Testing device and testing system of digital trigger monitoring board card

Abstract

The invention provides a testing device and a testing system for a digital trigger monitoring board card. The testing device comprises a damping branch, a voltage-sharing branch and a control module. The capacitance value and the resistance value of the damping branch circuit and the resistance value of the voltage-sharing branch circuit can be adjusted online in real time through the control module, and the digital trigger monitoring board card is tested according to the monitoring data sent by the digital trigger monitoring board card, so that the testing efficiency is improved, the abnormity of the monitoring data can be found in time, and the testing accuracy is improved. The thyristor is prevented from being damaged as much as possible. Besides, control over the temperature adjusting unit and the humidity adjusting unit is achieved through the control module, then adjustment of the environment temperature and the environment humidity of the digital trigger monitoring board card is achieved, and the safety of the digital trigger monitoring board card is further guaranteed.

Description

Technical Field

[0001] The present application relates to the technical field of DC power transmission, and particularly to a test device and a test system for a digital trigger monitoring board card. Background Art

[0002] As the core equipment of DC power transmission, the operating reliability of the converter valve largely determines the operating reliability of the power grid. The thyristor-level circuit is the basic component unit of the converter valve, and a digital trigger monitoring board card (hereinafter referred to as TTM) is often equipped for each thyristor-level circuit.

[0003] The TTM can apply gate current to trigger the thyristor and achieve the control and protection of the thyristor. For example, the TTM can provide overvoltage protection, reverse recovery period protection, current interruption protection, etc. for the thyristor. When the protection action occurs, the TTM triggers the thyristor and monitors the operating state of the thyristor in real time.

[0004] Related technologies usually preset the parameters of different equalizing resistors, damping resistors, and damping capacitors in advance to test the monitoring function of the TTM. That is to say, related technologies cannot automatically adjust the parameters, resulting in low test efficiency and inability to detect the abnormality of monitoring data in time, leading to the damage of thyristors. Summary of the Invention

[0005] In order to solve the problems of low test efficiency and easy damage to thyristors in the prior art, the present application provides a test device for a digital trigger monitoring board card, which may include a damping branch, an equalizing branch, and a control module.

[0006] The damping branch and the equalizing branch are connected in parallel to form a resistive-capacitive branch. The first end of the resistive-capacitive branch is connected to the anode of the thyristor, the second end of the resistive-capacitive branch is connected to the digital trigger monitoring board card, the digital trigger monitoring board card is also connected to the cathode of the thyristor, and the resistive-capacitive branch is connected to the control module.

[0007] Optionally, the control module is configured to: adjust the capacitance value, resistance value of the damping branch, and resistance value of the equalizing branch according to a control instruction from a host computer, and test the digital trigger monitoring board card according to the monitoring data sent by the digital trigger monitoring board card.

[0008] Wherein, the monitoring data includes at least one of the capacitance value of the damping branch, the resistance value of the damping branch, the resistance value of the equalizing branch, the turn-off time of the thyristor, and the voltage of the thyristor.

[0009] In some possible implementation manners, the damping branch includes a damping capacitor unit, a first damping resistor unit, and a second damping resistor unit.

[0010] The first end of the damping capacitor unit serves as the first end of the resistor-capacitor branch. The first ends of the first damping resistor unit and the second damping resistor unit are both connected to the second end of the damping capacitor unit. The second ends of the first damping resistor unit and the second damping resistor unit are connected to serve as the second end of the resistor-capacitor branch.

[0011] Furthermore, the damping capacitor unit includes a plurality of damping capacitor sub-units. Each damping capacitor sub-unit includes a damping capacitor and a first switch connected in series.

[0012] Both the first damping resistor unit and the second damping resistor unit include a plurality of damping resistor sub-units. Each damping resistor sub-unit includes a damping resistor and a second switch connected in series.

[0013] In some other possible implementation manners, the voltage equalizing branch includes a first voltage equalizing resistor unit and a second voltage equalizing resistor unit connected in series.

[0014] Both the first voltage equalizing resistor unit and the second voltage equalizing resistor unit include a plurality of voltage equalizing resistor sub-units. Each voltage equalizing resistor sub-unit includes a voltage equalizing resistor and a third switch connected in series.

[0015] Exemplarily, the first switch, the second switch, and the third switch are all connected to the control module.

[0016] The control module is further configured to: control the closing and opening of the first switch, the second switch, and the third switch.

[0017] The first switch, the second switch, and the third switch can all be implemented by a mechanical switch or a semiconductor device.

[0018] In a possible implementation manner, the test device further includes a temperature regulation unit, and the temperature regulation unit is connected to the control module.

[0019] The temperature regulation unit is configured to: regulate the ambient temperature of the digital trigger monitoring board card according to the first control signal sent by the control module.

[0020] The control module is further configured to: test the temperature monitoring function of the digital trigger monitoring board card according to the ambient temperature of the digital trigger monitoring board card.

[0021] In another possible implementation manner, the test device further includes a humidity regulation unit. The humidity regulation unit is connected to the control module.

[0022] The humidity regulation unit is configured to: regulate the ambient humidity of the digital trigger monitoring board card according to the second control signal sent by the control module.

[0023] The control module is further configured to: test the humidity monitoring function of the digital trigger monitoring board card according to the ambient humidity of the digital trigger monitoring board card.

[0024] Understandably, the monitoring data may also include the ambient temperature and ambient humidity of the digital trigger monitoring board.

[0025] On the other hand, the present application also provides a test system for a digital trigger monitoring board, including a host computer and the above-mentioned test device.

[0026] The host computer is used to: send control instructions to the test device.

[0027] The test device is used to: receive control instructions and send the monitoring data to the host computer.

[0028] The host computer is used to: receive and display the monitoring data.

[0029] Compared with the prior art, the beneficial effects of the present application are:

[0030] The test device provided by the present application includes a damping branch, a voltage equalizing branch and a control module. Through the control module, the capacitance value, resistance value of the damping branch and the resistance value of the voltage equalizing branch can be adjusted online in real time, and the digital trigger monitoring board can be tested according to the monitoring data sent by the digital trigger monitoring board, which not only improves the test efficiency, but also can timely detect the abnormality of the monitoring data and avoid damaging the thyristor as much as possible.

[0031] The monitoring data obtained by the digital trigger monitoring board in the present application can include not only at least one of the capacitance value of the damping branch, the resistance value of the damping branch, the resistance value of the voltage equalizing branch, the turn-off time of the thyristor and the voltage of the thyristor, but also the ambient temperature and ambient humidity of the digital trigger monitoring board. That is to say, the digital trigger monitoring board can have monitoring functions such as the capacitance value of the damping branch, the resistance value of the damping branch, the resistance value of the voltage equalizing branch, the turn-off time of the thyristor and the voltage of the thyristor, the ambient temperature and ambient humidity of the digital trigger monitoring board. Therefore, the test device provided by the present application can test the monitoring functions of the digital trigger monitoring board for the above-mentioned monitoring data.

[0032] The present application realizes the control of the temperature adjustment unit and the humidity adjustment unit through the control module, and further realizes the adjustment of the ambient temperature and ambient humidity of the digital trigger monitoring board, further ensuring the safety of the digital trigger monitoring board.

[0033] The present application can switch different damping capacitors in the damping capacitor unit through the first switch, switch different damping resistors in the damping resistor unit through the second switch, and switch different voltage equalizing resistors in the voltage equalizing resistor unit through the third switch, which can further improve the test efficiency and can be timely disconnected in the case of abnormal monitoring data to further ensure that the digital trigger monitoring board is not burned out in the case of abnormal monitoring data. Description of the Drawings

[0034] To more clearly illustrate the technical solutions in the present application or the prior art, the following will briefly introduce the accompanying drawings required for the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other accompanying drawings can also be obtained based on these drawings.

[0035] Figure 1 It is a schematic structural diagram of a test device in an embodiment of the present application;

[0036] Figure 2 It is another schematic structural diagram of a test device in an embodiment of the present application;

[0037] Figure 3 It is a schematic structural diagram of a test system in an embodiment of the present application. Detailed implementation manners

[0038] The following will describe the technical solutions in the present application in conjunction with the accompanying drawings.

[0039] In the embodiments of the specification, claims and accompanying drawings of the present application, the terms "first", "second", etc. are only used for the purpose of distinguishing descriptions, and cannot be understood as indicating or implying relative importance, nor can they be understood as indicating or implying an order. In addition, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a method, system, product or device comprising a series of steps or units does not necessarily have to be limited to those steps or units clearly listed, but may include other steps or units not clearly listed or inherent to these processes, methods, products or devices.

[0040] It should be understood that in the present application, "at least one (item)" means one or more, and "a plurality" means two or more. "And / or" is used to describe the association relationship of associated objects, indicating that three relationships may exist. For example, "A and / or B" may mean: only A exists, only B exists, and both A and B exist at the same time. Among them, A and B can be singular or plural. The character " / " generally means that the associated objects before and after are in an "or" relationship. "At least one (one) of the following" or its similar expressions refer to any combination of these items, including any combination of single item (one) or plural items (ones). For example, at least one (one) of a, b or c can mean: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, c can be single or multiple.

[0041] The present application provides a test device for a digital trigger monitoring board card, such as Figure 1As shown. The test device 100 may include a damping branch 1, a voltage equalizing branch 2, and a control module 20.

[0042] Optionally, the damping branch 1 and the voltage equalizing branch 2 are connected in parallel to form a resistance-capacitance branch 10. The first end of the resistance-capacitance branch 10 is connected to the anode of the thyristor Thy, the second end of the resistance-capacitance branch 10 is connected to the digital trigger monitoring board TTM, the digital trigger monitoring board TTM is also connected to the cathode of the thyristor Thy, and the resistance-capacitance branch 10 is connected to the control module 20.

[0043] Optionally, the control module 20 is configured to: adjust the capacitance value, resistance value of the damping branch 1, and the resistance value of the voltage equalizing branch 2 according to the control instruction from the host computer 200, and test the digital trigger monitoring board TTM according to the monitoring data sent by the digital trigger monitoring board TTM.

[0044] Wherein, the monitoring data includes at least one of the capacitance value of the damping branch 1, the resistance value of the damping branch 1, the resistance value of the voltage equalizing branch 2, the turn-off time of the thyristor Thy, and the voltage of the thyristor Thy.

[0045] In some possible implementation manners, as Figure 1 shown, the damping branch 1 includes a damping capacitor unit 11, a first damping resistor unit 12, and a second damping resistor unit 13.

[0046] The first end of the damping capacitor unit 11 serves as the first end of the resistance-capacitance branch 10. The first ends of the first damping resistor unit 12 and the second damping resistor unit 13 are both connected to the second end of the damping capacitor unit 11. The second ends of the first damping resistor unit 12 and the second damping resistor unit 13 are connected and serve as the second end of the resistance-capacitance branch 10.

[0047] In some other possible implementation manners, referring to Figure 1 , the voltage equalizing branch 2 includes a first voltage equalizing resistor unit 21 and a second voltage equalizing resistor unit 22 connected in series.

[0048] Furthermore, the damping capacitor unit 11 includes a plurality of damping capacitor sub-units. Each damping capacitor sub-unit includes a damping capacitor and a first switch connected in series. As Figure 2 shown, the damping capacitor unit 11 includes a capacitor C1, a capacitor C2,..., a capacitor Cn and a first switch K11, a first switch K12,..., a first switch K1n as Figure 2 shown.

[0049] Both the first damping resistor unit 12 and the second damping resistor unit 13 include a plurality of damping resistor sub-units. Each damping resistor sub-unit includes a damping resistor and a second switch connected in series. In Figure 2Among them, the first damping resistor unit 12 includes damping resistors R11, R12, ……, R1n and second switches K21, K22, ……, K2n. The second damping resistor unit 13 includes damping resistors R21, R22, ……, R2n and second switches K21, K22, ……, K2n.

[0050] Continue to refer to Figure 2 , both the first voltage-sharing resistor unit 21 and the second voltage-sharing resistor unit 22 include a plurality of voltage-sharing resistor sub-units, and each voltage-sharing resistor sub-unit includes a series-connected voltage-sharing resistor and a third switch. In Figure 2 Among them, the first voltage-sharing resistor unit 21 includes voltage-sharing resistors R31, R32, ……, R3n and third switches K31, K32, ……, K3n. The second voltage-sharing resistor unit 22 includes voltage-sharing resistors R41, R42, ……, R4n and third switches K41, K42, ……, K4n.

[0051] Exemplarily, the first switches K11, K12, ……, K1n, the second switches K21, K22, ……, K2n, the third switches K31, K32, ……, K3n, and the third switches K41, K42, ……, K4n are all connected to the control module ( Figure 2 not shown in the figure).

[0052] The control module 20 is further configured to: control the closing and opening of all the above-mentioned first switches, all the second switches, and all the third switches.

[0053] It can be understood that by controlling the closing and opening of the first switches K11, K12, ……, K1n, the capacitance value of the damping capacitor unit 11 can be adjusted. By controlling the closing and opening of the second switches K21, K22, ……, K2n in the first damping resistor unit 12, the resistance value of the first damping resistor unit 12 can be adjusted. By controlling the closing and opening of the second switches K21, K22, ……, K2n in the second damping resistor unit 13, the resistance value of the second damping resistor unit 13 can be adjusted. By controlling the closing and opening of the third switches K31, K32, ……, K3n in the first voltage-sharing resistor unit 21, the capacitance value of the first voltage-sharing resistor unit 21 can be adjusted. By controlling the closing and opening of the third switches K41, K42, ……, K4n in the second voltage-sharing resistor unit 22, the capacitance value of the second voltage-sharing resistor unit 22 can be adjusted.

[0054] Optionally, the above-mentioned first switch, second switch, and third switch can all be implemented using mechanical switches or semiconductor devices. The semiconductor device can be an insulated gate bipolar transistor (IGBT), etc., and the embodiments of the present application do not make any limitations in this regard.

[0055] In a possible implementation, the test device 100 further includes a temperature adjustment unit 30, and the temperature adjustment unit 30 is connected to the control module 20.

[0056] The temperature adjustment unit 30 is configured to: adjust the ambient temperature of the digital trigger monitoring board TTM according to the first control signal CS1 sent by the control module 20.

[0057] The control module 20 is further configured to: test the temperature monitoring function of the digital trigger monitoring board TTM based on the ambient temperature of the digital trigger monitoring board TTM.

[0058] In another possible implementation, the test device 100 further includes a humidity adjustment unit 40. The humidity adjustment unit 40 is connected to the control module 20.

[0059] The humidity adjustment unit 40 is configured to: adjust the ambient humidity of the digital trigger monitoring board TTM according to the second control signal CS2 sent by the control module 20.

[0060] The control module 20 is further configured to: test the humidity monitoring function of the digital trigger monitoring board TTM based on the ambient humidity of the digital trigger monitoring board TTM.

[0061] It can be understood that the monitoring data may include, in addition to the capacitance value of the damping branch, the resistance value of the damping branch, the resistance value of the voltage equalizing branch, the turn-off time of the thyristor, and the voltage of the thyristor mentioned above, the ambient temperature and ambient humidity of the digital trigger monitoring board TTM.

[0062] The embodiments of the present application further provide a test system for a digital trigger monitoring board, as Figure 3 shown. The test system 1000 includes a host computer 200 and the above-mentioned test device 100.

[0063] The host computer 200 is configured to: send control instructions to the test device 100.

[0064] The test device 100 is configured to: receive the control instructions and send the monitoring data to the host computer 200.

[0065] The host computer 200 is configured to: receive and display the monitoring data.

[0066] In the embodiments of the present application, the specific functions of the host computer 200 are as follows:

[0067] 1) It can receive monitoring data in real time, and can receive monitoring data every 20 milliseconds.

[0068] 2) It can continuously record, process and analyze monitoring data, calculate the average value, maximum value and minimum value of the monitoring data within the monitoring time period, generate waveform curves, and then conduct data mining and predict future change trends.

[0069] 3) It can display the processed and analyzed monitoring data in the form of charts, reports, etc.

[0070] 4) It can automatically detect abnormalities in the monitoring data and automatically alarm when the preset value is exceeded.

[0071] 5) It can transmit the monitoring data to the control center or cloud platform through network communication, and then conduct remote control and management.

[0072] 6) It has security management and maintenance functions to ensure the security of monitoring data and the maintainability of the test system.

[0073] The above are only embodiments of the present invention and are not used to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention are included within the scope of the claims of the present invention pending approval.

Claims

1. A test device for a digital trigger monitoring board, characterized in that: It includes a damping branch, a pressure equalizing branch and a control module; The damping branch and the voltage-equalizing branch are connected in parallel to form a resistance-capacitance branch; the first end of the resistance-capacitance branch is connected to the anode of the thyristor, the second end of the resistance-capacitance branch is connected to the digital trigger monitoring board, the digital trigger monitoring board is also connected to the cathode of the thyristor, and the resistance-capacitance branch is connected to the control module; The control module is used to adjust the capacitance value and resistance value of the damping branch and the resistance value of the voltage balancing branch according to the control instructions from the host computer, and test the digital trigger monitoring board according to the monitoring data sent by the digital trigger monitoring board.

2. The testing device according to claim 1, characterized in that: The damping branch includes a damping capacitor unit, a first damping resistor unit and a second damping resistor unit; The first end of the damping capacitor unit serves as the first end of the resistance-capacitance branch; the first end of the first damping resistor unit and the second damping resistor unit are respectively connected to the second end of the damping capacitor unit; the second end of the first damping resistor unit and the second damping resistor unit are respectively connected to serve as the second end of the resistance-capacitance branch.

3. The testing device according to claim 2, characterized in that: The damping capacitor unit includes a plurality of damping capacitor subunits; each damping capacitor subunit includes a damping capacitor and a first switch connected in series.

4. The testing device according to claim 3, characterized in that: The first damping resistor unit and the second damping resistor unit each include a plurality of damping resistor sub-units; each damping resistor sub-unit includes a damping resistor and a second switch connected in series.

5. The testing device according to claim 4, characterized in that: The voltage balancing branch includes a first voltage balancing resistor unit and a second voltage balancing resistor unit connected in series; The first voltage balancing resistor unit and the second voltage balancing resistor unit each include a plurality of voltage balancing resistor sub-units, and each voltage balancing resistor sub-unit includes a voltage balancing resistor and a third switch connected in series.

6. The testing device according to claim 5, characterized in that: The first switch, the second switch and the third switch are all connected to the control module; The control module is further used to control the closing and opening of the first switch, the second switch and the third switch.

7. The testing device according to claim 1, characterized in that: The monitoring data includes at least one of a capacitance value of the damping branch, a resistance value of the damping branch, a resistance value of the voltage balancing branch, a turn-off time of the thyristor, and a voltage of the thyristor.

8. The testing device according to claim 1, characterized in that: The testing device further comprises a temperature regulating unit, and the temperature regulating unit is connected to the control module; The temperature adjustment unit is used to adjust the ambient temperature of the digital trigger monitoring board according to the first control signal sent by the control module; The control module is also used to test the temperature monitoring function of the digital trigger monitoring board according to the ambient temperature of the digital trigger monitoring board.

9. The testing device according to claim 1, characterized in that: The testing device further comprises a humidity regulating unit; the humidity regulating unit is connected to the control module; The humidity adjustment unit is used to adjust the ambient humidity of the digital trigger monitoring board according to the second control signal sent by the control module; The control module is also used to test the humidity monitoring function of the digital trigger monitoring board according to the ambient humidity of the digital trigger monitoring board.

10. The testing device according to claim 5, characterized in that: The first switch, the second switch and the third switch are all mechanical switches or semiconductor devices.

11. A digital trigger monitoring board test system, characterized in that: A test device comprising a host computer and any one of claims 1 to 10; The host computer is used to: send control instructions to the test device; The testing device is used to: receive the control instruction and send the monitoring data to the host computer; The host computer is also used to receive and display the monitoring data.

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