Plating element analysis method and device, electronic equipment and storage medium

Abstract

The invention provides a coating element analysis method and device, electronic equipment and a storage medium, and relates to the technical field of alloy coating detection, in particular to the following steps: obtaining a to-be-analyzed picture which is an electron microscope scanning picture of a to-be-analyzed sample; performing picture processing on the to-be-analyzed picture to obtain a target picture; and based on the target picture, analyzing the coating element of the to-be-analyzed sample to obtain an analysis result.

Description

Technical Field

[0001] The present invention relates to the technical field of alloy coating detection, and in particular to an analysis method, device, electronic device and storage medium for coating elements. Background Art

[0002] In order to make the corrosion resistance of steel better, a coating can be added to the surface of the steel through electroplating and other treatments. In order to provide a more high-quality corrosion-resistant strip steel, the coating morphology and the distribution of alloy elements of the strip steel will be detected after production to determine the coating quality of the strip steel. In the past, the electron probe microanalyzer (Electron Probe MicroanAlyser, abbreviated as EPMA) was usually used to detect the surface morphology and element distribution of the coating. It took more than two hours to detect one position to achieve a satisfactory effect, which affected the detection efficiency. Summary of the Invention

[0003] The present invention provides an analysis method, device, electronic device and storage medium for coating elements, which are used to solve the problem of low detection efficiency caused by detecting the coating surface through an electron probe microanalyzer in the related art.

[0004] In a first aspect, an embodiment of the present invention provides an analysis method for coating elements, and the method includes:

[0005] Obtain a picture to be analyzed, where the picture to be analyzed is an electron microscope scan picture of a sample to be analyzed;

[0006] Perform picture processing on the picture to be analyzed to obtain a target picture;

[0007] Based on the target picture, analyze the coating elements of the sample to be analyzed to obtain an analysis result.

[0008] Optionally, the analysis result includes the distribution of aluminum and / or magnesium elements on the sample to be analyzed.

[0009] Optionally, the step of analyzing the coating elements of the sample to be analyzed based on the target picture to obtain an analysis result includes:

[0010] Obtain the analysis result according to the depth and distribution of the color blocks on the target picture.

[0011] Optionally, the picture to be analyzed is a picture obtained by the electron microscope detecting the sample to be analyzed in the secondary electron mode.

[0012] Optionally, the step of performing picture processing on the picture to be analyzed to obtain a target picture includes:

[0013] Perform grayscale processing on the picture to be analyzed to obtain a grayscale processed picture;

[0014] Based on the grayscale processed picture, obtain the target picture.

[0015] Optionally, the obtaining the target picture based on the grayscale processed picture includes:

[0016] Perform binarization calculation processing on the grayscale processed picture to obtain the target picture.

[0017] In a second aspect, an embodiment of the present invention provides an analysis device for plating elements, the device includes:

[0018] An acquisition module, configured to acquire a picture to be analyzed, where the picture to be analyzed is a scanning picture of an electron microscope of a sample to be analyzed;

[0019] A processing module, configured to perform picture processing on the picture to be analyzed to obtain a target picture;

[0020] An analysis module, configured to analyze the plating elements of the sample to be analyzed based on the target picture to obtain an analysis result.

[0021] In a third aspect, an embodiment of the present invention provides an electronic device, including:

[0022] A processor;

[0023] A memory for storing executable instructions of the processor;

[0024] Wherein, the processor is configured to execute the instructions to implement the method as described in the first aspect.

[0025] In a fourth aspect, an embodiment of the present invention provides a storage medium, when the instructions in the storage medium are executed by a processor of an electronic device, enabling the electronic device to execute the method as described in the first aspect.

[0026] In a fifth aspect, an embodiment of the present invention provides a computer program product, including a computer program, and the computer program is executed by a processor to implement the method as described in the first aspect.

[0027] The present invention provides a method for analyzing coating elements. Specifically, an image to be analyzed is obtained, and the image to be analyzed is a scanning electron microscope image of a sample to be analyzed. The image to be analyzed is processed to obtain a target image. Based on the target image, the coating elements of the sample to be analyzed are analyzed to obtain an analysis result. In this way, since the scanning speed of the electron microscope is faster than the detection speed of the electron probe microanalyzer for detecting the coating surface, in the embodiments of the present invention, the electron microscope is used to scan the sample to be analyzed to obtain the image to be analyzed, and the image to be analyzed is processed and analyzed, which can, to a certain extent, solve the problem of low detection efficiency caused by detecting the coating surface by the electron probe microanalyzer in the related art.

[0028] In addition, while improving the detection rate, the utilization rate of the electron microscope can also be increased, and the detection cost of the enterprise can be reduced. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for describing the embodiments or the prior art. Obviously, the following drawings are some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0030] Figure 1 It is a flowchart of a method for analyzing coating elements provided by an embodiment of the present invention;

[0031] Figure 2 It is a conceptual diagram in the process of image processing provided by an embodiment of the present invention;

[0032] Figure 3 It is another conceptual diagram in the process of image processing provided by an embodiment of the present invention;

[0033] Figure 4 It is a structural block diagram of an analysis device for coating elements provided by an embodiment of the present invention;

[0034] Figure 5 It is a structural block diagram of an electronic device provided by an embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0035] As described in the background art, in order to improve the corrosion resistance of steel, a coating can be added to the surface of the steel through processes such as electroplating. In order to provide a higher-quality corrosion-resistant strip steel, the coating morphology and the distribution of alloying elements of the strip steel are detected after production to determine the coating quality of the strip steel. In the past, the electron probe microanalyzer (EPMA) was usually used to detect the surface morphology and element distribution of the coating. It took more than two hours to detect a single position to achieve satisfactory results, which affected the detection efficiency.

[0036] The present invention provides a method for analyzing coating elements. Specifically, an image to be analyzed is obtained, and the image to be analyzed is a scanning electron microscope image of a sample to be analyzed; the image to be analyzed is processed to obtain a target image; based on the target image, the coating elements of the sample to be analyzed are analyzed to obtain an analysis result. In this way, since the scanning speed of the electron microscope is faster than the detection speed of the electron probe microanalyzer for the coating surface, the embodiment of the present invention scans the sample to be analyzed through the electron microscope to obtain the image to be analyzed, and processes and analyzes the image to be analyzed, which can, to a certain extent, solve the problem of low detection efficiency caused by detecting the coating surface through the electron probe microanalyzer in the related art.

[0037] In addition, while improving the detection rate, the utilization rate of the electron microscope can also be increased, and the detection cost of the enterprise can be reduced.

[0038] In practical applications, zinc and zinc alloys have excellent corrosion resistance. Combining with the hot-dip galvanizing technology, zinc or zinc alloys are hot-dip coated on the surface of steel to make the steel have excellent corrosion resistance and achieve corrosion resistance throughout the life cycle. In the zinc alloy coating, the zinc-aluminum-magnesium coating greatly reduces the corrosion rate of the coating under the synergistic action of appropriate proportions of zinc, aluminum, and magnesium elements. Its corrosion resistance is usually several times or even more than ten times that of a pure zinc coating product with the same coating weight. This coating has advantages such as excellent corrosion resistance, good formability, and potential for lightweight, making it have a wide application prospect in the automotive field and meeting the requirements of the new generation of green, low-carbon, cost-reducing, and lightweight manufacturing. In order to provide a higher-quality zinc-aluminum-magnesium coated strip steel for the OEM, the coating morphology and the distribution of alloying elements are detected after the strip steel is produced to determine the coating quality of the galvanized strip steel.

[0039] In the embodiment of the present invention, the analysis result may include the distribution of aluminum and / or magnesium elements on the sample to be analyzed. For example, when the sample to be analyzed is the above-mentioned zinc-aluminum-magnesium coating, since aluminum and magnesium in the surface elements of the zinc-aluminum-magnesium coating are relatively active elements, the quality of the galvanized strip steel can be quickly and accurately determined through the embodiment of the present invention.

[0040] Next, specific embodiments will be used to elaborate in detail on the technical solution of the present invention and how the technical solution of the present invention solves the above technical problems. The following several specific embodiments can be combined with each other, and the same or similar concepts or processes may not be repeated in some embodiments. The embodiments of the present invention will be described below in conjunction with the accompanying drawings.

[0041] It should be understood that the analysis method of the plating elements provided in the embodiments of the present invention can be executed by a target device. Among them, the target device can be an electronic device, or multiple electronic devices can cooperate with each other to execute. Among them, the electronic device can be a server, such as an independent physical server, a server cluster composed of multiple servers, and a cloud server capable of performing cloud computing.

[0042] Figure 1 It is a flowchart of an analysis method for plating elements provided in an embodiment of the present invention. As Figure 1 shown, the analysis method for plating elements provided in the embodiments of the present invention includes steps 110 to 130.

[0043] Step 110, obtain a picture to be analyzed, where the picture to be analyzed is an electron microscope scanning picture of a sample to be analyzed.

[0044] In the embodiments of the present invention, no specific restrictions are imposed on the size, shape, material, and thickness of the sample to be analyzed. That is to say, the material of the sample to be analyzed can be the zinc-aluminum-magnesium plating layer described above, or other alloy plating layers.

[0045] In the embodiments of the present invention, the electron microscope can be a scanning electron microscope (Scanning Electron Microscope, abbreviated as SEM). After obtaining the sample to be analyzed, it can be processed such as cutting and cleaning, and then scanned by an electron microscope to obtain a picture to be analyzed. After the electron microscope obtains the picture to be analyzed, the picture to be analyzed can be sent to the target device, and the target device obtains the picture to be analyzed by receiving the transmission of the electron microscope. In addition, after the electron microscope obtains the picture to be analyzed, the picture to be analyzed can also be uploaded to the target device manually so that the target device obtains the picture to be analyzed.

[0046] After the target device obtains the picture to be analyzed, step 120 can be executed to process the picture to be analyzed so that the distribution of the plating elements on the picture to be analyzed can be better displayed.

[0047] Step 120, perform picture processing on the picture to be analyzed to obtain a target picture.

[0048] In an embodiment of the present invention, image processing can be performed on the image to be analyzed, such as enhancing contrast, grayscale processing, etc., and the image after image processing is used as the target image so that the target device can perform plating element analysis on the target image.

[0049] Step 130: Based on the target image, analyze the plating elements of the sample to be analyzed to obtain an analysis result.

[0050] In an embodiment of the present invention, based on the color depth and distribution on the target image, the morphology and / or composition of the plating of the sample to be analyzed can be analyzed. For example, the areas with darker colors on the target image are used as the enrichment sites of a certain plating element.

[0051] The present invention provides a method for analyzing plating elements. Specifically, an image to be analyzed is obtained, and the image to be analyzed is a scanning electron microscope image of a sample to be analyzed; the image to be analyzed is subjected to image processing to obtain a target image; based on the target image, the plating elements of the sample to be analyzed are analyzed to obtain an analysis result. In this way, since the scanning speed of the electron microscope is faster than the detection speed of the electron probe microanalyzer for the plating surface, in the embodiment of the present invention, the sample to be analyzed is scanned by the electron microscope to obtain the image to be analyzed, and the image to be analyzed is processed and analyzed, which can, to a certain extent, solve the problem of low detection efficiency caused by detecting the plating surface by the electron probe microanalyzer in the related art.

[0052] In addition, while improving the detection rate, the utilization rate of the electron microscope can also be increased, and the detection cost of the enterprise can be reduced.

[0053] In an embodiment of the present invention, the sample to be analyzed can be the zinc-aluminum-magnesium alloy plating described above, and the analysis result includes the distribution of aluminum and / or magnesium elements on the sample to be analyzed. Correspondingly, if the sample to be analyzed is a plating of other elements, the analysis result can include the corresponding element distribution. In addition, when performing image processing on the image to be analyzed, different processing methods can also be performed according to element characteristics, such as increasing the color temperature, etc., and the distribution of other elements is determined according to different color differences on the target image. The embodiment of the present invention does not make specific limitations on this.

[0054] In an embodiment of the present invention, step 130 analyzes the coating elements of the sample to be analyzed based on the target picture, and a specific implementation manner for obtaining the analysis result may include the following steps: obtaining the analysis result according to the depth and distribution of the color blocks on the target picture. For example, the places where the color blocks are deep are considered as the places where elements are enriched. When the sample to be analyzed is a zinc-aluminum-magnesium coating, the places where the color blocks are deep on the target picture can be considered as the places where aluminum and / or magnesium elements are enriched. According to the distribution of the color blocks on the target picture, the proportion of the area of the element-enriched region in the sample to be analyzed can be determined, so as to further determine the coating quality of the sample to be analyzed. In addition, it can also be judged whether the coating on the sample to be analyzed is uniform according to whether the distribution of the color blocks on the target picture is uniform. By analyzing through the target picture, the analysis and detection efficiency can be improved while not affecting the accuracy of the analysis result.

[0055] In an embodiment of the present invention, the picture to be analyzed is a picture obtained by the electron microscope detecting the sample to be analyzed in the secondary electron mode. Before the electron microscope performs the detection, the sample can be preprocessed, for example, cut into a sample to be analyzed of a certain size, and the sample to be analyzed can also be cleaned to remove the dust and oil on the surface of the strip steel, so as to obtain a clean sample to be analyzed.

[0056] In an embodiment of the present invention, after obtaining the sample to be analyzed, the field emission scanning electron microscope can be used to detect the sample to be measured, and the detection is performed in the secondary electron mode, so as to obtain the picture to be analyzed for observing the coating morphology and component analysis.

[0057] In an embodiment of the present invention, a specific implementation manner for step 120 to perform picture processing on the picture to be analyzed to obtain the target picture may include the following steps: performing gray-scale processing on the picture to be analyzed to obtain a gray-scale processed picture; obtaining the target picture based on the gray-scale processed picture. After gray-scale processing, the color information on the picture to be analyzed is reduced, which can better reflect the depth and distribution of the color blocks on the picture to be analyzed.

[0058] In order to better analyze the coating elements, in an embodiment of the present invention, binary calculation processing can also be performed on the gray-scale processed picture to obtain the target picture reflecting the coating elements. For example Figure 2 as shown, in Figure 2 , Figure a is the original SEM picture, Figure b is the gray-scale processed picture after gray-scale processing, and Figure c is the target picture after binary calculation processing. By Figure 2By analyzing the target image shown in the Chinese figure, the areas with darker color patches can be considered as the areas where elements are enriched. In addition, in order to more accurately determine the accuracy of the analysis results, an Electron Probe Microanalyser (EPMA for short) can also be used to analyze Figure 2 the corresponding sample to be analyzed to obtain the EPMA analysis results, and compare or combine the EPMA analysis results with the analysis results obtained by the method provided in the embodiments of the present invention to jointly judge the coating element distribution and / or enrichment of the sample to be analyzed.

[0059] To better understand the coating element analysis method provided in the embodiments of the present invention, an example is given below. In actual application, the coating element analysis method provided by the present invention can be implemented through the following steps.

[0060] Step S1: Sample pretreatment. First, cut a sample plate on the galvanizing production line, and use a cutting machine to cut the sample plate into rectangular samples with a size of 100×50 mm. Then, use a wire cutting device to cut the rectangular sample into small samples with a size of 10×10 mm.

[0061] Step S2: Prepare the test sample. Place the 10×10 mm small sample described in Step S1 in an acetone solution, and use an ultrasonic cleaner to ultrasonically clean the sample for 5 - 10 minutes to remove dust and oil on the surface of the strip steel. Finally, clean the surface of the strip steel with alcohol and dry it with a hair dryer to obtain a scanning test sample (i.e., the sample to be analyzed described above).

[0062] Step S3: Detect the sample. Use a field emission scanning electron microscope to detect the sample to be tested (i.e., the sample to be analyzed described above), adopt the secondary electron mode, raise the sample stage to a position where the sample is about 5 - 10 mm away from the probe, and use a voltage of 15 - 20 kV to obtain the sample to be analyzed image described above for observing the morphology and composition analysis of the zinc-aluminum-magnesium coating.

[0063] Step S4: Result analysis. Through gray-scale processing and binary calculation processing of the SEM original image, the target image described above is obtained, realizing a simple, efficient, and accurate method for locating the enrichment of aluminum and magnesium elements in the alloy coating. For example Figure 3 as shown, in Figure 3 Figure a is the SEM original image, Figure b is the gray-scale processed image after gray-scale processing, and Figure c is the target image after binary calculation processing.

[0064] The present invention provides a method for quickly and accurately locating the enrichment of aluminum and magnesium elements in an alloy coating. Based on the traditional EPMA for detecting the coating composition of zinc-aluminum-magnesium strip steel, the detection efficiency and capabilities of SEM are maximally exploited. In combination with MATLAB software, a target image is obtained through grayscale processing and binary calculation of the original SEM image, and the target image is analyzed. This eliminates the drawbacks of long waiting times for EMPA equipment reservation and long detection times, improves the utilization rate of SEM, enables more efficient detection with clearer results, and realizes quick and accurate positioning of the element distribution. For example, when the sample to be analyzed is the coating of zinc-aluminum-magnesium strip steel, the enrichment and distribution of aluminum and / or magnesium elements can be detected.

[0065] Figure 4 This is a structural conceptual diagram of an analysis device for coating elements provided by an embodiment of the present invention. As Figure 4 shown, the analysis device for coating elements provided by an embodiment of the present invention includes an acquisition module 410, a processing module 420, and an analysis module 430.

[0066] The acquisition module 410 is configured to acquire a to-be-analyzed image, where the to-be-analyzed image is a scanning image of an electron microscope of a to-be-analyzed sample;

[0067] The processing module 420 is configured to perform image processing on the to-be-analyzed image to obtain a target image;

[0068] The analysis module 430 is configured to analyze the coating elements of the to-be-analyzed sample based on the target image to obtain an analysis result.

[0069] It should be noted that the embodiments of the analysis device for coating elements in this specification and the embodiments of the analysis method for coating elements in this specification are based on the same inventive concept. Therefore, the specific implementation manners of this embodiment can refer to the corresponding embodiments of the analysis method for coating elements in the foregoing text, and the repeated parts will not be elaborated.

[0070] Figure 5 This is a structural block diagram of an electronic device provided by an embodiment of the present application. As Figure 5 shown, the electronic device provided by an embodiment of the present application includes a processor 510 and a memory 520, where the memory is used to store instructions executable by the processor; wherein, the processor is configured to execute the instructions to implement the method as Figure 1 shown.

[0071] In an exemplary embodiment, the electronic device can be implemented by one or more application-specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field-programmable gate arrays (FPGAs), controllers, microcontrollers, microprocessors, or other electronic components for executing the above method.

[0072] In an exemplary embodiment, a non-transitory computer-readable storage medium including instructions is also provided, such as a memory including instructions, and the above instructions can be executed by a processor of the device to complete the above method. For example, the non-transitory computer-readable storage medium may be a ROM, a random access memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, an optical data storage device, etc. When the instructions in the storage medium are executed by a processor of an electronic device, the electronic device is enabled to execute Figure 1 the method shown

[0073] The present application also provides a computer program product, including a computer program, and when the computer program is executed by a processor, it is as Figure 1 the method shown

[0074] In the above description, no detailed description is made of technical details such as the composition of each layer. However, those skilled in the art should understand that various technical means can be used to form layers, regions, etc. of the required shapes. In addition, in order to form the same structure, those skilled in the art can also design methods that are not exactly the same as the methods described above. In addition, although the above embodiments are described separately, this does not mean that the measures in each embodiment cannot be used in combination advantageously.

[0075] Although the preferred embodiments of the present invention have been described, those skilled in the art can make additional changes and modifications once they know the basic creative concepts. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments and all changes and modifications falling within the scope of the present invention.

[0076] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalent technologies, the present invention is also intended to include these modifications and variations.

Claims

1. A method for analyzing coating elements, characterized in that: The method comprises: Obtaining a picture to be analyzed, wherein the picture to be analyzed is an electron microscope scanning picture of the sample to be analyzed; Performing image processing on the image to be analyzed to obtain a target image; Based on the target image, the coating elements of the sample to be analyzed are analyzed to obtain analysis results.

2. The method according to claim 1, characterized in that The analysis results include the distribution of aluminum and / or magnesium elements on the sample to be analyzed.

3. The method according to claim 1, characterized in that The step of analyzing the coating elements of the sample to be analyzed based on the target image to obtain an analysis result includes: The analysis result is obtained according to the depth and distribution of the color blocks on the target image.

4. The method according to claim 1, characterized in that: The image to be analyzed is an image obtained by detecting the sample to be analyzed using a secondary electron mode by the electron microscope.

5. The method according to claim 1, characterized in that The performing image processing on the image to be analyzed to obtain a target image includes: Performing grayscale processing on the image to be analyzed to obtain a grayscale processed image; Based on the grayscale processed picture, the target picture is obtained.

6. The method according to claim 5, characterized in that The step of obtaining the target image based on the grayscale processed image includes: The grayscale processed image is binarized to obtain the target image.

7. An analysis device for coating elements, characterized in that: The device comprises: An acquisition module is used to acquire a picture to be analyzed, wherein the picture to be analyzed is a scanning picture of an electron microscope of a sample to be analyzed; A processing module, used for processing the image to be analyzed to obtain a target image; The analysis module is used to analyze the coating elements of the sample to be analyzed based on the target image to obtain an analysis result.

8. An electronic device, characterized in that: include: processor; a memory for storing instructions executable by the processor; The processor is configured to execute the instructions to implement the method according to any one of claims 1 to 6. 9 . A storage medium, when instructions in the storage medium are executed by a processor of an electronic device, the electronic device is enabled to execute the method as claimed in any one of claims 1 to 6.

10. A computer program product, comprising a computer program, wherein the computer program is used by a processor to execute the method according to any one of claims 1 to 6.

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