Photovoltaic module grounding test device

Abstract

The utility model relates to a photovoltaic module grounding test device, and the device comprises a module placement table which is used for placing to-be-tested modules of different sizes; the grounding test clamp comprises an upper clamp and a lower clamp, and the upper clamp and the lower clamp jointly clamp the frame of the to-be-tested assembly; one side, opposite to the upper clamp, of the lower clamp is provided with a puncturing part, and the puncturing part is used for puncturing an insulating layer on the surface of the frame so as to conduct the frame and the test power supply; the test power supply is provided with power supply output lines, and one of the power supply output lines is connected into a grounding hole in the frame; and one of the power output lines is connected to the lower clamp. By arranging the special grounding test clamp, whether the grounding of the photovoltaic module meets the test requirement or not can be determined more quickly and conveniently, the efficiency of a laboratory grounding test is improved, and then the situation of performance failure of the photovoltaic module and the risk of customer complaint are reduced.

Description

Technical Field

[0001] This application relates to the technical field of photovoltaic module reliability testing, and particularly to a grounding test device for photovoltaic modules. Background Art

[0002] A solar cell is a device that uses the principle of photovoltaic conversion to convert the radiant light of the sun into electrical energy through semiconductor materials. Its main component, silicon, is the most abundant element on earth, and coupled with the inexhaustible solar energy, solar cells are a new type of green energy with broad development prospects.

[0003] Multiple solar cells need to go through a series of welding and encapsulation processes to be made into photovoltaic modules to generate electricity effectively. As a product, photovoltaic modules need to go through a series of tests before being put on the market to prove the reliability of the product or obtain relevant certifications. Reliability tests include performance tests, environmental tests, mechanical tests, and safety tests. The main test standards include: IEC 61215, IEC 61730, IEC 62804, IEC 60891, IEC 60904, etc. Among them, the grounding continuity test is an important test in the safety test of photovoltaic modules, which can detect whether the overall grounding connection of the photovoltaic module is effective and ensure the safety and reliability of the module. The traditional method requires grinding the surface of the module frame and then clamping a wire or wire clip at the ground position in the center of the frame. This method is time-consuming and laborious, and it is also easy to damage the outer surface of the photovoltaic module, affecting the appearance test of the module.

[0004] Therefore, it is very necessary to develop a non-destructive, efficient, and convenient grounding test device for photovoltaic modules to overcome the difficulties in the grounding test process of photovoltaic modules. Summary of the Utility Model

[0005] Based on this, a grounding test device for photovoltaic modules is provided. This test device can improve the convenience of the grounding test, enhance the efficiency and accuracy of the grounding test in the laboratory, and at the same time take into account the integrity of the appearance of the module.

[0006] To achieve the above object, this application provides a grounding test device for photovoltaic modules, including: a component placement table for placing test components of different sizes; a grounding test fixture including an upper fixture and a lower fixture, the upper fixture and the lower fixture jointly clamping the frame of the test component; a piercing part is arranged on one side of the lower fixture relative to the upper fixture, and the piercing part is used to pierce the insulating layer on the surface of the frame to conduct the frame and the test power supply; a test power supply is provided with a power output line, and one of the power output lines is connected to the grounding hole on the frame; one of the power output lines is connected to the lower fixture.

[0007] Alternatively, the material of the component placement table is set as an insulating material; or, a tabletop insulating layer is provided on the tabletop of the component placement table, and the tabletop insulating layer can isolate the conduction between the component placement table and the component to be tested.

[0008] Alternatively, the contact position between the upper fixture and the frame is an insulating connection.

[0009] Alternatively, the material of the upper fixture is set as hard insulating plastic; or, the material of the upper fixture is set as a conductive material, and an insulating material is wrapped around the contact position between the upper fixture and the frame.

[0010] Alternatively, both the lower fixture and the piercing part are set as conductive materials.

[0011] Alternatively, the piercing part is set as a sawtooth, and the number of the sawteeth is several and evenly arranged on the lower fixture.

[0012] Alternatively, the length of the sawtooth is set to 2 - 8 mm.

[0013] Alternatively, the sawtooth and the lower fixture are integrally connected.

[0014] Alternatively, a locking bolt is provided between the upper fixture and the lower fixture; the locking bolt can be used to lock after adjusting the distance between the upper fixture and the lower fixture.

[0015] Alternatively, the upper end of the locking bolt is set as an insulating material.

[0016] Advantageous effects:

[0017] For the above-mentioned photovoltaic module grounding test device, by using special upper and lower fixtures to lock the frame, an insulating layer for piercing the inner surface of the frame is provided on the inner side of the lower fixture, and then the test power supply and the frame can be conducted to complete the grounding test. Using this test device will cause no damage to the frame on the outer surface of the module, will not affect the appearance of the module, and can be used for the grounding continuity test project in a photovoltaic laboratory, which can ensure the convenience of the grounding test, improve the efficiency and accuracy of the laboratory grounding test, and at the same time take into account the integrity of the module appearance;

[0018] At the same time, compared with the existing test devices, this test device of the present application meets the IEC61730 test standard, can more quickly and conveniently confirm whether the grounding of the photovoltaic module meets the test requirements, improve the efficiency of the laboratory grounding test, and further reduce the risk of photovoltaic module performance failure and customer complaints. Description of the drawings

[0019] Figure 1Schematic three-dimensional structure diagram of a photovoltaic module grounding test device in an embodiment;

[0020] Figure 2 Top view of a photovoltaic module grounding test device in an embodiment;

[0021] Figure 3 Partial structure diagram showing the clamping of the grounding test fixture on the frame in an embodiment;

[0022] Figure 4 Structure diagram showing the grounding test fixture in an embodiment.

[0023] Reference numerals: 1, component placement table; 11, tabletop insulation layer; 2, component to be tested; 21, frame; 211, grounding hole; 3, grounding test fixture; 31, upper fixture; 32, lower fixture; 4, piercing part; 41, serrations; 5, test power supply; 6, power output line; 7, locking bolt. Detailed implementation manners

[0024] In order to make the purpose, technical solutions and advantages of the present application clearer, the present application will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0025] It should be noted that the diagrams provided in this embodiment only illustrate the basic concept of the present application schematically. Therefore, only the components related to the present application are shown in the diagrams, rather than being drawn according to the number, shape and size of the components in actual implementation. The type, quantity and proportion of each component in actual implementation can be arbitrarily changed, and the component layout type may also be more complex.

[0026] The structures, proportions, sizes, etc. shown in the drawings of this specification are only used to cooperate with the content disclosed in the specification for those skilled in this technology to understand and read, and are not used to limit the limiting conditions under which the present application can be implemented. Therefore, they do not have technical substance. Any modification of the structure, change of the proportional relationship or adjustment of the size, without affecting the effects that the present application can produce and the purposes that can be achieved, should still fall within the scope that can be covered by the technical content disclosed in the present application.

[0027] The orientation or positional relationship indicated by terms such as "upper", "lower", "left", "right", "middle", "longitudinal", "lateral", "horizontal", "inner", "outer", "radial", "circumferential", etc. cited in this specification is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of simplified description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to this application. In addition, the terms "first" and "second" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance.

[0028] The embodiment of this application provides a grounding test device for photovoltaic modules. By setting up an integrated test device composed of special grounding test fixtures, it meets the IEC61730 test standard. It can be used for the grounding continuity test project in a photovoltaic laboratory, and can quickly and conveniently detect and determine the grounding performance of the modules, improve the test efficiency, and save the test time.

[0029] The following will describe in detail a grounding test device for photovoltaic modules provided in this embodiment with reference to the Figures 1 - 3 drawings as shown. It includes: a module placement table 1, a grounding test fixture 3, and a test power supply 5. The module placement table 1 is used for placing the to-be-tested modules 2 of different sizes; the grounding test fixture 3 includes an upper fixture 31 and a lower fixture 32. The upper fixture 31 and the lower fixture 32 jointly clamp the frame 21 of the to-be-tested module 2. Among them, a piercing part 4 is provided on the side of the lower fixture 32 opposite to the upper fixture 31, and the piercing part 4 is used to pierce the insulating layer on the surface of the frame 21 to conduct the frame 21 and the test power supply 5; the test power supply 5 is provided with at least two power output lines 6. One of the power output lines 6 is connected into the grounding hole 211 on the frame 21; one of the power output lines 6 is connected to the lower fixture 32. Preferably, the test power supply 5 is set as a constant current power supply, which can provide a stable output of large current. The conventional maximum constant current output is not less than 100A, and the voltage is not less than 180V.

[0030] In this embodiment, during the test, one power output line 6 of the test power supply 5 is connected into the grounding hole 211 on the frame 21, and one power output line 6 is connected to the lower fixture 32. Then, the upper fixture 31 and the lower fixture 32 can jointly clamp the frame 21 of the to-be-tested module 2. During the clamping process, the piercing part 4 provided on the lower fixture 32 can easily pierce the insulating layers such as the anodic oxidation layer on the surface of the frame 21, and then conduct the frame 21 and the test power supply 5. Thus, the grounding test is completed by starting the test power supply 5. By adopting such a test device, the grounding performance of the module can be quickly and conveniently detected and determined, the test efficiency can be improved, and the test time can be saved. Moreover, the method of using the piercing part 4 to pierce the insulating layer on the inner surface of the frame 21 can avoid damaging the upper surface of the frame 21, does not affect the appearance of the module, and ensures the integrity of the module appearance.

[0031] Please refer to Figure 1 As shown, in this embodiment, it should be noted that the component placement table 1 can be made according to the size of the component 2 to be tested. For example, the size is set to 2.5m * 1.2m * 0.7m, and the height is preferably 65 - 75 cm. The material is set to an insulating material, which can be wood or plastic. The load-bearing capacity is above 100 kg. Alternatively, the material of the component placement table 1 can also be set to iron or other metal materials. At this time, a tabletop insulating layer 11 is provided on the tabletop of the component placement table 1. The tabletop insulating layer 11 can isolate the conduction between the component placement table 1 and the component 2 to be tested, and has good insulation performance and wear resistance. The thickness of the tabletop insulating layer 11 is set between 2 - 5 mm, and the size of the tabletop insulating layer 11 can cover the component placement table 1. In this embodiment, by using the component placement table 1, the component 2 to be tested can be supported and carried, facilitating the test.

[0032] Please refer to Figure 1 、 Figure 3 and Figure 4 As shown, in this embodiment, it should also be noted that the contact position between the upper clamp 31 and the frame 21 is an insulating connection. In other words, the contact position between the upper clamp 31 and the frame 21 is non-conductive, and the two are in an insulating state.

[0033] For example, in some embodiments, the material of the upper clamp 31 is set to hard insulating plastic, or the material of the upper clamp 31 is set to a conductive material, which can be a metal with conductive properties such as pure copper, stainless steel, etc. When the upper clamp 31 is set to a metal material, an insulating material is wrapped around the contact position between the upper clamp 31 and the frame 21. The insulating material can be plastic or a flexible cloth. On the one hand, the insulation between the upper clamp 31 and the frame 21 can be achieved through this insulating material. On the other hand, it can also prevent the upper clamp 31 from rubbing the surface of the frame 21 when clamping the frame 21, avoiding damage to the outer surface of the frame 21.

[0034] Please continue to refer to Figure 1 、 Figure 3 and Figure 4 As shown, in this embodiment, it should also be noted that the lower clamp 32 and the puncturing part 4 are made of the same conductive material, which can be a metal with conductive properties such as pure copper, stainless steel, etc. By setting the lower clamp 32 and the puncturing part 4 to metals with conductive properties, when using the puncturing part 4 to puncture the insulating layer such as the anodic oxidation layer on the surface of the frame 21, the frame 2 and the test power supply 5 can be conducted.

[0035] In some embodiments, the puncturing portion 4 is provided as a sawtooth 41, and the sawtooth 41 is integrally connected to the lower fixture 32. The number of sawteeth 41 is several and they are evenly arranged on the lower fixture 32. In this embodiment, by adopting the sawtooth 41, it is convenient for processing, has a large frictional force, and can easily puncture the insulating layer such as the anodic oxidation layer on the surface of the frame 21, thereby conducting the test power supply 5 and the frame 21, facilitating the grounding test. Of course, in other embodiments, the puncturing portion 4 can also be conical, and no specific limitation is made in this embodiment, as long as it can puncture the insulating layer on the surface of the frame 21.

[0036] In some embodiments, the thickness or width of the lower fixture 32 can be adjusted according to the size of the component 2 to be tested. For example, the thickness of the lower fixture 32 can be set to about 0.3 cm - 2 cm, and the length of the sawtooth 41 can be set to about 2 - 8 mm, such as 2 mm, 3 mm, 4 mm, 5 mm, 6 mm, 7 mm, 8 mm. No specific limitation is made in this embodiment.

[0037] Please continue to refer to Figure 1 、 Figure 3 and Figure 4 As shown, in this embodiment, it should also be noted that a locking bolt 7 is further provided between the upper fixture 31 and the lower fixture 32. The locking bolt 7 can be used to lock after adjusting the distance between the upper fixture 31 and the lower fixture 32. The lower end of the locking bolt 7 passes through the upper fixture 31 and is rotatably connected to the lower fixture 32, and the locking bolt 7 is threadedly connected to the upper fixture 31. Thus, by rotating the locking bolt 7, there is a certain adjustability between the upper fixture 31 and the lower fixture 32, which can adapt to the component 2 to be tested with different thickness frames 21, facilitating the laboratory to more conveniently and quickly complete the grounding test of various size frame components.

[0038] In some embodiments, the upper end of the locking bolt 7 is made of insulating material. By setting the top of the locking bolt 7 as insulating material, the locking or loosening operation can be achieved by manual rotation.

[0039] The implementation principle of this embodiment:

[0040] Step 1: Place the component 2 to be tested on the component placement table 1, ensuring that the tabletop insulating layer 11 completely isolates the component 2 to be tested and the component placement table 1;

[0041] Step 2: Connect one of the power output lines 6 of the test power supply 5 to the grounding hole 211 of the frame 21 of the component 2 to be tested by bolts;

[0042] Step 3: Connect one of the power output lines 6 of the test power supply 5 to the lower fixture 32, then use the upper fixture 31 and the lower fixture 32 to jointly clamp the frame 21, and pierce the insulating layers such as the anodic oxidation layer on the inner surface of the frame 21 through the piercing portion 4 to achieve conduction between the lower fixture 32 and the frame 21. At the same time, the lower fixture 32 is conducted with the test power supply 5 through the power output line 6;

[0043] Step 4: Adjust the test power supply 5, set the current to 2.5 times the maximum protection current of the component, and conduct subsequent tests in accordance with IEC61730.

[0044] The technical features of the above embodiments can be combined arbitrarily. For the sake of concise description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope described in this specification.

[0045] The above-described embodiments merely represent several implementation manners of the present application. The description is relatively specific and detailed, but it should not be construed as a limitation on the scope of the patent application. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several modifications and improvements can still be made, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the appended claims.

Claims

1. A photovoltaic module grounding test device, characterized in that, Comprising: A component placement table (1) for placing test components (2) of different sizes. A ground test fixture (3) including an upper fixture (31) and a lower fixture (32), the upper fixture (31) and the lower fixture (32) jointly clamping the frame (21) of the test component (2). A puncturing portion (4) is provided on one side of the lower fixture (32) relative to the upper fixture (31), and the puncturing portion (4) is used to puncture the insulating layer on the surface of the frame (21) to conduct the frame (21) and the test power supply (5). A test power supply (5) is provided with a power output line (6), one of the power output lines (6) is connected into a ground hole (211) on the frame (21); one of the power output lines (6) is connected to the lower fixture (32).

2. The photovoltaic component ground test device according to claim 1, wherein The material of the component placement table (1) is set as an insulating material; Or, a tabletop insulating layer (11) is provided on the tabletop of the component placement table (1), and the tabletop insulating layer (11) can isolate the conduction between the component placement table (1) and the test component (2).

3. The photovoltaic component ground test device according to claim 1, wherein The contact position between the upper fixture (31) and the frame (21) is an insulating connection.

4. The photovoltaic component ground test device according to claim 3, wherein The material of the upper fixture (31) is set as hard insulating plastic; Or, the material of the upper fixture (31) is set as a conductive material, and an insulating material is wrapped at the contact position between the upper fixture (31) and the frame (21).

5. The photovoltaic component ground test device according to claim 1, wherein Both the lower fixture (32) and the puncturing portion (4) are set as conductive materials.

6. The photovoltaic component ground test device according to claim 1 or 5, wherein The puncturing portion (4) is set as a sawtooth (41), and the number of the sawteeth (41) is several and evenly arranged on the lower fixture (32).

7. The photovoltaic component ground test device according to claim 6, wherein The length of the sawtooth (41) is set to 2 - 8 mm.

8. The photovoltaic component ground test device according to claim 6, wherein The sawtooth (41) and the lower fixture (32) are integrally connected.

9. The photovoltaic component ground test device according to claim 1, wherein A locking bolt (7) is provided between the upper fixture (31) and the lower fixture (32); The locking bolt (7) can be used to lock after adjusting the distance between the upper fixture (31) and the lower fixture (32).

10. The photovoltaic component ground test device according to claim 9, wherein The upper end of the locking bolt (7) is made of insulating material.

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