Novel power distribution network electronic equipment life evaluation method and system based on failure physics
By constructing the relationship between power, temperature and life of power grid equipment, using historical new energy line power change data to evaluate the life of power electronic equipment, the problems of high cost and low accuracy of life evaluation in the existing methods are solved, fast and accurate life evaluation is achieved, and random timing trend problems are considered.
Patent Information
- Application Number
- CN202510408545.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-02
- Publication Date
- 2025-06-06
AI Technical Summary
The existing power electronic equipment life evaluation method is based on statistical methods, requiring multiple equipment to run at the same time and wait for the failure to occur, resulting in high operating time costs and manual monitoring costs, and it is difficult to accurately analyze the cause of the failure, ignoring the random timing current problem caused by the access of new energy into the power grid, resulting in large errors between the evaluation results and the actual situation.
A new distribution network electronic equipment life evaluation method based on failure physics is adopted. By constructing the relationship between the power, temperature and life of the power of the power, temperature and life of the power change data of the power of the power of the power of the power grid, several power test values are generated, power electronic equipment is run, component status is detected, fault temperature points and fault time points are recorded, mathematical relationship between temperature and life is constructed, and equipment life is then evaluated.
It realizes rapid and accurate evaluation of the life of power electronic equipment in the actual operating environment, significantly shortens the life evaluation time, reduces costs, improves detection efficiency, and takes into account the random timing trend problems caused by the access of new energy into the power grid, improving the accuracy of evaluation.
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Figure CN120103030A_ABST
Abstract
Description
Technical Field
[0001] The present application belongs to the field of electronic power technology, and specifically relates to a new method and system for life assessment of electronic equipment in a distribution network based on failure physics. Background Art
[0002] The large-scale access of new sources and loads such as new energy and charging piles has led to intensified source and load fluctuations, increased peak-to-valley differences, and serious random time series power flow problems. The impact of short-term peak sources and loads on power electronic equipment in the distribution network has increased significantly, causing an increase in the failure rate of power electronic equipment and a decrease in reliability. The reliability of equipment has become an important factor restricting the carrying capacity of flexible power grids. Therefore, there is an urgent need for a method to evaluate the life of power electronic equipment while it is in operation.
[0003] The existing evaluation methods for the life of power electronic equipment in distribution networks are usually based on statistical methods. By counting the number of failures that occur in multiple devices after a period of operation, the failure probability is obtained, and the estimated service life of the equipment is obtained. However, this method requires multiple devices to run at the same time, and it is necessary to wait for a certain number of failures to occur before statistics can be made. The operating time cost and manual monitoring cost are relatively high. Although the equipment with faults is counted, the cause of the failure is unclear, and it is difficult to analyze the accuracy of the life. Finally, this method also ignores the random time series flow problem caused by the access of new energy to the power grid. This problem will have a great impact on the reliability of the equipment, which will lead to a large error between the statistical results and the actual situation. Summary of the invention
[0004] This application proposes a new method and system for life assessment of distribution network electronic equipment based on failure physics. By constructing the relationship between power, temperature and life of power grid equipment, accurate equipment life data under actual operating environment can be quickly obtained.
[0005] The first aspect of the present application provides a novel life assessment method for distribution network electronic equipment based on failure physics, the method comprising:
[0006] Selecting the highest power value from the historical new energy line power change data, and generating a number of power test values according to the highest power value at a preset growth ratio;
[0007] Based on the preset fault occurrence conditions, the power electronic equipment is operated at the maximum power value and the power test value respectively, and the operation status of the preset components in the power electronic equipment is detected to obtain the fault temperature point and the fault time point;
[0008] According to the fault temperature point and the fault time point, a mathematical relationship between the temperature of the preset components and the equipment life under different powers is established;
[0009] According to the historical new energy line power change data and the mathematical relationship, the equipment life evaluation value of the power electronic equipment within the preset time period is obtained.
[0010] The above scheme first selects the highest power value from the actual historical data as the power boundary condition for subsequent tests to improve the practicality of the test. The power electronic equipment starts to operate under high operating power, and continuously increases the operating power based on the highest power value until the power electronic equipment meets the fault condition, that is, when the preset fault occurs, the corresponding fault temperature point and fault time point are recorded, and the corresponding temperature and operating power when the fault occurs are clarified, so as to provide data support for the subsequent construction of the relationship between equipment life, power and temperature. And by continuously improving the operating power, the power electronic equipment can be stimulated to fail as early as possible, significantly shortening the life assessment time and improving the detection efficiency. After constructing the mathematical relationship between the temperature of the preset components and the equipment life under different powers, the historical new energy line power change data within a certain period of time in the actual operation situation can be used to obtain an accurate equipment life assessment value of a certain power electronic equipment under the actual operating environment.
[0011] In a possible implementation method of the first aspect, a plurality of power test values are generated according to the maximum power value at a preset growth ratio, specifically:
[0012] Setting a number of growth ratios of different sizes;
[0013] Calculate each of the growth ratios respectively with the maximum power value to obtain a power test value corresponding to each of the growth ratios; wherein the power test values are all greater than the maximum power value.
[0014] In a possible implementation method of the first aspect, based on a preset fault occurrence condition, the power electronic device is operated at the maximum power value and the power test value respectively, and the operating status of preset components in the power electronic device is detected to obtain a fault temperature point and a fault time point, specifically:
[0015] The operating power of the power electronic device is set to the maximum power value and operated, and when the operating state meets the fault occurrence condition, the fault temperature point and the fault time point corresponding to the maximum power value are obtained;
[0016] The operating power of the power electronic device is increased from the maximum power value to the power test value and operated, and when the operating state meets the fault occurrence condition, the fault temperature point and the fault time point corresponding to the power test value are obtained.
[0017] In the above scheme, the power electronic equipment is operated at the maximum power value and the power test value higher than the maximum power value respectively. By increasing the operating power, the power electronic equipment is stimulated to fail as early as possible, thereby reducing the test time and cost. In addition, the temperature of the components is increased by increasing the operating power, thereby causing the components to fail. In this way, the failure temperature point and the failure time point when the components fail at each power are obtained, providing data support for the subsequent construction of the relationship between operating power, temperature and equipment life.
[0018] In a possible implementation method of the first aspect, the operating state satisfies the fault occurrence condition, specifically:
[0019] Set the test fault type according to actual detection requirements;
[0020] When the power electronic device only has any one of the test fault types, it indicates that the operating state meets the fault occurrence condition.
[0021] In a possible implementation method of the first aspect, a mathematical relationship between the temperature of the preset component and the device life at different powers is constructed according to the fault temperature point and the fault time point, specifically:
[0022] Determine the equipment life of the power electronic device according to the fault time point, and associate the equipment life with the fault temperature point to construct a temperature-life relationship;
[0023] According to the maximum power value and the power test value, the fault temperature point is associated with the operating power of the power electronic device to establish a power-temperature relationship;
[0024] The mathematical relationship is obtained by calculating the temperature-life relationship and the power-temperature relationship.
[0025] The above scheme first determines the relationship between the equipment life and temperature through the fault temperature point corresponding to the fault occurrence to obtain the temperature-life relationship; then determines the power-temperature relationship according to the operating power corresponding to each fault temperature point; based on the temperature-life relationship and the power-temperature relationship, the temperature of components at different powers and the influence of temperature on the equipment life can be obtained, and then the mathematical relationship between power, temperature and equipment life can be obtained to evaluate the life of power electronic equipment, providing support for evaluating the operating reliability of current equipment.
[0026] In a possible implementation method of the first aspect, the mathematical relationship is specifically:
[0027] T j =A*P;
[0028] t=B*exp(Ea / kT j );
[0029] Where, T j is the temperature of the preset component, j is the preset component j, A and B are component constants, P is the operating power of the power electronic device, t is the equipment life, Ea is the activation energy, and k is the Boltzmann constant.
[0030] In a possible implementation method of the first aspect, an equipment life assessment value of the power electronic equipment within a preset time period is obtained according to the historical new energy line power change data and the mathematical relationship, specifically:
[0031] Select the data of the target device within a preset time period from the historical new energy line power change data and calculate the average value to obtain the power average value;
[0032] The current temperature of the target device is collected, and the power average value and the current temperature are calculated according to the mathematical relationship to obtain a device life evaluation value of the target device.
[0033] The second aspect of the present application provides a novel life assessment system for electronic equipment in a distribution network based on failure physics, the system comprising: a test power preparation module, an equipment operation module, a relationship construction module and an equipment life assessment module;
[0034] Among them, the test power preparation module is used to select the highest power value from the historical new energy line power change data, and generate a number of power test values according to the highest power value with a preset growth ratio;
[0035] The equipment operation module is used to operate the power electronic equipment at the maximum power value and the power test value respectively based on the preset fault occurrence conditions, and detect the operating status of the preset components in the power electronic equipment to obtain the fault temperature point and the fault time point;
[0036] The relationship building module is used to build a mathematical relationship between the temperature of the preset components and the device life at different powers according to the fault temperature point and the fault time point;
[0037] The equipment life assessment module is used to obtain the equipment life assessment value of the power electronic equipment within a preset time period according to the historical new energy line power change data and the mathematical relationship.
[0038] A third aspect of the present application provides a terminal device, the device comprising: a terminal device comprising a processor and a memory, the memory storing a computer program, and the processor implementing the steps of a new distribution network electronic device life assessment method based on failure physics as described in any one of the embodiments of the present application when executing the computer program.
[0039] A fourth aspect of the present application provides a storage medium storing computer-readable program code, which, when executed, implements the steps of a new method for life assessment of distribution network electronic equipment based on failure physics as described in any one of the embodiments of the present application. BRIEF DESCRIPTION OF THE DRAWINGS
[0040] In order to more clearly illustrate the technical solution of the present application, the drawings required for use in the implementation manner will be briefly introduced below. Obviously, the drawings described below are only some implementation manners of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.
[0041] Figure 1 It is a specific flow chart of a new method for life assessment of electronic equipment in a distribution network based on failure physics provided in a certain embodiment of the present application;
[0042] Figure 2 It is a new energy line power variation diagram of a new distribution network electronic equipment life assessment method based on failure physics provided in a certain embodiment of the present application;
[0043] Figure 3 It is a specific structural diagram of a new type of distribution network electronic equipment life assessment system based on failure physics provided in a certain embodiment of the present application;
[0044] Figure 4 A structural diagram of a terminal device is provided for a certain embodiment of the present application. DETAILED DESCRIPTION
[0045] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.
[0046] It should be understood that the step numbers used in this article are only for the convenience of description and are not intended to limit the order in which the steps are executed.
[0047] First embodiment
[0048] The existing life assessment of power electronic equipment in the power grid mainly relies on manual statistics. By counting the number of failures that occur in multiple equipment after a period of operation, the failure probability is obtained, and the estimated service life of the equipment is obtained. However, as more and more new energy sources are connected to the power grid, the random time series flow problems brought by new energy sources have brought obvious impacts on power electronic equipment, increased the failure rate of equipment, and made the accuracy of existing statistical methods lower. Therefore, when conducting life assessment, it is necessary to consider the impact of changes in random time series flow on equipment reliability in order to further improve the accuracy of life assessment.
[0049] Moreover, because the statistical method is to count the equipment that fails within a fixed time, the longer the fixed time is, the more accurate the statistical data can be obtained, which leads to a large time cost for manual monitoring. Therefore, how to achieve more accurate and efficient life assessment of power electronic equipment is the main research direction of the embodiments of this application.
[0050] like Figure 1 As shown, Figure 1 A specific flow chart of a new distribution network electronic equipment life assessment method based on failure physics is provided for a certain embodiment of the present application. The new distribution network electronic equipment life assessment method based on failure physics of this embodiment includes steps S1 to S4, which are described in detail as follows:
[0051] Step S1, selecting the highest power value from the historical new energy line power change data, and generating a plurality of power test values according to the highest power value with a preset growth ratio.
[0052] The random time-series power flow problem is a special power flow problem that takes random variables into consideration. In traditional power flow problems, all given quantities are deterministic, so the power flow calculation results are also deterministic. However, in the random time-series power flow problem, the power flow of a certain line is likely to exceed its allowed limit, resulting in a greatly increased probability of failure of the power electronic equipment on this line. Since this randomness is uncertain, simply counting the number of faulty devices within a certain period of time will be affected by this randomness, resulting in an uneven distribution of statistical results, further reducing the accuracy of statistical-based life assessment.
[0053] As an improvement on the above-mentioned scheme, in an embodiment of the present application, in order to introduce the random timing flow problem brought about by the access of new energy to the power grid into the equipment life assessment, historical new energy line power change data over a period of time in the past is selected as the data source for constructing the relationship between equipment life, output power and component temperature, and the probability of equipment failure is determined by considering the change in the output power of power electronic equipment.
[0054] First, the highest power value is selected from the historical new energy line power change data as the boundary condition reflecting the actual operating conditions, and based on this, the life test of the equipment is further carried out to obtain a high-accuracy life assessment.
[0055] Optionally, the embodiment of the present application selects the new energy line power change data within the past year as the historical new energy line power change data.
[0056] Figure 2 The figure shows the change of power of new energy lines in a certain period of time in the past. The horizontal axis represents time and the vertical axis represents the output power of electronic equipment. The red line represents the change of output power of electronic equipment A over time, and the blue line represents the change of output power of electronic equipment B over time. The highest power value is selected from the red line and the blue line as the boundary condition for subsequent life tests.
[0057] Because the temperature of the core electronic components of power electronic equipment is a very important equipment parameter, electronic components inevitably produce a certain amount of energy loss in the process of power conversion and control, and these losses are eventually dissipated in the form of heat, causing the temperature of the electronic components themselves to rise, and excessively high temperatures will directly lead to physical failure of electronic components, thereby affecting the reliability and life of power electronic equipment. Therefore, in the embodiment of the present application, the temperature of the preset components is selected to represent the actual operating reliability and life of the power electronic equipment.
[0058] Exemplarily, the preset components in the embodiments of the present application include but are not limited to power devices and capacitors.
[0059] Because high temperature can cause equipment failure, multiple corresponding power test values are generated by calculating the preset growth ratio based on the selected maximum power value, so that in subsequent tests, the output power of the power electronic equipment can be increased to quickly heat up the preset components in a short time, stimulate the power electronic equipment failure as early as possible, and significantly shorten the evaluation time. Among them, each power test value is greater than the maximum power value.
[0060] Specifically, the growth ratios selected in the embodiments of the present application are 110%, 120% and 130%. If the maximum power value is Pmax, then the power test values obtained are Pmax+10%Pmax, Pmax+20%Pmax, Pmax+30%Pmax.
[0061] Step S2, based on the preset fault occurrence conditions, respectively operate the power electronic equipment at the maximum power value and the power test value, and detect the operating status of preset components in the power electronic equipment to obtain the fault temperature point and the fault time point.
[0062] In the embodiment of the present application, the power electronic device is first operated at the highest power value, and the temperature of the preset components is monitored. When the power electronic device only has any preset test fault type, the temperature of the preset components and the fault occurrence time are recorded to obtain the corresponding fault temperature point and fault time point.
[0063] Among them, the test fault type is set according to actual detection requirements, and is set to a fault that causes the device to fail to operate normally in the embodiment of the present application.
[0064] Then, based on the maximum power value, continue to increase the output power of the power electronic equipment, such as Pmax+10%Pmax, Pmax+20%Pmax, Pmax+30%Pmax, and record the fault temperature point and fault time point when the power electronic equipment only has any preset test fault type under these three power test values.
[0065] The power test values Pmax+10%Pmax, Pmax+20%Pmax, Pmax+30%Pmax, and the corresponding fault temperature points are t (1+10％) ,t (1+20％) ,t (1+30％) The corresponding failure time points are T j(1+10％) , T j(1+20％) , T j(1+30％) .
[0066] Step S3, constructing a mathematical relationship between the temperature of the preset components and the equipment life at different powers according to the fault temperature point and the fault time point.
[0067] In the embodiment of the present application, the equipment life of the corresponding power electronic device is first determined according to the fault time point, and then the equipment life is associated with the corresponding fault temperature point to construct a temperature-life relationship.
[0068] Then, based on the fault temperature points corresponding to the maximum power value and the power test value, the temperature at the time of equipment failure is associated with the operating power of the power electronic equipment to construct a power-temperature relationship.
[0069] Finally, by calculating the temperature-life relationship and the power-temperature relationship, the mathematical relationship between the temperature of the preset components and the equipment life under different powers is obtained.
[0070] Among them, the mathematical relationship is specifically expressed as:
[0071] T j =A*P;
[0072] t=B*exp(Ea / kT j );
[0073] Where, T j is the temperature of the preset component, j is the preset component j, A and B are component constants, P is the operating power of the power electronic device, t is the equipment life, Ea is the activation energy, and k is the Boltzmann constant.
[0074] Among them, the component constants are mainly related to the preset component types, preparation processes, etc. The component constants and activation energy can be determined through life evaluation tests of the three groups of power test values.
[0075] Step S4, obtaining an equipment life assessment value of the power electronic equipment within a preset time period according to the historical new energy line power change data and the mathematical relationship.
[0076] In an embodiment of the present application, after determining the mathematical relationship between the temperature of the preset components and the equipment life at different powers, the power of the new energy lines in the past year is statistically analyzed to obtain the average power of the target equipment to be studied within a certain period of time.
[0077] Then, the current temperature of the target device is collected, and the power average value and the current temperature are substituted into the mathematical relationship to obtain the device life evaluation value of the target device in the power grid.
[0078] Based on the equipment life assessment value, the operating stability of a certain line in the power grid can be further evaluated, and direct guidance can be provided for the design and materials of power electronic equipment.
[0079] Implementing the embodiments of the present application has the following beneficial effects:
[0080] The embodiment of the present application first selects the highest power value from the actual historical data as the power boundary condition for subsequent tests to improve the practicality of the test. The power electronic equipment starts to operate under high operating power, and continuously increases the operating power based on the highest power value until the power electronic equipment meets the fault condition, that is, when a preset fault occurs, the corresponding fault temperature point and fault time point are recorded, and the corresponding temperature and operating power when the fault occurs are clarified, so as to provide data support for the subsequent construction of the relationship between equipment life, power and temperature. And by continuously improving the operating power, the power electronic equipment can be stimulated to fail as early as possible, significantly shortening the life assessment time and improving the detection efficiency. After constructing the mathematical relationship between the temperature of the preset components and the equipment life under different powers, the historical new energy line power change data within a certain time period in the actual operation situation can be used to obtain an accurate equipment life assessment value of a certain power electronic equipment under the actual operating environment.
[0081] Second embodiment
[0082] Furthermore, in order to execute the new distribution network electronic equipment life assessment system based on failure physics corresponding to the above method embodiment to achieve corresponding functions and technical effects, Figure 3 A structural diagram of a new distribution network electronic equipment life assessment system based on failure physics is provided. For ease of explanation, only the parts related to this embodiment are shown. The new distribution network electronic equipment life assessment system based on failure physics provided by the embodiment of the present application includes:
[0083] The test power preparation module 201 is used to select the highest power value from the historical new energy line power change data, and generate a plurality of power test values according to the highest power value with a preset growth ratio.
[0084] The random time-series power flow problem is a special power flow problem that takes random variables into consideration. In traditional power flow problems, all given quantities are deterministic, so the power flow calculation results are also deterministic. However, in the random time-series power flow problem, the power flow of a certain line is likely to exceed its allowed limit, resulting in a greatly increased probability of failure of the power electronic equipment on this line. Since this randomness is uncertain, simply counting the number of faulty devices within a certain period of time will be affected by this randomness, resulting in an uneven distribution of statistical results, further reducing the accuracy of statistical-based life assessment.
[0085] As an improvement on the above-mentioned scheme, in an embodiment of the present application, in order to introduce the random timing flow problem brought about by the access of new energy to the power grid into the equipment life assessment, historical new energy line power change data over a period of time in the past is selected as the data source for constructing the relationship between equipment life, output power and component temperature, and the probability of equipment failure is determined by considering the change in the output power of power electronic equipment.
[0086] First, the highest power value is selected from the historical new energy line power change data as the boundary condition reflecting the actual operating conditions, and based on this, the life test of the equipment is further carried out to obtain a high-accuracy life assessment.
[0087] Optionally, the embodiment of the present application selects the new energy line power change data within the past year as the historical new energy line power change data.
[0088] Because the temperature of the core electronic components of power electronic equipment is a very important equipment parameter, electronic components inevitably produce a certain amount of energy loss in the process of power conversion and control, and these losses are eventually dissipated in the form of heat, causing the temperature of the electronic components themselves to rise, and excessively high temperatures will directly lead to physical failure of electronic components, thereby affecting the reliability and life of power electronic equipment. Therefore, in the embodiment of the present application, the temperature of the preset components is selected to represent the actual operating reliability and life of the power electronic equipment.
[0089] Exemplarily, the preset components in the embodiments of the present application include but are not limited to power devices and capacitors.
[0090] Because high temperature can cause equipment failure, multiple corresponding power test values are generated by calculating the preset growth ratio based on the selected maximum power value, so that in subsequent tests, the output power of the power electronic equipment can be increased to quickly heat up the preset components in a short time, stimulate the power electronic equipment failure as early as possible, and significantly shorten the evaluation time. Among them, each power test value is greater than the maximum power value.
[0091] Specifically, the growth ratios selected in the embodiments of the present application are 110%, 120% and 130%. If the maximum power value is Pmax, then the power test values obtained are Pmax+10%Pmax, Pmax+20%Pmax, Pmax+30%Pmax.
[0092] The equipment operation module 202 is used to operate the power electronic equipment at the maximum power value and the power test value respectively based on the preset fault occurrence conditions, and detect the operating status of preset components in the power electronic equipment to obtain the fault temperature point and the fault time point.
[0093] In an embodiment of the present application, the operating power of the power electronic device is set to the maximum power value and operated. When the operating state meets the fault occurrence condition, the fault temperature point and the fault time point corresponding to the maximum power value are obtained.
[0094] Then, the operating power of the power electronic device is increased from the maximum power value to the power test value and operated. When the operating state meets the fault occurrence condition, the fault temperature point and the fault time point corresponding to the power test value are obtained.
[0095] The relationship building module 203 is used to build a mathematical relationship between the temperature of the preset components and the device life at different powers according to the fault temperature point and the fault time point.
[0096] In an embodiment of the present application, the equipment life of the power electronic device is determined according to the fault time point, and the equipment life is associated with the fault temperature point to construct a temperature-life relationship.
[0097] According to the maximum power value and the power test value, the fault temperature point is associated with the operating power of the power electronic device to establish a power-temperature relationship.
[0098] The mathematical relationship is obtained by calculating the temperature-life relationship and the power-temperature relationship.
[0099] The equipment life evaluation module 204 is used to obtain the equipment life evaluation value of the power electronic equipment within a preset time period according to the historical new energy line power change data and the mathematical relationship.
[0100] In an embodiment of the present application, after determining the mathematical relationship between the temperature of the preset components and the equipment life at different powers, the power of the new energy lines in the past year is statistically analyzed to obtain the average power of the target equipment to be studied within a certain period of time.
[0101] Then, the current temperature of the target device is collected, and the power average value and the current temperature are substituted into the mathematical relationship to obtain the device life evaluation value of the target device in the power grid.
[0102] Based on the equipment life assessment value, the operating stability of a certain line in the power grid can be further evaluated, and direct guidance can be provided for the design and materials of power electronic equipment.
[0103] In some embodiments, the device operation module 202 further includes:
[0104] First, the power electronic equipment is operated at the highest power value, and the temperature of the preset components is monitored. When the power electronic equipment only has any preset test fault type, the temperature of the preset components and the fault occurrence time are recorded at this time to obtain the corresponding fault temperature point and fault time point.
[0105] Among them, the test fault type is set according to actual detection requirements, and is set to a fault that causes the device to fail to operate normally in the embodiment of the present application.
[0106] Then, based on the maximum power value, continue to increase the output power of the power electronic equipment, such as Pmax+10%Pmax, Pmax+20%Pmax, Pmax+30%Pmax, and record the fault temperature point and fault time point when the power electronic equipment only has any preset test fault type under these three power test values.
[0107] The power test values Pmax+10%Pmax, Pmax+20%Pmax, Pmax+30%Pmax, and the corresponding fault temperature points are t (1+10％) ,t (1+20％) ,t (1+30％) The corresponding failure time points are T j(1+10％) , T j(1+20％) , T j(1+30％) .
[0108] In some embodiments, the relationship building module 203 is specifically:
[0109] Firstly, the equipment life of the corresponding power electronic device is determined according to the fault time point, and then the equipment life is associated with the corresponding fault temperature point to construct a temperature-life relationship.
[0110] Then, based on the fault temperature points corresponding to the maximum power value and the power test value, the temperature at the time of equipment failure is associated with the operating power of the power electronic equipment to construct a power-temperature relationship.
[0111] Finally, by calculating the temperature-life relationship and the power-temperature relationship, the mathematical relationship between the temperature of the preset components and the equipment life under different powers is obtained.
[0112] Among them, the mathematical relationship is specifically expressed as:
[0113] T j =A*P;
[0114] t=B*exp(Ea / kT j );
[0115] Where, T j is the temperature of the preset component, j is the preset component j, A and B are component constants, P is the operating power of the power electronic device, t is the equipment life, Ea is the activation energy, and k is the Boltzmann constant.
[0116] Among them, the component constants are mainly related to the preset component types, preparation processes, etc. The component constants and activation energy can be determined through life evaluation tests of the three groups of power test values.
[0117] Implementing the embodiments of the present application has the following beneficial effects:
[0118] The embodiment of the present application first selects the highest power value from the actual historical data as the power boundary condition for subsequent tests to improve the practicality of the test. The power electronic equipment starts to operate under high operating power, and continuously increases the operating power based on the highest power value until the power electronic equipment meets the fault condition, that is, when a preset fault occurs, the corresponding fault temperature point and fault time point are recorded, and the corresponding temperature and operating power when the fault occurs are clarified, so as to provide data support for the subsequent construction of the relationship between equipment life, power and temperature. And by continuously improving the operating power, the power electronic equipment can be stimulated to fail as early as possible, significantly shortening the life assessment time and improving the detection efficiency. After constructing the mathematical relationship between the temperature of the preset components and the equipment life under different powers, the historical new energy line power change data within a certain time period in the actual operation situation can be used to obtain an accurate equipment life assessment value of a certain power electronic equipment under the actual operating environment.
[0119] Furthermore, Figure 4 This is a structural diagram of a terminal device provided in one embodiment of the present application. Figure 4 As shown, the terminal device 3 of this embodiment includes: at least one processor 30 (in Figure 4 Only one is shown) and a memory 31 and a computer program 32 stored in the memory 31 and executable on the at least one processor. When the processor 30 executes the computer program 32, the steps of a new distribution network electronic device life assessment method based on failure physics as described in any one of the embodiments of the present application can be implemented.
[0120] The terminal device 3 may be a computing device such as a desktop computer, a cloud server, or a laptop computer. The computing device may include but is not limited to a processor 30 and a memory 31 . Figure 4 This is merely an example of the terminal device 3 and does not constitute a limitation on the terminal device 3 , which may include more or fewer components than those shown in the figure.
[0121] An embodiment of the present application provides a storage medium, which stores computer-readable program codes. When the computer-readable program codes are executed, the steps of the above-mentioned new method for life assessment of distribution network electronic equipment based on failure physics are implemented.
[0122] The specific embodiments described above further describe the purpose, technical solutions and beneficial effects of the present application in detail. It should be understood that the above description is only a specific embodiment of the present application and is not intended to limit the scope of protection of the present application. It is particularly pointed out that for those skilled in the art, any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the scope of protection of the present application.
Claims
1. A new method for life assessment of electronic equipment in distribution network based on failure physics, characterized in that: include: Selecting the highest power value from the historical new energy line power change data, and generating a number of power test values according to the highest power value at a preset growth ratio; Based on the preset fault occurrence conditions, the power electronic equipment is operated at the maximum power value and the power test value respectively, and the operation status of the preset components in the power electronic equipment is detected to obtain the fault temperature point and the fault time point; According to the fault temperature point and the fault time point, a mathematical relationship between the temperature of the preset components and the equipment life under different powers is established; According to the historical new energy line power change data and the mathematical relationship, the equipment life evaluation value of the power electronic equipment within the preset time period is obtained.
2. The new method for life assessment of distribution network electronic equipment based on failure physics according to claim 1 is characterized in that: The generating of a plurality of power test values according to the maximum power value with a preset growth ratio is specifically: Setting a number of growth ratios of different sizes; Calculate each of the growth ratios respectively with the maximum power value to obtain a power test value corresponding to each of the growth ratios; wherein the power test values are all greater than the maximum power value.
3. The new method for life assessment of distribution network electronic equipment based on failure physics according to claim 1 is characterized in that: Based on the preset fault occurrence condition, the power electronic device is operated at the maximum power value and the power test value respectively, and the operation state of the preset components in the power electronic device is detected to obtain the fault temperature point and the fault time point, specifically: The operating power of the power electronic device is set to the maximum power value and operated, and when the operating state meets the fault occurrence condition, the fault temperature point and the fault time point corresponding to the maximum power value are obtained; The operating power of the power electronic device is increased from the maximum power value to the power test value and operated, and when the operating state meets the fault occurrence condition, the fault temperature point and the fault time point corresponding to the power test value are obtained.
4. The new method for life assessment of distribution network electronic equipment based on failure physics according to claim 3 is characterized in that: The operating state meets the fault occurrence condition, specifically: Set the test fault type according to actual detection requirements; When the power electronic device only has any one of the test fault types, it indicates that the operating state meets the fault occurrence condition.
5. The new distribution network electronic equipment life assessment method based on failure physics according to claim 1 is characterized in that: The mathematical relationship between the temperature of the preset components and the equipment life under different powers is constructed according to the fault temperature point and the fault time point, specifically: Determine the equipment life of the power electronic device according to the fault time point, and associate the equipment life with the fault temperature point to construct a temperature-life relationship; According to the maximum power value and the power test value, the fault temperature point is associated with the operating power of the power electronic device to establish a power-temperature relationship; The mathematical relationship is obtained by calculating the temperature-life relationship and the power-temperature relationship.
6. The new method for life assessment of distribution network electronic equipment based on failure physics according to claim 5 is characterized in that: The mathematical relationship is specifically: T j =A*P; t=B*exp(Ea / kT j ); Where, T j is the temperature of the preset component, j is the preset component j, A and B are component constants, P is the operating power of the power electronic device, t is the equipment life, Ea is the activation energy, and k is the Boltzmann constant.
7. The new method for life assessment of distribution network electronic equipment based on failure physics according to claim 1 is characterized in that: The equipment life evaluation value of the power electronic equipment within a preset time period is obtained based on the historical new energy line power change data and the mathematical relationship, specifically: Select the data of the target device within a preset time period from the historical new energy line power change data and calculate the average value to obtain the power average value; The current temperature of the target device is collected, and the power average value and the current temperature are calculated according to the mathematical relationship to obtain a device life evaluation value of the target device.
8. A new distribution network electronic equipment life assessment system based on failure physics, characterized in that: include: Test power preparation module, equipment operation module, relationship building module and equipment life assessment module; Among them, the test power preparation module is used to select the highest power value from the historical new energy line power change data, and generate a number of power test values according to the highest power value with a preset growth ratio; The equipment operation module is used to operate the power electronic equipment at the maximum power value and the power test value respectively based on the preset fault occurrence conditions, and detect the operating status of the preset components in the power electronic equipment to obtain the fault temperature point and the fault time point; The relationship building module is used to build a mathematical relationship between the temperature of the preset components and the equipment life at different powers according to the fault temperature point and the fault time point; The equipment life assessment module is used to obtain the equipment life assessment value of the power electronic equipment within a preset time period according to the historical new energy line power change data and the mathematical relationship.
9. A terminal device, characterized in that: The invention comprises a processor and a memory, wherein the memory stores a computer program, and when the processor executes the computer program, the steps of a new method for life assessment of electronic equipment in distribution network based on failure physics as described in any one of claims 1 to 7 are implemented.
10. A storage medium, characterized in that: The storage medium stores computer-readable program codes, which, when executed, implement the steps of a new method for life assessment of distribution network electronic equipment based on failure physics as described in any one of claims 1 to 7.