Ultrasonic flaw detector capable of automatically identifying probe parameters

Abstract

The invention relates to the field of ultrasonic flaw detectors, and provides an ultrasonic flaw detector capable of automatically identifying probe parameters, which comprises a flaw detector body and a probe body, a probe identification module is arranged in the flaw detector body, and the probe identification module is fixedly connected with one side wall of the flaw detector body. A probe identification area is formed in the area where the flaw detector body is fixedly connected with the probe identification module, a parameter read-write card is arranged in the probe body and fixedly connected with one side wall of the probe body, a parameter read-write area is formed in the area where the probe body is fixedly connected with the parameter read-write card, and when the parameter read-write card is close to the probe identification module, the parameter read-write card is connected with the probe identification module. And the probe identification module reads the probe parameters in the parameter read-write card. By means of the technical scheme, automatic reading of probe parameters is achieved, when probes of special specifications or novel models are used and the probes are frequently replaced, all the parameters do not need to be modified manually in sequence, and operation convenience and flaw detection work efficiency are remarkably improved.

Description

Technical Field

[0001] The invention relates to the field of ultrasonic flaw detectors, and in particular to an ultrasonic flaw detector capable of automatically identifying probe parameters. Background Art

[0002] In today's industrial production, it is extremely important to ensure product quality and safety. As a key non-destructive testing equipment, ultrasonic flaw detectors are widely used to detect defects inside various materials, such as cracks, inclusions, and pores.

[0003] However, traditional ultrasonic flaw detectors have certain limitations in actual use. When entering probe parameters, traditional ultrasonic flaw detectors usually require operators to select parameters corresponding to the probe marks in the device. If the probe used is a commonly used probe, there is no need for much modification, but if the probe used is a special specification or a new model, it is necessary to modify the various parameter data corresponding to the probe in the device in sequence. The parameter data includes probe number, probe angle, probe frequency, probe size, probe type, probe focal length, etc. There is a problem of cumbersome operation when modifying so many parameter data manually. And when the structure of the workpiece to be inspected is complex or there is a mixed inspection of multiple materials, because different probes have different penetration capabilities, resolutions and detection angles, it is necessary to replace the appropriate probe for flaw detection, so there will be frequent switching of probes, and each time the probe is replaced, the probe parameters in the ultrasonic flaw detector need to be modified. This situation further reflects the problem of cumbersome operation of traditional ultrasonic flaw detectors, and this method is inefficient, which limits the detection efficiency of the flaw detector. Summary of the invention

[0004] The present invention proposes an ultrasonic flaw detector that automatically identifies probe parameters, aiming to simplify the process of entering parameters of probes of special specifications or new models, change the operating mode of traditional flaw detectors that require manual modification of probe parameters item by item, and reduce the operational burden caused by parameter adjustment when frequently switching probes, thereby improving the operational convenience and detection efficiency of the ultrasonic flaw detector, and providing more efficient and convenient detection equipment for non-destructive testing in industrial production.

[0005] The technical solution of the present invention is as follows: An ultrasonic flaw detector for automatically identifying probe parameters comprises a flaw detector body and a probe body. The flaw detector body is provided with a probe identification module, the probe identification module is used to automatically identify the parameters of the probe, the probe parameters identified by the probe identification module are output to a processing chip of the flaw detector body, the processing chip modifies the original probe parameter data in the flaw detector body according to the identified probe parameters, the probe identification module is fixedly connected to a side wall of the flaw detector body, the area where the flaw detector body and the probe identification module are fixedly connected forms a probe identification area, the probe identification area is used to facilitate users to determine the position of the probe identification module, the probe body is provided with a parameter reading and writing card, the parameter reading and writing card stores the parameters of the probe, and when the probe identification module is close to the probe identification module, the probe identification module reads the probe parameters, the parameter reading and writing card is fixedly connected to a side wall of the probe body, the area where the probe body and the parameter reading and writing card are fixedly connected forms a parameter reading and writing area, the parameter reading and writing area is used to facilitate users to determine the position of the parameter reading and writing card, and when the parameter reading and writing card is close to the probe identification module, the probe identification module reads the probe parameters in the parameter reading and writing card.

[0006] Furthermore, the probe identification module adopts an NFC card reader, which is located inside the flaw detector body and fixedly connected to a side wall of the flaw detector body. The output end of the NFC card reader is electrically connected to the input end of the processing chip of the flaw detector body. The parameter reader-writer card adopts an NFC tag card, which is located inside the probe body and fixedly connected to a side wall of the probe body. The NFC tag card stores parameter data of the probe body. The NFC card reader identifies the data in the NFC tag card and outputs the data to the processing chip of the flaw detector body. The processing chip of the flaw detector body modifies the probe data in the flaw detector body according to the data input by the NFC card reader.

[0007] Furthermore, the NFC card reader is provided with a first shielding protective sleeve, which is arranged on the outside of the NFC card reader, and is used to shield electromagnetic interference to prevent high-frequency and radio frequency signals from interfering with normal operation of the NFC card reader module.

[0008] Furthermore, the NFC tag card is made of high temperature resistant material to adapt to the working environment temperature of the probe, ensuring that the probe parameters in the NFC tag card will not be lost or damaged in a high temperature environment. The NFC tag card is provided with a second shielding protective cover, which is arranged on the outside of the NFC tag card. The second shielding protective cover is used to prevent external electromagnetic interference, avoid internal signals from interfering with the operation of the probe body, and protect data integrity and stability, so as to ensure that the NFC card reader accurately reads the NFC tag card.

[0009] Furthermore, a data cache module is provided inside the flaw detector body, and the data cache module is electrically connected to the processing chip and probe identification module of the flaw detector body. The data cache module is used to store the probe body usage data of the probe body during the current working process. The processing chip of the flaw detector body controls the probe identification module to write the probe body usage data stored in the data cache module into the parameter read-write card. When the probe identification module identifies the data in the parameter read-write card, it simultaneously reads the probe body usage data recorded in the parameter read-write card, and the flaw detector body displays the probe body usage data to the user.

[0010] Furthermore, the usage data stored in the data cache module includes the number of times the probe body is used, the duration of the probe body being used this time, the transmission power of the probe body during use, and the receiving sensitivity of the probe body. The probe body usage data recorded in the parameter reader / writer card includes the cumulative number of times the probe body is used, the cumulative usage duration of the probe body, the duration of the most recent uses of the probe body, the transmission power of the probe body in recent times, and the receiving sensitivity of the probe body in recent times. The flaw detector body integrates the usage data of the probe body in the current working process and the usage data identified from the parameter reader / writer card, and then writes the integrated data into the parameter reader / writer card through the probe identification module.

[0011] Furthermore, the parameter reader / writer card pre-stores a service life threshold of the probe body, and the service life threshold of the probe body includes a usage time threshold of the probe body, a usage number threshold of the probe body, and a receiving sensitivity threshold of the probe body. When the probe identification module identifies the parameter reader / writer card, it will identify the service life threshold of the probe body to facilitate the user to judge the length of the service life of the probe body.

[0012] Furthermore, the flaw detector body is provided with an early warning module, which calculates the remaining life of the probe body based on the service life threshold of the probe body identified by the probe identification module and the usage data of the probe body, and issues an early warning to the user when the remaining life of the probe body is close to the service life threshold of the probe body.

[0013] The working principle and beneficial effects of the present invention are: The present invention arranges a probe identification module and a probe identification area in the flaw detector body, and arranges a parameter read-write card and a parameter read-write area in the probe body. When the parameter read-write card is close to the probe identification module, the probe identification module automatically reads the probe parameters and the processing chip modifies the original probe parameter data in the flaw detector, thereby realizing automatic entry of parameters of probes of special specifications or new models and rapid updating of parameters when the probes are frequently switched, thereby avoiding the tedious operation of manually modifying multiple parameters. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0015] Figure 1 It is a schematic diagram of the structure of the present invention; Figure 2 It is a structural schematic diagram of the flaw detector body and the internal probe identification module of the present invention; Figure 3 It is a schematic diagram of the probe body and internal structure of the present invention.

[0016] In the figure: 1. flaw detector body; 2. probe body; 11. probe identification module; 12. first shielding protective cover; 13. display screen; 14. operation keyboard; 21. parameter reader / writer card; 22. second shielding protective cover; 23. socket; 24. coil; 25. wafer; 26. wedge. DETAILED DESCRIPTION

[0017] The following will be combined with the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0018] like Figure 1 to Figure 3 As shown, this embodiment proposes an ultrasonic flaw detector for automatically identifying probe parameters, including a flaw detector body 1 and a probe body 2. A probe identification module 11 is arranged in the flaw detector body 1. The probe identification module 11 is used to automatically identify the parameters of the probe. The probe parameters identified by the probe identification module 11 are output to a processing chip of the flaw detector body 1. The processing chip modifies the original probe parameter data in the flaw detector body 1 according to the identified probe parameters. The probe identification module 11 is fixedly connected to a side wall of the flaw detector body 1. The area where the flaw detector body 1 and the probe identification module 11 are fixedly connected forms a probe identification area. The probe identification area The area is used for facilitating users to determine the position of the probe identification module 11. A parameter reading and writing card 21 is set in the probe body 2. The parameter reading and writing card 21 stores the parameters of the probe, and when the probe identification module 11 is close to the probe identification module 11, the probe identification module 11 reads the probe parameters. The parameter reading and writing card 21 is fixedly connected to a side wall of the probe body 2. The area where the probe body 2 and the parameter reading and writing card 21 are fixedly connected forms a parameter reading and writing area. The parameter reading and writing area is used for facilitating users to determine the position of the parameter reading and writing card 21. When the parameter reading and writing card 21 is close to the probe identification module 11, the probe identification module 11 reads the probe parameters in the parameter reading and writing card 21.

[0019] The flaw detector body 1 is the core equipment of the entire ultrasonic flaw detector. It is equipped with a display screen 13 and an operating keyboard 14. It also includes various necessary circuits and systems, such as power circuit, transmitting circuit, receiving circuit, signal processing circuit, display circuit, etc., to provide power, signal transmission, reception and processing functions for the entire flaw detection process. The signal processing circuit includes necessary processing chips to control or process the above circuits or signals and display the final results. At the same time, the processing chip adjusts the relevant settings of the flaw detector according to the new probe parameters, so that the flaw detector can work in the best state according to the characteristics of the probe. The flaw detector body 1 is the main platform for flaw detection. The probe body 2 is an ultrasonic transmitting and receiving device. The probe body 2 mainly includes a socket 23 for connecting to an external line, a coil 24 for generating a magnetic field or assisting signal transmission, a chip 25 for realizing electrical-to-acoustic conversion, and a wedge 26 for changing the propagation direction of ultrasonic waves. The parameter read-write card 21 built into the probe body 2 carries the probe parameters closely related to flaw detection. When the probe body 2 contacts the material to be tested, it converts the electrical signal emitted by the flaw detector body 1 into ultrasonic waves and transmits them out, and then receives the ultrasonic waves reflected from the material and converts them into electrical signals and transmits them to the flaw detector body 1. As a conversion and transceiver device for ultrasonic waves, the probe body 2 is a key component for realizing nondestructive testing, and its performance directly affects the flaw detection results. The built-in parameter reader and writer card 21 stores the probe parameters, which facilitates the storage and transmission of the probe parameters and ensures that the flaw detector body 1 can perform accurate detection operations according to the actual characteristics of the probe. The probe identification module 11 is used to automatically identify the parameters of the probe, and cooperates with the parameter reader and writer card 21 in the probe body 2. When the two are close, the probe identification module 11 can read the probe parameters stored in the parameter reader and writer card 21, and output the read parameters to the processing chip of the flaw detector body 1. At the same time, the module is fixed on a side wall of the flaw detector body 1 to form a probe identification area, which is convenient for users to determine its position. The determination area of ​​its position is convenient for operators to operate and maintain, and also improves the convenience and operability of use. The parameter reader / writer card 21 is used to store various parameters of the probe body 2, such as the frequency, angle, size, focal length and other information of the probe body 2, and enables the probe identification module 11 to read such information when it is close to the probe identification module 11. The parameter reader / writer card 21 stores the probe parameters and can be read automatically, thus solving the tedious manual parameter entry of the traditional flaw detector, providing a convenient way for the storage and transmission of the probe parameters, and facilitating the operation of the user.

[0020] In this embodiment, the probe identification module 11 adopts an NFC card reader, which is located inside the flaw detector body 1 and fixedly connected to a side wall of the flaw detector body 1. The output end of the NFC card reader is electrically connected to the input end of the processing chip of the flaw detector body 1. The parameter reader / writer card 21 adopts an NFC tag card, which is located inside the probe body 2 and fixedly connected to a side wall of the probe body 2. The NFC tag card stores parameter data of the probe body 2. The NFC card reader identifies the data in the NFC tag card and outputs the data to the processing chip of the flaw detector body 1. The processing chip of the flaw detector body 1 modifies the probe data in the flaw detector body 1 according to the data input by the NFC card reader.

[0021] The NFC card reader is located inside the flaw detector body 1 and fixedly connected to one side wall, and is mainly responsible for identifying the data stored in the NFC tag card in the probe body 2. It communicates with the NFC tag card through radio frequency signals, reads the probe parameter information stored therein, and then transmits the read data to the processing chip of the flaw detector body 1. The NFC card reader serves as a probe identification module 11. The NFC card reader provides a technical means for the flaw detector to automatically obtain probe parameters, so that the flaw detector can establish intelligent information interaction with the probe. Since the NFC card reader is fixed in the flaw detector body 1, it ensures good integration with other circuit systems of the flaw detector, facilitates data transmission and processing, and also provides a guarantee for the stability and reliability of the equipment. The NFC tag card is used to store various parameter data of the probe body 2. It is installed inside the probe body 2 and fixed to one side wall. When the probe is close to the NFC card reader of the flaw detector, the stored parameter information can be provided to the NFC card reader. As a storage and transmission medium for probe parameters, the NFC tag card provides a simple and effective information storage method for the probe, which facilitates the transmission of information between the probe and the flaw detector. The setting of NFC tag card can facilitate the probe manufacturer to store detailed parameter information in NFC tag card in advance when producing the probe, which is convenient for the subsequent automatic identification of the flaw detector. Even if the specifications and models of the probe change, the information in the NFC tag card can be easily updated without complex software upgrades or hardware modifications to the flaw detector, which enhances the flexibility and adaptability of the system. For probes produced by different manufacturers, as long as they are equipped with NFC tag cards, the flaw detector can read the information through the NFC card reader, which improves the versatility of the system to a certain extent.

[0022] In this embodiment, the NFC card reader is provided with a first shielding protective cover 12, which is sleeved on the outside of the NFC card reader. The first shielding protective cover 12 is used to shield electromagnetic interference to prevent high-frequency and radio frequency signals from interfering with the normal operation of the NFC card reader module. The NFC tag card is made of high-temperature resistant materials to adapt to the working environment temperature of the probe, to ensure that the probe parameters in the NFC tag card will not be lost or damaged in a high-temperature environment. The NFC tag card is provided with a second shielding protective cover 22, which is sleeved on the outside of the NFC tag card. The second shielding protective cover 22 is used to prevent external electromagnetic interference, avoid internal signals from interfering with the operation of the probe body 2, and protect data integrity and stability, so as to ensure that the NFC card reader accurately reads the NFC tag card.

[0023] In industrial environments, there are a large number of electromagnetic interference sources, such as large electrical equipment, communication base stations, etc. If the high-frequency and radio frequency signals generated by these interference sources are not shielded, they will seriously affect the accuracy of the NFC card reader reading the NFC tag card data. The first shielding protective cover 12 can effectively isolate these interferences, ensuring that the NFC card reader stably reads the probe parameters in the NFC tag card, thereby ensuring that the probe parameters obtained by the flaw detector are accurate and improve the reliability of the flaw detection work. The setting of the second shielding protective cover 22, on the one hand, prevents external electromagnetic interference and prevents external electromagnetic signals from interfering with the communication between the NFC tag card and the NFC card reader; on the other hand, it prevents internal signals from interfering with the operation of the probe body 2. When the probe is working, it will generate various signals. The second shielding protective cover 22 can prevent these signals from interfering with the NFC tag card; at the same time, it protects data integrity and stability, ensures that the data in the NFC tag card will not be changed due to external factors, and guarantees the NFC card reader to accurately read the NFC tag card.

[0024] In this embodiment, a data cache module is arranged inside the flaw detector body 1, and the data cache module is electrically connected to the processing chip and the probe identification module 11 of the flaw detector body 1. The data cache module is used to store the usage data of the probe body 2 during the current working process of the probe body 2. The processing chip of the flaw detector body 1 controls the probe identification module 11 to write the usage data of the probe body 2 stored in the data cache module into the parameter read-write card 21. When the probe identification module 11 identifies the data in the parameter read-write card 21, it reads the usage data of the probe body 2 recorded in the parameter read-write card 21 at the same time, and the flaw detector body 1 displays the usage data of the probe body 2 to the user. The usage data stored in the data cache module includes the number of times the probe body 2 is used, the duration of the current use of the probe body 2, the transmission power of the probe body 2 during use, and the receiving sensitivity of the probe body 2. The usage data of the probe body 2 recorded in the parameter reader / writer card 21 includes the cumulative number of times the probe body 2 is used, the cumulative usage duration of the probe body 2, the duration of the most recent uses of the probe body 2, the transmission power of the probe body 2 in the most recent times, and the receiving sensitivity of the probe body 2 in the most recent times. The flaw detector body 1 integrates the usage data of the probe body 2 in the current working process and the usage data identified from the parameter reader / writer card 21, and then writes the integrated data into the parameter reader / writer card 21 through the probe identification module 11.

[0025] The setting of the data cache module can ensure that during the operation of the flaw detector, all kinds of data generated by the probe will not be lost due to short-term system failures or data processing delays. For example, during the complex signal processing or data transmission process of the flaw detector, the data cache module can temporarily store the newly generated probe usage data to avoid data omission. By temporarily storing data, the pressure on real-time data processing is reduced, so that other modules of the flaw detector (such as processing chips) can more efficiently handle other key tasks, such as signal analysis, flaw detection result calculation, etc. At the same time, it provides conditions for batch processing of data, reduces the number of data transmissions, and improves the operating efficiency of the overall system. The usage data of the probe body 2 recorded by the parameter reader and writer card 21 can enable maintenance personnel or users to judge the usage frequency and life loss of the probe by accumulating the number of times and duration of use, and formulate a reasonable maintenance plan. For each flaw detection work, by checking the usage data of the last few times, you can understand the working performance of the probe under different working conditions, which provides a reference for subsequent flaw detection work. The flaw detector body 1 integrates the usage data of the probe body 2 in the current working process and the usage data identified from the parameter reader / writer card 21, including: for the cumulative number of uses and the cumulative usage time, the number of uses and the usage time in the current working process are added to the original cumulative value; for the most recent usage data, the data in the current working process is updated to the most recent data records. If the number of records has reached the set upper limit (such as the most recent 5 times), the earliest record is deleted.

[0026] In this embodiment, the parameter reader / writer card 21 pre-stores the service life threshold of the probe body 2. The service life threshold of the probe body 2 includes the usage time threshold of the probe body 2, the usage number threshold of the probe body 2, and the receiving sensitivity threshold of the probe body 2. When the probe identification module 11 identifies the parameter reader / writer card 21, it will identify the service life threshold of the probe body 2 to facilitate the user to judge the length of the service life of the probe body 2.

[0027] The service life threshold is used to provide users with a quantitative standard for judging the service life of the probe body 2, helping users understand the life consumption of the probe during use, so as to take corresponding measures in time. During the operation of the probe, the user can compare the real-time data such as the probe usage time, number of uses, and receiving sensitivity with the threshold stored in the parameter reader 21 to determine whether the probe is approaching the end of its service life. At the same time, it helps to formulate a reasonable equipment maintenance plan, arrange the replacement or repair of the probe in advance, avoid interruption of flaw detection work due to accidental damage to the probe, and improve production efficiency.

[0028] In this embodiment, an early warning module is provided in the flaw detector body 1. The early warning module calculates the remaining life of the probe body 2 based on the service life threshold of the probe body 2 identified by the probe identification module 11 and the usage data of the probe body 2. When the remaining life of the probe body 2 is close to the service life threshold of the probe body 2, an early warning is issued to the user.

[0029] The early warning module can provide early warning prompts through which users can replace the probe before the performance of the probe drops significantly, thereby ensuring the reliability of the flaw detection results, avoiding misjudgment of product quality due to inaccurate flaw detection results, and reducing potential risks and losses caused by product quality problems. It provides a clear basis for the equipment maintenance plan, helps users to reasonably arrange the maintenance and replacement time of the probe, realize preventive maintenance, avoid excessive maintenance or untimely maintenance, reduce equipment maintenance costs, and improve equipment management efficiency. The early warning module can use a variety of methods to warn. Including displaying early warning information on the display screen 13 of the flaw detector body 1 with eye-catching pop-up windows and flashing prompts, or emitting sound alarms of different frequencies and durations through some built-in buzzers of the flaw detector body 1, or for flaw detectors connected to the network, it can also send text messages or push message notifications to the bound user's mobile phone or work terminal to ensure that the user can receive early warnings in time no matter where he is. The method for calculating the remaining life of the probe body 2 by the early warning module can be obtained by directly subtracting the used time from the use time threshold, and for thresholds such as the number of uses and receiving sensitivity, corresponding mathematical models can be established according to their relationship with the probe performance for calculation. For example, a sensitivity / number of uses-life relationship curve can be established in advance, and then the remaining life can be calculated using a curve fitting algorithm.

[0030] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. An ultrasonic flaw detector for automatically identifying probe parameters, characterized in that: The invention comprises a flaw detector body (1) and a probe body (2), wherein the flaw detector body (1) is provided with a probe identification module (11), wherein the probe identification module (11) is used to automatically identify the parameters of the probe, wherein the probe parameters identified by the probe identification module (11) are output to a processing chip of the flaw detector body (1), wherein the processing chip modifies the original probe parameter data in the flaw detector body (1) according to the identified probe parameters, wherein the probe identification module (11) is fixedly connected to a side wall of the flaw detector body (1), wherein the area where the flaw detector body (1) and the probe identification module (11) are fixedly connected forms a probe identification area, wherein the probe identification area is used to facilitate a user to determine whether the probe identification module (11), a parameter reading and writing card (21) is arranged in the probe body (2), the parameter reading and writing card (21) stores the parameters of the probe, and when the probe identification module (11) is close to the parameter reading and writing card (21), the probe identification module (11) reads the probe parameters, the parameter reading and writing card (21) is fixedly connected to a side wall of the probe body (2), and the area where the probe body (2) and the parameter reading and writing card (21) are fixedly connected forms a parameter reading and writing area, the parameter reading and writing area is used to facilitate users to determine the position of the parameter reading and writing card (21), and when the parameter reading and writing card (21) is close to the probe identification module (11), the probe identification module (11) reads the probe parameters in the parameter reading and writing card (21).

2. The ultrasonic flaw detector for automatically identifying probe parameters according to claim 1, characterized in that: The probe identification module (11) adopts an NFC card reader, the NFC card reader is located inside the flaw detector body (1) and is fixedly connected to a side wall of the flaw detector body (1), the output end of the NFC card reader is electrically connected to the input end of the processing chip of the flaw detector body (1), the parameter reading and writing card (21) adopts an NFC tag card, the NFC tag card is located inside the probe body (2) and is fixedly connected to a side wall of the probe body (2), the NFC tag card stores parameter data of the probe body (2), the NFC card reader identifies the data in the NFC tag card and outputs the data to the processing chip of the flaw detector body (1), and the processing chip of the flaw detector body (1) modifies the probe data in the flaw detector body (1) according to the data input by the NFC card reader.

3. The ultrasonic flaw detector for automatically identifying probe parameters according to claim 2, characterized in that: The NFC card reader is provided with a first shielding protective sleeve (12), the first shielding protective sleeve (12) being sleeved on the outside of the NFC card reader, the first shielding protective sleeve (12) being used for shielding electromagnetic interference to prevent high-frequency and radio frequency signals from interfering with the normal operation of the NFC card reader module.

4. The ultrasonic flaw detector for automatically identifying probe parameters according to claim 2, characterized in that: The NFC tag card is made of a high temperature resistant material to adapt to the working environment temperature of the probe, ensuring that the probe parameters in the NFC tag card will not be lost or damaged in a high temperature environment. The NFC tag card is provided with a second shielding protective sleeve (22), which is sleeved on the outside of the NFC tag card. The second shielding protective sleeve (22) is used to prevent external electromagnetic interference, avoid internal signals from interfering with the operation of the probe body (2), and protect data integrity and stability, thereby ensuring that the NFC card reader accurately reads the NFC tag card.

5. The ultrasonic flaw detector for automatically identifying probe parameters according to claim 1, characterized in that: A data cache module is provided inside the flaw detector body (1). The data cache module is electrically connected to a processing chip and a probe identification module (11) of the flaw detector body (1). The data cache module is used to store probe body (2) usage data of the probe body (2) during the current working process. The processing chip of the flaw detector body (1) controls the probe identification module (11) to write the probe body (2) usage data stored in the data cache module into a parameter read-write card (21). When the probe identification module (11) identifies the data in the parameter read-write card (21), it simultaneously reads the probe body (2) usage data recorded in the parameter read-write card (21). The flaw detector body (1) displays the probe body (2) usage data to a user.

6. The ultrasonic flaw detector for automatically identifying probe parameters according to claim 5, characterized in that: The usage data stored in the data cache module include the number of times the probe body (2) is used, the duration of the current use of the probe body (2), the transmission power of the probe body (2) during use, and the receiving sensitivity of the probe body (2); the usage data of the probe body (2) recorded in the parameter reader / writer card (21) include the cumulative number of times the probe body (2) is used, the cumulative duration of the use of the probe body (2), the duration of the most recent use of the probe body (2), the transmission power of the probe body (2) during the most recent use, and the receiving sensitivity of the probe body (2) during the most recent use; the flaw detector body (1) integrates the usage data of the probe body (2) during the current working process and the usage data identified from the parameter reader / writer card (21), and then writes the integrated data into the parameter reader / writer card (21) through the probe identification module (11).

7. An ultrasonic flaw detector for automatically identifying probe parameters according to claim 5 or 6, characterized in that: The parameter reading and writing card (21) pre-stores a life threshold of the probe body (2), wherein the life threshold of the probe body (2) comprises a usage time threshold of the probe body (2), a usage number threshold of the probe body (2), and a receiving sensitivity threshold of the probe body (2). When the probe identification module (11) identifies the parameter reading and writing card (21), it identifies the life threshold of the probe body (2), so as to facilitate a user to judge the length of the life of the probe body (2).

8. The ultrasonic flaw detector for automatically identifying probe parameters according to claim 7, characterized in that: The flaw detector body (1) is provided with an early warning module, which calculates the remaining life of the probe body (2) based on the service life threshold of the probe body (2) identified by the probe identification module (11) and the usage data of the probe body (2), and issues an early warning to a user when the remaining life of the probe body (2) approaches the service life threshold of the probe body (2).

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