MBIST test method and device, electronic equipment and computer readable storage medium

Abstract

The embodiment of the invention provides an MBIST test method and device, electronic equipment and a computer readable storage medium. The method comprises the following steps: sending test configuration information to a test module in MBIST through a main control processor; generating a test excitation signal according to the test configuration information through an MBIST internal test module, and sending the test excitation signal to an MBIST control module; performing control processing on an MBIST test module through an MBIST control module according to the test excitation signal so as to perform MBIST test processing on the static random access memory and obtain an MBIST test result; an MBIST test result is fed back to a test module in the MBIST; and obtaining an MBIST test result from the MBIST internal test module through the main control processor. According to the scheme of the embodiment of the invention, the MBIST test can be simplified in the finished product test stage.

Description

Technical Field

[0001] The present invention relates to the technical field of chip testing, and particularly relates to an MBIST testing method, device, electronic device, and computer-readable storage medium. Background Art

[0002] For the Memory Built-In Self-Test (MBIST) of Static Random Access Memory (SRAM), during the wafer probe test stage, the MBIST circuit inside the chip is activated by inputting signal excitation through the probes of the integrated circuit automatic tester via the pin pads, and the test results are read back to the integrated circuit automatic tester to determine whether there are faults in the SRAM using the integrated circuit automatic tester. However, it is still possible to introduce SRAM-related faults during the subsequent packaging process, and implementing the same MBIST test as in the wafer probe test stage during the final product test will become relatively complicated. Summary of the Invention

[0003] The present invention aims to at least solve one of the technical problems existing in the prior art.

[0004] To this end, the present invention proposes an MBIST testing method that can simplify the MBIST test during the final product test stage.

[0005] The present invention also proposes a device applying the above MBIST testing method.

[0006] The present invention also proposes an electronic device applying the above MBIST testing method.

[0007] The present invention also proposes a computer-readable storage medium applying the above MBIST testing method.

[0008] The MBIST testing method according to the first aspect embodiment of the present invention is applied to an MBIST testing device. The MBIST testing device includes a main control processor, an MBIST internal testing module, an MBIST control module, an MBIST testing module, and a static random access memory. The main control processor, the MBIST internal testing module, the MBIST control module, the MBIST testing module, and the static random access memory are connected in sequence. The method includes:

[0009] Sending test configuration information from the main control processor to the MBIST internal testing module;

[0010] The in-MBIST test module generates a test excitation signal according to the test configuration information, and sends the test excitation signal to the MBIST control module;

[0011] The MBIST control module controls and processes the MBIST test module according to the test excitation signal to perform MBIST test processing on the static random access memory, obtaining an MBIST test result; and feeds back the MBIST test result to the in-MBIST test module;

[0012] The main control processor obtains the MBIST test result from the in-MBIST test module.

[0013] According to some embodiments of the present invention, the MBIST test device further includes a multiplexer, the multiplexer is connected between the in-MBIST test module and the MBIST control module, and the input end of the multiplexer is further connected to an integrated circuit automatic test machine. Before the MBIST control module controls and processes the MBIST test module according to the test excitation signal to perform MBIST test processing on the static random access memory and obtain an MBIST test result, the method further includes:

[0014] The integrated circuit automatic test machine generates the test excitation signal and sends the test excitation signal to the multiplexer;

[0015] The multiplexer selects and processes the test excitation signal sent by the in-MBIST test module and the test excitation signal sent by the integrated circuit automatic test machine.

[0016] According to some embodiments of the present invention, the in-MBIST test module includes a register module, an excitation generation module, and a test mode storage module. The process that the in-MBIST test module generates a test excitation signal according to the test configuration information and sends the test excitation signal to the MBIST control module includes:

[0017] The register module receives the test configuration information sent by the main control processor; and reads the test mode information from the test mode storage module to the excitation generation module according to the test configuration information;

[0018] The excitation generation module generates the test excitation signal according to the test mode information; and sends the test excitation signal to the MBIST control module.

[0019] According to some embodiments of the present invention, the feedback of the MBIST test result to the in-MBIST test module includes:

[0020] Sending the MBIST test result to the register module through the MBIST control module.

[0021] According to some embodiments of the present invention, the obtaining of the MBIST test result from the in-MBIST test module by the main control processor includes:

[0022] Reading the MBIST test result from the register module by the main control processor;

[0023] Transferring and storing the MBIST test result to a preset non-volatile memory by the main control processor.

[0024] According to some embodiments of the present invention, before the main control processor sends test configuration information to the in-MBIST test module, the method further includes:

[0025] Configuring the working environment of the MBIST test device by the main control processor so that the MBIST test device enters the test mode.

[0026] According to some embodiments of the present invention, the sending of the test configuration information to the in-MBIST test module by the main control processor includes:

[0027] Obtaining a running program;

[0028] Generating the test configuration information according to the running program by the main control processor and sending the test configuration information to the in-MBIST test module.

[0029] According to the MBIST test device of the second aspect embodiment of the present invention, the MBIST test device includes a main control processor, an in-MBIST test module, an MBIST control module, an MBIST test module, and a static random access memory, and the main control processor, the in-MBIST test module, the MBIST control module, the MBIST test module, and the static random access memory are connected in sequence; wherein,

[0030] The main control processor is configured to send test configuration information to the in-MBIST test module;

[0031] The in-MBIST test module is configured to generate a test excitation signal according to the test configuration information and send the test excitation signal to the MBIST control module;

[0032] The MBIST control module is used to perform MBIST test processing on the static random access memory according to the test excitation signal, obtain the MBIST test result, and feedback the MBIST test result to the in-MBIST test module;

[0033] The main control processor is further used to obtain the MBIST test result from the in-MBIST test module.

[0034] An electronic device according to an embodiment of the third aspect of the present invention includes: a memory, a processor, and a computer program stored on the memory and executable on the processor. When the processor executes the computer program, the above-mentioned MBIST test method is implemented.

[0035] A computer-readable storage medium according to an embodiment of the fourth aspect of the present invention stores computer-executable instructions. When the computer-executable instructions are executed by a control processor, the above-mentioned MBIST test method is implemented.

[0036] The MBIST test method according to the embodiment of the present invention has at least the following beneficial effects: During the MBIST test process, first, the main control processor sends test configuration information to the in-MBIST test module; then, the in-MBIST test module generates a test excitation signal according to the test configuration information and sends the test excitation signal to the MBIST control module; then, the MBIST control module performs control processing on the MBIST test module according to the test excitation signal to implement MBIST test processing on the static random access memory, and the MBIST test result can be obtained; and the MBIST test result is feedback to the in-MBIST test module; finally, the main control processor obtains the MBIST test result from the in-MBIST test module. Through the above technical solution, an in-MBIST test module is provided inside the MBIST test device, and the main control processor and the in-MBIST test module are used to mobilize the MBIST test, so that the test process can be separated from the integrated circuit automatic test machine, and the random access memory can be tested after the chip is packaged and used for a long time. The whole process is simple and fast.

[0037] Other features and advantages of the present invention will be described in the following specification, and, in part, will be obvious from the specification, or will be understood by implementing the present invention. The objectives and other advantages of the present invention can be realized and obtained by the structures specifically pointed out in the specification, the claims, and the drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] The accompanying drawings are used to provide a further understanding of the technical solutions of the present disclosure, and constitute a part of the specification. Together with the embodiments of the present disclosure, they are used to explain the technical solutions of the present disclosure, and do not constitute a limitation to the technical solutions of the present disclosure.

[0039] Figure 1 is a flowchart of an MBIST test method provided by an embodiment of the present invention;

[0040] Figure 2 is a schematic structural diagram of an MBIST test device provided by an embodiment of the present invention;

[0041] Figure 3 is a flowchart of an MBIST test method provided by another embodiment of the present invention;

[0042] Figure 4 is Figure 1 a sub - flowchart of step S200 in

[0043] Figure 5 is a schematic structural diagram of an in - MBIST test module provided by an embodiment of the present invention;

[0044] Figure 6 is a flowchart of a method for feeding back an MBIST test result to an in - MBIST test module provided by an embodiment of the present invention;

[0045] Figure 7 is Figure 1 a sub - flowchart of step S400 in

[0046] Figure 8 is a sub - flowchart before sending test configuration information to an in - MBIST test module by a main control processor provided by an embodiment of the present invention;

[0047] Figure 9 is Figure 1 a sub - flowchart of step S100 in

[0048] Figure 10 is a schematic structural diagram of an electronic device provided by an embodiment of the present invention. Detailed Embodiments

[0049] In order to make the objectives, technical solutions and advantages of the present invention clearer and more understandable, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention.

[0050] In the description of the present invention, "a number of" means one or more, "a plurality of" means more than two, and understandings such as "greater than", "less than", "exceeding", etc. do not include the corresponding number, while understandings such as "above", "below", "within", etc. include the corresponding number. If there is a description of "first" and "second", it is only for the purpose of distinguishing technical features and cannot be understood as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features or implicitly specifying the sequence relationship of the indicated technical features.

[0051] In the description of the present invention, unless otherwise clearly defined, terms such as "set", "installed", "connected", etc. should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above terms in the present invention in combination with the specific content of the technical solution.

[0052] The present invention provides an MBIST test method, device, electronic device and computer-readable storage medium. The method includes: during the process of performing MBIST testing, first, the master processor sends test configuration information to the in-MBIST test module; then, the in-MBIST test module generates a test excitation signal according to the test configuration information and sends the test excitation signal to the MBIST control module; then, the MBIST control module performs control processing on the MBIST test module according to the test excitation signal to implement MBIST testing on the static random access memory, and then the MBIST test result can be obtained; and the MBIST test result is fed back to the in-MBIST test module; finally, the master processor obtains the MBIST test result from the in-MBIST test module. Through the above technical solution, an in-MBIST test module is provided inside the MBIST test device, and the master processor and the in-MBIST test module are used to initiate MBIST testing, so that the testing process can be separated from the integrated circuit automatic test machine, and the random access memory can be tested after the chip is packaged and used for a long time. The whole process is simple and fast.

[0053] The following further elaborates on the embodiments of the present invention in conjunction with the accompanying drawings.

[0054] As Figure 1 shown, Figure 1 is a flowchart of an MBIST test method provided by an embodiment of the present invention. This method is applied to an MBIST test device. The MBIST test device includes a master processor, an in-MBIST test module, an MBIST control module, an MBIST test module and a static random access memory. The master processor, the in-MBIST test module, the MBIST control module, the MBIST test module and the static random access memory are connected in sequence. The method includes but is not limited to steps S100, step S200, step S300 and step S400:

[0055] Step S100: Send test configuration information to the test module within MBIST through the main control processor;

[0056] Step S200: Generate a test excitation signal according to the test configuration information through the test module within MBIST, and send the test excitation signal to the MBIST control module;

[0057] Step S300: Control and process the MBIST test module according to the test excitation signal through the MBIST control module to implement MBIST test processing on the static random access memory, and obtain the MBIST test result; and feedback the MBIST test result to the test module within MBIST;

[0058] Step S400: Obtain the MBIST test result from the test module within MBIST through the main control processor.

[0059] It should be noted that during the MBIST test process, first, the main control processor sends test configuration information to the test module within MBIST; then, the test module within MBIST generates a test excitation signal according to the test configuration information and sends the test excitation signal to the MBIST control module; then, the MBIST control module controls and processes the MBIST test module according to the test excitation signal to implement MBIST test processing on the static random access memory, and the MBIST test result can be obtained; and the MBIST test result is feedback to the test module within MBIST; finally, the main control processor obtains the MBIST test result from the test module within MBIST. Through the above technical solution, a test module within MBIST is provided inside the MBIST test device, and the main control processor and the test module within MBIST are used to mobilize the MBIST test, so that the test process can be separated from the integrated circuit automatic test machine, and the test of the random access memory can be realized after the chip is packaged and used for a long time. The whole process is simple and fast.

[0060] As Figure 2 shown, the MBIST test method of the embodiment of the present invention is applied to an MBIST test device, and the MBIST test device can be Figure 2The chip 100 therein; the chip 100 includes a main control processor 110, an on-chip MBIST test module 120, an MBIST control module 130, an MBIST test module 140, and a static random access memory 150, and the main control processor 110, the on-chip MBIST test module 120, the MBIST control module 130, the MBIST test module 140, and the static random access memory 150 are connected in sequence; wherein, the MBIST test module 140 is responsible for performing read and write test stimuli on the corresponding static random access memory 150; the MBIST control module 130 is responsible for controlling and processing each MBIST test module 140; the on-chip MBIST test module 120 is used for controlling and processing the MBIST control module 130; the main control processor 110 is used for controlling and processing the on-chip MBIST test module 120. In an MBIST test device, multiple MBIST test modules 140 and multiple static random access memories 150 can be included; each MBIST test module 140 corresponds to a static random access memory 150, and each MBIST test module 140 can perform test processing on the static random access memory 150 connected thereto.

[0061] It should be noted that a static random access memory is a high-speed random access memory. This kind of memory has a fast access speed and is usually used in the caches of computers and other electronic devices. A static random access memory is a volatile memory; compared with a dynamic random access memory, a static random access memory does not require a refresh operation when maintaining data, so the power consumption is relatively low; a static random access memory can support parallel access of multiple data bits, which can further improve the data transmission efficiency.

[0062] It should be noted that the main control processor in the embodiments of the present invention can be a main control central processing unit, and the main control central processing unit is responsible for executing program instructions, processing data, and controlling other parts of the chip. The main control central processing unit executes instructions stored in an internal or external memory of the chip. The main control central processing unit can also process data from various input devices and generate outputs to output devices; the main control central processing unit controls other components of the chip, such as memory, input / output ports, etc. There is a set of registers inside the main control central processing unit for storing instructions, data, and addresses. The clock frequency of the main control central processing unit determines the speed at which it executes instructions, usually measured in hertz.

[0063] It should be noted that the main control processor can send test configuration information to the test module within MBIST to configure the test module within MBIST, making preparations for subsequent MBIST tests. After receiving the test configuration information, the test module within MBIST can generate test excitation signals, and then send the test excitation signals to the MBIST control module. Subsequently, the MBIST control module can perform excitation control processing on the MBIST test module according to the test excitation signals, so that the MBIST test module can perform MBIST test processing on the connected static random access memories respectively to obtain MBIST test results. After the test is completed, the MBIST control module can feedback the MBIST test results to the test module within MBIST. Finally, the main control processor can obtain the MBIST test results from the test module within MBIST. Through the above technical solution, the main control processor and the test module within MBIST are used to overall control the MBIST test processing, getting rid of the integrated circuit automatic test machine, realizing the test processing of the random access memory after the chip is packaged and used for a long time, making the entire MBIST test process more simple and fast.

[0064] In addition, in an embodiment, the MBIST test device further includes a multiplexer, which is connected between the test module within MBIST and the MBIST control module. The input end of the multiplexer is also connected to the integrated circuit automatic test machine, such as Figure 3 shown, before performing the above step S300, it may further include but is not limited to steps S510 to S520.

[0065] Step S510, generating test excitation signals through the integrated circuit automatic test machine and sending the test excitation signals to the multiplexer;

[0066] Step S520, performing selection processing on the test excitation signals sent by the test module within MBIST and the test excitation signals sent by the integrated circuit automatic test machine through the multiplexer.

[0067] It should be noted that the MBIST test device further includes a multiplexer, which is connected between the test module within the MBIST and the MBIST control module. The input end of the multiplexer can also be connected to an integrated circuit automatic test machine. During the MBIST test process, in addition to using the MBIST control module to receive the test excitation signal transmitted from the test module within the MBIST, the integrated circuit automatic test machine can also be used to generate a test excitation signal, and then the generated test excitation signal is sent to the multiplexer. Finally, the multiplexer can be used to select and process the test excitation signal sent by the test module within the MBIST and the test excitation signal sent by the integrated circuit automatic test machine. The multiplexer has the characteristic of selecting one of the two inputs for output. Therefore, in the actual test process, one of the generated test excitation signals can be selected to control and process the MBIST control module, making the MBIST test process more flexible and convenient to well adapt to different test scenarios.

[0068] It is worth noting that the MBIST test device further includes a multiplexer, which is connected between the test module within the MBIST and the MBIST control module. The input end of the multiplexer is also connected to an integrated circuit automatic test machine. The multiplexer mainly functions to select the test excitation signal. Through the above technical solution, it can well adapt to different test scenarios, making the MBIST test process more flexible.

[0069] Exemplarily, as Figure 2 shown, a multiplexer 160 can also be provided between the test module 120 within the MBIST and the MBIST control module 130. The multiplexer 160 can select whether the test excitation signal is obtained from the side of the integrated circuit automatic test machine or from the side of the main control processor. Through the above method, the MBIST test process can be made more comprehensive and flexible.

[0070] In addition, in an embodiment, as Figure 4 shown, the test module within the MBIST includes a register module, an excitation generation module, and a test mode storage module. The above step S200 can include but is not limited to step S210 and step S220.

[0071] Step S210, receiving the test configuration information sent by the main control processor through the register module; and reading the test mode information from the test mode storage module to the excitation generation module according to the test configuration information;

[0072] Step S220, generating a test excitation signal by the excitation generation module according to the test mode information; and sending the test excitation signal to the MBIST control module.

[0073] It should be noted that the in-MBIST test module further includes a register module, an excitation generation module, and a test mode storage module. During the process of generating a test excitation signal by the in-MBIST test module according to the test configuration information and sending the test excitation signal to the MBIST control module, the register module can receive the test configuration information sent by the main control processor, and then read the test mode information from the test mode storage module into the excitation generation module according to the test configuration information; finally, the excitation generation module can generate a test excitation signal according to the test mode information and send the test excitation signal to the MBIST control module, so that the MBIST control module can perform control processing on each MBIST test module according to the test excitation signal, thereby enabling test processing on each static random access memory; using the main control processor and the in-MBIST test module to perform test processing on the static random access memory is independent of the integrated circuit automatic test machine, enabling convenient and fast MBIST test processing on the chip even when the chip is in the packaged state.

[0074] It is worth noting that the register module is used to control and start the operation of the in-MBIST test module, such as the number of times of loop testing required during the test, and whether a certain static random access memory needs to be covered in this test. The test mode storage module stores the mode for starting the operation of the MBIST control module; the excitation generation module reads the test mode information from the test mode storage module and generates an excitation signal to be sent to the MBIST control module, so that the MBIST control module can perform control processing on the MBIST test module according to the test mode information to perform MBIST test processing on each static random access memory.

[0075] Exemplarily, such as Figure 5As shown, the in-MBIST test module 120 further includes a register module 121, an excitation generation module 122, and a test mode storage module 123. During the process of generating a test excitation signal by the in-MBIST test module 120 according to the test configuration information and sending the test excitation signal to the MBIST control module 130, the register module 121 can receive the test configuration information sent by the main control processor, and then read the test mode information from the test mode storage module 123 into the excitation generation module 122 according to the test configuration information; finally, the excitation generation module 122 can generate a test excitation signal according to the test mode information and send the test excitation signal to the MBIST control module 130, so that the MBIST control module 130 can perform control processing on each MBIST test module according to the test excitation signal, thereby enabling test processing on each static random access memory. A multiplexer 160 can also be provided between the excitation generation module 122 and the MBIST control module 160. The multiplexer 160 can select the test excitation signal in an alternative manner, making the process of MBIST testing more flexible and reliable.

[0076] In addition, in one embodiment, as Figure 6 shown, feeding back the MBIST test result to the in-MBIST test module may include, but is not limited to, step S610.

[0077] Step S610: Send the MBIST test result to the register module through the MBIST control module.

[0078] It should be noted that during the process of feeding back the MBIST test result to the in-MBIST test module, the MBIST control module can send the MBIST test result feedback to the register module, so that the subsequent main control processor can read the corresponding MBIST test result from the register module of the in-MBIST test module. The whole process is simple and reliable, facilitating testers to simply and quickly understand the test situation of the chip's MBIST test.

[0079] In addition, in one embodiment, as Figure 7 shown, the above step S400 may include, but is not limited to, step S410 and step S420.

[0080] Step S410: Read the MBIST test result from the register module through the main control processor;

[0081] Step S420: Transfer the MBIST test result to a preset non-volatile memory through the main control processor.

[0082] It should be noted that in the process of obtaining the MBIST test result from the in-MBIST test module by the main control processor, the MBIST test result can be first read from the register module by the main control processor; then the main control processor transfers and stores the MBIST test result into a pre-set non-volatile memory, so that the storage of the test result can be more reliable, and then it is convenient for subsequent result viewing and processing.

[0083] It is worth noting that a non-volatile memory is a type of computer memory that can retain the stored information even after a power outage. In contrast, volatile memory requires continuous power supply to retain data. Non-volatile memory generally refers to being stored in a semiconductor memory chip, storing data in a floating-gate storage unit composed of floating-gate metal-oxide semiconductor field-effect transistors, including flash memory storage such as NAND flash memory and solid-state drives. Other examples of non-volatile memory include read-only memory, erasable programmable read-only memory, and electrically erasable programmable read-only memory, most types of computer data storage devices (such as disk memory, hard disk drives, optical discs, floppy disks, and magnetic tapes), and early computer storage methods such as punched tapes and cards. The present invention does not limit the type of non-volatile memory.

[0084] In addition, in one embodiment, as Figure 8 shown, before the main control processor sends test configuration information to the in-MBIST test module, it may further include but is not limited to step S710.

[0085] Step S710: Use the main control processor to perform working environment configuration processing on the MBIST test device so that the MBIST test device enters the test mode.

[0086] It should be noted that before performing the MBIST test, the chip needs to enter the test mode. Therefore, the main control processor can be used to perform working environment configuration processing on the MBIST test device, so that the MBIST test device can enter the test mode, and then the chip can be subjected to MBIST test processing subsequently.

[0087] It is worth noting that the chip first uses the main control processor to configure the working environment and the in-MBIST test module in the normal working mode, then starts the chip to enter the MBIST test mode. After all the static random access memory tests are completed, the chip returns to the normal working module again, and the main control processor runs the program again to read the test result from the register module in the in-MBIST test module. The entire process of the MBIST test can be more stable and reliable, making the MBIST test more accurate.

[0088] In addition, in one embodiment, asFigure 9 As shown in Figure 9 , step S100 may include but is not limited to step S110 and step S120.

[0089] Step S110, obtain the running program;

[0090] Step S120, generate test configuration information according to the running program by the main control processor, and send the test configuration information to the in-MBIST test module.

[0091] It should be noted that in the process of sending the test configuration information to the in-MBIST test module by the main control processor, first, the running program can be obtained, then the test configuration information can be generated by the main control processor according to the running program, and then the test configuration information can be sent to the in-MBIST test module, so that the in-MBIST test module can control and process the running process of the MBIST control module.

[0092] It is worth noting that the tester can adjust the running program to adjust the parameters in the MBIST test process, and then can simply and quickly control and process the MBIST test process, which brings great convenience to the tester.

[0093] In some embodiments of the present invention, an embodiment of the present invention further provides an MBIST test device. The MBIST test device includes a main control processor, an in-MBIST test module, an MBIST control module, an MBIST test module, and a static random access memory. The main control processor, the in-MBIST test module, the MBIST control module, the MBIST test module, and the static random access memory are connected in sequence; wherein,

[0094] The main control processor is used to send test configuration information to the in-MBIST test module;

[0095] The in-MBIST test module is used to generate a test excitation signal according to the test configuration information, and send the test excitation signal to the MBIST control module;

[0096] The MBIST control module is used to perform MBIST test processing on the static random access memory according to the test excitation signal to obtain an MBIST test result; and feedback the MBIST test result to the in-MBIST test module;

[0097] The main control processor is further used to obtain the MBIST test result from the in-MBIST test module.

[0098] It is worth noting that the MBIST test device in the embodiment of the present invention can be Figure 2The chip 100 in the embodiment. The specific implementation of this MBIST test device is basically the same as the specific embodiments of the above MBIST test method, and will not be elaborated here.

[0099] In some embodiments of the present invention, as Figure 10 shown, an embodiment of the present invention further provides an electronic device 700, including: a memory 720, a processor 710, and a computer program stored on the memory 720 and executable on the processor 710. When the processor 710 executes the computer program, it implements the MBIST test method in the above embodiments. For example, it executes the method steps S100 to step S400 described above Figure 1 in, Figure 3 the method steps S510 to step S520 in, Figure 4 the method steps S210 to step S220 in, Figure 6 the method step S610 in, Figure 7 the method steps S410 to step S420 in, Figure 8 the method step S710 in and Figure 9 the method steps S110 to step S120 in.

[0100] In some embodiments of the present invention, an embodiment of the present invention further provides a computer-readable storage medium. The computer-readable storage medium stores computer-executable instructions. When the computer-executable instructions are executed by a processor or a controller, for example, executed by a processor in the above device embodiments, the above processor can execute the MBIST test method in the above embodiments. For example, it executes the method steps S100 to step S400 described above Figure 1 in, Figure 3 the method steps S510 to step S520 in, Figure 4 the method steps S210 to step S220 in, Figure 6 the method step S610 in, Figure 7 the method steps S410 to step S420 in, Figure 8 the method step S710 in and Figure 9 the method steps S110 to step S120 in.

[0101] Those of ordinary skill in the art will understand that all or some of the steps and systems disclosed above can be implemented as software, firmware, hardware, and their appropriate combinations. Some or all of the physical components can be implemented as software executed by a processor, such as a central processing unit, a digital signal processor, or a microprocessor, or can be implemented as hardware, or can be implemented as an integrated circuit, such as an application-specific integrated circuit. Such software can be distributed on a computer-readable medium, which can include a computer storage medium (or non-transitory medium) and a communication medium (or transitory medium). As is well known to those of ordinary skill in the art, the term computer storage medium includes volatile and non-volatile, removable and non-removable media implemented in any method or technology for storing information, such as computer-readable instructions, data structures, program modules, or other data. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technologies, CD-ROM, digital versatile disk (DVD) or other optical disk storage, magnetic cassettes, tapes, magnetic disk storage or other magnetic storage devices, or any other medium that can be used to store the desired information and can be accessed by a computer. In addition, as is well known to those of ordinary skill in the art, a communication medium typically includes computer-readable instructions, data structures, program modules, or other data in a modulated data signal such as a carrier wave or other transmission mechanism, and can include any information delivery medium.

[0102] The above is a specific description of the preferred embodiments of the present invention, but the present invention is not limited to the above embodiments. Those skilled in the art can make various equivalent deformations or substitutions without departing from the spirit of the present invention, and these equivalent deformations or substitutions are all included within the scope defined by the claims of the present invention.

Claims

1. An MBIST testing method, characterized in that, The invention is applied to an MBIST test device, wherein the MBIST test device comprises a main control processor, an MBIST internal test module, an MBIST control module, an MBIST test module and a static random access memory, wherein the main control processor, the MBIST internal test module, the MBIST control module, the MBIST test module and the static random access memory are connected in sequence, and the method comprises: Send test configuration information to test module in described MBIST by described main control processor; Generate a test stimulus signal according to the test configuration information by test module in the MBIST, and send the test stimulus signal to the MBIST control module; According to the test stimulus signal, the MBIST test module is controlled to process, so that the static random access memory is carried out the MBIST test process, and the MBIST test result is obtained; and the MBIST test result is fed back to the test module in the MBIST; The MBIST test result is obtained from the MBIST internal test module through the main control processor.

2. MBIST method of testing according to claim 1, is characterized in that, Described MBIST testing device also comprises multiplexer, described multiplexer is connected between test module and described MBIST control module in described MBIST, the input end of described multiplexer is also connected to integrated circuit automatic tester, described static random access memory is carried out MBIST test process according to described test stimulus signal by described MBIST control module, before obtaining MBIST test result, described method also comprises: Generate the test stimulus signal by the integrated circuit automatic test machine, and send the test stimulus signal to the multiplexer; The test excitation signal sent by the MBIST internal test module and the test excitation signal sent by the integrated circuit automatic test machine are selected and processed by the multiplexer.

3. MBIST method of testing according to claim 1, is characterized in that, The described MBIST inner test module comprises a register module, a stimulus generation module and a test mode storage module, the described test module generates a test stimulus signal according to the described test configuration information through the described MBIST inner test module, and the described test stimulus signal is sent to the described MBIST control module, comprising: Receiving the test configuration information sent by the main control processor through the register module; and reading the test mode information from the test mode storage module to the stimulus generation module according to the test configuration information; The test excitation signal is generated by the excitation generation module according to the test mode information; and the test excitation signal is sent to the MBIST control module.

4. MBIST method of testing according to claim 3, is characterized in that, The MBIST test result is fed back to the MBIST internal test module, comprising: The MBIST test result is sent to the register module through the MBIST control module.

5. MBIST method of testing according to claim 4, is characterized in that, Described obtaining described MBIST test result from described MBIST internal test module by described main control processor comprises: From described register module, read described MBIST test result by described main control processor; The MBIST test result is transferred to a preset non-volatile memory by the main control processor.

6. MBIST method of testing according to claim 1, is characterized in that, Before the test configuration information is sent to the MBIST internal test module by the main control processor, the method further comprises: The main control processor is used to perform working environment configuration processing on the MBIST test device so that the MBIST test device enters a test mode.

7. MBIST method of testing according to claim 1, is characterized in that, The method of sending test configuration information to the MBIST internal test module by the main control processor comprises: Get the running program; The test configuration information is generated by the main control processor according to the running program, and the test configuration information is sent to the MBIST internal test module.

8. An MBIST test device, characterized in that, Described MBIST test device comprises main control processor, MBIST internal test module, MBIST control module, MBIST test module and static random access memory, and described main control processor, described MBIST internal test module, described MBIST control module, described MBIST test module and described static random access memory are connected successively; Wherein, Described main control processor is used for sending test configuration information to described MBIST internal test module; Test module in described MBIST is used for generating test stimulus signal according to described test configuration information, and described test stimulus signal is sent to described MBIST control module; Described MBIST control module is used for controlling described MBIST test module according to described test stimulus signal through described MBIST control module, so that described static random access memory is carried out MBIST test process, obtains MBIST test result; And described MBIST test result is fed back to test module in described MBIST; The main control processor is also used to obtain the MBIST test result from the MBIST internal test module.

9. An electronic device, characterized in that: include: A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the MBIST test method as claimed in any one of claims 1 to 7 when executing the computer program.

10. A computer-readable storage medium storing computer-executable instructions, characterized in that: When the computer executable instructions are executed by the control processor, the MBIST test method as described in any one of claims 1 to 7 is implemented.

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