Storage device testing method, electronic device, and testing device

Abstract

The present invention discloses a test method, electronic device and test device for storage devices, the method comprising controlling a test device to sequentially perform multiple stages of testing on the storage device according to a test sequence; obtaining test data; judging whether the storage device has passed the test of the current stage based on the test data; controlling the test device to perform the test of the next stage on the storage device according to the test sequence; generating and displaying statistical charts based on the test data of the test of each stage; obtaining production process information; evaluating the test parameters in the test data of each stage based on the optimal data range corresponding to the test of each stage to obtain an evaluation result; and generating production process optimization suggestions based on the evaluation result, a preset database and production process information. The present application can test all parameters of the storage device at one time and display the test data of all stages at one time for the user to check, with a high degree of automation, saving time and effort, and thus improving test efficiency.

Description

Technical Field

[0001] The present invention relates to the field of chip technology, and in particular to a testing method, electronic equipment and testing device for a storage device. Background Art

[0002] With the rapid development of storage device technology, solid-state drives (SSDs) have become widely used. When an SSD experiences read / write anomalies, storage unit failures, or compatibility issues, it's often necessary to update the SSD's firmware to restore normal operation.

[0003] A BGA (Ball Grid Array) SSD is a solid-state drive that uses ball grid array packaging technology. The flash memory and controller of a BGA SSD are typically packaged together. Currently, traditional BGA SSD testing methods mostly rely on manual single-parameter testing. This involves placing the BGA SSD on one test device to test one parameter. After the test is complete, the tester must place the BGA SSD on another test device to test another parameter, and this continues until all parameters have been tested.

[0004] However, traditional BGA SSD testing methods cannot test all parameters of a BGA SSD at once. The BGA SSD needs to be manually moved multiple times during the test process. This method not only has a low degree of automation and is time-consuming and labor-intensive, but also cannot display test data from all stages at once for user inspection, resulting in low test efficiency. Summary of the Invention

[0005] In response to the shortcomings of the prior art, the present application provides a testing method, electronic device and testing device for storage devices. When it is detected that the storage device is located at the test position corresponding to the testing device and a start-up instruction is received, the testing device is controlled to perform multiple stages of testing on the storage device in sequence according to a preset test sequence, and statistical charts are generated and displayed based on the test data generated by the storage device in the test of each stage. All parameters of the storage device can be tested at one time, and the test data of all stages can be displayed at one time for the user to check. The method has a high degree of automation, saves time and effort, and thus can improve testing efficiency.

[0006] In order to solve the above problems, the present invention provides the following technical solutions:

[0007] In a first aspect, an embodiment of the present application provides a method for testing a storage device, comprising:

[0008] In some embodiments, upon detecting that a storage device is located at a corresponding test position of a test device and receiving a start instruction, the test device is controlled to sequentially perform multiple phases of testing on the storage device according to a preset test sequence, wherein the multiple phases of testing include a power supply test, a read / write performance test, and an operating temperature test;

[0009] Acquiring test data generated by the storage device during a current phase of testing;

[0010] Determining whether the storage device passes the test at the current stage based on the test data;

[0011] When it is determined that the storage device passes the current test, controlling the testing device to perform a next stage test on the storage device according to the test sequence;

[0012] When the storage device passes all phases of testing, generating and displaying a statistical chart based on the test data generated by the storage device in each phase of testing, the statistical chart is used to represent the correlation between the test data of each phase of the storage device and the test data of each phase;

[0013] Obtain production process information;

[0014] Evaluate the test parameters in the test data of each stage based on the optimal data range corresponding to the test of each stage to obtain an evaluation result;

[0015] A production process optimization suggestion is generated based on the evaluation result, a preset database and the production process information, wherein the database includes a correspondence between the test parameters in the test data and the production links in the production process information.

[0016] In some embodiments, upon detecting that the storage device is located at a corresponding test position of the test device and receiving a start instruction, controlling the test device to sequentially perform multiple stages of testing on the storage device according to a preset test sequence includes:

[0017] Upon detecting that the storage device is located at a test position corresponding to the test device, receiving a start instruction, and determining, according to the test sequence, that the test in the current stage is a power supply test, controlling a data operation module of the test device to operate the storage device based on a plurality of preset test conditions, so that the storage device is sequentially placed in a plurality of test conditions, the test conditions including a no-load state, a light-load state, a full-load state, and a peak-load state;

[0018] Controlling the power supply module of the testing device to supply power to the storage device according to a preset power supply parameter corresponding to the current test condition;

[0019] The acquiring of the test data generated by the storage device in the current phase of the test includes:

[0020] The data acquisition module of the test device is controlled to acquire the test data generated by the storage device under each of the test conditions.

[0021] In some implementations, determining whether the storage device passes the test at the current stage based on the test data includes:

[0022] When the test in the current stage is the power supply test, determining the power data of the storage device under each of the test conditions based on the voltage data and current data of the storage device under each of the test conditions in the test data;

[0023] When the numerical ranges and fluctuation amplitudes of the voltage data, the current data, and the power data all meet the judgment conditions of the corresponding test conditions, the storage device is judged to have passed the test of the current stage; otherwise, the storage device is judged to have failed the test of the current stage.

[0024] In some embodiments, upon detecting that the storage device is located at a corresponding test position of the test device and receiving a start instruction, controlling the test device to sequentially perform multiple stages of testing on the storage device according to a preset test sequence includes:

[0025] When it is detected that the storage device is located at the test position corresponding to the test device, a start instruction is received, and it is determined according to the test sequence that the test in the current stage is a read and write performance test, the data operation module of the test device is controlled to simulate the read and write performance test of the storage device in each application scenario based on the read and write operation models of multiple application scenarios, the application scenarios including database scenarios, video surveillance scenarios and high-frequency operation scenarios, and the read and write operation models including the data volume and execution mode of the write operation and the data volume and execution mode of the read operation in the corresponding application scenario;

[0026] The acquiring of the test data generated by the storage device in the current phase of the test includes:

[0027] The data acquisition module of the test device is controlled to acquire test data of the storage device in each application scenario, wherein the test data includes a read speed, a write speed, and a data error rate.

[0028] In some implementations, determining whether the storage device passes the test at the current stage based on the test data includes:

[0029] When the test in the current stage is the read / write performance test, it is determined whether the storage device has passed the test in the current stage based on the read / write performance parameter standard in each application scenario and the corresponding test parameters in the test data.

[0030] In some embodiments, upon detecting that the storage device is located at a corresponding test position of the test device and receiving a start instruction, controlling the test device to sequentially perform multiple stages of testing on the storage device according to a preset test sequence includes:

[0031] Upon detecting that the storage device is located at a test position corresponding to the test device, receiving a start instruction, and determining that the test in the current stage is an operating temperature test according to the test sequence, controlling the temperature adjustment module of the test device to heat, dissipate heat, or stop the storage device according to a preset sequence of multiple temperature test links and a temperature test range of each temperature test link;

[0032] The acquiring of the test data generated by the storage device in the current phase of the test includes:

[0033] When the operating temperature of the storage device is the test temperature in the temperature test link, the data acquisition module of the test device is controlled to acquire test data of the storage device at the current operating temperature, where the test data includes the operating status parameters of the storage device.

[0034] In some implementations, determining whether the storage device passes the test at the current stage based on the test data includes:

[0035] When the test in the current stage is the operating temperature test, whether the storage device passes the test in the current stage is determined based on the qualified numerical range of the test data corresponding to each temperature test link and the test data of the temperature test link.

[0036] In some embodiments, generating a production process optimization suggestion based on the evaluation result, a preset database, and the production process information includes:

[0037] Comprehensively weighting the scores of each test parameter generated in each test stage to obtain a comprehensive score for each test stage;

[0038] Determining whether each of the test parameters is optimizable based on the score of each test parameter and the minimum score threshold, and determining whether each of the test stages is optimizable based on the comprehensive score of each test stage and the minimum comprehensive score threshold;

[0039] Based on the database and the optimizable test parameters or test phases, the optimizable production links are located, and corresponding production process optimization suggestions are generated based on the optimizable production links.

[0040] In a second aspect, an embodiment of the present application provides an electronic device, comprising:

[0041] at least one processor; and,

[0042] a memory communicatively connected to the at least one processor; wherein,

[0043] The memory stores instructions that can be executed by the at least one processor. The instructions are executed by the at least one processor to enable the at least one processor to perform the storage device testing method according to the first aspect.

[0044] In a third aspect, an embodiment of the present application provides a testing device, which includes a driving module, a transmission module, a data operation module, a power supply module, a temperature adjustment module and a data acquisition module. The driving module is used to drive the transmission module to transfer the storage device to the corresponding test position, so that the electronic device as described in the second aspect executes the testing method of the storage device as described in the first aspect by controlling the testing device. The data operation module is used to perform data reading operations and data writing operations on the storage device. The power supply module is used to supply power to the storage device. The temperature adjustment module is used to heat or dissipate heat to the storage device. The data acquisition module is used to obtain test data generated by the storage device during the test.

[0045] The present application provides a testing method, electronic device and testing device for a storage device. The present application controls the testing device to perform multiple stages of testing on the storage device in sequence according to a preset test sequence when detecting that the storage device is located at a test position corresponding to the testing device and receiving a start-up instruction, and generates and displays statistical charts based on the test data generated by the storage device in the test of each stage. The present application can test all parameters of the storage device at one time and display the test data of all stages at one time for the user to check. The present application has a high degree of automation, saves time and effort, and thus can improve testing efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] Figure 1 It is a flowchart of the storage device testing method provided in an embodiment of the present application.

[0047] Figure 2 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application.

[0048] Figure 3This is a structural block diagram of a computer-readable storage medium provided in an embodiment of the present application.

[0049] Figure 4 Schematic diagram of the structure of the test device provided in the embodiment of the present application. DETAILED DESCRIPTION

[0050] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0051] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features being referred to. Thus, a feature specified as "first" or "second" may explicitly or implicitly include one or more of such features. In the description of the present invention, "plurality" means two or more, unless otherwise specifically defined.

[0052] The present application provides a storage device testing method, electronic device, and testing device. When detecting that the storage device is located at a test position corresponding to the testing device and receiving a start instruction, the testing device is controlled to perform multiple stages of testing on the storage device in sequence according to a preset test sequence, and statistical charts are generated and displayed based on the test data generated by the storage device in the test of each stage. All parameters of the storage device can be tested at one time, and the test data of all stages can be displayed at one time for the user to check. The method has a high degree of automation, saves time and effort, and thus can improve testing efficiency.

[0053] The storage device referred to in this application may be a mechanical hard disk, an SSD, an optical storage device, or a memory card. The SSD may be a BGA SSD. A BGA SSD may include a Flash memory chip, which may include NOR Flash and NAND Flash. The following example uses a BGA SSD as an example, but this should not be considered a limitation of this application.

[0054] The following will describe in detail the storage device testing method provided by this application with reference to the accompanying drawings.

[0055] See also Figure 1 , Figure 1 FIG. 1 is a flow chart of a method for testing a storage device according to an embodiment of the present application. Figure 1 As shown, the storage device testing method includes: steps S100 to S800.

[0056] Step S100: When it is detected that the storage device is located at the corresponding test position of the test device and a start instruction is received, the test device is controlled to sequentially perform multiple stages of testing on the storage device according to a preset test sequence.

[0057] Among them, the multiple stages of testing include power supply testing, read and write performance testing, and operating temperature testing.

[0058] Optionally, the multiple phases of testing also include other tests.

[0059] In some implementations, a driving module controls the test device to drive a transfer module to transfer the storage device to a corresponding test location.

[0060] In some embodiments, a driver module controls a test device to drive a transport module to sequentially transport the storage device to multiple test sections. Each test section includes at least one test bit. The test device controls the test device to perform a phase of testing on the storage device in each test section. Once the storage device has passed all test sections, all parameters of the storage device are tested at once, eliminating the need for manual operation of the storage device during the testing process.

[0061] Optionally, there are multiple storage devices. When the test device is operating, the storage devices therein can be tested simultaneously in multiple test sections to perform batch testing on the storage devices. In this case, each storage device will pass through all test sections and complete the full multi-stage test.

[0062] Optionally, the transport module is a conveyor belt. The test position is a position where the storage device can be tested.

[0063] Optionally, the test position includes a card slot for inserting a storage device, and is connected to a power supply module, a data operation module, and a data acquisition module to test the storage device.

[0064] Optionally, the testing device further includes a temperature regulating module, which is used to heat or dissipate heat from the storage device located at the testing position to change the operating temperature of the storage device.

[0065] In some embodiments, because testing storage devices may cause loss of storage devices, random inspections may be performed on storage devices in the same batch. When the qualified rate of storage devices in a batch is higher than a preset qualified rate, the storage devices in the batch are determined to be qualified products, otherwise they are unqualified products.

[0066] In some implementations, multiple electronic devices are used to control multiple testing devices to simultaneously test a large number of storage devices. One electronic device acts as a master device, controlling the other electronic devices, which act as slaves. The master device is used to obtain the load status of the slave devices and assign tasks to the slave devices based on their load status. Load status includes CPU usage, memory usage, and disk busyness.

[0067] Optionally, the master device uses an artificial intelligence model to assign tasks to the slave devices based on the load conditions of the multiple slave devices.

[0068] Optionally, the artificial intelligence model includes a neural network model and a reinforcement learning model, etc.

[0069] Exemplarily, more test tasks are allocated to slave devices with less load to achieve balanced utilization of resources.

[0070] In some implementations, the master device distributes the divided test tasks to the slave devices via the network, and simultaneously sends test control parameters related to the storage device, so that the slave devices can accurately execute the test tasks.

[0071] In some implementations, the master device receives test data sent by all slave devices.

[0072] In some embodiments, step S100 includes steps S110 to S120.

[0073] Step S110: When it is detected that the storage device is located at the test position corresponding to the test device, a start instruction is received, and it is determined that the test in the current stage is a power supply test according to the test sequence, the data operation module of the test device is controlled to operate the storage device based on the preset multiple test conditions, so that the storage device is in multiple test conditions in sequence.

[0074] The test conditions include no-load state, light-load state, full-load state and peak-load state.

[0075] Through the above method, the storage device can be tested under different test conditions, thereby improving the comprehensiveness of the test.

[0076] In some implementations, the storage device is operated according to a preset test condition switching sequence, so that the storage device is placed in multiple test conditions in sequence.

[0077] Optionally, the preset test condition switching sequence is the sequence of no-load state, light-load state, full-load state to peak load state.

[0078] In some embodiments, the idle state is a standby state in which the storage device does not perform any data read or write operations after being powered on. The data operation module of the test device can be controlled to keep the storage device from performing any operations, so that the storage device is in the idle state.

[0079] Optionally, the data operation module may be controlled to send a stop instruction to the storage device, and then no operation is performed on the storage device, so that the storage device is completely out of operation.

[0080] In some embodiments, the light load state is a state in which the storage device operates under low-intensity data operations. Optionally, the low-intensity data operations include periodic firmware self-tests and cache data refreshes.

[0081] Optionally, the data operation module may be controlled to perform data read and write operations on the storage device at a first preset frequency and a first data volume, so that the storage device is in a lightly loaded state. For example, the first preset frequency may be 1 time per second, and the data operation module may be controlled to write data of the first preset data volume to the storage device at a frequency of 1 time per second and read the written data at a frequency of 1 time per second.

[0082] Optionally, the first preset data size may be 4 kilobytes (KB), 10 KB, or 100 KB.

[0083] In some implementations, a fully loaded state refers to a storage device operating continuously under normal workloads. In this state, the storage device performs operations such as continuous sequential read and write of large data blocks and parallel processing of multiple tasks. This fully loaded state is a key test condition for evaluating the long-term stability of a storage device.

[0084] In some embodiments, the data operation module can be controlled to perform data read and write operations on the storage device at a second preset frequency and a second data volume, so that the storage device is in a fully loaded state. The second preset frequency is higher than the first preset frequency. For example, the second preset frequency can be 50 times / second, and the data operation module can be controlled to write data of the second preset data volume to the storage device at a frequency of 50 times / second, and read the written data at a frequency of 50 times / second. In this way, data read and write operations in a fully loaded state in actual application scenarios can be simulated, thereby making the test environment in the fully loaded state closer to the actual usage environment.

[0085] Optionally, the second preset data volume may be 1 megabyte (MB), 2 MB, or 10 MB.

[0086] In some implementations, the data operation module can be controlled to write data to the storage device at a second preset frequency and a second data volume, and to read data from the storage device at a third preset frequency and a third data volume, so that the storage device is fully loaded. In this way, the fully loaded test environment can be made closer to the actual usage environment.

[0087] Optionally, the third preset frequency may be the same as or different from the second preset frequency. For example, the third preset frequency may be 30 times / second, 45 times / second, 50 times / second, or 100 times / second.

[0088] Optionally, the third data amount may be the same as or different from the second data amount. For example, the third data amount may be 0.5 MB, 1 MB, or 10 MB.

[0089] In some embodiments, a peak load state is a momentary high load state of a storage device in an extreme business scenario. During a peak load state, the storage device undergoes high-load operations such as bursty data requests and peak multi-thread concurrency. The peak load state is used to verify the reliability of the storage device in extreme business scenarios.

[0090] In some embodiments, the data operation module may be controlled to perform high-frequency read and write operations on the storage device to place the storage device in a peak load state. For example, the data operation module may be controlled to perform data write operations on the storage device at a fourth preset frequency and a fourth data volume, and to perform data read operations on the storage device at a fifth preset frequency and a fifth data volume, to place the storage device in a peak load state.

[0091] Optionally, the fourth preset frequency is the same as or different from the fifth preset frequency.

[0092] Optionally, the fourth preset frequency is 300 times / second, 500 times / second or 1000 times / second, etc., and the fifth preset frequency is 200 times / second, 300 times / second, 500 times / second or 1000 times / second, etc.

[0093] In some embodiments, the data operation module is controlled to perform a data write operation on the storage device so that the remaining storage capacity percentage of the storage device in an unloaded state is 100%, the remaining storage capacity percentage in a lightly loaded state is a third preset percentage, the remaining storage capacity percentage in a fully loaded state is a fourth preset percentage, and the remaining storage capacity percentage in a peak load state is a fifth preset percentage. The third preset percentage is less than 100%, the fourth preset percentage is less than the third preset percentage, and the fifth preset percentage is less than the fourth preset percentage.

[0094] Exemplarily, the third preset percentage is 70%, the fourth preset percentage is 50%, and the fifth preset percentage is 0%.

[0095] Step S120: controlling the power supply module of the test device to supply power to the storage device according to the preset power supply parameters corresponding to the current test condition.

[0096] In some embodiments, the power supply module of the testing device is controlled to output a rated voltage to the storage device based on power supply parameters corresponding to the no-load state, while maintaining the current at a minimum value for a period greater than a first predetermined time to eliminate the impact of transient current fluctuations. In this state, only the storage device's main control chip, cache, and other basic circuits are powered, and the storage device's power consumption is the basic static power consumption.

[0097] In some embodiments, a power supply module of the testing apparatus is controlled to output a voltage fluctuating within a first preset voltage range to the storage device according to power supply parameters corresponding to the light load state.

[0098] Optionally, the lower limit of the first preset voltage range may be the rated voltage × (1 - the first preset percentage), and the upper limit may be the rated voltage × (1 + the first preset percentage). In this way, slight voltage fluctuations under light load conditions in actual application scenarios can be simulated, making the test environment under light load conditions closer to actual use environments.

[0099] Optionally, the first preset percentage may be 1%, 2%, 5%, etc.

[0100] In some embodiments, the power supply module is controlled to output a voltage fluctuating within a second preset voltage range to the storage device according to power supply parameters corresponding to the full load state.

[0101] Optionally, the lower limit of the second preset voltage range may be the rated voltage × (1 - the second preset percentage), and the upper limit may be the rated voltage × (1 + the second preset percentage). In this way, normal voltage fluctuations under full load in actual application scenarios can be simulated, making the test environment under full load closer to the actual use environment.

[0102] In some embodiments, the power supply module is controlled to output a peak voltage to the storage device for a second preset time according to a power supply parameter corresponding to the peak load state.

[0103] Optionally, the second preset time is 5 seconds (s) or 10 seconds, etc.

[0104] Optionally, the peak voltage is greater than an upper limit of the second preset voltage range and less than a maximum voltage that the storage device can withstand.

[0105] In some embodiments, the testing apparatus is further controlled so that the storage device is in each test condition for a corresponding preset duration. For example, the testing apparatus is controlled so that the storage device is in an unloaded state for 5 minutes, a lightly loaded state for 5 minutes, a fully loaded state for 10 minutes, and a peak load state for 30 seconds.

[0106] In some embodiments, step S100 includes step S130.

[0107] Step S130: When it is detected that the storage device is located at the test position corresponding to the test device, a start instruction is received, and the test in the current stage is determined to be a read and write performance test according to the test sequence, the data operation module of the test device is controlled based on the read and write operation models of multiple application scenarios to simulate the read and write performance test of the storage device in each application scenario.

[0108] Application scenarios include database scenarios, video surveillance scenarios, and high-frequency operation scenarios. The read and write operation model includes the data volume and execution mode of write operations and the data volume and execution mode of read operations in the corresponding application scenarios.

[0109] By controlling the data operation module of the test device based on the read and write operation models of multiple application scenarios to simulate the read and write performance test of the storage device in each application scenario, the actual application scenario can be simulated to test the storage device, thereby obtaining test data close to the actual application scenario.

[0110] Optionally, the execution mode includes calculating the time point for executing the operation according to a preset algorithm and executing the operation, executing the operation in a preset order, and randomly executing the operation.

[0111] In some embodiments, during the read / write performance test, multiple read / write operation models are sequentially used to control the data operation module of the test device according to a preset model switching sequence to simulate the read / write performance test of the storage device in each application scenario.

[0112] Exemplarily, when the read / write operation model is a database scenario, write operations for a sixth amount of data are randomly executed, and read operations for a seventh amount of data are executed in the write order. Furthermore, the number of write operations executed accounts for a sixth preset percentage of the total number of operations, and the number of read operations executed accounts for a seventh preset percentage of the total number of operations. The random execution of write operations for the sixth amount of data simulates frequent random write operations in a database scenario, and the execution of read operations for the seventh amount of data in the write order simulates data query operations in a database scenario.

[0113] Exemplarily, the sixth data amount is 4 KB, the seventh data amount is 1 MB, the sixth preset percentage is 70%, and the seventh preset percentage is 30%.

[0114] Exemplarily, when the read / write operation model is a read / write operation model for a video surveillance scenario, write operations of an eighth amount of data are performed multiple times continuously and read operations of a ninth amount of data are randomly performed, and the number of write operations performed accounts for an eighth preset percentage of the total number of operations, and the number of read operations performed accounts for a ninth preset percentage of the total number of operations. The multiple consecutive write operations of the eighth amount of data simulate continuous write operations in a video surveillance scenario, and the random read operations of the ninth amount of data simulate video review operations in a video surveillance scenario.

[0115] For example, the eighth data size is 128 KB, the ninth data size is 512 KB, the eighth preset percentage is 80%, and the ninth preset percentage is 20%. The write operation of the eighth data size is executed multiple times in succession for a preset number of executions, which can be 10, 20, or 100 times.

[0116] Optionally, the number of times the write operation of the eighth data volume is executed multiple times in a row is a number of times that changes dynamically within a preset number range, and the preset number range may be 10 to 200 times.

[0117] Exemplarily, when the read-write operation model is a read-write operation model of a high-frequency operation scenario, write operations of the tenth amount of data and read operations of the eleventh amount of data are randomly executed, and the number of executions of the write operation accounts for the tenth preset percentage of the total number of operations, the number of executions of the read operation accounts for the eleventh preset percentage of the total number of operations, the frequency of the write operation is the first preset frequency, and the frequency of the read operation is the second preset frequency.

[0118] Optionally, corresponding parameters in the read and write operation model are set according to high-frequency operation scenarios, namely, high-frequency large file operation scenarios and high-frequency small file operation scenarios.

[0119] Exemplarily, when the high-frequency operation scenario is a high-frequency large file operation scenario, the tenth data volume is 10MB, the eleventh data volume is 10MB, the tenth preset percentage and the eleventh preset percentage are both 50%, the first preset frequency is 500 times / second, and the second preset frequency is 500 times / second.

[0120] Exemplarily, when the high-frequency operation scenario is a high-frequency small file operation scenario, the tenth data volume is 10 KB, the eleventh data volume is 10 KB, 20 KB, or 30 KB, and so on.

[0121] In some implementations, the maximum values ​​of the read speed, write speed, and data error rate in the test data are recorded.

[0122] In some implementations, a big data analysis algorithm analyzes user operations in various application scenarios to establish a read / write operation model. In this read / write operation model, the specific processes of write and read operations can be determined based on user behavioral characteristics, rather than necessarily being performed randomly or sequentially. The amount of data used in each operation can also vary. This approach allows for better simulation of actual application scenarios to test storage devices, resulting in test data that is more closely aligned with actual application scenarios.

[0123] In some embodiments, a read-write operation model is used to gradually increase the number of operations, operation frequency and / or amount of data operated to corresponding preset values ​​during the test process. When the read speed, write speed and / or data error rate in the acquired test data are not detected to decrease after reaching the maximum value, the number of operations, operation frequency or the percentage of random operations executed in the total number of operations is further increased to increase the load intensity.

[0124] In some implementations, a storage device can be tested simultaneously in multiple phases under a single application scenario based on a read / write operation model. The multiple phases of testing include power supply testing, read / write performance testing, and operating temperature testing. This reduces testing time.

[0125] In some embodiments, step S100 includes step S140.

[0126] Step S140: When it is detected that the storage device is located at the test position corresponding to the test device, a start instruction is received, and the current stage of the test is determined to be an operating temperature test according to the test sequence, the temperature adjustment module of the test device is controlled according to the preset sequence of multiple temperature test links and the temperature test range of each temperature test link to heat, dissipate heat or stop working the storage device.

[0127] In some embodiments, the temperature testing section includes a low temperature testing section, a normal temperature testing section, a high temperature testing section, and an extreme high temperature testing section.

[0128] Each temperature test stage is used to simulate a different working environment. For example, the low-temperature test stage simulates a cold outdoor environment, the normal-temperature test stage simulates an indoor working environment, the high-temperature test stage simulates a high-load data center working environment, and the extreme high-temperature test stage simulates an extreme environment.

[0129] Optionally, the temperature test range of the low temperature test link is -20 degrees to 0 degrees, the temperature test range of the normal temperature test link is 20 degrees to 35 degrees, the temperature test range of the high temperature test link is 50 degrees to 70 degrees, and the temperature test range of the extreme high temperature test link is 80 degrees to 90 degrees.

[0130] In some embodiments, the temperature adjustment module of the test device is first controlled to gradually heat the storage device to increase the operating temperature of the storage device, and then the temperature adjustment module is controlled to stop working or dissipate heat from the storage device to reduce the operating temperature of the storage device.

[0131] In some implementations, multiple test temperatures are set within a temperature test range in each temperature test session, and test data is acquired when the storage device reaches the test temperature during a heating process or a cooling process.

[0132] In some embodiments, the order of the preset multiple temperature test links is determined according to the order of gradually increasing temperature test ranges, namely, low temperature test link, normal temperature test link, high temperature test link, and extreme high temperature test link.

[0133] Optionally, the preset order of the multiple temperature test links may not include all of the above temperature test links. For example, the preset order of the multiple temperature test links may be a low temperature test link, a normal temperature test link, and a high temperature test link.

[0134] Optionally, the order of the preset multiple temperature test segments may not be determined according to the order in which the temperature test ranges gradually increase. For example, the order of the preset multiple temperature test segments may be a normal temperature test segment, a low temperature test segment, and a high temperature test segment.

[0135] In some embodiments, the temperature control module of the testing device controls the operation of the storage device based on preset transition conditions. For example, the transition conditions include ensuring that the temperature change rate does not exceed a preset temperature change rate and / or that the duration of each temperature test phase is greater than a fifth preset time. In this way, the operating temperature of the storage device can be kept from changing too rapidly and the internal temperature of the storage device can be kept uniform and stable, thereby improving the accuracy of the test data.

[0136] For example, the preset temperature change rate is 2 degrees per minute. The fifth preset time is 30 minutes.

[0137] Step S200: Acquire test data generated by the storage device during the current phase of testing.

[0138] In some implementations, the data acquisition module of the control test apparatus acquires the test data generated by the storage device during the current phase of the test.

[0139] Optionally, the test data includes the test start time, test end time and corresponding test parameters of the current stage.

[0140] In some embodiments, when step S100 includes steps S110 to S120, step S200 includes step S210.

[0141] Step S210: controlling the data acquisition module of the test device to acquire the test data generated by the storage device under each test condition.

[0142] The test data includes voltage data and current data of the storage device under each test condition.

[0143] In some embodiments, when the duration of the storage device being in the current test condition reaches a second preset time, the data acquisition module of the control test apparatus acquires the test data generated by the storage device in the current test condition.

[0144] Optionally, the second preset time is longer than 5 seconds (s), for example, the first preset time is 5s, 10s, 30s or 70s.

[0145] In some implementations, when step S100 includes step S130 , step S200 includes step S220 .

[0146] Step S220: controlling the data acquisition module of the test device to store the test data of the device in each application scenario.

[0147] The test data includes read speed, write speed and data error rate.

[0148] In some implementations, when step S100 includes step S140, step S200 includes step S230.

[0149] Step S230: When the operating temperature of the storage device is the test temperature in the temperature test link, the data acquisition module of the test apparatus is controlled to acquire test data of the storage device at the current operating temperature.

[0150] The test data includes working status parameters of the storage device.

[0151] In some embodiments, the operating status parameters of the storage device include whether it operates normally at a test temperature, read speed, write speed, and data error rate.

[0152] In some embodiments, when performing an operating temperature test, the data operation module is controlled to perform write operations and read operations on the storage device, so that the acquisition module can acquire test data of the storage device at the current operating temperature.

[0153] Optionally, when performing an operating temperature test, in each temperature test link, the data operation module of the test device can be controlled to perform write operations and read operations on the storage device based on the read and write operation models of various application scenarios. The specific method is as described above.

[0154] Optionally, when performing the operating temperature test, the data operation module may be controlled to perform preset basic write operations and read operations on the storage device, and the operations in each temperature test link are the same.

[0155] Step S300: determining whether the storage device has passed the test of the current stage based on the test data.

[0156] In some embodiments, when step S100 includes steps S110 to S120, step S300 includes steps S310 to S320.

[0157] Step S310: When the test in the current stage is a power supply test, power data of the storage device under each test condition is determined based on voltage data and current data of the storage device under each test condition in the test data.

[0158] Optionally, the power of the storage device is calculated based on the voltage and current of the storage device.

[0159] Step S320: When the numerical range and fluctuation amplitude of the voltage data, current data and power data all meet the judgment conditions of the corresponding test conditions, the storage device is judged to have passed the test of the current stage; otherwise, the storage device is judged to have failed the test of the current stage.

[0160] In some embodiments, the judgment condition for each test condition includes that the numerical range and fluctuation amplitude of the voltage data, current data, and power data are all within the corresponding judgment condition numerical range.

[0161] Illustratively, in the no-load state, the judgment condition also includes that the numerical ranges and fluctuation amplitudes of the voltage data, current data, and power data are all within the corresponding judgment condition numerical ranges for a third preset time.

[0162] Optionally, the third preset time is 2 minutes, 3 minutes or 5 minutes.

[0163] Illustratively, in the light load state, the test data further includes an operation log of the storage device, and the judgment condition further includes determining, based on the operation log of the storage device, that no hardware error exists in the storage device in the light load state.

[0164] Exemplarily, under full load, the test data also includes the operation log and operating temperature of the storage device, and the judgment condition also includes determining based on the operation log of the storage device that there is no hardware error in the storage device under light load and the operating temperature is lower than the preset warning temperature.

[0165] Illustratively, during a peak load state, the judgment condition further includes that, after the peak load state ends and a fourth preset time has passed, the numerical ranges and fluctuation amplitudes of the voltage data, current data, and power data are all within the corresponding numerical ranges of the judgment conditions during a full load state. The judgment condition may further include determining, based on the storage device's operation log, that the storage device has no hardware errors during the peak load state and that the operating temperature is below a preset warning temperature.

[0166] In some implementations, when step S100 includes step S130, step S300 includes step S330.

[0167] Step S330: When the test in the current stage is a read / write performance test, it is determined whether the storage device passes the test in the current stage based on the read / write performance parameter standards in each application scenario and the corresponding test parameters in the test data.

[0168] In some embodiments, each application scenario corresponds to a read / write performance parameter standard, which specifies an acceptable range of values ​​for each test parameter in each application scenario. If the corresponding test parameters in the test data for each application scenario are all within the corresponding acceptable range, the storage device is determined to have passed the current phase of testing; otherwise, the storage device is determined to have failed the current phase of testing.

[0169] In some implementations, when step S100 includes step S130 , step S300 includes step S340 .

[0170] Step S340: When the test in the current stage is the operating temperature test, determine whether the storage device passes the test in the current stage based on the qualified value range of the test data corresponding to each temperature test link and the test data of the temperature test link.

[0171] In some embodiments, when each test parameter in the test data of each temperature test link is within the corresponding qualified value range, the storage device is determined to have passed the test of the current stage; otherwise, the storage device is determined to have failed the test of the current stage.

[0172] Step S400: When it is determined that the storage device passes the current test, the test apparatus is controlled to perform the next stage of testing on the storage device according to the test sequence.

[0173] Step S500: When the storage device passes all phases of testing, a statistical chart is generated based on the test data generated by the storage device in each phase of testing and displayed.

[0174] The statistical chart is used to represent the correlation of test data at various stages of the storage device and the test data at each stage.

[0175] Optionally, the statistical chart is a static statistical chart or a dynamic statistical chart.

[0176] Optionally, the statistical chart is a histogram, a line chart, a pie chart, or the like.

[0177] In some embodiments, data points under different test conditions or application scenarios are distinguished in statistical charts by different colors and marker images.

[0178] In some implementations, a statistical chart is generated for the test data of each stage, resulting in multiple statistical charts.

[0179] In some implementations, the statistical chart includes a parallel coordinates chart, which is used to simultaneously display test data of multiple stages.

[0180] For example, in a parallel coordinate diagram, the first coordinate axis may be used to represent various test parameters, the second coordinate axis may be used to represent the test phase, and the color of the coordinate axis segment corresponding to each test phase may be different.

[0181] In some implementations, statistical charts are used to represent the correlation of test data at various stages.

[0182] Exemplarily, the statistical chart includes a phase dependency network diagram, which can be generated based on the relevant test parameter combinations of each preset test phase. A relevant test parameter combination refers to a combination of a test parameter in one test phase and a related test parameter in another test phase. There can be multiple relevant test parameter combinations for two test phases. For example, one relevant test parameter combination can include power data in a power supply test and a read speed in a read-write performance test, and another relevant test parameter combination can include power data and write speed. Because the power of a storage device is related to the read speed and write speed, the greater the maximum power of the storage device, the higher the maximum read speed and maximum write speed that can be achieved.

[0183] For example, in a phase dependency network diagram, a node represents a test phase, and a child node in each node represents a test parameter of the test phase corresponding to the node. The node edge weight between two adjacent nodes is the comprehensive correlation between the two adjacent nodes. Among two adjacent nodes, the child node edge weight between a child node in one node and a child node in the other node is the correlation between the relevant test parameter combinations represented by the two child nodes.

[0184] In some implementations, the degree of association between the related test parameters represented by two sub-nodes is preset.

[0185] In some implementations, the comprehensive correlation between two adjacent nodes may be calculated based on all combinations of relevant test parameters in the two adjacent nodes. For example, the comprehensive correlation between the two adjacent nodes may be calculated by summing the correlations of each combination of relevant test parameters in the test phases represented by the two adjacent nodes.

[0186] Optionally, the node may be circular, rectangular, fan-shaped, or any other arbitrary shape.

[0187] In some embodiments, when it is determined that the storage device fails the test at the current stage, the testing apparatus is controlled to store the storage device in a waiting area for subsequent processing.

[0188] In some embodiments, when a storage device passes all stages of testing, the control test apparatus stores the storage device in a qualified product area.

[0189] Optionally, the testing device further includes a mechanical pick-and-place module that can be controlled to grab or absorb the storage device and place the storage device in an area to be processed or an area of ​​qualified products.

[0190] Optionally, the mechanical pick-and-place module includes a vacuum adsorption structure, a magnetic attraction structure, or a robotic arm structure.

[0191] Step S600: Acquire production process information.

[0192] In some embodiments, the production process information includes production steps, which may include raw material acquisition, wafer processing, and assembly.

[0193] Optionally, the production process information also includes raw material information, production process parameters and testing device operation information corresponding to each production link.

[0194] Optionally, the raw material information includes parameters of key raw materials required for storage device production, such as flash memory chip model, main control chip batch, cache chip specifications, and storage unit type.

[0195] Optionally, the raw material information can be automatically obtained by scanning the QR code on the raw material label or reading the electronic label of the raw material, and associated with the corresponding production batch.

[0196] Optionally, the production process parameters include a patch temperature curve, reflow soldering time and temperature, a firmware version identifier, and an assembly pressure value.

[0197] Optionally, the test device operation information includes the test device operation time, failure rate, maintenance record and real-time production capacity, etc.

[0198] Step S700: Evaluate the test parameters in the test data of each stage based on the optimal data range corresponding to the test of each stage to obtain an evaluation result.

[0199] In some embodiments, a corresponding score is calculated based on each test parameter and the corresponding optimal data range.

[0200] Optionally, multiple optimal data ranges are used to calculate the score corresponding to each test parameter.

[0201] For example, when the test parameter is within the corresponding first optimal data range, the score is 100 points. When the test parameter is not within the corresponding first optimal data range but within the corresponding second optimal data range, the score is 80 points. When the test parameter is not within the corresponding first optimal data range but within the corresponding second optimal data range, the score is 80 points. When the test parameter is not within the corresponding second optimal data range but within the corresponding third optimal data range, the score is 60 points. When the test parameter is not within the corresponding third optimal data range, the score is the lowest score.

[0202] Illustratively, the minimum score is 30, 40 or 50 points.

[0203] Optionally, the upper limit of the second optimal data range is the upper limit of the first optimal data range × (1 + a twelfth preset percentage), and the lower limit is the lower limit of the first optimal data range × (1 - the twelfth preset percentage). The upper limit of the third optimal data range is the upper limit of the first optimal data range × (1 + a thirteenth preset percentage), and the lower limit is the lower limit of the first optimal data range × (1 - the thirteenth preset percentage). The twelfth preset percentage is less than the thirteenth preset percentage. For example, the twelfth preset percentage is 5%, and the thirteenth preset percentage is 10%.

[0204] Step S800: Generate production process optimization suggestions based on the evaluation results, the preset database and production process information.

[0205] The database includes the corresponding relationship between the test parameters in the test data and the production links in the production process information.

[0206] In some implementations, step S800 includes steps S801 to S803.

[0207] Step S801: Comprehensively weight the scores of each test parameter generated in each test phase to obtain a comprehensive score for each test phase.

[0208] Exemplarily, corresponding weights are set for different test parameters, and a weighted calculation is performed based on the score of each test parameter and the corresponding weight to obtain a comprehensive score for each test stage.

[0209] Step S802: Determine whether each test parameter is optimizable based on the score of each test parameter and the minimum score threshold, and determine whether each test stage is optimizable based on the comprehensive score of each test stage and the minimum comprehensive score threshold.

[0210] In some embodiments, when the score of a test parameter is below a corresponding minimum score threshold, the test parameter is determined to be optimizable. When the comprehensive score of a test phase is below a corresponding minimum comprehensive score threshold, the test phase is determined to be optimizable.

[0211] Optionally, the minimum score threshold of the test parameter is the minimum score as described above, or other scores.

[0212] Step S803: Locate the optimizable production links based on the database and the optimizable test parameters or test phases, and generate corresponding production process optimization suggestions based on the optimizable production links.

[0213] For example, when the reading speed of a batch of storage devices is low in the read and write performance test, the production links that can be optimized are located as the raw material acquisition link and the assembly link based on the database, and the information corresponding to the raw material acquisition link and the assembly link in the production process information is analyzed, and then corresponding production process optimization suggestions are generated based on the analysis results. For example, when the analysis of the information of the raw material acquisition link in the production process information shows that the supplier of flash memory chips used by the storage devices of this batch has changed, the production process optimization suggestions include changing back to the original flash memory chip supplier. When the analysis of the information of the assembly link in the production process information shows that the firmware version of the storage devices of this batch is not compatible with the new flash memory chip, the production process optimization suggestions include burning the latest compatible version of the firmware.

[0214] In some implementations, production process optimization suggestions are displayed as flowcharts and text descriptions, along with their urgency (high, medium, or low) and expected impact. For example, a problem that severely impacts product performance is labeled "high urgency," with an expected impact of a 10% increase in product qualification rate.

[0215] The above-mentioned method of automatically generating production process optimization suggestions can facilitate users to optimize the production process.

[0216] In summary, the storage device testing method provided in the embodiments of the present application has the following advantages:

[0217] 1. When it is detected that the storage device is located at the test position corresponding to the test device and a start instruction is received, the test device is controlled to perform multiple stages of testing on the storage device in sequence according to a preset test sequence, and statistical charts are generated and displayed based on the test data generated by the storage device in each stage of testing. All parameters of the storage device can be tested at one time, and the test data of all stages can be displayed at one time for the user to check. The system has a high degree of automation, saves time and effort, and thus can improve test efficiency.

[0218] 2. By controlling the data operation module of the test device based on a plurality of preset test conditions to operate the storage device, the storage device is placed in a plurality of test conditions in turn. This enables the storage device to be tested under different test conditions, thereby improving the comprehensiveness of the test.

[0219] 3. By controlling the data operation module of the test device based on the read and write operation models of multiple application scenarios to simulate the read and write performance test of the storage device in each application scenario, the actual application scenario can be simulated to test the storage device, thereby obtaining test data close to the actual application scenario.

[0220] See also Figure 2 , Figure 2 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application. Figure 2 As shown, the electronic device 400 includes: one or more processors 410 and a memory 420, Figure 2 A processor 410 is taken as an example.

[0221] In some embodiments, the processor 410 and the memory 420 may be connected via a bus or other means. Figure 2 The bus connection is taken as an example.

[0222] In some embodiments, the processor 410 is used to control the test device to perform multiple stages of testing on the storage device in sequence according to a preset test sequence when it detects that the storage device is located at the test position corresponding to the test device and receives a start instruction. The multiple stages of testing include power supply testing, read and write performance testing, and operating temperature testing; obtain test data generated by the storage device in the test of the current stage; determine whether the storage device has passed the test of the current stage based on the test data; when it is determined that the storage device has passed the current test, control the test device to perform the next stage of testing on the storage device according to the test sequence; when the storage device passes all stages of testing, generate and display a statistical chart based on the test data generated by the storage device in the test of each stage, the statistical chart is used to represent the association between the test data of each stage of the storage device and the test data of each stage; obtain production process information; evaluate the test parameters in the test data of each stage based on the optimal data range corresponding to the test of each stage to obtain an evaluation result; generate production process optimization suggestions based on the evaluation result, a preset database, and production process information, the database including the correspondence between the test parameters in the test data and the production links in the production process information.

[0223] In some embodiments, memory 420, as a non-volatile computer-readable storage medium, can be used to store non-volatile software programs, non-volatile computer executable programs, and modules, such as the program instructions / modules of the storage device testing method in the embodiments of the present application. Processor 410 executes the non-volatile software programs, instructions, and modules stored in memory 420 to execute various functional applications and data processing of electronic device 400, thereby implementing the storage device testing method of the above-mentioned method embodiment.

[0224] In some embodiments, the memory 420 may include a program storage area and a data storage area, wherein the program storage area may store an operating system and applications required for at least one function; the data storage area may store data created based on the use of the electronic device 400, etc. In addition, the memory 420 may include a high-speed random access memory and may also include a non-volatile memory, such as at least one disk storage device, a flash memory device, or other non-volatile solid-state storage device. In some embodiments, the memory 420 may optionally include a memory remotely located relative to the processor 410, and these remote memories may be connected to the controller via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0225] In some embodiments, one or more modules are stored in the memory 420, and when executed by one or more processors 410, perform the storage device testing method in any of the above method embodiments, for example, perform the above described Figure 1Method steps S100 to S800.

[0226] Please refer to Figure 3 , Figure 3 The computer-readable storage medium 500 stores program code 510, which can be called by a processor to execute the storage device testing method described in the above method embodiment.

[0227] Computer-readable storage medium 500 may be an electronic memory such as flash memory, electrically erasable programmable read-only memory (EEPROM), a hard disk, or read-only memory (ROM). Alternatively, the computer-readable storage medium includes non-volatile computer-readable media. Computer-readable storage medium 500 has storage space for program code that executes any method steps in the aforementioned storage device testing method. This program code can be read from or written to one or more computer program products. The program code may be compressed, for example, in a suitable format.

[0228] The present application also provides a computer program product, including a computer program, which implements the above-mentioned storage device testing method when executed by a processor.

[0229] See also Figure 4 , Figure 4 This is a schematic diagram of the structure of the test device provided in the embodiment of the present application. Figure 4 As shown, the present application also provides a test device 600. In some embodiments, the test device 600 includes a drive module 610, a transmission module 620, a data operation module 630, a power supply module 640, a temperature adjustment module 650, and a data acquisition module 660. The drive module 610 is used to drive the transmission module 620 to transfer the storage device to the corresponding test position, so that the electronic device 400 described above performs the test method of the storage device described above by controlling the test device 600. The data operation module 630 is used to perform data read operations and data write operations on the storage device. The power supply module 640 is used to supply power to the storage device. The temperature adjustment module 650 is used to heat or dissipate heat for the storage device. The data acquisition module 660 is used to obtain test data generated by the storage device during testing.

[0230] In summary, the present application provides a testing method, electronic device and testing device for a storage device, the testing method for the storage device comprising: upon detecting that the storage device is located at a test position corresponding to the testing device and receiving a start instruction, controlling the testing device to perform multiple stages of testing on the storage device in sequence according to a preset test sequence, the multiple stages of testing including power supply testing, read-write performance testing and operating temperature testing; obtaining test data generated by the storage device in the test of the current stage; judging whether the storage device has passed the test of the current stage based on the test data; when judging that the storage device has passed the current test, controlling the testing device to perform the next stage of testing on the storage device according to the test sequence; when the storage device passes all stages of testing, generating and displaying a statistical chart based on the test data generated by the storage device in the test of each stage, the statistical chart being used to represent the association between the test data of each stage of the storage device and the test data of each stage; obtaining production process information; evaluating the test parameters in the test data of each stage based on the optimal data range corresponding to the test of each stage to obtain an evaluation result; generating production process optimization suggestions based on the evaluation result, a preset database and production process information, the database including the correspondence between the test parameters in the test data and the production links in the production process information. The present application controls the test device to perform multiple stages of testing on the storage device in sequence according to a preset test sequence when it detects that the storage device is located at the test position corresponding to the test device and receives a start-up instruction, and generates and displays statistical charts based on the test data generated by the storage device in the test of each stage. It can test all parameters of the storage device at one time and display the test data of all stages at one time for the user to check. It has a high degree of automation, saves time and effort, and thus can improve testing efficiency.

[0231] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A method for testing a storage device, characterized in that: include: Upon detecting that the storage device is located at a test position corresponding to the test device and receiving a start instruction, controlling the test device to sequentially perform multiple phases of testing on the storage device according to a preset test sequence, wherein the multiple phases of testing include a power supply test, a read / write performance test, and an operating temperature test; When the test device detects that the storage device is located at the test position corresponding to the test device and receives a start instruction, the test device is controlled to perform multiple stages of testing on the storage device in sequence according to a preset test sequence, including: Upon detecting that the storage device is located at a test position corresponding to the test device, receiving a start instruction, and determining, according to the test sequence, that the test in the current stage is a power supply test, controlling a data operation module of the test device to operate the storage device based on a plurality of preset test conditions, so that the storage device is sequentially placed in a plurality of test conditions, the test conditions including a no-load state, a light-load state, a full-load state, and a peak-load state; The control data operation module performs a data read and write operation on the storage device at a first preset frequency and a first data volume, so that the storage device is in a light load state; the control data operation module performs a data write operation on the storage device at a second preset frequency and a second data volume, and performs a data read operation on the storage device at a third preset frequency and a third data volume, so that the storage device is in a full load state; the control data operation module performs a data write operation on the storage device at a fourth preset frequency and a fourth data volume, and performs a data read operation on the storage device at a fifth preset frequency and a fifth data volume, so that the storage device is in a peak load state; Controlling the power supply module of the testing device to supply power to the storage device according to a preset power supply parameter corresponding to the current test condition; Among them, according to the power supply parameters corresponding to the no-load state, the power supply module of the test device is controlled to output the rated voltage to the storage device, and the current is maintained at the lowest value, and the duration is greater than the first preset time to eliminate the influence of transient current fluctuations; according to the power supply parameters corresponding to the light load state, the power supply module of the test device is controlled to output a voltage fluctuating within a first preset voltage range to the storage device; according to the power supply parameters corresponding to the full load state, the power supply module is controlled to output a voltage fluctuating within a second preset voltage range to the storage device; according to the power supply parameters corresponding to the peak load state, the power supply module is controlled to output a peak voltage to the storage device for a second preset time; When it is detected that the storage device is located at the test position corresponding to the test device, a start instruction is received, and it is determined that the test in the current stage is a read and write performance test according to the test sequence, the data operation module of the test device is controlled to simulate the read and write performance test of the storage device in each application scenario based on the read and write operation model of multiple application scenarios, the application scenarios including database scenarios, video surveillance scenarios and high-frequency operation scenarios, the read and write operation model including the data volume and execution mode of the write operation and the data volume and execution mode of the read operation in the corresponding application scenario, the execution mode calculating the time point of executing the operation according to a preset algorithm and executing the operation, and in the read and write operation model, the specific process of the write operation and the read operation is determined based on the user's behavioral characteristics; Acquiring test data generated by the storage device during a current phase of testing; Determining whether the storage device passes the test at the current stage based on the test data; When it is determined that the storage device passes the current test, controlling the testing device to perform a next stage test on the storage device according to the test sequence; When the storage device passes the test of all stages, a statistical chart is generated and displayed based on the test data generated by the storage device in the test of each stage, the statistical chart is used to represent the association of the test data of each stage of the storage device and the test data of each stage, and the statistical chart includes a stage dependency network diagram, in which a node represents a test stage, a sub-node in each node represents a test parameter of the test stage corresponding to the node, and the node edge weight between two adjacent nodes is the comprehensive correlation between the two adjacent nodes; among two adjacent nodes, the sub-node edge weight between a sub-node in one node and a sub-node in the other node is the correlation between the combination of related test parameters represented by the two sub-nodes; The phase dependency network diagram is generated based on preset relevant test parameter combinations of each test phase, wherein the relevant test parameter combination refers to a combination of a test parameter in one test phase and a related test parameter in another test phase; Obtain production process information; Evaluate the test parameters in the test data of each stage based on the optimal data range corresponding to the test of each stage to obtain an evaluation result; generating a production process optimization suggestion based on the evaluation result, a preset database and the production process information, wherein the database includes a correspondence between the test parameters in the test data and the production links in the production process information; The generating of production process optimization suggestions based on the evaluation results, a preset database and the production process information includes: Comprehensively weighting the scores of each test parameter generated in each test stage to obtain a comprehensive score for each test stage; Determining whether each of the test parameters is optimizable based on the score of each test parameter and the minimum score threshold, and determining whether each of the test stages is optimizable based on the comprehensive score of each test stage and the minimum comprehensive score threshold; Based on the database and the optimizable test parameters or test phases, the optimizable production links are located, and corresponding production process optimization suggestions are generated based on the optimizable production links.

2. The storage device testing method according to claim 1, wherein: The acquiring of the test data generated by the storage device in the current phase of the test includes: The data acquisition module of the test device is controlled to acquire the test data generated by the storage device under each of the test conditions.

3. The storage device testing method according to claim 2, wherein: The determining, based on the test data, whether the storage device passes the test at the current stage includes: When the test in the current stage is the power supply test, determining the power data of the storage device under each of the test conditions based on the voltage data and current data of the storage device under each of the test conditions in the test data; When the numerical ranges and fluctuation amplitudes of the voltage data, the current data, and the power data all meet the judgment conditions of the corresponding test conditions, the storage device is judged to have passed the test of the current stage; otherwise, the storage device is judged to have failed the test of the current stage.

4. The storage device testing method according to claim 1, wherein: The acquiring of the test data generated by the storage device in the current phase of the test includes: The data acquisition module of the test device is controlled to acquire test data of the storage device in each application scenario, wherein the test data includes a read speed, a write speed, and a data error rate.

5. The storage device testing method according to claim 4, wherein: The determining, based on the test data, whether the storage device passes the test at the current stage includes: When the test in the current stage is the read / write performance test, it is determined whether the storage device has passed the test in the current stage based on the read / write performance parameter standard in each application scenario and the corresponding test parameters in the test data.

6. The storage device testing method according to claim 1, wherein: When the test device detects that the storage device is located at the test position corresponding to the test device and receives a start instruction, the test device is controlled to perform multiple stages of testing on the storage device in sequence according to a preset test sequence, including: Upon detecting that the storage device is located at a test position corresponding to the test device, receiving a start instruction, and determining that the test in the current stage is an operating temperature test according to the test sequence, controlling the temperature adjustment module of the test device to heat, dissipate heat, or stop the storage device according to a preset sequence of multiple temperature test links and a temperature test range of each temperature test link; The acquiring of the test data generated by the storage device in the current phase of the test includes: When the operating temperature of the storage device is the test temperature in the temperature test link, the data acquisition module of the test device is controlled to acquire test data of the storage device at the current operating temperature, where the test data includes the operating status parameters of the storage device.

7. The storage device testing method according to claim 6, wherein: The determining, based on the test data, whether the storage device passes the test at the current stage includes: When the test in the current stage is the operating temperature test, whether the storage device passes the test in the current stage is determined based on the qualified numerical range of the test data corresponding to each temperature test link and the test data of the temperature test link.

8. An electronic device, characterized in that: The electronic device comprises: at least one processor; and, a memory communicatively connected to the at least one processor; wherein, The memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to perform the storage device testing method according to any one of claims 1 to 7.

9. A testing device, characterized in that: The testing device includes a driving module, a transmission module, a data operation module, a power supply module, a temperature adjustment module and a data acquisition module. The driving module is used to drive the transmission module to transfer the storage device to the corresponding test position, so that the electronic device according to claim 8 executes the testing method of the storage device according to any one of claims 1 to 7 by controlling the testing device. The data operation module is used to perform data reading operations and data writing operations on the storage device. The power supply module is used to supply power to the storage device. The temperature adjustment module is used to heat or dissipate heat for the storage device. The data acquisition module is used to obtain test data generated by the storage device during the test.

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