] Figure 2 is a schematic diagram of an optional storage unit according to an embodiment of the present application;

[0013] Figure 3 is a flowchart of an optional performance test method for a solid-state drive according to an embodiment of the present application;

[0014] Figure 4 is a flowchart of another optional performance test method for a solid-state drive according to an embodiment of the present application;

[0015] Figure 5 is a structure block diagram of an optional performance test device for a solid-state drive according to an embodiment of the present application;

[0016] Figure 6 is a schematic diagram of another optional computer device according to an embodiment of the present application. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0017] Hereinafter, embodiments of the present application will be described in detail with reference to the drawings and in conjunction with the embodiments.

[0018] It should be noted that the terms "first", "second", etc. in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects and do not necessarily need to be used to describe a specific order or sequence.

[0019] The method embodiments provided in the embodiments of the present application can be executed in a computer device or a similar computing device. Taking the operation on a computer device as an example, Figure 1 is a hardware structure block diagram of a computer device for a solid-state drive performance testing method according to an embodiment of the present application. As Figure 1 shown, the computer device may include one or more ( Figure 1 only one is shown in the figure) processors 102 (the processors 102 may include, but are not limited to, processing devices such as a microprocessor MCU or a programmable logic device FPGA) and a memory 104 for storing data. Among them, the above computer device may further include a transmission device 106 for communication functions and an input / output device 108. Those of ordinary skill in the art can understand that Figure 1 the structure shown is only schematic and does not limit the structure of the above computer device. For example, the computer device may further include more or fewer components than Figure 1 shown in the figure, or have a different configuration from Figure 1 shown in the figure.

[0020] The memory 104 can be used to store computer programs. For example, software programs and modules of application software, such as the computer program corresponding to the solid-state drive performance testing method in the embodiments of the present application. The processor 102 executes various functional applications and data processing by running the computer program stored in the memory 104, that is, implements the above method. The memory 104 may include a high-speed random access memory, and may also include a non-volatile memory, such as one or more magnetic storage devices, flash memories, or other non-volatile solid-state memories. In some instances, the memory 104 may further include a memory remotely disposed relative to the processor 102, and these remote memories can be connected to the computer device through a network. Examples of the above network include, but are not limited to, the Internet, an enterprise intranet, a local area network, a mobile communication network, and combinations thereof.

[0021] The transmission device 106 is used to receive or send data via a network. Specific examples of the above network may include a wireless network provided by a communication provider of the computer device. In one instance, the transmission device 106 includes a network adapter (abbreviated as NIC), which can be connected to other network devices through a base station and thus can communicate with the Internet. In one instance, the transmission device 106 may be a radio frequency (abbreviated as RF) module, which is used to communicate with the Internet wirelessly.

[0022] The following are the noun explanations involved in this embodiment:

[0023] SLC: Figure 2It is a schematic diagram of an optional storage cell according to an embodiment of the present application. As Figure 2 shown, originally, one Cell unit of the earliest SSD could only store 1 bit of information, that is, there were only two voltage changes, 0 and 1, which could be used to store one bit of binary data. This method has a simple structure and fast voltage control. Its characteristics are long lifespan and strong performance, with the P / E erase / write cycle between 90,000 and 100,000 times. However, its disadvantages are low capacity and high cost. After all, one Cell unit can only store 1 bit of information. This method is called Single-Level Cell (SLC), abbreviated as SLC.

[0024] TLC: As Figure 2 shown, over time, the Trinary-Level Cell (TLC for short), which stores 3 bits per unit, emerged. It has lower production costs and a cheaper price, but worse performance and a shorter lifespan, with the P / E erase / write cycle about 500 - 1000 times.

[0025] nvme change: Develop a private nvme cli command that can modify the PE value, and the command parameter is nvmechange_pe - d / dev / nvme* - V value.

[0026] Lba: Logical Block Address, the system logical address.

[0027] Fio: A flexible I / O testing tool that can perform multi-threaded / process I / O load patterns according to the I / O types specified by users.

[0028] smart-log: Public (viewable by everyone) log information showing the health status of the NVME hard disk.

[0029] nvme-vendor-log: Private (viewable by internal factory personnel) log information showing the health status of the NVME hard disk.

[0030] BS: In the FIO library, the BS (Buffer Size) parameter represents the buffer size, that is, the amount of data that the buffer can store during each read / write operation. The BS parameter is an important configuration parameter that directly affects the efficiency of file operations.

[0031] In this embodiment, a method for testing the performance of a solid-state drive is provided. Figure 1 It is a flowchart of an optional method for testing the performance of a solid-state drive according to an embodiment of the present application. As Figure 3 shown, the process includes the following steps:

[0032] Step S302: By means of a specified accelerated wear intervention strategy, change the wear value of the solid state drive (SSD) to be tested multiple times to simulate the wear states at multiple life cycle stages in the full life cycle of the SSD to be tested; the full life cycle refers to the life cycle of the SSD to be tested from zero wear to the wear value upper limit; different life cycle stages in the multiple life cycle stages correspond to different wear value ranges.

[0033] Among them, the accelerated wear intervention strategy is a set of procedures or methods designed to accelerate the wear process of the SSD to be tested through artificial means to simulate the state of the SSD to be tested after long-term use in a shorter period of time. For example, the accelerated wear intervention strategy refers to a method of accelerating its wear process by increasing the write frequency and the amount of data written each time to the SSD. For instance, a relatively high write frequency can be set, such as writing data blocks of a certain size per minute, and gradually increasing the amount of data written each time. For example, the accelerated wear intervention strategy refers to a method of selecting specific types of data for writing, such as random data, duplicate data, or data with a specific pattern, to affect the wear speed and wear distribution of the SSD. For example, the accelerated wear intervention strategy refers to a method of adjusting the write mode and read mode of the SSD to affect its wear speed and performance. For example, the proportion of sequential writes can be increased, or frequent read and write operations on small files can be increased.

[0034] The wear value refers to the degree of performance and life loss of the internal storage units (such as flash chips) of the SSD after frequent read and write operations. The higher the wear value, the closer the SSD to be tested is to the end of its life. For example, the wear value can be parameters such as the number of data erasure and programmable times (PE), the total number of written bytes, the number of writes per day, and the mean time between failures of the SSD to be tested.

[0035] The full life cycle of the SSD is the stage from the first power-on and start of use of the SSD until it is no longer suitable for continued use or its performance drops significantly. The full life cycle test aims to evaluate the performance stability of the SSD to be tested throughout the entire usage cycle.

[0036] The multiple life cycle stages refer to several stages into which the full life cycle of the SSD to be tested is divided, and each stage corresponds to a different wear value range. The multiple life cycle stages can be all the life cycle stages or some of them. The wear value range corresponding to the full life cycle can be configured according to different requirements of different disk wafers. Taking the CougarR1 disk as an example, taking the number of data erasure and programmable times (PE) as the wear value, the wear value range corresponding to the full life cycle should be taken according to the principle of covering the entire life cycle of the disk wafer, that is, taking values in the following ranges, and testing the latency and bandwidth performance in each range: PE < 1000, PE = 3000, PE = 5000, PE = 7000, PE = 9000, PE = 10000.

[0037] The wear state refers to the state in which, after a solid-state drive has been used for a certain period of time or has undergone a certain number of read / write operations, the performance of its internal components (such as flash memory chips, controllers, etc.) deteriorates or its lifespan shortens due to physical or chemical changes. For example, taking the wear value as the number of data erasure and programmable cycles (PE) as an example, for a solid-state drive, the wear state specifically refers to the range of its PE value, which reflects the usage degree and remaining lifespan of the solid-state drive to be tested. The higher the wear state, the closer the solid-state drive to be tested is to the end of its lifespan.

[0038] Optionally, the computer device determines the upper limit of the wear value of the solid-state drive to be tested. According to the upper limit of the wear value of the solid-state drive to be tested, its entire life cycle is divided into multiple stages, and each stage corresponds to a specific wear value range. The computer device adjusts the wear value of the solid-state drive to be tested to the wear states corresponding to multiple life cycle stages according to the formulated accelerated wear intervention strategy, so that the wear value of the solid-state drive to be tested is in different life cycle stages, and the solid-state drive to be tested with the changed wear value is tested multiple times. After each test, record its wear value and check its performance.

[0039] Step S304: For the specified performance item, perform performance tests on the solid-state drive to be tested in the wear states corresponding to multiple life cycle stages respectively, and obtain the test values corresponding to the specified performance item and multiple life cycle stages.

[0040] Among them, the specified performance item refers to a pre-selected performance index, such as bandwidth, latency, IOPS (number of input / output operations per second), etc. These indexes are used to measure the performance of the solid-state drive to be tested under different workloads. Table 1 provides an example of a test product. As shown in Table 1, the performance of bandwidth and latency of the CougarR1 disk is tested:

[0041] Table 1

[0042]

[0043] When testing the performance of the CougarR1 disk during its entire life cycle, all types of read / write verification tests performed on the CougarR1 disk should be tests without abnormalities. If there are abnormal phenomena, it can be suspected as a single-disk problem or a FW firmware problem.

[0044] Since the upper limit values of PEs for different disks are different, taking the CougarR1 disk as an example, the upper limit value of the PE for this disk is 10,000. When exceeding the life cycle of the disk (i.e., PE > 10,000), if operations such as read / write, power on / off are performed on the disk with a PE value greater than 10,000, the accuracy of the data cannot be guaranteed. Moreover, as the PE gradually increases, there is a high probability that the disk will be damaged, and it is outside the scope of maintenance beyond the life cycle. Therefore, the test for the PE value exceeding 10,000 can be skipped first.

[0045] The test value refers to the actual measurement result obtained for a specified performance item during the performance test.

[0046] The test values corresponding to a specified performance item and multiple life cycle stages indicate that for a certain specified performance item of a solid-state drive, performance tests are respectively carried out at different life cycle stages (i.e., different wear states), and the test values corresponding to each stage are recorded.

[0047] Optionally, once the solid-state drive to be tested is in a specific wear state, the computer device uses a performance test tool (such as fio) to test the selected performance item and records the test value in the current wear state.

[0048] Step S306, determine the performance test result of the solid-state drive to be tested according to the test values corresponding to the specified performance item and multiple life cycle stages.

[0049] Optionally, the computer device records the test values in each wear state to form a data set. By comparing the test values in different wear states, the performance test result of the solid-state drive to be tested is generated to evaluate the performance stability of the solid-state drive to be tested at different life cycle stages.

[0050] Through the above steps, the entire life cycle of the solid state drive to be tested is divided into multiple wear stages, each stage corresponding to a different wear value range. By means of a specified accelerated wear intervention strategy, the wear value of the solid state drive to be tested is changed multiple times to simulate the wear states of multiple life cycle stages of the solid state drive to be tested during its entire life cycle, accelerating the wear process of the solid state drive to be tested, simulating the wear states of different stages of the solid state drive to be tested during its entire life cycle in a short period of time without waiting for the time required for natural wear, greatly shortening the test cycle and improving the test efficiency. Under each simulated life cycle stage, the solid state drive to be tested is tested for specified performance items, and the performance test values of different life cycle stages are recorded. By comparing the test values of different life cycle stages, the change trend of the performance of the solid state drive to be tested during its entire life cycle can be determined, the performance conditions of each stage of the solid state drive to be tested during its entire life cycle can be identified in advance, and the stability and reliability of the solid state drive to be tested can be judged. This not only improves the coverage of the test scenarios and test aspects, as well as the overall quality of the product, but also can avoid the problem of performance degradation during use.

[0051] In an exemplary embodiment, before changing the wear value of the solid state drive to be tested multiple times by means of a specified accelerated wear intervention strategy, the performance test method for the solid state drive further includes:

[0052] After the solid state drive to be tested is normally powered on, it is formatted according to a specified disk format to obtain a formatted solid state drive to be tested.

[0053] Among them, the specified disk format means that before testing the solid state drive to be tested, according to specific test requirements or standards, the solid state drive to be tested is formatted into a preset logical block address (LBA) format. This formatting process involves configuring the logical structure of the solid state drive to be tested to determine how to store data in the physical storage units of the solid state drive to be tested. The specified disk format may include block size (such as 512 bytes, 4KB, etc.), number of sectors, and other parameters related to data access and storage. In actual application scenarios, the 512-byte format is usually widely used as the default or standard format because it is compatible with traditional hard disks and has wide applicability in many environments.

[0054] Optionally, Figure 4 is a flowchart of another alternative performance test method for a solid state drive according to an embodiment of the present application, as Figure 4As shown, after the solid state drive (SSD) to be tested is burned, it is powered on normally, and the SSD to be tested is formatted into a specified disk format (such as the LBA format) to obtain the formatted SSD to be tested. If there are no special requirements, the default is the 512b format (this mode is generally the factory mode of the disk, and in actual application scenarios, this mode is used the most and most widely). Record the initial wear value of the SSD to be tested before the test (denoted as Y), and then perform the step of changing the wear value of the SSD to be tested multiple times by a specified accelerated wear intervention strategy.

[0055] Through this embodiment, formatting the SSD to be tested into a specified disk format ensures that all tests will start from the same state, eliminating potential impacts caused by previous data or formatting differences, providing a clean and consistent environment for subsequent wear tests, and making the test results more comparable and reliable.

[0056] In an exemplary embodiment, before changing the wear value of the SSD to be tested multiple times by a specified accelerated wear intervention strategy, the SSD performance test method further includes:

[0057] Obtain the log information of the SSD to be tested, and determine the current state of the SSD to be tested according to the log information of the SSD to be tested; in the case where the SSD to be tested is currently in a normal state, perform the step of changing the wear value of the SSD to be tested multiple times by a specified accelerated wear intervention strategy to simulate the wear states of multiple life cycle stages in the entire life cycle of the SSD to be tested.

[0058] Among them, the log information refers to the detailed data about the current health status, performance indicators, and usage of the SSD to be tested output by the SSD to be tested through specific commands (such as nvme smart-log and nvmevendor-log). The log information contains information crucial for the key performance evaluation of the SSD to be tested, such as the number of data erasures and programmable times (PE value), error rate, temperature, firmware version, and the total running time of the SSD to be tested, etc. By analyzing this log information, it can be judged whether the current running state of the SSD to be tested is normal and its performance performance at different wear stages.

[0059] Optionally, as Figure 4As shown, ensure that the solid-state drive to be tested is correctly connected to the test system and the device is powered on normally and ready. The computer device uses the nvme smart-log and nvme vendor-log commands through the command-line interface to obtain the log of the solid-state drive to be tested. The computer device analyzes the obtained log information to confirm the current operating state of the solid-state drive to be tested, including whether it is within the normal temperature range, whether there are any read / write errors, whether the PE value is abnormal, and whether the firmware version is the version required for testing, etc. The computer device determines whether the solid-state drive to be tested is in a normal operating state based on the key metrics in the log information. If any abnormalities are found, such as too high a PE value, temperature exceeding the safe range, or read / write errors, the solid-state drive to be tested may be in an abnormal state, and it is not suitable to perform an accelerated wear test at this time. If the log information indicates that the solid-state drive to be tested is currently in a normal state, the computer device continues to execute the subsequent accelerated wear intervention strategy.

[0060] In this embodiment, the log information of the solid-state drive to be tested is obtained, and based on the log information of the solid-state drive to be tested, the current state of the solid-state drive to be tested is determined; only when the solid-state drive to be tested is currently in a normal state, the step of executing the specified accelerated wear intervention strategy to change the wear value of the solid-state drive to be tested multiple times to simulate the wear states of multiple life cycle stages in the entire life cycle of the solid-state drive is performed. This step ensures that the solid-state drive to be tested is in a normal and testable state before the test starts, and avoids test result deviations caused by faults or abnormalities of the solid-state drive to be tested.

[0061] In an exemplary embodiment, the wear value of the solid-state drive to be tested is changed multiple times through the specified accelerated wear intervention strategy to simulate the wear states of multiple life cycle stages in the entire life cycle of the solid-state drive, including:

[0062] Each life cycle stage in the multiple life cycle stages is respectively used as the current life cycle stage to perform the following first intervention operation to simulate the wear state of the solid-state drive to be tested in each life cycle stage. The wear value range corresponding to the current life cycle stage is the current wear value range: send a first instruction to the solid-state drive to be tested; the first instruction is used to modify the wear value of the solid-state drive to be tested to a first target wear value to simulate the wear state of the solid-state drive to be tested in the current life cycle stage through the first target wear value; the first target wear value is any wear value within the current wear value range.

[0063] Among them, the first instruction refers to a proprietary solid-state drive controller interface command used to directly modify the internal wear value of the solid-state drive under test, so as to quickly simulate the wear states of the solid-state drive under test at different life cycle stages without long-term actual data erasure and rewriting operations. For example, the first instruction can be the nvme change_pe command issued by the fio tool to modify the PE value (the number of data erasures and programmable times, abbreviated as the PE value) of the solid-state drive under test to a specified wear value range. For example, modifying the initial wear value Y of the solid-state drive under test to any value from 0 to 1000 (such as 578), the corresponding example of the first instruction is: nvme change_pe -d / dev / nvme0n1 -v578 (random value).

[0064] The first target wear value refers to any target value within the current wear value range at the current life cycle stage, and is used to simulate the wear state of the solid-state drive under test at the current life cycle stage. The first target wear value is within the wear value range of a specific stage in the entire life cycle of the solid-state drive under test. For example, the PE test value ranges of the solid-state drive under test at different life cycle stages are respectively: 0 - 1000, 1001 - 3000, 3001 - 5000, 5001 - 7000, 7001 - 9000, 9001 - 10000. Any wear value selected within these ranges can be used as the first target wear value to simulate the performance of the solid-state drive under test in this wear state.

[0065] Optionally, the computer device selects a stage in the entire life cycle of the solid-state drive under test as the current test stage. The wear value range corresponding to the current test stage is the current wear value range. The computer device selects a specific value within the current wear value range as the first target wear value. The computer device issues the first instruction to the solid-state drive under test through the command line interface to modify the wear value of the solid-state drive under test to the first target wear value. After the wear value of the solid-state drive under test has been modified to the first target wear value, fio or other performance testing tools can be used to test the performance of the solid-state drive under test in this wear state, including performance indicators such as read and write speeds and latency.

[0066] For example, the wear value is the PE value, and the current wear value range is the PE range from 0 to 1000. 578 can be selected as the first target wear value. The computer device issues the nvme change_pe command to the solid state drive to be tested through the command line interface, and modifies the PE value of the solid state drive to be tested to the first target wear value (such as 578). After executing the command, use the nvme smart-log or nvme vendor-log command to check whether the wear value of the solid state drive to be tested has been successfully modified to the first target wear value. This step is an important link to ensure that the intervention operation is effective and no additional problems are introduced. Once it is confirmed that the PE value has been modified to the first target wear value, fio or other performance testing tools can be used to test the performance of the solid state drive to be tested in this wear state, including performance indicators such as read and write speeds and latency.

[0067] Through this embodiment, a method for performance testing by modifying the wear value is provided. The method issues a first instruction to the solid state drive to be tested, and directly modifies the wear value of the solid state drive to be tested through the first instruction, which can quickly jump to any wear stage in the life cycle of the solid state drive to be tested, thus greatly shortening the test time and improving the test efficiency; the entire life cycle of the solid state drive to be tested is divided into multiple stages, and the wear value is modified once in each stage to cover the entire life range of the solid state drive to be tested from a new disk to the end of wear. This phased testing method can verify the performance value situation within the entire life cycle of the solid state drive to be tested, ensure that the performance data of the solid state drive to be tested will not be greatly affected by the change of PE, provide a quick testing method for R & D to locate problems, provide quality assurance for product listing, and reduce the probability of problems occurring after the customer uses the disk for a long time, thereby further improving the disk quality.

[0068] In an exemplary embodiment, through a specified accelerated wear intervention strategy, the wear value of the solid state drive to be tested is changed multiple times to simulate the wear states of multiple life cycle stages in the full life cycle of the solid state drive to be tested, and further includes:

[0069] After obtaining the test value corresponding to the specified performance item and the current life cycle stage, when the current life cycle stage is not the last life cycle stage among the multiple life cycle stages, the wear value of the solid state drive to be tested is restored from the first target wear value to the specified wear value, so as to use the next life cycle stage of the current life cycle stage as the new current life cycle stage to re-execute the first intervention operation.

[0070] Among them, the specified wear value refers to a specific wear state value to which the solid-state drive to be tested needs to be restored or reset before the start of the test or after the end of a certain test stage. The specified wear value can be the initial wear value of the solid-state drive to be tested (such as before the start of the test), or a baseline value set for the subsequent test stage to ensure that the solid-state drive to be tested is in a determined wear state before the next round of wear test.

[0071] Optionally, after obtaining the test value corresponding to the specified performance item and the current life cycle stage, when the current life cycle stage is not the last life cycle stage among the multiple life cycle stages, the first target wear value is restored to the specified wear value through the first instruction, and the next life cycle stage of the current life cycle stage is used as the new current life cycle stage to re-execute the first intervention operation until the test values of each life cycle in the full life cycle of the solid-state drive to be tested are obtained.

[0072] In some embodiments, after obtaining the test values of each life cycle in the full life cycle of the solid-state drive to be tested, the first target wear value can also be restored to the initial wear value Y through the first instruction, which helps the reuse test of the solid-state drive to be tested, ensures that the solid-state drive to be tested returns to the initial state for a new test cycle, and at the same time facilitates the comparison of the original performance differences of different test batches or different solid-state drive models to be tested.

[0073] Through this embodiment, after each test of a life cycle stage, the wear value of the solid-state drive to be tested is restored from the first target wear value to the specified wear value, rather than allowing it to wear naturally to the next stage, which significantly speeds up the test process and ensures that the test can smoothly transition to the next stage without the incoherence of the test results caused by the break of the wear value.

[0074] In an exemplary embodiment, the multiple life cycle stages include the first life cycle stage in the full life cycle; the wear values corresponding to different life cycle stages in the full life cycle increase sequentially starting from the first life cycle stage.

[0075] Among them, the first life cycle stage refers to the initial state of the solid-state drive to be tested, that is, the situation just after leaving the factory or the first formatting. At this time, the wear value of the solid-state drive to be tested is the lowest, and the performance is usually in the optimal state. As each life cycle stage progresses, the wear values corresponding to different life cycle stages in the full life cycle gradually increase starting from the first life cycle stage according to a preset wear pattern until the wear upper limit value is reached.

[0076] In one embodiment, by means of a specified accelerated wear intervention strategy, the wear value of the solid-state drive to be tested is changed multiple times to simulate the wear states of the solid-state drive to be tested in multiple life cycle stages in the full life cycle, including:

[0077] Starting from the first life cycle stage, sequentially take each life cycle stage in multiple life cycle stages as the current life cycle stage and perform the following second intervention operation: the wear value range corresponding to the current life cycle stage is the current wear value range.

[0078] Continuously send a second command to the solid state drive under test to continuously increase the wear value of the solid state drive under test starting from the initial wear value corresponding to the current life cycle stage; the second command is used to simulate read and write operations performed on the solid state drive under test by configuring the I / O pressure of the solid state drive under test to be greater than a preset pressure; during the process of continuously sending the second command to the solid state drive under test, query the current wear value of the solid state drive under test through a third command; the third command is used to query the current wear value of the solid state drive under test; when the current wear value reaches the second target wear value, stop sending the second command to the solid state drive under test to simulate the wear state of the solid state drive under test in the current life cycle stage through the second target wear value; the second target wear value is a wear value specified in advance within the current wear value range; wherein, for a specified performance item, performing a performance test on the solid state drive under test in the wear state corresponding to the current life cycle stage is executed after stopping sending the second command to the solid state drive under test; wherein, the initial wear value corresponding to the first life cycle stage is zero wear; when taking the next life cycle stage of the current life cycle stage as the new current life cycle stage and re - executing the second intervention operation, the initial wear value corresponding to the next life cycle stage is the second target wear value.

[0079] Among them, the second command refers to a command issued by a performance test tool (such as fio), and can simulate read and write operations performed on the solid state drive under test by configuring the I / O pressure of the solid state drive under test to be greater than a preset pressure, so as to increase the wear value of the solid state drive under test.

[0080] Initial wear value refers to the starting point of the wear state of the solid-state drive (SSD) under test at the beginning of each life cycle stage, indicating that the test for each life cycle stage will start from the corresponding initial wear value and continuously increase until the second target wear value of the corresponding life cycle stage is reached. For the first life cycle stage, the initial wear value is zero wear (i.e., the PE value is 0), indicating that the SSD under test is in a brand-new state. For each subsequent life cycle stage, the initial wear value is equal to the second target wear value at the end of the previous stage, i.e., the wear state of the SSD under test before entering the new stage. For example, at the start of the test, the SSD under test is brand-new and has not undergone any wear, so the initial wear value corresponding to the first life cycle stage is zero wear (e.g., the PE value is 0). After the test of the first life cycle stage is completed and the second target wear value (e.g., the PE value is 1000) is reached, the test of the second life cycle stage begins. At this time, the second target wear value (e.g., the PE value is 1000) is the initial wear value corresponding to the second life cycle stage, and it starts to continuously increase from the initial wear value corresponding to the second life cycle stage (e.g., the PE value is 1000).

[0081] The I / O pressure of the SSD under test refers to the intensity of read and write operations applied to the SSD under test through the fio tool or other performance testing means during the test. The level of I / O pressure directly affects the increasing speed of the wear value of the SSD under test, and the preset pressure is a reference value used to compare and determine the intensity of the I / O pressure used in the test.

[0082] The third instruction is used to query the current wear value and health status of the solid-state drive. For example, the third instruction can be the nvme smart-log or nvme vendor-log command. During the continuous issuance of the second instruction (fio command), the third instruction is used to periodically check the current wear value of the SSD under test to determine whether the current wear value has reached the expected second target wear value, so as to stop the issuance of the second instruction in a timely manner.

[0083] The second target wear value refers to a specific wear value within the preset current wear value range for the current life cycle stage when performing a performance test on the solid-state drive to be tested. Generally, the second target wear value is set to the upper limit value of the current wear value range corresponding to the current life cycle stage. The second target wear value is used to simulate the wear state reached by the solid-state drive to be tested in the current life cycle stage. During the test, the second target wear value is used to guide when to stop applying additional I / O pressure or wear operations to the solid-state drive to be tested. When the PE value of the solid-state drive to be tested reaches the second target wear value, the computer device stops using test tools such as the fio command to avoid the wear value of the solid-state drive to be tested exceeding the current wear value range of the current life cycle stage. For example, the wear value of the solid-state drive to be tested is the PE value, and the entire life cycle is divided into multiple life cycle stages with PE value ranges of 0 to 1000, 3000, 5000, 7000, 9000, and 10000. Among these PE value ranges, 1000, 3000, 5000, 7000, 9000, and 10000 can all be regarded as the second target wear values, which respectively represent the expected wear degrees of the solid-state drive to be tested in different life cycle stages. Any value within the wear value range corresponding to each life cycle stage among these PE value ranges can also be regarded as the second target wear value.

[0084] Optionally, the computer device ensures that the solid-state drive to be tested is powered on and in a normal working state, and has been formatted according to preset conditions, and records the initial wear value of the solid-state drive to be tested at this time (usually zero wear). The computer device uses the fio command to configure the I / O pressure parameter of the solid-state drive to be tested to be greater than the preset pressure, so as to simulate the data read and write operations of the solid-state drive to be tested in a high-load environment and accelerate the wear process of the solid-state drive to be tested. The computer device continuously issues the second instruction (fio command) to start applying high-load read and write pressure to the solid-state drive to be tested. This process will continue until the wear value of the solid-state drive to be tested reaches the predetermined second target wear value, that is, the target wear value of the current life cycle stage. During the process of increasing the wear value, the computer device regularly uses the third instruction (nvme smart-log or nvmevendor-log command) to query the current wear value of the solid-state drive to be tested to monitor the wear progress. Once it is confirmed through the third instruction that the wear value of the solid-state drive to be tested reaches the second target wear value, the computer device immediately stops issuing the fio command to ensure that the solid-state drive to be tested accurately stays in the wear state of the current life cycle stage and avoids uncontrollable test results caused by excessive wear. After stopping the wear operation, the computer device uses a performance testing tool to test the specified performance items of the solid-state drive to be tested, such as read and write speed, latency, number of I / O operations, etc., and records the performance data in the current wear state. The computer device takes the next life cycle stage of the current life cycle stage as the new current life cycle stage, and takes the second target wear value of the solid-state drive to be tested in the current life cycle stage as the initial wear value of the new current life cycle stage, and repeats the second intervention operation until the test values of each life cycle stage within the entire life cycle are obtained.

[0085] For example, the solid state drive (SSD) to be tested is in the first life cycle stage with an initial wear value of 0. At the start of the test, the SSD to be tested has not experienced any wear. Through the second intervention operation, that is, continuously issuing the second instruction (such as configuring a high-intensity I / O pressure and using the fio tool for read and write operations), the wear value of the SSD to be tested is increased from 0 until it reaches the second target wear value (such as a PE value of 1000). When the wear value of the SSD to be tested reaches 1000, the increase in the wear value is stopped, and the performance of the SSD to be tested in this wear state is tested. After completing the performance test of the current life cycle stage (when the wear value is 1000), 1000 is used as the initial wear value for the next test stage. The test team performs the second intervention operation again to increase the wear value of the SSD to be tested from 1000, aiming to reach the second target wear value of the next stage, such as 1100 (this is just an example number, and the actual target value may be set according to the characteristics of the SSD to be tested). Repeat the above steps to continuously increase the wear value of the SSD to be tested until the second target wear values of all predefined life cycle stages are reached. At the end of each stage, a performance test is conducted to comprehensively evaluate how the performance of the SSD to be tested changes as the wear value increases.

[0086] Through this embodiment, a method is provided to gradually simulate and test the performance under different wear states starting from the initial stage of the entire life cycle of the SSD to be tested, which solves the problem of insufficient testing of specific wear value states in related testing methods. Through this method, it can be ensured that the performance of the SSD to be tested is comprehensively evaluated throughout its entire service life; by using the second instruction, the wear process of the SSD to be tested can be accelerated to quickly reach the set second target wear value. Compared with natural wear or conventional use testing, the testing cycle is significantly shortened and the testing efficiency is improved, which is particularly important for rapid feedback and product iteration in the R & D stage.

[0087] In an exemplary embodiment, the method of directly modifying the wear value of the SSD to be tested and the method of increasing the wear value by continuously issuing fio instructions are used to test the same batch of SSDs to be tested at the same test point (that is, the first target wear value and the second target wear value are the same). The test results show that the performance test conducted by the method of directly modifying the wear value for performance testing is basically the same as the actual performance test value obtained by the method of increasing the wear value by continuously issuing fio instructions, with little difference. The standard performance gap within 7kvslk (comparing 7000 times of PE and 1000 times of PE) is very small, and the deviation is almost within 5%. The standard performance gap within 10kvslk (comparing 10000 times of PE and 1000 times of PE) is also very small, and the deviation is almost also within 5%. As the PE increases, the performance of the disk shows almost no downward trend, indicating that the performance of the disk is stable throughout the life cycle.

[0088] During the test process of increasing the wear value by continuously issuing fio commands, increasing the PE value is a very long process. When testing according to the maximum pressure used by fio, it takes at least 1 hour to increase each PE value. Then, for 1000 PEs, it takes 1000 hours (41 days), and for 10000 PEs, it takes at least 10000 hours (410 days).

[0089] Therefore, it can be concluded that the method of "performing performance testing by directly modifying the wear value" can replace the method of "increasing the wear value by continuously issuing fio commands". The method of "performing performance testing by directly modifying the wear value" greatly shortens the testing method for the full-life cycle performance, achieving the effect and purpose of quickly testing the actual performance value of the full-life cycle. The method of "performing performance testing by directly modifying the wear value" can provide data support for the performance data of the full-life cycle of the project during the project R & D stage, provide a quick testing method for R & D to locate problems, and provide quality assurance for product listing.

[0090] In an exemplary embodiment, based on the method of "performing performance testing by directly modifying the wear value" and the method of "increasing the wear value by continuously issuing fio commands", this embodiment can be further extended to obtain the following solutions:

[0091] Use the first command in the method of "performing performance testing by directly modifying the wear value" to directly modify the wear value of the solid-state drive under test to the first target wear value to quickly cover different stages of the life cycle of the solid-state drive under test. After verifying that the wear value modification is successful and there is no abnormality, execute the method of "increasing the wear value by continuously issuing fio commands", that is, start continuously increasing from the first target wear value, and use the fio tool to perform long-term read and write operations under the specified I / O pressure (such as bs, iodepth parameter configuration). Monitor the natural increase of the first target wear value until the first target wear value reaches the second target wear value. Use fio to perform performance testing, including testing specified performance items such as read and write bandwidth, latency, and IOPS. For example, use the first command to modify the wear value from 0 to 578, where the first target wear value is 578; use 578 as the initial wear value corresponding to the first life cycle stage, and continuously issue the second command to the solid-state drive under test to continuously increase the wear value of the solid-state drive under test from the initial wear value corresponding to the current life cycle stage (such as 578) until it increases to the second target wear value (such as 1000); repeat the execution until all preset key wear points are covered, and complete the performance testing of the full life cycle of the solid-state drive under test.

[0092] In this embodiment, the wear value of the solid-state drive (SSD) to be tested is directly modified to a preset first target wear value, and this operation can be completed in an extremely short time, effectively avoiding the long process of reaching these wear points through natural use. For example, if it takes months or even years to reach a 3k PE value through natural wear, direct modification can be achieved within a few minutes, thus significantly accelerating the test cycle. Starting from the preset first target wear value, the fio tool is used to continuously increase the wear value, simulating the I / O pressure in the actual usage environment. The obtained performance data more realistically reflects the behavior of the SSD to be tested at different wear stages in actual applications, enhancing the reliability of the test results. In summary, directly modifying the wear value to the first target wear value and then conducting performance tests by simulating actual wear ensures that the tests comprehensively cover the entire life cycle of the SSD to be tested. At the same time, it reduces the consumption of hardware resources in long-term natural wear tests and realizes the rational utilization of resources.

[0093] In an exemplary embodiment, for a specified performance item, performance tests are respectively conducted on the SSD to be tested in wear states corresponding to multiple life cycle stages, and test values corresponding to the specified performance item and multiple life cycle stages are obtained, including:

[0094] For the current life cycle stage, multiple performance test cases are retrieved through a fourth instruction; the fourth instruction is used to screen multiple performance test cases from a test case library; the multiple performance test cases are used to test the specific value of the specified performance item of the SSD to be tested in the current life cycle stage; the SSD to be tested is subjected to performance tests using the multiple performance test cases, and a test value corresponding to the specified performance item and the current life cycle stage is obtained.

[0095] Among them, the fourth instruction refers to a command or operation used to retrieve or screen specific performance test cases from a test case library. In the test environment of a solid-state drive (SSD to be tested), this generally means executing a script or program that can automatically or manually select a series of predefined performance test cases according to the current life cycle stage to be tested and the wear state of the SSD to be tested. These performance test cases may be included in the test case library of the SSD to be tested, and the library contains various different types of test cases designed to cover all aspects of the performance test of the SSD to be tested.

[0096] A performance test case is a preset series of operations or scripts used to test the performance metrics of a solid-state drive (SSD) under test under specific conditions, such as read / write speed, latency, IOPS (input / output operations per second), etc. These test cases are usually designed to simulate different workloads and usage scenarios to comprehensively understand the performance of the SSD under test under various conditions. In the life cycle test of the SSD under test, the performance test cases may target different wear value ranges to evaluate how the performance of the SSD under test changes with the increase in usage time.

[0097] Optionally, in the current life cycle stage, the computer device first identifies the specified performance items to be tested, including but not limited to read / write bandwidth, IOPS, latency, etc. When the wear value of the SSD under test reaches the first target wear value or the second target wear value, the computer device executes the fourth instruction to screen out the performance test cases that match the current life cycle stage and wear state from the test case library, and runs the screened performance test cases to perform tests such as read / write operations, random access, and sequential read / write on the SSD under test to simulate the load in the actual application environment, and obtain the test values corresponding to the specified performance items and the current life cycle stage.

[0098] Through this embodiment, multiple performance test cases are called from the test case library by the fourth instruction, ensuring that the test scheme can comprehensively cover the performance of the SSD under test in different life cycle stages, and making up for the deficiency of the relevant test methods in testing specific wear values (PE values).

[0099] In an exemplary embodiment, the performance test result of the SSD under test is determined according to the test values corresponding to the specified performance items and multiple life cycle stages, including:

[0100] When the test values corresponding to the specified performance items and multiple life cycle stages all meet the preset conditions, it is determined that the performance test result of the SSD under test is that the SSD under test is normal; when the test value corresponding to the specified performance item and at least one life cycle node among multiple life cycle stages does not meet the preset conditions, it is determined that the performance test result of the SSD under test is that the SSD under test is abnormal.

[0101] Among them, the preset conditions refer to the performance thresholds or expected standards set for specific performance metrics in different life cycle stages, used to evaluate whether the performance of the SSD under test in each wear state reaches or exceeds the expectation. The preset conditions can be the lower limit of performance (such as the minimum bandwidth, the lowest IOPS, etc.) to ensure that the SSD under test can maintain a basic performance level even in a high wear state, or the upper limit of performance, used to evaluate whether the performance of the SSD under test has reached or approached its design peak in the early stage of the life cycle.

[0102] Optionally, the computer device pre-determines performance test items and preset conditions, performs performance tests on the solid-state drive to be tested under different wear values during its entire life cycle, obtains the actual test values of the specified performance item corresponding to multiple life cycle stages, and compares the actual test values of the specified performance item in each life cycle stage with the preset conditions. If the test values of the specified performance item meet the preset conditions in all stages, then it can be determined that the performance test result of the solid-state drive to be tested is "no abnormality", that is, the solid-state drive to be tested can maintain good performance throughout its life cycle. If in any stage, the test value of the specified performance item does not meet the preset conditions, then it can be determined that the performance test result of the solid-state drive to be tested is "abnormal", indicating that the performance of the solid-state drive to be tested fails to reach the expected stability or reliability within a certain wear range.

[0103] Through this embodiment, in the case where the test values in at least one life cycle stage do not meet the preset conditions, the solid-state drive to be tested is determined to be "abnormal", thereby identifying performance problems at an early stage of the life cycle of the solid-state drive to be tested and avoiding the exposure of performance problems during the customer's use.

[0104] Through the description of the above embodiments, those skilled in the art can clearly understand that the method according to the above embodiments can be implemented by means of software plus a necessary general hardware platform. Of course, it can also be implemented by hardware, but in many cases the former is a better implementation method. Based on such an understanding, the technical solution of the present application, in essence, or the part that contributes to the related technology can be embodied in the form of a software product. The computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk), and includes several instructions for causing a terminal device (which can be a mobile phone, computer, server, or network device, etc.) to execute the methods described in various embodiments of the present application.

[0105] In this embodiment, a performance test device for a solid-state drive is also provided. This device is used to implement the above embodiments and preferred implementation manners, and those that have been described will not be repeated. As used below, the term "module" can be a combination of software and / or hardware that can achieve a predetermined function. Although the devices described in the following embodiments are preferably implemented in software, implementation in hardware, or a combination of software and hardware is also possible and contemplated.

[0106] Figure 5 is a structural block diagram of a performance test device for a solid-state drive according to an embodiment of the present application. As Figure 2 shown, the device includes:

[0107] A wear simulation unit 502 is configured to change the wear value of the solid state drive under test multiple times through a specified accelerated wear intervention strategy to simulate the wear states of multiple life cycle stages in the entire life cycle of the solid state drive under test; the entire life cycle refers to the life cycle of the solid state drive under test from zero wear to the wear value upper limit; different life cycle stages in the multiple life cycle stages correspond to different wear value ranges;

[0108] A performance test unit 504 is configured to perform performance tests on the solid state drive under test in the wear states corresponding to multiple life cycle stages respectively for a specified performance item, and obtain test values corresponding to the specified performance item and multiple life cycle stages;

[0109] A result generation unit 506 is configured to determine the performance test result of the solid state drive under test according to the test values corresponding to the specified performance item and multiple life cycle stages.

[0110] It should be noted that the wear simulation unit 502 in this embodiment can be used to execute the above step S302, the performance test unit 504 in this embodiment can be used to execute the above step S304, and the result generation unit 506 in this embodiment can be used to execute the above step S306.

[0111] In an exemplary embodiment, the wear simulation unit 502 is further configured to:

[0112] Before changing the wear value of the solid state drive under test multiple times through a specified accelerated wear intervention strategy, after the solid state drive under test is normally powered on, format the solid state drive under test according to a specified disk format to obtain a formatted solid state drive under test.

[0113] In an exemplary embodiment, the wear simulation unit 502 is further configured to:

[0114] Before changing the wear value of the solid state drive under test multiple times through a specified accelerated wear intervention strategy, obtain the log information of the solid state drive under test, and determine the current state of the solid state drive under test according to the log information of the solid state drive under test;

[0115] In the case that the solid state drive under test is currently in a normal state, execute the step of changing the wear value of the solid state drive under test multiple times through a specified accelerated wear intervention strategy to simulate the wear states of multiple life cycle stages in the entire life cycle of the solid state drive under test.

[0116] In an exemplary embodiment, the wear simulation unit 502 is further configured to use each life cycle stage in the multiple life cycle stages as the current life cycle stage respectively to perform the following first intervention operation to simulate the wear state of the solid state drive under test in each life cycle stage, and the wear value range corresponding to the current life cycle stage is the current wear value range:

[0117] Send a first instruction to the solid state drive to be tested; the first instruction is used to modify the wear value of the solid state drive to be tested to a first target wear value, so as to simulate the wear state of the solid state drive to be tested in the current life cycle stage through the first target wear value; the first target wear value is any wear value within the current wear value range.

[0118] In an exemplary embodiment, the wear simulation unit 502 is further configured to, after obtaining the test value corresponding to the specified performance item and the current life cycle stage, in the case that the current life cycle stage is not the last life cycle stage among the multiple life cycle stages, restore the wear value of the solid state drive to be tested from the first target wear value to the specified wear value, so as to use the next life cycle stage of the current life cycle stage as the new current life cycle stage and re - execute the first intervention operation.

[0119] In an exemplary embodiment, the multiple life cycle stages include the first life cycle stage in the entire life cycle; the wear values corresponding to different life cycle stages in the entire life cycle increase sequentially starting from the first life cycle stage;

[0120] The wear simulation unit 502 is further configured to, starting from the first life cycle stage, sequentially use each life cycle stage among the multiple life cycle stages as the current life cycle stage to perform the following second intervention operation, and the wear value range corresponding to the current life cycle stage is the current wear value range:

[0121] Continuously send a second instruction to the solid state drive to be tested to continuously increase the wear value of the solid state drive to be tested starting from the initial wear value corresponding to the current life cycle stage; the second instruction is used to simulate the read - write operations performed on the solid state drive to be tested by configuring the I / O pressure of the solid state drive to be tested to be greater than the preset pressure;

[0122] During the process of continuously sending the second instruction to the solid state drive to be tested, query the current wear value of the solid state drive to be tested through a third instruction; the third instruction is used to query the current wear value of the solid state drive to be tested;

[0123] In the case that the current wear value reaches the second target wear value, stop sending the second instruction to the solid state drive to be tested, so as to simulate the wear state of the solid state drive to be tested in the current life cycle stage through the second target wear value; the second target wear value is a wear value specified in advance within the current wear value range;

[0124] Wherein, for the specified performance item, the performance test on the solid state drive to be tested in the wear state corresponding to the current life cycle stage is performed after stopping sending the second instruction to the solid state drive to be tested;

[0125] Among them, the initial wear value corresponding to the first life cycle stage is zero wear; when the next life cycle stage of the current life cycle stage is used as the new current life cycle stage to re-execute the second intervention operation, the initial wear value corresponding to the next life cycle stage is the second target wear value.

[0126] In an exemplary embodiment, the performance testing unit 504 is further configured to, for the current life cycle stage, retrieve a plurality of performance test cases through a fourth instruction; the fourth instruction is used to screen a plurality of performance test cases from a test case library; the plurality of performance test cases are used to test specific values of specified performance items of the solid state drive to be tested in the current life cycle stage; the solid state drive to be tested is performance-tested using the plurality of performance test cases to obtain test values corresponding to the specified performance items and the current life cycle stage.

[0127] In an exemplary embodiment, the result generation unit 506 is further configured to, when the test values corresponding to the specified performance items and multiple life cycle stages all meet the preset conditions, determine that the performance test result of the solid state drive to be tested is that the solid state drive to be tested is normal; when the test value corresponding to the specified performance item and at least one life cycle node among the multiple life cycle stages does not meet the preset conditions, determine that the performance test result of the solid state drive to be tested is that the solid state drive to be tested is abnormal.

[0128] It should be noted that the above-mentioned modules can be implemented by software or hardware. For the latter, it can be implemented in the following ways, but not limited to: the above-mentioned modules are all located in the same processor; or, the above-mentioned modules are respectively located in different processors in any combination form.

[0129] An embodiment of the present application further provides a computer-readable storage medium, in which a computer program is stored, and the computer program is configured to execute the steps in any one of the above method embodiments when running.

[0130] In an exemplary embodiment, the above computer-readable storage medium may include, but is not limited to: USB flash drives, read-only memories (ROM for short), random access memories (RAM for short), mobile hard disks, magnetic disks, or optical disks and other various media that can store computer programs.

[0131] An embodiment of the present application further provides an electronic device, including a memory and a processor. A computer program is stored in the memory, and the processor is configured to run the computer program to execute the steps in any one of the above method embodiments.

[0132] In an exemplary embodiment, the above-mentioned electronic device may further include a transmission device and an input / output device, wherein the transmission device is connected to the above-mentioned processor, and the input / output device is connected to the above-mentioned processor.

[0133] An embodiment of the present application also provides a computer program product, the above-mentioned computer program product includes a computer program, and when the computer program is executed by a processor, it implements the steps in any one of the above-mentioned method embodiments.

[0134] An embodiment of the present application also provides another computer program product, including a non-volatile computer-readable storage medium, the non-volatile computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, it implements the steps in any one of the above-mentioned method embodiments.

[0135] An embodiment of the present application also provides a computer program, the computer program includes computer instructions, and the computer instructions are stored in a computer-readable storage medium; a processor of a computer device reads the computer instructions from the computer-readable storage medium, and the processor executes the computer instructions, so that the computer device executes the steps in any one of the above-mentioned method embodiments.

[0136] According to another aspect of the embodiments of the present application, there is also provided a computer program product, the computer program product includes a computer program / instructions, and the computer program / instructions include program codes for executing the method shown in the flowchart. The computer program product in this embodiment can be applied to the computing system of the electronic device as shown in Figure 6 In such an embodiment, the computer program can be downloaded and installed from the network through the communication part 609, and / or installed from the removable medium 611. When the computer program is executed by the central processing unit 601, it executes various functions provided by the embodiments of the present application. The above-mentioned serial numbers of the embodiments of the present application are only for description and do not represent the advantages and disadvantages of the embodiments.

[0137] As Figure 6 shown, the computer system 600 includes a central processing unit 601, which can perform various appropriate actions and processes according to the program stored in the read-only memory 602 or the program loaded from the storage part 608 into the random access memory 603. In the random access memory 603, various programs and data required for system operation are also stored. The central processing unit 601, the read-only memory 602, and the random access memory 603 are connected to each other through a bus 604. The input / output interface 605 is also connected to the bus 604.

[0138] The following components are connected to the input / output interface 605: an input section 606 including a keyboard, a mouse, etc.; an output section 607 including, for example, a CRT (Cathode Ray Tube), an LCD (Liquid Crystal Display), etc. and a speaker, etc.; a storage section 608 including a hard disk, etc.; and a communication section 609 including a network interface card such as a LAN card, a modem, etc. The communication section 609 performs communication processing via a network such as the Internet. The drive 610 is also connected to the input / output interface 605 as required. A removable medium 611, such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, etc., is installed on the drive 610 as required so that a computer program read therefrom can be installed into the storage section 608 as required.

[0139] Specifically, according to an embodiment of the present application, the processes described in each of the method flowcharts can be implemented as a computer software program. For example, an embodiment of the present application includes a computer program product that includes a computer program carried on a computer-readable medium, and the computer program includes program codes for performing the methods shown in the flowcharts. In such an embodiment, the computer program can be downloaded and installed from a network through the communication section 609, and / or installed from the removable medium 611. When the computer program is executed by the central processing unit 601, various functions defined in the system of the present application are executed.

[0140] It should be noted that Figure 6 the computer system 600 of the electronic device shown is only an example and should not impose any limitation on the functions and usage scope of the embodiments of the present application.

[0141] For the specific examples in this embodiment, reference may be made to the examples described in the above embodiments and the exemplary embodiments, and details are not repeated here.

[0142] Obviously, those skilled in the art should understand that the above-mentioned modules or steps of the present application can be implemented by a general-purpose computing device. They can be concentrated on a single computing device or distributed on a network composed of multiple computing devices. They can be implemented by program codes executable by the computing device, so that they can be stored in a storage device and executed by the computing device. And in some cases, the steps shown or described can be executed in a different order from here, or they can be separately fabricated into individual integrated circuit modules, or multiple modules or steps among them can be fabricated into a single integrated circuit module for implementation. In this way, the present application is not limited to any specific combination of hardware and software.

[0143] The above are only the preferred embodiments of the present application and are not intended to limit the present application. For those skilled in the art, the present application can have various changes and modifications. Any modification, equivalent replacement, improvement, etc. made within the principle of the present application shall be included within the protection scope of the present application.

Claims

1. A method for testing the performance of a solid state drive, characterized in that: include: By using a specified accelerated wear intervention strategy, the wear value of the solid state drive to be tested is changed multiple times to simulate the wear state of the solid state drive to be tested in multiple life cycle stages in the full life cycle; the full life cycle refers to the life cycle of the solid state drive to be tested from zero wear to the upper limit of the wear value; different life cycle stages in the multiple life cycle stages correspond to different wear value ranges; For a specified performance item, respectively perform performance tests on the solid-state hard disk to be tested in the wear state corresponding to the multiple life cycle stages to obtain test values ​​corresponding to the specified performance item and the multiple life cycle stages; A performance test result of the solid state drive to be tested is determined according to the test values ​​corresponding to the specified performance items and the multiple life cycle stages.

2. The method according to claim 1, characterized in that Before the wear value of the solid state drive to be tested is changed multiple times by using the specified accelerated wear intervention strategy, the method further includes: After the solid state hard disk to be tested is powered on normally, the solid state hard disk to be tested is formatted according to a specified disk format to obtain the formatted solid state hard disk to be tested.

3. The method according to claim 1, characterized in that Before the wear value of the solid state drive to be tested is changed multiple times by using the specified accelerated wear intervention strategy, the method further includes: Obtaining log information of the solid-state hard disk to be tested, and determining a current state of the solid-state hard disk to be tested according to the log information of the solid-state hard disk to be tested; When the solid-state hard disk to be tested is currently in a normal state, the step of changing the wear value of the solid-state hard disk to be tested multiple times through a specified accelerated wear intervention strategy is executed to simulate the wear state of the solid-state hard disk to be tested at multiple life cycle stages in its entire life cycle.

4. The method according to any one of claims 1 to 3, characterized in that The specified accelerated wear intervention strategy is used to change the wear value of the solid state drive to be tested multiple times to simulate the wear state of the solid state drive to be tested at multiple life cycle stages in the entire life cycle, including: The following first intervention operation is performed on each of the multiple life cycle stages as the current life cycle stage to simulate the wear state of the solid state drive to be tested in each life cycle stage, and the wear value range corresponding to the current life cycle stage is the current wear value range: A first instruction is sent to the solid-state hard disk to be tested; the first instruction is used to modify the wear value of the solid-state hard disk to be tested to a first target wear value, so as to simulate the wear state of the solid-state hard disk to be tested in the current life cycle stage through the first target wear value; the first target wear value is any wear value within the current wear value range.

5. The method according to claim 4, characterized in that The method of changing the wear value of the solid state drive to be tested multiple times by a specified accelerated wear intervention strategy to simulate the wear state of the solid state drive to be tested at multiple life cycle stages in the entire life cycle also includes: After obtaining the test value corresponding to the specified performance item and the current life cycle stage, if the current life cycle stage is not the last life cycle stage among the multiple life cycle stages, the wear value of the solid state drive to be tested is restored from the first target wear value to the specified wear value, so as to re-execute the first intervention operation with the next life cycle stage of the current life cycle stage as the new current life cycle stage.

6. The method according to any one of claims 1 to 3, characterized in that The multiple life cycle stages include the first life cycle stage in the whole life cycle; the wear values ​​corresponding to the different life cycle stages in the whole life cycle increase in sequence starting from the first life cycle stage; The specified accelerated wear intervention strategy is used to change the wear value of the solid state drive to be tested multiple times to simulate the wear state of the solid state drive to be tested at multiple life cycle stages in the entire life cycle, including: Starting from the first life cycle stage, the following second intervention operation is performed on each of the multiple life cycle stages as the current life cycle stage, and the wear value range corresponding to the current life cycle stage is the current wear value range: Continuously issuing a second instruction to the solid state drive to be tested, so as to continuously increase the wear value of the solid state drive to be tested from an initial wear value corresponding to the current life cycle stage; the second instruction is used to simulate the read and write operations performed on the solid state drive to be tested by configuring the I / O pressure of the solid state drive to be tested to be greater than a preset pressure; In the process of continuously sending the second instruction to the solid state drive to be tested, querying the current wear value of the solid state drive to be tested through a third instruction; the third instruction is used to query the current wear value of the solid state drive to be tested; When the current wear value reaches a second target wear value, stop sending the second instruction to the solid state drive to be tested, so as to simulate the wear state of the solid state drive to be tested in the current life cycle stage through the second target wear value; the second target wear value is a wear value pre-specified within the current wear value range; Wherein, for the specified performance item, the performance test of the solid state drive to be tested in the wear state corresponding to the current life cycle stage is performed after stopping issuing the second instruction to the solid state drive to be tested; Among them, the initial wear value corresponding to the first life cycle stage is zero wear; when the second intervention operation is re-executed with the next life cycle stage of the current life cycle stage as the new current life cycle stage, the initial wear value corresponding to the next life cycle stage is the second target wear value.

7. The method according to claim 6, characterized in that The step of performing performance tests on the solid-state hard disk to be tested in the wear state corresponding to the multiple life cycle stages for the specified performance item to obtain test values ​​corresponding to the multiple life cycle stages for the specified performance item includes: In the current life cycle stage, multiple performance test cases are retrieved through a fourth instruction; the fourth instruction is used to filter multiple performance test cases from a test case library; the multiple performance test cases are used to test the specific values ​​of the specified performance items of the solid state drive to be tested in the current life cycle stage; The multiple performance test cases are used to perform a performance test on the solid-state hard disk to be tested, and a test value corresponding to the specified performance item and the current life cycle stage is obtained.

8. The method according to claim 1, characterized in that The step of determining the performance test result of the solid state drive to be tested according to the test values ​​corresponding to the specified performance items and the multiple life cycle stages includes: When the test values ​​corresponding to the specified performance item and the multiple life cycle stages all meet the preset conditions, determining that the performance test result of the solid state drive to be tested is that the solid state drive to be tested has no abnormality; When the test value corresponding to the specified performance item and at least one life cycle node in the multiple life cycle stages does not meet the preset condition, it is determined that the performance test result of the solid state drive to be tested is that the solid state drive to be tested is abnormal.

9. A performance testing device for a solid state hard disk, characterized in that: include: A wear simulation unit, used to change the wear value of the solid state drive to be tested multiple times through a specified accelerated wear intervention strategy, so as to simulate the wear state of the solid state drive to be tested in multiple life cycle stages in the full life cycle; the full life cycle refers to the life cycle of the solid state drive to be tested from zero wear to the upper limit of the wear value; different life cycle stages in the multiple life cycle stages correspond to different wear value ranges; A performance testing unit, configured to perform performance tests on the solid-state hard disk to be tested in the wear state corresponding to the multiple life cycle stages for the specified performance items, respectively, to obtain test values ​​corresponding to the specified performance items and the multiple life cycle stages; The result generating unit is used to determine the performance test result of the solid state drive to be tested according to the test values ​​corresponding to the specified performance items and the multiple life cycle stages.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, wherein the computer program implements the steps of the method described in any one of claims 1 to 8 when executed by a processor.

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