Multi-channel on-resistance performance test system and method

Abstract

The invention discloses a multi-channel on-resistance performance test system and method, relates to the technical field of electronic component performance measurement, and solves the technical problem of low detection accuracy of a performance test system caused by the fact that an existing component performance test system adopts a fixed delay strategy to carry out performance test. The test module is used for carrying out performance test on elements according to a test scheme; the test temperature and the corresponding recording time are obtained in real time; the acquisition signal generation module is used for generating initial delay duration according to the characteristic data and the test scheme; generating an adjustment delay duration according to the initial delay duration and the test temperature recorded in real time, and generating an acquisition signal according to the adjustment delay duration; the data acquisition module is used for acquiring performance test data of the test element through data acquisition equipment connected with the data acquisition module according to the acquisition signal; the performance analysis module is used for generating an element performance test report according to the performance test data; the accuracy of test data is ensured, and the detection accuracy of the performance test system is improved.

Description

Technical Field

[0001] This application belongs to the technical field of electronic component performance measurement, involving electronic component performance measurement technology, and specifically relates to a multi-channel on-resistance performance test system and method. Background Art

[0002] Performing performance tests on electronic components plays a crucial role in ensuring product quality and reliability, promoting technological innovation, meeting regulatory standards, optimizing cost control, and troubleshooting and diagnosis, and is an essential key link in the semiconductor industry.

[0003] When testing the performance of electronic components, it is necessary to place the semiconductor in a test device to simulate a specific operating environment and measure the performance parameters related to the electronic components. In the existing tests on the performance of the on-resistance of electronic components affected by temperature, often by setting the same temperature interval, the temperature is increased or decreased in sequence to the set temperature, and when reaching the temperature test point, the relevant performances such as the on-resistance and power consumption of the component are measured immediately or after a fixed delay. Due to the different materials of different components, their sensitivities to temperature changes are different; the times for their performances to reach stability at different changing temperatures are different; using a fixed delay duration, when performing parameter measurement, it may occur that the electronic component is not in a stable state during measurement, and at this time, the performance test of the unstable component will not be accurate enough, thereby reducing the detection accuracy of the component performance test system. Therefore, a multi-channel on-resistance performance test system and method are needed. Summary of the Invention

[0004] This application aims to at least solve one of the technical problems existing in the prior art; for this purpose, this application proposes a multi-channel on-resistance performance test system and method, which are used to solve the technical problem that the existing component performance test system uses a fixed delay strategy for performance testing, resulting in a relatively low detection accuracy of the performance test system.

[0005] To achieve the above object, the first aspect of this application provides a multi-channel on-resistance performance test system, including: a data acquisition module, a test module, a sampling signal generation module, a performance analysis module, and a database;

[0006] The test module: obtains a test plan, performs a performance test on the component according to the test plan; and obtains the test temperature and its corresponding recording time in real time;

[0007] The sampling signal generation module: obtains the characteristic data of the component and the test plan; generates an initial delay duration according to the characteristic data and the test plan; generates an adjusted delay duration according to the initial delay duration and the test temperature recorded in real time, and generates a sampling signal according to the adjusted delay duration;

[0008] The data acquisition module: acquires the acquisition signal, and obtains the performance test data of the test component through the data acquisition device connected thereto according to the acquisition signal;

[0009] The performance analysis module: acquires several pieces of performance test data respectively, and generates a component performance test report according to the performance test data.

[0010] This application obtains the characteristic data of the test component; generates the initial delay duration according to the characteristic data and the test scheme; performs a performance test on the component according to the test scheme; obtains the test temperature and the recording time; generates an adjusted delay duration according to the initial delay duration and the test temperature recorded in real time, generates an acquisition signal according to the adjusted delay duration; obtains the performance test data of the test component through the data acquisition device connected thereto according to the acquisition signal; generates a component performance test report according to the performance test data; sets the existing delay time according to the actual test situation and the characteristics of the component, so that when measuring various performance parameters of the component, the component is in a stable or near-stable state, ensuring the accuracy of the test data, and thus improving the detection accuracy of the performance test system.

[0011] Preferably, generating the initial delay duration according to the characteristic data and the test scheme includes:

[0012] Extract the component material and component type in the characteristic data; input the component material and component type into the temperature sensitivity evaluation model to obtain a temperature sensitivity score; the temperature sensitivity evaluation model is obtained by training with an artificial intelligence model;

[0013] Extract the temperature values of each temperature test point and the estimated heating time between adjacent temperature points in the test scheme; generate a test influence coefficient according to the temperature values of each temperature test point and the estimated heating time;

[0014] Through the formula Calculate the initial delay duration CYTi corresponding to the temperature test point numbered i; where ZP is the maximum value of the test influence coefficient; MP is the temperature sensitivity score corresponding to the component; DYT is the unit delay duration; α2 is a proportionality coefficient used to adjust the influence of the test influence coefficient on the delay duration during component testing, and α2>1.

[0015] Due to the differences in the component materials and packaging materials of different components, their sensitivities to temperature changes are also different; different component materials will cause the on-resistance of the component to be affected by temperature differently when the temperature changes; this leads to different fluctuations of components with different component materials when the temperature changes by the same amount; there are those with a relatively short fluctuation time and a small fluctuation amplitude, and their corresponding delay times are shorter; in this embodiment, the initial delay duration is calculated through the above formula; when the temperature sensitivity score corresponding to the component is larger, it indicates that the component is more affected when the temperature changes. Usually, when the test temperature has reached the corresponding temperature test point, the various parameters of the component are more unstable; at this time, a longer delay duration needs to be set. When the delay duration arrives, the various performances of the component are stable or tend to a stable value. Therefore, in this embodiment, the corresponding delay duration is set longer; when the test influence factor is larger, it indicates that the temperature value span between adjacent temperature test points is larger, or the temperature change rate is faster. At this time, the time required for the component to adapt to the test temperature is longer, and the time required for the various performances of the component to be stable or tend to a stable value is longer. Therefore, in this embodiment, the corresponding delay duration is set longer.

[0016] Preferably, generating the test influence coefficient according to the temperature values of each temperature test point and the estimated heating time includes:

[0017] Number each temperature test point in the test order, and mark its corresponding temperature value as WHi; i is the number of the temperature test point; mark the estimated time from the (i - 1)-th temperature test point to the i-th temperature test point as YTi;

[0018] Through the formula Calculate the test influence coefficient CPi of the i-th temperature test point; where, α1 is a proportionality coefficient used to adjust the value range of the test influence coefficient, and the specific value is set according to experience; β1 is an adjustment coefficient used to adjust the proportional relationship between the temperature test point and the test influence coefficient; the specific value is set according to expert experience. In this embodiment, the adjustment coefficient is obtained through multiple experiments; DWH is the unit temperature change amount used to unify the change difference of the temperature value; DT is the unit time change amount; i = 1, 2,..., I; I is the total number of temperature test points in the test scheme; WH0 is the initial temperature of the test equipment; is the current ambient temperature.

[0019] Preferably, the temperature sensitivity evaluation model is obtained by training an artificial intelligence model, including:

[0020] Obtain the component materials and component types of several components from the database, as well as their corresponding temperature sensitivity scores; the temperature sensitivity score is an evaluation by experts on the performance stability of the component when the external environmental temperature changes according to the material and type of the component;

[0021] Integrate the component material, component standard, and their corresponding temperature sensitivity scores into several groups of training data and test data. Use the training data to train the artificial intelligence model, and use the test data to test the trained artificial intelligence model; finally, obtain a temperature sensitivity evaluation model with the component material and component standard as the input and the corresponding temperature sensitivity score as the output; among them, the artificial intelligence model includes a BP neural network model and an RBF neural network model.

[0022] Preferably, the generation of the adjusted delay duration according to the initial delay duration and the real-time recorded test temperature includes:

[0023] Obtain the real-time test temperature. When the test temperature is at the test temperature point; obtain the recording time when the previous test temperature was at the temperature test point, obtain the time difference between the recording time and the current time and record it as the actual temperature change time, and mark it as STi;

[0024] Through the formula Calculate the adjusted delay duration TZTi; where α3 is a proportionality coefficient, and 0 < α3 < 2 / π; the specific value is set according to experience.

[0025] Preferably, the generation of the acquisition signal according to the adjusted delay duration includes:

[0026] Obtain several performance test items and the adjusted delay duration; use the adjusted delay duration as the timing duration for each performance test item; the performance test items include items related to component performance such as on-resistance and power; the timing duration is a countdown starting from the current time, and performance test data acquisition is performed when the countdown reaches zero; generate several item acquisition signals from the timing duration and each performance test item, and integrate the several item acquisition signals into an acquisition signal; the acquisition signal includes several item acquisition signals.

[0027] Preferably, the generation of the component performance test report according to the performance test data includes:

[0028] Extract the test values corresponding to each performance test item in the performance test data; fit the test values into the corresponding item performance curves in ascending order of the temperature corresponding to the temperature test point.

[0029] Obtain the project performance curves of each performance test item corresponding to each test component in sequence; obtain the similarity between several project performance curves corresponding to the same performance test item, divide the project performance curves with similarity higher than the set similarity threshold into a test result group, obtain the number of project performance curves in each test result group corresponding to the same performance test item, obtain each project performance curve in the test result group with the largest number of project performance curves, and re-fit the average value of the test values corresponding to each test temperature of each project performance curve into the test performance curve of the corresponding performance test item;

[0030] Integrate the test performance curves corresponding to each performance test item into the same performance test graph to obtain the performance test graph of the corresponding component; integrate the performance test graph, the test temperatures of each temperature test point, the delay duration, and the test values of each performance test item into the component performance report.

[0031] Preferably, it further includes: a test planning module and an interaction module;

[0032] The test planning module: obtains the characteristic data of the component through the interaction module and generates a test plan according to the characteristic data;

[0033] The interaction module: is used to obtain the characteristic data of the test component.

[0034] Preferably, generating the test plan according to the characteristic data includes:

[0035] Extract the curve of the on-resistance varying with temperature R(T) in the characteristic data; obtain the second derivative value of each point on the temperature change curve and judge whether the second derivative value is greater than the set discontinuity threshold; if so, set the temperature corresponding to the second derivative value as the discontinuity temperature value; if not, set the temperature corresponding to the second derivative value as the interval temperature value;

[0036] Obtain each discontinuity temperature value on the curve of the on-resistance varying with temperature, segment the curve of the on-resistance varying with temperature according to the discontinuity temperature value to obtain several test temperature segments; obtain the average value of the absolute value of the first derivative of each test temperature segment and mark it as BHn; through the formula Calculate the number of test points CSn corresponding to the temperature test segment numbered n, where, is the ceiling symbol; BX is the set standard slope threshold, BS is the standard number of test points corresponding to the standard slope threshold; γ is a proportionality coefficient used to adjust the number of test points, and the specific value is set according to experience;

[0037] Evenly divide the test temperature segments according to the number of test points to obtain several temperature test points; integrate each temperature test point in order into the test plan.

[0038] By testing the curve of the on-resistance of the test component varying with temperature and setting temperature test points specifically, it is ensured that the performance of the component can be tested completely.

[0039] Another aspect of the present application provides a multi-channel on-resistance performance testing method, including the following steps:

[0040] Step 1: Obtain the characteristic data of the test component;

[0041] Step 2: Generate a test plan according to the curve of the on-resistance varying with temperature in the characteristic data;

[0042] Step 3: Generate an initial delay duration according to the component material and component type in the characteristic data, and the test plan;

[0043] Step 4: Conduct performance testing on the component according to the test plan;

[0044] Step 5: Obtain the test temperature and recording time; generate an adjusted delay duration according to the initial delay duration and the real-time recorded test temperature, and generate an acquisition signal according to the adjusted delay duration;

[0045] Step 6: Obtain the performance test data of the test component through the data acquisition device connected to it according to the data acquisition signal;

[0046] Step 7: Generate a component performance test report according to the performance test data.

[0047] Compared with the prior art, the beneficial effects of the present application are:

[0048] 1. By obtaining the characteristic data of the test component; generating an initial delay duration according to the characteristic data and the test plan; conducting performance testing on the component according to the test plan; obtaining the test temperature and recording time; generating an adjusted delay duration according to the initial delay duration and the real-time recorded test temperature, and generating an acquisition signal according to the adjusted delay duration; obtaining the performance test data of the test component through the data acquisition device connected to it according to the acquisition signal; generating a component performance test report according to the performance test data; setting the existing delay time according to the actual test situation and the characteristics of the component, when measuring various performance parameters of the component, the component is in a stable or near-stable state, ensuring the accuracy of the test data, and thus improving the detection accuracy of the performance test system.

[0049] 2. By testing the curve of the on-resistance of the test component varying with temperature and setting temperature test points specifically, it is ensured that the performance of the component can be tested completely. Description of the Drawings

[0050] To more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the accompanying drawings required for the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0051] Figure 1 It is a schematic diagram of the modules of the performance test system in the present application;

[0052] Figure 2 It is a schematic diagram of the steps of the performance test method in the present application. Detailed implementation manners

[0053] The following will clearly and completely describe the technical solutions of the present application in combination with the embodiments. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all of them. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of the present application.

[0054] Please refer to Figure 1 , the first aspect embodiment of the present application provides a multi-channel on-resistance performance test system, including: a data acquisition module, a test module, a collection signal generation module, a performance analysis module, a database, a test planning module, and an interaction module;

[0055] Test module: Obtain a test plan, and the test plan is a control plan for temperature; perform performance tests on components according to the test plan; and obtain the test temperature and its corresponding recording time in real time. The test temperature is the temperature of the component test environment collected by the test module, and the recording time is the acquisition time corresponding to the test temperature;

[0056] Collection signal generation module: Obtain the characteristic data of the component and the test plan; generate an initial delay duration according to the characteristic data and the test plan; the initial delay duration is the delay duration set considering the component characteristics and the temperature adjustment plan inside the test plan, which is the delay duration in the ideal state. Generate an adjusted delay duration according to the initial delay duration and the real-time recorded test temperature. The adjusted delay duration is the delay duration obtained by adjusting the initial delay duration according to the gap between the actual temperature change situation and the temperature change situation in the test plan. This delay duration is more matched with the actual test environment; generate a collection signal according to the adjusted delay duration; the collection signal is a signal for collecting the numerical values of each performance test item of the test component;

[0057] Data acquisition module: Obtain the acquisition signal, and acquire the performance test data of the test component through the data acquisition device connected thereto according to the acquisition signal; the performance test data includes the test data of each performance test item, and the performance test items include items such as the on-resistance, power, current, and voltage of the test component;

[0058] Performance analysis module: Obtain several pieces of performance test data respectively, and generate a component performance test report according to the performance test data.

[0059] In this embodiment, the characteristic data of the test component is obtained; a test scheme is generated according to the on-resistance vs. temperature change curve in the characteristic data; an initial delay duration is generated according to the component material and component type in the characteristic data, and the test scheme; the component is subjected to performance testing according to the test scheme; the test temperature and recording time are obtained; an adjusted delay duration is generated according to the initial delay duration and the real-time recorded test temperature, and an acquisition signal is generated according to the adjusted delay duration; the data acquisition signal acquires the performance test data of the test component through the data acquisition device connected thereto; a component performance test report is generated according to the performance test data; the existing delay time is set according to the actual test situation and the characteristics of the component, so that when measuring the performance parameters of the component, the component is in a stable or tending-to-be-stable state, ensuring the accuracy of the test data, and thus improving the detection accuracy of the performance test system.

[0060] Generating the initial delay duration according to the characteristic data and the test scheme includes:

[0061] Extract the component material and component type from the characteristic data; input the component material and component type into the temperature sensitivity evaluation model to obtain a temperature sensitivity score; the temperature sensitivity score is an evaluation of the performance stability of the component when the external environment temperature of the component changes according to the material and type of the component; the higher the temperature sensitivity score, the worse the stability of the component when the temperature changes, and the more likely the performance of the component is to fluctuate. When the temperature changes, the relevant parameters of the performance of the component will fluctuate, affecting the accuracy of the measurement result; the temperature sensitivity evaluation model is obtained through artificial intelligence model training;

[0062] Extract the temperature values of each temperature test point in the test scheme and the estimated heating time between adjacent temperature points; the estimated heating time is the time interval between adjacent temperature test points, which can be obtained through the temperature span between adjacent temperature test points and the heating rate of the test equipment; generate a test influence coefficient according to the temperature values of each temperature test point and the estimated heating time; the test influence coefficient is the influence coefficient of the test scheme on the delay time generated according to the planned test situation between each temperature test point in the test scheme;

[0063] Through the formula Calculate the initial delay duration CYTi corresponding to the temperature test point numbered i; where ZP is the maximum value of the test influence coefficient; MP is the temperature sensitivity score corresponding to the component; DYT is the unit delay duration, and its specific value is set according to expert experience; it can be understood that the unit delay duration should be set corresponding to the temperature sensitivity score, that is, the unit delay duration is the delay duration per unit temperature sensitivity score; for example, if the unit delay duration is 10s and the temperature sensitivity score is 65 points, 1 point of temperature sensitivity score corresponds to one unit delay duration, and 65 points correspond to a delay duration of 650s; α2 is a proportionality coefficient used to adjust the influence of the test influence coefficient on the delay duration during component testing, and α2>1, and its specific value is set according to expert experience.

[0064] Due to the differences in the component materials and packaging materials of different components, their sensitivities to temperature changes are also different; different component materials will cause different amplitudes of the on-resistance of the component to be affected by temperature when the temperature changes; resulting in different fluctuations of components with different component materials during the same temperature change; there are those with a relatively short fluctuation time and a small fluctuation amplitude, and their corresponding delay times are shorter; in this embodiment, the initial delay duration is calculated through the above formula; when the temperature sensitivity score corresponding to the component is larger, it means that when the temperature changes, the component is more affected, and often when the test temperature has reached the corresponding temperature test point, the various parameters of the component are more unstable; at this time, a longer delay duration needs to be set, and when the delay duration arrives, the various performances of the component are stable or tend to a stable value, so the corresponding delay duration is set longer in this embodiment; when the test influence factor is larger, it means that the temperature value span between adjacent temperature test points is larger, or the temperature change rate is faster. At this time, the time required for the component to adapt to the test temperature is longer, and the time required for the various performances of the component to be stable or tend to a stable value is longer, so the corresponding delay duration is set longer in this embodiment.

[0065] Generate a test influence coefficient based on the temperature values and estimated heating times of each temperature test point, including: numbering each temperature test point in the test order, and marking its corresponding temperature value as WHi; i is the number of the temperature test point; marking the estimated time from the (i - 1)th temperature test point to the i-th temperature test point as YTi;

[0066] Through the formula Calculate the test influence coefficient CPi of the i-th temperature test point; where α1 is a proportionality coefficient used to adjust the value range of the test influence coefficient, and the specific value is set according to experience; β1 is an adjustment coefficient used to adjust the proportional relationship between the temperature test point and the test influence coefficient; the specific value is set according to expert experience, and the adjustment coefficient in this embodiment is obtained through multiple experiments; DWH is the unit temperature change amount used to unify the change difference of the temperature value; DT is the unit time change amount; in this embodiment, DWH = 10 degrees Celsius and DT is equal to 30 seconds. It can be understood that the unit temperature change amount and the unit time change amount should match each other. The unit time change amount is the time for the test equipment to increase the temperature by the unit temperature change amount under the normal heating rate, and it is also related to the performance of the test equipment and the internal space size of the test equipment. Under the same heating performance, the larger the space, the slower the temperature rise, and the corresponding unit time change amount will increase accordingly; i = 1, 2,..., I; I is the total number of temperature test points in the test plan; WH0 is the initial temperature of the test equipment; is the current ambient temperature.

[0067] In this embodiment, the test influence coefficient is calculated through the above formula; when the temperature difference between two temperature test points is large, the influence on the component is large, that is, when the temperature adjustment span is large, the possibility of the component showing volatility is greater, and at this time, the corresponding test influence coefficient is set larger; when the time for temperature adjustment between two test points is shorter, the component's adaptation to temperature changes is worse, and the probability that the component's temperature has not reached the test point when the test environment reaches the temperature test point is greater. Therefore, the corresponding test influence coefficient is set larger.

[0068] The temperature sensitivity evaluation model is obtained through training of an artificial intelligence model, including: obtaining the component materials and component types of several components from a database, as well as their corresponding temperature sensitivity scores; the temperature sensitivity score is an evaluation by experts of the component performance stability when the external environmental temperature changes according to the component materials and types. When the component materials and types change in the external environment, the corresponding performance of the component also changes. The greater the degree of change, the lower the stability of the component performance, and the higher the corresponding temperature sensitivity score is set; the component material is the material used to make the component, including non-metallic materials and metallic materials, etc., and can also be divided in detail; the component type is the type-related data of the component, including whether it is encapsulated, the encapsulation material, and the component structure, etc.

[0069] Integrate the component material, component standard, and their corresponding temperature sensitivity scores into several groups of training data and test data. Use the training data to train the artificial intelligence model, and use the test data to test the trained artificial intelligence model; finally, obtain a temperature sensitivity evaluation model with the component material and component standard as the input and the corresponding temperature sensitivity score as the output; among them, the artificial intelligence model includes a BP neural network model and an RBF neural network model; the specific method of training the artificial intelligence is an existing technology and not the main content of this application, so it will not be elaborated here.

[0070] Generate an adjusted delay duration based on the initial delay duration and the real-time recorded test temperature, including: obtaining the real-time test temperature. When the test temperature is at the test temperature point; obtaining the recording time when the previous test temperature was at the temperature test point. It can be understood that this recording time may be the recording time of the current temperature test point or the recording time of the previous temperature test point, avoiding the situation of generating a delay time again during the delay process. Record the time difference between the obtained recording time and the current time as the actual temperature change time and mark it as STi.

[0071] Through the formula Calculate the adjusted delay duration TZTi; where α3 is a proportionality coefficient and 0 < α3 < 2 / π; the specific value is set according to experience and is used to adjust the proportion of the initial delay duration in cooperation with the gap between the actual temperature adjustment time and the expected temperature adjustment time.

[0072] In this embodiment, the initial delay duration is adjusted to obtain the adjusted delay duration based on the gap between the actual temperature adjustment time and the expected temperature adjustment time, making the delay duration more in line with the actual situation and ensuring that the delay duration is more accurate; when the actual temperature change duration is longer than the corresponding expected duration, the time for the component to adapt to the temperature change is longer. After the temperature reaches the temperature test point, the performance of the component is closer to the performance at the corresponding test temperature point; the duration of the delay required is shorter, so the initial delay duration needs to be adjusted downward to adapt to the actual test temperature change situation; when the actual temperature change duration is shorter than the corresponding expected duration, the time for the component to adapt to the temperature change is shorter. After the temperature reaches the temperature test point, the gap between the performance of the component and the performance at the corresponding test temperature point is larger; the duration of the delay required is longer, so the initial delay duration needs to be adjusted upward to adapt to the actual test temperature change situation; ensuring that the delay time is accurate enough, and thus ensuring that the performance test data is closer to the performance test data in the actual environment.

[0073] Generate a collection signal according to the adjusted delay time, including: obtain a number of performance test items and adjust the delay time; use the adjusted delay time as the timing time of each performance test item; the performance test items include items related to component performance such as on-resistance and power; the timing time is a countdown from the current time, and the performance test data is collected when the countdown returns to zero; generate a number of project collection signals from the timing time and each performance test item, and the project collection signals correspond to the performance test items one by one; integrate the several project collection signals into a collection signal; the collection signal includes several project collection signals.

[0074] Generating a component performance test report according to the performance test data, including: extracting the test values ​​corresponding to each performance test item in the performance test data; fitting the test values ​​into corresponding item performance curves according to the corresponding temperatures of the corresponding temperature test points from low to high; the fitting method includes an interpolation method;

[0075] Obtain the project performance curve of each performance test item corresponding to each test element in turn; obtain the similarity between several project performance curves corresponding to the same performance test item, the similarity can be obtained by the difference between the test values ​​corresponding to the same temperature test points of the two curves, and then cumulatively summing the differences corresponding to each temperature test point; the larger the result of this sum, the lower the similarity between the two curves; divide the project performance curves with similarity higher than the set similarity threshold into a test result group, obtain the number of project performance curves in each test result group corresponding to the same performance test item, obtain each project performance curve of the test result group with the largest number of project performance curves, and re-fit the average value of the test values ​​corresponding to each test temperature of each project performance curve into the test performance curve of the corresponding performance test item; wherein the similarity threshold is set according to experience;

[0076] The test performance curves corresponding to each performance test item are integrated into the same performance test graph to obtain the performance test graph of the corresponding component; the performance test graph, the test temperature of each temperature test point, the delay time, and the test values ​​of each performance test item are integrated into a component performance report.

[0077] This embodiment classifies the test results of each test component by the above method, and excludes as much as possible the situation where the test results of some components with poor performance due to production defects are significantly different from the performance of normal components.

[0078] As another embodiment of the present invention, different from the above embodiment, the multi-channel on-resistance performance testing system further includes:

[0079] Interaction module: used to obtain characteristic data of test components;

[0080] Test planning module: Generate a test plan based on characteristic data;

[0081] Obtain characteristic data through the interaction module, and generating a test plan based on the characteristic data can further improve its test method.

[0082] Generate a test plan based on the characteristic data, including:

[0083] Extract the curve of on-resistance varying with temperature R(T) in the characteristic data; Obtain the second derivative values of each point on the temperature change curve, and determine whether the second derivative value is greater than the set discontinuity threshold; If so, set the temperature corresponding to the second derivative value as the discontinuity temperature value; If not, set the temperature corresponding to the second derivative value as the interval temperature value;

[0084] In this embodiment, several discontinuity temperature values are obtained through the above method. When the change trends between different stages in the curve of on-resistance varying with temperature are different, the temperature value corresponding to the changing point is set as the discontinuity temperature value, and then the curve of on-resistance varying with temperature is segmented according to the discontinuity temperature value to obtain several test temperature segments, so that the change trends of on-resistance varying with temperature within each temperature test segment are not very different, which is convenient for subsequent data analysis;

[0085] Obtain each discontinuity temperature value on the curve of on-resistance varying with temperature, and segment the curve of on-resistance varying with temperature according to the discontinuity temperature value to obtain several test temperature segments; Obtain the average value of the absolute values of the first derivatives of each test temperature segment and mark it as BHn; Through the formula Calculate the number of test points CSn corresponding to the temperature test segment numbered n, where, is the ceiling symbol; BX is the set standard slope threshold, BS is the standard number of test points corresponding to the standard slope threshold; γ is a proportionality coefficient used to adjust the number of test points, and the specific value is set according to experience;

[0086] Evenly divide the test temperature segment according to the number of test points to obtain several temperature test points; Integrate each temperature test point in order to form a test plan.

[0087] In this embodiment, the number of test points for each temperature test segment is calculated through the above formula. When the on-resistance of the component in the corresponding temperature test segment changes greatly, the value of its corresponding first derivative is large. In order to ensure that the performance of the component can be tested as completely as possible, more temperature test points need to be set in this temperature test segment; When the on-resistance of the component in the corresponding temperature test segment changes little, the value of its corresponding first derivative is small. Fewer temperature test points are set in this temperature test segment, and the performance characteristics of the component in this temperature test segment can also be measured more accurately.

[0088] Please refer toFigure 2 , on the other hand, the present application provides a method for testing the multi-channel on-resistance performance, including the following steps:

[0089] Step 1: Obtain the characteristic data of the test component;

[0090] Step 2: Generate a test plan according to the curve of the on-resistance varying with temperature in the characteristic data;

[0091] Step 3: Generate an initial delay duration according to the component material and component type in the characteristic data, and the test plan;

[0092] Step 4: Perform a performance test on the component according to the test plan;

[0093] Step 5: Obtain the test temperature and recording time; generate an adjusted delay duration according to the initial delay duration and the real-time recorded test temperature, and generate a sampling signal according to the adjusted delay duration;

[0094] Step 6: Obtain the performance test data of the test component through the data acquisition device connected thereto according to the data sampling signal;

[0095] Step 7: Generate a component performance test report according to the performance test data.

[0096] Some of the data in the above formula are calculated by removing the dimension and taking their numerical values. The formula is obtained by software simulation of a large amount of collected data to get a formula closest to the actual situation; the preset parameters and preset thresholds in the formula are set by those skilled in the art according to the actual situation or obtained through simulation of a large amount of data.

[0097] The working principle of the present application:

[0098] The present application obtains the characteristic data of the test component; generates a test plan according to the curve of the on-resistance varying with temperature in the characteristic data; generates an initial delay duration according to the component material and component type in the characteristic data, and the test plan; performs a performance test on the component according to the test plan; obtains the test temperature and recording time; generates an adjusted delay duration according to the initial delay duration and the real-time recorded test temperature, and generates a sampling signal according to the adjusted delay duration; obtains the performance test data of the test component through the data acquisition device connected thereto according to the data sampling signal; generates a component performance test report according to the performance test data; sets the existing delay time according to the actual test situation and the characteristics of the component, so that when measuring various performance parameters of the component, the component is in a stable or tending-to-be-stable state, ensuring the accuracy of the test data, and thus improving the detection accuracy of the performance test system.

[0099] The above embodiments are only used to illustrate the technical solutions of the present application rather than to limit them. Although the present application has been described in detail with reference to the preferred embodiments, those of ordinary skill in the art should understand that the technical solutions of the present application can be modified or equivalently replaced without departing from the spirit and scope of the technical solutions of the present application.

Claims

1. A multi-channel on-resistance performance test system, comprising: Data acquisition module, test module, acquisition signal generation module, performance analysis module and database; characterized in that, The test module: obtains the test plan, performs performance test on the component according to the test plan; and obtains the test temperature and its corresponding recording time in real time; The acquisition signal generation module: obtains characteristic data and a test scheme of the component; generates an initial delay time according to the characteristic data and the test scheme; generates an adjustment delay time according to the initial delay time and the real-time recorded test temperature, and generates an acquisition signal according to the adjustment delay time; The data acquisition module is used to acquire an acquisition signal, and acquire the performance test data of the test element through a data acquisition device connected thereto according to the acquisition signal; The performance analysis module is used to obtain a plurality of performance test data and generate a component performance test report according to the performance test data.

2. A multi-channel on-resistance performance test system according to claim 1, characterized in that: The generating of the initial delay duration according to the characteristic data and the test scheme includes: Extracting component materials and component specifications from characteristic data; inputting component materials and component specifications into a temperature sensitivity evaluation model to obtain a temperature sensitivity score; the temperature sensitivity evaluation model is obtained by training an artificial intelligence model; Extract the temperature value of each temperature test point in the test plan and the estimated heating time between adjacent temperature points; generate the test influence coefficient according to the temperature value of each temperature test point and the estimated heating time; By formula The initial delay time CYTi corresponding to the temperature test point numbered i is calculated; wherein ZP is the maximum value of the test influence coefficient; MP is the temperature sensitivity score corresponding to the component; DYT is the unit delay time; and α2 is the proportional coefficient.

3. A multi-channel on-resistance performance test system according to claim 2, characterized in that: The test influence coefficient is generated according to the temperature value of each temperature test point and the estimated heating time, including: Each temperature test point is numbered according to the test order, and the corresponding temperature value is marked as WHi; i is the number of the temperature test point; the estimated time from the i-1th temperature test point to the ith temperature test point is marked as YTi; By formula The test influence coefficient CPi of the i-th temperature test point is calculated; wherein α1 is the proportional coefficient; β1 is the adjustment coefficient; DWH is the unit temperature change; DT is the unit time change; i=1, 2,…, I; I is the total number of temperature test points in the test plan; WH0 is the initial temperature of the test equipment.

4. A multi-channel on-resistance performance test system according to claim 2, characterized in that: The temperature sensitivity evaluation model is obtained through artificial intelligence model training, including: Obtain component materials and component specifications of a number of components, as well as their corresponding temperature sensitivity scores, from a database; integrate the component materials, component specifications, and their corresponding temperature sensitivity scores into a number of sets of training data and test data; The artificial intelligence model is trained using training data, and the trained artificial intelligence model is tested using test data; ultimately, a temperature sensitivity evaluation model is obtained, whose input is component material and component format, and whose output is the corresponding temperature sensitivity score; wherein the artificial intelligence model includes a BP neural network model and an RBF neural network model.

5. A multi-channel on-resistance performance testing system according to claim 2, characterized in that: The step of generating an adjusted delay time according to the initial delay time and the real-time recorded test temperature includes: Get the real-time test temperature, when the test temperature is the test temperature point; get the record time of the last test temperature as the temperature test point, get the time difference between the record time and the current time as the actual temperature change time, and mark it as STi; By formula The adjusted delay time TZTi is calculated, wherein α3 is a proportional coefficient.

6. A multi-channel on-resistance performance test system according to claim 1, characterized in that: Generating the acquisition signal according to the adjusted delay time includes: Acquire several performance test items and adjust the delay duration; use the adjusted delay duration as the timing duration of each performance test item; generate several item acquisition signals based on the timing duration and each performance test item, and integrate the several item acquisition signals into an acquisition signal; the acquisition signal includes several item acquisition signals.

7. A multi-channel on-resistance performance test system according to claim 1, characterized in that: Generating a component performance test report according to the performance test data includes: Extract the test values ​​corresponding to each performance test item in the performance test data; fit the test values ​​into corresponding project performance curves according to the corresponding temperatures of the corresponding temperature test points from low to high; Obtaining the project performance curve of each performance test item corresponding to each test element in sequence; obtaining the similarity between several project performance curves corresponding to the same performance test item, dividing the project performance curves with a similarity higher than a set similarity threshold into a test result group, obtaining the number of project performance curves in each test result group corresponding to the same performance test item, obtaining each project performance curve of the test result group with the largest number of project performance curves, and refitting the average value of the test values ​​corresponding to each test temperature of each project performance curve into a test performance curve of the corresponding performance test item; The test performance curves corresponding to each performance test item are integrated into the same performance test graph to obtain the performance test graph of the corresponding component; the performance test graph, the test temperature of each temperature test point, the delay time, and the test values ​​of each performance test item are integrated into a component performance report.

8. A multi-channel on-resistance performance test system according to claim 1, characterized in that: Also includes: Test planning module and interaction module; The test planning module: obtains the characteristic data of the component through the interactive module, and generates a test plan according to the characteristic data; The interaction module is used to obtain characteristic data of the test element.

9. A multi-channel on-resistance performance test system according to claim 8, characterized in that: The generating of a test plan according to the characteristic data comprises: Extract the on-resistance versus temperature curve in the characteristic data; obtain the second-order derivative value of each point of the temperature change curve, and determine whether the second-order derivative value is greater than a set discontinuity threshold; if yes, set the temperature corresponding to the second-order derivative value as the discontinuity temperature value; if no, set the temperature corresponding to the second-order derivative value as the interval temperature value; Obtain each discontinuous temperature value on the on-resistance versus temperature curve, and segment the on-resistance versus temperature curve according to the discontinuous temperature values ​​to obtain several test temperature segments; obtain the average value of the absolute value of the first-order derivative of each test temperature segment and mark it as BHn; through the formula The number of test points CSn corresponding to the temperature test section numbered n is calculated, where: is the rounding symbol; BX is the set standard slope threshold, BS is the number of standard test points corresponding to the standard slope threshold; γ is the proportional coefficient; The test temperature section is equally divided according to the number of test points to obtain a number of temperature test points; and the temperature test points are sequentially integrated into a test plan.

10. A multi-channel on-resistance performance test method, based on a multi-channel on-resistance performance test system according to any one of claims 1 to 9; characterized in that: The following steps are involved: Step 1: Obtain characteristic data of the test component; Step 2: Generate a test plan based on the on-resistance versus temperature curve in the characteristic data; Step 3: Generate an initial delay time according to the component material and component format in the characteristic data and the test plan; Step 4: Perform performance tests on components according to the test plan; Step 5: Obtain the test temperature and recording time; generate an adjusted delay time according to the initial delay time and the real-time recorded test temperature, and generate a collection signal according to the adjusted delay time; Step 6: Acquire the performance test data of the test element through the data acquisition device connected thereto according to the data acquisition signal; Step 7: Generate a component performance test report based on the performance test data.

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