Light emitting diode testing device

Abstract

The invention provides a light emitting diode testing device, which relates to the technical field of electronic component testing tools and comprises a testing socket, the right end of the testing socket is fixedly connected with a testing power supply, the bottom of the testing socket is provided with a socket lower cavity with a cavity structure, and a plurality of testing jacks are arranged above the testing socket. The two mutually parallel decomposition jacks are arranged in the test socket, the test device can be directly inserted without distinguishing the polarity of the pin of the diode, and the test device can be automatically triggered and accessed to corresponding voltage through the length of the pin, so that the step of distinguishing the polarity of the pin of the light-emitting diode is saved, and the test socket is suitable for batch and efficient detection of the light-emitting diode; the problems that in the traditional light-emitting diode testing process, the polarity of the pins needs to be distinguished after the diodes are taken, the two pins of the light-emitting diodes are inserted into the corresponding insertion holes respectively, the testing efficiency of the light-emitting diodes is influenced by the step of distinguishing the polarity of the pins of the light-emitting diodes, and batch and efficient detection of the light-emitting diodes is not facilitated are solved.

Description

Technical Field

[0001] The invention relates to the technical field of electronic component testing tools, and in particular to a light emitting diode testing device. Background Art

[0002] Light-emitting diodes are widely used in the manufacture of landscape decoration, billboards, LED displays and other equipment. After the production of light-emitting diodes is completed, before assembly, the quality of the light-emitting diodes needs to be tested. The diodes are connected to a power source to make them emit light, and the quality of the diodes is tested by the brightness and color effects. In order to more accurately detect the color effect of the diodes, multiple LEDs are often powered on at the same time, and the quality of the light-emitting diodes is quickly tested by comparing the brightness and color differences of multiple light-emitting diodes.

[0003] In the traditional LED testing process, after taking the diode, it is necessary to identify the polarity of the pins and insert the two pins of the LED into the corresponding sockets respectively. The step of identifying the polarity of the LED pins will affect the testing efficiency of the LED and is not conducive to efficient batch detection of LEDs. Summary of the invention

[0004] The disclosed embodiment relates to a light-emitting diode testing device to solve the problem that in the traditional light-emitting diode testing process, after taking the diode, the polarity of the pin needs to be identified and the two pins of the light-emitting diode need to be inserted into the corresponding sockets respectively. The step of identifying the polarity of the light-emitting diode pin will affect the testing efficiency of the light-emitting diode, which is not conducive to the efficient batch detection of light-emitting diodes.

[0005] In a first aspect of the present disclosure, a light emitting diode testing device is provided, specifically comprising: a test socket, wherein a test power supply is fixedly connected to the right end of the test socket, a socket lower cavity with a cavity structure is provided at the bottom of the test socket, a plurality of test sockets are provided above the test socket, two mutually parallel decomposition sockets are provided inside the test socket, the decomposition sockets are perpendicular to the upper surface of the test socket, a first ring groove is provided at the middle part of the inner wall of the decomposition socket, a first electrical connection ring is fixedly connected inside the first ring groove, the first electrical connection ring is a copper ring, and the lower end part of the inner wall of the decomposition socket A second annular groove is provided, and a second electrical connecting ring is fixedly connected inside the second annular groove, the first electrical connecting ring is connected to the positive pole of the output power supply of the test power supply through an electrical connecting line, and the second electrical connecting ring is connected to the negative pole of the output power supply of the test power supply through an electrical connecting line, a floating trigger rod is slidably connected to the bottom of the decomposition socket, the upper end of the floating trigger rod is fixedly connected to a sliding docking block, the lower end of the floating trigger rod is fixedly connected to a limiting end plate, the limiting end plate is located inside the lower cavity of the socket, and a reset tension spring is fixedly connected between the upper part of the limiting end plate and the upper surface of the lower cavity of the socket.

[0006] In at least some embodiments, a clamping plate socket is provided on an upper surface of the test socket, and the clamping plate socket is located in front of and behind the test socket.

[0007] In at least some embodiments, the splint socket is a square slot, a strip-shaped sliding groove is respectively provided on the left wall and the right wall of the splint socket, and a sliding locking plate is slidably connected inside the splint socket.

[0008] In at least some embodiments, the two side surfaces of the sliding lock plate are respectively provided with long strip-shaped sliders, and the side sliders of the sliding lock plate are slidably connected to the sliding grooves on the inner wall of the splint socket. The sliding lock plate is provided with an arc groove on the side facing the test socket, and a locking plate flange is provided above the arc groove, and the upper edge of the locking plate flange is processed with an arc slope.

[0009] In at least some embodiments, one end of the sliding lock plate away from the test socket is fixedly connected to a lock plate pull rod, and an outer end of the lock plate pull rod is fixedly connected to a magnetic sheet.

[0010] In at least some embodiments, the front surface and the rear surface of the test socket are fixedly connected with a spring lock bar by screws, and a plurality of spring pressure plates are provided above the spring lock bar. The positions and numbers of the spring pressure plates correspond one-to-one to the sliding lock plates. The spring pressure plates are curved plates made of spring steel, and the upper ends of the spring pressure plates are in contact with the outer end surfaces of the sliding lock plates.

[0011] In at least some embodiments, an external mounting frame is fixedly connected to the upper edges of the front surface and the rear surface of the test socket, respectively, and a plurality of electromagnets are fixedly connected to the upper folding plate of the external mounting frame facing the test socket, and the positions and quantities of the electromagnets correspond one-to-one to the magnetic sheets.

[0012] In at least some embodiments, the electromagnet is connected to a test power supply via an electrical connection line and a control switch.

[0013] In at least some embodiments, the test socket is formed into one body by two symmetrical split structures spliced ​​together by screws, and the lower ends of the front surface and the rear surface of the test socket are vertically connected to a bottom plate.

[0014] The present invention provides a light emitting diode testing device, which has the following beneficial effects: In the test work of the light emitting diode of the present invention, the diode is provided with a test voltage through the contact between the diode pin and the test power supply electrode. In the test process of the diode, the difference between the lengths of the two pins of the diode is used to push the sliding docking block inside the test device to move. The height deviation of the sliding docking block pushed by the positive pin and the negative pin of the diode inside the decomposition socket makes the two sliding docking blocks contact the first electrical connection ring and the second electrical connection ring respectively, so that the negative long pin of the two pins of the diode is connected to the negative pole of the test power supply through the sliding docking block and the second electrical connection ring, and the positive short pin is connected to the positive pole of the test power supply through the sliding docking block and the first electrical connection ring. Through this power connection method, the polarity of the diode pin does not need to be identified and the test device can be directly inserted. The test device can be automatically triggered and connected to the corresponding voltage according to the length of the pin, which saves the step of identifying the polarity of the light emitting diode pin and is suitable for batch and efficient detection of light emitting diodes.

[0015] In addition, a positioning structure for light-emitting diodes is provided. During the light-emitting diode detection process, the light-emitting diode lamp beads are fixed in the test device by sliding the lock plate, and multiple light-emitting diode lamp beads can be fixed at the same time, so that the multiple lamp beads are arranged side by side in the test device, and the power supply of the test device is turned on synchronously, so that multiple lamp beads are connected to voltage at the same time, and the brightness and color difference of the lamp beads are observed and compared to quickly judge the defective light-emitting diode lamp beads, so that the batch detection efficiency of light-emitting diodes is further improved, and after the detection is completed, the light-emitting diode is quickly dropped from the test device through the cooperation of the electromagnet and the lock plate pull rod, so that the disassembly efficiency of the light-emitting diode is further improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solution of the embodiment of the present invention, the drawings of the embodiment are briefly introduced below.

[0017] The drawings described below are only related to some embodiments of the present invention, but are not intended to limit the present invention.

[0018] In the attached picture: Figure 1 A schematic diagram showing the overall structure of the present application; Figure 2 Shows this application Figure 1 A right view structural diagram of ; Figure 3 Shows this application Figure 1 A schematic diagram of a top view structure; Figure 4 A schematic diagram showing the structure of the interior of the test socket of the present application is shown; Figure 5 It shows a schematic diagram of the structure of the light emitting diode of the present application when it is installed; Figure 6Shows this application Figure 4 A front view structural diagram of Figure 7 A schematic diagram of the structure of the spring pressure plate of the present application is shown; Figure 8 A schematic diagram of the structure of the sliding lock plate of the present application is shown; Fig. 9 This application shows Figure 4 A schematic diagram of the partially enlarged structure at point A in the middle; Fig.10 This application shows Figure 5 Schematic diagram of the partially enlarged structure at point B in the middle.

[0019] Reference numerals list 1. Test socket; 101. Socket lower cavity; 102. Clamp socket; 2. Test socket; 201. Disassembly socket; 202. First ring groove; 203. First electrical connection ring; 204. Second ring groove; 205. Second electrical connection ring; 3. Test power supply; 4. Floating trigger rod; 401. Limit end plate; 402. Reset spring; 403. Sliding docking block; 5. Sliding lock plate; 501. Lock plate flange; 502. Arc mouth slope; 503. Lock plate pull rod; 6. Spring lock bar; 601. Spring pressure plate; 7. External mounting frame; 8. Electromagnet. DETAILED DESCRIPTION

[0020] In order to make the purpose, technical solution and advantages of the embodiment of the present invention clearer, the technical solution of the embodiment of the present invention will be clearly and completely described below in conjunction with the accompanying drawings of the embodiment of the present invention. Obviously, the described embodiment is a part of the embodiment of the present invention, not all of the embodiments. Based on the described embodiment of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0021] Example 1: Please refer to Figures 1 to 10 : The present invention provides a light emitting diode testing device, comprising: a test socket 1, a test power supply 3 is fixedly connected to the right end of the test socket 1, a socket lower cavity 101 with a cavity structure is provided at the bottom of the test socket 1, six test sockets 2 are provided above the test socket 1, two mutually parallel decomposition sockets 201 are provided inside the test socket 2, the decomposition sockets 201 are perpendicular to the upper surface of the test socket 1, a first ring groove 202 is provided at the middle part of the inner wall of the decomposition socket 201, a first electrical connection ring 203 is fixedly connected inside the first ring groove 202, and the first electrical connection ring 203 is a copper ring, and a second electric connection ring 203 is provided at the lower end of the inner wall of the decomposition socket 201. The annular groove 204 is provided with a second electrical connection ring 205 fixedly connected inside the second annular groove 204. The first electrical connection ring 203 is connected to the positive pole of the output power supply of the test power supply 3 through an electrical connection line. The second electrical connection ring 205 is connected to the negative pole of the output power supply of the test power supply 3 through an electrical connection line. The bottom of the decomposition socket 201 is slidably connected with a floating trigger rod 4. The upper end of the floating trigger rod 4 is fixedly connected with a sliding docking block 403. The lower end of the floating trigger rod 4 is fixedly connected with a limited end plate 401. The limited end plate 401 is located inside the lower cavity 101 of the socket. The upper part of the limited end plate 401 is fixedly connected to the upper surface of the lower cavity 101 of the socket. There is a reset spring 402; in the process of inserting the light-emitting diode, the two pins of the light-emitting diode are respectively inserted into the two decomposition sockets 201 in the test socket 2, without distinguishing the polarity of the pins, and the two pins are respectively in contact with the sliding docking blocks 403 inside the two decomposition sockets 201, and the two sliding docking blocks 403 are respectively pushed down a certain distance according to the different lengths of the two pins of the diode. The negative pin in the light-emitting diode is longer, and the sliding docking block 403 can be pushed down to the position of the second electrical connection ring 205 and fit with it, so that the negative pin of the light-emitting diode is connected to the negative output terminal of the test power supply 3, and at the same time, the light-emitting diode The positive pin of the tube is relatively short, and the positive pin pushes the sliding docking block 403 downward to the position of the first electrical connecting ring 203, so that the first electrical connecting ring 203 and the sliding docking block 403 are fitted to form an electrical connection, and the positive pin of the light-emitting diode is connected to the positive output end of the test power supply 3, so that the docking of the light-emitting diode and the test device can be completed, so that the light-emitting diode does not need to identify the polarity of the diode pin during the test and can be directly inserted into the test device. The test device can be automatically triggered by the length of the pin and connected to the corresponding voltage, which saves the step of identifying the polarity of the light-emitting diode pin and greatly improves the detection efficiency of the light-emitting diode.

[0022] In the embodiment of the present disclosure, a splint socket 102 is provided on the upper surface of the test socket 1, and the splint socket 102 is located in front of and behind the test socket 2. The splint socket 102 is a square slot body, and a strip-shaped slide groove is respectively provided on the left wall and the right wall of the splint socket 102. A sliding lock plate 5 is slidably connected to the inside of the splint socket 102, and long strip-shaped sliders are respectively protruding from the two side surfaces of the sliding lock plate 5. The side sliders of the sliding lock plate 5 are slidably connected to the slide groove on the inner wall of the splint socket 102, which plays a guiding role to prevent the sliding lock plate 5 from falling off from the inside of the splint socket 102. An arc groove is provided on the side of the sliding lock plate 5 facing the test socket 2, and the arc groove can be stably fitted with the outer surface of the round light-emitting diode lamp bead. A lock plate flange 501 is provided above the arc groove, and the upper edge of the lock plate flange 501 is processed with an arc opening Inclined surface 502; during the insertion of the LED lamp bead, the bottom edge of the diode lamp bead contacts and pushes it up, and the sliding lock plate 5 moves away from the test socket 2 under the action of the inclined surface. When the LED is in contact with the upper surface of the test socket 1, the sliding lock plate 5 approaches the test socket 2 under the action of the spring pressure plate 601, and locks the convex ring on the lower edge of the LED through the locking plate flange 501, so that the LED is temporarily fixed above the test device. According to this step, multiple LEDs can be installed above the test socket 1 at the same time, so that multiple lamp beads are connected to voltage at the same time. Observing and comparing the brightness and color difference of the lamp beads can quickly determine the defective products in the LED lamp beads, so that the batch detection efficiency of LEDs is further improved, and the testing of LEDs is made more accurate.

[0023] In the disclosed embodiment, the test socket 1 is formed into one piece by two symmetrical split structures spliced ​​together by screws, which is convenient for the assembly of the test socket 1 and the installation of its internal components. The lower ends of the front surface and the rear surface of the test socket 1 are vertically connected with a base plate, and the base plate can be fixedly connected to the desktop by bolts or screws, which is convenient for integrated assembly with the test bench.

[0024] Embodiment 2: On the basis of embodiment 1, one end of the sliding lock plate 5 away from the test socket 2 is fixedly connected to a lock plate pull rod 503, and the outer end of the lock plate pull rod 503 is fixedly connected to a magnetic sheet. The front and rear surfaces of the test socket 1 are fixedly connected to a spring lock bar 6 by screws. Six spring pressure plates 601 are arranged above the spring lock bar 6. The spring pressure plates 601 are curved plates made of spring steel. The spring pressure plates 601 with a curved structure have better elasticity. The upper end of the spring pressure plate 601 fits the outer end surface of the sliding lock plate 5. The sliding lock plate 5 is limited by the action of the spring pressure plate 601, so that the sliding lock plate 5 is located in the clamping plate socket 102, and the sliding lock plate 5 is kept to have a limiting effect on the light-emitting diode lamp bead. Under normal circumstances, the sliding lock plate 5 is moved closer to the test socket by the action of the spring pressure plate 601. The test socket 1 is pushed in the direction of the opening 2, and the upper edges of the front surface and the rear surface of the test socket 1 are respectively fixedly connected with an external mounting frame 7, and the upper folding plate part of the external mounting frame 7 is fixedly connected with six electromagnets 8 on the side facing the test socket 1. The six electromagnets 8 are respectively aligned with the six locking plate pull rods 503, and the six electromagnets 8 are connected to the test power supply 3 through electrical connection lines and control switches. When the test work of the light-emitting diode is completed, the electromagnet 8 is turned on, and the electromagnet 8 is energized to generate magnetic force, which generates magnetic attraction on the magnetic sheet at the end of the locking plate pull rod 503, so that the locking plate pull rod 503 and the sliding lock plate 5 as a whole move closer to the direction away from the test socket 2, so that the locking plate flange 501 is separated from the light-emitting diode, and the light-emitting diode bounces upward under the pushing action of the reset tension spring 402, so that the light-emitting diode is quickly separated from the test device.

[0025] The working principle of this embodiment is as follows: first, the two pins of the light-emitting diode to be tested are installed in the test device. During the insertion of the light-emitting diode, the two pins of the light-emitting diode are respectively inserted into the two decomposition sockets 201 in the test socket 2, without distinguishing the polarity of the pins. The two pins are respectively in contact with the sliding docking blocks 403 in the two decomposition sockets 201, and the two sliding docking blocks 403 are respectively pushed down a certain distance according to the different lengths of the two pins of the diode. The negative pin of the light-emitting diode is longer, and the sliding docking block 403 can be pushed down to the position of the second electrical connection ring 205 and fit with it, so that the negative pin of the light-emitting diode is in contact with the test supply. The negative output terminal of the power supply 3 is connected. At the same time, the positive pin of the light-emitting diode is shorter. The positive pin pushes the sliding docking block 403 downward to the position of the first electrical connection ring 203, so that the first electrical connection ring 203 and the sliding docking block 403 are fitted to form an electrical connection. The positive pin of the light-emitting diode is connected to the positive output terminal of the test power supply 3, and the docking of the light-emitting diode and the test device can be completed. During the test, the light-emitting diode does not need to identify the polarity of the diode pin and can be directly inserted into the test device. The test device can be automatically triggered by the length of the pin and connected to the corresponding voltage. The light-emitting diode contacts the arc mouth inclined surface 502 and The inclined surface pushes the sliding lock plate 5 in a direction away from the test socket 2. During the insertion of the LED lamp bead, the bottom edge of the diode lamp bead contacts and pushes it up. The inclined surface moves the sliding lock plate 5 in a direction away from the test socket 2. When the LED fits the upper surface of the test socket 1, the sliding lock plate 5 approaches the test socket 2 under the action of the spring pressure plate 601, and locks the convex ring at the lower edge of the LED through the locking plate flange 501, so that the LED is temporarily fixed above the test device. According to this step, multiple LEDs can be installed above the test socket 1 at the same time, so that multiple lamp beads can be turned on at the same time. Voltage, observing and comparing the brightness and color difference of the lamp beads can quickly determine the defective LED lamp beads, mark the defective products, and after completing the inspection, control the electromagnet 8 to be energized, and the electromagnet 8 is energized to generate magnetic force, which generates magnetic attraction on the magnetic sheet at the end of the lock plate pull rod 503, so that the lock plate pull rod 503 and the sliding lock plate 5 as a whole move closer to the direction away from the test socket 2, so that the lock plate flange 501 is separated from the light-emitting diode, and the light-emitting diode bounces upward under the pushing action of the reset spring 402, so that the light-emitting diode is quickly separated from the test device, and the marked defective products and qualified products are stored separately, and the performance test of the light-emitting diode can be completed.

[0026] In this article, there are a few points to note: 1. The drawings of the embodiments of the present disclosure only involve structures related to the embodiments of the present disclosure, and other structures may refer to general designs.

[0027] 2. In the absence of conflict, the embodiments of the present disclosure and the features therein may be combined with each other to obtain new embodiments.

[0028] The above are only specific embodiments of the present disclosure, but the protection scope of the present disclosure is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed in the present disclosure, which should be included in the protection scope of the present disclosure. Therefore, the protection scope of the present disclosure should be based on the protection scope of the claims.

Claims

1. A light emitting diode testing device, comprising: A test socket (1), characterized in that a test power supply (3) is fixedly connected to the right end of the test socket (1), a socket lower cavity (101) with a cavity structure is provided at the bottom of the test socket (1), a plurality of test sockets (2) are provided above the test socket (1), two mutually parallel decomposition sockets (201) are provided inside the test sockets (2), the decomposition sockets (201) are perpendicular to the upper surface of the test socket (1), a first ring groove (202) is provided at the middle part of the inner wall of the decomposition socket (201), a first electrical connection ring (203) is fixedly connected inside the first ring groove (202), the first electrical connection ring (203) is a copper ring, a second ring groove (204) is provided at the lower end of the inner wall of the decomposition socket (201), the second ring groove (204) is fixedly connected with a second electrical connection ring (205) inside, the first electrical connection ring (203) is connected to the positive pole of the output power of the test power supply (3) through an electrical connection line, and the second electrical connection ring (205) is connected to the negative pole of the output power of the test power supply (3) through an electrical connection line. The bottom of the decomposition socket (201) is slidably connected with a floating trigger rod (4), the upper end of the floating trigger rod (4) is fixedly connected with a sliding docking block (403), and the lower end of the floating trigger rod (4) is fixedly connected with a limiting end plate (401), the limiting end plate (401) is located inside the socket lower cavity (101), and a reset tension spring (402) is fixedly connected between the upper part of the limiting end plate (401) and the upper surface of the socket lower cavity (101).

2. A light emitting diode testing device according to claim 1, characterized in that: The upper surface of the test socket (1) is provided with a clamping plate socket (102), and the clamping plate socket (102) is located in front of and behind the test socket (2).

3. A light emitting diode testing device according to claim 2, characterized in that: The splint socket (102) is a square slot body, and a strip-shaped sliding groove is respectively provided on the left wall and the right wall of the splint socket (102), and a sliding lock plate (5) is slidably connected inside the splint socket (102).

4. The light emitting diode testing device according to claim 3, characterized in that: The two side surfaces of the sliding lock plate (5) are respectively provided with long strip-shaped sliders, and the side sliders of the sliding lock plate (5) are slidably connected to the sliding grooves on the inner wall of the clamping plate socket (102). The sliding lock plate (5) is provided with an arc groove on one side facing the test socket (2), and a locking plate flange (501) is provided above the arc groove, and the upper edge of the locking plate flange (501) is processed with an arc groove inclined surface (502).

5. The light emitting diode testing device according to claim 3, characterized in that: One end of the sliding lock plate (5) away from the test socket (2) is fixedly connected to a lock plate pull rod (503), and the outer end of the lock plate pull rod (503) is fixedly connected to a magnetic sheet.

6. The light emitting diode testing device according to claim 5, characterized in that: The front and rear surfaces of the test socket (1) are fixedly connected with a spring lock bar (6) by means of screws, and a plurality of spring pressure plates (601) are arranged above the spring lock bar (6). The positions and numbers of the spring pressure plates (601) correspond one to one with the sliding lock plate (5). The spring pressure plates (601) are curved plates made of spring steel, and the upper ends of the spring pressure plates (601) are in contact with the outer end surfaces of the sliding lock plates (5).

7. The light emitting diode testing device according to claim 6, characterized in that: An outer mounting frame (7) is fixedly connected to the upper edges of the front surface and the rear surface of the test socket (1), respectively; a plurality of electromagnets (8) are fixedly connected to the upper folding plate of the outer mounting frame (7) facing the test socket (1); the positions and numbers of the electromagnets (8) correspond one to one with the magnetic sheets.

8. The light emitting diode testing device according to claim 7, characterized in that: The electromagnet (8) is connected to the test power supply (3) via an electrical connection line and a control switch.

9. The light emitting diode testing device according to claim 1, characterized in that: The test socket (1) is composed of two symmetrical split structures which are joined together by screws, and the bottom ends of the front surface and the rear surface of the test socket (1) are vertically connected to a bottom plate.

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