Adjacent channel leakage ratio index test system and method and electronic equipment

Abstract

The invention relates to the technical field of signal testing, and discloses an adjacent channel leakage ratio index testing system and method and electronic equipment. According to the method, a test case in a digital signal format is obtained through a test computer, the test case in the digital signal format is converted into a test case in an analog signal format through a waveform generator, and meanwhile, an adjacent channel leakage ratio index is calculated through a spectrum analyzer according to a format conversion signal in the analog signal format; and the test computer calculates the adjacent channel leakage ratio index according to the format conversion signal of the digital signal format, so that the adjacent channel leakage ratio index test of different types of data converters is realized by multiplexing a single system framework of the test computer. And the system-level adjacent channel leakage ratio performance during cooperative work of the analog-to-digital converter and the digital-to-analog converter can be evaluated synchronously, and the test cost is reduced.

Description

Technical Field

[0001] The present invention relates to the technical field of signal testing, and in particular, to an adjacent channel leakage ratio index testing system, method, and electronic device. Background Art

[0002] As a core device for the interaction between analog signals and digital signals, the performance of a data converter directly affects the overall efficiency of a communication system. An analog-to-digital converter (ADC) and a digital-to-analog converter (DAC) respectively undertake the key tasks of discretizing continuous analog signals and reverse conversion. However, in high-speed and high-precision communication scenarios, the problem of spectral purity is particularly prominent. Among them, the adjacent channel leakage ratio (ACLR) index has become a core index for measuring the performance of a transmitter. As the ratio of the leakage power of an adjacent channel to the power of the main channel, its performance is affected by multiple factors such as the nonlinear distortion of a power amplifier, the peak-to-average ratio of a modulation signal, and the out-of-band rejection ability of a filter. For example, existing 5G base stations require the ACLR index to be greater than or equal to 45 dB (decibels) to avoid interfering with adjacent frequency bands.

[0003] However, due to the differences in the input and output signal types of the ADC and DAC, independent test systems need to be constructed separately. For example, the ADC test requires a high-precision analog signal source and a digital analysis module, while the DAC test relies on digital signal generation and high-sensitivity spectrum analysis equipment. This discrete test architecture leads to repeated investment in equipment, complex test processes, and rising costs. Especially in multi-channel and wide-band application scenarios, the contradiction is more prominent, making it difficult to synchronously evaluate the system-level adjacent channel leakage ratio performance when the ADC and DAC work together. Summary of the Invention

[0004] To provide a basic understanding of some aspects of the disclosed embodiments, a simple summary is given below. This summary is not a comprehensive review, nor is it intended to identify key / important constituent elements or delineate the scope of protection of these embodiments. Instead, it serves as a preamble to the subsequent detailed description.

[0005] In view of the above-mentioned disadvantages of the prior art, the present application provides an adjacent channel leakage ratio index testing system, method, and electronic device to synchronously test the adjacent channel leakage ratio index of an ADC and a DAC through the same test architecture, thereby reducing the test cost.

[0006] The present application provides an adjacent channel leakage ratio index test system, including: a data converter configured to perform format conversion on a received test case according to a data communication protocol to obtain a format conversion signal; a test computer configured to obtain a test case in digital signal format, send the test case in digital signal format to the data converter or a waveform generator, and calculate an adjacent channel leakage ratio index according to the format conversion signal in digital signal format to obtain a test result; a waveform generator configured to perform format conversion on the test case in digital signal format to obtain a test case in analog signal format; and a spectrum analyzer configured to calculate an adjacent channel leakage ratio index according to the format conversion signal in analog signal format to obtain a test result.

[0007] In an embodiment of the present application, the system further includes at least one of the following: an acquisition and transmission module configured to control the data converter to perform format conversion; a power supply module configured to supply power to the data converter; and a signal source module configured to provide a reference signal for format conversion to the data converter.

[0008] In an embodiment of the present application, the acquisition and transmission module is further configured to: send the test case in digital signal format to the data converter; and send the format conversion signal in digital signal format to the test computer.

[0009] In an embodiment of the present application, if the data converter belongs to a digital-to-analog converter, the output end of the test computer is connected to the digital signal channel of the digital-to-analog converter through the acquisition and transmission module, and the output end of the digital-to-analog converter is connected to the spectrum analyzer; if the data converter belongs to an analog-to-digital converter, the output end of the test computer is connected to the analog signal channel of the analog-to-digital converter through the waveform generator, and the output end of the analog-to-digital converter is connected to the input end of the test computer through the acquisition and transmission module.

[0010] In an embodiment of the present application, the test computer obtains the test case in digital signal format in the following manner: obtaining a protocol standard document corresponding to the data communication protocol, where the protocol standard document carries a modulation method, a signal bandwidth, a center frequency, a symbol rate, a sampling rate, and a carrier frequency corresponding to the test case; generating a standard baseband signal according to the protocol standard document, and performing signal preprocessing on the standard baseband signal, where the signal preprocessing includes digital pre-distortion and / or filtering processing; and encapsulating the standard baseband signal according to an interface standard document of the data converter to obtain a test case in digital signal format.

[0011] In an embodiment of the present application, the test computer obtains test cases in digital signal format in the following manner: obtaining the protocol constraint conditions corresponding to the data communication protocol and the hardware constraint conditions corresponding to the data converter; using a preset digital signal library to match the data communication protocol to obtain an initial signal in digital signal format; comparing the signal parameters of the initial signal according to the protocol constraint conditions and the hardware constraint conditions to obtain parameters to be adjusted; using a preset adjustment strategy library to match the parameters to be adjusted to obtain a parameter adjustment strategy; adjusting the signal parameters of the initial signal according to the parameter adjustment strategy, and using the adjusted initial signal as a test case in digital signal format.

[0012] In an embodiment of the present application, the test computer calculates the adjacent channel leakage ratio index based on the format conversion signal in digital signal format in the following manner to obtain a test result: extracting a time-domain signal from the format conversion signal in digital signal format; performing windowing processing on the time-domain signal to obtain a windowed signal, and performing a fast Fourier transform on the windowed signal to obtain a frequency-domain complex value, so as to determine the power spectral density according to the spectral complex value; extracting the main channel center frequency and the adjacent channel frequency offset from the format conversion signal in digital signal format, and calculating the signal power according to the main channel center frequency and the adjacent channel frequency offset to obtain the main channel power and the adjacent channel power; calculating the adjacent channel leakage ratio index according to the main channel power and the adjacent channel power.

[0013] In an embodiment of the present application, the spectrum analyzer calculates the adjacent channel leakage ratio index based on the format conversion signal in analog signal format in the following manner to obtain a test result: performing power measurement on the format conversion signal in analog signal format to obtain the main channel power and the adjacent channel power respectively; calculating the adjacent channel leakage ratio index according to the main channel power and the adjacent channel power.

[0014] The present application provides a method for testing the adjacent channel leakage ratio index, including: obtaining a test case in digital signal format; sending the test case in digital signal format to a data converter, or performing format conversion according to the test case in digital signal format to obtain a test case in analog signal format, and sending the test case in analog signal format to the data converter; using the data converter to perform format conversion on the received test case according to the data communication protocol to obtain a format conversion signal; calculating the adjacent channel leakage ratio index based on the format conversion signal in digital signal format to obtain a test result, or calculating the adjacent channel leakage ratio index based on the format conversion signal in analog signal format to obtain a test result.

[0015] The present application provides an electronic device, including: a processor and a memory; the memory is used for storing a computer program, and the processor is used for executing the computer program stored in the memory so that the electronic device executes the above-mentioned method.

[0016] Advantages of the present application:

[0017] The test computer obtains test cases in digital signal format, and the waveform generator converts the test cases in digital signal format into test cases in analog signal format. At the same time, the spectrum analyzer calculates the adjacent channel leakage ratio index according to the format conversion signal in analog signal format, and the test computer calculates the adjacent channel leakage ratio index according to the format conversion signal in digital signal format. In this way, by combining the test computer and the waveform generator, digital signals or analog signals can be generated as test cases according to test requirements, and by combining the test computer and the spectrum analyzer, the adjacent channel leakage ratio index can be calculated according to the digital signals or analog signals output by the data converter. Thus, the adjacent channel leakage ratio index test of different types of data converters can be realized by reusing the single system architecture of the test computer, and the system-level adjacent channel leakage ratio performance when the analog-to-digital converter and the digital-to-analog converter work together can also be evaluated synchronously, reducing the test cost. Description of the drawings

[0018] Figure 1 is a schematic structural diagram of an adjacent channel leakage ratio index test system in an embodiment of the present application;

[0019] Figure 2 is a schematic structural diagram of another adjacent channel leakage ratio index test system in an embodiment of the present application;

[0020] Figure 3 is a schematic structural diagram of an adjacent channel leakage ratio index test system for a digital-to-analog converter in an embodiment of the present application;

[0021] Figure 4 is a schematic diagram of the test result of a digital-to-analog converter in an embodiment of the present application;

[0022] Figure 5 is a schematic diagram of the test result of another digital-to-analog converter in an embodiment of the present application;

[0023] Figure 6 is a schematic diagram of the test result of another digital-to-analog converter in an embodiment of the present application;

[0024] Figure 7 is a schematic structural diagram of an adjacent channel leakage ratio index test system for an analog-to-digital converter in an embodiment of the present application;

[0025] Figure 8It is a schematic diagram of the test results of an analog-to-digital converter in an embodiment of the present application;

[0026] Figure 9 It is a schematic diagram of the test results of another analog-to-digital converter in an embodiment of the present application;

[0027] Figure 10 It is a schematic flowchart of a method for testing the adjacent channel leakage ratio index in an embodiment of the present application;

[0028] Figure 11 It is a schematic diagram of the structure of an electronic device in an embodiment of the present invention. Detailed implementation manners

[0029] The following uses specific specific examples to illustrate the implementation manners of the present invention. Those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation manners. Various details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of the present invention. It should be noted that, without conflict, the following embodiments and sub-samples in the embodiments can be combined with each other.

[0030] It should be noted that the diagrams provided in the following embodiments only illustrate the basic concept of the present invention in a schematic manner. Therefore, only the components related to the present invention are shown in the diagrams, rather than being drawn according to the number, shape, and size of the components in actual implementation. The types, quantities, and proportions of the components in actual implementation can be arbitrarily changed, and the component layout type may also be more complex.

[0031] In the following description, a large number of details are discussed to provide a more thorough explanation of the embodiments of the present invention. However, it is obvious to those skilled in the art that the embodiments of the present invention can be implemented without these specific details. In other embodiments, well-known structures and devices are shown in the form of block diagrams rather than in detail to avoid making the embodiments of the present invention difficult to understand.

[0032] The terms "first", "second", etc. in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects, and do not have to be used to describe a specific order or sequence. It should be understood that such data can be interchanged under appropriate circumstances so as to implement the embodiments of the present application described herein. In addition, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion.

[0033] Unless otherwise specified, the term "plurality" means two or more.

[0034] In this application, the character " / " indicates an "or" relationship between the preceding and following objects. For example, A / B means: A or B.

[0035] The term "and / or" is an associative relationship describing an object, indicating that three relationships can exist. For example, A and / or B means: A or B, or, the three relationships of A and B.

[0036] Combined Figure 1 As shown, this application provides an adjacent channel leakage ratio index test system, including a data converter 101, a test computer 102, a waveform generator 103, and a spectrum analyzer 104.

[0037] The data converter 101 is configured to convert the format of the received test case according to the data communication protocol to obtain a format conversion signal.

[0038] The test computer 102 is configured to obtain a test case in digital signal format, send the test case in digital signal format to the data converter or the waveform generator, and calculate the adjacent channel leakage ratio index according to the format conversion signal in digital signal format to obtain a test result.

[0039] The waveform generator 103 is configured to convert the format of the test case in digital signal format to obtain a test case in analog signal format.

[0040] The spectrum analyzer 104 is configured to calculate the adjacent channel leakage ratio index according to the format conversion signal in analog signal format to obtain a test result.

[0041] Using the adjacent channel leakage ratio index test system provided by this application, a test case in digital signal format is obtained through the test computer, and the test case in digital signal format is converted into a test case in analog signal format through the waveform generator. At the same time, the adjacent channel leakage ratio index is calculated by the spectrum analyzer according to the format conversion signal in analog signal format, and the adjacent channel leakage ratio index is calculated by the test computer according to the format conversion signal in digital signal format. In this way, by combining the test computer and the waveform generator, a digital signal or an analog signal can be generated as a test case according to the test requirements, and by combining the test computer and the spectrum analyzer, the adjacent channel leakage ratio index can be calculated according to the digital signal or the analog signal output by the data converter. Thus, the adjacent channel leakage ratio index test of different types of data converters can be realized by reusing the single system architecture of the test computer, and the system-level adjacent channel leakage ratio performance when the analog-to-digital converter and the digital-to-analog converter work together can also be evaluated synchronously, reducing the test cost.

[0042] Combined Figure 2As shown in the figure, the present application provides an adjacent channel leakage ratio index test system, including a data converter 101, a test computer 102, a waveform generator 103, a spectrum analyzer 104, an acquisition and transmission module 105, a power supply module 106, and a signal source module 107.

[0043] The data converter 101 is configured to convert the format of the received test case according to the data communication protocol to obtain a format conversion signal.

[0044] In some embodiments, the data converter 101 includes a digital-to-analog converter 1011 and / or an analog-to-digital converter 1012.

[0045] In some embodiments, the digital-to-analog converter 1011 is used to convert a digital signal into a continuous analog signal, including: receiving a set of binary codes by the digital input; mapping the digital value to the corresponding analog output through an internal circuit; the accuracy of the output analog signal is determined by the resolution and the reference voltage, where the resolution represents the digital quantity corresponding to the smallest analog quantity change that the data converter can distinguish or generate, and it determines the fineness of the converter.

[0046] In some embodiments, the analog-to-digital converter 1012 is used to convert a continuous analog signal into a discrete digital signal, including: capturing the instantaneous value of the analog signal at a fixed sampling rate, keeping the sampled value stable for a period of time for subsequent circuit processing, mapping the sampled value to a limited number of discrete levels, and converting the quantized value into a binary code for output.

[0047] The test computer 102 is configured to obtain a test case in digital signal format, send the test case in digital signal format to the data converter or the waveform generator, and calculate the adjacent channel leakage ratio index according to the format conversion signal in digital signal format to obtain a test result.

[0048] In some embodiments, the test computer 102 includes a personal computer, a laptop computer, a smart phone, a tablet computer, etc.

[0049] Optionally, the test computer obtains the test case in digital signal format in the following manner: obtaining the protocol standard document corresponding to the data communication protocol, where the protocol standard document carries the modulation method, signal bandwidth, center frequency, symbol rate, sampling rate, carrier frequency corresponding to the test case; generating a standard baseband signal according to the protocol standard document and performing signal preprocessing on the standard baseband signal, where the signal preprocessing includes digital pre-distortion and / or filtering processing; encapsulating the standard baseband signal according to the interface standard document of the data converter to obtain a test case in digital signal format.

[0050] In some embodiments, the modulation methods include QPSK (Quadrature Phase Shift Keying), 16QAM (16 Quadrature Amplitude Modulation), 64QAM (64 Quadrature Amplitude Modulation), 256QAM (256-ary Quadrature Amplitude Modulation), etc.; the signal bandwidth is selected according to the specifications of the device under test, for example, 5 MHz, 20 MHz, 100 MHz, etc.; the sampling rate needs to match the sampling rate of the data converter to avoid aliasing.

[0051] Optionally, the test computer obtains the test cases in digital signal format in the following manner: obtaining the protocol constraint conditions corresponding to the data communication protocol and the hardware constraint conditions corresponding to the data converter; using a preset digital signal library to match the data communication protocol to obtain the initial signal in digital signal format; comparing the signal parameters of the initial signal according to the protocol constraint conditions and the hardware constraint conditions to obtain the parameters to be adjusted; using a preset adjustment strategy library to match the parameters to be adjusted to obtain the parameter adjustment strategy; adjusting the signal parameters of the initial signal according to the parameter adjustment strategy, and using the adjusted initial signal as the test case in digital signal format.

[0052] The waveform generator 103 is configured to perform format conversion according to the test case in digital signal format to obtain the test case in analog signal format.

[0053] In some embodiments, the waveform generator 103 includes an arbitrary waveform generator (AWG), which generates an analog signal of an arbitrary time domain waveform through the received waveform file, and supports complex modulation, transient signals, and protocol simulation.

[0054] The spectrum analyzer 104 is configured to calculate the adjacent channel leakage ratio index according to the format conversion signal in analog signal format to obtain the test result.

[0055] The acquisition and transmission module 105 is configured to control the data converter to perform format conversion.

[0056] Optionally, the acquisition and transmission module 105 is further configured to send the test case in digital signal format to the data converter; and send the format conversion signal in digital signal format to the test computer.

[0057] In some embodiments, the acquisition and transmission module 105 includes an FPGA (Field-Programmable Gate Array) acquisition and transmission card.

[0058] The power supply module 106 is configured to supply power to the data converter.

[0059] The signal source module 107 is configured to provide a reference signal for format conversion to the data converter.

[0060] In some embodiments, the reference signal is used to provide a reference clock to the data converter. Among them, the digital-to-analog converter needs to determine the conversion rate of the digital signal according to the reference clock, and the analog-to-digital converter needs to trigger the sampling of the analog signal according to the edge of the reference clock.

[0061] Combined Figure 3 As shown, the present application provides an adjacent channel leakage ratio index test system for a digital-to-analog converter, including a digital-to-analog converter 1011, a test computer 102, a spectrum analyzer 104, and an acquisition and transmission module 105. Among them, the output end of the test computer 102 is connected to the digital signal channel of the digital-to-analog converter 1011 through the acquisition and transmission module 105, and the output end of the digital-to-analog converter 1011 is connected to the spectrum analyzer 105.

[0062] In some embodiments, the test computer sends a test case in digital signal format to the acquisition and transmission module; the acquisition and transmission module sends a test case in digital signal format to the digital-to-analog converter and controls the digital-to-analog converter to output a format conversion signal in analog signal format; the spectrum analyzer receives the format conversion signal in analog signal format and performs an adjacent channel leakage ratio index test.

[0063] In some embodiments, the digital-to-analog converter is a 16-bit dual-channel digital-to-analog converter, its output interface is a complementary metal oxide semiconductor (CMOS, Complementary Metal-Oxide-Semiconductor) single-ended signal, the maximum input data rate is 300 Mbps, and the acquisition and transmission module uses an FPGA acquisition and transmission card that can meet the high-speed data transmission requirements of the digital-to-analog converter; the adjacent channel leakage ratio index test system is used to perform 3G WCDMA (Wideband Code Division Multiple Access) tests on the digital-to-analog converter with single-carrier and four-carrier respectively; the test results corresponding to the single-carrier are as Figure 4 shown, the spectrum of the single-carrier is shifted to 143.88 MHz, the bandwidth is 3.84 MHz, and the final adjacent channel leakage ratio index reaches the manual standard of the digital-to-analog converter; the test results corresponding to the four-carrier are as Figure 5As shown, the spectrum of the four carriers is shifted to 151.38 MHz, with a bandwidth of 3.84 MHz, and the final adjacent channel leakage ratio index also meets the manual standard of this digital-to-analog converter.

[0064] In some embodiments, the digital-to-analog converter is a 16-bit four-channel digital-to-analog converter with a maximum serial interface data rate of 10.96 Gbps; the adjacent channel leakage ratio index test system is used to conduct 4G LTE (4G Long Term Evolution) tests on this digital-to-analog converter with dual carriers; the corresponding test results of this digital-to-analog converter are as Figure 6 shown, the spectrum of a single carrier is shifted to 180 MHz, with a bandwidth of 20 MHz.

[0065] Optionally, the spectrum analyzer calculates the adjacent channel leakage ratio index based on the format-converted signal of the analog signal format in the following way to obtain the test result: perform power measurement on the format-converted signal of the analog signal format to obtain the main channel power and the adjacent channel power respectively; calculate the adjacent channel leakage ratio index according to the main channel power and the adjacent channel power.

[0066] In some embodiments, set the device parameters of the spectrum analyzer, including but not limited to the center frequency, sweep width, resolution bandwidth, video bandwidth, reference level, etc.; read the main channel power value, left adjacent channel power value, and right adjacent channel power value through the spectrum analyzer, and calculate the adjacent channel leakage ratio index through formula (1):

[0067]

[0068] In formula (1), ACLR is the adjacent channel leakage ratio index, ACLR Left is the left adjacent channel leakage ratio index, ACLR Right is the right adjacent channel leakage ratio index, P main is the main channel power value, P adjacent-left is the left adjacent channel power value, P adjacent-right is the right adjacent channel power value, [dBc] is the measurement unit, that is, decibel carrier.

[0069] Combined with Figure 7 shown, the present application provides an adjacent channel leakage ratio index test system for an analog-to-digital converter, including an analog-to-digital converter 1012, a test computer 102, a waveform generator 103, and an acquisition and transmission module 105. Among them, the output end of the test computer 102 is connected to the analog signal channel of the analog-to-digital converter 1012 through the waveform generator 103, and the output end of the analog-to-digital converter 1012 is connected to the input end of the test computer 102 through the acquisition and transmission module 105.

[0070] In some embodiments, the test computer sends test cases in digital signal format to the waveform generator; the waveform generator converts the test cases in digital signal format into test cases in analog signal format and sends the test cases in analog signal format to the analog-to-digital converter; the acquisition and transmission module controls the analog-to-digital converter to output a format conversion signal in digital signal format and sends the format conversion signal in digital signal format to the test computer; the test computer receives the format conversion signal in digital signal format and performs adjacent channel leakage ratio index testing.

[0071] In some embodiments, the analog-to-digital converter is a 14-bit dual-channel analog-to-digital converter, its output interface is JESD204B, and the serial interface data rate is 13 Gbps; the acquisition and transmission module sends the format conversion signal in digital signal format output by the output interface to the test computer; the adjacent channel leakage ratio index test system performs 3G WCDMA testing and 4G LTE testing on the analog-to-digital converter respectively with a single carrier; the test results corresponding to the 3G WCDMA testing are as Figure 8 shown, the center frequency is 280 MHz and the bandwidth is 3.84 MHz; the test results corresponding to the 4G LTE testing are as Figure 9 shown, the center frequency is 180 MHz and the bandwidth is 20 MHz.

[0072] Optionally, the test computer calculates the adjacent channel leakage ratio index based on the format conversion signal in digital signal format in the following manner to obtain the test result: extract the time-domain signal from the format conversion signal in digital signal format; perform windowing processing on the time-domain signal to obtain a windowed signal, and perform a fast Fourier transform (FFT) on the windowed signal to obtain frequency-domain complex values, so as to determine the power spectral density according to the spectral complex values; extract the main channel center frequency and adjacent channel frequency offset from the format conversion signal in digital signal format, perform signal power calculation according to the main channel center frequency and adjacent channel frequency offset to obtain the main channel power and adjacent channel power; calculate the adjacent channel leakage ratio index according to the main channel power and adjacent channel power.

[0073] In some embodiments, the time-domain signal is up-converted to a radio frequency carrier by formula (2):

[0074]

[0075] In formula (2), S rf [n] is the time-domain signal after up-conversion, s[n] is the time-domain signal before up-conversion, f c is the carrier frequency, Δt is the sampling interval, and n is the discrete time point.

[0076] In some embodiments, the time-domain signal is windowed by formula (3):

[0077] S win [n] = S rf [n]·w[n] Formula (3)

[0078] In Formula (3), S win [n] is the windowed signal, and w[n] is the weight coefficient of the window function at the discrete time point n.

[0079] In some embodiments, the complex value in the frequency domain is determined by Formula (4):

[0080]

[0081] In Formula (4), X[k] is the complex value in the frequency domain.

[0082] In some embodiments, the power spectral density is determined by Formula (5):

[0083]

[0084] In Formula (5), P[k] is the power spectral density.

[0085] In some embodiments, the main channel frequency point index and the adjacent channel frequency point index are determined by Formula (6):

[0086]

[0087] In Formula (6), k main is the main channel frequency point index, k adjacent is the adjacent channel frequency point index, f main is the center frequency of the main channel, f s is the sampling rate, M is the length of the fast Fourier transform, and Δf offset is the adjacent channel frequency offset.

[0088] In some embodiments, the main channel power value is determined by Formula (7):

[0089]

[0090] In Formula (7), k start and k end are based on the main channel frequency point index.

[0091] In some embodiments, the calculation method of the adjacent channel power value is similar to that of the main channel power value.

[0092] Combined with Figure 10 shown, this application provides a method for testing the adjacent channel leakage ratio index, including:

[0093] Step S1001, obtaining a test case in digital signal format;

[0094] Step S1002: Send the test case in digital signal format to the data converter, or perform format conversion according to the test case in digital signal format to obtain a test case in analog signal format, and send the test case in analog signal format to the data converter;

[0095] Step S1003: Use the data converter to perform format conversion on the received test case according to the data communication protocol to obtain a format-converted signal;

[0096] Step S1004: Calculate the adjacent channel leakage ratio index based on the format-converted signal in digital signal format to obtain a test result, or calculate the adjacent channel leakage ratio index based on the format-converted signal in analog signal format to obtain a test result.

[0097] By using the adjacent channel leakage ratio index test method provided in this application, a test case in digital signal format is obtained through a test computer, and the test case in digital signal format is converted into a test case in analog signal format through a waveform generator. At the same time, the adjacent channel leakage ratio index is calculated based on the format-converted signal in analog signal format through a spectrum analyzer, and the adjacent channel leakage ratio index is calculated based on the format-converted signal in digital signal format through a test computer. In this way, by combining the test computer and the waveform generator, a digital signal or an analog signal can be generated as a test case according to the test requirements, and by combining the test computer and the spectrum analyzer, the adjacent channel leakage ratio index can be calculated based on the digital signal or the analog signal output by the data converter. Thus, the adjacent channel leakage ratio index test of different types of data converters can be realized by reusing the single system architecture of the test computer, and the system-level adjacent channel leakage ratio performance when the analog-to-digital converter and the digital-to-analog converter work together can also be evaluated synchronously, reducing the test cost.

[0098] This application also provides an electronic device, including: a processor and a memory; the memory is used to store a computer program, and the processor is used to execute the computer program stored in the memory so that the electronic device executes the above method.

[0099] Figure 11 The structural schematic diagram of the computer system of the electronic device suitable for implementing the embodiments of this application is shown. It should be noted that Figure 11 The computer system 1100 of the electronic device shown is only an example, and should not bring any restrictions to the functions and usage scopes of the embodiments of this application.

[0100] As Figure 11As shown, the computer system 1100 includes a Central Processing Unit (CPU) 1101, which can perform various appropriate actions and processes according to the program stored in the Read-Only Memory (ROM) 1102 or the program loaded from the storage section 1108 into the Random Access Memory (RAM) 1103, such as executing the methods in the above embodiments. In the RAM 1103, various programs and data required for system operation are also stored. The CPU 1101, ROM 1102, and RAM 1103 are connected to each other via a bus 1104. An Input / Output (I / O) interface 1105 is also connected to the bus 1104.

[0101] The following components are connected to the I / O interface 1105: an input section 1106 including a keyboard, a mouse, etc.; an output section 1107 including a Cathode Ray Tube (CRT), a Liquid Crystal Display (LCD), etc. and a speaker, etc.; a storage section 1108 including a hard disk, etc.; and a communication section 1109 including a network interface card such as a LAN (Local Area Network) card, a modem, etc. The communication section 1109 performs communication processing via a network such as the Internet. A drive 1110 is also connected to the I / O interface 1105 as required. A removable medium 1111, such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, etc., is installed on the drive 1110 as required so that the computer program read from it can be installed into the storage section 1108 as required.

[0102] The electronic device disclosed in this embodiment includes a processor, a memory, a transceiver, and a communication interface. The memory and the communication interface are connected to the processor and the transceiver and complete communication with each other. The memory is used to store computer programs, the communication interface is used for communication, and the processor and the transceiver are used to run the computer programs so that the electronic device executes each step of the above method.

[0103] The above description and the accompanying drawings fully illustrate the embodiments of the present disclosure, enabling those skilled in the art to practice them. Other embodiments may include structural, logical, electrical, process, and other changes. The embodiments merely represent possible variations. Unless explicitly required, the individual components and functions are optional, and the order of operations may vary. Parts and sub-samples of some embodiments may be included in or replace parts and sub-samples of other embodiments. Moreover, the terms used in this application are only for describing the embodiments and do not limit the claims. As used in the description of the embodiments and the claims, unless the context clearly indicates otherwise, the singular forms "a", "an", and "the" are intended to also include the plural forms. Similarly, as used in this application, the term "and / or" refers to any and all possible combinations of one or more of the associated listed items. Additionally, when used in this application, the term "comprise" and its variants "comprises" and / or "comprising" etc. mean the presence of the stated sub-samples, wholes, steps, operations, elements, and / or components, but do not exclude the presence or addition of one or more other sub-samples, wholes, steps, operations, elements, components, and / or groupings of these. Without further limitation, an element defined by the statement "comprising one..." does not exclude the presence of additional identical elements in the process, method, or device comprising the element. Herein, each embodiment may focus on the differences from other embodiments, and the same or similar parts among the embodiments may be referred to each other. For the methods, products, etc. disclosed in the embodiments, if they correspond to the method part disclosed in the embodiments, the relevant parts may refer to the description of the method part.

[0104] Those skilled in the art can realize that the units and algorithm steps of each example described in connection with the embodiments disclosed herein can be implemented by electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are executed in a hardware or software manner may depend on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods for each specific application to implement the described functions, but such implementation should not be considered to exceed the scope of this application. Those skilled in the art can clearly understand that for the convenience and brevity of description, the specific working processes of the systems, devices, and units described above can refer to the corresponding processes in the foregoing method embodiments, and will not be elaborated herein.

[0105] In the embodiments disclosed in this document, the disclosed methods, products (including but not limited to devices, equipment, etc.) can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of units can be merely a logical function division. In actual implementation, there can be other division methods. For example, multiple units or components can be combined or integrated into another system, or some sub-samples can be ignored or not executed. Additionally, the couplings or direct couplings or communication connections shown or discussed between each other can be through some interfaces. The indirect coupling or communication connection of devices or units can be in electrical, mechanical, or other forms. The units described as separate components may or may not be physically separated. The components shown as units may or may not be physical units, that is, they can be located in one place or distributed to multiple network units. Some or all of the units can be selected according to actual needs to implement this embodiment. Additionally, in this application, each functional unit can be integrated in a processing unit, or each unit can exist physically separately, or two or more units can be integrated in one unit.

[0106] The flowcharts and block diagrams in the accompanying drawings illustrate the possible architectures, functions, and operations of the systems, methods, and computer program products according to this application. In this regard, each block in the flowchart or block diagram can represent a module, a program segment, or a part of code that contains one or more executable instructions for implementing the specified logical function. In some alternative implementations, the functions marked in the blocks can also occur in a different order than that marked in the accompanying drawings. For example, two consecutive blocks can actually be executed substantially in parallel, and they can sometimes be executed in the reverse order, which can depend on the functions involved. In the descriptions corresponding to the flowcharts and block diagrams in the accompanying drawings, the operations or steps corresponding to different blocks can also occur in a different order than that disclosed in the description. Sometimes, there is no specific order between different operations or steps. For example, two consecutive operations or steps can actually be executed substantially in parallel, and they can sometimes be executed in the reverse order, which can depend on the functions involved. Each block in the block diagram and / or flowchart, as well as the combination of blocks in the block diagram and / or flowchart, can be implemented by a dedicated hardware-based system for performing the specified functions or actions, or can be implemented by a combination of dedicated hardware and computer instructions.

Claims

1. An adjacent channel leakage ratio index test system, characterized in that: include: A data converter is configured to perform format conversion on the received test case according to the data communication protocol to obtain a format conversion signal; A test computer is configured to obtain a test case in a digital signal format, send the test case in the digital signal format to the data converter or the waveform generator, and calculate an adjacent channel leakage ratio index according to a format conversion signal in the digital signal format to obtain a test result; A waveform generator is configured to perform format conversion according to the test case in the digital signal format to obtain the test case in the analog signal format; The spectrum analyzer is configured to calculate an adjacent channel leakage ratio index according to a format conversion signal in an analog signal format to obtain a test result.

2. The system according to claim 1, characterized in that The system further comprises at least one of the following: A collection and transmission module, configured to control the data converter to perform format conversion; A power module, configured to provide power to the data converter; The signal source module is configured to provide a reference signal for format conversion to the data converter.

3. The system according to claim 2, characterized in that The acquisition and transmission module is also configured as follows: sending a test case in a digital signal format to the data converter; A format conversion signal in a digital signal format is sent to the test computer.

4. The system according to claim 2, characterized in that If the data converter is a digital-to-analog converter, the output end of the test computer is connected to the digital signal channel of the digital-to-analog converter through an acquisition and transmission module, and the output end of the digital-to-analog converter is connected to the spectrum analyzer; If the data converter is an analog-to-digital converter, the output end of the test computer is connected to the analog signal channel of the analog-to-digital converter through a waveform generator, and the output end of the analog-to-digital converter is connected to the input end of the test computer through an acquisition and transmission module.

5. The system according to any one of claims 1 to 4, characterized in that: The test computer obtains the test case in digital signal format in the following manner: Obtain a protocol standard document corresponding to the data communication protocol, wherein the protocol standard document carries a modulation mode, signal bandwidth, center frequency, symbol rate, sampling rate, and carrier frequency corresponding to the test case; Generate a standard baseband signal according to the protocol standard document, and perform signal preprocessing on the standard baseband signal, wherein the signal preprocessing includes digital predistortion and / or filtering processing; The standard baseband signal is encapsulated according to the interface standard document of the data converter to obtain a test case in a digital signal format.

6. The system according to any one of claims 1 to 4, characterized in that: The test computer obtains the test case in digital signal format in the following manner: Acquire protocol constraints corresponding to the data communication protocol and hardware constraints corresponding to the data converter; Matching the data communication protocol using a preset digital signal library to obtain an initial signal in a digital signal format; Comparing the signal parameters of the initial signal according to the protocol constraint condition and the hardware constraint condition to obtain the parameters to be adjusted; Using a preset adjustment strategy library to match the parameters to be adjusted to obtain a parameter adjustment strategy; The signal parameters of the initial signal are adjusted according to the parameter adjustment strategy, and the adjusted initial signal is used as a test case of the digital signal format.

7. The system according to any one of claims 1 to 4, characterized in that: The test computer calculates the adjacent channel leakage ratio index according to the format conversion signal of the digital signal format in the following way to obtain the test result: extracting a time domain signal from a format-converted signal in the digital signal format; Performing windowing processing on the time domain signal to obtain a windowed signal, and performing fast Fourier transform on the windowed signal to obtain a frequency domain complex value, so as to determine a power spectral density according to the frequency spectrum complex value; Extracting a main channel center frequency and an adjacent channel frequency offset from a format conversion signal of the digital signal format, performing signal power calculation according to the main channel center frequency and the adjacent channel frequency offset, and obtaining a main channel power and an adjacent channel power; An adjacent channel leakage ratio index is calculated according to the main channel power and the adjacent channel power.

8. The system according to any one of claims 1 to 4, characterized in that: The spectrum analyzer calculates the adjacent channel leakage ratio index based on the format conversion signal of the analog signal format in the following way to obtain the test result: Perform power measurement on the format-converted signal in the analog signal format to obtain the main channel power and the adjacent channel power respectively; An adjacent channel leakage ratio index is calculated according to the main channel power and the adjacent channel power.

9. A method for testing an adjacent channel leakage ratio index, characterized in that: include: Get test cases in digital signal format; Sending the test case in the digital signal format to a data converter, or performing format conversion according to the test case in the digital signal format to obtain a test case in an analog signal format, and sending the test case in the analog signal format to the data converter; Using the data converter to convert the format of the received test case according to the data communication protocol to obtain a format conversion signal; The adjacent channel leakage ratio index is calculated according to the format conversion signal of the digital signal format to obtain the test result, or the adjacent channel leakage ratio index is calculated according to the format conversion signal of the analog signal format to obtain the test result.

10. An electronic device, characterized in that: include: Processor and memory; The memory is used to store a computer program, and the processor is used to execute the computer program stored in the memory, so that the electronic device executes the method as claimed in claim 9.

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