Two-dimensional defect-free atom array assembling method and device, medium and product

Abstract

The invention discloses a two-dimensional defect-free atom array assembling method and device, a medium and a product, and relates to the field of cold atom molecular physics and quantum simulation. The method comprises the steps that position information of atoms is acquired according to fluorescence images of the atoms; according to the position information of the atoms, an atom rearrangement strategy is adopted, and the moving tracks of the atoms are determined; according to the atom rearrangement strategy, an atom dense area is determined according to the position information of atoms, the atom dense area serves as a target rank, and the atoms in the target rank are kept still; synchronously moving a plurality of atoms in a certain row or column outside the target row and column to the defect position of the target row and column; matching a corresponding waveform according to the moving track of the atom; atom movement is realized according to the waveform; according to the fluorescence image of the atom, position information of the moved atom is obtained again; according to the position information of the moved atoms, whether two-dimensional defect-free atom array assembling is completed or not is judged. According to the invention, the assembling speed and success rate of the two-dimensional defect-free atom array can be improved.

Description

Technical Field

[0001] The present application relates to the field of cold atom molecular physics and quantum simulation, and in particular to a two-dimensional defect-free atomic array assembly method, equipment, medium and product. Background Art

[0002] In recent years, with the continuous advancement of quantum technology, two-dimensional defect-free atomic arrays have become an important research platform for cutting-edge technologies such as quantum computing and quantum communication due to their excellent controllability and scalability. However, how to accurately assemble a defect-free two-dimensional atomic array has always been a technical challenge faced by this field.

[0003] The existing array assembly methods have problems such as uneven atomic positions, slow atomic movement, and atomic loss, which make it difficult to ensure the quality and stability of the array. How to improve the assembly success rate and efficiency has become a current research hotspot. Summary of the invention

[0004] The purpose of the present application is to provide a two-dimensional defect-free atomic array assembly method, equipment, medium and product, which can improve the assembly speed and success rate of the two-dimensional defect-free atomic array.

[0005] To achieve the above objectives, this application provides the following solutions:

[0006] In a first aspect, the present application provides a two-dimensional defect-free atomic array assembly method, the two-dimensional defect-free atomic array assembly method comprising:

[0007] Obtaining atomic position information based on the atomic fluorescence image;

[0008] According to the position information of atoms, an atomic rearrangement strategy is adopted to determine the movement trajectory of atoms; the atomic rearrangement strategy is to determine the atom-dense area according to the position information of atoms, and use the atom-dense area as the target row and column, and the atoms in the target row and column remain stationary; at the same time, multiple atoms in a row or column outside the target row and column are synchronously moved to the defect position of the target row and column;

[0009] Match the corresponding waveform according to the movement trajectory of the atom; and realize the movement of the atom according to the waveform;

[0010] The position information of the atoms after the movement is reacquired according to the fluorescence image of the atoms; according to the position information of the atoms after the movement, whether the two-dimensional defect-free atomic array assembly is completed is determined; if completed, the assembly is completed; if not completed, the process returns to the step of determining the movement trajectory of the atoms according to the position information of the atoms, adopting the atomic rearrangement strategy, and performing atomic movement until the two-dimensional defect-free atomic array assembly is completed.

[0011] Optionally, the obtaining the position information of the atom according to the fluorescence image of the atom specifically includes:

[0012] Use an electron multiplying detector to film static optical tweezers and capture fluorescence images of atoms;

[0013] The position information of the atoms is determined based on the fluorescence image of the atoms.

[0014] Optionally, determining the position information of the atom according to the fluorescence image of the atom specifically includes:

[0015] The atomic fluorescence image is processed by computer to obtain the atomic position information.

[0016] Optionally, the step of performing image processing on the fluorescent image of the atom using a computer to obtain the position information of the atom specifically includes:

[0017] Use a computer to process the gray value of the atomic fluorescence image and determine the ROI area;

[0018] Determine the atomic region according to the pixel value corresponding to the ROI region and the pixel value threshold; the pixel value threshold is the minimum pixel value corresponding to the atom;

[0019] Determine the position information of atoms based on atomic regions.

[0020] Optionally, the atomic rearrangement strategy includes:

[0021] The optimal moving trajectory is calculated using the Hungarian algorithm;

[0022] According to the optimal movement trajectory, a multi-atom synchronous movement strategy and the method of exchanging target points are adopted to synchronously move multiple atoms in a row or column outside the target row or column to the defect position of the target row or column.

[0023] Optionally, matching a corresponding waveform according to the movement trajectory of the atom; and realizing the movement of the atom according to the waveform specifically includes:

[0024] An arbitrary waveform generator is used to generate a waveform that matches the movement trajectory of the atom;

[0025] The corresponding dynamic optical tweezers are generated by using an acousto-optic deflector according to a waveform that matches the moving trajectory of the atoms;

[0026] Using dynamic optical tweezers to move atoms.

[0027] In a second aspect, the present application provides a two-dimensional defect-free atomic array assembly device, the two-dimensional defect-free atomic array assembly device comprising:

[0028] An atomic position information acquisition module, used to acquire the atomic position information according to the atomic fluorescence image;

[0029] The atomic movement trajectory determination module is used to determine the atomic movement trajectory according to the atomic position information and the atomic rearrangement strategy; the atomic rearrangement strategy is to determine the atomic dense area according to the atomic position information, and use the atomic dense area as the target row and column, and the atoms in the target row and column remain stationary; at the same time, multiple atoms in a row or column outside the target row and column are synchronously moved to the defect position of the target row and column;

[0030] Atom movement module, used to match the corresponding waveform according to the movement trajectory of the atom; and realize the movement of the atom according to the waveform;

[0031] The judgment module is used to re-acquire the position information of the atoms after the movement according to the fluorescence image of the atoms; according to the position information of the atoms after the movement, judge whether the two-dimensional defect-free atomic array assembly is completed; if completed, the assembly is completed; if not completed, return to the atomic movement trajectory determination module to move the atoms until the two-dimensional defect-free atomic array assembly is completed.

[0032] In a third aspect, the present application provides a computer device, comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the two-dimensional defect-free atomic array assembly method.

[0033] In a fourth aspect, the present application provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the two-dimensional defect-free atomic array assembly method.

[0034] In a fifth aspect, the present application provides a computer program product, including a computer program, which implements the two-dimensional defect-free atomic array assembly method when executed by a processor.

[0035] According to the specific embodiments provided in this application, this application has the following technical effects:

[0036] The present application provides a two-dimensional defect-free atomic array assembly method, equipment, medium and product, according to the position information of the atoms, an atomic rearrangement strategy is adopted to determine the movement trajectory of the atoms; the atomic rearrangement strategy is to determine the atomic dense area according to the position information of the atoms, and the atomic dense area is used as the target row, and the atoms in the target row remain motionless; at the same time, multiple atoms in a row or column outside the target row are synchronously moved to the defect position of the target row; through the atomic rearrangement strategy, under the premise that the equipment conditions allow and there is no collision between atoms, the synchronous movement of multiple atoms in the same row or column can be achieved. This not only improves the assembly speed, but also avoids the loss of atoms in the target row, thereby significantly improving the assembly success rate; the present application adopts an atomic rearrangement strategy, which greatly improves the speed and success rate of assembling a two-dimensional defect-free atomic array, and can flexibly assemble atoms into various complex two-dimensional geometric structures, such as triangular lattices or custom graphics, etc., to meet the needs of different applications. The two-dimensional defect-free atomic array assembled by this method has become an important platform for cutting-edge technology research such as quantum computing and quantum communication by virtue of its excellent controllability and scalability, and has promoted the development of quantum technology. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0038] Figure 1 This is a schematic diagram of a two-dimensional defect-free atomic array assembly method in one embodiment of the present application;

[0039] Figure 2 Flow chart of the device for assembling a two-dimensional defect-free atomic array;

[0040] Figure 3 Schematic diagram of the rearrangement strategy steps for assembling a 4×4 target square grid array;

[0041] Figure 4 Spectrum plot of the waveform loaded for the acousto-optic deflector (AOD);

[0042] Figure 5 Schematic diagram of an example of achieving arbitrary target geometry in two dimensions through the rearrangement strategy. DETAILED DESCRIPTION

[0043] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0044] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, the present application is further described in detail below with reference to the accompanying drawings and specific implementation methods.

[0045] In an exemplary embodiment, Figure 1 As shown, a two-dimensional defect-free atomic array assembly method is provided, the method comprising the following S101 to S104. Wherein:

[0046] S101, obtaining position information of atoms according to the fluorescence image of the atoms;

[0047] S102, according to the position information of the atoms, an atom rearrangement strategy is adopted to determine the movement trajectory of the atoms; the atom rearrangement strategy is to determine the atom-dense area according to the position information of the atoms, and use the atom-dense area as the target row and column, and the atoms in the target row and column remain stationary; at the same time, multiple atoms in a row or column outside the target row and column are synchronously moved to the defect position of the target row and column;

[0048] S103, matching a corresponding waveform according to the movement trajectory of the atom; and realizing the movement of the atom according to the waveform;

[0049] S104, after the atom movement is completed, re-take the atomic fluorescence image to obtain the atomic position information after the movement; re-obtain the atomic position information after the movement based on the atomic fluorescence image; determine whether the two-dimensional defect-free atomic array assembly is completed based on the atomic position information after the movement; if completed, the assembly is completed; if not completed, return to the step of determining the atomic movement trajectory based on the atomic position information and adopting the atomic rearrangement strategy to move the atoms until the two-dimensional defect-free atomic array assembly is completed.

[0050] This application uses cold atom capture and movement technology and atomic rearrangement strategy to load the cooled captured atoms from random distribution into a two-dimensional defect-free atomic array. First, laser cooling is used to cool the atoms to a very low temperature, and a magneto-optical trap or an optical dipole trap is used to capture atoms. Atomic fluorescence images are taken using an electron multiplication detector (EMCCD) 2 to obtain atomic position information, and an atomic rearrangement strategy is used to rationally plan the atomic movement trajectory. Under the condition of minimizing the total atomic movement cost and the atoms do not collide, the position and intensity of the optical potential well are accurately controlled by the acousto-optic deflector 5 to move the atoms from a random distribution to the target position. At the same time, combined with real-time feedback loops and dynamic adjustments, collisions and losses are avoided, and finally a defect-free, high-filling-rate two-dimensional atomic array is achieved.

[0051] In an exemplary embodiment, a two-dimensional defect-free atomic array assembly method provided in the present application is applied to Figure 2 The assembled atomic array device shown in the figure comprises an electron multiplying detector (EMCCD) 2, an arbitrary waveform generator (AWG) 4 and an acousto-optic deflector (AOD) 5. The EMCCD is used to take atomic fluorescence images, the AWG 4 is used to generate a specific waveform that matches the movement trajectory of atoms, and the AOD 5 will generate dynamic optical tweezers based on the waveform generated by the AWG 4 to load atomic movement.

[0052] like Figure 2 As shown, the assembled atomic array device specifically includes: atoms 1 for optical tweezers to bind and capture, an electron multiplying detector (EMCCD) 2 for obtaining fluorescence images of atoms, a computer 3 for obtaining position information of atoms based on the fluorescence images of atoms and determining the movement trajectory of atoms using an atomic rearrangement strategy, an arbitrary waveform generator (AWG) 4 for generating a waveform matching the movement trajectory of atoms, and an acousto-optic deflector (AOD) 5 for generating dynamic optical tweezers loaded atomic movement.

[0053] In this application, the two-dimensional defect-free atomic array assembly method is applied to the assembly atomic array device to form an effective feedback loop, which connects the various devices in series to ensure that they work in coordination. After the atoms are moved, the EMCCD is used to re-photograph the distribution of the atoms after the movement to determine whether the two-dimensional defect-free atomic array has been successfully assembled. If not, the system will enter a new cycle until the two-dimensional defect-free atomic array is assembled.

[0054] The working principle of the device for assembling defect-free atomic arrays is as follows:

[0055] The atomic fluorescence image captured by the static optical tweezers is photographed by using EMCCD, and the photographed image is transmitted to the computer 3 for processing to generate coordinates related to the optical tweezers. In this way, the position of the atom is directly obtained and mapped to the predefined source coordinates, that is, the position information of the atom, and the rearrangement strategy will calculate the movement trajectory of the atom based on this position information.

[0056] In an exemplary embodiment, S101 specifically includes:

[0057] S11, using the electron multiplier detector 2 to shoot the static optical tweezers and capture the fluorescence image of the atoms;

[0058] S12, determining the position information of the atom according to the fluorescence image of the atom.

[0059] In an exemplary embodiment, the process of image processing performed by computer 3 is as follows:

[0060] S1, using computer 3 to process the gray value of the fluorescence image of the atom and determine the ROI area;

[0061] S2, determining the atomic region according to the pixel value corresponding to the ROI region and the pixel value threshold; the pixel value threshold is the minimum pixel value corresponding to the atom;

[0062] S3, determining the position information of the atom according to the atomic region.

[0063] In an exemplary embodiment, the atom rearrangement strategy includes:

[0064] The optimal movement trajectory is calculated using the Hungarian algorithm. Based on the optimal movement trajectory, a multi-atom synchronous movement strategy and the method of exchanging target points are adopted to synchronously move multiple atoms in a row or column outside the target row or column to the defect position of the target row or column.

[0065] Specifically, since the probability of capturing atoms by static optical tweezers is about 60%, and atoms are lost during the movement of atoms, in order to ensure the success rate and speed of assembling a two-dimensional defect-free atomic array, the core of the atomic rearrangement strategy of this application is to select the places with dense atoms as the target rows and columns, ensure that the atoms in the target rows and columns do not move, and simultaneously move multiple atoms in a row or column outside the target rows and columns to the defective positions in the target rows and columns to assemble a two-dimensional defect-free atomic array. Figure 3 As shown, in order to clearly demonstrate the advantages of the rearrangement strategy and its entire operation steps, taking the case where the probability of capturing atoms by static optical tweezers is only 30%, assembling a 4×4 two-dimensional defect-free atomic array is taken as an example, the steps of the rearrangement strategy are specifically explained as follows:

[0066] S100, such as Figure 3As shown in the "initial diagram" in the figure, based on the atomic position information, the number of atoms in each row and column of the target array is read, and the total number of atoms in odd and even rows is compared. The row with the larger number of atoms is determined as the target row by comparison, and the same method is applied to the column to select the target column. After this process, a target row and column are obtained (marked in green). Next, the atomic positions with defects in the target rows and columns are marked (indicated in blue), and these defects will become the target positions for subsequent atomic movement.

[0067] S200, such as Figure 3 As shown in "Move 1" in the figure, during the rearrangement process, a multi-atom synchronous movement strategy is adopted to increase the assembly speed. At this stage, all atoms in the same row will move simultaneously. The specific operation is as follows: Scan all target rows, take the atoms outside the target rows and columns as the starting point, and the defect position in the target rows and columns as the target point, and use the Hungarian algorithm to calculate the optimal movement trajectory of each atom. Since the atoms in the target rows and columns do not participate in the movement, in order to avoid atomic collisions, if the movement trajectory of an atom contains atoms in the target rows and columns, the movement of the atom is canceled. In addition, when multiple atoms in the same row move synchronously, atomic collisions may also occur. To solve this problem, the movement trajectory needs to be further optimized: when there are starting points and target points of other atoms on the movement trajectory of an atom, the movement trajectory needs to be replanned by exchanging the target points. After the atom movement is completed, it is necessary to detect whether there are still defect positions in the target rows and columns. If there are no defects in the target rows and columns, go directly to S800 for atom removal and final adjustment of the array. If there are still defects, continue to S300.

[0068] S300, such as Figure 3 As shown in "Move 2" in the figure, all non-target rows are scanned. If the target row and column are odd rows, the atoms in the next row are moved below the defect position of the target row and column; if the target row is an even row, the atoms in the previous row are moved above the defect position of the target row and column. In order to optimize the assembly speed, the multi-atom synchronous movement strategy is continued. The Hungarian algorithm is also used to calculate the optimal movement trajectory, and the collision of atoms during movement is avoided by exchanging target points to ensure efficient and collision-free atomic movement.

[0069] S400, such as Figure 3As shown in "Move 3" in, after completing S300, all the moved atoms are moved upward to fill the defective positions in the target rows and columns. After the movement is completed, it is necessary to detect whether there are still defective positions. If there are no defects in the target rows and columns, go directly to S800 for atom removal and final adjustment of the array. If there are still defects, and the number of atoms outside the target rows and columns and not in the target columns is greater than the number of defective atoms, continue to execute S500; if the number of available atoms is not enough to fill the defects, abandon the current assembly and restart the assembly process.

[0070] S500, such as Figure 3 As shown in "Move 4" in the figure, in the current move, the atoms in the target row and column that are not in the target column are moved within the column. In this process, the atoms in a column will move simultaneously in the same column, and the optimal movement trajectory will be calculated by the Hungarian algorithm. Similar to the "Move 1" move, the collision of atoms during movement is avoided by exchanging the target points. After the move is completed, the atom will move to the next row of the defect position.

[0071] S600, such as Figure 3 As shown in "Move 5" and "Move 6" in Figure 1, the movement of "Move 5" and "Move 6" is similar to "Move 2" and "Move 3". Through continuous adjustments within the row and column, the defect positions are gradually filled to ensure that the atomic arrangement in the target row and column is finally defect-free. Each round of movement will further correct the imperfections in the array until the target row and column are exactly as expected.

[0072] S700, such as Figure 3 As shown in "Move 7" and "Target Diagram" in Figure 1, after all defect positions are successfully filled, the redundant atoms outside the target rows and columns are removed. After this process, a defect-free 4×4 two-dimensional atomic array is finally formed, as shown in Figure 1. Figure 3 As shown in the “target diagram”, it perfectly meets the predetermined structural requirements.

[0073] S800, after the atomic movement trajectory planning is completed, in order to achieve the precise movement of the atoms, it is first necessary to use the arbitrary waveform generator 4 to generate specific waveforms matching these trajectories according to the calculated atomic movement trajectories, and load them onto the acousto-optic deflector 5. In this process, each atomic movement corresponds to a specific waveform. Figure 4 As shown, the spectrum diagram shows Figure 3 The waveform distribution loaded on the acousto-optic deflector 5 during the first atomic movement in FIG. The generation and application of these waveforms ensure that the atoms can move accurately along the predetermined trajectory.

[0074] In order to successfully assemble a preset two-dimensional defect-free atomic array, the waveforms generated by each atomic movement must be combined into a complete waveform that contains all movement behaviors. This complete waveform is then sent to the acousto-optic deflector 5 to drive the atoms to perform each precise movement in sequence. It should be noted that since each movement involves the simultaneous movement of multiple atoms in a row or column, the acousto-optic deflector 5 needs to generate multiple dynamic optical tweezers to act simultaneously. However, since the acousto-optic deflector 5 is a nonlinear device, when multiple signals act simultaneously, frequency intermodulation effects may occur, resulting in the generation of new signal components and the amplitudes between the signals becoming uneven. This will affect the diffraction efficiency of the diffracted beam and cause an uneven distribution of the diffracted light intensity, thereby affecting the accuracy of atomic movement.

[0075] In order to solve the frequency intermodulation problem, the phase between different signals can be adjusted first to eliminate the nonlinear effect caused by the acousto-optic deflector drive, thereby reducing the intermodulation interference. Then, combined with the camera feedback system, the amplitude ratio between the signals is adjusted in real time to further optimize the signal amplitude distribution, effectively suppress the intermodulation effect, and ensure that the atoms can move accurately according to the predetermined trajectory.

[0076] Through the above method, a pre-designed two-dimensional defect-free atomic array can be efficiently assembled. Since the simultaneous movement of a row or a column of atoms can be achieved, the atomic rearrangement time is saved through spatial parallelism. More importantly, instead of directly moving the atoms in the target row and column, the atoms outside the target row and column are moved to the target row and column to fill the missing atoms in the target row and column. This ensures that the atoms in the target row and column are not lost, avoids the occurrence of errors, and gradually forms the preset atomic array. Through this method, the speed and success rate of assembling two-dimensional defect-free atomic arrays can be significantly improved. At the same time, this method can also accurately assemble atoms into various two-dimensional geometric structures, such as Figure 5 Complex shapes such as the triangular lattice shown or the "SXU" symbol.

[0077] This application achieves the simultaneous movement of a row or column of atoms to fill the defective positions of the target rows and columns by optimizing the atomic movement trajectory without collision and without moving the target row and column atoms, thereby significantly improving the success rate and speed of assembly. Compared with the prior art, this application adopts a new atomic rearrangement strategy, which greatly improves the speed and success rate of assembling two-dimensional defect-free atomic arrays, and can flexibly assemble atoms into various complex two-dimensional geometric structures, such as triangular lattices or custom graphics, to meet the needs of different applications. The two-dimensional defect-free atomic array assembled by this method has become an important platform for cutting-edge technology research such as quantum computing and quantum communication, with its excellent controllability and scalability, and has promoted the development of quantum technology.

[0078] Based on the same inventive concept, the embodiment of the present application also provides a two-dimensional defect-free atomic array assembly device for implementing the two-dimensional defect-free atomic array assembly method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations in one or more two-dimensional defect-free atomic array assembly device embodiments provided below can refer to the limitations of the two-dimensional defect-free atomic array assembly method above, and will not be repeated here.

[0079] In an exemplary embodiment, a two-dimensional defect-free atomic array assembly device is provided, comprising:

[0080] An atomic position information acquisition module, used to acquire the atomic position information according to the atomic fluorescence image;

[0081] The atomic movement trajectory determination module is used to determine the atomic movement trajectory according to the atomic position information and the atomic rearrangement strategy; the atomic rearrangement strategy is to determine the atomic dense area according to the atomic position information, and use the atomic dense area as the target row and column, and the atoms in the target row and column remain stationary; at the same time, multiple atoms in a row or column outside the target row and column are synchronously moved to the defect position of the target row and column;

[0082] Atom movement module, used to match the corresponding waveform according to the movement trajectory of the atom; and realize the movement of the atom according to the waveform;

[0083] The judgment module is used to re-acquire the position information of the atoms after the movement according to the fluorescence image of the atoms; according to the position information of the atoms after the movement, judge whether the two-dimensional defect-free atomic array assembly is completed; if completed, the assembly is completed; if not completed, return to the atomic movement trajectory determination module to move the atoms until the two-dimensional defect-free atomic array assembly is completed.

[0084] In an exemplary embodiment, a computer device is provided, which may be a server or a terminal. The computer device includes a processor, a memory, an input / output interface (I / O for short) and a communication interface. The processor, the memory and the input / output interface are connected via a system bus, and the communication interface is connected to the system bus via the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal via a network connection. When the computer program is executed by the processor, a two-dimensional defect-free atomic array assembly method is implemented.

[0085] In an exemplary embodiment, a computer-readable storage medium is provided, storing a computer program, and when the computer program is executed by a processor, the steps in the above method embodiments are implemented.

[0086] In an exemplary embodiment, a computer program product is provided, including a computer program, and when the computer program is executed by a processor, the steps in the above method embodiments are implemented.

[0087] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant regulations.

[0088] Those of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM may be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM).

[0089] The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. The non-relational database may include a distributed database based on blockchain, etc., but is not limited thereto. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but is not limited thereto.

[0090] In this application, all actions to obtain signals, information or data are carried out in compliance with the relevant data protection laws and policies of the country where they are located and with the authorization given by the owner of the corresponding device.

[0091] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0092] This article uses specific examples to illustrate the principles and implementation methods of this application. The description of the above embodiments is only used to help understand the method and core ideas of this application. At the same time, for those skilled in the art, according to the ideas of this application, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as limiting this application.

Claims

1. A method for assembling a two-dimensional defect-free atomic array, characterized in that: The two-dimensional defect-free atomic array assembly method comprises: Obtaining atomic position information based on the atomic fluorescence image; According to the position information of atoms, an atomic rearrangement strategy is adopted to determine the movement trajectory of atoms; the atomic rearrangement strategy is to determine the atom-dense area according to the position information of atoms, and use the atom-dense area as the target row and column, and the atoms in the target row and column remain stationary; at the same time, multiple atoms in a row or column outside the target row and column are synchronously moved to the defect position of the target row and column; Match the corresponding waveform according to the movement trajectory of the atom; and realize the movement of the atom according to the waveform; The position information of the atoms after the movement is reacquired according to the fluorescence image of the atoms; according to the position information of the atoms after the movement, whether the two-dimensional defect-free atomic array assembly is completed is determined; if completed, the assembly is completed; if not completed, the process returns to the step of determining the movement trajectory of the atoms according to the position information of the atoms, adopting the atomic rearrangement strategy, and performing atomic movement until the two-dimensional defect-free atomic array assembly is completed.

2. The method for assembling a two-dimensional defect-free atomic array according to claim 1, characterized in that: The step of obtaining the position information of the atom according to the fluorescence image of the atom specifically includes: Use an electron multiplying detector to film static optical tweezers and capture fluorescence images of atoms; The position information of the atoms is determined based on the fluorescence image of the atoms.

3. The method for assembling a two-dimensional defect-free atomic array according to claim 2, characterized in that: Determining the position information of the atom according to the fluorescence image of the atom specifically includes: The atomic fluorescence image is processed by computer to obtain the atomic position information.

4. The method for assembling a two-dimensional defect-free atomic array according to claim 3, characterized in that: The method of using a computer to process the fluorescence image of the atom to obtain the position information of the atom specifically includes: Use a computer to process the gray value of the atomic fluorescence image and determine the ROI area; Determine the atomic region according to the pixel value corresponding to the ROI region and the pixel value threshold; the pixel value threshold is the minimum pixel value corresponding to the atom; Determine the position information of atoms based on atomic regions.

5. The method for assembling a two-dimensional defect-free atomic array according to claim 1, characterized in that: The atomic rearrangement strategy includes: The optimal moving trajectory is calculated using the Hungarian algorithm; According to the optimal movement trajectory, a multi-atom synchronous movement strategy and the method of exchanging target points are adopted to synchronously move multiple atoms in a row or column outside the target row or column to the defect position of the target row or column.

6. The method for assembling a two-dimensional defect-free atomic array according to claim 1, characterized in that: The step of matching the corresponding waveform according to the movement trajectory of the atom; And realize atomic movement according to the waveform, including: An arbitrary waveform generator is used to generate a waveform that matches the movement trajectory of the atom; The corresponding dynamic optical tweezers are generated by using an acousto-optic deflector according to a waveform that matches the moving trajectory of the atoms; Use dynamic optical tweezers to load atoms for movement.

7. A two-dimensional defect-free atomic array assembly device, characterized in that: The two-dimensional defect-free atomic array assembly device comprises: An atomic position information acquisition module, used to acquire the atomic position information according to the atomic fluorescence image; The atomic movement trajectory determination module is used to determine the atomic movement trajectory according to the atomic position information and the atomic rearrangement strategy; the atomic rearrangement strategy is to determine the atomic dense area according to the atomic position information, and use the atomic dense area as the target row and column, and the atoms in the target row and column remain stationary; at the same time, multiple atoms in a row or column outside the target row and column are synchronously moved to the defect position of the target row and column; Atom movement module, used to match the corresponding waveform according to the movement trajectory of the atom; and realize the movement of the atom according to the waveform; The judgment module is used to re-acquire the position information of the atoms after the movement according to the fluorescence image of the atoms; according to the position information of the atoms after the movement, judge whether the two-dimensional defect-free atomic array assembly is completed; if completed, the assembly is completed; if not completed, return to the atomic movement trajectory determination module to move the atoms until the two-dimensional defect-free atomic array assembly is completed.

8. A computer device comprising: A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the two-dimensional defect-free atomic array assembly method according to any one of claims 1 to 6.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the two-dimensional defect-free atomic array assembly method according to any one of claims 1 to 6 is implemented.

10. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the two-dimensional defect-free atomic array assembly method according to any one of claims 1 to 6 is implemented.

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